TWM481406U - The test probe and a probe device using the same - Google Patents

Description

Test probe and probe device using the same

The invention relates to a probe, in particular to an elastic test probe capable of accurately detecting potential and prolonging service life and a probe device using the test probe.

In today's society, the habits of electronic products can be said to be greatly different from the previous ones. In particular, the design of electronic devices is becoming more and more human. Nowadays, human beings cannot be separated from the use of electronic products, making a large number of electronic products from the factory. Made out.

Before the electronic equipment was shipped from the factory, its circuit had check levels to ensure the shipment rate. The check level used a lot of manpower to use the hand-held probe to detect whether the board has an open circuit or short circuit, but the manual test has The shortcomings of fatigue and cumbersome personnel management. With the advancement of the times, electronic products have become smaller and smaller, and automated detection equipment technology has gradually improved, and its advantages include long working hours, fast detection time and accurate detection results, which can replace a large amount of manpower and save a lot of personnel costs.

As electronic products become more sophisticated, automated inspection equipment has to be improved, especially in the form of probes that are in contact with electronic equipment. Although the form is exquisite, as the detection speed increases, the accuracy of the detection cannot be lost.

In the early days, the form of the probe required high-density contact with the measuring contact, so the spring was used to buffer the force of the device to reduce the friction loss of the probe contact measuring point. In particular, the design of the probe was particularly low. The test probe for wear is used to increase the number of uses, for example, as described in "China Test Patent Publication No. M309102 "Test Probe".

It is known from another convention that the inventor proposes a shortening The solution for setting the distance between two adjacent probes, as described in the "Probe and Probe Device" of the Chinese Patent Publication No. M384318, is designed to be eccentrically set by the probe contact portion to shorten the stitch length. The measurement results show that the spacing between adjacent probes can be shortened from the original non-eccentric design pitch of 0.5mm to 0.15~0.2mm, but because of the probe head design, the probe and measurement contact points are reduced, so the probe The wear rate of the top is relatively increased, resulting in a reduction in service life.

Refer to Figure 1, for the general test probe 2 used with half The conductor solder balls 3 are in contact with each other, and the top end 21 has a plurality of conical portions 211 of the same height and the same size, and the plurality of tapered portions 211 tend to wear after being in contact with the semiconductor solder balls 3 a plurality of times.

Referring again to FIG. 2, due to the complex cone 211 and the When the semiconductor solder ball 3 is in contact, it is limited by the shape of the semiconductor solder ball 3 and the half turn of the spring of the test probe 2 (not shown), so that the plurality of tapered portions 211 are not always The test can be vertically inserted into the semiconductor solder ball 3, and the plurality of tapered portions 211 are worn out, and the tapered portion 211 is collapsed, eventually leading to the test probe 2 and the semiconductor solder ball 3. The contact area becomes smaller, the test impedance is improved when the semiconductor test is performed, and the measurement data is inaccurate, resulting in a misjudgment of the semiconductor test.

As can be seen from the above description, the conventional test probe has the following disadvantages:

1. Short service life: Because the material of the measuring contact is made of metal material, when the probe is in contact with the measuring contact, the traditional probe will wear and collapse under the image of the spring half-turn drop yielding rate. The phenomenon, however, leads to misjudgment of the measurement, and the test probe and the probe device using the test probe cannot continue to be used.

Second, the impedance value is too high: the traditional test probe design, usually in the case of a small number of contact surfaces, sometimes due to external factors lead to reduced accuracy of the test, such as wear, dust, and metal oxidation and other factors, And the resulting current is proportional to the contact area, and less contact area will affect Accuracy when measuring.

3. Spring elastic fatigue is accelerated: due to traditional probe design When the contact area is small, the measuring device needs to increase the contact force when obtaining the accurate value of the measuring end, but the excessive pressing force is applied to the spring body, and the frequent pressing will cause the spring to have no elasticity, and the test is performed. The result will be inaccurate.

The inventor of the present invention is aware of the design of the aforementioned existing test device. Considering the benefits and shortcomings of the service life, the in-depth concept and active research and development of a semiconductor test probe structure that can more accurately detect potential and extend the service life.

In view of the above, it is an object of the present invention to provide a test probe that is suitable for connection with a test contact of a circuit and includes: a connecting rod, a first electrical contact component, and a second electrical contact. Component.

The connecting rod is substantially cylindrical. The first electrical contact assembly includes a connecting portion disposed at a top end of the connecting rod, and a plurality of sharp cones disposed on the connecting portion and having different sizes and heights. The second electrical contact assembly is disposed at a bottom end of the connecting rod relative to the first electrical contact assembly and includes a protruding pin.

The connecting rod has an outer diameter larger than an outer diameter of the connecting portion, and the connecting rod and the connecting portion adjoin the connecting portion define a first edge.

The plurality of pointed cone shapes are selected from the group consisting of a circular cone, a triangular cone, a quadrangular pyramid, a hexagonal cone, and combinations thereof.

Another object of the present invention is to provide a probe device comprising: a housing, two test probes, and a resilient member.

The housing includes a top wall, a surrounding wall extending downward from the outer edge of the top wall, and a bottom wall connected by the bottom end of the surrounding wall, the top wall, the surrounding wall, and the bottom wall The top wall and the bottom wall respectively have a through hole for enabling the receiving space to communicate with the outside. The two test probes are disposed in the accommodating space and respectively The top wall and the bottom wall are adjacent to each other, and the flanges of the two test probes abut the top wall and the bottom wall, respectively. The elastic member is disposed in the accommodating space, and the two ends of the second electrical contact component are respectively protruded outwardly from the through hole. Out of the housing.

The elastic element is a compression spring.

The beneficial effect of the novel is to increase the test probe The tip of the detecting end has different characteristics of size and height. After the high cone is damaged, the low tip cone can interfere with the measuring contact, thereby continuing the service life of the test probe, especially More pointed cones will increase the contact area of the measuring contacts, and the potential measurement accuracy will be greatly improved. Finally, because the contact area has been improved, when the device detects the electronic circuit, the force setting of the pressing can be alleviated and applied to The force of the spring inside the probe device is also reduced, the durability of the spring is increased, and the frictional force of the tip cone and the measuring contact is reduced, which also reduces the wear of the tip cone.

5‧‧‧Test probe

51‧‧‧ Connecting rod

511‧‧‧ 缘缘

52‧‧‧First electrical contact assembly

521‧‧‧Connecting Department

522‧‧‧ pointed cone

53‧‧‧Second electrical contact assembly

531‧‧ ‧ protruding needle

6‧‧‧ Probe device

61‧‧‧Shell

610‧‧‧ accommodating space

611‧‧‧ top wall

612‧‧‧ Around the wall

613‧‧‧ bottom wall

614‧‧‧through hole

62‧‧‧Flexible components

X‧‧‧ test joints

1 is a side view showing a conventional display of a test probe in contact with a test contact; FIG. 2 is a side view showing the wear and collapse of the test probe after repeated use in a conventional manner. 3 is a perspective view showing a preferred embodiment of the test probe of the present invention; FIG. 4 is a side view showing a state in which the test probe is connected to a test contact of a circuit; and FIG. 5 is A side view of a preferred embodiment of a probe device using the test probe is illustrated.

The related patent features and technical contents of the present invention will be described in the following detailed description of the preferred embodiments with reference to the drawings. Can be clearly presented.

Referring to Figures 3 and 4, the preferred test probe of the present invention is Example. The test probe 5 is suitable for a test contact X connection of a general electronic circuit, and includes a connecting rod 51, a first electrical contact assembly 52, and a second electrical contact assembly 53.

The connecting rod 51 is substantially cylindrical. The first electrical contact The assembly 52 includes a connecting portion 521 disposed at the top end of the connecting rod 51 and a plurality of pointed cones 522 disposed on the end of the connecting portion 521 and having different sizes and heights. The shape of the plurality of pyramids 522 may be selected from the group consisting of a circular cone, a triangular cone, a quadrangular pyramid, a hexagonal cone, and combinations thereof.

The outer diameter of the connecting rod 51 is larger than the connecting portion 521. The outer diameter of the connecting rod 51 and the connecting portion 521 abut each other to define a flange 511.

The second electrical contact assembly 53 is disposed on the connecting rod 51 The bottom end is located opposite the first electrical contact assembly 52 and includes a protruding pin 531.

Referring to FIG. 5, the present invention additionally provides an use of the above. The probe device 6 of the probe 5 is tested. The probe device 6 includes a housing 61, two test probes 5, and a resilient member 62.

The housing 61 includes a top wall 611 and a top wall a surrounding wall 612 extending downwardly from the outer edge of the 611, and a bottom wall 613 connected to the bottom end of the surrounding wall 612. The top wall 611, the surrounding wall 612 and the bottom wall 613 cooperate to define one of the surrounding walls. The accommodating space 610, the top wall 611 and the bottom wall 613 respectively have a through hole 614, the through hole 614 enables the accommodating space 610 to communicate with the outside.

The test probe 5 is disposed in the accommodating space 610. The top wall 611 and the bottom wall 613 are respectively adjacent to the top wall 611 and the bottom wall 613.

The elastic member 62 is disposed in the accommodating space 610. The two ends of the test probe 5 are respectively placed on the protruding needle 531 of the test probe 5, and are offset from the The test probes 5 are tested so that the two first electrical contact assemblies 52 protrude from the through holes 614 outwardly from the outside of the housing 61. Wherein, the elastic member 62 is a compression spring.

As can be seen from the above description, the novel test probe 5 and the probe device 6 using the test probe 5 have the following advantages:

1. The test probe 5 has an extended service life: since the test probe 5 is designed with many different heights of the vertebral body 522 than the conventional one, the test probe 5 is used with a new sharp vertebral body. 522 is in contact with the test contact X. After a plurality of contact with the test contact X, the high tip cone 522 will wear and collapse, and the lower tip cone 522 will contact the measurement contact to The use of the test probe 5 is continued.

2. Measurement Impedance Reduction: The present invention provides a plurality of sharp cones 522 relative to conventional test probes, and more of the pointed cones 522 and the test contacts X will provide more contact during the measurement operation. The point and contact area can eliminate some of the effects of dust and metal oxidation, and get accurate measurement values.

3. The elastic member 62 is not easily elastic and fatigued: since the tip cone 522 provides more contact points and contact areas, the automatic measuring device can set a smaller measuring force when working, and can obtain accurate The value is measured, and the reaction force applied to the elastic member 62 is also reduced, and the service life of the elastic member 62 is greatly improved. And less frictional force can also reduce the wear of the test probe, thereby increasing the life of the test probe 5.

In summary, the novel test probe and the probe device using the test probe can achieve the purpose of the present invention.

However, the above description is only a preferred embodiment of the present invention, and the scope of the present invention cannot be limited thereto, that is, the simple equivalent change and modification made by the novel patent application scope and the novel description content, All remain within the scope of this new patent.

5‧‧‧Test probe

511‧‧‧ 缘缘

6‧‧‧ Probe device

61‧‧‧Shell

610‧‧‧ accommodating space

611‧‧‧ top wall

612‧‧‧ Around the wall

613‧‧‧ bottom wall

614‧‧‧through hole

62‧‧‧Flexible components

Claims (5)

A test probe is adapted to be connected to a test contact of a circuit, and comprises: a connecting rod, which is substantially cylindrical; a first electrical contact assembly, comprising a connecting portion disposed at a top end of the connecting rod, and a plurality a tip cone disposed on the connecting portion and having different sizes and heights; and a second electrical contact component disposed at a bottom end of the connecting rod opposite to the first electrical contact component and including a protruding pin. The test probe of claim 1, wherein the connecting rod has an outer diameter larger than an outer diameter of the connecting portion, and the connecting rod and the connecting portion adjoin the connecting portion define a first edge. The test probe of claim 2, wherein the plurality of pyramid shapes are selected from the group consisting of a circular cone, a triangular cone, a quadrangular pyramid, a hexagonal cone, and combinations thereof. A probe device comprising: a housing comprising a top wall, a surrounding wall extending downward from an outer edge of the top wall, and a bottom wall connected by a bottom end of the surrounding wall, the top wall surrounding the wall a wall, which cooperates with the bottom wall to define a receiving space, the top wall and the bottom wall respectively have a through hole for communicating the receiving space with the outside; and the test probe is disposed on the wall The accommodating space is adjacent to the top wall and the bottom wall, and the flanges of the two test probes respectively abut the top wall and the bottom wall; and an elastic element is disposed in the accommodating space. Its two ends are separately set The probe is placed on the protruding pin and abuts against the two test probes, so that the two first electrical contact components protrude from the through hole outwardly from the outside of the housing. The probe device of claim 4, wherein the elastic member is a compression spring.