TWM403648U - Pressure measurement jig of touch type electronic product - Google Patents

Pressure measurement jig of touch type electronic product Download PDF

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Publication number
TWM403648U
TWM403648U TW99223534U TW99223534U TWM403648U TW M403648 U TWM403648 U TW M403648U TW 99223534 U TW99223534 U TW 99223534U TW 99223534 U TW99223534 U TW 99223534U TW M403648 U TWM403648 U TW M403648U
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Taiwan
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test
touch
electronic product
test platform
probe
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TW99223534U
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Chinese (zh)
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Rui-Ren Zheng
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Rui-Ren Zheng
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Priority to TW99223534U priority Critical patent/TWM403648U/en
Publication of TWM403648U publication Critical patent/TWM403648U/en

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Description

M403648 .五、新型說明: 【新型所屬之技術領域】 本創作係有關一種壓力量測治具,尤指一種應用在觸 控面板或按鍵等壓力量測領域中的觸控式電子產品之壓力 里測治具改良者。 . 【先前技術】 • 一般的觸控式電子產品,例如電腦鍵盤、筆記型電腦 鍵盤、手機按鍵、薄膜開關、薄膜鍵盤或觸控面板等等, 在製造過程或製造完成後都需要進行多種品管測試,以確 定產品的良率,並藉此汰除不良的或有瑕疵的產品。習知 針對觸控式電子產品進行壓力量測的方式,係在治具上設 有測試單元,該測試單元包含有一壓力傳感器,及一結合 在壓力傳感器一端的探棒,將觸控式電子產品放置在治具 上’使探棒的頂端對齊觸控式電子產品的受測部位,例: 鍵盤特定的按鍵或觸控面板特定的點,再通過測試機器下 ‘ 壓受測部位,使觸控式電子產品受壓並作用於探棒及壓力 •傳感器,如此該壓力傳感器可將機械應變的變化(變形)轉 換成電阻變化透過惠斯頓電橋阻可轉成電壓變化,再通過 儀器紀錄電阻(電壓)變化,即可得知量測的結果。 然而,習知壓力測式觸控式電子產品的治具,係在一 平台上結合上述的測試單元,因為各測試單元都具有一定 的體積,而且傳感器後端需要電線連接到紀錄儀器,導致 在一平台難以排列結合多數排測試單元,一般只能排列成 排或一排,但疋現今的觸控式電子產品,例如電腦鍵盤 3 M403648 或觸控面板等,都必需全面進行測試,因此要將一排或二 排的測試單元應用在全面測試時實有困難,只能分成多次 逐一測試(即測完-排再換下—排),如此將導致測試工作 的效率低落、緩慢。 【新型内容】 曰本創作之主要目的在提供—種觸控式電子產品之壓力 具’藉由多層次的測試平台結構改良,使多數個探 W夠緊㈣排列’進而達到可多點同步或全面進行量測 及提升量測速率之目的。 為達上述目的,本創作觸控式電子產品之壓力量測治 具之實施内容係包含:二個或二個以上的測試平台’各測 試平台包含中間設有-鏤空部,及在鏤空部相對應的二側 分別設有-測試單心定部,並將二個或二個以上的測試 平σ上下相互宜合成多層次結構;及多數個測試單元,各 測試Γ元包含一傳感器及一輛合在傳感器的探棒,並將各 測4早7L的傳感器排列結合在測試平台的測試單元固定部 ’使下層測試平台的探棒穿過上層測試平台的鏤空部,並 與上層測試平㈣探棒相互湖,以使探棒 控式電子產品進行壓力量測。 -任觸 t創作進一步實施改良,該測試平台係為矩形環框體 ’在壤框體中形成該鏤空部,而該測試單元固定部係設置 於鏤空部相對應的二側的板片。 賴作進-步實施改良’更實施有一底座,該底座的 上面k供δ亥下層測試平台結合。 M403648 本創作進一步實施改良,更實施有一上蓋,該上蓋覆 蓋在該層測試平台的上面。其中,該上蓋設有對應各探棒 的探棒穿孔,使各探棒上端分別通過探棒穿孔而凸出在上 蓋的上面。亦可設有一開孔,使各探棒上端共同通過開孔 而凸出在上蓋的上面。又,該上蓋的上面可設有一用於固 定觸控式電子產品的固定器,該固定器係為鏤空框體。 * 本創作進一步實施改良,更實施有一夾層板,該夾層 • 板中間設有一夾層板鏤空部,並將夾層板設置在二個測試 • 平台之間,使探棒得以穿過夾層板鏤空部。 藉此,本創作觸控式電子產品之壓力量測治具,透過 多層次的測試平台結構改良,使多數個探棒能夠緊密地排 列成多排,以全面對應觸控式電子產品各受測點的結構, 以克服習知測試治具只能實施一排或二排的測試單元的缺 點,因此使得本創作可以對觸控式電子產品進行全面壓力 量測,進而達到可多點同步或全面進行量測及提升量測速 β 率的功效。 # 【實施方式】 茲依附圖實施例將本創作之結構特徵及其他之作用、 目的詳細說明如下: 如第一圖、第二圖及第三圖所示,本創作觸控式電子 產品之壓力量測治具,其較佳的實施例係包含:二個或二 個以上的測試平台1、多數個測試單元2,並可結合有一 底座3、一上蓋4及一夾層板5,其中: 該測試平台1係包含在中間設有一鏤空部11,及在鏤 5 M403648 空部11相對應的二側分別設有一測試單元固定部12,如此 在組合應用時將二個或二個以上的測試平台丄上下相互聂 合成多層次結構。其中,制試平台1可為矩形或其他^ 狀的環框體,在環框體之中形成該鏤空部丨〗,而該測試單 元固定部12係設置於鏤空部丨丨相對應的二側的板片ΐ2ι。 該測試單元2,如第五圖所示,係為壓力測試元件, 其幸父佳的實施例包含—傳感器21及一耦合在傳感器21 一端 的探棒22,並將各測試單元2的傳感器21排列結合在測試 平台1的測試單元固定部12,使下層測試平台丄的探棒22 穿過上層測試平台1 #鏤空部u,並與上層測試平台工的 探棒22相互排列。如第六圖所示,為測試單元2之又一實 施例圖,其主要係將測試單元2,採一體製成一L型結構 體,而令測試單元2,之探棒部22,直接成型而豎立在傳感 器部21’之一側上端面。其中,本創作之測試單元2可為電 阻應變片壓力傳感器、半導體應變片壓力傳感器、壓阻式 壓力傳感器、電感式壓力傳感器、電容式壓力傳感器、諧 振式壓力傳感器及電容式加速度傳感器等。 該底座3係對應或不對應測試平台i的矩形板塊,使 底座3的上面提供最下層測試平台1結合。 5亥上蓋4係對應或不對應測試平台^的矩形板塊,將 上蓋4覆蓋在最上層測試平台1的上面,通過上蓋4及底 座3將多層次的測試平台1夾合。其中,該上蓋4可以設 有對應各探棒22的探棒穿孔41,使各探棒22的上端分別通 過探棒穿孔41而凸出在上蓋4的上面。又,該上蓋4的上 M4U3648 面可以設有-用於固^觸控式電子產品6的固定器42,該 固定器42係為鏤空框體或其他足以將觸控式電子產品6固 疋在上蓋4上面的元件或裝置。 該夾層板5係對應測試平台i的矩形板塊,在夾層板 5的中間設有一夾層板鏤空部51,可依此用需求將夾層板 5设置在二個測試平台1之間,使測試單元2的探棒22得 以穿過夾層板鏤空部51,再延伸到最上層測試平台1,與 最上層測試平台1的探棒22相互排列。 鲁 如第二圖及第四圖所示,本創作實際應用在觸控式電 子產品6的壓力量測時,可依實際需求疊合二個測試平台 1,在上層測試平台i二側的測試單元固定部12分別排列 的固定有多個測試單元2,使探棒22垂直往上延伸,而在 下層測試平台1 一側的測試單元固定部12排列的固定有多 個測試單元2,使探棒22垂直往上延伸穿過上層測試平台 1的鏤空部11,如此組成三排排列的探棒22,另外可依上 ‘述結構及方式組裝在底座3上,再組裝上蓋4或再加裝夾 •層板5,如此就能組成完整的壓力量測治具。其後,將觸 控式電子產品6放置在上蓋4上面,並使用固定器42加以 固定,使觸控式電子產品6的各受測部位61對齊探棒22, 如此再使用機器下壓觸控式電子產品6的各受測部位61, 就可使受測部位61受壓並再作用於探棒22上端,如此全面 進行壓力量測。 如第七圖及第八圖所示,當觸控式電子產品6的各受 測部位61更多時,本創作可以實施有三個測試平台1,在 7 M403648 上層及中間的測試平台1二側的測試單元固定部12分別排 列的固定有多個測試單元2,使中間測試平台1的探棒22 垂直往上延伸,並穿過上層測試平台1的鏤空部11 ;而在 下層測試平台1可再一側或二側的測試單元固定部12排列 的固定有多個測試單元2,使探棒22垂直往上延伸穿過上 層測試平台1的鏤空部11,如此組成至少五排排列的探棒 22 ’可分別對觸控式電子產品6的各受測部位61進行量測 〇 再如第七圖所示,本創作上蓋4亦可設有一開孔43, 如此使各測試單元2的探棒22上端共同通過開孔43而凸出 在上蓋4的上面,由此可見本創作的具體結構仍可依實際 測試需求而改變,並不以上述為限。 本創作觸控式電子產品之壓力量測治具,透過上述的 多層次的測試平台1結構改良,使多數個探棒22能夠緊密 地排列成全面對應觸控式電子產品6各受測部位61的結構 ,例如可排列成三排、五排或更多排,將能克服習知測試 治具只能實施一排或二排的測試單元的缺點,因此使得本 創作可以對觸控式電子產品6進行全面壓力量測,進而達 到可多點同步或全面進行量測及提升量測速率的功效。 、上述實施例所揭,僅係本創作主要技術之例舉說明, 並非用以限定本案技術範圍,凡涉及等效應用或基於前項 技料段為W變更或置換者,均魏為本案技術範圍。 綜上所述,本創作觸控式電子產品之壓力量測治具, 確>、實用性與創作性,其技術手段之運用亦出於新賴無 皆合,已稱合理進步至明。為 ’惟懇請鈞局惠予詳審,並 且功效與設計目的誠然符合 此,依法提出新型專利申請,惟 賜准專利為禱,至感德便。 【圖式簡單說明】 第圖為本創作第一較佳實施例之分解立體圖。 第二圖為本創作第—較佳實施例之組合立體圖。 第三圖為本創作第—較佳實施例之組合剖面圖。 第四圖為本創作第—較佳實施例之應用狀態示意圖。 第五圖為本創作之測試單元立體示意圖。 第/、圖為本創作之測試單元另一實施例立體示意圖。 第七圖為本創作第二較佳實施例之分解立體圖。 第八圖為本創作第二較佳實施例之應用狀態示意圖。 【主要元件符號說明】 1測έ式平台 11鏤空部 12測試單元固定部 12ι板片 2、2,測試單元 21傳感器 21’傳感器部 22探棒 22’探棒部 3底座 4 上蓋 42固定器 5 夾層板 6 觸控式電子產品 41 探棒穿孔 43開孔 51 夾層板鏤空部 61 受測部位M403648 . V. New description: [New technical field] This creation is about a pressure measuring fixture, especially one that is applied to the pressure of touch electronic products in the field of pressure measurement such as touch panel or button. The test fixture is improved. [Prior Art] • General touch electronic products, such as computer keyboards, notebook keyboards, cell phone buttons, membrane switches, membrane keyboards or touch panels, etc., require a variety of products during the manufacturing process or after manufacturing. Tube testing to determine the yield of the product and to eliminate bad or defective products. A method for pressure measurement of a touch-sensitive electronic product is provided with a test unit on the fixture, the test unit includes a pressure sensor, and a probe coupled to one end of the pressure sensor, the touch-type electronic product Placed on the fixture to align the top of the probe with the tested part of the touch-sensitive electronic product, for example: a specific button on the keyboard or a specific point on the touch panel, and then press the test part to press the measured part to make the touch The electronic product is pressed and applied to the probe and the pressure sensor, so that the pressure sensor can convert the mechanical strain change (deformation) into a resistance change, which can be converted into a voltage change through the Wheatstone bridge resistance, and then the resistance is recorded by the instrument. The (voltage) changes, you can know the results of the measurement. However, the conventional pressure measuring type touch electronic product fixture is combined with the above test unit on a platform, because each test unit has a certain volume, and the sensor rear end needs wires to be connected to the recording instrument, resulting in A platform is difficult to arrange and combines most of the test units. Generally, it can only be arranged in rows or rows. However, today's touch-sensitive electronic products, such as the computer keyboard 3 M403648 or touch panel, must be fully tested, so The test unit of one row or two rows is difficult to use in the comprehensive test. It can only be divided into multiple tests one by one (that is, the measurement is completed - the row is replaced again - the row), which will result in the test work being inefficient and slow. [New Content] The main purpose of Sakamoto's creation is to provide a pressure-sensitive electronic device's pressure tool's structure improvement through multi-level test platform, so that most of the probes are tight enough (four) to be arranged to achieve multi-point synchronization or Fully measure and increase the rate of measurement. In order to achieve the above objectives, the implementation of the pressure measuring fixture of the present touch electronic product includes: two or more test platforms 'each test platform includes a hollow portion in the middle, and a hollow portion The corresponding two sides are respectively provided with a test single core portion, and two or more test flats are preferably combined with each other to form a multi-level structure; and a plurality of test units, each test unit includes a sensor and a Integrate the probe of the sensor, and combine the 4A sensor arrays of the test 4 in the test unit fixing part of the test platform to make the probe of the lower test platform pass through the hollow part of the upper test platform, and probe with the upper layer (4) Rods are mutually lakes for pressure measurement of probe-controlled electronic products. Further, the test platform is a rectangular ring frame body. The hollow portion is formed in the soil frame, and the test unit fixing portion is disposed on the two side plates corresponding to the hollow portion. In the process of implementing the improvement, the implementation has a base, and the upper surface of the base is combined with the lower layer test platform. M403648 The present invention is further improved, and an upper cover is further provided, and the upper cover is overlaid on the test platform of the layer. Wherein, the upper cover is provided with a probe piercing corresponding to each of the probes, so that the upper ends of the probes are respectively protruded through the probe to protrude above the upper cover. An opening may also be provided so that the upper ends of the probes project together through the opening to protrude above the upper cover. Moreover, the upper surface of the upper cover may be provided with a fixing device for fixing the touch electronic product, and the fixing device is a hollow frame. * This work was further improved. A sandwich panel was installed. The sandwich panel was provided with a sandwich panel hollow and the sandwich panel was placed between the two test platforms to allow the probe to pass through the sandwich panel hollow. In this way, the pressure measurement tool of the touch-sensitive electronic product is improved through a multi-level test platform structure, so that most of the probes can be closely arranged in multiple rows to comprehensively correspond to the touch electronic products. The structure of the point to overcome the shortcomings of the conventional test fixture can only implement one or two rows of test units, thus enabling the creation of a comprehensive pressure measurement of the touch electronic product, thereby achieving multi-point synchronization or comprehensive The ability to measure and increase the beta rate of the rate. #实施实施方式 The following is a detailed description of the structural features and other functions and purposes of the present invention as follows: As shown in the first, second and third figures, the pressure of the touch-sensitive electronic product is created. A preferred embodiment of the measuring fixture comprises: two or more test platforms 1, a plurality of test units 2, and a base 3, an upper cover 4 and a sandwich panel 5, wherein: The test platform 1 includes a hollow portion 11 in the middle, and a test unit fixing portion 12 on each of the two sides corresponding to the 镂5 M403648 hollow portion 11, so that two or more test platforms are used in combination application.丄 丄 相互 相互 合成 合成 合成 合成 合成. The test platform 1 may be a rectangular or other ring-shaped ring frame, and the hollow portion is formed in the ring frame, and the test unit fixing portion 12 is disposed on two sides corresponding to the hollow portion The plate ΐ 2ι. The test unit 2, as shown in the fifth figure, is a pressure test element, and its embodiment includes a sensor 21 and a probe 22 coupled to one end of the sensor 21, and the sensor 21 of each test unit 2 The test unit fixing portion 12 of the test platform 1 is aligned so that the probe 22 of the lower test platform 穿过 passes through the upper test platform 1 #镂 部 u and is arranged with the probe 22 of the upper test platform. As shown in the sixth figure, it is a further embodiment of the test unit 2, which mainly comprises the test unit 2, which is integrally formed into an L-shaped structure, and the test unit 2, the probe portion 22, is directly formed. The upper end surface of one side of the sensor portion 21' is erected. Among them, the test unit 2 of the present invention may be a resistance strain gauge pressure sensor, a semiconductor strain gauge pressure sensor, a piezoresistive pressure sensor, an inductive pressure sensor, a capacitive pressure sensor, a resonant pressure sensor, and a capacitive acceleration sensor. The base 3 corresponds to or does not correspond to the rectangular plate of the test platform i, so that the upper surface of the base 3 provides the combination of the lowermost test platform 1. 5 The upper cover 4 series corresponds to or does not correspond to the rectangular plate of the test platform ^, and the upper cover 4 is overlaid on the uppermost test platform 1, and the multi-level test platform 1 is sandwiched by the upper cover 4 and the base 3. The upper cover 4 may be provided with the probe through holes 41 corresponding to the probes 22, so that the upper ends of the probes 22 are respectively protruded from the upper surface of the upper cover 4 through the probe through holes 41. Moreover, the upper M4U3648 side of the upper cover 4 may be provided with a holder 42 for fixing the touch-sensitive electronic product 6, and the holder 42 is a hollow frame or other sufficient to fix the touch-type electronic product 6 The component or device above the upper cover 4. The sandwich panel 5 is a rectangular panel corresponding to the test platform i, and a sandwich panel hollow portion 51 is disposed in the middle of the sandwich panel 5. The sandwich panel 5 can be disposed between the two test platforms 1 according to the requirement, so that the test unit 2 is The probes 22 are passed through the sandwich panel hollow portion 51 and then extended to the uppermost test platform 1 to be aligned with the probes 22 of the uppermost test platform 1. Lu Ru shown in the second and fourth figures, the actual application of this creation in the pressure measurement of the touch-sensitive electronic product 6, can be combined with two test platforms 1 according to actual needs, on the test side of the upper test platform i The unit fixing portions 12 are respectively arranged with a plurality of test units 2 fixed to extend the probes 22 vertically upward, and the test unit fixing portions 12 on the side of the lower layer test platform 1 are fixed with a plurality of test units 2, so that the plurality of test units 2 are fixed. The rods 22 extend vertically upward through the hollow portion 11 of the upper test platform 1, thus forming the rows of probes 22 arranged in three rows, and can be assembled on the base 3 according to the structure and manner described above, and then assembling the upper cover 4 or reassembling The clamp plate 5 is such that a complete pressure measuring fixture can be formed. Thereafter, the touch-sensitive electronic product 6 is placed on the upper cover 4 and fixed by the holder 42 so that the tested portions 61 of the touch-sensitive electronic product 6 are aligned with the probe 22, and then the device is pressed down. Each of the tested portions 61 of the electronic product 6 can press the tested portion 61 and act on the upper end of the probe 22, so that the pressure measurement is performed comprehensively. As shown in the seventh and eighth figures, when there are more test sites 61 of the touch-sensitive electronic product 6, the author can implement three test platforms 1 on the upper side of the 7 M403648 and the test platform 1 on the middle side. The test unit fixing portion 12 is respectively arranged with a plurality of test units 2 fixed so that the probe 22 of the intermediate test platform 1 extends vertically upward and passes through the hollow portion 11 of the upper test platform 1; and the lower test platform 1 can be The test unit fixing portion 12 on one or both sides is arranged with a plurality of test units 2 arranged to extend the probe 22 vertically upward through the hollow portion 11 of the upper test platform 1, thus forming the probes arranged in at least five rows. 22 ' can measure each of the tested parts 61 of the touch-sensitive electronic product 6 respectively. As shown in the seventh figure, the upper cover 4 can also be provided with an opening 43 so that the probes of the test units 2 are The upper end of the second end 22 is protruded from the upper surface of the upper cover 4 through the opening 43. It can be seen that the specific structure of the present invention can still be changed according to the actual testing requirements, and is not limited to the above. The pressure measuring tool of the touch-sensitive electronic product is improved in structure by the multi-level test platform 1 described above, so that most of the probes 22 can be closely arranged to fully correspond to the tested parts of the touch-sensitive electronic product 6 The structure, for example, can be arranged in three rows, five rows or more rows, which will overcome the shortcomings of the conventional test fixtures that can only implement one or two rows of test units, thus making the creation of the touch electronic products 6 Perform comprehensive pressure measurement to achieve multi-point simultaneous or comprehensive measurement and increase measurement rate. The above embodiments are merely illustrative of the main techniques of the present invention, and are not intended to limit the technical scope of the present invention. Where the equivalent application or the change or replacement based on the preceding technical segment is W, the technical scope of the present invention is . In summary, the pressure measuring and measuring tool of the touch-sensitive electronic product is indeed, practical, and creative, and the application of its technical means is also based on the new one, which has been said to be reasonably improved. For the sake of 'department, please ask the bureau to give a detailed examination, and the effect and design purpose are in line with this. A new type of patent application is filed according to law, but the patent is granted as a prayer. BRIEF DESCRIPTION OF THE DRAWINGS The drawings are an exploded perspective view of a first preferred embodiment of the present invention. The second figure is a combined perspective view of the first preferred embodiment of the present invention. The third drawing is a combined sectional view of the first preferred embodiment of the present invention. The fourth figure is a schematic diagram of the application state of the first preferred embodiment of the present invention. The fifth picture is a three-dimensional schematic diagram of the test unit of the creation. The figure / is a perspective view of another embodiment of the test unit of the present creation. Figure 7 is an exploded perspective view of a second preferred embodiment of the present invention. The eighth figure is a schematic diagram of an application state of the second preferred embodiment of the present invention. [Main component symbol description] 1 test platform 11 hollow portion 12 test unit fixing portion 12ι plate 2, 2, test unit 21 sensor 21' sensor portion 22 probe 22' probe portion 3 base 4 upper cover 42 holder 5 Mezzanine board 6 touch-type electronic product 41 probe hole perforation 43 opening 51 sandwich board hollow part 61 part to be tested

Claims (1)

六、申請專利範圍: 1、一種觸控式電子產品之壓力量測治具,其至少包含·· 一個或二個以上的測試平台及多數個測試單元所構成 ’唯其特徵乃在於: 一個或二個以上的測試平台,各測試平台包含中 間設有一鏤空部,及在鏤空部相對應的二側分 -測試單元固定部,並將二個或二個以上的測試^ . 上下相互疊合成多層次結構。 . 2如申清專利範圍第1項所述觸控式電子產品之壓力量拳 測治具’其中’該測試平台係為矩形環框體,在環框 體中形成該鏤空部,該測試單元固定部係設置於鎮空 部相對應的二側的板片。 3、 如申請專利範圍第i項所述觸控式電子產品之壓力量 測’口具,其中,多數個測試單元,各測試單元包含一 傳感器及_合在傳感器的探棒’並將各測試單元的 傳感器排列結合在測試平台的測試單元固定部,使下 層測試平台的探棒穿過上層測試平台的鐘空部,並與 上層測試平台的探棒相互排列。 4、 如申請專利範圍第i項所述觸控式電子產品之壓力量 測/CT具其中,多數個測試單元,該測試單元可採一 體製成-L型結構體,而令測試單元之探棒部以直接 成型而豎立在傳感器部之—側上端面。 10Sixth, the scope of application for patents: 1. A pressure measuring fixture for touch-sensitive electronic products, which comprises at least one or more test platforms and a plurality of test units. The only features are: one or Two or more test platforms, each test platform includes a hollow portion in the middle, and a two-side split-test unit fixed portion corresponding to the hollow portion, and two or more tests are stacked on top of each other. Hierarchy. [2] The pressure measurement boxing tool of the touch-type electronic product according to the first paragraph of the patent scope of the claim is wherein the test platform is a rectangular ring frame body, and the hollow portion is formed in the ring frame body, the test unit The fixing portion is disposed on the two side plates corresponding to the hollow portion. 3. The pressure measurement of the touch-sensitive electronic product described in the scope of claim i, wherein a plurality of test units, each test unit includes a sensor and a probe connected to the sensor and each test The sensor arrangement of the unit is combined with the test unit fixing portion of the test platform, so that the probe of the lower test platform passes through the clock space of the upper test platform and is arranged with the probe of the upper test platform. 4. The pressure measurement/CT of the touch-type electronic product mentioned in the scope of claiming patent item i, wherein a plurality of test units can be integrated into an L-shaped structure, and the test unit is explored. The rod portion is erected directly on the side upper end surface of the sensor portion. 10
TW99223534U 2010-12-03 2010-12-03 Pressure measurement jig of touch type electronic product TWM403648U (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI489345B (en) * 2013-03-27 2015-06-21 Wistron Corp Testing fixture
CN114354049A (en) * 2022-03-18 2022-04-15 深圳市三江名创电子科技有限公司 Stress detection device for mobile phone protective film

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI489345B (en) * 2013-03-27 2015-06-21 Wistron Corp Testing fixture
CN114354049A (en) * 2022-03-18 2022-04-15 深圳市三江名创电子科技有限公司 Stress detection device for mobile phone protective film
CN114354049B (en) * 2022-03-18 2022-05-20 深圳市三江名创电子科技有限公司 Stress detection device for mobile phone protective film

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