TWM359374U - Apparatus for selecting and testing electronic components - Google Patents

Apparatus for selecting and testing electronic components Download PDF

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Publication number
TWM359374U
TWM359374U TW98201173U TW98201173U TWM359374U TW M359374 U TWM359374 U TW M359374U TW 98201173 U TW98201173 U TW 98201173U TW 98201173 U TW98201173 U TW 98201173U TW M359374 U TWM359374 U TW M359374U
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Taiwan
Prior art keywords
electronic component
turntable
component test
turntables
test sorter
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TW98201173U
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Chinese (zh)
Inventor
Fang-Xu Lin
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All Ring Tech Co Ltd
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Priority to TW98201173U priority Critical patent/TWM359374U/en
Publication of TWM359374U publication Critical patent/TWM359374U/en

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M359374 四、 指定代表圖: (一) 本案指定代表圖為:第(三)圖。 (二) 本代表圖之元件符號簡單說明: (2) 轉盤 (4) 移載裝置 (4 1 )連結通道 五、 新型說明: 【新型所屬之技術領域】 [0001] 本創作係有關於一種電子元件測試分選機,尤其是 Φ 指一種能自動將電子元件載入以進行檢測,並依檢測結 果將電子元件分類至相對應之儲料盒中之測試分選機, 特別是該測試分選機能適用在分選類別較多的工作場合 中。 【先前技術】 [0002]M359374 IV. Designated representative map: (1) The representative representative of the case is: (3). (2) A brief description of the symbol of the representative figure: (2) Turntable (4) Transfer device (4 1 ) Link channel 5. New description: [New technical field] [0001] This creation is about an electronic Component test sorter, especially Φ refers to a test sorter that can automatically load electronic components for inspection and classify electronic components into corresponding storage bins according to the test results, especially the test sorting The function is suitable for use in workplaces with a large number of sorting categories. [Prior Art] [0002]

按,電子元件裝配在相關電子電路上後,方可令該 電子電路執行所需之動作,因此電子元件的良率除關係 到製造業者的製造成本之外,對於電子電路是否能夠執 行相關之運作也具有絕對性的影響。於是電子元件在出 廠之前必須透過相關之電性檢測,以篩選出符合訂購廠 家要求之元件條件。 [0003] 目前常見的電子元件測試分選機,如我國第 89206975A01號之「圓形外觀之電子元件特性値檢測裝 置追加一」、第931 00081號之「元件測試分選機」、 第88213444號之「表面黏著元件自動檢測分類機」、第 851 05250號之「電路元件裝卸裝置」,上述各專利案 098201173 雖均具有檢測並將檢測結果加以分類之效能,但是其因 表單編號A0101 第2頁/共18頁 0982003779-0 M359374 受限於其單一轉盤的設計,且該轉盤周緣又必須設置入 料單元、檢測單元及分類單元,因此電子元件的分類類 別相當有限,即上述各專利案在必須對電子元件進行多 種的電性分類時,將無法執行與達成。 【新型内容】 [0004] 本創作之主要目的,係提供一種電子元件測試分選 機,該電子元件測試分選機係適用在分選類別較多的工 作場合中,且不會有分選時間延遲之情形發生。 [0005] 為達到上述之目的,本創作乃提供一種電子元件測 試分選機,尤其是指一種該電子元件測試分選機至少包 括二個以上能承載電子元件之轉盤,且二轉盤間以一連 結通道做為電子元件由其一轉盤輸送至其二轉盤之通道 ,而在二轉盤運送電子元件的流路上預設有供檢測電子 元件之電子特性的檢測裝置及將電子元件吹離轉盤之喷 出機構,另在藉由噴出機構以將在轉盤上之電子元件喷 出的路徑處設置儲料盒;藉此結構設計,使該電子元件 測試分選機能自動將電子元件載入,以進行檢測,並依 檢測結果將電子元件分類至相對應之儲料盒中。尤其該 轉盤的配置數量能根據電子元件檢測結果後之分類而定 ,且電子元件在載入轉盤上後,便始終處在流動的載送 流路上,直到被下載至儲料盒處,因此不會有分選時間 延遲之情形發生。 【實施方式】 [0006] 具體而言,係令電子元件測試分選機具備二個以上 之轉盤,且相鄰的轉盤間具有一個相連通以傳送電子元 098201173 表單編號A0101 第3頁/共18頁 0982003779-0 M359374 [0007] [0008]According to the electronic component mounted on the relevant electronic circuit, the electronic circuit can perform the required action, so that the yield of the electronic component can be related to the manufacturing cost of the manufacturer, and whether the electronic circuit can perform the related operation. It also has an absolute impact. Therefore, the electronic components must pass the relevant electrical test before they are shipped to screen out the component conditions that meet the requirements of the ordering manufacturer. [0003] At present, a common electronic component test sorting machine, such as "No. 1 of the electronic component characteristic detecting device of a circular appearance" of the 89206975A01, No. 931 00081 "Component test sorting machine", No. 8821344 "Surface Adhesive Element Automatic Detection and Sorting Machine", "Module Component Loading and Unloading Device" No. 851 05250, the above-mentioned patents 098201173 have the performance of detecting and classifying the detection results, but the form number A0101 page 2 / A total of 18 pages 0982003779-0 M359374 is limited to the design of its single turntable, and the turntable must have a feeding unit, a detection unit and a classification unit. Therefore, the classification of electronic components is quite limited, that is, the above patents must be When multiple electronic classifications of electronic components are performed, they cannot be implemented and achieved. [New Content] [0004] The main purpose of this creation is to provide an electronic component test sorting machine that is suitable for use in a large number of sorting workplaces without sorting time. The delay occurs. [0005] In order to achieve the above object, the present invention provides an electronic component test sorting machine, and more particularly to an electronic component test sorter comprising at least two turntables capable of carrying electronic components, and The connecting channel is used as a channel for the electronic component to be transported from one of the turntables to the two turntables, and a detecting device for detecting the electronic characteristics of the electronic component and a spray for blowing the electronic component away from the turntable are preliminarily provided on the flow path of the two turntables for transporting the electronic components. The outlet mechanism further sets a storage box at a path for ejecting the electronic components on the turntable by the ejection mechanism; thereby, the electronic component test sorting machine can automatically load the electronic components for detection. And classify the electronic components into corresponding storage bins according to the detection results. In particular, the number of configurations of the turntable can be determined according to the classification of the electronic component detection result, and after the electronic component is loaded on the turntable, it is always on the flowing carrier flow path until it is downloaded to the storage box, so There will be a delay in the sorting time. [Embodiment] [0006] Specifically, the electronic component test sorter has two or more turntables, and adjacent turntables have one phase to communicate with each other to transmit an electronic element 098201173 Form No. A0101 Page 3 of 18 Page 0982003779-0 M359374 [0007] [0008]

[0009] 098201173 件的通道’明此設計延長載送t子元件之流路,使該 電子元件測試分選機適用於較多分類之工作場合,同時 不致有載送時間受到延遲之情形。 以下參照圖式說明本創作之實施例,使本創作之技 術手段、創作目的及功效有更完整及清楚的揭露,同時 並請一併參閱對應之元件符號。 其中,第一圖係本創作之電子元件測試分選機之立 體外觀圖;第二圖係本創作之電子元件測試分選機於將 護蓋自轉盤上取下之立體外觀圖;第三圖係本創作之電 子元件測試分選機於將護蓋自轉盤上取下之俯視示意圖 ;第四圖係本創作之電子元件測試分選機於將護蓋自轉 盤上取下之局部放大俯視示意圖;第五圖係本創作之電 子元件測試分選機相鄰之二轉盤間的構造示意圖;第六 圖係本創作之電子元件測試分選機的分選架構示意圖; 第七圖係本創作之電子元件測試分選機之轉盤採串連方 式銜接示意圖;第八圖係本創作之電子元件測試分選機 之轉盤採環狀方式銜接示意圖。 該電子元件測試分選機至少包括二個以上能承載電 子元件(1 )之轉盤(2)、在二轉盤(2)運送電子 元件(1 )的流路上所預設之檢測裝置(3)、能將電 子元件(1)由一轉盤(2)移載至另一轉盤(2)的 移載裝置(4)、能將電子元件(1)吹離轉盤(2) 之喷出機構(5)、以及承接被噴出以脫離轉盤(2) 槽孔(21)之電子元件(1)的儲料盒(6);其中 表單編號A0101 第4頁/共18頁 M359374 [0010] [0011] [0012] [0013] 098201173 °亥轉盤(2) ’係以間歇性轉動的方式承載並運送 A子兀件(1 )至檢測位置或喷出位置或移載位置,該 轉盤(2)在其周緣處以等角間距設置數多槽孔(2工 )且該轉盤轉動的角度即為相鄰之槽孔間的距離,每 一槽孔(21)均向内連接—槽道(22),以透過該 槽道(2 2)與噴出機構(5)之空氣輸出端銜接; 該檢測裝置(3)’係設置在相對轉盤(2)運送 電子元件(1)的流路上; 移載裝置(4)、係設在兩兩相鄰的轉盤(2) 之間,該移載裝置(4)包括一連結通道(41)以及 —移載動力單元(42),該連結通道(41)係用以 連結二轉盤(2)之槽孔(21),使位在其—轉盤( 2)之槽孔(2 1)中的電子轉(1)由該連結通道 (41)進入另一轉盤(2)的槽孔(2 1)巾;該移 載動力單凡(4 2)可為一味出單元或為吸引單元,當 Γ移載動力單元(42) ‘吹出單元時,該移載動力 早兀(4 2)係設置在移載位置的始端,即指相對於其 :轉盤(2)之槽孔(21)處’當該移载動力單元( 2)為-吸引單元時,該移載動力單元(42)係設 在移載位置的終端,即指相對於另—轉 孔(2 1 )處; 該嘴出機構(5),係設置在相對轉盤(2)運送 =兀件⑴麟路上,係錢子元件⑴經檢測 、(3)檢測完畢後依其檢測結果透過該喷出機構( 5=盤(2)中之電子元件(1)噴出並使之落入[0009] The channel of the 098201173 device is designed to extend the flow path of the t sub-element, so that the electronic component test sorter can be applied to more classified work situations without delaying the carrier time. The embodiments of the present invention are described below with reference to the drawings, so that the technical means, the purpose of creation and the functions of the present invention are more completely and clearly disclosed, and the corresponding component symbols are also referred to. The first picture is a three-dimensional appearance of the electronic component test sorting machine of the present creation; the second figure is a three-dimensional appearance view of the electronic component test sorting machine of the present invention for removing the cover from the turntable; The electronic component test sorting machine of the present invention is a top view of the cover removed from the turntable; the fourth figure is a partial enlarged top view of the electronic component test sorting machine of the present invention for removing the cover from the turntable. The fifth picture is a schematic diagram of the structure of the adjacent two turntables of the electronic component test sorting machine of the present creation; the sixth figure is a schematic diagram of the sorting structure of the electronic component test sorting machine of the present creation; The electronic component test sorting machine's turntable adopts a series connection diagram; the eighth figure is a schematic diagram of the turntable of the electronic component test sorting machine of the present invention. The electronic component test sorter includes at least two turntables (2) capable of carrying electronic components (1), and a detecting device (3) preset on a flow path of the two turntables (2) for transporting the electronic components (1), A transfer device (4) capable of transferring an electronic component (1) from a turntable (2) to another turntable (2), and a discharge mechanism (5) capable of blowing the electronic component (1) away from the turntable (2) And a storage box (6) that receives the electronic component (1) that is ejected to detach from the slot (21) of the turntable (2); wherein the form number A0101 is 4/18 M359374 [0010] [0011] [0012 [0013] 098201173 °Hai turntable (2) ' carries and transports the A sub-assembly (1) to the detection position or the ejection position or the transfer position in an intermittent rotation manner, the turntable (2) is at its periphery The equiangular spacing is provided with a plurality of slots (2 work) and the angle at which the turntable rotates is the distance between adjacent slots, and each slot (21) is connected inwardly - the channel (22) to transmit The channel (22) is coupled to the air output end of the ejection mechanism (5); the detecting device (3)' is disposed on the flow path of the electronic component (1) relative to the turntable (2) The transfer device (4) is disposed between two adjacent rotating disks (2), and the transfer device (4) includes a connecting passage (41) and a transfer power unit (42), the connecting passage ( 41) is used to connect the slot (21) of the two turntable (2) so that the electron turn (1) located in the slot (2 1) of the turntable (2) enters the other by the connecting passage (41) a slot (2 1) of a turntable (2); the transfer power unit (4 2) may be a single unit or a suction unit, and when the load power unit (42) is blown out of the unit, the shift The premature power (4 2) is set at the beginning of the transfer position, that is, relative to the slot (21) of the turntable (2). When the transfer power unit (2) is a suction unit, The transfer power unit (42) is disposed at the terminal of the transfer position, that is, with respect to the other-turn hole (2 1 ); the mouth-out mechanism (5) is disposed at the opposite turntable (2) for transport = 兀On the (1) Lin Road, the money component (1) is tested, and (3) after the test is completed, according to the test result, the electronic component (1) in the disk (2) is ejected and dropped through the ejection mechanism (5).

單編號 ^1^181 〇9820〇377M M359374 至相對應的儲料盒(6)中; 係供―構⑴所噴 [0015] [0016] _據此’被載人轉盤(2)之槽孔(21)中的電子 兀件(1)隨著轉盤(2)的轉動來到相對檢測裝置( 3)之位置時’該檢測裝置(3)便會對容置在該槽孔 2 1 )中之電子元件(i )進行電性檢測,於檢測完 畢後,再依檢測結果且透過轉盤(2)旋轉以將電子元 件(1)承載至噴出位置或移載位置。當該電子元件( 1 )係被承载至噴出位置時,係藉由該噴出機構(5) 將該電子元件(1 )噴出# 7丨彳9 _!、 ^贺出槽孔(2 1 ) ’並落入對應該 噴出位置之儲料盒(6)巾。當該電子元件(1 )係被 承載至移齡置時’係藉由歸縣置(4)之移載動 力單元(4 2)提供該電子元件(1)移動位置之動力 ’使該電子元件(1 )由其—雜(2 )之槽孔(2工 )經該連結通道(41)進入另一轉盤(2)的槽孔( 2 1 )中。 本創作進-步在對應該喷出機構(5)之噴出位置 處設置-導引斜面(7),以令被噴出之電子元件(1 )在該導?丨斜面(7)的導引下,_進人簡盒(6 )中。 [0017] 本創作再進一步於相對轉盤(2 )運載電子元件( 1)的流路上設置蓋板(8),以防止電子元件(工) 在被運載的過程中脫離轉盤(2)之槽孔(21) 098201173 表單編號A0101 第6頁/共18頁 0982003779-0 M359374 [0018] 又,本創作之結構設計特別適合在該電子元件(1 )的分類數較多的情形下,例如L E D之檢測分類,目 前L E D檢測分類能分類到二百多類,故藉由本創作之 檢測分選機能將運載電子元件(1)之流路在情況所需 下無限延長,而其延長運載流路的模式可如第七圖所示 之串接方式,或如第八圖所示之環狀方式銜接,而採用 本創作之運載方式可確實避免載送電子元件(1)之時 間受到延遲之情形發生。 • [0019] 综上所述,本創作實施例確能達到所預期之使用功 效,又其所揭露之具體構造,不僅未曾見諸於同類產品 中,亦未曾公開於申請前,誠已完全符合專利法之規定 與要求,爰依法提出新型專利之申請,懇請惠予審查, 並賜准專利,則實感德便。 [0020] 【圖式簡單說明】 第一圖:本創作之電子元件測試分選機之立體外觀圖 [0021] • 第二圖:本創作之電子元件測試分選機於將護蓋自轉盤 上取下之立體外觀圖 [0022] 第三圖:本創作之電子元件測試分選機於將護蓋自轉盤 上取下之俯視示意圖 [0023] 第四圖:本創作之電子元件測試分選機於將護蓋自轉盤 上取下之局部放大俯視圖 [0024] 第五圖:本創作之電子元件測試分選機相鄰之二轉盤間 的構造不意圖 098201173 表單編號A0101 第7頁/共18頁 0982003779-0 M359374 [0025] 第六圖:本創作之電子元件測試分選機的分選架構示意 圖 [0026] 第七圖:本創作之電子元件測試分選機之轉盤採串連方 式銜接不意圖 [0027] 第八圖 :本創作之電子元件測試分選機之轉盤採環狀方 式銜接示意圖 【主要元件符號說明】 [0028] (1 ) 電子元件 (2 ) 轉盤 [0029] (3 ) 檢測裝置 (4) 移載裝置 [0030] (5 ) 噴出機構 (6) 儲料盒 [0031] (2 1 )槽孔 (2 2)槽道 [0032] (4 1 )連結通道 (4 2)移載動力單元 [0033] (7 ) 導引斜面 (8 ) 蓋板 參 098201173 表單編號 A0101 第 8 頁/共 18 頁 0982003779-0Single number ^1^181 〇9820〇377M M359374 to the corresponding storage box (6); is supplied by the structure (1) [0015] [0016] _ according to the slot of the manned carousel (2) The electronic component (1) in (21) is placed in the position of the relative detecting device (3) as the turntable (2) rotates. 'The detecting device (3) will be accommodated in the slot 2 1 ) The electronic component (i) is electrically detected, and after the detection is completed, the electronic component (1) is carried to the ejection position or the transfer position according to the detection result and rotated through the turntable (2). When the electronic component (1) is carried to the ejection position, the electronic component (1) is ejected by the ejection mechanism (5). #7丨彳9_!, ^贺出槽孔(2 1 ) ' And fall into the storage box (6) towel corresponding to the discharge position. When the electronic component (1) is carried to the time of aging, the electronic component (1) is powered by the transfer power unit (42) of the county (4) to make the electronic component (1) The slot (2) of the - (2) slot enters the slot (2 1 ) of the other turntable (2) via the connecting passage (41). The creation step-by-step is provided with a guiding bevel (7) at the ejection position corresponding to the ejection mechanism (5) so that the electronic component (1) to be ejected is guided. Under the guidance of the bevel (7), _ enters the box (6). [0017] The present invention further provides a cover plate (8) on the flow path of the carrying electronic component (1) relative to the turntable (2) to prevent the electronic component (work) from being detached from the slot of the turntable (2) during being carried. (21) 098201173 Form No. A0101 Page 6 of 18 0982003779-0 M359374 [0018] Furthermore, the structural design of the creation is particularly suitable in the case where the number of classifications of the electronic component (1) is large, such as detection of LEDs. Classification, the current LED detection classification can be classified into more than 200 categories. Therefore, the detection and sorting function of the present invention can extend the flow path of the carrying electronic component (1) indefinitely under the circumstances, and the mode of extending the carrying flow path can be extended. As shown in the seventh figure, the tandem mode, or the loop mode as shown in the eighth figure, can be used to ensure that the time for carrying the electronic component (1) is delayed. [0019] In summary, the present embodiment can achieve the expected use efficiency, and the specific structure disclosed therein has not been seen in the same product, nor has it been disclosed before the application. The provisions and requirements of the Patent Law, the application for a new type of patent in accordance with the law, and the application for review, and the grant of a patent, are truly sensible. [0020] [Simple description of the figure] The first picture: the stereoscopic appearance of the electronic component test sorting machine of this creation [0021] • The second picture: The electronic component test sorting machine of this creation is to cover the cover from the turntable The three-dimensional appearance of the removal [0022] The third picture: the schematic diagram of the electronic component test sorting machine of the present invention for removing the cover from the turntable [0023] The fourth picture: the electronic component test sorting machine of the present creation Partial enlarged top view of the cover removed from the turntable [0024] Fifth picture: The structure of the adjacent two turntables of the electronic component test sorter of the present invention is not intended to be 098201173 Form No. A0101 Page 7 of 18 0982003779-0 M359374 [0025] Figure 6: Schematic diagram of the sorting structure of the electronic component test sorter of this creation [0026] Figure 7: The turntable of the electronic component test sorter of this creation is not intended to be connected in series [0027] The eighth picture: the schematic diagram of the turntable of the electronic component test sorting machine of the present invention [main component symbol description] [0028] (1) electronic component (2) turntable [0029] (3) detecting device (4) Transfer Device [0030] (5) Discharge mechanism (6) Storage bin [0031] (2 1 ) Slot (2 2) channel [0032] (4 1 ) Connection channel (42) Transfer power unit [0033] (7) Guide bevel (8) Cover plate 098201173 Form number A0101 Page 8 of 18 0982003779-0

Claims (1)

M359374 、申請專利範圍: 1. 一種電子元件測試分選機,至少包括二個以上能承載電 子元件之轉盤,且二轉盤間以一連結通道做為電子元件由其 一轉盤輸送至其二轉盤之移載裝置,而在二轉盤運送電子元 件的流路上預設有供檢測電子元件之電子特性的檢測裝置及 將電子元件吹離轉盤之喷出機構,另在藉由喷出機構以將在 轉盤上之電子元件喷出的路徑處設置儲料盒。 2. 如申請專利範圍第1項所述電子元件測試分選機,其中該 轉盤係以間歇性轉動的方式承載並運送電子元件至檢測位置 或喷出位置或移載位置。 3. 如申請專利範圍第2項所述電子元件測試分選機,其中該 轉盤在其周緣處以等角間距設置數多槽孔,且該轉盤轉動的 角度即為相鄰之槽孔間的距離。 4. 如申請專利範圍第1項所述電子元件測試分選機,其中該 轉盤上的每一槽孔連接一槽道,以透過該槽道與喷出機構之 空氣輸出端銜接。 5. 如申請專利範圍第1項所述電子元件測試分選機,其中該 移載裝置包括一連結通道以及一移載動力單元,該連結通道 係用以連結二轉盤之槽孔,該移載動力單元則為提供電子元 件由其一轉盤之槽孔經該連結通道進入另一轉盤之槽孔中的 動力來源。 6. 如申請專利範圍第5項所述電子元件測試分選機,其中該 移載動力單元為一吹出單元,係設置在移載位置的始端。 7. 如申請專利範圍第5項所述電子元件測試分選機,其中該 移載動力單元為一吸引單元,係設置在移載位置的終端。 098201173 表單編號A0101 第9頁/共18頁 0982003779-0 M359374 8. 如申請專利範圍第1項所述電子元件測試分選機,其中在 對應該喷出裝置之喷出位置處設置一導引斜面。 9. 如申請專利範圍第1項所述電子元件測試分選機,其中於 相對轉盤運載電子元件的流路上設置蓋板。 10. 如申請專利範圍第1項所述電子元件測試分選機,其中 在轉盤數量為3個以上時,該轉盤採串接方式以延長運載流 路。 ' 11.如申請專利範圍第1項所述電子元件測試分選機,其中 在轉盤數量為3個以上時,該轉盤採環狀方式銜接以延長運 ® 載流路。M359374, the scope of application for patents: 1. An electronic component test sorter, comprising at least two turntables capable of carrying electronic components, and the two turntables are connected by a connecting passage as an electronic component from one turntable to the second turntable. a transfer device, and a detection device for detecting the electronic characteristics of the electronic component and a discharge mechanism for blowing the electronic component away from the turntable are provided on the flow path of the electronic component to be transported by the two turntables, and the discharge mechanism is to be placed on the turntable by the discharge mechanism A storage bin is disposed at a path where the upper electronic component is ejected. 2. The electronic component test sorter of claim 1, wherein the turntable carries and transports the electronic component to the detection position or the ejection position or the transfer position in an intermittent rotation manner. 3. The electronic component test sorter according to claim 2, wherein the turntable is provided with a plurality of slots at equal intervals at the periphery thereof, and the angle of rotation of the turntable is the distance between adjacent slots . 4. The electronic component test sorter of claim 1, wherein each slot in the turntable is coupled to a channel for engaging the air output of the discharge mechanism through the channel. 5. The electronic component test sorter according to claim 1, wherein the transfer device comprises a connecting passage and a transfer power unit, the connecting passage is for connecting the slots of the two turntables, the transfer The power unit is a source of power for providing electronic components from the slot of one of the turntables through the connecting passage into the slot of the other turntable. 6. The electronic component test sorter of claim 5, wherein the transfer power unit is a blow-out unit disposed at a beginning of the transfer position. 7. The electronic component test sorter according to claim 5, wherein the transfer power unit is a suction unit and is disposed at a terminal at the transfer position. 098201173 Form No. A0101 Page 9 of 18 0982003779-0 M359374 8. The electronic component test sorter according to claim 1, wherein a guiding slope is provided at a discharge position corresponding to the ejection device . 9. The electronic component test sorter of claim 1, wherein the cover is disposed on a flow path relative to the turntable carrying electronic component. 10. The electronic component test sorter according to claim 1, wherein when the number of the turntables is three or more, the turntable adopts a serial connection manner to extend the carrying flow path. 11. The electronic component test sorter according to item 1 of the patent application scope, wherein when the number of the turntables is three or more, the turntable is connected in an annular manner to extend the transport path. 098201173 表單編號A0101 第10頁/共18頁 0982003779-0098201173 Form No. A0101 Page 10 of 18 0982003779-0
TW98201173U 2009-01-21 2009-01-21 Apparatus for selecting and testing electronic components TWM359374U (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI464428B (en) * 2012-11-13 2014-12-11 All Ring Tech Co Ltd Electronic component sorting method and device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI464428B (en) * 2012-11-13 2014-12-11 All Ring Tech Co Ltd Electronic component sorting method and device

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