TWM507579U - Semiconductor device packaging system - Google Patents

Semiconductor device packaging system Download PDF

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Publication number
TWM507579U
TWM507579U TW104202158U TW104202158U TWM507579U TW M507579 U TWM507579 U TW M507579U TW 104202158 U TW104202158 U TW 104202158U TW 104202158 U TW104202158 U TW 104202158U TW M507579 U TWM507579 U TW M507579U
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Taiwan
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carrier
head
colloid
injection
injection head
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TW104202158U
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Chinese (zh)
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qing-song Ding
Jian-Hua Zhang
Dong Wei
Ming-ming WANG
Zhen-Yu Li
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Advanced Semiconductor Eng
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Publication of TWM507579U publication Critical patent/TWM507579U/en

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
    • H01L24/75Apparatus for connecting with bump connectors or layer connectors

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  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Spray Control Apparatus (AREA)
  • Die Bonding (AREA)

Description

半導體器件封裝系統Semiconductor device packaging system

本創作大體上係關於晶片封裝,更具體言之,係關於晶粒結合(die bonding)。This creation is generally related to wafer packaging, and more specifically to die bonding.

半導體器件之製造過程通常包括將晶粒附著或結合至基板上之步驟。附著或結合步驟之一個目的係產生晶粒與基板之間的牢固物理結合。已有不同晶粒附著方法,如共熔方法、焊接方法及黏合方法。黏合方法因為其經濟性且適於流水線操作而得到廣泛應用。The fabrication process of a semiconductor device typically includes the step of attaching or bonding the die to the substrate. One purpose of the attachment or bonding step is to create a strong physical bond between the die and the substrate. There are different methods of grain attachment, such as eutectic methods, welding methods, and bonding methods. The bonding method is widely used because of its economy and suitable for pipeline operation.

在傳統晶粒結合製程中,採用塗佈頭與基板或引線框架近距離地流體接觸之方式,藉由塗佈頭之虹吸作用及毛細作用將膠體塗佈於基板或引線框架上。膠體之塗佈量(體積)受到塗佈頭與基板或引線框架之間的距離之影響,距離稍遠則塗佈量較多,距離稍近則塗佈量較少。由於流水線之起伏、基板或引線框架之翹曲等各種不理想之因素,導致每一次之膠體塗佈量不穩定,從而影響晶粒結合之品質乃至成品半導體器件之良率,降低生產效率。In the conventional die bonding process, the colloid is applied to the substrate or the lead frame by the siphon action and capillary action of the coating head by means of fluid contact of the coating head with the substrate or the lead frame at a close distance. The coating amount (volume) of the colloid is affected by the distance between the coating head and the substrate or the lead frame. When the distance is slightly longer, the coating amount is large, and when the distance is slightly, the coating amount is small. Due to various undesired factors such as fluctuations in the pipeline, warpage of the substrate or the lead frame, the amount of colloid coating per time is unstable, thereby affecting the quality of the grain bonding and the yield of the finished semiconductor device, and reducing the production efficiency.

本創作之一個目的在於提供一種半導體器件封裝系統,以改良晶粒結合之品質。One object of the present invention is to provide a semiconductor device packaging system to improve the quality of die bonding.

在一個實施例中,提供一種用於製作半導體器件之系統,該系統包括:噴注頭,其經組態以向載體上噴注熱固性膠體;裝配頭,其經組態以將半導體晶粒經由該熱固性膠體貼合至該載體上。該載體例 如但不限於引線框架或印刷電路板。In one embodiment, a system for fabricating a semiconductor device is provided, the system comprising: a jetting head configured to inject a thermoset colloid onto a carrier; a mounting head configured to pass the semiconductor die via The thermoset colloid is applied to the carrier. Carrier example Such as but not limited to lead frames or printed circuit boards.

在一個實施例中,系統亦包括傳送器,其經組態以傳送該載體。In one embodiment, the system also includes a transmitter configured to transmit the carrier.

在一個實施例中,系統亦包括影像感測器,其經組態以偵測該載體之位置。In one embodiment, the system also includes an image sensor configured to detect the position of the carrier.

在一個實施例中,系統亦包括控制器,其經組態以控制該噴注頭及裝配頭之動作。In one embodiment, the system also includes a controller configured to control the action of the injection head and the assembly head.

在一個實施例中,該噴注頭包括腔室以容納該熱固性膠體,該腔室之容積在0.1至200立方毫米之範圍內。In one embodiment, the injection head includes a chamber to accommodate the thermoset colloid, the volume of the chamber being in the range of 0.1 to 200 cubic millimeters.

在一個實施例中,噴注頭中之該腔室呈圓筒形,其內徑在0.01毫米至2毫米之範圍內,其高度在0.02毫米至100毫米之範圍內。In one embodiment, the chamber in the injection head has a cylindrical shape with an inner diameter in the range of 0.01 mm to 2 mm and a height in the range of 0.02 mm to 100 mm.

在一個實施例中,系統亦包括支撐結構以支撐該噴注頭及裝配頭。In one embodiment, the system also includes a support structure to support the injection head and the assembly head.

10‧‧‧系統10‧‧‧System

12‧‧‧噴注頭12‧‧‧Injection head

14‧‧‧感測器14‧‧‧Sensor

15a‧‧‧載體15a‧‧‧Vector

15b‧‧‧載體15b‧‧‧Vector

15c‧‧‧載體15c‧‧‧ Carrier

16‧‧‧裝配頭16‧‧‧Assembled head

18‧‧‧感測器18‧‧‧ Sensor

20‧‧‧控制器20‧‧‧ Controller

25‧‧‧傳送器25‧‧‧transmitter

26‧‧‧箭頭26‧‧‧ arrow

28‧‧‧外殼28‧‧‧Shell

結合附圖,將更易於理解以下關於本創作之較佳實施例之詳細說明。本創作係以舉例之方式說明,然並未受限於附圖,附圖中類似之附圖標記指示相似之元件。The detailed description of the preferred embodiments of the present invention will be more readily understood from the accompanying drawings. The present invention is illustrated by way of example, and is not limited by the accompanying drawings.

圖1表示用於製作半導體器件之系統10之立體結構示意圖;圖2表示系統10中噴注頭12之局部剖面示意圖。1 shows a schematic perspective view of a system 10 for fabricating a semiconductor device; and FIG. 2 shows a partial cross-sectional view of the injection head 12 of the system 10.

附圖之詳細說明意在作為本創作之當前較佳實施例之說明,而非意在表示本創作能夠得以實現之僅有形式。應理解,相同或等同之功能可以由意在包含於本創作之精神及範圍內之不同實施例完成。The detailed description of the drawings is intended to be illustrative of the preferred embodiments of the present invention and is not intended to It is to be understood that the same or equivalent functions may be carried out in various embodiments that are intended to be included within the spirit and scope of the present invention.

如圖1所示,系統10包括控制器20、噴注頭12、裝配頭16、影像感測器14及18、傳送器25及外殼28。為了清楚地表示其他部件,外殼28以虛線表示。外殼28通常作為其他部件之支撐結構,並且能夠起到 防塵等作用。噴注頭12、裝配頭16、影像感測器14及18可通信地耦合至控制器20,並在控制器20之控制下操作。傳送器25可以為例如圖中所示之傳送帶,大體上沿著箭頭26所指之方向前進,傳送例如但不限於引線框架或印刷電路板之載體15。圖中表示三個載體15a、15b及15c,其中每個載體15包含數個呈矩陣排列之載體單元。傳送器25受控間歇性地使載體15停止前進以便於噴膠頭12及裝配頭16對載體進行相應操作。As shown in FIG. 1, system 10 includes a controller 20, a jetting head 12, a mounting head 16, image sensors 14 and 18, a conveyor 25, and a housing 28. In order to clearly show other components, the outer casing 28 is indicated by a broken line. The outer casing 28 is generally used as a support structure for other components and can Dustproof and other functions. The injector head 12, the assembly head 16, the image sensors 14 and 18 are communicatively coupled to the controller 20 and operate under the control of the controller 20. The conveyor 25 can be, for example, a conveyor belt as shown in the figures, generally advanced in the direction indicated by arrow 26, carrying a carrier 15 such as, but not limited to, a lead frame or printed circuit board. Three carriers 15a, 15b and 15c are shown, wherein each carrier 15 comprises a plurality of carrier units arranged in a matrix. The conveyor 25 is controlled to intermittently stop the carrier 15 to facilitate the corresponding operation of the carrier by the glue head 12 and the assembly head 16.

影像感測器14經組態以偵測載體15之位置,根據偵測到之位置,噴注頭12受控而藉由活塞之運動向載體上噴注熱固性膠體。影像感測器18經組態以偵測經過噴膠之載體15之位置,根據偵測到之位置,裝配頭16受控而將半導體晶粒貼合至熱固性膠體上。在操作中,對載體定位時,可以採用單顆載體單元定位方法,除此之外,影像感測器14及18亦可藉由區域定位之方式對載體定位。噴膠頭12及裝配頭16操作時係根據區域定位結果在該區域範圍內進行操作,當對第一個載體單元操作後,根據載體上之載體單元之間的固定間距跳轉至下一個載體單元進行操作,直至該區域內之載體單元全部操作完畢,則再次藉由影像感測器對下一個區域進行定位。圖中表示尚未噴注膠體之載體15a、己經噴注了膠體但尚未貼合晶粒之載體15b及已經貼合了晶粒之載體15c。之後,完成晶粒貼合之載體可以被送入烘箱加熱固化。通常,噴注頭12中包括一個管狀腔室來容納膠體,該腔室之容積即限定了每一次噴注之膠體之體積。噴注頭12利用氣體及機械運動完成膠體噴注動作。因此,在流水線操作中,每一次膠體施加之量得以保持穩定,從而保證晶粒結合之品質,提高成品半導體器件之良率,提高生產效率,降低成本。The image sensor 14 is configured to detect the position of the carrier 15, and based on the detected position, the injection head 12 is controlled to inject a thermosetting colloid onto the carrier by the movement of the piston. The image sensor 18 is configured to detect the position of the glued carrier 15, and based on the detected position, the assembly head 16 is controlled to attach the semiconductor die to the thermoset colloid. In operation, when positioning the carrier, a single carrier unit positioning method may be employed. In addition, the image sensors 14 and 18 may also position the carrier by means of regional positioning. The glue head 12 and the assembly head 16 operate in the region according to the regional positioning result, and after the operation of the first carrier unit, jump to the next carrier unit according to the fixed spacing between the carrier units on the carrier. The operation is performed until the carrier unit in the area is completely operated, and the next area is again positioned by the image sensor. The figure shows a carrier 15a to which a colloid has not been injected, a carrier 15b which has been sprayed with a colloid but has not been bonded to a crystal grain, and a carrier 15c which has been bonded with crystal grains. Thereafter, the carrier that completes the die attach can be sent to an oven for heat curing. Typically, the injection head 12 includes a tubular chamber for receiving the colloid, the volume of which defines the volume of the gel that is injected each time. The jetting head 12 uses a gas and mechanical motion to complete the colloidal injection action. Therefore, in the pipeline operation, the amount of colloid applied per time is kept stable, thereby ensuring the quality of the die bonding, improving the yield of the finished semiconductor device, improving the production efficiency, and reducing the cost.

影像感測器14及18除了用於偵測載體15之位置,亦可用來偵測操作品質,如感測器14用於偵測噴膠之品質,影像感測器18用來偵測 晶粒貼合品質。In addition to detecting the position of the carrier 15, the image sensors 14 and 18 can also be used to detect the operation quality. For example, the sensor 14 is used to detect the quality of the glue, and the image sensor 18 is used for detecting. Die bonding quality.

圖2表示噴注頭12之局部剖面示意圖,斜線陰影部分表示剖面之實心部分。管狀腔室可以呈圓筒形,其具有內徑D及高度H。內徑D通常在0.01毫米至2毫米之範圍內,高度H通常在0.02毫米至100毫米之範圍內,腔室之容積通常在0.1至200立方毫米之範圍內。較小之內徑D較有利於膠體噴注量之精確控制。噴注頭12可以設置為可拆卸式的,可以更換不同規格之噴注頭以適應不同需要。Fig. 2 is a partial cross-sectional view showing the injection head 12, and the hatched portion indicates the solid portion of the cross section. The tubular chamber may have a cylindrical shape with an inner diameter D and a height H. The inner diameter D is usually in the range of 0.01 mm to 2 mm, the height H is usually in the range of 0.02 mm to 100 mm, and the volume of the chamber is usually in the range of 0.1 to 200 mm 3 . The smaller inner diameter D is more conducive to the precise control of the amount of colloidal injection. The injection head 12 can be configured to be detachable, and different sizes of injection heads can be replaced to suit different needs.

雖然圖1所示實施例中,噴注頭12及裝配頭16被示為容納於同一個外殼28內,熟習此項技術者將容易理解,噴注程序及晶粒貼合程序可以分離,噴注頭及裝配頭亦可以分別整合於兩個獨立之子系統內,由各自獨立之控制器所控制。Although the injection head 12 and the assembly head 16 are shown as being housed in the same housing 28 in the embodiment shown in FIG. 1, those skilled in the art will readily appreciate that the injection procedure and the die attach procedure can be separated and sprayed. The injector and assembly heads can also be integrated into two separate subsystems, controlled by separate controllers.

在另一個實施例中,用於製作半導體器件之系統包括噴注頭、裝配頭、固定平台及傳送機械手等。固定平台用於置放載體以供噴注頭及裝配頭進行操作。傳送機械手用於在固定平台上傳送載體。In another embodiment, a system for fabricating a semiconductor device includes an inkjet head, a mounting head, a fixed platform, a transfer robot, and the like. The fixed platform is used to place the carrier for operation by the injection head and the assembly head. A transfer robot is used to transport the carrier on a fixed platform.

在一個實施例中,噴注頭之支撐結構包括大體上垂直於傳送帶之前進方向之懸軌,噴注頭附著於該懸軌上之機械臂,從而能夠受控地沿著懸軌之方向來回移動。噴注頭所附著之機械臂亦可設置為能夠沿著傳送帶之長度方向做短距離之移動,此可藉由懸吊於懸軌之上且與懸軌方向垂直之輔助懸軌來實現。In one embodiment, the support structure of the injection head includes a suspension rail that is substantially perpendicular to the forward direction of the conveyor belt, and the injection head is attached to the robot arm on the suspension rail so as to be controllable back and forth along the direction of the suspension rail mobile. The robot arm to which the injection head is attached may also be arranged to be able to move a short distance along the length of the conveyor belt, which can be achieved by an auxiliary suspension rail suspended above the suspension rail and perpendicular to the direction of the suspension rail.

在一個實施例中,一個機械臂上可以附著多個噴注頭,從而可以一次對多個載體或者一個載體上之多個區域(例如但不限於一個引線框架上之多個晶粒承載盤)進行噴注。各噴注頭之間的距離與載體上之噴注區域相匹配。In one embodiment, a plurality of injection heads may be attached to one robot arm so that a plurality of carriers or a plurality of regions on one carrier (such as but not limited to a plurality of die carriers on one lead frame) may be used at a time. Spray. The distance between the injection heads matches the injection area on the carrier.

儘管已經闡明及描述了本創作之不同實施例,但本創作並不限於此等實施例。僅在某些請求項或實施例中出現之技術特徵並不意味著不能與其他請求項或實施例中之其他特徵相結合以實現有益之新技 術方案。在不背離如申請專利範圍所描述之本創作之精神及範圍的情況下,許多修改、改變、變形、替代及等同對於熟習此項技術者而言係明顯的。Although various embodiments of the present work have been illustrated and described, the present work is not limited to such embodiments. Technical features that appear only in certain claims or embodiments are not meant to be combined with other claims or other features in the embodiments to achieve beneficial new techniques. Program. Many modifications, changes, variations, substitutions and equivalents will be apparent to those skilled in the art without departing from the scope of the invention.

10‧‧‧系統10‧‧‧System

12‧‧‧噴注頭12‧‧‧Injection head

14‧‧‧感測器14‧‧‧Sensor

15a‧‧‧載體15a‧‧‧Vector

15b‧‧‧載體15b‧‧‧Vector

15c‧‧‧載體15c‧‧‧ Carrier

16‧‧‧裝配頭16‧‧‧Assembled head

18‧‧‧感測器18‧‧‧ Sensor

20‧‧‧控制器20‧‧‧ Controller

25‧‧‧傳送器25‧‧‧transmitter

26‧‧‧箭頭26‧‧‧ arrow

28‧‧‧外殼28‧‧‧Shell

Claims (7)

一種半導體器件封裝系統,其特徵在於,該系統包括:傳送器,其經組態以傳送載體;噴注頭,其經組態以向該載體上噴注熱固性膠體;裝配頭,其經組態以將半導體晶粒貼合至該已噴注熱固性膠體之載體上,且其中該半導體晶粒係經由該熱固性膠體貼合至該載體上;及控制器,其與該噴注頭及裝配頭耦接且經組態以控制該噴注頭及該裝配頭之動作。 A semiconductor device package system, the system comprising: a transmitter configured to transport a carrier; a jetting head configured to inject a thermoset colloid onto the carrier; a mounting head configured And bonding a semiconductor die to the carrier of the injected thermosetting colloid, wherein the semiconductor die is attached to the carrier via the thermosetting colloid; and a controller coupled to the injection head and the assembly head It is configured and controlled to control the action of the injection head and the assembly head. 如請求項1之系統,其特徵在於,亦包括影像感測器,該影像感測器經組態以偵測該載體之位置。 The system of claim 1 further comprising an image sensor configured to detect the location of the carrier. 如請求項1之系統,其特徵在於,該噴注頭包括腔室以容納該熱固性膠體,該腔室之容積在0.1至200立方毫米之範圍內。 A system according to claim 1, characterized in that the injection head comprises a chamber for accommodating the thermosetting colloid, the volume of the chamber being in the range of 0.1 to 200 cubic millimeters. 如請求項3之系統,其特徵在於,該腔室呈圓筒形,其內徑在0.01毫米至2毫米之範圍內,其高度在0.02毫米至100毫米之範圍內。 The system of claim 3, wherein the chamber has a cylindrical shape with an inner diameter in the range of 0.01 mm to 2 mm and a height in the range of 0.02 mm to 100 mm. 如請求項1之系統,其特徵在於,亦包括支撐結構以支撐該噴注頭及裝配頭。 A system according to claim 1, further comprising a support structure for supporting the injection head and the assembly head. 如請求項1之系統,其特徵在於,該載體為引線框架或印刷電路板。 A system according to claim 1, characterized in that the carrier is a lead frame or a printed circuit board. 一種半導體器件封裝系統,其特徵在於,該系統包括:固定平台,經組態以置放該載體;傳送機械手,其經組態以在該固定平台上傳送該載體;噴注頭,其經組態以向該載體上噴注熱固性膠體;裝配頭,其經組態以將半導體晶粒貼合至該已噴注熱固性膠 體之載體上,且其中該半導體晶粒係經由該熱固性膠體貼合至該載體上;及控制器,其與該噴注頭及該裝配頭耦接且經組態以控制該噴注頭及該裝配頭之動作。A semiconductor device package system, the system comprising: a fixed platform configured to place the carrier; a transfer robot configured to transport the carrier on the fixed platform; and a jetting head Configuring to inject a thermoset colloid onto the carrier; a mounting head configured to attach the semiconductor die to the injected thermoset adhesive On the carrier of the body, and wherein the semiconductor die is attached to the carrier via the thermosetting colloid; and a controller coupled to the injection head and the assembly head and configured to control the injection head and The action of the assembly head.
TW104202158U 2014-04-03 2015-02-10 Semiconductor device packaging system TWM507579U (en)

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