TWI839955B - Use of indium-bismuth alloys as solder - Google Patents
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- bismuth alloy
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- 229910000679 solder Inorganic materials 0.000 title claims abstract description 113
- 229910001152 Bi alloy Inorganic materials 0.000 title claims abstract description 104
- MPZNMEBSWMRGFG-UHFFFAOYSA-N bismuth indium Chemical compound [In].[Bi] MPZNMEBSWMRGFG-UHFFFAOYSA-N 0.000 title claims abstract description 104
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 claims abstract description 58
- 238000005476 soldering Methods 0.000 claims abstract description 37
- 239000004020 conductor Substances 0.000 claims abstract description 31
- RSWGJHLUYNHPMX-UHFFFAOYSA-N Abietic-Saeure Natural products C12CCC(C(C)C)=CC2=CCC2C1(C)CCCC2(C)C(O)=O RSWGJHLUYNHPMX-UHFFFAOYSA-N 0.000 claims abstract description 30
- KHPCPRHQVVSZAH-HUOMCSJISA-N Rosin Natural products O(C/C=C/c1ccccc1)[C@H]1[C@H](O)[C@@H](O)[C@@H](O)[C@@H](CO)O1 KHPCPRHQVVSZAH-HUOMCSJISA-N 0.000 claims abstract description 30
- KHPCPRHQVVSZAH-UHFFFAOYSA-N trans-cinnamyl beta-D-glucopyranoside Natural products OC1C(O)C(O)C(CO)OC1OCC=CC1=CC=CC=C1 KHPCPRHQVVSZAH-UHFFFAOYSA-N 0.000 claims abstract description 30
- 229910052742 iron Inorganic materials 0.000 claims abstract description 29
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims abstract description 27
- 229910052802 copper Inorganic materials 0.000 claims abstract description 27
- 239000010949 copper Substances 0.000 claims abstract description 27
- 238000002844 melting Methods 0.000 claims abstract description 22
- 230000008018 melting Effects 0.000 claims abstract description 22
- 238000010438 heat treatment Methods 0.000 claims abstract description 11
- QPLDLSVMHZLSFG-UHFFFAOYSA-N Copper oxide Chemical compound [Cu]=O QPLDLSVMHZLSFG-UHFFFAOYSA-N 0.000 claims abstract description 5
- 239000005751 Copper oxide Substances 0.000 claims abstract description 5
- 229910000431 copper oxide Inorganic materials 0.000 claims abstract description 5
- 239000011248 coating agent Substances 0.000 claims abstract description 4
- 238000000576 coating method Methods 0.000 claims abstract description 4
- 239000000758 substrate Substances 0.000 claims description 45
- 238000000034 method Methods 0.000 claims description 7
- 229910052797 bismuth Inorganic materials 0.000 claims description 6
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 claims description 6
- 229910052738 indium Inorganic materials 0.000 claims description 6
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 claims description 6
- 238000007711 solidification Methods 0.000 claims description 6
- 230000008023 solidification Effects 0.000 claims description 6
- 239000007788 liquid Substances 0.000 claims description 5
- 239000000203 mixture Substances 0.000 claims description 3
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 abstract description 7
- 229910052718 tin Inorganic materials 0.000 abstract description 7
- 238000003466 welding Methods 0.000 description 26
- KRKNYBCHXYNGOX-UHFFFAOYSA-N citric acid Chemical compound OC(=O)CC(O)(C(O)=O)CC(O)=O KRKNYBCHXYNGOX-UHFFFAOYSA-N 0.000 description 12
- 229910001128 Sn alloy Inorganic materials 0.000 description 7
- PSMFTUMUGZHOOU-UHFFFAOYSA-N [In].[Sn].[Bi] Chemical compound [In].[Sn].[Bi] PSMFTUMUGZHOOU-UHFFFAOYSA-N 0.000 description 7
- 230000000694 effects Effects 0.000 description 5
- 230000005540 biological transmission Effects 0.000 description 4
- 230000003647 oxidation Effects 0.000 description 3
- 238000007254 oxidation reaction Methods 0.000 description 3
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 230000001590 oxidative effect Effects 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 239000001301 oxygen Substances 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 238000009736 wetting Methods 0.000 description 2
- 241000282414 Homo sapiens Species 0.000 description 1
- 235000008331 Pinus X rigitaeda Nutrition 0.000 description 1
- 235000011613 Pinus brutia Nutrition 0.000 description 1
- 241000018646 Pinus brutia Species 0.000 description 1
- 241000779819 Syncarpia glomulifera Species 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 235000000396 iron Nutrition 0.000 description 1
- 239000000155 melt Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
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- 239000001739 pinus spp. Substances 0.000 description 1
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- 229920005989 resin Polymers 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229940036248 turpentine Drugs 0.000 description 1
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Abstract
Description
本發明係關於一種銦鉍合金作為焊料之用途,尤指利用銦鉍合金熔點溫度低之特性作為焊料進行焊接之作業,防止銅電烙鐵頭發生氧化現象的發明。 This invention is about the use of an indium-bismuth alloy as a solder, especially the invention of using the low melting point of the indium-bismuth alloy as a solder for welding operations to prevent the copper soldering iron tip from oxidizing.
隨著日新月異的科技發展,人類對於電子產品已具有密不可分的依賴,各項電子相關技術也隨著時間推移逐步走向成熟且高效率的發展,而關於電子產品的焊接,最常見的即為錫作為焊接時所使用的焊料,由於錫的延展性及焊接性能良好,並且具有導電特性,因此錫成為電子行業在焊接時最普遍使用的焊料。錫的熔點為232℃,而PCB電路板常見使用電烙鐵進行焊接,電烙鐵頭常見使用銅,銅的氧化溫度又大致在200℃出現。因而,為了熔化錫進行電子元件的焊接,將付出高溫導致銅電烙鐵頭氧化及/或電子元件損壞的代價。 With the rapid development of science and technology, human beings have become inseparable from electronic products. Various electronic-related technologies have gradually become mature and efficient over time. As for the welding of electronic products, the most common solder used is tin. Due to its good ductility and welding performance, and its conductive properties, tin has become the most commonly used solder in the electronics industry. The melting point of tin is 232℃, and PCB circuit boards are commonly welded with electric soldering irons. The electric soldering iron tip is commonly made of copper, and the oxidation temperature of copper is approximately 200℃. Therefore, in order to melt tin for welding electronic components, the high temperature will cause oxidation of the copper electric soldering iron tip and/or damage to the electronic components.
半導體層次的元件接合有使用銦鉍合金作為接合層,如美國專利公告第US09502376B2號,該發明使用質量為66.7%的銦及質量為33.3%的鉍組成,該案使用的銦鉍合金熔點約為120℃。 The semiconductor layer components are bonded using indium-bismuth alloy as the bonding layer, such as US Patent Publication No. US09502376B2, which uses 66.7% indium and 33.3% bismuth. The melting point of the indium-bismuth alloy used in this case is about 120°C.
爰此,為了防止銅電烙鐵頭因焊接導致氧化,本發明人提出一種銦鉍合金作為焊料之用途,包含:將一銦鉍合金焊料設置於一基板與一導 體之間,該銦鉍合金焊料之熔點係介於60℃至120℃之間;在該基板與該銦鉍合金焊料之間塗覆一松香;將一電烙鐵之一銅電烙鐵頭加熱至略高於該銦鉍合金焊料之熔點;使該銅電烙鐵頭接觸該銦鉍合金焊料藉以融熔該銦鉍合金焊料,以焊接該基板與該導體。 Therefore, in order to prevent the copper soldering iron tip from being oxidized due to welding, the inventor proposes a method of using an indium-bismuth alloy as a solder, which includes: placing an indium-bismuth alloy solder between a substrate and a conductor, wherein the melting point of the indium-bismuth alloy solder is between 60°C and 120°C; applying rosin between the substrate and the indium-bismuth alloy solder; heating a copper soldering iron tip of a soldering iron to a temperature slightly higher than the melting point of the indium-bismuth alloy solder; and making the copper soldering iron tip contact the indium-bismuth alloy solder to melt the indium-bismuth alloy solder to weld the substrate and the conductor.
其中,所述將該銅電烙鐵頭加熱至略高於該銦鉍合金焊料之熔點係將該銅電烙鐵頭加熱至高於該銦鉍合金焊料之熔點10%。 Wherein, heating the copper soldering iron tip to a temperature slightly higher than the melting point of the indium-bismuth alloy solder means heating the copper soldering iron tip to a temperature 10% higher than the melting point of the indium-bismuth alloy solder.
進一步,將使用銦鉍合金焊料焊接完成之該基板與該導體於100℃持溫1小時。 Furthermore, the substrate and the conductor that were soldered using indium-bismuth alloy solder were kept at 100°C for 1 hour.
其中,該銦鉍合金焊料係由銦與鉍混合而成,該銦鉍合金焊料呈片狀且厚度介於0.01公厘至1公厘之間。 The indium-bismuth alloy solder is a mixture of indium and bismuth. The indium-bismuth alloy solder is in sheet form and has a thickness ranging from 0.01 mm to 1 mm.
進一步,該銦鉍合金焊料在液態時填補該基板及/或該導體之介面縫隙。 Furthermore, the indium-bismuth alloy solder fills the interface gaps of the substrate and/or the conductor when in liquid state.
進一步,該銦鉍合金焊料經升溫熔化過後,將於固化後的表面進一步形成一氧化層,藉此使該銦鉍合金焊料不因再次升溫而熔化流出。 Furthermore, after the indium-bismuth alloy solder is heated and melted, an oxide layer will be further formed on the solidified surface, thereby preventing the indium-bismuth alloy solder from melting and flowing out due to heating again.
其中,該銦鉍合金焊料固化後之抗拉強度介於每平方毫米5.90公斤力至每平方毫米9.66公斤力之間。 Among them, the tensile strength of the indium-bismuth alloy solder after solidification ranges from 5.90 kgf/mm2 to 9.66 kgf/mm2.
其中,該導體係為導線或電子元件接腳。 Wherein, the conductor is a wire or an electronic component pin.
其中,該基板係為電路板。 Among them, the substrate is a circuit board.
其中,所述松香在該焊接過程將還原該銅電烙鐵頭所產生的氧化銅層。 The rosin will reduce the copper oxide layer produced by the copper soldering iron tip during the welding process.
根據上述技術特徵可達成以下功效: Based on the above technical features, the following effects can be achieved:
1.藉由銦與鉍混合成銦鉍合金作為焊料,有效使銅電烙鐵頭僅以介於60℃至120℃之間的溫度,即可達成焊接電子線路的作業,防止銅電烙鐵頭因高溫而氧化及/或電路板因受熱而致損壞。 1. By mixing indium and bismuth into an indium-bismuth alloy as solder, the copper soldering iron tip can effectively achieve the task of soldering electronic circuits at a temperature between 60℃ and 120℃, preventing the copper soldering iron tip from oxidizing due to high temperature and/or damaging the circuit board due to heat.
2.透過松香塗覆於基板與銦鉍合金焊料之間,使基板與銦鉍合金焊料之間降低表面張力以及具有濕潤效果,確保銦鉍合金焊料被熔化後可在基板表面順利流動或擴展,同時在焊接過程也可還原該銅電烙鐵頭所產生的氧化銅層。由於松香揮發溫度為153℃,故在120℃下進行焊接,松香可以防止基板和導體表面金屬被氧化,更可以避免與氧接觸長達1小時。 2. By coating the rosin between the substrate and the indium bismuth alloy solder, the surface tension between the substrate and the indium bismuth alloy solder is reduced and the wetting effect is achieved, ensuring that the indium bismuth alloy solder can flow or expand smoothly on the substrate surface after being melted. At the same time, the copper oxide layer produced by the copper soldering iron tip can be restored during the welding process. Since the rosin volatile temperature is 153°C, when welding is performed at 120°C, the rosin can prevent the metal on the substrate and the conductor surface from being oxidized, and can also avoid contact with oxygen for up to 1 hour.
3.銦鉍合金焊料固化後之抗拉強度可以達到每平方毫米5.90公斤力至每平方毫米9.66公斤力之間,從而有效降低焊接完成的導體再度與基板發生分離的風險。 3. The tensile strength of indium-bismuth alloy solder after solidification can reach between 5.90 kgf/mm2 and 9.66 kgf/mm2, which effectively reduces the risk of the soldered conductor separating from the substrate again.
4.將使用銦鉍合金焊料焊接完成之基板與導體於100℃持溫1小時,可增加銦鉍合金焊料之抗拉強度達每平方毫米21.57公斤力。 4. Keeping the substrate and conductor soldered with indium-bismuth alloy solder at 100°C for 1 hour can increase the tensile strength of indium-bismuth alloy solder to 21.57 kgf/mm2.
5.當銦鉍合金焊料熔化後係屬低黏度的液態,可有效填補基板及/或導體的介面縫隙,使電力的傳輸具有良好的輸送路徑。 5. When the indium-bismuth alloy solder melts, it is a low-viscosity liquid that can effectively fill the interface gaps of the substrate and/or conductor, providing a good transmission path for the transmission of electricity.
6.銦鉍合金焊料在首次升溫熔化並凝固後,將於表面自然形成氧化層,保護銦鉍合金焊料不因再次升溫而熔化,導致由介面縫隙流出。 6. After the indium bismuth alloy solder is heated up for the first time, melted and solidified, an oxide layer will naturally form on the surface to protect the indium bismuth alloy solder from melting due to heating up again, causing it to flow out from the interface gap.
7.由於本發明的銦鉍合金焊料的黏度甚低,在焊接過程很難控制其流動方向,透過將銦鉍合金焊料成形為厚度介於0.01公厘至1公厘之間的片狀構造,再將呈片狀的銦鉍合金焊料剪成如其焊接平面的尺寸,並直接置於基板欲焊接的部位,有效降低控制難度,更使得焊接平面上的銦鉍合金焊料可以分佈均勻。 7. Since the viscosity of the indium bismuth alloy solder of the present invention is very low, it is difficult to control its flow direction during the welding process. By forming the indium bismuth alloy solder into a sheet structure with a thickness between 0.01 mm and 1 mm, and then cutting the sheet of indium bismuth alloy solder into the size of its welding plane, and directly placing it on the part of the substrate to be welded, the control difficulty is effectively reduced, and the indium bismuth alloy solder on the welding plane can be evenly distributed.
1:基板 1: Substrate
2:導體 2: Conductor
3:松香 3: Rosin
4:銦鉍合金焊料 4: Indium-bismuth alloy solder
[第一圖]係本發明銦鉍合金作為焊料之用途之立體外觀圖。 [Figure 1] is a three-dimensional appearance diagram of the use of the indium-bismuth alloy of the present invention as solder.
[第二圖]係本發明銦鉍合金作為焊料之用途之剖面示意圖。 [Figure 2] is a cross-sectional schematic diagram of the use of the indium-bismuth alloy of the present invention as solder.
綜合上述技術特徵,本發明銦鉍合金作為焊料之用途的主要功效將可於下述實施例清楚呈現。 Combining the above technical features, the main effect of the indium-bismuth alloy of the present invention as solder can be clearly presented in the following embodiments.
請先參閱第一圖,係揭示本發明實施例銦鉍合金作為焊料之用途,包括一基板1、一導體2、一松香3及一銦鉍合金焊料4,其中,所述銦鉍合金焊料4位於基板1與導體2之間,而松香3則位於基板1與銦鉍合金焊料4之間。
Please refer to the first figure, which discloses the use of indium bismuth alloy as solder in the embodiment of the present invention, including a
具體而言,所述基板1係為電路板,所述導體2為導線或電子元件接腳,基板1與導體2透過銦鉍合金焊料4進行電性連接,所述銦鉍合金焊料4係由銦與鉍混合而成的一銦鉍合金,藉以作為焊接時所使用的焊料,其中,銦鉍合金焊料4的熔點介於60℃至120℃之間,且固化後之抗拉強度介於每平方毫米5.90公斤力至每平方毫米9.66公斤力之間,並具有導電特性,有效使焊接作業僅以介於60℃至120℃之間的溫度即可達成,以防止銅電烙鐵頭因高溫而氧化及/或電路板因受熱而致損壞。
Specifically, the
另外,本發明的銦鉍合金焊料4也可以選自一銦鉍錫合金,其中,該銦鉍錫合金為銦、鉍及錫依所需的比例混合而成,若錫的添加量為混合比例中所佔最低,則仍然可以實施。上述各佔比例僅為示例之用,非以此為限。
In addition, the indium-
在所述基板1與所述銦鉍合金焊料4之間塗覆所述松香3,又稱為煉松脂,係由松樹與針葉樹的油樹脂去除松節油揮發性成份後所得到的產物,所述松香3之熔點介於110℃至135℃之間,揮發溫度為153℃,故在120℃下進行焊接,松香可以防止基板1和導體2表面金屬被氧化,更可以避免與氧接觸長達1小時,此為所屬技術領域中具有通常知識者所難以臆測的,由於銦鉍合金焊料4之熔點溫度低於所述松香3之熔點及揮發溫度,故利用所述銦鉍合金焊料4進行焊接作業時並不影響所述松香3的使用。
The
請參閱第一圖及第二圖,當實際進行焊接作業時,先在基板1欲焊接的部位均勻塗覆松香3,由於本發明的銦鉍合金焊料4的黏度甚低,在焊接過程很難控制其流動方向,透過將銦鉍合金焊料4成形為厚度介於0.01公厘至1公厘之間的片狀構造,再將呈片狀的銦鉍合金焊料4剪成符合焊接平面的尺寸,並直接置於基板1欲焊接的部位,有效降低控制難度,更使得焊接平面上的銦鉍合金焊料4可以分佈均勻,接著透過一電烙鐵之一銅電烙鐵頭加熱,以高於銦鉍合金焊料4的熔點溫度10%的攝氏溫度接觸銦鉍合金焊料4,使銦鉍合金焊料4由固態轉變為液態,並流動於導體2以及已塗覆松香3的基板1之間,接著將導體2靠近或抵貼於基板1欲焊接的部位藉以完成焊接作業。由於銦鉍合金焊料4在基板1上透過松香3,使銦鉍合金焊料4與基板1之間的表面張力降低更具有濕潤效果,藉此,協助熔化後的銦鉍合金焊料4可以在基板1上增加流動性並順利擴展,更可以還原所述銅電烙鐵頭在焊接過程所產生的氧化銅層,並透過在液態時具有低黏度特性的銦鉍合金焊料4填補所述基板1及/或所述導體2之介面縫隙,並覆蓋或包覆所述導體2的末端,使電力具有良好
的傳輸路徑,最後待銦鉍合金焊料4轉變為固態後,基板1及導體2即可藉由銦鉍合金焊料4達成結合並進行電性連接以完成電力輸送之目的。
Please refer to the first and second figures. When actually performing the welding operation, the
除此之外,本發明進一步將銦鉍合金焊料4及前述銦鉍錫合金同樣作為焊料於不同溫度下,使用松香3或一檸檬酸塗覆於基板1上再執行焊接作業,以測試銦鉍合金焊料4或所述銦鉍錫合金焊料在基板1與導體2之間焊接過後的抗拉強度。請參閱表一所揭示,當於60℃下,使用松香3塗覆於基板1並分別使用銦鉍合金焊料4及所述銦鉍錫合金焊料進行焊接,焊接完畢後抗拉強度分別為每平方毫米2.50公斤力及每平方毫米1.90公斤力;當使用所述檸檬酸取代松香3後,抗拉強度則分別降低為每平方毫米0.40公斤力及每平方毫米1.50公斤力。當於70℃下,使用松香3塗覆於基板1並分別使用銦鉍合金焊料4及所述銦鉍錫合金焊料進行焊接,焊接完畢後抗拉強度分別為每平方毫米9.66公斤力及每平方毫米7.80公斤力;當使用所述檸檬酸取代松香3後,抗拉強度則分別降低為每平方毫米4.40公斤力及每平方毫米4.10公斤力。當於80℃下,使用松香3塗覆於基板1並分別使用銦鉍合金焊料4及所述銦鉍錫合金焊料進行焊接,焊接完畢後抗拉強度分別為每平方毫米8.60公斤力及每平方毫米6.30公斤力;當使用所述檸檬酸取代松香3後,抗拉強度則分別降低為每平方毫米4.70公斤力及每平方毫米0.60公斤力。
In addition, the present invention further uses the indium
整體而言,本發明透過銦鉍合金作為焊接時之焊料,在介於60℃至120℃之間的溫度即可作業完成,有效降低焊接作業時的工作溫度,避免銅烙鐵頭高溫氧化及/或電子元件受熱而損壞,或防止超過153℃而造成松香3揮發殆盡。此外,銦鉍合金焊料4固化後的抗拉強度介於每平方毫米5.90公斤力至每平方毫米9.66公斤力之間,從而有效降低焊接完成的導體2再度與基板1發生分離的風險,若基板1與導體2使用銦鉍合金焊料4完成焊接並於100℃持溫1小時,抗拉強度更可提升至每平方毫米21.57公斤力,並且在銦鉍合金焊料4固化後將於表面形成一氧化層,透過所述氧化層的包覆,使銦鉍合金焊料4可以不因再次升溫而熔化,導致由介面縫隙流出。
In general, the present invention uses indium-bismuth alloy as solder during welding, and the operation can be completed at a temperature between 60°C and 120°C, which effectively reduces the working temperature during the welding operation, avoids high-temperature oxidation of the copper soldering iron tip and/or damage to electronic components due to heat, or prevents the temperature from exceeding 153°C and causing the
綜合上述實施例之說明,當可充分瞭解本發明之操作、使用及本發明產生之功效,惟以上所述實施例僅係為本發明之較佳實施例,當不能 以此限定本發明實施之範圍,即依本發明申請專利範圍及發明說明內容所作簡單的等效變化與修飾,皆屬本發明涵蓋之範圍內。 Combined with the description of the above embodiments, the operation, use and effects of the present invention can be fully understood. However, the above embodiments are only the preferred embodiments of the present invention and should not be used to limit the scope of implementation of the present invention. That is, simple equivalent changes and modifications made according to the scope of the patent application of the present invention and the content of the invention description are all within the scope of the present invention.
1:基板 1: Substrate
2:導體 2: Conductor
3:松香 3: Rosin
4:銦鉍合金焊料 4: Indium-bismuth alloy solder
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Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101934438A (en) * | 2005-08-18 | 2011-01-05 | 千住金属工业株式会社 | Lead-free low-temperature solder |
WO2012141869A1 (en) * | 2011-04-11 | 2012-10-18 | General Electric Company | Low temperature contact structure for flexible solid state device |
CN103231180A (en) * | 2013-05-15 | 2013-08-07 | 郑州机械研究所 | Aluminum alloy low-temperature brazing solder and production method thereof |
WO2015148178A1 (en) * | 2014-03-28 | 2015-10-01 | Dow Global Technologies Llc | Device and method for forming solder joints in photovoltaic components |
CN106068059A (en) * | 2015-04-23 | 2016-11-02 | 松下知识产权经营株式会社 | The attachment structure of circuit block, method of attachment and connecting material |
CN107452706A (en) * | 2016-05-30 | 2017-12-08 | 松下知识产权经营株式会社 | The connecting structure of circuit block and connection method |
TWI740332B (en) * | 2019-12-27 | 2021-09-21 | 遠東科技大學 | Method for reducing surface tension between indium-bismuth alloy and substrate by coating rosin as well as composite material manufactured by the method |
-
2022
- 2022-11-21 TW TW111144435A patent/TWI839955B/en active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101934438A (en) * | 2005-08-18 | 2011-01-05 | 千住金属工业株式会社 | Lead-free low-temperature solder |
WO2012141869A1 (en) * | 2011-04-11 | 2012-10-18 | General Electric Company | Low temperature contact structure for flexible solid state device |
CN103231180A (en) * | 2013-05-15 | 2013-08-07 | 郑州机械研究所 | Aluminum alloy low-temperature brazing solder and production method thereof |
WO2015148178A1 (en) * | 2014-03-28 | 2015-10-01 | Dow Global Technologies Llc | Device and method for forming solder joints in photovoltaic components |
CN106068059A (en) * | 2015-04-23 | 2016-11-02 | 松下知识产权经营株式会社 | The attachment structure of circuit block, method of attachment and connecting material |
CN107452706A (en) * | 2016-05-30 | 2017-12-08 | 松下知识产权经营株式会社 | The connecting structure of circuit block and connection method |
TWI740332B (en) * | 2019-12-27 | 2021-09-21 | 遠東科技大學 | Method for reducing surface tension between indium-bismuth alloy and substrate by coating rosin as well as composite material manufactured by the method |
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