TWI809042B - Fused spherical silica powder and its production method - Google Patents

Fused spherical silica powder and its production method Download PDF

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TWI809042B
TWI809042B TW108105071A TW108105071A TWI809042B TW I809042 B TWI809042 B TW I809042B TW 108105071 A TW108105071 A TW 108105071A TW 108105071 A TW108105071 A TW 108105071A TW I809042 B TWI809042 B TW I809042B
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silica powder
silica
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浦川孝雄
永野尊凡
柏木政斗
梶山俊重
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日商德山股份有限公司
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Abstract

[課題] 提供一種二氧化矽粉末,雖然其含有某種程度之較大粒徑的粒子用以確保流動性,然而其係將在粒子內存在的氣泡量減低至即便使用在晶圓等級‧封裝型半導體的封裝材料用填充材等的用途時亦實質上沒有問題之水準為止。 [解決手段] 提供一種熔融球狀二氧化矽粉末,其特徵在於:藉由雷射繞射而測定時,為累積體積95%粒徑(d95)在5μm~30μm的範圍之熔融球狀二氧化矽粉末,將使該熔融球狀二氧化矽粉末與環氧樹脂以質量比1:1混煉、硬化而成之硬化體的一部分進行研磨而露出的二氧化矽剖面,以1,000倍進行顯微鏡觀察時,能夠檢測出之最長徑5μm以上的氣泡之數目,係每10cm2 前述硬化體研磨面為50個以下。能夠藉由將經疏水化處理的霧狀二氧化矽作為原料,並將二氧化矽供給量、火焰溫度設為特定範圍,且使其熔融球狀化而得到的熔融二氧化矽進行分級而得到。[Problem] To provide a silicon dioxide powder that contains particles with a somewhat larger particle size to ensure fluidity, but which reduces the amount of air bubbles existing in the particles to a level that can be used even in wafer-level packaging Even when used as fillers for encapsulation materials of type semiconductors, there are substantially no problems. [Solution] Provide a fused spherical silica powder, characterized in that: when measured by laser diffraction, it is a fused spherical silica powder with a cumulative volume 95% particle size (d95) in the range of 5 μm to 30 μm. For silicon powder, a part of the hardened body obtained by kneading and hardening the molten spherical silicon dioxide powder and epoxy resin at a mass ratio of 1:1 was ground and the exposed silicon dioxide section was observed under a microscope at 1,000 magnifications , the number of detectable air bubbles with a longest diameter of 5 μm or more is 50 or less per 10 cm 2 of the hardened body grinding surface. It can be obtained by classifying fused silica obtained by using hydrophobized fumed silica as a raw material, setting the amount of silica supplied and the flame temperature within a specific range, and making it melt and spheroidize. .

Description

熔融球狀二氧化矽粉末及其製造方法Fused spherical silica powder and its production method

本發明係有關於一種新穎熔融球狀二氧化矽粉末及其製造方法。詳言之,係有關於一種能夠適合使用於半導體封裝材料的填充材等之氣泡含量較少的熔融球狀二氧化矽粉末及其製造方法。The present invention relates to a novel fused spherical silicon dioxide powder and its manufacturing method. More specifically, it relates to a fused spherical silica powder with a small bubble content that can be suitably used as a filler for semiconductor packaging materials, etc., and a method for producing the same.

二氧化矽係被使用在各式各樣的用途,就其用途之一而言,係作為半導體封裝材料的填充材使用。作為半導體封裝材料的填充材使用時,係被要求電絕緣性、以及高熱傳導性、低熱膨脹性且期望填料的高填充化用以滿足該等物性。Silica is used in a variety of applications, and one of its uses is as a filler for semiconductor packaging materials. When used as a filler for semiconductor packaging materials, electrical insulation, high thermal conductivity, and low thermal expansion are required, and high filling of fillers is desired to satisfy these physical properties.

為了得到較高的填充性,相較於粒徑單一相同之物,以具有某種程度的粒度分布者作為填充材為佳。而且粒徑較大之物,具有能夠提高填充率之傾向。In order to obtain higher filling properties, it is better to use a particle size distribution to a certain extent as a filler than a material with a single particle size. Furthermore, those with larger particle diameters tend to increase the filling rate.

又,同時被要求較高的成形性且期望經填充填料的樹脂之流動性亦即低黏性(在溫度:25℃、剪切速率(shear rate):1s-1 之黏度:1000Pa‧s以下)。為了得到如此的流動性,近年來,作為填充材使用之二氧化矽係通常使用球狀物。Also, at the same time, high formability is required and the fluidity of the filler-filled resin is desired, that is, low viscosity (at temperature: 25°C, shear rate (shear rate): 1s -1 viscosity: 1000Pa‧s or less ). In order to obtain such fluidity, in recent years, silica-based fillers generally use spherical ones.

而且,由於越來越進展之半導體的薄型化、微細化、及晶圓等級之大量個數的整批封裝化,填料的最大容許粒徑為小粒徑化且高填充變為困難之中,維持較高的填料填充率之必要性越來越提高。Moreover, due to the increasing thinning and miniaturization of semiconductors, and the bulk packaging of a large number of wafers, the maximum allowable particle size of the filler is reduced and high filling becomes difficult. The necessity to maintain a high filler filling rate is increasing.

就藉由球狀且具有適當的粒度分布而得到之填充特性而言,而且從製造成本較而言,熔融二氧化矽係相較於其它製法的二氧化矽,具有較優異之處。In terms of the filling characteristics obtained by being spherical and having an appropriate particle size distribution, and in terms of manufacturing cost, fused silica is superior to silica produced by other methods.

作為熔融二氧化矽的製造方法,已知下列方法:(1)使矽粉末邊熔融邊氧化之方法;(2)使微少的二氧化矽粉末在火焰中熔融,而且使複數個熔融粒子熔合且使其粒成長及球狀化而製造之方法;及(3)使含有矽原子之化合物在火焰中燃燒‧氧化而產生微小二氧化矽且使該微小二氧化矽直接在火焰中熔融,而且藉由熔融粒子的熔合而使其粒成長及球狀化而製造之方法等。例如在專利文獻1,係將藉由有機矽烷化合物的燃燒而得到之微小二氧化矽粒子,進一步在火焰中使粒成長且得到平均粒徑0.05~5μm的熔融球狀二氧化矽粉末。在專利文獻2,係將煙霧二氧化矽在火焰中熔融且得到大量地含有粒徑3μm以下的粒子之熔融二氧化矽。 [先前技術文獻] [專利文獻 ]As a method for producing fused silica, the following methods are known: (1) a method of oxidizing silicon powder while melting; (2) melting a small amount of silica powder in a flame, and fusing a plurality of fused particles and and (3) burning and oxidizing a compound containing silicon atoms in a flame to produce tiny silicon dioxide and directly melting the tiny silicon dioxide in a flame, and by A method of producing by fusing molten particles to grow and spheroidize them, etc. For example, in Patent Document 1, fine silica particles obtained by burning an organosilane compound are further grown in a flame to obtain fused spherical silica powder with an average particle diameter of 0.05-5 μm. In Patent Document 2, fumed silica is melted in a flame to obtain fused silica containing a large amount of particles with a particle diameter of 3 μm or less. [Prior Art Literature] [Patent Literature]

[專利文獻1] 日本特開2003-137533號公報 [專利文獻2] 日本特開2000-191316號公報[Patent Document 1] Japanese Patent Laid-Open No. 2003-137533 [Patent Document 2] Japanese Patent Laid-Open No. 2000-191316

[發明欲解決之課題][Problem to be solved by the invention]

在二氧化矽粒子內部存在氣泡時,在半導體製造步驟,將半導體封裝後,具有將封裝材料部分切斷、或磨削之步驟時,被填充在封裝材料之二氧化矽粒子係被切斷、或磨削且粒子內部的氣泡(空隙)露出。因此,在封裝材料的截面、或磨削面有產生凹部之情形。第1圖中顯示封裝體的磨削面之示意性平面圖在。二氧化矽粒子係通常為緻密粒子1且在磨削面不產生空隙,在粒子內部具有氣泡之中空粒子2時,因磨削而氣泡露出且在磨削面產生空隙3。第2圖中顯示第1圖的A-A線剖面圖。如第2圖顯示,磨削面的空隙3係成為凹部。此種凹部的產生,特別是在經由扇出型晶圓級封裝(Fan Out Wafer Level Package;FOWLP)之半導體製品的製造時成為問題。FOWLP的製造係例如能夠如以下進行。將經個別片化的複數個半導體晶片以電極面朝向上面而配置在玻璃等的基板上。其次,將半導體晶片整批封裝。隨後,將封裝材料磨削使電極露出。隨後,塗佈光阻且進行曝光、顯影,使經除去光阻的部分析出導電性金屬而形成再配線層。最後,將經封裝的複數個半導體晶片每一晶片切開而得到FOWLP型半導體製品。若封裝材料所含有的二氧化矽粒子係含有氣泡的話,將封裝材料磨削時,氣泡露出且在磨削面產生凹部。將光阻設置在該凹部時亦在光阻產生凹部,在下一個步驟,導電性金屬係在該凹部不均勻地析出。其結果,有產生因再配線層形成缺陷等而引起製品產率低落、半導體製品的長期可靠性低落等的問題之可能性。When air bubbles exist inside the silicon dioxide particles, the silicon dioxide particles filled in the packaging material will be cut off, Or grinding and air bubbles (voids) inside the particles are exposed. For this reason, recesses may be formed on the cross section or the ground surface of the encapsulating material. Figure 1 shows a schematic plan view of the ground surface of the package. Silica particles are usually dense particles 1 and do not generate voids on the grinding surface. When hollow particles 2 have air bubbles inside the particles, the air bubbles are exposed due to grinding and voids 3 are generated on the grinding surface. Fig. 2 shows a sectional view along line A-A of Fig. 1 . As shown in Fig. 2, the gap 3 on the ground surface becomes a concave portion. The occurrence of such recesses becomes a problem especially in the manufacture of semiconductor products via Fan Out Wafer Level Package (FOWLP). The production system of FOWLP can be performed as follows, for example. A plurality of semiconductor wafers that have been individually sliced are arranged on a substrate such as glass with the electrode surface facing upward. Second, package the semiconductor wafers in batches. Subsequently, the encapsulation material is ground to expose the electrodes. Subsequently, a photoresist is coated, exposed, and developed, so that the conductive metal is separated from the part where the photoresist has been removed to form a rewiring layer. Finally, each of the packaged plurality of semiconductor wafers is cut to obtain FOWLP type semiconductor products. If the silicon dioxide particles contained in the encapsulating material contain air bubbles, when the encapsulating material is ground, the air bubbles are exposed and recesses are formed on the ground surface. When the photoresist is placed in the concave portion, a concave portion is also formed in the photoresist, and in the next step, the conductive metal system is deposited unevenly in the concave portion. As a result, problems such as a reduction in product yield and a reduction in long-term reliability of semiconductor products due to defects in the formation of the rewiring layer may occur.

但是,在熔融二氧化矽的製造時係如上述,因為伴隨著微小的二氧化矽粒子之間在火焰中熔融及熔合而得到粒成長,在該熔合時氣泡亦捲入,其結果,所製造的二氧化矽亦存在具有氣泡之物的問題係無法避免的。However, as mentioned above, in the production of fused silica, particle growth is obtained by melting and fusing among fine silica particles in a flame, and air bubbles are also involved during this fusion, and as a result, the produced Silicon dioxide also has the problem of things with air bubbles, which cannot be avoided.

該氣泡的捲入,係能夠藉由改良製造時的燃燒條件等而減低。該結果,能夠將氣泡含量減少至使用先前的檢查方法無法探測之程度。但是嘗試使用在如前述之具有將封裝材料部分切斷或磨削的步驟之WLP型半導體封裝材料用填充材之用途時,仍舊是可能產生問題之水準。在製造WLP型的半導體製品製造時,磨削步驟大致是最後步驟,在該階段所產生的缺陷係直接造成成本增大。The entrainment of the air bubbles can be reduced by improving the combustion conditions during production and the like. As a result, it was possible to reduce the air bubble content to a level that was undetectable using previous inspection methods. However, it is still at a level where problems may arise when attempting to use the WLP-type semiconductor packaging material filler having a step of partially cutting or grinding the packaging material as described above. In the manufacture of WLP-type semiconductor products, the grinding step is generally the last step, and defects generated at this stage directly lead to an increase in cost.

當然,因為不存在比粒徑更大的氣泡,所以將較大粒徑的粒子從粉末完全排除時,不產生上述問題。因而,二氧化矽粒子為小粒徑時,氣泡所造成之不良影響較少。但是如前述,為了得到高填充率,以亦存在某種程度較大粒徑的粒子為佳。粒徑越大越容易含有氣泡。Of course, since there are no air bubbles larger than the particle size, the above-mentioned problem does not occur when particles with a larger particle size are completely excluded from the powder. Therefore, when the silica particles have a small particle size, there are few adverse effects caused by air bubbles. However, as mentioned above, in order to obtain a high filling rate, it is preferable that particles having a somewhat larger particle size also exist. The larger the particle size, the easier it is to contain air bubbles.

因而,本發明之目標係提供一種新穎二氧化矽粉末,雖然其含有某種程度之較大粒徑的粒子,然而其係將此種氣泡的量減低至即便使用在WLP型半導體的封裝材料用填充材等的用途時亦實質上沒有問題之水準為止。 [用以解決課題之手段]Therefore, the object of the present invention is to provide a novel silicon dioxide powder which, although it contains particles of a certain larger particle size, reduces the amount of such air bubbles to a level even when used as a packaging material for WLP type semiconductors. Even when using fillers, etc., there are substantially no problems. [Means to solve the problem]

本發明者等係鑒於上述課題而進行專心研討。而且,發現在使微小二氧化矽粉末在火焰中熔合‧球狀化而製造熔融球狀二氧化矽粉末之方法,藉由特定原料二氧化矽粉末及燃燒條件且亦限定回收的熔融二氧化矽之粒徑,能夠解決上述課題而完成了本發明。The inventors of the present invention have intensively studied in view of the above-mentioned problems. Moreover, it was found that in the method of producing fused spherical silica powder by fusing and spheroidizing fine silica powder in a flame, the recovered fused silica powder is also limited by specifying the raw material silica powder and combustion conditions The particle size can solve the above-mentioned problems and the present invention has been completed.

亦即,本發明係有關於一種熔融球狀二氧化矽粉末,其係在藉由雷射繞射進行測定時,為累積體積95%粒徑(d95)在5μm~30μm的範圍之熔融球狀二氧化矽粉末,其特徵在於: 將該熔融球狀二氧化矽粉末與環氧樹脂以質量比1:1混煉、硬化而成之硬化體的一部分進行研磨而露出的二氧化矽剖面,以1,000倍進行顯微鏡觀察時能夠檢測出之最長徑5μm以上的氣泡之數目,係每10cm2 前述硬化體研磨面為50個以下。 [發明效果 ]That is, the present invention relates to a fused spherical silica powder, which is a fused spherical shape with a cumulative volume 95% particle diameter (d95) in the range of 5 μm to 30 μm when measured by laser diffraction. The silicon dioxide powder is characterized in that: the silicon dioxide section exposed by grinding a part of the hardened body formed by kneading and hardening the molten spherical silicon dioxide powder and epoxy resin at a mass ratio of 1:1, and The number of bubbles with a longest diameter of 5 μm or more detectable under a microscope at 1,000 magnifications is 50 or less per 10 cm 2 of the polished surface of the hardened body. [Invention effect]

本發明的熔融球狀二氧化矽粉末之氣泡量為非常少。因此使用在WLP型半導體的封裝材料用填充材時,能夠達成使半導體的製品產率及長期可靠性提升之效果。The amount of bubbles in the fused spherical silica powder of the present invention is very small. Therefore, when used as a filler for packaging materials of WLP type semiconductors, the effect of improving the product yield and long-term reliability of semiconductors can be achieved.

[用以實施發明之形態][Mode for Carrying Out the Invention]

本發明的熔融球狀二氧化矽粉,係在藉由雷射繞射進行測定時,累積體積95%粒徑(d95)在5μm~30μm的範圍。d95太小時,使用作為填充材時,對樹脂組合物不容易得到較高的填充率。 另一方面,d95太大時,作為填充材使用時,有對樹脂組合物的狹窄部之滲透性較差等的問題。較佳是d95為20μm以下。The fused spherical silica powder of the present invention has a cumulative volume 95% particle size (d95) in the range of 5 μm to 30 μm when measured by laser diffraction. When the d95 is too small, it is difficult to obtain a high filling rate of the resin composition when used as a filler. On the other hand, when d95 is too large, there are problems such as poor permeability to the narrow portion of the resin composition when used as a filler. Preferably, d95 is 20 μm or less.

將粗大粒子除外之意思,係藉由雷射繞射測定時,大於100μm之粒子係以0質量%為佳,大於75μm之粒子係以0質量%為較佳,大於50μm之粒子係以0質量%為特佳。The meaning of excluding coarse particles is that when measured by laser diffraction, particles larger than 100 μm are preferably 0 mass %, particles larger than 75 μm are preferably 0 mass %, particles larger than 50 μm are 0 mass % % is the best.

藉由雷射繞射之測定,其詳細係在後述的實施例進行說明。The measurement by laser diffraction will be described in detail in Examples described later.

而且,本發明的二氧化矽粉末係在上述條件下測定時,累積體積50%粒徑(d50)係以在1~20μm的範圍為佳,以在3~15μm的範圍為較佳。就將粗大粒子排除而言,本發明的熔融球狀二氧化矽粉末係使用濕式篩測定時,106μm殘留的粒子量為0質量%,以45μm殘留的粒子量為0.1質量%以下為更佳,以0.05質量%以下為較佳,以0.01質量%以下為特佳。又,「106μm殘留」係指未通過孔眼開度106μm的網眼而殘留在網眼上之粒子的比率。Moreover, when the silica powder of the present invention is measured under the above conditions, the cumulative volume 50% particle size (d50) is preferably in the range of 1-20 μm, more preferably in the range of 3-15 μm. In terms of removing coarse particles, when the fused spherical silica powder of the present invention is measured using a wet sieve, the amount of remaining particles at 106 μm is 0% by mass, and the amount of remaining particles at 45 μm is less than 0.1% by mass. , preferably 0.05% by mass or less, particularly preferably 0.01% by mass or less. Also, "106 μm remaining" refers to the ratio of particles remaining on the mesh without passing through the mesh with a pore opening of 106 μm.

藉由具有此種粒徑及黏度分布,作為半導體封裝材料的填充材,特別是WLP型半導體的用途之液狀封裝材料的填充材使用時,能夠得到較高的流動性和對狹窄部具有良好的滲透性等。By having such a particle size and viscosity distribution, when used as a filler for semiconductor packaging materials, especially liquid packaging materials for WLP semiconductor applications, high fluidity and good resistance to narrow parts can be obtained. permeability etc.

本發明的二氧化矽粉末為球狀。因此作為各種樹脂的填充材使用時樹脂組合物具有優異的流動性。在此,所謂球狀,係意味著Wadell實用圓形度(圓相當徑/最大徑)為0.7~1.0。 在此,所謂上述圓相當徑,係定義為粒子的投影剖面積與具有相等面積之圓的直徑,所謂最長徑,係定義為粒子的投影外周上的任意2點間之最大距離。較佳Wadell實用圓形度為0.8~1.0。通常使用熔融法所製造的二氧化矽為球狀。The silica powder of the present invention is spherical. Therefore, the resin composition has excellent fluidity when used as a filler for various resins. Here, the term "spherical" means that Wadell's practical circularity (circle equivalent diameter/maximum diameter) is 0.7 to 1.0. Here, the above-mentioned circle-equivalent diameter is defined as the projected cross-sectional area of the particle and the diameter of a circle having the same area, and the longest diameter is defined as the maximum distance between any two points on the projected outer periphery of the particle. The preferred Wadell practical circularity is 0.8~1.0. Silica usually produced by fusion method is spherical.

本發明的二氧化矽粉末係實質上不含有氣泡。具體而言,係將二氧化矽粉末與環氧樹脂以質量比1:1混煉且使其硬化而成之硬化體的一部分進行研磨,而且將露出的二氧化矽剖面以1,000倍進行顯微鏡觀察時能夠檢測出之最長徑5μm以上的氣泡之數目,係每10cm2 前述硬化體研磨面為50個以下。The silica powder of the present invention does not substantially contain air bubbles. Specifically, a part of the hardened body obtained by kneading and hardening silica powder and epoxy resin at a mass ratio of 1:1 was ground, and the exposed silica section was observed under a microscope at 1,000 magnifications The number of detectable air bubbles with a longest diameter of 5 μm or more is 50 or less per 10 cm 2 of the polished surface of the hardened body.

更詳細地敘述該評價方法時,係對常溫硬化型環氧樹脂,以二氧化矽粉末成為50質量%之方式進行混合且捏合至成為均勻為止。其次,將捏合物以不捲入氣泡的方式填充至適當的模具且在常溫使其硬化。硬化用的模具係以在將硬化體研磨時能夠確保研磨面為1cm2 以上的形狀之物為佳。When this evaluation method is described in more detail, it mixed and kneaded until it became uniform with respect to the room temperature hardening type epoxy resin so that the silica powder may become 50 mass %. Next, the kneaded product is filled in an appropriate mold so as not to trap air bubbles, and is cured at normal temperature. The mold for hardening is preferably a shape that can ensure a grinding surface of 1 cm or more when the hardened body is ground.

經充分硬化的硬化體,接著係將一部分研磨用以確保觀察面。研磨條件係首先使用1~3μm左右的鑽石研磨粒進行粗研磨,接著將膠態二氧化矽作為研磨粒且將2小時左右設為目標而進行研磨表面直至表面不粗糙且產生光澤為止。The hardened body that has been fully hardened is then partially ground to ensure the viewing surface. The polishing conditions are first rough grinding with diamond abrasive grains of about 1~3μm, and then using colloidal silica as the abrasive grains and setting the target of about 2 hours to polish the surface until the surface is not rough and shiny.

以1000倍進行顯微鏡觀察所得到的研磨面。顯微鏡係光學顯微鏡、偏光顯微鏡、電子顯微鏡等的任一者均可,較佳為光學顯微鏡。在該顯微鏡觀察,係觀察研磨面之中至少1cm2 以上的面積。The obtained polished surface was observed under a microscope at 1000 magnifications. Any of an optical microscope, a polarizing microscope, and an electron microscope may be used as the microscope, and an optical microscope is preferred. In this microscope observation, it is necessary to observe an area of at least 1 cm 2 or more in the grinding surface.

藉由前述研磨,因為環氧樹脂硬化體中的二氧化矽粒子之剖面(研磨面)係成能夠觀察的狀態,所以可藉由上述顯微鏡觀察而觀察在觀察範圍中能夠確認的全部二氧化矽剖面且把握有無氣泡。而且,計算氣泡之中最長徑(對象物的周上之任意2點間的距離之中,最大長度)為5μm以上的氣泡之數目。而且,在此,一個二氧化矽粒子係具有複數個氣泡時,氣泡數係以複數值的方式計算且測定各個氣泡的最長徑。The cross section (polished surface) of the silica particles in the cured epoxy resin can be observed by the aforementioned grinding, so all the silica that can be identified in the observation range can be observed by the aforementioned microscope observation. Section and grasp whether there are bubbles. Then, the number of bubbles whose longest diameter (the distance between any two points on the circumference of the object, the maximum length) among the bubbles is 5 μm or more is counted. In addition, here, when one silica particle has a plurality of bubbles, the number of bubbles is calculated as a complex value, and the longest diameter of each bubble is measured.

從藉由此種觀察而計量之最長徑5μm以上的氣泡之數目及觀察面積,能夠算出硬化體研磨面每10cm2 為的氣泡之數目。The number of bubbles per 10 cm 2 of the polished surface of the hardened body can be calculated from the number of bubbles with a longest diameter of 5 μm or more measured by such observation and the observed area.

上述氣泡數的計量亦可藉由肉眼,但是使用數位顯微鏡且使用影像解析軟體而進行,係在時間上及勞力上均為有利的。The above-mentioned measurement of the number of bubbles can also be performed with the naked eye, but it is advantageous in terms of time and labor to perform the measurement using a digital microscope and image analysis software.

本發明的熔融球狀二氧化矽粉末之上述最長徑5μm以上的氣泡之數目,係每10cm2 硬化體研磨面,以10個以下為佳,以5個以下為較佳。又,針對最長徑小於5μm的氣泡,其數目為越少越佳。但是因為此種微小的氣泡係藉由再配線層形成時的阻劑樹脂而被埋入的傾向較強,在本申請案申請時點之半導體的配線微細化水準時,係能夠容許其存在。The number of bubbles with the longest diameter of 5 μm or more in the fused spherical silica powder of the present invention is preferably 10 or less, more preferably 5 or less, per 10 cm 2 of the grinding surface of the hardened body. Also, the number of bubbles whose longest diameter is less than 5 μm is preferably as small as possible. However, since such tiny air bubbles tend to be embedded by the resist resin at the time of rewiring layer formation, their existence can be tolerated at the level of miniaturization of semiconductor wiring at the time of filing this application.

本發明的熔融球狀二氧化矽粉末係考慮作為半導體封裝材料的填充材等使用時,不純物含量係以下的範圍為佳。亦即,Fe為10ppm以下,較佳為7ppm以下,Al為0.7ppm以下,較佳為0.6ppm以下、U及Th係各自0.1ppb以下,Na及K係各自1ppm以下,Cl為1ppm以下。When the fused spherical silica powder of the present invention is considered to be used as a filler for semiconductor packaging materials, etc., the impurity content is preferably in the following range. That is, Fe is 10 ppm or less, preferably 7 ppm or less, Al is 0.7 ppm or less, preferably 0.6 ppm or less, U and Th are each 0.1 ppb or less, Na and K are each 1 ppm or less, and Cl is 1 ppm or less.

基於同樣的理由,本發明的熔融球狀二氧化矽粉末係以不含有離子性不純物為佳。因而,熔融球狀二氧化矽粉末的水分散液,係以導電度較低且pH接近中性為佳。具體而言,使用二氧化矽粉末0.8g分散在純水80ml時之導電度為1.5μS/cm以下為佳,係以1.4μS/cm以下為較佳,以1.3μS/cm以下又更佳,pH係以5.0~7.0為佳,以5.5~7.0為較佳。For the same reason, it is preferable that the fused spherical silica powder of the present invention does not contain ionic impurities. Therefore, the aqueous dispersion of molten spherical silica powder is preferably low in electrical conductivity and close to neutral in pH. Specifically, when 0.8g of silicon dioxide powder is dispersed in 80ml of pure water, the conductivity is preferably below 1.5μS/cm, more preferably below 1.4μS/cm, and more preferably below 1.3μS/cm. The pH is preferably 5.0~7.0, more preferably 5.5~7.0.

又,藉由使用氮氣之BET1點法而得到的比表面積,係以1~5m2 /g為佳,以1.5~4m2 /g為較佳。Also, the specific surface area obtained by the BET 1-point method using nitrogen gas is preferably 1~5m 2 /g, more preferably 1.5~4m 2 /g.

本發明的熔融球狀二氧化矽粉末係以水分量較少為佳,具體而言,係以0.05質量%以下為佳,以0.02質量%以下為較佳。The fused spherical silica powder of the present invention preferably has less water content, specifically, less than 0.05% by mass, more preferably less than 0.02% by mass.

為了提高與樹脂的相溶性、反應性等之目的,本發明的熔融球狀二氧化矽粉末亦可經各種表面處理劑處理。作為表面處理劑,可舉出各種矽烷化合物和矽烷偶合劑、鈦酸鹽系偶合劑、鋁酸鹽系偶合劑、聚矽氧油等。In order to improve the compatibility and reactivity with resin, the fused spherical silica powder of the present invention can also be treated with various surface treatment agents. Examples of the surface treatment agent include various silane compounds and silane coupling agents, titanate-based coupling agents, aluminate-based coupling agents, silicone oil, and the like.

具體地例示矽烷化合物和矽烷偶合劑時,可舉出六甲基二矽氮烷、甲基三甲氧基矽烷、甲基三乙氧基矽烷、乙基三甲氧基矽烷、正丙基三甲氧基矽烷、己基三甲氧基矽烷、癸基三甲氧基矽烷、苯基三甲氧基矽烷、二甲基二乙氧基矽烷、二甲氧基二苯基矽烷、1,6-雙(三甲氧基矽烷基)己烷、三氟丙基三甲氧基矽烷、甲基三氯矽烷、二甲基二氯矽烷、三甲基氯矽烷、3-氯丙基三氯矽烷、乙烯基三甲氧基矽烷、乙烯基三乙氧基矽烷、3-(2-胺乙基胺基)丙基三甲氧基矽烷、3,(2.胺乙基胺基)丙基甲基二甲氧基矽烷、N-苯基-3-胺丙基三甲氧基矽烷、3-三乙氧基矽烷基-N-(1,3-二甲基-亞丁基)丙胺、3-環氧丙氧基丙基三甲氧基矽烷、3-環氧丙氧基丙基三乙氧基矽烷、3-環氧丙氧基丙基甲基二甲氧基矽烷、3-環氧丙氧基丙基甲基二乙氧基矽烷、2-(3,4-環氧環己基)乙基三甲氧基矽烷、對苯乙烯基三甲氧基矽烷、3-甲基丙烯醯氧基丙基甲基二甲氧基矽烷、3-甲基丙烯醯氧基丙基三甲氧基矽烷、3-甲基丙烯醯氧基丙基甲基二乙氧基矽烷、3-甲基丙烯醯氧基丙基三乙氧基矽烷、3-丙烯醯氧基丙基三甲氧基矽烷、參-(三甲氧基矽烷基丙基)異三聚氰酸酯、3-脲丙基三烷氧基矽烷、3-巰基丙基甲基二甲氧基矽烷、3-巰基丙基三甲氧基矽烷、3-異氰酸酯丙基三乙氧基矽烷等。Specific examples of silane compounds and silane coupling agents include hexamethyldisilazane, methyltrimethoxysilane, methyltriethoxysilane, ethyltrimethoxysilane, n-propyltrimethoxy Silane, hexyltrimethoxysilane, decyltrimethoxysilane, phenyltrimethoxysilane, dimethyldiethoxysilane, dimethoxydiphenylsilane, 1,6-bis(trimethoxysilane base) hexane, trifluoropropyltrimethoxysilane, methyltrichlorosilane, dimethyldichlorosilane, trimethylchlorosilane, 3-chloropropyltrichlorosilane, vinyltrimethoxysilane, ethylene Triethoxysilane, 3-(2-aminoethylamino)propyltrimethoxysilane, 3,(2.aminoethylamino)propylmethyldimethoxysilane, N-phenyl -3-aminopropyltrimethoxysilane, 3-triethoxysilyl-N-(1,3-dimethyl-butylene)propylamine, 3-glycidoxypropyltrimethoxysilane, 3-Glycidoxypropyltriethoxysilane, 3-Glycidoxypropylmethyldimethoxysilane, 3-Glycidoxypropylmethyldiethoxysilane, 2 -(3,4-Epoxycyclohexyl)ethyltrimethoxysilane, p-Styryltrimethoxysilane, 3-methacryloxypropylmethyldimethoxysilane, 3-methylpropene Acyloxypropyltrimethoxysilane, 3-methacryloxypropylmethyldiethoxysilane, 3-methacryloxypropyltriethoxysilane, 3-acryloxy Propyltrimethoxysilane, ginseng-(trimethoxysilylpropyl)isocyanurate, 3-ureapropyltrialkoxysilane, 3-mercaptopropylmethyldimethoxysilane, 3 -Mercaptopropyltrimethoxysilane, 3-isocyanatopropyltriethoxysilane, etc.

本發明的熔融球狀二氧化矽粉末之製造方法係沒有限定,能夠使用以下的方法而適當地製造。亦即,將經疏水化處理的霧狀二氧化矽使用多層管燃燒器,以前述霧狀二氧化矽的比率成為0.3kg/Nm3 ~3kg/Nm3 之方式,伴隨氧氣或/含氧氣體而從前述多層管燃燒器之中心管供給且在火焰內於1400℃~1700℃使其熔融、球狀化之後,將0.01μm~100μm的熔融二氧化矽回收之方法。The manufacturing method of the fused spherical silica powder of this invention is not limited, It can manufacture suitably using the following method. That is, the hydrophobized silica fume is used in a multi-layer tube burner, and oxygen or/oxygen-containing gas is accompanied by such that the ratio of the fume silica is 0.3kg/Nm 3 ~3kg/Nm 3 A method of recovering fused silica of 0.01 μm to 100 μm after being supplied from the central tube of the aforementioned multilayer tube burner and melted and spheroidized in a flame at 1400°C to 1700°C.

使用作為原料之霧狀二氧化矽(亦被稱為Pyrogenic sillca等),係使用經疏水化處理之物。在本發明者已研討之限度,使用親水性霧狀二氧化矽而得到本發明的熔融球狀二氧化矽粉末為困難的。疏水化程度,係霧狀二氧化矽完全不分散在純水之程度即可,較佳是使用甲醇滴定法之疏水化度(M值)為25體積%以上,較佳為30體積%以上。又,雖然使用Si粉、石英粉等作為原料亦能夠得到熔融球狀二氧化矽,但是使用該等作為原料時,所得到的熔融球狀二氧化矽中之不純物含量係有增大之傾向。The fumed silica (also known as pyrogenic sillca, etc.) is used as a raw material, and it is hydrophobized. To the extent that the present inventors have studied, it is difficult to obtain the fused spherical silica powder of the present invention using hydrophilic fumed silica. The degree of hydrophobization should be such that the fume silica does not disperse in pure water at all, and the degree of hydrophobization (M value) using the methanol titration method is preferably at least 25% by volume, more preferably at least 30% by volume. Also, although Si powder, quartz powder, etc. can be used as raw materials to obtain fused spherical silica, when these are used as raw materials, the content of impurities in the obtained fused spherical silica tends to increase.

作為疏水化的方法,係藉由前述的矽烷類(具體而言,係以六甲基二矽氮烷、甲基三氯矽烷、二甲基二氯矽烷、三甲基氯矽烷等為佳),將霧狀二氧化矽進行表面處理之方法為佳。As a method of hydrophobization, the above-mentioned silanes (specifically, hexamethyldisilazane, methyltrichlorosilane, dimethyldichlorosilane, trimethylchlorosilane, etc. are preferred) , the method of surface treatment of fumed silicon dioxide is preferred.

作為原料使用之二氧化矽的粒子性狀係沒有特別限定,藉由氮吸附之BET1點法的比表面積係較佳為80~250m2 /g,更佳為100~230m2 /g。又,為了減少熔融球狀二氧化矽粉末的金屬不純物量,原料二氧化矽的不純物量係以較少為佳,具體而言,Fe、Al、U、Th、Na、K含量係與在前述熔融球狀二氧化矽粉末之金屬不純物量相同程度以下為佳。The particle properties of silicon dioxide used as a raw material are not particularly limited, but the specific surface area by the BET 1-point method of nitrogen adsorption is preferably 80-250 m 2 /g, more preferably 100-230 m 2 /g. Also, in order to reduce the amount of metal impurities in the molten spherical silica powder, it is better to have less impurity in the raw material silicon dioxide. Specifically, the contents of Fe, Al, U, Th, Na, and K are the same as those in the aforementioned The amount of metal impurities in the fused spherical silica powder is preferably equal to or less.

在本發明的熔融球狀二氧化矽粉末之製造方法,係使上述經疏水化的原料霧狀二氧化矽在火焰中熔融且藉由熔融粒子的熔合而進行粒成長及球狀化。In the production method of the fused spherical silica powder of the present invention, the above-mentioned hydrophobized raw material fumed silica is melted in a flame, and the fused particles are fused to perform grain growth and spheroidization.

在火焰中熔融等之時點,係使用多層管燃燒器且以原料霧狀二氧化矽的比率成為0.3kg/Nm3 ~3kg/Nm3 之方式,伴隨氧氣或/含氧氣體而從多層管燃燒器之中心管供給而進行。多層管燃燒器係能夠使用二層管燃燒器、三層管燃燒器等。At the time of melting in the flame, etc., use a multi-layer tube burner and burn from the multi-layer tube with oxygen or/oxygen-containing gas in such a manner that the ratio of the raw material fume silica is 0.3kg/Nm 3 ~3kg/Nm 3 It is carried out by supplying the central tube of the device. As the multi-layer tube burner system, a two-layer tube burner, a three-layer tube burner, and the like can be used.

被供給至火焰中的原料霧狀二氧化矽之比率太少時,所得到的熔融球狀二氧化矽粉末中之1μm以下的粒子比例變成太多,且容易成為不適合高填充的黏度分布之粉體。又,被供給至火焰中的原料霧狀二氧化矽太多時,容易成為含有未熔融霧狀二氧化矽粒子、熔融不充分且球形度較低的粒子等之粉體。該原料霧狀二氧化矽的比率係較佳為0.5kg/Nm3 ~2.0kg/Nm3 。又,作為伴隨其之含氧氣體,係以空氣為佳。When the proportion of the raw material fumed silica supplied to the flame is too small, the proportion of particles below 1 μm in the obtained molten spherical silica powder becomes too large, and it tends to become a powder with a viscosity distribution that is not suitable for high filling body. Also, when the raw material fumed silica supplied to the flame is too much, it is likely to become a powder containing unmelted fumed silica particles, insufficiently melted particles with low sphericity, and the like. The ratio of the raw material fumed silica is preferably 0.5kg/Nm 3 -2.0kg/Nm 3 . Also, air is preferably used as the accompanying oxygen-containing gas.

多層管燃燒器係使用例如三層管燃燒器時,以從2環狀管供給氧氣且從最外周管供給氫氣為佳。When a multi-layer tube burner is used, for example, a three-layer tube burner, it is preferable to supply oxygen from two annular tubes and supply hydrogen from the outermost peripheral tube.

火焰溫度係設為1400℃~1700℃,較佳為1500℃~1600℃。小於1400℃時,係成為熔融球狀化不充分的粉體,另一方面,大於1700℃時,因為製程溫度上升,所以必須提升冷卻能力、或燃料使用量增加致使製造成本增大。又,越高溫,小粒徑粒子的比率變多之傾向亦越強。The flame temperature is set at 1400°C to 1700°C, preferably 1500°C to 1600°C. When the temperature is lower than 1400°C, it becomes a powder with insufficient fusion and spheroidization. On the other hand, when the temperature is higher than 1700°C, the cooling capacity must be increased because the process temperature rises, or the fuel consumption increases, resulting in increased manufacturing costs. Also, the higher the temperature, the stronger the tendency that the ratio of the small-diameter particles increases.

火焰溫度係能夠藉由對燃燒器供給之氧氣和氫氣、氮氣等的氣體組成、供給速度等來調整。The flame temperature can be adjusted by the gas composition, supply rate, etc. of oxygen, hydrogen, nitrogen, etc. supplied to the burner.

在本發明的熔融球狀二氧化矽粉末之製造方法,係將在火焰中產生的熔融球狀二氧化矽之中,粒徑為0.01μm~100μm的範圍之物回收。作為回收手段,係首先使用旋風器將平均粒徑0.01μm~1000μm的粒子回收,隨後,使用篩及/或風力分級機在分級點8μm~100μm進行分級而將其細粒側(分級點以下)回收之方法為效率良好且適合的。使用篩及/或風力分級機時,分級點係以設置在10μm~50μm的範圍為佳。藉由調整成為此種分級點,係容易使藉由上述方法所製成之物的細粒側的d95成為5μm~30μm的範圍。又,因為d95並不是在所有條件下均落入5μm~30μm的範圍,必須按照使用的分級機之特性而適當地設定條件。In the production method of the fused spherical silica powder of the present invention, among the fused spherical silica powder generated in the flame, those having a particle diameter in the range of 0.01 μm to 100 μm are recovered. As a recovery method, first use a cyclone to recover particles with an average particle size of 0.01 μm to 1000 μm, and then use a sieve and/or a wind classifier to classify at a classification point of 8 μm to 100 μm to separate the fine particle side (below the classification point) The method of recovery is efficient and suitable. When using a sieve and/or wind classifier, it is better to set the classification point within the range of 10μm~50μm. By adjusting to such a classification point, it becomes easy to make the d95 of the fine grain side of the thing produced by the said method into the range of 5 micrometers - 30 micrometers. Also, since d95 does not fall within the range of 5 μm to 30 μm under all conditions, the conditions must be set appropriately according to the characteristics of the classifier used.

使用篩之回收,其優點為實質上沒有將所使用篩的孔眼開度以上的粒子回收之可能性。相反地,回收時所費的工夫較大,工業上生產性係以風力分級機為較高。但是因為風力分級機亦有將大於分級點之粒子少量回收之傾向,亦具有少量含有目標上限粒徑以上的粒子之可能性。認識此種優點‧缺點,且按照目標粒徑範圍、生產性等而適當地選擇即可。又,亦可併用篩分級及風力分級機而進行分級。又,使用篩進行分級時,可為乾式分級亦可為濕式分級。The advantage of recovery using a sieve is that there is virtually no possibility of recovering particles whose openings are larger than the sieve used. On the contrary, it takes a lot of time to recycle, and the industrial productivity is higher with the wind classifier. However, because the wind classifier also tends to recover a small amount of particles larger than the classification point, it also has the possibility of containing a small amount of particles with a particle size above the target upper limit. It is sufficient to recognize such advantages and disadvantages, and select appropriately according to the target particle size range, productivity, and the like. Moreover, it is also possible to classify using a sieve classifier and an air classifier in combination. Moreover, when classification is performed using a sieve, either dry classification or wet classification may be used.

將熔融球狀二氧化矽粉末進行表面處理時,可在使用上述篩及/或風力分級機而分級之前進行,亦可在分級之後進行。Surface treatment of the fused spherical silica powder may be performed before classification using the above-mentioned sieve and/or air classifier, or after classification.

表面處理係按照所使用的矽烷化合物‧矽烷偶合劑而應用習知的方法即可,可為乾式亦可為濕式。表面處理特別是濕式表面處理時,因為粒子有產生凝聚之情形,所以可按照必要而適當地進行粉碎、或進一步進行分級。藉由使用賦予機械應力之裝置進行處理,能夠得到凝聚粉碎、調整體積密度、含氣泡粒子之粉碎效果。又,作為賦予機械應力之裝置,能夠使用自由渦流型離心分級機、強制渦流型離心分級機、球磨機、噴射研磨機、二輥磨機、三輥磨機、石臼式粉碎機、旋轉漿葉式攪拌機等。 [實施例 ]The surface treatment can be done by a known method according to the silane compound and silane coupling agent used, and it can be dry or wet. During surface treatment, especially wet surface treatment, since the particles may aggregate, it may be properly pulverized or further classified as necessary. By processing with a device that imparts mechanical stress, it is possible to obtain effects of agglomeration and crushing, adjustment of bulk density, and crushing of bubble-containing particles. Also, as a device for imparting mechanical stress, free vortex type centrifugal classifiers, forced vortex type centrifugal classifiers, ball mills, jet mills, two-roll mills, three-roll mills, stone mortar pulverizers, rotary paddle type Blender etc. [Example]

以下,揭示實施例及比較例用以更具體地說明本發明,但是本發明係不被該等實施例限定。Hereinafter, examples and comparative examples are disclosed to describe the present invention more specifically, but the present invention is not limited by these examples.

又,在實施例、比較例之熔融球狀二氧化矽製造條件、以及各種物性評價方法係如以下。In addition, the production conditions of fused spherical silica in Examples and Comparative Examples, and various physical property evaluation methods are as follows.

以下,記載製造熔融二氧化矽之製造方法。Hereinafter, a production method for producing fused silica will be described.

(1)使用在燃燒器的熔融‧球狀化 使用三層管燃燒器,將原料霧狀二氧化矽及氧氣從中心管供給,將氧氣從第2環狀管供給且將氫氣從最外周管供給。火焰溫度係藉由氫氣/氧氣比及二氧化矽量而調整。(1) Used in melting and spheroidizing of burners Using a three-layer tube burner, the raw material fumed silica and oxygen are supplied from the central tube, the oxygen is supplied from the second annular tube, and the hydrogen is supplied from the outermost peripheral tube. The flame temperature is adjusted by the hydrogen/oxygen ratio and the amount of silicon dioxide.

(2)分級 從上述所得到的熔融二氧化矽,係首先藉由旋風器而將0.1μm~1000μm的粒子回收,接著將所回收的二氧化矽使用風力分級機且在預定分級點進行分級而將細粒側回收。 (2) Grading From the fused silica obtained above, the particles of 0.1 μm to 1000 μm are first recovered by a cyclone, and then the recovered silica is classified at a predetermined classification point using a wind classifier to separate the fine particle side Recycle.

以下,揭示物性評價方法。 Hereinafter, the physical property evaluation method will be disclosed.

(1)原料霧狀二氧化矽的疏水化度(M值) (1) Hydrophobic degree (M value) of raw material fume silica

在原料霧狀二氧化矽係浮游在純水表面之狀態下,邊攪拌邊滴下甲醇。以體積%求取使二氧化矽懸浮在全量純水中之所需要的甲醇量。 In a state where the raw material fume silica is floating on the surface of pure water, methanol is dropped while stirring. Find the amount of methanol required to suspend silicon dioxide in the total amount of pure water in volume %.

(2)二氧化矽濃度 (2) Silica concentration

將被導入至熔融球狀化燃燒器的二氧化矽供給噴嘴之二氧化矽重量,除以被供給至中心管之氧氣體積而求取每單位體積的二氧化矽濃度。 The silica concentration per unit volume was obtained by dividing the weight of silica introduced into the silica supply nozzle of the melting spheroidizing burner by the volume of oxygen supplied to the central tube.

(3)火焰溫度 (3) Flame temperature

採用被導入至二氧化矽熔融球狀化燃燒器之氫氣、氧氣以及、霧狀二氧化矽的量,且使用絕熱計算火焰溫度計算式,而求取燃燒器火焰溫度。 The flame temperature of the burner is obtained by using the amount of hydrogen, oxygen, and fume silicon dioxide introduced into the silicon dioxide melting spheroidizing burner, and using the adiabatic flame temperature calculation formula.

(4)累積體積徑 (4) cumulative volume diameter

使用Microtrac製雷射繞射散射式黏度分布測定裝置(MT-3300EX2)而進行藉由水分散介質之測定,來算出累積體積50%粒徑(d50)及95%粒徑(d95)。又,在測定裝置的試料漿料循環槽,投入分散介質250mL、試料0.02g~0.1g。接著,邊使試料漿料循環邊進行40W超音波分散1分鐘之後,測定d50及d95。在此,上述試料投入量係依照裝置的使用說明書,且以在裝置控制用個人電腦畫面所顯示的試料漿料濃度值(Sample Loading值)為落入0.85~0.90之間的方式調整。 The cumulative volume 50% particle diameter (d50) and the 95% particle diameter (d95) were calculated by measuring with the aqueous dispersion medium using a laser diffraction scattering type viscosity distribution measuring device (MT-3300EX2) manufactured by Microtrac. Also, 250 mL of a dispersion medium and 0.02 g to 0.1 g of a sample were put into the sample slurry circulation tank of the measuring device. Next, after performing 40W ultrasonic dispersion for 1 minute while circulating the sample slurry, d50 and d95 were measured. Here, the above-mentioned sample input amount is adjusted in accordance with the instruction manual of the device so that the sample slurry concentration value (Sample Loading value) displayed on the screen of the personal computer for device control falls within 0.85 to 0.90.

(5)BET比表面積 (5) BET specific surface area

使用柴田理化學公司製比表面積測定裝置(SA-1000),並藉由氮吸附BET1點法而測定。 The specific surface area measuring device (SA-1000) manufactured by Shibata Rika Co., Ltd. was used to measure by the nitrogen adsorption BET 1-point method.

(6)Fe、A1濃度的測定 (6) Determination of Fe and A1 concentrations

採用氟硝酸(hydrofluoric nitric acid)將二氧化矽粒子溶液化,並藉由ICP發光光譜分析法而測定。The silicon dioxide particles were solubilized with hydrofluoric nitric acid, and measured by ICP emission spectrometry.

(7) 水分 藉由乾燥減量法(在110℃6小時)測定二氧化矽粒子中的水分。(7) Moisture Moisture in the silica particles was measured by the loss on drying method (at 110°C for 6 hours).

(8) pH、導電度的測定 製造二氧化矽粒子的水分散液(二氧化矽8.0g/純水80mL、25℃),藉由玻璃電極法pH計測定pH,並使用交流二電極法導電度計測定導電度。(8) Determination of pH and conductivity An aqueous dispersion of silica particles (8.0 g of silica/80 mL of pure water, 25° C.) was prepared, the pH was measured with a glass electrode method pH meter, and the conductivity was measured with an AC two-electrode method conductivity meter.

(9) U濃度 採用氟硝酸將二氧化矽粒子溶液化且使用ICP-MS測定。(9) U concentration The silica particles were solubilized with fluoronitric acid and measured using ICP-MS.

(10) Na+ 、Cl- 濃度 將二氧化矽粒子浸漬在110℃的純水24小時來製造溶出水溶液,使用原子吸光光度計測定Na+ 濃度,並使用離子層析法測定Cl- 濃度。(10) Na + , Cl - concentration Silica particles were immersed in pure water at 110°C for 24 hours to prepare an eluting aqueous solution, and the Na + concentration was measured using an atomic absorption photometer, and the Cl - concentration was measured using ion chromatography.

(11) 樹脂組合物黏度 將環氧樹脂(東都化成製雙酚A/F混合樹脂ZX-1059)、及各實施例、比較例的二氧化矽粒子以二氧化矽78:樹脂22(重量比)的比率調配,使用自轉公轉式行星齒輪混合機(THINKY公司製AR-250),並以攪拌時間8分鐘、轉數1000rpm進行攪拌,且進一步在脫泡時間2分鐘、轉數2000rpm的條件下進行混煉而得到環氧樹脂組合物。(11) Viscosity of resin composition Epoxy resin (bisphenol A/F mixed resin ZX-1059 manufactured by Dongdu Chemical Co., Ltd.), and the silica particles of each example and comparative example were formulated at a ratio of silica 78: resin 22 (weight ratio), and the A revolving planetary gear mixer (AR-250 manufactured by THINKY Co.) was stirred with a stirring time of 8 minutes and a rotation speed of 1000 rpm, and further kneaded under the conditions of a defoaming time of 2 minutes and a rotation speed of 2000 rpm to obtain epoxy resin composition.

接著,將環氧樹脂組合物使用流變黏度計(HAAKE製Rheostress RS600)且在溫度25℃、板間隙50μm、剪切速率1s-1 的條件下測定黏度。Next, the viscosity of the epoxy resin composition was measured on conditions of a temperature of 25° C., a plate gap of 50 μm, and a shear rate of 1 s −1 using a rheological viscometer (Rheostress RS600 manufactured by HAAKE).

(12) 氣泡含有數 相對於常溫硬化型環氧樹脂(BUEHLER公司製EpoxiCure2),將二氧化矽粉末成為50質量%的方式混合且捏合至均勻為止。其次,將捏合物以不捲入氣泡的方式填充至埋入成形模具(BUEHLER公司製塑膠環、內徑1英吋(25.4mm))且在常溫使其充分地硬化。(12) Number of bubbles contained Silica powder was mixed and kneaded until it became uniform with respect to room-temperature-curing epoxy resin (EpoxiCure 2 manufactured by BUEHLER company) so that it may become 50 mass %. Next, the kneaded product was filled into an embedding mold (plastic ring manufactured by BUEHLER, inner diameter 1 inch (25.4 mm)) so as not to entrap air bubbles, and fully hardened at room temperature.

接著,將硬化體的一部分研磨用以確保觀察面。研磨條件係首先藉由研磨粒徑3μm及1μm的研磨劑(BUEHLER公司製METADI、單結晶鑽石懸浮液、水性/研磨粒徑3μm、隨後使用1μm )進行粗研磨,接著藉由正式研磨用研磨劑(MASTERMET2 膠態二氧化矽)進行研磨至在表面產生光澤為止。Next, a part of the hardened body is ground to ensure a viewing surface. The grinding conditions are first rough grinding with abrasives with a particle size of 3 μm and 1 μm (METADI from BUEHLER, single crystal diamond suspension, water-based/abrasive particle size 3 μm, and then 1 μm) for rough grinding, and then with the abrasive for main grinding (MASTERMET2 colloidal silicon dioxide) is ground until a glossy finish is produced on the surface.

將所得到的研磨面之1cm2 的範圍使用光學顯微鏡(KEYENCE公司製MICROSCOPE VHX-5000),且藉由落射照明(epi-illumination)/同軸落射以1000倍觀察,來計算氣泡之中最長徑(對象物的周上之任意2點間的距離之中,最大長度)為5μm以上者的數目。Using an optical microscope (MICROSCOPE VHX-5000 manufactured by KEYENCE Co., Ltd.), the range of 1 cm 2 of the obtained polished surface was observed at 1000 times by epi-illumination/coaxial epi-illumination, and the longest diameter in the bubble was calculated ( Among the distances between any two points on the circumference of the object, the maximum length) is the number of 5 μm or more.

又,在此,一個二氧化矽粒子係具有複數個氣泡時,係以複數個的方式計算。使用試樣數目10個而進行該觀察,且合計所觀察到的氣泡數,來算出每10cm2 硬化體研磨面剖面積之氣泡數。Also, here, when one silica particle has plural bubbles, it is counted as plural. This observation was performed using 10 samples, and the number of observed bubbles was totaled to calculate the number of bubbles per 10 cm 2 of the cross-sectional area of the polished surface of the hardened body.

(13) Wadell實用圓形度 將二氧化矽粉末1mg左右放置在載玻片(2cm×4cm)之中央,將純水2~3滴滴下以製造二氧化矽漿料,以氣泡不進入的方式將罩蓋玻璃放置在該二氧化矽漿料上,來製造觀察用調製品。使用Leica製光學顯微鏡DMLB(穿透式光源、倍率400倍)觀察該調製品,將二氧化矽粒子的影像使用影像解析裝置(Leica製Q500IW),求取各粒子每個圓相當徑/最長徑。邊使觀察視野移動邊重複計量,直至測定粒子數成為合計500個以上為止,將其測定值的算術平均值作為該二氧化矽粉末的Wadell實用圓形度之值。(13) Wadell Practical Circularity Put about 1 mg of silica powder on the center of a glass slide (2cm×4cm), add 2~3 drops of pure water to make a silica slurry, and place a cover glass on the slide so that air bubbles do not enter. Silicon oxide slurry is used to make preparations for observation. The prepared product was observed with an optical microscope DMLB (transmissive light source, 400 times magnification) manufactured by Leica, and the image of the silica particles was obtained using an image analyzer (Q500IW manufactured by Leica) to obtain the equivalent diameter/longest diameter per circle of each particle. . The measurement was repeated while moving the observation field of view until the number of measured particles reached a total of 500 or more, and the arithmetic mean value of the measured values was taken as the value of the Wadell's practical circularity of the silica powder.

實施例1 使用M值為47、BET比表面積為120m2 /g的疏水化霧狀二氧化矽,將霧狀二氧化矽對燃燒器的供給量設為0.7kg/Nm3 而進行,且火焰溫度設為1600℃而得到熔融二氧化矽粉末。其次,將所得到的二氧化矽粉末,將分級點設為10μm而分級後,進行回收。將所得到的熔融球狀二氧化矽粉末之物性顯示在表1。Example 1 Using hydrophobic fumed silica with an M value of 47 and a BET specific surface area of 120m 2 /g, the supply of fumed silica to the burner was set to 0.7kg/Nm 3 , and the flame The temperature was set to 1600° C. to obtain fused silica powder. Next, the obtained silica powder was collected after classification with a classification point of 10 μm. Table 1 shows the physical properties of the obtained fused spherical silica powder.

使用在實施例2~5 使用表1記載的M值及BET比表面積的疏水化霧狀二氧化矽,將設為表1記載的二氧化矽供給量、火焰溫度、分級點,而與實施例1同樣地製造熔融球狀二氧化矽粉末。將所得到的熔融球狀二氧化矽粉末之物性顯示在表1。Use in embodiment 2~5 Using the hydrophobized fumed silica with the M value and BET specific surface area recorded in Table 1, the amount of silicon dioxide supplied, the flame temperature, and the classification point described in Table 1 were used, and molten spherical particles were produced in the same manner as in Example 1. Silica powder. Table 1 shows the physical properties of the obtained fused spherical silica powder.

比較例1 使用M值為47、BET比表面積為126m2 /g的疏水化霧狀二氧化矽,將霧狀二氧化矽對燃燒器的供給量設為0.3kg/Nm3 、火焰溫度1800℃、將分級點設為3μm以外,係與實施例1同樣地製造熔融二氧化矽。將所得到的熔融二氧化矽之物性顯示在表1,因為火焰溫度較高而小粒徑的粒子之比率變高,而且製造時的分級點亦太小,所以d95較小,因此樹脂組合物調製時的增黏顯著且無法形成樹脂組合物。Comparative Example 1 Use hydrophobic fumed silica with an M value of 47 and a BET specific surface area of 126m 2 /g, set the supply rate of fumed silica to the burner at 0.3kg/Nm 3 , and set the flame temperature at 1800°C , Except that the classification point was 3 μm, fused silica was produced in the same manner as in Example 1. The physical properties of the obtained fused silica are shown in Table 1. Because the flame temperature is higher, the ratio of small particle size particles becomes higher, and the classification point at the time of manufacture is too small, so the d95 is smaller, so the resin composition Thickening during preparation was remarkable, and a resin composition could not be formed.

比較例2 使用M值為47、BET比表面積為115m2 /g的疏水化霧狀二氧化矽,將霧狀二氧化矽對燃燒器的供給量設為0.7kg/Nm3 、火焰溫度1600℃、將分級點設為5μm以外,係與實施例1同樣地製造熔融二氧化矽。將所得到的熔融二氧化矽之物性顯示在表1,因為製造時的分級點太小,所以d95較小。雖然與比較例1不同而能夠形成樹脂組合物,但是顯著地成為黏度較高之物。Comparative Example 2 Use hydrophobic fumed silica with an M value of 47 and a BET specific surface area of 115m 2 /g, set the supply rate of fumed silica to the burner at 0.7kg/Nm 3 , and set the flame temperature at 1600°C , Except that the classification point was 5 μm, fused silica was produced in the same manner as in Example 1. The physical properties of the obtained fused silica are shown in Table 1. The d95 is small because the classification point at the time of manufacture is too small. Unlike Comparative Example 1, it was possible to form a resin composition, but it was remarkably high in viscosity.

但是,當比較例1、比較例2等的熔融二氧化矽,與實施例的熔融二氧化矽混合而使用時,認為能夠是樹脂組合物黏度變低且氣泡數亦較少之狀態。However, when the fused silicas of Comparative Examples 1 and 2 are mixed with the fused silicas of Examples, it is considered that the viscosity of the resin composition becomes low and the number of bubbles is also reduced.

比較例3 除了使用親水性之物(M值=0)作為原料霧狀二氧化矽以外,係與實施例1同樣地進行而製造熔融二氧化矽。此時,氣泡含有數為顯著地較多。Comparative example 3 Fused silica was produced in the same manner as in Example 1, except that a hydrophilic substance (M value=0) was used as the raw material fumed silica. At this time, the number of bubbles contained was remarkably high.

比較例4 除了使用親水性(M值=0)、BET比表面積為125m2 /g之物作為原料霧狀二氧化矽以外,係與實施例2同樣地進行而製造熔融二氧化矽。此時,氣泡含有數為顯著地較多。Comparative Example 4 Fused silica was produced in the same manner as in Example 2, except that a substance having hydrophilicity (M value=0) and a BET specific surface area of 125 m 2 /g was used as the raw material fume silica. At this time, the number of bubbles contained was remarkably high.

比較例5 將市售的熔融二氧化矽(d95為29.5μm、d50為10μm)進行評價,氣泡含有數為顯著地較多。而且,藉由與前述比較例1或2之小粒徑的熔融二氧化矽混合而使用,成為將大粒徑粒子與小粒徑粒子組合,雖然填充特性提升且樹脂組合物黏度能夠降低,但是判定無法使氣泡含有數充分地降低。Comparative Example 5 When commercially available fused silica (d95: 29.5 μm, d50: 10 μm) was evaluated, the number of bubbles contained was remarkably high. Furthermore, by mixing and using the fused silica with a small particle size in Comparative Example 1 or 2 above, the large particle size and the small particle size particle are combined, although the filling characteristics are improved and the viscosity of the resin composition can be reduced, but It was determined that the number of bubbles contained could not be sufficiently reduced.

[表1] [Table 1]

1‧‧‧緻密二氧化矽粒子 2‧‧‧中空二氧化矽粒子 3‧‧‧因磨削而露出的空隙(凹部)1‧‧‧Dense silica particles 2‧‧‧Hollow silica particles 3‧‧‧The gap (recess) exposed by grinding

第1圖係顯示封裝體的磨削面之示意性平面圖。 第2圖係顯示第1圖的A-A線剖面圖。FIG. 1 is a schematic plan view showing a ground surface of a package. Fig. 2 is a sectional view along line A-A of Fig. 1 .

Claims (11)

一種熔融球狀二氧化矽粉末,其係在藉由雷射繞射進行測定時,累積體積95%粒徑(d95)在5μm~30μm的範圍之熔融球狀二氧化矽粉末,其特徵在於:將該熔融球狀二氧化矽粉末與環氧樹脂以質量比1:1混煉、硬化而成之硬化體的一部分進行研磨而露出的二氧化矽剖面,以1,000倍進行顯微鏡觀察時能夠檢測出之最長徑5μm以上的氣泡之數目,係每10cm2前述硬化體研磨面為50個以下。 A fused spherical silica powder, which is a fused spherical silica powder whose cumulative volume 95% particle size (d95) is in the range of 5 μm to 30 μm when measured by laser diffraction, characterized in that: The silica cross section exposed by grinding a part of the hardened body obtained by kneading and hardening the molten spherical silica powder and epoxy resin at a mass ratio of 1:1 can be detected under a microscope at 1,000 magnifications. The number of bubbles with a longest diameter of 5 μm or more is 50 or less per 10 cm 2 of the polished surface of the hardened body. 如申請專利範圍第1項所述之熔融球狀二氧化矽粉末,其中,粒子表面係經矽烷化合物及/或矽烷偶合劑處理。 The fused spherical silica powder as described in item 1 of the scope of the patent application, wherein the surface of the particles is treated with a silane compound and/or a silane coupling agent. 如申請專利範圍第1項所述之熔融球狀二氧化矽粉末,其中,BET比表面積為在1.0m2/g~5.0m2/g的範圍。 The fused spherical silica powder described in item 1 of the scope of the patent application, wherein the BET specific surface area is in the range of 1.0m 2 /g~5.0m 2 /g. 如申請專利範圍第2項所述之熔融球狀二氧化矽粉末,其中,BET比表面積為在1.0m2/g~5.0m2/g的範圍。 The fused spherical silica powder as described in item 2 of the patent application, wherein the BET specific surface area is in the range of 1.0m 2 /g~5.0m 2 /g. 如申請專利範圍第1項所述之熔融球狀二氧化矽粉末,係液狀半導體封裝材料的填充材用。 The fused spherical silicon dioxide powder described in item 1 of the scope of application is used as a filling material for liquid semiconductor packaging materials. 如申請專利範圍第2項所述之熔融球狀二氧化矽粉末,係液狀半導體封裝材料的填充材用。 The fused spherical silicon dioxide powder described in item 2 of the scope of application is used as a filling material for liquid semiconductor packaging materials. 如申請專利範圍第3項所述之熔融球狀二氧化矽粉末,係液狀半導體封裝材料的填充材用。 The fused spherical silicon dioxide powder described in item 3 of the scope of the patent application is used as a filling material for liquid semiconductor packaging materials. 一種如申請專利範圍第1項所述之熔融球狀二氧化矽粉末的製造方法, 係將經疏水化處理至使用甲醇滴定法之疏水化度(M值)為25體積%以上的霧狀二氧化矽使用多層管燃燒器,以前述霧狀二氧化矽的比率成為0.3kg/Nm3~3kg/Nm3之方式,伴隨氧氣或/含氧氣體而從前述多層管燃燒器之中心管供給且在火焰內於1400℃~1700℃使其熔融、球狀化之後,將0.01μm~100μm的熔融二氧化矽回收。 A method for manufacturing the fused spherical silica powder as described in item 1 of the scope of the patent application, which is to use hydrophobization treatment until the hydrophobization degree (M value) of the methanol titration method is more than 25% by volume. Silicon oxide is supplied from the central tube of the multi-layer tube burner along with oxygen or/oxygen-containing gas in such a manner that the ratio of the aforementioned fumed silicon dioxide becomes 0.3 kg/Nm 3 ~3 kg/Nm 3 using a multi-layer tube burner. After melting and spheroidizing at 1400°C to 1700°C in a flame, fused silica of 0.01 μm to 100 μm is recovered. 一種如申請專利範圍第3項所述之熔融球狀二氧化矽粉末的製造方法,係將經疏水化處理至使用甲醇滴定法之疏水化度(M值)為25體積%以上的霧狀二氧化矽使用多層管燃燒器,以前述霧狀二氧化矽的比率成為0.3kg/Nm3~3kg/Nm3之方式,伴隨氧氣或/含氧氣體而從前述多層管燃燒器之中心管供給且在火焰內於1400℃~1700℃使其熔融、球狀化之後,將0.01μm~100μm的熔融二氧化矽回收。 A method for manufacturing the fused spherical silica powder as described in item 3 of the scope of the patent application, which is to use hydrophobization treatment until the hydrophobization degree (M value) of the methanol titration method is more than 25% by volume. Silicon oxide is supplied from the central tube of the multi-layer tube burner along with oxygen or/oxygen-containing gas in such a manner that the ratio of the aforementioned fumed silicon dioxide becomes 0.3 kg/Nm 3 ~3 kg/Nm 3 using a multi-layer tube burner. After melting and spheroidizing at 1400°C to 1700°C in a flame, fused silica of 0.01 μm to 100 μm is recovered. 如申請專利範圍第8項所述之熔融球狀二氧化矽粉末的製造方法,其中,將0.01μm~100μm的熔融二氧化矽回收之方法,係首先使用旋風器將平均粒徑0.01μm~1000μm的粒子回收,隨後,使用篩及/或風力分級機在分級點8μm~100μm進行分級而將其細粒側回收之方法。 The method for producing fused spherical silica powder as described in item 8 of the scope of the patent application, wherein, the method of recovering fused silica powder of 0.01 μm to 100 μm is to first use a cyclone to reduce the average particle size of 0.01 μm to 1000 μm The particles are recovered, and then, using a sieve and/or a wind classifier to classify at a classification point of 8 μm to 100 μm and recover the fine side. 如申請專利範圍第9項所述之熔融球狀二氧化矽粉末的製造方法,其中,將0.01μm~100μm的熔融二氧化矽回收之方法,係首先使用旋風器將平均粒徑0.01μm~1000μm的粒子回收,隨後,使用篩及/或風力分級機在分級點8μm~100μm進行分級而將其細粒側回收之方法。 The method for producing fused spherical silica powder as described in item 9 of the scope of the patent application, wherein, the method of recovering fused silica powder of 0.01 μm to 100 μm is to first use a cyclone to reduce the average particle size of 0.01 μm to 1000 μm The particles are recovered, and then, using a sieve and/or a wind classifier to classify at a classification point of 8 μm to 100 μm and recover the fine side.
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