五、新型說明： 【新型所屬之技術領域】 [0001] 本創作涉及電性能測試裝置，尤其涉及用於測試印刷電 路的短路和斷路的測試機的組合式底座及治具。 【先前技術】 [0002] 線路板生產廠家在製作完成線路板後都要對線路板上的 線路進行斷路和短路測試。現有技術對線路板短路和斷 路的測試設備包括專用測試機、通用測試機和飛針測試 機，其中飛針測試機測試速度慢，主要適合於測試工程 樣品，而用於批量生產線路板的測試設備則主要是專用 測試機和通用測試機。 . . ： [〇〇〇3]專用測試機和通用測試機通遍測試治具對奏測線路板進 行測試。測試治具通常包括底座、以及安裝在底座上的 轉接裝置。該底座用於將轉接裝置電連接到測試機的對 應導電點上》 [0004]該轉接裝置用於將待測線路板的被測試點合理的轉接分 配電連接到底座的插座點丨〇上，該轉接裝置可以採用如 第一圖所示的結構形式，包括設有多個測試探針1的針盤 2、上網格點組件3、下網格點組件4、以及在上網格點組 件3和下網格點組件4之間設置的轉換線路板5等。針盤2 的測試探針1與待測線路板的被測試點對應，通過上網格 點組件3對應的第一導電元件6、轉接線路板的正面導電 點7、反面導電點和下網格點的對應第二導電元件8 ’底 座上的導電點9電連接，再通過底座上的插座點1〇連接到 表單编號A0101 第3頁/共31頁 M382488 測試機對應的測試點。 [0005] 另外，該轉接裝置還可以採用如第二圖所示的結構形式 ，包括轉接線路板11、設置在待測線路板12和轉接線路 板11之間的垂直導電膠13、下網格點組件14、以及位於 下網格點組件14和轉接線路板11之間的探針17轉接裝置 。該探針17轉接裝置包括導向板15、以及設在導向板15 上側的定位板1 6。探針17穿過導向板1 5和定位板1 6，兩 端分別連接轉接線路板11的背面導電點19和下網格點組 件14的第二導電元件18。第二導電元件18的.下端與底座 的導電點19導電連接，再通過底座上的插座點連接到測 試機對應的測試點。 [0006] 現有的底座通常是根據測試機的測試點數來製作的，由 於-測試機的測試點數時固定的，因此，底座的導電點的 點數必須等於或為測試機的測試點數的N倍。這大大影響 了底座的通用性，造成不必要的浪費。 [0007] 而且，當底座的導電點的點數為測試機的測試點數的N倍 時，是N個導電點共用一個插座點。導電點是在底座的水 準方向、縱向方向上排列開的，N個導電點的導電連接變 得縱橫交錯，底座内的佈線困難、複雜，從而限制了底 座的導電點數的數量，不利於探針的撒針。 【新型内容】 [0008] 本創作要解決的技術問題在於提供一種可方便拼合、適 用於不同測試點數的線路板測試機的組合式底座。 [0009] 本創作所要解決的另一技術問題在於提供一種可方便拼 表單編號A0101 第4頁/共31頁 M382488 合、適用於不同測試點數的線路板測試機的治具。 [0010] 本創作解決其技術問題所採用的技術方案在於：提供一 種用於線路板測5式機的組合式底座，包括至少一單元底 座’所述單元底座包括具有規則形狀的基板、在所述基 板一端設置的若干導電點、以及在所述基板另一端設置 的若干插座點； [0011] 所述導電點排列成至少兩導電點矩陣，所述導電點矩陣 在所述基板長度方向排列； [0012] 位於各個所述導電點矩陣相同位置的導電點同時與同一 個插座點導電連接。 [0013] 優選的，所述單元底座為兩個，並且每一所述單元底座 的基板具有一接合邊，並且兩個所述基板的形狀基於所 述接合邊對稱；或者，所述單元底座為多個，並且每一 所述單元底座的基板為矩形。 [0014] 優選的，所述插座點排列組成排線插座點組，並且上下 相鄰的兩個所述排線插座點組為一組，位於同一組的各 所述排線插座點組相同位置的兩插座點導電連接。 [0015] 優選的’所述組合式底座還包括轉接板，所述轉接板包 括第一插座點和第二插座點； 所述第一插座點與所述單元底座上的插座點相匹配；所 述第二插座點與所述線路板測試機的測試點相匹配。 優選的，所述第一插座點排列成第一排線插座點組，並 且位於水準相鄰的兩組第一排線插座點組相同位置的兩 第一插座點同時與一個第二插座點導電連接。 第5頁/共31頁 表單编號A0101 M382488 本創作還提供—削於線路板職機的治具，包括設有 多個第二導電元件的下網格點㈣ '以及絲在所述下 網格點組件下側的底座；所述底座為上述任-的組合式 底座；所述底座的導電點與所述第二導電元件對應導電 連接。 〜 [◦_優選的’所述治㈣包括設衫個職探針的針盤、設 有多個第-導電元件的上網格點組件、以及位於所述上 網格點組件和下網格點組件之間的轉換線路板； _7]所述轉換線路板的正、反兩面各設有多個正面導電點和 反面導电點，所述正面導電點的位置與所述上網格點組 件中有和測試探針接觸到的第—導電元件的點的位置一 一對應，所述正面導電點在轉換線路板内部與反面導電 點--對應電連接； [0018] 所述上網格點組件安裝在所述針盤的背φ ;所述針盤上 的各測試探針通過所述上網格點組件上對應的第一導電 元件、轉換線路板上的正面導電點及反面導電點和下網 格點組件上對應的第二導電元件與底座上的導電點一一 電接觸連接。 [0019] 優選的，所述治具還包括轉接線路板、設置在待測線路 板與所述轉接線路板之間的垂直導電膠、以及位於所述 下網格點組件與所述轉接線路板之間的探針轉接裝置； [0020] 所述待測線路板上設有定位孔；所述轉接線路板上設有 與所述定位孔相對的過孔； [0021] 所述探針轉接裝置包括導向板、以及設在所述導向板上 表單編號Α0101 第6頁/共31頁 7較位板；所述導向板上設有若干探針安裝孔，所述 ' _上可拆卸地安裝有與所述下網格點組件的第 二導電元件對應的探針；所述定位板上設有供所述探針 伸出的開孔、與所述待測線路板的定位孔對應的安裝孔 位所述安裝孔位内安裝有與所述定位孔和所述過孔配 的彈&疋位銷元件；所述導向板與所述安裝孔位對應 的探針安裝孔的所述探針被移除。 _]本創作還提供_則於線路板職機的治具，包括上述 任一的組合式底座、在所述組合式底座的基板上設置的 第垂直冷電勝、設置在所述第一垂直導電耀L上的第一 轉接線路板、以及設置在所述第_轉接線路板上的第二 垂直導電膠》 [〇〇23]優選的，所述第一垂直導電膠與所屬第一轉接線路板之 間還依次設有第二轉接線路板和第三垂直導電膠；所述 第二轉接線路板的正面和反面設有與所述基板上的導電 點對應的導電突起，並且正面和反面的所述導電突起對 應導電連接。 同現有技術相比較，本創作用於測試線路板專用測試機 的組合式地板和治具之有益效果在於：針對不同測試點 數的測試機’可以將本創作的多個單元底座進行簡單的 拼接，即可適用，避免了現有技術需要針對每一測試機 制作對應的底座的麻煩，具有使用方便、通用性好、成 本低等優點。 而且，每一單元底座的導電點矩陣在極板的長度方向排 第7頁/共31頁 表單坞衆A0101 [00251 M382488 列，避免了現有技術的η個導電點與同一插座點連接時縱 橫交錯的缺陷，具有接線簡單、能夠根據用戶需要設計 足夠多的導電點。 [0026] 另外，可以通過轉接板蔣組合式底座的中心距較密的插 座點轉接後，形成中心距較寬的插座點，以適應測試機 的測試點的中心距，從而無需改變測試機，具有良好的 通用性。 【實施方式】 [0027] 下面結合各附圖對本創作作進一步詳細說明。 [0028] 參見第三圖，是本創作用於線路板測試機的組合式底座 的一個具體實施例。線路板測試機包括若干測試點，通 常通過排線或導線與底座連接。 [0029] 該組合式底座包括兩個可拼合的單元底座；每一單元底 座包括具有規則形狀的基板101。在該基板101的一端設 置有若干導電點102，而在基板101的另一端則設有若干 插座點103。該基板101可以選用多層線路板，導電點 102之間、導電點102與插座點103之間的電連接可在多 層線路板内實現電連接。當然，可以通過在線路板的不 同層中佈置連接線，從而使得連接線之間不會互相影響 ;線路板的層數可以根據導電點102的數量進行選擇，當 導電點102的數量越多，選擇的線路板的層數越多。 [0030] 如圖所示，該兩基板101具有一接合邊，並且兩基板101 的形狀基於接合邊對稱，從而可以使得兩個基板101可以 拼接起來，或單獨使用，以適用於不同測試點數的測試 表單編號Α0101 第8頁/共31頁 [0031] 機’、有良好的通用性。當然，基板1 〇 1的形狀還可以為 矩形等，方便拼接。 為了使得扭接後的兩基板101的導電點102的均勻分佈， 母一基板101靠近接合邊的導電點1〇2的中心到接合邊的 距離為兩導電點1Q2的中心距的_半，從而，在拼接後， 接合邊兩側的導電點的中心距與其他導電點的中心距— 致，保證了導電點102的一致性。 [0032] 如圖所不該導電點1 〇2排列成多個導電點矩陣i 〇4，圖 中僅不意性的給出了兩個導電點矩陣1G4，並且導電點矩 車在基板1 0 1的長度方向排列。而插座點1 〇3排列 在導電點1G2的下方，在各個導電點矩陣1()4中位於相同 位置的V電點1〇2同時與同一個标座點1〇3導電連接圖 中僅不意性的給出了兩個位置的導電點102與對應插座點 103的連接關係，其他的對應連接即可。這樣，就可以使 得導電點1G 2的數！是測試機❹梢點數的2倍；可以理 解的’導電點_以為_，此時測試機的_個測試點 數可以同時對應_導電點，在撒針時可以選擇祕中的 其中-個導電點即可，從而方便探針的撒針，而且不會 增加底座的設計、製作難度。 [0033] 插座點103設置在基板ιοί靠近測試機的一端，插座點 103分別排列組成多個供排線插座對應安裝的排線插座點 組105。相鄰的排線插座點組丨05之間在基板101的長度 方向具有一定的距離，從而方便各排線插座並列安裝到 對應的排線插座點組105。 表單编號Α010Ι 第9頁/共31頁 [0034] [0034] [0035] [0036] [0037] 在本實施例中，排線插座點組丨05距離接合邊一定距離， 從而避免排線插座接頭的牛角的相互干涉，方便安裝。 進一步的’由於相鄰插座點1〇3之間的中心距小於測試機 的相鄰測試點之間的中心距，無法通過排線直接將插座 點103與測試點連接，因此，該組合式底座還包括轉接板 106，如第四圖所示，該轉接板1〇6包括第一插座點1〇7 和第二插座點108。第一插座點〗07與單元底座上的插座 點103相匹配，通過排線電連接；而第二插座點1〇8與線 路板測試機的測試點相匹配，通過排線電連接。並且， 第一插座點107與第二插座點1〇8_—一對應導電連接，圖 中僅示意性的畫出了兩個第一插座點1〇7與第二插座點 108之間的電連接關係。相鄰的第一插座點1〇7之間的中 心距小於相鄰的第二插座點1〇8之間的中心距，從而通過 轉接將單元底座的插座點1〇3與測試點實現電連接。可以 理解的，當相鄰插座點i 〇3之㈣㈤中心距與測試點的中心 距匹配時，也可以省略轉接·6，|直接通過排線連接 .... p 可以理解的’在單減座上、轉接板上還可以設有定位 安裝孔1G9 ’用於固定安裝單元底座和轉接板ι〇6。 如第五圖所示，是本創作的組合式底座的第二實施例， 其與上-實施例的區別在於，其基板1()1為矩形從而可 以根據測試機_試點數，❹—域多個單元底座拼 接起來，實現與_制試點數_配，㈣須根據每 一測試機單獨製作-塊底座，具有良好的通用性。 表單编號A0101 第10頁/共31頁 [0038] 為了使得拼接後的兩基板101的導電點102的均勾分佈， 兩側的導電點102的中心到基板1〇1邊緣的距離為兩導電 點102的中心距的一半，從而，在拼接後，相鄰接的兩塊 基板101的導電點的中心距與其他導電點的中心距一致’ 保證了導電點102的一致性，從而方便撒針。 [0039] 插座點103設置在基板1〇1的下端’並且排列成排線插座 點組105，方便排線插座的插接。 [0040] 為了避免拼接後的排線插座的牛角的干涉，可以將同一 基板101的兩組排線插座點組105的距離增加，並且將兩 塊基板101的排線插座點組105錯開一定高度，如第六圖 所示。 [0041] 如第七圖所示，是插座點佈皇的另一種形式，可以增加 排線插座點組105的數量，將上下相鄰的兩個排線插座點 組105分為一組，位於同一組的各排線插座點組105相同 位置的兩插座點103導電連接，圖中僅示意性的給出了兩 個導電點103之間的連接，其他可參照連接即可。在使用 時’同一組的排線插座點組105擇一使用，從而錯開兩個 基板101的排線插座的插接位置，避免干涉。 [0042] 如第八圖所示，是插座點佈置的另一種形式，通過縮小 排線插座點103之間的中心距，使得排線插座點組1〇5與 基板邊緣形成一定的距離，從而在兩塊單元底座拼接後 ’並排相鄰的兩個排線插座之間具有一定的距離，避免 了排線插座的牛角之間的干涉。 [0043] 如第九圖所示，是本創作的轉接板的另一種形式，第一 表單編號A0101 第1丨頁/共31頁 M382488 插座點107排列成第一插座點組112，第二插座點108排 列成第二插座點組113。位於水準相鄰的兩組第一排線插 座點組11 2相同位置的兩第一插座點1 0 7同時與一個第二 插座點108導電連接。這樣，可以選擇其中一個第一排線 插座點組與第二插座點組電連接，方便選擇撒針。 [0044] 在本創作用於線路板測試機的治具的第一實施例中，包 括下網格點組件、安裝在下網格點組件下側的底座、針 盤、上網格點組件、以及轉換線路板等。該底盤可以選 用上述任一實施例的組合式底盤。 [0045] 該上網格點組件設有多個第一導電元件，下網格點組件 設有多個第二導電元件。上網格點組件安裝在針盤的背 面；並且針盤設有多個測試探針，測試探針與待測線路 板的被測試點相對應，並且每一測試探針對應與上網格 點組件的一個第一導電元件相電連接。 [0046] 轉換線路板的正、反兩面各設有多個正面導電點和反面 導電點。其中，正面導電點的位置與上網·格點組件中有 與測試探針接觸的第一導電元件的點的位置——對應； 正面導電點在轉換線路板内部與反面導電點--對應電 連接。而反面導電點與下網格點的第二導電元件——對 應，第二導電元件的下端與底座上的導電點對應導電連 接。 [0047] 針盤上的各測試探針通過上網格點組件上對應的第一導 電元件、轉換線路板上的正面導電點及反面導電點和下 網格點組件上對應的第二導電元件與底座上的導電點一 表單編號A0101 第12頁/共31頁 M382488 -電接觸連接，在通過底座上的插座點與測試機的測試 點電連接，從而由測試機對待測線路板的被測試點進行 測試。 可以理解的’當待測線路板的被測試點較少或分佈較稀 疏等情況下’還可以省略上網格點組件和轉接線路板， 針盤的個測試探針直接連接到下網格點組件的第二導電 元件上，從而簡化結構。 [〇〇48]在本創作用於線路板測試機的治具的第二實施例的中， 包括底座、下網格點組件' 探針轉接裝置 '轉接線路板 以及垂直導電橡膠等。該底座可以採用上述實施例中的 任—種組合式底座β []°亥垂直導電橡膠位於轉接線路板與待測線路板之間，用 於待測線路板的被測試點與凸起測試點的導電連接。該 轉接線路板的正面和背面設有通過内部導線導電連接的 凸起測試點。 [〇〇5〇]探針轉接裝置包括導向板、以及設在導向板上側的定位 板。導向板上設有若干探針安裝孔，探針安裴孔上可拆 卸地安裝有與下網格點組件的第二導電元件對應的探針 。定位板上設有供所針伸出的開孔、以及與待測線路板 的疋位孔對應的安裝孔位。安裝孔位内安裝有與定位孔 和過孔配合的彈性定位銷元件。而且，導向板與安裝孔 位元對應的探針安裝孔的探針被移除。 [0051]待測線路板的被測試點通過導電膠與轉接線路板上側的 凸起測試點電連接，然後通過待測線路板的轉接，通過 表單編號Α0101 第13頁/共31頁 M382488 待測線路板下側的突起測試點在通過測試探針電連接到 下網格點組件的第二導電元件，第二導電元件的下端與 底座上的導電點電連接，在通過插座點電連接到測試機 的測試點，由測試機對待測線路板進行測試。 [0052] 在本創作用於線路板測試機的治具的第三實施例中，其 與上述實施例的治具的區別在於，治具分為上治具和下 治具，並分別位於待測線路板的兩側，其他的結構形式 與上述實施例的治具的結構相同，故不贅述。 [0053] 上述兩個實施例的治具，可以根據測試機的測試點數、 待測線路板的被測試點的密度等，選擇一個或多個單元 底座，大大增加了底座的通用性，節約成本。另外，上 述組合式底座可以應用于現有的各種測試機和治具中。 [0054] 進一步的，上述實施例第二導電元件可以為彈簧探針元 件，對應的底座的導電點可以為導電孔；或者，第二導 電元件也可以為導電凸起、對應的底座的導電點也可以 為導電凸起。 [0055] 如第十圖所示，是本創作用於線路板測試機的治具的第 四實施例，其中，包括上述任一實施例的組合式底座、 在組合式底座的基板上設置的第一垂直導電膠115、設置 在所述第一垂直導電膠115上的第一轉接線路板116、以 及設置在所述第一轉接線路板11 6上的第二垂直導電膠 117。待測線路板118設置在第二垂直導電膠117上側。 第一轉接線路板11 6的正面和反面設有導電突點，正面的 導電突點與待測線路板118的待測試點相對應；而反面的 表單编號A0101 第14頁/共31頁 導電突點與基板101上的導電點102對應。在本實施例中 ，基板101的導電點102突出基板的頂面，從而便於與第 一垂直導電膠115接觸，形成垂直導電。 [0056] 如第十一圖所示，是本創作用於線路板測試機的治具的 第五實施例，其與第九圖的實施例的區別在於，增加了 第二轉接線路板11 9和第三垂直導電膠118。第二轉接線 路板正面和反面均設有與基板上的導電點對應的導電突 點，並且正面和反面的導電突點對應導電連接，從而適 用於基板101的導電點102基本與基板101的頂面平齊或 務高的情況。 [0057] 以上實施例僅表達了本創作的優選實施方式，其描述較 為具體和詳細，但並不能因此而理解為對本創作專利範 圍的限制；應當指出的是，對於本領域的普通技術人員 來說，在不脫離本創作構思的前提下，還可以做出若干 變形和改進，這些都屬於本創作的保護範圍；因此，凡 跟本創作專利申請範圍範圍所做的等同變換與修飾，均 應屬於本創作專利申請範圍的涵蓋範圍。 【圖式簡單說明】 [0058] 第一圖是現有技術的一種結構形式的測試治具的剖視示 意圖； 第二圖是現有技術的另一種結構形式的測試治具的刮視 示意圖； 第三圖是本創作的組合式底座第一實施例的正面示意圖 > 第四圖是本創作的組合式底座的轉接板的正面示意圖； 表單編號A0101 窠15頁/共31頁 M382488 第五圖是本創作的組合式底座的第二實施例的正面示意 圖； 第六圖是本創作的組合式底座的插座點的另一種分佈形 式的局部示意圖； 第七圖是本創作的組合式底座的插座點的另一種分佈形 式的局部示意圖； 第八圖是本發明的組合式底座的插座點的另一種分佈形 式的局部示意圖； 第九圖是本創作的組合式底座的轉接板的另一種形式的 局部不意圖， 第十圖是本創作的用於線路板測試機的治具的第四實施 例； 第十一圖是本創作的用於線路板測試機的治具的第五實 施例》 【主要元件符號說明】 [0059] 測試探針1 針盤2 上網格點組件3 下網格點組件4 轉換線路板5 第一導電元件6 正面導電點7 第二導電元件8 導電點9 插座點1 0 表單編號A0101 第16頁/共31頁 M382488 轉接線路板11 待測線路板12 垂直導電膠13 網格點組件14 導向板1 5 定位板1 6 探針17 第二導電元件18 導電點19 基板101 導電點102 插座點103 導電點矩陣1 0 4 排線插座點組105 轉接板106 第一插座點107 第二插座點108 第一插座點組112 第二插座點組113 第一垂直導電膠115 第一轉接線路板116 第二垂直導電膠117 第三垂直導電膠118 第二轉接線路板119 表單編號A0101 第17頁/共31頁V. New description: [New technical field] [0001] The present invention relates to an electrical performance testing device, and more particularly to a combined base and jig for testing a short circuit and an open circuit of a printed circuit. [Prior Art] [0002] The circuit board manufacturer must perform the open circuit and short circuit test on the circuit board after the circuit board is completed. The prior art test equipment for circuit board short circuit and open circuit includes special test machine, universal test machine and flying probe test machine, wherein the flying probe test machine has a slow test speed, and is mainly suitable for testing engineering samples, and is used for mass production circuit board test. The equipment is mainly a dedicated test machine and a universal test machine. . . : [〇〇〇3] The dedicated tester and the universal tester pass the test fixture to test the circuit board. The test fixture typically includes a base and an adapter mounted on the base. The base is used for electrically connecting the switching device to the corresponding conductive point of the testing machine. [0004] The switching device is used for electrically connecting the reasonable distribution of the tested points of the circuit board to be tested to the socket of the base. In turn, the switching device can be in the form of a structure as shown in the first figure, comprising a dial 2 provided with a plurality of test probes 1, an upper grid point assembly 3, a lower grid point assembly 4, and an upper grid. A conversion board 5 or the like provided between the point assembly 3 and the lower grid point unit 4. The test probe 1 of the dial 2 corresponds to the tested point of the circuit board to be tested, through the first conductive element 6 corresponding to the upper grid point component 3, the front conductive point 7 of the transit circuit board, the reverse conductive point and the lower grid The conductive dots 9 on the base of the corresponding second conductive element 8' are electrically connected to each other, and then connected to the test points corresponding to the M382488 test machine of Form No. A0101, page 3/31 through the socket point 1 on the base. [0005] In addition, the switching device can also adopt the structural form as shown in the second figure, including the transit circuit board 11, the vertical conductive adhesive 13 disposed between the circuit board 12 to be tested and the transit circuit board 11, The lower grid point assembly 14, and the probe 17 adapter between the lower grid point assembly 14 and the patch panel 11. The probe 17 adapter includes a guide plate 15 and a positioning plate 16 provided on the upper side of the guide plate 15. The probe 17 passes through the guide plate 15 and the positioning plate 66, and the two ends are respectively connected to the back conductive point 19 of the transfer circuit board 11 and the second conductive element 18 of the lower grid point assembly 14. The lower end of the second conductive element 18 is electrically connected to the conductive point 19 of the base, and is connected to the test point corresponding to the test machine through a socket point on the base. [0006] The existing base is usually made according to the test points of the test machine. Since the test points of the test machine are fixed, the number of conductive points of the base must be equal to or the number of test points of the test machine. N times. This greatly affects the versatility of the base and causes unnecessary waste. [0007] Moreover, when the number of conductive points of the base is N times the number of test points of the test machine, N conductive points share a socket point. The conductive points are arranged in the horizontal direction and the longitudinal direction of the base, and the conductive connections of the N conductive points become criss-crossed, and the wiring in the base is difficult and complicated, thereby limiting the number of conductive points of the base, which is disadvantageous for exploring The needle is needled. [New Content] [0008] The technical problem to be solved by this creation is to provide a modular base that can be easily assembled and applied to circuit board testing machines with different test points. [0009] Another technical problem to be solved by the present invention is to provide a jig for a circuit board tester that can be easily used for form number A0101, page 4/31, M382488, which is suitable for different test points. [0010] The technical solution adopted by the present invention to solve the technical problem thereof is to provide a combined base for a circuit board measuring type 5 machine, comprising at least one unit base, wherein the unit base comprises a substrate having a regular shape, a plurality of conductive dots disposed at one end of the substrate, and a plurality of socket dots disposed at the other end of the substrate; [0011] the conductive dots are arranged in a matrix of at least two conductive dots, and the conductive dot matrix is arranged in a length direction of the substrate; [0012] The conductive dots located at the same position of each of the conductive dot matrices are simultaneously electrically connected to the same socket point. [0013] Preferably, the unit base is two, and the base of each of the unit bases has a joint edge, and the shapes of the two substrates are symmetrical based on the joint edges; or, the unit base is A plurality, and the substrate of each of the unit bases is rectangular. [0014] Preferably, the socket points are arranged to form a cable socket point group, and two of the two adjacent cable socket socket groups are a group, and the same group of the cable socket point groups are in the same position. The two socket points are electrically connected. [0015] Preferably, the modular base further includes an adapter plate, the adapter plate includes a first socket point and a second socket point; the first socket point matches a socket point on the unit base The second socket point matches the test point of the circuit board tester. Preferably, the first socket points are arranged in a first row of socket point groups, and two first socket points located at the same position of the two groups of first row of socket socket points adjacent to each other are simultaneously electrically conductive with a second socket point. connection. Page 5 of 31 Form No. A0101 M382488 This creation also provides a fixture for cutting off the board's job, including a lower grid point (four) with multiple second conductive elements 'and the wire on the lower net a base on the lower side of the grid assembly; the base is a combined base of any of the above; the conductive point of the base is electrically connected to the second conductive element. ~ [◦_优选的'的治(四) includes a dial of a shirting probe, an upper grid point component provided with a plurality of first-conducting elements, and an upper grid point component and a lower grid point component a conversion circuit board; _7] the front and back sides of the conversion circuit board are respectively provided with a plurality of front conductive points and reverse conductive points, the position of the front conductive points and the upper grid point component The position of the point of the first conductive member contacted by the test probe is in one-to-one correspondence, and the front conductive point is electrically connected to the opposite conductive point inside the conversion circuit board; [0018] the upper grid point component is installed in the a back φ of the dial; each test probe on the dial passes through a corresponding first conductive element on the upper grid point component, a front conductive point on the conversion circuit board, and a reverse conductive point and a lower grid point component The corresponding second conductive element is electrically connected to the conductive dots on the base. [0019] Preferably, the jig further comprises a transit circuit board, a vertical conductive adhesive disposed between the circuit board to be tested and the transit circuit board, and the lower grid point component and the turn a probe switching device between the circuit boards; [0020] the circuit board to be tested is provided with a positioning hole; and the switching circuit board is provided with a through hole opposite to the positioning hole; [0021] The probe adapting device comprises a guiding plate, and a positioning plate provided on the guiding plate with a form number Α0101, a sixth page, a total of 31 pages; the guiding plate is provided with a plurality of probe mounting holes, the _ Removably mounted with a probe corresponding to the second conductive element of the lower grid point assembly; the positioning plate is provided with an opening for the probe to protrude, and the circuit board to be tested Mounting hole corresponding to the positioning hole, the mounting hole is mounted with a spring & pin member corresponding to the positioning hole and the through hole; the guide plate is mounted with a probe corresponding to the mounting hole The probe of the well is removed. _] The creation also provides a fixture for the circuit board, including any of the above-mentioned combined bases, a vertical cold power set on the substrate of the combined base, and disposed at the first vertical a first transfer wiring board on the conductive glare L, and a second vertical conductive paste disposed on the first _transfer circuit board. [23] Preferably, the first vertical conductive adhesive and the first one A second transfer circuit board and a third vertical conductive adhesive are sequentially disposed between the transfer circuit boards; and the front and back surfaces of the second transfer circuit board are provided with conductive protrusions corresponding to the conductive points on the substrate, And the conductive protrusions on the front side and the back side correspond to the conductive connection. Compared with the prior art, the utility model has the beneficial effects of the combined floor and fixture for testing the circuit board special test machine: the test machine for different test points can simply splicing the plurality of unit bases of the creation. It can be applied, avoiding the trouble that the prior art needs to make a corresponding base for each test machine, and has the advantages of convenient use, good versatility, low cost and the like. Moreover, the matrix of conductive dots of each unit base is arranged in the length direction of the plate on the 7th page/total 31 pages of the form docking station A0101 [00251 M382488 column, which avoids the vertical and horizontal staggering of the prior art n conductive points when connected with the same socket point. The defect has simple wiring and can design enough conductive points according to user needs. [0026] In addition, the socket point of the center of the adapter plate can be transferred through the center of the socket of the adapter plate to form a socket point with a wider center distance, so as to adapt to the center distance of the test point of the test machine, thereby eliminating the need to change the test. Machine, with good versatility. [Embodiment] [0027] This creation will be further described in detail below with reference to the accompanying drawings. [0028] Referring to the third figure, a specific embodiment of the combined base for the board tester is created. The board tester includes several test points that are typically connected to the base by wires or wires. [0029] The modular base includes two unit bases that can be joined together; each unit base includes a base plate 101 having a regular shape. A plurality of conductive dots 102 are disposed at one end of the substrate 101, and a plurality of socket dots 103 are provided at the other end of the substrate 101. The substrate 101 can be a multi-layer circuit board. The electrical connection between the conductive dots 102 and between the conductive dots 102 and the socket dots 103 can be electrically connected in the multi-layer circuit board. Of course, the connecting lines can be arranged in different layers of the circuit board so that the connecting lines do not affect each other; the number of layers of the circuit board can be selected according to the number of conductive points 102, and the more the number of conductive points 102, The number of layers of the selected board is more. [0030] As shown, the two substrates 101 have a joint edge, and the shapes of the two substrates 101 are symmetrical based on the joint edges, so that the two substrates 101 can be spliced together or used separately to suit different test points. Test form number Α0101 Page 8 of 31 [0031] Machine', has good versatility. Of course, the shape of the substrate 1 〇 1 can also be a rectangle or the like to facilitate splicing. In order to uniformly distribute the conductive dots 102 of the two substrates 101 after the twisting, the distance from the center of the conductive dots 1〇2 of the mother substrate 101 to the bonding edge to the bonding edge is _half the center distance of the two conductive dots 1Q2, thereby After splicing, the center distance of the conductive dots on both sides of the joint edge and the center distance of other conductive dots ensure the uniformity of the conductive dots 102. [0032] As shown in the figure, the conductive dots 1 〇 2 are arranged in a plurality of conductive dot matrices i 〇 4, and only two conductive dot matrices 1G4 are given in an unintentional manner, and the conductive dots are placed on the substrate 1 0 1 Arranged in the length direction. The socket point 1 〇 3 is arranged below the conductive point 1G2, and the V electrical point 1 〇 2 at the same position in each conductive point matrix 1 () 4 is simultaneously unintentionally connected to the same pedestal point 1 〇 3 conductive connection diagram. The connection relationship between the conductive points 102 at two positions and the corresponding socket points 103 is given, and other corresponding connections are sufficient. In this way, the number of conductive points 1G 2 can be made! It is twice the number of points in the test machine; it can be understood that the 'conducting point _ is _, at this time, the number of test points of the test machine can correspond to the _ conductive point at the same time, and one of the secrets can be selected when the needle is sprinkled. The conductive point can be used, which facilitates the needle sprinkling, and does not increase the design and manufacture difficulty of the base. [0033] The socket point 103 is disposed at one end of the substrate ιοί near the testing machine, and the socket points 103 are respectively arranged to form a plurality of cable socket point groups 105 corresponding to the cable sockets. The adjacent cable socket point groups 丨05 have a certain distance in the length direction of the substrate 101, so that the cable sockets are conveniently mounted side by side to the corresponding cable socket point group 105. Form No. Α Ι Ι 9 9 9 9 9 9 9 9 9 9 00 00 00 00 00 00 00 00 排 排 排 排 排 排 排 排 排 排 排 排 排 排 排 排 排 排 排 排 排 排 排 排 排 排 排 排 排 排 排 排 排The joints of the horns of the joint interfere with each other for easy installation. Further, since the center distance between adjacent socket points 1〇3 is smaller than the center distance between adjacent test points of the test machine, the socket point 103 cannot be directly connected to the test point through the cable, therefore, the combined base Also included is an adapter plate 106 that includes a first socket point 1〇7 and a second socket point 108, as shown in the fourth figure. The first socket point 07 matches the socket point 103 on the unit base, and is electrically connected through the cable; and the second socket point 1〇8 matches the test point of the line board tester, and is electrically connected through the cable. Moreover, the first socket point 107 is electrically connected to the second socket point 1 〇 8 _, and only the electrical connection between the two first socket points 1 〇 7 and the second socket point 108 is schematically illustrated. relationship. The center distance between adjacent first socket points 1〇7 is smaller than the center distance between adjacent second socket points 1〇8, thereby electrically connecting the socket point 1〇3 of the unit base and the test point by switching connection. It can be understood that when the center distance between the (4) and (5) center distances of the adjacent socket points i 〇 3 is matched with the center distance of the test points, the transfer can also be omitted. 6, | directly connected through the cable.... p can understand the 'in the single On the reduction seat, the adapter plate can also be provided with a positioning mounting hole 1G9' for fixing the mounting unit base and the adapter plate ι〇6. As shown in the fifth figure, it is a second embodiment of the combined base of the present invention, which differs from the above-described embodiment in that the substrate 1() 1 is rectangular so that it can be based on the number of test machines. Multiple unit bases are spliced together to achieve the number of pilots with _ system, and (4) must be separately fabricated according to each test machine - block base, with good versatility. Form No. A0101 Page 10 of 31 [0038] In order to make the joints of the conductive dots 102 of the two substrates 101 after splicing, the distance between the center of the conductive dots 102 on both sides to the edge of the substrate 1〇1 is two conductive The center distance of the point 102 is half, so that after the splicing, the center distance of the conductive points of the adjacent two substrates 101 coincides with the center distance of the other conductive points' to ensure the consistency of the conductive points 102, thereby facilitating the needle insertion. . [0039] The socket points 103 are disposed at the lower end ' of the substrate 1〇1 and are arranged in a row of socket point groups 105 to facilitate the plugging of the cable sockets. [0040] In order to avoid the interference of the horns of the spliced cable sockets, the distance between the two sets of cable socket point groups 105 of the same substrate 101 may be increased, and the cable socket point groups 105 of the two substrates 101 may be shifted by a certain height. As shown in the sixth picture. [0041] As shown in the seventh figure, it is another form of socket outlets, which can increase the number of the row outlet point groups 105, and divide the two adjacent line outlet point groups 105 into one group. The two socket points 103 of the same position of the same row of cable socket point groups 105 are electrically connected. The connection between the two conductive points 103 is only schematically shown in the figure, and other connections can be referred to. When in use, the same set of cable outlet dot groups 105 are used one by one, thereby staggering the insertion positions of the two sockets of the substrate 101 to avoid interference. [0042] As shown in the eighth figure, it is another form of the socket point arrangement. By reducing the center distance between the line socket points 103, the cable socket point group 1〇5 forms a certain distance from the edge of the substrate, thereby After the two unit bases are spliced, there is a certain distance between the two adjacent line sockets, which avoids the interference between the horns of the cable socket. [0043] As shown in the ninth figure, another form of the adapter plate of the present invention, the first form number A0101, the first page, the 31st page, M382488, the socket points 107 are arranged into the first socket point group 112, and the second The socket points 108 are arranged in a second socket point group 113. The two first socket points 107, which are located at the same position of the two sets of first row of plug-in point groups 11 adjacent to each other, are simultaneously electrically connected to a second socket point 108. In this way, one of the first cable socket point groups can be electrically connected to the second socket point group to facilitate the selection of the needle. [0044] In the first embodiment of the jig for the circuit board testing machine, the lower grid point component, the base mounted on the lower side of the lower grid point component, the dial, the upper grid point component, and the conversion Circuit board, etc. The chassis can be selected from the combined chassis of any of the above embodiments. [0045] The upper grid point assembly is provided with a plurality of first conductive elements, and the lower grid point assembly is provided with a plurality of second conductive elements. The upper grid point component is mounted on the back of the dial; and the dial is provided with a plurality of test probes corresponding to the tested points of the circuit board to be tested, and each test probe corresponds to the upper grid point component A first conductive element is electrically connected. [0046] The front and back sides of the conversion circuit board are respectively provided with a plurality of front conductive points and reverse conductive points. Wherein, the position of the front conductive point corresponds to the position of the point of the first conductive element in the grid/grid component that is in contact with the test probe; the front conductive point is electrically connected to the reverse conductive point inside the conversion circuit board. . The opposite conductive point corresponds to the second conductive element of the lower grid point, and the lower end of the second conductive element is electrically conductively connected to the conductive point on the base. [0047] each test probe on the dial passes through a corresponding first conductive element on the upper grid point component, a front conductive point on the conversion circuit board, and a corresponding second conductive element on the reverse conductive point and the lower grid point component. Conductive point on the base A form number A0101 Page 12 of 31 M382488 - Electrical contact connection, electrically connected to the test point of the test machine through the socket point on the base, so that the test point of the test board to be tested by the test machine carry out testing. It can be understood that 'When the tested circuit board has fewer tested points or less distributed, etc.', the upper grid point component and the transit circuit board can be omitted, and the test probes of the dial are directly connected to the lower grid point. The second conductive element of the assembly, thereby simplifying the structure. [〇〇48] In the second embodiment of the jig for the board tester, the base, the lower grid point assembly 'probe adapter' transit circuit board, and the vertical conductive rubber are included. The base can be used in any of the above embodiments. The combined base β [ ] ° vertical conductive rubber is located between the transit circuit board and the circuit board to be tested, and is used for testing the tested points and bumps of the circuit board to be tested. Point of electrical connection. The front and back sides of the patch panel are provided with raised test points that are electrically connected by internal leads. [〇〇5〇] The probe adapter includes a guide plate and a positioning plate provided on the side of the guide plate. The guide plate is provided with a plurality of probe mounting holes, and the probe ampule is detachably mounted with a probe corresponding to the second conductive member of the lower grid point assembly. The positioning plate is provided with an opening for the needle to protrude, and a mounting hole corresponding to the clamping hole of the circuit board to be tested. An elastic locating pin member that fits the locating hole and the through hole is mounted in the mounting hole. Moreover, the probe of the probe mounting hole corresponding to the guide plate and the mounting hole position is removed. [0051] The tested point of the circuit board to be tested is electrically connected to the bump test point on the side of the transfer circuit board through the conductive adhesive, and then through the transfer of the circuit board to be tested, through the form number Α0101, page 13 / total 31 pages M382488 The protrusion test point on the lower side of the circuit board to be tested is electrically connected to the second conductive element of the lower grid point component through the test probe, and the lower end of the second conductive element is electrically connected to the conductive point on the base, and is electrically connected through the socket point. At the test point of the test machine, the test board is tested by the tester. [0052] In the third embodiment of the jig for the circuit board testing machine, the difference from the jig of the above embodiment is that the jig is divided into an upper jig and a lower jig, and are respectively located The two sides of the circuit board are measured, and other structural forms are the same as those of the jig of the above embodiment, and therefore will not be described again. [0053] The fixtures of the above two embodiments can select one or more unit bases according to the number of test points of the testing machine, the density of the tested points of the circuit board to be tested, etc., which greatly increases the versatility of the base and saves cost. In addition, the above-described modular base can be applied to various existing test machines and jigs. [0054] Further, the second conductive component of the above embodiment may be a spring probe component, and the conductive point of the corresponding base may be a conductive hole; or the second conductive component may also be a conductive bump and a conductive point of the corresponding base. It can also be a conductive bump. [0055] As shown in FIG. 10, is a fourth embodiment of the jig for the circuit board testing machine, wherein the combined base of any of the above embodiments is disposed on the substrate of the combined base a first vertical conductive paste 115, a first riser board 116 disposed on the first vertical conductive paste 115, and a second vertical conductive paste 117 disposed on the first riser board 116. The circuit board to be tested 118 is disposed on the upper side of the second vertical conductive paste 117. The front and back sides of the first transfer circuit board 116 are provided with conductive bumps, and the conductive bumps on the front side correspond to the points to be tested of the circuit board 118 to be tested; and the form number A0101 on the reverse side is 14 pages/total 31 pages The conductive bumps correspond to the conductive dots 102 on the substrate 101. In this embodiment, the conductive dots 102 of the substrate 101 protrude from the top surface of the substrate to facilitate contact with the first vertical conductive paste 115 to form a vertical conductive. [0056] As shown in FIG. 11, is a fifth embodiment of the jig for the circuit board testing machine, which is different from the embodiment of the ninth embodiment in that the second transit circuit board 11 is added. 9 and a third vertical conductive paste 118. The front and back sides of the second riser board are provided with conductive bumps corresponding to the conductive points on the substrate, and the conductive bumps on the front and back sides are electrically connected, so that the conductive dots 102 of the substrate 101 are substantially compatible with the substrate 101. The situation where the top surface is flush or high. [0057] The above embodiments are merely illustrative of the preferred embodiments of the present invention, and the description thereof is more specific and detailed, but is not to be construed as limiting the scope of the present invention; it should be noted that those skilled in the art It is said that certain modifications and improvements can be made without departing from the concept of this creation, which are within the scope of protection of this creation; therefore, equivalent transformations and modifications made to the scope of the scope of application for the creation of this patent should be It is covered by the scope of this patent application. BRIEF DESCRIPTION OF THE DRAWINGS [0058] The first figure is a schematic cross-sectional view of a test fixture of a structural form of the prior art; the second figure is a schematic view of a test fixture of another structural form of the prior art; The figure is a front view of the first embodiment of the modular base of the present invention. The fourth figure is a front view of the adapter plate of the combined base of the present invention; Form No. A0101 窠 15 pages / Total 31 pages M382488 The fifth figure is A front view of a second embodiment of the modular base of the present invention; a sixth view is a partial schematic view of another distribution of the socket points of the combined base of the present invention; and the seventh figure is a socket point of the combined base of the present creation A partial schematic view of another distribution form; the eighth figure is a partial schematic view of another distribution form of the socket point of the modular base of the present invention; the ninth figure is another form of the adapter plate of the combined base of the present invention. Partially not intended, the tenth figure is a fourth embodiment of the jig for the circuit board testing machine of the present invention; the eleventh figure is the treatment for the circuit board testing machine of the present invention. Fifth Embodiment [Explanation of Main Component Symbols] [0059] Test Probe 1 Yard 2 Upper Grid Point Assembly 3 Lower Grid Point Assembly 4 Conversion Circuit Board 5 First Conductive Element 6 Front Conductive Point 7 Second Conductive Element 8 Conductor point 9 Socket point 1 0 Form number A0101 Page 16 of 31 M382488 Transfer board 11 Board to be tested 12 Vertical conductive adhesive 13 Grid point assembly 14 Guide plate 1 5 Positioning plate 1 6 Probe 17 Two conductive elements 18 conductive dots 19 substrate 101 conductive dots 102 socket dots 103 conductive dot matrix 1 0 4 cable socket dot group 105 adapter plate 106 first socket point 107 second socket point 108 first socket point group 112 second socket Point set 113 First vertical conductive paste 115 First transfer wiring board 116 Second vertical conductive paste 117 Third vertical conductive paste 118 Second transfer wiring board 119 Form No. A0101 Page 17 of 31