TWI829418B - Wafer magnetic fixing mechanism and wafer magnetic fixture comprising thereof - Google Patents

Wafer magnetic fixing mechanism and wafer magnetic fixture comprising thereof Download PDF

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TWI829418B
TWI829418B TW111142588A TW111142588A TWI829418B TW I829418 B TWI829418 B TW I829418B TW 111142588 A TW111142588 A TW 111142588A TW 111142588 A TW111142588 A TW 111142588A TW I829418 B TWI829418 B TW I829418B
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wafer
magnetic
platform
positioning mechanism
outer edge
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TW202420490A (en
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張紘睿
何嘉哲
陳泰甲
林繼榮
黃彥儒
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中國砂輪企業股份有限公司
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Abstract

The present invention discloses a wafer magnetic fixing mechanism, comprising a main body, a device positioning portion, and a wafer alignment groove. The device positioning portion is combined with the bottom side of the main body, and the device positioning portion is provided with a mechanism fixing portion. The device positioning part is combined with one side of a platform. The wafer alignment groove is an open groove that extends in the horizontal direction from the main body. The shape of the wafer alignment groove matches the shape of the outer edge of one of the sidewalls of the wafer, so that the outer edge of one of the sidewalls of the wafer is aligned to precisely position the wafer.

Description

晶圓磁吸定位機構以及包含其的晶圓磁吸定位治具Wafer magnetic positioning mechanism and wafer magnetic positioning jig containing the same

本發明係有關於一種晶圓定位機構以及包含其的晶圓定位治具,尤指一種方便快速精確定位的晶圓磁吸定位機構以及包含其的晶圓磁吸定位治具。The present invention relates to a wafer positioning mechanism and a wafer positioning fixture including the same, and in particular to a wafer magnetic positioning mechanism that facilitates rapid and accurate positioning and a wafer magnetic positioning fixture including the same.

在科技創新發達且技術日新月異的時代,積體電路元件具有體積小、功能強大等特點,因此廣泛地應用在各種不同領域或類型的電子產品中。為實現更為小型化且高性能的電子產品,現今對於薄型晶圓的需求日益增長,在縮減晶圓尺寸的同時需要確保後續製成記憶體或功率裝置等的效能不受影響、甚或是可以具有更好的電氣性能、散熱性能等,賦予電子產品更多的優勢。In an era of advanced technological innovation and rapid technological changes, integrated circuit components have the characteristics of small size and powerful functions, so they are widely used in various fields or types of electronic products. In order to realize more miniaturized and high-performance electronic products, there is an increasing demand for thin wafers. While reducing the size of the wafers, it is necessary to ensure that the performance of subsequent fabricated memories or power devices is not affected or even possible. It has better electrical performance, heat dissipation performance, etc., giving electronic products more advantages.

目前最常見的晶圓薄化方式為磨削,也就是在晶圓製程中需要經過一道晶圓研磨減薄的程序,讓晶圓的厚度減薄與表面平坦化,於一般進行晶圓研磨的程序中,會先使用膠帶黏貼於晶圓的表面進行保護,再將晶圓的背面朝上設置於研磨機的檯面上,讓研磨機對晶圓的背面進行研磨加工,達到減薄晶圓的厚度。At present, the most common wafer thinning method is grinding, which means that during the wafer manufacturing process, a wafer grinding and thinning process is required to reduce the thickness of the wafer and flatten the surface. In general, wafer grinding During the procedure, tape is first attached to the surface of the wafer for protection, and then the wafer is placed on the grinder table with the back side facing up, and the grinder is allowed to grind the back side of the wafer to achieve the purpose of thinning the wafer. thickness.

此外,在晶圓製造的過程中,晶圓自晶錠或晶棒切割下來後,表面之線鋸痕與損傷層或雷射切片燒灼或損傷區域,皆需要經過研磨加工以去除該缺陷區域,並使晶圓表面達成一較為平坦之狀態。過程中需要將晶圓透過真空吸盤吸附固定,以利後續採用砂輪進行表面研磨加工,使其達到平坦化。In addition, during the wafer manufacturing process, after the wafer is cut from the ingot or ingot, the saw lines and damaged layers on the surface or the laser slicing burnt or damaged areas need to be polished to remove the defective areas. And make the wafer surface reach a relatively flat state. During the process, the wafer needs to be adsorbed and fixed through a vacuum suction cup to facilitate subsequent surface grinding with a grinding wheel to flatten it.

進行晶圓減薄或去除缺陷區域之平坦化製程時,將晶圓準確的定位於承載平台上是相當重要的步驟。例如使用真空吸盤作為承載平台的晶圓加工設備,作業人員必須以目視的方式調整晶圓定位以完成晶圓定位作業,這樣的方式不僅需花費過多的時間校準造成效率低落,定位精準度也會因為作業人員的經驗而產生差異。是以提出本發明的晶圓磁吸定位機構以及包含其的晶圓磁吸定位治具以解決上述的問題。When performing a planarization process for wafer thinning or removal of defective areas, accurately positioning the wafer on the carrier platform is a very important step. For example, in wafer processing equipment that uses vacuum suction cups as the carrying platform, operators must visually adjust the wafer positioning to complete the wafer positioning operation. This method not only takes too much time to calibrate, resulting in low efficiency, but also reduces the positioning accuracy. Differences arise due to the experience of the operator. Therefore, the present invention provides a wafer magnetic positioning mechanism and a wafer magnetic positioning jig including the same to solve the above problems.

本發明的主要目的,在於提供一種晶圓磁吸定位機構,包括一本體部、一裝置定位部、以及一晶圓對齊槽。該裝置定位部結合於該本體部的底側,該裝置定位部上係設置有一機構磁吸部。該晶圓對齊槽係為由該本體部沿水平方向上延伸形成的開口槽,該晶圓對齊槽的形狀與一晶圓的其中一側壁外緣的形狀相符合以供該晶圓的該其中一側壁外緣憑靠對齊藉以定位該晶圓。The main purpose of the present invention is to provide a wafer magnetic positioning mechanism, which includes a body part, a device positioning part, and a wafer alignment groove. The device positioning part is combined with the bottom side of the body part, and a mechanical magnetic attraction part is provided on the device positioning part. The wafer alignment groove is an open groove formed by extending in the horizontal direction from the body part. The shape of the wafer alignment groove is consistent with the shape of the outer edge of one side wall of a wafer to provide space for the middle part of the wafer. The outer edge of one side wall is aligned to position the wafer.

進一步地,該機構磁吸部係為磁鐵、或磁性吸附件。Furthermore, the magnetic attraction part of the mechanism is a magnet or a magnetic adsorption piece.

進一步地,該晶圓對齊槽係為一弧形開口槽,該其中一側壁外緣係為該晶圓的圓周區域且該弧形開口槽與該圓周區域的曲率相符以供該側壁外緣憑靠。Further, the wafer alignment groove is an arc-shaped opening groove, the outer edge of one of the side walls is the circumferential area of the wafer, and the arc-shaped opening groove conforms to the curvature of the circumferential area for the outer edge of the side wall to pass Depend on.

進一步地,該弧形開口槽上更進一步包括一突出部,該突出部與該晶圓的缺口形狀相符以供該側壁外緣上的該缺口憑靠。Furthermore, the arc-shaped opening groove further includes a protruding portion, the protruding portion conforms to the shape of the notch of the wafer for leaning against the notch on the outer edge of the side wall.

進一步地,該晶圓對齊槽係為一梯型開口槽,該其中一側壁外緣係為該晶圓的平邊區域且該梯型開口槽與該平邊區域的形狀相符以供該側壁外緣憑靠。Further, the wafer alignment groove is a trapezoidal opening groove, the outer edge of one of the side walls is a flat edge area of the wafer, and the trapezoidal opening groove conforms to the shape of the flat edge area for the outer edge of the side wall. Depend on fate.

進一步地,該其中一側壁外緣更進一步包括位於該晶圓的平邊區域相對兩側的圓周區域,該梯型開口槽相對兩側更進一步包括一與該圓周區域曲率相符的弧形部以供該晶圓的圓周區域憑靠。Further, the outer edge of one of the side walls further includes circumferential areas located on opposite sides of the flat edge area of the wafer, and the opposite sides of the trapezoidal opening groove further include an arcuate portion consistent with the curvature of the circumferential area. Provides support for the circumferential area of the wafer.

進一步地,該晶圓磁吸定位機構的材料係為金屬、金屬合金、陶瓷、碳化矽、金屬氮化物、金屬氧化物、橡膠、塑膠、玻纖複合材、碳纖複合材、有機纖維複合材或上述材料之組合。Further, the material of the wafer magnetic positioning mechanism is metal, metal alloy, ceramic, silicon carbide, metal nitride, metal oxide, rubber, plastic, glass fiber composite material, carbon fiber composite material, organic fiber composite material or A combination of the above materials.

本發明的另一目的,在於提供一種晶圓磁吸定位治具,包括一前面所述的晶圓磁吸定位機構、以及一平台。該平台包括平台本體、於該平台本體頂側的晶圓設置檯面、以及設置於該平台本體一側對應該機構磁吸部的平台磁吸部,通過該平台磁吸部與該機構磁吸部對應以將該晶圓磁吸定位機構固定於該平台本體上,該晶圓磁吸定位機構固定於該平台上時該晶圓對齊槽的底側抵靠於該平台本體頂側的該晶圓設置檯面上,以使該晶圓對齊槽於水平方向上供該晶圓的該其中一側壁外緣憑靠。Another object of the present invention is to provide a wafer magnetic positioning fixture, which includes a wafer magnetic positioning mechanism as described above and a platform. The platform includes a platform body, a wafer setting table on the top side of the platform body, and a platform magnetic part provided on one side of the platform body corresponding to the magnetic part of the mechanism. Through the platform magnetic part and the magnetic part of the mechanism, Correspondingly, the wafer magnetic positioning mechanism is fixed on the platform body. When the wafer magnetic positioning mechanism is fixed on the platform, the bottom side of the wafer alignment groove abuts the wafer on the top side of the platform body. The table is arranged so that the wafer alignment groove is supported by the outer edge of one side wall of the wafer in the horizontal direction.

進一步地,該平台本體包括一底座、以及一設置於該底座上的晶圓吸附盤,該晶圓設置檯面設置於該晶圓吸附盤的頂側。Further, the platform body includes a base and a wafer suction disk disposed on the base, and the wafer setting table is disposed on the top side of the wafer suction disk.

進一步地,該平台磁吸部環繞佈設於該平台本體外周,該晶圓磁吸定位機構的該機構磁吸部數量為至少二個,各該機構磁吸部分別吸附該平台磁吸部使得該晶圓磁吸定位機構固定於該平台上。Further, the magnetic suction part of the platform is arranged around the periphery of the platform body, and the number of the magnetic suction parts of the wafer magnetic suction positioning mechanism is at least two, and each of the magnetic suction parts of the mechanism respectively attracts the magnetic suction part of the platform so that the magnetic suction part of the platform is The wafer magnetic positioning mechanism is fixed on the platform.

進一步地,該平台磁吸部係為與相鄰二側具有相反磁極的第一磁鐵,該機構磁吸部係為分別對應吸附相鄰設置之該第一磁鐵的第二磁鐵或磁性吸附件。Furthermore, the magnetic attraction part of the platform is a first magnet with opposite magnetic poles to the adjacent two sides, and the magnetic attraction part of the mechanism is a second magnet or a magnetic adsorption piece that respectively attracts the adjacent first magnets.

進一步地,該平台本體各該平台磁吸部相鄰兩側的其他二該平台磁吸部互為相反磁極。Further, the other two magnetic attraction portions of the platform on adjacent sides of each magnetic attraction portion of the platform body have opposite magnetic poles to each other.

進一步地,該平台磁吸部係為磁性吸附件,該機構磁吸部係為分別對應吸附該平台磁吸部的磁鐵。Further, the magnetic attraction part of the platform is a magnetic adsorption piece, and the magnetic attraction part of the mechanism is a magnet that respectively attracts the magnetic attraction part of the platform.

進一步地,該機構磁吸部係為磁性吸附件,該平台磁吸部係為分別對應吸附該機構磁吸部的磁鐵。Furthermore, the magnetic attraction part of the mechanism is a magnetic adsorption part, and the magnetic attraction part of the platform is a magnet corresponding to the magnetic attraction part of the mechanism.

是以,本發明的晶圓磁吸定位機構以及晶圓磁吸定位治具有助於快速並精準的定位晶圓,有助於提升作業的工作效率。此外,本發明的晶圓磁吸定位機構以及晶圓磁吸定位治具結構簡單、容易加工製造、且方便操作。此外,本發明的晶圓磁吸定位機構以及晶圓磁吸定位治具可用於自動化程度較低的設備,亦可用於自動化設備中,其應用範圍廣泛。Therefore, the wafer magnetic positioning mechanism and the wafer magnetic positioning fixture of the present invention help to position the wafer quickly and accurately, and help improve the work efficiency of the operation. In addition, the wafer magnetic positioning mechanism and the wafer magnetic positioning fixture of the present invention have a simple structure, are easy to process and manufacture, and are convenient to operate. In addition, the wafer magnetic positioning mechanism and the wafer magnetic positioning fixture of the present invention can be used in equipment with a low degree of automation, and can also be used in automated equipment, and have a wide range of applications.

有關本創作之詳細說明及技術內容,現就配合圖式說明如下。再者,本創作中之圖式,為說明方便,其比例未必按實際比例繪製,而有誇大之情況,該等圖式及其比例非用以限制本創作之範圍。The detailed description and technical content of this creation are described below with reference to the drawings. Furthermore, the figures in this creation are for convenience of explanation, and their proportions may not be drawn according to actual proportions, but may be exaggerated. These figures and their proportions are not intended to limit the scope of this creation.

請參閱「圖1」至「圖2」,為本發明的晶圓磁吸定位機構第一至第六實施例的外觀示意圖、以及「圖3」,為本發明的晶圓對齊槽不同實施例的俯視示意圖、以及「圖4」至「圖5」,為本發明晶圓磁吸定位治具不同實施例的組合示意圖(一)、(二),如圖所示。Please refer to "Figure 1" to "Figure 2", which are schematic appearance views of the first to sixth embodiments of the wafer magnetic positioning mechanism of the present invention, and "Figure 3", which are different embodiments of the wafer alignment groove of the present invention. The top schematic diagram and "Fig. 4" to "Fig. 5" are combination schematic diagrams (1) and (2) of different embodiments of the wafer magnetic positioning fixture of the present invention, as shown in the figures.

本發明揭示一種晶圓磁吸定位機構100,用於組合於平台200(如「圖4」及「圖5」所示)以準確定位晶圓WF位置,以利對晶圓WF進行加工處理。所述的晶圓磁吸定位機構100的材料例如但不限為金屬、金屬合金、陶瓷、碳化矽、金屬氮化物、金屬氧化物、橡膠、塑膠、玻纖複合材、碳纖複合材、有機纖維複合材或上述材料之組合、或其他任何用以製成固體結構且不具被磁鐵吸附作用的單一材料或複合材料。於一實施例中,該加工處理例如包括可以是晶圓缺陷層去除、晶圓研磨、晶圓拋光、減薄程序,於本發明中不予以限制。The present invention discloses a wafer magnetic positioning mechanism 100, which is used to be combined with the platform 200 (as shown in "Fig. 4" and "Fig. 5") to accurately position the wafer WF to facilitate processing of the wafer WF. The materials of the wafer magnetic positioning mechanism 100 include, but are not limited to, metals, metal alloys, ceramics, silicon carbide, metal nitrides, metal oxides, rubber, plastics, glass fiber composite materials, carbon fiber composite materials, and organic fibers. Composite materials or combinations of the above materials, or any other single material or composite materials used to form a solid structure and are not adsorbed by magnets. In one embodiment, the processing includes, for example, wafer defective layer removal, wafer grinding, wafer polishing, and thinning procedures, which are not limited in the present invention.

所述的晶圓磁吸定位機構100包括一本體部10、一裝置定位部20、以及一晶圓對齊槽30,該裝置定位部20結合於該本體部10的底側,用以組合於平台200的一側,該裝置定位部20上係設置有一機構磁吸部21。所述的機構磁吸部21例如但不限為磁鐵、或磁性吸附件,其中,磁鐵(或可稱為磁石)為可以吸引磁性吸附件並於其外產生磁場的物體,以及磁性吸附件例如但不限為包含有鐵、鎳、鈷的金屬或其合金、或包含有具有順磁性、鐵磁性之材料特性的元件或結構以被磁鐵吸附,於該平台200對應設置有吸附該機構磁吸部21元件或結構,後面段落將詳細描述該晶圓磁吸定位機構100與平台200的組合內容。所述的機構磁吸部21例如但不限為經由嵌合、卡合、黏合或其他方式或手段結合於該本體部10底側,本發明中對此並不予以限制,在此先行敘明。The wafer magnetic positioning mechanism 100 includes a body part 10, a device positioning part 20, and a wafer alignment groove 30. The device positioning part 20 is combined with the bottom side of the body part 10 for assembly on the platform. On one side of the device 200, the device positioning portion 20 is provided with a mechanical magnetic attraction portion 21. The magnetic attraction part 21 of the mechanism is, for example, but not limited to, a magnet or a magnetic adsorption piece. The magnet (or magnet) is an object that can attract the magnetic adsorption piece and generate a magnetic field outside it, and the magnetic adsorption piece is, for example, But it is not limited to metals or alloys containing iron, nickel, cobalt, or components or structures containing material properties of paramagnetic or ferromagnetic properties to be adsorbed by magnets. The platform 200 is provided with a corresponding magnetic adsorption mechanism. 21 components or structures, the following paragraphs will describe the combination of the wafer magnetic positioning mechanism 100 and the platform 200 in detail. The magnetic attraction part 21 of the mechanism is, for example, but not limited to, coupled to the bottom side of the body part 10 through fitting, snapping, adhesion or other ways or means. This is not limited in the present invention and will be explained here. .

所述的晶圓對齊槽30係為由該本體部10沿水平方向D1(如「圖4」及「圖5」所示)上延伸形成的開口槽,該晶圓對齊槽30的形狀與晶圓WF的其中一側壁外緣LS的形狀相符合,以供該晶圓的該其中一側壁外緣LS憑靠對齊,藉以精準定位該晶圓WF。具體而言,所述的晶圓對齊槽30係朝向水平方向D1(亦即與平台200表面平行的方向)上開口,並使得該開口與晶圓WF的側壁外緣LS於形狀上相符。所述的形狀相符合,除了完全相符外,亦可以是部分相符,例如晶圓對齊槽30可以為鋸齒狀(如「圖3」中的(A))、波浪狀(如「圖3」中的(B))或其他類此的形狀,以圓周兩點決定一弦的情況下,至少在最凸出的兩點位置上與該晶圓WF構成止擋(干涉)即屬形狀相符,在此先行敘明。The wafer alignment groove 30 is an open groove formed by the main body 10 extending in the horizontal direction D1 (as shown in "Fig. 4" and "Fig. 5"). The shape of the wafer alignment groove 30 is consistent with the shape of the wafer alignment groove 30. The shape of the outer edge LS of one of the side walls of the circle WF is consistent, so that the outer edge LS of one of the side walls of the wafer can be aligned to accurately position the wafer WF. Specifically, the wafer alignment groove 30 opens in the horizontal direction D1 (that is, the direction parallel to the surface of the platform 200 ), and the opening is consistent in shape with the outer edge LS of the side wall of the wafer WF. In addition to being completely consistent, the shapes described above may also be partially consistent. For example, the wafer alignment groove 30 may be in a zigzag shape (such as (A) in "Figure 3") or a wavy shape (such as in "Figure 3"). (B)) or other similar shapes, when a chord is determined by two points on the circumference, the shape is consistent if at least the two most protruding points form a stop (interference) with the wafer WF. This is explained first.

於一實施例中,如「圖1」及「圖2」中的(A)所示(晶圓磁吸定位機構100的第一、及第四實施例),所述的晶圓對齊槽30係為一弧形開口槽,該其中一側壁外緣LS係為該晶圓WF的圓周區域,且該弧形開口槽與該圓周區域的曲率相符,以供該側壁外緣LS憑靠。於另一實施例中,如「圖1」及「圖2」中的(B)所示(晶圓磁吸定位機構100的第二、及第四實施例),所述的晶圓對齊槽30係為一弧形開口槽,該其中一側壁外緣LS係為該晶圓WF的圓周區域,且該弧形開口槽與該圓周區域的曲率相符,以供該側壁外緣LS憑靠,其中該弧形開口槽上更進一步包括一突出部31,該突出部31與該晶圓WF的缺口NT(Notch)形狀相符,以供該側壁外緣LS上的該缺口NT(如「圖6」中的(B)所示)憑靠。於又一實施例中,如「圖1」及「圖2」中的(C)所示(晶圓磁吸定位機構100的第三、及第六實施例),該晶圓對齊槽30係為一梯型開口槽,該其中一側壁外緣LS係為該晶圓WF的平邊區域(Flat),且該梯型開口槽與該平邊區域的形狀相符,以供該側壁外緣LS(指前述的平邊區域)憑靠,其中,該梯型開口槽相對兩側例如但不限為與該晶圓WF保持間距、或可接觸該晶圓WF,舉例來說,上述的該其中一側壁外緣更進一步包括位於該晶圓WF的平邊區域相對兩側的圓周區域,該梯型開口槽相對兩側更進一步包括一與該圓周區域曲率相符的弧形部32,以供該晶圓WF該側壁外緣(指前述的圓周區域)憑靠。後面段落將說明該晶圓磁吸定位機構100利用該裝置定位部20組合於平台200的具體實施態樣,在此先行敘明。In one embodiment, as shown in (A) in "Figure 1" and "Figure 2" (first and fourth embodiments of the wafer magnetic positioning mechanism 100), the wafer alignment groove 30 It is an arc-shaped opening groove, and the outer edge LS of one of the side walls is the circumferential area of the wafer WF, and the arc-shaped opening groove conforms to the curvature of the circumferential area for the outer edge LS of the side wall to lean. In another embodiment, as shown in (B) in "Figure 1" and "Figure 2" (the second and fourth embodiments of the wafer magnetic positioning mechanism 100), the wafer alignment groove 30 is an arc-shaped opening groove, and the outer edge LS of one of the side walls is the circumferential area of the wafer WF, and the arc-shaped opening groove is consistent with the curvature of the circumferential area for the outer edge LS of the side wall to lean. The arc-shaped opening groove further includes a protrusion 31. The protrusion 31 is consistent with the shape of the notch NT (Notch) of the wafer WF and is used for the notch NT on the outer edge LS of the side wall (as shown in "Figure 6 "Indicated by (B)) is reliable. In another embodiment, as shown in (C) in "Figure 1" and "Figure 2" (the third and sixth embodiments of the wafer magnetic positioning mechanism 100), the wafer alignment groove 30 is It is a trapezoidal opening groove, and the outer edge LS of one of the side walls is the flat edge area (Flat) of the wafer WF, and the trapezoidal opening groove conforms to the shape of the flat edge area to provide space for the outer edge LS of the side wall. (referring to the aforementioned flat-edge area), wherein the opposite sides of the trapezoidal opening groove are, for example, but not limited to, maintaining a distance from the wafer WF or being able to contact the wafer WF. For example, the above-mentioned The outer edge of one side wall further includes circumferential areas located on opposite sides of the flat edge area of the wafer WF, and the opposite sides of the trapezoidal opening groove further include an arcuate portion 32 consistent with the curvature of the circumferential area for the The outer edge of the side wall (referring to the aforementioned circumferential area) of the wafer WF rests against it. The following paragraphs will describe the specific implementation of the wafer magnetic positioning mechanism 100 using the device positioning part 20 to be combined with the platform 200, which will be described here first.

接續,請一併參閱「圖4」至「圖5」,為本發明晶圓磁吸定位治具不同實施例的組合示意圖(一)、(二),以及「圖6」,為本發明晶圓磁吸定位治具的磁極配置示意圖,並請復參「圖1」至「圖2」,如圖所示。Continuing, please refer to "Fig. 4" to "Fig. 5", which are assembly schematic diagrams (1) and (2) of different embodiments of the wafer magnetic positioning fixture of the present invention, and "Fig. 6", which is a schematic diagram of the wafer magnetic positioning fixture of the present invention. Schematic diagram of the magnetic pole configuration of the circular magnetic positioning fixture, and please refer to "Figure 1" to "Figure 2" as shown in the figure.

本發明另揭示一種晶圓磁吸定位治具300,該晶圓磁吸定位治具300包括一前述任一實施例的晶圓磁吸定位機構100、以及一該平台200。所述的平台200包括平台本體40、於該平台本體40頂側的晶圓設置檯面P1、以及設置於該平台本體40一側對應該機構磁吸部21的平台磁吸部P2,通過該平台磁吸部P2與該機構磁吸部21對應以將該晶圓磁吸定位機構100固定於該平台本體40上,該晶圓磁吸定位機構21固定於該平台200上時該晶圓對齊槽30的底側抵靠於該平台本體40頂側的該晶圓設置檯面P1上,以使該晶圓對齊槽30於水平方向D1上供該晶圓WF的該其中一側壁外緣LS憑靠。所述的平台磁吸部P2例如但不限為經由嵌合、卡合、黏合或其他方式或手段結合於該平台本體40,本發明中對此並不予以限制,在此先行敘明。The present invention also discloses a wafer magnetic positioning fixture 300. The wafer magnetic positioning fixture 300 includes a wafer magnetic positioning mechanism 100 of any of the aforementioned embodiments and a platform 200. The platform 200 includes a platform body 40, a wafer setting table P1 on the top side of the platform body 40, and a platform magnetic part P2 provided on one side of the platform body 40 corresponding to the magnetic part 21 of the mechanism. Through the platform The magnetic suction part P2 corresponds to the magnetic suction part 21 of the mechanism to fix the wafer magnetic suction positioning mechanism 100 on the platform body 40. When the wafer magnetic suction positioning mechanism 21 is fixed on the platform 200, the wafer alignment groove The bottom side of 30 is against the wafer setting table P1 on the top side of the platform body 40, so that the wafer alignment groove 30 is supported by the outer edge LS of one side wall of the wafer WF in the horizontal direction D1 . The platform magnetic part P2 is coupled to the platform body 40 by, for example but not limited to, fitting, snapping, adhesion or other ways or means. This is not limited in the present invention and will be described in advance.

所述的平台本體40包括一底座41、以及一設置於該底座41上的晶圓吸附盤42,該晶圓設置檯面P1設置於該晶圓吸附盤42的頂側。所述的平台本體40的該平台磁吸部P2係供該晶圓磁吸定位機構100的該機構磁吸21對應吸附,用以將該晶圓磁吸定位機構100組合且固定於該平台本體40上,且該晶圓磁吸定位機構100組合且固定於該平台200上時,該晶圓對齊槽30的底側抵靠於該平台本體40頂側的該晶圓設置檯面P1上,以使該晶圓對齊槽30於水平方向D1上供該晶圓WF的該其中一側壁外緣LS憑靠。The platform body 40 includes a base 41 and a wafer suction disc 42 disposed on the base 41 . The wafer setting table P1 is disposed on the top side of the wafer suction disc 42 . The platform magnetic portion P2 of the platform body 40 is for the magnetic attraction 21 of the wafer magnetic positioning mechanism 100 to be correspondingly attracted, so as to assemble and fix the wafer magnetic positioning mechanism 100 to the platform body. 40, and when the wafer magnetic positioning mechanism 100 is assembled and fixed on the platform 200, the bottom side of the wafer alignment groove 30 abuts the wafer setting table P1 on the top side of the platform body 40, so as to The wafer alignment groove 30 is configured to lean against the outer edge LS of one of the side walls of the wafer WF in the horizontal direction D1.

所述的晶圓對齊槽30的底側抵靠於該平台本體40頂側的該晶圓設置檯面P1上所指的「抵靠」,例如但不限為,該晶圓對齊槽30底側緊密貼合於該晶圓設置檯面P1上、或者部分接觸、或者該晶圓對齊槽30底側與該晶圓設置檯面P1尚保持細微間距,若保留間距則該間距至少小於該晶圓WF厚度,確保該晶圓對齊槽30供晶圓WF的側壁外緣LS憑靠。The bottom side of the wafer alignment groove 30 is against what is referred to as "resistance" on the wafer setting table P1 on the top side of the platform body 40. For example, but not limited to, the bottom side of the wafer alignment groove 30 It is closely attached to the wafer setting table P1, or is partially in contact, or the bottom side of the wafer alignment groove 30 and the wafer setting table P1 still maintain a fine distance. If the distance is maintained, the distance is at least smaller than the thickness of the wafer WF. , ensuring that the wafer alignment groove 30 is supported by the outer edge LS of the side wall of the wafer WF.

於一實施例中,所述的平台磁吸部P2環繞佈設於該平台本體40外周,該晶圓磁吸定位機構100的該機構磁吸部21數量為至少二個(即二個或二個以上),各該機構磁吸部21分別吸附該平台磁吸部P2,使得該晶圓磁吸定位機構100得以組合且固定於該平台200上,如「圖4」及「圖5」所示,利用二個該機構磁吸部21於該平台本體40上構成兩點一線進行固定。於另一實施例中,本實施例與前一實施例的區別在於,所述的平台磁吸部P2及該機構磁吸部21的數量及位置為相對應。本發明中並不欲限制該平台磁吸部P2及該機構磁吸部21的大小、形狀、數量或位置等,在此先行敘明。In one embodiment, the platform magnetic suction parts P2 are arranged around the periphery of the platform body 40 , and the number of the magnetic suction parts 21 of the wafer magnetic suction positioning mechanism 100 is at least two (ie, two or two). above), each magnetic attraction part 21 of the mechanism respectively attracts the magnetic attraction part P2 of the platform, so that the wafer magnetic attraction positioning mechanism 100 can be assembled and fixed on the platform 200, as shown in "Figure 4" and "Figure 5" , two magnetic suction parts 21 of the mechanism are used to form two points and one line on the platform body 40 for fixation. In another embodiment, the difference between this embodiment and the previous embodiment is that the number and position of the magnetic attraction portion P2 of the platform and the magnetic attraction portion 21 of the mechanism are corresponding. The present invention does not intend to limit the size, shape, quantity or position of the platform magnetic attraction part P2 and the mechanism magnetic attraction part 21, which will be described in advance.

於一實施例中,所述的平台磁吸部P2係為與相鄰二側具有相反磁極的第一磁鐵,該機構磁吸部21係為分別對應吸附相鄰設置之該第一磁鐵的第二磁鐵、或磁性吸附件,該磁性吸附件例如但不限為包括有鐵、鎳、鈷等成分的金屬或其合金、或具有順磁性、鐵磁性等可以被磁鐵吸附的元件,如「圖6」中的(A)所示,該平台磁吸部P2係以N、S、N、S…依此類推的磁極排列方式環繞佈設於該平台本體40以達到設置的平衡,避免對晶圓WF進行研磨或拋光時造成該平台200震動或搖晃,以及二個該機構磁吸部21(即第二磁鐵)具有相反磁極以達到設置的平衡、且得以對應吸附相鄰設置且亦具有相反磁極的該平台磁吸部P2(即第一磁鐵),達到組合的效果。於另一實施例中,本實施例與前一實施例的區別在於,所述的平台本體40環繞佈設的各該平台磁吸部P2相鄰兩側的其他二該平台磁吸部P2互為相反磁極,如「圖6」中的(B)所示,該平台磁吸部P2係以N、N、S、S、N、N、S、S…依此類推的磁極排列方式環繞佈設於該平台本體40,利用具有相反磁極的該機構磁吸部21(即第二磁鐵)對應吸附於相鄰設置的該平台磁吸部P2(即第一磁鐵)、且被吸附的該平台磁吸部P2亦具有相反磁極,達到組合的效果。於另一實施例中,所述的機構磁吸部21(即第二磁鐵)係具有相同磁極,該平台磁吸部P2(即第一磁鐵)係對應該機構磁吸部21的數量、位置及磁極進行配置以供該機構磁吸部21對應吸附,如「圖6」中的(C)所示,具有相同磁極(例如但不限為至少兩個N極、或S極)的機構磁吸部21(即第二磁鐵)係對應吸附與該機構磁吸部21之磁極相反的平台磁吸部P2(即第一磁鐵),達到組合的效果。本發明中並不欲限制該機構磁吸部21與該平台磁吸部P2對應吸附的數量或磁極等,在此先行敘明。In one embodiment, the magnetic attraction part P2 of the platform is a first magnet with opposite magnetic poles to the adjacent two sides, and the magnetic attraction part 21 of the mechanism is a third magnet that respectively attracts the adjacent first magnets. 2. Magnets, or magnetic adsorption parts. The magnetic adsorption parts are, for example, but not limited to, metals or their alloys containing iron, nickel, cobalt, etc., or components with paramagnetic properties, ferromagnetism, etc. that can be adsorbed by magnets, as shown in "Fig. As shown in (A) in 6", the magnetic attraction part P2 of the platform is arranged around the platform body 40 in a magnetic pole arrangement of N, S, N, S... and so on to achieve a balanced arrangement and avoid damaging the wafer. When WF is grinding or polishing, the platform 200 vibrates or shakes, and the two magnetic suction parts 21 of the mechanism (i.e., the second magnet) have opposite magnetic poles to achieve the balance of the setting, and can correspondingly absorb adjacent ones that also have opposite magnetic poles. The magnetic attraction part P2 (ie the first magnet) of the platform achieves the effect of combination. In another embodiment, the difference between this embodiment and the previous embodiment is that the other two magnetic suction parts P2 on the adjacent sides of each platform magnetic suction part P2 arranged around the platform body 40 are mutually exclusive. Opposite magnetic poles, as shown in (B) in "Figure 6", the magnetic part P2 of the platform is arranged around the magnetic poles in a magnetic pole arrangement of N, N, S, S, N, N, S, S... and so on. The platform body 40 utilizes the magnetic attraction part 21 (i.e., the second magnet) of the mechanism with opposite magnetic poles to be correspondingly attracted to the adjacent magnetic attraction part P2 (i.e., the first magnet) of the platform, and is attracted by the magnetic attraction of the platform. Part P2 also has opposite magnetic poles to achieve the effect of combination. In another embodiment, the magnetic attraction parts 21 of the mechanism (i.e., the second magnet) have the same magnetic poles, and the magnetic attraction part P2 (i.e., the first magnet) of the platform corresponds to the number and position of the magnetic attraction parts 21 of the mechanism. and magnetic poles are configured for corresponding adsorption by the magnetic suction part 21 of the mechanism. As shown in (C) in "Figure 6", the mechanism magnets with the same magnetic poles (such as but not limited to at least two N poles or S poles) The suction part 21 (i.e., the second magnet) is correspondingly attracted to the platform magnetic suction part P2 (i.e., the first magnet) whose magnetic pole is opposite to that of the magnetic suction part 21 of the mechanism, thereby achieving the combined effect. The present invention does not intend to limit the number or magnetic poles of the magnetic suction portion 21 of the mechanism and the magnetic suction portion P2 of the platform, which will be described in advance.

所述的機構磁吸部21及平台磁吸部P2均配置磁鐵可以於晶圓磁吸定位機構100組合於該平台200時起到「防呆作用」,具體而言,在平台本體40上的平台磁吸部P2,可以在不希望配置晶圓磁吸定位機構100的位置上設置與其機構磁吸部21相反磁極的磁鐵,使得晶圓磁吸定位機構100在特定的位置上達到與該平台磁吸部P2相斥的效果,也就是基於同極相斥、異極相吸的原理達到組合時的防呆效果。舉例來說,如「圖6」中(A)的實施例,該機構磁吸部21(由上至下的磁極為N、S)僅得與該平台本體40之位置Z1(左側由上至下的磁極為S、N) 、位置Z2(上側由左至右的磁極為N、S)、位置Z3(右側由上至下的磁極為N、S)、及位置Z4(下側由左至右的磁極為S、N)的該平台磁吸部P2相吸、且與相鄰但為不同位置的該平台磁吸部P2相斥,達到組合時的防呆效果;如「圖6」中(B)的實施例,該機構磁吸部21(由上至下的磁極為S、N)僅得與該平台本體40相對兩側之位置Z5(左側由上至下的磁極為N、S)、及位置Z6(右側由上至下的磁極為S、N)的該平台磁吸部P2相吸、且與上側(由左至右的磁極為N、S)、及下側(由左至右的磁極為S、N)的該平台磁吸部P2相斥,達到組合時的防呆效果;如「圖6」中(C)的實施例,該機構磁吸部21(由上至下為雙N極)僅得與該平台本體40相對兩側之位置Z7(左側由上至下為雙S極)、及位置Z8(右側由上至下為雙S極)的該平台磁吸部P2相吸、且與上、下側(由左至右為雙N極)的該平台磁吸部P2相斥,達到組合時的防呆效果。The mechanism magnetic suction part 21 and the platform magnetic suction part P2 are both equipped with magnets, which can play an "anti-fooling role" when the wafer magnetic suction positioning mechanism 100 is assembled on the platform 200. Specifically, the magnets on the platform body 40 The platform magnetic suction part P2 can be provided with a magnet with an opposite magnetic pole to the magnetic suction part 21 of the wafer magnetic suction positioning mechanism 100 at a position where it is not desired to dispose the wafer magnetic suction positioning mechanism 100, so that the wafer magnetic suction positioning mechanism 100 can reach the platform at a specific position. The mutual repulsion effect of the magnetic suction part P2 is based on the principle of like poles repelling each other and opposite poles attracting each other to achieve the anti-fooling effect during combination. For example, as in the embodiment of (A) in "Figure 6", the magnetic suction part 21 of the mechanism (the magnetic poles from top to bottom are N and S) can only be in contact with the position Z1 of the platform body 40 (from the left side from top to bottom). The magnetic poles at the bottom are S and N), position Z2 (the magnetic poles on the upper side from left to right are N and S), position Z3 (the magnetic poles on the right side from top to bottom are N and S), and position Z4 (the lower side is from left to right). The magnetic parts P2 of the platform with magnetic poles S and N on the right are attracted to each other and repel with the magnetic parts P2 of the platform that are adjacent but at different positions to achieve a fool-proof effect when combined; as shown in "Figure 6" In the embodiment of (B), the magnetic attraction part 21 of the mechanism (the magnetic poles S and N from top to bottom) can only be located at the position Z5 on both sides of the platform body 40 (the magnetic poles N and S from top to bottom on the left side). ; The magnetic poles S and N of the platform to the right repel each other to achieve a fool-proof effect during combination; as in the embodiment of (C) in "Figure 6", the magnetic portion 21 of the mechanism (from top to bottom) (Double N poles at the bottom) can only be magnetically attracted to the platform at position Z7 (double S poles from top to bottom on the left side) and Z8 (double S poles from top to bottom on the right side) on opposite sides of the platform body 40 The magnetic parts P2 attract each other and repel the magnetic parts P2 on the upper and lower sides (double N poles from left to right) of the platform, thereby achieving a fool-proof effect during combination.

於一實施例中,所述的平台磁吸部P2係為磁性吸附件,例如但不限為包括有鐵、鎳、鈷等成分的金屬或其合金、或具有順磁性、鐵磁性等可以被磁鐵吸附的元件,該機構磁吸部21係為分別對應吸附該平台磁吸部P2的磁鐵,其中,該機構磁吸部21(即磁鐵)的磁極係可為相同或相反,較佳為該機構磁吸部21與相鄰側的磁極相反以達到設置的平衡。於又一實施例中,所述的機構磁吸部21係為磁性吸附件,例如但不限為包括有鐵、鎳、鈷等成分的金屬或其合金、或具有順磁性、鐵磁性等可以被磁鐵吸附的元件,該平台磁吸部P2係為分別對應吸附該機構磁吸部21的磁鐵,其中,該平台磁吸部P2(即磁鐵)的磁極係可採用有規則或任意排列的方式設置,該平台磁吸部P2較佳為以N、S、N、S…依此類推的磁極排列方式環繞佈設於該平台本體40,達到設置的平衡以避免對晶圓WF進行研磨或拋光時造成該平台200震動或搖晃。本發明中並不欲限制該機構磁吸部21與該平台磁吸部P2對應吸附的數量或磁極等,在此先行敘明。In one embodiment, the magnetic attraction part P2 of the platform is a magnetic adsorption member, such as but not limited to metals or their alloys including iron, nickel, cobalt, etc., or having paramagnetic properties, ferromagnetism, etc., which can be As a component for magnet attraction, the magnetic attraction parts 21 of the mechanism are magnets corresponding to the magnetic attraction parts P2 of the platform. The magnetic poles of the magnetic attraction parts 21 (i.e., the magnets) of the mechanism can be the same or opposite, preferably as follows The magnetic pole of the mechanism magnetic attraction part 21 is opposite to that of the adjacent side to achieve the balance of the arrangement. In another embodiment, the magnetic attraction part 21 of the mechanism is a magnetic adsorption piece, such as but not limited to metals containing iron, nickel, cobalt and other components or their alloys, or having paramagnetic properties, ferromagnetic properties, etc. For the components that are attracted by magnets, the magnetic attraction portions P2 of the platform are magnets that respectively attract the magnetic attraction portions 21 of the mechanism. The magnetic poles of the magnetic attraction portions P2 (i.e., the magnets) of the platform can be arranged in a regular or arbitrary manner. Setting, the magnetic attraction part P2 of the platform is preferably arranged around the platform body 40 in a magnetic pole arrangement of N, S, N, S... and so on, so as to achieve a balanced setting to avoid grinding or polishing the wafer WF. causing the platform 200 to vibrate or shake. The present invention does not intend to limit the number or magnetic poles of the magnetic suction portion 21 of the mechanism and the magnetic suction portion P2 of the platform, which will be described in advance.

接續,請一併參閱「圖4」及「圖5」,為本發明的晶圓磁吸定位治具與晶圓的不同實施例組合示意圖,並請一併復參「圖1」及「圖2」,如圖所示;「圖1」及「圖2」中的各個晶圓磁吸定位機構之晶圓對齊槽的結構區別如前所述,故本段落中不重複描述,以下係以「圖1」及「圖2」中的其中一個晶圓磁吸定位機構說明與平台的組合關係,在此先行敘明。Continuing, please refer to "Figure 4" and "Figure 5" together, which are schematic diagrams of the combination of the wafer magnetic positioning fixture and the wafer according to different embodiments of the present invention. Please refer to "Figure 1" and "Figure 1" together. 2", as shown in the figure; the structural differences of the wafer alignment grooves of each wafer magnetic positioning mechanism in "Figure 1" and "Figure 2" are as mentioned above, so the description will not be repeated in this paragraph, and the following is One of the wafer magnetic positioning mechanisms in "Figure 1" and "Figure 2" illustrates the combination relationship with the platform, which will be described here first.

於一實施例中,如「圖4」所示,所述的晶圓磁吸定位機構100係以「圖1」中的(A)為例,該晶圓磁吸定位機構100沿水平方向D1組合於該平台200,於該機構磁吸部21對應吸附於該平台磁吸部P2時,該晶圓磁吸定位機構100的裝置定位部20底側的憑靠壁22抵靠於該平台本體40外周。In one embodiment, as shown in "Fig. 4", the wafer magnetic positioning mechanism 100 is based on (A) in "Fig. 1" as an example. The wafer magnetic positioning mechanism 100 is along the horizontal direction D1 Combined with the platform 200, when the magnetic suction part 21 of the mechanism is correspondingly attracted to the magnetic suction part P2 of the platform, the supporting wall 22 on the bottom side of the device positioning part 20 of the wafer magnetic positioning mechanism 100 abuts against the platform body. 40 periphery.

於另一實施例中,如「圖5」所示,所述的晶圓磁吸定位機構100係以「圖2」中的(A)為例,為增加該晶圓磁吸定位機構100組合且固定於該平台200的水平向穩固性,該平台本體40的底座41頂側環繞佈設有複數個位於該晶圓吸附盤42外周側的鉚柱P3(或稱螺柱,後統稱鉚柱),該晶圓磁吸定位機構100的裝置定位部20底側設置有供該鉚柱P3嵌入的限位槽23,該限位槽23於靠近該晶圓吸附盤42中心的方向上開口,以供該鉚柱P3沿水平方向D1嵌入,利用該鉚柱P3分別固定於對應的該限位槽23內以構成水平向限位,並且該晶圓磁吸定位機構100的裝置定位部20底側的憑靠壁22抵靠於該平台本體40外周。In another embodiment, as shown in "Fig. 5", the wafer magnetic positioning mechanism 100 is based on (A) in "Fig. 2" as an example. In order to increase the combination of the wafer magnetic positioning mechanism 100 And fixed to the horizontal stability of the platform 200, the top side of the base 41 of the platform body 40 is surrounded by a plurality of rivet posts P3 (or studs, hereafter collectively referred to as rivet posts) located on the outer peripheral side of the wafer adsorption plate 42. , The bottom side of the device positioning portion 20 of the wafer magnetic positioning mechanism 100 is provided with a limiting groove 23 for the rivet post P3 to be inserted. The limiting groove 23 opens in a direction close to the center of the wafer suction plate 42, so as to The rivet posts P3 are inserted along the horizontal direction D1, and the rivet posts P3 are respectively fixed in the corresponding limiting grooves 23 to form horizontal limiting, and the bottom side of the device positioning portion 20 of the wafer magnetic positioning mechanism 100 The supporting wall 22 is against the outer periphery of the platform body 40 .

接續,請一併參閱「圖7」,為本發明的晶圓磁吸定位治具與晶圓的不同實施例組合示意圖,並請一併復參「圖1」,如圖所示;「圖1」與「圖2」中的各個晶圓磁吸定位機構之晶圓對齊槽、及裝置定位部底側與平台相組合的結構區別如前所述,故本段落中不重複描述,以下係以「圖1」中的各個晶圓磁吸定位機構說明晶圓磁吸定位治具與晶圓的定位關係,在此先行敘明。Continuing, please refer to "Figure 7", which is a schematic diagram of the combination of the wafer magnetic positioning fixture and the wafer according to different embodiments of the present invention, and please refer to "Figure 1" as well, as shown in the figure; "Figure 1" and "Figure 2". The structural differences between the wafer alignment grooves of each wafer magnetic positioning mechanism and the combination of the bottom side of the device positioning part and the platform are as mentioned above, so the description will not be repeated in this paragraph. The following is The positioning relationship between the wafer magnetic positioning fixture and the wafer is explained using each wafer magnetic positioning mechanism in "Figure 1", which will be described first.

於一實施例中,如「圖7」中的(A)所示,所述的晶圓磁吸定位機構100係以「圖1」中的(A)為例,於實際應用時,先將該晶圓磁吸定位機構100組合於該平台200,於該晶圓磁吸定位機構100就定位後,再將晶圓WF放置於晶圓設置檯面P1上,並且朝晶圓對齊槽30的方向移動該晶圓WF,使該晶圓WF的側壁外緣LS(指圓周區域)憑靠於為弧形開口槽的晶圓對齊槽30,藉以完成該晶圓WF的定位。In one embodiment, as shown in (A) in "Fig. 7", the wafer magnetic positioning mechanism 100 is based on (A) in "Fig. 1" as an example. In actual application, first The wafer magnetic positioning mechanism 100 is assembled on the platform 200 . After the wafer magnetic positioning mechanism 100 is positioned, the wafer WF is placed on the wafer setting table P1 and faces the direction of the wafer alignment groove 30 The wafer WF is moved so that the outer edge LS (referring to the circumferential area) of the side wall of the wafer WF leans against the wafer alignment groove 30 which is an arc-shaped opening groove, thereby completing the positioning of the wafer WF.

於另一實施例中,如「圖7」中的(B)所示,所述的晶圓磁吸定位機構100係以「圖1」中的(B)為例,亦先將該晶圓磁吸定位機構100組合於該平台200,再將晶圓WF放置於晶圓設置檯面P1上,並且朝晶圓對齊槽30的方向移動該晶圓WF,使該晶圓WF的缺口NT對準至突出部31、且使該晶圓WF的側壁外緣LS(指圓周區域)憑靠於為弧形開口槽的晶圓對齊槽30,藉以完成該晶圓WF的定位。In another embodiment, as shown in (B) in "Fig. 7", the wafer magnetic positioning mechanism 100 is based on (B) in "Fig. 1" as an example. The wafer is also first The magnetic positioning mechanism 100 is assembled on the platform 200, and then places the wafer WF on the wafer setting table P1, and moves the wafer WF in the direction of the wafer alignment groove 30 to align the notch NT of the wafer WF to the protruding portion 31, and make the sidewall outer edge LS (referring to the circumferential area) of the wafer WF lean against the wafer alignment groove 30 which is an arc-shaped opening groove, thereby completing the positioning of the wafer WF.

於又一實施例中,如「圖7」中的(C)所示,所述的晶圓磁吸定位機構100係以「圖1」中的(C)為例,亦先將該晶圓磁吸定位機構100組合於該平台200,再將晶圓WF放置於晶圓設置檯面P1上,並且朝晶圓對齊槽30的方向移動該晶圓WF,使該晶圓WF的側壁外緣LS(指平邊區域及圓周區域)憑靠於為相對兩側包括有弧形部32之梯形開口槽的晶圓對齊槽30,藉以完成該晶圓WF的定位。In another embodiment, as shown in (C) in "Figure 7", the wafer magnetic positioning mechanism 100 is based on (C) in "Figure 1" as an example. The wafer is also first The magnetic positioning mechanism 100 is assembled on the platform 200, and then places the wafer WF on the wafer setting table P1, and moves the wafer WF in the direction of the wafer alignment groove 30, so that the outer edge LS of the side wall of the wafer WF (Referring to the flat edge area and the circumferential area) The positioning of the wafer WF is completed by relying on the wafer alignment groove 30 which is a trapezoidal opening groove including arcuate portions 32 on opposite sides.

綜上所述,本發明的晶圓磁吸定位機構以及晶圓磁吸定位治具有助於快速並精準的定位晶圓,有助於提升作業的工作效率。此外,本發明的晶圓磁吸定位機構以及晶圓磁吸定位治具結構簡單、容易加工製造、且方便操作。此外,本發明之可用於自動化程度較低的設備,亦可用於自動化設備中,其應用範圍廣泛。In summary, the wafer magnetic positioning mechanism and the wafer magnetic positioning jig of the present invention help to position the wafer quickly and accurately, and help improve the work efficiency of the operation. In addition, the wafer magnetic positioning mechanism and the wafer magnetic positioning fixture of the present invention have a simple structure, are easy to process and manufacture, and are convenient to operate. In addition, the present invention can be used in equipment with a low degree of automation and can also be used in automated equipment, and its application range is wide.

以上已將本創作做一詳細說明,惟以上所述者,僅為本創作之一較佳實施例而已,當不能以此限定本創作實施之範圍,即凡依本創作申請專利範圍所作之均等變化與修飾,皆應仍屬本創作之專利涵蓋範圍內。The invention has been described in detail above. However, the above is only one of the preferred embodiments of the invention. This should not be used to limit the scope of the invention, that is, any work based on the scope of the patent application for this invention is equivalent. Changes and modifications should still fall within the scope of the patent for this creation.

100:晶圓磁吸定位機構 10:本體部 20:裝置定位部 21:機構磁吸部 22:憑靠壁 23:限位槽 30:晶圓對齊槽 31:突出部 32:弧形部 200:平台 300:晶圓磁吸定位治具 40:平台本體 41:底座 42:晶圓吸附盤 P1:晶圓設置檯面 P2:平台磁吸部 P3:鉚柱 WF:晶圓 NT:缺口 D1:水平方向 LS:側壁外緣 Z1至Z8:位置100: Wafer magnetic positioning mechanism 10: Ontology part 20:Device positioning department 21: Mechanism magnetic suction department 22: Lean against the wall 23:Limit slot 30: Wafer alignment groove 31:Protrusion 32: Arc part 200:Platform 300: Wafer magnetic positioning fixture 40:Platform ontology 41:Base 42: Wafer suction disc P1: Wafer setting table P2: Platform magnetic suction part P3: Rivet post WF: wafer NT: notch D1: horizontal direction LS: outer edge of side wall Z1 to Z8: position

圖1,(A)至(C)為本發明的晶圓磁吸定位機構第一至第三實施例的外觀示意圖。Figure 1, (A) to (C) are schematic appearance views of the first to third embodiments of the wafer magnetic positioning mechanism of the present invention.

圖2,(A)至(C)為本發明的晶圓磁吸定位機構第四至第六實施例的外觀示意圖。Figure 2, (A) to (C) are schematic appearance views of the fourth to sixth embodiments of the wafer magnetic positioning mechanism of the present invention.

圖3,(A)至(B)為本發明的晶圓對齊槽的俯視示意圖。Figure 3, (A) to (B) are schematic top views of the wafer alignment groove of the present invention.

圖4,為本發明的晶圓磁吸定位治具的組合示意圖(一)。Figure 4 is a schematic diagram (1) of the assembly of the wafer magnetic positioning fixture of the present invention.

圖5,為本發明的晶圓磁吸定位治具的組合示意圖(二)。Figure 5 is a schematic diagram (2) of the assembly of the wafer magnetic positioning fixture of the present invention.

圖6,(A)至(C)為本發明的晶圓磁吸定位治具的磁極配置示意圖。Figure 6, (A) to (C) are schematic diagrams of the magnetic pole configuration of the wafer magnetic positioning fixture of the present invention.

圖7,(A)至(C)為本發明的晶圓磁吸定位治具與晶圓的局部組合示意圖。Figure 7, (A) to (C) are partial schematic diagrams of the combination of the wafer magnetic positioning fixture and the wafer of the present invention.

100:晶圓磁吸定位機構 100: Wafer magnetic positioning mechanism

10:本體部 10: Ontology part

20:裝置定位部 20:Device positioning department

21:機構磁吸部 21: Mechanism magnetic suction department

22:憑靠壁 22: Lean against the wall

30:晶圓對齊槽 30: Wafer alignment groove

200:平台 200:Platform

300:晶圓磁吸定位治具 300: Wafer magnetic positioning fixture

40:平台本體 40:Platform ontology

41:底座 41:Base

42:晶圓吸附盤 42: Wafer suction disc

P1:晶圓設置檯面 P1: Wafer setting table

P2:平台磁吸部 P2: Platform magnetic suction part

P3:鉚柱 P3: Rivet post

D1:水平方向 D1: horizontal direction

Claims (14)

一種晶圓磁吸定位機構,包括: 一本體部; 一裝置定位部,結合於該本體部的底側,該裝置定位部上係設置有一機構磁吸部;以及 一晶圓對齊槽,係為由該本體部沿水平方向上延伸形成的開口槽,該晶圓對齊槽的形狀與一晶圓的其中一側壁外緣的形狀相符合以供該晶圓的該其中一側壁外緣憑靠對齊藉以定位該晶圓。 A wafer magnetic positioning mechanism, including: One body part; A device positioning part is combined with the bottom side of the body part, and a mechanism magnetic part is provided on the device positioning part; and A wafer alignment groove is an open groove formed by extending in the horizontal direction from the body part. The shape of the wafer alignment groove is consistent with the shape of the outer edge of one side wall of a wafer to provide the wafer with The outer edge of one side wall is aligned to position the wafer. 如請求項1所述的晶圓磁吸定位機構,其中,該機構磁吸部係為磁鐵、或磁性吸附件。The wafer magnetic positioning mechanism according to claim 1, wherein the magnetic part of the mechanism is a magnet or a magnetic adsorption piece. 如請求項1所述的晶圓磁吸定位機構,其中,該晶圓對齊槽係為一弧形開口槽,該其中一側壁外緣係為該晶圓的圓周區域且該弧形開口槽與該圓周區域的曲率相符以供該側壁外緣憑靠。The wafer magnetic positioning mechanism according to claim 1, wherein the wafer alignment groove is an arc-shaped opening groove, the outer edge of one of the side walls is the circumferential area of the wafer, and the arc-shaped opening groove is in line with the circumferential area of the wafer. The curvature of the circumferential area is consistent with that of the outer edge of the side wall. 如請求項3所述的晶圓磁吸定位機構,其中,該弧形開口槽上更進一步包括一突出部,該突出部與該晶圓的缺口形狀相符以供該側壁外緣上的該缺口憑靠。The wafer magnetic positioning mechanism as claimed in claim 3, wherein the arc-shaped opening groove further includes a protrusion that matches the shape of the notch of the wafer to accommodate the notch on the outer edge of the side wall. Rely on. 如請求項1所述的晶圓磁吸定位機構,其中,該晶圓對齊槽係為一梯型開口槽,該其中一側壁外緣係為該晶圓的平邊區域且該梯型開口槽與該平邊區域的形狀相符以供該側壁外緣憑靠。The wafer magnetic positioning mechanism according to claim 1, wherein the wafer alignment groove is a trapezoidal opening groove, the outer edge of one side wall is the flat edge area of the wafer, and the trapezoidal opening groove It conforms to the shape of the flat area for the outer edge of the side wall to rest against. 如請求項5所述的晶圓磁吸定位機構,其中,該其中一側壁外緣更進一步包括位於該晶圓的平邊區域相對兩側的圓周區域,該梯型開口槽相對兩側更進一步包括一與該圓周區域曲率相符的弧形部以供該晶圓的圓周區域憑靠。The wafer magnetic positioning mechanism according to claim 5, wherein the outer edge of one of the side walls further includes circumferential areas located on opposite sides of the flat edge area of the wafer, and the trapezoidal opening groove further includes two opposite sides of the flat edge area of the wafer. An arc-shaped portion conforming to the curvature of the circumferential area is included for the circumferential area of the wafer to lean against. 如請求項1所述的晶圓磁吸定位機構,其中,該晶圓磁吸定位機構的材料係為金屬、金屬合金、陶瓷、碳化矽、金屬氮化物、金屬氧化物、橡膠、塑膠、玻纖複合材、碳纖複合材、有機纖維複合材或上述材料之組合。The wafer magnetic positioning mechanism as described in claim 1, wherein the material of the wafer magnetic positioning mechanism is metal, metal alloy, ceramic, silicon carbide, metal nitride, metal oxide, rubber, plastic, glass Fiber composite materials, carbon fiber composite materials, organic fiber composite materials or a combination of the above materials. 一種晶圓磁吸定位治具,包括: 一如請求項1至7中任一項所述的晶圓磁吸定位機構;以及 一平台,包括平台本體、於該平台本體頂側的晶圓設置檯面、以及設置於該平台本體一側對應該機構磁吸部的平台磁吸部,通過該平台磁吸部與該機構磁吸部對應以將該晶圓磁吸定位機構固定於該平台本體上,該晶圓磁吸定位機構固定於該平台上時該晶圓對齊槽的底側抵靠於該平台本體頂側的該晶圓設置檯面上,以使該晶圓對齊槽於水平方向上供該晶圓的該其中一側壁外緣憑靠。 A wafer magnetic positioning fixture, including: The wafer magnetic positioning mechanism as described in any one of claims 1 to 7; and A platform, including a platform body, a wafer setting table on the top side of the platform body, and a platform magnetic part provided on one side of the platform body corresponding to the magnetic part of the mechanism, through which the platform magnetic part is magnetically attracted to the mechanism Correspondingly, the wafer magnetic positioning mechanism is fixed on the platform body. When the wafer magnetic positioning mechanism is fixed on the platform, the bottom side of the wafer alignment groove is against the wafer on the top side of the platform body. The circle is arranged on the table, so that the wafer alignment groove is supported by the outer edge of one of the side walls of the wafer in the horizontal direction. 如請求項8所述的晶圓磁吸定位治具,其中,該平台本體包括一底座、以及一設置於該底座上的晶圓吸附盤,該晶圓設置檯面設置於該晶圓吸附盤的頂側。The wafer magnetic positioning fixture as described in claim 8, wherein the platform body includes a base and a wafer suction disk arranged on the base, and the wafer setting table is provided on the wafer suction disk. top side. 如請求項8所述的晶圓磁吸定位治具,其中,該平台磁吸部環繞佈設於該平台本體外周,該晶圓磁吸定位機構的該機構磁吸部數量為至少二個,各該機構磁吸部分別吸附該平台磁吸部使得該晶圓磁吸定位機構固定於該平台上。The wafer magnetic positioning fixture as claimed in claim 8, wherein the platform magnetic part is arranged around the periphery of the platform body, and the number of the mechanism magnetic parts of the wafer magnetic positioning mechanism is at least two, each of which is The magnetic attraction part of the mechanism respectively attracts the magnetic attraction part of the platform so that the wafer magnetic attraction positioning mechanism is fixed on the platform. 如請求項10所述的晶圓磁吸定位治具,其中,該平台磁吸部係為與相鄰二側具有相反磁極的第一磁鐵,該機構磁吸部係為分別對應吸附相鄰設置之該第一磁鐵的第二磁鐵或磁性吸附件。The wafer magnetic positioning fixture according to claim 10, wherein the magnetic attraction part of the platform is a first magnet with opposite magnetic poles to the adjacent two sides, and the magnetic attraction part of the mechanism is for adsorbing adjacent ones respectively. The second magnet or magnetic adsorption member of the first magnet. 如請求項10所述的的晶圓磁吸定位治具,其中,該平台本體環繞佈設的各該平台磁吸部相鄰兩側的其他二該平台磁吸部互為相反磁極。The wafer magnetic positioning fixture as claimed in claim 10, wherein the other two magnetic parts of the platform on adjacent sides of each magnetic part of the platform arranged around the platform body have opposite magnetic poles to each other. 如請求項10所述的晶圓磁吸定位治具,其中,該平台磁吸部係為磁性吸附件,該機構磁吸部係為分別對應吸附該平台磁吸部的磁鐵。The wafer magnetic positioning fixture according to claim 10, wherein the magnetic attraction part of the platform is a magnetic adsorption part, and the magnetic attraction part of the mechanism is a magnet that respectively adsorbs the magnetic attraction part of the platform. 如請求項10所述的晶圓磁吸定位治具,其中,該機構磁吸部係為磁性吸附件,該平台磁吸部係為分別對應吸附該機構磁吸部的磁鐵。The wafer magnetic positioning fixture according to claim 10, wherein the magnetic attraction part of the mechanism is a magnetic adsorption part, and the magnetic attraction part of the platform is a magnet corresponding to the magnetic attraction part of the mechanism.
TW111142588A 2022-11-08 2022-11-08 Wafer magnetic fixing mechanism and wafer magnetic fixture comprising thereof TWI829418B (en)

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Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070256632A1 (en) * 2006-04-21 2007-11-08 Xuyen Pham Systems and methods for clamping semiconductor wafers
US20210013041A1 (en) * 2019-07-11 2021-01-14 United Semiconductor (Xiamen) Co., Ltd. Method for depositing a metal layer on a wafer

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070256632A1 (en) * 2006-04-21 2007-11-08 Xuyen Pham Systems and methods for clamping semiconductor wafers
US20210013041A1 (en) * 2019-07-11 2021-01-14 United Semiconductor (Xiamen) Co., Ltd. Method for depositing a metal layer on a wafer

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