TWM565397U - Gas filling control device - Google Patents
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Abstract
氣體填充控制裝置,包括:箱體、至少一氣體填充控制單元、分流模組、集流模組及管理單元。各氣體填充控制單元係可移除地裝設於箱體內,用以流體連接氣體源以接收氣體源之氣體,並對氣體源之氣體進行偵測及處理以將經處理之氣體輸出至對應之晶圓盒裝載埠之氣體輸入端,並接收晶圓盒裝載埠之氣體輸出端之氣體以進行偵測並排放於至少一回收槽。分流模組用以流體連接於氣體源及至少一氣體填充控制單元之間。集流模組用以流體連接於至少一回收槽及至少一氣體填充控制單元之間。管理單元用以管理各氣體填充控制單元。The gas filling control device includes a box body, at least one gas filling control unit, a shunt module, a current collecting module, and a management unit. Each gas filling control unit is removably installed in the box for fluidly connecting the gas source to receive the gas from the gas source, and detecting and processing the gas from the gas source to output the processed gas to the corresponding The gas input terminal of the wafer box loading port receives gas from the gas output terminal of the wafer box loading port for detection and discharge to at least one recovery tank. The shunt module is used to fluidly connect between a gas source and at least one gas-filled control unit. The current collecting module is used to be fluidly connected between at least one recovery tank and at least one gas-filled control unit. The management unit is used to manage each gas filling control unit.
Description
本創作係關於一種控制裝置,更特別的是關於一種氣體填充控制裝置。This creation relates to a control device, and more particularly to a gas filling control device.
在半導體製程中,晶圓的潔淨度、穩定度要求很高。為了保證晶圓係設置在最潔淨、最穩定的環境中,習知常用的方式是利用氣密的晶圓盒作為載具,將一定數量的晶圓容置於晶圓盒之中暫時儲存。In the semiconductor process, the cleanliness and stability of wafers are very high. In order to ensure that the wafer system is set in the cleanest and most stable environment, a commonly used method is to use an air-tight wafer box as a carrier to store a certain number of wafers in the wafer box for temporary storage.
此外,半導體工廠之不同製程機台處設置了晶圓盒裝載埠(load port)。在半導體製程中,晶圓盒會經由自動化運輸設備而傳輸並置放於晶圓盒裝載埠上,並等待由對應的製程機台對晶圓進行處理。In addition, a wafer cassette load port is provided at different process equipment of the semiconductor factory. In the semiconductor manufacturing process, wafer cassettes are transported and placed on wafer cassette loading ports via automated transport equipment, and wait for wafers to be processed by corresponding process equipment.
若晶圓盒的容置空間中含有氧氣與水分時,將容易導致晶圓片表面產生一些不可預期的影響,嚴重的甚至會造成最終的製程良率降低以及半導體產品的失效。故此,半導體業界逐漸發展出氣體充填技術以對晶圓盒充氣,藉以將晶圓盒內部的空氣置換成惰性氣體,以符合製程所需標準。If the accommodating space of the wafer box contains oxygen and moisture, it will easily cause some unpredictable effects on the wafer surface, which may even seriously reduce the final process yield and the failure of semiconductor products. Therefore, the semiconductor industry has gradually developed a gas filling technology to inflate the wafer box, thereby replacing the air inside the wafer box with an inert gas to meet the standards required by the process.
習知技術中,必須對已有的晶圓盒裝載埠進行改裝,譬如在晶圓盒裝載埠中用以承載晶圓盒的基座上設置多個孔洞並於晶圓盒裝載埠上額外設置個別的氣體填充相關的多種元件及電系部件。如此,對晶圓盒裝載埠來說,晶圓盒裝載埠在機構上來說已遭更改,可能會造成不可預期的狀況。再者,為了氣體填充的控制,勢必要將廠內所有的晶圓盒裝載埠進行上述複雜的改裝。在設置及維護上,增加不少的複雜度,也大大增加了維護、管理的成本。若某一台晶圓盒裝載埠上的氣體填充的裝置有異常,也可能令此晶圓盒裝載埠需要暫時停機以作維修,如此將可能影響整體製程的運作。In the conventional technology, the existing wafer cassette loading port must be modified. For example, a plurality of holes are provided in the wafer cassette loading port and a base for carrying the wafer cassette, and additional installation is provided on the wafer cassette loading port. Various gas and electrical components related to individual gas filling. In this way, for the cassette loading port, the cassette loading port has been changed in the organization, which may cause an unexpected situation. Furthermore, for the control of gas filling, it is necessary to carry out the above complex modification to all wafer box loading ports in the factory. In the setting and maintenance, a lot of complexity is added, and the cost of maintenance and management is greatly increased. If the gas filling device on a wafer cassette loading port is abnormal, the wafer cassette loading port may need to be temporarily stopped for maintenance, which may affect the operation of the overall process.
故此,在晶圓盒裝載埠實現氣體填充控制的方式仍有待改進。Therefore, the way to realize the gas filling control in the wafer cassette loading port still needs to be improved.
本創作之一目的在於提供一種氣體填充控制裝置,氣體填充控制裝置係獨立於晶圓盒裝載埠,並進行集中式管理,以降低晶圓盒裝載埠的氣體填充氣控制在裝設、管理及維護上的複雜度,並可使管理人員對廠房內多個晶圓盒裝載埠的充氣狀態得以整體性地管理及調度。One of the objectives of this creation is to provide a gas filling control device that is independent of the wafer box loading port and performs centralized management to reduce the gas filling gas control of the wafer box loading port during installation, management, and The complexity of maintenance allows managers to manage and dispatch the inflation status of multiple wafer box loading ports in the plant as a whole.
為達上述目的及其他目的,本創作提出一種氣體填充控制裝置,其包括:箱體、至少一氣體填充控制單元、分流模組、集流模組及管理單元。各氣體填充控制單元係可移除地裝設於箱體內,用以流體連接氣體源以接收氣體源之氣體,並對氣體源之氣體進行偵測及處理以將經處理之氣體輸出至對應之一晶圓盒裝載埠(load port)之氣體輸入端,並接收晶圓盒裝載埠之氣體輸出端之氣體以進行偵測並排放於至少一回收槽。分流模組用以流體連接於氣體源及至少一氣體填充控制單元之間。集流模組用以流體連接於至少一回收槽及至少一氣體填充控制單元之間。管理單元係電性耦接於至少一氣體填充控制單元,用以管理各氣體填充控制單元。In order to achieve the above-mentioned object and other objects, the present invention proposes a gas filling control device, which includes a cabinet, at least one gas filling control unit, a shunt module, a current collecting module, and a management unit. Each gas filling control unit is removably installed in the box for fluidly connecting the gas source to receive the gas from the gas source, and detecting and processing the gas from the gas source to output the processed gas to the corresponding A gas input terminal of a wafer box load port receives gas from a gas output terminal of the wafer box load port for detection and discharge to at least one recovery tank. The shunt module is used to fluidly connect between a gas source and at least one gas-filled control unit. The current collecting module is used to be fluidly connected between at least one recovery tank and at least one gas-filled control unit. The management unit is electrically coupled to at least one gas-filled control unit for managing each gas-filled control unit.
於本創作之一實施例中,分流模組包含複數個第一開關閥,各第一開關閥用以流體連接於氣體源及對應之氣體填充控制單元之間;集流模組包含複數個第二開關閥,各第二開關閥用以流體連接於至少一回收槽及對應之氣體填充控制單元之間。In one embodiment of the present invention, the shunt module includes a plurality of first switching valves, and each of the first switching valves is used to fluidly connect between the gas source and the corresponding gas filling control unit; the current collecting module includes a plurality of first switching valves. Two on-off valves, each of which is used to be fluidly connected between at least one recovery tank and a corresponding gas-filled control unit.
於本創作之一實施例中,氣體填充控制裝置更包括調節器,用以流體連接於氣體源及分流模組之間。In an embodiment of the present invention, the gas filling control device further includes a regulator for fluidly connecting between the gas source and the shunt module.
於本創作之一實施例中,氣體填充控制裝置更包括電源單元,電源單元用以輸出電源訊號以供氣體填充控制裝置內部使用。In an embodiment of the present invention, the gas filling control device further includes a power supply unit, and the power supply unit is configured to output a power signal for internal use of the gas filling control device.
於本創作之一實施例中,氣體填充控制單元包括:氣體填充模組及氣體回收模組。氣體填充模組用以流體連接氣體源以接收氣體源之氣體,並對氣體源之氣體進行偵測、控制及過濾之處理以將經處理之氣體輸出至對應之晶圓盒裝載埠之氣體輸入端,其中氣體填充模組具有第一輸入連接端和第一輸出連接端,第一輸入連接端用以接收氣體源之氣體,第一輸出連接端用以將經處理之氣體輸出至對應之晶圓盒裝載埠之氣體輸入端。氣體回收模組用以接收晶圓盒裝載埠之氣體輸出端之氣體以進行偵測並排放於至少一回收槽,氣體回收模組具有第二輸入連接端和第二輸出連接端,第二輸入連接端用以接收晶圓盒裝載埠之氣體輸出端之氣體,第二輸出連接端用以將晶圓盒裝載埠之氣體輸出端之氣體排放於至少一回收槽。In one embodiment of the present invention, the gas filling control unit includes a gas filling module and a gas recovery module. The gas filling module is used to fluidly connect the gas source to receive the gas from the gas source, and to detect, control and filter the gas from the gas source to output the processed gas to the gas input of the corresponding wafer box loading port. End, wherein the gas filling module has a first input connection end and a first output connection end, the first input connection end is used to receive the gas of the gas source, and the first output connection end is used to output the processed gas to the corresponding crystal Gas input terminal of round box loading port. The gas recovery module is used to receive the gas at the gas output terminal of the wafer box loading port for detection and discharge to at least one recovery tank. The gas recovery module has a second input connection terminal and a second output connection terminal, and the second input The connection end is used to receive the gas at the gas output end of the wafer box loading port, and the second output connection end is used to discharge the gas at the gas output end of the wafer box loading port to at least one recovery tank.
於本創作之一實施例中,氣體回收模組用以偵測來自第二輸入連接端之氣體的濕度並輸出濕度感測訊號,管理單元基於濕度感測訊號控制氣體填充模組以改變經處理之氣體之流速。In one embodiment of the present invention, the gas recovery module is used to detect the humidity of the gas from the second input connection terminal and output a humidity sensing signal. The management unit controls the gas filling module based on the humidity sensing signal to change the processed gas. The velocity of the gas.
於本創作之一實施例中,若濕度感測訊號表示來自第二輸入連接端之氣體的濕度大於濕度門檻值,管理單元控制氣體填充模組以增加經處理之氣體之流速。In one embodiment of the present invention, if the humidity sensing signal indicates that the humidity of the gas from the second input connection terminal is greater than the humidity threshold, the management unit controls the gas filling module to increase the flow rate of the processed gas.
於本創作之一實施例中,氣體填充模組包括:氣流調節器、第一壓力感測器、氣流感測器、過濾器。氣流調節器之輸入端係流體連接於第一輸入連接端。第一壓力感測器流體連接於氣流調節器,用以感測氣流調節器所輸出之氣體之壓力並輸出第一壓力感測訊號。氣流感測器係流體連接於氣流調節器,用以感測氣流調節器所輸出之氣體之氣流速度並輸出氣流感測訊號。過濾器係流體連接於第一輸入連接端及第一輸出連接端之間。In one embodiment of the present invention, the gas filling module includes: an air flow regulator, a first pressure sensor, a gas flu detector, and a filter. The input end of the air conditioner is fluidly connected to the first input connection end. The first pressure sensor is fluidly connected to the airflow regulator, and is configured to sense the pressure of the gas output by the airflow regulator and output a first pressure sensing signal. The gas flu detector is fluidly connected to the airflow regulator, and is used to sense the gas flow velocity of the gas output by the airflow regulator and output a gas flu signal. The filter is fluidly connected between the first input connection end and the first output connection end.
於本創作之一實施例中,氣體回收模組包括:排氣閥、第二壓力感測器、濕度感測器。排氣閥係流體連接於第二輸入連接端及第二輸出連接端之間。第二壓力感測器係流體連接於第二輸入連接端及第二輸出連接端之間,用以感測來自該第二輸入連接端之氣體之壓力並輸出第二壓力感測訊號。濕度感測器係流體連接於第二輸入連接端及第二輸出連接端之間,用以感測來自該第二輸入連接端之氣體之濕度並輸出濕度感測訊號。In one embodiment of the present invention, the gas recovery module includes: an exhaust valve, a second pressure sensor, and a humidity sensor. The exhaust valve is fluidly connected between the second input connection end and the second output connection end. The second pressure sensor is fluidly connected between the second input connection end and the second output connection end, and is used for sensing the pressure of the gas from the second input connection end and outputting a second pressure sensing signal. The humidity sensor is fluidly connected between the second input connection end and the second output connection end, and is used to sense the humidity of the gas from the second input connection end and output a humidity sensing signal.
於本創作之一實施例中,管理單元包括:控制模組及顯示模組。 顯示模組係電性耦接於控制模組,用以顯示使用介面,其中控制模組用以控制顯示模組顯示各氣體填充控制單元的狀態於使用介面上。In one embodiment of the present invention, the management unit includes a control module and a display module. The display module is electrically coupled to the control module for displaying the use interface, wherein the control module is used to control the display module to display the status of each gas-filled control unit on the use interface.
藉此,多個氣體填充控制單元可以可移除地裝設於氣體填充控制裝置的箱體內以便進行集中式管理,以降低晶圓盒裝載埠的氣體填充氣控制在裝設、管理及維護上的複雜度,並可使管理人員對廠房內多個晶圓盒裝載埠的充氣狀態得以整體性地管理及調度。在必要時,管理人員可以藉由抽換氣體填充控制單元而進行維護或狀況排除。如此,大大降低了氣體填充控制之設置的複雜度,使得維護及設置更為便利,並能降低設置及維護的成本。Thereby, a plurality of gas filling control units can be removably installed in the box of the gas filling control device for centralized management, so as to reduce the gas filling gas control of the wafer box loading port in installation, management and maintenance. Complexity, and can enable managers to manage and schedule the inflation status of multiple wafer box loading ports in the plant as a whole. When necessary, the manager can perform maintenance or condition removal by replacing the gas with the control unit. In this way, the complexity of the setting of the gas filling control is greatly reduced, the maintenance and the setting are more convenient, and the cost of the setting and the maintenance can be reduced.
為充分瞭解本創作之目的、特徵及功效,茲藉由下述具體之實施例,並配合所附之圖式,對本創作做詳細說明,說明如後:In order to fully understand the purpose, features, and effects of this creation, we will use the following specific examples and the accompanying drawings to explain this creation in detail, as described below:
請參考圖1A、圖1B及圖2,圖1A為本創作一實施例中之氣體填充控制裝置的外觀示意圖,圖1B為氣體填充控制裝置之箱體之一實施例的外觀示意圖,圖2為本創作一實施例中之氣體填充控制裝置的方塊示意圖。如圖1A所示,氣體填充控制裝置1包括:箱體10、至少一氣體填充控制單元20、管理單元30,其中各氣體填充控制單元20係可移除地裝設於箱體10內,管理單元30則可裝設於箱體10內或外。如圖1B所示,箱體10可以實現為具有前門11及側門12。在前門11被打開後,氣體填充控制單元20係可移除地裝設於箱體10的容置空間內。側門12具有散熱槽以用於散熱,而使用者可將側門12打開以便對氣體填充控制單元20進行維護作業。此外,管理單元30可配置為具有顯示模組並可裝設於箱體10上而使顯示模組的顯示畫面朝外,以便技術人員從顯示畫面得知氣體填充控制單元20的狀態或進行設定。然而,本創作之實現並不受上述例子限制。譬如,箱體10亦可實現為具有多個側門或不具有側門,或任何能提供容置空間的配置方式。Please refer to FIG. 1A, FIG. 1B, and FIG. 2. FIG. 1A is a schematic diagram of an appearance of a gas filling control device in an embodiment of the creation, FIG. 1B is an appearance diagram of an embodiment of a box of the gas filling control device, and FIG. 2 is A block diagram of a gas filling control device in an embodiment of the present invention. As shown in FIG. 1A, the gas filling control device 1 includes a cabinet 10, at least one gas filling control unit 20, and a management unit 30. Each of the gas filling control units 20 is removably installed in the cabinet 10 to manage The unit 30 can be installed inside or outside the cabinet 10. As shown in FIG. 1B, the cabinet 10 may be implemented with a front door 11 and a side door 12. After the front door 11 is opened, the gas filling control unit 20 is removably installed in the accommodation space of the box 10. The side door 12 has a heat sink for heat dissipation, and the user can open the side door 12 to perform maintenance work on the gas filling control unit 20. In addition, the management unit 30 can be configured to have a display module and can be installed on the cabinet 10 so that the display screen of the display module faces outward, so that a technician can know the status of the gas filling control unit 20 or make settings from the display screen. . However, the realization of this creation is not limited by the above examples. For example, the cabinet 10 can also be implemented with multiple side doors or without side doors, or any configuration that can provide a space for accommodation.
如圖2所示,氣體填充控制裝置1係獨立於晶圓盒裝載埠LP,並進行集中式管理,故氣體填充控制裝置1可以同時流體連接至複數個晶圓盒裝載埠LP。各氣體填充控制單元20係用以流體連接氣體源GS以接收氣體源GS之氣體,並對氣體源GS之氣體進行偵測及處理以將經處理之氣體輸出至對應之晶圓盒裝載埠LP(load port)之氣體輸入端LI,並接收晶圓盒裝載埠LP之氣體輸出端LO之氣體以進行偵測並排放於至少一回收槽SK。舉例而言,晶圓盒裝載埠LP用以承載晶圓盒FP,如前端開口整合盒(Front Open Unified Pod;FOUP);晶圓盒FP亦有氣體輸入及輸出端,用以與氣體輸入端LI及氣體輸出端LO流體連接。氣體填充控制單元20透過晶圓盒裝載埠LP進而可對晶圓盒FP內部填充惰性氣體(Inert Gas)(如氮氣、氦氣或其他惰性氣體)、潔淨乾燥空氣(Clean Dry Air,CDA)、超潔淨乾燥空氣(Extreme Clean Dry Air,XCDA)或其他氣體,來達到排除氧氣與水氣之目的,藉以符合製程所需標準。As shown in FIG. 2, the gas filling control device 1 is independent of the wafer box loading port LP and performs centralized management, so the gas filling control device 1 can be fluidly connected to a plurality of wafer box loading ports LP at the same time. Each gas filling control unit 20 is for fluidly connecting the gas source GS to receive the gas from the gas source GS, and detecting and processing the gas from the gas source GS to output the processed gas to the corresponding wafer box loading port LP (load port) gas input terminal LI, and receives the gas at the gas output terminal LO of the wafer cassette loading port LP for detection and discharge to at least one recovery tank SK. For example, the wafer cassette loading port LP is used to carry a wafer cassette FP, such as a Front Open Unified Pod (FOUP); the wafer cassette FP also has a gas input and output terminal for communicating with the gas input terminal. LI is in fluid connection with the gas output LO. The gas filling control unit 20 can fill the inside of the wafer cassette FP with an inert gas (such as nitrogen, helium, or other inert gas), clean dry air (CDA), and the like through the cassette loading port LP. Ultra Clean Dry Air (XCDA) or other gases to achieve the purpose of excluding oxygen and water vapor, so as to meet the standards required by the process.
管理單元30,電性耦接於至少一氣體填充控制單元20,用以從各氣體填充控制單元20接收對應之偵測訊號,並控制各氣體填充控制單元20。The management unit 30 is electrically coupled to at least one gas-filled control unit 20 and is configured to receive a corresponding detection signal from each gas-filled control unit 20 and control each gas-filled control unit 20.
藉此,多個氣體填充控制單元20可以可移除地裝設於氣體填充控制裝置1的箱體10內以便進行集中式管理。此外,半導體製程商不再需要為了對晶圓盒提供氣體填充控制功能而改裝晶圓盒裝載埠,大大降低了設置的複雜度。此外,藉由管理單元30的集中式管理,管理人員更可以有效率地對於廠房內多個晶圓盒裝載埠LP的充氣狀態得以整體性地管理及調度;在必要時,可以藉由抽換氣體填充控制單元20而進行維護或狀況排除。再者,管理單元30亦可被配置為提供管理人員所需的管理功能,如對氣體填充控制單元20的狀態事件進行追蹤。如此,大大降低了氣體填充控制之設置的複雜度,使得維護及設置更為便利,並能降低設置及維護的成本。Thereby, a plurality of gas filling control units 20 can be removably installed in the casing 10 of the gas filling control device 1 for centralized management. In addition, semiconductor manufacturers no longer need to modify the wafer cassette loading port in order to provide the gas cassette with a gas filling control function, which greatly reduces the complexity of the setup. In addition, with the centralized management of the management unit 30, managers can more efficiently manage and dispatch the inflation status of multiple wafer box loading ports LP in the plant as a whole; if necessary, they can be replaced by replacement The control unit 20 is filled with gas for maintenance or condition elimination. Furthermore, the management unit 30 can also be configured to provide management functions required by a manager, such as tracking status events of the gas filling control unit 20. In this way, the complexity of the setting of the gas filling control is greatly reduced, the maintenance and the setting are more convenient, and the cost of the setting and the maintenance can be reduced.
請參考圖3,其為氣體填充控制裝置1之一實施例的方塊示意圖。在此實施例中,氣體填充控制裝置1更包括分流模組40,用以流體連接於氣體源GS及至少一氣體填充控制單元20之間。舉例而言,分流模組40可以包括複數個開關閥41,各開關閥41用以流體連接於氣體源GS及對應之氣體填充控制單元20之間,譬如開關閥41藉由連通的管路流體連接至氣體源GS。此外,氣體填充控制裝置1更可包括調節器45,如氣流穩定裝置,用以流體連接於氣體源GS及分流模組40之間,以使來自氣體源GS的氣體的流量更為穩定。此外,氣體填充控制裝置1更包括集流模組50,用以流體連接於至少一回收槽SK及至少一氣體填充控制單元20之間。舉例而言,集流模組50可以包括複數個開關閥51,各開關閥51用以流體連接於至少一回收槽SK及對應之氣體填充控制單元20之間,譬如開關閥51藉由連通的管路流體連接至至少一回收槽SK。然而,本創作之氣體填充控制裝置的實現方式並不受上述例子限制;譬如亦可將調節器視為氣體填充控制裝置1之外部裝置;開關閥可以為電磁閥或手動閥。Please refer to FIG. 3, which is a block diagram of an embodiment of the gas filling control device 1. In this embodiment, the gas filling control device 1 further includes a shunt module 40 for fluidly connecting between the gas source GS and at least one gas filling control unit 20. For example, the shunt module 40 may include a plurality of on-off valves 41, each of which is used to fluidly connect between the gas source GS and the corresponding gas-filled control unit 20, such as the on-off valve 41 through a connected pipeline fluid Connected to gas source GS. In addition, the gas filling control device 1 may further include a regulator 45, such as a gas flow stabilization device, for fluidly connecting between the gas source GS and the shunt module 40 to make the flow of the gas from the gas source GS more stable. In addition, the gas filling control device 1 further includes a current collecting module 50 for fluidly connecting between at least one recovery tank SK and at least one gas filling control unit 20. For example, the current collecting module 50 may include a plurality of on-off valves 51. Each on-off valve 51 is used to fluidly connect between at least one recovery tank SK and the corresponding gas filling control unit 20, for example, the on-off valve 51 is connected by The pipeline is fluidly connected to at least one recovery tank SK. However, the implementation method of the gas filling control device of this creation is not limited by the above examples; for example, the regulator can also be regarded as an external device of the gas filling control device 1; the on-off valve can be a solenoid valve or a manual valve.
若某一氣體填充控制單元20有異常時,只需把分流模組40及集流模組50中對應的開關閥閉合,即可將有異常的氣體填充控制單元20移除出氣體填充控制裝置1以外,以便進行置換正常的氣體填充控制單元的動作,如此可避免對應的晶圓盒裝載埠需要長時間的停機,故可將對整體的製程運作的影響大大的降低,提升維護的效率。If there is an abnormality in a certain gas filling control unit 20, only the corresponding on-off valves in the shunt module 40 and the current collecting module 50 need to be closed to remove the abnormal gas filling control unit 20 from the gas filling control device. Other than 1, in order to replace the normal gas filling control unit, so that the corresponding wafer cassette loading port needs to be stopped for a long time, so it can greatly reduce the impact on the overall process operation and improve the efficiency of maintenance.
如圖3所示,舉例而言,管理單元30可以包括:控制模組31及顯示模組32。顯示模組32係電性耦接於控制模組31,用以顯示使用介面,其中控制模組31用以控制顯示模組32顯示各氣體填充控制單元20的狀態於使用介面上。譬如,氣體填充控制單元20會對氣體源GS之氣體進行偵測及處理,並且對來自晶圓盒裝載埠LP之氣體輸出端LO之氣體進行偵測,當中所產生的偵測訊號的相關數據(如壓力、氣流速度、或濕度等)會透過使用介面而顯示。此外,控制模組31可依據偵測訊號對各氣體填充控制單元20進行控制,例如控制模組31輸出複數個控制訊號至各氣體填充控制單元20。控制模組31例如是微處理器或微控制器。此外,管理單元30更可包括網路模組,用以有線或無線方式與中控系統通訊,以進行各種管理的用途,中控系統例如是製造執行系統(Manufacturing Execution System, MES)或機台自動化(Equipment Automation Program, EAP)系統。然而,本創作之氣體填充控制裝置的實現方式並不受上述例子限制;譬如管理單元亦可實現為至少包含控制模組。As shown in FIG. 3, for example, the management unit 30 may include a control module 31 and a display module 32. The display module 32 is electrically coupled to the control module 31 to display the use interface. The control module 31 is used to control the display module 32 to display the status of each gas-filled control unit 20 on the use interface. For example, the gas filling control unit 20 detects and processes the gas of the gas source GS, and detects the gas from the gas output terminal LO of the wafer box loading port LP, and the relevant data of the detection signal generated therein (Such as pressure, air velocity, or humidity) will be displayed through the user interface. In addition, the control module 31 can control each gas filling control unit 20 according to the detection signal. For example, the control module 31 outputs a plurality of control signals to each gas filling control unit 20. The control module 31 is, for example, a microprocessor or a microcontroller. In addition, the management unit 30 may further include a network module for communicating with the central control system in a wired or wireless manner for various management purposes. The central control system is, for example, a Manufacturing Execution System (MES) or a machine. Automation (Equipment Automation Program, EAP) system. However, the implementation of the gas filling control device of this creation is not limited by the above examples; for example, the management unit can also be implemented to include at least a control module.
再者,氣體填充控制裝置1更可包括電源單元,用以輸出電源訊號以供氣體填充控制裝置1內部的單元或模組使用。Furthermore, the gas filling control device 1 may further include a power supply unit for outputting a power signal for use by a unit or module inside the gas filling control device 1.
請參考圖4,其為氣體填充控制單元20之一實施例的方塊示意圖。於此實施例中,氣體填充控制單元20包括:氣體填充模組21及氣體回收模組22,其中管理單元30係電性耦接於氣體填充模組21及氣體回收模組22。Please refer to FIG. 4, which is a block diagram of an embodiment of the gas filling control unit 20. In this embodiment, the gas filling control unit 20 includes: a gas filling module 21 and a gas recovery module 22, wherein the management unit 30 is electrically coupled to the gas filling module 21 and the gas recovery module 22.
此外,在圖4中,舉例而言,可利用電源單元60輸出電源訊號以供氣體填充控制單元20使用。舉例而言,電源單元可包括變壓器、穩壓器、不斷電裝置或其他合適之電源電路或其組合。然而,本創作之氣體填充控制裝置的實現方式並不受上述例子限制。譬如,電源單元可實現於各氣體填充控制單元20中;或氣體填充控制裝置1可實現為包含至少一電源單元以供應電力給內部使用。又例如,氣體填充控制裝置1可具有複數個電源單元,當有電源單元發生故障時可切換至另一電源單元。此外,氣體填充控制裝置1亦可實現為將電源單元視作外部元件之設備。In addition, in FIG. 4, for example, the power supply unit 60 may be used to output a power signal for use by the gas filling control unit 20. For example, the power supply unit may include a transformer, a voltage regulator, a UPS, or other suitable power supply circuits or a combination thereof. However, the implementation of the gas filling control device of this creation is not limited by the above examples. For example, the power supply unit may be implemented in each gas filling control unit 20; or the gas filling control device 1 may be implemented to include at least one power supply unit to supply power for internal use. As another example, the gas filling control device 1 may have a plurality of power supply units, and may switch to another power supply unit when a power supply unit fails. In addition, the gas filling control device 1 can also be realized as a device that regards the power supply unit as an external component.
請再參考圖4,氣體填充模組21用以流體連接氣體源GS以接收氣體源GS之氣體,並對氣體源GS之氣體進行偵測、控制及過濾之處理以將經處理之氣體輸出至對應之晶圓盒裝載埠LP之氣體輸入端LI。如圖4所示,氣體填充模組21具有第一輸入連接端IN1和第一輸出連接端OUT1,第一輸入連接端IN1用以接收氣體源GS之氣體,第一輸出連接端OUT1用以將經處理之氣體輸出至對應之晶圓盒裝載埠LP之氣體輸入端LI。Please refer to FIG. 4 again, the gas filling module 21 is used to fluidly connect the gas source GS to receive the gas from the gas source GS, and to detect, control and filter the gas from the gas source GS to output the processed gas to Gas input terminal LI of the corresponding cassette loading port LP. As shown in FIG. 4, the gas filling module 21 has a first input connection terminal IN1 and a first output connection terminal OUT1. The first input connection terminal IN1 is used to receive the gas of the gas source GS, and the first output connection terminal OUT1 is used to connect The processed gas is output to the gas input terminal LI of the corresponding wafer cassette loading port LP.
氣體回收模組22用以接收晶圓盒裝載埠LP之氣體輸出端LO之氣體以進行偵測並排放於至少一回收槽SK。如圖4所示,氣體回收模組22具有第二輸入連接端IN2和第二輸出連接端OUT2,第二輸入連接端IN2用以接收氣體(如晶圓盒裝載埠LP之氣體輸出端LO所排出之氣體),第二輸出連接端OUT2用以將所接收之氣體(如晶圓盒裝載埠LP之氣體輸出端LO之氣體)排放於至少一回收槽SK。The gas recovery module 22 is used to receive the gas at the gas output terminal LO of the wafer box loading port LP for detection and discharge to at least one recovery tank SK. As shown in FIG. 4, the gas recovery module 22 has a second input connection terminal IN2 and a second output connection terminal OUT2. The second input connection terminal IN2 is used to receive a gas (such as the gas output terminal LO of the wafer box loading port LP). The second output connection terminal OUT2 is used to discharge the received gas (such as the gas at the gas output terminal LO of the wafer cassette loading port LP) to at least one recovery tank SK.
於一實施例中,氣體回收模組22用以偵測來自第二輸入連接端IN2的氣體(如晶圓盒裝載埠LP之氣體輸出端LO之氣體)的濕度並輸出濕度感測訊號,管理單元30基於濕度感測訊號控制氣體填充模組21以改變經處理之氣體之流速。In one embodiment, the gas recovery module 22 is used to detect the humidity of the gas from the second input connection terminal IN2 (such as the gas at the gas output terminal LO of the wafer box loading port LP) and output a humidity sensing signal for management. The unit 30 controls the gas filling module 21 based on the humidity sensing signal to change the flow rate of the processed gas.
例如,若濕度感測訊號表示來自第二輸入連接端IN2的氣體(如晶圓盒裝載埠LP之氣體輸出端LO之氣體)的濕度大於或等於濕度門檻值,管理單元30控制氣體填充模組21以增加經處理之氣體之流速。若濕度感測訊號表示所接收之氣體(如晶圓盒裝載埠LP之氣體輸出端LO之氣體)的濕度小於濕度門檻值,則管理單元30可控制氣體填充模組21以減小或保持經處理之氣體之目前流速。For example, if the humidity sensing signal indicates that the humidity of the gas from the second input connection terminal IN2 (such as the gas at the gas output terminal LO of the wafer box loading port LP) is greater than or equal to the humidity threshold, the management unit 30 controls the gas filling module 21 to increase the flow rate of the treated gas. If the humidity sensing signal indicates that the humidity of the received gas (such as the gas at the gas output terminal LO of the wafer box loading port LP) is less than the humidity threshold, the management unit 30 may control the gas filling module 21 to reduce or maintain the The current flow rate of the processed gas.
請參考圖5,其為氣體填充控制單元20之氣體填充模組21之一實施例的方塊示意圖。於本創作之一實施例中,氣體填充模組21包括:氣流調節器110、第一壓力感測器120、氣流感測器130、過濾器140。氣流調節器110之輸入端係流體連接於第一輸入連接端IN1。第一壓力感測器120流體連接於氣流調節器110,用以感測氣流調節器110所輸出之氣體之壓力並輸出第一壓力感測訊號。氣流感測器130係流體連接於氣流調節器110,用以感測氣流調節器110所輸出之氣體之氣流速度並輸出氣流感測訊號。過濾器140係流體連接於第一輸入連接端IN1及第一輸出連接端OUT1之間。舉例而言,除了如圖5的配置關係以外,氣體填充模組21內部亦可作其他任何合適之排列方式或增加其他元件。例如,過濾器140可設置於氣流調節器110、第一壓力感測器120之間;氣流感測器130可設置於氣流調節器110、第一壓力感測器120之間。本創作的實現方式並不受上述例子限制。Please refer to FIG. 5, which is a block diagram of an embodiment of the gas filling module 21 of the gas filling control unit 20. In one embodiment of the present invention, the gas filling module 21 includes: an airflow regulator 110, a first pressure sensor 120, a gas flu detector 130, and a filter 140. An input terminal of the airflow regulator 110 is fluidly connected to the first input connection terminal IN1. The first pressure sensor 120 is fluidly connected to the airflow regulator 110 and is configured to sense the pressure of the gas output by the airflow regulator 110 and output a first pressure sensing signal. The gas flu detector 130 is fluidly connected to the airflow regulator 110, and is used to sense the gas flow velocity of the gas output from the gas flow regulator 110 and output a gas flu signal. The filter 140 is fluidly connected between the first input connection terminal IN1 and the first output connection terminal OUT1. For example, in addition to the configuration relationship shown in FIG. 5, the gas filling module 21 may also be arranged in any other suitable arrangement manner or add other components. For example, the filter 140 may be disposed between the airflow regulator 110 and the first pressure sensor 120; the gas flu sensor 130 may be disposed between the airflow regulator 110 and the first pressure sensor 120. The implementation of this creation is not limited by the above examples.
舉例而言,氣流調節器110可包含複數個調節閥111、112,各調節閥在開啟時可產生相對應的流量,藉由調節閥111、112的開啟或閉合的各種組合,可以令氣流調節器110之輸出端的氣體產生不同流速。上述第一壓力感測訊號、氣流感測訊號可以傳送至管理單元130,管理單元130可據以處理、分析、記錄、或顯示,以便於管理人員管理氣體填充控制之事宜。For example, the airflow regulator 110 may include a plurality of control valves 111 and 112, each of which can generate a corresponding flow when opened, and the airflow can be adjusted by various combinations of the opening and closing of the control valves 111 and 112. The gas at the output of the generator 110 produces different flow rates. The above-mentioned first pressure sensing signal and gas flu testing signal may be transmitted to the management unit 130, and the management unit 130 may process, analyze, record, or display the information so as to facilitate the management personnel to manage the gas filling control matters.
請參考圖6,其為氣體填充控制單元20之氣體回收模組22之一實施例的方塊示意圖。於本創作之一實施例中,氣體回收模組22包括:排氣閥210、第二壓力感測器220、濕度感測器230。排氣閥210係流體連接於第二輸入連接端IN2及第二輸出連接端OUT2之間。第二壓力感測器220係流體連接於第二輸入連接端IN2及第二輸出連接端OUT2之間,用以感測晶圓盒裝載埠LP之氣體輸出端LO之氣體之壓力並輸出第二壓力感測訊號。濕度感測器230係流體連接於第二輸入連接端IN2及第二輸出連接端OUT2之間,用以感測晶圓盒裝載埠LP之氣體輸出端LO之氣體之濕度並輸出濕度感測訊號。如前述實施例,管理單元30可以基於濕度感測訊號控制氣體填充模組21以改變經處理之氣體之流速,例如管理單元30輸出控制訊號至氣流調節器110以控制調節閥111、112的開啟或閉合以改變氣體之流速。舉例而言,除了如圖6的配置關係以外,氣體回收模組22內部亦可作其他任何合適之排列方式或增加其他元件。例如,濕度感測器230亦可設置於排氣閥210及第二輸入連接端IN2之間。本創作的實現方式並不受上述例子限制。Please refer to FIG. 6, which is a schematic block diagram of an embodiment of the gas recovery module 22 of the gas filling control unit 20. In one embodiment of the present invention, the gas recovery module 22 includes: an exhaust valve 210, a second pressure sensor 220, and a humidity sensor 230. The exhaust valve 210 is fluidly connected between the second input connection terminal IN2 and the second output connection terminal OUT2. The second pressure sensor 220 is fluidly connected between the second input connection terminal IN2 and the second output connection terminal OUT2 to sense the pressure of the gas at the gas output terminal LO of the wafer box loading port LP and output the second Pressure sensing signal. The humidity sensor 230 is fluidly connected between the second input connection terminal IN2 and the second output connection terminal OUT2, and is used to sense the humidity of the gas at the gas output terminal LO of the wafer box loading port LP and output a humidity sensing signal. . As in the foregoing embodiment, the management unit 30 can control the gas filling module 21 to change the flow rate of the processed gas based on the humidity sensing signal. For example, the management unit 30 outputs a control signal to the airflow regulator 110 to control the opening of the regulating valves 111 and 112. Or close to change the flow rate of the gas. For example, in addition to the configuration relationship as shown in FIG. 6, the gas recovery module 22 may be arranged in any other suitable arrangement manner or add other components. For example, the humidity sensor 230 may also be disposed between the exhaust valve 210 and the second input connection terminal IN2. The implementation of this creation is not limited by the above examples.
請參考圖7,其為利用氣體填充控制裝置進行集中式管理之使用情景之一實施例的示意圖。如圖7所示,氣體填充控制裝置1可以同時流體連接至複數個晶圓盒裝載埠LP以對所承載之晶圓盒FP進行氣體填充控制。在圖7中,氣體填充控制裝置1可以利用有線或無線方式透過如網際網路通訊協定(TCP/IP)與中控系統通訊以進行各種管理的用途,中控系統例如是製造執行系統(MES)710或機台自動化(EAP)系統720。機台自動化系統720可與製造執行系統710通訊。藉此,氣體填充控制裝置1可以將各個晶圓盒裝載埠LP對應之晶圓盒FP之偵測訊號或狀態傳送至機台自動化系統720及製造執行系統710,製造執行系統710或機台自動化系統720也可以用於設定及管理氣體填充控制裝置1,從而對複數個晶圓盒裝載埠LP進行氣體填充控制之管理。此外,氣體填充控制裝置1、製造執行系統710、機台自動化系統720之間係可利用業界標準之通訊協定來進行通訊,例如半導體設備通訊標準(SEMI Equipment Communication Standard, SECS)或高速SECS訊息服務(High-Speed SECS Message Services, HSMS)等之通訊協定。然而,本創作的實現方式並不受上述例子限制。Please refer to FIG. 7, which is a schematic diagram of an embodiment of a use scenario for centralized management using a gas filling control device. As shown in FIG. 7, the gas filling control device 1 can be fluidly connected to a plurality of wafer box loading ports LP at the same time to perform gas filling control on the wafer box FP carried thereon. In FIG. 7, the gas filling control device 1 can communicate with the central control system through a wired or wireless method such as the Internet Protocol (TCP / IP) for various management purposes. The central control system is, for example, a manufacturing execution system (MES ) 710 or Machine Automation (EAP) system 720. The machine automation system 720 may communicate with a manufacturing execution system 710. Thereby, the gas filling control device 1 can transmit the detection signal or status of the wafer cassette FP corresponding to each wafer cassette loading port LP to the machine automation system 720 and the manufacturing execution system 710, and the manufacturing execution system 710 or machine automation The system 720 can also be used to set and manage the gas filling control device 1 so as to manage the gas filling control of the plurality of wafer cassette loading ports LP. In addition, the gas filling control device 1, the manufacturing execution system 710, and the machine automation system 720 can communicate using industry standard communication protocols, such as the Semiconductor Equipment Communication Standard (SECS) or high-speed SECS message service. (High-Speed SECS Message Services, HSMS). However, the implementation of this creation is not limited by the above examples.
在上述之多個實施例中,複數個氣體填充控制單元20可以可移除地裝設於氣體填充控制裝置1的箱體10內以便進行集中式管理。此外,半導體製程商亦不再需要為了對晶圓盒提供氣體填充控制功能而改裝晶圓盒裝載埠,大大降低了設置的複雜度,使得維護及設置更為便利,能降低設置及維護的成本。此外,藉由管理單元30的集中式管理,更可以便於管理人員對廠房內多個晶圓盒裝載埠LP的狀態得以整體性地掌握及調度,在必要時,可以藉由抽換氣體填充控制單元20而進行維護或狀況排除。再者,管理單元30亦可被配置為提供管理人員所需的管理功能,如對氣體填充控制單元20的狀態事件進行追蹤。如此,大大降低了氣體填充控制之設置的複雜度,使得維護及設置更為便利,並能降低設置及維護的成本。In the above embodiments, the plurality of gas filling control units 20 may be removably installed in the casing 10 of the gas filling control device 1 for centralized management. In addition, semiconductor manufacturers no longer need to modify the wafer cassette loading port in order to provide a gas fill control function to the wafer cassette, which greatly reduces the complexity of setup, makes maintenance and setup more convenient, and can reduce setup and maintenance costs. . In addition, the centralized management of the management unit 30 makes it easier for managers to grasp and schedule the status of multiple wafer box loading ports LP in the plant. When necessary, it can be controlled by gas replacement. The unit 20 performs maintenance or condition elimination. Furthermore, the management unit 30 can also be configured to provide management functions required by a manager, such as tracking status events of the gas filling control unit 20. In this way, the complexity of the setting of the gas filling control is greatly reduced, the maintenance and the setting are more convenient, and the cost of the setting and the maintenance can be reduced.
本創作在上文中已以較佳實施例揭露,然熟習本項技術者應理解的是,該實施例僅用於描繪本創作,而不應解讀為限制本創作之範圍。應注意的是,舉凡與該實施例等效之變化與置換,均應設為涵蓋於本創作之範疇內。因此,本創作之保護範圍當以申請專利範圍所界定者為準。This creation has been disclosed above with a preferred embodiment, but those skilled in the art should understand that this embodiment is only used to describe this creation, and should not be interpreted as limiting the scope of this creation. It should be noted that all changes and substitutions equivalent to this embodiment should be included in the scope of this creation. Therefore, the scope of protection of this creation shall be defined by the scope of the patent application.
1‧‧‧氣體填充控制裝置
10‧‧‧箱體
11‧‧‧前門
12‧‧‧側門
20‧‧‧氣體填充控制單元
21‧‧‧氣體填充模組
22‧‧‧氣體回收模組
30‧‧‧管理單元
31‧‧‧控制模組
32‧‧‧顯示模組
40‧‧‧分流模組
41‧‧‧開關閥
45‧‧‧調節器
50‧‧‧集流模組
51‧‧‧開關閥
60‧‧‧電源單元
110‧‧‧氣流調節器
111、112‧‧‧調節閥
120‧‧‧第一壓力感測器
130‧‧‧氣流感測器
140‧‧‧過濾器
210‧‧‧排氣閥
220‧‧‧第二壓力感測器
230‧‧‧濕度感測器
710‧‧‧製造執行系統
720‧‧‧機台自動化系統
GS‧‧‧氣體源
SK‧‧‧回收槽
LP‧‧‧晶圓盒裝載埠
LI‧‧‧氣體輸入端
LO‧‧‧氣體輸出端
FP‧‧‧晶圓盒
IN1‧‧‧第一輸入連接端
OUT1‧‧‧第一輸出連接端
IN2‧‧‧第二輸入連接端
OUT2‧‧‧第二輸出連接端1‧‧‧Gas filling control device
10‧‧‧Box
11‧‧‧ front door
12‧‧‧ side entrance
20‧‧‧Gas filling control unit
21‧‧‧Gas Filled Module
22‧‧‧Gas Recovery Module
30‧‧‧Management Unit
31‧‧‧Control Module
32‧‧‧Display Module
40‧‧‧ Diversion Module
41‧‧‧On-off valve
45‧‧‧ Regulator
50‧‧‧collection module
51‧‧‧on-off valve
60‧‧‧Power supply unit
110‧‧‧Air Regulator
111, 112‧‧‧ regulating valve
120‧‧‧The first pressure sensor
130‧‧‧Gas Flu Detector
140‧‧‧filter
210‧‧‧ exhaust valve
220‧‧‧Second pressure sensor
230‧‧‧Humidity sensor
710‧‧‧Manufacturing Execution System
720‧‧‧machine automation system
GS‧‧‧Gas source
SK‧‧‧ Recovery Tank
LP‧‧‧Wafer Box Loading Port
LI‧‧‧Gas input
LO‧‧‧Gas output
FP‧‧‧ Wafer Box
IN1‧‧‧First input connection
OUT1‧‧‧First output connection
IN2‧‧‧Second input connection
OUT2‧‧‧Second output connection
[圖1A]係為本創作一實施例中之氣體填充控制裝置的外觀示意圖。 [圖1B]係為氣體填充控制裝置之箱體之一實施例的外觀示意圖。 [圖2]係為本創作一實施例中之氣體填充控制裝置的方塊示意圖。 [圖3]係為氣體填充控制裝置之一實施例的方塊示意圖。 [圖4]係為氣體填充控制單元之一實施例的方塊示意圖。 [圖5]係為氣體填充控制單元之氣體填充模組之一實施例的方塊示意圖。 [圖6]係為氣體填充控制單元之氣體回收模組之一實施例的方塊示意圖。 [圖7]係為利用氣體填充控制裝置進行集中式管理之使用情景之一實施例的示意圖。[Fig. 1A] is a schematic diagram of the appearance of a gas filling control device in an embodiment of the present invention. [Fig. 1B] is a schematic diagram of an appearance of an embodiment of a box of a gas filling control device. [Fig. 2] is a block diagram of a gas filling control device in an embodiment of the present invention. [Fig. 3] A block diagram of an embodiment of a gas filling control device. [Fig. 4] It is a schematic block diagram of an embodiment of a gas filling control unit. [Fig. 5] It is a block diagram of an embodiment of a gas filling module of a gas filling control unit. [Fig. 6] It is a block diagram of an embodiment of a gas recovery module of a gas filling control unit. [Fig. 7] It is a schematic diagram of an embodiment of a use scenario for centralized management using a gas filling control device.
Claims (10)
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
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CN113941561A (en) * | 2020-07-17 | 2022-01-18 | 南亚科技股份有限公司 | Load port apparatus, gas gate and gas supply method |
WO2023004938A1 (en) * | 2021-07-26 | 2023-02-02 | 长鑫存储技术有限公司 | System and method for adjusting oxygen content in front opening unified pod |
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
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CN113941561A (en) * | 2020-07-17 | 2022-01-18 | 南亚科技股份有限公司 | Load port apparatus, gas gate and gas supply method |
CN113941561B (en) * | 2020-07-17 | 2024-03-01 | 南亚科技股份有限公司 | Load port device, gas gate and gas supply method |
WO2023004938A1 (en) * | 2021-07-26 | 2023-02-02 | 长鑫存储技术有限公司 | System and method for adjusting oxygen content in front opening unified pod |
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