TWM421550U - Testing device of touch panel - Google Patents

Testing device of touch panel Download PDF

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Publication number
TWM421550U
TWM421550U TW100217969U TW100217969U TWM421550U TW M421550 U TWM421550 U TW M421550U TW 100217969 U TW100217969 U TW 100217969U TW 100217969 U TW100217969 U TW 100217969U TW M421550 U TWM421550 U TW M421550U
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TW
Taiwan
Prior art keywords
test
touch panel
head
transmission mechanism
test head
Prior art date
Application number
TW100217969U
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Chinese (zh)
Inventor
Yuan-Ji Lin
Sheng-Jie Chen
Original Assignee
Arktek Co Ltd
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Application filed by Arktek Co Ltd filed Critical Arktek Co Ltd
Priority to TW100217969U priority Critical patent/TWM421550U/en
Publication of TWM421550U publication Critical patent/TWM421550U/en

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Description

M4Z1550 五、新型說明: 【新型所屬之技術領域】 本創作係為-_控面板職,尤指可於賴健進行前即可對 所有測試頭機構其測試頭完成下壓力量之校準,進而可達到提升測試精度 與降低成本及提升測試效率之功效。 【先前技術】 -般之驗面酬職置,如巾錢國糊公報雜695_「新型三 _測頭雙台面可定位之觸控面板測試機」,請參閱第—圖所示,其係利用一z 轴馬達11帶動-測試職構20下降位移,而使該測試頭機職其測試頭23 可抵壓該待侧之觸控面板12,再利用該測試頭機構2〇其荷重元21 Cell)感應偵測該彈簧22之變形量,而可換算出該測試頭23與觸控面板i2 之間的壓力,再藉由該壓力等荷重資訊之回授與2軸馬達叶降位移之補償 機制’而使制試賴可依預先設定之力量抵壓觸控面板12,進而可達 到測試該觸控面板12之目的。 鲁該「新型三測頭雙台面可定位之觸控面板測試機」,其雖可達到測試 該觸控面板12之目的,惟因該測試頭23其下壓力量係由彈簧22其變形量所 決定(彈性力學之虎克定律),而該彈簧22之變形量則取決於z軸馬達 降位移之量,但該彈簧22本身並無任何可事先調整或設定其變形量之機構 設計,因而並無法預先設定或校準該測試頭23其下壓之力量,因此該習用 之觸控面板測試機雖可設有數個測試頭機構2〇而可同時進行多片觸控面板 12之測試,但每一個測試頭機構20都必須配置一Z轴馬達11與一荷重元21, 方可控制該測試頭23每次下壓之力量,進而使得該測試頭機構2〇之結構設 3 M421550 計複雜且製造成本提高;此外,又因該彈簧22之變形量與測試頭23其下壓 力量無法事先調整與校準,因此該測試頭23每—次下壓測試該觸控面板12 時,系統皆須重複進行荷重資訊之回授與Z轴馬達u位移補償等動作與程 序,導致測試速度變慢與測試效率不佳,進而造成測試產能之降低。 又如中華民國專利公報第M385755號「觸控面板測試設備」,請參閱第 二圖所示,其係由一XYZS轴機構13帶動數個侧單元24水平或垂直位移, 而使該偵測單元24其職藝可下降抵壓該制之觸控面板14,以達到測M4Z1550 V. New description: [New technical field] This creation is -_ control panel, especially before Lai Jian can perform calibration of the pressure on all test heads. Improve the accuracy of testing and reduce costs and improve test efficiency. [Prior Art] - The general remuneration position, such as the towel money country bullet 695 _ "new three _ probe double table top positionable touch panel test machine", please refer to the figure - figure, the use A z-axis motor 11 drives-tests the lowering displacement of the job 20, so that the test head serves its test head 23 to press against the touch panel 12 of the standby side, and then uses the test head mechanism 2 to load its load element 21 Cell Inductively detecting the deformation amount of the spring 22, and converting the pressure between the test head 23 and the touch panel i2, and then applying the load information such as the pressure and the compensation mechanism of the 2-axis motor leaf drop displacement 'The test can be pressed against the touch panel 12 according to a predetermined force, and the purpose of testing the touch panel 12 can be achieved. Lu "The new three-head dual-surface-positionable touch panel tester" can achieve the purpose of testing the touch panel 12, but the amount of pressure under the test head 23 is determined by the amount of deformation of the spring 22. Determined (Hooke's Law of Elasticity), and the amount of deformation of the spring 22 depends on the amount of displacement of the z-axis motor, but the spring 22 itself does not have any mechanism design that can be adjusted or set in advance, and thus The power of the test head 23 can not be preset or calibrated. Therefore, the conventional touch panel tester can be provided with a plurality of test head mechanisms 2, and can simultaneously test a plurality of touch panels 12, but each one The test head mechanism 20 must be equipped with a Z-axis motor 11 and a load cell 21 to control the force of the test head 23 to be pressed each time, so that the structure of the test head mechanism 2 is complicated and the manufacturing cost is 3 M421550. In addition, because the deformation amount of the spring 22 and the amount of pressure under the test head 23 cannot be adjusted and calibrated in advance, the test head 23 must repeatedly load the touch panel 12 every time the test is performed. Capital The Z-axis motor and feedback compensation operations are u displacement procedure, the test results in poor test efficiency and slow down, thereby resulting in reduced production capacity of the test. For example, in the Republic of China Patent Gazette No. M385755 "Touch Panel Test Equipment", please refer to the second figure, which is driven by an XYZS axis mechanism 13 to horizontally or vertically shift a plurality of side units 24, so that the detection unit 24 his skills can be reduced to resist the touch panel 14 of the system to achieve measurement

觸控面板測試設備」並無荷重元或測試頭 25下壓«之感贿校正機構,因此其雖具有數個細單元編可同時進 灯多片觸控面板u之職’卻無法鱗—烟觸25其下壓力量進行預先 且個別之校正’因而容易造成各測試頭25下壓力量不準確且不—致 進而導致測試精準度與測試良率之降低 影響測試結果之正確性, 改進之必要。 是故,如作 困難點之所在〇 如何將上麟缺失加簡除,㈣本_作人所欲解決之技術 【新型内容】The touch panel test equipment does not have a load-bearing element or a test head 25 under the pressure of the bribe correction mechanism, so although it has several fine units, it can enter the multi-touch panel at the same time. Touching 25 the amount of pressure underneath to perform pre- and individual corrections' thus easily causing inaccurate pressures under each test head 25 and not causing the test accuracy and test yield to be reduced, which affects the correctness of the test results. . Therefore, if it is the point of difficulty, how to remove the missing of the upper lining, (4) this _ the technology that people want to solve [new content]

4 M421550 試精度與降低成本及提升測試效率之功效。 為達成以上之目的’本創作係提供一種觸控面板測試装置,其包含: 一機體,該機體内設有控制單元; 一進出料裝置,該進出料裝置設於該機體内,該進出料装置包含有至 少-個第-傳動機構與至少-個測試平台,該測試平台固設於該第—傳動 機構上方,該測試平台上尚包含有數個測試座與一荷重元;4 M421550 Test accuracy and cost reduction and test efficiency. In order to achieve the above objectives, the present invention provides a touch panel testing device, which comprises: a body having a control unit therein; an inlet and outlet device, the feeding and discharging device being disposed in the body, the feeding and discharging device The method includes at least one first transmission mechanism and at least one test platform, and the test platform is fixed on the first transmission mechanism, and the test platform further includes a plurality of test seats and a load cell;

-測試裝置,刺試裝置設於該機體内,且細試裝置設於該進出料 裝置上方,該測試裝置包含有_第二傳動機構與數個測試頭機構,該測試 頭機構尚包含有-測試本賴—難機構及—測_,糊試職構尚可 包含有-調整機構’該調整機構與該壓抵麟相穿固; 藉由該測試平台一側設有荷重元,該測試頭機構尚包含有一調整機 t,而可細細酬,職峨_峨輪m頭下壓之 力r,ΓΓ於測賴進行前即可對所有測試頭機糊試頭完成下壓 率進__達顺制__縣城升測試效 為使貴審查員方便簡捷瞭解本創作之其 成之功簡峨_驾樣 7、恤其所達 請參嶋圓所示,本創作係提供-種觸控面板H下:a test device, the stab test device is disposed in the body, and the fine test device is disposed above the feed and discharge device, the test device includes a second transmission mechanism and a plurality of test head mechanisms, the test head mechanism further includes - The test is based on the difficulty of the organization and the measurement, and the paste test structure may include an adjustment mechanism. The adjustment mechanism is worn with the pressure; and the test head is provided with a load cell on one side of the test platform. The organization still includes an adjustment machine t, and can be finely paid, the job _ 峨 峨 m m head down the force r, before the test is carried out, all the test head machine paste test head can complete the compression rate __ Dashun system __ County Chengsheng test effect is to make your examiner convenient and simple to understand the success of this creation _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ Under panel H:

-機體3 ’該機體3内設有控解元31 、H ^為微峨’陶W輸伽腦主機 平疋31電性連接,該輪 认褒置32與該控制 置32 了為鍵盤’又該機體3更可進一步包含 5 M421550 有—輪出裝置33 33可為螢幕; 該輸出裝置33_控制單元31電性連接 該輪出裝置 ㈣繼4,纖嶋4物機㈣侧料裝置〇 :至少傳動機構41與至少—個測試平台犯,該測試平台^ 傳動機構與測試平台42分別與該 八:制單元31電性連接,其中該第—傳動機構 時規皮帶或娜等結構所組成,俾舰第—_機構- The body 3 'The inside of the body 3 is provided with a control element 31, and H ^ is a micro-峨 'Tao W transmission gamma host flat 31 electrical connection, the wheel recognition device 32 and the control set 32 for the keyboard' The body 3 can further include a 5 M421550--the wheel-out device 33 33 can be a screen; the output device 33_ control unit 31 is electrically connected to the wheel-out device (4), and then the fiber-optic device (4) side-feed device: At least one of the transmission mechanism 41 and the at least one test platform, the test platform ^ transmission mechanism and the test platform 42 are electrically connected to the eight: unit 31, wherein the first transmission mechanism is composed of a timing belt or a structure.俾船第—_机构

=水平位移’又該第—傳動機構41其細部構造與動作原理係屬先前技姐 与本案技術特徵,故邮愼,辦姆,該㈣動機構❹ 測試平台42之數量均為兩個,藉由本創作其蝴裝置4包含有兩個第;; 傳動機構41與兩_試平台42,俾當其巾—酬試平台42進行測試作業 時,操作者即可·另—侧試平台42進行上下料作業,而可充分利用上 下料時間並使峨健不會帽,進而可使本_兼具提升職效率之功 效,該測試平台42上尚包含有數侧試錢與-荷重元43(LoadCell), 該荷重元43與 3其控鮮元31躲連接,請再配合相第四圖所示, 該測試座421 -侧設有訊號插座奶,該訊號插座似與該機體3其控制單 兀31電連接,又該測試座421上可設有數個固定孔似,請再配合參閱 第六圖所示’該固定孔423可供與廠務設備之真空系統相連接,俾當該真 空系統作神,該測試座421其固定孔423可吸固置放於制試座421上 待、丨 $面板6 ’以達到固定該觸控面板Θ之目的,此種透過真空之吸附 或釋放細定待測元件如晶,或液晶面板之方式已普遍應麟半導體或 面板產業之機H設備’其侧原讀技_為所屬技術領域巾具有通常知 6 M421550 訊號插座422後,即可使賴控面板6與機體3其控制單元3ι電 而可供驗料抑讀取_控吨6之資伽進行後續_ ^ 作者可透職輸人裝置32輸人啟動命令,該控鮮元&即弘 裝置4其第,機構41帶動該測試平台42水平位移至該測^置5料 方,該控制單元31可再令該測試裝置5其第二傳動機構Η帶動該測試= 機構52偷移下降,請再配合參閱第七騎示,而使綱試頭機構 其測試頭53可抵壓該觸控面板6,又藉由該第二傳動機構Η可為抛 機構,而侧二傳動機構52可繼續帶動該測試頭機構π與測試㈣ 照不同測試項目之需求直接於該觸控面板6上進行水平位移,該觸控面㈣ 即:將感應該測試頭53所產生之訊_料傳回該控鮮元&,而使該控 制早π 31可將最終之測試結果顯示於該輪出裝置犯上,進而使本創 達到測試該觸控面板6之目的。 請再參閱第三圖、第五圖所示,藉由該測試平台4卜側設有荷重元你= horizontal displacement 'the first transmission mechanism 41 its detailed structure and operation principle belongs to the previous technical sister and the technical characteristics of the case, so the number of the postal, the um, the (four) moving mechanism ❹ test platform 42 are two, borrow By the present invention, the butterfly device 4 includes two parts; the transmission mechanism 41 and the two-test platform 42, when the towel-reward test platform 42 performs the test operation, the operator can perform the other-side test platform 42 Material operation, and can make full use of the loading and unloading time and make the health not cap, so that this _ has the effect of improving the efficiency of the job, the test platform 42 also contains several side test money and load weight 43 (LoadCell) The load cell 43 and the third control element 31 are connected to each other. Please cooperate with the phase shown in the fourth figure. The test socket 421 is provided with a signal socket milk, and the signal socket is like the control unit 31 of the body 3. Electrical connection, and the test seat 421 can be provided with a plurality of fixing holes, please refer to the figure shown in the sixth figure. The fixing hole 423 can be connected with the vacuum system of the factory equipment, and when the vacuum system is used as a god The test socket 421 has a fixing hole 423 which can be affixed and placed on the test socket 421. Waiting for, 丨 $ panel 6 ' to achieve the purpose of fixing the touch panel, such a way to absorb or release the components to be tested, such as crystals, or liquid crystal panels through vacuum, has been generally accepted by the semiconductor or panel industry. The device 'the original reading technology _ is the technical field of the art has the general known 6 M421550 signal socket 422, then the control panel 6 and the body 3 its control unit 3 ι can be used for inspection and reading _ control ton 6 The GG is carried out _ ^ The author can pass the input device 32 input command, the control element & that is, the Hong device 4, the mechanism 41 drives the test platform 42 horizontal displacement to the test The control unit 31 can further cause the second transmission mechanism of the testing device 5 to drive the test = the mechanism 52 steals and descends, please refer to the seventh riding instruction, and the test head mechanism can be pressed against the test head 53 The touch panel 6 can be a throwing mechanism by the second transmission mechanism, and the side two transmission mechanism 52 can continue to drive the test head mechanism π and test (4) according to the requirements of different test items directly to the touch panel 6 Perform horizontal displacement on the touch surface (four): The information generated by the test head 53 is transmitted back to the control unit & and the control is displayed π 31 to display the final test result on the wheel-out device, thereby enabling the user to test the touch panel. The purpose of 6. Please refer to the third and fifth figures again, with the load cell on the side of the test platform 4

.該測試頭機構52尚包含有—機機構54,且該調整機構%為迫緊旋知, 請再配合參騎示,_______ 命令’而使該控解元31可令該測試裝置5其第二傳動機構Η帶動該測 試賴構52斜_直歸,峨該職補構52麵朗π可下塵抵 頂該荷重元43,該荷重元43即可將感測到之壓力與荷重資訊傳回該控制單 疋3卜該控制單元31可再將該壓力與荷重資訊顯示於該顯示裝置犯,此 時該操作朴可魏碰_ 54讀射向,崎制整機構μ 可迫緊壓縮或放_測試頭機構52其壓抵機構峨之彈性件微,而如第 八圖所示’而可調整並控制該彈性件淑之變形量,而可藉由彈性力學之 M421550 識者所熟知,於此不再詳加贅述; .i試裝置5,_試裝置5設於賴體W,且侧試裝置5設於該 她;'•置4上方該測趟置5包含有一第二傳動機制與數個測試頭 Γ 52 I該測試頭機構52固設於該第二傳動機㈣下方,該第二傳動機 Μ可為XYZ三軸機構,請再配合參閱第五圖所示,該測試頭機構π尚 ^含有-測試本體521與-壓抵機細及一測試頭53,_機構吻 =設於該測試本體521内,_試頭53固設於壓抵機構奶下方其中該 =機構522㈣含有_活動件卿與-雜件汹及—抵㈣,該彈 相=-端與該活動物相抵頂,該彈性件迦另一端與該抵件呦 另” 性件524可為精密彈簧,該抵件525與測試頭53相固設, 另-』Μ碩53可為電阻式剩試 為電阻式測試頭或為電容式_頭或為電谷式測試頭’藉由該測試頭53可 板或電容式_板之_,^錢本物___控面 測試頭機構52尚可包含有1替可使本創作兼具提升適用性之功效,該 其活動件523相穿固,該調^構54’該調整機構54與該_構522 更可進-步包含有一第三傳動54可為迫緊旋紐,又該測試頭機構52 構52 -側,該第三傳動機構55 ’該第二傳動機構55設於該測試頭機 第三傳動機構55尚包含有―麴::其控制單元31電性連接,又該 別與該氣壓缸别及制試 則與—從動件552,該從動件552分 設,該從動件552可為板體;52麵抵機構522之活動件523相固 請參閱第三圖、第六圖所示 該測試平台42其測試座421上,\當操作者將待測之觸控面板6置放於 波將該觸控φ^6魏號_6ι插於該 M421550 :克定:’肅改軸幽_ 53峨扣取力量直到該 t f _操作者所要的數值為止如此 即可元成早一測試頭機構52其測試頭53下愿力 作者也可再依術法繼續校正其他測試頭機構52 === =^作_切,㈣咖幽倾& _娜3完成下 =之校準,而可避免習用之觸控面板職装置無法對每一個測試頭烈 訂勤量進行預先且個別之校正,導致測試精準度與測試良率降低,或 母-個測胡節G都必須配置—z崎n與—荷編,導致結構 設計複雜且製造成本提高,或_試時找行即時之荷重制導致測試速 度變慢與職效辨鱗敎,•縣_可_提制試精度與降低 成本及提升測試效率之功效。The test head mechanism 52 further includes a mechanism 54, and the adjustment mechanism % is tightly screwed, please cooperate with the rider, _______ command to make the control device 31 make the test device 5 The second transmission mechanism drives the test to slant 52 _ straight, 峨 峨 52 52 52 52 52 52 52 52 52 52 52 52 52 52 52 52 52 52 52 52 52 52 52 52 52 52 52 52 52 52 52 52 52 52 52 52 52 52 Returning to the control unit 3, the control unit 31 can display the pressure and load information on the display device again. At this time, the operation can be detected by the singularity of the device, and the device can be forced to compress or The test head mechanism 52 is pressed against the elastic member of the mechanism ,, and as shown in the eighth figure, the deformation amount of the elastic member can be adjusted and controlled, and can be known by the M421550 of the elastic mechanics. This is not described in detail; i test device 5, _ test device 5 is set in the body W, and the side test device 5 is set at the other; '• 4 above the test device 5 includes a second transmission mechanism and a plurality of test heads 52 I. The test head mechanism 52 is fixed under the second conveyor (4), and the second conveyor can be XYZ three-axis The mechanism, please refer to the fifth figure, the test head mechanism π still contains - test body 521 and - pressure machine fine and a test head 53, _ mechanism kiss = set in the test body 521, _ test The head 53 is fixed under the pressure against the milk of the mechanism, wherein the mechanism 522 (4) contains _ movable parts and - miscellaneous pieces and - (four), the elastic phase = end and the movable object abuts the top of the elastic member The resisting member 524 can be a precision spring, the resisting member 525 is fixed to the test head 53, and the other can be a resistive test head or a capacitive test head or a capacitive type head or For the electric valley type test head 'by the test head 53 can be plate or capacitive _ board _, ^ money ___ control surface test head mechanism 52 can still contain 1 replacement can make this creation both improve applicability The function of the movable member 523 is through, and the adjustment mechanism 54 and the structure 522 further include a third transmission 54 which can be a tightening knob, and the test head mechanism 52 52 52 - side, the third transmission mechanism 55 'the second transmission mechanism 55 is provided in the test head machine, the third transmission mechanism 55 still contains 麴:: its control unit 31 Sexual connection, and the same as the pneumatic cylinder and the test and the follower 552, the follower 552 is divided, the follower 552 can be a plate; 52 the surface of the movable mechanism 523 of the mechanism 523 Please refer to the third and sixth diagrams of the test platform 42 on its test socket 421, when the operator puts the touch panel 6 to be tested on the wave, the touch φ^6 Wei _6ι In the M421550: Keding: 'Cutting the shaft _ _ 53 峨 deducting power until the tf _ operator wants the value so that the element can be tested as early as the test head mechanism 52, the test head 53 under the willingness of the author can also According to the method, continue to correct other test head mechanisms 52 === =^ for _ cut, (four) coffee sloping & _ na 3 complete = calibration, and can avoid the use of the touch panel device can not be used for each test head Pre- and individual corrections are made to the accuracy of the test, resulting in a decrease in test accuracy and test yield, or a mother-to-measure measure G must be configured - z-n and ---, resulting in complex structural design and increased manufacturing costs. Or _ try to find the immediate load system, which causes the test speed to slow down and the occupational effect to be scaled, and the county _ can _ improve the test accuracy and reduce This and improve the efficiency of the test.

請再參閱第五圖、第七圖所示,又藉由該測試頭機構犯更包含有一第 三傳動機構55’該第三傳動機構55尚包含有一氣壓缸551與—從動件碰, 該從動件552分別與該氣壓虹551及該測試頭機構52其壓抵機職之活 動件523相固設,而使該控制單元31可個別控制該第三傳動機構π盆氣 壓缸551作動,而使該氣壓虹551可控制該測試頭機構52其測試頭53是 否下降到可抵壓該制之觸翻板6的高度位置,俾當侧試平台犯其某 一個測試座421未放置有待測之觸控面板6時,該控制單元31即可令:相 對應的測試頭機構52其第三傳動機構55之氣壓缸551不作動,而可避免 該測試頭機構52其測朗53仍然下壓而翻該職座421,造成該測試頭 53或機台之損壞’而使本創作可單獨控制各測試頭53之下壓動作因而即 使當測試座421未放置觸控面板6時,也無須先將該測試頭53拆下,進^ M421550 可使本創作兼具可達到經安全性與提升使跋繼之功效。 為使本創作更加顯現出其進步性與實用性,茲與習用作一比較分析如 下.: 習用技術: 1每一個測試頭須搭配一個z軸馬達與荷重元,結構複雜,製造成本 提高。 2、無法個別預先校正測試頭之下壓力量,測試精度與測試良率降低。 φ 本創作優點: 1、 所有測試頭可共用一個傳動機構,結構簡化,製造成本降低。 2、 所有測試頭之下壓力量可預先個別校正,測試精度與測試良率提高。 【圖式簡單說明】. 第一圖係為習用之動作示意圖。 第二圖係為第二種習用之動作示意圖。 第三圖係為本創作之組合示意圖。 罐I 第四圖係為本創作其測試平台之部分示意圖。 第五圖係為本創作其測試頭機構之部分示意圖。 第六圖係為本創作其動作前示意圖。 第七圖係為本創作其動作後示意圖。 第八圖係為本創作其測試頭機構之校正動作示意圖。 【主要元件符號說明】 12···觸控面板 14···觸控面板 11…Z轴馬達 13…XYZ三軸機構 M421550Referring to FIG. 5 and FIG. 7 again, the test head mechanism further includes a third transmission mechanism 55 ′. The third transmission mechanism 55 further includes a pneumatic cylinder 551 and a follower member. The follower 552 is fixed to the air pressure 551 and the movable member 523 of the test head mechanism 52, and the control unit 31 can individually control the third transmission mechanism π basin pneumatic cylinder 551 to operate. And the air pressure rainbow 551 can control whether the test head mechanism 52 of the test head mechanism 52 is lowered to a height position capable of pressing the tactile plate 6 of the system, and the side test platform commits that one of the test sockets 421 is not placed. When the touch panel 6 is measured, the control unit 31 can make the corresponding test head mechanism 52 not actuate the pneumatic cylinder 551 of the third transmission mechanism 55, and the test head mechanism 52 can be prevented from being measured. Pressing the seat 421 to cause damage to the test head 53 or the machine', so that the creation can individually control the pressing action of each test head 53 and thus even when the test stand 421 is not placed with the touch panel 6, First remove the test head 53 and enter the M421550 to make this creation Reached through security and to enhance the effectiveness of the Postscript followed. In order to make this creation more progressive and practical, I use it as a comparative analysis.: Conventional technology: 1 Each test head must be equipped with a z-axis motor and load cell, which has complex structure and high manufacturing cost. 2. It is not possible to pre-correct the amount of pressure under the test head in advance, and the test accuracy and test yield are reduced. φ Advantages of this creation: 1. All test heads can share one transmission mechanism, the structure is simplified, and the manufacturing cost is reduced. 2. The pressure under all test heads can be individually corrected in advance, and the test accuracy and test yield are improved. [Simple diagram of the diagram]. The first diagram is a schematic diagram of the action of the conventional. The second figure is a schematic diagram of the second conventional action. The third picture is a schematic diagram of the combination of the creation. The fourth picture of the tank I is a schematic diagram of part of the test platform. The fifth picture is a partial schematic diagram of the test head mechanism. The sixth picture is a schematic diagram of the action before the creation. The seventh picture is a schematic diagram of the action after the creation. The eighth figure is a schematic diagram of the corrective action of the test head mechanism. [Description of main component symbols] 12···Touch panel 14···Touch panel 11...Z-axis motor 13...XYZ three-axis mechanism M421550

20…測試頭機構 2l···荷重元 22…彈簧 23…測試頭 24…偵測單元 25…測試頭 3…機體 31…控制單元 32…輸入裝置 33···輸出裝置 4···進出料裝置 4l···第一傳動機構 42…測試平台 421…測試座 422…訊號插座 423…固定孔 43…荷重元 5…測試裝置 5l···第二傳動機構 52…測試頭機構 521···測試本體 522…壓抵機構 523…活動件 524…彈性件 525…抵件 53…測試頭 54…調整機構 55…第三傳動機構 551...氣壓缸 552…從動件 6…觸控面板 71…測試頭 61…訊號插頭 1120...test head mechanism 2l···load element 22...spring 23...test head 24...detection unit 25...test head 3...body 31...control unit 32...input device 33···output device 4···in and out Device 4l···first transmission mechanism 42...test platform 421...test socket 422...signal socket 423...fixing hole 43...loading element 5...testing device 5l···second transmission mechanism 52...test head mechanism 521··· Test body 522 ... pressing mechanism 523 ... movable member 524 ... elastic member 525 ... resisting member 53 ... test head 54 ... adjusting mechanism 55 ... third transmission mechanism 551 ... pneumatic cylinder 552 ... follower 6 ... touch panel 71 ...test head 61...signal plug 11

Claims (1)

M421550 六、申請專利範圍: 1、一種觸控面板測試裝置,其包含: 一機體,該機體内設有控制單元; 一進出料裝置,該進出料裝置設於該機體内,該進出料骏置包含有至 少一個第一傳動機構與至少一個測試平台,該測試爭台固設於該第一傳動 機構上方,該第一傳動機構與測試平台分別與該機體其控制單元電性連 接,該測試平纟上尚包含核個職赫_荷重元,减^與機體其抑 • 制單元電性連接; I 一測試裝置試裝置設於該機體内,且該测試裝置設於該進出料 裝置上方,該測試裝置包含有_第二傳動機構與數個測試頭機構,該測試 頭機構固設於該第二傳動機構下方,該職頭機構尚包含有—測試本體與 -壓抵機構及-測朗,賴抵機構套設於鋼試本體内,該觀頭固設 於壓抵機構下方’朗朗機構尚包含有—調整機構,該調整機構與賴 抵機構相穿固》M421550 VI. Patent application scope: 1. A touch panel test device comprising: a body having a control unit therein; an input and discharge device, the inlet and outlet device being disposed in the body, the input and output device Included in the at least one first transmission mechanism and the at least one test platform, the test competition platform is fixed on the first transmission mechanism, and the first transmission mechanism and the test platform are respectively electrically connected to the control unit of the body, and the test is flat. The 尚 尚 尚 尚 尚 尚 尚 尚 尚 核 核 核 核 核 核 核 核 核 核 核 核 核 核 核 核 核 核 核 核 核 核 核 核 核 核 核 核 核 核 核 核 核 核 I I I I I I I I I The test device comprises a second transmission mechanism and a plurality of test head mechanisms, the test head mechanism is fixed under the second transmission mechanism, and the head mechanism further comprises a test body and a pressure-receiving mechanism and The reliance mechanism is set in the steel test body, and the view head is fixed under the pressure-fitting mechanism. The Lang Lang mechanism also includes an adjustment mechanism, and the adjustment mechanism is worn by the reliance mechanism. 2、 如申清專利範圍第i項所述之觸控面板測試裝置,其中該測試頭 電阻式測試頭或為電容式測試頭。 3、 如申請專利軸第丨項所叙秘測試裝置射 機構與測解台之數#㈣_。 動 =_範_顧叙_板測_,_調整機構 為迫緊知知。 I專贱圍第丨至4項中任_項所述之觸控 中該壓抵機構内尚包含有一活.▼置其 干。祕件及一抵件,該彈性件-端與 12 M421550 該活動件滅頂,_轉另-额魏件相抵頂。 其中該彈性件為 6、如申請專利範_5項所述之觸控面板測試裝置, 精密彈簧 其 7如申1專利範圍第!至4項中任—項所述之觸控面板測試裝置, 中該測試頭機構更進—步包含有-第三傳動機構。 8、 如申請翻範圍第7項所述之觸控面板職裝置,其中該第三傳動 機構尚包含有-氣壓缸與—從動件,該從動件與該氣攸相固設。2. The touch panel test device of claim 1, wherein the test head resistive test head is a capacitive test head. 3. If the patent application axis is the first item of the test device, the number of the detection mechanism and the measurement station #(4)_. Move =_范_顾叙_board test_,_ adjustment mechanism for tightly aware. I specializes in the touch described in item _ to item 4 of the _ item. The pressure-receiving mechanism also contains a live. The secret piece and a piece of the fastener, the end of the elastic piece - 12 M421550, the movable part is extinguished, and the other part is offset. The elastic member is 6. The touch panel test device as described in the patent application _5, the precision spring 7 is as claimed in the patent scope! In the touch panel testing device of any of the preceding claims, the test head mechanism further includes a third transmission mechanism. 8. The touch panel device of claim 7, wherein the third transmission mechanism further comprises a pneumatic cylinder and a driven member, and the driven member is fixed to the air cylinder. 9、 如申請專利綱第i至4項中任—項·之觸麵板麟裝置其 中該測雜-修W減嫩,該峨插雜韻蝴單元電性連接。 10、 如中請專利範圍第1至4項中任__項所述之觸控面板測試裝置, 其中該測試座上設有數個固定孔。 139. If the touch panel lining device of any of the items i to 4 of the patent program is applied for, the miscellaneous-repairing device is electrically connected. The touch panel test device of any of the above-mentioned claims, wherein the test stand is provided with a plurality of fixing holes. 13
TW100217969U 2011-09-26 2011-09-26 Testing device of touch panel TWM421550U (en)

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20140190282A1 (en) * 2013-01-10 2014-07-10 Wistron Corp. Testing apparatus for touch panel and method for using the same
TWI463390B (en) * 2012-07-03 2014-12-01 E Ink Holdings Inc Positioning method for touch display panel
CN104391206A (en) * 2014-12-04 2015-03-04 昆山精讯电子技术有限公司 OLED panel test device
TWI486609B (en) * 2013-04-16 2015-06-01 Wistron Corp A system and? a fixture for? a test of multi-touch

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI463390B (en) * 2012-07-03 2014-12-01 E Ink Holdings Inc Positioning method for touch display panel
US20140190282A1 (en) * 2013-01-10 2014-07-10 Wistron Corp. Testing apparatus for touch panel and method for using the same
CN103926425A (en) * 2013-01-10 2014-07-16 纬创资通股份有限公司 Touch control test clamp and method for using the touch control test clamp
TWI464437B (en) * 2013-01-10 2014-12-11 Wistron Corp Apparatus for testing tough panel and method using the same
CN103926425B (en) * 2013-01-10 2017-01-04 纬创资通股份有限公司 Touch-control test fixture and the method using touch-control test fixture
US9551634B2 (en) 2013-01-10 2017-01-24 Wistron Corp. Testing apparatus for touch panel and method for using the same
TWI486609B (en) * 2013-04-16 2015-06-01 Wistron Corp A system and? a fixture for? a test of multi-touch
CN104391206A (en) * 2014-12-04 2015-03-04 昆山精讯电子技术有限公司 OLED panel test device
CN104391206B (en) * 2014-12-04 2017-02-22 昆山精讯电子技术有限公司 OLED panel test device

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