TWM494307U - Rapid multi-port signal measurement device - Google Patents

Description

Device for quickly measuring multi-signal signals

This creation is about a multi-signal measurement device, especially a fast measurement device suitable for measuring multi-turn RF signals.

With the rapid development of technology and the changing of the modern people's way of life, people's current quality requirements for mobile communication have also increased. In order to achieve better quality mobile communications, well-designed communication systems, antennas and RF components play a very important role. In addition to the design, the test of the sample to be tested is also an extremely important part. In addition to the RF component designed by the test, whether the bandwidth, radiant energy, power output and other requirements meet the standards, it also affects the operation quality of the RF component. One of the important factors.

Wherein, when the test chip has multiple signal outputs, and the signal analyzer has only one single, in order to measure and analyze each output and its individual power output, the conventional technology proposes to use the RF switch and the directional coupler as parts. The method of combining the methods is performed. The measuring step includes: first switching the RF switch to an output port to be measured, then starting the signal analyzer to measure, analyze, and record the test signal, and then switching the RF switch. To the other output to be measured, start the signal analyzer again to measure, analyze and record the test signal, and repeat the above process until all the outputs to be measured are measured.

However, it is worth noting that the measurement process using such a conventional device, the signal The analyzer must wait for the RF switch to switch to each output to be measured before it can be started to complete the measurement and analysis of the signal. Each time an output analyzer is used to measure an output, it takes time to start the instrument, resulting in longer test times and lower test efficiency.

In view of this, the creator feels that the above-mentioned deficiencies can be improved, and based on years of experience in this field, carefully observe and study, and with the use of academics, propose a novel design and effectively improve the above-mentioned defects. In this creation, a measuring device capable of quickly measuring a plurality of signals is disclosed, and the specific structure and implementation manner thereof will be described in detail below.

In order to solve the problems existing in the prior art, one of the aims of the present invention is to provide a device for quickly measuring multi-signal signals, which is to improve the test time of the measuring device and the test efficiency is too low.

Another object of the present invention is to provide a device for quickly measuring multi-turn signals, which uses a control host to simultaneously control the measurement of the RF switch and the signal analyzer, and simultaneously extracts the output signals of all the output ports and utilizes them. The captured signals are analyzed to generate a continuous continuous signal that resolves the power output of each output of the wafer to be tested.

A further object of the present invention is to provide a device for quickly measuring a plurality of signals, which is also suitable for measuring more than one wafer to be tested, and providing a plurality of test modules, wherein each test module is coupled to For each chip to be tested, the control host can also generate a plurality of consecutive signals corresponding to the chips to be tested, thereby increasing the feasibility of practical application.

Therefore, the apparatus for quickly measuring a multi-signal signal according to the present invention includes a control host and at least one test module, wherein the test module is coupled to the control host and the wafer to be tested, and the wafer to be tested has a Enter 埠 and a number of outputs 埠.

According to an embodiment of the present invention, the test module further includes a signal generator, a switch module and a signal analyzer. The signal generator and the switch module are coupled between the control host and the chip to be tested, and the signal analyzer is coupled between the switch module and the control host. Therefore, the control host can control the signal generator to generate a test signal to one of the input chips of the chip to be tested, so that each output of the chip to be tested generates a corresponding one of the output signals.

After that, the control host controls the switch module to switch each output port, so that the signal analyzer can sequentially capture each output signal according to the switching sequence of each output port, and return to the control host after obtaining all the output signals. analysis.

According to an embodiment of the present invention, the control host generates a continuous continuous signal according to the output signals of the output ports. The continuous signal includes output signals of each output port on the same time axis.

Furthermore, the measuring device disclosed in the present invention may further include one or more test modules. When the number of test modules is plural, the control host is coupled to each test module to achieve simultaneous quantities. The purpose of measuring a plurality of chips to be tested.

The purpose of the present invention, the technical content, the features, and the effects achieved by the present invention will be more readily understood by the specific embodiments and the accompanying drawings.

1‧‧‧Samps to be tested

10‧‧‧Control host

20‧‧‧Test module

202‧‧‧Signal Generator

204‧‧‧Switch Module

206‧‧‧Signal Analyzer

Fig. 1 is a schematic diagram of a device for quickly measuring a multi-turn signal according to the present embodiment.

Fig. 2 is a schematic view of a wafer to be tested according to the present embodiment.

Figure 3 is a schematic diagram of the measurement flow according to the present creative embodiment.

Figure 4 is a schematic diagram of controlling successive signals generated by a host in accordance with the present creative embodiment.

Fig. 5 is a comparison of result data of the total measurement time measured by the present creation and the prior art.

Figure 6 is a schematic diagram of an apparatus for rapidly measuring a plurality of signals according to another embodiment of the present creation.

Figure 7A is a schematic diagram of controlling one of the continuous signals output by the host according to the embodiment of Figure 6.

Figure 7B is a schematic diagram of another continuous signal that controls the output of the host in accordance with the embodiment of Figure 6.

Figure 7C is a schematic diagram of another continuous signal that controls the output of the host in accordance with the embodiment of Figure 6.

The above description of the content of the present invention is used to demonstrate and explain the spirit and principle of the present invention, and to provide a further explanation of the scope of the patent application of the present invention. The features, implementations, and effects of the present invention are described in detail below with reference to the preferred embodiment.

In order to facilitate the understanding of the spirit and principle of the present invention, please refer to FIG. 1 , which is a schematic diagram of a device for quickly measuring multi-signal signals according to the present embodiment. The measuring device disclosed in the present invention is for measuring at least one signal of the wafer 1 to be tested, the wafer 1 to be tested has an input 埠Vin and a plurality of outputs 埠V1, V2, V3...Vn-1 , Vn.

The measuring device disclosed in the present invention comprises a control host 10 and at least one test module 20. The test module 20 is electrically coupled between the control host 10 and the wafer 1 to be tested, and the test module 20 includes a signal generator 202, a switch module 204, and a signal analyzer 206. The signal generator 202 can be, for example, a vector signal generator (Vector Signal Generator, VSG), the signal analyzer 206 can be, for example, a Vector Signal Analyzer (VSA). The signal generator 202 and the switch module 204 are respectively coupled between the control host 10 and the wafer 1 to be tested, and the signal analyzer 206 is coupled between the switch module 204 and the control host 10. Therefore, according to the embodiment of the present invention, the control host 10 first controls the signal generator 202 to provide a test signal. As shown in FIG. 2, the test signal is input to the input of the wafer 1 to be tested 埠Vin. . After that, after receiving the test signal, the wafer to be tested 1 separately generates corresponding output signals A, B, and C at the outputs 埠V1, V2, and V3. The test signal and the output signal received and outputted by the chip 1 to be tested may be, for example, a radio frequency (RF) signal.

As shown in FIG. 3, it is a schematic diagram of the measurement process according to the present embodiment. As shown in step S401, the control host 10 starts control and starts the signal analyzer 206 to extract the output signal, and then, as in the step. As shown in S402 to S404, the control host 10 controls the switch module 204 to sequentially switch each output port of the wafer 1 to be tested. According to the embodiment of the present invention, as shown in FIG. 1, the switch module 204 has a plurality of ports 1S1, S2, S3, ..., Sn-1, Sn, each of which is electrically coupled to one of the ports. Output 埠 to switch each output ,, and turn on each output 埠V1, V2...Vn in sequence. For example, when the output 埠V1 is turned on, the signal analyzer 206 captures the output signal A; when the output 埠V1 is turned off and the output 埠V2 is turned on, the signal analyzer 206 captures the output signal. B; When the output 埠V2 is turned off and the output 埠V3 is turned on, the signal analyzer 206 captures the output signal C. Until the output 埠Vn is turned on, and the signal analyzer 206 captures all the output signals, the signal analyzer 206 stops the action of capturing the signal (step S405). Finally, as shown in step S406, after all the output signals have been retrieved, the signal analyzer 206 transmits the output signals back to the control host 10 for analysis.

It should be noted that, in order to solve the problem that the mechanical switch is used for switching and measuring signals, the test module 204 can be selected to use the solid state switch. In order to perform the above switching operation, the solid state switch may be, for example, a diode, a MOS field effect transistor, or a bipolar junction transistor, or the like. However, within the range of allowable test time and number of switching times, the switch module 204 can still be implemented by using a general mechanical switch. The technical idea of the present invention is not based on the implementation of the switch module. limit.

FIG. 4 is a schematic diagram of signals generated after controlling the host analysis according to the present embodiment. As can be seen from FIG. 4, the control host 10 generates a continuous continuous signal according to the output signals, and the continuous signal system is Includes output signals for each output on the same time axis. The chip to be tested shown in Figure 2 of the previous example (haves an input 埠Vin and three outputs 埠V1, V2, V3, and the output signal of output 埠V1 is A, and the output signal of output 埠V2 is B, output 埠When the output signal of V3 is C), the continuous signal can display the output signals A, B, and C sequentially on the same time axis according to the order in which the outputs 埠V1, V2, and V3 are turned on.

Therefore, according to the embodiment of the present invention, when the wafer to be tested 1 has n outputs 埠V1, V2, V3...Vn-1, Vn, the switching time of each output 系 is B, and the signal analyzer 206 is activated. When the time of the signal is A, then the total measurement time required for this creation is (A+B*n), and the unit of measurement time can be as short as seconds, milliseconds (ms) or even microseconds ( Ss) grade. Compared with the prior art, as in the case of the same test condition and the same wafer 1 to be tested, the total time required for the prior art would be (A*n+B*n). It is thus apparent that the measurement time required for the measurement of the multi-signal signal by the measuring device disclosed in the present invention can be greatly reduced and more efficient than the prior art. When the quantity of output 所需 required is measured, the effect is The benefits are more obvious.

Figure 5 is a comparison of the result data of the total measurement time measured by the present invention and the prior art, and it can be clearly seen from the figure that when the number of output defects is 4埠, the use of the present disclosure reveals The measuring device performs multi-signal measurement, and the measuring time is twice as fast as the prior art. As for the case where the number of output defects is increased to 20 ,, the measurement time taken by the creation can be more than three times faster than the prior art. It is thus proved that the measuring device disclosed in the embodiment of the present invention can not only accelerate the measurement speed of the conventionally, but also the effect is more significant and superior to the learning. Know the technology.

In addition, the measuring device disclosed in the present application is not limited to measuring a single wafer to be tested. In other words, with the measuring device disclosed in the present invention, it can be further used to measure more than one wafer 1 to be tested, and the device schematic is as shown in FIG. When the number of the test modules 20 is plural, the control host 10 is electrically coupled to each test module 20, and controls each test module 20 to be connected to each of the tested chips. 1 Performing the measurement procedure of step S401 to step S406, the measurement and analysis of the output signals of the plurality of wafers to be tested 1 can be simultaneously performed, thereby achieving the purpose of rapid measurement and parallel acquisition of multiple signals. In this embodiment, when the number of the wafers 1 to be tested is three, the control host can output the corresponding three consecutive signals VO1, VO2, and VO3, and the respective signal diagrams are as shown in FIG. 7A and FIG. 7B. Figure 7C shows.

Therefore, in summary, the measuring device disclosed in the present invention is an innovative and novel design in the industry today, which has been proven to be one of the time required to effectively eliminate the need to measure multiple signals. Measuring device. According to the technical content of the creation, the measuring device not only initiates the action of controlling the switch module and the analyzer by using a control host, but also reduces the number of times the analog signal analyzer must be repeatedly activated, thereby shortening the test time. . Other than that, The measuring device can capture all the output signals of the wafer to be tested at one time, and accordingly generate a corresponding continuous signal, and use the continuous signal to display the output signals of all the output 一次 on the same time axis, which is fast. Measurements and signals can be presented continuously and continuously.

The embodiments described above are only for explaining the technical idea and characteristics of the present invention, and the purpose thereof is to enable those skilled in the art to understand the contents of the present invention and implement them according to the scope of the patent. That is, the equivalent changes or modifications made by the people in accordance with the spirit revealed by this creation should still be covered by the scope of the patent of this creation.

1‧‧‧Samps to be tested

10‧‧‧Control host

20‧‧‧Test module

202‧‧‧Signal Generator

204‧‧‧Switch Module

206‧‧‧Signal Analyzer

Claims (11)

A device for rapidly measuring a multi-turn signal is used for measuring at least one chip to be tested, the chip to be tested has an input port and a plurality of output ports, and the device for quickly measuring the multi-signal signal comprises: a control host; And the at least one test module is coupled to the control host and the chip to be tested, the test module further includes: a signal generator coupled to the control host and the chip to be tested, the control host controls the signal generator A test signal is generated at the input port, so that each output of the chip to be tested generates a corresponding output signal; a switch module is coupled to the control host and the chip to be tested, and the control host controls the switch module The signal analyzer is coupled to the control unit and the switch module, and the signal analyzer sequentially extracts the outputs of the output ports according to the switching sequence of the output ports. The signal is sent back to the control panel for analysis after extracting all of the output signals. The apparatus for rapidly measuring a multi-signal signal according to claim 1, wherein the control host generates a continuous signal according to the output signals to parse the power output of each of the output ports. The apparatus for rapidly measuring a multi-signal signal as claimed in claim 2, wherein the continuous signal comprises an output signal of each of the output ports on the same time axis. The device of claim 1, wherein the switch module further has a plurality of ports, each of the ports being coupled to the output ports of the chip to be tested for each output.埠 Switch. The device for quickly measuring a multi-signal signal as claimed in claim 1, wherein the signal generator is a vector signal generator (VSG). The device for quickly measuring a multi-signal signal as claimed in claim 1, wherein the signal analyzer is a vector signal analyzer (VSA). The device for quickly measuring a plurality of signals according to claim 1, wherein the number of the output ports is n, the switching time of each of the output ports is B, and the time for starting the signal analyzer is A, The total measurement time for all of these output signals is (A+B*n). The apparatus for rapidly measuring a multi-signal signal as claimed in claim 7, wherein the unit of the total measurement time is seconds, milliseconds or microseconds. The device for quickly measuring a plurality of signals according to claim 1, wherein the number of the test modules is plural, and the test modules are corresponding to measuring a plurality of the chips to be tested. The device for quickly measuring a multi-signal signal as claimed in claim 1, wherein the test signal and the output signal are radio frequency signals. The device for quickly measuring a multi-signal signal as claimed in claim 1, wherein the switch module is a solid state switch, a mechanical switch or an RF switch.