TWM483263U - Die sucking rail with replaceable sucking sections - Google Patents
Die sucking rail with replaceable sucking sections Download PDFInfo
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- TWM483263U TWM483263U TW102224514U TW102224514U TWM483263U TW M483263 U TWM483263 U TW M483263U TW 102224514 U TW102224514 U TW 102224514U TW 102224514 U TW102224514 U TW 102224514U TW M483263 U TWM483263 U TW M483263U
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Description
本創作係關於一種可更換式吸料段之晶粒吸料軌道,尤指一種適用於半導體晶粒檢測設備之進料軌道。This creation relates to a die suction track for a replaceable suction section, and more particularly to a feed track suitable for use in a semiconductor die inspection apparatus.
請參閱第1圖,圖1係習知晶粒檢測設備之進料模組的俯視圖。如第1圖所示,晶粒檢測設備Ti之進料模組Fc主要包括一喂料盤6、及一進料軌道7,其中藉由喂料盤6產生震動力使晶粒C循序經由進料軌道7進給至吸料機構8處,而吸料機構8吸取晶粒C後移至檢測裝置81(探針)處以進行測試。Please refer to FIG. 1 , which is a top view of a feed module of a conventional grain inspection apparatus. As shown in FIG. 1, the feeding module Fc of the grain detecting device Ti mainly includes a feeding tray 6 and a feeding rail 7, wherein the feeding force is generated by the feeding tray 6, and the crystal grains C are sequentially passed through. The material track 7 is fed to the suction mechanism 8, and the suction mechanism 8 sucks the crystal grains C and moves to the detecting device 81 (probe) for testing.
再請參閱第2圖,第2圖係習知吸料機構與進料軌道之局部側視圖。如第2圖所示,當晶粒C進給到進料軌道7末端時,吸料機構8會下降接觸晶粒C並將之吸取而進行移載。另一方面,常見的晶粒種類中,晶粒的四周緣會設有類似玻璃材質之絕緣材料,其具有高強度、耐壓、及絕緣之特性。然而,當檢測機台經過長時間的運轉之後,因吸料機構8不斷地吸取晶粒C,且晶粒C本身具有高強度之玻璃絕緣材料,將導致進料軌道7損耗、凹陷,而造成晶粒無法正常定位之情形。Referring again to Figure 2, Figure 2 is a partial side elevational view of a conventional suction mechanism and feed track. As shown in Fig. 2, when the crystal grain C is fed to the end of the feed rail 7, the suction mechanism 8 is lowered in contact with the crystal grain C and sucked for transfer. On the other hand, in the common crystal grain type, the peripheral edge of the crystal grain is provided with an insulating material similar to glass, which has high strength, withstand voltage, and insulation properties. However, after the detection machine has been operated for a long time, the suction mechanism 8 continuously sucks the crystal grains C, and the crystal grain C itself has a high-strength glass insulation material, which will cause the feed rail 7 to be worn and sunken, resulting in The case where the grain cannot be properly positioned.
此外,如第1圖所示,習知的進料軌道7係直接固定於機台上,其通常透過螺栓9與螺孔直接鎖附的方式,無法對進料軌道7之位置進行調整。然而,當面臨對檢測不同尺寸的晶粒、或欲對進料軌道7進一步的加工時,將無法調整進料軌道7之位置,而必須重新製備一全新的進料軌道7,造成成本上的耗費。Further, as shown in Fig. 1, the conventional feed rail 7 is directly fixed to the machine table, and it is usually impossible to adjust the position of the feed rail 7 by directly locking the bolt 9 and the screw hole. However, when faced with the detection of different sized grains, or the further processing of the feed track 7, the position of the feed track 7 cannot be adjusted, and a completely new feed track 7 must be reworked, resulting in a cost Cost.
由此可知,一種可以局部地更換已損耗、凹陷的部分,而無須淘汰整個進料軌道 ,並可適時地調整進料軌道之位置之可更換式吸料段之晶粒吸料軌道實為產業上迫切的需求者。It can be seen that the die suction track of the replaceable suction section which can replace the worn and recessed parts locally without having to eliminate the entire feed track and adjust the position of the feed track in time is actually an industry. An urgent demander.
本創作之主要目的係在提供一種可更換式吸料段之晶粒吸料軌道,當因吸料軌道局部損耗而影響正常使用時,可局部地更換已損耗、凹陷的部分,而無須淘汰整個進料軌道,以降低成本、及資源上的耗費。The main purpose of this creation is to provide a die suction track of a replaceable suction section. When the normal loss of the suction track affects normal use, the worn and recessed parts can be partially replaced without eliminating the entire part. Feed rails to reduce costs and resource costs.
為達成上述目的,本創作一種可更換式吸料段之晶粒吸料軌道,主要包括一吸料段、及一軌道本體。其中,吸料段包括一第一導引側壁、及一吸料平台,而第一導引側壁係鄰接於吸料平台之一側緣並向上凸出於吸料平台;另外,軌道本體包括一第二導引側壁、及一進料平台,而第二導引側壁係鄰接於進料平台之一側緣並向上凸出於進料平台。再者,吸料段係可拆卸式地組設於軌道本體之一側端,且吸料段之第一導引側壁、及吸料平台分別對應連接於軌道本體之第二導引側壁、及進料平台。據此,本創作之吸料段可因應因長久使用後所產生之表面損耗而進行更換,無須整個吸料軌道淘汰,俾利成本上的降低、及減少資源浪費。In order to achieve the above object, the present invention creates a die suction track of a replaceable suction section, which mainly comprises a suction section and a rail body. The suction section includes a first guiding sidewall and a suction platform, and the first guiding sidewall is adjacent to a side edge of the suction platform and protrudes upwardly from the suction platform; in addition, the rail body includes a The second guiding sidewall and a feeding platform are adjacent to one of the side edges of the feeding platform and protrude upwardly from the feeding platform. Furthermore, the suction section is detachably assembled to one side end of the rail body, and the first guiding side wall of the suction section and the suction platform are respectively connected to the second guiding side wall of the rail body, and Feeding platform. Accordingly, the suction section of the creation can be replaced according to the surface loss caused by long-term use, without the elimination of the entire suction rail, the reduction of the profit margin, and the reduction of resource waste.
較佳的是,本創作之吸料段可為一L型構件,其可包括一吸料側、及一固定側,而第一導引側壁、及吸料平台可位於吸料側。另外,本創作之晶粒吸料軌道可更包括一鎖附螺栓,且吸料段之固定側上可開設一貫穿孔,而軌道本體之側端上可開設一螺孔,鎖附螺栓可穿經吸料段之貫穿孔並鎖附於軌道本體之螺孔。據此,本創作可藉由鎖附螺栓螺鎖的固定方式來將吸料段組設於軌道本體上,此一固定方式簡單、穩定、且拆裝便利。Preferably, the suction section of the present invention can be an L-shaped member, which can include a suction side and a fixed side, and the first guiding side wall and the suction platform can be located on the suction side. In addition, the die suction track of the present invention may further comprise a locking bolt, and a constant perforation may be formed on the fixed side of the suction section, and a screw hole may be formed on the side end of the rail body, and the locking bolt can be worn through. The through hole of the suction section is locked to the screw hole of the rail body. Accordingly, the creation of the suction section can be set on the rail body by the fixing method of the bolt bolt, which is simple, stable, and convenient to assemble and disassemble.
再者,本創作之軌道本體之側端上可凸設一定位銷,而吸料段之固定側上可開設一定位孔,軌道本體之定位銷插設於吸料段之定位孔。據此,本創作進一步可藉由定位銷及定位孔的方式來固定吸料段與軌道本體,其與螺栓構成二固定點,可穩固結合吸料段與軌道本體,使吸料段不會因為單靠螺栓鎖附而輕易產生轉動或晃動。Furthermore, a positioning pin can be protruded from the side end of the main body of the present invention, and a positioning hole can be formed on the fixed side of the suction section, and the positioning pin of the rail body is inserted into the positioning hole of the suction section. Accordingly, the present invention can further fix the suction section and the rail body by means of the positioning pin and the positioning hole, and the bolt and the bolt form two fixed points, and can stably combine the suction section and the rail body, so that the suction section is not caused by It is easy to rotate or shake by bolts alone.
另外,本創作之軌道本體之側端上可凸設一定位台,且吸料段之固定側上可凹設一定位槽,而軌道本體之定位台可容設於吸料段之定位槽內。據此,本創作可另外透過定位台與定位槽之設計,可更穩固地結合吸料段與軌道本體,且亦有助於裝配吸料段時之定位。In addition, a positioning platform can be protruded from the side end of the track body of the present invention, and a positioning groove can be recessed on the fixed side of the suction section, and the positioning platform of the rail body can be accommodated in the positioning groove of the suction section . Accordingly, the design can additionally integrate the suction section and the rail body through the design of the positioning table and the positioning groove, and also helps to locate the suction section.
再且,本創作之軌道本體可更包括一固定台,其係鄰接於進料平台,且固定台上可開設至少一鎖附長槽。其中,鎖附長槽主要係用於將軌道本體鎖附於機台上,而鎖附長槽之設置可提供晶粒吸料軌道位置上之調整。換言之,可因應各種的需求,例如因應不同的晶粒尺寸、或者欲對進料軌道裁切或其他加工,來調整進料軌道之位置,以達可重複利用而節省資源和成本之功效。Moreover, the track body of the present invention may further comprise a fixing platform adjacent to the feeding platform, and at least one locking long groove may be formed on the fixing table. Among them, the locking long groove is mainly used to lock the rail body to the machine table, and the setting of the locking long groove can provide the adjustment of the position of the die suction track. In other words, the position of the feed track can be adjusted to meet the various needs, such as depending on the grain size, or the cutting or other processing of the feed track, to achieve reusable and resource and cost savings.
此外,本創作之固定台可開設複數落料通孔,其係沿著進料平台等距佈設,其較佳為開設三個落料通孔。又,每一落料通孔可包括一斜面,其係朝向一晶粒的進料方向,而且斜面與進料平台之水平夾角可為30度。其中,斜面的設置主要是為了協助晶粒的落料,可避免晶粒以垂直的角度落下而遭受損傷。In addition, the fixed table of the present invention can open a plurality of blanking through holes, which are arranged equidistantly along the feeding platform, and preferably have three blanking through holes. Moreover, each of the blanking through holes may include a bevel that faces the feed direction of a die, and the horizontal angle of the bevel to the feed platform may be 30 degrees. Among them, the setting of the inclined surface is mainly to assist the blanking of the crystal grains, and the crystal grains can be prevented from being damaged by falling at a vertical angle.
本創作可更換式吸料段之晶粒吸料軌道在本實施例中被詳細描述之前,要特別注意的是,以下的說明中,類似的元件將以相同的元件符號來表示。Before the detailed description of the die suction track of the replaceable suction section is described in this embodiment, it is to be noted that in the following description, like elements will be denoted by the same reference numerals.
請同時參閱第3圖、第4圖、第5A圖、及第5B圖,第3圖係本創作可更換式吸料段之晶粒吸料軌道一較佳實施例之俯視分解圖,第4圖係本創作可更換式吸料段之晶粒吸料軌道一較佳實施例之軌道本體的局部放大圖,第5A圖係本創作可更換式吸料段之晶粒吸料軌道一較佳實施例之吸料段的俯視圖,第5B圖係本創作可更換式吸料段之晶粒吸料軌道一較佳實施例之吸料段的左側視圖。Please also refer to FIG. 3, FIG. 4, FIG. 5A, and FIG. 5B. FIG. 3 is a top exploded view of a preferred embodiment of the die suction track of the replaceable suction section of the present invention. The figure is a partial enlarged view of a track suction body of a replaceable suction section of a preferred embodiment, and FIG. 5A is a preferred die suction track of the replaceable suction section of the present invention. A top view of the suction section of the embodiment, and FIG. 5B is a left side view of the suction section of the preferred embodiment of the die suction track of the replaceable suction section.
如圖所示,本實施例可更換式吸料段之晶粒吸料軌道,主要包括一吸料段2、一軌道本體3、及一鎖附螺栓4。其中,吸料段2包括一第一導引側壁21、及一吸料平台22,二者構成為一體,而第一導引側壁21係鄰接於吸料平台22之一側緣並向上凸出於吸料平台22。第一導引側壁21主要用於引導待測晶片,使待測晶片可以沿著第一導引側壁21進給,而吸料段2主要係為載置待測晶片而供吸料機構所吸取移載用。As shown in the figure, the die suction track of the replaceable suction section of the embodiment mainly comprises a suction section 2, a rail body 3, and a locking bolt 4. The suction section 2 includes a first guiding side wall 21 and a suction platform 22, which are integrally formed, and the first guiding side wall 21 is adjacent to one side edge of the suction platform 22 and protrudes upward. On the suction platform 22. The first guiding sidewall 21 is mainly used for guiding the wafer to be tested, so that the wafer to be tested can be fed along the first guiding sidewall 21, and the suction section 2 is mainly for loading the wafer to be tested for suction by the suction mechanism. Transfer.
此外,本實施例之吸料段2為一L型構件,其包括一吸料側201、及一固定側202,而第一導引側壁21、及吸料平台22係位於吸料側201。另外,吸料段2之固定側202開設一貫穿孔23,其貫穿固定側202之二側對應端面,而面向軌道本體3之一側端面上開設一定位孔24、及凹設一定位槽25。其中,定位槽25係自固定側202之下表面凹設。In addition, the suction section 2 of the present embodiment is an L-shaped member, which includes a suction side 201 and a fixed side 202, and the first guiding side wall 21 and the suction platform 22 are located on the suction side 201. In addition, the fixed side 202 of the suction section 2 defines a continuous through hole 23 which penetrates the corresponding end surface of the fixed side 202, and a positioning hole 24 is formed on one side end surface of the rail body 3, and a positioning groove 25 is recessed. The positioning groove 25 is recessed from the lower surface of the fixed side 202.
另一方面,軌道本體3包括一第二導引側壁31、及一進料平台32,二者亦構成為一體,且第二導引側壁31係鄰接於進料平台32之一側緣並向上凸出於進料平台32。同樣地,第二導引側壁31與進料平台32主要功用在於使待測晶片可以沿著第二導引側壁31而在進料平台32上行進進料。On the other hand, the rail body 3 includes a second guiding side wall 31 and a feeding platform 32, which are also integrally formed, and the second guiding side wall 31 is adjacent to one side edge of the feeding platform 32 and upward. Projected out of the feed platform 32. Likewise, the second guiding sidewall 31 and the feed platform 32 serve primarily to enable the wafer to be tested to travel along the second guiding sidewall 31 to feed on the feed platform 32.
另外,如圖所示,該軌道本體3於面向吸料段2之側端面上開設一螺孔33,且凸設一定位銷34、及一定位台35。其中,定位銷34係用於配合吸料段2之定位孔24,而定位台35則係用於配合吸料段2之定位槽25。In addition, as shown in the figure, the rail body 3 defines a screw hole 33 on a side end surface facing the suction section 2, and a positioning pin 34 and a positioning platform 35 are protruded. The positioning pin 34 is used for the positioning hole 24 of the suction section 2, and the positioning table 35 is used for the positioning groove 25 of the suction section 2.
再者,吸料段2係藉由鎖附螺栓4而可拆卸式地組設於軌道本體3之一側端,亦即鎖附螺栓4穿經吸料段2之貫穿孔23並鎖附於軌道本體3之螺孔33內。其中,鎖附螺栓4鎖附時,軌道本體3之定位銷34插設於吸料段2之定位孔24,且軌道本體3之定位台35容設於吸料段2之定位槽25內。據此,吸料段2之第一導引側壁21、及吸料平台22分別對應連接於軌道本體3之第二導引側壁31、及進料平台32,故待測晶片可以沿著第一導引側壁21與第二導引側壁31,而於進料平台32進給至吸料平台22上以供吸料。Furthermore, the suction section 2 is detachably assembled to one side end of the rail body 3 by the locking bolt 4, that is, the locking bolt 4 passes through the through hole 23 of the suction section 2 and is locked to Inside the screw hole 33 of the rail body 3. The positioning pin 34 of the rail body 3 is inserted into the positioning hole 24 of the suction section 2, and the positioning table 35 of the rail body 3 is accommodated in the positioning groove 25 of the suction section 2. Accordingly, the first guiding sidewall 21 of the suction section 2 and the suction platform 22 are respectively connected to the second guiding sidewall 31 of the rail body 3 and the feeding platform 32, so that the wafer to be tested can be along the first The guiding side wall 21 and the second guiding side wall 31 are fed to the suction platform 22 at the feeding platform 32 for suction.
承上所述,本實施例藉由鎖附螺栓螺鎖4來將吸料段2組設於軌道本體3上,此一固定方式簡單、穩定、且拆裝便利。另外,本實施例進一步藉由定位銷34及定位孔24的方式來固定吸料段2與軌道本體3,其與螺栓構成二固定點,可穩固結合吸料段2與軌道本體3,使吸料段2不會因為單靠螺栓鎖附而輕易產生轉動或晃動。此外,本實施例亦透過定位台35與定位槽25之設計,可更穩固地結合吸料段2與軌道本體3,且亦有助於裝配吸料段2時之定位,且可增加吸料段2之支撐力。As described above, in this embodiment, the suction section 2 is assembled on the rail body 3 by the bolt bolts 4, which is simple, stable, and convenient to assemble and disassemble. In addition, in the embodiment, the suction section 2 and the rail body 3 are fixed by the positioning pin 34 and the positioning hole 24, and the bolt and the bolt form two fixed points, and the suction section 2 and the rail body 3 can be stably combined to make suction. Segment 2 does not easily rotate or sway due to bolting alone. In addition, the embodiment also adopts the design of the positioning table 35 and the positioning groove 25 to more stably combine the suction section 2 and the rail body 3, and also helps to locate the suction section 2, and can increase the suction. The support of paragraph 2.
如第3圖所示,本實施例之軌道本體3更包括一固定台36,其係鄰接於進料平台32,而固定台36主要係用於將軌道本體3固定於機台上(圖中未示)。其中,固定台36上開設有五個鎖附長槽361,其主要係用於供固定台36鎖附於機台上,而且藉由長槽之設置可提供晶粒吸料軌道位置上之調整。換言之,藉由鎖附長槽361之特性,可因應各種的需求,例如因應不同的晶粒尺寸、或者欲對進料軌道裁切或其他加工,來調整進料軌道之位置,以達可重複利用而節省資源和成本之功效。As shown in FIG. 3, the rail body 3 of the present embodiment further includes a fixing base 36 which is adjacent to the feeding platform 32, and the fixing base 36 is mainly used for fixing the rail body 3 to the machine table (in the figure). Not shown). The fixing table 36 is provided with five locking long slots 361, which are mainly used for the fixing table 36 to be attached to the machine table, and the position of the die suction rail position can be adjusted by the arrangement of the long slots. . In other words, by locking the characteristics of the long slot 361, the position of the feed track can be adjusted to meet various needs, such as depending on different grain sizes, or to cut or otherwise process the feed track, to achieve repeatability. Use to save resources and cost.
再如第3圖所示,固定台36開設三個落料通孔362,其係沿著進料平台32等距佈設,且每一落料通孔362包括一斜面363,其係朝向一晶粒的進料方向,而斜面363與進料平台32之水平夾角為30度。據此,本實施例藉由落料通孔362之設置,而未依序排列於進料平台32上之晶粒將落入落料通孔362內重新進料,以避免因位置不正確之晶粒持續進給至吸料段2造成吸料機構無法吸取或吸取位置不正而導致測試失效。再者,落料通孔362之斜面363的則可協助晶粒的落料,可避免晶粒以垂直的角度落下而遭受損傷。As shown in FIG. 3, the fixing table 36 defines three blanking through holes 362 which are arranged equidistantly along the feeding platform 32, and each blanking through hole 362 includes a slope 363 which is oriented toward a crystal. The feed direction of the pellets, while the angle between the ramps 363 and the feed platform 32 is 30 degrees. Accordingly, in this embodiment, by the arrangement of the blanking through holes 362, the crystal grains that are not sequentially arranged on the feeding platform 32 will fall into the blanking through holes 362 to be re-fed to avoid the position being incorrect. Continued feeding of the die to the suction section 2 causes the suction mechanism to fail to pick up or pick up the position and cause the test to fail. Moreover, the bevel 363 of the blanking through hole 362 can assist in the blanking of the crystal grains, and can prevent the crystal grains from falling at a vertical angle and being damaged.
上述實施例僅係為了方便說明而舉例而已,本創作所主張之權利範圍自應以申請專利範圍所述為準,而非僅限於上述實施例。The above-described embodiments are merely examples for convenience of description, and the scope of the claims is intended to be limited to the above embodiments.
〔習知〕[study]
6‧‧‧喂料盤
7‧‧‧進料軌道
8‧‧‧吸料機構
81‧‧‧檢測裝置
9‧‧‧螺栓
C‧‧‧晶粒
Fc‧‧‧進料模組
Ti‧‧‧晶粒檢測設備
〔本創作〕
2‧‧‧吸料段
21‧‧‧第一導引側壁
201‧‧‧吸料側
202‧‧‧固定側
22‧‧‧吸料平台
23‧‧‧貫穿孔
24‧‧‧定位孔
25‧‧‧定位槽
3‧‧‧軌道本體
31‧‧‧第二導引側壁
32‧‧‧進料平台
33‧‧‧螺孔
34‧‧‧定位銷
35‧‧‧定位台
36‧‧‧固定台
361‧‧‧鎖附長槽
362‧‧‧落料通孔
363‧‧‧斜面
4‧‧‧鎖附螺栓6‧‧‧feed tray
7‧‧‧Feed track
8‧‧‧Suction mechanism
81‧‧‧Detection device
9‧‧‧ bolt
C‧‧‧ grain
Fc‧‧‧feed module
Ti‧‧‧ grain inspection equipment [this creation]
2‧‧‧ suction section
21‧‧‧First guiding side wall
201‧‧‧ suction side
202‧‧‧ fixed side
22‧‧‧Suction platform
23‧‧‧through holes
24‧‧‧Positioning holes
25‧‧‧ positioning slot
3‧‧‧ Track body
31‧‧‧Second guiding side wall
32‧‧‧ Feeding platform
33‧‧‧ screw holes
34‧‧‧Locating pin
35‧‧‧ Positioning table
36‧‧‧ fixed table
361‧‧‧Lock with long slot
362‧‧‧Dropping through hole
363‧‧‧Bevel
4‧‧‧Lock bolts
第1圖係習知晶粒檢測設備之進料模組的俯視圖。 第2圖係習知吸料機構與進料軌道之局部側視圖。 第3圖係本創作一較佳實施例之俯視分解圖。Figure 1 is a top plan view of a feed module of a conventional grain inspection apparatus. Figure 2 is a partial side view of a conventional suction mechanism and feed track. Figure 3 is a top exploded view of a preferred embodiment of the present invention.
第4圖係本創作一較佳實施例之軌道本體的局部放大圖。 第5A圖係本創作一較佳實施例之吸料段的俯視圖。 第5B圖係本創作一較佳實施例之吸料段的左側視圖。Figure 4 is a partial enlarged view of the track body of a preferred embodiment of the present invention. Figure 5A is a top plan view of a suction section of a preferred embodiment of the present invention. Figure 5B is a left side view of the suction section of a preferred embodiment of the present invention.
2‧‧‧吸料段2‧‧‧ suction section
3‧‧‧軌道本體3‧‧‧ Track body
31‧‧‧第二導引側壁31‧‧‧Second guiding side wall
32‧‧‧進料平台32‧‧‧ Feeding platform
33‧‧‧螺孔33‧‧‧ screw holes
34‧‧‧定位銷34‧‧‧Locating pin
35‧‧‧定位台35‧‧‧ Positioning table
36‧‧‧固定台36‧‧‧ fixed table
361‧‧‧鎖附長槽361‧‧‧Lock with long slot
362‧‧‧落料通孔362‧‧‧Dropping through hole
363‧‧‧斜面363‧‧‧Bevel
4‧‧‧鎖附螺栓4‧‧‧Lock bolts
Claims (10)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW102224514U TWM483263U (en) | 2013-12-26 | 2013-12-26 | Die sucking rail with replaceable sucking sections |
CN201420068349.4U CN203760429U (en) | 2013-12-26 | 2014-02-17 | Crystal grain suction rail with replaceable suction section |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW102224514U TWM483263U (en) | 2013-12-26 | 2013-12-26 | Die sucking rail with replaceable sucking sections |
Publications (1)
Publication Number | Publication Date |
---|---|
TWM483263U true TWM483263U (en) | 2014-08-01 |
Family
ID=51255673
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW102224514U TWM483263U (en) | 2013-12-26 | 2013-12-26 | Die sucking rail with replaceable sucking sections |
Country Status (2)
Country | Link |
---|---|
CN (1) | CN203760429U (en) |
TW (1) | TWM483263U (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI550283B (en) * | 2015-05-08 | 2016-09-21 | High voltage detection module of high voltage detection device and its detection method | |
TWI580977B (en) * | 2015-12-17 | 2017-05-01 | Separate probe module and electronic component detection equipment with separate probe module |
-
2013
- 2013-12-26 TW TW102224514U patent/TWM483263U/en not_active IP Right Cessation
-
2014
- 2014-02-17 CN CN201420068349.4U patent/CN203760429U/en not_active Expired - Fee Related
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI550283B (en) * | 2015-05-08 | 2016-09-21 | High voltage detection module of high voltage detection device and its detection method | |
TWI580977B (en) * | 2015-12-17 | 2017-05-01 | Separate probe module and electronic component detection equipment with separate probe module |
Also Published As
Publication number | Publication date |
---|---|
CN203760429U (en) | 2014-08-06 |
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