TWM527543U - Probe card assembly - Google Patents
Probe card assembly Download PDFInfo
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- TWM527543U TWM527543U TW105206900U TW105206900U TWM527543U TW M527543 U TWM527543 U TW M527543U TW 105206900 U TW105206900 U TW 105206900U TW 105206900 U TW105206900 U TW 105206900U TW M527543 U TWM527543 U TW M527543U
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- adjustable
- circuit board
- probe card
- card assembly
- support
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Abstract
Description
本創作是關於一種探針卡總成,特別是有關於一種含有可調式支撐組件的探針卡總成。 This creation relates to a probe card assembly, and more particularly to a probe card assembly having an adjustable support assembly.
請參照第1圖,其顯示一種習知探針卡總成1之剖視圖。該習知探針卡總成1包含一電路板10、一加固件30及一支撐組件50。該加固件30是設置於該電路板10上,該加固件30的一區域具有一裸露該電路板10的開孔。該支撐組件50是設置於該開孔中的該電路板10上,該支撐組件50與該加固件30之間具有一間距。該支撐組件50包含一支撐件501、至少三個螺絲模板502(screw plate)、複數個墊片503及一支撐體504。該支撐體504是夾設於該支撐件501與該電路板10之間,且位於該撐件501的中心位置。該至少三個螺絲模板502是設置於該電路板10上,且圍繞該支撐體504。該等墊片503是夾設於該支撐件501與該至少三個螺絲模板502之間。 Referring to Figure 1, a cross-sectional view of a conventional probe card assembly 1 is shown. The conventional probe card assembly 1 includes a circuit board 10, a reinforcement 30, and a support assembly 50. The stiffener 30 is disposed on the circuit board 10, and an area of the stiffener 30 has an opening through which the circuit board 10 is exposed. The support assembly 50 is disposed on the circuit board 10 in the opening, and the support assembly 50 has a spacing from the reinforcement 30. The support assembly 50 includes a support member 501, at least three screw plates 502, a plurality of spacers 503, and a support body 504. The support body 504 is sandwiched between the support member 501 and the circuit board 10 and is located at a central position of the support member 501. The at least three screw templates 502 are disposed on the circuit board 10 and surround the support body 504. The spacers 503 are sandwiched between the support member 501 and the at least three screw templates 502.
然而,該習知探針卡總成1具有以下缺點: However, the conventional probe card assembly 1 has the following disadvantages:
(1)使用墊片503調整會產生新的間隙D:將該支撐件501組裝上該習知探針卡總成1後,會利用墊片503將該支撐件501調整到水平線A的高度。但是當間隙值小於墊片503的厚度時,會產生無法由墊片503補足的空間。 (1) Adjustment using the spacer 503 generates a new gap D: After the support member 501 is assembled with the conventional probe card assembly 1, the support member 501 is adjusted to the height of the horizontal line A by the spacer 503. However, when the gap value is smaller than the thickness of the spacer 503, a space which cannot be filled by the spacer 503 is generated.
(2)該支撐件501無法與上方的測試機台(圖中未示)平行:該支撐件501的水平與否會影響該習知探針卡總成1的測試良率,所以需將該支撐件501調整與該測試機台平行(亦即,調整至水平線A)。若產生無法由墊片503補足的間隙,會讓該支撐件501無法調整到與該測試機台平行的理想水平。 (2) The support member 501 cannot be parallel to the upper test machine (not shown): the level of the support member 501 affects the test yield of the conventional probe card assembly 1, so it is necessary to The support member 501 is adjusted in parallel with the test machine (i.e., adjusted to the horizontal line A). If a gap is created that cannot be filled by the spacer 503, the support member 501 cannot be adjusted to an ideal level parallel to the test machine.
(3)無法確認該支撐體504完全抵靠於該電路板10:由於該電路板10的上表面為不規則面,在該支撐體504未完全抵靠於該電路板10上時會產生間隙,使力量無法有效地傳遞至該支撐件501。 (3) It cannot be confirmed that the support body 504 is completely abutted against the circuit board 10: since the upper surface of the circuit board 10 is an irregular surface, a gap is generated when the support body 504 does not completely abut against the circuit board 10. The force cannot be effectively transmitted to the support member 501.
(4)無法觀測調整情況:由於該支撐件501覆蓋於該支撐體504上,當使用墊片503調整該支撐件501與該至少三個螺絲模板502之間的間隙時無法觀測該支撐體504是否完全抵靠於該電路板10上。 (4) The adjustment condition cannot be observed: since the support member 501 covers the support body 504, the support body 504 cannot be observed when the gap between the support member 501 and the at least three screw templates 502 is adjusted using the spacer 503. Whether it is completely against the circuit board 10.
因此,有必要提供一種新穎的探針卡總成結構,以解決先前技術所存在的問題。 Therefore, it is necessary to provide a novel probe card assembly structure to solve the problems of the prior art.
有鑑於此,本創作目的在於提供一種探針卡總成,其是藉由微調該探針卡總成中的可調式支撐組件中的至少一可調式中柱及至少三個可調式側柱的Z軸,使得該探針卡總成中的一加固件與該可調式支撐組件處於同一水平線,從而提升該探針卡總成的測試良率。 In view of this, the present invention aims to provide a probe card assembly by fine-tuning at least one adjustable center pillar and at least three adjustable side pillars of the adjustable support assembly in the probe card assembly. The Z-axis causes a stiffener in the probe card assembly to be at the same level as the adjustable support assembly, thereby increasing the test yield of the probe card assembly.
為達成上述目的,本創作提供一種探針卡總成,其包含:一電路板; 一探針頭,固定於該電路板的底側,該探針頭具有以一微細間距(fine pitch)設置的多個探針固持於其內;一加固件(stiffener),設置於該電路板上,該加固件的一區域具有一裸露該電路板的開孔;以及一可調式支撐組件,設置於該開孔中的該電路板上,該可調式支撐組件與該加固件之間具有一間距,該可調式支撐組件包含:一支撐件(backer);至少一可調式中柱,設置於該支撐件與該電路板之間且位於該支撐件的中心位置;以及至少三個可調式側柱,設置於該支撐件與該電路板之間且圍繞該至少一可調式中柱。 In order to achieve the above object, the present invention provides a probe card assembly comprising: a circuit board; a probe head fixed to a bottom side of the circuit board, the probe head having a plurality of probes disposed at a fine pitch held therein; a stiffener disposed on the circuit board An area of the reinforcing member has an opening for exposing the circuit board; and an adjustable supporting assembly is disposed on the circuit board in the opening, and the adjustable supporting assembly and the reinforcing member have a The adjustable support assembly comprises: a backer; at least one adjustable center post disposed between the support and the circuit board and located at a center of the support; and at least three adjustable sides a post disposed between the support and the circuit board and surrounding the at least one adjustable center pillar.
在本創作的一實施例中,該探針頭的位置對應於該開孔的中心位置。 In an embodiment of the present creation, the position of the probe head corresponds to the center position of the opening.
在本創作的一實施例中,該至少一可調式中柱的上端是連接於該支撐件。 In an embodiment of the present invention, the upper end of the at least one adjustable center pillar is coupled to the support.
在本創作的一實施例中,該至少一可調式中柱的下端是抵靠於該電路板。 In an embodiment of the present invention, the lower end of the at least one adjustable center pillar is abutted against the circuit board.
在本創作的一實施例中,該至少一可調式中柱和該電路板之間更包含一支撐體(supporter),該支撐體的下表面是抵靠於該電路板。 In an embodiment of the present invention, the at least one adjustable center pillar and the circuit board further comprise a supporter, and the lower surface of the support body abuts against the circuit board.
在本創作的一實施例中,該至少三個可調式側柱的上端及下端分別連接於該支撐件及該電路板。 In an embodiment of the present invention, the upper end and the lower end of the at least three adjustable side posts are respectively connected to the support member and the circuit board.
在本創作的一實施例中,該至少一可調式中柱具有至少一第 一調整機構,該至少一第一調整機構是位於該至少一可調式中柱的上端及中間段的至少之一者。 In an embodiment of the present invention, the at least one adjustable center pillar has at least one An adjustment mechanism, the at least one first adjustment mechanism being at least one of an upper end and an intermediate section of the at least one adjustable center pillar.
在本創作的一實施例中,位於該至少一可調式中柱的上端的該第一調整機構是裸露於該支撐件的上表面。 In an embodiment of the present invention, the first adjustment mechanism at the upper end of the at least one adjustable center post is exposed to an upper surface of the support member.
在本創作的一實施例中,該至少三個可調式側柱具有至少一第二調整機構,該至少一第二調整機構是位於該至少三個可調式側柱的上端、中間段及下端的至少之一者。 In an embodiment of the present invention, the at least three adjustable side pillars have at least one second adjustment mechanism, and the at least one second adjustment mechanism is located at an upper end, a middle section, and a lower end of the at least three adjustable side pillars. At least one of them.
在本創作的一實施例中,位於該至少三個可調式側柱的上端的該第二調整機構是裸露於該支撐件的上表面。 In an embodiment of the present invention, the second adjustment mechanism at the upper end of the at least three adjustable side posts is exposed to the upper surface of the support.
在本創作的一實施例中,位於該至少三個可調式側柱的下端的該第二調整機構是裸露於該電路板的下表面。 In an embodiment of the present creation, the second adjustment mechanism at the lower end of the at least three adjustable side posts is exposed to a lower surface of the circuit board.
在本創作的一實施例中,該可調式支撐組件包含至少八個可調式側柱。 In an embodiment of the present author, the adjustable support assembly includes at least eight adjustable side posts.
相較於先前技術,本創作是提供一種探針卡總成,其是藉由微調該可調式支撐組件中的該至少一可調式中柱及該至少三個可調式側柱的Z軸,使得該可調式支撐組件與該加固件處於同一水平線,從而提升該探針卡總成的測試良率。 Compared with the prior art, the present invention provides a probe card assembly by fine-tuning the Z-axis of the at least one adjustable center pillar and the at least three adjustable side pillars in the adjustable support assembly. The adjustable support assembly is at the same level as the reinforcement, thereby increasing the test yield of the probe card assembly.
1‧‧‧習知探針卡總成 1‧‧‧Finding probe card assembly
2‧‧‧探針卡總成 2‧‧‧ Probe card assembly
10‧‧‧電路板 10‧‧‧ boards
20‧‧‧探針頭 20‧‧‧Probe head
30‧‧‧加固件 30‧‧‧Firmware
40‧‧‧可調式支撐組件 40‧‧‧Adjustable support assembly
50‧‧‧支撐組件 50‧‧‧Support components
201‧‧‧探針 201‧‧‧ probe
301‧‧‧開孔 301‧‧‧Opening
401‧‧‧支撐件 401‧‧‧Support
402‧‧‧可調式中柱 402‧‧‧Adjustable center column
403‧‧‧可調式側柱 403‧‧‧Adjustable side column
404‧‧‧支撐體 404‧‧‧Support
501‧‧‧支撐件 501‧‧‧Support
502‧‧‧螺絲模板 502‧‧‧screw template
503‧‧‧墊片 503‧‧‧shims
504‧‧‧支撐體 504‧‧‧Support
A‧‧‧水平線 A‧‧‧ horizontal line
D‧‧‧間隙 D‧‧‧ gap
G‧‧‧間距 G‧‧‧ spacing
第1圖係習知探針卡總成之剖視圖。 Figure 1 is a cross-sectional view of a conventional probe card assembly.
第2圖係本創作一實施例中探針卡總成之立體上視圖。 Figure 2 is a perspective top view of the probe card assembly in one embodiment of the present invention.
第3圖係本創作一實施例中探針卡總成之立體下視圖。 Figure 3 is a perspective bottom view of the probe card assembly of one embodiment of the present invention.
第4圖係沿第2圖之A-A剖面線所取之剖視圖。 Figure 4 is a cross-sectional view taken along line A-A of Figure 2;
為詳細說明本創作之技術內容、構造特徵、所達成目的及功效,以下茲舉例並配合圖式詳予說明。 In order to explain in detail the technical content, structural features, goals and effects of the present invention, the following is a detailed description with reference to the drawings.
請參閱第2-4圖,第2圖為本創作一實施例中探針卡總成2之立體上視圖;第3圖為本創作一實施例中探針卡總成2之立體下視圖;第4圖為沿第2圖之A-A剖面線所取之剖視圖。該探針卡總成2包括一電路板10、一探針頭20、一加固件30及一可調式支撐組件40。 Please refer to FIG. 2-4, FIG. 2 is a perspective top view of the probe card assembly 2 according to an embodiment of the present invention; FIG. 3 is a perspective bottom view of the probe card assembly 2 according to an embodiment of the present invention; Figure 4 is a cross-sectional view taken along line AA of Figure 2; The probe card assembly 2 includes a circuit board 10, a probe head 20, a stiffener 30, and an adjustable support assembly 40.
該探針頭20是固定於該電路板10的底側。該探針頭20具有以一微細間距(fine pitch)設置的多個探針201固持於其內。該加固件30是設置於該電路板10上。該加固件30的中間區域具有一裸露該電路板10的開孔301。該探針頭20的位置是對應於該開孔301的中心位置。該可調式支撐組件40是設置於該開孔301中的該電路板10上。該可調式支撐組件40與該加固件30之間具有一間距G。 The probe head 20 is fixed to the bottom side of the circuit board 10. The probe head 20 has a plurality of probes 201 disposed at a fine pitch and held therein. The stiffener 30 is disposed on the circuit board 10. The intermediate portion of the stiffener 30 has an opening 301 that exposes the circuit board 10. The position of the probe head 20 corresponds to the center position of the opening 301. The adjustable support assembly 40 is disposed on the circuit board 10 in the opening 301. The adjustable support assembly 40 and the stiffener 30 have a spacing G therebetween.
該可調式支撐組件40包含一支撐件401、一可調式中柱402、八個可調式側柱403及一支撐體404。該支撐件401是一板狀體。該支撐體404是夾設於該支撐件401與該電路板10之間,且位於該支撐件401的中心位置。該可調式中柱402的上端和該等可調式側柱403的上端與下端皆為調整機構。該調整機構是一具有十字槽的螺絲頭,其可藉由十字螺絲起子進行Z軸的微調。 The adjustable support assembly 40 includes a support member 401, an adjustable center post 402, eight adjustable side posts 403, and a support body 404. The support member 401 is a plate-like body. The support body 404 is sandwiched between the support member 401 and the circuit board 10 and is located at a center position of the support member 401. The upper end of the adjustable center pillar 402 and the upper end and the lower end of the adjustable side pillars 403 are adjustment mechanisms. The adjustment mechanism is a screw head having a cross recess which can be finely adjusted by the Phillips screwdriver.
該可調式中柱402的上端是埋設於該支撐件401中,該可調式中柱402的下端是鎖固於該支撐體404,且該可調式中柱402的上端的該調整 機構是裸露於該支撐件401的上表面。該可調式中柱402是位於該支撐件401的中心位置。在此,藉由十字螺絲起子旋轉該可調式中柱402的上端的該調整機構可以調整該支撐體404的下表面抵靠於該電路板10上。 The upper end of the adjustable center pillar 402 is embedded in the support member 401. The lower end of the adjustable center pillar 402 is locked to the support body 404, and the adjustment of the upper end of the adjustable center pillar 402 is performed. The mechanism is exposed to the upper surface of the support member 401. The adjustable center post 402 is located at a center position of the support member 401. Here, the adjustment mechanism of the upper end of the adjustable center pillar 402 is rotated by a Phillips screwdriver to adjust the lower surface of the support body 404 against the circuit board 10.
該等可調式側柱403是由上半部的螺帽和下半部的螺絲組合構成。該螺帽的上端是埋設於該支撐件401中,該螺絲則是由下而上地穿透該電路板10,而相互地組合。位於該等可調式側柱403的上端(亦即,該螺帽的上端)及下端(亦即,該螺絲的下端)的該調整機構是分別裸露於該支撐件401的上表面及該電路板10的下表面。該等可調式側柱403是圍繞該可調式中柱402。 The adjustable side posts 403 are composed of a combination of a nut of the upper half and a screw of the lower half. The upper end of the nut is embedded in the support member 401, and the screws penetrate the circuit board 10 from bottom to top and are combined with each other. The adjusting mechanism at the upper end of the adjustable side post 403 (ie, the upper end of the nut) and the lower end (ie, the lower end of the screw) are respectively exposed on the upper surface of the support member 401 and the circuit board The lower surface of 10. The adjustable side posts 403 surround the adjustable center post 402.
如上所述,本創作的探針卡總成2係藉由微調該可調式支撐組件40中的該可調式中柱402及該等可調式側柱403的Z軸,使得該可調式支撐組件40與該加固件30處於同一水平線。因此,本創作具有可穩定抵靠於測試機台而提升該探針卡總成2的測試良率、不產生多餘間隙、確保該支撐體404完全抵靠於該電路板10及可觀測調整狀態等優點。 As described above, the probe card assembly 2 of the present invention is such that the adjustable support member 40 is fine-tuned by adjusting the Z-axis of the adjustable center post 402 and the adjustable side posts 403 in the adjustable support assembly 40. It is at the same level as the reinforcement 30. Therefore, the present invention has the ability to stably abut the test machine to improve the test yield of the probe card assembly 2, without generating excessive gaps, ensuring that the support body 404 is completely abutted against the circuit board 10 and the observable adjustment state. Etc.
雖然本創作已用較佳實施例揭露如上,然其並非用以限定本創作,本創作所屬技術領域中具有通常知識者,在不脫離本創作之精神和範圍內,當可作各種之更動與潤飾,因此本創作之保護範圍當視後附之申請專利範圍所界定者為準。 Although the present invention has been disclosed in the above preferred embodiments, it is not intended to limit the present invention, and those skilled in the art can make various changes without departing from the spirit and scope of the present invention. Retouching, therefore, the scope of protection of this creation is subject to the definition of the scope of the patent application attached.
10‧‧‧電路板 10‧‧‧ boards
20‧‧‧探針頭 20‧‧‧Probe head
30‧‧‧加固件 30‧‧‧Firmware
40‧‧‧可調式支撐組件 40‧‧‧Adjustable support assembly
201‧‧‧探針 201‧‧‧ probe
301‧‧‧開孔 301‧‧‧Opening
401‧‧‧支撐件 401‧‧‧Support
402‧‧‧可調式中柱 402‧‧‧Adjustable center column
403‧‧‧可調式側柱 403‧‧‧Adjustable side column
404‧‧‧支撐體 404‧‧‧Support
G‧‧‧間距 G‧‧‧ spacing
Claims (10)
Priority Applications (1)
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TW105206900U TWM527543U (en) | 2016-05-12 | 2016-05-12 | Probe card assembly |
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TW105206900U TWM527543U (en) | 2016-05-12 | 2016-05-12 | Probe card assembly |
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TWM527543U true TWM527543U (en) | 2016-08-21 |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
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TWI610080B (en) * | 2016-05-12 | 2018-01-01 | 中華精測科技股份有限公司 | Probe card assembly |
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2016
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
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TWI610080B (en) * | 2016-05-12 | 2018-01-01 | 中華精測科技股份有限公司 | Probe card assembly |
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