TWM450730U - Tester structure improvement - Google Patents

Tester structure improvement Download PDF

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Publication number
TWM450730U
TWM450730U TW101221908U TW101221908U TWM450730U TW M450730 U TWM450730 U TW M450730U TW 101221908 U TW101221908 U TW 101221908U TW 101221908 U TW101221908 U TW 101221908U TW M450730 U TWM450730 U TW M450730U
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Taiwan
Prior art keywords
base
test machine
locking
handle
improved
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TW101221908U
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Chinese (zh)
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Yuan-Ji Lin
Hong-Yi Zeng
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Arktek Co Ltd
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Priority to TW101221908U priority Critical patent/TWM450730U/en
Publication of TWM450730U publication Critical patent/TWM450730U/en

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Description

測試機台結構改良Test machine structure improvement

本創作係為一種測試機台結構改良,尤指一種可避免握柄的位置易被任意更動,導致測試訊號中斷之缺失,進而可提升測試機台可靠度與測試良率之測試機台結構。This creation is a test machine structure improvement, especially a test machine structure that can avoid the position of the handle being easily changed, resulting in the lack of test signal interruption, thereby improving the reliability and test yield of the test machine.

一般半導體產業之測試機台,請參閱第一圖所示,其通常係由一機台本體10與一設置於該機台本體10上的基座11所構成,該基座11上設有訊號連接部12,該訊號連接部12與機台本體10電性連接,俾使該機台本體10的測試訊號可傳送至該訊號連接部12,當欲進行測試作業時,請再配合參閱第二圖所示,操作者會將一塊電路板20固定並安裝到該基座11上,此一動作稱為對接(docking),通常該電路板20周圍會設有一結構補強框22(stiffener),該結構補強框22可於對接時對電路板20提供較佳之結構承受力,又該電路板20底部表面設有與該訊號連接部12相對應的訊號被連接部21,俾當該電路板20與底座11完成對接後,該電路板20其訊號被連接部21可與該底座11其訊號連接部12穩固觸接而達成電性連接,操作者即可將待測物(Device Under Test,DUT)置於該電路板20的測試區23上進行測試。The test machine of the general semiconductor industry, as shown in the first figure, is generally composed of a machine body 10 and a base 11 disposed on the machine body 10, and the base 11 is provided with a signal. The connection portion 12 is electrically connected to the machine body 10 so that the test signal of the machine body 10 can be transmitted to the signal connection portion 12. When the test operation is to be performed, please refer to the second reference. As shown, the operator will fix and mount a circuit board 20 to the base 11. This action is called docking. Usually, a structural reinforcement frame 22 (stiffener) is disposed around the circuit board 20. The structural reinforcement frame 22 can provide a better structural endurance to the circuit board 20 when docked, and the bottom surface of the circuit board 20 is provided with a signal-connected portion 21 corresponding to the signal connection portion 12, when the circuit board 20 is After the base 11 is docked, the signal of the circuit board 20 can be firmly connected to the signal connection portion 12 of the base 11 to achieve electrical connection, and the operator can take the device under test (DUT). The test is placed on the test area 23 of the circuit board 20.

請參閱第一圖、第三圖所示,該機台本體10尚包含有滑動塊13與對接切換機構14,其中該滑動塊13係可滑移地設置於該基座11上,該滑動塊13一側面設有斜向導槽131,該斜向導槽131一端設有出入口132,該對接切換機構14則與該滑動塊13動力連接,又該對接切換機構14通常可由連桿141與 轉盤142所組成,且該連桿141可分別與該轉盤142或滑動塊13動力連接,又該轉盤142可進一步連接設有握柄143,請再配合參閱第二圖所示,該結構補強框22設有與該滑動塊13其出入口132相對應的軸承221,藉此,俾當操作者欲將該電路板20與底座11對接時,即可將該結構補強框22的軸承221對準並放入該滑動塊13其出入口132內,請再參閱第三圖所示,此時操作者可轉動該握柄143以帶動轉盤142轉動,而使該轉盤142可進一步帶動連桿141與滑動塊13水平移位,請再參閱第二圖、第四圖所示,此時該滑動塊13即可帶動其斜向導槽131橫向水平移位,而使該斜向導槽131可利用凸輪原理帶動該結構補強框22其軸承221向下垂直移位,也即可使整個電路板20向下位移,俾使該電路板20其訊號被連接部21與該底座11其訊號連接部12兩者可穩固觸接,如此即可完成對接動作流程;當操作者欲解除該電路板20與底座11之對接狀態時(稱為undocking),只需反向轉動該握柄143即可,又該對接切換機構14及滑動塊13其細部結構、連接關係與動作原理皆為所屬技術領域中具備通常知識者所熟知,於此不再詳述。Referring to the first and third figures, the machine body 10 further includes a sliding block 13 and a docking switching mechanism 14 , wherein the sliding block 13 is slidably disposed on the base 11 , the sliding block A side of the 13 is provided with a slanting guide groove 131. The slanting guide groove 131 is provided with an inlet and outlet 132 at one end. The docking switching mechanism 14 is electrically connected to the sliding block 13, and the docking switching mechanism 14 can generally be connected by the connecting rod 141. The turntable 142 is composed of the turntable 142, and the connecting rod 141 can be respectively connected to the turntable 142 or the sliding block 13 respectively, and the turntable 142 can be further connected with the handle 143. Please refer to the second figure to see the structure reinforcing frame. 22 is provided with a bearing 221 corresponding to the entrance and exit 132 of the sliding block 13, whereby when the operator wants to interface the circuit board 20 with the base 11, the bearing 221 of the structural reinforcing frame 22 can be aligned and The slide block 13 is placed in the inlet and outlet 132. Please refer to the third figure. At this time, the operator can rotate the handle 143 to drive the turntable 142 to rotate, so that the turntable 142 can further drive the link 141 and the slide block. 13 horizontal shift, please refer to the second figure and the fourth figure again. At this time, the sliding block 13 can drive the horizontally horizontal displacement of the oblique guiding groove 131, so that the inclined guiding groove 131 can drive the cam principle. The structural reinforcing frame 22 has its bearing 221 vertically displaced downward, so that the entire circuit board 20 can be displaced downward, so that the signal of the circuit board 20 can be stabilized by both the connecting portion 21 and the signal connecting portion 12 of the base 11. Touch, so that the docking action flow can be completed; when the operator wants In addition to the docking state of the circuit board 20 and the base 11 (referred to as "undocking"), only the handle 143 can be reversely rotated, and the detailed structure, connection relationship and operation principle of the docking switching mechanism 14 and the sliding block 13 are It is well known to those of ordinary skill in the art and will not be described in detail herein.

該習用之對接切換機構14雖可切換電路板20與底座11之對接狀態,但其並無避免或防止不慎誤觸或撥動該握柄143之機構設計,故測試時容易因人為或意外等因素而使該握柄143位置被任意更動,導致測試訊號中斷甚至造成測試機台或待測物之損壞,因此實有改進之必要。Although the conventional docking switching mechanism 14 can switch the docking state of the circuit board 20 and the base 11, but it does not prevent or prevent accidental mis-touch or toggle the mechanism design of the handle 143, so it is easy to be artificial or accidental during testing. The position of the handle 143 is arbitrarily changed by other factors, causing the test signal to be interrupted or even causing damage to the test machine or the object to be tested, so that there is a need for improvement.

是故,如何將上述等缺失加以摒除,即為本案創作人所欲解決之技術困難點之所在。Therefore, how to eliminate the above-mentioned defects is the technical difficulty point that the creators of this case want to solve.

有鑑於現有之測試機台,因握柄無安全制鎖機構設計,故於測試時易 被撥動而造成測試訊號中斷,因此本創作之目的在於提供一種測試機台結構改良,藉由該基座設有卡抵機構,且該對接切換機構其握柄內設有與該卡抵機構相對應的制鎖機構,而可透過控制切換該制鎖機構與該卡抵機構兩者之卡抵或分離,達到防止該握柄在測試中被意外撥動之安全制鎖功能,而可避免習用握柄的位置易被任意更動,導致測試訊號中斷之缺失,進而使本創作可達到提升測試機台可靠度與測試良率之功效。In view of the existing test machine, because the handle has no safety lock mechanism design, it is easy to test. The purpose of the creation is to provide a test machine structure improvement. The base is provided with a card abutting mechanism, and the docking switching mechanism is provided with a locking mechanism in the handle. Corresponding locking mechanism can control the switching of the locking mechanism and the locking mechanism to achieve the safety locking function of preventing the handle from being accidentally toggled during the test, thereby avoiding The position of the conventional grip is easily changed, resulting in the lack of test signal interruption, which in turn enables the creation of the test machine to improve the reliability and test yield of the test machine.

為達成以上之目的,本創作係提供一種測試機台結構改良,其包含:一機台本體;一基座,該基座設置於該機台本體上,該基座設有一卡抵機構,該卡抵機構固設於該基座一側或下方;至少兩個滑動塊,該滑動塊係可滑移地設置於該基座上;一對接切換機構,該對接切換機構與各該滑動塊動力連接,該對接切換機構包含有連桿與轉盤,該連桿分別與該滑動塊或轉盤動力連接,該轉盤進一步連接設有握柄,該握柄設有容置空間,該容置空間內設有與該卡抵機構相對應的制鎖機構;藉由該基座設有卡抵機構,且該對接切換機構其握柄內設有與該卡抵機構相對應的制鎖機構,而可透過控制切換該制鎖機構與該卡抵機構兩者之卡抵或分離,達到防止該握柄在測試中被意外撥動之安全制鎖功能,而可避免習用握柄的位置易被任意更動,導致測試訊號中斷之缺失,進而使本創作可達到提升測試機台可靠度與測試良率之功效。In order to achieve the above object, the present invention provides a test machine structure improvement, comprising: a machine body; a base, the base is disposed on the machine body, the base is provided with a card abutting mechanism, The card abutting mechanism is fixed on one side or the bottom of the base; at least two sliding blocks are slidably disposed on the base; a pair of switching mechanisms, the docking switching mechanism and each sliding block power The connecting mechanism includes a connecting rod and a turntable, and the connecting rod is respectively connected to the sliding block or the rotary table. The rotating plate is further connected with a handle, and the handle is provided with an accommodating space, and the receiving space is provided There is a locking mechanism corresponding to the locking mechanism; the base is provided with a locking mechanism, and the docking switching mechanism has a locking mechanism corresponding to the locking mechanism in the handle, and is transparent Controlling the switching of the locking mechanism of the locking mechanism and the locking mechanism to achieve a safety locking function for preventing the handle from being accidentally toggled during the test, and avoiding the position of the conventional grip being easily changed. Lead to the interruption of the test signal And thus enable the creation of up to enhance the efficacy of the test machine reliability and yield of the test.

為使 貴審查員方便簡捷瞭解本創作之其他特徵內容與優點及其所達 成之功效能夠更為顯現,茲將本創作配合附圖,詳細說明如下:請參閱第五圖所示,本創作係提供一種測試機台結構改良,其包含:一機台本體3;一基座4,該基座4設置於該機台本體3上,該基座4設有訊號連接部41,該訊號連接部41與機台本體3電性連接,又該基座4設有一卡抵機構42,該卡抵機構42固設於該基座4一側或下方,在本實施例中,該卡抵機構42係固設於該基座4一側,又該卡抵機構42具有一被抵部421,該被抵部421可為軸棒;至少兩個滑動塊5,該滑動塊5係可滑移地設置於該基座4上,且該兩個滑動塊5較佳地係設置於該基座4之對角線上,該滑動塊5其細部構造係屬先前技術且非本案技術特徵,於此不再贅述;一對接切換機構6,請再配合參閱第六圖所示,該對接切換機構6與各該滑動塊5動力連接,該對接切換機構6包含有連桿61與轉盤62,其中該連桿61可分別與該滑動塊5或轉盤62動力連接,該轉盤62可進一步連接設有握柄63,藉此,俾可藉由轉動該握柄63以帶動該轉盤62轉動,而使該轉盤62可進一步帶動連桿61及滑動塊5水平移位,又該連桿61、轉盤62的細部構造及其與滑動塊5之連結關係與動作原理皆屬先前技術且非本案特徵,故在此不予詳述;請再配合參閱第七圖所示,該握柄63設有容置空間631,該容置空間631內設有與該卡抵機構42相對應的制鎖機構64,該制鎖機構64包含有鎖扣件641、轉軸642與彈性件643,其中該轉軸642兩端分別固設於該容置空間631的頂部與底部,該鎖扣件641與轉軸642相軸接,該鎖扣件641兩端可分別設有施力臂644及與該卡抵機構42其被 抵部421相對應的卡扣部645,且該施力臂644與卡扣部645分別位於該轉軸642兩側,藉此,而使該施力臂644與卡扣部645可以該轉軸642為支點進行槓桿運動,又該卡扣部645可為凹口,另該鎖扣件641於卡扣部645一側可設有導角646,又該彈性件643兩端分別與該鎖扣件64其施力臂644及容置空間631側壁相固設,另該彈性件643可為彈簧;請參閱第六圖、第七圖所示,俾當操作者轉動本創作的握柄63進行對接(docking)動作時,藉由該制鎖機構64設於該握柄63的容置空間631內,且該鎖扣件641於卡扣部645一側設有導角646,而使該握柄63可帶動該制鎖機構64其鎖扣件641朝靠近該卡抵機構42其被抵部421的方向移位,而可令該被抵部421抵靠該鎖扣件641的導角646,同時該被抵部421也會沿著該導角646朝靠近卡扣部645的方向進行相對運動滑移,此時該鎖扣件641也會因導角646受力而轉動,同時該彈性件643即會受到鎖扣件641其施力臂644的擠壓而儲存有一彈性恢復力,請再配合參閱第八圖所示,俾當該握柄63轉動超過一定範圍而使該被抵部421順利滑過該導角646時,該彈性件643所儲存的彈性恢復力即可帶動該施力臂644轉動復位,而使該鎖扣件641其卡扣部645可與該被抵部421相卡抵,請再配合參閱第五圖所示,因該被抵部421係與底座5相固設,故此時該握柄63即會因卡扣部645與被抵部421相卡抵而無法再任意撥動,同時該握柄63也已完成對接之動作流程,而使本創作可於原有的對接動作中自動完成該制鎖機構64的安全制鎖功能;此外,請再參閱第九圖所示,當操作者欲解除對接(undocking)或解除該制鎖機構64的上鎖狀態時,只需按壓該鎖扣件641其施力臂644即可使該卡扣部645轉動移位而令其與該被抵部421 分離,此時操作者即可反向轉動該握柄63而完成解除對接之動作流程,進而使本創作可達到提供測試機台對接安全制鎖功能之目的。In order to make it easy for your examiner to understand the other features and advantages of this creation and its advantages. The effect can be more obvious. I will explain this creation with the drawings as follows: Please refer to the fifth figure. This creation provides a test machine structure improvement, which includes: a machine body 3; a base a base 4, the base 4 is disposed on the machine body 3, the base 4 is provided with a signal connection portion 41, the signal connection portion 41 is electrically connected to the machine body 3, and the base 4 is provided with a card The mechanism 42 is fixed to the side of the base 4 or below. In this embodiment, the latching mechanism 42 is fixed on the side of the base 4, and the latching mechanism 42 has a The abutting portion 421 can be a shaft rod; at least two sliding blocks 5 are slidably disposed on the base 4, and the two sliding blocks 5 are preferably The sliding block 5 is disposed on the diagonal line of the base 4, and the detailed structure of the sliding block 5 is a prior art and is not a technical feature of the present invention, and is not described herein again; the paired switching mechanism 6 is referred to the sixth figure. The docking switching mechanism 6 is electrically connected to each of the sliding blocks 5, and the docking switching mechanism 6 includes a connecting rod 61 and a turntable 62, wherein the connecting rod 61 The rotating block 5 or the turntable 62 can be respectively connected to the sliding block 5 or the turntable 62. The turntable 62 can be further connected with a handle 63. The turntable 62 can be rotated by rotating the handle 63 to make the turntable 62 Further, the connecting rod 61 and the sliding block 5 are horizontally displaced, and the detailed structure of the connecting rod 61 and the rotating plate 62 and the connection relationship with the sliding block 5 and the operating principle are all prior art and are not the characteristics of the present case. The shank 63 is provided with a accommodating space 631. The accommodating space 631 is provided with a locking mechanism 64 corresponding to the locking mechanism 42. The locking mechanism is provided. The locking member 641 includes a locking member 641, a rotating shaft 642 and an elastic member 643. The two ends of the rotating shaft 642 are respectively fixed on the top and the bottom of the accommodating space 631. The locking member 641 is axially coupled to the rotating shaft 642. The two ends of the piece 641 can be respectively provided with a force applying arm 644 and the card engaging mechanism 42 The abutting portion 421 corresponds to the locking portion 645, and the biasing arm 644 and the locking portion 645 are respectively located on opposite sides of the rotating shaft 642, whereby the biasing arm 644 and the locking portion 645 can be pivoted by the rotating shaft 642. The lever portion 645 can be a notch, and the locking member 641 can be provided with a guiding angle 646 on the side of the locking portion 645, and the two ends of the elastic member 643 are respectively coupled to the locking member 64. The arm 644 and the side wall of the accommodating space 631 are fixed, and the elastic member 643 can be a spring; as shown in the sixth and seventh figures, when the operator rotates the grip 63 of the present invention for docking (docking) During the operation, the locking mechanism 64 is disposed in the accommodating space 631 of the handle 63, and the locking member 641 is provided with a guiding angle 646 on the side of the locking portion 645, so that the handle 63 can be driven. The locking mechanism 64 has its locking member 641 displaced in the direction of the abutting portion 421 of the locking mechanism 64, so that the abutting portion 421 can abut the guiding angle 646 of the locking member 641 while the The abutting portion 421 is also slidably moved along the guiding angle 646 toward the locking portion 645. At this time, the locking member 641 is also rotated by the guiding angle 646, and the The 643 is compressed by the urging arm 644 of the locking member 641 to store an elastic restoring force. Please refer to the eighth figure as shown in the eighth figure. When the handle 63 rotates beyond a certain range, the detachment is offset. When the portion 421 smoothly slides over the guide 646, the elastic restoring force stored by the elastic member 643 can drive the urging arm 644 to rotate and reset, so that the locking member 641 can be engaged with the affixed portion 645. As shown in the fifth figure, the contact portion 421 is fixed to the base 5, so that the grip 63 is locked by the buckle portion 645 and the abutted portion 421 at this time. It can no longer be arbitrarily dialed, and the grip 63 has also completed the docking action flow, so that the creation can automatically complete the safety lock function of the lock mechanism 64 in the original docking action; in addition, please refer to As shown in FIG. 9 , when the operator wants to release the undocking or release the locking state of the locking mechanism 64, the pressing member 644 can be rotated by simply pressing the locking member 641. And let it be with the afflicted part 421 Separating, at this time, the operator can reversely rotate the grip 63 to complete the disengagement action flow, thereby enabling the creation to achieve the purpose of providing the test machine docking safety lock function.

請參閱第五圖、第六圖所示,藉由該基座4設有卡抵機構42,且該對接切換機構6其握柄63內設有與該卡抵機構42相對應的制鎖機構64,而可透過控制切換該制鎖機構64與該卡抵機構42兩者之卡抵或分離,達到防止該握柄63在測試中被意外撥動之安全制鎖功能,而可避免習用握柄143的位置易被任意更動,導致測試訊號中斷甚至造成測試機台或待測物損壞之缺失,進而使本創作可達到提升測試機台可靠度與測試良率之功效。Referring to FIG. 5 and FIG. 6 , the base 4 is provided with a latching mechanism 42 , and the docking switch mechanism 6 has a lock mechanism corresponding to the latching mechanism 42 in the grip 63 . 64, and can control the switching of the lock mechanism 64 and the card abutment mechanism 42 to achieve a locking or separating function, thereby preventing the handle 63 from being accidentally toggled during the test, and avoiding the use of the grip. The position of the handle 143 is easily changed, resulting in the interruption of the test signal or even the loss of the test machine or the object to be tested, thereby enabling the creation of the test machine to improve the reliability and test yield of the test machine.

請再參閱第十圖、第十一圖所示係為本創作之第二實施例,其中該基座4係為圓形,且該基座4設有一容置槽44,該容置槽44可為圓形,又該卡抵機構42係固設於該基座4一側或上方,在本實施例中,該卡抵機構42係固設於該基座4上方,且該卡抵機構42其被抵部421係位於該卡抵機構42中間,又該被抵部421可為凹槽,另該被抵部421兩側可分別設有導引部422,該導引部422可為斜面或為導角,此外,該基座4尚可包含有至少一個第二卡抵機構43,該第二卡抵機構43可固設於該基座4上方,且該第二卡抵機構43位於該卡抵機構42一側,又該第二卡抵機構43亦可分別設有一位於中間的被抵部421及位於該被抵部421兩側的導引部422,又該基座4上可設有至少一個限位部45,該限位部45可為凸塊,另外,本創作更可進一步包含有一對鎖裝置7,該對鎖裝置7係套置於該基座4其容置槽44上,該對鎖裝置7包含有一與該容置槽44相對應的環框本體71及至少一個與該環框本體71相連接的握柄72,藉此,使用者即可透過推動握炳72帶動該環框本體71相對該基座4轉動,又該環框本體71上可設有至少 兩個斜向導槽711,其中各該斜向導槽711一端分別設有出入口712,藉此,請再參閱第十一圖所示,俾當操作者將外部的電路板其結構補強框8的軸承81對準並放入該環框本體71其斜向導槽711之出入口712時,即可推動該握炳72轉動該環框本體71,而可帶動該斜向導槽711轉動移位,俾可依與習用相同的動作原理完成對接(docking)動作流程,而使本實施例可以該對鎖裝置7取代第一實施例中的滑動塊5與對接切換機構6,另,該環框本體71尚可設有至少一個與該基座4其限位部45相對應的被限位部713,該被限位部713可為長條孔,又該限位部45係可活動地與該被限位部713相穿設,藉此,而使該限位部45可對該環框本體71達到限位效果,又,該握柄72設有容置空間721,在本實施例中,該容置空間721係開設於該握柄72底部,此外,本創作更具有一卡制機構65,該卡制機構65包含有一鎖扣件651與至少一個彈性件652,請再配合參閱第十二圖所示,其中該鎖扣件651係可活動滑移地置設於該容置空間721中,該鎖扣件651可為T字狀棒體,也即該鎖扣件651兩端可分別具有一施力臂654與一卡扣部655,且該施力臂654與卡扣部655分別突出於該容置空間721外,又該卡扣部655的位置可與該卡抵機構42其被抵部421或第二卡抵機構43其被抵部421的位置相對應,另該彈性件652兩端分別抵頂該鎖扣件651其施力臂654與容置空間721側壁,藉此,請再配合參閱第十二圖所示,俾當對接動作開始前,該鎖扣件65其卡扣部651係卡抵於該第二卡抵機構43其被抵部421中,此時,只有當操作者施力向外拉動該鎖扣件651其施力臂654,而使該鎖扣件651其卡扣部655脫離該第二卡抵機構43其被抵部421後,方可繼續推動該握柄72與環框本體71轉動以進行後續的對接 動作,藉此,俾使本創作可額外提供對接前的安全制鎖機制,俾可於對接前、後均具備安全制鎖功能,而可達到更佳之安全性,進而使本創作可兼具達到更佳產品可靠度之功效;請再參閱第十二圖、第十三圖所示,當操作者繼續推動該握柄72與環框本體71轉動時,即可帶動該鎖扣件651轉動移位並使其遠離第二卡抵機構43同時靠近該卡抵機構42,當該鎖扣件651其卡扣部655與該卡抵機構42其導引部422相觸接時,藉由該導引部422為斜面或為導角,而使該導引部422可發揮類似凸輪原理引導該鎖扣件651其卡扣部移位並滑入該卡抵機構42其被抵部421中,俾使該鎖扣件651其卡扣部655可與該卡抵機構42其被抵部421相卡抵,而如第十三圖所示,此時該環框本體71也已轉動至完成對接動作的位置,也即完成對接後的安全制鎖狀態,在此,本創作係透過拉動該鎖扣件651切換該卡制機構65對於環框本體71的安全制鎖狀態,俾使本實施例可以該卡制機構65取代第一實施例中的制鎖機構64,藉此,而使本實施例可將第一實施例中的滑塊5與對接切換機構6整合為單一的對鎖裝置7,並以結構及動作原理更為簡單可靠的卡制機構65取代制鎖機構64,進而使本創作可兼具簡化結構與節省成本之功效;此外,請再參閱第十圖所示,因本實施例其容置空間721係位於該握柄72底部,故該卡制機構65尚可進一步包含有一檔片653,該檔片653與該握柄72其容置空間721相固設,藉此,而可避免該容置空間721中的鎖扣件651與彈性件652掉出。Please refer to the tenth and eleventh drawings, which are the second embodiment of the present invention. The base 4 is circular, and the base 4 is provided with a receiving slot 44. The receiving slot 44 is provided. The latching mechanism 42 is fixed on one side or above the base 4, and in the embodiment, the latching mechanism 42 is fixed on the base 4, and the latching mechanism is fixed. 42, the abutting portion 421 is located in the middle of the engaging mechanism 42, and the abutting portion 421 can be a groove, and the guiding portion 422 can be respectively provided with a guiding portion 422, and the guiding portion 422 can be The slanting surface is a slanting surface. In addition, the pedestal 4 can further include at least one second yoke mechanism 43. The second yoke mechanism 43 can be fixed on the pedestal 4, and the second yoke mechanism 43 On the side of the card abutment mechanism 42 , the second card abutment mechanism 43 can also be respectively provided with a middle portion of the abutting portion 421 and a guiding portion 422 on both sides of the abutting portion 421 . At least one limiting portion 45 may be provided, and the limiting portion 45 may be a bump. In addition, the present invention may further include a pair of locking devices 7 that are sleeved on the base 4 and accommodated therein. Slot 44 The pair of lock devices 7 includes a ring frame body 71 corresponding to the receiving groove 44 and at least one handle 72 connected to the ring frame body 71, whereby the user can drive the grip 72 The ring frame body 71 is rotated relative to the base 4, and the ring frame body 71 can be provided with at least Two inclined guide grooves 711, wherein one end of each of the oblique guide grooves 711 is respectively provided with an inlet and outlet 712, whereby, as shown in the eleventh figure, the operator will reinforce the outer circuit board with the structure of the bearing of the frame 8 When the 81 is aligned and placed in the entrance and exit 712 of the ring frame body 71, the baffle 72 can be rotated to rotate the ring frame body 71, and the oblique guide groove 711 can be rotated and displaced. The operation principle of the docking process is completed in the same manner as the conventional operation, so that the lock device 7 can replace the slider 5 and the docking switch mechanism 6 in the first embodiment, and the ring frame body 71 can still be used. At least one of the limiting portion 713 corresponding to the limiting portion 45 of the base 4 is disposed. The restricted portion 713 can be a long hole, and the limiting portion 45 is movably and constrained. The portion 713 is disposed through, so that the limiting portion 45 can achieve a limiting effect on the ring frame body 71. Further, the handle 72 is provided with an accommodating space 721. In this embodiment, the receiving portion is provided. The space 721 is opened at the bottom of the handle 72. In addition, the creation has a card mechanism 65, and the card mechanism 65 includes a The locking member 651 and the at least one elastic member 652 are further referred to as shown in FIG. 12, wherein the locking member 651 is movably disposed in the accommodating space 721, and the locking member 651 can be The T-shaped rod body, that is, the locking member 651 has a biasing arm 654 and a latching portion 655 respectively, and the biasing arm 654 and the latching portion 655 respectively protrude outside the receiving space 721 The position of the latching portion 655 can be corresponding to the position of the abutting portion 421 of the abutting portion 421 or the second latching mechanism 43 of the latching mechanism 42, and the two ends of the elastic member 652 respectively abut the latch. The fastener 651 has a biasing arm 654 and a side wall of the accommodating space 721. Therefore, please refer to the twelfth figure. When the docking action starts, the locking component 65 is fastened to the latching portion 651. The second latching mechanism 43 is in the abutted portion 421. At this time, only when the operator applies the force to pull the latching member 651 to the arm 654, the latching member 651 is disengaged from the latching portion 655. After the second carding mechanism 43 is resisted by the portion 421, the handle 72 and the ring frame body 71 can be further rotated for subsequent docking. The action, in order to enable the creation of the security lock mechanism before docking, can be safely locked before and after docking, and achieve better security, so that the creation can achieve The effect of the reliability of the product is better; please refer to the twelfth and thirteenth drawings. When the operator continues to push the handle 72 and the ring frame body 71 to rotate, the locking member 651 can be rotated. Positioning and moving away from the second latching mechanism 43 while approaching the latching mechanism 42, when the latching member 651 has the latching portion 655 contacting the guiding portion 422 of the latching mechanism 42 The guiding portion 422 is a beveled surface or a guiding angle, so that the guiding portion 422 can guide the locking member 651 to shift the locking portion thereof and slide into the abutting portion 421 of the locking member 421. The locking portion 651 can be engaged with the abutting portion 421 of the locking member 651, and as shown in the thirteenth figure, the ring frame body 71 is also rotated to complete the docking action. The position, that is, the security lock state after the docking is completed. Here, the creation system switches the card by pulling the lock member 651. For the safety lock state of the ring frame body 71, the locking mechanism 64 of the first embodiment can be replaced by the locking mechanism 65 in this embodiment, thereby enabling the first embodiment to be implemented in this embodiment. In the example, the slider 5 and the docking switching mechanism 6 are integrated into a single pair locking device 7, and the locking mechanism 64 is replaced by a simple and reliable locking mechanism 65 with a structural and operational principle, thereby enabling the creation of a simplified structure. And the cost-saving effect; in addition, please refer to the tenth figure. Since the accommodating space 721 is located at the bottom of the handle 72 in this embodiment, the locking mechanism 65 may further include a flap 653. The flap 653 is fixed to the accommodating space 721 of the grip 72, whereby the latching member 651 and the elastic member 652 in the accommodating space 721 can be prevented from falling out.

為使本創作更加顯現出其進步性與實用性,茲與習用作一比較分析如下:In order to make this creation more progressive and practical, a comparative analysis is used as follows:

習用技術:Conventional technology:

1、握柄無安全制鎖機構設計,測試時易因被撥動而造成測試訊號中斷。1. The handle has no safety lock mechanism design, and the test signal is easily interrupted due to being dialed during the test.

2、測試機台可靠度較差。2. The reliability of the test machine is poor.

本創作優點:The advantages of this creation:

1、握柄具安全制鎖機構設計,可避免被撥動而造成測試訊號中斷。1. The handle has a safety lock mechanism designed to avoid interruption of the test signal caused by being dialed.

2、可提升測試機台可靠度與測試良率。2. It can improve the reliability and test yield of the test machine.

10‧‧‧機台本體10‧‧‧ machine body

11‧‧‧基座11‧‧‧Base

12‧‧‧訊號連接部12‧‧‧ Signal Connection

13‧‧‧滑動塊13‧‧‧Sliding block

131‧‧‧斜向導槽131‧‧‧ oblique guide slot

132‧‧‧出入口132‧‧‧ entrances and exits

14‧‧‧對接切換機構14‧‧‧Docking switching mechanism

141‧‧‧連桿141‧‧‧ Connecting rod

142‧‧‧轉盤142‧‧‧ Turntable

143‧‧‧握柄143‧‧‧Handle

20‧‧‧電路板20‧‧‧ boards

21‧‧‧訊號被連接部21‧‧‧ Signal connected

22‧‧‧結構補強框22‧‧‧Structural reinforcement frame

221‧‧‧軸承221‧‧‧ bearing

23‧‧‧測試區23‧‧‧Test area

3‧‧‧機台本體3‧‧‧ machine body

4‧‧‧底座4‧‧‧Base

41‧‧‧訊號連接部41‧‧‧Signal Connection

42‧‧‧卡抵機構42‧‧‧ card agency

421‧‧‧被抵部421‧‧‧Party

422‧‧‧導引部422‧‧‧Guidance

43‧‧‧第二卡抵機構43‧‧‧Second card arrival agency

44‧‧‧容置槽44‧‧‧ accommodating slots

45‧‧‧限位部45‧‧‧Limited

5‧‧‧滑動塊5‧‧‧Sliding block

6‧‧‧對接切換機構6‧‧‧Docking switching mechanism

61‧‧‧連桿61‧‧‧ linkage

62‧‧‧轉盤62‧‧‧ Turntable

63‧‧‧握柄63‧‧‧Handle

631‧‧‧容置空間631‧‧‧ accommodating space

64‧‧‧制鎖機構64‧‧‧Lock mechanism

641‧‧‧鎖扣件641‧‧‧Locks

642‧‧‧轉軸642‧‧‧ shaft

643‧‧‧彈性件643‧‧‧Flexible parts

644‧‧‧施力臂644‧‧‧施力臂

645‧‧‧卡扣部645‧‧‧ buckle department

646‧‧‧導角646‧‧‧ lead angle

65‧‧‧卡制機構65‧‧‧Card mechanism

651‧‧‧鎖扣件651‧‧‧Locks

652‧‧‧彈性件652‧‧‧Flexible parts

653‧‧‧檔片653‧‧ ‧ pieces

654‧‧‧施力臂654‧‧‧ force arm

655‧‧‧卡扣部655‧‧‧ buckle department

7‧‧‧對鎖裝置7‧‧‧Lock device

71‧‧‧環框本體71‧‧‧ ring frame body

711‧‧‧斜向導槽711‧‧‧ oblique guide slot

712‧‧‧出入口712‧‧‧ entrance

713‧‧‧被限位部713‧‧‧Restricted Department

72‧‧‧握柄72‧‧‧Handle

721‧‧‧容置空間721‧‧‧ accommodating space

8‧‧‧結構補強框8‧‧‧Structural reinforcement frame

81‧‧‧軸承81‧‧‧ bearing

第一圖係為習用測試機台之示意圖。The first picture is a schematic diagram of a conventional test machine.

第二圖係為習用測試機台與電路板對接之動作示意圖。The second figure is a schematic diagram of the action of the conventional test machine docking with the circuit board.

第三圖係為習用測試機台其對接切換機構之動作示意圖。The third figure is a schematic diagram of the action of the docking switching mechanism of the conventional test machine.

第四圖係為習用測試機台其滑動塊帶動軸承垂直移位之動作示意圖。The fourth figure is a schematic diagram of the action of the vertical displacement of the bearing by the sliding block of the conventional test machine.

第五圖係為本創作之示意圖。The fifth picture is a schematic diagram of the creation.

第六圖係為本創作其對接切換機構與制鎖機構之示意圖。The sixth figure is a schematic diagram of the docking switching mechanism and the locking mechanism.

第七圖係為本創作其制鎖機構於對接時自動制鎖之動作前示意圖。The seventh picture is a schematic diagram of the action before the automatic locking operation of the lock mechanism is created.

第八圖係為第七圖之動作後示意圖。The eighth figure is a schematic diagram of the action of the seventh figure.

第九圖係為本創作其制鎖機構解除鎖定之動作示意圖。The ninth figure is a schematic diagram of the action of unlocking the lock mechanism of the creation.

第十圖係為本創作其第二實施例之部分分解示意圖。The tenth figure is a partially exploded schematic view of the second embodiment of the present invention.

第十一圖係為本創作其第二實施例之部分組合示意圖。The eleventh figure is a partial combination diagram of the second embodiment of the present invention.

第十二圖係為本創作其第二實施例之動作前俯視示意圖。The twelfth figure is a schematic plan view of the second embodiment of the present invention.

第十三圖係為本創作其第二實施例之動作後俯視示意圖。The thirteenth drawing is a schematic plan view of the second embodiment of the present invention.

3‧‧‧機台本體3‧‧‧ machine body

4‧‧‧基座4‧‧‧Base

41‧‧‧訊號連接部41‧‧‧Signal Connection

42‧‧‧卡抵機構42‧‧‧ card agency

421‧‧‧被抵部421‧‧‧Party

5‧‧‧滑動塊5‧‧‧Sliding block

6‧‧‧對接切換機構6‧‧‧Docking switching mechanism

64‧‧‧制鎖機構64‧‧‧Lock mechanism

Claims (10)

一種測試機台結構改良,其包含:一機台本體;一基座,該基座設置於該機台本體上,該基座設有一卡抵機構,該卡抵機構固設於該基座一側或下方;至少兩個滑動塊,該滑動塊係可滑移地設置於該基座上;一對接切換機構,該對接切換機構與各該滑動塊動力連接,該對接切換機構包含有連桿與轉盤,該連桿分別與該滑動塊或轉盤動力連接,該轉盤進一步連接設有握柄,該握柄設有容置空間,該容置空間內設有與該卡抵機構相對應的制鎖機構,該制鎖機構包含有鎖扣件、轉軸與彈性件,其中該轉軸兩端分別固設於該容置空間的頂部與底部,該鎖扣件與轉軸相軸接,該鎖扣件兩端分別設有施力臂及與該卡抵機構相對應的卡扣部,且該施力臂與卡扣部分別位於該轉軸兩側,又該彈性件兩端分別與該鎖扣件其施力臂及容置空間側壁相固設。A test machine structure is improved, comprising: a machine body; a base, the base is disposed on the machine body, the base is provided with a card abutting mechanism, and the card abutting mechanism is fixed on the base Side or lower; at least two sliding blocks, the sliding block is slidably disposed on the base; a pair of switching mechanisms, the docking switching mechanism is dynamically connected with each sliding block, and the docking switching mechanism includes a connecting rod And the turntable, the connecting rod is respectively connected to the sliding block or the turntable, and the turntable is further connected with a handle, the handle is provided with an accommodating space, and the accommodating space is provided with a corresponding system corresponding to the latching mechanism a lock mechanism, the lock mechanism includes a lock member, a rotating shaft and an elastic member, wherein the two ends of the rotating shaft are respectively fixed on the top and the bottom of the accommodating space, and the locking member is axially coupled to the rotating shaft, and the locking member is The two ends are respectively provided with a force applying arm and a locking portion corresponding to the locking mechanism, and the force applying arm and the buckle portion are respectively located on two sides of the rotating shaft, and the two ends of the elastic member are respectively applied to the locking member The arm and the side wall of the accommodating space are fixed. 如申請專利範圍第1項所述之測試機台結構改良,其中該卡抵機構具有一被抵部。The test machine structure is improved as described in claim 1, wherein the card abutment mechanism has a resisted portion. 如申請專利範圍第2項所述之測試機台結構改良,其中該被抵部為軸棒。The test machine structure is improved as described in claim 2, wherein the abutted portion is a shaft rod. 如申請專利範圍第1項所述之測試機台結構改良,其中該卡扣部為凹口。The test machine structure as described in claim 1 is improved, wherein the buckle portion is a notch. 如申請專利範圍第1項所述之測試機台結構改良,其中該兩個滑動塊係設置於該基座之對角線上。The test machine structure is improved as described in claim 1, wherein the two sliding blocks are disposed on a diagonal of the base. 一種測試機台結構改良,其包含:一機台本體;一基座,該基座設置於該機台本體上,該基座為圓形,該基座設有至少一個卡抵機構,該卡抵機構固設於該基座一側或上方;一對鎖裝置,該對鎖裝置套置於該基座上,該對鎖裝置包含有一環框本體及至少一個與該環框本體相連接的握柄,又該環框本體上設有至少兩個斜向導槽,各該斜向導槽一端分別設有出入口,又該握柄設有容置空間;一卡制機構,該卡制機構包含有一鎖扣件與至少一個彈性件,其中該鎖扣件係可活動滑移地置設於該握柄其容置空間中,該鎖扣件兩端分別具有一施力臂與一卡扣部,且該施力臂與卡扣部分別突出於該容置空間外,又該卡扣部的位置與該卡抵機構的位置相對應,另該彈性件兩端分別抵頂該鎖扣件其施力臂與容置空間側壁。A test machine structure is improved, comprising: a machine body; a base, the base is disposed on the machine body, the base is circular, and the base is provided with at least one carding mechanism, the card The abutting mechanism is fixed on one side or the upper side of the base; a pair of locking devices are disposed on the base, the pair of locking devices comprise a ring frame body and at least one connected to the ring frame body a handle, the ring frame body is provided with at least two oblique guide grooves, one end of each of the oblique guide grooves is respectively provided with an entrance and exit, and the handle is provided with an accommodation space; a card mechanism, the card mechanism includes The locking member and the at least one elastic member, wherein the locking member is movably disposed in the accommodating space of the handle, and the two ends of the locking member respectively have a force applying arm and a buckle portion. And the urging arm and the buckle portion respectively protrude outside the accommodating space, and the position of the Snap portion corresponds to the position of the latching mechanism, and the two ends of the elastic member respectively abut against the latching member The arm and the side wall of the accommodation space. 如申請專利範圍第6項所述之測試機台結構改良,其中該卡抵機構具有一被抵部,且該被抵部位於該卡抵機構中間,又該被抵部為凹槽。The structure of the test machine according to claim 6 is improved, wherein the card abutting mechanism has an abutting portion, and the abutting portion is located in the middle of the engaging mechanism, and the abutting portion is a groove. 如申請專利範圍第7項所述之測試機台結構改良,其中該被抵部兩側分別設有導引部,且該導引部為斜面或為導角。The test machine structure according to claim 7 is improved, wherein the two sides of the abutting portion are respectively provided with guiding portions, and the guiding portion is a slope or a guiding angle. 如申請專利範圍第6項所述之測試機台結構改良,其中該鎖扣件為T字狀棒體。The structure of the test machine described in claim 6 is improved, wherein the locking member is a T-shaped rod. 如申請專利範圍第6項至第9項中任一項所述之測試機台結構改良,其中更包含有至少一個第二卡抵機構,該第二卡抵機構固設於該基座上方,且該第二卡抵機構位於該卡抵機構一側。The test machine structure improvement according to any one of claims 6 to 9, further comprising at least one second latching mechanism, the second latching mechanism being fixed above the base And the second carding mechanism is located on the side of the carding mechanism.
TW101221908U 2012-11-13 2012-11-13 Tester structure improvement TWM450730U (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI639833B (en) * 2018-03-30 2018-11-01 致茂電子股份有限公司 Foldable handle assembly and tester docking assembly
CN110318580A (en) * 2018-03-30 2019-10-11 致茂电子(苏州)有限公司 Handle assembly and test machine can be stored to connected components

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI639833B (en) * 2018-03-30 2018-11-01 致茂電子股份有限公司 Foldable handle assembly and tester docking assembly
CN110318580A (en) * 2018-03-30 2019-10-11 致茂电子(苏州)有限公司 Handle assembly and test machine can be stored to connected components
CN110318580B (en) * 2018-03-30 2021-01-12 致茂电子(苏州)有限公司 Can accomodate handle subassembly and test machine butt joint subassembly

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