TWI844569B - System and method for measuring a surface in contoured glass sheets - Google Patents

System and method for measuring a surface in contoured glass sheets Download PDF

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TWI844569B
TWI844569B TW108137112A TW108137112A TWI844569B TW I844569 B TWI844569 B TW I844569B TW 108137112 A TW108137112 A TW 108137112A TW 108137112 A TW108137112 A TW 108137112A TW I844569 B TWI844569 B TW I844569B
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glass sheet
coordinate
camera
series
visible light
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TW108137112A
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Chinese (zh)
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TW202117276A (en
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傑森 C 阿丁頓
班傑明 L 莫倫
麥可 J 維爾德
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美商玻璃技術股份有限公司
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Abstract

An optical inspection system is provided for an ultraviolet laser and associated optics forming a planar laser sheet directed to a glass sheet. The planar laser sheet intersects a surface of the glass sheet thereby causing the surface of the glass sheet to fluoresce and form a visible wavelength line on the surface. A camera has an image sensor for detecting the visible wavelength line. A control system is configured to receive image data indicative of the visible wavelength line, analyze and triangulate the data to determine a series of coordinates associated with the line, and create a three-dimensional map of the surface of the glass sheet as a function of the series of coordinates. Methods for using an optical inspection system, for gauging a surface using an optical inspection system, and for providing optical reflectance information for a surface using an optical inspection system are also provided.

Description

用於測量弧曲玻璃片之表面的系統及方法 System and method for measuring the surface of a curved glass sheet

各種具體實施例係有關於用於測量弧曲玻璃片之表面的系統及方法。 Various specific embodiments relate to systems and methods for measuring the surface of a curved glass sheet.

玻璃片的製造商感興趣於玻璃片表面的測量及評估,特別是形成為有各種彎曲形狀以用作汽車擋風玻璃、後擋玻璃(backlite)及側擋玻璃(sidelite)的玻璃片。製造商可能想要判定玻璃片是否在規測(gauging)的預定規格內。製造商也可能想要測量及評估成形片由人類觀察者察覺的反射光學失真數量,例如外面觀察者或車輛中的操作者或乘客,其中玻璃可能安裝為擋風玻璃、後擋玻璃或側擋玻璃、或其類似者。例如,規測指標及反射失真閾值隨著車輛應用增加使用例如抬頭顯示器的技術而變得越來越嚴緊。製造商也想要識別在成形玻璃片表面可看見的小痕跡或其他缺陷。 Manufacturers of glass sheets are interested in measuring and evaluating the surface of glass sheets, particularly glass sheets formed into various curved shapes for use as automotive windshields, backlites, and sidelites. The manufacturer may want to determine whether the glass sheet is within predetermined specifications for gauging. The manufacturer may also want to measure and evaluate the amount of reflected optical distortion of the formed sheet as perceived by a human observer, such as an outside observer or an operator or passenger in a vehicle, where the glass may be installed as a windshield, backlites, or sidelites, or the like. For example, gauging specifications and reflection distortion thresholds are becoming increasingly stringent as automotive applications increase the use of technologies such as head-up displays. Manufacturers also want to identify small marks or other defects that are visible on the surface of formed glass sheets.

在一具體實施例中,一種光學檢測系統設有一紫外線雷射與相關光件,其形成指向一玻璃片之一平面雷射切頁(planer laser sheet)。該平面雷射切頁與玻璃片的表面相交藉此造成該玻璃片表面發螢光且形成可見光波長線於表面上。攝影機有影像感測器用於偵測跨越該片之一寬度之至少一部份的可見光波長線。控制系統經組配為可(i)從該攝影機接收表示該可見光波長線的影 像資料,(ii)分析來自該攝影機的該資料以判定一座標系列中與該線關聯的第一及第二座標,(iii)三角測量(triangulate)各與該座標系列中之該第一及第二座標關聯的一第三座標,以及(iv)建立該玻璃片之該表面的作為該座標系列之函數的一三維圖(three-dimensional map)。 In one embodiment, an optical inspection system is provided with an ultraviolet laser and associated optical components that form a planer laser sheet directed toward a glass sheet. The planer laser sheet intersects the surface of the glass sheet thereby causing the surface of the glass sheet to fluoresce and form visible light wavelengths on the surface. A camera has an image sensor for detecting visible light wavelengths across at least a portion of a width of the sheet. The control system is configured to (i) receive image data representing the visible light wavelength line from the camera, (ii) analyze the data from the camera to determine first and second coordinates in a coordinate series associated with the line, (iii) triangulate a third coordinate each associated with the first and second coordinates in the coordinate series, and (iv) create a three-dimensional map of the surface of the glass sheet as a function of the coordinate series.

在另一具體實施例中,提供一種使用光學檢測系統的方法。一平面雷射切頁從一紫外線雷射及相關光件形成且指向一玻璃片之一表面。該玻璃片表面在該平面雷射切頁與該表面的一交叉處被激發以形成一可見光波長線於該玻璃片的該表面上。該可見光波長線使用一攝影機成像。判定在一座標系列中與該可見光波長線相關的第一及第二座標係藉由分析來自該攝影機的成像資料。在與該可見光波長線關聯的該座標系列中,藉由三角測量來判定與該第一及第二座標中之各者關聯的一第三座標。建立該玻璃片之該表面的作為該座標系列之函數的一三維圖。 In another specific embodiment, a method of using an optical detection system is provided. A planar laser cut page is formed from an ultraviolet laser and related optical components and directed to a surface of a glass sheet. The surface of the glass sheet is excited at an intersection of the planar laser cut page and the surface to form a visible light wavelength line on the surface of the glass sheet. The visible light wavelength line is imaged using a camera. Determining first and second coordinates associated with the visible light wavelength line in a coordinate series is by analyzing imaging data from the camera. In the coordinate series associated with the visible light wavelength line, a third coordinate associated with each of the first and second coordinates is determined by triangulation. A three-dimensional graph of the surface of the glass sheet as a function of the coordinate series is established.

在另一具體實施例中,提供一種使用光學檢測系統來規測表面的方法。藉由三角測量使用一攝影機在該表面上成像之一螢光線(fluoresced line)的一位置,算出包含對應至在一玻璃片之一表面上之一位置之一座標集合的一資料集,其中該螢光線建立在來自一紫外線雷射的平面雷射切頁與該表面的一交叉處。建立該表面的作為一系列之資料集之函數的一三維圖。使用該資料集比較該表面之一規測模型(gauge model),算出一不變量指標。該不變量指標為輸出。 In another specific embodiment, a method for measuring a surface using an optical detection system is provided. A data set including a set of coordinates corresponding to a position on a surface of a glass sheet is calculated by triangulating a position of a fluorescent line imaged on the surface using a camera, wherein the fluorescent line is established at an intersection of a planar laser cut from an ultraviolet laser and the surface. A three-dimensional graph of the surface is established as a function of a series of data sets. An invariant index is calculated by comparing the data set to a gauge model of the surface. The invariant index is output.

在另一具體實施例中,提供一種使用光學檢測系統來提供表面之光學反射率資訊的方法。藉由三角測量使用一攝影機在該表面上成像之一螢光線的一位置,算出包含對應至在一玻璃片之一表面上之一位置之一座標集合的一資料集,其中該螢光線建立在來自一紫外線雷射的平面雷射切頁與該表面的一交叉處。建立該表面的作為一系列之資料集之函數的一三維圖。去雜訊 (denoising)該表面之該三維圖。使用來自該去雜訊圖的資料集比較被指定用於該玻璃片G表面之一光學反射率規格,算出一不變量指標。該不變量指標為輸出。 In another embodiment, a method is provided for providing optical reflectance information of a surface using an optical detection system. A data set comprising a set of coordinates corresponding to a position on a surface of a glass sheet is calculated by triangulating a position of a fluorescent line imaged on the surface using a camera, wherein the fluorescent line is established at an intersection of a planar laser cut from an ultraviolet laser and the surface. A three-dimensional map of the surface is established as a function of a series of data sets. Denoising the three-dimensional map of the surface. An invariant index is calculated by comparing the data set from the denoised map to an optical reflectance specification specified for the surface of the glass sheet G. The invariant index is output.

10:光學檢測系統,檢測系統,系統 10: Optical detection system, detection system, system

12:輸送器 12:Conveyor

14:光學系統,系統 14:Optical system, system

16:控制系統,電腦 16: Control system, computer

18:位置感測器 18: Position sensor

20:使用者介面及顯示螢幕 20: User interface and display screen

50:雷射 50:Laser

52:雷射光束 52: Laser beam

54:光學元件 54:Optical components

55:光束整形器 55: Beam shaper

56:第一透鏡 56: First lens

57:附加聚焦透鏡 57: Additional focusing lens

58:第二透鏡 58: Second lens

60:平面雷射切頁,雷射切頁 60: Plane laser cutting, laser cutting

62:第一表面 62: First surface

64:第二表面 64: Second surface

66:路徑,雷射線,線 66: path, laser beam, line

68:原放射線,放射線,線 68: Original radiation, radiation, line

70:放射光 70: Radiant light

72、72A、72B:攝影機 72, 72A, 72B: Camera

73A、73B:區域 73A, 73B: Area

80:電腦,控制系統 80: Computer, control system

82:影像處理器單元 82: Image processor unit

100:模型線 100: Model line

200:方法 200:Methods

202-220:步驟 202-220: Steps

250:區域 250: Area

300:方法 300:Methods

302-310:步驟 302-310: Steps

350:方法 350:Methods

352-362:步驟 352-362: Steps

B:定界框 B: Bounding box

C:校準圖 C: Calibration diagram

D:資料集 D: Dataset

D1、D2:距離 D1, D2: distance

G:玻璃片,玻璃面板 G: Glass sheet, glass panel

L:線 L: Line

M1、M2:兩個矩陣或點雲 M1, M2: two matrices or point clouds

M1*、M2*:子矩陣 M1*, M2*: sub-matrices

M3:最終矩陣或點雲 M3: Final matrix or point cloud

λ 1λ 2:波長 λ 1 , λ 2 : wavelength

圖1根據一具體實施例示意圖示玻璃片檢測系統的一具體實施例;圖2根據一具體實施例示意圖示與圖1檢測系統一起使用的光學系統;圖3的曲線圖圖示供使用於圖1及圖2系統之玻璃片的光學透射率;圖4示意圖示與圖1檢測系統一起使用的另一光學系統;圖5示意圖示與圖1檢測系統一起使用的另一光學系統;圖6的流程圖根據一具體實施例圖示使用圖1、圖2、圖4及圖5系統來測量玻璃片之表面的方法;圖7圖示玻璃片表面使用圖2系統取得的可見光譜影像之一部份;圖8A及圖8B示意圖示供使用於三角測量第三座標的圖1至圖2光學檢測系統;圖9根據一具體實施例示意圖示與圖7方法一起使用之多攝影機系統的資料調正步驟順序(data alignment step sequence);圖10的流程圖圖示使用如從圖6方法判定之表面圖來規測表面的方法;圖11A及圖11B為在使用圖10方法判定時顯示給使用者的代表性系統輸出; 圖12的流程圖圖示使用如從圖6方法判定之表面圖來建模及判定表面之光學反射率及失真的方法;與圖13為在使用圖12方法判定時顯示給使用者的代表性系統輸出。 FIG. 1 schematically illustrates a specific embodiment of a glass sheet detection system according to a specific embodiment; FIG. 2 schematically illustrates an optical system used with the detection system of FIG. 1 according to a specific embodiment; FIG. 3 is a graph illustrating the optical transmittance of a glass sheet used in the systems of FIG. 1 and FIG. 2; FIG. 4 schematically illustrates another optical system used with the detection system of FIG. 1; FIG. 5 schematically illustrates another optical system used with the detection system of FIG. 1; FIG. 6 is a flow chart According to a specific embodiment, a method for measuring the surface of a glass sheet using the system of FIG. 1, FIG. 2, FIG. 4 and FIG. 5 is illustrated; FIG. 7 illustrates a portion of a visible spectrum image of the surface of a glass sheet obtained using the system of FIG. 2; FIGS. 8A and 8B schematically illustrate the optical detection system of FIG. 1 to FIG. 2 for use in triangulating a third coordinate; FIG. 9 schematically illustrates a data adjustment step sequence (data alignment) of a multi-camera system used with the method of FIG. 7 according to a specific embodiment. alignment step sequence); FIG. 10 is a flowchart illustrating a method for measuring a surface using a surface map determined from the method of FIG. 6; FIG. 11A and FIG. 11B are representative system outputs displayed to a user when determining using the method of FIG. 10; FIG. 12 is a flowchart illustrating a method for modeling and determining the optical reflectivity and distortion of a surface using a surface map determined from the method of FIG. 6; and FIG. 13 is a representative system output displayed to a user when determining using the method of FIG. 12.

按要求,在此提供本揭示內容的數個詳細具體實施例;不過,應瞭解,所揭露的具體實施例僅為實施例且可用不同及替代的形式體現。附圖不一定按比例繪製;有些特徵可能被誇大或最小化以圖示特定組件的細節。因此,揭露於此的特定結構及功能細節不應被解釋為限制,反而僅僅作為代表性基礎供教導熟諳此藝者以各種方式運用本揭示內容。 As requested, several detailed specific embodiments of the present disclosure are provided herein; however, it should be understood that the specific embodiments disclosed are only embodiments and may be embodied in different and alternative forms. The drawings are not necessarily drawn to scale; some features may be exaggerated or minimized to illustrate the details of a particular component. Therefore, the specific structural and functional details disclosed herein should not be interpreted as limiting, but rather merely as a representative basis for teaching those skilled in the art to use the present disclosure in various ways.

事實證明,揭露於此的任何電路或其他電子裝置可包括任意多個微處理器、積體電路、記憶體裝置(例如,FLASH、隨機存取記憶體(RAM)、唯讀記憶體(ROM)、電子可程式唯讀記憶體(EPROM)、電子可抹除可程式唯讀記憶體(EEPROM)、或彼等之其他合適變體)以及互相一起起用以執行揭露於此之運作(s)的軟體。此外,揭露於此的電子裝置中之任一或多個可經組配為可執行體現於非暫時性電腦可讀媒體中經編程為可執行揭露於此之任意多個功能的電腦程式。 It is evident that any circuit or other electronic device disclosed herein may include any number of microprocessors, integrated circuits, memory devices (e.g., FLASH, random access memory (RAM), read-only memory (ROM), electronically programmable read-only memory (EPROM), electronically erasable programmable read-only memory (EEPROM), or other suitable variants thereof) and software that work together to perform the operation(s) disclosed herein. In addition, any one or more of the electronic devices disclosed herein may be configured to execute a computer program embodied in a non-transitory computer-readable medium and programmed to execute any number of functions disclosed herein.

圖1圖示線上玻璃片光學檢測系統10。檢測系統10包括在與玻璃片之第一尺寸大體平行之第一方向輸送玻璃片G的輸送器12。在圖示實施例中,弧曲玻璃片G為大體矩形的車輛擋風玻璃或後擋玻璃,其具有相對較小尺寸的第一尺寸(且替換地可稱為高度)與第二相對較大尺寸(替換地可稱為寬度)。玻璃片G在第三維有厚度,該厚度小於寬度及高度。玻璃片G相對於與第一方向大體平行的一或多個曲率軸線彎曲。在其他實施例中,玻璃片G可具有其他曲率軸線,或提供作為平坦或實質平坦的片體。 FIG. 1 illustrates an online glass sheet optical inspection system 10. The inspection system 10 includes a conveyor 12 for conveying a glass sheet G in a first direction substantially parallel to a first dimension of the glass sheet. In the illustrated embodiment, the curved glass sheet G is a substantially rectangular vehicle windshield or rear shield having a first dimension that is a relatively smaller dimension (and may alternatively be referred to as a height) and a second relatively larger dimension (alternatively referred to as a width). The glass sheet G has a thickness in a third dimension that is less than the width and the height. The glass sheet G is bent relative to one or more axes of curvature that are substantially parallel to the first direction. In other embodiments, the glass sheet G may have other axes of curvature, or be provided as a flat or substantially flat sheet.

輸送器12可為單一輸送器,其單獨專門運送玻璃片G通過可作為獨立光學檢測系統組配及/或運作的檢測系統10。在其他實施例中,輸送器12可為輸送玻璃片通過各種製程工作站的一系列輸送器中之一者,例如,出現在典型汽車、建築及/或太陽能玻璃片製造系統中的加熱、塑形及退火或回火工作站。為了用所述方式處理玻璃,玻璃片G的輸送器可由例如輥輪、氣墊、或皮帶輸送器、定位器、及機器人手臂的各種技術提供。也應瞭解,可獨立控制複數個輸送器中之各者以使玻璃片高速移動通過不同加工工作站以有效支配玻璃片在系統10中的流動及加工。 The conveyor 12 may be a single conveyor that is solely dedicated to transporting the glass sheet G through the inspection system 10, which may be configured and/or operated as a stand-alone optical inspection system. In other embodiments, the conveyor 12 may be one of a series of conveyors that transport the glass sheet through various process workstations, such as heating, shaping, and annealing or tempering workstations found in typical automotive, architectural, and/or solar glass sheet manufacturing systems. In order to process the glass in the manner described, the conveyor of the glass sheet G may be provided by various technologies such as rollers, air cushions, or belt conveyors, positioners, and robotic arms. It should also be understood that each of the plurality of conveyors may be independently controlled to move the glass sheet at high speed through different processing workstations to effectively control the flow and processing of the glass sheet in the system 10.

替換地,檢測系統10可提供作為無輸送器的個別獨立系統或設備。檢測系統10也可設有玻璃面板G的夾具,其中檢測系統10經組配為相對於面板G可平移,例如裝在輸送器系統上的光學系統14。檢測系統10可設有互相固定的玻璃面板G與光學系統14,其中該光學系統有經組配為可掃描玻璃面板G表面的數個光學元件。 Alternatively, the detection system 10 may be provided as a separate independent system or device without a conveyor. The detection system 10 may also be provided with a fixture for the glass panel G, wherein the detection system 10 is configured to be translatable relative to the panel G, such as an optical system 14 mounted on a conveyor system. The detection system 10 may be provided with a glass panel G and an optical system 14 fixed to each other, wherein the optical system has a plurality of optical elements configured to scan the surface of the glass panel G.

檢測系統10有用來識別及測量玻璃片表面的光學系統14,且可進一步用來規測片體、識別及測量片體中的小缺陷、及/或測量反射光學失真。參考圖2詳述光學系統14。 The inspection system 10 has an optical system 14 for identifying and measuring the surface of the glass sheet, and can be further used to gauge the sheet, identify and measure small defects in the sheet, and/or measure reflected optical distortion. Refer to Figure 2 for a detailed description of the optical system 14.

大體上,光學系統14包括有至少部份基於玻璃片G之光學性質來選定之波長的雷射或其他光源。來自光源的光線被光學系統14引導至玻璃片G。在一實施例中,該光源經選定成在諧調窄頻帶中有對於該玻璃片G為不透明或大體不透射的波長λ1。該光源也經選定成該光源的波長λ1可誘發或導致玻璃片G的表面以不同於光源的波長λ2發光。例如,該光源也經選定成該光源的波長λ1可誘發或導致玻璃片G的表面以比該光源之波長λ1長的波長λ2發螢光或發光。 In general, the optical system 14 includes a laser or other light source having a wavelength selected at least in part based on the optical properties of the glass sheet G. Light from the light source is directed by the optical system 14 to the glass sheet G. In one embodiment, the light source is selected to have a wavelength λ 1 in a harmonic narrow band that is opaque or substantially non-transmissive to the glass sheet G. The light source is also selected so that the wavelength λ 1 of the light source can induce or cause the surface of the glass sheet G to emit light at a wavelength λ 2 that is different from the wavelength λ 2 of the light source. For example, the light source is also selected so that the wavelength λ 1 of the light source can induce or cause the surface of the glass sheet G to fluoresce or emit light at a wavelength λ 2 that is longer than the wavelength λ 1 of the light source.

光學系統14有偵測從玻璃片G射出之光線的至少一攝影機或其 他偵測器。光學系統14也包括各種光學元件以控制及引導從光源到玻璃片G以及從玻璃片G到偵測器的光線。 The optical system 14 has at least one camera or other detector for detecting light emitted from the glass sheet G. The optical system 14 also includes various optical elements to control and guide the light from the light source to the glass sheet G and from the glass sheet G to the detector.

光學系統14有至少一電腦及/或控制單元,其包括至少一處理器,其經程式化為可執行邏輯用以控制包括該光源及該偵測器的該光學系統,獲取來自各個玻璃片之偵測器的資料,分析玻璃片的資料,且提供與表面形狀有關的資訊、反射光學失真、或玻璃片的其他表面資訊或缺陷。電腦可與檢測系統10的控制系統16集成,如圖示,或可提供作為與控制系統16通訊的個別裝置。 The optical system 14 has at least one computer and/or control unit, which includes at least one processor, which is programmed to execute logic to control the optical system including the light source and the detector, obtain data from the detector of each glass sheet, analyze the data of the glass sheet, and provide information related to the surface shape, reflected optical distortion, or other surface information or defects of the glass sheet. The computer can be integrated with the control system 16 of the detection system 10, as shown, or can be provided as a separate device that communicates with the control system 16.

光學系統14因此提供非接觸檢測系統用於快速獲取對應至玻璃片G表面的詳細資料以及分析獲取的表面資料以評定及報告玻璃片G的表面形狀和與玻璃片G之光學特性有關的性質,特別是,在彎曲、冷卻或其他加工運作之間或之後在輸送器12上運送的玻璃片G。 The optical system 14 thus provides a non-contact inspection system for quickly acquiring detailed data corresponding to the surface of the glass sheet G and analyzing the acquired surface data to evaluate and report the surface shape of the glass sheet G and properties related to the optical characteristics of the glass sheet G, particularly, the glass sheet G transported on the conveyor 12 between or after bending, cooling or other processing operations.

檢測系統10包括可程式控制單元或控制系統16,在此具體實施例描繪為電腦。電腦16可與光學系統14的電腦通訊或集成。電腦16包括至少一處理器,其經程式化為可在玻璃片於輸送器上前進時偵測它,且控制馬達(s)以控制輸送器12的移動及速度。 The detection system 10 includes a programmable control unit or control system 16, which is specifically described as a computer in this embodiment. The computer 16 can communicate with or be integrated with the computer of the optical system 14. The computer 16 includes at least one processor that is programmed to detect the glass sheet as it advances on the conveyor and control the motor(s) to control the movement and speed of the conveyor 12.

輸送器12使玻璃片G沿著一路徑或在一方向移動,在此圖示為y方向,通過光學系統14。輸送器12的移動使用一或多個馬達及支承輥輪或其他裝置。 The conveyor 12 moves the glass sheet G along a path or in a direction, shown here as the y direction, through the optical system 14. The conveyor 12 is moved using one or more motors and support rollers or other devices.

檢測系統10有一或多個位置感測器18以判定輸送器12的位置及時序以在玻璃片G移動通過系統10時使用光學系統14分析玻璃片G。位置感測器(s)18可由數位編碼器、光學編碼器或其類似者提供。可選擇輸送器12的速度及玻璃片G的速度以允許來自光學系統14光源的光線在玻璃片G表面之一區域上有充分的滯留時間以造成該表面發螢光,同時維持玻璃片G的直線運行。在一 實施例中,輸送器12以0.1至0.2米/秒的速度連續移動,或以與光學系統14協調的速率移動以基於玻璃面板G的指定移動來獲取資料,例如在1至4毫米範圍內的移動。在進一步的實施例中,輸送器12的移動致使在約10至15秒的時框內可檢測玻璃面板G。在另一實施例中,使該輸送器以0.01米/秒或更多的速度連續移動以基於玻璃面板G約5毫米或更小的移動來獲取資料。來自玻璃片的資料的獲取可基於玻璃面板G對應至網格大小(grid size)的變化移動,且可小於5毫米,小於2毫米,約1毫米,或另一數值。又在另一實施例中,可增加輸送器的速度藉此基於玻璃面板G約5毫米以上的移動來獲取資料,例如有5毫米以上的網格大小,或10毫米以上。當輸送器的速度減少時,掃描面板G的時間增加,且可約數秒、數十秒、或數分鐘,例如兩分鐘。對於有複雜表面外形的玻璃面板G,掃描面板的時間同樣可能增加,因為使用較小的網格大小可能需要增加解析度。位置感測器18可用作光學系統14的輸入以判定資料獲取的時序,例如作為攝影機的觸發器。 The inspection system 10 has one or more position sensors 18 to determine the position and timing of the conveyor 12 to analyze the glass sheet G using the optical system 14 as the glass sheet G moves through the system 10. The position sensor(s) 18 may be provided by a digital encoder, an optical encoder, or the like. The speed of the conveyor 12 and the speed of the glass sheet G may be selected to allow sufficient residence time for light from the light source of the optical system 14 on an area of the surface of the glass sheet G to cause the surface to fluoresce, while maintaining straight-line travel of the glass sheet G. In one embodiment, the conveyor 12 moves continuously at a speed of 0.1 to 0.2 m/s, or moves at a rate coordinated with the optical system 14 to obtain data based on a specified movement of the glass panel G, such as a movement in the range of 1 to 4 mm. In a further embodiment, the movement of the conveyor 12 enables the glass panel G to be detected within a time frame of about 10 to 15 seconds. In another embodiment, the conveyor is continuously moved at a speed of 0.01 m/s or more to obtain data based on a movement of the glass panel G of about 5 mm or less. The acquisition of data from the glass sheet can be based on the changing movement of the glass panel G corresponding to the grid size, and can be less than 5 mm, less than 2 mm, about 1 mm, or another value. In another embodiment, the speed of the conveyor can be increased to obtain data based on a movement of the glass panel G of more than about 5 mm, for example, with a grid size of more than 5 mm, or more than 10 mm. When the speed of the conveyor is reduced, the time to scan the panel G increases, and can be about a few seconds, tens of seconds, or a few minutes, for example, two minutes. For glass panels G with complex surface contours, the time to scan the panel may also increase, as the use of smaller grid sizes may require increased resolution. The position sensor 18 can be used as an input to the optical system 14 to determine the timing of data acquisition, such as as a trigger for a camera.

檢測系統10可設有附加感測器,例如光電感測器或其類似者,其與控制系統16通訊以判定玻璃片G在輸送器12上的適當位置,或已前進到光學系統14。電腦16隨後與光學系統14通訊以激活系統14且開始測量片G的表面。在其他實施例中,光學系統14可持續運作且開始獲取及處理與玻璃片G有關的資料以響應系統14偵測器記錄到表示光源已開始與玻璃片G相互作用的適當訊號。 The detection system 10 may be provided with additional sensors, such as photoelectric sensors or the like, which communicate with the control system 16 to determine that the glass sheet G is in the proper position on the conveyor 12, or has advanced to the optical system 14. The computer 16 then communicates with the optical system 14 to activate the system 14 and begin measuring the surface of the glass sheet G. In other embodiments, the optical system 14 may continue to operate and begin to acquire and process data related to the glass sheet G in response to the system 14 detector recording an appropriate signal indicating that the light source has begun to interact with the glass sheet G.

請參考圖2至圖4,詳述根據各種具體實施例的光學系統14。在揭露的具體實施例中,光源由雷射50提供,且可為二極體雷射。雷射50可以二極體雷射封裝成有適當基座及透鏡以提供準直光束,且另外可設有散熱器。在其他具體實施例中,雷射50可由另一雷射或雷射組合提供,其經組配為在所欲雷射強度及其他光束參數可提供有所欲波長的雷射光。在進一步的具體實施例 中,該光源可提供作為紫外線光源,其具有相關濾波器及光學元件以提供引導至玻璃片G的光切頁(light sheet)。在進一步的具體實施例中,系統14可設有一個以上的雷射50。 Please refer to Figures 2 to 4 for a detailed description of the optical system 14 according to various specific embodiments. In the disclosed specific embodiment, the light source is provided by a laser 50, which can be a diode laser. The laser 50 can be packaged as a diode laser with an appropriate base and lens to provide a collimated beam, and a heat sink can also be provided. In other specific embodiments, the laser 50 can be provided by another laser or a combination of lasers, which are configured to provide laser light of a desired wavelength at a desired laser intensity and other beam parameters. In a further specific embodiment, the light source can be provided as an ultraviolet light source, which has associated filters and optical elements to provide a light sheet directed to the glass sheet G. In a further specific embodiment, the system 14 can be provided with more than one laser 50.

基於由鈉鈣矽酸鹽玻璃形成之玻璃片G的所欲用途,雷射50經選定成有在紫外線範圍中的波長,且在對於玻璃片G不透明或不透射或對於玻璃片G實質不透射的特定波長有例如小於5%或2%的雷射輸出透射率。在揭露的實施例中,雷射50由脈衝二極體固態雷射提供,其經諧調為可輸出有中心波長λ1的光線。可選擇中心波長以與玻璃片G的不透明度或不透射率對應,且可為非可見光波長,而且也被選定成可誘發玻璃片G表面發螢光或發光。該中心波長可小於350奈米,且在一實施例中,提供在紫外線範圍中的266奈米。 Based on the intended use of the glass sheet G formed of sodium calcium silicate glass, the laser 50 is selected to have a wavelength in the ultraviolet range and a laser output transmittance of, for example, less than 5% or 2% at a specific wavelength that is opaque or non-transmissive to the glass sheet G or substantially non-transmissive to the glass sheet G. In the disclosed embodiment, the laser 50 is provided by a pulsed diode solid-state laser that is tuned to output light having a central wavelength λ 1. The central wavelength may be selected to correspond to the opacity or non-transmissivity of the glass sheet G and may be a non-visible wavelength and is also selected to induce fluorescence or luminescence on the surface of the glass sheet G. The central wavelength may be less than 350 nanometers and, in one embodiment, 266 nanometers in the ultraviolet range are provided.

在一實施例中,該雷射在15千赫有150微焦耳的功率輸出。在進一步的實施例中,可提供有其他功率輸出及重複率的雷射50,以及可考慮在266奈米中心波長有500-100微焦耳及一千赫或更多的雷射。系統10、14可經組配為在指定時段內可測量玻璃片G,例如,每片約10秒,然而基於片體大小及模型的所欲解析度,也可考慮其他時間。當然,基於玻璃片G的組合物,可選擇其他波長。 In one embodiment, the laser has a power output of 150 microjoules at 15 kHz. In further embodiments, lasers 50 with other power outputs and repetition rates may be provided, and lasers with 500-100 microjoules and 1 kHz or more at a center wavelength of 266 nanometers are contemplated. Systems 10, 14 may be configured to measure glass sheets G within a specified time period, for example, approximately 10 seconds per sheet, although other times may be contemplated based on sheet size and desired resolution of the model. Of course, other wavelengths may be selected based on the composition of glass sheets G.

圖3圖示鈉鈣矽酸鹽玻璃之透射率相對於入射光波長的曲線圖。由該圖可見,玻璃片G的透射率隨著入射光的波長遞減而銳減且近似不透明材料。雷射50的波長也繪於圖上,且顯示玻璃片G在此波長不透明。對於有另一塊材組合物的玻璃片G,可選擇諧調至另一波長的雷射50供使用於光學檢測系統10致使選定波長不透射穿過玻璃片G,且在玻璃片G中誘發發光或發螢光。 FIG3 illustrates a curve of the transmittance of sodium calcium silicate glass relative to the wavelength of the incident light. As can be seen from the figure, the transmittance of the glass sheet G decreases sharply as the wavelength of the incident light decreases and is close to an opaque material. The wavelength of the laser 50 is also plotted on the graph, and it is shown that the glass sheet G is opaque at this wavelength. For the glass sheet G having another material composition, the laser 50 tuned to another wavelength can be selected for use in the optical detection system 10 so that the selected wavelength does not transmit through the glass sheet G and induces luminescence or fluorescence in the glass sheet G.

請再參考圖2,數個光學元件54設在雷射50下游以與雷射光束相互作用,塑形及引導雷射光束朝向玻璃片G。光學元件54可包括一或多個光束 整形器、透鏡、反射鏡及其類似者。在揭露具體實施例中,藉由把雷射光束的準直高斯光束輪廓轉換為有更均勻強度分布且無內部雷射聚焦的準直平頂輪廓光束,提供光束整形器55以提高雷射強度的均勻度,藉此導致雷射線強度在玻璃片G表面上的均勻度增加。提供第一透鏡56以從雷射光束52形成平面雷射切頁(planar laser sheet)。在揭露具體實施例中,第一透鏡56為柱狀平凹透鏡,其焦距係基於雷射50相對於輸送器及玻璃片的定位來選定,或從雷射50到玻璃片G的距離D1。為了進一步聚焦平面雷射切頁,也可提供第二透鏡58。在揭露具體實施例中,第二透鏡58可為柱狀平凹透鏡以進一步聚焦平面雷射切頁。可提供附加聚焦透鏡57以窄化及聚焦雷射切頁。雖然圖示第二透鏡58在第一透鏡56之後或其下游,然而在其他具體實施例中,可改變或顛倒透鏡56、57、58的定位致使第二透鏡58在第一透鏡56之前。基於形成玻璃片G之材料的不透明度,透鏡56、57、58用來以266奈米的諧調中心波長λ1形成引導至玻璃片G之第一表面62的聚焦平面雷射切頁60。在圖示實施例中,光學元件56、57、58各自由f=-8毫米平凹柱狀透鏡,f=1000毫米平凸柱狀聚焦透鏡,及f=-25毫米平凹柱狀透鏡提供。光學元件54合作形成在玻璃片G表面上有1至2毫米束寬的平面雷射切頁。在另一實施例中,該等光學元件可具有不同的焦距,且焦距及透鏡選擇可部份基於面板G的大小。在其他具體實施例中,在雷射50、玻璃片G之間可裝設例如濾波器、截波器(chopper)及其類似者的附加光學元件。 Referring again to FIG. 2 , a plurality of optical elements 54 are provided downstream of the laser 50 to interact with the laser beam, shape and direct the laser beam toward the glass sheet G. The optical elements 54 may include one or more beam shapers, lenses, reflectors and the like. In the disclosed embodiment, a beam shaper 55 is provided to improve the uniformity of the laser intensity by converting the collimated Gaussian beam profile of the laser beam into a collimated flat-top profile beam with a more uniform intensity distribution and without internal laser focusing, thereby resulting in an increase in the uniformity of the laser line intensity on the surface of the glass sheet G. A first lens 56 is provided to form a planar laser sheet from the laser beam 52. In the disclosed embodiment, the first lens 56 is a cylindrical plano-concave lens, and its focal length is selected based on the positioning of the laser 50 relative to the conveyor and the glass sheet, or the distance D1 from the laser 50 to the glass sheet G. In order to further focus the planar laser cut page, a second lens 58 may also be provided. In the disclosed embodiment, the second lens 58 may be a cylindrical plano-concave lens to further focus the planar laser cut page. An additional focusing lens 57 may be provided to narrow and focus the laser cut page. Although the second lens 58 is shown after or downstream of the first lens 56, in other embodiments, the positioning of the lenses 56, 57, 58 may be changed or reversed so that the second lens 58 is before the first lens 56. Based on the opacity of the material forming the glass sheet G, lenses 56, 57, 58 are used to form a focused plane laser cutting page 60 directed to the first surface 62 of the glass sheet G at a harmonic center wavelength λ 1 of 266 nanometers. In the illustrated embodiment, the optical elements 56, 57, 58 are each provided by an f=-8 mm plano-concave cylindrical lens, an f=1000 mm plano-convex cylindrical focusing lens, and an f=-25 mm plano-concave cylindrical lens. The optical element 54 cooperates to form a planar laser cutting page with a beam width of 1 to 2 mm on the surface of the glass sheet G. In another embodiment, the optical elements can have different focal lengths, and the focal length and lens selection can be based in part on the size of the panel G. In other embodiments, additional optical elements such as filters, choppers, and the like may be installed between the laser 50 and the glass sheet G.

替換地或另外,例如鮑爾透鏡(Powell lens)的其他光學元件可用來提供雷射強度在平面雷射切頁上的更均勻分布。此外,儘管一個雷射50圖示於圖2至圖4,然而在其他具體實施例中,系統14可設有一個以上的雷射50。例如,系統14可具有引導至玻璃片G之不同區域的兩個雷射50,或光束經對齊成可在玻璃片G上形成共用切頁(common sheet)。雷射切頁的強度在來自一雷射的雷射切頁上例如隨著分布而有所不同,且多個雷射可用來在玻璃片G的表面上 提供更均勻的強度,或提供各自用於多個攝影機的螢光線。 Alternatively or in addition, other optical elements such as Powell lenses may be used to provide a more uniform distribution of laser intensity on the planar laser sheet. Furthermore, although one laser 50 is illustrated in FIGS. 2-4 , in other embodiments, the system 14 may be provided with more than one laser 50. For example, the system 14 may have two lasers 50 directed to different regions of the glass sheet G, or the beams may be aligned to form a common sheet on the glass sheet G. The intensity of the laser sheet may vary, for example, with the distribution of the laser sheet from one laser, and multiple lasers may be used to provide a more uniform intensity on the surface of the glass sheet G, or to provide fluorescent light for multiple cameras, respectively.

玻璃片G有形成玻璃片G之第一及第二面的第一及第二表面62、64。第一及第二表面62、64互相分開有玻璃片G的厚度。由於雷射切頁60的波長λ1對於玻璃片G不透明或實質不透射,雷射切頁60與第一表面62相互作用而不行進穿過玻璃片G或至第二表面64,且因此只在第一表面62激發玻璃片G。可改變玻璃片G的厚度,亦即第一及第二表面62、64的距離,且在有些實施例中,其大於1.2毫米或大於1.6毫米,且在一非限定性實施例中,落在1.6至25毫米的範圍內。 The glass sheet G has first and second surfaces 62, 64 forming the first and second sides of the glass sheet G. The first and second surfaces 62, 64 are separated from each other by the thickness of the glass sheet G. Since the wavelength λ1 of the laser cutting page 60 is opaque or substantially non-transmissive to the glass sheet G, the laser cutting page 60 interacts with the first surface 62 without traveling through the glass sheet G or to the second surface 64, and thus excites the glass sheet G only at the first surface 62. The thickness of the glass sheet G, i.e., the distance between the first and second surfaces 62, 64, can vary, and in some embodiments, is greater than 1.2 mm or greater than 1.6 mm, and in a non-limiting embodiment, falls within the range of 1.6 to 25 mm.

平面雷射切頁60可經定向成它橫向或在x方向延伸到皮帶。雷射切頁60與玻璃片G的第一表面62沿著路徑66(或雷射切頁60與玻璃片G第一表面62的交叉處)相互作用。以平面玻璃片G而言,路徑66為直線。就彎曲玻璃片G而言,在雷射切頁60與彎曲表面相互作用時,路徑66可隨著玻璃片G沿著表面62的曲率而改變。 The planar laser cutting page 60 can be oriented so that it extends transversely or in the x-direction to the belt. The laser cutting page 60 interacts with the first surface 62 of the glass sheet G along a path 66 (or the intersection of the laser cutting page 60 and the first surface 62 of the glass sheet G). For a planar glass sheet G, the path 66 is a straight line. For a curved glass sheet G, the path 66 can change with the curvature of the glass sheet G along the surface 62 as the laser cutting page 60 interacts with the curved surface.

雷射切頁60在第一表面62激發玻璃片G的材料且造成在第一表面62發光。玻璃片G沿著激發的雷射線66發螢光以放射比λ1長的波長λ2。在本實施例中,來自玻璃片G的放射光70有在可見光範圍中或在近紫外線範圍中的波長λ2,且顯現為沿著表面62的線68與激發的線66。 Laser cutting 60 excites the material of glass sheet G at first surface 62 and causes luminescence at first surface 62. Glass sheet G fluoresces along excited laser line 66 to emit wavelength λ 2 longer than λ 1. In this embodiment, radiated light 70 from glass sheet G has a wavelength λ 2 in the visible range or in the near ultraviolet range and appears as line 68 along surface 62 and excited line 66.

放射光70用例如攝影機72的偵測器偵測。該攝影機可設有電荷耦合裝置(CCD)影像感測器或互補金屬氧化物半導體(CMOS)影像感測器。在本實施例中以及如圖2所示,偵測器72設有CMOS感測器且經定位成,可將玻璃片G的全寬,或在x方向的玻璃片,攝入影像。在圖示實施例中,該攝影機由有5496x3672像素的CMOS感測器攝影機提供,在一實施例中,它設定在有5496x1836或5496x1000像素的感興趣區,或在另一實施例中,為有5120x5120像素的CMOS感測器。各種攝影機設定的控制可基於雷射參數、輸送器速度、 及其他系統因子,而且這些攝影機設定包括透鏡焦距、孔徑,增益、與曝光時間。在一實施例中,該攝影機使用固定透鏡,例如16毫米或25毫米透鏡,且設定至f2.4孔徑或更高的孔徑用於增加景深,且使用15-20毫秒的曝光時間和2-15分貝的增益。在另一實施例中,該等攝影機設定可使用另一曝光時間,例如在10毫秒至300毫秒或更多之間,且增益同樣可設定至2至30分貝之間的另一數值。在其他實施例中,攝影機72可經定位以只拍照玻璃片G的選定區域。在進一步的實施例中,該偵測器可裝設為另一光偵測器或光感測元件。在進一步的實施例中,例如濾波器的附加光學元件可設在玻璃片G、偵測器72之間以進一步提高訊號雜訊比。 The radiation 70 is detected by a detector such as a camera 72. The camera may be provided with a charge coupled device (CCD) image sensor or a complementary metal oxide semiconductor (CMOS) image sensor. In the present embodiment and as shown in FIG2 , the detector 72 is provided with a CMOS sensor and is positioned so as to image the full width of the glass sheet G, or the glass sheet in the x-direction. In the illustrated embodiment, the camera is provided by a CMOS sensor camera having 5496x3672 pixels, in one embodiment it is arranged at a region of interest having 5496x1836 or 5496x1000 pixels, or in another embodiment, a CMOS sensor having 5120x5120 pixels. The control of various camera settings may be based on laser parameters, conveyor speed, and other system factors, and these camera settings include lens focal length, aperture, gain, and exposure time. In one embodiment, the camera uses a fixed lens, such as a 16 mm or 25 mm lens, and is set to an aperture of f2.4 or higher for increased depth of field, and uses an exposure time of 15-20 milliseconds and a gain of 2-15 dB. In another embodiment, the camera settings may use another exposure time, such as between 10 milliseconds and 300 milliseconds or more, and the gain may also be set to another value between 2 and 30 dB. In other embodiments, the camera 72 may be positioned to photograph only selected areas of the glass sheet G. In a further embodiment, the detector may be configured as another light detector or light sensing element. In a further embodiment, an additional optical element such as a filter may be provided between the glass sheet G and the detector 72 to further improve the signal-to-noise ratio.

在其他實施例中且如圖4至圖5所示,光學系統14可使用一個以上的攝影機72。圖4至圖5為示意圖且未圖示各種系統14組件,例如光學元件、控制器等等。在圖4中,一對攝影機72A、72B位在雷射切頁60的一側上。各攝影機72A、72B拍照玻璃片G的區域73A、73B,且該等區域互相重疊例如約10厘米。利用圖3系統中一個以上的攝影機,基於各攝影機的較長焦距,玻璃片G表面的最終表面圖可減少由光學失真引進的誤差。此外,使用有兩個或多個攝影機的光學系統14也可提供用於玻璃表面的較高解析度成像,例如增加玻璃片G每單位表面積的像素,以及在攝影機實體比較靠近玻璃片G時提高準確度及靈敏度。 In other embodiments and as shown in FIGS. 4-5 , more than one camera 72 may be used with the optical system 14. FIGS. 4-5 are schematic diagrams and do not illustrate various components of the system 14, such as optical elements, controllers, etc. In FIG. 4 , a pair of cameras 72A, 72B are located on one side of the laser cut page 60. Each camera 72A, 72B photographs an area 73A, 73B of the glass sheet G, and the areas overlap each other by, for example, about 10 centimeters. By using more than one camera in the system of FIG. 3 , the final surface image of the surface of the glass sheet G can reduce errors introduced by optical distortion due to the longer focal length of each camera. In addition, the optical system 14 using two or more cameras can also provide higher resolution imaging for the glass surface, such as increasing the pixels per unit surface area of the glass sheet G, and improving accuracy and sensitivity when the camera is physically closer to the glass sheet G.

在圖5中,裝設一對攝影機72A、72B,其中雷射切頁60位在攝影機72A、72B之間。各攝影機72A、72B拍照玻璃片G的區域73A、73B,且該等區域互相重疊例如約10厘米。利用圖3系統中一個以上的攝影機,玻璃片G表面的最終表面圖可減少由光學失真引進的誤差。此外,攝影機72A、72B經定位以,例如在一個攝影機72A在圖4中對於玻璃片G表面左邊有受阻視線或有小入射角或掠射角時,拍照有高度曲率的玻璃片G。在又一具體實施例中,系統14 可具有兩個以上的攝影機。例如,可想到,可裝設在雷射切頁60兩邊各有兩個的4個攝影機72,且所有4個攝影機的區域互相重疊。在其他實施例中,可存在4個以上的攝影機72。 In FIG. 5 , a pair of cameras 72A, 72B are provided, with the laser cutter 60 positioned between the cameras 72A, 72B. Each camera 72A, 72B photographs an area 73A, 73B of the glass sheet G, and the areas overlap each other by, for example, about 10 centimeters. By using more than one camera in the system of FIG. 3 , the final surface image of the surface of the glass sheet G can reduce errors introduced by optical distortion. In addition, the cameras 72A, 72B are positioned to photograph a glass sheet G with a high degree of curvature, for example, when one camera 72A has an obstructed view to the left of the surface of the glass sheet G in FIG. 4 or has a small angle of incidence or a grazing angle. In another embodiment, the system 14 may have more than two cameras. For example, it is conceivable that four cameras 72 may be installed, two on each side of the laser cutting page 60, and the areas of all four cameras overlap each other. In other embodiments, there may be more than four cameras 72.

請再參考圖2,雷射50及攝影機72與控制單元中的至少一電腦80通訊。電腦80可連接至控制系統16或檢測系統10或與其集成。電腦80有影像處理器單元82而且也連接至記憶體。電腦80可接收來自控制系統16及位置感測器的資訊以用來判定何時送出觸發訊號給圖2及圖4至圖5的攝影機(s)72。例如,基於玻璃片G的1-4毫米對應移動,該(等)攝影機可以達80fps的框速率(frame rate)來獲取資料,或達160fps。 Referring again to FIG. 2 , the laser 50 and the camera 72 communicate with at least one computer 80 in the control unit. The computer 80 may be connected to or integrated with the control system 16 or the detection system 10 . The computer 80 has an image processor unit 82 and is also connected to a memory. The computer 80 may receive information from the control system 16 and the position sensor to determine when to send a trigger signal to the camera(s) 72 of FIG. 2 and FIG. 4 to FIG. 5 . For example, based on a 1-4 mm corresponding movement of the glass sheet G, the camera(s) may acquire data at a frame rate of up to 80 fps, or up to 160 fps.

電腦80接收來自攝影機72的影像資料。電腦80使用來自影像的資料形成矩陣或點雲,例如矩陣中的單元(cell)與玻璃片表面62上的位置關聯,或點雲中的點陣列與玻璃片表面62上的位置關聯。影像資料可提供作為一系列灰階值,其中各值在0至255之間,如果基於8位元灰階的話。在其他實施例中,該影像資料可提供作為各自對應至如攝影機感測器所偵測之紅、綠、藍區塊或色彩分量的一系列RGB訊號,可基於不同的色彩空間及色彩模型來提供,或可提供作為另一位元值。以下參考圖6至圖13提供資料獲取以及雲前(pre-cloud)及雲後(post-cloud)資料處理的進一步細節。 Computer 80 receives image data from camera 72. Computer 80 uses the data from the image to form a matrix or point cloud, such as associating cells in the matrix with locations on glass sheet surface 62, or associating arrays of points in the point cloud with locations on glass sheet surface 62. The image data may be provided as a series of grayscale values, where each value is between 0 and 255, if based on an 8-bit grayscale. In other embodiments, the image data may be provided as a series of RGB signals each corresponding to a red, green, and blue block or color component as detected by a camera sensor, may be provided based on different color spaces and color models, or may be provided as another cell value. Further details of data acquisition and pre-cloud and post-cloud data processing are provided below with reference to FIGS. 6 to 13.

圖6的流程圖根據一具體實施例使用光學檢測系統的方法200用於判定玻璃片G表面的三維圖。在各種具體實施例中,方法200可各自與圖1至圖2及圖4至圖5之系統10、14一起使用,且根據各種具體實施例,可重新排列或省略數個步驟,或可添加附加步驟。 The flowchart of FIG6 is a method 200 for determining a three-dimensional image of the surface of a glass sheet G using an optical detection system according to a specific embodiment. In various specific embodiments, the method 200 can be used with the systems 10 and 14 of FIGS. 1 to 2 and 4 to 5, respectively, and according to various specific embodiments, several steps can be rearranged or omitted, or additional steps can be added.

在步驟202,基於玻璃片的透射率,選擇例如紫外線波長的第一波長,其中選擇實質不透射穿過玻璃片的第一波長。在步驟204,例如,使用紫外線雷射,以該第一波長形成一平面光切頁。 In step 202, a first wavelength, such as an ultraviolet wavelength, is selected based on the transmittance of the glass sheet, wherein the first wavelength is selected to be substantially non-transmissive through the glass sheet. In step 204, a planar optical section is formed with the first wavelength, for example, using an ultraviolet laser.

在步驟206,校準光學系統14。各自校準該(等)攝影機及該(等)雷射。提供棋盤圖表或其他習知平面校準表面而不是玻璃片G,且大約位在玻璃片G的中間z-距離,或在界定用於該(等)攝影機之定界框(bounding box)的中間。用於該等攝影機的定界框被定義為一立體空間,其考慮到足夠的垂直深度或景深以包含玻璃片G的上界及下界,同時忽略任何底下的夾具支承表面。在一實施例中,該定界框有約10-15厘米的深度,然而基於該部件的細節,可設想其他的尺寸。 In step 206, calibrate the optical system 14. Calibrate the camera(s) and the laser(s) individually. Provide a checkerboard chart or other known planar calibration surface instead of the glass sheet G and approximately at the middle z-distance of the glass sheet G, or in the middle of defining a bounding box for the camera(s). The bounding box for the cameras is defined as a three-dimensional space that allows for sufficient vertical depth or depth of field to include the upper and lower boundaries of the glass sheet G while ignoring any underlying fixture support surfaces. In one embodiment, the bounding box has a depth of approximately 10-15 cm, although other dimensions are contemplated based on the details of the component.

校準圖的位置因此為已知且提供該定界框之全域座標系統的基礎。該攝影機的校準基於靜止不動的校準圖,且選擇包括焦距、曝光、孔徑、增益及其類似者的攝影機設定。 The position of the calibration map is thus known and provides the basis for the global coordinate system of the bounding box. Calibration of the camera is based on the stationary calibration map and selection of camera settings including focus, exposure, aperture, gain and the like.

也校準該雷射。對於經定向成有雷射切頁沿著z軸延伸或在x-z平面中的雷射,該(等)攝影機偵測雷射切頁相對於校準圖的位置且使此一位置與全域座標系統關聯。對於不在x-z平面中的雷射,需要額外規測步驟以提供雷射切頁位置給全域座標系統。選擇包括強度及頻率的雷射設定。稍後參考在步驟214表面之z座標的判定,會使用相對於校準圖及全域座標系統的攝影機及雷射校準。 The laser is also calibrated. For lasers oriented with the laser page extending along the z axis or in the x-z plane, the camera(s) detect the position of the laser page relative to the calibration map and relate this position to the global coordinate system. For lasers not in the x-z plane, additional calibration steps are required to provide the laser page position to the global coordinate system. Laser settings including intensity and frequency are selected. Later reference is made to the determination of the z coordinate of the surface in step 214, using camera and laser calibration relative to the calibration map and the global coordinate system.

在步驟208,例如使用相關光件引導平面光切頁至玻璃片,且激發玻璃片的表面致使它以例如可見光波長的第二波長沿著平面光切頁與玻璃片面向光源之表面的交叉處的路徑放射光線。 In step 208, for example, a related optical element is used to guide the plane light cutting page to the glass sheet, and the surface of the glass sheet is excited so that it radiates light at a second wavelength, such as a visible light wavelength, along a path at the intersection of the plane light cutting page and the surface of the glass sheet facing the light source.

在步驟210,使用一或多個攝影機測量或偵測表示一系列之可見光波長線(visible wavelength line)的一系列資料,其中各攝影機拍照玻璃片G的感興趣區。對於有單一攝影機系統的光學系統14,攝影機72可偵測跨越面板或在面板上的感興趣區中偵測到的各條線。對於有多攝影機系統的光學系統14,各攝影機72可指向玻璃片G的重疊個別感興趣區且偵測感興趣區內的各條線。 In step 210, a series of data representing a series of visible wavelength lines is measured or detected using one or more cameras, where each camera photographs a region of interest of the glass sheet G. For an optical system 14 with a single camera system, the camera 72 can detect each line detected in the region of interest across the panel or on the panel. For an optical system 14 with a multi-camera system, each camera 72 can be pointed at overlapping individual regions of interest of the glass sheet G and detect each line within the region of interest.

在步驟212,處理及分析各可見光波長線以判定在與各條線關聯之一座標系列中的第一及第二座標,例如(x,y)座標,且將座標存入與攝影機關聯的矩陣或點雲。 In step 212, each visible light wavelength line is processed and analyzed to determine a first and second coordinate in a coordinate series associated with each line, such as (x, y) coordinates, and the coordinates are stored in a matrix or point cloud associated with the camera.

電腦80使用影像處理器單元82處理影像。圖7提供一段代表性示範影像以及基於下述影像處理的相關示意重疊區。 Computer 80 processes the image using image processor unit 82. FIG. 7 provides a representative example image and associated schematic overlays based on the image processing described below.

電腦80及影像處理器82可處理影像以減少雜訊,例如,藉由應用閾值於影像,歸一化該影像,使用快速傅立葉轉換來轉換影像,及其類似者。在一實施例中,使用用於去雜訊的中數濾波器(median filter)來過濾影像,包括斑點雜訊(speckle noise)。去雜訊步驟的需要可能隨著攝影機增益設定的增加而增加。 The computer 80 and the image processor 82 may process the image to reduce noise, for example, by applying a threshold to the image, normalizing the image, transforming the image using a fast Fourier transform, and the like. In one embodiment, the image is filtered using a median filter for removing noise, including speckle noise. The need for a noise removal step may increase as the camera gain setting increases.

電腦80及影像處理器82基於指示線寬大小輸入及最小強度來選擇影像中的線寬區域(line width region)。藉由選擇線寬區域,在隨後步驟的處理及判定座標中使用影像的縮小區域。例如,可選擇指示線寬作為有公差因子的標稱值。在一實施例中,選擇在3-10像素之間的標稱線寬,且選擇在1-5像素之間的公差。在另一實施例中,選擇在4-6像素之間的標稱線寬,且選擇在2-3像素之間的公差。又在另一實施例中,選擇有一個像素之最小寬度的指示線寬。也選擇強度作為輸入且可部份基於螢光線在相關框速率的預期強度,且排除含有不必要地包括在內之背景雜訊的像素。在各種實施例中,在5/255、10/255、20/255、30/255或另一數值的灰階上選擇最小強度。圖7中的區域250為選定線寬區域的一實施例。 The computer 80 and image processor 82 select a line width region in the image based on the indicated line width size input and the minimum intensity. By selecting the line width region, the reduced area of the image is used in the processing and determining coordinates in subsequent steps. For example, the indicated line width can be selected as a nominal value with a tolerance factor. In one embodiment, a nominal line width between 3-10 pixels is selected, and a tolerance between 1-5 pixels is selected. In another embodiment, a nominal line width between 4-6 pixels is selected, and a tolerance between 2-3 pixels is selected. In yet another embodiment, an indicated line width with a minimum width of one pixel is selected. Intensity is also selected as an input and can be based in part on the expected intensity of the fluorescence at the relevant frame rate, and excludes pixels that contain background noise that is not necessarily included. In various embodiments, the minimum intensity is selected on a grayscale of 5/255, 10/255, 20/255, 30/255, or another value. Region 250 in Figure 7 is an embodiment of a selected line width region.

在玻璃片G對於以第二波長λ2放射的可見光是透明且從表面62射出的光線可穿過及/或從另一表面64反射時,實驗顯示,後表面64的任何反射有極低訊號且大體可作為雜訊丟掉。例如,放射線68在後表面64上的反射在獲取影像中的灰階約為5/255,同時原放射線(primary emission line)68的灰階約為 20至100/255,致使反射訊號可視為雜訊。此外,基於反射線在影像中的位置以及與原可見光線(primary visible line)的間隔,反射線可排除在外或在選定線寬區域250的範圍外,致使資料處理時不再考慮它。在反射線充分靠近放射線68致使使用線寬區域250無法合意地排除在外的情形下,資料處理時可包括該反射線;不過,資料處理由於反射線的低訊號而不被大幅影響。替換地以及在第二反射線存在下,資料處理可選擇發螢光線(fluorescing line)以考慮到攝影機幾何,諸線基於面板的位置,比反射線高的螢光線亮度,及其他因子。資料處理可進一步接收關於面板G材料的輸入。例如,可預期錫側浮製玻璃(tin-side float glass)的影像有反射線,同時空氣側浮製玻璃的影像可能不存在反射線。 When the glass sheet G is transparent to visible light emitted at the second wavelength λ2 and the light emitted from the surface 62 can pass through and/or reflect from the other surface 64, experiments have shown that any reflection from the rear surface 64 has a very low signal and can be discarded as noise. For example, the reflection of the radiation line 68 on the rear surface 64 has a gray level of about 5/255 in the acquired image, while the gray level of the primary emission line 68 is about 20 to 100/255, so that the reflection signal can be regarded as noise. In addition, based on the position of the reflected line in the image and the spacing from the primary visible line, the reflected line can be excluded or outside the range of the selected line width area 250 so that it is no longer considered in data processing. In the event that a reflection line is sufficiently close to radiation line 68 that it cannot be desirably excluded using linewidth region 250, the reflection line may be included in the data processing; however, the data processing is not significantly affected due to the low signal of the reflection line. Alternatively and in the presence of a second reflection line, the data processing may select the fluorescing line to take into account camera geometry, the position of the lines based on the panel, the higher brightness of the fluorescence line than the reflection line, and other factors. The data processing may further receive input regarding the material of panel G. For example, an image of tin-side float glass may be expected to have a reflection line, while an image of air-side float glass may not have a reflection line.

電腦80及影像處理器82基於影像資料和可見光螢光線中之像素的灰階位準來判定或計算模型線上的點。由示範影像可見,可獲取在區域250內沿著y方向延伸跨越多個像素的表面62放射光。同樣地,電腦80基於像素之灰階值來計算用於模型線的點作為一座標或(x,y)資料集系列。例如,將模型線100計算得到的點覆蓋於圖4上。 Computer 80 and image processor 82 determine or calculate points on the model line based on the image data and the gray level of the pixels in the visible light fluorescence. From the example image, it can be seen that the surface 62 radiates light extending across multiple pixels in the y direction in the area 250. Similarly, computer 80 calculates the points for the model line as a series of coordinates or (x, y) data sets based on the gray level of the pixels. For example, the points calculated for the model line 100 are overlaid on Figure 4.

在一實施例中,電腦及影像處理器可平均相鄰像素的群組以找出各點及(x,y)資料集作為模型線的估計中心,且可為該影像中在x方向的各個像素提供一個(x,y)資料集。在其他實施例中,電腦及影像處理器可執行像素的加權平均以找出各點及(x,y)資料集作為該線的估計中心。電腦及影像處理器使用該等像素值的分布函數可計算該等點及(x,y)資料集,例如高斯分布,平均或中值寬度,或其他數學函數。電腦及影像處理器替換地可使用已知市售影像程式庫處理工具或軟體使用像素資料來判定用於該等資料集的數值。 In one embodiment, the computer and image processor may average groups of adjacent pixels to find each point and (x, y) data set as the estimated center of the model line, and may provide a (x, y) data set for each pixel in the image in the x direction. In other embodiments, the computer and image processor may perform a weighted average of the pixels to find each point and (x, y) data set as the estimated center of the line. The computer and image processor may calculate the points and (x, y) data sets using a distribution function of the pixel values, such as a Gaussian distribution, mean or median width, or other mathematical function. The computer and image processor may alternatively use known commercially available image library processing tools or software to use the pixel data to determine the values for the data sets.

然後,電腦80輸入該等(x,y)資料集系列於矩陣的相關單元中,或於點雲中。該資料集可包括來自如從影像判定之模型線的一座標系列。各資料集可包括玻璃片G表面62在x-y平面中之位置的(x,y)值,彼等集體界定模型 線100且連結至全域座標系統。 The computer 80 then inputs the series of (x, y) data sets in the relevant cells of the matrix, or in the point cloud. The data sets may include a series of coordinates from the model line as determined from the image. Each data set may include (x, y) values for the position of the surface 62 of the glass sheet G in the x-y plane, which collectively define the model line 100 and are linked to the global coordinate system.

該矩陣同樣可填充至一線掃描影像(linescan image),其中使用來自出於各個玻璃片G影像之模型線的座標填充矩陣中的各個橫列,以及後續的影像填充後續的橫列。同樣,可從玻璃片G的順序影像構成一點雲。在一實施例中,該矩陣可具有一單元和與來自該影像在x方向之各像素關聯的座標集。在其他實施例中,該矩陣可具有一單元和與多個相鄰像素關聯的座標集,致使電腦在進入該資料之前執行平均步驟或其類似者。在有些實施例中,可疏化該矩陣或點雲,例如,藉由刪去編號為n之倍數的收集資料集。 The matrix can also be populated to a linescan image, where each row in the matrix is populated with coordinates from the model lines from each glass sheet G image, and subsequent images populate subsequent rows. Similarly, a point cloud can be constructed from sequential images of glass sheet G. In one embodiment, the matrix can have a cell and a set of coordinates associated with each pixel from the image in the x direction. In other embodiments, the matrix can have a cell and a set of coordinates associated with multiple adjacent pixels, causing the computer to perform an averaging step or the like before entering the data. In some embodiments, the matrix or point cloud can be thinned, for example, by removing multiples of n in the collected data set.

在步驟214,使用雷射的位置、攝影機的位置、與第一及第二座標來三角測量例如(z)座標的第三座標,且存入矩陣或點雲。然後,電腦80計算各個(x,y)座標集的z值,其係與該座標集在玻璃片G表面62上的z-位置關聯。該z值的計算使用來自各單元之座標集的(x,y)值以及來自檢測系統10之雷射及攝影機在如以下在說明圖8A至圖8B時所述之三角測量計算中的定位。該電腦輸入(z)值於有對應(x,y)座標之矩陣中的相關單元以完成表面62的地圖。當在步驟212處理影像時,電腦及影像程序可計算各個座標集的(z)值,或在玻璃片已全部成像後,可計算矩陣或點雲中所有資料集的(z)值。 In step 214, a third coordinate, such as a (z) coordinate, is triangulated using the position of the laser, the position of the camera, and the first and second coordinates and stored in a matrix or point cloud. The computer 80 then calculates a z value for each (x, y) coordinate set that is associated with the z-position of that coordinate set on the surface 62 of the glass sheet G. The z value calculation uses the (x, y) values from each cell of the coordinate set and the positioning of the laser and camera from the detection system 10 in a triangulation calculation as described below in connection with FIGS. 8A-8B. The computer enters the (z) value for the associated cell in the matrix with the corresponding (x, y) coordinate to complete a map of the surface 62. When processing the image in step 212, the computer and imaging program can calculate the (z) value of each coordinate set, or after the entire glass sheet has been imaged, the (z) value of all data sets in the matrix or point cloud can be calculated.

圖8A至圖8B的視圖圖示在從如圖4所示之影像算出之每條線的座標系列中有關於與資料集D中之第一及第二(x,y)座標關聯之第三(z)座標的三角測量。雷射50與攝影機72可互相固定,以及雷射光束與所產生之平面雷射切頁也固定,致使玻璃片G在相對於光學系統14的方向y平移或移動且通過平面雷射切頁。由於雷射切頁及攝影機的位置已校準且連結至全域座標系統,因此可算出z座標。 The views of FIG. 8A-8B illustrate the triangulation of the third (z) coordinate associated with the first and second (x, y) coordinates in the data set D in the coordinate series of each line calculated from the image shown in FIG. 4. The laser 50 and camera 72 can be fixed to each other, and the laser beam and the resulting planar laser cut page are also fixed, so that the glass sheet G translates or moves in the direction y relative to the optical system 14 and through the planar laser cut page. Because the positions of the laser cut page and camera are calibrated and linked to the global coordinate system, the z coordinate can be calculated.

圖8A的側面示意圖圖示有上覆玻璃片G之校準圖C的光學系統14,而且也圖示定界框B。雷射切頁60的參照相對於校準圖C及全域座標系統。 同樣,攝影機中的各像素參照校準圖C及全域座標系統,致使各像素在(x,y,z)空間中有相關向量。用於資料集D的(x,y)座標可使用上述步驟212判定且綁定至基於圖示於圖8B之示意圖的全域座標系統。然後,參考圖8A的示意圖且使用三角測量技術,使用雷射切頁60與相關像素向量的交叉處,比較像素及向量會與校準圖C相交處,可算出全域座標系統中用於資料集D的z座標。因此,可算出座標系列中沿著該線之各個(x,y)座標的z值,且控制系統80隨後將此z座標輸入到矩陣單元或點雲中,其中已存在線中各點的(x,y)值。 The side schematic diagram of FIG8A illustrates the optical system 14 with calibration map C overlying the glass sheet G, and also illustrates the bounding box B. The reference of the laser cut page 60 is relative to the calibration map C and the global coordinate system. Similarly, each pixel in the camera is referenced to the calibration map C and the global coordinate system, so that each pixel has an associated vector in (x, y, z) space. The (x, y) coordinates for data set D can be determined using step 212 described above and tied to the global coordinate system based on the schematic diagram shown in FIG8B. Then, referring to the schematic diagram of FIG8A and using triangulation techniques, using the intersection of the laser cut page 60 and the associated pixel vector, comparing the pixel and vector to the intersection of the calibration map C, the z coordinate for data set D in the global coordinate system can be calculated. Thus, the z value of each (x, y) coordinate in the coordinate series along the line can be calculated, and the control system 80 then inputs this z coordinate into a matrix cell or point cloud, where the (x, y) value of each point in the line already exists.

在步驟216,隨後,針對玻璃片G在攝影機中一系列之可見光波長線之各者,從矩陣或點雲建立出玻璃片表面的作為座標系列之函數的三維圖。 In step 216, a three-dimensional map of the surface of the glass sheet as a function of the coordinate series is then created from the matrix or point cloud for each of the series of visible light wavelengths of the glass sheet G in the camera.

執行由區域218指示用於各攝影機來自各攝影機之資料的步驟。對於單一攝影機系統,步驟216產生玻璃面板G表面的最終矩陣或點雲。 The steps indicated by region 218 are performed for each camera with data from each camera. For a single camera system, step 216 produces a final matrix or point cloud of the surface of glass panel G.

對於多攝影機系統,提供附加步驟220以把來自不同攝影機的矩陣或點雲組合成代表玻璃片G的單一矩陣或點雲。圖9示意圖示用在步驟220的副程式以對齊多個矩陣或點雲,例如,使用圖示於圖4的雙攝影機系統。至於如圖5所示之雙攝影機系統或有許多攝影機的系統,用於對齊多個矩陣或點雲的副程式相似,且本技藝一般技術人員基於如本文所述及圖9實施例的方法200會明白。 For a multi-camera system, an additional step 220 is provided to combine matrices or point clouds from different cameras into a single matrix or point cloud representing the glass sheet G. FIG. 9 schematically illustrates a subroutine used in step 220 to align multiple matrices or point clouds, for example, using the dual camera system illustrated in FIG. 4 . For a dual camera system as shown in FIG. 5 or a system with many cameras, the subroutine used to align multiple matrices or point clouds is similar and will be understood by those of ordinary skill in the art based on the method 200 as described herein and the embodiment of FIG. 9 .

圖9示意圖示方法200的步驟220。電腦80載入各自從兩個攝影機72A、72B掃描玻璃片G所獲取的兩個矩陣或點雲M1、M2。在其他實施例中,使用類似描述於本文的技術,可組合兩個以上的矩陣或點雲。由圖9A可見,在攝影機72A、72B的視場互相重疊時,矩陣M1、M2重疊。此外,然而該系統已用設在各攝影機區域73A、73B中之校準圖中的至少一點校準,且最好該等區域有一定程度的重疊,在矩陣M1、M2互相重疊時,重疊區段中的點之間可有程度很小的偏差。為了形成代表玻璃片G表面的最終矩陣,該電腦處理矩陣M1、 M2以解決偏差。在一實施例中,被解決的偏差可小到約千分之一英吋。此外,偏差在重疊區可不同。 FIG9 schematically illustrates step 220 of method 200. Computer 80 is loaded with two matrices or point clouds M1, M2 obtained from scanning glass G by two cameras 72A, 72B, respectively. In other embodiments, more than two matrices or point clouds may be combined using techniques similar to those described herein. As can be seen from FIG9A, when the fields of view of cameras 72A, 72B overlap, matrices M1, M2 overlap. In addition, while the system has been calibrated using at least one point in the calibration map located in each camera region 73A, 73B, and preferably such regions overlap to a certain extent, when matrices M1, M2 overlap, there may be a small degree of deviation between points in the overlapping segments. To form the final matrix representing the surface of the glass sheet G, the computer processes the matrices M1, M2 to resolve the deviations. In one embodiment, the deviations resolved can be as small as about one thousandth of an inch. In addition, the deviations can be different in the overlapping areas.

在圖9B中,該電腦移動矩陣或點雲M1、M2中之一者或兩者。在一實施例中,電腦80使用剛性變換來移動矩陣中之一者使它相對於另一矩陣平移及/或旋轉致使兩個重疊區如圖示互相對齊且減少誤差或失準。 In FIG. 9B , the computer moves one or both of the matrices or point clouds M1, M2. In one embodiment, the computer 80 uses a rigid transformation to move one of the matrices so that it is translated and/or rotated relative to the other matrix so that the two overlapping regions are aligned with each other as shown and errors or misalignments are reduced.

在圖9C中,電腦80隨後建立玻璃片G的最終矩陣或點雲M3。在一實施例中,該電腦從一或另一矩陣移除重疊區的點。在另一實施例中,且如圖示,該電腦使用與矩陣之共用校準點相關的線L且使用來自一矩陣的點填充在線L之一側上的最終矩陣作為子矩陣M1*,且使用來自另一矩陣的點填充在線L之另一側上的最終矩陣作為子矩陣M2*。 In FIG. 9C , the computer 80 then creates a final matrix or point cloud M3 for the glass sheet G. In one embodiment, the computer removes points of overlap from one or the other matrix. In another embodiment, and as shown, the computer uses a line L associated with the common calibration points of the matrices and fills the final matrix on one side of the line L with points from one matrix as a sub-matrix M1*, and fills the final matrix on the other side of the line L with points from the other matrix as a sub-matrix M2*.

在雷射光不穿過玻璃片G時,只有面向檢測系統的表面62發光。同樣地,有座標系列的矩陣經由該等(x,y,z)座標系列提供玻璃片G表面62的三維高解析度數學模型。在一實施例中,該矩陣提供有用於玻璃片G超過一百萬個座標集的數學模型。例如,該模型可具有片表面62之每平方米有1,000,000個座標集的點密度,或片表面62之每平方毫米有約一個座標集。 When the laser light does not pass through the glass sheet G, only the surface 62 facing the detection system emits light. Similarly, the matrix with the coordinate series provides a three-dimensional high-resolution mathematical model of the surface 62 of the glass sheet G through the (x, y, z) coordinate series. In one embodiment, the matrix provides a mathematical model with more than one million coordinate sets for the glass sheet G. For example, the model may have a point density of 1,000,000 coordinate sets per square meter of the sheet surface 62, or about one coordinate set per square millimeter of the sheet surface 62.

在說明圖1至圖2時提及的實施例中,玻璃片G在輸送器上相對於光學系統14移動。在此情節中,雷射50與攝影機72互相相對固定,且玻璃片G在底下經過。在另一實施例中,玻璃片G可固定,且從雷射50射出的雷射光束用一軸或兩軸反射鏡電流計或其類似者可掃描遍及玻璃片G的第一表面62。在此情節中,為了判定和與沿著玻璃片移動之線66、68之位置關聯的距離D1、D2關聯的角度,電腦80也接收表示由電流計提供之光束轉向角的輸入。 In the embodiment mentioned in describing FIGS. 1-2 , the glass sheet G moves on a conveyor relative to the optical system 14. In this scenario, the laser 50 and the camera 72 are fixed relative to each other, and the glass sheet G passes underneath. In another embodiment, the glass sheet G can be fixed, and the laser beam emitted from the laser 50 can be scanned across the first surface 62 of the glass sheet G using a one-axis or two-axis mirror galvanometer or the like. In this scenario, in order to determine the angle associated with the distance D1, D2 associated with the position along the line 66, 68 along which the glass sheet moves, the computer 80 also receives an input representing the beam steering angle provided by the galvanometer.

在進一步的實施例中,光學檢測系統10可用來檢測玻璃片G的第二面64,且建立代表玻璃片G之表面64的對應三維矩陣或點雲。 In a further embodiment, the optical detection system 10 can be used to detect the second surface 64 of the glass sheet G and establish a corresponding three-dimensional matrix or point cloud representing the surface 64 of the glass sheet G.

玻璃片G的矩陣或點雲提供玻璃片G表面的高解析度三維圖。矩 陣中的座標可用來比較玻璃片G的數學模型以判定玻璃片的形狀是否在形狀的規格內,例如曲率。此外,矩陣中的座標可用來比較玻璃片G的數學模型以判定玻璃片G的表面是否在該表面之光學反射率的規格或標準內。 The matrix or point cloud of the glass sheet G provides a high-resolution three-dimensional image of the surface of the glass sheet G. The coordinates in the matrix can be used to compare the mathematical model of the glass sheet G to determine whether the shape of the glass sheet is within the specification of the shape, such as the curvature. In addition, the coordinates in the matrix can be used to compare the mathematical model of the glass sheet G to determine whether the surface of the glass sheet G is within the specification or standard of the optical reflectivity of the surface.

該矩陣及所產生之模型可與系統10一起用來提供玻璃片G的規測,作為通過/失敗檢測系統以修正製程的偏移或防止系統10偏離規格,以建立玻璃片G的光學反射率模型。 The matrix and the resulting model can be used with the system 10 to provide specifications for the glass sheet G as a pass/fail detection system to correct for process drift or prevent the system 10 from deviating from specifications to establish an optical reflectivity model for the glass sheet G.

電腦(s)16、80可經程式化為可以圖畫(例如,顏色編碼影像)及/或統計形式呈現與來自矩陣之三維圖有關的資訊。在各種實施例中,可導出及報告玻璃片或玻璃片之預定義區的統計資料,包括z-距離、標準差、與其他表面整形或光學反射率指標。 Computer(s) 16, 80 may be programmed to present information associated with the three-dimensional map from the matrix in graphical (e.g., color-coded image) and/or statistical form. In various embodiments, statistics for the glass sheet or predefined regions of the glass sheet may be derived and reported, including z-distance, standard deviation, and other surface shaping or optical reflectivity indicators.

光學系統14也可包括可由攝影機72或另一元件提供的玻璃片部件識別器,以識別玻璃片為存入電腦80之記憶體的一組已知部件形狀中之一者,其中各個已知部件有相關形狀標準,以及用於比較矩陣中之地圖的光學反射率標準。系統10、14可由使用者程式化為可以圖畫及/或數值方式顯示由光學系統14偵測之玻璃片G的各種光學或形狀標記,例如,經由使用者介面及顯示螢幕20,包括與工業標準最相關的標記,或工業中被視為與分析成形及製成玻璃片之光學反射率品質相關的的其他標記。也可將系統10程式化為可顯示被光學系統14識別的小缺陷位置。 The optical system 14 may also include a glass piece component identifier, which may be provided by the camera 72 or another element, to identify the glass piece as one of a set of known component shapes stored in the memory of the computer 80, wherein each known component has an associated shape standard, and an optical reflectivity standard for comparison to the map in the matrix. The systems 10, 14 may be programmed by the user to graphically and/or numerically display various optical or shape markers of the glass piece G detected by the optical system 14, for example, via a user interface and display screen 20, including markers that are most relevant to industry standards, or other markers that are considered relevant in the industry to analyze the optical reflectivity quality of the formed and manufactured glass piece. The system 10 may also be programmed to display the location of small defects identified by the optical system 14.

由所揭露的線內光學檢測系統10、14輸出的選定資料,也可提供作為用於相關玻璃片加熱、彎曲及回火系統(或汽車擋風玻璃製造系統)之控制邏輯的輸入,以允許玻璃片系統之一或多個工作站的控制器(s)依據從先前加工玻璃片開發的光學資料來修改工作參數。 Selected data output by the disclosed in-line optical inspection systems 10, 14 may also be provided as input to control logic for an associated glass sheet heating, bending and tempering system (or automotive windshield manufacturing system) to allow the controller(s) of one or more workstations of the glass sheet system to modify operating parameters based on optical data developed from previously processed glass sheets.

圖10的流程圖圖示使用如電腦80使用光學系統14所判定之玻璃片表面的矩陣或點雲來規測例如玻璃片G之部件的方法300。在各種具體實施例 中,可省略或重新排列方法300的步驟,或可提供附加步驟。 The flowchart of FIG. 10 illustrates a method 300 for measuring a component such as a glass sheet G using a matrix or point cloud of the surface of the glass sheet as determined by computer 80 using optical system 14. In various specific embodiments, steps of method 300 may be omitted or rearranged, or additional steps may be provided.

在步驟302,如上述使用光學系統及方法200所判定之玻璃片G表面的矩陣或點雲由電腦80輸入到處理器單元中。該矩陣可表示玻璃片G的整個第一表面,或可以只包括玻璃片G之選定表面區域的資料集。 In step 302, a matrix or point cloud of the surface of the glass sheet G determined using the optical system and method 200 as described above is input into the processor unit by the computer 80. The matrix may represent the entire first surface of the glass sheet G, or may include only a data set of a selected surface area of the glass sheet G.

在步驟304,電腦80涉及玻璃片G的合適規測模型。使用電腦輔助設計(CAD)模型及/或資料可提供該規測模型,或其他數學模型或尺寸或形狀的再現。該電腦可從儲存於記憶體中有各種形狀及/或大小之玻璃片G的數個模型中之一個決定使用正確的規測模型。然後,電腦80使選定的規測模型輸入到處理器。 In step 304, the computer 80 determines the appropriate specification model for the glass piece G. The specification model may be provided using a computer-aided design (CAD) model and/or data, or other mathematical model or representation of size or shape. The computer may determine the correct specification model to use from one of several models of glass pieces G of various shapes and/or sizes stored in memory. The computer 80 then causes the selected specification model to be input into a processor.

在步驟306,電腦80判定與該規測模型比較的玻璃片不變量指標資料。在一實施例中,該電腦可判定資料集或玻璃片G表面與該規測模型比較的z-距離。該電腦可計算從各個資料集或玻璃片G表面到規測模型的法向量距離。替換地,該電腦可計算從各個資料集或玻璃片G表面到規測模型的垂直距離或z-距離。 In step 306, the computer 80 determines the glass sheet invariant index data compared to the standard model. In one embodiment, the computer may determine the z-distance of the data set or the surface of the glass sheet G compared to the standard model. The computer may calculate the normal vector distance from each data set or the surface of the glass sheet G to the standard model. Alternatively, the computer may calculate the vertical distance or z-distance from each data set or the surface of the glass sheet G to the standard model.

該電腦可經組配為參照該矩陣或點雲可規測整個玻璃片G。在其他實施例中,該電腦可以只規測玻璃片G的選定區域(s)或部份(s)或在規定區域中有附加規測點,例如周邊區域,或打算用於例如抬頭顯示器或攝影機或其他感測器之光學用途的區域。在一實施例中,該電腦使用玻璃片G的選定區域模擬接觸規測方法。 The computer may be configured to measure the entire glass sheet G with reference to the matrix or point cloud. In other embodiments, the computer may measure only selected area(s) or portion(s) of the glass sheet G or have additional measurement points in specified areas, such as peripheral areas, or areas intended for optical use such as heads-up displays or cameras or other sensors. In one embodiment, the computer uses a selected area of the glass sheet G to simulate a contact measurement method.

在進一步的實施例中,且如以虛線圖示的視需要區塊308所示,該電腦可對數個點的鄰域執行計算或副程式以提供後處理過之表面資料點或資料集以用來判定不變量指標。在一實施例中,該電腦對相鄰點或資料集執行內插,平均,或另一數學函數,例如定限(thresholding)或其類似者,以算出該鄰域的後處理過之資料集。這可藉由排除由表面灰塵等等造成的離群資料集 (outlier dataset)來提供改良的規測及不變量指標。 In further embodiments, and as shown in the optional block 308 illustrated in dashed lines, the computer may perform a calculation or subroutine on a neighborhood of a plurality of points to provide a post-processed surface data point or data set for determining an invariant indicator. In one embodiment, the computer performs interpolation, averaging, or another mathematical function, such as thresholding or the like, on the neighboring points or data sets to calculate a post-processed data set of the neighborhood. This may provide improved specifications and invariant indicators by excluding outlier datasets caused by surface dust, etc.

在其他實施例中,該電腦可判定z-距離的標準差,或表面與玻璃片G的另一不變量指標,例如計算曲率半徑,或其他形狀規測指標。可輸入該等不變量指標於玻璃片G的規測矩陣或點雲中。 In other embodiments, the computer may determine the standard deviation of the z-distance, or another invariant metric of the surface and the glass sheet G, such as calculating the radius of curvature, or other shape measurement metrics. These invariant metrics may be input into the measurement matrix or point cloud of the glass sheet G.

在步驟310,電腦80輸出與表面之規測有關的資訊,包括任何不變量指標,例如規測矩陣。該電腦可進一步分析規測矩陣中的資訊以判定一或多個指標是否超過臨界值。該電腦另外可提供與規測有關的資訊給使用者,例如,經由玻璃片的彩色編碼圖(color-coded map)或經由數值或其他表現形式,例如表格。該電腦另外可提供來自規測的資訊給玻璃片G的製程步驟作為控制反饋回路的一部份。 In step 310, the computer 80 outputs information related to the gauge of the surface, including any invariant indices, such as a gauge matrix. The computer may further analyze the information in the gauge matrix to determine whether one or more indices exceed a critical value. The computer may additionally provide information related to the gauge to a user, for example, via a color-coded map of the glass sheet or via numerical values or other representations, such as a table. The computer may additionally provide information from the gauge to a process step of the glass sheet G as part of a control feedback loop.

圖11A及圖11B圖示來自方法300之輸出顯示給使用者的代表性實施例。圖11A圖示玻璃片G或玻璃片G之區域的簡化點圖(simplified point map),且提供系統輸出的代表性實施例。規測點已與列出的不變量指標相關,例如基於法線、垂直或其他距離與規測值的微分值。如果微分值超過規定臨界值或在允許公差外,則可加上旗標讓使用者容易明白。在圖示實施例中,該等數值對應至與規測模型的法線垂直距離且以毫米為單位,然而可想到其他的單元。此外,加底線的數值落在臨界值或裕度之外且加上旗標給使用者。 Figures 11A and 11B illustrate representative embodiments of outputs from method 300 displayed to a user. Figure 11A illustrates a simplified point map of glass sheet G or a region of glass sheet G and provides a representative embodiment of system output. Gauge points have been associated with listed invariant indicators, such as differential values based on normal, perpendicular or other distances from gauge values. If the differential value exceeds a specified critical value or is outside of an allowable tolerance, a flag may be added to facilitate user understanding. In the illustrated embodiment, the values correspond to the normal perpendicular distance from the gauge model and are in millimeters, however other units are contemplated. In addition, underlined values fall outside of a critical value or margin and are flagged to the user.

圖11B圖示玻璃片G或玻璃片G之區域的地圖,其中不同的陰影基於與規測值的法線、垂直或其他距離對應至不同微分值範圍,且提供系統輸出的另一代表性實施例。如果微分值超過規定臨界值或在允許公差外,則可加上旗標讓使用者容易明白。基於該片的所欲用途及要求,不同面板區域的公差或臨界值可設定不同的數值。以圖示實施例而言,該等微分以毫米為單位,然而也可想到其他的單元。 FIG. 11B illustrates a map of a glass sheet G or a region of a glass sheet G, where different shading corresponds to different differential value ranges based on the normal, perpendicular or other distance from the gauge value, and provides another representative embodiment of the system output. If the differential value exceeds the specified critical value or is outside the allowable tolerance, a flag can be added to make it easy for the user to understand. Based on the intended use and requirements of the sheet, the tolerance or critical value of different panel areas can be set to different values. For the illustrated embodiment, the differentials are in millimeters, but other units are also conceivable.

方法300提供用於表面及玻璃片G的非接觸規測,其允許用於部 件的線上監控及檢測,且允許快速便利地規測一系列的不同部件,或使用多個規測模型。此外,經由方法300的非接觸規測提供用於減少與規測部件相關的時間及費用,因為使用CAD資料可輕易建立、改變或更新規測模型,且不需要使用部件專用之接觸規測的精密測量規測工具。 Method 300 provides non-contact measurement for surfaces and glass sheets G, which allows for on-line monitoring and inspection of components, and allows for quick and convenient measurement of a range of different components, or the use of multiple measurement models. In addition, non-contact measurement via method 300 provides for reducing the time and costs associated with measuring components, because measurement models can be easily created, changed or updated using CAD data, and precise measurement measurement tools that require contact measurement for component-specific measurement are not required.

圖12的流程圖圖示方法350,如由使用光學系統14之電腦80所判定的,其使用玻璃片表面的矩陣或點雲用來判定及建模例如玻璃片G之部件的光學反射率。在各種具體實施例中,可省略或重新排列方法300中的步驟,或可提供附加步驟。 The flowchart of FIG. 12 illustrates a method 350 for determining and modeling the optical reflectivity of a component such as a glass sheet G using a matrix or point cloud of the surface of the glass sheet as determined by a computer 80 using an optical system 14. In various embodiments, the steps in method 300 may be omitted or rearranged, or additional steps may be provided.

在步驟352,玻璃片G表面如上述使用光學系統及方法200所判定的矩陣或點雲由電腦80輸入到處理器單元中。該矩陣可表示玻璃片G的整個第一表面,或可以只包括玻璃片G之選定表面區域的資料集。 In step 352, the matrix or point cloud of the surface of the glass sheet G as determined using the optical system and method 200 described above is input into the processor unit by the computer 80. The matrix may represent the entire first surface of the glass sheet G, or may only include a data set of a selected surface area of the glass sheet G.

在步驟354,電腦80對該矩陣或點雲執行後處理運作(s)。在一實施例中,電腦80修改或去雜訊矩陣或點雲以從點雲移除某些點或假影(artifact)。例如,電腦80可移除或修改點雲中與面板G邊緣鄰接或在例如1到2毫米之規定距離內的點以移除在測量位置有邊緣效應或偏差的點,例如由光束轉向效應造成,及/或計算線心基於雷射線或可見光的寬度結合面板邊緣不與該線或片垂直而被引進的偏差。另外,及螢光的可見光可能緊接著出現在面板G外且可能由例如面板的研磨或其他參數造成導致光線散播,從而在點雲或矩陣中產生額外的假影點。在一實施例中,這些不準確或假影點形成曲率符號與相鄰面板G相反的曲線,或在不準確或假影點與相鄰面板G之間形成曲線的曲折點(knee),致使電腦80可能使用拐點(inflection point)或曲折點作為邊界從點雲或矩陣截斷或刪除這些點。雖然此去雜訊步驟的描述涉及去雜訊在使用來自雷射切頁之可見螢光測量玻璃片G表面時建立的點雲,然而該去雜訊步驟也可應用於用來去雜訊邊緣效應的其他視域及測量系統。 At step 354, the computer 80 performs post-processing operation(s) on the matrix or point cloud. In one embodiment, the computer 80 modifies or denoises the matrix or point cloud to remove certain points or artifacts from the point cloud. For example, the computer 80 may remove or modify points in the point cloud that are adjacent to the edge of the panel G or within a specified distance, such as 1 to 2 mm, to remove points that have edge effects or deviations in the measured position, such as caused by beam steering effects, and/or deviations introduced by the calculated line center based on the width of the laser line or visible light combined with the panel edge not being perpendicular to the line or sheet. In addition, visible light and fluorescent light may appear immediately outside of the panel G and may be caused by, for example, grinding of the panel or other parameters that cause light spread, thereby generating additional artifact points in the point cloud or matrix. In one embodiment, these inaccurate or artifact points form a curve with a curvature sign opposite to that of the adjacent panel G, or form a knee of the curve between the inaccurate or artifact point and the adjacent panel G, so that the computer 80 may use the inflection point or inflection point as a boundary to truncate or delete these points from the point cloud or matrix. Although the description of this de-noising step involves de-noising a point cloud created when measuring the surface of the glass sheet G using visible fluorescence from laser cutting, the de-noising step can also be applied to other viewing and measurement systems used to de-noise edge effects.

電腦80也在步驟354對點雲或矩陣執行去雜訊演算法。根據一實施例,藉由平均在資料集鄰域中的法向量可提供去雜訊,然後使用平均法向量更新資料集以建立與法線變化匹配的後處理過之資料集。在一非限定性實施例中,由資料集組成的點雲有以各個資料集作為頂點的三角網孔(triangular mesh)。在其他實施例中,可使用其他的網孔形狀。計算每個網孔三角形的法向量。發散法向量可表示點雲中的雜訊,同時收歛法向量可表示點雲的較平滑表面。該點雲的平滑化係藉由平均或以其他方式數學組合網孔三角形之鄰域或群組的法向量,且該等鄰域可定義為共享公用頂點或共享公共邊緣(s)的網孔。各個平均法向量用來調整相關頂點的座標以建立在後處理過之去雜訊點雲或矩陣中的後處理過之頂點或資料集。在其他實施例中,可提供其他去雜訊演算法且可基於與表面整形技術相關的數學演算法,例如描述以下文獻的:作者Gabriel Taubin在SIGGRAPH '95 Proceedings of the 22nd annual conference發表的「A signal processing approach to fair surface design」;Hirokazu Yagou等人在GMP '02 Proceedings of the Geometric Modeling and Processing-Theory and Applications(GMP'02)發表的「Mesh Smoothing via Mean and Median Filtering Applied to Face Normals」;Shachar Fleishman等人在SIGGRAPH '03 ACM SIGGRAPH 2003 Papers發表的「Bilateral mesh denoising」;以及Thouis R.Jones等人在SIGGRAPH '03 ACM SIGGRAPH 2003 Papers發表的「Non-iterative,feature-preserving mesh smoothing」。 The computer 80 also performs a denoising algorithm on the point cloud or matrix at step 354. According to one embodiment, denoising can be provided by averaging the normal vectors in a neighborhood of the data set, and then using the average normal vector to update the data set to create a post-processed data set that matches the normal changes. In a non-limiting embodiment, the point cloud composed of the data sets has a triangular mesh with each data set as a vertex. In other embodiments, other mesh shapes can be used. The normal vector is calculated for each mesh triangle. Diverging normal vectors can represent noise in the point cloud, while convergent normal vectors can represent a smoother surface of the point cloud. The point cloud is smoothed by averaging or otherwise mathematically combining the normal vectors of neighborhoods or groups of mesh triangles, where such neighborhoods may be defined as meshes that share common vertices or share common edge(s). Each averaged normal vector is used to adjust the coordinates of the associated vertex to create a post-processed vertex or data set in a post-processed de-noised point cloud or matrix. In other embodiments, other denoising algorithms may be provided and may be based on mathematical algorithms related to surface reshaping techniques, such as those described in the following literature: "A signal processing approach to fair surface design" by Gabriel Taubin, published in the SIGGRAPH '95 Proceedings of the 22nd annual conference; "Mesh Smoothing via Mean and Median Filtering Applied to Face Normals" by Hirokazu Yagou et al., published in the GMP '02 Proceedings of the Geometric Modeling and Processing-Theory and Applications (GMP'02); "Bilateral mesh denoising" by Shachar Fleishman et al., published in the SIGGRAPH '03 ACM SIGGRAPH 2003 Papers; and "Non-iterative, feature-preserving mesh denoising" by Thouis R. Jones et al., published in the SIGGRAPH '03 ACM SIGGRAPH 2003 Papers. "smoothing".

根據另一非限定性實施例,電腦80對點雲或矩陣執行去雜訊演算法,其使用移動最小平方法(moving least squares method)以平滑化及內插資料。根據本揭示內容以及對於點雲中的給定資料點,用電腦80以最小平方方式擬合(least squares fit)點雲中的許多相鄰點至一函數。在一實施例中,該函數可為多項式。後處理過之資料點的判定係藉由使點雲中的原始給定點移到判定的 多項式表面。電腦80迭代點雲的去雜訊以建立後處理過之去雜訊點雲或矩陣。移動最小平方方法的實施例及其表面應用在作者Lancaster,Peter,and Kes Salkauskas在Mathematics of computation 37.155(1981):141-158的著作「Surfaces generated by moving least squares methods」;以及作者Alexa,Marc等人在IEEE Transactions on visualization and computer graphics 9.1(2003):3-15的著作「Computing and rendering point set surfaces」可找到。 According to another non-limiting embodiment, the computer 80 performs a denoising algorithm on the point cloud or matrix that uses a moving least squares method to smooth and interpolate the data. According to the present disclosure and for a given data point in the point cloud, the computer 80 least squares fits a number of neighboring points in the point cloud to a function. In one embodiment, the function may be a polynomial. The post-processed data point is determined by moving the original given point in the point cloud to the determined polynomial surface. The computer 80 iterates the denoising of the point cloud to create a post-processed denoised point cloud or matrix. Examples of moving least squares methods and their surface applications can be found in Lancaster, Peter, and Kes Salkauskas, "Surfaces generated by moving least squares methods", Mathematics of computation 37.155 (1981): 141-158; and Alexa, Marc et al., "Computing and rendering point set surfaces", IEEE Transactions on visualization and computer graphics 9.1 (2003): 3-15.

在步驟356,電腦80從去雜訊矩陣或點雲的後處理過之資料集判定或算出該表面或該表面之一或多個選定區域的一或多個不變量指標。不變量指標可包括水平曲率、垂直曲率、曲率半徑、主曲率、高斯曲率、平均曲率、該等曲率中之一或多個的導數或變化率、屈光度或光學功率指標及其類似者。 In step 356, the computer 80 determines or calculates one or more invariant indicators of the surface or one or more selected regions of the surface from the post-processed data set of the de-noised matrix or point cloud. The invariant indicators may include horizontal curvature, vertical curvature, radius of curvature, principal curvature, Gaussian curvature, mean curvature, derivatives or rates of change of one or more of these curvatures, diopters or optical power indicators, and the like.

在步驟358,該電腦可判定表示該表面之光學反射率的不變量指標是否在被指定用於玻璃片G表面或該表面之區域的光學反射率規格內。該電腦可比較該等不變量指標中之一或多個與玻璃片G的對應設計指標。例如,該光學反射率規格可為玻璃片G的標準或定限不變量指標(thresholded invariant metric)。在一實施例中,該規格包括例如來自電腦輔助工程(CAE)模型之計算曲率或用於玻璃片G之其他模型資料的指標。該電腦可比較不變量指標與臨界值,或建立彩色編碼圖或其他視覺輸出以表示玻璃片或玻璃片的區域是否在預定規格內,或比較該表面與預定規格。在進一步的實施例中,該電腦可使用一個以上不變量的數學函數以提供光學反射率評分或其他讀數與規格比較,該規格在它與光學反射率有關時,以加權或其他方式加入不同的不變量及表面區域。 At step 358, the computer may determine whether an invariant metric representing the optical reflectivity of the surface is within an optical reflectivity specification specified for the surface of the glass sheet G or a region of the surface. The computer may compare one or more of the invariant metrics to a corresponding design metric for the glass sheet G. For example, the optical reflectivity specification may be a standard or thresholded invariant metric for the glass sheet G. In one embodiment, the specification includes a metric such as a calculated curvature from a computer-aided engineering (CAE) model or other model data for the glass sheet G. The computer may compare the invariant metric to a critical value, or create a color-coded map or other visual output to indicate whether the glass sheet or a region of the glass sheet is within a predetermined specification, or compare the surface to a predetermined specification. In further embodiments, the computer may use a mathematical function of more than one invariant to provide an optical reflectance score or other readout for comparison to a specification that weights or otherwise incorporates different invariants and surface areas as it relates to optical reflectance.

在步驟360,且在一些具體實施例中,電腦80判定或計算玻璃片G的變量指標。在一實施例中,電腦80建立用於光學反射率及任何失真之模擬視覺表現的模擬反射網格、斑馬板、或其他影像。用來建立模擬反射影像的電腦演算法可使用例如射線追蹤(ray tracing)的技術,其使用去雜訊矩陣中的後處 理過之頂點與從每個後處理過之頂點算出的法向量。例如且參考射線追蹤的用法,來自去雜訊點雲中之後處理過之頂點的射線對於該法向量在一像素處以一角度打擊一虛擬攝影機,且由於入射角等於反射角,來自點雲上同一後處理過之頂點的射線因此為已知且可判定與虛擬格子板的交叉處。使用虛擬攝影機上的像素及虛擬格子板上的點可構建例如反射格子板或斑馬板的反射影像,因為它們一對一對應。使用入射角、攝影機設定等等與使用於演算法一樣之網格或斑馬板的真實反射影像,可調諧或校準電腦用來模擬反射網格或斑馬板的演算法。又在另一實施例中,該電腦可組合例如以不同入射角取得的一系列模擬網格或模擬斑馬板,以提供斑馬板的影片或活頁簿供視覺顯示給使用者以從相對於斑馬板改變的位置來模擬掃描斑馬板。 In step 360, and in some embodiments, the computer 80 determines or calculates variable indices of the glass sheet G. In one embodiment, the computer 80 creates a simulated reflective grid, zebra stripe, or other image for a simulated visual appearance of optical reflectivity and any distortion. The computer algorithm used to create the simulated reflective image may use techniques such as ray tracing using post-processed vertices in a de-noising matrix and normal vectors calculated from each post-processed vertex. For example and referring to the use of ray tracing, a ray from a post-processed vertex in a de-noised point cloud hits a virtual camera at an angle to the normal vector at a pixel, and since the angle of incidence equals the angle of reflection, the ray from the same post-processed vertex on the point cloud is therefore known and the intersection with the virtual grid can be determined. Using the pixels on the virtual camera and the points on the virtual grid, a reflection image of, for example, a reflection grid or zebra board can be constructed since they correspond one-to-one. The algorithm used by the computer to simulate the reflection grid or zebra board can be tuned or calibrated using the real reflection image of the same grid or zebra board with the angle of incidence, camera settings, etc. as used in the algorithm. In yet another embodiment, the computer may combine, for example, a series of simulated grids or simulated zebra strips acquired at different angles of incidence to provide a video or flipbook of the zebra strips for visual display to a user to simulate scanning the zebra strips from varying positions relative to the zebra strips.

在步驟362,電腦80輸出與表面之模擬光學反射率及失真有關的資訊,包括任何變量或不變量指標、不變量資料或模擬斑馬板的視覺表現或映射、或其他計算或模擬。在一實施例中,電腦80顯示資訊於顯示螢幕或其他使用者介面上。圖13圖示使用如本文所述方法200、350所構建之格子板的模擬反射光學影像的代表性實施例。該電腦另外可提供此資訊給玻璃片G的製程步驟作為控制反饋回路的一部份。 In step 362, the computer 80 outputs information related to the simulated optical reflectivity and distortion of the surface, including any variable or invariant indicators, invariant data or a visual representation or mapping of a simulated zebra strip, or other calculations or simulations. In one embodiment, the computer 80 displays the information on a display screen or other user interface. FIG. 13 illustrates a representative embodiment of a simulated reflected optical image of a grid plate constructed using methods 200, 350 as described herein. The computer may additionally provide this information to the process steps of the glass sheet G as part of a control feedback loop.

方法350提供用於非接觸檢測及判定玻璃片G表面的光學反射率及任何失真,其允許線上監控及檢測部件,且允許快速便利地檢測一系列的不同部件。此外,經由方法350的非接觸光學反射檢測提供用於減少與檢測部件相關的時間及費用,且另外可提供非主觀指標用來判定部件是否已通過規格。 Method 350 provides for non-contact detection and determination of the optical reflectivity and any distortion of the surface of the glass sheet G, which allows for online monitoring and inspection of components, and allows for quick and convenient inspection of a range of different components. In addition, non-contact optical reflection inspection via method 350 provides for reducing the time and expense associated with inspecting components, and additionally provides a non-subjective indicator for determining whether a component has passed specification.

在其他實施例中,且取決於用來形成玻璃片的製造技術,第一及第二表面62、64可放射不同波長的光線以響應來自雷射50的激活。在一實施例中,玻璃片G使用浮製玻璃製程形成且在一表面上有比另一表面高的錫濃度。在此情節中,有較高錫濃度的表面以與另一表面不同的強度及/或波長發螢 光,且檢測系統可進一步基於放射光的不同強度及/或波長λ2用來識別該片的一面與另一面。例如,以第一表面有高於第二表面之錫濃度的玻璃片而言,第一表面可以與第二表面不同的強度及/或波長發螢光,此外,第一表面以比第二表面高的強度及/或較短的波長發螢光。此外,控制單元及電腦80可基於玻璃片面向雷射的表面來修改雷射50的強度,及/或調整攝影機設定,例如增益或影像處理設定。例如,以第一表面有高於第二表面之錫濃度的玻璃片而言,相較於第二表面,可減少第一表面的雷射強度,例如以防止攝影機感測器過飽和。替換地或附加地,可增加第二面的增益,或第二面可能需要用於去雜訊的附加影像處理步驟。 In other embodiments, and depending on the manufacturing technology used to form the glass sheet, the first and second surfaces 62, 64 may emit light of different wavelengths in response to activation from the laser 50. In one embodiment, the glass sheet G is formed using a float glass process and has a higher concentration of tin on one surface than the other surface. In this scenario, the surface with the higher concentration of tin fluoresces at a different intensity and/or wavelength than the other surface, and the detection system can further be used to identify one side of the sheet from the other side based on the different intensity and/or wavelength λ2 of the emitted light. For example, in the case of a glass sheet having a first surface having a higher concentration of tin than a second surface, the first surface may fluoresce at a different intensity and/or wavelength than the second surface, and further, the first surface fluoresces at a higher intensity and/or shorter wavelength than the second surface. In addition, the control unit and computer 80 can modify the intensity of the laser 50 based on the surface of the glass sheet facing the laser, and/or adjust camera settings, such as gain or image processing settings. For example, for a glass sheet having a higher concentration of tin on a first surface than on a second surface, the laser intensity on the first surface can be reduced compared to the second surface, for example to prevent oversaturation of the camera sensor. Alternatively or additionally, the gain of the second surface can be increased, or the second surface may require additional image processing steps for de-noising.

此外,例如,為了使用於較大的玻璃片G,減少掃描時間,或增加測量準確度,系統10可設有一個以上的光學系統14。 In addition, for example, in order to be used with a larger glass sheet G, reduce scanning time, or increase measurement accuracy, the system 10 may be provided with more than one optical system 14.

利用有不透射玻璃片G之光源的系統14,可提供玻璃片G表面的測量,也避免使用可見光之其他系統查詢玻璃片引起以及來自前、後表面62、64兩者之合成散射及反射率的問題。同樣,藉由使從玻璃片G射出的光線在可見光譜中可簡化測量致使不需要紫外線感測器。 Using a system 14 with a light source that is not transmissive to the glass sheet G, measurements of the surface of the glass sheet G can be provided while avoiding the problems caused by other systems that interrogate the glass sheet using visible light and the combined scattering and reflectivity from both the front and back surfaces 62, 64. Likewise, by making the light emitted from the glass sheet G in the visible spectrum, the measurement is simplified so that a UV sensor is not required.

在進一步的具體實施例中,該光學系統可用來形成物件而不是玻璃片G的三維表面圖。在一限定性實施例中,有雷射以例如可見光波長之另一波長發光的光學系統可用來掃描有漫射表面的物件。該光學系統使用有如上述之方法的一或多個攝影機(s)以判定漫射表面的三維表面圖。 In further embodiments, the optical system can be used to form a three-dimensional surface image of an object other than the glass sheet G. In a limited embodiment, an optical system having a laser emitting light at another wavelength, such as visible light wavelengths, can be used to scan an object having a diffuse surface. The optical system uses one or more cameras (s) as described above to determine a three-dimensional surface image of the diffuse surface.

儘管以上描述本揭示內容的各種實施例,然而非旨在這些具體實施例描述本發明的所有可能形式。反而,使用於專利說明書的字彙為描述而不是限制字彙,且應瞭解,可做出各種變更而不脫離本揭示內容的精神及範疇。另外,可組合各種實現具體實施例的特徵以形成其他具體實施例。 Although various embodiments of the present disclosure are described above, it is not intended that these specific embodiments describe all possible forms of the present invention. Instead, the terms used in the patent specification are descriptive rather than limiting, and it should be understood that various changes can be made without departing from the spirit and scope of the present disclosure. In addition, the features of various implementations of specific embodiments can be combined to form other specific embodiments.

10:光學檢測系統,檢測系統,系統 10: Optical detection system, detection system, system

12:輸送器 12:Conveyor

14:光學系統,系統 14:Optical system, system

16:控制系統,電腦 16: Control system, computer

18:位置感測器 18: Position sensor

20:使用者介面及顯示螢幕 20: User interface and display screen

G:玻璃片,玻璃面板 G: Glass sheet, glass panel

λ1、λ2:波長 λ 1, λ 2: wavelength

Claims (20)

一種光學檢測系統(10),其包含:一紫外線雷射(50)及相關光件(54),其形成指向一玻璃片(G)之一平面雷射切頁(60),其中,該平面雷射切頁(60)與該玻璃片(G)的一表面(62)相交,藉此造成該玻璃片(G)的該表面(62)發螢光且形成一可見光波長線(68)於該表面(62)上;一第一攝影機(72A),其具有一第一影像感測器,用於偵測跨越該玻璃片(G)之寬度之一第一部份(73A)的該可見光波長線(68);一第二攝影機(72B),其具有一第二影像感測器,用於偵測跨越該玻璃片(G)之寬度之一第二部份(73B)的該可見光波長線(68),該第一部分(73A)與該第二部分(73B)不同,使得該第一攝影機(72A)與該第二攝影機(72B)在該玻璃片(G)的該表面(62)上具有個別視場;及一控制系統(16),其組配來:(i)從該第一攝影機(72A)接收表示該可見光波長線(68)的影像資料;(ii)分析來自該第一攝影機(72A)的該影像資料以判定一第一座標系列中與該可見光波長線(68)相關聯的一第一座標及一第二座標;(iii)三角測量該第一座標系列中之與該第一座標及該第二座標中之各座標相關聯的一第三座標;(iv)建立該玻璃片(G)之該表面(62)的作為該第一座標系列之函數的一第一三維圖(M1);(v)從該第二攝影機(72B)接收表示該可見光波長線(68)的影像資料;(vi)分析來自該第二攝影機(72B)的該影像資料以判定一第二座標系列中與該可見光波長線(68)相關聯的一第一座標及一第二座標;(vii)三角測量該第二座標系列中之與該第一座標及該第二座標中之各座 標相關聯的一第三座標;(viii)建立該玻璃片(G)之該表面(62)的作為該第二座標系列之函數的一第二三維圖(M2);與(ix)用該第一三維圖(M1)及該第二三維圖(M2)來形成一組合圖(M3)。 An optical detection system (10) comprises: an ultraviolet laser (50) and associated optical components (54) which form a planar laser cutting page (60) directed toward a glass sheet (G), wherein the planar laser cutting page (60) intersects a surface (62) of the glass sheet (G), thereby causing the surface (62) of the glass sheet (G) to fluoresce and form a visible light wavelength line (68) on the surface (62); a first camera (72A) having a first image sensor for detecting the visible light across a first portion (73A) of the width of the glass sheet (G); a first camera (72A) having a second image sensor for detecting the visible light wavelength (68) across a second portion (73B) of the width of the glass sheet (G), the first portion (73A) being different from the second portion (73B) so that the first camera (72A) and the second camera (72B) have separate fields of view on the surface (62) of the glass sheet (G); and a control system (16) configured to: (i) receive an image representing the visible light wavelength (68) from the first camera (72A); (ii) analyzing the image data from the first camera (72A) to determine a first coordinate and a second coordinate in a first coordinate series associated with the visible light wavelength (68); (iii) triangulating a third coordinate in the first coordinate series associated with each of the first coordinate and the second coordinate; (iv) creating a first three-dimensional map (M1) of the surface (62) of the glass sheet (G) as a function of the first coordinate series; (v) receiving image data representing the visible light wavelength (68) from the second camera (72B); (v i) analyzing the image data from the second camera (72B) to determine a first coordinate and a second coordinate in a second coordinate series associated with the visible light wavelength (68); (vii) triangulating a third coordinate in the second coordinate series associated with each of the first coordinate and the second coordinate; (viii) establishing a second three-dimensional map (M2) of the surface (62) of the glass sheet (G) as a function of the second coordinate series; and (ix) using the first three-dimensional map (M1) and the second three-dimensional map (M2) to form a combined map (M3). 如請求項1之光學檢測系統(10),其中該控制系統(16)係進一步組配來使用一剛性變換來將該第一三維圖(M1)相對於該第二三維圖(M2)移動,以使該第一三維圖(M1)與該第二三維圖(M2)對齊,且隨後自該第一三維圖(M1)及該第二三維圖(M2)中之一三維圖的重疊視場中移除座標系列以形成該組合圖(M3)。 An optical detection system (10) as claimed in claim 1, wherein the control system (16) is further configured to use a rigid transformation to move the first three-dimensional image (M1) relative to the second three-dimensional image (M2) so that the first three-dimensional image (M1) is aligned with the second three-dimensional image (M2), and then remove the coordinate series from the overlapping field of view of one of the first three-dimensional image (M1) and the second three-dimensional image (M2) to form the combined image (M3). 如請求項1之光學檢測系統(10),其中,該第一攝影機(72A)及該第二攝影機(72B)係定置在該平面雷射切頁(60)之一側。 As in claim 1, the optical detection system (10), wherein the first camera (72A) and the second camera (72B) are fixed on one side of the planar laser cutting page (60). 如請求項1之光學檢測系統(10),其中該平面雷射切頁(60)係定置在該第一攝影機(72A)及該第二攝影機(72B)之間。 An optical detection system (10) as claimed in claim 1, wherein the planar laser cutting page (60) is positioned between the first camera (72A) and the second camera (72B). 如請求項1之光學檢測系統(10),其進一步包含:一第三攝影機,其具有一第三影像感測器,用於偵測跨越該玻璃片(G)之寬度之一第三部份的該可見光波長線(68);及一第四攝影機,其具有一第四影像感測器,用於偵測跨越該玻璃片(G)之寬度之一第四部份的該可見光波長線(68);其中該第一攝影機(72A)、該第二攝影機(72B)、第三攝影機及該第四攝影機在該玻璃片(G)的該表面(62)上具有個別視場。 The optical detection system (10) of claim 1 further comprises: a third camera having a third image sensor for detecting the visible light wavelength (68) across a third portion of the width of the glass sheet (G); and a fourth camera having a fourth image sensor for detecting the visible light wavelength (68) across a fourth portion of the width of the glass sheet (G); wherein the first camera (72A), the second camera (72B), the third camera and the fourth camera have respective fields of view on the surface (62) of the glass sheet (G). 如請求項1之光學檢測系統(10),其進一步包含:一輸送器,其組配來使該玻璃片(G)與該雷射(50)中之至少一者相對於另外一者平移;其中該雷射(50)、該平面雷射切頁(60)及該等攝影機(72A、72B)相對於彼此固定; 其中該控制系統(16)係進一步組配來在跨越該玻璃片(G)測量時,從各攝影機(72A、72B)接收表示一系列的可見光波長線(68)的一系列資料,該系列的可見光波長線(68)中之各線對應於沿著該玻璃片(G)之該表面(62)的一不同位置;與其中該控制系統(16)係進一步組配來:分析該系列的可見光波長線(68)中之各線以判定與其相關聯之一座標系列中的一第一座標及一第二座標,三角測量與該等座標系列中之各座標系列中的該第一座標及該第二座標中之各座標相關聯的一第三座標,以及從與各攝影機(72A、72B)相關聯之該等座標系列中之各座標系列建立該玻璃片(G)之該表面(62)的各個三維圖(M1、M2、M3)。 The optical detection system (10) of claim 1 further comprises: a conveyor configured to translate at least one of the glass sheet (G) and the laser (50) relative to the other; wherein the laser (50), the planar laser cutting sheet (60) and the cameras (72A, 72B) are fixed relative to each other; wherein the control system (16) is further configured to receive a series of data representing a series of visible light wavelength lines (68) from each camera (72A, 72B) when measuring across the glass sheet (G), each line in the series of visible light wavelength lines (68) corresponding to a wavelength along a different position of the surface (62) of the glass sheet (G); and wherein the control system (16) is further configured to: analyze each line in the series of visible light wavelength lines (68) to determine a first coordinate and a second coordinate in a coordinate series associated therewith, triangulate a third coordinate associated with each of the first coordinate and the second coordinate in each of the coordinate series, and establish three-dimensional maps (M1, M2, M3) of the surface (62) of the glass sheet (G) from each of the coordinate series associated with each camera (72A, 72B). 如請求項1之光學檢測系統(10),其中該控制系統(16)係進一步組配來使用一預定的線寬區域(250)來分析來自各攝影機(72A、72B)之該影像資料,以判定與該可見光波長線(68)相關聯的各座標系列中的該第一座標及該第二座標,其中,各座標系列中的該第一座標及該第二座標落在該線寬區域(250)內。 The optical detection system (10) of claim 1, wherein the control system (16) is further configured to use a predetermined line width region (250) to analyze the image data from each camera (72A, 72B) to determine the first coordinate and the second coordinate in each coordinate series associated with the visible light wavelength (68), wherein the first coordinate and the second coordinate in each coordinate series fall within the line width region (250). 如請求項7之光學檢測系統(10),其中該線寬區域(250)為數個像素及/或一灰階臨界值的函數。 As in claim 7, the optical detection system (10), wherein the line width region (250) is a function of a number of pixels and/or a grayscale threshold value. 如請求項1之光學檢測系統(10),其中該玻璃片(G)之該表面(62)為一第一表面(62);其中該玻璃片(G)具有與該第一表面(62)相反的一第二表面(64);與其中該控制系統(16)係進一步組配來響應於該第一表面(62)及第二表面(64)中之一表面包含了比該第一表面(62)及第二表面(64)中之另一表面高的錫濃度而調整該雷射(50)的強度。 The optical detection system (10) of claim 1, wherein the surface (62) of the glass sheet (G) is a first surface (62); wherein the glass sheet (G) has a second surface (64) opposite to the first surface (62); and wherein the control system (16) is further configured to adjust the intensity of the laser (50) in response to one of the first surface (62) and the second surface (64) containing a higher concentration of tin than the other of the first surface (62) and the second surface (64). 如請求項9之光學檢測系統(10),其中該控制系統(16)係進一步組配來在該第一表面(62)包含較高的錫濃度時,使該雷射(50)以較低的強度運作。 The optical detection system (10) of claim 9, wherein the control system (16) is further configured to operate the laser (50) at a lower intensity when the first surface (62) contains a higher concentration of tin. 如請求項1之光學檢測系統(10),其中該控制系統(16)係進一 步組配來使用該表面(62)的該組合圖(M3)來判定該表面(62)的一模擬光學反射率。 The optical detection system (10) of claim 1, wherein the control system (16) is further configured to use the combination map (M3) of the surface (62) to determine a simulated optical reflectivity of the surface (62). 如請求項11之光學檢測系統(10),其進一步包含與該控制系統(16)通訊的一顯示器;其中該控制系統(16)係進一步組配來向該顯示器輸出不變量資料之一圖及/或一格子板及一斑馬板中之一板的一模擬反射光學影像。 The optical detection system (10) of claim 11 further comprises a display communicating with the control system (16); wherein the control system (16) is further configured to output a graph of invariant data and/or a simulated reflected optical image of one of a grid plate and a zebra plate to the display. 如請求項1之光學檢測系統(10),其中該控制系統(16)係進一步組配來使用該表面(62)的該組合圖(M3)來規測該玻璃片(G)。 The optical inspection system (10) of claim 1, wherein the control system (16) is further configured to use the combination map (M3) of the surface (62) to measure the glass sheet (G). 如請求項1之光學檢測系統(10),其中該控制系統(16)係進一步組配來藉由下述方式對該組合圖(M3)去雜訊:網格化該組合圖(M3)中之該第一座標系列及該第二座標系列;平均化網格鄰域的法向量;以及調整該第一座標系列及該第二座標系列中之一座標位置,以在該組合圖(M3)中建立一系列之經後處理的座標。 The optical detection system (10) of claim 1, wherein the control system (16) is further configured to denoise the combined image (M3) by: gridding the first coordinate series and the second coordinate series in the combined image (M3); averaging the normal vectors of the grid neighbors; and adjusting a coordinate position in the first coordinate series and the second coordinate series to establish a series of post-processed coordinates in the combined image (M3). 如請求項1之光學檢測系統(10),其中該控制系統(16)係進一步組配來藉由下述方式對該組合圖(M3)去雜訊:使用一拐點與一曲折點中之一者來移除鄰接該三維圖之一邊緣的數個點。 The optical detection system (10) of claim 1, wherein the control system (16) is further configured to denoise the combined image (M3) by removing a plurality of points adjacent to an edge of the three-dimensional image using one of an inflection point and a zigzag point. 一種使用光學檢測系統(10)的方法,其包含:從一紫外線雷射(50)及相關光件(54)形成一平面雷射切頁(60)且使該平面雷射切頁(60)指向一玻璃片(G)的一表面(62);在該平面雷射切頁(60)與該表面(62)的一交叉處激發該玻璃片(G)的該表面(62)以形成一可見光波長線(68)於該玻璃片(G)的該表面(62)上;使用一第一攝影機(72A)及一第二攝影機(72B)拍攝該可見光波長線(68),該第一攝影機(72A)及該第二攝影機(72B)各自對該玻璃片(G)之該表面(62)之一相對的個別部分(73A、73B)拍照,且在該玻璃片(G)之該表面(62)上具有個別視場;藉由分析來自該第一攝影機(72A)的成像資料,判定與該可見光波長線(68)相 關聯的一第一座標系列中的一第一座標及一第二座標;藉由三角測量,判定與該可見光波長線(68)相關聯的該第一座標系列中的與該第一座標及該第二座標中之各座標相關聯的一第三座標;藉由分析來自該第二攝影機(72B)的成像資料,判定與該可見光波長線(68)相關聯的一第二座標系列中的一第一座標及一第二座標;藉由三角測量,判定與該可見光波長線(68)相關聯的該第二座標系列中的與該第一座標及該第二座標中之各座標相關聯的一第三座標;建立該玻璃片(G)之該表面(62)的作為該第一座標系列之函數的一第一三維圖(M1);建立該玻璃片(G)之該表面(62)的作為該第二座標系列之函數的一第二三維圖(M2);與結合該第一三維圖(M1)及該第二三維圖(M2)以形成該玻璃片(G)之該表面(62)的一組合圖(M3)。 A method for using an optical detection system (10) includes: forming a planar laser cutting page (60) from an ultraviolet laser (50) and related optical components (54) and directing the planar laser cutting page (60) toward a surface (62) of a glass sheet (G); exciting the surface (62) of the glass sheet (G) at an intersection of the planar laser cutting page (60) and the surface (62) to form a visible light wavelength line (68) on the surface (62) of the glass sheet (G); using a first camera A first camera (72A) and a second camera (72B) are used to photograph the visible light wavelength (68), the first camera (72A) and the second camera (72B) each photograph a relatively individual portion (73A, 73B) of the surface (62) of the glass sheet (G), and have individual fields of view on the surface (62) of the glass sheet (G); by analyzing the imaging data from the first camera (72A), a first coordinate series associated with the visible light wavelength (68) is determined a first coordinate and a second coordinate in the first coordinate series associated with the visible light wavelength (68); determining a third coordinate associated with each of the first coordinate and the second coordinate in the first coordinate series associated with the visible light wavelength (68) by triangulation; determining a first coordinate and a second coordinate in a second coordinate series associated with the visible light wavelength (68) by analyzing imaging data from the second camera (72B); determining the second coordinate associated with the visible light wavelength (68) by triangulation A third coordinate in the series associated with each of the first coordinate and the second coordinate; establishing a first three-dimensional graph (M1) of the surface (62) of the glass sheet (G) as a function of the first coordinate series; establishing a second three-dimensional graph (M2) of the surface (62) of the glass sheet (G) as a function of the second coordinate series; and combining the first three-dimensional graph (M1) and the second three-dimensional graph (M2) to form a combined graph (M3) of the surface (62) of the glass sheet (G). 如請求項16之方法,其進一步包含:使該玻璃片(G)相對於該雷射(50)、該平面雷射切頁(60)及該等攝影機(72A、72B)移動;與在該玻璃片(G)相對於該平面雷射切頁(60)移動時,使用該第一攝影機(72A)來拍攝一第一系列可見光波長線;在該玻璃片(G)相對於該平面雷射切頁(60)移動時,使用該第二攝影機(72B)來拍攝一第二系列可見光波長線;其中該表面(62)的該第一三維圖(M1)係作為該第一系列可見光波長線中的該第一座標系列的函數而建立;其中該表面(62)的該第二三維圖(M2)係作為該第二系列可見光波長線中的該第二座標系列的函數而建立。 The method of claim 16 further comprises: moving the glass sheet (G) relative to the laser (50), the planar laser cutting page (60) and the cameras (72A, 72B); and when the glass sheet (G) moves relative to the planar laser cutting page (60), using the first camera (72A) to capture a first series of visible light wavelengths; when the glass sheet (G) moves relative to the planar laser cutting page (60), When the page (60) moves, the second camera (72B) is used to shoot a second series of visible light wavelengths; wherein the first three-dimensional map (M1) of the surface (62) is established as a function of the first coordinate series in the first series of visible light wavelengths; wherein the second three-dimensional map (M2) of the surface (62) is established as a function of the second coordinate series in the second series of visible light wavelengths. 如請求項16之方法,其進一步包含:使用該組合圖(M3)中之一組座標與該表面(62)之一規測模型相比較而計算出玻璃片(G)之一不變量指標;與輸出該不變量指標,以提供該玻璃片(G)之規測資訊。 The method of claim 16 further comprises: using a set of coordinates in the combined graph (M3) to compare with a gauge model of the surface (62) to calculate an invariant index of the glass sheet (G); and outputting the invariant index to provide gauge information of the glass sheet (G). 如請求項16之方法,其進一步包含:對該表面(62)之該組合圖(M3)去雜訊;與使用來自該組合圖(M3)之至少一組座標與被指定用於該玻璃片(G)之該表面(62)之一光學反射率規格相比較,而計算出該玻璃片(G)之一不變量指標;與輸出該不變量指標,以提供該表面(62)之光學反射率資訊。 The method of claim 16 further comprises: denoising the combined image (M3) of the surface (62); calculating an invariant index of the glass sheet (G) by comparing at least one set of coordinates from the combined image (M3) with an optical reflectance specification of the surface (62) specified for the glass sheet (G); and outputting the invariant index to provide optical reflectance information of the surface (62). 如請求項19之方法,其進一步包含:藉由射線追蹤來自被去雜訊之該組合圖(M3)的資料集,而構建一格子板與一斑馬板中之一板的一模擬反射光學影像;與輸出該模擬反射光學影像。 The method of claim 19 further comprises: constructing a simulated reflected optical image of one of a grid plate and a zebra plate by ray tracing the data set from the denoised combined image (M3); and outputting the simulated reflected optical image.
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