M413992 五、新型說明： 【新型所屬之技術領域】 本創作涉及一種連接器，尤其涉及一種可防止探針端子燒 焦的探針連接器。 【先前技術】 按，第一圖所示，一種探針連接器100’包括一絕緣本體 10’、複數探針端子20’、複數導電端子30,、容置底座4〇，及 一彈性件50’。絕緣本體10,開設有複數探針端子槽u，及複數 導電端子槽12’ ；複數探針端子20,安裝於絕緣本體1〇,之探針 端子槽11’内且頂端可活動地凸出於探針端子槽u’外，複數導 電端子30’置於導電端子槽12’内，每一導電端子30’具有一接 觸部31’ ’接觸部31’可彈性的伸入絕緣本體1〇’之探針端子槽 11’内並抵接於探針端子20,上；容置底座40,封閉於探針端子 槽11’下端；彈性件50’收容於探針端子槽11，内，且上端抵頂 探針端子20’，下端抵頂於容置底座40,。對接連接器未插入 時’導電端子30’與探針端子20,相導通。 惟’習知之探針連接器當對接連接器插入時，由於電弧效 應的關係’當我們要把對接連接器與帶著電流的導體探針連接 器100’作接觸時’其會產生電火花，會造成探針端子2〇，燒焦 發黑。 【新型内容】 本創作之目的在於克服上述現有技術中的不足，提供一種 可防止探針端子燒焦的探針連接器。 為達成上述目的，本創作所提供一種探針連接器，包括一 絕緣本體、複數探針端子、絕緣套筒、複數導電端子、容置底 座及一彈性件。絕緣本體開設有複數探針端子槽及複數導電端 3 M413992 子槽；複數探針端子安裝於絕緣本體之探針端子槽 内且頂端可 活動地凸出於探針端子槽外，探針端子底部向探針端子内部開 設有孔槽，探針端子接近底端周緣處向外凸設有一凸台；絕緣 套筒可拆卸地卡套於探針端子底端外並收容於探針端子槽 内，複數導電端子置於導電端子槽内，每一導電端子具有一接 觸部’接觸部可彈性的伸入絕緣本體之探針端子槽内並抵接於 凸台或者絕緣套筒上；容置底座封閉於探針端子槽底端；彈性 件收容於探針端子槽内，且頂端抵頂探針端子，頂端抵頂於容 - 置底座。 . 如上所述，本創作探針連接器藉由導電端子之接觸部可彈 鲁 性的伸入絕緣本體之探針端子槽内並抵接於探針端子之凸台 及絕緣套筒上’當探針連接器之所有的探針端子皆下壓一定位 移至到位時，才能實現所有的探針端子和對應的導電端子導 通’從而避免探針連接器與對接連接器之間產生電弧效應。 【實施方式】 為詳細說明本創作之技術内容、構造特徵、所達成目的及 功效，以下茲舉例並配合圖式詳予說明。 - 請參閱第一圖、第二圖及第三圖，本創作探針連接器100 馨 包括一絕緣本體10、複數探針端子20、複數絕緣套筒30、複 數導電端子40、複數容置底座50及複數彈性件60。 — 所述絕緣本體10開設有複數上下貫穿絕緣本體10的探針 - 端子槽11及從絕緣本體10底壁兩側向上開設的且與探針端子 槽11相通的複數導電端子槽12。 複數探針端子20大致呈圓柱狀，其安裝於絕緣本體10之 探針端子槽11内且頂端可活動地凸出於探針端子槽11外，探 針端子20底部向探針端子20内部開設有孔槽21，探針端子 4 M413992 20接近底端周緣處向外凸設有一卡稜22,探針端子20於卡稜 22上方周緣向外凸設有一凸台23。 所述絕緣套筒30可拆卸地卡套於探針端子20下端外並收 容於探針端子槽11内。具體地，絕緣套筒30内部對應卡稜 22徑向凹設有一卡槽（圖未示），卡稜22卡合於卡槽内。 所述複數導電端子40置於導電端子槽12内，每一導電端 子40具有一板狀的固持部41、一從固持部41上端向上向内 傾斜延伸形成的彈臂部42、一從彈臂部42末端彎折延伸形成 的接觸部43及一從固持部41下端向外彎折延伸形成的焊接部 44，導電端子40之固持部41固持於導電端子槽12内，接觸 部43可彈性的伸入絕緣本體10之探針端子槽11内並抵接於 凸台23或者絕緣套筒30上，焊接部44焊接於外部電路板（圖 未示）上。 所述容置底座50封閉於探針端子槽11底端，具有一圓筒 狀的容置筒51及一封閉該容置筒51之一端的插接部52。具 體地，容置筒51封閉於探針端子槽11底端，插接部52伸出 探針端子槽11底端外。 所述彈性件60收容於探針端子槽11内，且頂端伸入並抵 頂於孔槽21槽頂壁，彈性件60底端伸入並抵頂於容置底座 50之容置筒51内。 本創作探針連接器100的工作原理如下： 當探針端子20未下壓或者下壓不到位時導電端子40之接 觸部43抵接於絕緣套筒30上，因此探針端子20和導電端子 40未導通； 當探針端子20下壓到位時，探針端子20壓縮彈性件60 從而向下移動，使導電端子40之接觸部43與探針端子20之 5 M413992 凸台23導通’從而探針端子20和導電端子40導通。 當下壓探針端子20時’由於操作過失’下壓起始時，可 能會造成單一探針端子2〇先下移，然而，當單一探針端子2〇 下壓不到位時’接觸部43抵接於絕緣套筒3 0上’該探針端子 20未能和對應的導電端子40導通；只有當單一探針端子20 下壓/定位移至到位時，接觸部43抵接於凸台23上，該探針 端子2〇才能和對應的導電端子導通，而此時，探針連接 100之所有的探針端子20皆下壓一定位移至到位，則所有的 探針踹子20和對應的導電端子40導通。M413992 V. New Description: [New Technology Field] This creation relates to a connector, and more particularly to a probe connector that prevents the probe terminal from being burnt. [Previous Art] According to the first figure, a probe connector 100' includes an insulative housing 10', a plurality of probe terminals 20', a plurality of conductive terminals 30, a receiving base 4, and an elastic member 50. '. The insulative housing 10 is provided with a plurality of probe terminal slots u and a plurality of conductive terminal slots 12'; the plurality of probe terminals 20 are mounted in the insulative housing 1'', and the top end of the probe terminal slot 11' is movablely protruded Outside the probe terminal slot u', the plurality of conductive terminals 30' are disposed in the conductive terminal slot 12', and each of the conductive terminals 30' has a contact portion 31'. The contact portion 31' elastically extends into the insulating body 1' The probe terminal slot 11' abuts against the probe terminal 20, and the base 40 is received at the lower end of the probe terminal slot 11'. The elastic member 50' is received in the probe terminal slot 11, and the upper end is abutted. The top probe terminal 20' has a lower end that abuts against the receiving base 40. When the docking connector is not inserted, the conductive terminal 30' is electrically connected to the probe terminal 20. However, the conventional probe connector is inserted into the docking connector due to the arc effect. 'When we want to make the mating connector in contact with the conductor probe connector 100' with current, it will generate an electric spark. Will cause the probe terminal 2〇, burnt black. [New Content] The purpose of the present invention is to overcome the above-mentioned deficiencies in the prior art and to provide a probe connector that can prevent the probe terminals from being burnt. To achieve the above object, the present invention provides a probe connector including an insulative housing, a plurality of probe terminals, an insulating sleeve, a plurality of conductive terminals, a receiving base, and an elastic member. The insulating body is provided with a plurality of probe terminal slots and a plurality of conductive terminals 3 M413992 sub-slots; the plurality of probe terminals are mounted in the probe terminal slots of the insulative housing, and the top end is movablely protruded from the probe terminal slot, and the probe terminal bottom A hole slot is defined in the probe terminal, and a protrusion is protruded outwardly from the periphery of the probe end; the insulating sleeve is detachably sleeved outside the bottom end of the probe terminal and received in the probe terminal slot. The plurality of conductive terminals are disposed in the conductive terminal slots, and each of the conductive terminals has a contact portion. The contact portion can elastically protrude into the probe terminal slot of the insulating body and abut on the boss or the insulating sleeve; The bottom end of the probe terminal slot; the elastic member is received in the probe terminal slot, and the top end abuts the probe terminal, and the top end abuts against the receiving base. As described above, the probe connector of the present invention can be elastically extended into the probe terminal slot of the insulating body by the contact portion of the conductive terminal and abuts on the boss and the insulating sleeve of the probe terminal. When all the probe terminals of the probe connector are pressed down to a certain position, all the probe terminals and the corresponding conductive terminals can be turned on to avoid an arc effect between the probe connector and the mating connector. [Embodiment] In order to explain in detail the technical contents, structural features, achieved goals and effects of the present invention, the following is a detailed description with reference to the drawings. - Referring to the first, second and third figures, the inventive probe connector 100 includes an insulative housing 10, a plurality of probe terminals 20, a plurality of insulating sleeves 30, a plurality of conductive terminals 40, and a plurality of receiving bases. 50 and a plurality of elastic members 60. The insulative housing 10 is provided with a plurality of probe-terminal slots 11 extending through the insulative housing 10 and a plurality of conductive terminal slots 12 extending upward from both sides of the bottom wall of the insulative housing 10 and communicating with the probe terminal slots 11. The plurality of probe terminals 20 are substantially cylindrical, and are mounted in the probe terminal slot 11 of the insulative housing 10, and the top end is movably protruded from the probe terminal slot 11, and the bottom of the probe terminal 20 is opened inside the probe terminal 20. A hole 21 is formed in the outer periphery of the bottom end of the probe terminal 4, and a projection 22 is protruded outwardly from the periphery of the upper end of the card edge 22. The insulating sleeve 30 is detachably sleeved outside the lower end of the probe terminal 20 and received in the probe terminal slot 11. Specifically, the corresponding inner edge of the insulating sleeve 30 is radially recessed with a card slot (not shown), and the card edge 22 is engaged in the card slot. The plurality of conductive terminals 40 are disposed in the conductive terminal slots 12, and each of the conductive terminals 40 has a plate-shaped holding portion 41, a spring arm portion 42 extending obliquely upward and upward from the upper end of the holding portion 41, and a slave arm a contact portion 43 formed by bending and extending at a distal end of the portion 42 and a soldering portion 44 formed by bending outwardly from a lower end of the holding portion 41. The holding portion 41 of the conductive terminal 40 is retained in the conductive terminal slot 12, and the contact portion 43 is elastic. The probe portion of the insulative housing 10 extends into the probe terminal slot 11 and abuts against the boss 23 or the insulating sleeve 30. The solder portion 44 is soldered to an external circuit board (not shown). The accommodating base 50 is closed at the bottom end of the probe terminal slot 11, and has a cylindrical accommodating cylinder 51 and a plug portion 52 that closes one end of the accommodating cylinder 51. Specifically, the accommodating cylinder 51 is closed at the bottom end of the probe terminal slot 11, and the insertion portion 52 extends beyond the bottom end of the probe terminal slot 11. The elastic member 60 is received in the probe terminal slot 11 , and the top end projects into the top wall of the slot 21 . The bottom end of the elastic member 60 extends into the receiving sleeve 51 of the receiving base 50 . . The working principle of the present probe connector 100 is as follows: When the probe terminal 20 is not depressed or pressed down, the contact portion 43 of the conductive terminal 40 abuts against the insulating sleeve 30, so the probe terminal 20 and the conductive terminal 40 is not turned on; when the probe terminal 20 is pressed down into position, the probe terminal 20 compresses the elastic member 60 to move downward, so that the contact portion 43 of the conductive terminal 40 and the 5 M413992 boss 23 of the probe terminal 20 are turned on. The pin terminal 20 and the conductive terminal 40 are turned on. When the probe terminal 20 is pressed down, the start of the pressing due to the operation failure may cause the single probe terminal 2 to move down first. However, when the single probe terminal 2 is pressed down, the contact portion 43 is abutted. Connected to the insulating sleeve 30, the probe terminal 20 fails to conduct with the corresponding conductive terminal 40; the contact portion 43 abuts against the boss 23 only when the single probe terminal 20 is pressed/positioned into position. The probe terminal 2 导 can be electrically connected to the corresponding conductive terminal, and at this time, all the probe terminals 20 of the probe connection 100 are pressed down to a certain position, then all the probes 20 and the corresponding conductive Terminal 40 is turned on.
綜上所述，本創作探針連接器100藉由導電端子4〇之接 觸部43可彈性的伸入絕緣本體1〇之探針端子槽丨丨内並抵接 於探針端子20之凸台23及絕緣套筒30上，當探針連接器 之所有的探針端子20皆下壓-定位移至到位時，才能實現所 有的探針端子20和對應的導電端子4〇導通，從而避免探 接器1 〇〇與對接連接器之間產生電狐效應。 【圖式簡單說明】In summary, the probe connector 100 of the present invention can elastically protrude into the probe terminal slot of the insulative housing 1 and abut against the boss of the probe terminal 20 through the contact portion 43 of the conductive terminal 4 23 and the insulating sleeve 30, when all the probe terminals 20 of the probe connector are pressed down and positioned to be in position, all the probe terminals 20 and the corresponding conductive terminals 4 can be turned on, thereby avoiding exploration. An electric fox effect is generated between the connector 1 and the docking connector. [Simple description of the map]
第一圖為本創作之探針連接器的立體圖。 第二圖為第-圖所示探針連接器的 第三圖為第一圖所示探針連接器的剖二解圖 第四圖為習知之探針連接器的剖面圖。 【主要元件符號說明】 探針連接器 100 探針端子槽 11 探針端子 20 卡稜 22 絕緣套筒 30 10 12 21 23 40 絕緣本體 導電端子槽 孔槽 凸台 導電端子 6 M413992 固持部 41 彈臂部 42 接觸部 43 焊接部 44 容置底座 50 容置筒 51 插接部 52 彈性件 60The first figure is a perspective view of the probe connector of the present invention. The second figure is the probe connector shown in Fig. - Fig. 3 is a cross-sectional view of the probe connector shown in Fig. 1. The fourth figure is a cross-sectional view of a conventional probe connector. [Main component symbol description] Probe connector 100 Probe terminal slot 11 Probe terminal 20 Card edge 22 Insulation sleeve 30 10 12 21 23 40 Insulation body Conductive terminal slot hole boss Conductor terminal 6 M413992 Holding portion 41 Arm Portion 42 Contact portion 43 Weld portion 44 accommodating base 50 accommodating cylinder 51 Socket portion 52 Elastic member 60