TWM500892U - Probe type connector with cable - Google Patents

Probe type connector with cable Download PDF

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Publication number
TWM500892U
TWM500892U TW104200174U TW104200174U TWM500892U TW M500892 U TWM500892 U TW M500892U TW 104200174 U TW104200174 U TW 104200174U TW 104200174 U TW104200174 U TW 104200174U TW M500892 U TWM500892 U TW M500892U
Authority
TW
Taiwan
Prior art keywords
probe
guiding
receiving space
item
slot
Prior art date
Application number
TW104200174U
Other languages
Chinese (zh)
Inventor
Kuan-Wu Chen
Chia-Hung Kuo
Hsing-Yu Lee
Original Assignee
Bellwether Electronic Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bellwether Electronic Corp filed Critical Bellwether Electronic Corp
Priority to TW104200174U priority Critical patent/TWM500892U/en
Publication of TWM500892U publication Critical patent/TWM500892U/en

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Description

具有纜線的探針式連接器Probe connector with cable 【0001】【0001】

本創作是有關於一種連接器,尤指一種具有纜線的探針式連接器。This creation relates to a connector, and more particularly to a probe connector having a cable.

【0002】【0002】

伸縮端子通常設置在電子產品內的電池安裝空間、電源安裝空間或電子元件安裝空間的一側,主要電性連接電池或電源供應單元等,以提供電子產品電能,或者用以電性連接電子元件,用以傳遞高頻訊號給電子產品。The telescopic terminal is usually disposed on the side of the battery installation space, the power supply installation space or the electronic component installation space in the electronic product, and is mainly electrically connected to the battery or the power supply unit, etc., to provide electrical energy for the electronic product, or to electrically connect the electronic component. For transmitting high frequency signals to electronic products.

【0003】[0003]

習知的伸縮端子主要包括一套筒、一頂針及一彈簧。套筒為絕緣材料所製成之元件,頂針與彈簧則為金屬材料所製成之元件,且頂針滑接於套筒。彈簧安裝在套筒內且抵頂頂針,以使電池、電源供應單元或電子元件夠藉由壓接頂針,而與頂針及彈簧形成一導電通路。因此電池、電源供應單元或電子元件內的電能或訊號能夠透過導電通路傳遞給電子產品。The conventional telescopic terminal mainly comprises a sleeve, a thimble and a spring. The sleeve is made of an insulating material, the thimble and the spring are made of a metal material, and the thimble is slid to the sleeve. The spring is mounted in the sleeve and abuts against the ejector pin to enable the battery, power supply unit or electronic component to form a conductive path with the thimble and the spring by crimping the ejector pin. Therefore, the electric energy or signal in the battery, the power supply unit or the electronic component can be transmitted to the electronic product through the conductive path.

【0004】[0004]

然而習知的伸縮端子由於彈簧為一螺旋彈簧且為金屬材料所製成之元件,所以會和頂針導通,因此電池、電源供應單元或電子元件的電能或訊號通過彈簧時會發生電感效應,而無法有效傳遞高頻電能或高頻訊號。習知的伸縮端子的一端必須另與電路板焊接,若需與電子裝置使用,又須透過線纜與前述電路板焊接,因此焊接程序複雜,製造費時費工。However, since the conventional telescopic terminal is a coil spring and is made of a metal material, it is electrically connected to the thimble, so that the electric energy or signal of the battery, the power supply unit, or the electronic component passes through the spring, and an inductive effect occurs. High frequency power or high frequency signals cannot be effectively transmitted. One end of the conventional telescopic terminal must be soldered to the circuit board. If it is used with an electronic device, it must be soldered to the circuit board through the cable. Therefore, the welding procedure is complicated, and the manufacturing is time-consuming and labor-intensive.

【0005】[0005]

因此,如何設計出一種可改善上述缺失的本創作,乃為本案創作人所亟欲解決的一大課題。Therefore, how to design a novel that can improve the above-mentioned defects is a major issue that the creators of this case want to solve.

【0006】[0006]

本創作的目的在於提供一種符合高頻訊號傳輸(或高頻電能的傳遞)、結構精簡且易於組裝的具有纜線的探針式連接器。The purpose of this creation is to provide a cabled probe connector that conforms to high frequency signal transmission (or transmission of high frequency power), is structurally simple and easy to assemble.

【0007】【0007】

為達上述目的,本創作提供一種具有纜線的探針式連接器,包括一絕緣本體、一探針組件、一導接板及一纜線。絕緣本體開設有彼此連通的一收容空間和一插槽。探針組件收容於收容空間且包含一探針端子、一絕緣件和提供絕緣件和探針端子在收容空間內往復移動的一彈性元件。探針端子設有一對接段和自對接段朝插槽方向延伸的一導接彈臂段。絕緣件連接於對接段與彈性元件之間。導接板設有多數導接部,且導接板對應插槽插接於絕緣本體內。探針端子之導接彈臂段則對應各導接部設置並抵接各導接部。纜線電性連接突伸絕緣本體之外的導接板的各導接部。To achieve the above object, the present invention provides a probe connector having a cable, comprising an insulative housing, a probe assembly, a guide plate and a cable. The insulating body is provided with a receiving space and a slot that communicate with each other. The probe assembly is received in the receiving space and includes a probe terminal, an insulating member, and an elastic member that provides the insulating member and the probe terminal to reciprocate in the receiving space. The probe terminal is provided with a pair of connecting segments and a guiding elastic arm segment extending from the docking portion toward the slot. The insulating member is connected between the abutting section and the elastic member. The guiding plate is provided with a plurality of guiding portions, and the corresponding slots of the guiding plate are inserted into the insulating body. The guiding elastic arm segments of the probe terminals are disposed corresponding to the respective guiding portions and abut against the guiding portions. The cable is electrically connected to each of the guiding portions of the guiding plate outside the insulating body.

【0032】[0032]

100‧‧‧連接器100‧‧‧Connector

【0033】[0033]

1‧‧‧絕緣本體1‧‧‧Insulating body

【0034】[0034]

10‧‧‧卡接塊10‧‧‧Card block

【0035】[0035]

11、11’‧‧‧收容空間11, 11' ‧ ‧ accommodating space

【0036】[0036]

112‧‧‧穿孔112‧‧‧Perforation

【0037】[0037]

12‧‧‧貫通槽12‧‧‧through slot

【0038】[0038]

13‧‧‧插槽13‧‧‧ slots

【0039】[0039]

131‧‧‧擋壁131‧‧ ‧ retaining wall

【0040】[0040]

14‧‧‧凹槽14‧‧‧ Groove

【0041】[0041]

16‧‧‧卡扣臂16‧‧‧Knuckle arm

【0042】[0042]

17‧‧‧卡扣槽17‧‧‧Snap slot

【0043】[0043]

18‧‧‧卡扣凸塊18‧‧‧Snap bumps

【0044】[0044]

19‧‧‧卡扣槽19‧‧‧Snap slot

【0045】[0045]

2‧‧‧第一探針組件2‧‧‧First probe assembly

【0046】[0046]

21‧‧‧探針端子21‧‧‧ probe terminal

【0047】[0047]

211‧‧‧對接段211‧‧‧ docking section

【0048】[0048]

2111‧‧‧裸露部2111‧‧‧Exposed parts

【0049】[0049]

212‧‧‧導接彈臂段212‧‧‧guided arm section

【0050】[0050]

2121‧‧‧第二彎折部2121‧‧‧second bend

【0051】[0051]

213‧‧‧第一彎折部213‧‧‧First bend

【0052】[0052]

22‧‧‧絕緣件22‧‧‧Insulation

【0053】[0053]

224‧‧‧容槽224‧‧‧ 容容

【0054】[0054]

225‧‧‧定位部225‧‧‧ Positioning Department

【0055】[0055]

23‧‧‧彈性元件23‧‧‧Flexible components

【0056】[0056]

3‧‧‧第二探針組件3‧‧‧Second probe assembly

【0057】[0057]

4‧‧‧導接板4‧‧‧ Guide plate

【0058】[0058]

41‧‧‧第一導接部41‧‧‧First Guide

【0059】[0059]

42‧‧‧第二導接部42‧‧‧Second Guide

【0060】[0060]

5‧‧‧金屬外殼5‧‧‧Metal casing

【0061】[0061]

51‧‧‧擋片51‧‧‧Block

【0062】[0062]

700‧‧‧纜線700‧‧‧ cable

【0063】[0063]

7‧‧‧電性固接件7‧‧‧Electrical fasteners

【0064】[0064]

800‧‧‧對接連接器800‧‧‧Docking connector

【0065】[0065]

8‧‧‧對接部8‧‧‧Docking Department

【0008】[0008]

圖1為繪示本創作探針式連接器的立體分解圖。FIG. 1 is an exploded perspective view showing the probe connector of the present invention.

【0009】【0009】

圖2為圖1組合後與金屬外殼的立體分解圖。Figure 2 is an exploded perspective view of the assembled metal casing of Figure 1.

【0010】[0010]

圖3為圖2立體示意圖。Figure 3 is a perspective view of Figure 2.

【0011】[0011]

圖4為繪示本創作探針組件之具體實施例圖。4 is a diagram showing a specific embodiment of the present probe assembly.

【0012】[0012]

圖5為繪示本創作焊接有纜線的導接板與連接器插接的剖視圖。FIG. 5 is a cross-sectional view showing the connector of the present invention with a cable-bonded guide plate inserted into the connector.

【0013】[0013]

圖6為圖5組裝後之剖視圖,也是與對接連接器連接前的動作圖。Fig. 6 is a cross-sectional view of Fig. 5 assembled, and is an operation diagram before being connected to the mating connector.

【0014】[0014]

圖7為繪示本創作探針式連接器與對接連接器的剖視圖,也是與對接連接器對接後的動作圖。FIG. 7 is a cross-sectional view showing the probe connector and the docking connector of the present invention, and is an operation diagram after docking with the docking connector.

【0015】[0015]

有關本創作之詳細說明及技術內容,配合圖式說明如下,然而所附圖式僅提供參考與說明用,並非用來對本創作加以限制者。The detailed description and technical content of the present invention are described below with reference to the drawings, but the drawings are only for reference and explanation, and are not intended to limit the creation.

【0016】[0016]

本創作提供一種具有纜線的探針式的探針式連接器,如圖1至圖3所示,用以設置在一電子裝置(圖未繪示)的一安裝空間(圖未繪示),例如:電池安裝空間、供電單元安裝空間或電子元件安裝空間等的一側。當一對接連接器800(如圖6或圖7所示),例如:電池、供電單元或電子元件等,安裝於安裝空間並對應抵接於本創作探針式連接器100時,對接連接器800的電能或訊號將傳遞給電子裝置。The present invention provides a probe type probe connector with a cable, as shown in FIG. 1 to FIG. 3, for mounting in an installation space (not shown) of an electronic device (not shown). For example, one side of the battery installation space, the power supply unit installation space, or the electronic component installation space. When the mating connector 800 (shown in FIG. 6 or FIG. 7), for example, a battery, a power supply unit, or an electronic component, is mounted in the installation space and correspondingly abuts the present probe connector 100, the docking connector The 800 energy or signal will be transmitted to the electronic device.

【0017】[0017]

如圖1、圖4和圖5並搭配圖2和圖3所示,本創作探針式連接器100包括一絕緣本體1、多數第一探針組件2、一導接板4以及一纜線700。如圖2及圖3所示,較佳還包括一金屬外殼5。如圖5所示的本實施例中,進一步包含複數第二探針組件3為例進行說明。As shown in FIG. 1 , FIG. 4 and FIG. 5 , together with FIG. 2 and FIG. 3 , the present probe connector 100 includes an insulative housing 1 , a plurality of first probe assemblies 2 , a guiding plate 4 , and a cable . 700. As shown in FIGS. 2 and 3, a metal casing 5 is preferably further included. In the embodiment shown in FIG. 5, a plurality of second probe assemblies 3 are further included as an example for description.

【0018】[0018]

絕緣本體1較佳為一整體式結構,然而亦可為如圖1所示包含絕緣本體1彼此組合的一卡接塊10,卡接塊10開設有與收容空間11相連通的一貫通槽12及從卡接塊10兩端凸伸的一卡接臂16。絕緣本體1相對於卡接臂16則設有一卡扣槽17,以與卡接塊10扣接。較佳地,卡扣槽17更設有一卡扣凸塊18,卡扣臂16則設有一卡扣孔15,供扣合卡扣凸塊18。絕緣本體1除可為開設有彼此連通的一第一收容空間11和一插槽13(見圖5),亦可為開設有彼此連通的多數第一收容空間11和一插槽13。The insulative housing 1 is preferably a one-piece structure. However, the insulative housing 1 can be combined with the insulative housing 1 as shown in FIG. 1 . The latching block 10 defines a through slot 12 communicating with the receiving space 11 . And a latching arm 16 projecting from both ends of the card block 10. The insulative housing 1 is provided with a latching slot 17 relative to the latching arm 16 for fastening to the latching block 10. Preferably, the latching slot 17 is further provided with a latching projection 18, and the latching arm 16 is provided with a latching hole 15 for engaging the latching projection 18. The insulative housing 1 can be a first receiving space 11 and a slot 13 (see FIG. 5) that are connected to each other, and can also be provided with a plurality of first receiving spaces 11 and a slot 13 that communicate with each other.

【0019】[0019]

在如圖1、圖5、圖6及圖7所示的實施例中,較佳同時開設有彼此連通的多數第一收容空間11、多數第二收容空間11’和一插槽13。因此前述多數第一收容空間11及多數第二收容空間11’,第一探針組件2和第二探針組件3皆相對應各第一及第二收容空間11內且為多數設置,使多數第一收容空間11和多數第二收容空間11’且彼此上、下排列配置。In the embodiment shown in Figs. 1, 5, 6, and 7, it is preferable to simultaneously open a plurality of first receiving spaces 11, a plurality of second receiving spaces 11', and a slot 13 that communicate with each other. Therefore, the plurality of first receiving spaces 11 and the plurality of second receiving spaces 11 ′, the first probe component 2 and the second probe component 3 are corresponding to each of the first and second receiving spaces 11 and are provided in a plurality of positions, so that the majority The first accommodating space 11 and the plurality of second accommodating spaces 11' are arranged side by side and downward.

【0020】[0020]

此外,本創作探針式連接器100的絕緣本體1還可套設有金屬外殼5。金屬外殼5一端設有兩相對應的擋片51,供於卡接塊兩側的卡扣槽19相對應扣合,使金屬外殼5相對定位卡接塊10與絕緣本體1,如圖2所示。前述第一收容空間11包含彼此連通的貫通槽12和穿孔112,其中穿孔112連通於貫通槽12與收容空間11之間。In addition, the insulative housing 1 of the present probe connector 100 can also be sleeved with a metal outer casing 5. The metal casing 5 is provided with two corresponding baffles 51 at one end, and the snap grooves 19 on both sides of the snap block are correspondingly fastened, so that the metal casing 5 is relatively positioned with the latching block 10 and the insulative body 1, as shown in FIG. Show. The first receiving space 11 includes a through groove 12 and a through hole 112 that communicate with each other, and the through hole 112 communicates between the through groove 12 and the receiving space 11 .

【0021】[0021]

如圖1和圖5所示,更包含一擋壁131及一凹槽14。凹槽14設於相對於收容空間11的另一端,擋壁131則設於收容空間11靠近該凹槽14處,使絕緣件22的一端能夠滑移地抵觸擋壁131,且收容探針組件2、3。插槽13是從凹槽14一端貫穿絕緣本體1並間隔上述第一、第二收容空間11、11’,使部份的第一、第二收容空間11、11’與插槽13相互連通,進而與導接板4接觸。As shown in FIG. 1 and FIG. 5, a barrier wall 131 and a recess 14 are further included. The groove 14 is disposed at the other end of the receiving space 11 , and the blocking wall 131 is disposed at the receiving space 11 near the groove 14 , so that one end of the insulating member 22 can slide against the blocking wall 131 and the probe assembly is received. 2, 3. The slot 13 extends from the end of the recess 14 to the insulative housing 1 and is spaced apart from the first and second receiving spaces 11 and 11 ′ so that the first and second receiving spaces 11 , 11 ′ and the slot 13 communicate with each other. Further, it is in contact with the guide plate 4.

【0022】[0022]

如圖4所示,第一探針組件2包含一探針端子21 (一體沖壓成型的金屬端子)、一絕緣件22和一彈性元件23。請一併參閱圖1和圖5所示,各第一探針組件2和各第二探針組件3係彼此相同並彼此對稱地分別配置於各第一收容空間11內和各第二收容空間11’內。在本實施例中僅以第一探針組件2為例進行說明。As shown in FIG. 4, the first probe assembly 2 includes a probe terminal 21 (integrated stamped metal terminal), an insulating member 22, and an elastic member 23. As shown in FIG. 1 and FIG. 5 , each of the first probe assemblies 2 and the second probe assemblies 3 are identical to each other and symmetrically disposed in each of the first receiving spaces 11 and the second receiving spaces. Within 11'. In the present embodiment, only the first probe assembly 2 will be described as an example.

【0023】[0023]

探針端子21包含一對接段211和自對接段211的一處朝插槽13或通道14方向延伸的一導接彈臂段212。於如圖4及圖5所示的實施例中,導接彈臂段212係自對接段211的一端(即第一彎折部213位置)一體延伸為例進行說明。探針端子21的對接段211與導接彈臂段212之間可連接有一第一彎折部213,導接彈臂段212是經由第一彎折部213朝插槽13或通道14方向延伸。The probe terminal 21 includes a pair of connecting segments 211 and a guiding elastic arm segment 212 extending from the docking portion 211 toward the slot 13 or the channel 14. In the embodiment shown in FIG. 4 and FIG. 5, the guiding elastic arm segment 212 is integrally extended from one end of the butting section 211 (ie, the position of the first bending portion 213). A first bending portion 213 is connected between the butting portion 211 of the probe terminal 21 and the guiding elastic arm segment 212. The guiding elastic arm segment 212 extends toward the slot 13 or the channel 14 via the first bending portion 213. .

【0024】[0024]

如圖4所示,探針端子21的對接段211固定於絕緣件22上,其中絕緣件22的固定位置靠近於對接段211的一端(即第一彎折部213),使對接段211形成有自絕緣件22裸露的一裸露部2111,供與對接連接器(圖略)電性接觸。前述探針端子21的導接彈臂段212更具有一第二彎折部2121,第二彎折部2121是從第一彎折部213延伸彎折。As shown in FIG. 4, the abutting portion 211 of the probe terminal 21 is fixed to the insulating member 22, wherein the fixing member 22 is fixed at a position close to one end of the mating portion 211 (ie, the first bent portion 213), so that the docking portion 211 is formed. There is a bare portion 2111 exposed from the insulating member 22 for electrical contact with the mating connector (not shown). The guiding elastic arm segment 212 of the probe terminal 21 further has a second bending portion 2121, and the second bending portion 2121 is bent and extended from the first bending portion 213.

【0025】[0025]

請一併參閱圖5所示,絕緣件22滑移於收容空間11且開設有一容槽224,導接彈臂段212(即第二彎折部2121)可於容槽224彈性凸起。第一探針組件2的容槽224和第二探針組件3的容槽(未標示)彼此對應連通,使探針端子21的導接彈臂段212皆經由容槽224伸出於絕緣件22之外。As shown in FIG. 5 , the insulating member 22 slides on the receiving space 11 and defines a receiving slot 224 . The guiding elastic arm segment 212 (ie, the second bent portion 2121 ) can be elastically protruded in the receiving slot 224 . The receiving groove 224 of the first probe assembly 2 and the receiving groove (not labeled) of the second probe assembly 3 are in communication with each other, so that the guiding elastic arm segments 212 of the probe terminal 21 are extended through the receiving groove 224 to the insulating member. Outside of 22.

【0026】[0026]

彈性元件23支撐於絕緣件22相對裸露部2111的另一端上,換言之,絕緣件22連接於對接段211與彈性元件23之間,使各彈性元件23能夠分別提供探針端子21和絕緣件22在第一、二收容空間11、11’內往復移動,從而讓探針端子21的裸露部2111對應並伸出於穿孔112,以伸到貫通槽12內。此外,絕緣件22的一端更一體凸設有一定位部225,供與彈性元件23的一端定位。在如圖5的實施例中,彈性元件23的另一端則可抵接收容空間11的底端。The elastic member 23 is supported on the other end of the insulating member 22 opposite to the exposed portion 2111. In other words, the insulating member 22 is connected between the abutting portion 211 and the elastic member 23, so that the elastic members 23 can respectively provide the probe terminal 21 and the insulating member 22. The first and second accommodating spaces 11, 11' reciprocate, so that the exposed portion 2111 of the probe terminal 21 corresponds to and protrudes from the through hole 112 to extend into the through groove 12. In addition, one end of the insulating member 22 is integrally protruded with a positioning portion 225 for positioning with one end of the elastic member 23. In the embodiment of FIG. 5, the other end of the elastic member 23 is responsive to the bottom end of the receiving space 11.

【0027】[0027]

此外,導接板4對應插槽13的位置插接於絕緣本體1內,一端並抵觸至卡接塊10上。導接板4兩側表面設有多數導接部41、42。請一併參考圖1及圖5所示,導接板4以設有多數金手指的電路板為例進行說明。導接板4的兩側表面分別設置有多數第一導接部41(金手指)和多數第二導接部42(金手指)。各第一探針組件2的導接彈臂段212分別對應並電性抵接於各第一導接部41,各第二探針組件3的導接彈臂段(圖略)同樣對應並電性抵接於各第二導接部42。因此各探針端子21較佳是以第二彎折部2121分別與第一導接部41或第二導接部42相互抵觸,以形成電性連接。In addition, the position of the guiding plate 4 corresponding to the slot 13 is inserted into the insulative housing 1 and one end is in contact with the latching block 10. A plurality of guiding portions 41, 42 are provided on both side surfaces of the guiding plate 4. Referring to FIG. 1 and FIG. 5 together, the guide plate 4 is described by taking a circuit board with a plurality of gold fingers as an example. Both side surfaces of the guide plate 4 are provided with a plurality of first guiding portions 41 (gold fingers) and a plurality of second guiding portions 42 (gold fingers). The guiding elastic arm segments 212 of the first probe assemblies 2 respectively correspond to and electrically abut against the first guiding portions 41, and the guiding elastic arm segments (not shown) of the second probe assemblies 3 also correspond to each other. Electrically abutting each of the second guiding portions 42. Therefore, each of the probe terminals 21 preferably has a second bent portion 2121 that interferes with the first guiding portion 41 or the second guiding portion 42 to form an electrical connection.

【0028】[0028]

如圖5所示,導接板4兩側的導接部41、42較佳是分別與纜線700以電性故接件7,例如焊錫或其他適合的焊料焊接後,再從凹槽14插接於絕緣本體1中。因此當導接板4可分離地從凹槽14插接於絕緣本體1的插槽13時,各第一探針組件2的導接彈臂段212即可電性接觸於導接板4一面的各第一導接部41而導通,並同時使各第二探針組件3的導接彈臂段212亦電性接觸於導接板4另一面的各第二導接部42而導通,如圖6所示。As shown in FIG. 5, the guiding portions 41, 42 on both sides of the guiding plate 4 are preferably respectively soldered to the cable 700 by an electrical connector 7, such as solder or other suitable solder, and then from the groove 14. Plugged into the insulative housing 1. Therefore, when the guiding plate 4 is detachably inserted from the recess 14 into the slot 13 of the insulative housing 1, the guiding elastic arm segment 212 of each first probe assembly 2 can be electrically contacted with one side of the guiding plate 4 Each of the first guiding portions 41 is electrically connected, and at the same time, the guiding elastic arm segments 212 of the second probe assemblies 3 are electrically connected to the second guiding portions 42 on the other surface of the guiding plate 4 to be electrically connected. As shown in Figure 6.

【0029】[0029]

如圖6和圖7所示,當使用者將一對接連接器800安裝於所述電子裝置的安裝空間內時,對接連接器800的各對接部8將分別插入本創作連接器100的各貫通槽12內。各對接部8分別抵接於各探針端子21之對接段211的裸露部2111,各探針端子21順勢收縮並壓縮各彈性元件23。此時,各探針端子21利用導接彈臂段212而與導接板4的第一、二導接部41、42保持電性接觸。對接連接器800的高頻電能或高頻訊號將經由探針端子21和導接板4上的第一、二導接部41、42而能夠傳遞到纜線700。As shown in FIG. 6 and FIG. 7, when the user mounts the mating connector 800 in the installation space of the electronic device, each of the mating portions 8 of the docking connector 800 is inserted into each of the authoring connectors 100. Inside the slot 12. Each of the abutting portions 8 abuts against the exposed portion 2111 of the mating segment 211 of each of the probe terminals 21, and each of the probe terminals 21 contracts and compresses each of the elastic members 23. At this time, each probe terminal 21 is electrically contacted with the first and second guiding portions 41 and 42 of the guide plate 4 by the guiding elastic arm segment 212. The high frequency electrical energy or high frequency signal of the docking connector 800 can be transmitted to the cable 700 via the probe terminals 21 and the first and second guiding portions 41, 42 on the guiding plate 4.

【0030】[0030]

因此本創作利用第一、二探針組件2、3朝絕緣本體1前端組裝,再藉由卡接塊10分別定位上述第一、二探針組件2、3後卡合於絕緣本體1上,因此本創作結構精簡、易於組裝。利用各探針組件2、3的各第二彎折部2121滑移地抵觸各導接部41、42上,也使高頻訊號傳輸或高頻電能能從對接連接器800藉由導接板4傳遞於纜線700。Therefore, the first and second probe assemblies 2 and 3 are assembled to the front end of the insulative housing 1 , and the first and second probe assemblies 2 and 3 are respectively positioned by the snap block 10 and then engaged with the insulative housing 1 . Therefore, the creation structure is simple and easy to assemble. The second bending portion 2121 of each of the probe assemblies 2, 3 is slidably in contact with the guiding portions 41, 42 to also enable high-frequency signal transmission or high-frequency power to pass from the docking connector 800 through the guiding plate. 4 is passed on the cable 700.

【0031】[0031]

綜上所述,本文於此所揭示的實施例應被視為用以說明本創作,而非用以限制本創作。本創作的範圍應由後附申請專利範圍所界定,並涵蓋其合法均等物,並不限於先前的描述。In summary, the embodiments disclosed herein are to be considered as illustrative of the present invention and are not intended to limit the present invention. The scope of this creation is defined by the scope of the appended patent application and covers its legal equivalents and is not limited to the foregoing description.

100‧‧‧連接器 100‧‧‧Connector

1‧‧‧絕緣本體 1‧‧‧Insulating body

10‧‧‧卡接塊 10‧‧‧Card block

11、11’‧‧‧收容空間 11, 11' ‧ ‧ accommodating space

12‧‧‧貫通槽 12‧‧‧through slot

13‧‧‧插槽 13‧‧‧ slots

14‧‧‧凹槽 14‧‧‧ Groove

15‧‧‧卡扣孔 15‧‧‧Snap holes

16‧‧‧卡扣臂 16‧‧‧Knuckle arm

17‧‧‧卡扣槽 17‧‧‧Snap slot

18‧‧‧卡扣凸塊 18‧‧‧Snap bumps

19‧‧‧卡扣槽 19‧‧‧Snap slot

2‧‧‧第一探針組件 2‧‧‧First probe assembly

21‧‧‧探針端子 21‧‧‧ probe terminal

22‧‧‧絕緣件 22‧‧‧Insulation

23‧‧‧彈性元件 23‧‧‧Flexible components

3‧‧‧第二探針組件 3‧‧‧Second probe assembly

4‧‧‧導接板 4‧‧‧ Guide plate

41‧‧‧第一導接部 41‧‧‧First Guide

42‧‧‧第二導接部 42‧‧‧Second Guide

Claims (9)

【第1項】[Item 1] 一種具有纜線的探針式連接器,包括:
一絕緣本體,開設有彼此連通的一收容空間和一插槽;
一探針組件,收容於該收容空間且包含一探針端子、一絕緣件和提供該絕緣件和該探針端子在該收容空間內往復移動的一彈性元件,該探針端子設有一對接段和自該對接段朝該插槽方向延伸的一導接彈臂段,該絕緣件連接於該對接段與該彈性元件之間;
一導接板,設有多數導接部,該導接板對應該插槽插接於該絕緣本體內,該探針端子之該導接彈臂段則對應各該導接部設置並抵接各該導接部;以及
一纜線,電性連接該導接板的各該導接部。
A probe connector with a cable, comprising:
An insulating body is provided with a receiving space and a slot communicating with each other;
a probe assembly is received in the receiving space and includes a probe terminal, an insulating member and an elastic member for providing the insulating member and the probe terminal to reciprocate in the receiving space, the probe terminal is provided with a pair of connecting portions And a guiding elastic arm segment extending from the docking section toward the slot, the insulating member is connected between the mating segment and the elastic member;
a guiding plate is provided with a plurality of guiding portions, the guiding plates are correspondingly inserted into the insulating body, and the guiding elastic arm segments of the probe terminals are disposed corresponding to the guiding portions and abutting Each of the guiding portions; and a cable electrically connected to each of the guiding portions of the guiding plate.
【第2項】[Item 2] 如請求項1所述之具有纜線的探針式連接器,其中該導接板為一電路板,各該導接部則為該電路板的多數金手指。The probe connector with a cable according to claim 1, wherein the guide plate is a circuit board, and each of the guide portions is a plurality of gold fingers of the circuit board. 【第3項】[Item 3] 如請求項1所述之具有纜線的探針式連接器,更包含一擋壁及一凹槽,該凹槽設於相對於該收容空間的另一端。The probe connector with a cable according to claim 1, further comprising a retaining wall and a recess disposed at the other end of the receiving space. 【第4項】[Item 4] 如請求項1所述之具有纜線的探針式連接器,其中該探針端子之該導接彈臂段係自該對接段的一端一體延伸,該對接段固定於該絕緣件上,該絕緣件滑移於該收容空間且開設有一容槽,該探針端子之該導接彈臂段經由該容槽電性接觸於各該導接部。The cable-connected probe connector of claim 1, wherein the guiding elastic arm segment of the probe terminal extends integrally from one end of the docking portion, and the docking portion is fixed to the insulating member. The insulating member is slidably disposed in the receiving space and defines a receiving slot. The guiding elastic arm segment of the probe terminal is electrically connected to each of the guiding portions via the receiving slot. 【第5項】[Item 5] 如請求項1所述之具有纜線的探針式連接器,其中該探針端子之該對接段與該導接彈臂段之間連接有一第一彎折部,該導接彈臂段經由該第一彎折部而朝該插槽方向延伸。The cable-connected probe connector of claim 1, wherein a first bending portion is connected between the docking portion of the probe terminal and the guiding elastic arm segment, and the guiding elastic arm segment is connected The first bent portion extends toward the slot. 【第6項】[Item 6] 如請求項1所述之具有纜線的探針式連接器,其中該探針端子之該導接彈臂段具有一第二彎折部,該探針端子以該第二彎折部電性接觸於各該導接部。The probe connector with a cable according to claim 1, wherein the guiding elastic arm segment of the probe terminal has a second bending portion, and the probe terminal is electrically connected to the second bending portion. Contacting each of the guiding portions. 【第7項】[Item 7] 如請求項1所述之具有纜線的探針式連接器,其中該絕緣本體包含彼此連接的一卡接塊,該卡接塊開設有與該收容空間相連通的一貫通槽及從該卡接塊兩端凸伸的一卡接臂,該絕緣本體相對於該卡接臂則設有一卡扣槽,以與該卡接塊扣接。The probe connector with a cable according to claim 1, wherein the insulative housing comprises a snap block connected to each other, the snap block having a through slot communicating with the receiving space and the card from the card A latching arm protruded from the two ends of the block, and the insulating body is provided with a snap groove relative to the latching arm to be fastened with the latching block. 【第8項】[Item 8] 如請求項7所述之具有纜線的探針式連接器,其中各該卡接臂更設有一卡扣孔,該卡扣槽更設有與該卡扣孔相對應設置的一卡扣凸塊。The probe connector with a cable according to claim 7, wherein each of the latching arms further has a latching hole, and the latching slot is further provided with a latching protrusion corresponding to the latching hole. Piece. 【第9項】[Item 9] 如請求項1所述之具有纜線的探針式連接器,進一步包括另一探針組件,該絕緣本體則開設有另一收容空間,該收容空間和另一該收容空間係彼此相同並彼此對稱地開設於該絕緣本體,該探針組件和另一該探針組件則彼此相同並彼此對稱地分別配置於該收容空間和另一該收容空間內。The probe connector having a cable according to claim 1, further comprising another probe assembly, the insulating body being provided with another receiving space, the receiving space and the other receiving space being identical to each other and each other The insulative housing is symmetrically disposed, and the probe assembly and the other of the probe assemblies are identical to each other and symmetrically disposed in the receiving space and the other receiving space.
TW104200174U 2015-01-06 2015-01-06 Probe type connector with cable TWM500892U (en)

Priority Applications (1)

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Application Number Priority Date Filing Date Title
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Publications (1)

Publication Number Publication Date
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ID=53722668

Family Applications (1)

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Country Status (1)

Country Link
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