TWM501667U - Probe-type connector structure - Google Patents

Description

Probe connector structure

The present invention relates to a connector, and more particularly to a probe connector structure that is easy to solder a circuit board.

The telescopic terminal is usually disposed on the side of the battery installation space, the power supply installation space or the electronic component installation space in the electronic product, and is mainly electrically connected to the battery or the power supply unit, etc., to provide electrical energy for the electronic product, or to electrically connect the electronic component. For transmitting high frequency signals to electronic products.

The conventional telescopic terminal mainly comprises a sleeve, a thimble and a spring. The sleeve is made of an insulating material, the thimble and the spring are made of a metal material, and the thimble is slid to the sleeve. The spring is mounted in the sleeve and abuts against the ejector pin to enable the battery, power supply unit or electronic component to form a conductive path with the thimble and the spring by crimping the ejector pin. Therefore, the electric energy or signal in the battery, the power supply unit or the electronic component can be transmitted to the electronic product through the conductive path.

However, since the conventional telescopic terminal is a coil spring and is made of a metal material, it is electrically connected to the thimble, so that the electric energy or signal of the battery, the power supply unit, or the electronic component passes through the spring, and an inductive effect occurs. High frequency power or high frequency signals cannot be effectively transmitted. Conventional thimbles and sleeves are not easy to manufacture, costly, and assembly time with the insulative body is time consuming, so that the application of the probe connector does not provide a better application method for the system, such as with connectors and cables or Board mating use.

Therefore, how to design a novel that can improve the above-mentioned defects is a major issue that the creators of this case want to solve.

The purpose of this creation is to provide a probe connector structure that conforms to high frequency signal transmission (or transmission of high frequency power), is structurally simple, and is easy to assemble.

To achieve the above object, the present invention provides a probe connector structure including an insulative housing, a plurality of probe assemblies, and a plurality of terminals. Each of the probe assemblies is respectively received in each receiving space, and includes a probe terminal, an insulating member, and an elastic member that provides an insulating member and a probe terminal to reciprocate in the corresponding receiving space. The probe terminal is provided with a pair of connecting sections and a guiding elastic arm section extending from the butting section toward the elastic element and the insulating member is connected between the abutting section and the elastic element. Each of the terminals is embedded in the connection portion and provided for each of the housing spaces. The guiding spring arm segments of the probe terminals can be correspondingly slidably connected to the respective terminals.

100‧‧‧Connector

1‧‧‧Insulating body

10‧‧‧Card block

11‧‧‧First containment space

11’‧‧‧Second containment space

112‧‧‧Perforation

12‧‧‧through slot

13‧‧‧Connecting Department

131‧‧ ‧ retaining wall

14‧‧‧ accommodating space

15‧‧‧Snap holes

16‧‧‧Knuckle arm

17‧‧‧Snap slot

18‧‧‧Snap bumps

19‧‧‧Snap slot

2‧‧‧First probe assembly

21‧‧‧ probe terminal

211‧‧‧ docking section

2111‧‧‧Exposed parts

212‧‧‧guided arm section

2121‧‧‧second bend

213‧‧‧First bend

22‧‧‧Insulation

224‧‧‧ 容容

225‧‧‧ Positioning Department

23‧‧‧Flexible components

3‧‧‧Second probe assembly

4, 4'‧‧‧ first terminal / second terminal

41, 41’ ‧ ‧ lead section

42, 42' ‧ ‧ welding department

5‧‧‧Metal casing

51‧‧‧Block

52‧‧‧ Positioning film

700‧‧‧ boards

7‧‧‧ solder pads

800‧‧‧Docking connector

8‧‧‧Docking Department

FIG. 1 is an exploded perspective view showing the probe connector of the present invention.

Figure 2 is an exploded perspective view of the assembled metal casing of Figure 1.

Figure 3 is a perspective view of Figure 2.

4 is a diagram showing a specific embodiment of the present probe assembly.

Figure 5 is a cross-sectional view showing the present probe connector.

FIG. 6 is a view showing the operation of the present probe connector before being connected to the circuit board and the mating connector, respectively.

FIG. 7 is a diagram showing the operation of the probe connector of the present invention after docking with the circuit board and the mating connector, respectively.

The detailed description and technical content of the present invention are described below with reference to the drawings, but the drawings are only for reference and explanation, and are not intended to limit the creation.

The present invention provides a probe connector structure, as shown in FIG. 1 to FIG. 3, for installation in an installation space (not shown) of an electronic device (not shown), such as a battery installation space and a power supply unit installation. One side of space or electronic component mounting space, etc. When the mating connector 800 (shown in FIG. 6 or FIG. 7), for example, a battery, a power supply unit, or an electronic component, is mounted in the installation space and correspondingly abuts the present probe connector 100, the docking connector 800 high frequency power or high frequency signals will be transmitted to the electronic device.

As shown in FIGS. 1, 4, and 5 and in conjunction with FIGS. 2 and 3, the present probe connector 100 includes an insulative housing 1, a plurality of (first) probe assemblies 2, and a plurality of terminals 4. As shown in FIG. 2, FIG. 3 and FIG. 5, a metal casing 5 is preferably further included. In the embodiment shown in FIG. 2, FIG. 3 and FIG. 5, a plurality of second probe assemblies 3 are further included as an example for description. The insulative housing 1 is provided with a plurality of receiving spaces 14 and a connecting portion 13 that partitions the receiving spaces 14 . Each of the accommodating spaces 14 further includes a plurality of first accommodating spaces 11 and a plurality of second accommodating spaces 11 ′ corresponding to the first accommodating spaces 11 , wherein the connecting portions 13 further communicate with the two ends of the insulating body 1 and are spaced apart from each of the first receiving spaces 11 . And each of the second receiving spaces 11'.

In the embodiment shown in FIG. 1, the insulative housing 1 further includes a snap block 10 that is combined with each other. The engaging block 10 is provided with a through slot 12 communicating with each of the first and second receiving spaces 11, 11' and a latching arm 16 projecting from both ends of the engaging block 10. The insulative housing 1 is provided with a latching slot 17 relative to the latching arm 16 for fastening to the latching block 10. Preferably, the buckle The slot 17 is further provided with a latching projection 18, and the latching arm 16 is provided with a latching hole 15 for engaging the latching projection 18. Further, the engaging block 10 is provided with a through hole 112 and a through groove 12 which communicate with each other, so that the first and second receiving spaces 11, 11' can communicate with the through groove 12.

Referring to FIG. 2 and FIG. 3 simultaneously, the insulative housing 1 of the probe connector 100 can also be sleeved with a metal outer casing 5. The metal shell 5 is provided with two corresponding flaps 51 at one end, and the snap grooves 19 on the two sides of the latching block 10 are correspondingly engaged, so that the metal shell 5 is relatively positioned with the latching block 10 and the insulative housing 1. The other end of the metal casing 5 is further provided with two positioning pieces 52 for being inserted on the mating circuit board (not shown).

As shown in FIG. 4, the first probe assembly 2 includes a probe terminal 21 (integrated stamped metal terminal), an insulating member 22, and an elastic member 23. As shown in FIG. 1 and FIG. 5 , each of the first probe assemblies 2 and the second probe assemblies 3 are identical to each other and symmetrically disposed in each of the first receiving spaces 11 and the second receiving spaces. Within 11'. In the present embodiment, only the first probe assembly 2 will be described as an example.

The probe terminal 21 includes a pair of connecting segments 211 and a guiding spring arm segment 212 extending from the direction of the elastic member 23 from abutting portion 211. In the embodiment shown in FIG. 4 and FIG. 5, the guiding spring arm segment 212 is connected to one end of the butting section 211 (ie, the position of the first bending portion 213) as an example for description. A first bent portion 213 is connected between the butting portion 211 of the probe terminal 21 and the guiding elastic arm segment 212. The guiding elastic arm segment 212 extends toward the connecting portion 13 via the first bent portion 213.

As shown in FIG. 4, the abutting portion 211 of the probe terminal 21 is fixed to the insulating member 22, wherein the fixing member 22 is fixed at a position close to one end of the mating portion 211 (ie, the first bent portion 213), so that the docking portion 211 is formed. There is a bare portion 2111 exposed from the insulating member 22 for electrical contact with the mating connector (not shown). The guiding elastic arm segment 212 of the aforementioned probe terminal 21 is more There is a second bent portion 2121, and the second bent portion 2121 is bent and extended from the first bent portion 213.

As shown in FIG. 5, the insulating member 22 is slidable in the first receiving space 11 and defines a receiving slot 224. The guiding elastic arm segment 212 (ie, the second bent portion 2121) can be elastically convex on the receiving slot 224. Start. The receiving groove 224 of the first probe assembly 2 and the receiving groove (not labeled) of the second probe assembly 3 are in communication with each other, so that the guiding elastic arm segments 212 of the probe terminal 21 are extended through the receiving groove 224 to the insulating member. Outside of 22.

In addition, the elastic member 23 is supported on the other end of the insulating member 22 opposite to the exposed portion 2111. In other words, the insulating member 22 is connected between the abutting portion 211 and the elastic member 23, so that the elastic members 23 can respectively provide the probe terminal 21 and the insulating portion. The member 22 reciprocates in the first and second housing spaces 11, 11'. Thereby, the exposed portion 2111 of the probe terminal 21 corresponds to and protrudes from the through hole 112 to extend into the through groove 12. In addition, one end of the insulating member 22 is integrally protruded with a positioning portion 225 for positioning with one end of the elastic member 23. In the embodiment of FIG. 5, the other end of the elastic member 23 can abut the bottom end of the corresponding first receiving space 11.

In the embodiment shown in FIG. 5, each of the first receiving spaces 11 further includes a blocking wall 131 capable of slidingly contacting one end of the insulating member 22, wherein the length of the insulating member 22 is greater than the length of the blocking wall 131. The needle assembly 2 is positionable and slidable within the first receiving space 11. Each of the terminals 4 is embedded in both side surfaces of the connecting portion 13 and provided for each of the receiving spaces 14. In other words, each of the first terminals 4 is provided for each of the first housing spaces 11, and each of the second terminals 4' is provided for each of the second housing spaces 11'.

As shown in FIG. 5, each of the terminals 4 is preferably integrally formed with the insulating body 1 by inserting and injecting (Insert Molding), and each terminal 4 further includes a guiding portion 41 and is connected to the guiding portion 41. A soldering portion 42 in which the soldering portion protrudes beyond the insulating body 1. Therefore, the guiding elastic arm segments 212 of the probe terminals 2 can be slidably coupled to the surfaces of the terminals 4. Further, each of the first probe assemblies 2 and the second probe assemblies 3 are further disposed corresponding to the guiding segments 41, 41' of the first terminal 4 and the second terminal 4', respectively. Further, each of the first and second terminals 4, 4' is disposed between the barrier 131 and the connecting portion 13, respectively. In other different embodiments, each of the terminals 4 may be disposed on both sides of the connecting portion 13 in a copper foil or other conductive material, and is not limited.

When the first probe assemblies 2 are respectively disposed in the first receiving spaces 11 , the guiding elastic arm segments 212 of the first probe assemblies 2 respectively correspond to and electrically abut the guiding of the first terminals 4 . Connect the segment 41. Similarly, when the second probe assemblies 3 are respectively disposed in the second accommodating spaces 11 ′, the guiding elastic arm segments (not shown) of the second probe assemblies 3 also correspond to each other and electrically abut each other. The guiding section 42' of the second terminal 4'. Further, each of the probe terminals 21 preferably abuts against the surfaces of the first and second terminals 4, 4' by the second bent portion 2121 to form an electrical connection. Referring to also Fig. 6, the circuit board 700 is electrically connected to the soldering portions 42, 42' of the respective terminals 4. That is, the pads 7 on the circuit board 700 are soldered to the respective soldering portions 42, 42' to form high frequency power or high frequency signals.

As shown in FIG. 6 and FIG. 7, when the user mounts the mating connector 800 in the installation space of the electronic device, each of the mating portions 8 of the docking connector 800 is inserted into each of the authoring connectors 100. Inside the slot 12. Each of the abutting portions 8 abuts against the exposed portion 2111 of the mating segment 211 of each of the probe terminals 21, and each of the probe terminals 21 contracts and compresses each of the elastic members 23. At this time, each of the probe terminals 21 is electrically contacted with the surfaces of the respective first and second terminals 4, 4' by the conductive elastic arm segments 212. The high frequency power or high frequency signal of the docking connector 800 will pass through the probe terminal 21 and each of the first and second terminals 4, 4'. Can be transferred to the circuit board 700. On the contrary, the same.

Therefore, the first and second probe assemblies 2 and 3 are assembled to the front end of the insulative housing 1 , and the first and second probe assemblies 2 and 3 are respectively positioned by the snap block 10 and then engaged with the insulative housing 1 . Therefore, the creation structure is simple and easy to assemble. The second bending portion 2121 of each of the probe assemblies 2, 3 is slidably in contact with the surfaces of the first and second terminals 4, 4', so that high-frequency signal transmission or high-frequency power can be transmitted from the docking connector. The 800 is transmitted to the circuit board 700 by the first and second terminals 4, 4' provided on the connecting portion 13.

In summary, the embodiments disclosed herein are to be considered as illustrative of the present invention and are not intended to limit the present invention. The scope of this creation is defined by the scope of the appended patent application and covers its legal equivalents and is not limited to the foregoing description.

100‧‧‧Connector

1‧‧‧Insulating body

10‧‧‧Card block

11‧‧‧First containment space

11’‧‧‧Second containment space

12‧‧‧through slot

14‧‧‧ accommodating space

15‧‧‧Snap holes

16‧‧‧Knuckle arm

17‧‧‧Snap slot

18‧‧‧Snap bumps

19‧‧‧Snap slot

2‧‧‧First probe assembly

21‧‧‧ probe terminal

22‧‧‧Insulation

23‧‧‧Flexible components

3‧‧‧Second probe assembly

4, 4'‧‧‧ first terminal / second terminal

41‧‧‧ Guide section

42‧‧‧Weld Department

Claims (8)

A probe-type connector structure includes: an insulative housing, a plurality of receiving spaces, and a connecting portion separating the receiving spaces; a plurality of probe assemblies, each of the probe assemblies being respectively received in each of the receiving spaces, and respectively The invention comprises a probe terminal, an insulating member and an elastic component for providing the insulating member and the probe terminal to reciprocate in the corresponding receiving space, the probe terminal is provided with a pair of connecting segments and the elastic component from the butting segment a guiding elastic arm segment extending in a direction, the insulating member is connected between the butting portion and the elastic member; and a plurality of terminals are respectively embedded in the connecting portion and disposed relative to each of the receiving spaces, the probe terminal The guiding elastic arm segments can be correspondingly slidably connected to the respective terminals. The probe connector structure of claim 1, wherein each of the receiving spaces further includes a plurality of first receiving spaces and a plurality of second receiving spaces corresponding to the first receiving spaces, the connecting portions communicating with the insulating body The first receiving space and each of the second receiving spaces are spaced apart from each other. The probe connector structure of claim 1, wherein each of the terminals further comprises a guiding portion and a welding portion connected to the guiding portion, and each of the terminals is embedded on both sides of the connecting portion. The probe connector structure of claim 1, wherein the guiding elastic arm segment of the probe terminal is connected to one end of the docking segment, the docking segment is fixed to the insulating member, and the insulating member is slid A receiving slot is defined in the receiving space, and the guiding elastic arm segment of the probe terminal is electrically contacted to each of the terminal surfaces via the receiving slot. The probe connector structure of claim 1, wherein a first bending portion is connected between the docking portion of the probe terminal and the guiding elastic arm segment, and the guiding elastic arm segment is connected to the first The bent portion extends in the direction of the connecting portion. The probe connector structure of claim 1, wherein the guiding elastic arm segment of the probe terminal has a second bending portion, and the probe terminal is electrically contacted with each of the second bending portions The terminal surface. The probe connector structure of claim 1, wherein the insulative housing comprises a latching block connected to the receiving space, the latching block is provided with a through slot communicating with the receiving space and two from the latching block A latching arm is protruded from the end, and the insulating body is provided with a snap groove relative to the latching arm to be fastened to the latching block. The probe connector structure of claim 7, wherein each of the latching arms is further provided with a latching hole, and the latching slot is further provided with a latching protrusion corresponding to the latching hole.