100年.10月28日梭正替換頁 五、新型說明： 【新型所屬之技術領域】 [0001] 本創作係關於一種發光裝置，特別關於一種基板檢測之 發光裝置。 【先前技術】 [0002] 隨著半導體技術的發展，電子裝置也越來越輕薄化。半 導體技術係將各式各樣的電子元件以微米或奈米的尺寸 藉由半導體製程而製作於基板上，再應用於终端的電子 裝置，例如太陽能電池、發光二極體裝置、平面顯示裝 置等等。 [0003] 在製造的過程中，需要有一檢測程序來檢驗基板是否有 缺陷存在，其缺陷例如為外觀或電性上的缺陷，例如檢 測基板有無灰塵或微粒異物的附著、針孔（pinh〇ie)、 保護膜下層的不均勻性、形成於下層的銦錫氧化物（丨τ〇 )有無不良等。 [0004] 第一圖為一種習知用以檢測基板之發光裝置丨的示意圖， 其藉由發出光線至待檢測基板上，以檢測其外觀是否具 有缺陷。發光裝置1包含一光源u、一光纖丨2以及一凸透 鏡13。光纖12連接光源1丨與凸透鏡13，並將光源丨丨所發 出之光線導至凸透鏡13，再由凸透鏡13發散至基板上以 進行檢測。第二圖為第一圖中虛線圓之局部放大圖。由 第二圖可知’雖然光纖12可達到光線導引之功能，但卻 難控制光纖12與凸透鏡13之間的距離，使得從光纖12射 出之光線除了到達凸透鏡13之球面部131之外，亦會擴散 到凸透鏡13邊緣之圓角部132 ^然而，球面部131會使光100 years. October 28th, the shuttle is replacing the page. 5. New description: [New technical field] [0001] The present invention relates to a light-emitting device, and more particularly to a light-emitting device for substrate detection. [Prior Art] [0002] With the development of semiconductor technology, electronic devices are becoming thinner and lighter. The semiconductor technology system manufactures various electronic components on a substrate by a semiconductor process in a micron or nanometer size, and then applies them to a terminal electronic device such as a solar cell, a light emitting diode device, a flat display device, and the like. Wait. [0003] In the manufacturing process, a test procedure is needed to check whether the substrate has defects, such as appearance or electrical defects, such as detecting the presence or absence of dust or particulate foreign matter attachment, pinholes (pinh〇ie ), the unevenness of the lower layer of the protective film, the presence or absence of indium tin oxide (丨τ〇) formed in the lower layer, and the like. The first figure is a schematic view of a conventional light-emitting device for detecting a substrate, which emits light onto a substrate to be inspected to detect whether its appearance is defective. The illuminating device 1 comprises a light source u, a fiber cymbal 2 and a convex lens 13. The optical fiber 12 is connected to the light source 1 丨 and the convex lens 13, and guides the light emitted from the light source 至 to the convex lens 13, and is then radiated to the substrate by the convex lens 13 for detection. The second figure is a partial enlarged view of the dotted circle in the first figure. As can be seen from the second figure, although the optical fiber 12 can achieve the function of light guiding, it is difficult to control the distance between the optical fiber 12 and the convex lens 13, so that the light emitted from the optical fiber 12 reaches the spherical surface 131 of the convex lens 13 in addition to the light. It will diffuse to the rounded portion 132 at the edge of the convex lens 13 . However, the spherical portion 131 will cause light.
表單編號 A0101 ^ 3 I/* 19 I M421501 100年10月28日核正替換百 線產生集中的效果，而圓角部132會使光線產生擴散的效 果，因此，通過球面部131之光線係形成一較強的光形， 而圓角部132係形成較弱的光形，這兩光形係構成一光暈 ，而不利基板檢測因而降低檢測效能。 【新型内容】 [0005] 有鑒於上述課題，本創作之一目的在於提供一種基板檢 測之發光裝置，能夠改善習知問題，進而提升基板檢測 效能。 [0006] 為達上述目的，本創作之一種基板檢測之發光裝置包含 一發光單元、一凸鏡單元以及一罩體。凸鏡單元位於發 光單元之光路徑上。罩體具有一擋件，擋件位於發光單 元與凸鏡單元之間，並遮擋發光單元所發出之部分光線 [0007] 在一實施例中，發光單元包含至少一發光二極體。 [0008] 在一實施例中，凸鏡單元包含一凸透鏡。 [0009] 在一實施例中，凸鏡單元具有一球面部與一圓角部，圓 角部位於球面部之外圍，發光單元所發出之光線係經過 球面部而不經過圓角部。 [0010] 在一實施例中，擋件係由罩體之一内表面向内部延伸設 置。 [0011] 在一實施例中，基板檢測之發光裝置更包含一散熱單元 。發光單元連結於散熱單元。 [0012] 在一實施例中，散熱單元作為發光單元之基板。 表單编號A0101 第4頁/共19頁 M421501 [0013] [0014] [0015] 100年.10月28日核正替換頁 在一實施例中，罩體與散熱單元連接。 在一實施例中，發光裝置更包含一濾光單元，其係過濾 發光單元所發出之光線。 在一實施例中，發光裝置更包含一驅動單元，其係與濾 光單元耦接以控制濾光單元轉動。 [0016] 承上所述，本創作利用罩體延伸一擋件，擋件位於發光 單元與凸鏡單元之間，並可遮擋發光單元所發出之部分 光線。藉此，發光單元所發出之光線的光角受到擋件的 • 限制，使得光線能夠只經過凸鏡單元之球面部而不經過 圓角部。如此，發光單元所發出之光線係經過球面部的 折射，並避免圓角部的散射，進而提升發光與基板檢測 效能。 【實施方式】 [0017] 以下將參照相關圖式，說明依本創作較佳實施例之一種 基板檢測之發光裝置，其中相同的元件將以相同的參照 符號加以說明。 [0018] 第三圖為本創作較佳實施例之一種基板檢測之發光裝置2 的示意圖。發光裝置2包含一發光單元22、一凸鏡單元23 以及一罩體24。 [0019] 發光單元22可包含至少一發光元件，例如發光二極體（ LED)或其他發光元件。 [0020] 凸鏡單元23包含至少一凸透鏡，並位於發光單元22之光 路徑上。在本實施例中，凸鏡單元23與發光單元22相對 設置，使得發光單元22所發出之光線不需經由任何導光 表單編號A0101 第5頁/共19頁 100年10月28日修正替換頁 單元即能到達凸鏡單元23 ^藉此，本實施例就能精準控 制發光單元22到凸鏡單元23之距離，以致發光單元22所 發出之光線係經過凸鏡單元23的折射而非散射，進而提 升發光與基板檢測效能。 [0021] 罩體24具有一擋件241，擋件241位於發光單元22與凸鏡 單元23之間，並遮擋發光單元22所發出之部分光線，以 限制發光單元22所發出之光線的光角，以致發光單元22 所發出之光線係經過凸鏡單元23的折射而非散射，進而 提升發光與基板檢測效能。於此，擋件241係從罩體24之 内表面向内部延伸，並形成一通孔以讓光線通過。此外 看 ，若無擋件241存在，則發光單元22所發出之部分光線會 經過罩體24之内壁，可能會造成内壁吸收某一些頻譜的 光’以致改變原本的色度，因而造成基板檢測不準確β 然而，本實施例之擋件241遮擋部分光線’使得剩餘的光 線直接到達凸鏡單元23，因而可避免上述問題發生，進 而提升基板檢測準確度。 [0022] 此外，凸鏡單元23具有一球面部231與一圓角部232，圓 謂 角部232位於球面部231之外圍。由於凸透鏡在製作上除 了球面部231之外，在邊緣亦會產生圓角部232，由於圓 角部232的光線不受控制並會產生散射，因此較佳者係光 線不經過圓角部232。而本實施例之罩體24之擋件241可 遮擋發光單元22所發出之部分光線，進而限制發光單元 22所發出之光線的光角，使得光線不會經過圓角部232而 避免散射。 [0023] 另外，第四圖與第五圖為凸鏡單元之不同態樣的示意圖 表單編號Α0101 第6頁/共19頁 100年10月28日 。如第三圖所示之凸鏡單元23可使發光單元22所發出之 光線產生收敛的效果。而第四圖所示之凸鏡單元23a，其 為另一側之單凸透鏡，並可使發光單元22所發出之光線 產生發散的效果。而第五圖所示之凸鏡單元23b，其為一 雙凸透鏡’並可使光線產生先發散再收斂的效果。 [0024]第六圖為本創作較佳實施例之一種基板檢測之發光裝置2 進一步的示意圖，第七圖為發光裝置2的立體分解示意圖 [0025]發光裝置2更包含一散熱單元21 ^散熱單元21可藉由散熱 材料、或散熱結構或其組合來達到散熱目的◊於此，散 熱單元21包含一散熱鰭片。發光單元22固定於散熱單元 21上，兩者可例藉由黏接或焊接而固定。發光單元a本 身可包含一基板以設置發光元件；或者，散熱單元21可 直接作為發光單元22之基板，即發光二極體直接設置於 散熱單元21上。藉由發光單元22固定於散熱單元21上， 可達到直接散熱效果。另外，在本實施例中，罩體24與 散熱單元21連接，兩者可例如藉由黏接、焊接、卡接或 一體成型而連接。 _斜’基板檢測之發光裝置2更包含―遽光單元25，其係 過滤發光單元22所發出之光線。於此不特別限制滤光單 元25所濾除之光線，例如渡光單元25可濾除紅外線、或 紫外線或任—色光，這可依據實際情況而變化H單 元25可包含濾光材料或登光材料來達到轉換色光之目的 〇 固定環2 6，其係用 [0027]另外，基板檢測之發光裝置2更包含一 表單编號A0101 第7頁/共19頁 100年10月28日梭正替換頁 以將凸鏡單元23固定於罩體24内。固定環26係頂抵凸鏡 單元23與罩體24之内表面。 [0028] 另外，基板檢測之發光裝置2可更包含一驅動單元27，其 係與濾光單元25耦接以控制濾光單元25轉動；當然，在 其他實施例中可省略驅動單元27。於此，濾光單元25上 可分為複數區域，各區域之濾光材料或螢光材料皆不同 ，以達到不同的濾光效能。藉由驅動單元2 7可驅動濾光 單元25轉動，可例如轉至一方位角、或調整轉速等。此 外，基板檢測之發光裝置2更包含另一驅動單元28，其係 | 與發光單元22耦接，以控制發光單元22發光，可例如控 制其發光亮度、發光時間或週期。 [0029] 第八圖為本創作較佳實施例之基板檢測之發光裝置2的透 視示意圖。藉由本創作之罩體所延伸的擋件遮擋發光單 元所發出之部分光線而形成適當的發光角度，進而產生 均勻且集中的光形。第八圖係以第六圖之凸鏡單元23為 例，並形成有些許收斂的光形。若是以第四圖的凸鏡單 元為例，則可形成更發散並集中的光形；若是以第五圖 痛 的凸鏡單元為例，則可形成些許發散並集中的光形。 [0030] 综上所述，本創作利用罩體延伸一擋件，擋件位於發光 單元與凸鏡單元之間，並可遮擋發光單元所發出之部分 光線。藉此，發光單元所發出之光線的光角受到擋件的 限制，使得光線能夠只經過凸鏡單元之球面部而不經過 圓角部。如此，發光單元所發出之光線係經過球面部的 折射，並避免圓角部的散射，進而提升發光與基板檢測 效能。 表單编號A0101 第8頁/共19頁 M421501 100年.10月28日按正替换頁 [0031] 以上所述僅為舉例性，而非為限制性者。任何未脫離本 創作之精神與範疇，而對其進行之等效修改或變更，均 應包含於後附之申請專利範圍中。 【圖式簡單說明】 [0032] 第一圖為一種習知用以檢測基板之發光裝置的示意圖； [0033] 第二圖為第一圖之發光裝置的局部放大圖； [0034] 第三圖為本創作較佳實施例之一種基板檢測之發光裝置 的不意圖，Form No. A0101 ^ 3 I/* 19 I M421501 On October 28, 100, the nuclear replacement of the hundred lines produces a concentrated effect, and the rounded portion 132 causes the light to diffuse, and therefore, the light passing through the spherical portion 131 is formed. A stronger light shape, and the rounded portion 132 forms a weaker light shape, and the two light shapes form a halo, which is disadvantageous for substrate detection and thus reduces detection efficiency. [New Content] [0005] In view of the above problems, an object of the present invention is to provide a light-emitting device for substrate detection, which can improve conventional problems and improve substrate detection efficiency. In order to achieve the above object, a substrate-detecting light-emitting device of the present invention comprises a light-emitting unit, a convex mirror unit and a cover. The convex mirror unit is located on the light path of the light emitting unit. The cover has a stop member between the light-emitting unit and the convex mirror unit and blocks a portion of the light emitted by the light-emitting unit. [0007] In an embodiment, the light-emitting unit includes at least one light-emitting diode. In an embodiment, the convex mirror unit comprises a convex lens. In one embodiment, the convex mirror unit has a spherical portion and a rounded portion, and the rounded corner portion is located at a periphery of the spherical portion, and the light emitted by the light emitting unit passes through the spherical portion without passing through the rounded portion. [0010] In an embodiment, the stop member is disposed to extend inwardly from an inner surface of one of the covers. [0011] In an embodiment, the substrate detecting light emitting device further comprises a heat dissipating unit. The light emitting unit is coupled to the heat dissipation unit. [0012] In an embodiment, the heat dissipation unit functions as a substrate of the light emitting unit. Form No. A0101 Page 4 of 19 M421501 [0015] [0015] 100 years. October 28th Nuclear Replacement Page In one embodiment, the cover is coupled to the heat sink unit. In one embodiment, the illumination device further includes a filter unit that filters the light emitted by the illumination unit. In an embodiment, the light emitting device further includes a driving unit coupled to the filter unit to control the rotation of the filter unit. [0016] As described above, the present invention uses the cover to extend a stop member between the light-emitting unit and the convex mirror unit, and blocks part of the light emitted by the light-emitting unit. Thereby, the light angle of the light emitted by the light-emitting unit is limited by the stopper, so that the light can pass only through the spherical surface of the convex mirror unit without passing through the rounded portion. In this way, the light emitted by the light-emitting unit is refracted by the spherical surface, and the scattering of the rounded portion is avoided, thereby improving the light-emitting and substrate detection performance. [Embodiment] Hereinafter, a substrate-detecting light-emitting device according to a preferred embodiment of the present invention will be described with reference to the accompanying drawings, wherein the same elements will be described with the same reference numerals. [0018] The third figure is a schematic diagram of a light-emitting device 2 for substrate detection according to a preferred embodiment of the present invention. The light-emitting device 2 includes a light-emitting unit 22, a convex mirror unit 23, and a cover 24. [0019] The light unit 22 may comprise at least one light emitting element, such as a light emitting diode (LED) or other light emitting element. [0020] The convex mirror unit 23 includes at least one convex lens and is located on the optical path of the light emitting unit 22. In this embodiment, the convex mirror unit 23 is disposed opposite to the light emitting unit 22, so that the light emitted by the light emitting unit 22 does not need to pass any light guide form number A0101. Page 5/19 pages revised on October 28, 100. The unit can reach the convex mirror unit 23. Thereby, the distance between the light-emitting unit 22 and the convex mirror unit 23 can be precisely controlled in this embodiment, so that the light emitted by the light-emitting unit 22 is refracted by the convex mirror unit 23 instead of being scattered. In turn, the illuminating and substrate detection performance is improved. [0021] The cover body 24 has a blocking member 241 between the light emitting unit 22 and the convex mirror unit 23, and blocks part of the light emitted by the light emitting unit 22 to limit the light angle of the light emitted by the light emitting unit 22. Therefore, the light emitted by the light-emitting unit 22 is refracted by the convex mirror unit 23 instead of being scattered, thereby improving the light-emitting and substrate detection performance. Here, the stopper 241 extends inwardly from the inner surface of the cover body 24, and a through hole is formed to allow light to pass therethrough. In addition, if there is no blocking member 241, part of the light emitted by the light-emitting unit 22 will pass through the inner wall of the cover body 24, which may cause the inner wall to absorb some spectrum of light', thereby changing the original chromaticity, thereby causing the substrate to be detected. Accurate β However, the blocking member 241 of the embodiment blocks part of the light ′ so that the remaining light directly reaches the convex mirror unit 23, thereby avoiding the above problem, thereby improving the substrate detection accuracy. Further, the convex mirror unit 23 has a spherical portion 231 and a rounded portion 232, and the corner portion 232 is located at the periphery of the spherical portion 231. Since the convex lens is formed in addition to the spherical portion 231, the rounded portion 232 is also formed at the edge. Since the light of the rounded portion 232 is uncontrolled and scattered, it is preferable that the light does not pass through the rounded portion 232. The blocking member 241 of the cover body 24 of the embodiment can block part of the light emitted by the light-emitting unit 22, thereby limiting the light angle of the light emitted by the light-emitting unit 22, so that the light does not pass through the rounded portion 232 to avoid scattering. [0023] In addition, the fourth and fifth figures are schematic diagrams of different aspects of the convex mirror unit. Form No. 1010101 Page 6 of 19 October 28, 100. The convex mirror unit 23 as shown in the third figure can cause the light emitted from the light-emitting unit 22 to have a convergent effect. The convex mirror unit 23a shown in the fourth figure is a single convex lens on the other side, and can cause the light emitted from the light-emitting unit 22 to have a diverging effect. The convex mirror unit 23b shown in Fig. 5 is a lenticular lens and allows the light to be diverged and then converged. 6 is a schematic view of a substrate detecting light-emitting device 2 according to a preferred embodiment of the present invention, and FIG. 7 is a perspective exploded view of the light-emitting device 2 [0025] The light-emitting device 2 further includes a heat dissipating unit 21 The unit 21 can achieve heat dissipation by means of a heat dissipating material, or a heat dissipating structure or a combination thereof. The heat dissipating unit 21 includes a heat dissipating fin. The light emitting unit 22 is fixed to the heat radiating unit 21, and the two can be fixed by bonding or welding. The light-emitting unit a may include a substrate to provide a light-emitting element. Alternatively, the heat-dissipating unit 21 may directly serve as a substrate of the light-emitting unit 22, that is, the light-emitting diode is directly disposed on the heat-dissipating unit 21. The direct heat dissipation effect can be achieved by the light unit 22 being fixed to the heat dissipation unit 21. Further, in the present embodiment, the cover 24 is connected to the heat radiating unit 21, and the two can be joined, for example, by bonding, welding, snapping or integral molding. The illuminating device 2 for detecting the slanting substrate further includes a cascading unit 25 that filters the light emitted by the illuminating unit 22. The light filtered by the filter unit 25 is not particularly limited. For example, the light-passing unit 25 can filter out infrared rays, or ultraviolet rays or any color light, which can be changed according to actual conditions. The H unit 25 can include a filter material or a light-densing material. The material is used for the purpose of converting the color light. The fixing ring 2 6 is used [0027] In addition, the substrate detecting light-emitting device 2 further includes a form number A0101, page 7 / 19 pages, October 28, 100, the shuttle is being replaced. The page is used to fix the convex mirror unit 23 in the cover 24. The retaining ring 26 abuts against the inner surface of the convex mirror unit 23 and the cover 24. In addition, the substrate detecting light emitting device 2 may further include a driving unit 27 coupled to the filter unit 25 to control the rotation of the filter unit 25; of course, the driving unit 27 may be omitted in other embodiments. Here, the filter unit 25 can be divided into a plurality of regions, and the filter materials or the fluorescent materials of the regions are different to achieve different filter performance. The filter unit 25 can be driven to rotate by the drive unit 27, for example, to an azimuth angle, or to adjust the rotational speed or the like. In addition, the substrate-detecting illuminating device 2 further includes another driving unit 28 coupled to the illuminating unit 22 to control the illuminating unit 22 to emit light, for example, to control its illuminating brightness, illuminating time or period. 8 is a schematic perspective view of a light-emitting device 2 for substrate detection according to a preferred embodiment of the present invention. The shield extending from the cover of the present invention blocks part of the light emitted by the light-emitting unit to form an appropriate light-emitting angle, thereby producing a uniform and concentrated light shape. The eighth figure is exemplified by the convex mirror unit 23 of the sixth figure, and forms a somewhat convergent light shape. If the convex mirror unit of the fourth figure is taken as an example, a more divergent and concentrated light shape can be formed; if the convex mirror unit of the fifth figure is taken as an example, a slightly divergent and concentrated light shape can be formed. [0030] In summary, the present invention utilizes a cover to extend a stop member between the light-emitting unit and the convex mirror unit and block a portion of the light emitted by the light-emitting unit. Thereby, the light angle of the light emitted by the light-emitting unit is limited by the stopper, so that the light can pass only through the spherical surface of the convex mirror unit without passing through the rounded portion. In this way, the light emitted by the light-emitting unit is refracted by the spherical surface, and the scattering of the rounded portion is avoided, thereby improving the light-emitting and substrate detection performance. Form No. A0101 Page 8 of 19 M421501 100 years. October 28th is replaced by the page [0031] The above description is for illustrative purposes only and not as a limitation. Any equivalent modifications or changes made to the spirit and scope of this creation shall be included in the scope of the appended patent application. BRIEF DESCRIPTION OF THE DRAWINGS [0032] The first figure is a schematic view of a conventional light-emitting device for detecting a substrate; [0033] The second figure is a partial enlarged view of the light-emitting device of the first figure; [0034] For the purpose of creating a light-emitting device for substrate detection according to a preferred embodiment of the present invention,
[0035] 第四圖與第五圖為本創作較佳實施例之凸鏡單元不同態 樣的不意圖， [0036] 第六圖為本創作較佳實施例之一種基板檢測之發光裝置 進一步的示意圖；以及 [0037] 第七圖為第六圖之發光裝置的立體分解圖；[0035] The fourth and fifth figures are not intended to illustrate different aspects of the convex mirror unit of the preferred embodiment, and the sixth embodiment is a substrate detecting light emitting device according to a preferred embodiment of the present invention. Schematic diagram; and [0037] FIG. 7 is an exploded perspective view of the illumination device of the sixth diagram;
[0038] 第八圖為本創作較佳實施例之基板檢測之發光裝置的透 視示意圖。 【主要元件符號說明】 [0039] 1:發光裝置 [0040] 11 :光源 [0041] 12 :光纖 [0042] 13 :凸透鏡 [0043] 131 :球面部 [0044] 132 :圓角部 表單編號A0101 第9頁/共19頁 M421501 [0045] 2:發光裝置 [0046] 21 :散熱單元 [0047] 22 :發光單元 [0048] 23、23a、23b :凸鏡單元 [0049] 231 :球面部 [0050] 232 :圓角部 [0051] 24 :罩體 [0052] 241 :擋件 [0053] 25 :濾光單元 [0054] 26 :固定環 [0055] 27、28 :驅動單元 [0056] P :基板 表單編號A0101 第10頁/共19頁 100年.10月28日修正替換百[0038] FIG. 8 is a schematic perspective view of a light-emitting device for substrate detection according to a preferred embodiment of the present invention. [Description of main component symbols] [0039] 1: Light-emitting device [0040] 11: Light source [0041] 12: Optical fiber [0042] 13: Convex lens [0043] 131: Spherical surface [0044] 132: Rounded corner form No. A0101 9 pages/total 19 pages M421501 [0045] 2: Light-emitting device [0046] 21: heat-dissipating unit [0047] 22: light-emitting unit [0048] 23, 23a, 23b: convex mirror unit [0049] 231: spherical surface [0050] 232: fillet portion [0051] 24: cover [0052] 241: stop [0053] 25: filter unit [0054] 26: fixed ring [0055] 27, 28: drive unit [0056] P: substrate form No. A0101 Page 10 / Total 19 pages 100 years. October 28 revised replacement 100