TWI807494B - Input and output circuit for wafer on wafer technology, and chip device using thereof - Google Patents

Input and output circuit for wafer on wafer technology, and chip device using thereof Download PDF

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TWI807494B
TWI807494B TW110143087A TW110143087A TWI807494B TW I807494 B TWI807494 B TW I807494B TW 110143087 A TW110143087 A TW 110143087A TW 110143087 A TW110143087 A TW 110143087A TW I807494 B TWI807494 B TW I807494B
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circuit
input
signal detection
control circuit
output
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TW202322345A (en
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蔡昆華
蔡亞東
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鯨鏈科技股份有限公司
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Abstract

An input and output circuit and a chip device are provided in the present disclosure. The input and output circuit includes multiple groups of first connection node groups, multiple groups of second connection node groups, and multiple groups of connection structure groups, multiple input and output circuits. Multiple groups of first connection node groups and multiple groups of second connection node groups are disposed correspondingly. The multiple connection structure groups are arranged between the multiple first connection node groups and the multiple second connection node groups. When one or more of the multiple transmission signals are not correctly transmitted to the first circuit, the second control circuit adjusts the output volume of the transmission signal of the second input/output drive circuit by gradually increasing or decreasing by a predetermined output volume interval to adjust the output volume of the transmission signal.

Description

晶圓對晶圓技術之輸入及輸出電路與使用其晶片裝置Input and output circuits of wafer-to-wafer technology and chip devices using it

本發明涉及一種輸入及輸出電路與晶片裝置,特別是涉及一種高良率的輸入及輸出電路與晶片裝置。The invention relates to an input and output circuit and a chip device, in particular to an input and output circuit and a chip device with high yield.

晶圓堆疊製程(wafer on wafer)以及晶片級電路(chip level circuits design)的需求在現今半導體製程逐漸增加。如圖1所示,第一電路2以及第二電路3可以通過輸入及輸出電路1進行堆疊,設置在基板SB上。但是晶圓堆疊製程或是晶片級電路的輸入及輸出電路設計則會影響最終產品的良率高低。The demand for wafer on wafer and chip level circuits design is gradually increasing in today's semiconductor manufacturing process. As shown in FIG. 1 , the first circuit 2 and the second circuit 3 can be stacked through the input and output circuit 1 and disposed on the substrate SB. However, the wafer stacking process or the input and output circuit design of the chip-level circuit will affect the yield of the final product.

因此,如何提供一種高良率的輸入及輸出電路與晶片裝置,來克服上述的缺陷,已成為該項事業所欲解決的重要課題之一。Therefore, how to provide a high-yield input and output circuit and chip device to overcome the above-mentioned defects has become one of the important issues to be solved by this business.

本發明所要解決的技術問題在於,針對現有技術的不足提供一種輸入及輸出電路,適用於連接一第一電路以及一第二電路,所述輸入及輸出電路設置在所述第一電路以及所述第二電路之間,所述第一電路包括一第一控制電路,所述第二電路包括一第二控制電路,所述輸入及輸出電路包括:多組第一連接節點組,所述多組第一連接節點組設置在所述第一電路的一側;多組第二連接節點組,所述多組第二連接節點組設置在所述第二電路的一側,所述多組第一連接節點組與所述多組第二連接節點組是對應設置的,每一組所述第一連接節點組對應設置一組所述第二連接節點組;多組連接結構組,設置在所述多組第一連接節點組以及所述多組第二連接節點組之間;多個第一輸入輸出驅動電路,每一所述第一輸入輸出驅動電路電性連接一組所述第一連接節點組,所述第一控制電路連接所述多個第一輸入輸出驅動電路;多個第二輸入輸出驅動電路,每一所述第二輸入輸出驅動電路電性連接一組所述第二連接節點組,所述第二控制電路連接所述多個第二輸入輸出驅動電路;其中,所述多個第一輸入輸出驅動電路接收來自所述第二電路發送的多個傳輸訊號,並將所述多個傳輸訊號提供至所述第一控制電路,當所述多個傳輸訊號的其中一個或是多個未能正確被傳送至所述第一電路時,所述第二控制電路調整未能正確傳輸所述傳輸訊號的對應的所述第二輸入輸出驅動電路的所述傳輸訊號的輸出大小,所述第二控制電路調整所述第二輸入輸出驅動電路的所述傳輸訊號的輸出大小是漸次地以一預定輸出大小區間增加或是減少以調整所述傳輸訊號的輸出大小。The technical problem to be solved by the present invention is to provide an input and output circuit for the deficiencies of the prior art, which is suitable for connecting a first circuit and a second circuit. The connection node groups and the plurality of second connection node groups are set correspondingly, and each group of the first connection node groups is correspondingly provided with a group of the second connection node groups; multiple sets of connection structure groups are arranged between the plurality of first connection node groups and the plurality of second connection node groups; a plurality of first input-output drive circuits, each of the first input-output drive circuits is electrically connected to a group of the first connection node groups, and the first control circuit is connected to the plurality of first input-output drive circuits; The plurality of second input-output drive circuits; wherein the plurality of first input-output drive circuits receive a plurality of transmission signals sent from the second circuit, and provide the plurality of transmission signals to the first control circuit. When one or more of the plurality of transmission signals is not correctly transmitted to the first circuit, the second control circuit adjusts the output size of the transmission signal of the corresponding second input-output drive circuit that fails to transmit the transmission signal correctly. The second control circuit adjusts the output size of the transmission signal of the second input-output drive circuit. Or decrease to adjust the output size of the transmission signal.

本發明還公開了一種輸入及輸出電路,適用於連接一第一電路以及一第二電路,所述輸入及輸出電路設置在所述第一電路以及所述第二電路之間,所述第一電路包括一第一控制電路,所述第二電路包括一第二控制電路,所述輸入及輸出電路包括:多組第一連接節點組,所述多組第一連接節點組設置在所述第一電路的一側;多組第二連接節點組,所述多組第二連接節點組設置在所述第二電路的一側,所述多組第一連接節點組與所述多組第二連接節點組是對應設置的,每一組所述第一連接節點組對應設置一組所述第二連接節點組;多組連接結構組,設置在所述多組第一連接節點組以及所述多組第二連接節點組之間;多個第一輸入輸出驅動電路,每一所述第一輸入輸出驅動電路電性連接一組所述第一連接節點組,所述第一控制電路連接所述多個第一輸入輸出驅動電路;多個第二輸入輸出驅動電路,每一所述第二輸入輸出驅動電路電性連接一組所述第二連接節點組,所述第二控制電路連接所述多個第二輸入輸出驅動電路;其中,所述多個第一輸入輸出驅動電路接收來自所述第二電路發送的多個傳輸訊號,並將所述多個傳輸訊號提供至所述第一控制電路,當所述多個傳輸訊號的其中一個或是多個未能正確被傳送至所述第一電路時,所述第二控制電路通過一通訊路徑提供一通知訊號,以通知所述第一控制電路調整對應的所述第一輸入輸出驅動電路調整訊號檢測區間,以檢測所述傳輸訊號,所述通訊路徑設置在所述第一電路以及所述第二電路之間。The invention also discloses an input and output circuit, which is suitable for connecting a first circuit and a second circuit, the input and output circuit is arranged between the first circuit and the second circuit, the first circuit includes a first control circuit, the second circuit includes a second control circuit, the input and output circuit includes: multiple first connection node groups, the multiple first connection node groups are arranged on one side of the first circuit; multiple second connection node groups, the multiple second connection node groups are arranged on one side of the second circuit, the multiple first connection node groups and the multiple second connection node groups Each group of the first connection node groups is correspondingly provided with a group of the second connection node groups; multiple groups of connection structures are arranged between the multiple groups of the first connection node groups and the multiple groups of the second connection node groups; a plurality of first input-output drive circuits, each of the first input-output drive circuits is electrically connected to a group of the first connection node groups, and the first control circuit is connected to the plurality of first input-output drive circuits; A plurality of first input-output drive circuits receive a plurality of transmission signals sent from the second circuit, and provide the plurality of transmission signals to the first control circuit. When one or more of the plurality of transmission signals is not correctly transmitted to the first circuit, the second control circuit provides a notification signal through a communication path to notify the first control circuit to adjust the corresponding first input-output drive circuit to adjust the signal detection interval to detect the transmission signal. The communication path is set between the first circuit and the second circuit.

本發明還公開了一種晶片裝置,包括:一第一電路,包括一第一控制電路以及一第一儲存電路,所述第一控制電路電性連接所述第一儲存電路;一第二電路;以及一輸入及輸出電路,包括:多個第一連接節點組;多個第二連接節點組;多個連接結構組,所述多組連接結構組分別連接所述多組第一連接節點組以及所述多組第二連接節點組;以及多個第一輸入輸出驅動電路,每一所述輸入輸出驅動電路電性連接一組所述第一連接節點組;其中,所述多個第一輸入輸出驅動電路接收來自所述第二電路發送的多個傳輸訊號,並將所述多個傳輸訊號提供至所述第一控制電路,當所述多個傳輸訊號的其中一個或是多個未能正確被傳送至所述第一電路時,所述第二控制電路調整對應的所述第二輸入輸出驅動電路的所述傳輸訊號的輸出大小,所述第二控制電路調整所述第二輸入輸出驅動電路的所述傳輸訊號的輸出大小是漸次地以一預定輸出大小區間增加或是減少以調整所述傳輸訊號的輸出大小。The present invention also discloses a chip device, comprising: a first circuit, including a first control circuit and a first storage circuit, the first control circuit is electrically connected to the first storage circuit; a second circuit; and an input and output circuit, including: a plurality of first connection node groups; a plurality of second connection node groups; a plurality of connection structure groups, the plurality of connection structure groups are respectively connected to the plurality of first connection node groups and the plurality of second connection node groups; The output driver circuit receives a plurality of transmission signals sent from the second circuit, and provides the plurality of transmission signals to the first control circuit. When one or more of the plurality of transmission signals is not correctly transmitted to the first circuit, the second control circuit adjusts the output size of the transmission signal of the corresponding second input-output driver circuit. The second control circuit adjusts the output size of the transmission signal of the second input-output driver circuit.

本發明還公開了一種晶片裝置,包括:一第一電路,包括一第一控制電路以及一第一儲存電路,所述第一控制電路電性連接所述第一儲存電路;一第二電路;以及一輸入及輸出電路,包括:多個第一連接節點組;多個第二連接節點組;多個連接結構組,所述多組連接結構組分別連接所述多組第一連接節點組以及所述多組第二連接節點組;以及多個第一輸入輸出驅動電路,每一所述輸入輸出驅動電路電性連接一組所述第一連接節點組;     其中,所述多個第一輸入輸出驅動電路接收來自所述第二電路發送的多個傳輸訊號,並將所述多個傳輸訊號提供至所述第一控制電路,當所述多個傳輸訊號的其中一個或是多個未能正確被傳送至所述第一電路時,所述第二控制電路通過一通訊路徑,提供一通知訊號,以通知所述第一控制電路調整對應的所述第一輸入輸出驅動電路調整訊號檢測區間,以檢測所述傳輸訊號,所述通訊路徑設置在所述第一電路以及所述第二電路之間。The present invention also discloses a chip device, comprising: a first circuit, including a first control circuit and a first storage circuit, the first control circuit is electrically connected to the first storage circuit; a second circuit; and an input and output circuit, including: a plurality of first connection node groups; a plurality of second connection node groups; a plurality of connection structure groups, the plurality of connection structure groups are respectively connected to the plurality of first connection node groups and the plurality of second connection node groups; The plurality of first input-output drive circuits receive a plurality of transmission signals sent from the second circuit, and provide the plurality of transmission signals to the first control circuit. When one or more of the plurality of transmission signals is not correctly transmitted to the first circuit, the second control circuit provides a notification signal through a communication path to notify the first control circuit to adjust the corresponding first input-output drive circuit to adjust the signal detection interval to detect the transmission signal. The communication path is set between the first circuit and the second circuit.

本發明的其中一有益效果在於,本發明所提供的輸入及輸出電路以及晶片裝置,可以通過調整第一電路的第一預定訊號檢測區間或是第二電路的第二預定訊號檢測區間以有效提高晶圓電路之間的連接電路的利用率,也可以因此提升電路以及晶片裝置的使用效益。One of the beneficial effects of the present invention is that the input and output circuits and the chip device provided by the present invention can effectively improve the utilization rate of the connection circuit between the wafer circuits by adjusting the first predetermined signal detection interval of the first circuit or the second predetermined signal detection interval of the second circuit, and thus improve the use efficiency of the circuit and the chip device.

為使能更進一步瞭解本發明的特徵及技術內容,請參閱以下有關本發明的詳細說明與圖式,然而所提供的圖式僅用於提供參考與說明,並非用來對本發明加以限制。In order to further understand the features and technical content of the present invention, please refer to the following detailed description and drawings related to the present invention. However, the provided drawings are only for reference and description, and are not intended to limit the present invention.

以下是通過特定的具體實施例來說明本發明所公開有關“輸入及輸出電路以及晶片裝置”的實施方式,本領域技術人員可由本說明書所公開的內容瞭解本發明的優點與效果。本發明可通過其他不同的具體實施例加以施行或應用,本說明書中的各項細節也可基於不同觀點與應用,在不背離本發明的構思下進行各種修改與變更。另外,本發明的附圖僅為簡單示意說明,並非依實際尺寸的描繪,事先聲明。以下的實施方式將進一步詳細說明本發明的相關技術內容,但所公開的內容並非用以限制本發明的保護範圍。另外,本文中所使用的術語“或”,應視實際情況可能包括相關聯的列出項目中的任一個或者多個的組合。The following is an illustration of the implementation of the "input and output circuits and chip device" disclosed by the present invention through specific specific embodiments. Those skilled in the art can understand the advantages and effects of the present invention from the content disclosed in this specification. The present invention can be implemented or applied through other different specific embodiments, and various modifications and changes can be made to the details in this specification based on different viewpoints and applications without departing from the concept of the present invention. In addition, the drawings of the present invention are only for simple illustration, and are not drawn according to the actual size, which is stated in advance. The following embodiments will further describe the relevant technical content of the present invention in detail, but the disclosed content is not intended to limit the protection scope of the present invention. In addition, the term "or" used herein may include any one or a combination of more of the associated listed items depending on the actual situation.

[第一實施例][first embodiment]

請參閱圖2以及圖3,圖2是本發明第一實施例的輸入及輸出電路的示意圖。圖3是本發明第一實施例的輸入及輸出電路的另一示意圖。Please refer to FIG. 2 and FIG. 3 . FIG. 2 is a schematic diagram of the input and output circuits of the first embodiment of the present invention. FIG. 3 is another schematic diagram of the input and output circuits of the first embodiment of the present invention.

本實施例中,提供了一種輸入及輸出電路1,適用於連接一第一電路2以及一第二電路3。輸入及輸出電路1設置在第一電路2以及第二電路3之間。In this embodiment, an input and output circuit 1 is provided, which is suitable for connecting a first circuit 2 and a second circuit 3 . The input and output circuit 1 is arranged between the first circuit 2 and the second circuit 3 .

輸入及輸出電路1包括多組第一連接節點組11、多組第二連接節點組12、多組連接結構組13、多個第一輸入輸出驅動電路14、多個第二輸入輸出驅動電路15。第一連接節點組11設置在第一電路2的一側。第二連接節點組12設置在第二電路3的一側。每一第一連接節點組11與第二連接節點組12對應設置。The input and output circuit 1 includes a plurality of first connection node groups 11 , a plurality of second connection node groups 12 , a plurality of connection structure groups 13 , a plurality of first input and output driving circuits 14 , and a plurality of second input and output driving circuits 15 . The first connection node group 11 is provided on one side of the first circuit 2 . The second connection node group 12 is provided on one side of the second circuit 3 . Each first connection node group 11 is set corresponding to the second connection node group 12 .

第一電路2還包括一第一控制電路21以及一第一儲存電路22。第一控制電路21電性連接第一儲存電路22。第二電路3還包括一第二控制電路31以及一第二儲存電路32。第二控制電路31電性連接第二儲存電路32。The first circuit 2 further includes a first control circuit 21 and a first storage circuit 22 . The first control circuit 21 is electrically connected to the first storage circuit 22 . The second circuit 3 further includes a second control circuit 31 and a second storage circuit 32 . The second control circuit 31 is electrically connected to the second storage circuit 32 .

第一控制電路21電性連接多個第一輸入輸出驅動電路14。The first control circuit 21 is electrically connected to a plurality of first input-output driving circuits 14 .

第二控制電路31電性連接多個第二輸入輸出驅動電路15。The second control circuit 31 is electrically connected to the plurality of second input and output driving circuits 15 .

多個第一輸入輸出驅動電路14分別電性連接多個第一連接節點組11。The plurality of first input-output driving circuits 14 are respectively electrically connected to the plurality of first connection node groups 11 .

多個第二輸入輸出驅動電路15分別電性連接多個第二連接節點組12。多個連接結構組13則是分別設置在多個第一連接節點組11以及多個第二連接節點組12之間。The plurality of second input-output driving circuits 15 are respectively electrically connected to the plurality of second connection node groups 12 . The plurality of connection structure groups 13 are respectively arranged between the plurality of first connection node groups 11 and the plurality of second connection node groups 12 .

其中,多個第一輸入輸出驅動電路14接收來自第二電路3發送的傳輸訊號,並將多個傳輸訊號提供至第一控制電路21。Wherein, a plurality of first input-output driving circuits 14 receive transmission signals sent from the second circuit 3 and provide a plurality of transmission signals to the first control circuit 21 .

第一控制電路21調整一預定訊號檢測區間,以與多個傳輸訊號進行檢測,以產生對應多個連接結構組13的多個調整後訊號檢測區間,第一控制電路21根據多個調整後訊號檢測區間進行訊號檢測。The first control circuit 21 adjusts a predetermined signal detection interval to detect multiple transmission signals to generate multiple adjusted signal detection intervals corresponding to multiple connection structure groups 13, and the first control circuit 21 performs signal detection according to the multiple adjusted signal detection intervals.

也就是,每一個輸入輸出驅動電路14會接收來自第二電路3傳送的傳輸訊號。不過每一個傳輸訊號通過各自傳送路徑上的第一連接節點組11、連接結構組13以及第二連接節點組12時,會由於第一連接節點組11、連接結構組13以及第二連接節點組12的傳輸狀態,而產生訊號失真或是訊號強度降低(如圖2以及圖3所示)。第一控制電路21由於會根據第一預定訊號檢測區間,對每一個接收的傳輸訊號進行訊號檢測,以判斷接收的傳輸訊號是一正常訊號。That is, each input-output driving circuit 14 receives the transmission signal transmitted from the second circuit 3 . However, when each transmission signal passes through the first connection node group 11, the connection structure group 13 and the second connection node group 12 on the respective transmission paths, due to the transmission status of the first connection node group 11, the connection structure group 13 and the second connection node group 12, signal distortion or signal strength reduction will occur (as shown in FIG. 2 and FIG. 3 ). The first control circuit 21 performs signal detection on each received transmission signal according to the first predetermined signal detection interval, so as to determine that the received transmission signal is a normal signal.

當多個輸入輸出驅動電路14接收的傳輸訊號有訊號失真或是訊號強度降低的情況,第一控制電路21會偵測所接收的傳輸訊號的一訊號上限值、一訊號下限值或是其組合,以調整第一預定訊號檢測區間,產生一調整後的第一訊號檢測區間。When the transmission signals received by the plurality of input and output driving circuits 14 have signal distortion or signal strength reduction, the first control circuit 21 will detect a signal upper limit value, a signal lower limit value or a combination thereof of the received transmission signals to adjust the first predetermined signal detection interval to generate an adjusted first signal detection interval.

由於每一個輸入輸出驅動電路14對應的第一連接節點組11、連接結構組13以及第二連接節點組12的傳輸狀態未必相同。因此每一組第一連接節點組11、連接結構組13以及第二連接節點組12以及對應的輸入輸出驅動電路14會各自包括一調整後的第一預定訊號檢測區間。第一控制電路21會根據對應每一個輸入輸出驅動電路14的調整後的第一預定訊號檢測區間,對每一個傳輸訊號進行檢測。而對應每一個輸入輸出驅動電路14的調整後的第一預定訊號檢測區間則會儲存在第一儲存電路22中。The transmission states of the first connection node group 11 , the connection structure group 13 and the second connection node group 12 corresponding to each input-output driving circuit 14 are not necessarily the same. Therefore, each of the first connection node group 11 , the connection structure group 13 , the second connection node group 12 and the corresponding input/output driving circuit 14 each includes an adjusted first predetermined signal detection interval. The first control circuit 21 detects each transmission signal according to the adjusted first predetermined signal detection interval corresponding to each input and output driving circuit 14 . The adjusted first predetermined signal detection interval corresponding to each input and output driving circuit 14 is stored in the first storage circuit 22 .

第一控制電路21調整第一預定訊號檢測區間有下列幾種方式:The first control circuit 21 adjusts the first predetermined signal detection interval in the following ways:

第一預定訊號檢測區間包括一第一預定訊號上限值以及一第二預定訊號上限值。The first predetermined signal detection interval includes a first predetermined signal upper limit and a second predetermined signal upper limit.

第一種方式是根據傳輸訊號的訊號上限值調整第一預定訊號檢測區間的第一預定訊號上限值。The first way is to adjust the first predetermined signal upper limit value of the first predetermined signal detection interval according to the signal upper limit value of the transmission signal.

當傳輸訊號的訊號上限值低於第一預定訊號檢測區間的第一預定訊號上限值時,第一控制電路21則可以將第一預定訊號檢測區間的第一預定訊號上限值調低,以檢測較低的傳輸訊號的訊號上限值。When the signal upper limit of the transmission signal is lower than the first predetermined signal upper limit of the first predetermined signal detection interval, the first control circuit 21 may lower the first predetermined signal upper limit of the first predetermined signal detection interval to detect a lower signal upper limit of the transmission signal.

當傳輸訊號的訊號上限值遠高於第一預定訊號檢測區間的第一預定訊號上限值時,第一控制電路21則可以將第一預定訊號檢測區間的第一預定訊號上限值調高,以檢測較高的傳輸訊號的訊號上限值。When the signal upper limit of the transmission signal is much higher than the first predetermined signal upper limit of the first predetermined signal detection interval, the first control circuit 21 can increase the first predetermined signal upper limit of the first predetermined signal detection interval to detect a higher signal upper limit of the transmission signal.

第二種方式是根據傳輸訊號的訊號下限值調整第一預定訊號檢測區間的第一預定訊號下限值。The second method is to adjust the first predetermined signal lower limit value of the first predetermined signal detection interval according to the signal lower limit value of the transmission signal.

當傳輸訊號的訊號下限值遠小於第一預定訊號檢測區間的第一預定訊號下限值時,第一控制電路21則可以將第一預定訊號檢測區間的第一預定訊號下限值調小,以檢測較小的傳輸訊號的訊號下限值。When the signal lower limit value of the transmission signal is much smaller than the first predetermined signal lower limit value of the first predetermined signal detection interval, the first control circuit 21 can adjust the first predetermined signal lower limit value of the first predetermined signal detection interval to be smaller, so as to detect a smaller signal lower limit value of the transmission signal.

當傳輸訊號的訊號下限值遠高於第一預定訊號檢測區間的第一預定訊號下限值時,第一控制電路21則可以將第一預定訊號檢測區間的第一預定訊號下限值調高,以檢測較高的傳輸訊號的訊號下限值。When the signal lower limit value of the transmission signal is much higher than the first predetermined signal lower limit value of the first predetermined signal detection interval, the first control circuit 21 can increase the first predetermined signal lower limit value of the first predetermined signal detection interval to detect a higher signal lower limit value of the transmission signal.

第三種方式是根據傳輸訊號的訊號上限值以及訊號下限值調整第一預定訊號檢測區間的第一預定訊號上限值以及第一預定訊號下限值。The third method is to adjust the first predetermined signal upper limit and the first predetermined signal lower limit of the first predetermined signal detection interval according to the signal upper limit and the signal lower limit of the transmission signal.

也就是,第一控制電路21可以如圖2所示,調整第一預定訊號檢測區間的第一預定訊號上限值以及第一預定訊號下限值,以對傳輸訊號進行檢測。That is, as shown in FIG. 2 , the first control circuit 21 can adjust the first predetermined signal upper limit and the first predetermined signal lower limit in the first predetermined signal detection interval to detect the transmission signal.

此外,第一控制電路21調整第一預定訊號上限值以及第一預定訊號下限值可以依據一單位調整區間,每一次調整一次單位調整區間。也可以直接根據傳輸訊號的訊號上限值以及訊號下限值調整第一預定訊號檢測區間的第一預定訊號上限值以及第一預定訊號下限值,以產生調整後的第一預定訊號檢測區間。調整後的第一預定訊號檢測區間則是包括調整後的第一調整後訊號檢測上限值以及的第一調整後訊號檢測下限值。In addition, the first control circuit 21 can adjust the upper limit value of the first predetermined signal and the lower limit value of the first predetermined signal according to a unit adjustment interval, and adjust the unit adjustment interval once each time. The first predetermined signal upper limit and the first predetermined signal lower limit of the first predetermined signal detection interval can also be directly adjusted according to the signal upper limit and signal lower limit of the transmission signal to generate an adjusted first predetermined signal detection interval. The adjusted first predetermined signal detection interval includes the adjusted first adjusted upper limit of signal detection and the first adjusted lower limit of signal detection.

類似地,第二電路3也可以接收第一電路2發送的傳輸訊號。也就是,多個第二輸入輸出驅動電路15可以接收設置在第一電路2的多個第一輸入輸出驅動電路14發送的傳輸訊號。多個第二輸入輸出驅動電路15會將接收到的多個傳輸訊號提供至第二控制電路31。Similarly, the second circuit 3 can also receive the transmission signal sent by the first circuit 2 . That is, the multiple second I/O driving circuits 15 can receive the transmission signals sent by the multiple first I/O driving circuits 14 disposed on the first circuit 2 . The plurality of second input-output driving circuits 15 provide the received transmission signals to the second control circuit 31 .

在初始化的過程中,第二控制電路31調整一第二預定訊號檢測區間與多個傳輸訊號進行檢測,以產生對應多個連接結構組13的多個第二調整後訊號檢測區間,第二控制電路31再根據多個調整後訊號檢測區間進行訊號檢測。During the initialization process, the second control circuit 31 adjusts a second predetermined signal detection interval and detects a plurality of transmission signals to generate a plurality of second adjusted signal detection intervals corresponding to a plurality of connection structure groups 13, and the second control circuit 31 performs signal detection according to the plurality of adjusted signal detection intervals.

也就是,每一個第二輸入輸出驅動電路15會接收來自第一電路2傳送的傳輸訊號。不過每一個傳輸訊號通過各自傳送路徑上的第一連接節點組11、連接結構組13以及第二連接節點組12時,會由於第一連接節點組11、連接結構組13以及第二連接節點組12的傳輸狀態,而產生訊號失真或是訊號強度降低(如圖2以及圖3所示)。第二控制電路31由於會根據第一預定訊號檢測區間,對每一個接收的傳輸訊號進行訊號檢測,以判斷接收的傳輸訊號是一正常訊號。That is, each second input-output driving circuit 15 receives the transmission signal transmitted from the first circuit 2 . However, when each transmission signal passes through the first connection node group 11, the connection structure group 13 and the second connection node group 12 on the respective transmission paths, due to the transmission status of the first connection node group 11, the connection structure group 13 and the second connection node group 12, signal distortion or signal strength reduction will occur (as shown in FIG. 2 and FIG. 3 ). The second control circuit 31 performs signal detection on each received transmission signal according to the first predetermined signal detection interval, so as to determine that the received transmission signal is a normal signal.

當多個第二輸入輸出驅動電路15接收的傳輸訊號有訊號失真或是訊號強度降低的情況,第二控制電路31會偵測所接收的傳輸訊號的一訊號上限值、一訊號下限值或是其組合,以調整第二預定訊號檢測區間,產生一調整後的第二預定訊號檢測區間。When the transmission signals received by the plurality of second input and output driving circuits 15 have signal distortion or signal intensity reduction, the second control circuit 31 will detect a signal upper limit value, a signal lower limit value or a combination of the received transmission signals to adjust the second predetermined signal detection interval to generate an adjusted second predetermined signal detection interval.

由於每一個第二輸入輸出驅動電路15對應的第一連接節點組11、連接結構組13以及第二連接節點組12的傳輸狀態未必相同。因此每一組第一連接節點組11、連接結構組13以及第二連接節點組12以及對應的第二輸入輸出驅動電路15會各自包括一調整後的第二預定訊號檢測區間。第二控制電路31會根據對應每一個第二輸入輸出驅動電路15的調整後的第二預定訊號檢測區間,對每一個傳輸訊號進行檢測。而對應每一個第二輸入輸出驅動電路15的調整後的第二預定訊號檢測區間則會儲存在第二儲存電路32中。Since the transmission states of the first connection node group 11 , the connection structure group 13 and the second connection node group 12 corresponding to each second input-output driving circuit 15 are not necessarily the same. Therefore, each of the first connection node group 11 , the connection structure group 13 , the second connection node group 12 and the corresponding second input-output driving circuit 15 each includes an adjusted second predetermined signal detection interval. The second control circuit 31 detects each transmission signal according to the adjusted second predetermined signal detection interval corresponding to each second input-output driving circuit 15 . The adjusted second predetermined signal detection interval corresponding to each second input-output driving circuit 15 will be stored in the second storage circuit 32 .

如圖2所示,每一組第一連接節點組11是包括一個第一連接節點11A。每一組第二連接節點組12包括一個第二連接節點12A。每一組連結結構組13包括一個連結結構13A。As shown in FIG. 2 , each first connection node group 11 includes a first connection node 11A. Each second connection node group 12 includes one second connection node 12A. Each connecting structure group 13 includes a connecting structure 13A.

此外,如圖3所示,第一連接節點組11包括多個第一連接節點A,而且第一連接節點組11的多個第一連接節點11A是互相連接的。第二連接節點組12包括多個第二連接節點12A,第二連接節點組12的多個第二連接節點12A是互相連接的。連接結構組13則是包括多個連接結構13A。Furthermore, as shown in FIG. 3 , the first connection node group 11 includes a plurality of first connection nodes A, and the plurality of first connection nodes 11A of the first connection node group 11 are connected to each other. The second connection node group 12 includes a plurality of second connection nodes 12A, and the plurality of second connection nodes 12A of the second connection node group 12 are connected to each other. The connection structure group 13 includes a plurality of connection structures 13A.

如圖2所示,在本實施例中,每一輸入輸出驅動電路14包括一輸出端。在輸入輸出驅動電路21的輸出端則會電性連接一阻抗R。作為輸出控制訊號時的電壓調控阻抗,一般稱為下拉阻抗(pull low resistor)。在其他實施例中,阻抗R也可以不做設置。As shown in FIG. 2 , in this embodiment, each input-output driving circuit 14 includes an output terminal. An impedance R is electrically connected to the output terminal of the input-output driving circuit 21 . As a voltage regulation impedance when outputting a control signal, it is generally called a pull-down impedance (pull low resistor). In other embodiments, the impedance R may not be set.

在本實施例中,多個輸入輸出驅動電路14可以連接一控制電路21或是一邏輯電路(圖未示),在本發明不做限制。第二電路3則可以包括多個記憶體電路31、一控制電路或是一應用電路,在本發明中也不做限制。也就是,設置在第二電路3的多個第二連接節點12A連接的電路並沒有任何限制。In this embodiment, the multiple input and output driving circuits 14 can be connected to a control circuit 21 or a logic circuit (not shown in the figure), which is not limited in the present invention. The second circuit 3 may include a plurality of memory circuits 31 , a control circuit or an application circuit, which are not limited in the present invention. That is, the circuits connected to the plurality of second connection nodes 12A provided in the second circuit 3 are not limited in any way.

也就是,第一電路2與第二電路3在進行堆疊程序的時候,會進行對位後再進行連結:例如晶圓鍵合(wafer bonding)、打線 (wire bonding),以進行第一電路2與第二電路3的堆疊設置。在電路對位的時候,精度相當重要。第一電路2與第二電路3之間的距離,則會影響輸入及輸出電路1連結第一電路2與第二電路3的良率。在本實施例中,連結結構13A可以是例如排針結構、晶圓鍵合結構(wafer bonding)或是打線結構(wire bonding)。That is, when the first circuit 2 and the second circuit 3 are stacked, they will be aligned and then connected: for example, wafer bonding (wafer bonding), wire bonding (wire bonding), so as to perform the stacking arrangement of the first circuit 2 and the second circuit 3 . When the circuit is aligned, the accuracy is very important. The distance between the first circuit 2 and the second circuit 3 will affect the yield rate of the input and output circuit 1 connecting the first circuit 2 and the second circuit 3 . In this embodiment, the connection structure 13A can be, for example, a pin header structure, a wafer bonding structure (wafer bonding) or a wire bonding structure (wire bonding).

在本實施例中,第一電路2與第二電路3可以是晶圓級電路(wafer)、晶片級電路(chip)或是一般尺度的電路等。輸入輸出驅動電路21則是互補式金屬氧化物半導體輸入端口(CMOS IO logic)。In this embodiment, the first circuit 2 and the second circuit 3 may be a wafer-level circuit (wafer), a chip-level circuit (chip), or a general-scale circuit. The input and output driving circuit 21 is a CMOS IO logic.

第一儲存電路22以及第二儲存電路32是一快閃記憶體、一唯讀記憶體、一可規化唯讀記憶體、一電可改寫唯讀記憶體、一可擦可規化唯讀記憶體或是一電可擦可規化唯讀記憶體。The first storage circuit 22 and the second storage circuit 32 are a flash memory, a read-only memory, a programmable read-only memory, an electrically rewritable read-only memory, an erasable programmable read-only memory or an electrically erasable programmable read-only memory.

[第二實施例][Second embodiment]

請參閱圖4以及圖5,圖4是本發明第二實施例的晶片裝置的示意圖。圖5是本發明第二實施例的晶片裝置的另一示意圖。Please refer to FIG. 4 and FIG. 5 . FIG. 4 is a schematic diagram of a wafer device according to a second embodiment of the present invention. FIG. 5 is another schematic view of the wafer device according to the second embodiment of the present invention.

本實施例中,提供一種晶片裝置C1。晶片裝置C1包括一輸入及輸出電路C11、一第一電路C12以及一第二電路C13。In this embodiment, a wafer device C1 is provided. The chip device C1 includes an input and output circuit C11, a first circuit C12 and a second circuit C13.

輸入及輸出電路C11,適用於連接一第一電路C12以及一第二電路C13。輸入及輸出電路C11設置在第一電路C12以及第二電路C13之間。The input and output circuit C11 is suitable for connecting a first circuit C12 and a second circuit C13. The input and output circuit C11 is provided between the first circuit C12 and the second circuit C13.

輸入及輸出電路C11包括多組第一連接節點組C111、多組第二連接節點組C112、多組連接結構組C113、多個第一輸入輸出驅動電路C114、多個第二輸入輸出驅動電路C115。第一連接節點組C111設置在第一電路C12的一側。第二連接節點組C112設置在第二電路C13的一側。每一第一連接節點組C111與第二連接節點組C112對應設置。The input and output circuit C11 includes a plurality of first connection node groups C111, a plurality of second connection node groups C112, a plurality of connection structure groups C113, a plurality of first input and output driving circuits C114, and a plurality of second input and output driving circuits C115. The first connection node group C111 is provided on one side of the first circuit C12. The second connection node group C112 is provided on one side of the second circuit C13. Each first connection node group C111 is set correspondingly to the second connection node group C112.

第一電路C12還包括一第一控制電路C121以及一第一儲存電路C122。第一控制電路C121電性連接第一儲存電路C122。第二電路C13還包括一第二控制電路C131以及一第二儲存電路C132。第二控制電路C131電性連接第二儲存電路C132。The first circuit C12 further includes a first control circuit C121 and a first storage circuit C122. The first control circuit C121 is electrically connected to the first storage circuit C122. The second circuit C13 further includes a second control circuit C131 and a second storage circuit C132. The second control circuit C131 is electrically connected to the second storage circuit C132.

第一控制電路C121電性連接多個第一輸入輸出驅動電路C114。The first control circuit C121 is electrically connected to a plurality of first input-output driving circuits C114.

第二控制電路C131電性連接多個第二輸入輸出驅動電路C115。The second control circuit C131 is electrically connected to a plurality of second input-output driving circuits C115.

多個第一輸入輸出驅動電路C114分別電性連接多個第一連接節點組C111。The plurality of first input and output driving circuits C114 are electrically connected to the plurality of first connection node groups C111 respectively.

多個第二輸入輸出驅動電路C115分別電性連接多個第二連接節點組C112。多個連接結構組C113則是分別設置在多個第一連接節點組C111以及多個第二連接節點組C112之間。The plurality of second input and output driving circuits C115 are electrically connected to the plurality of second connection node groups C112 respectively. The plurality of connection structure groups C113 are respectively arranged between the plurality of first connection node groups C111 and the plurality of second connection node groups C112.

其中,多個第一輸入輸出驅動電路C114接收來自第二電路C13發送的傳輸訊號,並將多個傳輸訊號提供至第一控制電路C121。Wherein, a plurality of first input and output driving circuits C114 receive transmission signals sent from the second circuit C13, and provide a plurality of transmission signals to the first control circuit C121.

第一控制電路C121調整一預定訊號檢測區間與多個傳輸訊號進行檢測,以產生對應多個連接結構組C113的多個調整後訊號檢測區間,第一控制電路21根據多個調整後訊號檢測區間進行訊號檢測。The first control circuit C121 adjusts a predetermined signal detection interval and detects a plurality of transmission signals to generate a plurality of adjusted signal detection intervals corresponding to a plurality of connection structure groups C113, and the first control circuit 21 performs signal detection according to the plurality of adjusted signal detection intervals.

也就是,每一個輸入輸出驅動電路C114會接收來自第二電路3傳送的傳輸訊號。不過每一個傳輸訊號通過各自傳送路徑上的第一連接節點組C111、連接結構組C113以及第二連接節點組C112時,會由於第一連接節點組C111、連接結構組C113以及第二連接節點組C112的傳輸狀態,而產生訊號失真或是訊號強度降低(如圖4所示)。第一控制電路C121由於會根據第一預定訊號檢測區間,對每一個接收的傳輸訊號進行訊號檢測,以判斷接收的傳輸訊號是一正常訊號。That is, each input-output driving circuit C114 receives the transmission signal transmitted from the second circuit 3 . However, when each transmission signal passes through the first connection node group C111, the connection structure group C113, and the second connection node group C112 on the respective transmission paths, signal distortion or signal strength reduction will occur due to the transmission status of the first connection node group C111, the connection structure group C113, and the second connection node group C112 (as shown in FIG. 4 ). The first control circuit C121 performs signal detection on each received transmission signal according to the first predetermined signal detection interval, so as to determine that the received transmission signal is a normal signal.

當多個輸入輸出驅動電路C114接收的傳輸訊號有訊號失真或是訊號強度降低的情況,第一控制電路C121會偵測所接收的傳輸訊號的一訊號上限值、一訊號下限值或是其組合,以調整第一預定訊號檢測區間,產生一調整後的第一訊號檢測區間。When the transmission signals received by the multiple input and output driving circuits C114 have signal distortion or signal strength decrease, the first control circuit C121 detects a signal upper limit, a signal lower limit or a combination thereof of the received transmission signals to adjust the first predetermined signal detection interval to generate an adjusted first signal detection interval.

由於每一個輸入輸出驅動電路C114對應的第一連接節點組C111、連接結構組C113以及第二連接節點組C112的傳輸狀態未必相同。因此每一組第一連接節點組C111、連接結構組C113以及第二連接節點組C112以及對應的輸入輸出驅動電路C114會各自包括一調整後的第一預定訊號檢測區間。第一控制電路C121會根據對應每一個輸入輸出驅動電路C114的調整後的第一預定訊號檢測區間,對每一個傳輸訊號進行檢測。而對應每一個輸入輸出驅動電路C114的調整後的第一預定訊號檢測區間則會儲存在第一儲存電路C122中。如圖4所示,傳輸訊號S1與傳輸訊號S2則是利用不同的調整訊號檢測區間進行檢測。The transmission states of the first connection node group C111 , the connection structure group C113 and the second connection node group C112 corresponding to each input-output driving circuit C114 are not necessarily the same. Therefore, each of the first connection node group C111 , the connection structure group C113 , the second connection node group C112 and the corresponding input/output driving circuit C114 each includes an adjusted first predetermined signal detection interval. The first control circuit C121 detects each transmission signal according to the adjusted first predetermined signal detection interval corresponding to each input and output driving circuit C114 . The adjusted first predetermined signal detection interval corresponding to each input and output driving circuit C114 is stored in the first storage circuit C122. As shown in FIG. 4 , the transmission signal S1 and the transmission signal S2 are detected using different adjustment signal detection intervals.

第一控制電路C121調整第一預定訊號檢測區間有下列幾種方式:The first control circuit C121 adjusts the first predetermined signal detection interval in the following ways:

第一預定訊號檢測區間包括一第一訊號檢測上限值以及一第一訊號檢測下限值。The first predetermined signal detection interval includes a first signal detection upper limit and a first signal detection lower limit.

第一種方式是根據傳輸訊號的訊號上限值調整第一預定訊號檢測區間的第一訊號檢測上限值。The first way is to adjust the first signal detection upper limit of the first predetermined signal detection interval according to the signal upper limit of the transmission signal.

當傳輸訊號的訊號上限值低於第一預定訊號檢測區間的第一訊號檢測上限值時,第一控制電路C121則可以將第一預定訊號檢測區間的第一訊號檢測上限值調低,以檢測較低的傳輸訊號的訊號上限值。When the signal upper limit of the transmission signal is lower than the first signal detection upper limit of the first predetermined signal detection interval, the first control circuit C121 can lower the first signal detection upper limit of the first predetermined signal detection interval to detect a lower signal upper limit of the transmission signal.

當傳輸訊號的訊號上限值遠高於第一預定訊號檢測區間的第一訊號檢測上限值時,第一控制電路C121則可以將第一預定訊號檢測區間的第一訊號檢測上限值調高,以檢測較高的傳輸訊號的訊號上限值。When the signal upper limit of the transmission signal is much higher than the first signal detection upper limit of the first predetermined signal detection interval, the first control circuit C121 can increase the first signal detection upper limit of the first predetermined signal detection interval to detect a higher signal upper limit of the transmission signal.

第二種方式是根據傳輸訊號的訊號下限值調整第一預定訊號檢測區間的第一訊號檢測下限值。The second way is to adjust the first signal detection lower limit value of the first predetermined signal detection interval according to the signal lower limit value of the transmission signal.

當傳輸訊號的訊號下限值遠小於第一預定訊號檢測區間的第一訊號檢測下限值時,第一控制電路C121則可以將第一預定訊號檢測區間的第一訊號檢測下限值調小,以檢測較小的傳輸訊號的訊號下限值。When the signal lower limit value of the transmission signal is much smaller than the first signal detection lower limit value of the first predetermined signal detection interval, the first control circuit C121 can adjust the first signal detection lower limit value of the first predetermined signal detection interval to be smaller, so as to detect a smaller signal lower limit value of the transmission signal.

當傳輸訊號的訊號下限值遠高於第一預定訊號檢測區間的第一訊號檢測下限值時,第一控制電路C121則可以將第一預定訊號檢測區間的第一訊號檢測下限值調高,以檢測較高的傳輸訊號的訊號下限值。When the signal lower limit of the transmission signal is much higher than the first signal detection lower limit of the first predetermined signal detection interval, the first control circuit C121 can increase the first signal detection lower limit of the first predetermined signal detection interval to detect a higher signal lower limit of the transmission signal.

第三種方式是根據傳輸訊號的訊號上限值以及訊號下限值調整第一預定訊號檢測區間的第一訊號檢測上限值以及第一訊號檢測下限值。The third method is to adjust the first signal detection upper limit and the first signal detection lower limit of the first predetermined signal detection interval according to the signal upper limit and the signal lower limit of the transmission signal.

也就是,第一控制電路C121可以如圖4所示,調整第一預定訊號檢測區間的第一訊號檢測上限值以及第一訊號檢測下限值,以對傳輸訊號進行檢測。That is, as shown in FIG. 4 , the first control circuit C121 can adjust the first signal detection upper limit and the first signal detection lower limit of the first predetermined signal detection interval to detect the transmission signal.

此外,第一控制電路C121調整第一訊號檢測上限值以及第一訊號檢測下限值可以依據一單位調整區間,每一次調整一次單位調整區間。也可以直接根據傳輸訊號的訊號上限值以及訊號下限值調整第一預定訊號檢測區間的第一訊號檢測上限值以及第一訊號檢測下限值,以產生調整後的第一調整訊號檢測區間。調整後的第一調整訊號檢測區間則是包括調整後的第一調整訊號檢測上限值以及的第一調整訊號檢測下限值。In addition, the first control circuit C121 can adjust the first signal detection upper limit value and the first signal detection lower limit value according to a unit adjustment interval, and the unit adjustment interval is adjusted each time. The first signal detection upper limit and the first signal detection lower limit of the first predetermined signal detection interval can also be directly adjusted according to the signal upper limit and signal lower limit of the transmission signal to generate an adjusted first adjusted signal detection interval. The adjusted first adjusted signal detection interval includes the adjusted first adjusted signal detection upper limit and the first adjusted signal detection lower limit.

類似地,第二電路C13也可以接收第一電路C12發送的傳輸訊號。也就是,多個第二輸入輸出驅動電路C115可以接收設置在第一電路C12的多個第一輸入輸出驅動電路C114發送的傳輸訊號。多個第二輸入輸出驅動電路C115會將接收到的多個傳輸訊號提供至第二控制電路C131。Similarly, the second circuit C13 can also receive the transmission signal sent by the first circuit C12. That is, the plurality of second input-output driving circuits C115 can receive the transmission signals sent by the plurality of first input-output driving circuits C114 disposed in the first circuit C12. The plurality of second input-output driving circuits C115 provide the received transmission signals to the second control circuit C131.

在初始化的過程中,第二控制電路C131調整一第二預定訊號檢測區間與多個傳輸訊號進行檢測,以產生對應多個連接結構組C113的多個第二調整後訊號檢測區間,第二控制電路C131再根據多個調整後訊號檢測區間進行訊號檢測。During the initialization process, the second control circuit C131 adjusts a second predetermined signal detection interval and a plurality of transmission signals for detection to generate a plurality of second adjusted signal detection intervals corresponding to the plurality of connection structure groups C113, and the second control circuit C131 performs signal detection according to the plurality of adjusted signal detection intervals.

也就是,每一個第二輸入輸出驅動電路C115會接收來自第一電路C12傳送的傳輸訊號。不過每一個傳輸訊號通過各自傳送路徑上的第一連接節點組C111、連接結構組C113以及第二連接節點組C112時,會由於第一連接節點組C111、連接結構組C113以及第二連接節點組C112的傳輸狀態,而產生訊號失真或是訊號強度降低(如圖4以及圖5所示)。第二控制電路C131由於會根據第一預定訊號檢測區間,對每一個接收的傳輸訊號進行訊號檢測,以判斷接收的傳輸訊號是一正常訊號。That is, each second input-output driving circuit C115 receives the transmission signal transmitted from the first circuit C12. However, when each transmission signal passes through the first connection node group C111, the connection structure group C113, and the second connection node group C112 on the respective transmission paths, signal distortion or signal strength reduction will occur due to the transmission status of the first connection node group C111, the connection structure group C113, and the second connection node group C112 (as shown in FIG. 4 and FIG. 5 ). The second control circuit C131 performs signal detection on each received transmission signal according to the first predetermined signal detection interval, so as to determine that the received transmission signal is a normal signal.

當多個第二輸入輸出驅動電路C115接收的傳輸訊號有訊號失真或是訊號強度降低的情況,第二控制電路C131會偵測所接收的傳輸訊號的一訊號上限值、一訊號下限值或是其組合,以調整第二預定訊號檢測區間,產生一調整後的第二預定訊號檢測區間。When the transmission signals received by the plurality of second input and output driving circuits C115 have signal distortion or signal intensity reduction, the second control circuit C131 detects a signal upper limit, a signal lower limit or a combination thereof of the received transmission signals to adjust the second predetermined signal detection interval to generate an adjusted second predetermined signal detection interval.

由於每一個第二輸入輸出驅動電路C115對應的第一連接節點組C111、連接結構組C113以及第二連接節點組C112的傳輸狀態未必相同。因此每一組第一連接節點組C111、連接結構組C113以及第二連接節點組C112以及對應的第二輸入輸出驅動電路C115會各自包括一調整後的第二預定訊號檢測區間。第二控制電路C131會根據對應每一個第二輸入輸出驅動電路C115的調整後的第二預定訊號檢測區間,對每一個傳輸訊號進行檢測。而對應每一個第二輸入輸出驅動電路C115的調整後的第二預定訊號檢測區間則會儲存在第二儲存電路C132中。The transmission states of the first connection node group C111 , the connection structure group C113 and the second connection node group C112 corresponding to each second input-output driving circuit C115 are not necessarily the same. Therefore, each of the first connection node group C111 , the connection structure group C113 , the second connection node group C112 and the corresponding second input-output driving circuit C115 each includes an adjusted second predetermined signal detection interval. The second control circuit C131 detects each transmission signal according to the adjusted second predetermined signal detection interval corresponding to each second input-output driving circuit C115. The adjusted second predetermined signal detection interval corresponding to each second input-output driving circuit C115 will be stored in the second storage circuit C132.

如圖4所示,每一組第一連接節點組C111是包括一個第一連接節點C111A。每一組第二連接節點組C112包括一個第二連接節點C112A。每一組連結結構組C113包括一個連結結構C113A。As shown in FIG. 4 , each first connection node group C111 includes a first connection node C111A. Each second connection node group C112 includes a second connection node C112A. Each connection structure group C113 includes a connection structure C113A.

此外,如圖5所示,第一連接節點組C111包括多個第一連接節點C111A,而且第一連接節點組C111的多個第一連接節點C111A是互相連接的。第二連接節點組C112包括多個第二連接節點C112A,第二連接節點組C112的多個第二連接節點C112A是互相連接的。連接結構組C113則是包括多個連接結構C113A。Furthermore, as shown in FIG. 5 , the first connection node group C111 includes a plurality of first connection nodes C111A, and the plurality of first connection nodes C111A of the first connection node group C111 are connected to each other. The second connection node group C112 includes a plurality of second connection nodes C112A, and the plurality of second connection nodes C112A of the second connection node group C112 are connected to each other. The connection structure group C113 includes a plurality of connection structures C113A.

如圖4所示,在本實施例中,每一輸入輸出驅動電路C114包括一輸出端。在輸入輸出驅動電路C121的輸出端則會電性連接一阻抗R。作為輸出控制訊號時的電壓調控阻抗,一般稱為下拉阻抗(pull low resistor)。在其他實施例中,阻抗R也可以不做設置。As shown in FIG. 4 , in this embodiment, each input-output driving circuit C114 includes an output terminal. An impedance R is electrically connected to the output terminal of the input-output driving circuit C121. As a voltage regulation impedance when outputting a control signal, it is generally called a pull-down impedance (pull low resistor). In other embodiments, the impedance R may not be set.

在本實施例中,多個輸入輸出驅動電路C114可以連接一控制電路C121或是一邏輯電路(圖未示),在本發明不做限制。第二電路C13則可以包括多個記憶體電路C131、一控制電路或是一應用電路,在本發明中也不做限制。也就是,設置在第二電路3的多個第二連接節點C112A連接的電路並沒有任何限制。In this embodiment, the multiple input and output driving circuits C114 may be connected to a control circuit C121 or a logic circuit (not shown in the figure), which is not limited in the present invention. The second circuit C13 may include a plurality of memory circuits C131, a control circuit or an application circuit, which are not limited in the present invention. That is, the circuits connected to the plurality of second connection nodes C112A provided in the second circuit 3 are not limited in any way.

也就是,第一電路C12與第二電路C13在進行堆疊程序的時候,會進行對位後再進行連結:例如晶圓鍵合(wafer bonding)、打線 (wire bonding),以進行第一電路C12與第二電路C13的堆疊設置。在電路對位的時候,精度相當重要。第一電路C12與第二電路C13之間的距離,則會影響輸入及輸出電路1連結第一電路C12與第二電路C13的良率。在本實施例中,連結結構C113A可以是例如排針結構、晶圓鍵合結構(wafer bonding)或是打線結構(wire bonding)。That is, when the first circuit C12 and the second circuit C13 are performing the stacking process, they will be connected after alignment: such as wafer bonding (wafer bonding), wire bonding (wire bonding), so as to perform the stacking arrangement of the first circuit C12 and the second circuit C13. When the circuit is aligned, the accuracy is very important. The distance between the first circuit C12 and the second circuit C13 will affect the yield rate of the input and output circuit 1 connecting the first circuit C12 and the second circuit C13. In this embodiment, the connecting structure C113A may be, for example, a pin header structure, a wafer bonding structure (wafer bonding) or a wire bonding structure (wire bonding).

在本實施例中,第一電路C12與第二電路C13可以是晶圓級電路(wafer)、晶片級電路(chip)或是一般尺度的電路等。輸入輸出驅動電路C121則是互補式金屬氧化物半導體輸入端口(CMOS IO logic)。In this embodiment, the first circuit C12 and the second circuit C13 may be a wafer-level circuit (wafer), a chip-level circuit (chip), or a general-scale circuit. The input and output driving circuit C121 is a CMOS IO logic.

第一儲存電路C122以及第二儲存電路C132是一快閃記憶體、一唯讀記憶體、一可規化唯讀記憶體、一電可改寫唯讀記憶體、一可擦可規化唯讀記憶體或是一電可擦可規化唯讀記憶體。The first storage circuit C122 and the second storage circuit C132 are a flash memory, a read-only memory, a programmable read-only memory, an electrically rewritable read-only memory, an erasable programmable read-only memory or an electrically erasable programmable read-only memory.

[第三實施例][Third embodiment]

請參閱圖6,圖6是本發明第三實施例的晶片裝置的示意圖。Please refer to FIG. 6 . FIG. 6 is a schematic diagram of a wafer device according to a third embodiment of the present invention.

在本實施例的晶片裝置C3以及輸入及輸出電路C31與第二實施例的晶片裝置C1以及輸入及輸出電路C11類似,其主要的差異是在第一控制電路C321以及第二控制電路C331對於第一輸入輸出驅動電路C314及第二輸入輸出驅動電路C315的控制動作。The chip device C3 and the input and output circuit C31 of this embodiment are similar to the chip device C1 and the input and output circuit C11 of the second embodiment, and the main difference is the control action of the first input and output driving circuit C314 and the second input and output driving circuit C315 in the first control circuit C321 and the second control circuit C331.

在本實施例中,多個第一輸入輸出驅動電路C314接收來自第二電路C315發送的多個傳輸訊號,並將多個傳輸訊號提供至第一控制電路C321。當多個傳輸訊號的其中一個或是多個未能正確地被傳送至第一控制電路C321時,第二控制電路C331則調整對應的第二輸入輸出驅動電路C315的輸出量級,以調整傳輸訊號的輸出大小。In this embodiment, the plurality of first input and output driving circuits C314 receive the plurality of transmission signals sent from the second circuit C315, and provide the plurality of transmission signals to the first control circuit C321. When one or more of the transmission signals are not correctly transmitted to the first control circuit C321, the second control circuit C331 adjusts the output level of the corresponding second input-output driving circuit C315 to adjust the output size of the transmission signal.

例如,第二控制電路C331調整第二輸入輸出驅動電路C315的傳輸訊號的輸出大小的方式,可以是漸次地以一預定輸出大小區間增加或是減少,以調整所述傳輸訊號的輸出大小。類似地,第二控制電路C331調整第二輸入輸出驅動電路C315的傳輸訊號的輸出大小可以儲存在第二儲存電路C332中。For example, the way the second control circuit C331 adjusts the output size of the transmission signal of the second input-output driving circuit C315 may be to gradually increase or decrease the output size in a predetermined range to adjust the output size of the transmission signal. Similarly, the output size of the transmission signal adjusted by the second control circuit C331 of the second input-output driving circuit C315 can be stored in the second storage circuit C332.

在其他實施例中,第二控制電路C331也可以直接增加或是減少一較大的輸出大小區間。In other embodiments, the second control circuit C331 can also directly increase or decrease a larger output size range.

在本實施例中,第一電路C32的第一控制電路C321與第二電路C33的第二控制電路C331是利用一通訊路徑CP1進行通訊連接。通訊路徑CP1是設置在第一電路C32以及第二電路C33之間。In this embodiment, the first control circuit C321 of the first circuit C32 is connected to the second control circuit C331 of the second circuit C33 through a communication path CP1. The communication path CP1 is set between the first circuit C32 and the second circuit C33.

[第四實施例][Fourth embodiment]

請參閱圖7,圖7是本發明第四實施例的晶片裝置的示意圖。Please refer to FIG. 7 . FIG. 7 is a schematic diagram of a wafer device according to a fourth embodiment of the present invention.

在本實施例的晶片裝置C5以及輸入及輸出電路C51與第二實施例的晶片裝置C1以及輸入及輸出電路C11類似,其主要的差異是在第一控制電路C521以及第二控制電路C531對於第一輸入輸出驅動電路C514及第二輸入輸出驅動電路C515的控制動作。The chip device C5 and the input and output circuit C51 in this embodiment are similar to the chip device C1 and the input and output circuit C11 in the second embodiment, the main difference is the control action of the first input and output driving circuit C514 and the second input and output driving circuit C515 in the first control circuit C521 and the second control circuit C531.

在本實施例中,多個第一輸入輸出驅動電路C514接收來自第二電路C53發送的多個傳輸訊號,並將多個傳輸訊號提供至第一控制電路C521,當多個傳輸訊號的其中一個或是多個未能正確地傳送到第一電路C52的第一控制電路C521時,第二控制電路C531則會通過通訊路徑CP2通知第一控制電路C521調整對應的第一輸入輸出驅動電路C514調整訊號檢測區間,以檢測傳輸訊號。也就是,第一控制電路C521可以如第一實施例類似地調整第一預定訊號檢測區間的大小。In this embodiment, the plurality of first input-output driving circuits C514 receive the plurality of transmission signals sent from the second circuit C53, and provide the plurality of transmission signals to the first control circuit C521. When one or more of the plurality of transmission signals cannot be correctly transmitted to the first control circuit C521 of the first circuit C52, the second control circuit C531 will notify the first control circuit C521 to adjust the corresponding first input-output driving circuit C514 to adjust the signal detection interval through the communication path CP2 to detect the transmission signal. That is, the first control circuit C521 can adjust the size of the first predetermined signal detection interval similarly to the first embodiment.

在本實施例中,第一電路C52的第一控制電路C521與第二電路C53的第二控制電路C531是利用一通訊路徑CP2進行通訊連接。通訊路徑CP2是設置在第一電路C52以及第二電路C53之間。In this embodiment, the first control circuit C521 of the first circuit C52 is connected to the second control circuit C531 of the second circuit C53 through a communication path CP2. The communication path CP2 is set between the first circuit C52 and the second circuit C53.

[實施例的有益效果][Advantageous Effects of Embodiment]

本發明的其中一有益效果在於,本發明所提供的輸入及輸出電路以及晶片裝置,可以通過調整第一電路的第一預定訊號檢測區間或是第二電路的第二預定訊號檢測區間以有效提高晶圓電路之間的連接電路的利用率,也可以因此提升電路以及晶片裝置的使用效益。One of the beneficial effects of the present invention is that the input and output circuits and the chip device provided by the present invention can effectively improve the utilization rate of the connection circuit between the wafer circuits by adjusting the first predetermined signal detection interval of the first circuit or the second predetermined signal detection interval of the second circuit, and thus improve the use efficiency of the circuit and the chip device.

以上所公開的內容僅為本發明的優選可行實施例,並非因此侷限本發明的申請專利範圍,所以凡是運用本發明說明書及圖式內容所做的等效技術變化,均包含於本發明的申請專利範圍內。The content disclosed above is only a preferred feasible embodiment of the present invention, and does not limit the scope of the patent application of the present invention. Therefore, all equivalent technical changes made by using the description and drawings of the present invention are included in the scope of the patent application of the present invention.

C1:晶片裝置 1, C11:輸入及輸出電路 2, C12:第一電路 3, C13:第二電路 11, C111:第一連接節點組 12, C112:第二連接節點組 13, C113:連接結構組 14, C114:第一輸入輸出驅動電路 15, C115:第一輸入輸出驅動電路 21, C121:第一控制電路 22, C122:第一儲存電路 R:阻抗 31, C131:第二控制電路 32, C132:第二儲存電路 11A, C111A:第一連接節點 12A, C112A:第二連接節點 13A, C113A:連接結構 SB:基板 C1: wafer device 1, C11: input and output circuit 2, C12: the first circuit 3, C13: Second circuit 11, C111: The first connection node group 12, C112: Second connection node group 13, C113: Connection structure group 14, C114: the first input and output drive circuit 15, C115: the first input and output drive circuit 21, C121: the first control circuit 22, C122: the first storage circuit R: Impedance 31, C131: Second control circuit 32, C132: Second storage circuit 11A, C111A: first connection node 12A, C112A: Second connection node 13A, C113A: connection structure SB: Substrate

圖1是多個電路通過輸入及輸出電路進行堆疊的示意圖。FIG. 1 is a schematic diagram of stacking multiple circuits through input and output circuits.

圖2是本發明第一實施例的輸入及輸出電路的示意圖。FIG. 2 is a schematic diagram of the input and output circuits of the first embodiment of the present invention.

圖3是本發明第一實施例的輸入及輸出電路的另一示意圖。FIG. 3 is another schematic diagram of the input and output circuits of the first embodiment of the present invention.

圖4是本發明第二實施例的晶片裝置的示意圖。FIG. 4 is a schematic diagram of a wafer device according to a second embodiment of the present invention.

圖5是本發明第二實施例的晶片裝置的另一示意圖。FIG. 5 is another schematic view of the wafer device according to the second embodiment of the present invention.

圖6是本發明第三實施例的晶片裝置的示意圖。FIG. 6 is a schematic diagram of a wafer device according to a third embodiment of the present invention.

圖7是本發明第四實施例的晶片裝置的示意圖。FIG. 7 is a schematic diagram of a wafer device according to a fourth embodiment of the present invention.

1:輸入及輸出電路 2:第一電路 3:第二電路 11:第一連接節點組 12:第二連接節點組 13:連接結構組 14:第一輸入輸出驅動電路 15:第一輸入輸出驅動電路 21:第一控制電路 22:第一儲存電路 R:阻抗 31:第二控制電路 32:第二儲存電路 11A:第一連接節點 12A:第二連接節點 13A:連接結構 1: Input and output circuit 2: The first circuit 3: The second circuit 11: The first connection node group 12: The second connection node group 13: Connection structure group 14: The first input and output drive circuit 15: The first input and output drive circuit 21: The first control circuit 22: the first storage circuit R: Impedance 31: Second control circuit 32: the second storage circuit 11A: first connection node 12A: the second connection node 13A: Connection structure

Claims (10)

一種輸入及輸出電路,適用於連接一第一電路以及一第二電路,所述輸入及輸出電路設置在所述第一電路以及所述第二電路之間,所述第一電路包括一第一控制電路,所述第二電路包括一第二控制電路,所述輸入及輸出電路包括:多組第一連接節點組,所述多組第一連接節點組設置在所述第一電路的一側;多組第二連接節點組,所述多組第二連接節點組設置在所述第二電路的一側,所述多組第一連接節點組與所述多組第二連接節點組是對應設置的,每一組所述第一連接節點組對應設置一組所述第二連接節點組;多組連接結構組,設置在所述多組第一連接節點組以及所述多組第二連接節點組之間;多個第一輸入輸出驅動電路,每一所述第一輸入輸出驅動電路電性連接一組所述第一連接節點組,所述第一控制電路連接所述多個第一輸入輸出驅動電路;多個第二輸入輸出驅動電路,每一所述第二輸入輸出驅動電路電性連接一組所述第二連接節點組,所述第二控制電路連接所述多個第二輸入輸出驅動電路;其中,所述多個第一輸入輸出驅動電路接收來自所述第二電路發送的多個傳輸訊號,並將所述多個傳輸訊號提供至所述第一控制電路,當所述多個傳輸訊號的其中一個或是多個未能正確被傳送至所述第一電路時,所述第二控制電路調整未能正確傳輸所述傳輸訊號的對應的所述第二輸入輸出驅動電路的所述傳輸訊號的輸出大小,所述第二控制電路調整所述第二輸入輸出驅動電路的所述傳輸訊號的輸出大小是漸次地以一預定輸出大小區間增加或是減少以調整所述傳輸訊號的輸出大小。 An input and output circuit, suitable for connecting a first circuit and a second circuit, the input and output circuit is arranged between the first circuit and the second circuit, the first circuit includes a first control circuit, the second circuit includes a second control circuit, the input and output circuit includes: multiple sets of first connection node groups, the multiple sets of first connection node groups are arranged on one side of the first circuit; Each group of the first connection node groups is correspondingly provided with a group of the second connection node groups; multiple groups of connection structures are arranged between the multiple groups of the first connection node groups and the multiple groups of the second connection node groups; a plurality of first input-output drive circuits, each of the first input-output drive circuits is electrically connected to a group of the first connection node groups, and the first control circuit is connected to the plurality of first input-output drive circuits; a plurality of second input-output drive circuits, each of the second input-output drive circuits is electrically connected to a group of the second connection node groups, and the second control circuit is connected to the plurality of second input-output drive circuits; The driving circuit receives multiple transmission signals sent from the second circuit, and provides the multiple transmission signals to the first control circuit. When one or more of the multiple transmission signals cannot be correctly transmitted to the first circuit, the second control circuit adjusts the output size of the transmission signal of the corresponding second input-output drive circuit that fails to transmit the transmission signal correctly. The second control circuit adjusts the output size of the transmission signal of the second input-output drive circuit. 一種輸入及輸出電路,適用於連接一第一電路以及一第二電路,所述輸入及輸出電路設置在所述第一電路以及所述第二電路之間,所述第一電路包括一第一控制電路,所述第二電路包括一第二控制電路,所述輸入及輸出電路包括:多組第一連接節點組,所述多組第一連接節點組設置在所述第一電路的一側;多組第二連接節點組,所述多組第二連接節點組設置在所述第二電路的一側,所述多組第一連接節點組與所述多組第二連接節點組是對應設置的,每一組所述第一連接節點組對應設置一組所述第二連接節點組;多組連接結構組,設置在所述多組第一連接節點組以及所述多組第二連接節點組之間;多個第一輸入輸出驅動電路,每一所述第一輸入輸出驅動電路電性連接一組所述第一連接節點組,所述第一控制電路連接所述多個第一輸入輸出驅動電路;多個第二輸入輸出驅動電路,每一所述第二輸入輸出驅動電路電性連接一組所述第二連接節點組,所述第二控制電路連接所述多個第二輸入輸出驅動電路;其中,所述多個第一輸入輸出驅動電路接收來自所述第二電路發送的多個傳輸訊號,並將所述多個傳輸訊號提供至所述第一控制電路,當所述多個傳輸訊號的其中一個或是多個未能正確被傳送至所述第一電路時,所述第二控制電路通過一通訊路徑提供一通知訊號,以通知所述第一控制電路調整對應的所述第一輸入輸出驅動電路調整訊號檢測區間,以檢測所述傳輸訊號,所述通訊路徑設置在所述第一電路以及所述第二電路之間。 An input and output circuit, suitable for connecting a first circuit and a second circuit, the input and output circuit is arranged between the first circuit and the second circuit, the first circuit includes a first control circuit, the second circuit includes a second control circuit, the input and output circuit includes: multiple sets of first connection node groups, the multiple sets of first connection node groups are arranged on one side of the first circuit; Each group of the first connection node groups is correspondingly provided with a group of the second connection node groups; multiple groups of connection structures are arranged between the multiple groups of the first connection node groups and the multiple groups of the second connection node groups; a plurality of first input-output drive circuits, each of the first input-output drive circuits is electrically connected to a group of the first connection node groups, and the first control circuit is connected to the plurality of first input-output drive circuits; a plurality of second input-output drive circuits, each of the second input-output drive circuits is electrically connected to a group of the second connection node groups, and the second control circuit is connected to the plurality of second input-output drive circuits; The driving circuit receives multiple transmission signals sent from the second circuit, and provides the multiple transmission signals to the first control circuit. When one or more of the multiple transmission signals cannot be correctly transmitted to the first circuit, the second control circuit provides a notification signal through a communication path to notify the first control circuit to adjust the corresponding first input and output drive circuit to adjust the signal detection interval to detect the transmission signal. The communication path is set between the first circuit and the second circuit. 如請求項2所述的輸入及輸出電路,其中,每一所述傳輸訊號包括一訊號上限值以及一訊號下限值,一第一預定訊號檢 測區間包括一第一訊號檢測上限值以及一第一訊號檢測下限值,所述第一控制電路調整所述第一訊號檢測上限值以產生一第一調整訊號檢測區間的一第一調整訊號檢測上限值。 The input and output circuit as described in claim 2, wherein each of the transmission signals includes a signal upper limit value and a signal lower limit value, a first predetermined signal detection The detection interval includes a first signal detection upper limit and a first signal detection lower limit, and the first control circuit adjusts the first signal detection upper limit to generate a first adjustment signal detection upper limit of a first adjustment signal detection interval. 如請求項2所述的輸入及輸出電路,其中,每一所述傳輸訊號包括一訊號上限值以及一訊號下限值,一第一預定訊號檢測區間包括一第一訊號檢測上限值以及一第一訊號檢測下限值,所述第一控制電路調整所述第一訊號檢測下限值以產生一第一調整預定訊號檢測區間的一第一調整訊號檢測下限值。 The input and output circuit according to claim 2, wherein each of the transmission signals includes a signal upper limit and a signal lower limit, a first predetermined signal detection interval includes a first signal detection upper limit and a first signal detection lower limit, and the first control circuit adjusts the first signal detection lower limit to generate a first adjusted signal detection lower limit of the first adjusted predetermined signal detection interval. 如請求項2所述的輸入及輸出電路,其中,每一所述傳輸訊號包括一訊號上限值以及一訊號下限值,一第一預定訊號檢測區間包括一第一預定訊號上限值以及一第一預定訊號下限值,所述第一控制電路調整所述第一預定訊號檢測區間的一第一預定訊號上限值與所述第一預定訊號下限值,以產生所述第一調整訊號檢測區間的一第一調整訊號檢測上限值以及一第一調整訊號檢測下限值。 The input and output circuit according to claim 2, wherein each of the transmission signals includes a signal upper limit and a signal lower limit, and a first predetermined signal detection interval includes a first predetermined signal upper limit and a first predetermined signal lower limit, and the first control circuit adjusts the first predetermined signal upper limit and the first predetermined signal lower limit in the first predetermined signal detection interval to generate a first adjusted signal detection upper limit and a first adjusted signal detection lower limit in the first adjusted signal detection interval. 如請求項2所述的輸入及輸出電路,其中,所述第二電路還包括一第二儲存電路,所述第二控制電路電性連接所述第二儲存電路,所述輸入及輸出電路還包括多個第二輸入輸出驅動電路,所述多個第二輸入輸出驅動電路分別電性連接所述多個第二連接節點組,所述多個第二輸入輸出驅動電路電性連接所述第二控制電路;其中,所述多個第二輸入輸出驅動電路接收來自所述第一電路發送的多個傳輸訊號,並將所述多個傳輸訊號提供至所述第二控制電路,以產生對應所述多個連接結構組的多個第二調整訊號檢測區間,接著,所述第二控制電路根據所述多個第二調整訊號檢測區間進行訊號檢測。 The input and output circuit according to claim 2, wherein the second circuit further includes a second storage circuit, the second control circuit is electrically connected to the second storage circuit, the input and output circuit further includes a plurality of second input and output driving circuits, the plurality of second input and output driving circuits are respectively electrically connected to the plurality of second connection node groups, and the plurality of second input and output driving circuits are electrically connected to the second control circuit; wherein the plurality of second input and output driving circuits receive a plurality of transmission signals sent from the first circuit, and provide the plurality of transmission signals to the second control circuit to generate corresponding connections A plurality of second adjustment signal detection intervals are configured, and then, the second control circuit performs signal detection according to the plurality of second adjustment signal detection intervals. 一種晶片裝置,包括:一第一電路,包括一第一控制電路以及一第一儲存電路,所述第一控制電路電性連接所述第一儲存電路;一第二電路,包括一第二控制電路以及多個第二輸入輸出驅動電路,所述第二控制電路連接所述多個第二輸入輸出驅動電路;以及一輸入及輸出電路,包括:多個第一連接節點組;多個第二連接節點組;多個連接結構組,所述多組連接結構組分別連接所述多組第一連接節點組以及所述多組第二連接節點組;以及多個第一輸入輸出驅動電路,每一所述第一輸入輸出驅動電路電性連接一組所述第一連接節點組,每一所述第二輸入輸出驅動電路電性連接一組所述第二連接節點組;其中,所述多個第一輸入輸出驅動電路接收來自所述第二電路發送的多個傳輸訊號,並將所述多個傳輸訊號提供至所述第一控制電路,當所述多個傳輸訊號的其中一個或是多個未能正確被傳送至所述第一電路時,所述第二控制電路調整對應的所述第二輸入輸出驅動電路的所述傳輸訊號的輸出大小,所述第二控制電路調整所述第二輸入輸出驅動電路的所述傳輸訊號的輸出大小是漸次地以一預定輸出大小區間增加或是減少以調整所述傳輸訊號的輸出大小。 A chip device, comprising: a first circuit, including a first control circuit and a first storage circuit, the first control circuit is electrically connected to the first storage circuit; a second circuit, including a second control circuit and a plurality of second input-output driving circuits, the second control circuit is connected to the plurality of second input-output driving circuits; and an input and output circuit, including: a plurality of first connection node groups; a plurality of second connection node groups; Each of the first input-output drive circuits is electrically connected to a set of first connection node groups, and each of the second input-output drive circuits is electrically connected to a set of second connection node groups; wherein, the plurality of first input-output drive circuits receive multiple transmission signals sent from the second circuit, and provide the multiple transmission signals to the first control circuit. The output size of the transmission signal is gradually increased or decreased in a predetermined output size interval to adjust the output size of the transmission signal. 一種晶片裝置,包括:一第一電路,包括一第一控制電路以及一第一儲存電路,所述第一控制電路電性連接所述第一儲存電路;一第二電路,包括一第二控制電路;以及一輸入及輸出電路,包括: 多個第一連接節點組;多個第二連接節點組;多個連接結構組,所述多組連接結構組分別連接所述多組第一連接節點組以及所述多組第二連接節點組;以及多個第一輸入輸出驅動電路,每一所述輸入輸出驅動電路電性連接一組所述第一連接節點組;其中,所述多個第一輸入輸出驅動電路接收來自所述第二電路發送的多個傳輸訊號,並將所述多個傳輸訊號提供至所述第一控制電路,當所述多個傳輸訊號的其中一個或是多個未能正確被傳送至所述第一電路時,所述第二電路的所述第二控制電路通過一通訊路徑,提供一通知訊號,以通知所述第一控制電路調整對應的所述第一輸入輸出驅動電路調整訊號檢測區間,以檢測所述傳輸訊號,所述通訊路徑設置在所述第一電路以及所述第二電路之間。 A chip device, comprising: a first circuit including a first control circuit and a first storage circuit, the first control circuit electrically connected to the first storage circuit; a second circuit including a second control circuit; and an input and output circuit including: A plurality of first connection node groups; a plurality of second connection node groups; a plurality of connection structure groups, the plurality of connection structure groups are respectively connected to the plurality of first connection node groups and the plurality of second connection node groups; and a plurality of first input-output drive circuits, each of which is electrically connected to a set of the first connection node groups; wherein, the plurality of first input-output drive circuits receive a plurality of transmission signals sent from the second circuit, and provide the plurality of transmission signals to the first control circuit, when one or more of the plurality of transmission signals is not correctly transmitted to the first circuit, The second control circuit of the second circuit provides a notification signal through a communication path to notify the first control circuit to adjust the corresponding first input-output drive circuit to adjust the signal detection interval to detect the transmission signal, and the communication path is set between the first circuit and the second circuit. 如請求項8所述的晶片裝置,其中,每一所述傳輸訊號包括一訊號上限值以及一訊號下限值,一第一預定訊號檢測區間包括一第一訊號檢測上限值以及一第一訊號檢測下限值,所述第一控制電路調整所述第一訊號檢測上限值以產生一第一調整訊號檢測區間的一第一調整訊號檢測上限值,或是所述第一控制電路調整所述第一訊號檢測下限值以產生所述第一調整預定訊號檢測區間的一第一調整訊號檢測下限值。 The chip device according to claim 8, wherein each of the transmission signals includes a signal upper limit and a signal lower limit, a first predetermined signal detection interval includes a first signal detection upper limit and a first signal detection lower limit, the first control circuit adjusts the first signal detection upper limit to generate a first adjusted signal detection upper limit in a first adjusted signal detection interval, or the first control circuit adjusts the first signal detection lower limit to generate a first adjusted signal detection lower limit in the first adjusted predetermined signal detection interval. 如請求項8所述的晶片裝置,其中,每一所述傳輸訊號包括一訊號上限值以及一訊號下限值,一第一預定訊號檢測區間包括一第一預定訊號上限值以及一第一預定訊號下限值,所述第一控制電路調整所述第一預定訊號檢測區間的所述第一預定訊號上限值與所述第一預定訊號下限值,以產生一第一調整訊號檢測區間的一第一調整訊號檢測上限值以及一第一 調整訊號檢測下限值。 The chip device according to claim 8, wherein each of the transmission signals includes a signal upper limit and a signal lower limit, and a first predetermined signal detection interval includes a first predetermined signal upper limit and a first predetermined signal lower limit, and the first control circuit adjusts the first predetermined signal upper limit and the first predetermined signal lower limit in the first predetermined signal detection interval to generate a first adjusted signal detection upper limit and a first adjusted signal detection interval. Adjust the signal detection lower limit.
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