TWM549353U - Mechanism linking inspection fixture and test platform - Google Patents
Mechanism linking inspection fixture and test platform Download PDFInfo
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- TWM549353U TWM549353U TW106208548U TW106208548U TWM549353U TW M549353 U TWM549353 U TW M549353U TW 106208548 U TW106208548 U TW 106208548U TW 106208548 U TW106208548 U TW 106208548U TW M549353 U TWM549353 U TW M549353U
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Description
本創作係提供一種檢測治具與測試機台之聯結機構,尤指檢測治具與測試機台可利用電動的方式來自動結合,以使檢測治具之插接模組與測試機台之對接模組形成電性連接,且亦可透過電動的方式來使檢測治具與測試機台自動分離,以達到省時、省力,且具快速更換之效果。 The creation department provides a connection mechanism between the detection fixture and the test machine, especially the detection fixture and the test machine can be automatically combined by means of electric power, so that the connection module of the detection fixture and the test machine are docked. The module is electrically connected, and the detection fixture can be automatically separated from the testing machine by an electric method to save time, labor, and quick replacement.
按,在現行的電器產品中,為了達到更容易控制以及減少生產流程,許多廠商紛紛在設計電器產品的時候,將控制家電產品的控制裝置或操作裝置予以模組化,並統一設置在電路板中,如控制面板採用數位化的按鈕與液晶顯示器,以及內部採用微處理器對電器產品的功能進行控制,特別是在數位資訊產品中,所有的功能幾乎來自電路板,藉由電路板上各類型的電子元件與電子電路的相互組合,達到各種不同的功能。 According to the current electrical products, in order to achieve easier control and reduce the production process, many manufacturers have modularized the control devices or operating devices for controlling home appliances when designing electrical products, and uniformly set them on the circuit board. For example, the control panel uses digital buttons and liquid crystal displays, and the internal use of microprocessors to control the functions of electrical products, especially in digital information products, all functions are almost from the board, through the various boards Types of electronic components and electronic circuits are combined to achieve a variety of different functions.
電路板早期的生產方式,幾乎為人工或半自動的生產方式,即電子元件以人工的方式插接在電路板,經過錫爐後把電子元件焊固在電路板上,最後以人工方式剪去多餘的腳位;而隨著生產線的自動化與模組化,電路板在生產製造時,已經可透自動化的生產線進行大量的生產,而可大幅降低電路板的製造與生產成本。 The early production method of the circuit board is almost manual or semi-automatic production mode, that is, the electronic components are manually connected to the circuit board, and the electronic components are soldered to the circuit board after passing through the tin furnace, and finally the excess is manually cut. With the automation and modularization of the production line, the circuit board can be mass-produced through automated production lines during production, which can greatly reduce the manufacturing and production costs of the circuit board.
不論電路板的生產方式為自動、人工或半自動,生產後的 電路板在出廠前,必須經過各類型態的測試,如電磁波測試、電路功率消耗測試、抗干擾測試等,俾使電路板符合政府規定的電氣安全規定,經過測試後的電路板才可包裝上市,而不論是哪一種電器產品的電路板,其測試的項目與內容幾乎大同小異,故廠商在測試時,必須依照電路板型態而設計測試治具。 Whether the production method of the board is automatic, manual or semi-automatic, after production Before the board is shipped from the factory, it must pass various types of tests, such as electromagnetic wave test, circuit power consumption test, anti-interference test, etc., so that the circuit board meets the government's specified electrical safety regulations, and the tested circuit board can be packaged. When it comes to the market, no matter which kind of electrical product's circuit board, the test items and contents are almost the same, so the manufacturer must design the test fixture according to the circuit board type when testing.
然而,一般測試治具會透過複數連接埠來與測試裝置之複數連接埠進行電性連接,而當電路板置放於測試治具上進行檢測作業時,即可藉由測試裝置來接收電路板的訊號,以得知測試結果,但是,由於廠商並非只生產單一種電器產品的電路板,故在測試時,必須依照各電路板的大小與功能去設計測試治具,所以每次更換測試治具時,皆須先將測試治具之複數連接埠與測試裝置之連接埠間的連接線予以拔除,以重新將另一測試治具之複數連接埠來與測試裝置之連接埠進行連接,而在反覆更換測試治具的同時,勢必浪費許多寶貴的時間,而導致測試時間增加,降低生產線之效率。 However, the general test fixture will be electrically connected to the test device through a plurality of connection ports, and the circuit board can be received by the test device when the circuit board is placed on the test fixture for testing. The signal is to know the test result. However, since the manufacturer does not only manufacture the circuit board of a single electrical product, in the test, the test fixture must be designed according to the size and function of each circuit board, so each time the test is replaced In time, the connection between the plurality of test fixtures and the connection between the test fixtures must be removed to reconnect the other test fixtures to connect with the test device. At the same time as the test fixture is replaced, it will inevitably waste a lot of precious time, which will increase the test time and reduce the efficiency of the production line.
是以,要如何解決上述習用之問題與缺失,即為本案之創作人與從事此行業之相關廠商所亟欲研究改善之方向所在者。 Therefore, how to solve the above problems and problems in the past, that is, the creators of the case and the relevant manufacturers engaged in this industry are eager to study the direction of improvement.
故,創作人有鑑於上述之問題與缺失,乃蒐集相關資料,經由多方評估及考量,並以從事於此行業累積之多年經驗,經由不斷試作及修改,始設計出此種檢測治具與測試機台之聯結機構之新型誕生。 Therefore, in view of the above-mentioned problems and deficiencies, the creators have collected relevant information, evaluated and considered them through multiple parties, and have designed and tested such test fixtures and tests through continuous trial and modification through years of experience in the industry. The new type of linkage mechanism of the machine was born.
本創作之主要目的乃在於該檢測治具所具之檢測裝置一側設有檢測部,而檢測裝置另側所設對接結構之基部上設有至少一個導引槽 ,再於基部上設有與檢測裝置形成電性連接之插接模組,且該測試機台所具之基架相對二側處設有滑移結構,其滑移結構相對內側處之二導軌上樞設有可呈橫向往復位移之軌道,再於二軌道相對內側處設有至少一個滑動體,其檢測治具與測試機台便可透過對接結構之導引槽及滑移結構之滑動體來使檢測治具自動朝測試機台方向位移,進而使插接模組與對接模組形成電性連接狀態,而不需藉由人工的方式來進行對接作業,以具有省時、省力之效果,且欲拆離檢測治具與測試機台時,僅需再次藉由對接結構及滑移結構,便可輕易自動拆離檢測治具與測試機台,藉此節省時間、人力,並達到輕易、快速更換之目的。 The main purpose of the present invention is that the detecting device has a detecting portion on one side of the detecting device, and at least one guiding groove is provided on the base portion of the docking structure provided on the other side of the detecting device. And a plug-in module electrically connected to the detecting device is further disposed on the base, and the base frame of the testing machine has a sliding structure on opposite sides thereof, and the sliding structure is opposite to the inner side of the two rails The rail is provided with a track that can be reciprocally displaced laterally, and at least one sliding body is disposed opposite the inner side of the two rails, and the detecting fixture and the testing machine can pass through the guiding groove of the docking structure and the sliding body of the sliding structure. The detection fixture is automatically displaced toward the test machine, so that the plug module and the docking module are electrically connected, and the docking operation is not required by manual means, so as to save time and effort. Moreover, when the test fixture and the test machine are to be detached, the test fixture and the test machine can be easily detached automatically by the docking structure and the slip structure, thereby saving time and manpower, and achieving easy, The purpose of quick replacement.
本創作之次要目的乃在於該檢測治具之插接模組與測試機台之對接模組形成電性連接時,是利用複數連接器來與複數連接埠進行電性插接,以可節省檢測治具與測試機台間的連接時間,且更換不同的檢測治具時,僅需直接將檢測治具與測試機台分離,便可使檢測治具之插接模組與測試機台之對接模組脫離,藉以方便替換不同的檢測治具,進而達到節省時間、快速更換之目的。 The secondary purpose of the present invention is that when the plug-in module of the test fixture and the docking module of the test machine are electrically connected, the plurality of connectors are used to electrically connect with the plurality of ports, thereby saving When detecting the connection time between the jig and the test machine, and replacing the different test fixtures, it is only necessary to directly separate the test fixture from the test machine, so that the plugging module of the test fixture and the test machine can be The docking module is detached, so that it is convenient to replace different detecting fixtures, thereby achieving the purpose of saving time and quickly replacing.
本創作之另一目的乃在於該對接結構的基部表面二側處所設之至少一根限位柱為穿設於對接模組二側定位體之限位孔中呈一限位,以避免推移檢測治具時,產生偏移之情況,進而提升檢測治具之插接模組與測試機台之對接模組對接準確度,以避免產生接觸不良的狀況,影響測試時的數據與結果之目的。 Another object of the present invention is that at least one of the limiting posts disposed on the two sides of the base surface of the docking structure is a limit in the limiting hole of the positioning body disposed on the two sides of the docking module to avoid the detection of the displacement. When the fixture is used, the offset is generated, thereby improving the docking module docking module and the docking module of the testing machine to avoid the poor contact condition and affecting the data and results during the test.
1‧‧‧檢測治具 1‧‧‧Test fixture
11‧‧‧檢測裝置 11‧‧‧Detection device
111‧‧‧檢測部 111‧‧‧Detection Department
12‧‧‧對接結構 12‧‧‧ docking structure
121‧‧‧基部 121‧‧‧ base
1211‧‧‧限位柱 1211‧‧‧Limited column
1212‧‧‧側板 1212‧‧‧ side panels
122‧‧‧導引槽 122‧‧‧ guiding slot
1221‧‧‧開口 1221‧‧‧ openings
1222‧‧‧滑移通道 1222‧‧‧Slip channel
1223‧‧‧抵持面 1223‧‧‧Resistance
1224‧‧‧定位槽 1224‧‧‧ positioning slot
13‧‧‧插接模組 13‧‧‧Docking module
131‧‧‧連接器 131‧‧‧Connector
2‧‧‧測試機台 2‧‧‧Testing machine
21‧‧‧基架 21‧‧‧ pedestal
211‧‧‧定位孔 211‧‧‧Positioning holes
212‧‧‧滑移孔 212‧‧‧Slip hole
213‧‧‧剖槽 213‧‧‧ slotting
214‧‧‧感測裝置 214‧‧‧Sensing device
2141‧‧‧透孔 2141‧‧‧through hole
2142‧‧‧螺絲 2142‧‧‧ screws
215‧‧‧第一感測器 215‧‧‧first sensor
2151‧‧‧第一感測槽 2151‧‧‧First sensing slot
216‧‧‧第二感測器 216‧‧‧Second sensor
2161‧‧‧第二感測槽 2161‧‧‧Second sensing slot
22‧‧‧滑移結構 22‧‧‧Sliding structure
221‧‧‧導軌 221‧‧‧rail
2211‧‧‧板體 2211‧‧‧ board
2212‧‧‧固定桿 2212‧‧‧Fixed rod
222‧‧‧軌道 222‧‧‧ Track
2221‧‧‧插接塊 2221‧‧‧ plug block
223‧‧‧滑動體 223‧‧‧Sliding body
224‧‧‧驅動裝置 224‧‧‧ drive
2241‧‧‧傳動桿 2241‧‧‧Drive rod
225‧‧‧滑動板 225‧‧‧Sliding plate
226‧‧‧感測元件 226‧‧‧Sensor components
2261‧‧‧凸板 2261‧‧‧ convex plate
2262‧‧‧通孔 2262‧‧‧through hole
2263‧‧‧鎖固元件 2263‧‧‧Locking components
23‧‧‧對接模組 23‧‧‧Docking module
231‧‧‧連接埠 231‧‧‧Links
232‧‧‧定位體 232‧‧‧ Positioning body
2321‧‧‧限位孔 2321‧‧‧Limited holes
24‧‧‧測試儀器 24‧‧‧Testing equipment
第一圖 係為本創作之立體外觀圖。 The first picture is a three-dimensional appearance of the creation.
第二圖 係為本創作檢測治具與測試機台之立體分解圖。 The second figure is an exploded view of the creation test fixture and the test machine.
第三圖 係為本創作測試機台之立體分解圖。 The third figure is an exploded view of the creation test machine.
第四圖 係為本創作測試機台另一視角之立體分解圖。 The fourth figure is an exploded view of another perspective of the creation test machine.
第五圖 係為本創作檢測治具與測試機台組裝前之局部側視剖面圖。 The fifth figure is a partial side cross-sectional view of the creation test fixture and the test machine before assembly.
第六圖 係為本創作檢測治具與測試機台組裝前之局部立體外觀圖。 The sixth figure is a partial stereoscopic appearance of the creation test fixture and the test machine before assembly.
第七圖 係為本創作檢測治具與測試機台組裝時之局部側視剖面圖。 The seventh figure is a partial side cross-sectional view of the creation of the test fixture and the test machine.
第八圖 係為本創作檢測治具與測試機台組裝時之局部立體外觀圖。 The eighth figure is a partial stereoscopic view of the creation of the test fixture and the test machine.
第九圖 係為本創作檢測治具與測試機台組裝後之局部側視剖面圖。 The ninth figure is a partial side cross-sectional view of the creation of the test fixture and the test machine.
為達成上述目的及功效,本創作所採用之技術手段及其構造,茲繪圖就本創作之較佳實施例詳加說明其特徵與功能如下,俾利完全瞭解。 In order to achieve the above objectives and effects, the technical means and structure of the present invention are described in detail in the preferred embodiment of the present invention, and the features and functions are as follows.
請參閱第一、二、三、四圖所示,係為本創作之立體外觀圖、檢測治具與測試機台之立體分解圖、測試機台之立體分解圖及測試機台另一視角之立體分解圖,由圖中所示可以清楚看出,本創作係包括檢測治具1及測試機台2,其中:該檢測治具1為具有檢測裝置11,並於檢測裝置11一側電性連接有檢測部111,再於檢測裝置11另側處設有對接結構12,其具有一基部121,並於基部121表面二側處凸設有至少一根限位柱1211,再於基部121上、下二側處分別凸設有側板1212,且側板1212上設有至少一個導引槽122,其導引槽122開口122 1朝遠離測試機台2方向形成有傾斜狀之滑移通道1222,而滑移通道1222相鄰測試機台2一側處設有抵持面1223,且滑移通道1222末端處設有定位槽1224,再於基部121之二側板1212間設有與檢測裝置11形成電性連接之插接模組13,且插接模組13具有縱向間隔排列之複數連接器131。 Please refer to the first, second, third and fourth figures, which are the three-dimensional appearance of the creation, the three-dimensional exploded view of the test fixture and the test machine, the three-dimensional exploded view of the test machine and the other perspective of the test machine. The three-dimensional exploded view, as can be clearly seen from the figure, includes a detecting fixture 1 and a testing machine 2, wherein the detecting fixture 1 has a detecting device 11 and is electrically connected to the detecting device 11 side. A detecting portion 111 is connected to the detecting device 11, and a mating structure 12 is disposed on the other side of the detecting device 11. The base portion 121 has a base portion 121, and at least one limiting post 1211 is protruded from two sides of the surface of the base portion 121, and then the base portion 121 is disposed on the base portion 121. The side plate 1212 is respectively protruded from the lower two sides, and the side plate 1212 is provided with at least one guiding groove 122, and the guiding groove 122 opening 122 1 is formed with a slanting sliding channel 1222 away from the testing machine 2, and a sliding groove 1222 is provided with a resisting surface 1223 adjacent to the testing machine 2, and a positioning groove is provided at the end of the sliding channel 1222. 1224, a plug-in module 13 electrically connected to the detecting device 11 is disposed between the two side plates 1212 of the base portion 121, and the plug-in module 13 has a plurality of connectors 131 arranged longitudinally.
該測試機台2為具有一基架21,並於基架21相對二側處設有滑移結構22之導軌221,且各導軌221上活動樞設有可呈橫向往復位移之軌道222,再於二軌道222相對內側處設有至少一個滑動體223,而滑移結構22之軌道222一側處設有使其產生橫向往復位移之驅動裝置224,再於基架21內部設有對接模組23,且對接模組23具有縱向間隔排列之複數連接埠231,並於複數連接埠231一側處為可利用傳輸線(圖中未示出)來電性連接有測試儀器24。 The test machine 2 is a guide rail 221 having a base frame 21 and a sliding structure 22 at opposite sides of the base frame 21, and each of the guide rails 221 is pivotally provided with a track 222 which can be laterally reciprocally displaced, and then At least one sliding body 223 is disposed on the opposite inner side of the two rails 222, and a driving device 224 for causing lateral reciprocating displacement is disposed on one side of the rail 222 of the sliding structure 22, and a docking module is disposed inside the base frame 21 23, and the docking module 23 has a plurality of ports 231 arranged longitudinally spaced apart, and a test instrument 24 is electrically connected to the side of the plurality of ports 231 for use with a transmission line (not shown).
上述測試機台2之基架21表面二側處為穿設有至少一個定位孔211,且基架21位於一側定位孔211上、下二側處分別設有滑移孔212,再於基架21一側壁面設有剖槽213,而剖槽213上設有供偵測至少一個滑動體223是否位於導引槽122開口1221處之感測裝置214,其感測裝置214一側設有至少一個透孔2141,並於透孔2141內穿過有供鎖設於剖槽213內壁面處之螺絲2142,而該滑移結構22之二軌道222一側處分別凸設有穿入滑移孔212內且供驅動裝置224帶動之插接塊2221,且該測試機台2之對接模組23二側處設有供活動穿入於定位孔211內之定位體232,再於定位體232內穿設有限位孔2321。 The base frame 21 of the testing machine 2 is provided with at least one positioning hole 211 at two sides of the surface of the base frame 21, and the base frame 21 is disposed on one side of the positioning hole 211, and the sliding holes 212 are respectively disposed at the lower two sides. The side wall of the frame 21 is provided with a slot 213, and the slot 213 is provided with a sensing device 214 for detecting whether the at least one sliding body 223 is located at the opening 1221 of the guiding slot 122. The at least one through hole 2141 passes through the screw 2142 for locking the inner wall surface of the slot 213 in the through hole 2141, and the two rails 222 of the sliding structure 22 are respectively convexly inserted and slipped. The insertion block 2221 is provided in the hole 212 and is driven by the driving device 224, and the positioning body 232 for moving through the positioning hole 211 is disposed at two sides of the docking module 23 of the testing machine 2, and then the positioning body 232 is disposed. The inner hole is provided with a limiting hole 2321.
再者,上述滑移結構22之導軌221較佳為可設置於基架21上、下二側處,其滑移結構22之導軌221位於基架21一側表面前方處間隔設有呈豎立狀之複數板體2211,並於其中二相鄰複數板體2211之間連設有至少一個固定桿2212,再於驅動裝置224一側為可透過皮帶與皮帶輪、齒輪與鏈條或齒輪組來連設有供樞接於複數板體2211上之傳動桿2241,且固定桿2212與傳動桿2241上活動樞設有隨著驅動裝置224帶動而產生橫向往復位移之滑動板225,而該滑動板225為可連接於複數插接塊2221上,以帶動二軌道222於導軌221上進行滑移。 Furthermore, the guide rail 221 of the sliding structure 22 is preferably disposed on the lower side of the base frame 21, and the guide rails 221 of the sliding structure 22 are vertically spaced apart from the front surface of the side surface of the base frame 21. The plurality of plates 2211 are connected with at least one fixing rod 2212 between the two adjacent plurality of plates 2211, and are connected to the pulley 338, the gear and the chain or the gear set on the side of the driving device 224. There is a transmission rod 2241 pivotally connected to the plurality of plates 2211, and the fixed rod 2212 and the transmission rod 2241 are pivotally disposed with a sliding plate 225 which is laterally reciprocally displaced as the driving device 224 drives, and the sliding plate 225 is It can be connected to the plurality of plug blocks 2221 to drive the two rails 222 to slide on the rails 221.
然而,上述測試機台2之基架21表面上為間隔設有供與驅動裝置224形成電性連接之第一感測器215及第二感測器216,並於第一感測器215及第二感測器216表面上分別凹設有第一感測槽2151及第二感測槽2161,而該滑移結構22之滑動板225上設有供感測元件226,其感測元件226一側設有供進入第一感測槽2151或第二感測槽2161內,以使驅動裝置224停止運作之凸板2261,再於感測元件226另側設有至少一個通孔2262,而至少一個通孔2262中穿設有使感測元件226鎖固於滑動板225上之鎖固元件2263。 However, the first sensor 215 and the second sensor 216 are electrically connected to the driving device 224 on the surface of the base 21 of the testing machine 2, and are disposed on the first sensor 215 and A first sensing slot 2151 and a second sensing slot 2161 are respectively recessed on the surface of the second sensor 216. The sliding plate 225 of the sliding structure 22 is provided with a sensing component 226, and the sensing component 226 One side is provided with a convex plate 2261 for entering the first sensing groove 2151 or the second sensing groove 2161 to stop the driving device 224, and at least one through hole 2262 is provided on the other side of the sensing element 226, and A locking element 2263 for locking the sensing element 226 to the sliding plate 225 is disposed in the at least one through hole 2262.
另外,上述插接模組13之複數連接器131與對接模組23之複數連接埠231可為相對型式之複數母座連接器與複數公頭連接器,且該滑移結構22之驅動裝置224可為直流馬達、交流馬達、步進馬達或伺服馬達等。 In addition, the plurality of connectors 231 of the plurality of connectors 131 and the docking module 23 of the plug module 13 can be a plurality of mating female connectors and a plurality of male connectors, and the driving device 224 of the sliding structure 22 It can be a DC motor, an AC motor, a stepper motor or a servo motor.
請參閱第五、六、七、八、九圖所示,係為本創作檢測治具與測試機台組裝前之局部側視剖面圖、檢測治具與測試機台組裝前之局部立體外觀圖、檢測治具與測試機台組裝時之局部側視剖面圖、檢測治具與測試機台組裝時之局部立體外觀圖及檢測治具與測試機台組裝後之局部側視剖面圖,由圖中可清楚看出,本創作之檢測治具1與測試機台2欲進行電性連接作業時,係先將檢測治具1擺放到預設啟動位置處,即使測試機台2滑移結構22之至少一個滑動體223置入於檢測治具1對接結構12之至少一個導引槽122開口1221處,此時,該對接結構12基部121表面之複數限位柱1211便會穿入至對接模組23二側定位體232之限位孔2321中呈一限位,且待基架21一側之感測裝置214傳輸訊號來告知檢測治具1確實擺放到預設啟動位置處後,便可啟動滑移結構22之驅動裝置224,以透過驅動裝置224之傳動桿2241來帶動滑動板225產生橫向位移,進而利用滑動板225來使二軌道222一側之複數插接塊2221於基架21之複數滑移孔212中位移,藉此使二軌道222可於二導軌221中進行橫向位移之動作。 Please refer to the fifth, sixth, seventh, eighth and ninth diagrams for the partial side view of the creation test fixture and the test machine before assembly, and the partial stereoscopic appearance of the test fixture and the test machine before assembly. a partial side cross-sectional view of the test fixture and the test machine assembly, a partial stereoscopic appearance view of the test fixture and the test machine assembly, and a partial side cross-sectional view of the test fixture and the test machine assembled, It can be clearly seen that when the test fixture 1 and the test machine 2 are to be electrically connected, the test fixture 1 is first placed at the preset starting position, even if the test machine 2 is slipped. At least one sliding body 223 of the base 12 of the detecting structure 1 is inserted into the opening 1221 of the guiding groove 122 of the docking structure 12, and the plurality of limiting posts 1211 of the surface of the base portion 121 of the docking structure 12 are inserted into the docking The limiting hole 2321 of the two-position positioning body 232 of the module 23 is in a limit position, and the sensing device 214 on the side of the base frame 21 transmits a signal to inform the detecting fixture 1 that it is actually placed at the preset starting position. The driving device 224 of the sliding structure 22 can be activated to drive through the drive The transmission rod 2241 of the 224 drives the sliding plate 225 to generate a lateral displacement, and the sliding plate 225 is used to displace the plurality of insertion blocks 2221 on the side of the two rails 222 in the plurality of sliding holes 212 of the base frame 21, thereby making the two tracks The 222 can perform a lateral displacement action in the two guide rails 221.
而該滑移結構22之二軌道222於二導軌221中橫向位移的過程中,其滑移結構22感測元件226之凸板2261即會從基架21第一感測器215之第一感測槽2151中脫離,並往基架21之第二感測器216方向移動,同時,該滑移結構22之至少一個滑動體223便會隨著二軌道222的橫向位移,而沿著導引槽122之滑移通道1222滑移,然而,由於滑移通道1222為朝遠離測試機台2方向呈傾斜狀,所以至少一個滑動體223即會抵壓滑移通道1222一側之抵 持面1223,進而將檢測治具1朝測試機台2方向推移,且待滑移結構22之至少一個滑動體223通過導引槽122之滑移通道1222後,則會嵌入於導引槽122之定位槽1224內呈一定位,同時使檢測治具1插接模組13之複數連接器131對接於測試機台2對接模組23之複數連接埠231處,藉此使檢測治具1與測試機台2形成電性連接狀態。 During the lateral displacement of the two tracks 222 of the sliding structure 22 in the two guide rails 221, the convex plate 2261 of the sensing component 226 of the sliding structure 22 will have a first sense from the first sensor 215 of the base frame 21. The slot 2151 is disengaged and moved toward the second sensor 216 of the base frame 21, and at least one of the sliding bodies 223 of the sliding structure 22 is displaced along with the lateral displacement of the two rails 222. The sliding channel 1222 of the groove 122 slips. However, since the sliding channel 1222 is inclined toward the test machine 2, at least one sliding body 223 can resist the side of the sliding channel 1222. The holding surface 1223, and then the detecting jig 1 is moved in the direction of the testing machine 2, and at least one sliding body 223 of the to-be-sliding structure 22 passes through the sliding channel 1222 of the guiding groove 122, and then is embedded in the guiding groove 122. The positioning slot 1224 is positioned in a position, and the plurality of connectors 131 of the detecting fixture 1 is connected to the plurality of connectors 231 of the docking module 23 of the testing machine 2, thereby enabling the detecting fixture 1 and The test machine 2 is in an electrically connected state.
而上述檢測治具1朝測試機台2方向移動的過程中,該基部121表面之複數限位柱1211則會持續穿入至複數定位體232之限位孔2321中呈一限位,以避免推移檢測治具1產生偏移之情況,且該滑移結構22之至少一個滑動體223嵌入於導引槽122之定位槽1224內呈一定位時,其感測元件226之凸板2261即會同時進入至第二感測器216之第二感測槽2161中,以停止使用滑移結構22之驅動裝置224,藉以使檢測治具1與測試機台2完成之電性連接作業。 During the movement of the detecting fixture 1 toward the testing machine 2, the plurality of limiting posts 1211 on the surface of the base portion 121 are continuously penetrated into the limiting holes 2321 of the plurality of positioning bodies 232 to be in a limit position to avoid When the displacement detecting fixture 1 is offset, and at least one sliding body 223 of the sliding structure 22 is embedded in the positioning slot 1224 of the guiding slot 122, the convex plate 2261 of the sensing component 226 is At the same time, the second sensing slot 2161 of the second sensor 216 is inserted to stop the driving device 224 of the sliding structure 22, so that the detecting fixture 1 and the testing machine 2 are electrically connected.
且當檢測治具1之插接模組13對接於測試機台2之對接模組23處,以使檢測治具1與測試機台2形成電性連接狀態後,即可將外部電路板(圖中未示出)置放於檢測治具1檢測裝置11上方之檢測部111上進行各類的檢測作業,以透過插接模組13之複數連接器131與對接模組23之複數連接埠231來將檢測裝置11檢測之訊號傳輸至測試機台2之測試儀器24,再利用測試儀器24來得知檢測結果。 And when the plug module 13 of the test fixture 1 is docked to the docking module 23 of the test machine 2, so that the test fixture 1 and the test machine 2 are electrically connected, the external circuit board can be The detection unit 111 placed above the detection device 11 of the detection jig 1 performs various types of detection operations to pass through the plurality of connectors 131 of the plug-in module 13 and the plurality of docking modules 23. 231, the signal detected by the detecting device 11 is transmitted to the testing device 24 of the testing machine 2, and the testing device 24 is used to know the detection result.
且待檢測完畢後,若使用者欲更換不同型式、規格的外部電路板與檢測治具1時,係可再次啟動滑移結構22之驅動裝置224,以反向帶動驅動裝置224之傳動桿2241,進而使滑移結構22之二軌道222朝反向位移,藉以帶動滑移結構22之至少一個滑動體223 朝至少一個導引槽122開口1221方向滑移,以及同時使感測元件226之凸板2261從第二感測器216之第二感測槽2161中脫離,且待至少一個滑動體223位於至少一個導引槽122開口1221處時,其第一感測器215之第一感測槽2151中即會感測到感測元件226之凸板2261進入,以停止啟動滑移結構22之驅動裝置224,此時,該檢測治具1之插接模組13為與測試機台2之對接模組23未呈電性連接,進而使檢測治具1與測試機台2呈分開狀態,而使用者便可替換另一檢測治具1,再將另一檢測治具1依據前述之結合方式與測試機台2組裝為一體。 After the detection is completed, if the user wants to replace the external circuit board and the detecting fixture 1 of different types and specifications, the driving device 224 of the sliding structure 22 can be activated again to reversely drive the driving rod 2241 of the driving device 224. And causing the two rails 222 of the sliding structure 22 to be displaced in the reverse direction, thereby driving at least one sliding body 223 of the sliding structure 22 Sliding toward the opening 1221 of the at least one guiding slot 122, and simultaneously disengaging the convex plate 2261 of the sensing element 226 from the second sensing slot 2161 of the second sensor 216, and at least one sliding body 223 is located at least When a guiding slot 122 is opened at the opening 1221, the first sensing slot 2151 of the first sensor 215 senses that the convex plate 2261 of the sensing component 226 enters to stop the driving device of the starting sliding structure 22. 224. At this time, the plug-in module 13 of the detecting jig 1 is not electrically connected to the docking module 23 of the testing machine 2, and the detecting jig 1 is separated from the testing machine 2, and is used. The other test fixture 1 can be replaced, and the other test fixture 1 can be assembled with the test machine 2 in accordance with the aforementioned combination.
本創作為具有下列之優點: This creation has the following advantages:
(一)該檢測治具1與測試機台2為可透過對接結構12及滑移結構22來使插接模組13自動與對接模組23形成電性連接狀態,即不需藉由人工的方式來進行對接作業,以具有省時、省力之效果,且欲拆離檢測治具1與測試機台2時,僅需再次藉由對接結構12及滑移結構22,便可自動拆離檢測治具1與測試機台2,進而節省時間、人力,並達到輕易、快速更換之效用。 (1) The test fixture 1 and the test machine 2 are permeable to the docking structure 12 and the sliding structure 22, so that the plug module 13 is automatically electrically connected to the docking module 23, that is, without manual The method of performing the docking operation has the effect of saving time and labor, and when the test fixture 1 and the test machine 2 are to be detached, the docking structure 12 and the slip structure 22 can be used again to automatically detach the detection. Fixture 1 and test machine 2, which saves time and manpower, and achieves the effect of easy and quick replacement.
(二)該檢測治具1之插接模組13為具有複數連接器131,而該測試機台2之對接模組23具有複數連接埠231,其插接模組13與對接模組23形成電性連接時,是利用複數連接器131來與複數連接埠231進行電性插接,故不需用額外的傳輸線進行連接,因此可節省檢測治具1與測試機台2間的連接時間,且更換不同的檢測治具1時,僅需直接將檢測治具1與測試機台2分離,便可使檢測治具1之插接模 組13與測試機台2之對接模組23脫離,以方便替換不同的檢測治具1,進而達到節省時間、快速更換之效果。 (2) The plug-in module 13 of the test fixture 1 has a plurality of connectors 131, and the docking module 23 of the test machine 2 has a plurality of ports 231, and the plug-in module 13 and the docking module 23 are formed. In the electrical connection, the plurality of connectors 131 are electrically connected to the plurality of ports 231, so that no additional transmission lines are needed for connection, thereby saving the connection time between the detecting jig 1 and the testing machine 2. When the different test fixtures 1 are replaced, it is only necessary to directly separate the test fixture 1 from the test machine 2, so that the test fixture 1 can be inserted into the mold. The group 13 is separated from the docking module 23 of the testing machine 2 to facilitate replacement of different detecting fixtures 1, thereby achieving the effect of saving time and quick replacement.
(三)該對接結構12之基部121表面二側處為凸設有至少一根限位柱1211,其限位柱1211為穿設於對接模組23二側定位體232之限位孔2321中呈一限位,即可透過限位柱1211來避免推移檢測治具1產生偏移之情況,進而使檢測治具1之插接模組13與測試機台2之對接模組23準確對接,以避免產生接觸不良的狀況,影響測試時的數據與結果。 (3) at least two limiting posts 1211 are protruded from the two sides of the base portion 121 of the docking structure 12, and the limiting posts 1211 are disposed in the limiting holes 2321 of the two positioning bodies 232 of the docking module 23. In the case of a limit position, the position detection column 1 can be prevented from being offset by the limit column 1211, and the docking module 13 of the test fixture 1 and the docking module 23 of the test machine 2 can be accurately docked. To avoid poor contact conditions, affect the data and results of the test.
上述詳細說明為針對本創作一種較佳之可行實施例說明而已,惟該實施例並非用以限定本創作之申請專利範圍,凡其它未脫離本創作所揭示之技藝精神下所完成之均等變化與修飾變更,均應包含於本創作所涵蓋之專利範圍中。 The above detailed description is intended to illustrate a preferred embodiment of the present invention, and is not intended to limit the scope of the present invention, and other equivalents and modifications may be made without departing from the spirit of the invention. Changes are to be included in the scope of patents covered by this creation.
綜上所述,本創作上述檢測治具與測試機台之聯結機構於使用時,為確實能達到其功效及目的,故本創作誠為一實用性優異之創作,為符合新型專利之申請要件,爰依法提出申請,盼 審委早日賜准本案,以保障創作人之辛苦創作,倘若 鈞局審委有任何稽疑,請不吝來函指示,創作人定當竭力配合,實感德便。 In summary, the creation of the above-mentioned detection jig and the test machine linkage mechanism can really achieve its efficacy and purpose when used. Therefore, the creation is a practical and excellent creation, and is in conformity with the application requirements of the new patent.爰Proposing an application in accordance with the law, I hope that the trial committee will grant this case as soon as possible to protect the creators' hard work. If there is any doubt in the arbitral tribunal, please do not hesitate to give instructions, the creators will try their best to cooperate and feel good.
1‧‧‧檢測治具 1‧‧‧Test fixture
11‧‧‧檢測裝置 11‧‧‧Detection device
111‧‧‧檢測部 111‧‧‧Detection Department
12‧‧‧對接結構 12‧‧‧ docking structure
121‧‧‧基部 121‧‧‧ base
1211‧‧‧限位柱 1211‧‧‧Limited column
1212‧‧‧側板 1212‧‧‧ side panels
122‧‧‧導引槽 122‧‧‧ guiding slot
1221‧‧‧開口 1221‧‧‧ openings
1222‧‧‧滑移通道 1222‧‧‧Slip channel
1223‧‧‧抵持面 1223‧‧‧Resistance
1224‧‧‧定位槽 1224‧‧‧ positioning slot
13‧‧‧插接模組 13‧‧‧Docking module
131‧‧‧連接器 131‧‧‧Connector
2‧‧‧測試機台 2‧‧‧Testing machine
21‧‧‧基架 21‧‧‧ pedestal
213‧‧‧剖槽 213‧‧‧ slotting
214‧‧‧感測裝置 214‧‧‧Sensing device
215‧‧‧第一感測器 215‧‧‧first sensor
216‧‧‧第二感測器 216‧‧‧Second sensor
22‧‧‧滑移結構 22‧‧‧Sliding structure
221‧‧‧導軌 221‧‧‧rail
2211‧‧‧板體 2211‧‧‧ board
2212‧‧‧固定桿 2212‧‧‧Fixed rod
222‧‧‧軌道 222‧‧‧ Track
2221‧‧‧插接塊 2221‧‧‧ plug block
224‧‧‧驅動裝置 224‧‧‧ drive
2241‧‧‧傳動桿 2241‧‧‧Drive rod
225‧‧‧滑動板 225‧‧‧Sliding plate
226‧‧‧感測元件 226‧‧‧Sensor components
232‧‧‧定位體 232‧‧‧ Positioning body
2321‧‧‧限位孔 2321‧‧‧Limited holes
24‧‧‧測試儀器 24‧‧‧Testing equipment
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Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109490680A (en) * | 2019-01-02 | 2019-03-19 | 珠海市运泰利自动化设备有限公司 | A kind of mechanism for testing of PCBA Male head connector |
TWI692282B (en) * | 2018-05-18 | 2020-04-21 | 鴻勁精密股份有限公司 | Electronic component working equipment with mounting adjustment mechanism |
CN111122920A (en) * | 2019-12-30 | 2020-05-08 | 富士康(昆山)电脑接插件有限公司 | Tool for loading chip module |
-
2017
- 2017-06-13 TW TW106208548U patent/TWM549353U/en not_active IP Right Cessation
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI692282B (en) * | 2018-05-18 | 2020-04-21 | 鴻勁精密股份有限公司 | Electronic component working equipment with mounting adjustment mechanism |
CN109490680A (en) * | 2019-01-02 | 2019-03-19 | 珠海市运泰利自动化设备有限公司 | A kind of mechanism for testing of PCBA Male head connector |
CN109490680B (en) * | 2019-01-02 | 2024-03-19 | 珠海市运泰利自动化设备有限公司 | Test mechanism of PCBA male connector |
CN111122920A (en) * | 2019-12-30 | 2020-05-08 | 富士康(昆山)电脑接插件有限公司 | Tool for loading chip module |
CN111122920B (en) * | 2019-12-30 | 2022-02-25 | 富士康(昆山)电脑接插件有限公司 | Tool for loading chip module |
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