TWI817359B - Linear image sensor and image sensing method - Google Patents
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本發明是有關於一種感測技術,且特別是有關於一種線性影像感測器以及影像感測方法。The present invention relates to a sensing technology, and in particular, to a linear image sensor and an image sensing method.
傳統的線性影像感測器內的多個感測晶片是各自透過多個走線來分別耦接控制晶片,並且控制晶片需透過大量接腳來耦接這些走線。控制晶片需產生多個控制指令來分別控制這些感測晶片。因此,傳統的線性影像感測器具有內部走線過多而佔有大量設備空間,而導致傳統的線性影像感測器的體積無法精簡,並且還具有控制設定複雜的問題。Multiple sensing chips in a traditional linear image sensor are respectively coupled to the control chip through multiple traces, and the control chip needs to couple to these traces through a large number of pins. The control chip needs to generate multiple control instructions to control these sensing chips respectively. Therefore, traditional linear image sensors have too many internal wirings and occupy a large amount of equipment space. As a result, the size of traditional linear image sensors cannot be reduced, and the control settings are also complicated.
本發明提供一種線性影像感測器以及影像感測方法,可有效減少線性影像感測器內的走線數量與所佔有的空間。The present invention provides a linear image sensor and an image sensing method, which can effectively reduce the number of wires and the space occupied in the linear image sensor.
本發明的線性影像感測器包括主控制晶片以及多個感測晶片。主控制晶片耦接一個晶片選擇走線的一端以及一個資料輸出致能走線的一端。多個感測晶片包括多個串列週邊介面、多個資料輸出接腳以及多個資料輸出致能接腳。多個串列週邊介面的多個晶片選擇接腳耦接一個晶片選擇走線的另一端,以接收由主控制晶片輸出的晶片選擇信號。多個串列週邊介面的多個資料輸出致能接腳耦接一個資料輸出致能走線的另一端,以接收由主控制晶片輸出的致能信號。當晶片選擇信號以及致能信號分別為第一電壓準位時,多個感測晶片操作為接收命令模式,以依序且分時接收多個控制指令。當晶片選擇信號為第二電壓準位,並且該致能信號為第一電壓準位時,多個感測晶片操作為執行命令模式。當晶片選擇信號為第一電壓準位,並且致能信號為第二電壓準位時,多個感測晶片操作為輸出資料模式,以依序且分時輸出多個感測信號至該主控制晶片,以使主控制晶片根據多個感測信號產生感測影像。The linear image sensor of the present invention includes a main control chip and a plurality of sensing chips. The main control chip is coupled to one end of a chip selection trace and one end of a data output enable trace. The plurality of sensing chips include a plurality of serial peripheral interfaces, a plurality of data output pins and a plurality of data output enable pins. A plurality of chip select pins of a plurality of serial peripheral interfaces are coupled to the other end of a chip select trace to receive a chip select signal output by the main control chip. A plurality of data output enable pins of a plurality of serial peripheral interfaces are coupled to the other end of a data output enable trace to receive an enable signal output by the main control chip. When the chip selection signal and the enable signal are respectively at the first voltage level, the plurality of sensing chips operate in a command receiving mode to receive a plurality of control instructions sequentially and in a time-sharing manner. When the chip selection signal is at the second voltage level and the enable signal is at the first voltage level, the plurality of sensing chips operate in the execution command mode. When the chip selection signal is at the first voltage level and the enable signal is at the second voltage level, the plurality of sensing chips operate in the output data mode to output multiple sensing signals to the main control in sequence and time division. chip, so that the main control chip generates a sensing image based on multiple sensing signals.
本發明的影像感測方法適於線性影像感測器。線性影像感測器的主控制晶片耦接一個晶片選擇走線的一端以及一個資料輸出致能走線的一端。線性影像感測器的多個感測晶片包括多個串列週邊介面、多個資料輸出接腳以及多個資料輸出致能接腳。多個串列週邊介面的多個晶片選擇接腳耦接一個晶片選擇走線的另一端,以接收由主控制晶片輸出的晶片選擇信號。多個串列週邊介面的多個資料輸出致能接腳耦接一個資料輸出致能走線的另一端,以接收由主控制晶片輸出的致能信號。影像感測方法包括以下步驟:當晶片選擇信號以及致能信號分別為第一電壓準位時,藉由多個感測晶片操作為接收命令模式,以依序且分時接收多個控制指令;當晶片選擇信號為第二電壓準位,並且致能信號為第一電壓準位時,藉由多個感測晶片操作為執行命令模式;以及當晶片選擇信號為第一電壓準位,並且致能信號為第二電壓準位時,藉由多個感測晶片操作為輸出資料模式,以依序且分時輸出多個感測信號至主控制晶片,以使主控制晶片根據多個感測信號產生感測影像。The image sensing method of the present invention is suitable for linear image sensors. The main control chip of the linear image sensor is coupled to one end of a chip selection trace and one end of a data output enable trace. The multiple sensing chips of the linear image sensor include multiple serial peripheral interfaces, multiple data output pins, and multiple data output enable pins. A plurality of chip select pins of a plurality of serial peripheral interfaces are coupled to the other end of a chip select trace to receive a chip select signal output by the main control chip. A plurality of data output enable pins of a plurality of serial peripheral interfaces are coupled to the other end of a data output enable trace to receive an enable signal output by the main control chip. The image sensing method includes the following steps: when the chip selection signal and the enable signal are respectively at the first voltage level, multiple sensing chips are operated in a command receiving mode to receive multiple control commands sequentially and in a time-sharing manner; When the chip selection signal is at the second voltage level and the enable signal is at the first voltage level, the plurality of sensing chips are operated in the execution command mode; and when the chip selection signal is at the first voltage level and the When the energy signal is at the second voltage level, the multiple sensing chips are operated in the output data mode to sequentially and time-shared output of multiple sensing signals to the main control chip, so that the main control chip responds to the multiple sensing The signal produces a sensed image.
基於上述,本發明的線性影像感測器以及影像感測方法,可有效減少線性影像感測器中的晶片選擇走線的數量,並且可有效率地操作線性影像感測器中的多個感測晶片。Based on the above, the linear image sensor and the image sensing method of the present invention can effectively reduce the number of chip selection traces in the linear image sensor, and can efficiently operate multiple sensors in the linear image sensor. Test chip.
為讓本發明的上述特徵和優點能更明顯易懂,下文特舉實施例,並配合所附圖式作詳細說明如下。In order to make the above-mentioned features and advantages of the present invention more obvious and easy to understand, embodiments are given below and described in detail with reference to the accompanying drawings.
為了使本發明之內容可以被更容易明瞭,以下特舉實施例做為本揭示確實能夠據以實施的範例。另外,凡可能之處,在圖式及實施方式中使用相同標號的元件/構件/步驟,係代表相同或類似部件。In order to make the content of the present invention easier to understand, the following embodiments are provided as examples according to which the present disclosure can be implemented. In addition, wherever possible, elements/components/steps with the same reference numbers in the drawings and embodiments represent the same or similar parts.
圖1是本發明的一實施例的線性影像感測器的電路示意圖。參考圖1,線性影像感測器100包括主控制晶片110以及多個感測晶片120_1~120_N,其中N為正整數。在本實施例中,主控制晶片110耦接一個晶片選擇(Chip Select Bar,CSB)走線101的一端。感測晶片120_1~120_N分別包括串列週邊介面(Serial Peripheral Interface,SPI)以及多個資料輸出接腳。感測晶片120_1~120_N的多個串列週邊介面的多個晶片選擇接腳(CSB pin)耦接此一個晶片選擇走線101的另一端。對此,主控制晶片110可只需透過一條晶片選擇走線來耦接至感測晶片120_1~120_N的每一個的一個晶片選擇接腳。在本實施例中,感測晶片120_1~120_N可沿著一方向排列設置,以實現線性的影像感測功能。在一實施例中,感測晶片120_1~120_N的數量可為17個。FIG. 1 is a schematic circuit diagram of a linear image sensor according to an embodiment of the present invention. Referring to FIG. 1 , the linear image sensor 100 includes a main control chip 110 and a plurality of sensing chips 120_1 to 120_N, where N is a positive integer. In this embodiment, the main control chip 110 is coupled to one end of a chip select bar (CSB) trace 101 . The sensing chips 120_1~120_N respectively include a serial peripheral interface (Serial Peripheral Interface, SPI) and a plurality of data output pins. A plurality of chip selection pins (CSB pins) of a plurality of serial peripheral interfaces of the sensing chips 120_1~120_N are coupled to the other end of the chip selection trace 101. In this regard, the main control chip 110 may only be coupled to one chip select pin of each of the sensing chips 120_1~120_N through one chip select trace. In this embodiment, the sensing chips 120_1 ~ 120_N can be arranged along one direction to achieve a linear image sensing function. In one embodiment, the number of sensing chips 120_1~120_N may be 17.
在本實施例中,主控制晶片110還耦接多個資料傳輸走線102的一端。感測晶片120_1~120_N還包括多個資料傳輸接腳(data output pin),並且此多個資料傳輸接腳耦接多個資料傳輸走線102的另一端。多個資料傳輸走線102的數量可例如是8條。並且,感測晶片120_1~120_N各別的多個資料傳輸接腳的數量等於多個資料傳輸走線的數量。對此,感測晶片120_1~120_N的每一個可例如包括8個資料傳輸接腳。In this embodiment, the main control chip 110 is also coupled to one end of a plurality of data transmission lines 102 . The sensing chips 120_1 ~ 120_N also include a plurality of data output pins, and the plurality of data output pins are coupled to the other ends of the plurality of data transmission traces 102 . The number of the plurality of data transmission lines 102 may be, for example, eight. Moreover, the number of data transmission pins of the sensing chips 120_1~120_N is equal to the number of data transmission lines. In this regard, each of the sensing chips 120_1~120_N may include, for example, 8 data transmission pins.
在本實施例中,主控制晶片110還耦接一個資料輸出致能走線103的一端。感測晶片120_1~120_N還包括多個資料輸出致能接腳(data output enable pin)。一個感測晶片具有一個資料輸出致能接腳。此多個資料輸出致能接腳耦接此一個資料輸出致能走線103的另一端。對此,主控制晶片110是透過一條走線來耦接至感測晶片120_1~120_N的每一個的一個資料輸出致能接腳。In this embodiment, the main control chip 110 is also coupled to one end of a data output enabling trace 103 . The sensing chips 120_1~120_N also include a plurality of data output enable pins (data output enable pins). A sensing chip has a data output enable pin. The plurality of data output enable pins are coupled to the other end of the one data output enable trace 103 . In this regard, the main control chip 110 is coupled to a data output enable pin of each of the sensing chips 120_1~120_N through a trace.
在本實施例中,感測晶片120_1~120_N可同時進行曝光操作。感測晶片120_1~120_N可分別經配置以具有不同的多個晶片編號,並且感測晶片120_1~120_N可分別根據不同的晶片編號來依序且分時輸出感測信號至主控制晶片110。因此,本實施例的線性影像感測器100只需透過一條晶片選擇走線101即可輸出感測晶片120_1~120_N分別的感測信號,而可有效降低線性影像感測器100的走線數量及其走線所占的體積。In this embodiment, the sensing wafers 120_1 ~ 120_N can be exposed at the same time. The sensing chips 120_1 ~ 120_N can be configured to have different chip numbers respectively, and the sensing chips 120_1 ~ 120_N can respectively output sensing signals to the main control chip 110 sequentially and time-sharing according to different chip numbers. Therefore, the linear image sensor 100 of this embodiment can output the respective sensing signals of the sensing chips 120_1~120_N through only one chip selection trace 101, which can effectively reduce the number of traces of the linear image sensor 100. and the volume occupied by its wiring.
另外,感測晶片120_1~120_N還可具有其他功能接腳,但本發明並不加以限制。In addition, the sensing chips 120_1~120_N may also have other functional pins, but the invention is not limited thereto.
圖2是本發明的一實施例的感測晶片的示意圖。參考圖2,圖1實施例的感測晶片120_1~120_N的每一個可實現如圖2所示的感測晶片120的架構。在本實施例中,感測晶片120包括一個晶片選擇接腳121、多個資料傳輸接腳122、一個資料輸出致能接腳123、一個或多個晶片編號接腳124以及多個感測單元125_1~125_M,其中M為正整數。在本實施例中,感測晶片120的晶片選擇接腳121可耦接至如圖1所示的晶片選擇走線101的另一端。感測晶片120的多個資料傳輸接腳122可耦接至如圖1所示的多個資料傳輸走線102的另一端。感測晶片120的資料輸出致能接腳123可耦接至如圖1所示的一個資料輸出致能走線103的另一端。FIG. 2 is a schematic diagram of a sensing chip according to an embodiment of the present invention. Referring to FIG. 2 , each of the sensing chips 120_1 ~ 120_N in the embodiment of FIG. 1 can implement the architecture of the sensing chip 120 shown in FIG. 2 . In this embodiment, the sensing chip 120 includes a chip selection pin 121, a plurality of data transmission pins 122, a data output enable pin 123, one or more chip number pins 124 and a plurality of sensing units. 125_1~125_M, where M is a positive integer. In this embodiment, the chip selection pin 121 of the sensing chip 120 may be coupled to the other end of the chip selection trace 101 as shown in FIG. 1 . The plurality of data transmission pins 122 of the sensing chip 120 may be coupled to the other ends of the plurality of data transmission traces 102 as shown in FIG. 1 . The data output enable pin 123 of the sensing chip 120 can be coupled to the other end of a data output enable trace 103 as shown in FIG. 1 .
在一實施例中,感測晶片120可包括多個晶片編號接腳124。感測晶片120可藉由多個晶片編號接腳124接收不同的數位信號,以決定不同的晶片編號。舉例而言,感測晶片120可具有四個晶片編號接腳,並且可分別接收例如具有代表數值“1”的高電壓準位或具有代表數值“0”的低電壓準位的數位信號(例如根據對應於四個接腳所接收到數位信號的依序排列的數值“1011”來決定對應的晶片編號)。因此,感測晶片120的內部控制電路可根據特定的晶片編號而在特定的時間(或稱特定的時隙(time slot))輸出感測單元125_1~125_M的感測信號至主控制晶片。In one embodiment, the sensing die 120 may include a plurality of die number pins 124 . The sensing chip 120 can receive different digital signals through a plurality of chip number pins 124 to determine different chip numbers. For example, the sensing chip 120 may have four chip number pins, and may respectively receive digital signals such as having a high voltage level representing the value "1" or having a low voltage level representing the value "0" (eg, The corresponding chip number is determined based on the sequentially arranged value "1011" corresponding to the digital signal received by the four pins). Therefore, the internal control circuit of the sensing chip 120 can output the sensing signals of the sensing units 125_1 to 125_M to the main control chip at a specific time (or a specific time slot) according to a specific chip number.
在另一實施例中,感測晶片120可包括一個晶片編號接腳。感測晶片120可藉由此一個晶片編號接腳接收不同的類比信號,以決定不同的晶片編號。舉例而言,感測晶片120可具有一個晶片編號接腳,並且可接收特定電壓的類比信號。因此,感測晶片120的內部控制電路可根據特定電壓來決定特定的晶片編號,而根據此特定的晶片編號在特定的時間輸出感測單元(或稱感測像素)125_1~125_M的感測信號至主控制晶片。對此,圖1的感測晶片120_1~120_N可設置在同一電路板(例如同一個印刷電路板(Printed circuit board,PCB))上。感測晶片120_1~120_N分別的一個晶片編號接腳耦接電路板上的分壓電路,並且分別接收由分壓電路所提供的不同的分壓信號。因此,感測晶片120_1~120_N可接收到分別對應於不同特定電壓的類比信號(即不同的分壓信號),以分別定義不同的晶片編號。In another embodiment, the sensing die 120 may include a die number pin. The sensing chip 120 can receive different analog signals through this chip number pin to determine different chip numbers. For example, the sensing die 120 may have a die number pin and may receive an analog signal of a specific voltage. Therefore, the internal control circuit of the sensing chip 120 can determine a specific chip number according to a specific voltage, and output the sensing signals of the sensing units (or sensing pixels) 125_1~125_M at a specific time according to the specific chip number. to the main control chip. In this regard, the sensing chips 120_1~120_N in FIG. 1 can be disposed on the same circuit board (for example, the same printed circuit board (PCB)). Each of the chip number pins of the sensing chips 120_1 ~ 120_N is coupled to the voltage dividing circuit on the circuit board, and respectively receives different voltage dividing signals provided by the voltage dividing circuit. Therefore, the sensing chips 120_1 ~ 120_N can receive analog signals corresponding to different specific voltages (ie, different divided voltage signals) to respectively define different chip numbers.
圖3是本發明的一實施例的影像感測方法的流程圖。圖4是本發明的一實施例的晶片選擇信號以及致能信號的信號變化圖。參考圖1、圖3以及圖4,線性影像感測器100可執行如以下步驟S310~S330。主控制晶片110可透過一個晶片選擇走線101輸出晶片選擇信號CSB至感測晶片120_1~120_N,並且可透過一個資料輸出致能走線103輸出致能信號DO_EN至感測晶片120_1~120_N。FIG. 3 is a flow chart of an image sensing method according to an embodiment of the present invention. FIG. 4 is a signal change diagram of the chip selection signal and the enable signal according to an embodiment of the present invention. Referring to FIG. 1 , FIG. 3 and FIG. 4 , the linear image sensor 100 may perform the following steps S310 to S330 . The main control chip 110 can output the chip selection signal CSB to the sensing chips 120_1~120_N through a chip selection trace 101, and can output the enable signal DO_EN to the sensing chips 120_1~120_N through a data output enable trace 103.
在步驟S310,當晶片選擇信號CSB以及致能信號DO_EN分別為第一電壓準位時,感測晶片120_1~120_N可自動地操作在接收命令模式,以依序且分時接收多個控制指令。如圖4所示,在時間t1至時間t2的期間,當晶片選擇信號CSB以及致能信號DO_EN分別為低電壓準位時(例如對應數值為“00”),感測晶片120_1~120_N可自動地操作在接收命令模式,以依序且分時接收多個控制指令。感測晶片120_1~120_N分別從主控制晶片110依序且分時接收多個控制指令(例如藉由感測晶片的其他接腳或是SPI介面的其他接腳接收)。In step S310, when the chip selection signal CSB and the enable signal DO_EN are respectively at the first voltage level, the sensing chips 120_1~120_N can automatically operate in the command receiving mode to receive multiple control commands sequentially and in time. As shown in Figure 4, during the period from time t1 to time t2, when the chip selection signal CSB and the enable signal DO_EN are respectively at a low voltage level (for example, the corresponding value is "00"), the sensing chips 120_1~120_N can automatically The ground operation is in the command receiving mode to receive multiple control commands sequentially and in time-sharing. The sensing chips 120_1 ~ 120_N respectively receive multiple control instructions sequentially and in a time-sharing manner from the main control chip 110 (for example, through other pins of the sensing chip or other pins of the SPI interface).
在步驟S320,當晶片選擇信號CSB為第二電壓準位,並且致能信號DO_EN為第一電壓準位時,感測晶片120_1~120_N操作為執行命令模式。在所述執行命令模式中,感測晶片120_1~120_N可進行曝光值調整操作、增益(Gain)值調整操作、偏移值調整操作、影像感測操作、進入等待模式或重置操作等,而本發明並不限於此。如圖4所示,在時間t2至時間t3的期間,當晶片選擇信號CSB為高電壓準位,並且致能信號DO_EN為低電壓準位時(例如對應數值為“10”),主控制晶片110可操作感測晶片120_1~120_N可分別根據接收到的對應的控制指令進行相關操作。另外,在前述的影像感測操作中,感測晶片120_1~120_N可同時進行曝光或分時進行曝光,而本發明並不加以限制。In step S320, when the chip selection signal CSB is at the second voltage level and the enable signal DO_EN is at the first voltage level, the sensing chips 120_1~120_N operate in the execution command mode. In the execution command mode, the sensing chips 120_1 ~ 120_N can perform exposure value adjustment operations, gain (Gain) value adjustment operations, offset value adjustment operations, image sensing operations, enter waiting mode or reset operations, etc., and The present invention is not limited to this. As shown in Figure 4, during the period from time t2 to time t3, when the chip selection signal CSB is at a high voltage level and the enable signal DO_EN is at a low voltage level (for example, the corresponding value is "10"), the main control chip The 110 operable sensing chips 120_1~120_N can respectively perform relevant operations according to the corresponding control instructions received. In addition, in the aforementioned image sensing operation, the sensing chips 120_1 ~ 120_N can be exposed at the same time or in a time-sharing manner, and the present invention is not limited thereto.
在步驟S330,當晶片選擇信號CSB為第一電壓準位,並且致能信號DO_EN為第二電壓準位時,感測晶片120_1~120_N操作為輸出資料模式,以依序且分時輸出多個感測信號至主控制晶片110。主控制晶片110藉由感測晶片120_1~120_N根據各自的晶片編號的順序而依序且分時輸出多個感測信號。如圖4所示,在時間t3至時間t4的期間,當晶片選擇信號CSB為低電壓準位,並且致能信號DO_EN為高電壓準位時(例如對應數值為“01”),感測晶片120_1~120_N依序且分時輸出多個感測信號,並且透過多個資料傳輸走線102傳送至主控制晶片110,以使主控制晶片110根據這些感測信號產生感測影像。因此,本實施例的線性影像感測器100可只需透過一條晶片選擇走線101和一條資料輸出致能走線103即可輸出感測晶片120_1~120_N分別的感測信號。In step S330, when the chip selection signal CSB is at the first voltage level and the enable signal DO_EN is at the second voltage level, the sensing chips 120_1~120_N operate in the output data mode to sequentially and time-divided output multiple Sensing signals to the main control chip 110 . The main control chip 110 uses the sensing chips 120_1 to 120_N to sequentially and time-sharing output multiple sensing signals according to the order of respective chip numbers. As shown in Figure 4, during the period from time t3 to time t4, when the chip selection signal CSB is at a low voltage level and the enable signal DO_EN is at a high voltage level (for example, the corresponding value is "01"), the sensing chip 120_1~120_N outputs a plurality of sensing signals sequentially and in a time-divided manner, and transmits them to the main control chip 110 through a plurality of data transmission lines 102, so that the main control chip 110 generates sensing images based on these sensing signals. Therefore, the linear image sensor 100 of this embodiment can output the respective sensing signals of the sensing chips 120_1~120_N through only one chip selection trace 101 and one data output enable trace 103.
值得注意的是,上述的步驟S310~S330的執行順序並不限制。步驟S310~S330僅用於表示感測晶片120_1~120_N的操作條件。線性影像感測器100可根據當前操作需求來決定執行步驟S310~S330的其中之一。圖3僅用於表示感測晶片120_1~120_N可根據當前接收到的晶片選擇信號CSB以及致能信號DO_EN分別的電壓準位,來執行相對應的模式或操作。另外,當晶片選擇信號CSB以及致能信號DO_EN分別為高電壓準位時(例如“11”),感測晶片120_1~120_N為無反應,但本發明並不限於此。It is worth noting that the execution order of the above-mentioned steps S310 to S330 is not limited. Steps S310 to S330 are only used to represent the operating conditions of the sensing chips 120_1 to 120_N. The linear image sensor 100 may decide to perform one of steps S310 to S330 according to current operating requirements. FIG. 3 is only used to show that the sensing chips 120_1 ~ 120_N can perform corresponding modes or operations according to the currently received voltage levels of the chip selection signal CSB and the enable signal DO_EN. In addition, when the chip selection signal CSB and the enable signal DO_EN are respectively at a high voltage level (for example, “11”), the sensing chips 120_1 ~ 120_N are unresponsive, but the invention is not limited thereto.
綜上所述,本發明的線性影像感測器以及影像感測方法,可只需透過一條晶片選擇走線和一條致能信號走線即可控制線性影像感測器中的多個感測晶片,以操作線性影像感測器中的多個感測晶片分時傳送多個感測信號至主控制晶片,以實現線性影像感測功能。因此,本發明的線性影像感測器以及影像感測方法,可有效降低線性影像感測器中所需設置的晶片選擇走線的走線數量及其走線所占的體積。In summary, the linear image sensor and image sensing method of the present invention can control multiple sensing chips in the linear image sensor through only one chip selection trace and one enable signal trace. , to operate multiple sensing chips in the linear image sensor to transmit multiple sensing signals to the main control chip in a time-shared manner to realize the linear image sensing function. Therefore, the linear image sensor and the image sensing method of the present invention can effectively reduce the number of chip selection traces required in the linear image sensor and the volume occupied by the traces.
雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明的精神和範圍內,當可作些許的更動與潤飾,故本發明的保護範圍當視後附的申請專利範圍所界定者為準。Although the present invention has been disclosed above through embodiments, they are not intended to limit the present invention. Anyone with ordinary knowledge in the technical field may make some modifications and modifications without departing from the spirit and scope of the present invention. Therefore, The protection scope of the present invention shall be determined by the appended patent application scope.
100:線性影像感測器 101:晶片選擇走線 102:資料傳輸走線 103:資料輸出致能走線 110:主控制晶片 120、120_1~120_N:感測晶片 121:晶片選擇接腳 122:資料傳輸接腳 123:資料輸出致能接腳 124:晶片編號接腳 125_1~125_M:感測單元 CSB:晶片選擇信號 DO_EN:致能信號 t1、t2、t3、t4:時間 S310~S330:步驟 100: Linear image sensor 101: Chip selection routing 102: Data transmission wiring 103: Data output enable wiring 110: Main control chip 120, 120_1~120_N: sensing chip 121: Chip selection pin 122: Data transmission pin 123: Data output enable pin 124: Chip number pin 125_1~125_M: Sensing unit CSB: chip select signal DO_EN: enable signal t1, t2, t3, t4: time S310~S330: steps
圖1是本發明的一實施例的線性影像感測器的電路示意圖。 圖2是本發明的一實施例的感測晶片的示意圖。 圖3是本發明的一實施例的影像感測方法的流程圖。 圖4是本發明的一實施例的信號以及致能信號的信號時序圖。 FIG. 1 is a schematic circuit diagram of a linear image sensor according to an embodiment of the present invention. FIG. 2 is a schematic diagram of a sensing chip according to an embodiment of the present invention. FIG. 3 is a flow chart of an image sensing method according to an embodiment of the present invention. FIG. 4 is a signal timing diagram of signals and enable signals according to an embodiment of the present invention.
100:線性影像感測器 100: Linear image sensor
101:晶片選擇走線 101: Chip selection routing
102:資料傳輸走線 102: Data transmission wiring
103:資料輸出致能走線 103: Data output enable wiring
110:主控制晶片 110: Main control chip
120_1~120_N:感測晶片 120_1~120_N: Sensing chip
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