TWM495614U - Tapered vacuum chamber - Google Patents

Tapered vacuum chamber Download PDF

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Publication number
TWM495614U
TWM495614U TW103217123U TW103217123U TWM495614U TW M495614 U TWM495614 U TW M495614U TW 103217123 U TW103217123 U TW 103217123U TW 103217123 U TW103217123 U TW 103217123U TW M495614 U TWM495614 U TW M495614U
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Taiwan
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vacuum chamber
evaporation
tapered
vacuum
conical
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TW103217123U
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Chinese (zh)
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zheng-zhong Hu
zhi-wen Fan
Yuan-Shu Zhong
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Cello Technology Co Ltd
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Priority to TW103217123U priority Critical patent/TWM495614U/en
Publication of TWM495614U publication Critical patent/TWM495614U/en

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Description

錐形真空腔體Conical vacuum chamber

本案為一種錐形真空腔體,尤指利用蒸鍍源之錐形擴散的範圍而設計出之較小容積有利氣體抽真空速度之錐形真空腔體。The present invention is a conical vacuum chamber, especially a conical vacuum chamber with a small volume favorable gas evacuation speed by utilizing the range of conical diffusion of the evaporation source.

習用真空腔體可用於蒸鍍。在真空的腔體中、將欲蒸鍍的材料加熱直至汽化昇華、並使此氣體附著於放置在附近的基板表面上,即可形成一層薄膜。依蒸鍍材料、基板的種類可分為:抵抗加熱、電子束、高周波誘導、雷射等加熱方式。蒸鍍材料有鋁、亞鉛、金、銀、白金、鎳等金屬材料與可產生光學特性薄膜的材料,主要有使用SiO2、TiO2、ZrO2、MgF2等氧化物與氟化物。蒸鍍除金屬外,樹脂與玻璃也可以使用、近年來連紙也變成可蒸鍍。Conventional vacuum chambers can be used for evaporation. A film is formed by heating the material to be evaporated in a vacuum chamber until vaporization sublimates and attaching the gas to the surface of the substrate placed nearby. Depending on the type of vapor deposition material or substrate, it can be classified into heating methods such as resistance heating, electron beam, high-cycle induction, and laser. The vapor deposition materials include metal materials such as aluminum, lead, gold, silver, platinum, and nickel, and materials capable of producing optical properties, and oxides and fluorides such as SiO2, TiO2, ZrO2, and MgF2 are mainly used. In addition to metal, vapor deposition can be used for resin and glass, and in recent years, continuous paper has also become vapor-depositable.

將真空腔體真空化的作用為,蒸鍍材料的分子在到達基板之前,避免與容器內殘存的氣體分子發生衝突,以及可以降低蒸鍍材料的蒸發溫度。一般需要10-3~10-4Pa程度的真空度,要達成真空情況需使用真空幫浦。The vacuum chamber is vacuumed so that molecules of the vapor deposition material avoid collision with gas molecules remaining in the container before reaching the substrate, and the evaporation temperature of the evaporation material can be lowered. Generally, a vacuum of 10-3~10-4Pa is required, and a vacuum pump is required to achieve a vacuum.

習用許多半導體製程通常需要在一個真空的環境下來進 行。例如半導體晶圓之蒸鍍,必須在一個真空腔體來進行,才能確保蒸鍍的品質與良率。Many semiconductor processes are often used in a vacuum environment. Row. For example, vapor deposition of a semiconductor wafer must be performed in a vacuum chamber to ensure the quality and yield of the vapor deposition.

真空腔體必須把腔體抽真空,才能進行相關的製程動作。腔體抽真空的時間與真空腔體的容積成正比。真空腔體的容積愈大,抽真空的時間愈久,真空腔體的容積愈小,抽真空的時間愈短。The vacuum chamber must be evacuated to perform the relevant process actions. The time during which the chamber is evacuated is proportional to the volume of the vacuum chamber. The larger the volume of the vacuum chamber, the longer the vacuum is taken, and the smaller the volume of the vacuum chamber, the shorter the vacuuming time.

真空腔體被抽真空的時間愈短則有利製程的速度提昇,可有效提昇半導體製程的產能及利用率。因此,一般通常是利用較佳的抽氣設備來進行。The shorter the vacuum chamber is evacuated, the faster the process speed is, which can effectively improve the productivity and utilization of the semiconductor process. Therefore, it is generally carried out using a preferred pumping device.

請參照第一圖,其為習用的真空腔體的示意圖,其中包含:真空腔體11、被蒸鍍物載具12、轉軸13、蒸鍍源14、蒸鍍範圍15。 真空腔體11在進行蒸鍍時,必須利用真空幫浦,將真空腔體的空氣抽出,使其內部呈真空狀態。接著,蒸鍍源14的蒸鍍物向上呈錐形擴散,同時轉軸13帶動被蒸鍍物載具12旋轉,被蒸鍍物載具12上則有被蒸鍍物,進而將蒸鍍物鍍於被蒸鍍物表面。Please refer to the first figure, which is a schematic diagram of a conventional vacuum chamber, which includes a vacuum chamber 11, a vapor-deposited carrier 12, a rotating shaft 13, an evaporation source 14, and an evaporation range 15. When the vacuum chamber 11 is subjected to vapor deposition, it is necessary to use a vacuum pump to evacuate the air in the vacuum chamber to bring the inside into a vacuum state. Then, the vapor deposition material of the vapor deposition source 14 is tapered upward, and the rotating shaft 13 is rotated by the vapor deposition material carrier 12, and the vapor deposition material carrier 12 is vapor-deposited, and the vapor deposition material is plated. On the surface of the vapor deposited.

習用的技術具有下列缺點:The conventional technology has the following disadvantages:

習用真空腔體,其形狀為圓筒狀,抽真空時,需要較長的時間,造成製程的產能及利用率無法提昇。The vacuum chamber is conventionally shaped in the shape of a cylinder. When vacuuming, it takes a long time, and the production capacity and utilization rate of the process cannot be improved.

因此,如何改進上述習用的缺點,防止邊緣缺陷,降低軟膜的受損,係為本案所關注者。Therefore, how to improve the above-mentioned shortcomings, prevent edge defects, and reduce the damage of the soft film is the concern of this case.

本案的目的在於提出一新穎且進步的錐形真空腔體,於真空 腔體的形狀上作一改良,使其形狀符合蒸鍍物擴散的錐形範圍,減少真空腔體的容積,進而在抽真空時,可以快速抽真空,以利增加製程的產能。The purpose of this case is to propose a novel and progressive conical vacuum chamber in vacuum The shape of the cavity is modified to conform to the conical range of the diffusion of the vapor deposition material, and the volume of the vacuum chamber is reduced, so that when vacuuming, the vacuum can be quickly evacuated to increase the throughput of the process.

為達上述目的,本案提出一種錐形真空腔體,係用於一真空處理製程,至少包含:一本體,呈錐形,其頂部比底部大;一蒸鍍源,係置於該本體的底部;一被鍍物,係置於該本體的頂部;其中,該蒸鍍源於蒸鍍時,係產生一蒸鍍物,而後該蒸鍍物係呈圓錐形向上擴散,藉以將該蒸鍍物鍍於該被鍍物表面;其中,於蒸鍍時,該本體係被抽成真空,而該本體之錐體較小容積設計係可減少該本體被抽真空的時間。In order to achieve the above object, the present invention proposes a conical vacuum chamber for a vacuum processing process, comprising at least: a body having a taper shape with a top portion larger than the bottom portion; and an evaporation source disposed at the bottom of the body An object to be plated is placed on top of the body; wherein the evaporation is caused by evaporation, and an evaporation is generated, and then the evaporation is conically diffused upward, whereby the evaporation is performed Plating on the surface of the object to be plated; wherein, in vapor deposition, the system is evacuated, and the smaller volume design of the cone of the body reduces the time during which the body is evacuated.

根據本案之錐形真空腔體之構想,其中該真空處理製程係為一半導體真空處理製程。According to the conical vacuum chamber of the present invention, the vacuum processing process is a semiconductor vacuum processing process.

根據本案之錐形真空腔體之構想,其中該蒸鍍源係為一半導體蒸鍍源。According to the conical vacuum chamber of the present invention, the evaporation source is a semiconductor evaporation source.

根據本案之錐形真空腔體之構想,其中該被鍍物係為一半導體晶圓。According to the conical vacuum chamber of the present invention, the object to be plated is a semiconductor wafer.

根據本案之錐形真空腔體之構想,其中該錐形係為一圓錐形,其頂部之直徑大於底部。According to the conical vacuum chamber of the present invention, wherein the tapered system is a conical shape, the diameter of the top portion is larger than the bottom portion.

11‧‧‧真空腔體11‧‧‧Vacuum chamber

12‧‧‧被蒸鍍物載具12‧‧‧ vaporized vehicle

13‧‧‧轉軸13‧‧‧ shaft

14‧‧‧蒸鍍源14‧‧‧vaporation source

15‧‧‧蒸鍍範圍15‧‧‧Extraction range

21‧‧‧錐形真空腔體21‧‧‧Conical vacuum chamber

第一圖為習用的真空腔體示意圖; 第二圖為本案較佳實施例之錐形真空腔體示意圖。The first picture is a schematic view of a conventional vacuum chamber; The second figure is a schematic view of a tapered vacuum chamber of the preferred embodiment of the present invention.

參照第二圖為本案較佳實施例之錐形真空腔體示意圖,其中包含:被蒸鍍物載具12、轉軸13、蒸鍍源14、蒸鍍範圍15及錐形真空腔體21等構件。Referring to the second drawing, a schematic diagram of a tapered vacuum chamber according to a preferred embodiment of the present invention includes: a vapor-deposited carrier 12, a rotating shaft 13, an evaporation source 14, an evaporation range 15, and a conical vacuum chamber 21; .

本案之錐形真空腔體21,係用於一真空處理製程,其本體呈錐形,頂部比底部大。本體裡設有蒸鍍源14及被蒸鍍物載具12。蒸鍍源14係置於錐形真空腔體21的底部。被鍍物係置於頂部被蒸鍍物載具12上,被鍍物可為一半導體晶片或晶圓。The conical vacuum chamber 21 of the present invention is used for a vacuum processing process, the body of which is tapered, and the top is larger than the bottom. A vapor deposition source 14 and a vapor deposition material carrier 12 are provided in the main body. The evaporation source 14 is placed at the bottom of the conical vacuum chamber 21. The object to be plated is placed on the top vapor-deposited carrier 12, which may be a semiconductor wafer or wafer.

蒸鍍源14於蒸鍍時係產生一蒸鍍物,而後該蒸鍍物係呈圓錐形向上在蒸鍍範圍15內擴散,藉以將該蒸鍍物鍍於該被鍍物表面。其中,於蒸鍍時,該錐形真空腔體係被抽成真空,而由於錐形真空腔體比習用圓筒形腔體的較小容積設計,因此可減少該本體被抽真空的時間。The vapor deposition source 14 generates a vapor deposition material during vapor deposition, and then the vapor deposition material diffuses in a conical shape upward in the vapor deposition range 15, whereby the vapor deposition material is plated on the surface of the object to be plated. Wherein, in the evaporation process, the conical vacuum chamber system is evacuated, and since the conical vacuum chamber is designed to have a smaller volume than the conventional cylindrical cavity, the time during which the body is evacuated can be reduced.

本案之錐形真空腔體中,真空處理製程係為一半導體真空處理製程。蒸鍍源係為一半導體蒸鍍源。被鍍物係為一半導體晶圓或晶片等。同時該錐形係為一圓錐形,其頂部之直徑大於底部。In the conical vacuum chamber of the present case, the vacuum processing process is a semiconductor vacuum processing process. The evaporation source is a semiconductor evaporation source. The object to be plated is a semiconductor wafer or wafer. At the same time, the taper is a conical shape with a top portion having a larger diameter than the bottom portion.

由本案錐形真空腔體的錐形設計,可以有效減少腔體的容積,進而在抽真空的程序時,使真空腔體快速達成真空狀態,進而增加半導體製程的產能及設備利用率。The tapered design of the conical vacuum chamber of the present invention can effectively reduce the volume of the cavity, and thus the vacuum chamber can quickly reach a vacuum state during the vacuuming process, thereby increasing the productivity of the semiconductor process and the utilization rate of the device.

本案具有下列優點:This case has the following advantages:

本案所提出的錐形真空腔體設計,可縮小腔體的容積,在抽真空時,快速達真空狀態,進而增加真空蒸鍍等製程的產能及利用率。The tapered vacuum chamber design proposed in this case can reduce the volume of the cavity, and quickly reach the vacuum state when vacuuming, thereby increasing the productivity and utilization rate of the vacuum evaporation process.

綜上所述,本案所提之錐形真空腔體,有效減少腔體的容積,減少抽真空所需的時間,進步新穎且實用,如其變更設計,例如應用至各式真空腔體、採用各種錐形腔體,只要是在真空腔體以錐形的形狀結構呈現者,皆為本案所欲揭露及保護者。In summary, the tapered vacuum chamber proposed in this case effectively reduces the volume of the cavity and reduces the time required for vacuuming. The improvement is novel and practical, such as its modified design, for example, applied to various vacuum chambers, using various The tapered cavity, as long as it is presented in a tapered shape structure in the vacuum chamber, is intended to be disclosed and protected by the present invention.

本案所揭露之技術,得由熟習本技術人士據以實施,而其前所未有之作法亦具備專利性,爰依法提出專利之申請。惟上述之實施例尚不足以涵蓋本案所欲保護之專利範圍,因此,提出申請專利範圍如附。The technology disclosed in this case can be implemented by a person familiar with the technology, and its unprecedented practice is also patentable, and the application for patent is filed according to law. However, the above embodiments are not sufficient to cover the scope of patents to be protected in this case. Therefore, the scope of the patent application is attached.

12‧‧‧被蒸鍍物載具12‧‧‧ vaporized vehicle

13‧‧‧轉軸13‧‧‧ shaft

14‧‧‧蒸鍍源14‧‧‧vaporation source

15‧‧‧蒸鍍範圍15‧‧‧Extraction range

21‧‧‧錐形真空腔體21‧‧‧Conical vacuum chamber

Claims (5)

一種錐形真空腔體,係用於一真空處理製程,至少包含:一本體,呈錐形,其頂部比底部大;一蒸鍍源,係置於該本體的底部;一被鍍物,係置於該本體的頂部;其中,該蒸鍍源於蒸鍍時,係產生一蒸鍍物,而後該蒸鍍物係呈圓錐形向上擴散,藉以將該蒸鍍物鍍於該被鍍物表面;其中,於蒸鍍時,該本體係被抽成真空,而該本體之錐形較小容積設計係可減少該本體被抽真空的時間。A conical vacuum chamber is used for a vacuum processing process, comprising at least: a body having a taper shape with a top portion larger than a bottom portion; an evaporation source disposed at a bottom portion of the body; and a substrate to be plated And being deposited on the top of the body; wherein the evaporation is caused by evaporation, and an evaporation is generated, and then the evaporation is diffused upward in a conical shape, thereby plating the evaporation on the surface of the object to be plated Wherein, in the evaporation process, the system is evacuated, and the tapered small volume design of the body reduces the time during which the body is evacuated. 如申請專利範圍第1項所述之錐形真空腔體,其中該真空處理製程係為一半導體真空處理製程。The tapered vacuum chamber of claim 1, wherein the vacuum processing process is a semiconductor vacuum processing process. 如申請專利範圍第1項所述之錐形真空腔體,其中該蒸鍍源係為一半導體蒸鍍源。The tapered vacuum chamber according to claim 1, wherein the evaporation source is a semiconductor evaporation source. 如申請專利範圍第1項所述之錐形真空腔體,其中該被鍍物係為一半導體晶圓。The tapered vacuum chamber of claim 1, wherein the object to be plated is a semiconductor wafer. 如申請專利範圍第1項所述之錐形真空腔體,其中該錐形係為一圓錐形,其頂部之直徑大於底部。The tapered vacuum chamber of claim 1, wherein the tapered shape is a conical shape having a top portion having a larger diameter than the bottom portion.
TW103217123U 2014-09-25 2014-09-25 Tapered vacuum chamber TWM495614U (en)

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