TWI886225B - 感光性樹脂組成物、硬化膜、積層體、硬化膜之製造方法、及半導體器件 - Google Patents
感光性樹脂組成物、硬化膜、積層體、硬化膜之製造方法、及半導體器件 Download PDFInfo
- Publication number
- TWI886225B TWI886225B TW110108181A TW110108181A TWI886225B TW I886225 B TWI886225 B TW I886225B TW 110108181 A TW110108181 A TW 110108181A TW 110108181 A TW110108181 A TW 110108181A TW I886225 B TWI886225 B TW I886225B
- Authority
- TW
- Taiwan
- Prior art keywords
- group
- resin composition
- formula
- photosensitive resin
- film
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G73/00—Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
- C08G73/06—Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/027—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/027—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
- G03F7/028—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with photosensitivity-increasing substances, e.g. photoinitiators
- G03F7/029—Inorganic compounds; Onium compounds; Organic compounds having hetero atoms other than oxygen, nitrogen or sulfur
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/027—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
- G03F7/032—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with binders
- G03F7/037—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with binders the binders being polyamides or polyimides
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/40—Treatment after imagewise removal, e.g. baking
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Medicinal Chemistry (AREA)
- Organic Chemistry (AREA)
- Polymers & Plastics (AREA)
- Health & Medical Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Inorganic Chemistry (AREA)
- Materials For Photolithography (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Macromolecular Compounds Obtained By Forming Nitrogen-Containing Linkages In General (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2020-040968 | 2020-03-10 | ||
| JP2020040968 | 2020-03-10 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW202140621A TW202140621A (zh) | 2021-11-01 |
| TWI886225B true TWI886225B (zh) | 2025-06-11 |
Family
ID=77672389
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW110108181A TWI886225B (zh) | 2020-03-10 | 2021-03-08 | 感光性樹脂組成物、硬化膜、積層體、硬化膜之製造方法、及半導體器件 |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JP7451681B2 (https=) |
| TW (1) | TWI886225B (https=) |
| WO (1) | WO2021182394A1 (https=) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20230314934A1 (en) * | 2022-03-31 | 2023-10-05 | Rohm And Haas Electronic Materials Llc | Photoactive compounds, photoresist compositions including the same, and pattern formation methods |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000131838A (ja) * | 1998-10-26 | 2000-05-12 | Hitachi Chemical Dupont Microsystems Ltd | 感光性樹脂組成物、レリーフパターンの製造法及び半導体装置 |
| TW201831995A (zh) * | 2016-08-01 | 2018-09-01 | 富士軟片股份有限公司 | 感光性樹脂組成物、硬化膜、積層體、硬化膜的製造方法、 積層體的製造方法及半導體元件 |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000356853A (ja) * | 1999-06-15 | 2000-12-26 | Hitachi Chemical Dupont Microsystems Ltd | 塩基性水溶液現像用ネガ型感光性ポリイミド前駆体組成物及びそれを用いたパターン製造方法 |
| JP2008122889A (ja) * | 2006-10-18 | 2008-05-29 | Hitachi Chemical Dupont Microsystems Ltd | 感光性樹脂組成物、この感光性樹脂組成物を用いたパターン形成方法及び電子部品 |
-
2021
- 2021-03-08 JP JP2022507177A patent/JP7451681B2/ja active Active
- 2021-03-08 WO PCT/JP2021/008984 patent/WO2021182394A1/ja not_active Ceased
- 2021-03-08 TW TW110108181A patent/TWI886225B/zh active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000131838A (ja) * | 1998-10-26 | 2000-05-12 | Hitachi Chemical Dupont Microsystems Ltd | 感光性樹脂組成物、レリーフパターンの製造法及び半導体装置 |
| TW201831995A (zh) * | 2016-08-01 | 2018-09-01 | 富士軟片股份有限公司 | 感光性樹脂組成物、硬化膜、積層體、硬化膜的製造方法、 積層體的製造方法及半導體元件 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPWO2021182394A1 (https=) | 2021-09-16 |
| WO2021182394A1 (ja) | 2021-09-16 |
| TW202140621A (zh) | 2021-11-01 |
| JP7451681B2 (ja) | 2024-03-18 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| TWI878445B (zh) | 硬化性樹脂組成物、樹脂膜、硬化膜、積層體、硬化膜的製造方法及半導體元件 | |
| TWI841777B (zh) | 硬化膜的製造方法、積層體的製造方法及電子元件的製造方法 | |
| TWI904169B (zh) | 感光性樹脂組成物、硬化膜、積層體、硬化膜之製造方法、及半導體器件 | |
| TWI890798B (zh) | 硬化性樹脂組成物、硬化膜、積層體、硬化膜的製造方法及半導體元件 | |
| TWI888627B (zh) | 硬化物的製造方法、積層體的製造方法及半導體元件的製造方法 | |
| TWI875930B (zh) | 樹脂組成物、硬化膜、積層體、硬化膜的製造方法及半導體元件 | |
| TWI860437B (zh) | 硬化性樹脂組成物、硬化膜、積層體、硬化膜的製造方法及半導體器件 | |
| TWI870556B (zh) | 硬化性樹脂組成物、硬化膜、積層體、硬化膜之製造方法及半導體器件 | |
| TWI878598B (zh) | 硬化性樹脂組成物、硬化物、積層體、硬化物之製造方法、半導體器件、聚醯亞胺前驅物及其製造方法 | |
| TWI890801B (zh) | 硬化性樹脂組成物、硬化膜、積層體、硬化膜之製造方法及半導體器件 | |
| TWI890907B (zh) | 樹脂組成物、硬化物、積層體、硬化物之製造方法及半導體元件 | |
| TWI890841B (zh) | 硬化性樹脂組成物、硬化物、積層體、硬化物之製造方法、半導體器件、聚醯亞胺前驅物及其製造方法 | |
| TWI869552B (zh) | 硬化性樹脂組成物、硬化膜、積層體、硬化膜之製造方法及半導體器件 | |
| TWI883191B (zh) | 硬化性樹脂組成物、硬化膜、積層體、硬化膜之製造方法及半導體器件 | |
| TWI896742B (zh) | 感光性樹脂組成物、硬化物、積層體、硬化物之製造方法及半導體器件 | |
| TWI875941B (zh) | 樹脂組成物、硬化膜、積層體、硬化膜的製造方法及半導體元件 | |
| TWI882163B (zh) | 硬化性樹脂組成物、硬化物、積層體、硬化物之製造方法及半導體元件 | |
| TWI886225B (zh) | 感光性樹脂組成物、硬化膜、積層體、硬化膜之製造方法、及半導體器件 | |
| TWI894341B (zh) | 硬化性樹脂組成物、硬化物、積層體、硬化物之製造方法及半導體元件 | |
| TWI912484B (zh) | 樹脂組成物、硬化物、積層體、硬化物的製造方法及半導體元件 | |
| TWI914402B (zh) | 樹脂組成物、硬化物、積層體、硬化物的製造方法及半導體元件 | |
| TWI901645B (zh) | 感光性樹脂組成物、圖案的製造方法、感光膜、硬化物、積層體及元件 | |
| TW202244639A (zh) | 永久膜之製造方法、積層體之製造方法及半導體裝置之製造方法 |