TWM507511U - Uniform light source correction device suitable for microscopic high spectral system - Google Patents

Description

Uniform light source correction device for microscopic hyperspectral systems

This creation is related to the correction of the light source; in particular, a uniform light source correction device suitable for microscopic hyperspectral systems.

In an ideal situation, the light source sub-conversion efficiency of each pixel of the camera should be the same, but in fact each pixel has different response efficiency and sensitivity to light, and the frequency response of the light for different bands It is also different, and in order to correct the difference between each pixel, the uneven photosensitive phenomenon of each pixel is corrected. In other words, in order to make each pixel appear the same grayscale value, we need to provide a uniform light source everywhere. Test and correct camera components.

In the field of microscopic hyperspectral imaging systems, in order to capture the correct spectral data and image data, the need for a uniform light source is particularly important. However, the correction light source system used in the conventional micro-spectral system has the disadvantage of being difficult to locate in the operation of correcting and positioning due to its structural design defects. In addition, barium sulfate (BaSO) is used in the material selection of the conventional integrating sphere. ₄ ) Although it has the advantage of low cost, it is easy to peel off and generate debris in practical application, which directly affects the cleanliness of the microscope, and has many defects.

In view of this, the purpose of this creation is to provide a uniform light source calibration device suitable for microscopic hyperspectral systems, suitable for microscopic hyperspectral systems. It provides a uniform light source with high uniformity and is easy to operate and easy to position.

In order to achieve the above objective, the present invention provides a uniform light source calibration device suitable for use in a microscopic hyperspectral system, which is used in conjunction with an optical microscope that receives light emitted by a light source and emits light. The output is homogenized; the uniform light source correction device includes an integrating sphere and a correction sheet. The integrating sphere has an entrance port and a light exit port, and a spherical cavity is formed inside the integrating sphere; the light entrance port and the light exit port respectively communicate with the spherical cavity; the light source is incident on the light through the light entrance port. The light is diffused and reflected in the spherical cavity, and is emitted at the light exiting opening; the correcting sheet has a high light transmittance and is detachably disposed on the light exiting opening of the integrating sphere.

The effect of the present invention is that the uniform light source correcting device can effectively make the focal plane of the objective lens of the optical microscope focus on the optimal light-emitting surface of the integrating sphere, and therefore, can be used evenly when applied to the microscopic hyperspectral system. A uniform light source with a degree of more than 99% is corrected.

100‧‧‧Uniform light source correction device

10‧‧·score ball

12‧‧‧ housing

122‧‧‧Upper shell

124‧‧‧lower shell

126‧‧‧ grip

128‧‧‧ lamp holder mounting hole

12a‧‧‧Light outlet

14‧‧‧Cylinder

142‧‧‧ upper half

142a‧‧‧ gap

144‧‧‧ lower half

144a‧‧‧ gap

14a‧‧‧Into the light port

14b‧‧‧Light outlet

16‧‧‧ Groove

20‧‧‧correcting fixture

22‧‧‧floor

22a‧‧‧Opening

22b‧‧‧Long slot

22c‧‧‧ Periphery

24‧‧‧Hosting

24a‧‧‧ slotted

26‧‧‧Bumps

30‧‧‧ calibration film

200‧‧‧Light microscope

210‧‧‧stage

210a‧‧‧ openings

220‧‧‧ objective lens

230‧‧‧ eyepiece

L‧‧‧ halogen lamp

S‧‧‧ spherical cavity

BRIEF DESCRIPTION OF THE DRAWINGS Figure 1 is a side elevational view of a preferred embodiment of a uniform light source correction device applied to an optical microscope.

Figure 2 is a partial exploded view of the uniform light source correction device of the present invention.

Figure 3 is a partial exploded view of the integrating sphere of the present creation.

Figure 4 is a top view of the calibration sheet of the present creation.

Fig. 5 is a cross-sectional view showing the uniform light source correcting device of the present invention combined with the base.

In order to explain the present invention more clearly, the preferred embodiment will be described in detail with reference to the accompanying drawings. Referring to FIG. 1 , a uniform light source suitable for the micro hyperspectral system is created according to a preferred embodiment of the present invention. A schematic diagram of the calibration apparatus 100 used in conjunction with an optical microscope 200, and in the present embodiment, the optical microscope 200 is exemplified by an inverted microscope. The uniform light source calibration device 100 is placed on the stage 210 of the optical microscope 200. The uniform light source calibration device 100 can receive the light emitted by a light source and homogenize the light to output. The detailed structure of the uniform light source correction device 100 will be described later.

2 and FIG. 3, the uniform light source calibration apparatus 100 includes an integrating sphere 10, a calibration fixture 20, and a calibration sheet 30. Wherein: the integrating sphere 10 comprises a casing 12 and a cylinder 14. The housing 12 is assembled from an upper casing 122 and a lower casing 124, and has an accommodating space therein. The bottom of the lower casing 124 has a light exiting opening 12a communicating with the accommodating space, and the lower casing 124 is connected to the casing 12. A grip 126 is conveniently held by a user to lift or move the integrating sphere 10. In addition, the lower case 124 has a socket mounting hole 128 for mounting a light source.

The cylinder 14 is made of a material of polytetrafluoroethylene and has high reflectance and resistance to short-wavelength light. The cylinder 14 can be divided into an upper half 142 and a lower half 144; the upper half 142 is hollowed out with an upper hemispherical cavity and has an upper notch 142a; the inside of the lower half 144 The hollowed out cavity has a lower hemisphere cavity, and has a lower notch 144a and a light exit port 14b. Therefore, after the upper half 142 is combined with the lower half 144, a spherical cavity S surrounded by the upper hemisphere cavity and the lower hemisphere cavity is formed inside the cylinder 14 (FIG. 5). Reference); The upper notch 142a is in contact with the lower notch 144a to form an optical entrance 14a, and the optical entrance 14a and the optical opening 14b are respectively connected to the spherical cavity S.

After the cylinder 14 is placed in the accommodating space of the casing 12, the light-in port 14a is a socket mounting hole 128 for the casing 12; the light-emitting port 14b is directly facing the light-emitting port of the casing. 12a, therefore, light can be incident on the spherical cavity S of the cylinder 14 from the socket mounting hole 128 and the light entrance opening 14a, and after being diffusely reflected in the spherical cavity S, The light exit ports 14b and 12a are emitted. Further, a baffle 146 is further disposed at the lower notch 144a of the lower half portion 144. The baffle 146 is used to prevent light from being incident from the light entrance opening 14a and directly emitted toward the light exit opening 14b.

The calibration fixture 20 includes a bottom plate 22 and a carrier 24. The bottom plate 22 has an opening 22a and a long slot 22b. The long slot 22b communicates with the opening 22a. The bottom plate 22 is a magnetic bottom plate that is magnetically attracted to the stage 210. In other embodiments, it may be fixed to the stage 210 as a lock, and is not limited thereto. The carrier 24 is detachably disposed on the opening 22a of the bottom plate 22. The carrier 24 has a recess 24a for the correction piece 30 to be embedded therein.

The calibration sheet 30 has a high light transmittance, and is made of a glass material in the present embodiment, and may be made of other materials such as plastics in other applications, and is not limited thereto. Referring to FIG. 4, one of the surfaces of the calibration sheet is textured, and the texture is assisted by the user to perform correction using the uniform light source correction device 100. When the objective lens 220 of the optical microscope 200 is moved, the user can have a focus target, in other words, when the focal plane of the objective lens 220 is adjusted to be coplanar with the textured surface of the correction sheet 30, the correction sheet 30 can be clearly seen. Texture on.

Please refer to FIG. 1 , FIG. 2 and FIG. 5 , the flow of the uniform light source calibration device of the present invention can be roughly divided into the following steps:

1. The bottom plate 22 is placed on the stage 210 of the optical microscope 200, and the opening 22a of the bottom plate 22 is aligned with the opening 210a at the center of the stage 210.

2. The carrier 24 in which the correction piece 30 is embedded is placed at the opening 22a of the bottom plate 22.

3. The integrating sphere 10 is placed on the bottom plate 22, and a groove 16 at the bottom of the integrating sphere 10 is fitted to a peripheral edge 22c of the bottom plate 22, and the surface of the integrating sphere 10 abuts against the bottom plate. A bump 26 of 22 is provided to assist in positioning the integrating sphere 10 on the bottom plate 22. When the integrating sphere 10 is placed on the bottom plate 22, the textured surface of the correcting piece 30 embedded in the carrier 24 will be coplanar with the cut surface at which the spherical cavity S and the light exit opening 14b communicate.

4. A halogen lamp L is mounted on the socket mounting hole 128 such that light emitted by the halogen lamp L is incident from the light entrance opening 14a. Therefore, the light emitted by the halogen lamp L can be diffused and reflected in the spherical cavity S of the integrating sphere 10, and then uniformly emitted from the light exit opening 14b. Among them, the halogen lamp L is the aforementioned light source.

5. Adjusting the objective lens 220 of the optical microscope 200 to focus, and observing by the eyepiece 230 whether the texture of the correction sheet 30 can be clearly seen. If the texture is clearly visible, it indicates that the focal plane of the objective lens 220 has been successfully adjusted to The correction sheet 30 has a surface coplanar with the texture.

6. The integrating sphere 10 is removed from the bottom plate 22, and the carrier 24 in which the correction sheet 30 is embedded is removed. The long slot 22b of the bottom plate 22 is designed to facilitate the removal of the carrier 24 for the convenience of the user's fingers.

7. Fix the integrating sphere 10 to the bottom plate 22. At this time, after the focal plane of the objective lens 220 is adjusted, the spherical cavity S has been And the cut surface of the light exit port is coplanar, in other words, the focal plane of the objective lens 220 has been adjusted to the optimal light exit surface of the integrating sphere 10, and an optimal uniform light source can be received.

Therefore, the uniform light source correcting device has a corresponding foolproof design on the integrating sphere and the calibration jig, and can facilitate the user to handle the alignment of the uniform light source correcting device and the optical microscope; through the carrier and the correction The design of the film can further assist the user to focus the focal plane of the objective lens precisely on the optimal light-emitting surface of the integrating sphere, and can be corrected by using a uniform light source with a uniformity of more than 99%.

It is worth mentioning that, because the integral sphere of this creation is made of polytetrafluoroethylene (PTFE), it is not easy to produce debris, so it is especially suitable for use in microscope systems with high cleanliness requirements. In addition, PTFE has the property of being able to withstand ultraviolet light, and therefore, it is suitable for use in a microscopic hyperspectral system with a wide optical spectrum.

The above is only a preferred embodiment of the present invention, and equivalent changes to the scope of the present application and the scope of the patent application are intended to be included in the scope of the present patent.

100‧‧‧Uniform light source correction device

10‧‧·score ball

12a‧‧‧Light outlet

126‧‧‧ grip

128‧‧‧ lamp holder mounting hole

16‧‧‧ Groove

20‧‧‧correcting fixture

22‧‧‧floor

22a‧‧‧Opening

22b‧‧‧Long slot

22c‧‧‧ Periphery

24‧‧‧Hosting

24a‧‧‧ slotted

26‧‧‧Bumps

30‧‧‧ calibration film

210‧‧‧stage

210a‧‧‧ openings

Claims (7)

A uniform light source calibration device suitable for use in a microscopic hyperspectral system is used in conjunction with an optical microscope that receives light emitted by a light source and homogenizes the light for output; the uniform light source correction device includes An integrating sphere having an entrance opening and an exit opening, wherein the integrating sphere is internally formed with a spherical cavity; the optical entrance and the optical outlet are respectively connected to the spherical cavity; the light source is incident from the optical entrance Light, which is diffused and reflected in the spherical cavity, is emitted at the light exit port; and a calibration sheet has a high light transmittance, and the calibration piece is detachably disposed at the light exit of the integrating sphere . A uniform light source correcting device according to claim 1, wherein a surface of the correcting sheet is textured; and the surface of the correcting sheet having a texture is coplanar with a plane of the spherical cavity and the light exit opening. The uniform light source correcting device of claim 1, wherein the integrating sphere is made of polytetrafluoroethylene. The uniform light source correcting device of claim 1, further comprising a correction jig comprising a bottom plate and a carrier; the bottom plate is respectively connected to the integrating sphere, and is connected to one of the microscope stages, and the The bottom plate has an opening, the opening is an opening of the stage; the carrier is detachably disposed on the opening, and the carrier has a slot for the calibration piece to be embedded . The uniform light source correcting device according to claim 4, wherein the integrating sphere has a groove, and a groove surface of the groove is fitted to a circumference of the bottom plate. The uniform light source correcting device of claim 4, wherein the bottom plate has a bump that abuts against a surface of the integrating sphere. The uniform light source correcting device of claim 4, wherein the bottom plate further has a long slotted hole communicating with the opening.