TWM276199U - Peak voltage detector with leakage current compensation - Google Patents
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M276199 八、新型說明: 【新型所屬之技術領域】 本創作係有關一種電壓峰值檢知器,尤指利用一差動放大器(differential amplifier)、-充電電晶體(chargingtransistor)、以及-電容器所組成以求 獲得精確電壓峰值之具漏電流補償之互補式金氧半(qjos)電子電路。 【先前技術】 電壓峰值檢知器係一種電子電路,能夠測得一電壓波形之最大值,質言之, 該電路之輸入為一變動之電壓信號,而其輸出則是該輸入電壓波形之最大值。 在許多應用中,輸入電壓信號之峰值必須被測出,然後將之以直流電型態 φ 保留住以便後續分析、使用。一個脈衝串之尖峰值常比它的平均值要更有用, 例如當執行破壞性測試時,就有必要追尋出並保持峰值信號,而量測電壓信號 在傳輸媒介上之哀減量、類比至數位轉換器(A/d 、最大近似解碼系 統(Maximum likelihood decoding system)以及用以檢測核輻射之脈衝信號檢 測電路等也需要用到電壓峰值檢知器。 先前技藝(prior art)中,電壓峰值檢知器之最簡單作法係令輸入電壓信號 通過二極體,而對電容充電,以便取得該輸入電壓波形之峰值。 如第一圖所示,當輸入電壓V(IN)大於電容器C之電壓時,二極體D導通, 遂行充電作用,直到輸入電壓V(IN)到達其最大值,電容器c不能再繼續充 _ 電’此時輸出電壓V(〇UT)即表示輸入電壓V(IN)之峰值。 由於輸出端與輸入端之間存在二極體D,此電路無法精確地檢得輸入電壓 V(IN)之真正峰值。換言之,輸出電壓ν(〇ϋτ)與輸入電壓V(IN)之峰值之間永遠 存在=極體導通電壓vd之誤差。亦即,MAX(V(OUT))=MAX(V(IN))-Vd,如第二 圖所不(該圖係OrCAD PSpice之暫態分析模擬結果)。 β對於許多應用而言,上述二極體導通電壓vd之誤差係不欲見到的,並且該 電壓差會因為使用不同之二極體而有所差異,可能導致不良之影響或不可預測 之後果。 一為了能夠精確地檢測輸入之峰值電壓,另一種常用之先前技藝係使用了由 一個,算放大器0P1和0P2、二個二極體D1和呢、二個電阻器R1和取、以及一 個電各器C來構成一電壓峰值檢知器,如第三圖所示,其OrCAD PSpice之暫態 M276199 分析模擬結果,如第四圖所示。其中,0P1是一個精確的半波整流器,當輸入 電壓V(IN)大於電容電壓V(C)時,二極體D1將傳送偏壓對電容器C1進行ϋ, 最後電容電壓V(C)將會與輸入電壓V(IN)之峰值電壓相當接近,所檢測出的輸出 電壓V(OUT)也會與輸入電壓V(IN)之峰值電壓相當接近,不會再有如第二圖^示 於輸出端與輸入端之間存在一二極體導通電壓Vd之誤差。而當輸入電壓 V(IN)小於電容電壓V(C)時,二極體D2將會導通,二極體饥將會截止而不再對 電容器C進行充電之動作,這使得所檢測出的輸出電壓ν(ουτ)會等於輸入電壓 V(IN)之峰值電壓。雖說第三圖之電壓峰值檢知器能精確地檢測出峰值電壓,但 其電路結構複雜、佔用的晶片面積大,實不利於積體電路之要求。 迄今,有許多電壓峰值檢知器之技術被提出,例如於美國專利案第 US5304939、5502746、5546027、、5969545、6051998、6064238 和 6472861 號 以及中華民國專利案第8822G146號情揭露者均是,該等技術均能精確地檢測 輸入信號之峰值電壓,但由於該等電壓峰值檢知器均使用到一個以上之運算放 大器,因此存在有電路結構複雜、佔用的晶片面積大等缺失。 最近,有幾種不需使用到運算放大器之精密電壓峰值檢知器之技術被提 出」例如中華賴專第9Q119722和議號中所揭露者即是,該等技 術係以:差動放大||和_電流鏡所組成的電路棘代運算放大器,由於並不使 用到運算放大H,因此,具備電路結構鮮、個的⑼面積似及有利 置之小型化等多重功效。 但由於該等技術所使用之差動放大器具有對稱之兩個負載電晶體,且使用 j立之電流鏡,因此,在減少電壓峰值檢知器所需之電晶體數量方面仍有改良 I間,在。此外’該等技術並未考慮到漏電流效應,電壓峰值檢知器在完成輸 入電壓峰值之檢顺至輸出電壓錢v⑽τ)被外部電賴取之前,怪存在有 夺門差因此s有漏電流存在,而上述技術並未考慮到此漏電流效應。 有鑑於此’本創作之主要目的係提出一種新穎架構之電壓锋值檢知器,其 不但能精確地檢測崎人信號之峰值霞,並且兼具電路結構簡單 、佔用的晶 片_小以及有利於裝置之小型化等多重功效,同時亦考慮到漏電流效應。 【新型内容】 本創作所提出之電壓峰值檢知器係由一差動放大器i、一充電電晶體2、以 M276199 及-電容ϋ c所組成,其中,該差動放大n係以非對稱式結構來設計,亦即僅 使用單邊之負載電晶體,且該負載電晶體與該充電電晶體共同構成一電流鏡, 因此可較傳統之精密電壓峰值檢知器(即中華民國專利案第9〇119722和 90131188號專利所揭露之電壓峰值檢知器)少二個pM〇s電晶體。此外,本文所 提出之電壓峰值檢知器亦可有效補償漏電流。 【實施方式】 〃根據上述之目的,本創作提出一種新穎之電壓峰值檢知器,如第五圖所示, 其系由-差動放大器卜-充電電晶體2、以及一電容器c所組成。該差動放大器 1是使用非對稱性之電路組態來設計,其係由麵s電晶體腿、ΜΝ2和腦,以及 •四呢電β曰體MF1所組成’其中,該NM〇s電晶體顺1和ΜΝ2係做為驅動器使用,該pm〇s 電晶體ΜΡ1係做為電晶體負載使用,而腿〇s電晶體做3則提供一參考電流給該差 •動放大器使用。該顺〇S電晶體ΜΝ1和ΜΝ2之閘極係分別接受輸入電壓信號ν^)及 檢知器之輸出電壓回授信號V⑽T),源極連接在一起,並連接至顺〇^ϋ晶獅3 之/及極,而其汲極則分別與PM〇s電晶體MP1之汲極和電源供應電壓Vdd相連接; 該NMOS電晶體MN3之閘極連接至一控制偏壓Vc,而源極則接地;該pM〇s電晶體Mpl 之源極與電源供應電壓Vdd連接,而閘極與汲極則連接在一起,並連接至充電電 晶體MP2之閘極。 請再參考第五圖,該充電電晶體係由PM〇s電晶體Mp2所組成,該PM〇s電晶體 MP2之源極連接至電源供應電壓Vdd,閘極與PMOS電晶體MP1之閘極以及nm〇s電晶 • 體顯1之汲極相連接,而沒極則與該電容器C以及NMOS電晶體MN2之閘極相連接。 為了便於說明起見,以下之推導過程,均將金氧半電晶體以〇趣pspice 中之最簡單模型(即level 1模型)來描述,且不考慮通道長度調變⑽annel length modulation)效應。但於後續之模擬驗證時,則考慮了〇rCAD pspice中 之所有電晶體參數(當然包括通道長度調變效應)。 由第五圖所示電路得知,當輸入電壓信號V(IN)大於輸出電壓信號ν(〇υτ) 時,電流Id (ΜΝ1)會大於Id (ΜΝ2),且M276199 8. Description of the new type: [Technical field to which the new type belongs] This creation relates to a voltage peak detector, especially using a differential amplifier, a charging transistor, and a capacitor. Complementary qjos electronic circuits with leakage current compensation to obtain accurate voltage peaks. [Prior technology] A voltage peak detector is an electronic circuit that can measure the maximum value of a voltage waveform. In other words, the input of the circuit is a changing voltage signal, and its output is the maximum of the input voltage waveform. value. In many applications, the peak value of the input voltage signal must be measured and then retained as a direct current type φ for subsequent analysis and use. The peak value of a burst is often more useful than its average value. For example, when performing a destructive test, it is necessary to track down and maintain the peak signal, and measure the amount of voltage signal degradation on the transmission medium, analog to digital Converters (A / d, Maximum likelihood decoding system) and pulse signal detection circuits used to detect nuclear radiation also need voltage peak detectors. Prior art, voltage peak detection The simplest method of the detector is to let the input voltage signal pass through the diode and charge the capacitor in order to obtain the peak value of the input voltage waveform. As shown in the first figure, when the input voltage V (IN) is greater than the voltage of the capacitor C The diode D is turned on, and then performs the charging function until the input voltage V (IN) reaches its maximum value, and the capacitor c cannot continue to be charged. At this time, the output voltage V (〇UT) represents the input voltage V (IN). Peak. Due to the existence of diode D between the output and input, this circuit cannot accurately detect the true peak value of the input voltage V (IN). In other words, the output voltage ν (〇ϋτ) and the input voltage V ( There is always an error between the peaks of IN) = polar body on voltage vd. That is, MAX (V (OUT)) = MAX (V (IN))-Vd, as shown in the second picture (this picture is OrCAD PSpice The results of transient analysis simulation). Β For many applications, the above-mentioned error of the diode on-voltage vd is undesired, and the voltage difference will be different due to the use of different diodes, which may cause Undesirable effects or unpredictable consequences. One in order to be able to accurately detect the peak voltage of the input, another commonly used prior art system uses one amplifier, 0P1 and 0P2, two diodes D1, and two resistors. And R1, and an electrical device C to form a voltage peak detector, as shown in the third figure, the transient simulation result of OrCAD PSpice M276199 is shown in the fourth figure. Among them, 0P1 is a An accurate half-wave rectifier. When the input voltage V (IN) is greater than the capacitor voltage V (C), the diode D1 will transmit the bias voltage to the capacitor C1. Finally, the capacitor voltage V (C) will be equal to the input voltage V ( The peak voltage of IN) is quite close, and the detected output voltage V (OUT) will also be The peak voltage of the input voltage V (IN) is quite close, and there will no longer be an error in the diode conduction voltage Vd between the output terminal and the input terminal as shown in the second figure. When the input voltage V (IN) is less than the capacitance When the voltage is V (C), the diode D2 will be turned on, and the diode will be cut off and the capacitor C will no longer be charged. This makes the detected output voltage ν (ουτ) equal to the input voltage V (IN) peak voltage. Although the voltage peak detector in the third figure can accurately detect the peak voltage, its circuit structure is complex and the occupied chip area is large, which is not conducive to the requirements of integrated circuits. To date, many voltage peak detector technologies have been proposed, such as those disclosed in U.S. Patent Nos. US5304939, 5502746, 5560027, 5969545, 6051998, 6064238, and 6468261 and the Republic of China Patent No. 8822G146 Other technologies can accurately detect the peak voltage of the input signal, but because these voltage peak detectors use more than one operational amplifier, there are defects such as a complicated circuit structure and a large chip area. Recently, several technologies that do not require the use of precision voltage peak detectors for operational amplifiers have been proposed. "For example, as disclosed in China Lai Zhuan No. 9Q119722 and the proposal, these technologies are: differential amplification || and _The circuit-spinned operational amplifier composed of a current mirror does not use the operational amplifier H, so it has multiple functions such as a fresh circuit structure, a small area, and a favorable miniaturization. However, because the differential amplifiers used in these technologies have two symmetrical load transistors and use a current mirror, there is still room for improvement in reducing the number of transistors required for the voltage peak detector. in. In addition, 'these technologies do not take into account the effect of leakage current. Before the voltage peak detector completes the detection of the input voltage peak to the output voltage (v⑽τ), it is strange that there is a gate difference and therefore there is a leakage current. Yes, but the above-mentioned technology does not take into account this leakage current effect. In view of this, the main purpose of this creation is to propose a novel voltage spike detector that not only can accurately detect the peak of the rugged signal, but also has a simple circuit structure, a small chip, and is conducive to Multiple functions such as miniaturization of the device, taking into account the effect of leakage current. [New content] The voltage peak detector proposed in this creation is composed of a differential amplifier i, a charging transistor 2, with M276199 and -capacitance ϋ c, where the differential amplifier n is asymmetric The structure is designed, that is, only one side of the load transistor is used, and the load transistor and the charge transistor together form a current mirror, so it can be compared with the traditional precision voltage peak detector (the 9th The voltage peak detectors disclosed in patents Nos. 119722 and 90131188) have two pM0s transistors. In addition, the voltage peak detector proposed in this paper can also effectively compensate the leakage current. [Embodiment] 〃 According to the above purpose, the present invention proposes a novel voltage peak detector, as shown in the fifth figure, which is composed of a differential amplifier, a charging transistor 2, and a capacitor c. The differential amplifier 1 is designed using an asymmetrical circuit configuration, which is composed of a surface transistor transistor leg, MN2 and brain, and a four-cell β-body MF1. Among them, the NMOS transistor The cis1 and MN2 series are used as drivers, the pMOS transistor MP1 is used as a transistor load, and the leg MOS transistor 3 is used to provide a reference current for the differential amplifier. The gates of the cis transistor MN1 and MN2 respectively receive the input voltage signal ν ^) and the output voltage feedback signal V⑽T) of the detector. The sources are connected together and connected to cis ^ 3 The NMOS transistor MN3 is connected to a control bias voltage Vc, and the source is connected to ground. The drain of the NMOS transistor MN3 is connected to the drain of the PMMOS transistor MP1 and the power supply voltage Vdd. ; The source of the pM0s transistor Mpl is connected to the power supply voltage Vdd, and the gate and the drain are connected together and connected to the gate of the charging transistor MP2. Please refer to the fifth figure again. The charging transistor system is composed of a PMMOS transistor Mp2. The source of the PMMOS transistor MP2 is connected to the power supply voltage Vdd, the gate and the gate of the PMOS transistor MP1, and nm MOS transistor • The drain of body 1 is connected, while the non-pole is connected to the capacitor C and the gate of NMOS transistor MN2. For the convenience of explanation, the following derivation process describes the metal-oxide-semiconductor transistor as the simplest model (that is, the level 1 model) in the pspice, and does not consider the channel length modulation (annel length modulation) effect. However, in the subsequent simulation verification, all transistor parameters (including channel length modulation effects) in rCAD pspice were considered. According to the circuit shown in the fifth figure, when the input voltage signal V (IN) is greater than the output voltage signal ν (〇υτ), the current Id (MN1) will be greater than Id (MN2), and
Id (MN1) + Id (MN2) = Id (MN3) ⑴ 又Id (MN1) + Id (MN2) = Id (MN3) ⑴ again
Id (MN1) = -Id (MP1) ⑵ 由於PMOS電晶體MP1及MP2係構成一電流鏡,因此 M276199 ⑶ -Id (MP1) = -Id (MP2) 故可對電容器C進行充電動作。 當充電動作達到V(OUT)等於輸入電壓信號v(in)之峰值電壓時,電流 Id (MN1) = Id (MN2) = γ id (MN3) ⑷ 此時仍會對電容器C進行充電動作。 但依據差動放大器之轉移特性曲線得知··輸出電壓信號ν(〇υτ)須較輸入峰 值電壓U高過-超量電壓(0verSh〇〇t v〇ltage簡稱v〇s)才能將臓電晶體醜Id (MN1) = -Id (MP1) ⑵ Because the PMOS transistors MP1 and MP2 form a current mirror, so M276199 ⑶ -Id (MP1) = -Id (MP2), so the capacitor C can be charged. When the charging operation reaches the peak voltage of V (OUT) equal to the input voltage signal v (in), the current Id (MN1) = Id (MN2) = γ id (MN3) ⑷ At this time, the capacitor C will still be charged. However, according to the transfer characteristic curve of the differential amplifier, the output voltage signal ν (〇υτ) must be higher than the input peak voltage U by an excess voltage (0verSh〇〇tv〇ltage referred to as v〇s) in order to convert the 臓 transistor. ugly
強迫為截止狀態,當_S«MN1城止雜時,充電電晶體即停止對電容器 C進行充電作用,此時輸出電壓信號八01]1^為 V(OUT) = Vpeak +V〇S (5) 、由於此時的臓電晶體ΜΝ2係工作於飽和區,而NM0S電晶體ΜΝ1恰由飽和區 進入截止區,因此,可由下列電流方程式求出VGS2&VGS1 :Forced to a cut-off state. When _S «MN1 stops miscellaneous, the charging transistor stops charging capacitor C. At this time, the output voltage signal 0101] 1 ^ is V (OUT) = Vpeak + V〇S (5 ). Since the tritium transistor MN2 works in the saturation region, and the NMOS transistor MN1 enters the cut-off region from the saturation region, VGS2 & VGS1 can be obtained from the following current equation:
Id (MN2) = Id (MN3) (β)Id (MN2) = Id (MN3) (β)
Id (MN1) = 〇 ⑺ 故超量電壓Vos等於Id (MN1) = 〇 ⑺ so the excess voltage Vos is equal to
Vos = VGS2 - VGS1 ⑻ 之後’當輸入電壓信號V (IN)由峰值電壓往下掉時,因顺呢電晶體腿 已進入截止狀態,因此電流 -Id (MP1) = -Id (MP2) = 〇 ⑼ 所以充電電salt不會再對電容HG進行充電動作,因此輸丨電壓信號ν(〇υτ) 仍會固定維持在方程式(5)之電壓。 由方程式(5)得知,輸出電麼信號ν⑽τ)值較輸入峰值電壓U高出一超量 電壓Vos,該超量電壓VGS _示於方程式⑻巾,若所有的麵電晶體均具 有相同的零偏壓臨限電壓yTO(ZeiO-bias threshGld voltage)以及互導參數 KP^Transconductance parameter),該零偏壓臨限電壓〜以及互導參數κρ均為 金氧半電晶體之一模型參數,則方程式(8)可改寫為 V〇s = [2 · Id (MN3) · 1/KP · 1/(W/L)mn2]1/2 (1〇) 其中,(W/Dm表示NMOS電晶體MN2之有效通道寬長比,有關超量電壓v〇s 之推,可參考 Kenneth Κ· Laker 及 Willy M.G· Sansen 合著由 McGRAW-Hill 出版 Design of analog integrated circuits and systems」一書中之第 357 M276199 至375頁。請再參見第五圖,於_s電晶體工作於飽和區時,該方程式 可進一步改寫為 V〇S = [(W/L) mn3/(W/L) mn2]1/2 · (Vc - Vto) (11) 其中’(W/L)«表示NM0S電晶體腦之有效通道寬長比,1Vc表示控制偏壓 (即NM0S電晶體MN3之閘源極電壓),以臓電晶體MN2之通道寬長比(w/l)mn 2等於10、NM0S電晶體瞧之通道寬長比⑽)㈣等於1/1〇、零偏壓臨限電壓Vos = VGS2-VGS1 ⑻ After 'when the input voltage signal V (IN) drops from the peak voltage, the current-Id (MP1) = -Id (MP2) = 〇 because the parasitic transistor leg has entered the cut-off state. ⑼ Therefore, the charging salt does not charge the capacitor HG, so the input voltage signal ν (〇υτ) will still be fixed at the voltage of equation (5). It is known from equation (5) that the value of the output electric signal ν⑽τ) is higher than the input peak voltage U by an excess voltage Vos. The excess voltage VGS _ is shown in the equation. If all the surface transistors have the same The zero bias threshold voltage yTO (ZeiO-bias threshGld voltage) and the transconductance parameter KP ^ Transconductance parameter), the zero bias threshold voltage ~ and the transconductance parameter κρ are one of the model parameters of the metal-oxide semiconductor, Equation (8) can be rewritten as V〇s = [2 · Id (MN3) · 1 / KP · 1 / (W / L) mn2] 1/2 (1〇) where (W / Dm means NMOS transistor MN2 Effective channel width-to-length ratio. For the extrapolation of excess voltage v0s, refer to Kenneth K · Lake and Willy MG · Sansen, co-authored by McGRAW-Hill, Design of analog integrated circuits and systems, No. 357 M276199 Go to page 375. Please refer to the fifth figure again. When the _s transistor operates in the saturation region, the equation can be further rewritten as V0S = [(W / L) mn3 / (W / L) mn2] 1/2 · (Vc-Vto) (11) where '(W / L) «represents the effective channel width-to-length ratio of the NM0S transistor brain, and 1Vc represents the control bias (ie, NM0S transistor M The gate-source voltage of N3) is based on the channel width-to-length ratio of the transistor MN2 (w / l). Mn 2 is equal to 10, and the channel width-to-length ratio of the NM0S transistor is equal to 1). Limit voltage
Vto等於G· 5伏特、且控制偏壓Ve等於Q. 6伏特為例,該超量電壓—等於仍 伏特。 · . 忒超ϊ電壓Vos之值即為電壓峰值檢知器之固有誤差來源之一,但此固有 誤差恰可用來補償電壓峰值檢知器之輸出端因電容漏電流以及因外部電路操取 所造成的電壓降,於電壓峰值檢知器檢測出輸入峰值電壓K後至該輸入峰值 電壓棚取前之等待時間太長時,該電容之漏電流效應不可忽視。所幸,該 電,峰值檢知器之輸出端因電容漏電流以及因外部電路擷取所造成的電壓降, 可藉由適當地設定控制偏壓Vc之大小,以有效地補償該電壓降,該控制偏壓Vc 可輕易地藉由改寫方程式(U)而得到,亦即Vto is equal to G · 5 volts, and the control bias Ve is equal to Q. 6 volts. For example, the excess voltage is equal to still volts. ·. The value of the over-voltage Vos is one of the inherent errors of the voltage peak detector, but this inherent error can just be used to compensate the output of the voltage peak detector due to capacitor leakage current and due to external circuit operation. When the voltage drop caused by the voltage peak detector detects the input peak voltage K and the waiting time before the input peak voltage is taken too long, the leakage current effect of the capacitor cannot be ignored. Fortunately, the output of the electrical peak detector due to capacitor leakage current and voltage drop caused by external circuit capture can be properly compensated for the voltage drop by setting the control bias Vc appropriately. The control bias Vc can be easily obtained by rewriting equation (U), that is,
Vc = Vto + [ (W/L) MN 2/(W/L) mn 3]1/2. Vos (12) 因此,若已知電壓峰值檢知器之輸出端因電容漏電流以及因外部電路擷取 所造,的電壓降,則可將該電壓降設定等於超量電壓vos,並經由方程式⑽ 之計算,即可_地估算出躲有效鑛該賴降所需之控制偏壓Vc之值。 9 1 本創作所提出之電壓峰值檢知器之OrCAD PSpice暫態分析模擬結果,如第 /、圖所示,由该模擬結果可証實,本創作所提出之電壓峰值檢知器可精確且有 效地檢知輸入電壓波形之峰值電壓。第六圖係以level 3模型並使用〇·35微米 CMOS製程參數加以模擬(其ΡΜ_晶體和麵電晶體之零偏壓臨限電壓Vt。分別 為-〇. 5V和0. 5V),且電源供應電壓Vdd等於5· 〇伏特,控制偏壓Vc等於〇· 6伏特, PM0S電ΘΘΜΡ1、MP2之通道寬長比均為(21〇· 35_/0. 35μπι),fiMOS電晶體MN1之 通道寬長比為(〇· 35μιη/0· 35μιη)、NM0S電晶體MN2之通道寬長比為 (1010^». βδμιη)^ \Vc = Vto + [(W / L) MN 2 / (W / L) mn 3] 1/2. Vos (12) Therefore, if the output of the voltage peak detector is known due to capacitor leakage current and external circuit If the generated voltage drop is captured, the voltage drop can be set equal to the excess voltage vos, and the value of the control bias Vc required to avoid the drop in the effective mine can be estimated _ through the calculation of equation ⑽. . 9 1 The OrCAD PSpice transient analysis simulation result of the voltage peak detector proposed in this creation, as shown in the figure, the simulation results can confirm that the voltage peak detector proposed in this creation can be accurate and effective Ground to detect the peak voltage of the input voltage waveform. The sixth figure is simulated with a level 3 model and using 0.35 micron CMOS process parameters (the zero bias threshold voltage Vt of its PM_ crystal and surface transistor. -0.5V and 0.5V, respectively), and The power supply voltage Vdd is equal to 5.0 volts, and the control bias voltage Vc is equal to 0.6 volts. The channel width-to-length ratio of the PM0S power ΘΘMP1 and MP2 are both (210.35 / 0.35μm), and the channel width of the fiMOS transistor MN1 The aspect ratio is (〇 · 35μιη / 0 · 35μιη), and the channel width-length ratio of the NM0S transistor MN2 is (1010 ^ ». Βδμιη) ^ \
而電容器之電容值則為1PF。由第六圖之結果可知,於控制偏壓Vc等於〇·6伏特 時,輸出電壓信號ν(ουτ)怪較輸入峰值電壓Vpeak高出0 015伏特。湖· 015伏特⑧ 之超量電壓Vos即為電壓峰值檢知器之固有誤差,該固有誤差可用來補償電壓峰U M276199 值檢知器之輸出端因漏電流以及因外部電蝴取所造成的電壓降。 由以上刀析可知,在考慮電壓峰值檢知器之輸出端因漏電流以及因外部電 路擷取所造成的電壓降之因素下,本文所提出之電壓峰健知器,確實可精確 且有效地檢知輸入電壓波形之峰值電壓。 本創作之電壓峰值檢知器在使用時可於電容器c兩端並聯連接一開關,該 =關係用以提供-放電路徑,以便將電容器上所儲存之電荷放電,俾利於下次 輸入電壓信號之峰值檢測。 【創作功效】 本創作所提出之電壓峰值檢知器,具有如下功效: (1)=精確度·由於本創作可經由適當地設定控制偏壓Vc,即可利用相對應的超 里電壓Vos以抵消電容漏電流以及外部電路擷取所造成的電壓降誤差,藉此 即可使外部電路精確地擷取到輸入電壓波形之峰值電壓; ⑵利於裝置之小型化:由於本創作所提出之電壓峰值檢知器僅使用了糊臓 電晶體、3個·0S電晶體、以及1個電容器,因此不但電路架構新穎、簡單、 使用的電晶體數量少,並且因不需使用運算放大器,因而也有利於裝置之 小型化。 雖然本創作特綱露並描述了所選之最佳實施例,但舉凡減本技術之人 士可明瞭任何形式或是細節上可能的變化均未脫離本創作的精神與範圍。因 此,所有相關技術範疇内之改變都包括在本創作之申請專利範圍内。 M276199 【圖式簡單說明】 第一圖係顯示第一先前技藝中電壓峰值檢知器之電路圖; 第二圖係顯示第一圖電壓峰值檢知器之輸入電壓信號及輸出電壓信號之暫態分 析時序圖, 第三圖係顯示第二先前技藝中電壓峰值檢知器之電路圖; 第四圖係顯示第三圖電壓峰值檢知器之輸入電壓信號及輸出電壓信號之暫態分 析時序圖; 第五圖係顯示本創作較佳實施例之電壓峰值檢知器之電路圖; 第六圖係顯示本創作電壓峰值檢知器之輸入電壓信號及輸出電壓信號之暫態分 析時序圖。 [元件符號說明] 1 差動放大器 2 充電電晶體 V(IN)輸入電壓信號 V(OUT)輸出電壓信號 Vc控制偏壓 Vdd 電源供應電壓 C 電容器 D 二極體 D1二極體 D2 二極體 0P1運算放大器 0P2 運算放大器 MP1第一 PMOS電晶體 MP2 第二PM0S電晶體 丽1第一 NMOS電晶體 MM3第三NMOS電晶體 MN2 第二NM0S電晶體The capacitance of the capacitor is 1PF. It can be seen from the results in the sixth figure that when the control bias voltage Vc is equal to 0.6 volts, the output voltage signal ν (ουτ) is strangely higher than the input peak voltage Vpeak by 0 015 volts. Lake · 015 Volts The excess voltage Vos is the inherent error of the voltage peak detector. This inherent error can be used to compensate for the voltage peak U M276199 output terminal due to leakage current and external power Voltage drop. From the above analysis, it can be seen that the voltage peak detector proposed in this paper can be accurately and effectively given the leakage current of the voltage peak detector and the voltage drop caused by the external circuit capture. Detect the peak voltage of the input voltage waveform. The voltage peak detector of this creation can be connected in parallel with a switch at both ends of the capacitor c when in use. This = relationship is used to provide a -discharge path to discharge the charge stored on the capacitor, which is beneficial to the next input voltage signal. Peak detection. [Creation effect] The voltage peak detector proposed in this creation has the following effects: (1) = Precision · Since this creation can set the control bias voltage Vc appropriately, the corresponding super-voltage Vos can be used to Cancel the capacitor leakage current and the voltage drop error caused by the external circuit capture, so that the external circuit can accurately capture the peak voltage of the input voltage waveform; ⑵ Conducive to the miniaturization of the device: due to the voltage peak proposed in this creation The detector only uses paste transistors, 3 · 0S transistors, and 1 capacitor, so it is not only a novel and simple circuit architecture, the number of transistors used is small, and it does not require an operational amplifier, which is also beneficial. Miniaturization of the device. Although this work outlines and describes the preferred embodiment selected, those skilled in the art will appreciate that any form or detail of possible changes may be made without departing from the spirit and scope of the work. Therefore, all changes within the relevant technical scope are included in the scope of the patent application for this creation. M276199 [Schematic description] The first picture shows the circuit diagram of the voltage peak detector in the first prior art; the second picture shows the transient analysis of the input voltage signal and the output voltage signal of the voltage peak detector in the first picture Timing diagram, the third diagram shows the circuit diagram of the voltage peak detector in the second prior art; the fourth diagram shows the timing diagram of the transient analysis of the input voltage signal and the output voltage signal of the voltage peak detector of the third diagram; The fifth figure is a circuit diagram showing a voltage peak detector of the preferred embodiment of the present invention; the sixth figure is a timing diagram showing the transient analysis of the input voltage signal and the output voltage signal of the present voltage peak detector. [Description of Symbols] 1 Differential amplifier 2 Charging transistor V (IN) Input voltage signal V (OUT) Output voltage signal Vc Control bias voltage Vdd Power supply voltage C Capacitor D Diode D1 Diode D2 Diode 0P1 Operational amplifier 0P2 Operational amplifier MP1 First PMOS transistor MP2 Second PM0S transistor Li 1 First NMOS transistor MM3 Third NMOS transistor MN2 Second NMOS transistor
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TWI627421B (en) * | 2017-08-22 | 2018-06-21 | 華邦電子股份有限公司 | Leakage current detection apparatus and detection method thereof |
CN109425802A (en) * | 2017-08-22 | 2019-03-05 | 华邦电子股份有限公司 | Leak current detection device and its detection method |
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TWI627421B (en) * | 2017-08-22 | 2018-06-21 | 華邦電子股份有限公司 | Leakage current detection apparatus and detection method thereof |
CN109425802A (en) * | 2017-08-22 | 2019-03-05 | 华邦电子股份有限公司 | Leak current detection device and its detection method |
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