TWM483427U - Vertical type probe device and supporting pillars used in the vertical type probe device - Google Patents

Description

Vertical probe device and support column for the vertical probe device

This creation is related to probe cards, particularly with respect to a vertical probe device for use with a probe card, and a support column for use with the vertical probe device.

Please refer to the patent of the Chinese Patent No. I299085. The conventional vertical probe device comprises a probe base composed of upper and lower guide plates or upper, middle and lower guide plates, and one between the upper and lower guide plates. a positioning piece, and a plurality of probes each having a head disposed on the upper and lower positioning plates, a tail portion disposed on the lower guide plate, and a space between the upper and lower guide plates The curved body of the space, the tail of the probes can be moved up and down when contacting the components to be tested with different heights to achieve the effect of finely adjusting the height of the tip, and the positioning piece is used to detect the upper guide when the upper guide is not installed. Position the needle head to avoid skewing the probe and making the upper guide difficult to install.

A positioning piece mounting aspect of the prior art is such that the positioning piece is suspended in the accommodating space. However, when the upper guide plate is to be removed when the probe is to be replaced, the positioning piece is easily flipped together, and possibly simultaneously Pulling the probe up increases the time cost of reinstalling the pulled probe and can cause damage to the probe.

Another type of positioning piece used in the prior art is to fix the positioning piece on the top surface of the lower guiding plate, so that the problem that the positioning piece is turned up as described above can be avoided, but the positioning piece cannot be slightly pressed when the probe is stressed. The displacement causes the probe to withstand large stresses and is more susceptible to damage.

The vertical probe device provided by the aforementioned patents places the positioning piece on the lower guide plate and provides a small distance between the upper and lower guide plates, so that the positioning piece can be slightly displaced, and in addition, the positioning piece can be If necessary, it is fixed to the lower guide by screws, so that the positioning piece can be prevented from being turned up when the upper guide is removed. However, the circuit board or space converter to which the top surface of the guide plate is connected may require electronic components to be mounted. In this case, the top of the probe device needs to have a space for accommodating the electronic component, but the setting The area of the electronic component often interferes with the block in which the positioning piece is fixed to the lower guide. Therefore, the vertical probe device provided by the aforementioned patent is difficult to apply to the condition in which the top portion needs to accommodate the electronic component.

In addition, please refer to the patent of the Japanese Patent Publication No. 201120452, which installs a maintenance device in the probe device to fix the positioning piece by the maintenance device to prevent the positioning piece from being turned up, however, the maintenance device can be The function of fixing the positioning piece is achieved, but the structure is slightly larger, so that the structure is slightly complicated and the installation is time consuming.

In view of the above-mentioned deficiencies, the main object of the present invention is to provide a vertical probe device and a support column for the vertical probe device, wherein the support column can prevent the positioning piece of the vertical probe device from being turned over. And the positioning piece can be slightly displaced to make the probe difficult to damage, and the vertical probe device is simple in structure, easy to install, and suitable for the condition that the top part needs to accommodate electronic components.

In order to achieve the above object, the vertical probe device provided by the present invention comprises a lower guide plate having a plurality of snap holes and a plurality of probe mounting holes, a positioning piece having a plurality of limit holes and a plurality of probe mounting holes, and a plurality of The probes are respectively disposed on the probe mounting holes of the lower guide plate and respectively pass through the probe mounting holes of the positioning piece, and the plurality of support columns, and the support columns are sequentially connected a head portion, a neck portion, a body portion and a tail portion, wherein at least one of the support column heads has an upper stop surface, and at least one of the remaining support column portions has a lower stop surface, the support The neck portions of the column are respectively disposed in the limiting holes of the positioning piece, and the length of the neck of each of the supporting columns is greater than the thickness of the positioning piece, and the positioning piece is movably limited to the supporting columns. Between the stop surface and the lower stop surface, the tail portions of the support columns are engaged with the engaging holes of the lower guide plate.

Thereby, the positioning piece maintains a stable connection relationship with the lower guiding plate by the supporting columns, when the user needs to disassemble and fix the lower guiding plate and pass the probe through the upper guiding plate. The support columns can prevent the positioning piece from being picked up in conjunction. Moreover, the positioning piece can be slightly displaced between the support post and the lower stop surface by the support post, so that the probe can be prevented from being subjected to excessive stress when contacting the test object. damage. In addition, the vertical probe device has a simple structure and is easy to install, and the support columns occupy a small space, so that a space around the probe for accommodating electronic components may be required.

The detailed construction, features, assembly or use of the vertical probe device provided by the present invention and the support column used in the vertical probe device will be described in the detailed description of the subsequent embodiments. However, those of ordinary skill in the art should understand that the detailed description and specific embodiments of the present invention are merely used to illustrate the present invention and are not intended to limit the scope of the patent application.

10‧‧‧Vertical probe device

12‧‧‧ accommodating space

14‧‧‧ probe area

20‧‧‧Upper Guide

22‧‧‧ Probe mounting hole

24‧‧‧ accommodating holes

30‧‧‧ lower guide

31‧‧‧Upper components

32‧‧‧lower components

34‧‧‧Card hole

36‧‧‧Probe mounting holes

40‧‧‧ Positioning film

42‧‧‧Limited holes

422‧‧‧Straits

424‧‧‧Expanding Department

44‧‧‧ Probe mounting hole

442‧‧‧Straits

444‧‧‧Expansion Department

50‧‧‧ probe

52‧‧‧ head

54‧‧‧ Body

56‧‧‧ tail

60A~E‧‧‧Support column

62‧‧‧ head

622‧‧‧Upper stop surface

64‧‧‧ neck

66‧‧‧ Body

662‧‧‧ Lower stop surface

664‧‧‧ bottom

666‧‧‧stop section

668‧‧‧Extended section

68‧‧‧ tail

End of 682‧‧‧

684‧‧‧"

686‧‧‧ card pin

688‧‧‧ Barb

70‧‧‧Support column

72‧‧‧ head

74‧‧‧ neck

76‧‧‧ Body

78‧‧‧ tail

782‧‧‧Support feet

784‧‧‧ Barb

786‧‧‧Flexible section

D1‧‧‧Longitudinal direction

D2‧‧‧ tilt direction

Θ‧‧‧ angle

1 is a cross-sectional view of a vertical probe device according to a first preferred embodiment of the present invention; and FIG. 2 is a partially enlarged view of a portion A of FIG. 1; FIG. 3 is a schematic top plan view of the vertical probe device provided by the first preferred embodiment, but the upper guide plate of one of the vertical probe devices is removed for explanation; FIG. 4 and FIG. 5 is a perspective view showing a positioning piece, a probe and a supporting column of the vertical probe device provided by the first preferred embodiment, and showing the mounting manner thereof; FIG. 6 is the creation of the present invention. A perspective view of a support column provided by the first preferred embodiment; FIGS. 7 and 8 are similar to FIG. 3, but showing that the vertical probe device provided by the present invention has two kinds of multiple probe regions. Embodiments of the present invention; FIGS. 9 to 12 are perspective views of the support columns provided in the second to fifth preferred embodiments of the present invention; and FIG. 13 is a vertical view of the sixth preferred embodiment of the present invention. A schematic cross-sectional view of a probe device.

The Applicant first describes the same or similar elements or structural features thereof in the embodiments and the drawings which will be described below.

Please refer to FIG. 1 to FIG. 3 . The vertical probe device 10 provided by the first preferred embodiment includes an upper guide 20 , a lower guide 30 , a positioning piece 40 , and a plurality of probes 50 . And a plurality of support columns 60A.

The upper guide plate 20 is locked to the lower guide plate 30 by screws (not shown), and an accommodation space 12 is formed therebetween. In this embodiment, the lower guide plate 30 is a two-piece design including an upper member 31 and a lower member 32 fixed to each other by screws (not shown); however, the lower guide plate 30 can also The one-piece design means that the upper and lower members 31, 32 can be integrally formed. The upper guide plate 20 has a plurality of probe mounting holes 22 having a plurality of snap holes 34 and a plurality of probe mounting holes 36.

The positioning piece 40 is a flexible insulating sheet having a plurality of limiting holes 42 and a plurality of probe mounting holes 44. As shown in FIG. 4 and FIG. 5, each of the limiting hole 42 and the probe mounting hole 44 has the same shape, and has an elongated portion 422, 442 having a narrow rectangular shape, and a central portion of the elongated portion 422, 442. Round flared portions 424, 444.

Each of the probes 50 is a conventional vertical probe having a head portion 52, a body portion 54 and a tail portion 56. The head portion 52 and the tail portion 56 are straight and parallel to each other. The body portion 54 is curved such that the head portion 52 and the tail portion 56 at the two ends thereof are not located on the same axis, and the body portion 54 has a narrow rectangular (or elliptical) cross section.

Referring to FIGS. 2 and 6, each of the support posts 60A has a head 62, a neck portion 64, a body portion 66, and a tail portion 68 in sequence. The head portion 62 is a cube having a slit shape perpendicular to a longitudinal direction D1, and a bottom surface of the head portion 62 substantially perpendicular to the longitudinal direction D1 is an upper stop surface 622. The neck portion 64 extends from the upper stop surface 622 in the longitudinal direction D1, and each of the cross sections perpendicular to the longitudinal direction D1 of the neck portion 64 has a side length and the upper stop surface 622. The square with the short sides being equal. The body portion 66 is curved and extends from the neck portion 64 in an oblique direction D2. The oblique direction D2 has an acute angle θ with the longitudinal direction D1, and the body portion 66 is perpendicular to the longitudinal direction. Each of the sections D1 has a long rectangular shape, and the short side is substantially equal to the short side of the upper stop surface 622, and the long side is smaller than and perpendicular to the long side of the upper stop surface 622, and the body 66 One of the top surfaces substantially perpendicular to the longitudinal direction D1 is a lower stop surface 662. The tail portion 68 extends from a bottom surface 664 of the body portion 66 substantially perpendicular to the longitudinal direction D1, and extends in a direction substantially parallel to the longitudinal direction D1, the tail portion 68 being perpendicular to the longitudinal direction Each of the sections in the longitudinal direction D1 is smaller than the bottom surface 664.

The positioning piece 40, the probes 50 and the supporting columns 60A are attached to the upper guiding plate The heads 52 of the probes 50 are respectively inserted through the probe mounting holes 44 of the positioning piece 40, and the probes are respectively mounted on the lower guide plate 20. The tail portions 56 of the 50 are respectively disposed in the probe mounting holes 36 of the lower guide plate 30. The neck portions 64 of the support posts 60A are respectively disposed through the limiting holes 42 of the positioning piece 40, and the support posts 60A. The tail portions 68 are respectively engaged with the latching holes 34 of the lower guide plate 30.

In detail, the probe mounting hole 44 and the limiting hole 42 of the positioning piece 40 are just enough for the probe 50 and the body portions 54, 66 of the support post 60A to pass through, and each of the probe 50 and the support post 60A The probe mounting holes 44 and the limiting holes 42 of the positioning piece 40 are passed through the tail portions 56 and 68 and the body portions 54 and 66, so that the head 52 of each of the probes 50 and each of the supporting columns 60A are The neck portion 64 is located at the limiting hole 42 and the expanded portions 424, 444 of the probe mounting hole 44, as shown in FIG. The neck portion 64 of the support post 60A and the head portion 52 of the probe 50 are rotatable in the limiting hole 42 and the expanding portions 424 and 444 of the probe mounting hole 44. Therefore, each of the probe 50 and the supporting column The 60 can be rotated by about 90 degrees to be in the state shown in FIG. 5, so that the probe 50 and the support post 60 cannot be pushed upward to disengage from the positioning piece 40. In addition, the length of the neck portion 64 of each of the support posts 60A is greater than the thickness of the positioning piece 40, and the upper and lower stop faces 622, 662 of the support post 60A face each other across the positioning piece 40, Therefore, the positioning piece 40 can be restricted between the support posts 60A and the lower stop faces 622, 662 with a slight up and down movement.

When the upper guide 20 is mounted on the lower guide 30, the head 52 of the probe 50 passes through the probe mounting hole 22 of the upper guide 20, so that when the vertical probe is used When the device 10 is disposed at the bottom of a circuit board or a space converter (not shown) to form a probe card, the portion of the head 52 of the probe 50 protruding from the upper guide 20 is used for The contacts of the circuit board or the space transformer are electrically connected, and the tail portion 56 of the probes 50 protrudes from the portion of the lower guide 30 It is used to touch the contact of the object under test.

When the vertical probe device 10 needs to be replaced, the upper guide 20 can be detached from the lower guide 30. At this time, since the positioning piece 40 is supported by the support posts 60A, The lower guide plate 30 maintains a stable connection relationship. The support posts 60A can prevent the positioning piece 40 from being picked up in a detached manner when the upper guide plate 20 is detached, and the probes 50 can be prevented from being accidentally pulled up.

The support posts 60A can prevent the positioning piece 40 from being turned up, and can slightly displace the positioning piece 40 between the support posts 60A and the lower stop faces 622, 662, thereby avoiding the probe 50. It is easily damaged due to excessive stress when it comes into contact with the test object. Moreover, the vertical probe device 10 is simple in structure and easy to install, as long as the support posts 60A are mounted by a similar mounting method when the probes 50 are mounted. In addition, the support columns 60A can be relatively close to the probe 50 and occupy a small space. The positioning piece 40 is suspended in the accommodating space 12 by the support columns 60A, and does not need to extend to the upper and lower guide plates. Wherein 20, 30 meet; thereby, when the circuit board or space converter disposed at the top of the vertical probe device 10 has downwardly protruding electronic components, the upper guide 20 may be provided to accommodate the electronic The accommodating hole 24 of the component (such as the recess 24 shown in FIG. 1 , which may also be a through hole), in other words, the design of the present invention allows the space around the probe 50 to be used to accommodate the electronic component, so Applicable to the condition of the top of the vertical probe device to accommodate electronic components.

It is worth mentioning that the vertical probe device 10 has a probe region 14 defined by the probes 50 (as shown in FIG. 3), and the support columns 60A are located in the probe region 14 In the periphery, such a manner of arrangement can support the positioning piece 40 quite effectively. The creation may also have a plurality of probe zones 14 for use in probes capable of simultaneously spotting multiple test objects (Multi-DUTs). The card, for example, the vertical probe device shown in Figures 7 and 8 has a four-probe zone 14 for simultaneously spotting four Device Under Tests (DUTs). In the aspect shown in FIG. 7, the probe regions 14 share the same positioning piece 40, and a portion of the support columns 60A are located at the periphery of two adjacent probe regions 14, that is, two adjacent probes. Only one row of support columns 60A need to be provided between the zones 14, in such a manner as to reduce the number of support columns 60A and the space occupied by them. The state shown in FIG. 8 is respectively disposed on the probe regions 14 by using four positioning pieces 40, and each two adjacent positioning pieces 40 are partially overlapped, and in this aspect, a part of the supporting columns can also be made. 60A is located on the periphery of two adjacent probe zones 14 to achieve good locator support with fewer support posts 60A, and the neck 64 of the support post 60A located at the periphery of the two adjacent probe zones 14 is traversed. Two-positioned positioning piece 40.

The vertical probe device 10 can also adopt the support post 60B provided by the second preferred embodiment of the present invention as shown in FIG. 9, which is different from the support post 60A described above in that the support post 60B The cross-sectional shape of the body portion 66 perpendicular to the longitudinal direction D1 is substantially the same as that of the neck portion 64, and thus does not have a top surface capable of blocking the positioning piece 40, and the stop surface 662 below the support post 60B. A side surface of the body portion 66 extending from the neck portion 64 in the oblique direction D2, the lower stop surface 662 is not parallel to the upper stop surface 622 but substantially faces the upper stop surface 622 Yes, the positioning piece 40 can be limited between the upper and lower stop faces 622, 662.

It should be noted that in the second preferred embodiment and the embodiments to be described below, the longitudinal direction D1 is defined as described above and as shown in FIG. 2, the neck 64 is From the direction in which the head 62 extends, the oblique direction D2 is also defined as described above and as shown in Fig. 2, has an acute angle θ with the longitudinal direction D1.

The vertical probe device 10 can also adopt the support column 60C provided by the third preferred embodiment of the present invention as shown in FIG. 10, which is different from the support column 60A described above. The body portion 66 of the support post 60C extends from the neck portion 64 in the longitudinal direction D1, that is, the body portion 66 is not curved.

The vertical probe device 10 can also adopt the support post 60D provided by the fourth preferred embodiment of the present invention as shown in FIG. 11 , which differs from the support post 60C described above in that the support post 60C The cross-section of the body portion 66 perpendicular to the longitudinal direction D1 is substantially the same shape as the lower stop surface 662, and the body portion 66 of the support post 60D has a blocking portion 666 and an extending portion 668. The lower stop surface 662 is located in the stop portion 666. The cross-section of the extended portion 668 perpendicular to the longitudinal direction D1 is smaller than the lower stop surface 662.

The vertical probe device 10 can also adopt the support post 60E provided by the fifth preferred embodiment of the present invention as shown in Fig. 12, and the body portion 66 has the same body 66 as the support post 60D. The blocking section 666 having a larger cross-sectional area and the extending section 668 having a smaller cross-sectional area, but the extending section 668 of the supporting post 60E extends from the blocking section 666 toward the oblique direction D2.

The tail portions 68 of the various support columns described above can also be designed as shown in Figures 11 and 12, having a split groove 684 that is open at its end 682, and separated by the split groove 684 and elastic. The second latching pin 686 is swung; thereby, the tail portion 68 can be squeezed into the latching hole 34 of the lower guiding plate 30 by the external force of the two latching pins 686, so as to be more firmly stuck in the latching The hole 34 is inside to avoid rotation of the support column. In addition, the tail portion 68 can further have two barbs 688 at the ends of the two card pins 686 to limit the lower guide plate 30 between the bottom surface 664 of the body portion 66 and the barbs 688, such that each The tail portion 68 of the support post is less susceptible to detachment from the lower guide plate 30.

Referring to FIG. 13 , a vertical probe device according to a sixth preferred embodiment of the present invention uses another support column 70 having a head 72 connected in sequence. a neck portion 74, a body portion 76 and a tail portion 78, the head portion 72 is elastically and compressibly passed through the limiting hole 42 of the positioning piece 40, so that the neck portion 74 is disposed through the limiting hole 42 and The positioning piece 40 is limited between the head 72 and the body 76. The tail portion 78 of the support column 70 includes two support legs 782, two barbs 784 respectively located at the ends of the two support legs 782, and an elastic section 786 between the two support legs 782. The two barbs 784 are The lower guide plate 30 is pressed between the elastic section 786 and the two barbs 784 by elastically compressively passing through the two engaging holes 34 of the lower guide plate 30. Thereby, the support column 70 can also achieve the effect of the support post 60A as described in the first preferred embodiment.

In each of the foregoing embodiments, each of the support columns has a substantially opposite upper and lower stop faces across the positioning piece. However, each of the support columns may have only a stop surface above the head or a stop surface below the body, as long as a part of the support column has an upper stop surface to limit the positioning piece to the upper end. Below the stop surface, and the remaining support columns have a lower stop surface to limit the positioning piece above the lower stop surface. In other words, the support column provided by the present invention may not have the upper stop surface. For example, the head 62 of the support columns 60A-E provided in the first to fifth preferred embodiments may not have a long rectangular shape but a cross-sectional area. The shape is smaller than the neck portion 64, or the cross-sectional area is the same as the neck portion 64 and is in continuous shape. Alternatively, the support column provided by the present invention may not have the lower stop surface. For example, the body portion 66 of the support post 60D provided in the fourth preferred embodiment may not have the stop portion 666, so that the extension region Segment 668 is in continuous shape with the neck 64.

Finally, it must be explained again that the constituent elements disclosed in the foregoing embodiments are merely illustrative and are not intended to limit the scope of the present invention. Alternatives or variations of other equivalent elements should also be the scope of patent application of the present application. Covered.

10‧‧‧Vertical probe device

12‧‧‧ accommodating space

20‧‧‧Upper Guide

22‧‧‧ Probe mounting hole

24‧‧‧ accommodating holes

30‧‧‧ lower guide

31‧‧‧Upper components

32‧‧‧lower components

34‧‧‧Card hole

36‧‧‧Probe mounting holes

40‧‧‧ Positioning film

50‧‧‧ probe

52‧‧‧ head

54‧‧‧ Body

56‧‧‧ tail

60A‧‧‧Support column

62‧‧‧ head

66‧‧‧ Body

68‧‧‧ tail

Claims (19)

A vertical probe device comprises: a lower guide plate having a plurality of card connection holes and a plurality of probe mounting holes; a positioning piece having a plurality of limit holes and a plurality of probe mounting holes; and a plurality of probes respectively a probe mounting hole disposed in the lower guide plate, and respectively disposed through the probe mounting hole of the positioning piece; and a plurality of support columns, each of the support columns having a head, a neck, and a body in sequence And a tail portion, wherein at least one of the support columns has an upper stop surface, and at least one of the support columns has a lower stop surface, and the neck portions of the support columns are respectively disposed at the positioning portion a limiting hole of the sheet, wherein a length of the neck of each of the supporting columns is greater than a thickness of the positioning piece, and the positioning piece is movably disposed between the blocking surface and the lower stop surface of the supporting column; The tail portions of the support columns are engaged with the engaging holes of the lower guide plate. The vertical probe device of claim 1, wherein each of the support columns has the upper stop surface and the lower stop surface, and each of the support columns has a stop surface and a lower stop surface. It faces substantially across the positioning piece. The vertical probe device of claim 1, wherein each of the limiting holes has an elongated portion through which the body portion of the support column passes, and an expansion portion located at a center of the elongated portion. The neck of the support column is rotatably disposed at the expansion of the limit holes. The vertical probe device of claim 1, having at least one probe region defined by the probes, the support columns being located at the periphery of the probe region. The vertical probe device of claim 4, having a plurality of the probe regions, a portion of the support columns being located at the periphery of the two adjacent probe regions. The vertical probe device of claim 5, comprising a plurality of the positioning pieces respectively located in the probe areas, each of the two adjacent positioning pieces being partially overlapped and located at two adjacent probes The neck of the support column at the periphery of the zone passes through the two spaced apart positioning tabs. The vertical probe device of claim 1, further comprising a fixed to the lower guide plate and passing the probe through the upper guide plate, wherein the upper guide plate is provided with an electronic device for receiving an electronic device The accommodating hole of the component. A support column is disposed in a vertical probe device including a lower guide plate and a positioning piece for supporting the positioning piece suspended above the lower guide plate; the support column has a sequence Connecting a head portion, a neck portion for inserting a limiting hole in the positioning piece and having a length greater than a thickness of the positioning piece, a body portion, and a locking hole for engaging with one of the lower guiding plates The support post further includes a stop surface above the head, a stop surface below the body, and a stop surface above the head and a substantially planar surface One of the three blocking surfaces below the upper stop surface is configured to movably limit the positioning piece to the neck portion. The support column of claim 8, wherein the neck portion extends from the head toward a longitudinal direction, the body extending from the neck toward an oblique direction, the tilting direction and the The longitudinal direction has an angle of an acute angle, the support post has the lower stop surface and the lower stop surface is a top surface of the body substantially perpendicular to the longitudinal direction. The support column of claim 8, wherein the neck portion extends from the head toward a longitudinal direction, the body extending from the neck toward an oblique direction, the tilting direction and the The longitudinal direction has an angle of an acute angle, the support post has the lower stop surface and the lower stop surface is a side of the body extending from the neck toward the oblique direction. The support column of claim 8, wherein the neck portion extends from the head in a longitudinal direction, the body extending from the neck portion in the longitudinal direction. The support post according to claim 11, having the lower stop surface and the lower stop surface being a top surface of the body substantially perpendicular to the longitudinal direction, the body being perpendicular to the Each cross section in the longitudinal direction is substantially the same shape as the lower stop surface. The support column of claim 11, wherein the body has a stop portion and an extended portion, the support post has the lower stop surface and the lower stop surface is located in the stop region And a section of the extension section perpendicular to the longitudinal direction is substantially smaller than the lower stop surface. The support column of claim 8, wherein the neck portion extends from the head toward a longitudinal direction, the body portion has a stop portion connected to the neck portion, and a An extending portion extending from the blocking portion in an oblique direction, the inclined direction having an acute angle with the longitudinal direction, the supporting column having the lower stopping surface, wherein the lower stopping surface is located in the blocking region The segment is a top surface of the body that is substantially perpendicular to the longitudinal direction, and each of the sections of the extending section perpendicular to the longitudinal direction is substantially smaller than the lower stop surface. The support post according to any one of claims 9 to 14, which has the upper stop surface, and the neck portion extends from the upper stop surface in the longitudinal direction. The support column according to any one of claims 9 to 14, wherein the body has a substantially perpendicular direction to the longitudinal direction and abuts against a bottom surface of the lower guide, the tail is The bottom surface extends substantially parallel to the longitudinal direction. The support column according to any one of claims 9 to 14, wherein the tail portion has an end, an open groove at the end, and is separated by the split groove and elastically swingable. Two card pins. The support column of claim 17, wherein the tail portion has two barbs respectively located on the two card pins. The support column of claim 8, wherein the head portion is elastically compressively passed through the limiting hole of the positioning piece, the tail portion comprising two supporting legs and two barbs respectively located at the ends of the two supporting legs And an elastic section between the two supporting legs, the two barbs elastically compressively pass through the two engaging holes of the lower guiding plate, so that the lower guiding plate is pressed against the elastic section and Between the two barbs.