TWI833504B - Non-contact testing apparatus with internal circulation - Google Patents

Non-contact testing apparatus with internal circulation Download PDF

Info

Publication number
TWI833504B
TWI833504B TW111148359A TW111148359A TWI833504B TW I833504 B TWI833504 B TW I833504B TW 111148359 A TW111148359 A TW 111148359A TW 111148359 A TW111148359 A TW 111148359A TW I833504 B TWI833504 B TW I833504B
Authority
TW
Taiwan
Prior art keywords
test
internal circulation
temperature control
test chamber
temperature
Prior art date
Application number
TW111148359A
Other languages
Chinese (zh)
Other versions
TW202426934A (en
Inventor
李文新
Original Assignee
翌實實業有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 翌實實業有限公司 filed Critical 翌實實業有限公司
Priority to TW111148359A priority Critical patent/TWI833504B/en
Application granted granted Critical
Publication of TWI833504B publication Critical patent/TWI833504B/en
Publication of TW202426934A publication Critical patent/TW202426934A/en

Links

Images

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

The present invention provides a non-contact testing apparatus with an internal circulation, which includes a testing device, a temperature adjustment device connected to the testing device, and a gas supplying device. The testing device includes two testing chambers and a testing carrier located thereon. The temperature adjustment device includes a guiding cover located above the testing carrier, a temperature controlling unit arranged in the guiding cover, and a fan mechanism that is assembled to one of the two testing chambers. The guiding cover defines an internal circulation path that is arranged in an interior of the two testing chambers and that passes through the temperature controlling unit. The fan mechanism is configured to form a circulation airflow traveling along the internal circulation path, and the airflow has a predetermined temperature through the temperature controlling unit. The gas supplying device is spatially communicated with the interior of the two testing chambers, and the gas supplying device is configured to input a predetermined gas into the interior of the two testing chambers and enables the interior of the two testing chambers to achieve a predetermined pressure.

Description

內循環式非接觸測試設備Internal circulation non-contact testing equipment

本發明涉及一種測試設備,尤其涉及一種內循環式非接觸測試設備。The present invention relates to a kind of testing equipment, in particular to an internal circulation non-contact testing equipment.

現有測試設備在對一待測電子元件進行測試時,需以溫控元件抵頂於所述待測電子元件,使得所述待測電子元件達到測試要求的溫度。然而,現有測試設備的接觸式測試方式已逐漸不符合電子產業日新月異的變化與需求。When the existing testing equipment tests an electronic component to be tested, a temperature control element needs to be pressed against the electronic component to be tested so that the electronic component to be tested reaches the temperature required for testing. However, the contact testing methods of existing test equipment have gradually failed to meet the ever-changing changes and needs of the electronics industry.

於是,本發明人認為上述缺陷可改善,乃特潛心研究並配合科學原理的運用,終於提出一種設計合理且有效改善上述缺陷的本發明。Therefore, the inventor believed that the above-mentioned defects could be improved, so he devoted himself to research and applied scientific principles, and finally proposed an invention that is reasonably designed and effectively improves the above-mentioned defects.

本發明實施例在於提供一種內循環式非接觸測試設備,其能有效地改善現有測試設備所可能產生的缺陷。An embodiment of the present invention provides an internal circulation non-contact testing equipment, which can effectively improve the defects that may occur in existing testing equipment.

本發明實施例公開一種內循環式非接觸測試設備,其包括:一機台本體;一測試裝置,其安裝於所述機台本體,並且所述測試裝置包含有:一第一測試腔體與一第二測試腔體,其皆安裝於所述機台本體;其中,所述第二測試腔體能與所述第一測試腔體沿一第一方向彼此相對地移動,以共同封閉形成有一測試空間;所述第一測試腔體的頂部形成有連通於所述測試空間的一開口;及一測試載座,設置於所述第二測試腔體,並且所述測試載座用以供一待測電子元件設置;一溫度調節裝置,其安裝於所述第一測試腔體,並且所述溫度調節裝置的部分位於所述測試空間之內;其中,所述溫度調節裝置包含有:一溫控機構,包含有:一導流罩,位於所述測試空間內,並且所述導流罩位於所述測試載座的上方;及一溫控單元,配置於所述導流罩內且鄰近於所述開口;及一風扇機構,安裝於所述第一測試腔體的所述開口且面向所述溫控單元,並且所述測試空間通過所述導流罩與所述風扇機構而定義有於所述導流罩內側與外側進行循環且沿經所述溫控單元的一內循環路徑;其中,所述風扇機構能運轉而形成有沿所述內循環路徑流動的一循環氣流,並且所述循環氣流能通過所述溫控單元而具有一預設溫度;以及一供氣裝置,連通於所述測試空間;其中,所述供氣裝置用以通入一預定氣體至所述測試空間、並能使所述測試空間達到一預設氣壓,以使設置於所述測試載座的所述待測電子元件能在所述預設氣壓與所述預設溫度的環境下進行一非接觸測試作業。An embodiment of the present invention discloses an internal circulation non-contact testing equipment, which includes: a machine body; a testing device installed on the machine body, and the testing device includes: a first testing cavity and A second test chamber, both of which are installed on the machine body; wherein, the second test chamber and the first test chamber can move relative to each other along a first direction to be jointly closed to form a test chamber. space; the top of the first test chamber is formed with an opening connected to the test space; and a test carrier is provided in the second test chamber, and the test carrier is used for a test Test electronic components; a temperature adjustment device, which is installed in the first test cavity, and part of the temperature adjustment device is located in the test space; wherein, the temperature adjustment device includes: a temperature control The mechanism includes: a flow guide cover located in the test space, and the flow guide cover is located above the test carrier; and a temperature control unit configured in the flow guide cover and adjacent to the The opening; and a fan mechanism, installed at the opening of the first test chamber and facing the temperature control unit, and the test space is defined by the air guide and the fan mechanism. The inside and outside of the shroud circulate and follow an internal circulation path through the temperature control unit; wherein the fan mechanism can operate to form a circulating airflow flowing along the internal circulation path, and the circulation The air flow can pass through the temperature control unit to have a preset temperature; and an air supply device is connected to the test space; wherein the air supply device is used to introduce a predetermined gas into the test space and can The test space is brought to a preset air pressure, so that the electronic component to be tested disposed on the test carrier can perform a non-contact test operation in the environment of the preset air pressure and the preset temperature.

綜上所述,本發明實施例所公開的內循環式非接觸測試設備,其通過多個裝置之間的結構搭配,以使得至少一個所述待測電子元件可以經由非接觸方式(如:所述測試空間具有所述預設氣壓與所述預設溫度)來對進行測試參數(如:溫度)的調整。To sum up, the internal circulation non-contact testing equipment disclosed in the embodiment of the present invention uses the structural coordination between multiple devices so that at least one of the electronic components to be tested can be tested in a non-contact manner (such as: The test space has the preset air pressure and the preset temperature) to adjust test parameters (such as temperature).

為能更進一步瞭解本發明的特徵及技術內容,請參閱以下有關本發明的詳細說明與附圖,但是此等說明與附圖僅用來說明本發明,而非對本發明的保護範圍作任何的限制。In order to further understand the characteristics and technical content of the present invention, please refer to the following detailed description and drawings of the present invention. However, these descriptions and drawings are only used to illustrate the present invention and do not make any reference to the protection scope of the present invention. limit.

以下是通過特定的具體實施例來說明本發明所公開有關“內循環式非接觸測試設備”的實施方式,本領域技術人員可由本說明書所公開的內容瞭解本發明的優點與效果。本發明可通過其他不同的具體實施例加以施行或應用,本說明書中的各項細節也可基於不同觀點與應用,在不悖離本發明的構思下進行各種修改與變更。另外,本發明的附圖僅為簡單示意說明,並非依實際尺寸的描繪,事先聲明。以下的實施方式將進一步詳細說明本發明的相關技術內容,但所公開的內容並非用以限制本發明的保護範圍。The following is a specific example to illustrate the implementation of the "internal circulation non-contact testing equipment" disclosed in the present invention. Those skilled in the art can understand the advantages and effects of the present invention from the content disclosed in this specification. The present invention can be implemented or applied through other different specific embodiments, and various details in this specification can also be modified and changed based on different viewpoints and applications without departing from the concept of the present invention. In addition, the drawings of the present invention are only simple schematic illustrations and are not depictions based on actual dimensions, as is stated in advance. The following embodiments will further describe the relevant technical content of the present invention in detail, but the disclosed content is not intended to limit the scope of the present invention.

應當可以理解的是,雖然本文中可能會使用到“第一”、“第二”、“第三”等術語來描述各種元件或者信號,但這些元件或者信號不應受這些術語的限制。這些術語主要是用以區分一元件與另一元件,或者一信號與另一信號。另外,本文中所使用的術語“或”,應視實際情況可能包括相關聯的列出項目中的任一個或者多個的組合。It should be understood that although terms such as “first”, “second” and “third” may be used herein to describe various elements or signals, these elements or signals should not be limited by these terms. These terms are primarily used to distinguish one component from another component or one signal from another signal. In addition, the term "or" used in this article shall include any one or combination of more of the associated listed items depending on the actual situation.

請參閱圖1至圖9所示,其為本發明的一實施例。本實施例公開一種內循環式非接觸測試設備100,用以對至少一個待測電子元件200進行一非接觸測試作業。也就是說,所述內循環式非接觸測試設備100是通過非接觸方式來對所述待測電子元件200進行測試參數(如:溫度)調整。據此,以接觸方式來調整待測電子元件之溫度的任何測試設備,其皆不同於本實施例所指的所述內循環式非接觸測試設備100。Please refer to FIG. 1 to FIG. 9 , which is an embodiment of the present invention. This embodiment discloses an internal circulation non-contact testing equipment 100 for performing a non-contact testing operation on at least one electronic component 200 to be tested. That is to say, the internal circulation non-contact testing equipment 100 adjusts the test parameters (such as temperature) of the electronic component to be tested 200 in a non-contact manner. Accordingly, any testing equipment that uses a contact method to adjust the temperature of the electronic component under test is different from the internal circulation non-contact testing equipment 100 referred to in this embodiment.

如圖1至圖4所示,所述內循環式非接觸測試設備100於本實施例中包含有一機台本體1、安裝於所述機台本體1的一測試裝置2、協助所述測試裝置2運作的一抽氣裝置3、安裝於所述測試裝置2的一溫度調節裝置4、及安裝於所述溫度調節裝置4的一供氣裝置5,但本發明不以此為限。舉例來說,在本發明未繪示的其他實施例中,所述內循環式非接觸測試設備100也可以省略所述抽氣裝置3。As shown in Figures 1 to 4, the internal circulation non-contact testing equipment 100 in this embodiment includes a machine body 1, a testing device 2 installed on the machine body 1, and an assisting testing device. 2 operates an air extraction device 3, a temperature adjustment device 4 installed on the test device 2, and an air supply device 5 installed on the temperature adjustment device 4, but the invention is not limited thereto. For example, in other embodiments not shown in the present invention, the internal circulation non-contact testing equipment 100 may also omit the air extraction device 3 .

於本實施例中,所述測試裝置2包含有一第一測試腔體21、對應於所述第一測試腔體21的一第二測試腔體22、設置於所述第二測試腔體22的一測試載座23、位於所述第一測試腔體21與所述第二測試腔體22之間的一氣密墊圈24、及一密合機構25,但本發明不受限於此。舉例來說,在本發明未繪示的其他實施例中,所述內循環式非接觸測試設備100可依據設計需求而選擇性地採用所述氣密墊圈24及所述密合機構25至少其中之一、或是以其他構件取代。In this embodiment, the test device 2 includes a first test chamber 21, a second test chamber 22 corresponding to the first test chamber 21, and a second test chamber 22 provided in the second test chamber 22. A test carrier 23, an airtight gasket 24 located between the first test chamber 21 and the second test chamber 22, and a sealing mechanism 25, but the invention is not limited thereto. For example, in other embodiments not shown in the present invention, the internal circulation non-contact testing equipment 100 can selectively use at least one of the air-tight gasket 24 and the sealing mechanism 25 according to design requirements. one, or replaced by other components.

所述第一測試腔體21與所述第二測試腔體22皆安裝於所述機台本體1,以使所述第二測試腔體22能與所述第一測試腔體21沿一第一方向D1(如:鉛錘方向)彼此相對地移動,以共同封閉形成有一測試空間S。需說明的是,所述第一測試腔體21與所述第二測試腔體22的具體結構可依設計需求而加以調整變化,所以下述僅說明其中一種可行的態樣。The first test chamber 21 and the second test chamber 22 are both installed on the machine body 1 so that the second test chamber 22 can be along a first test chamber 21 with the first test chamber 21 . One direction D1 (such as the plumb bob direction) moves relative to each other to form a test space S together to form a closed space. It should be noted that the specific structures of the first test chamber 21 and the second test chamber 22 can be adjusted and changed according to design requirements, so the following only describes one of the possible ways.

所述第一測試腔體21包含有一第一容置部211、相連於所述第一容置部211周緣的一第一密合部212、及形成於所述第一容置部211外表面與所述第一密合部212外表面的多個第一強化肋條213。於本實施例中,所述第一容置部211大致呈矩形槽且於其頂部形成有連通於所述測試空間S的一開口2111,所述第一密合部212相連於所述第一容置部211的槽口而呈矩形環狀。The first test cavity 21 includes a first accommodating part 211, a first sealing part 212 connected to the periphery of the first accommodating part 211, and a first sealing part 212 formed on the outer surface of the first accommodating part 211. A plurality of first reinforcing ribs 213 are formed on the outer surface of the first sealing portion 212 . In this embodiment, the first accommodating part 211 is generally in the shape of a rectangular groove and has an opening 2111 connected to the test space S formed on the top thereof, and the first sealing part 212 is connected to the first The notch of the accommodating portion 211 is in the shape of a rectangular ring.

此外,所述第一測試腔體21於所述第一容置部211形成有連通於所述測試空間S的至少一個外接孔2112,並且至少一個所述外接孔2112的數量於本實施例中為多個,據以使所述抽氣裝置3與所述供氣裝置5各連接於至少一個所述外接孔2112而連通於所述測試空間S,但本發明不受限於此。舉例來說,在本發明未繪示的其他實施例中,所述抽氣裝置3及/或所述供氣裝置5也可依據設計需求、而通過所述第二測試腔體22(如:下述第二容置部221)另行開設的孔洞而連通於所述測試空間S。In addition, the first test cavity 21 is formed with at least one external connection hole 2112 connected to the test space S in the first accommodating part 211, and the number of at least one external connection hole 2112 in this embodiment is There are multiple, so that the air extraction device 3 and the air supply device 5 are each connected to at least one of the external connection holes 2112 and connected to the test space S, but the invention is not limited thereto. For example, in other embodiments not shown in the present invention, the air extraction device 3 and/or the air supply device 5 can also pass through the second test chamber 22 according to design requirements (such as: A separate hole is opened in the second accommodation part 221 (described below) and is connected to the test space S.

再者,所述第一容置部211、所述第一密合部212、及多個所述第一強化肋條213共同形成有多個第一開放式隔間214。其中,多個所述第一開放式隔間214之中的四個分別位於所述第一測試腔體21的多個角落,並且所述第一測試腔體21以四個所述第一開放式隔間214安裝固定於所述機台本體1(也就是,所述第一測試腔體21於本實施例中不會相對於所述機台本體1移動)。Furthermore, the first accommodating part 211 , the first sealing part 212 , and the plurality of first reinforcing ribs 213 jointly form a plurality of first open compartments 214 . Wherein, four of the plurality of first open compartments 214 are respectively located at multiple corners of the first test chamber 21 , and the first test chamber 21 has four first open compartments 214 . The compartment 214 is installed and fixed on the machine body 1 (that is, the first test chamber 21 will not move relative to the machine body 1 in this embodiment).

所述第二測試腔體22包含有一第二容置部221、相連於所述第二容置部221周緣的一第二密合部222、及形成於所述第二容置部221外表面與所述第二密合部222外表面的多個第二強化肋條223。於本實施例中,所述第二容置部221大致呈矩形體,而所述測試載座23設置於所述第二容置部221,用以供至少一個所述待測電子元件200設置與進行電性測試;所述第二密合部222則是呈矩形環狀並形成有多個長形貫孔2221,並且所述第二密合部222形成有位於所述測試載座23與多個所述長形貫孔2221之間的一環形溝槽2222,以使所述氣密墊圈24嵌於所述環形溝槽2222內。The second test cavity 22 includes a second accommodating part 221, a second sealing part 222 connected to the periphery of the second accommodating part 221, and a second accommodating part 221 formed on the outer surface of the second accommodating part 221. A plurality of second reinforcing ribs 223 are formed on the outer surface of the second sealing portion 222 . In this embodiment, the second accommodating part 221 is generally rectangular, and the test carrier 23 is provided in the second accommodating part 221 for at least one of the electronic components to be tested 200 to be placed. and perform electrical testing; the second sealing portion 222 is in a rectangular ring shape and is formed with a plurality of elongated through holes 2221, and the second sealing portion 222 is formed between the test carrier 23 and An annular groove 2222 is formed between the plurality of elongated through holes 2221 so that the airtight gasket 24 is embedded in the annular groove 2222.

再者,所述第二密合部222沿所述第一方向D1面向於所述第一密合部212,而所述氣密墊圈24位於所述第一密合部212與所述第二密合部222之間,並且多個所述第二強化肋條223的位置大致沿所述第一方向D1分別對應於多個所述第一強化肋條213。其中,所述第二容置部221、所述第二密合部222、及多個所述第二強化肋條223共同形成有多個第二開放式隔間224,並且多個所述第二開放式隔間224沿所述第一方向D1分別對應於多個所述第一開放式隔間214,而每個所述長形貫孔2221則是連通於一個所述第二開放式隔間224。Furthermore, the second sealing part 222 faces the first sealing part 212 along the first direction D1, and the airtight gasket 24 is located between the first sealing part 212 and the second sealing part 212. between the close-fitting portions 222, and the positions of the plurality of second reinforcing ribs 223 generally correspond to the plurality of first reinforcing ribs 213 along the first direction D1. Wherein, the second accommodating part 221, the second sealing part 222, and the plurality of second reinforcing ribs 223 jointly form a plurality of second open compartments 224, and the plurality of second open compartments 224 are formed. The open compartments 224 respectively correspond to a plurality of the first open compartments 214 along the first direction D1, and each of the elongated through holes 2221 is connected to one of the second open compartments. 224.

依上所述,所述第一測試腔體21與所述第二測試腔體22能相對地移動,以使所述第一容置部211與所述第二容置部221共同包圍形成所述測試空間S,並且所述第一密合部212與所述第二密合部222夾持於所述氣密墊圈24,以實現一預合作業(如:圖4)。According to the above, the first test cavity 21 and the second test cavity 22 can move relatively, so that the first accommodating part 211 and the second accommodating part 221 jointly surround and form the The test space S is provided, and the first sealing part 212 and the second sealing part 222 are clamped by the air-tight gasket 24 to achieve a pre-collision operation (eg, FIG. 4 ).

進一步地說,所述第一測試腔體21與所述第二測試腔體22之間的作動於本實施例中是通過所述機台本體1來實現,以下說明所述機台本體1的其中一種可行態樣,但本發明不以此為限。Furthermore, in this embodiment, the action between the first test chamber 21 and the second test chamber 22 is realized through the machine body 1. The following describes the operation of the machine body 1. One of the possible forms is, but the present invention is not limited to this.

如圖1至圖3所示,所述機台本體1包含有一軌道機構11(如:線性滑軌)與位置對應於所述軌道機構11的一升降機構12(如:氣壓缸或液壓缸)。其中,所述第二測試腔體22安裝於所述軌道機構11,以使所述第二測試腔體22能通過所述軌道機構11而沿垂直所述第一方向D1的一第二方向D2於一置料位置(如:圖1)與一作業位置(如:圖2和圖3)之間移動。As shown in Figures 1 to 3, the machine body 1 includes a track mechanism 11 (such as a linear slide rail) and a lifting mechanism 12 (such as a pneumatic cylinder or a hydraulic cylinder) positioned corresponding to the track mechanism 11. . Wherein, the second test chamber 22 is installed on the track mechanism 11 so that the second test chamber 22 can pass through the track mechanism 11 along a second direction D2 perpendicular to the first direction D1. Move between a material placement position (eg: Figure 1) and an operating position (eg: Figure 2 and Figure 3).

舉例來說,如圖1所示,當所述第二測試腔體22位於所述置料位置時,所述第二測試腔體22相對於所述第一測試腔體21呈錯位設置,以使安裝於所述第二測試腔體22的所述測試載座23能用以供至少一個所述待測電子元件200設置。For example, as shown in FIG. 1 , when the second test chamber 22 is located at the material placement position, the second test chamber 22 is disposed in a staggered position relative to the first test chamber 21 . The test carrier 23 installed in the second test cavity 22 can be used for setting at least one of the electronic components 200 to be tested.

如圖2和圖3所示,當所述第二測試腔體22位於所述作業位置時,所述第二密合部222沿所述第一方向D1面向於所述第一密合部212,所述升降機構12的位置對應於位在所述作業位置的所述第二測試腔體22,並且所述升降機構12能驅使位在所述作業位置的所述第二測試腔體22沿所述第一方向D1移動而實現所述預合作業。As shown in FIGS. 2 and 3 , when the second test chamber 22 is in the working position, the second sealing part 222 faces the first sealing part 212 along the first direction D1 , the position of the lifting mechanism 12 corresponds to the second test cavity 22 in the working position, and the lifting mechanism 12 can drive the second testing cavity 22 in the working position along the The first direction D1 moves to realize the pre-cooperation operation.

如圖3至圖6所示,所述密合機構25包含一驅動器251、多個鎖合件252、及傳輸所述驅動器251動力至與多個所述鎖合件252的一傳動件253。其中,所述驅動器251安裝於所述機台本體1且鄰近於所述第一測試腔體21,並且所述驅動器251於本實施例中是以一驅動馬達來說明,其包含有作為動力輸出使用的一齒型部2511。As shown in FIGS. 3 to 6 , the close mechanism 25 includes a driver 251 , a plurality of locking parts 252 , and a transmission part 253 that transmits the power of the driver 251 to the plurality of locking parts 252 . Among them, the driver 251 is installed on the machine body 1 and adjacent to the first test chamber 21, and the driver 251 is illustrated as a drive motor in this embodiment, which includes a power output as a power output. A toothed part 2511 is used.

再者,每個所述鎖合件252具有分別位於相反兩端的一連動端部2521與一鎖合端部2522,並且多個所述鎖合件252可轉動地設置於所述第一測試腔體21的所述第一密合部212。於本實施例中,每個所述鎖合件252配置於一個所述第一開放式隔間214且直立地安裝於所述第一密合部212(也就是,多個所述連動端部2521的旋轉軸線彼此平行),並且每個所述鎖合件252的所述連動端部2521與所述鎖合端部2522是分別位於所述第一密合部212的相反兩側。Furthermore, each of the locking parts 252 has a linking end part 2521 and a locking end part 2522 respectively located at opposite ends, and a plurality of the locking parts 252 are rotatably disposed in the first test chamber. The first sealing portion 212 of the body 21 . In this embodiment, each locking member 252 is configured in one of the first open compartments 214 and is installed upright on the first sealing portion 212 (that is, a plurality of the linking end portions). 2521 are parallel to each other), and the linking end 2521 and the locking end 2522 of each locking member 252 are respectively located on opposite sides of the first sealing portion 212 .

更詳細地說,每個所述鎖合件252的所述連動端部2521為一齒輪,並且所述齒型部2511與多個所述連動端部2521配置在高於所述第一測試腔體21(也就是,遠離所述第二測試腔體22的所述第一測試腔體21一側)的一平面。此外,所述傳動件253連接所述驅動器251與多個所述鎖合件252的所述連動端部2521;也就是說,所述傳動件253於本實施例中為嚙合於所述齒型部2511與多個所述連動端部2521的一傳動鍊條,但本發明不以此為限。舉例來說,在本發明未繪示的其他實施例中,所述傳動件253與多個所述連動端部2521之間的配合也可以是採用皮帶與多個摩擦輪的方式實現;或者,所述驅動器251可以通過採用氣壓缸或液壓缸搭配其他構造來實現。In more detail, the interlocking end portion 2521 of each locking member 252 is a gear, and the toothed portion 2511 and the plurality of interlocking end portions 2521 are arranged higher than the first test chamber. A plane of the body 21 (that is, the side of the first test chamber 21 away from the second test chamber 22). In addition, the transmission member 253 connects the linkage end portions 2521 of the driver 251 and the plurality of locking members 252; that is to say, the transmission member 253 is engaged with the tooth profile in this embodiment. 2511 and a plurality of said linking end portions 2521 of a transmission chain, but the present invention is not limited to this. For example, in other embodiments not shown in the present invention, the cooperation between the transmission member 253 and the plurality of linkage end portions 2521 can also be achieved by using a belt and a plurality of friction wheels; or, The driver 251 can be implemented by using a pneumatic cylinder or a hydraulic cylinder in combination with other structures.

再者,多個所述鎖合端部2522的位置與形狀分別對應於多個所述長形貫孔2221的位置與形狀。據此,於所述預合作業之後,所述驅動器251能通過所述傳動件253而驅使多個所述鎖合件252同步轉動來實現一鎖合作業(如:圖5和圖6),以使每個所述鎖合件252的所述鎖合端部2522與所述第一密合部212分別夾持於所述第二密合部222的相反兩側。也就是說,每個所述鎖合端部2522於所述預合作業時穿過相對應的所述長形貫孔2221、並於所述鎖合作業時旋轉錯位於相對應的所述長形貫孔2221。Furthermore, the positions and shapes of the plurality of locking end portions 2522 respectively correspond to the positions and shapes of the plurality of elongated through holes 2221 . Accordingly, after the pre-locking operation, the driver 251 can drive a plurality of the locking members 252 to rotate synchronously through the transmission member 253 to achieve a locking operation (such as Figure 5 and Figure 6), Therefore, the locking end portion 2522 of each locking member 252 and the first sealing portion 212 are clamped on opposite sides of the second sealing portion 222 respectively. That is to say, each of the locking end portions 2522 passes through the corresponding elongated through hole 2221 during the pre-locking operation, and is rotated and misaligned with the corresponding elongated through hole 2221 during the locking operation. Shaped through hole 2221.

需額外說明的是,基於所述密合機構25在實施所述鎖合作業之後,所述測試裝置2的所述測試空間S需能夠長時間維持在高壓環境,所以對於所述密合機構25的所述鎖合作業之密合度要求極高(如:所述驅動器251必須以極大的輸出動力來實現所述鎖合作業),因而導致所述鎖合作業不易於實施。It should be additionally noted that after the sealing mechanism 25 performs the locking operation, the test space S of the test device 2 needs to be able to maintain a high-pressure environment for a long time, so for the sealing mechanism 25 The locking operation requires extremely high tightness (for example, the driver 251 must use a huge output power to achieve the locking operation), which makes the locking operation difficult to implement.

據此,如圖2至圖6所示,於所述預合作業之後,所述內循環式非接觸測試設備100於本實施例中是進一步採用所述抽氣裝置3(如:幫浦)來對所述測試空間S進行一抽真空作業,以使所述測試空間S呈現負壓狀態、而令所述第一密合部212與所述第二密合部222更為緊密地抵接(或更為緊密地夾持所述氣密墊圈24),用以利於所述密合機構25接著實施所述鎖合作業(如:所述驅動器251能以較小的輸出動力來實現所述鎖合作業),使得所述測試空間S能夠通過所述密合機構25而長時間維持在高壓環境。Accordingly, as shown in FIGS. 2 to 6 , after the preparatory work, the internal circulation non-contact testing equipment 100 further uses the air extraction device 3 (such as a pump) in this embodiment. To perform a vacuuming operation on the test space S, so that the test space S presents a negative pressure state, so that the first sealing portion 212 and the second sealing portion 222 are more closely contacted. (or clamp the air-tight gasket 24 more tightly) to facilitate the closing mechanism 25 to then perform the locking operation (for example: the driver 251 can achieve the locking operation with a smaller output power) Locking operation), so that the test space S can be maintained in a high-pressure environment for a long time through the sealing mechanism 25 .

更詳細地說,所述抽氣裝置3連通於所述第一容置部211與所述第二容置部221的至少其中之一(如:所述抽氣裝置3於本實施例中是連通於所述第一容置部211),據以連通於所述測試空間S而能夠實施所述抽真空作業。In more detail, the air extraction device 3 is connected to at least one of the first accommodation part 211 and the second accommodation part 221 (for example: the air extraction device 3 in this embodiment is Communicated with the first accommodating portion 211 ), thereby communicating with the test space S so that the vacuuming operation can be performed.

如圖6至圖9所示,所述溫度調節裝置4安裝於所述第一測試腔體21,並且所述溫度調節裝置4的部分位於所述測試空間S之內。具體來說,所述溫度調節裝置4包含有一溫控機構41、安裝於所述第一測試腔體21(如:所述開口2111)的一風扇機構43、及位於所述測試空間S之內的一加熱燈具42。As shown in FIGS. 6 to 9 , the temperature adjustment device 4 is installed in the first test chamber 21 , and part of the temperature adjustment device 4 is located in the test space S. Specifically, the temperature adjustment device 4 includes a temperature control mechanism 41, a fan mechanism 43 installed in the first test chamber 21 (such as the opening 2111), and a fan mechanism 43 located in the test space S. A heating lamp 42.

所述溫控機構41包含有一導流罩411及配置於所述導流罩411內的一溫控單元412。其中,所述導流罩411位於所述測試空間S內並且位在所述測試載座23的上方。The temperature control mechanism 41 includes a flow guide cover 411 and a temperature control unit 412 arranged in the flow guide cover 411 . Wherein, the air guide cover 411 is located in the test space S and above the test carrier 23 .

更詳細地說,所述導流罩411包含有鄰近於所述開口2111的一配置管4111、及自所述配置管4111底緣朝向所述第二測試腔體22延伸的一罩體4112。其中,所述罩體4112的容積自所述配置管4111朝所述第二測試腔體22的方向呈漸增狀;也就是說,所述罩體4112大致呈截錐狀且其較佳是與所述第一測試腔體21及所述第二測試腔體22之間留有間隙。In more detail, the air guide 411 includes a configuration tube 4111 adjacent to the opening 2111 and a cover 4112 extending from the bottom edge of the configuration tube 4111 toward the second test chamber 22 . Wherein, the volume of the cover 4112 gradually increases from the configuration tube 4111 toward the second test chamber 22; that is to say, the cover 4112 is generally in the shape of a truncated cone and is preferably There is a gap between the first test chamber 21 and the second test chamber 22 .

再者,所述溫控單元412設置於所述導流罩411(如:所述配置管4111)內且鄰近於所述開口2111,並且所述溫控單元412包含有一升溫器4121(如:電熱器)與一降溫器4122(如:蒸發器)的至少其中之一。也就是說,所述溫控單元412於本實施例中能夠依據設計需求而搭配需要的所述升溫器4121的數量與所述降溫器4122的數量。Furthermore, the temperature control unit 412 is disposed in the air guide 411 (such as the configuration tube 4111) and adjacent to the opening 2111, and the temperature control unit 412 includes a temperature riser 4121 (such as: At least one of an electric heater) and a cooler 4122 (such as an evaporator). That is to say, in this embodiment, the temperature control unit 412 can match the required number of the temperature risers 4121 and the number of the temperature coolers 4122 according to the design requirements.

所述風扇機構43安裝於所述第一測試腔體21的所述開口2111且面向所述溫控單元412,並且所述測試空間S通過所述導流罩411與所述風扇機構43而定義有於所述導流罩411內側與外側進行循環且沿經所述溫控單元412的一內循環路徑。所述風扇機構43能運轉而形成有沿所述內循環路徑流動的一循環氣流F,並且所述循環氣流F能通過所述溫控單元412而具有一預設溫度。其中,位於所述測試空間S之內的所述加熱燈具42能用以搭配所述溫控單元412(如:所述升溫器4121)來加熱所述循環氣流F,據以有效地提升加熱效率。The fan mechanism 43 is installed in the opening 2111 of the first test chamber 21 and faces the temperature control unit 412 , and the test space S is defined by the air guide 411 and the fan mechanism 43 There is an internal circulation path that circulates inside and outside the air guide cover 411 and passes through the temperature control unit 412 . The fan mechanism 43 can operate to form a circulating airflow F flowing along the inner circulation path, and the circulating airflow F can have a preset temperature through the temperature control unit 412 . Among them, the heating lamp 42 located in the test space S can be used with the temperature control unit 412 (such as the temperature riser 4121) to heat the circulating air flow F, thereby effectively improving the heating efficiency. .

進一步地說,所述風扇機構43較佳是要能避免影響所述測試空間S內的所述循環氣流F的溫度與壓力,所以所述風扇機構43於下述內容是以其中一種可行的態樣來說明,但本發明不受限於此。Furthermore, the fan mechanism 43 is preferably able to avoid affecting the temperature and pressure of the circulating airflow F in the test space S, so the fan mechanism 43 is in one of the possible states in the following content. Examples are described below, but the present invention is not limited thereto.

於本實施例中,所述風扇機構43包含有一框體431、安裝於所述框體431的一馬達432、安裝於所述框體431內的一阻隔層433、可轉動地穿設於所述阻隔層433的一轉軸434、固定於所述轉軸434的一扇葉435、位於所述框體431內的一隔熱聯軸器436、及一外殼437,但本發明不以此為限。舉例來說,在本發明未繪示的其他實施例中,所述外殼437也可依據設計需求而省略或以其他構件取代。In this embodiment, the fan mechanism 43 includes a frame 431, a motor 432 installed in the frame 431, a barrier layer 433 installed in the frame 431, and is rotatably installed in the frame 431. A rotating shaft 434 of the barrier layer 433, a fan blade 435 fixed on the rotating shaft 434, an insulating coupling 436 located in the frame 431, and a housing 437, but the invention is not limited thereto. . For example, in other embodiments not shown in the present invention, the housing 437 can also be omitted or replaced with other components according to design requirements.

更詳細地說,所述框體431大致呈方管狀且其一端安裝於所述開口2111,所述馬達432安裝於所述框體431的另一端,並且所述馬達432的一輸出軸4321位於所述框體431之內,而所述馬達432的本體位於所述框體431之外。再者,所述阻隔層433鄰近於所述框體431與所述開口2111的交界處,以隔絕所述框體431內的空間與所述測試空間S之間的溫度與氣壓。In more detail, the frame 431 is generally in the shape of a square tube and one end thereof is installed in the opening 2111. The motor 432 is installed at the other end of the frame 431, and an output shaft 4321 of the motor 432 is located at Inside the frame 431 , the body of the motor 432 is located outside the frame 431 . Furthermore, the barrier layer 433 is adjacent to the interface between the frame 431 and the opening 2111 to isolate the temperature and air pressure between the space in the frame 431 and the test space S.

所述轉軸434的一端位於所述框體431之內,並且所述轉軸434的另一端位於所述導流罩411(如:所述配置管4111)之內,而所述扇葉435固定於所述轉軸434的所述另一端,所述扇葉435位於所述配置管4111內且鄰近於所述溫控單元412。其中,所述輸出軸4321與所述轉軸434皆沿著一預設軸線L配置,並且所述隔熱聯軸器436連接所述輸出軸4321與所述轉軸434的所述一端。據此,所述輸出軸4321與所述轉軸434不但能通過所述隔熱聯軸器436而同步轉動,並且所述輸出軸4321與所述轉軸434還能通過所述隔熱聯軸器436而有效地降低熱能的彼此相互傳遞。One end of the rotating shaft 434 is located in the frame 431 , and the other end of the rotating shaft 434 is located in the air guide 411 (such as the configuration tube 4111 ), and the fan blade 435 is fixed on The other end of the rotating shaft 434 and the fan blade 435 are located in the configuration tube 4111 and adjacent to the temperature control unit 412 . The output shaft 4321 and the rotating shaft 434 are both arranged along a preset axis L, and the heat-insulating coupling 436 connects the output shaft 4321 and the one end of the rotating shaft 434 . Accordingly, the output shaft 4321 and the rotating shaft 434 can not only rotate synchronously through the heat insulating coupling 436, but the output shaft 4321 and the rotating shaft 434 can also rotate through the heat insulating coupling 436. And effectively reduce the mutual transfer of heat energy.

需額外說明的是,所述框體431較佳是形成有位置對應於所述隔熱聯軸器436的一拆裝孔4311,據以使所述隔熱聯軸器436能通過所述拆裝孔4311而於所述框體431內進行安裝或拆卸。再者,所述外殼437安裝於所述第一測試腔體21的所述頂部且其包覆且封閉所述框體431與所述馬達432(如:所述本體)於內,據以使所述馬達432和所述隔熱聯軸器436能通過所述外殼437而與外部環境隔開。It should be noted that the frame 431 is preferably formed with a disassembly and assembly hole 4311 corresponding to the position of the heat-insulating coupling 436, so that the heat-insulating coupling 436 can pass through the disassembly and assembly hole 4311. The mounting holes 4311 are used for installation or disassembly in the frame 431 . Furthermore, the shell 437 is installed on the top of the first test chamber 21 and covers and seals the frame 431 and the motor 432 (such as the body) inside, so that The motor 432 and the insulated coupling 436 can be isolated from the external environment by the housing 437 .

依上所述,所述馬達432能以所述輸出軸4321、並通過所述隔熱聯軸器436與所述轉軸434而驅使所述扇葉435轉動,以形成於所述測試空間S內流動經過所述溫控單元412的所述循環氣流F。據此,所述溫度調節裝置4於本實施例中通過所述隔熱聯軸器436與所述阻隔層433,以使其所形成的氣流之溫度能夠不被所述馬達432影響,進而精準地被控制。As mentioned above, the motor 432 can drive the fan blade 435 to rotate with the output shaft 4321 and through the heat insulation coupling 436 and the rotating shaft 434 to form a fan blade 435 in the test space S. The circulating air flow F flows through the temperature control unit 412 . Accordingly, in this embodiment, the temperature adjustment device 4 passes through the heat-insulating coupling 436 and the barrier layer 433 so that the temperature of the airflow formed by it is not affected by the motor 432 and thus can be accurately The ground is controlled.

需說明的是,所述扇葉435是指能夠通過轉動而形成氣流的構造,所以所述扇葉435的具體構造可依據設計需求而加以調整變化、並不受限於圖式所呈現的構造。舉例來說,在本發明未繪示的其他實施例中,所述扇葉435可以是利於機械增壓的渦輪構造。It should be noted that the fan blade 435 refers to a structure that can form airflow through rotation. Therefore, the specific structure of the fan blade 435 can be adjusted and changed according to design requirements and is not limited to the structure presented in the drawings. . For example, in other embodiments not shown in the present invention, the fan blades 435 may be of a turbine structure that is conducive to supercharging.

此外,所述風扇機構43於本實施例中能夠依據實際需求而選擇性地執行一第一運轉模式(如:圖7)或一第二運轉模式(如:圖8)。具體來說,如圖7所示,當所述風扇機構43執行所述第一運轉模式時,所述風扇機構43的所述扇葉435轉動,以形成沿著所述內循環路徑且自所述扇葉435朝向所述溫控單元412(或所述測試載座23)流動的所述循環氣流F,據以利於使所述循環氣流F能夠較為快速地與至少一個所述待測電子元件200進行熱能交換。或者,如圖8所示,當所述風扇機構43執行所述第二運轉模式時,所述扇葉435轉動,以形成沿著所述內循環路徑且自所述溫控單元412朝向所述扇葉435流動的所述循環氣流F,據以使所述測試空間S內的溫度分佈較為穩定。In addition, in this embodiment, the fan mechanism 43 can selectively execute a first operation mode (eg, FIG. 7 ) or a second operation mode (eg, FIG. 8 ) according to actual needs. Specifically, as shown in FIG. 7 , when the fan mechanism 43 executes the first operation mode, the fan blades 435 of the fan mechanism 43 rotate to form a flow path along the inner circulation path and from where the fan mechanism 43 moves. The circulating airflow F flowing from the fan blades 435 toward the temperature control unit 412 (or the test carrier 23 ) facilitates the circulating airflow F to relatively quickly interact with at least one of the electronic components to be tested. 200 for heat energy exchange. Alternatively, as shown in FIG. 8 , when the fan mechanism 43 executes the second operation mode, the fan blades 435 rotate to form a path along the internal circulation path from the temperature control unit 412 toward the temperature control unit 412 . The circulating airflow F flowing through the fan blades 435 makes the temperature distribution in the test space S relatively stable.

需額外說明的是,在實施所述鎖合作業之後,所述測試空間S大致呈真空狀態,所以所述內循環式非接觸測試設備100可以採用所述供氣裝置5通入一預定氣體至所述測試空間S、並能使所述測試空間S達到一預設氣壓,以使設置於所述測試載座23的至少一個所述待測電子元件200能在所述預設氣壓與所述預設溫度的環境下進行所述非接觸測試作業。It should be additionally noted that after the locking operation is performed, the test space S is generally in a vacuum state, so the internal circulation non-contact test equipment 100 can use the gas supply device 5 to pass a predetermined gas into The test space S can make the test space S reach a preset air pressure, so that at least one of the electronic components to be tested 200 disposed on the test carrier 23 can operate at the preset air pressure and the preset air pressure. The non-contact test operation is performed in an environment with a preset temperature.

依上所述,所述內循環式非接觸測試設備100於本實施例中是通過多個裝置之間的結構搭配,以使得至少一個所述待測電子元件200可以經由非接觸方式(如:所述測試空間S具有所述預設氣壓與所述預設溫度)來對進行測試參數(如:溫度)的調整。As mentioned above, in this embodiment, the internal circulation non-contact testing equipment 100 adopts the structural matching between multiple devices, so that at least one of the electronic components to be tested 200 can be tested through a non-contact method (such as: The test space S has the preset air pressure and the preset temperature) to adjust test parameters (such as temperature).

此外,所述供氣裝置5所輸出的所述預定氣體可依據需求而加以變化;舉例來說,所述預定氣體可以採用乾燥氣體或是分子量大於空氣的氣體(如:二氧化碳氣體),據以進一步形成具有預設溫度的所述循環氣流F,進而利於所述測試空間S快速地達到所述預設氣壓。In addition, the predetermined gas output by the gas supply device 5 can be changed according to demand; for example, the predetermined gas can be dry gas or a gas with a molecular weight greater than air (such as carbon dioxide gas). The circulating air flow F with a preset temperature is further formed, thereby facilitating the test space S to quickly reach the preset air pressure.

[本發明實施例的技術效果][Technical effects of the embodiments of the present invention]

綜上所述,本發明實施例所公開的內循環式非接觸測試設備,其通過多個裝置之間的結構搭配,以使得至少一個所述待測電子元件可以經由非接觸方式(如:所述測試空間具有所述預設氣壓與所述預設溫度)來對進行測試參數(如:溫度)的調整。To sum up, the internal circulation non-contact testing equipment disclosed in the embodiment of the present invention uses the structural coordination between multiple devices so that at least one of the electronic components to be tested can be tested in a non-contact manner (such as: The test space has the preset air pressure and the preset temperature) to adjust test parameters (such as temperature).

再者,本發明實施例所公開的內循環式非接觸測試設備,其進一步採用所述抽氣裝置來對所述測試空間進行抽真空作業,以使所述測試空間呈現負壓狀態、而令所述第一密合部與所述第二密合部更為緊密地抵接(或更為緊密地夾持所述氣密墊圈),用以利於所述密合機構接著實施所述鎖合作業(如:所述驅動器能以較小的輸出動力來實現所述鎖合作業),使得所述測試空間能夠通過所述密合機構而長時間維持在高壓環境。Furthermore, the internal circulation non-contact test equipment disclosed in the embodiment of the present invention further uses the air extraction device to perform vacuuming operation on the test space, so that the test space presents a negative pressure state, so that The first sealing part and the second sealing part abut more closely (or clamp the airtight gasket more closely) to facilitate the sealing mechanism to then implement the locking cooperation. operation (for example, the driver can realize the locking operation with a smaller output power), so that the test space can be maintained in a high-pressure environment for a long time through the sealing mechanism.

另外,本發明實施例所公開的溫度調節裝置,其通過所述隔熱聯軸器與所述阻隔層,以使其所形成的氣流之溫度能夠不被所述馬達影響,進而精準地被控制。In addition, the temperature regulating device disclosed in the embodiment of the present invention uses the thermal insulation coupling and the barrier layer so that the temperature of the air flow formed can not be affected by the motor and can be accurately controlled. .

以上所公開的內容僅為本發明的優選可行實施例,並非因此侷限本發明的專利範圍,所以凡是運用本發明說明書及圖式內容所做的等效技術變化,均包含於本發明的專利範圍內。The contents disclosed above are only preferred and feasible embodiments of the present invention, and do not limit the patent scope of the present invention. Therefore, all equivalent technical changes made by using the description and drawings of the present invention are included in the patent scope of the present invention. within.

100:內循環式非接觸測試設備 1:機台本體 11:軌道機構 12:升降機構 2:測試裝置 21:第一測試腔體 211:第一容置部 2111:開口 2112:外接孔 212:第一密合部 213:第一強化肋條 214:第一開放式隔間 22:第二測試腔體 221:第二容置部 222:第二密合部 2221:長形貫孔 2222:環形溝槽 223:第二強化肋條 224:第二開放式隔間 23:測試載座 24:氣密墊圈 25:密合機構 251:驅動器 2511:齒型部 252:鎖合件 2521:連動端部 2522:鎖合端部 253:傳動件 3:抽氣裝置 4:溫度調節裝置 41:溫控機構 411:導流罩 4111:配置管 4112:罩體 412:溫控單元 4121:升溫器 4122:降溫器 42:加熱燈具 43:風扇機構 431:框體 4311:拆裝孔 432:馬達 4321:輸出軸 433:阻隔層 434:轉軸 435:扇葉 436:隔熱聯軸器 437:外殼 5:供氣裝置 S:測試空間 F:循環氣流 D1:第一方向 D2:第二方向 L:預設軸線 200:待測電子元件100: Internal circulation non-contact testing equipment 1:Machine body 11: Orbital mechanism 12:Lifting mechanism 2:Test device 21: The first test cavity 211:First Accommodation Department 2111:Open your mouth 2112: External hole 212:First Close Unit 213:The first reinforced rib 214: First open compartment 22: Second test chamber 221:Second Accommodation Department 222:Second Close Section 2221: Long through hole 2222: Annular groove 223: Second reinforced rib 224: Second open compartment 23:Test carrier 24: Air sealing gasket 25: Close mechanism 251:drive 2511:Tooth profile part 252:Lock parts 2521: Linked end 2522:Locked end 253: Transmission parts 3: Air extraction device 4: Temperature adjustment device 41:Temperature control mechanism 411:Shroud 4111:Configuration management 4112:Cover body 412:Temperature control unit 4121:heater 4122: Cooler 42:Heating lamps 43:Fan mechanism 431:frame 4311: Disassembly and assembly holes 432: Motor 4321:Output shaft 433: Barrier layer 434:Shaft 435:Fan blade 436:Thermal insulation coupling 437: Shell 5:Air supply device S: test space F: circulating air flow D1: first direction D2: second direction L: Default axis 200: Electronic components to be tested

圖1為本發明實施例的內循環式非接觸測試設備的立體示意圖。Figure 1 is a three-dimensional schematic diagram of an internal circulation non-contact testing device according to an embodiment of the present invention.

圖2為圖1的後續作動的立體示意圖。FIG. 2 is a schematic three-dimensional view of the subsequent actions of FIG. 1 .

圖3為圖2的平面剖視示意圖。FIG. 3 is a schematic cross-sectional plan view of FIG. 2 .

圖4為圖2的後續作動的立體剖視示意圖。FIG. 4 is a schematic three-dimensional cross-sectional view of the subsequent actions of FIG. 2 .

圖5為圖4的後續作動的立體剖視示意圖。FIG. 5 is a schematic three-dimensional cross-sectional view of the subsequent actions of FIG. 4 .

圖6為圖5的後續作動以使所述內循環式非接觸測試設備處於非接觸測試作業的立體剖視示意圖。FIG. 6 is a schematic three-dimensional cross-sectional view of the subsequent actions of FIG. 5 to put the internal circulation non-contact testing equipment into non-contact testing operation.

圖7為本發明實施例的所述內循環式非接觸測試設備在風扇機構處於第一運轉模式時的平面剖視示意圖。7 is a schematic plan view of the internal circulation non-contact testing equipment when the fan mechanism is in the first operating mode according to the embodiment of the present invention.

圖8為本發明實施例的所述內循環式非接觸測試設備在所述風扇機構處於第二運轉模式時的平面剖視示意圖。8 is a schematic plan view of the internal circulation non-contact testing device when the fan mechanism is in the second operating mode according to the embodiment of the present invention.

圖9為本發明實施例的所述風扇機構的立體剖視示意圖。Figure 9 is a schematic three-dimensional cross-sectional view of the fan mechanism according to the embodiment of the present invention.

100:內循環式非接觸測試設備 100: Internal circulation non-contact testing equipment

1:機台本體 1:Machine body

11:軌道機構 11: Orbital mechanism

12:升降機構 12:Lifting mechanism

2:測試裝置 2:Test device

21:第一測試腔體 21: The first test chamber

211:第一容置部 211:First Accommodation Department

2111:開口 2111:Open your mouth

2112:外接孔 2112: External hole

212:第一密合部 212:First Close Unit

213:第一強化肋條 213: The first reinforced rib

214:第一開放式隔間 214: First open compartment

22:第二測試腔體 22: Second test chamber

221:第二容置部 221:Second Accommodation Department

222:第二密合部 222:Second Close Section

2222:環形溝槽 2222: Annular groove

223:第二強化肋條 223: Second reinforced rib

224:第二開放式隔間 224: Second open compartment

23:測試載座 23:Test carrier

24:氣密墊圈 24: Air sealing gasket

25:密合機構 25: Close mechanism

252:鎖合件 252:Lock parts

2521:連動端部 2521: Linked end

253:傳動件 253: Transmission parts

3:抽氣裝置 3: Air extraction device

4:溫度調節裝置 4: Temperature adjustment device

41:溫控機構 41:Temperature control mechanism

411:導流罩 411:Shroud

4111:配置管 4111:Configuration management

4112:罩體 4112:Cover body

412:溫控單元 412:Temperature control unit

4121:升溫器 4121:heater

4122:降溫器 4122: Cooler

42:加熱燈具 42:Heating lamps

43:風扇機構 43:Fan mechanism

5:供氣裝置 5:Air supply device

S:測試空間 S: test space

F:循環氣流 F: circulating air flow

D1:第一方向 D1: first direction

L:預設軸線 L: Default axis

200:待測電子元件 200: Electronic components to be tested

Claims (10)

一種內循環式非接觸測試設備,其包括:一機台本體;一測試裝置,其安裝於所述機台本體,並且所述測試裝置包含有:一第一測試腔體與一第二測試腔體,其皆安裝於所述機台本體;其中,所述第一測試腔體具有一第一密合部,所述第二測試腔體具有一第二密合部,其沿所述第一方向面向於所述第一密合部;所述第二測試腔體能與所述第一測試腔體沿所述第一方向彼此相對地移動,以使所述第一密合部與所述第二密合部共同封閉形成有一測試空間;所述第一測試腔體的頂部形成有連通於所述測試空間的一開口;及一測試載座,設置於所述第二測試腔體,並且所述測試載座用以供一待測電子元件設置;一溫度調節裝置,其安裝於所述第一測試腔體,並且所述溫度調節裝置的部分位於所述測試空間之內;其中,所述溫度調節裝置包含有:一溫控機構,包含有:一導流罩,位於所述測試空間內,並且所述導流罩位於所述測試載座的上方;及一溫控單元,配置於所述導流罩內且鄰近於所述開口;及一風扇機構,安裝於所述第一測試腔體的所述開口且面向所述溫控單元,並且所述測試空間通過所述導流罩與所述風扇機構而定義有於所述導流罩內側與外側進行循環且沿經所述溫控單元的一內循環路徑;其中,所述風扇 機構能運轉而形成有沿所述內循環路徑流動的一循環氣流,並且所述循環氣流能通過所述溫控單元而具有一預設溫度;以及一供氣裝置,連通於所述測試空間;其中,所述供氣裝置用以通入一預定氣體至所述測試空間、並能使所述測試空間達到一預設氣壓,以使設置於所述測試載座的所述待測電子元件能在所述預設氣壓與所述預設溫度的環境下進行一非接觸測試作業。 An internal circulation non-contact testing equipment, which includes: a machine body; a testing device installed on the machine body, and the testing device includes: a first test chamber and a second test chamber bodies, which are installed on the machine body; wherein, the first test chamber has a first sealing portion, and the second test chamber has a second sealing portion along the first The direction faces the first sealing portion; the second test chamber and the first test chamber can move relative to each other along the first direction, so that the first sealing portion and the third sealing portion The two sealing parts are jointly closed to form a test space; an opening connected to the test space is formed on the top of the first test cavity; and a test carrier is provided in the second test cavity, and the The test carrier is used for setting an electronic component to be tested; a temperature adjustment device is installed in the first test cavity, and part of the temperature adjustment device is located in the test space; wherein, the The temperature adjustment device includes: a temperature control mechanism, including: a flow guide cover located in the test space, and the flow guide cover is located above the test carrier; and a temperature control unit configured in the test space. inside the air guide and adjacent to the opening; and a fan mechanism installed at the opening of the first test chamber and facing the temperature control unit, and the test space passes through the air guide and The fan mechanism is defined to circulate inside and outside the shroud and along an internal circulation path passing through the temperature control unit; wherein, the fan The mechanism can operate to form a circulating air flow flowing along the internal circulation path, and the circulating air flow can have a preset temperature through the temperature control unit; and an air supply device is connected to the test space; Wherein, the gas supply device is used to introduce a predetermined gas into the test space and enable the test space to reach a preset air pressure, so that the electronic component under test provided on the test carrier can A non-contact test operation is performed under the environment of the preset air pressure and the preset temperature. 如請求項1所述的內循環式非接觸測試設備,其中,所述溫控單元包含有一升溫器與一降溫器的至少其中之一,其鄰近於所述風扇機構的一扇葉。 The internal circulation non-contact testing equipment according to claim 1, wherein the temperature control unit includes at least one of a temperature riser and a temperature dropper, which is adjacent to a blade of the fan mechanism. 如請求項1所述的內循環式非接觸測試設備,其中,所述導流罩包含有:一配置管,鄰近於所述開口,並且所述溫控單元與所述風扇機構的一扇葉皆位於所述配置管內;及一罩體,自所述配置管的底緣朝向所述第二測試腔體延伸所形成,並且所述罩體的容積自所述配置管朝所述第二測試腔體的方向呈漸增狀。 The internal circulation non-contact testing equipment according to claim 1, wherein the air deflector includes: a configuration tube adjacent to the opening, and the temperature control unit and a blade of the fan mechanism are located in the configuration tube; and a cover is formed extending from the bottom edge of the configuration tube towards the second test chamber, and the volume of the cover extends from the configuration tube towards the second test chamber. The direction of the test cavity is increasing. 如請求項1所述的內循環式非接觸測試設備,其中,所述風扇機構能選擇性地執行一第一運轉模式或一第二運轉模式;其中,當所述風扇機構執行所述第一運轉模式時,所述風扇機構的一扇葉轉動,以形成沿著所述內循環路徑且自所述扇葉朝向所述溫控單元流動的所述循環氣流;其中,當所述風扇機構執行所述第二運轉模式時,所述扇葉轉動,以形成沿 著所述內循環路徑且自所述溫控單元朝向所述扇葉流動的所述循環氣流。 The internal circulation non-contact testing equipment of claim 1, wherein the fan mechanism can selectively execute a first operation mode or a second operation mode; wherein, when the fan mechanism executes the first operation mode In the operating mode, one blade of the fan mechanism rotates to form the circulating air flow along the internal circulation path and flowing from the blade toward the temperature control unit; wherein, when the fan mechanism executes In the second operating mode, the fan blades rotate to form a The circulating air flow flows along the inner circulation path and from the temperature control unit toward the fan blades. 如請求項1所述的內循環式非接觸測試設備,其中,所述第一測試腔體包含有一第一容置部,其周緣相連於所述第一密合部;所述第二測試腔體包含有一第二容置部,其周緣相連於所述第二密合部;所述測試裝置包含位於所述第一密合部與所述第二密合部之間的一氣密墊圈;其中,所述第一測試腔體與所述第二測試腔體能相對地移動,以使所述第一容置部與所述第二容置部共同包圍形成所述測試空間,並且所述第一密合部與所述第二密合部夾持於所述氣密墊圈,以實現一預合作業。 The internal circulation non-contact testing equipment according to claim 1, wherein the first test chamber includes a first accommodating part, the periphery of which is connected to the first sealing part; the second test chamber The body includes a second accommodating portion, the periphery of which is connected to the second sealing portion; the testing device includes an airtight gasket located between the first sealing portion and the second sealing portion; wherein , the first test cavity and the second test cavity can move relatively, so that the first accommodating part and the second accommodating part jointly surround and form the test space, and the first The sealing part and the second sealing part are clamped by the air-tight gasket to achieve a pre-collision operation. 如請求項5所述的內循環式非接觸測試設備,其中,所述測試裝置進一步包括有一密合機構,其包含:一驅動器,安裝於所述機台本體;多個鎖合件,可轉動地設置於所述第一測試腔體的所述第一密合部,並且每個所述鎖合件具有分別位於相反兩端的一連動端部與一鎖合端部;及一傳動件,連接所述驅動器與多個所述鎖合件的所述連動端部;其中,於所述預合作業之後,所述驅動器能通過所述傳動件而驅使多個所述鎖合件同步轉動來實現一鎖合作業,以使每個所述鎖合件的所述鎖合端部與所述第一密合部分別夾持於所述第二密合部的相反兩側。 The internal circulation non-contact testing equipment according to claim 5, wherein the testing device further includes a sealing mechanism, which includes: a driver installed on the machine body; a plurality of locking parts that can rotate is disposed on the first sealing portion of the first test cavity, and each locking member has a linking end and a locking end respectively located at opposite ends; and a transmission member, connected The linkage end portions of the driver and the plurality of locking parts; wherein, after the pre-cooperation operation, the driver can drive the plurality of locking parts to rotate synchronously through the transmission member. A locking operation is performed so that the locking end portion of each locking member and the first sealing portion are respectively clamped on opposite sides of the second sealing portion. 如請求項6所述的內循環式非接觸測試設備,其中,所述內 循環式非接觸測試設備進一步包括一抽氣裝置,其連通於所述第一容置部與所述第二容置部的至少其中之一;其中,於所述預合作業之後,所述抽氣裝置能對所述測試空間進行一抽真空作業,用以利於接著實施所述鎖合作業。 The internal circulation non-contact testing equipment as described in claim 6, wherein the internal circulation The cyclic non-contact testing equipment further includes an air extraction device connected to at least one of the first accommodating part and the second accommodating part; wherein, after the pre-operation, the exhaust device The gas device can perform a vacuum operation on the test space to facilitate subsequent implementation of the locking operation. 如請求項6所述的內循環式非接觸測試設備,其中,所述驅動器包含有一齒型部,每個所述鎖合件的所述連動端部為一齒輪,並且所述傳動件為嚙合於所述齒型部與多個所述連動端部的一傳動鍊條;所述齒型部與多個所述連動端部配置在高於所述第一測試腔體的一平面,並且多個所述連動端部的旋轉軸線彼此平行。 The internal circulation non-contact testing equipment of claim 6, wherein the driver includes a toothed portion, the linking end of each locking member is a gear, and the transmission member is a meshing A transmission chain between the toothed portion and the plurality of interlocking end portions; the toothed portion and the plurality of interlocking end portions are arranged on a plane higher than the first test chamber, and a plurality of The rotation axes of the linkage ends are parallel to each other. 如請求項1所述的內循環式非接觸測試設備,其中,所述風扇機構包含有:一框體,其一端安裝於所述開口;一馬達,安裝於所述框體的另一端,並且所述馬達的一輸出軸位於所述框體之內;一阻隔層,安裝於所述框體內,以隔絕所述框體內的空間與所述測試空間之間的溫度與氣壓;一轉軸,可轉動地穿設於所述阻隔層;其中,所述轉軸的一端位於所述框體之內,並且所述轉軸的另一端位於所述導流罩之內;一扇葉,固定於所述轉軸的所述另一端並相鄰於所述溫控單元;及一隔熱聯軸器,連接所述輸出軸與所述轉軸的所述一端;其中,所述馬達能以所述輸出軸、並通過所述隔熱聯軸器與所述轉軸而驅使所述扇葉轉動,以形成流動經過所述溫控 單元的所述循環氣流。 The internal circulation non-contact test equipment of claim 1, wherein the fan mechanism includes: a frame with one end installed on the opening; a motor installed on the other end of the frame, and An output shaft of the motor is located in the frame; a barrier layer is installed in the frame to isolate the temperature and air pressure between the space in the frame and the test space; a rotating shaft can Rotated through the barrier layer; wherein, one end of the rotating shaft is located within the frame, and the other end of the rotating shaft is located within the air deflector; a fan blade is fixed to the rotating shaft The other end is adjacent to the temperature control unit; and an insulated coupling connects the output shaft and the one end of the rotating shaft; wherein the motor can use the output shaft and the The fan blades are driven to rotate through the thermal insulation coupling and the rotating shaft to form a flow through the temperature control The circulating air flow of the unit. 如請求項9所述的內循環式非接觸測試設備,其中,所述風扇機構包含有安裝於所述第一測試腔體的所述頂部的一外殼,其包覆且封閉所述框體與所述馬達於內;其中,所述框體形成有位置對應於所述隔熱聯軸器的一拆裝孔,以使所述隔熱聯軸器能通過所述拆裝孔而於所述框體內進行安裝或拆卸。 The internal circulation non-contact test equipment according to claim 9, wherein the fan mechanism includes a shell installed on the top of the first test chamber, which covers and seals the frame and The motor is inside; wherein, the frame is formed with a disassembly and assembly hole whose position corresponds to the heat-insulating coupling, so that the heat-insulating coupling can pass through the disassembly and assembly hole and be attached to the heat-insulating coupling. Install or disassemble inside the frame.
TW111148359A 2022-12-16 2022-12-16 Non-contact testing apparatus with internal circulation TWI833504B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW111148359A TWI833504B (en) 2022-12-16 2022-12-16 Non-contact testing apparatus with internal circulation

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW111148359A TWI833504B (en) 2022-12-16 2022-12-16 Non-contact testing apparatus with internal circulation

Publications (2)

Publication Number Publication Date
TWI833504B true TWI833504B (en) 2024-02-21
TW202426934A TW202426934A (en) 2024-07-01

Family

ID=90825134

Family Applications (1)

Application Number Title Priority Date Filing Date
TW111148359A TWI833504B (en) 2022-12-16 2022-12-16 Non-contact testing apparatus with internal circulation

Country Status (1)

Country Link
TW (1) TWI833504B (en)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002005325A2 (en) * 2000-07-11 2002-01-17 Temptronic Corporation Chuck with heat exchanger and temperature control fluid
CN1534754A (en) * 2003-03-21 2004-10-06 Զ���� Temperature monitoring system of test classifier
CN105051556A (en) * 2013-03-15 2015-11-11 泰拉丁公司 Air circulation in a system
US20160091559A1 (en) * 2014-09-25 2016-03-31 Pentamaster Instrumentation Sdn Bhd Apparatus for Burn-In Test
TW201818053A (en) * 2016-11-14 2018-05-16 精工愛普生股份有限公司 Temperature-measuring apparatus, inspection apparatus, and control method

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002005325A2 (en) * 2000-07-11 2002-01-17 Temptronic Corporation Chuck with heat exchanger and temperature control fluid
CN1534754A (en) * 2003-03-21 2004-10-06 Զ���� Temperature monitoring system of test classifier
CN105051556A (en) * 2013-03-15 2015-11-11 泰拉丁公司 Air circulation in a system
US20160091559A1 (en) * 2014-09-25 2016-03-31 Pentamaster Instrumentation Sdn Bhd Apparatus for Burn-In Test
TW201818053A (en) * 2016-11-14 2018-05-16 精工愛普生股份有限公司 Temperature-measuring apparatus, inspection apparatus, and control method

Similar Documents

Publication Publication Date Title
JP6178507B2 (en) Fully automatic vacuum drying furnace
CN105618884A (en) Horizontal type vacuum furnace for diamond particle brazing
KR20190070840A (en) Integrated chamber for vacuum coating
TWI833504B (en) Non-contact testing apparatus with internal circulation
CN109092022B (en) Internal and external circulation air duct switching structure and humidity control device thereof
CN208078480U (en) One kind can dehumidify ring heat radiating type electric power cabinet
TW202426934A (en) Non-contact testing apparatus with internal circulation
KR101021114B1 (en) Cooling system for battery of driving vehicle
TWI833503B (en) Testing apparatus
CN104637837B (en) Reaction chamber and plasma processing device
TWI833506B (en) Non-contact testing apparatus with dual-circulation
TWI839023B (en) Non-contact testing apparatus with external circulation
TWI836799B (en) Temperature adjustment device of testing apparatus
CN218276274U (en) Vacuum sealing motor
TW202426925A (en) Testing apparatus
TW202426936A (en) Temperature adjustment device of testing apparatus
TW202426935A (en) Non-contact testing apparatus with external circulation
TW202426937A (en) Non-contact testing apparatus with dual- circulation
CN108517393A (en) A kind of Full-automatic high-temperature heat treatment cycle system
CN109404306B (en) Centrifugal hot air circulating fan capable of cooling inside kiln
CN112161435B (en) Rapid cooling vacuum drying device and method
TWM472484U (en) Isothermal pressurized oven
CN207781547U (en) A kind of solidification apparatus for baking of multichip IC packaging technology section
CN218269906U (en) Double-station negative pressure drying box
CN112652553B (en) Loading chamber and semiconductor processing equipment