M399987 五 新型說明： 【新型所屬之技術領域】 ^係有關—種電子元件，例如積體電路⑽㈣試機構 種具有定位確實、接觸穩定之電子元件測試機構。 尤才曰 【先前技術】 按電子元件，例如積體電路(|C)製成後， 、後’以峰保電子元件之品質，方能進行後續的包農出貨作^剛試 .和位力感測器_騎)的積體電路為例，因其可提供迷声 和位移的魏。所以重域測器可_ _ 托供逮度M399987 V New type of description: [New technical field] ^Related electronic components, such as integrated circuit (10) (4) Test mechanism A kind of electronic component testing mechanism with stable positioning and stable contact. You Caiyu [Prior Art] After the electronic components, such as the integrated circuit (|C), can be used to carry out the subsequent shipments of the electronic components. The integrated circuit of the force sensor_riding is taken as an example because it provides Wei and displacement. So the heavy domain tester can _ _
度’以便輸出不同的電壓值:再經由S 中的_或將手機榮= 因此’該重力感測器的傾斜角度測試，並 試機所能勝任，而是必須藉助動態球形旋轉測路测 以便測試該重力感測器在旋轉時是否發生異疋作’ =態試機之示意圖，該測試機係在：= 對5又有-對支架101，該對支架1〇1間以一第 幼 -外框件2〇,且該第一樞轴1〇2經由第一傳 •使該外框件20相對於第—樞軸1〇2 == 轉’ 第二傳動二的;第，外框件2。之 3〇1之丫轴方向呈左、右轉逆動轉。使_件3〇相對於第二樞轴 至圖2b中所亥内^牛*30上裝設一電子元件測試機構40，如圖1 數個容置凹係在—基座401表面以陣列方式開設複 位對應設置“ 4034〇2，内_待測試積體電路的腳 為使待測试積體電路於該動態球形旋轉 3 M399987 Ϊΐΐ:寺的定位，各容置凹槽402上方橫向樞設-可轉動之 架一各====對彈性伸縮 =進仃賴測試時，該機台1()藉由 1〇 ^ ^ 404 2b所二二以則頭代表)後被壓縮，而將該等壓擎臂403如圖 凹槽4〇2陣列配置的吸嘴移動至該頂蓋上方將=== 丨C穿過該頂蓋對應容置凹請陣列所開設穿槽各而 mG2内後’該機械手臂賴，而機台1〇再度藉由升降 而緩慢地下降，而此下移過程中，若該等彈性伸】 架404尚未完全伸展時’使壓擎臂4〇3無法向下壓擎^，而令所 有^C因處於非定位狀態’容易造成偏移縣，進而無法與探針 403 ^成準確的對位關係、，以致在隨後之外、内框件2〇、加分別 進行前後、左右轉動_斜肢測試，將無法獲得準確的測試社 —尤有進者，由猶述電子元制試機構4Q的結構複雜，例如 各，置凹槽4。2之兩側需相對設置—對彈性伸縮架似，且其中 一彈性伸縮架404内以槓桿原理樞接一壓掣臂4〇3的組合，將限 制電子元件測試機構的擴紐，亦即lc同時進行檢測數量受到^ 制；以及因機台10頂底部需分別設置伸降機構及頂蓋，而使得咳 動態球形旋轉測試機體積龐大，而亟待改善。 ^ 【新型内容】 本案的主要目地在於提供一種電子元件測試機構，該測試機 構使得待測試電子元件，例如積體電路具有定位確實、接觸穩定、 擴充性佳、及有效縮減機台體積的優點。 為達成前述之目地，本案所採取之技術手段係提供一種電子 元件測試機構，其包括： 4 座，其表面設有至少—基座連接11，以及伸出至少一對 彼此隔開且可開合的夾具； 及盤座，其縱向開設複數個縱向槽，各縱向槽底部連通一 可吸附或釋放電子元件之容置凹穴；以及 疋位’則。式裝置，其裝設於该基座頂面，該裝置進一步包括： 電路板，其表面依據各容置凹穴内之電子元件接腳位置設 、至電路布局的接點，且該電路板縱向開設供各夾具穿出之板 f 1另於該電路板底面設有至少—與職座連接n相對接之電路 板連接器； 一定位框，其固設於該電路板頂面，該定位框縱向開設一開 口，開口頂部兩側相對設有一對限位板；以及 彳木針座，其套設於該開口内，並使兩側邊鄰接該對限位板 底面，該探針賴應各接齡置插射雜義之探針，並將各 探針底部與對應的接點相接觸； 田吸盤座蚊純職時’該至少_對可開合的爽具炎住該 $座’使該吸盤座底面所吸附之各電子^件被探針座頂面突伸 的探針所頂持與接觸。 為進-步揭示本案之具體技術内容，首先請參閱圖式，其中， 圖1為習知動態球形旋轉測試機之局部立體圖，目2a及圖2b為 驾知電子元制試機構未侧及上升以承接電子元件之示意圖， 圖3為本案動態球形旋轉測試機之立體圖，圖4a及圖4b為本案 電子几件職機躺不同視肖之立體分賴，圖5為本案電子元 件測試機構裝設於動態球形旋轉測試機之立體圖，圖&及圖6b 為本案電子元件測试機構組合前後之剖面圖。 【實施方式】 如圖3至圖5所7F ’本案電子元件測試機構2裝設於一動態 球形旋轉測試機1的頂面。 雜態球形旋轉測試機1係在一機台U上相對設有一對支架 該電路板231上方裝設一定位框232，該定位框232縱向開 設一開口 232a’另將一探針座233由該定位框232底部套設於該 開口 232a内，該開口 232a頂部兩側相對設有一對限位板232b， 並使該探針座233兩側邊鄰接該對限位板232b底面。 該探針座233對應電路板231的接點231a位置縱向開設針 孔233a，供探針233b插入與定位後，使複數個探針233b與容 置凹八222相同呈陣列配置，並突伸於前述的開口 232a區域内。 δ亥才采針座233頂面突設至少兩固定銷233c，各固定銷233c插入 各限位板232b預设的固定孔232c内定位。而為使該探針座233 月匕夠穩固地固设於§玄疋位框232的開口 232a内，因此，該電路 板231底面設有一固定板234 ’該固定板234四角隅開設穿孔 234a ’以便供習知的連接件234b ’例如螺栓穿越穿孔234a、電 路板231之通孔231 d、並鎖固於定位框232之框孔232d内，使 該固定板234與定位框232共同包夾該探針座233及電路板231。 尤有進者，該對限位板232b頂面另開設至少兩定位孔232e， 且為偵測後敘吸盤座22是否到位，該定位框232頂面適當位置， 例如定位孔232e外側各自接裝一近接開關235，以便以非接觸方 式偵測該吸盤座22確實到位後，即發出一訊號，使該至少一對夾 具212向内呈扇形運動，以便夾固該吸盤座22之夾塊223。如圖 4a所不’該近接開關235橫向插入一開關座235a内，並將各開 關座235a接裝於定位孔232e外侧’即可完成該定位測試裝置23 的組裝工序。接著，將該定位測試裝置23固設於基座21上方， 使電路板連接器231b與基座連接器211對接，以形成電路的接 通，且各對夾具212由電路板231之板孔231c伸出。 本案操作時，首先位於他處並呈反置型態之吸盤座22的容置 凹穴222内依序放妥電子元件3，例如丨c後，此時，一習知載具 4，例如具有等同於縱向槽221陣列配置吸嘴41之機械手臂移動 至《亥及盤座22之各縱向槽221位置，並將各吸嘴41對正所屬之 M3999.87 縱向槽221進行抽真空作業，使各IC吸附於容置凹穴222内；接 著’該機械手臂將該吸盤座22反轉，使該吸盤座22如圖6a所示 移動至定位框232上方並下降；然後’該吸盤座22藉由兩根定位 銷224插入該定位框232之定位孔232e内，使各ic的接腳與兮 探針座233對應設置的探針233b形成接觸，並藉由且有彈性伸^ 縮的探針233b頂持著IC ’藉以形成如圖6b所示之定位與接觸狀 態。此時，該近接開關235偵測到吸盤座22與定位框232形成 準確對位關係後，該近接開關235發出一訊號，使該至少一對夾 具212向内呈扇形運動，以便夾固該吸盤座22之夾塊223,而形 成如圖5所示之型態。 最後，該動態球形旋轉測試機1之第一傳動裝置15帶動第一 樞軸13正、逆向轉動，使該外框件14、第二傳動裝置18、内框 與電子元件測試機構2亦同步正、逆向轉動，藉以測試㈣ 之x軸方向呈前、後轉動的傾斜角度測試。接 -傳動裝置15停機後，該第二傳動裝置18帶動第二框 ^7正、逆向轉動’使内框件16與電子元件測試機構2亦同步 正、逆向轉動，藉以測試該丨C相對於第二樞軸17之 左、右轉動的傾斜角度測試。 定位:梦案的實施’其所增益之功效在於’當吸盤座與 吸盤座位框對接時，該至少-對可開合的夾具夾住該 頂持與接觸，以形成定位確實與接觸穩定二 果，且在此對接過針’電子S件不會 的穩定性，並增加電子元件ΜI =成偏移攸而確保測试 機構的結構簡單，僅需改變電^板’本案的電子70件測試 座之2 接點、探針座之騎及吸盤 具ί局：即可增減待測試電子元件的數量，而 形旋轉測試：，σ則：U有^者、，本案的實施例若用於動態球 '、、Μ ‘％球形旋轉測試機無需設置升降機構及頂 8 M399987 ί所尺寸’並有效降低製造成本’誠為同類物品 本案_示者’乃難#_之—種，軌局部 案之技術思想而為熟習該項技藝之人所易於推知i: 俱不脫本案之專利權範疇。 $ 【圖式簡單說明】 圖1為習知動態球形旋轉測試機之局部立體圖。 知電子元伽m麟未飾及上相承接電子 圖3為本案動態球形旋轉測試機之立體圖。 林案電子元相说倾科同視狀立體分解圖。 ^為本案電子70件測試機構I設於動態球形旋轉測試機之 1體Degree 'in order to output different voltage values: then through the _ in the S or the mobile phone Rong = therefore 'the gravity sensor's tilt angle test, and the test machine can be competent, but must rely on the dynamic spherical rotation path test so that Test whether the gravity sensor rotates when it is a schematic diagram of the '= state test machine, the test machine is: = 5 pairs - for the bracket 101, the pair of brackets 1 to 1 with a younger - The outer frame member 2〇, and the first pivot member 1〇2 transmits the outer frame member 20 relative to the first pivot 1〇2== to the second transmission two via the first transmission; 2. The axis direction of the 3〇1 turns left and right and reverses. The electronic component testing mechanism 40 is mounted on the surface of the pedestal 401. Open the reset corresponding setting "4034〇2, the inner _ the foot of the integrated circuit to be tested is to rotate the integrated circuit to be tested in the dynamic sphere 3 M399987 Ϊΐΐ: the positioning of the temple, the lateral erection of each receiving groove 402 - Rotating frame one ==== For elastic expansion = When the test is in progress, the machine 1 () is compressed by 1 〇 ^ ^ 404 2b and then the head is compressed) The isobaric engine arm 403 moves to the top of the top cover as shown in the array of the groove 4〇2, and the === 丨C passes through the top cover corresponding to the accommodating concave array, and the groove is opened inside the mG2. The mechanical arm is lowered, and the machine 1 〇 is slowly lowered again by the lifting and lowering, and during the downward movement, if the elastic stretching frame 404 is not fully extended, the pressure engine arm 4〇3 cannot be pressed downward.擎^, and let all ^C be in a non-positional state' easily cause an offset county, and thus cannot be accurately aligned with the probe 403, so that it is beyond The inner frame member 2〇, plus the front and rear, left and right rotation _ oblique limb test, will not be able to obtain an accurate test society - especially advanced, the structure of the 4Q by the Juxun electronic standard test mechanism is complex, for example, each concave The two sides of the slot 4. 2 need to be oppositely disposed - similar to the elastic telescopic frame, and one of the elastic telescopic frames 404 is pivotally connected to a combination of the pressing arms 4 〇 3 by a lever principle, which will limit the expansion of the electronic component testing mechanism. That is to say, the number of simultaneous detection of lc is controlled; and because the top and bottom of the machine 10 need to be separately provided with the extension mechanism and the top cover, the cough dynamic spherical rotation tester is bulky and needs to be improved. ^ [New content] The main purpose is to provide an electronic component testing mechanism, which makes the electronic component to be tested, such as an integrated circuit, have the advantages of accurate positioning, stable contact, good expandability, and effective reduction of the size of the machine. To achieve the foregoing objectives, the present invention The technical means adopted is to provide an electronic component testing mechanism comprising: 4 seats, at least a pedestal connection 11 on the surface thereof, and at least one pair extending a spaced apart and closable clamp; and a disk holder having a plurality of longitudinal grooves extending in a longitudinal direction, a bottom portion of each longitudinal groove being connected to a receiving recess for adsorbing or releasing electronic components; and a clamping device for mounting The device further includes: a circuit board, the surface of which is disposed according to the position of the electronic component pin in each of the receiving recesses, and the connection to the circuit layout, and the circuit board is longitudinally opened for each clamp to pass through The board f1 is further provided with a circuit board connector at least opposite to the base connection n of the circuit board; a positioning frame is fixed on the top surface of the circuit board, and the positioning frame defines an opening in the longitudinal direction. a pair of limiting plates are oppositely arranged on the two sides of the top; and a beech needle seat is sleeved in the opening, and the two sides are adjacent to the bottom surface of the pair of limiting plates, and the probe is adapted to be inserted into each of the connecting plates. Probe of the righteousness, and the bottom of each probe is in contact with the corresponding contact; when the mosquito sucker is in the pure position, the at least _ the pair of openable and sturdy inflamed living in the $seat makes the bottom of the sucker holder adsorb Each electronic component is held by a probe protruding from the top surface of the probe base Touch. In order to further reveal the specific technical content of the case, first, please refer to the drawings. FIG. 1 is a partial perspective view of a conventional dynamic spherical rotation testing machine, and FIG. 2a and FIG. 2b show the side and rise of the electronic component testing mechanism. In order to take over the electronic components, Figure 3 is a perspective view of the dynamic spherical rotation testing machine of the present case. Figures 4a and 4b show the three-dimensional separation of the electronic parts of the electronic device. Figure 5 shows the electronic component testing mechanism installed in this case. The perspective view of the dynamic spherical rotation tester, Fig. & and Fig. 6b are cross-sectional views of the electronic component testing mechanism before and after the combination. [Embodiment] As shown in Figs. 3 to 5, the electronic component testing mechanism 2 of the present invention is mounted on the top surface of a dynamic spherical rotation testing machine 1. The hybrid spherical rotation testing machine 1 is provided with a pair of brackets on a machine U. The positioning frame 232 is disposed above the circuit board 231. The positioning frame 232 defines an opening 232a in the longitudinal direction and a probe holder 233. The bottom of the positioning frame 232 is sleeved in the opening 232a. A pair of limiting plates 232b are oppositely disposed on opposite sides of the opening 232a, and the two sides of the probe holder 233 are adjacent to the bottom surface of the pair of limiting plates 232b. The probe base 233 is provided with a pinhole 233a extending longitudinally corresponding to the position of the contact 231a of the circuit board 231. After the probe 233b is inserted and positioned, the plurality of probes 233b and the receiving recess 222 are arranged in an array and protruded from the array. The aforementioned opening 232a is in the region. At least two fixing pins 233c are protruded from the top surface of the δ海才针座 233, and the fixing pins 233c are inserted into the predetermined fixing holes 232c of the respective limiting plates 232b. In order to ensure that the probe holder 233 is firmly fixed in the opening 232a of the 疋 疋 frame 232, the bottom surface of the circuit board 231 is provided with a fixing plate 234. The fixing plate 234 has a through hole 234a. The fixing member 234b and the positioning frame 232 are sandwiched between the fixing hole 234b and the positioning hole 232d of the positioning frame 232. Probe holder 233 and circuit board 231. In particular, at least two positioning holes 232e are defined in the top surface of the limiting plate 232b, and whether the rear surface of the positioning frame 232 is in position, for example, the positioning holes 232e are respectively attached to the outer side of the positioning hole 232e. A proximity switch 235 is provided to detect in a non-contact manner that the chuck holder 22 is in place, and a signal is issued to cause the at least one pair of clamps 212 to move inwardly to clamp the clamp 223 of the chuck holder 22. As shown in Fig. 4a, the proximity switch 235 is laterally inserted into a switch holder 235a, and each switch holder 235a is attached to the outside of the positioning hole 232e, thereby completing the assembly process of the positioning test device 23. Next, the positioning test device 23 is fixed on the base 21, the circuit board connector 231b is docked with the base connector 211 to form a circuit, and each pair of clamps 212 is formed by the board hole 231c of the circuit board 231. Extend. In the operation of the present invention, the electronic component 3, such as 丨c, is placed in the receiving pocket 222 of the suction cup holder 22, which is first located at the other side, and is in the reversed position, for example, a conventional carrier 4, for example, has The robot arm corresponding to the array of the longitudinal grooves 221 is configured to move to the positions of the longitudinal grooves 221 of the chassis and the sockets 22, and the suction nozzles 41 are aligned with the M3999.87 longitudinal grooves 221 to which the nozzles 41 are attached. Each IC is adsorbed in the receiving pocket 222; then the mechanical arm reverses the chuck holder 22, so that the chuck holder 22 moves above the positioning frame 232 and descends as shown in FIG. 6a; then the sucker holder 22 borrows The two positioning pins 224 are inserted into the positioning holes 232e of the positioning frame 232, so that the pins of the ic are in contact with the probes 233b corresponding to the probe holders 233, and the elastically stretchable probes are provided. 233b holds the IC 'top to form the position and contact state as shown in Figure 6b. At this time, after the proximity switch 235 detects that the chuck holder 22 forms an accurate alignment relationship with the positioning frame 232, the proximity switch 235 sends a signal to cause the at least one pair of clamps 212 to move inward in a fan shape to clamp the suction cup. The block 22 of the seat 22 forms a pattern as shown in FIG. Finally, the first transmission device 15 of the dynamic spherical rotation testing machine 1 drives the first pivot shaft 13 to rotate positively and backwardly, so that the outer frame member 14, the second transmission device 18, the inner frame and the electronic component testing mechanism 2 are also synchronized. The reverse rotation is used to test the tilt angle of the front and rear rotations in the x-axis direction of the test (4). After the transmission-transmission device 15 is stopped, the second transmission device 18 drives the second frame 7 to rotate positively and reversely to synchronize the inner frame member 16 with the electronic component testing mechanism 2 in a positive and negative direction, thereby testing the 丨C relative to the 传动C. The tilt angle test of the left and right rotation of the second pivot shaft 17. Positioning: The implementation of the dream case's effect is that when the suction cup holder is docked with the suction cup seat frame, the at least-to-openable clamp clamps the top holding and contact to form the positioning and the contact stability. And here the docking needle 'electronic S parts will not be stable, and increase the electronic component ΜI = offset 攸 to ensure the structure of the test mechanism is simple, only need to change the board's electronic 70 test seat 2 contacts, probe holder riding and suction cups ί: can increase or decrease the number of electronic components to be tested, and the shape rotation test: σ: U has ^, the embodiment of this case is used for dynamic The ball ', Μ '% spherical rotation test machine does not need to set the lifting mechanism and the top 8 M399987 ί size 'and effectively reduce the manufacturing cost' is a similar item of this case _ shower 'is difficult # _ - type, track partial case The technical idea and the person familiar with the skill can easily infer that i: does not deviate from the scope of patent rights in this case. $ [Simple Description of the Drawings] FIG. 1 is a partial perspective view of a conventional dynamic spherical rotation testing machine. Knowing that the electronic element is not decorated with the upper phase and the upper phase accepts the electron. Figure 3 is a perspective view of the dynamic spherical rotation tester of the present case. The electronic case of the forest case is said to be a three-dimensional exploded view of the same view. ^The electronic test unit I of this case is set in the body of the dynamic spherical rotation test machine.
及圖6b為本案電子元件測試機構組合前後面 【主要元件符號說明】 M 機台11 第一樞軸13 第一傳動裝置15 第二樞軸17 基座21 夾具212 吸盤座22 容置凹穴222 定位銷224 電路板231 電路板連接器231b 通孔231 d 動態球形旋轉測試機1 支架12 外框件14 内框件16 第二傳動裝置18 電子元件測試機構2 基座連接器211 扣鉤213 縱向槽221 夾塊223 定位測試裝置23 接點231a 板孔231c 9 M399987And Fig. 6b is the front and back of the electronic component testing mechanism combination of the present invention. [Main component symbol description] M machine 11 first pivot 13 first transmission device 15 second pivot 17 base 21 clamp 212 suction cup holder 22 housing recess 222 Locating pin 224 Circuit board 231 Circuit board connector 231b Through hole 231 d Dynamic spherical rotation tester 1 Bracket 12 Frame member 14 Inner frame member 16 Second transmission device 18 Electronic component testing mechanism 2 Base connector 211 Buckle 213 Portrait Slot 221 Clamp 223 Positioning test device 23 Contact 231a Plate hole 231c 9 M399987
定位框232 限位板232b 框孔232d 探針座233 探針233b 固定板234 連接件234b 開關座235a 載具4 機台10 第一樞軸102 外框件20 第二樞軸301 電子元件測試機構40 容置凹槽402 彈性伸縮架404 開口 232a 固定孔232c 定位孔232e 針孔233a 固定銷233c 穿孔234a 近接開關235 電子元件3 吸嘴41 支架101 第一傳動裝置103 内框件30 第二傳動裝置302 基座401 探針403Positioning frame 232 Limiting plate 232b Frame hole 232d Probe holder 233 Probe 233b Fixing plate 234 Connecting piece 234b Switching seat 235a Carrier 4 Machine table 10 First pivot 102 Outer frame member 20 Second pivot 301 Electronic component testing mechanism 40 accommodating groove 402 elastic expansion frame 404 opening 232a fixing hole 232c positioning hole 232e pinhole 233a fixing pin 233c perforation 234a proximity switch 235 electronic component 3 suction nozzle 41 bracket 101 first transmission 103 inner frame member 30 second transmission 302 pedestal 401 probe 403