M349550 八、新型說明： 【新型所屬之技術領域】 本創作是關於一種夾持裝置，特別是關於透過具有導電接觸端 部對待檢測物進行檢測之夾持裝置。 【先前技術】 利用軟性印刷電路板（耵⑶出匕卩他行呢Circuit Board，FPCB)上排 歹J»又置複數發光一極體（Light EmittingDi〇de，LED)晶粒而成的 光棒（Light-Bar)做為顯示器背光板的光源，以取代傳統的冷陰極 燈管（CCFL) ’已普遍為業界、使用者認同。再者，由於顯示器製 作曰趨輕薄’所以顯示器内部的電子零組件必須跟著微型化，原本 光棒上所佈-X的發光二極體就多達數十顆，在軟性印刷電路板的提 供相對應電几號的線路佈局已經被揭限在有限的空間之中，如今跟 著微型化的趨勢，線路就更顯精密。 為了確保光棒的品質，業者會要求藉由外部光學裝置量測光棒 的特性及優劣，測試項目可能包括：亮度、色度、光㈣㈣等， 错此淘汰不良品來提升出貨產品良率。由於每條光棒的發光二極體 會劃刀為組或讀_路並祕路提供電訊號，這種設計將會依 象不同A司或是使用者的需求有些許差異，不過相同的特徵是：上 述迴路的導電線路將整合在軟性電路板的一個區域位置上。所以， Μ業者必須從此區域位置提供電訊號，使光棒上的發光二極體點 亮，以進行後續的測試項目。 在實務上’前段提到軟性電路板上的線路隨著微型化更為精 M349550 密’故測试人員對各個避路分別供應電訊號時將遭遇線路微型化的 挑戰目絀，測试方式係透過檢測機具將探針（pr〇be)對準軟性 電路板線路的位置上，以便透過探針觸壓線路而提供電訊號，此實 施方式之缺失在於：1·更換待測物進行測試時，每一次均必須精 準定位，效率不彰。2·接觸失敗機率高9 3.探針必須維持相同的 接觸平面，故極易發生接觸不良情況。4.無法全面提升測試速度。 因此，若能提供一種無需擔心接觸定位精準的問題，並透過面 型的接觸面提供電訊號的裝置，將可迅速對每一條待測光棒測試， 並有助於提升全面性的測試速度。 【新型内容】 本創作之目的在於提出一種具有面型導電接觸端部的夾持裝 置，透過與該面型導電接觸端部接觸，解诀待測物微型化接觸不易 精準的問題。 本創作之次一目的在於可以提升測試速度、測試效率的測試夾 持裝置及使用該夾持裝置之檢測設備。 本創作具有導電接觸端部之夾持裝置，可獨立使用或是設置於 檢測機台，應用為手動、半自動或自動化之動作設計。該夾持裝置 係設置在一基板上，主要由：基座以及按壓件所組成，該基板上具 有一組導電區，該基座内設置有一面型導電接觸端部，基座上的面 5L導電接觸端部係對應設置於該導電區之上，該夾持裝置對待測物 進行測試時，透過按壓件將待測物之電極夾持在基座的面型導電接 觸端部，該面型導電接觸端部能夠輕易對待測物上複數組電氣迴路 6 M349550 進灯對應導接，並且由基板上的導電區提供各迴路測試所需之電信 號。故1面料電接綱料將料由探針騎轉觸的方式改 進為面接觸。 /下將配合圖式說明本創作的較佳實施例，下述所列舉的實施 例係用β闡明本創作，並非用以限 r 〜令劓作之章&圍，任何熟習此技M349550 VIII. New description: [New technical field] The present invention relates to a clamping device, in particular to a clamping device for detecting a substance to be detected through a conductive contact end. [Prior Art] Using a flexible printed circuit board (耵(3), Circuit Board, FPCB), a light bar made of a plurality of light-emitting diodes (LEDs) (Light-Bar) as the light source of the display backlight board to replace the traditional cold cathode lamp (CCFL) 'has been widely recognized by the industry and users. Moreover, since the display is made light and thin, the electronic components inside the display must be miniaturized, and the light-emitting diodes on the original light bar are as many as several dozen, which are provided in the flexible printed circuit board. The layout of the line corresponding to the number of electric has been exposed to a limited space, and now with the trend of miniaturization, the line is more sophisticated. In order to ensure the quality of the light bar, the manufacturer will require the external optical device to measure the characteristics and advantages and disadvantages of the light bar. The test items may include: brightness, chromaticity, light (4) (4), etc., in order to eliminate the defective products to improve the yield of the shipped products. . Since the light-emitting diode of each light bar will provide a signal for the group or the read and the road, the design will vary slightly depending on the needs of different A divisions or users, but the same feature is : The conductive traces of the above circuit will be integrated in one area of the flexible circuit board. Therefore, the operator must provide a signal from the location to brighten the LEDs on the light bar for subsequent testing. In practice, the previous section mentioned that the circuit on the flexible circuit board is more refined with the miniaturization M349550. Therefore, the tester will encounter the challenge of miniaturization of the circuit when supplying the electrical signals to each of the avoidance paths. The test method is Aligning the probe (pr〇be) with the inspection tool to position the flexible circuit board to provide electrical signals through the probe touch voltage line. The lack of this embodiment is: 1. When replacing the test object for testing, Each time must be accurately positioned, the efficiency is not good. 2. The probability of contact failure is high. 9. 3. The probe must maintain the same contact plane, so it is extremely prone to contact failure. 4. Can not fully improve the test speed. Therefore, if a device that does not need to worry about the accuracy of contact positioning and provides electrical signals through the contact surface of the surface type can be provided, it can quickly test each of the light bars to be tested and help to improve the overall test speed. [New content] The purpose of this creation is to propose a clamping device having a surface-type conductive contact end, which is in contact with the surface-shaped conductive contact end, thereby solving the problem that the object to be touched is less sensitive to precise contact. The second purpose of this creation is a test holding device that can improve test speed and test efficiency, and a detecting device using the same. The creation has a clamping device for the conductive contact end, which can be used independently or on the inspection machine, and the application is designed for manual, semi-automatic or automated operation. The clamping device is disposed on a substrate, and is mainly composed of a base and a pressing member. The substrate has a set of conductive regions, and the base is provided with a one-side conductive contact end, and the surface on the base is 5L. The conductive contact end portion is correspondingly disposed on the conductive region. When the clamping device tests the object to be tested, the electrode of the object to be tested is clamped on the surface type conductive contact end of the base through the pressing member. The conductive contact end can easily refer to the corresponding array of electrical circuit 6 M349550 into the corresponding reference of the lamp, and the electrical signal required for each loop test is provided by the conductive area on the substrate. Therefore, the fabric of the fabric is changed to face contact by the way the probe rides and touches. The preferred embodiment of the present invention will be described with reference to the drawings. The following examples illustrate the use of β to clarify the creation, and are not intended to limit the use of this chapter.
\ ’當可做些許更動與麟，因此本創作之保護範圍當視後附之 申請專利範圍所界定者為準。 【實施方式】 、請參閱第-圖及第二圖所示，所示為本創作第一較佳實施例， 並乂光棒（Light Bar)作為待測物。該失持裝置1〇係設置在— 個基板20上，主要由：基座12以及與該基座12搭配的按壓件μ 所組成。該基板20上規劃有-組導電區22，透過該導電區22可提 供待測光棒30有關測試的電信號，譬如：以該電信號使待測光棒 30發光，實務上需將該電訊號穩定的提供給待測光棒3〇。再者， 基座12 在基板2〇上，於基座12内设置有一面型導電接觸端部 40 ’該面型導電接觸端部4〇係對應設置覆蓋於該導電區22上方， 其下端面與基板20的導電區22相貼將形成導通狀態，上端面則露 出於基座12上的開口部120，而該開口部120於測試時作為待測光 棒30之電極32置放位置，並衧以使待測光棒30的電極32與面型 導電接觸端部40的上端面相貼導通。基座12兩側壁分設有孔位 122、124，將提供按壓件14雨側延伸出的樞軸142、144結合，該 按壓件14以樞軸142、144為分界’ 一邊是對待測光棒的壓持部 7 M349550 146、另—邊是使壓持部146開啟的按壓部148，在基座心按壓 部Η之間將設置-彈性元件.元件5q之彈性將在經過拖轴 142、⑷後變成壓持部146物則光棒3〇的爽持力道。 透過上述結構組合，透過該面型導電接觸端部4〇將可擴大盘 待測光棒3G之電極32接觸範圍，該夾«置H)對待測光棒30進 行測試時’透過按壓件14將待測光棒3Q之電極U夾持在基座Η 的面型導電接觸端部40之上端面，該面型導電接觸端部仙能夠輕 易對待測光棒30上複數組錢迴路進行對應導接，並且由基板2〇 ^的導電區22提供待測光棒3G各迴路測試所需之電信號，從而讓 待測光棒30發光進行後續的檢測項目。 由上述說明可知，該面型導電接觸端部4〇將可有效改善以往 使用探針作為接觸的缺失，亦可透賴面解電接觸端部本身 :構特色，譬如可應用：日本信越（Shin_Etsu)所生產的金屬接 军意接端（Metalcontactconnectors)，達成令待測光棒3〇上迴路同時 點凴，或是分迴路、分顆間隔點亮進行後續測試。 以、請參閱第三圖及第四圖所示，為本創作第二較佳實施例，同樣 以光棒（Light Bar)作為待測物據以說明。該夾持裴置主要由： 基座π以及與該基座γ搭配的按壓件14>組成，並藉由固定部 70以鎖固元件60將按壓件if固設在基座12'上。於基座12.内設 置有二面型導電接觸端部400、420,與第一較佳實施例不同在於： 面型導電接觸端部400、420 $金屬導體、並間隔分設於基座 12 — ，由鎖固元件60固定在基座12'上。該二面型導電接觸端部 M349550 400、420之一端與供應電 。號之邻位電性相接形成導通狀態，另一 端則跨設在基座12'，測隸、 、、可以使待測光棒的電極與面型導電接 觸端部跨設在基座之該端相貼導通。《㈣142'M4 ,為分界棒的_ 146,、另—邊是使_⑽ 開啟的誠部|，在基座^與觀部他之間設置一彈性元 件5(Γ，將彈性元件5(Γ 性將經過_此、Μ變缝持部 146對待測光棒的夾持力 雖祕壓件14的結構與第-實施例 有些衫異，卻衫響鱗裝置ΗΓ整體功能。 本實施例同樣可透過 測光棒之電極接觸範圍， 以單一迴路設計。 二面型導電接觸端部_、420擴大與待 但此實施方式特別適合待測光棒的· 縱上所述，本創作的確能夠能提供一種檢測待測物時益、、 接觸定位鮮的_，錢糾㈣賴面可迅料每 測試，並有助於提升全面㈣職速度。 【圖式簡單說明】 第一圖為本創作第一較佳實施例之組合圖； 第二圖為本創作第一較佳實施例之分解圖； 第二圖為本創作第二較佳實施例之分解圖；以及 第四圖為本創作第二較佳實施例之分解圖。 【主要元件符號說明】 1〇、10'夾持裝置 12、12'基座 120 開口部 122 > 124 孔位 M349550 14、14' 按壓件 144、14〆樞軸 148、14^按壓部 22 導電區 32 電極 400、420面型導電接觸端部 142、142< 樞軸 146、146'壓持部 20 基板 30 待測光棒 40 面型導電接觸端部 50、5(Τ 彈性元件 4 60 鎖固元件 70 固定部\ ‘When you can make some changes and lining, the scope of protection of this creation is subject to the definition of the patent application scope attached. [Embodiment] Referring to the first and second figures, the first preferred embodiment of the present invention is shown, and a Light Bar is used as the object to be tested. The drop device 1 is disposed on one of the substrates 20 and is mainly composed of a base 12 and a pressing member μ associated with the base 12. The substrate 20 is provided with a set of conductive regions 22, through which the electrical signals of the light bar 30 to be tested are provided, for example, the light to be measured is illuminated by the electrical signal, and the electrical signal needs to be stabilized in practice. Provided to the light bar to be measured 3 〇. Furthermore, the susceptor 12 is disposed on the substrate 2, and a one-sided conductive contact end portion 40 is disposed in the susceptor 12. The surface-type conductive contact end portion 4 is disposed correspondingly over the conductive region 22, and the lower end surface thereof A conductive state is formed in contact with the conductive region 22 of the substrate 20, and the upper end surface is exposed to the opening portion 120 of the susceptor 12, and the opening portion 120 is placed as the electrode 32 of the optical rod 30 to be tested at the time of testing, and The electrode 32 of the light rod 30 to be measured is brought into contact with the upper end surface of the surface-type conductive contact end portion 40. The two side walls of the base 12 are provided with hole positions 122 and 124, and the pivots 142 and 144 extending from the rain side of the pressing member 14 are combined. The pressing member 14 is defined by the pivots 142 and 144. The pressing portion 7 M349550 146 and the other side are pressing portions 148 for opening the pressing portion 146, and the elastic member will be disposed between the base pressing portions .. The elasticity of the member 5q will pass through the trailing shafts 142, (4). When the pressing portion 146 is turned on, the light holding force of the light bar 3〇 is maintained. Through the above-mentioned structural combination, the contact surface of the electrode 32 to be metered by the light-receiving rod 3G can be enlarged by the surface-type conductive contact end portion 4, which is to be tested by the pressing member 14 The electrode U of the rod 3Q is clamped on the upper end surface of the surface type conductive contact end portion 40 of the base Η, and the surface type conductive contact end portion can easily be used for correspondingly guiding the multi-array loop on the photometric rod 30, and the substrate is guided by the substrate. The conductive region 22 of the 〇^ provides an electrical signal required for each loop test of the optical rod 3G to be tested, thereby allowing the light rod 30 to be illuminated to perform subsequent detection items. It can be seen from the above description that the surface-type conductive contact end portion 4 有效 can effectively improve the conventional use of the probe as a missing contact, and can also be used to dissipate the electrical contact with the end portion itself: structural features, such as applicable: Shin-Etsu, Japan (Shin_Etsu The metal contacts are connected to the metal contact connectors, so that the loops to be measured are simultaneously clicked, or the loops and the intervals are lit for subsequent testing. Referring to the third and fourth figures, the second preferred embodiment of the present invention is also illustrated by using a light bar as a test object. The clamping device is mainly composed of a base π and a pressing member 14 collocated with the base γ, and the pressing member 70 is fixed to the base 12' by the fixing member 70 by the fixing member 60. Two-sided conductive contact ends 400, 420 are disposed in the pedestal 12. The difference from the first preferred embodiment is that the planar conductive contact ends 400, 420 are metal conductors and are spaced apart from the pedestal 12 — is secured to the base 12' by a locking element 60. One end of the two-sided conductive contact end M349550 400, 420 is supplied with electricity. The adjacent position of the number is electrically connected to form a conducting state, and the other end is spanned across the pedestal 12'. The electrode and the surface-type conductive contact end of the light-measuring rod are disposed across the end of the pedestal. Stick to the conduction. "(4) 142'M4, which is the _ 146 of the demarcation rod, and the other side is the Chengbu part that opens _(10), and an elastic element 5 is placed between the pedestal ^ and the viewing part (Γ, the elastic element 5 (Γ The gripping force of the measuring stick to be measured by the slitting portion 146 is somewhat different from that of the first embodiment, but the overall function of the scale device is the same. The electrode contact range of the metering rod is designed in a single loop. The two-sided conductive contact end _, 420 is enlarged and ready, but this embodiment is particularly suitable for the longitudinal direction of the light rod to be tested, and the creation can indeed provide a detection Measured when the object is good, and the contact position is fresh _, Qian Zheng (4) Lai surface can quickly test each test, and help to improve the overall (four) job speed. [Simplified schematic] The first picture is the first best implementation of the creation The second drawing is an exploded view of the first preferred embodiment of the creation; the second drawing is an exploded view of the second preferred embodiment of the creation; and the fourth drawing is a second preferred embodiment of the creation. Exploded view. [Main component symbol description] 1〇, 10' clamping device 12, 12' base Seat 120 opening 122 > 124 hole position M349550 14, 14' pressing member 144, 14 〆 pivot 148, 14^ pressing portion 22 conductive portion 32 electrode 400, 420 surface type conductive contact end portion 142, 142 < pivot 146 146' pressing portion 20 substrate 30 to be tested light bar 40 surface type conductive contact end portions 50, 5 (Τ elastic member 4 60 locking member 70 fixing portion