TWM460276U - Testing fixture for rapid elevating structure - Google Patents

Testing fixture for rapid elevating structure Download PDF

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Publication number
TWM460276U
TWM460276U TW102208175U TW102208175U TWM460276U TW M460276 U TWM460276 U TW M460276U TW 102208175 U TW102208175 U TW 102208175U TW 102208175 U TW102208175 U TW 102208175U TW M460276 U TWM460276 U TW M460276U
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Taiwan
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shaft
linkage
sliding seat
sliding
test fixture
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TW102208175U
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Chinese (zh)
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De-Xing Xiao
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De-Xing Xiao
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Priority to TW102208175U priority Critical patent/TWM460276U/en
Publication of TWM460276U publication Critical patent/TWM460276U/en

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Description

測試治具之快速升降結構Test fixture rapid lifting structure

本新型係有關於一種測試治具之快速升降結構,尤指一種藉由旋轉聯動軸一小於360度之角度後,便可以聯動一滑座呈無段快速地完成總昇降位移行程,並使該滑座可以確實地迫緊被檢測物,使該被檢測物可以與對應之檢測用之探針確實地電性連接。The present invention relates to a rapid lifting structure of a test fixture, in particular, a rotation of a linkage axis of less than 360 degrees, the linkage can be coordinated to complete the total lifting displacement stroke without a section, and the The slider can surely press the object to be tested so that the object to be tested can be reliably electrically connected to the corresponding probe for detection.

目前應用於檢測如中央處理器等電子裝置的治具,通常是含有一基座,該基座係固定於用以檢測該電子裝置之治具座體上,於該基座中,係螺設有一螺桿,並於該螺桿之末端樞裝有一壓制盤,如是操作者可以藉由旋轉該螺桿,使該壓制盤緊壓在電子裝置上,使該電子裝置可以與檢測之探針呈電性接觸,以完成檢測工作。Currently, a fixture for detecting an electronic device such as a central processing unit usually includes a base fixed to a fixture body for detecting the electronic device, and the base is screwed There is a screw, and a pressing disc is pivotally mounted at the end of the screw. If the operator can rotate the screw, the pressing disc is pressed against the electronic device, so that the electronic device can be in electrical contact with the detecting probe. To complete the inspection work.

惟上述之檢測所應用之治具,由於基座所螺合之螺桿,其螺距通常為0.5~1mm,因此,當要驅使該壓制盤位移4~5mm時,便必須旋轉該螺桿4~5圈,在操作上除了十分不方便、費時外,由於螺桿與基座間,一定存在著些許的螺隙,在長期使用後,螺隙更形加大,因此在檢測的過程難免會生晃動,而影響檢測的準確度,而顯有改進的必要。However, the jig used for the above detection is usually 0.5 to 1 mm due to the screw screwed by the base. Therefore, when the displacement of the pressing plate is to be 4 to 5 mm, the screw must be rotated 4 to 5 times. In addition to being very inconvenient and time consuming in operation, there must be some screw gap between the screw and the base. After long-term use, the screw gap is more enlarged, so the process of detection will inevitably sway and affect. The accuracy of the test is shown to be necessary for improvement.

本新型之創作人有鑑於此,乃予研究創新,而揭示出本新型所示測試治具之快速升降結構。In view of this, the creators of the present invention have researched and innovated to reveal the rapid lifting structure of the test fixture shown in the present invention.

本新型之目的旨在提供一種測試治具之快速升降結構,係包括:一基座,用以固定於供被檢測物檢測使用之座體上,該基座凹設有一滑穴,並貫穿一軸孔者;一滑座,滑置於該基座之滑穴中者;以及一聯動軸,含有一軸段,樞裝於該基座之軸孔中,並於該軸段之第一端,軸向地突伸一聯動段,令該聯動段軸向套接該滑座,並令該聯動軸之聯動段與滑座上,設有至少一組對應之導引槽及導銷,該導銷係伸入於該導引槽中,且令該導引槽之兩端投影在一平行該滑座之滑動方向的平面上時,相隔一距離,使旋轉該聯動軸時,可驅使該導銷於該導引槽中產生相對滑移,而使該滑座沿該滑穴快速地昇降,以快速迫緊或釋放該被檢測物者。The purpose of the present invention is to provide a rapid lifting structure for a test fixture, comprising: a base for fixing to a seat for detecting the object to be detected, the base having a sliding hole and extending through a shaft a hole holder; a slider that slides into the sliding hole of the base; and a linkage shaft including a shaft segment pivotally mounted in the shaft hole of the base and at the first end of the shaft shaft Extending a linkage section to the ground, the linkage section axially sleeves the sliding seat, and the linkage section of the linkage shaft and the sliding seat are provided with at least one corresponding set of guiding slots and guide pins, the guiding pin system Extending into the guiding groove, and projecting the two ends of the guiding groove on a plane parallel to the sliding direction of the sliding seat, separated by a distance, when the rotating shaft is rotated, the guiding pin can be driven Relative sliding occurs in the guiding groove, so that the sliding seat is quickly raised and lowered along the sliding hole to quickly press or release the detected object.

本新型所揭示測試治具之快速升降結構,其中該基座,於其兩相對側,係分別樞裝一扣鉤,並令兩該扣鉤與該基座間,分別彈性地頂撐一彈簧,使兩該扣鉤之末端勾扣部,相對併合,以緊夾於供被檢測物檢測使用之座體上者。The quick lifting structure of the test fixture disclosed in the present invention, wherein the base is pivotally mounted on a pair of opposite sides thereof, and a spring is elastically supported between the two hooks and the base. The hook portions of the hooks of the two hooks are oppositely combined to be tightly clamped to the seat for detecting the object to be detected.

本新型所揭示測試治具之快速升降結構,其中該滑座,係軸向地凹設有一軸穴,以容許該聯動軸之聯動段伸入於內,並令該滑座之底部,界定形成一壓制面,以迫壓被檢測物者。The quick lifting structure of the test fixture disclosed in the present invention, wherein the sliding seat is axially recessed with a shaft hole to allow the linkage section of the linkage shaft to extend therein, and the bottom of the sliding seat is defined and formed A pressing surface to force the object to be detected.

本新型所揭示測試治具之快速升降結構,其中該聯動軸之軸段與該聯動段間,係形成一擋肩,並使該軸段穿出該基座之軸孔後,令該軸段之第二端鎖接一旋鈕,以供操作者藉由旋轉該旋鈕,達到聯動該聯動軸旋轉之目的。本新型所揭示之軸段,其第二端係呈等徑度的環狀排列凹設有多數固定孔,藉由不同固定孔與旋鈕對應鎖接,以決定該聯動段與該 滑座間之相對位置,以調整該滑座滑動時之起始相對位置,以因應不同的檢測條件之需。The rapid lifting structure of the test fixture disclosed in the present invention, wherein a shaft shoulder is formed between the shaft section of the linkage shaft and the linkage section, and the shaft section is passed through the shaft hole of the base to make the shaft section The second end is locked with a knob for the operator to rotate the knob to achieve the purpose of interlocking the rotation of the linkage shaft. The shaft segment disclosed in the present invention has a plurality of fixing holes in the annular arrangement of the second end of the equal diameter, and the locking holes are correspondingly locked by different fixing holes to determine the linkage segment and the shaft segment. The relative position between the slides to adjust the initial relative position of the slide when sliding, in response to different test conditions.

本新型所揭示測試治具之快速升降結構,其中設置於該聯動段與滑座上之各組對應之導銷及導引槽,係可令該導銷徑向地穿置於該聯動軸之聯動段上,且向外徑向突出該聯動段;而該導引槽係徑向穿設於該滑座之軸穴的穴壁上,且令該導引槽之兩端投影在一平行該滑座之滑動方向平面上時,相隔一距離,界定為該滑座滑動之總行程者。上述之導引槽之兩端,分別延伸一水平段,使該導銷相對移入該水平段時,可制動該滑座軸向位移。The quick lifting structure of the test fixture disclosed in the present invention, wherein the guide pin and the guiding groove disposed corresponding to each group of the linkage segment and the sliding seat are configured to radially pass the guiding pin to the linkage shaft And the guiding groove is radially outwardly protruded from the hole wall of the shaft of the sliding seat, and the two ends of the guiding groove are projected in a parallel manner When the sliding direction of the sliding seat is in the plane, the distance is defined as the total stroke of the sliding of the sliding seat. The two ends of the guiding groove respectively extend a horizontal section, so that when the guiding pin is relatively moved into the horizontal section, the axial displacement of the sliding seat can be braked.

本新型所揭示測試治具之快速升降結構,其中設置於該聯動段與滑座上之各組對應之導銷及導引槽,係可以修飾地令該導銷徑向地突設在滑座之軸穴的穴壁上;而該導引槽係徑向穿設於該聯動軸之聯動段上,且令該導引槽之兩端投影在一平行該滑座之滑動方向平面上時,相隔一距離,界定為該滑座滑動之總行程者。上述之導引槽之兩端,係可分別延伸一水平段者。The quick lifting structure of the test fixture disclosed in the present invention, wherein the guide pin and the guiding groove disposed corresponding to each group of the linkage section and the sliding seat can be modified to cause the guiding pin to protrude radially on the sliding seat The guide groove is radially disposed on the linkage section of the linkage shaft, and the two ends of the guide groove are projected on a plane parallel to the sliding direction of the carriage. A distance apart is defined as the total stroke of the slide. The two ends of the guiding groove are respectively extended by a horizontal section.

本新型所揭示測試治具之快速升降結構,其中於該聯動段與滑座上,係可對應地設置多數組相對應之導銷及導引槽,本新型並不自限設置該導銷及導引槽之組數。The quick lifting structure of the test fixture disclosed in the present invention, wherein the linkage pin and the guiding slot are correspondingly arranged on the linkage segment and the sliding seat, and the present invention does not self-limit the guiding pin and The number of sets of guide grooves.

本新型所揭示測試治具之快速升降結構,乃具有以下之特徵及優點:The rapid lifting structure of the test fixture disclosed in the present invention has the following features and advantages:

1.可以快速、無段地升降該滑座,即可以在旋轉該旋鈕小於360度時,便可完成所有升降行程的操作,使操作更為快速。1. The slider can be lifted quickly and without segments, that is, all the lifting strokes can be completed when the knob is rotated less than 360 degrees, so that the operation is faster.

2.該軸段之第二端,係呈等徑度地環狀排列凹設有多數固定孔,藉由不同固定孔與旋鈕對應鎖接,便可以決定該聯動段與該滑座間之相對位置,以調整該滑座滑動時之起始相對位置,以因應不同的檢測條件之需。2. The second end of the shaft section is arranged in an annular shape with a plurality of fixing holes, and the relative positions between the linkage section and the sliding seat can be determined by locking the different fixing holes and the knobs. To adjust the initial relative position of the slide when sliding, in response to different test conditions.

3.結構簡單、組裝容易。3. Simple structure and easy assembly.

本新型之可取實體,可由以下所附之圖式及實施方式,而得以明晰。The desirable entities of the present invention can be clarified by the following drawings and embodiments.

(10)‧‧‧基座(10) ‧ ‧ pedestal

(101)‧‧‧被檢測物(101)‧‧‧Tested objects

(102)‧‧‧座體(102) ‧ ‧ ‧ body

(11)‧‧‧滑穴(11)‧‧‧Slip

(12)‧‧‧軸孔(12)‧‧‧Axis hole

(13)‧‧‧扣鉤(13) ‧‧‧catch

(131)‧‧‧勾扣部(131)‧‧‧Deduction

(14)‧‧‧彈簧(14) ‧ ‧ spring

(20)‧‧‧滑座(20)‧‧‧Slide

(21)‧‧‧軸穴(21)‧‧‧ Axial

(22)‧‧‧壓制面(22) ‧ ‧ pressed surface

(30)‧‧‧聯動軸(30)‧‧‧ linkage axis

(31)‧‧‧軸段(31)‧‧‧ shaft segments

(310)‧‧‧擋肩(310)‧‧‧ Shoulder

(311)‧‧‧固定孔(311)‧‧‧Fixed holes

(32)‧‧‧聯動段(32) ‧‧‧ linkage segment

(33)‧‧‧旋鈕(33)‧‧‧ knob

(331)‧‧‧固定穿孔(331) ‧‧‧Fixed perforation

(41)‧‧‧導引槽(41) ‧‧‧ guiding slot

(411)‧‧‧水平段(411) ‧‧‧ horizontal section

(42)‧‧‧導銷(42) ‧‧ ‧ sales guide

(D)‧‧‧距離(D) ‧ ‧ distance

第一圖:係本新型之分解立體圖。The first picture: an exploded perspective view of the present invention.

第二圖:係顯示本新型夾置於座體上之應用狀態示意圖。The second figure shows a schematic diagram of the application state of the present clip placed on the base.

第三圖:係自第二圖3-3方向局部剖面結構圖。Third figure: a partial cross-sectional structure diagram from the direction of the third figure 3-3.

第四圖:係自第二圖旋轉該旋鈕一角度後之立體圖。The fourth picture is a perspective view of the knob rotated from the angle of the second figure.

第五圖:係第四圖5-5方向局部剖面示意圖。Fig. 5 is a partial cross-sectional view taken in the direction of the fifth figure 5-5.

第六圖:係本新型另一實施例立體分解圖。Figure 6 is a perspective exploded view of another embodiment of the present invention.

請參閱第一、二、三圖所示,本新型係有關於一種測試治具之快速升降結構,係包括:一基座(10),用以固定於供被檢測物(101)檢測使用之座體(102)上,該基座(10)凹設有一滑穴(11),並貫穿一軸孔(12)者;一滑座(20),滑置於該基座(10)之滑穴(11)中者;以及一聯動軸(30),含有一軸段(31),樞裝於該基座(10)之軸孔(12)中,並於該軸段(31)之第一端,軸向地突伸一聯動段(32),令該聯動段(32)軸向套接該滑座(20),並令該聯動軸(30)之聯動段(32)與滑座(20)上,設有至少一組對應之導引槽(41)及導銷(42),該 導銷(42)係伸入於該導引槽(41)中,且令該導引槽(41)之兩端投影在一平行該滑座(20)之滑動方向的平面上時,相隔一距離(D),而使該聯動軸(30)與滑座(20)間構成凸輪聯動裝置,以於旋轉該聯動軸(30)時,便可驅使該導銷(42)於該導引槽(41)中產生相對滑移,而使該滑座(20)沿該滑穴(11)快速地昇降,以快速迫緊或釋放該被檢測物(101)者。Please refer to the first, second and third figures. The present invention relates to a rapid lifting structure for a test fixture, comprising: a base (10) for fixing and detecting the object to be tested (101). On the base (102), the base (10) is recessed with a sliding hole (11) and penetrates through a shaft hole (12); a sliding seat (20) slides on the sliding hole of the base (10) (11) the middle; and a linkage shaft (30) having a shaft section (31) pivotally mounted in the shaft hole (12) of the base (10) and at the first end of the shaft section (31) Abutting a linkage section (32) axially, the linkage section (32) axially sleeves the carriage (20), and the linkage section (32) and the carriage (20) of the linkage shaft (30) Above, at least one corresponding set of guiding grooves (41) and guide pins (42) are provided, The guide pin (42) extends into the guiding groove (41), and the two ends of the guiding groove (41) are projected on a plane parallel to the sliding direction of the sliding seat (20), separated by one The distance (D) is such that a cam linkage is formed between the linkage shaft (30) and the carriage (20), so that when the linkage shaft (30) is rotated, the guide pin (42) can be driven in the guide slot. A relative slip occurs in (41), and the slider (20) is quickly raised and lowered along the sliding hole (11) to quickly press or release the detected object (101).

本新型所揭示測試治具之快速升降結構,決定其昇降之速度,係與導引槽(41)之斜率成正比,即斜率越大昇降速度也會越快。The rapid lifting structure of the test fixture disclosed in the present invention determines the speed of the lifting and lowering, which is proportional to the slope of the guiding groove (41), that is, the higher the slope, the faster the lifting speed will be.

本新型所揭示測試治具之快速升降結構,其中該基座(10),於其兩相對側,係分別樞裝一扣鉤(13),並令兩該扣鉤(13)與該基座(10)間,分別彈性地頂撐一彈簧(14),使兩該扣鉤(13)之末端勾扣部(131),相對併合,以緊夾於供被檢測物(101)檢測使用之座體(102)上者。The quick lifting structure of the test fixture disclosed in the present invention, wherein the base (10) is pivotally mounted with a clasp (13) on opposite sides thereof, and the two hooks (13) and the base are respectively (10), respectively, elastically supporting a spring (14), so that the end hook portions (131) of the hooks (13) are oppositely combined to be tightly clamped to the object to be tested (101) for detection and use. The seat (102) is above.

本新型所揭示測試治具之快速升降結構,其中該滑座(20),係軸向地凹設有一軸穴(21),以容許該聯動軸(30)之聯動段(32)伸入於內,並令該滑座(20)之底部,界定形成一壓制面(22),以迫壓於該被檢測物(101)上者。The quick lifting structure of the test fixture disclosed in the present invention, wherein the sliding seat (20) is axially recessed with a shaft hole (21) to allow the linkage section (32) of the linkage shaft (30) to extend into Inside, and at the bottom of the slider (20), a pressing surface (22) is defined to press against the object (101).

本新型所揭示測試治具之快速升降結構,其中該聯動軸(30)之軸段(31)與該聯動段(32)間,係形成一擋肩(310),並使該軸段(31)穿出該基座(10)之軸孔(12)後,令該軸段(31)之第二端鎖接一旋鈕(33),以供操作者藉由旋轉該旋鈕(33)達到聯動聯動軸(30)旋轉之目的。本新型所揭示之軸段(31),其第二端係呈等徑度地環狀排列凹設有多數固定孔(311),而該旋鈕(33)上係穿設有固定穿孔(331),藉由不同固定孔(311)與旋鈕(33)之固定穿孔(331)對應鎖接,以決定該聯動段(32)與該滑座(20)間之相對位置,以調整該 滑座(20)滑動時之起始相對位置,以因應不同的檢測條件之需。The rapid lifting structure of the test fixture disclosed in the present invention, wherein a shaft shoulder (31) of the linkage shaft (30) and the linkage section (32) form a shoulder (310), and the shaft section (31) After the shaft hole (12) of the base (10) is worn out, the second end of the shaft segment (31) is locked with a knob (33) for the operator to rotate by rotating the knob (33). The purpose of the linkage shaft (30) to rotate. The shaft segment (31) disclosed in the present invention has a second end end which is annularly arranged with a plurality of fixing holes (311), and the knob (33) is provided with a fixed perforation (331). The fixing holes (331) of the knobs (33) are correspondingly locked by different fixing holes (311) to determine the relative position between the linking section (32) and the sliding seat (20) to adjust the position. The initial relative position of the slide (20) when sliding, in response to different test conditions.

本新型所揭示測試治具之快速升降結構,其中設置於該聯動段(32)與滑座(20)上之各組對應之導銷(42)及導引槽(41),其中可令該導銷(42)徑向地穿置於該聯動軸(30)之聯動段(32)上,且向外徑向突出該聯動段(32);而該導引槽(41)係徑向穿設於該滑座(20)之軸穴(21)的穴壁上,且令該導引槽(41)之兩端投影在一平行該滑座之滑動方向平面上時,相隔一距離(D),即界定為該滑座(20)滑動之總行程者。上述之導引槽(41)之兩端,係進一步分別延伸一水平段(411),使該導銷(42)相對移入該水平段時,可制動該滑座(20)沿軸向位移及該旋鈕(33)繼續旋轉。The quick lifting structure of the test fixture disclosed in the present invention, wherein the guide pin (42) and the guiding groove (41) corresponding to each group of the linkage section (32) and the sliding seat (20) are The guide pin (42) is radially disposed on the linkage section (32) of the linkage shaft (30) and radially protrudes the linkage section (32); and the guide slot (41) is radially worn Provided on the wall of the shaft hole (21) of the sliding seat (20), and the two ends of the guiding groove (41) are projected on a plane parallel to the sliding direction of the sliding seat, separated by a distance (D) ), which is defined as the total stroke of the slide (20) sliding. The two ends of the guiding groove (41) further extend a horizontal section (411) respectively, so that when the guiding pin (42) is relatively moved into the horizontal section, the sliding seat (20) can be braked and displaced axially. The knob (33) continues to rotate.

如第六圖所示,本新型所揭示測試治具之快速升降結構,其中設置於該聯動段(32)與滑座(20)上之各組對應之導銷(42)及導引槽(41),係可以修飾地令該導銷(42)係徑向地突設在滑座(20)的軸穴(21)上;而該導引槽(41)係徑向穿設於該聯動軸(30)之聯動段(32)上,且令該導引槽(41)之兩端投影在一平行該滑座之滑動方向平面上時,相隔一距離(D),即界定為該滑座(20)滑動之總行程者。As shown in the sixth figure, the rapid lifting structure of the test fixture disclosed in the present invention, wherein the guide pin (42) and the guiding groove corresponding to each group of the linkage section (32) and the sliding seat (20) are provided ( 41), the guide pin (42) can be modified to protrude radially on the shaft hole (21) of the sliding seat (20); and the guiding groove (41) is radially inserted in the linkage On the linkage section (32) of the shaft (30), and projecting the two ends of the guiding groove (41) on a plane parallel to the sliding direction of the sliding seat, separated by a distance (D), which is defined as the sliding The total stroke of the seat (20) sliding.

本新型所揭示測試治具之快速升降結構,其中於該聯動段(32)與滑座(20)上,係可對應地設置多數組相對應之導銷(42)及導引槽(41),本新型並不自限設置該導銷(42)及導引槽(41)之組數。The quick lifting structure of the test fixture disclosed in the present invention, wherein the linkage section (32) and the sliding seat (20) are correspondingly arranged with corresponding arrays of guide pins (42) and guiding slots (41) The present invention does not limit the number of sets of the guide pin (42) and the guiding groove (41).

本新型所揭示測試治具之快速升降結構,在應用時,可以相對壓按位於該基座(10)兩側之扣鉤(13),如第二、三圖所示,使本新型可以藉由該兩扣鉤(13)勾扣於用以檢測被檢測物(101)檢測使用之座體(102)上,此時,操作者便可以藉由旋轉旋鈕(33),如第四、五圖所示,而聯動地使滑 座(20)軸向位移,使其之底部壓制面(22),緊迫於該被檢測物(101)上,使該被檢測物(101)可以與座體(102)之檢測探針(圖未示出)電性連接,以順利完成檢測工作。待檢測完成後,反轉該旋鈕(33),以釋放被檢測物(101),並再次相對壓按兩側之扣鉤(13),便可以與該座體(102)解扣,使本新型可以順利自座體(102)上卸下,以待下次的檢測工作。The quick lifting structure of the test fixture disclosed in the present invention can press the hooks (13) located on both sides of the base (10) relative to each other as shown in the second and third figures, so that the novel can be borrowed The two hooks (13) are hooked on the seat body (102) for detecting the detected object (101). At this time, the operator can rotate the knob (33), such as the fourth and fifth. As shown in the figure, while sliding together The seat (20) is axially displaced such that the bottom pressing surface (22) is pressed against the object to be tested (101) so that the object to be detected (101) can be detected with the detecting body of the body (102) (Fig. Not shown) electrical connection to successfully complete the inspection work. After the detection is completed, the knob (33) is reversed to release the detected object (101), and the hooks (13) on both sides are pressed again, and the seat body (102) can be unbuttoned to make the present The new type can be successfully removed from the seat (102) for the next inspection.

本新型所揭示測試治具之快速升降結構,乃具有以下之特徵及優點:The rapid lifting structure of the test fixture disclosed in the present invention has the following features and advantages:

1.可以快速、無段地升降該滑座(20),即可以在旋轉該旋鈕(33)小於360度的狀態下,便可完成所有升降總行程的操作,使操作更為快速。1. The slider (20) can be lifted quickly and without segments, that is, the operation of all the lifting and lowering strokes can be completed in a state where the knob (33) is rotated less than 360 degrees, so that the operation is faster.

2.該聯動軸(30)之軸段(31)第二端,係呈等徑度地環狀排列凹設有多數固定孔(311),藉由不同固定孔(311)與旋鈕(33)對應鎖接,便可以決定該聯動段(32)與該滑座(20)間之相對位置,以調整該滑座(20)滑動時之起始相對位置,以因應不同的檢測條件之需。2. The second end of the shaft section (31) of the linkage shaft (30) is annularly arranged with equal diameters and provided with a plurality of fixing holes (311), by different fixing holes (311) and knobs (33) Corresponding to the locking, the relative position between the linkage segment (32) and the sliding seat (20) can be determined to adjust the initial relative position of the sliding seat (20) when sliding, in order to meet different detection conditions.

3.結構簡單、組裝容易。3. Simple structure and easy assembly.

本新型所揭示之結構、形狀可於不違本新型之精神及範疇下,予以修飾應用,本新型並不自限於上述之實施方式。The structure and shape disclosed in the present invention can be modified and applied without departing from the spirit and scope of the present invention. The present invention is not limited to the above embodiments.

(10)‧‧‧基座(10) ‧ ‧ pedestal

(101)‧‧‧被檢測物(101)‧‧‧Tested objects

(102)‧‧‧座體(102) ‧ ‧ ‧ body

(11)‧‧‧滑穴(11)‧‧‧Slip

(12)‧‧‧軸孔(12)‧‧‧Axis hole

(13)‧‧‧扣鉤(13) ‧‧‧catch

(131)‧‧‧勾扣部(131)‧‧‧Deduction

(14)‧‧‧彈簧(14) ‧ ‧ spring

(20)‧‧‧滑座(20)‧‧‧Slide

(21)‧‧‧軸穴(21)‧‧‧ Axial

(22)‧‧‧壓制面(22) ‧ ‧ pressed surface

(30)‧‧‧聯動軸(30)‧‧‧ linkage axis

(31)‧‧‧軸段(31)‧‧‧ shaft segments

(310)‧‧‧擋肩(310)‧‧‧ Shoulder

(311)‧‧‧固定孔(311)‧‧‧Fixed holes

(32)‧‧‧聯動段(32) ‧‧‧ linkage segment

(33)‧‧‧旋鈕(33)‧‧‧ knob

(331)‧‧‧固定穿孔(331) ‧‧‧Fixed perforation

(41)‧‧‧導引槽(41) ‧‧‧ guiding slot

(411)‧‧‧水平段(411) ‧‧‧ horizontal section

(42)‧‧‧導銷(42) ‧‧ ‧ sales guide

(D)‧‧‧距離(D) ‧ ‧ distance

Claims (8)

一種測試治具之快速升降結構,係包括:一基座,用以固定於供被檢測物檢測使用之座體上,該基座凹設有一滑穴,並貫穿一軸孔者;一滑座,滑置於該基座之滑穴中者;以及一聯動軸,含有一軸段,樞裝於該基座之軸孔中,並於該軸段之第一端,軸向地突伸一聯動段,令該聯動段軸向套接該滑座,並令該聯動軸之聯動段與滑座上,設有至少一組對應之導引槽及導銷,該導銷係伸入於該導引槽中,且令該導引槽之兩端投影在一平行該滑座之滑動方向的平面上時,相隔一距離,於旋轉該聯動軸時,可驅使該導銷於該導引槽中產生相對滑移,驅使該滑座沿該滑穴昇降者。A rapid lifting structure for a test fixture includes: a base for fixing to a seat for detecting the object to be detected, the base having a sliding hole and extending through a shaft hole; a sliding seat, a sliding shaft disposed in the sliding hole of the base; and a linkage shaft, comprising a shaft segment pivotally mounted in the shaft hole of the base, and axially protruding a linkage portion at the first end of the shaft segment The linkage section axially sleeves the sliding seat, and the linkage section of the linkage shaft and the sliding seat are provided with at least one corresponding guiding slot and a guiding pin, and the guiding pin extends into the guiding slot And, when the two ends of the guiding groove are projected on a plane parallel to the sliding direction of the sliding seat, separated by a distance, when the rotating shaft is rotated, the guiding pin can be driven to generate relative in the guiding groove Sliding, driving the slider along the sliding point. 如申請專利範圍第1項所述測試治具之快速升降結構,其中該基座,於其兩相對側,係分別樞裝一扣鉤,並令兩該扣鉤與該基座間,分別彈性地頂撐一彈簧者。The quick lifting structure of the test fixture according to claim 1, wherein the base is pivotally mounted on a pair of opposite sides thereof, and the two hooks and the base are elastically respectively Support a spring. 如申請專利範圍第1項所述測試治具之快速升降結構,其中該滑座,係軸向地凹設有一軸穴,以容許該聯動軸之聯動段伸入於內,並令該滑座之底部,界定形成一壓制面,以迫壓於該被檢測物上者。The quick lifting structure of the test fixture according to the first aspect of the invention, wherein the sliding seat is axially recessed with a shaft hole to allow the linkage section of the linkage shaft to extend therein, and the sliding seat is made At the bottom, a person defining a pressing surface to press against the object to be tested is defined. 如申請專利範圍第1項所述測試治具之快速升降結構,其中該聯動軸之軸段與該聯動段間,係形成一擋肩,並使該軸段穿出該基座之軸孔後,令該軸段之第二端鎖接一旋鈕者。The quick lifting structure of the test fixture according to the first aspect of the invention, wherein a shaft shoulder is formed between the shaft section of the linkage shaft and the linkage section, and the shaft section is passed through the shaft hole of the base. , the second end of the shaft segment is locked to a knob. 如申請專利範圍第4項所述測試治具之快速升降結構,其中該軸段之第二端,係呈等徑度地環狀排列凹設有多數固定孔,而該旋鈕上係穿設有固定穿孔,藉由不同固定孔與旋鈕之固定穿孔對應鎖接,以決定該聯動段與該滑座間之相對位置者。The quick lifting structure of the test fixture according to the fourth aspect of the invention, wherein the second end of the shaft section is arranged in an annular shape with a plurality of fixing holes, and the knob is provided with a plurality of fixing holes. The fixed perforation is fixed by the fixing holes of the knob by different fixing holes to determine the relative position between the linkage segment and the sliding seat. 如申請專利範圍第1項所述測試治具之快速升降結構,係令該導銷徑向地穿置於該聯動軸之聯動段上,且向外徑向突出該聯動段,而該導引槽係徑向穿設於該滑座之軸穴上者。The quick lifting structure of the test fixture according to claim 1 is such that the guide pin is radially inserted on the linkage section of the linkage shaft, and the linkage section is radially outwardly protruded, and the guiding The groove is radially disposed on the shaft of the sliding seat. 如申請專利範圍第1項所述測試治具之快速升降結構,係令該導銷徑向地突設在滑座上,而該導引槽係徑向穿設於該聯動軸之聯動段上者。The rapid lifting structure of the test fixture according to the first aspect of the patent application is such that the guide pin is radially protruded from the sliding seat, and the guiding groove is radially disposed on the linkage section of the linkage shaft. By. 如申請專利範圍第1項所述測試治具之快速升降結構,其中於該聯動段與滑座上,係可對應地設置多數組相對應之導銷及導引槽者。For example, in the fast lifting structure of the test fixture according to the first aspect of the patent application, in the linkage section and the sliding seat, the corresponding guide pins and guiding slots of the plurality of arrays can be correspondingly arranged.
TW102208175U 2013-05-03 2013-05-03 Testing fixture for rapid elevating structure TWM460276U (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI579568B (en) * 2016-04-12 2017-04-21 致茂電子股份有限公司 Electronic device testing apparatus with fastening mechanism for pressing header and socket plate

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI579568B (en) * 2016-04-12 2017-04-21 致茂電子股份有限公司 Electronic device testing apparatus with fastening mechanism for pressing header and socket plate
US10254308B2 (en) 2016-04-12 2019-04-09 Chroma Ate Inc. Electronic device testing apparatus with locking mechanism for pressing header and socket plate

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