TWI802723B - Evaporation process jig - Google Patents
Evaporation process jig Download PDFInfo
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- TWI802723B TWI802723B TW108124213A TW108124213A TWI802723B TW I802723 B TWI802723 B TW I802723B TW 108124213 A TW108124213 A TW 108124213A TW 108124213 A TW108124213 A TW 108124213A TW I802723 B TWI802723 B TW I802723B
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- vapor deposition
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- Physical Vapour Deposition (AREA)
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Abstract
Description
本發明有關於一種蒸鍍製程治具改良設計,尤指一種可避免工件於蒸鍍製程中受損之蒸鍍製程治具。 The invention relates to an improved design of a vapor deposition process fixture, in particular to a vapor deposition process fixture which can prevent workpieces from being damaged during the vapor deposition process.
在工件(例如晶圓)的蒸鍍製程作業中,產線人員需要將工件放入蒸鍍治具的承載盤內,將蒸鍍治具的上蓋蓋上,接著收入蒸鍍鍋內,然後開始進行蒸鍍製程。 During the evaporation process of workpieces (such as wafers), the production line personnel need to put the workpiece into the carrier tray of the evaporation fixture, cover the upper cover of the evaporation fixture, then put it into the evaporation pot, and then start Perform evaporation process.
當蒸鍍製程結束後,產線人員將工件從承載盤中取出,接著將工件收入工件旋轉盒內。 When the evaporation process is over, the production line personnel take out the workpiece from the carrier tray, and then put the workpiece into the workpiece rotating box.
於上述蒸鍍製程中,很容易造成工件異常。以晶圓為例,薄化後的晶圓很容易因為外力作用而受損,例如,當蓋上蒸鍍治具的上蓋時,由於上蓋直接抵壓於晶圓上,因此很容易造成晶圓損傷。此外,由於某些外力影響,例如操作人員於作業中所施加的外力,或蒸鍍鍋於蒸鍍製程旋轉時所產生的外力,都很容易造成晶圓受損。而目前的蒸鍍製程治具皆無法有效降低控制上述異常的發生率。 In the above vapor deposition process, it is easy to cause workpiece abnormality. Taking the wafer as an example, the thinned wafer is easily damaged by external force. For example, when the upper cover of the evaporation fixture is covered, because the upper cover is directly pressed against the wafer, it is easy to cause the wafer to be damaged. damage. In addition, due to some external force, such as the external force exerted by the operator during the operation, or the external force generated when the evaporation pot rotates during the evaporation process, the wafer is easily damaged. However, none of the current evaporation process fixtures can effectively reduce and control the occurrence rate of the above abnormalities.
據此,如何能有一種可避免工件於蒸鍍製程中受損之『蒸鍍製程治具』,是相關技術領域人士亟待解決之課題。 Accordingly, how to have an "evaporation process jig" that can prevent workpieces from being damaged during the evaporation process is an urgent problem to be solved by people in the relevant technical field.
於一實施例中,本發明提出一種蒸鍍製程治具,包含:一承載盤,用以承載至少一工件;以及一上蓋,於其所具有之一第一面之週緣設有至少一緩衝件,緩衝件突出於第一面,緩衝件的硬度小於工件的硬度,上蓋之第一面朝向承載盤設置於承載盤上且該緩衝件抵壓於工件。 In one embodiment, the present invention provides an evaporation process jig, comprising: a carrier plate for carrying at least one workpiece; and an upper cover with at least one buffer member disposed on the periphery of a first surface thereof. , the cushioning piece protrudes from the first surface, the hardness of the cushioning piece is smaller than that of the workpiece, the first surface of the upper cover faces the carrying plate and is arranged on the carrying plate, and the cushioning piece presses against the workpiece.
1:蒸鍍製程治具 1: Evaporation process fixture
10:上蓋 10: Upper cover
11、11A、11B:第一面 11, 11A, 11B: the first side
111、111A、111B:凹槽 111, 111A, 111B: groove
12、12A、12B:緩衝件 12, 12A, 12B: Buffer
20:承載盤 20: carrying plate
30:工件 30: Workpiece
31:無效區域 31: invalid area
H、HA、HB:高度 H, HA, HB: Height
W、WA:徑向寬度 W, WA: radial width
WB:橫斷面尺寸 WB: cross section size
圖1為本發明之一實施例之分解結構示意圖。 Fig. 1 is a schematic diagram of an exploded structure of an embodiment of the present invention.
圖2為圖1實施例之上蓋之分解結構示意圖。 FIG. 2 is a schematic diagram of an exploded structure of the top cover of the embodiment in FIG. 1 .
圖3為圖1實施例之剖面結構示意圖。 Fig. 3 is a schematic cross-sectional structure diagram of the embodiment in Fig. 1 .
圖4為圖1實施例之上蓋設置於承載盤上之結構示意圖。 FIG. 4 is a schematic diagram of the structure of the upper cover disposed on the carrier tray in the embodiment of FIG. 1 .
圖5為本發明之上蓋另一實施例之底部結構示意圖。 Fig. 5 is a schematic diagram of the bottom structure of another embodiment of the top cover of the present invention.
圖6為圖5實施例之A-A剖面結構示意圖。 Fig. 6 is a schematic diagram of the A-A sectional structure of the embodiment in Fig. 5 .
圖7為本發明之上蓋又一實施例之底部結構示意圖。 Fig. 7 is a schematic diagram of the bottom structure of another embodiment of the top cover of the present invention.
圖8為圖7實施例之B-B剖面結構示意圖。 Fig. 8 is a schematic diagram of the B-B sectional structure of the embodiment in Fig. 7 .
請參閱圖1至圖3所示,本發明所提供之一種蒸鍍製程治具1,包含一上蓋10與一承載盤20。承載盤20用以承載工件30。上蓋10於其所具有之一第一面11之週緣設有一緩衝件12。於本實施例中,於上蓋10之第一面11
設有一圓環形之凹槽111,於凹槽111內設有一呈圓環形之緩衝件12。
Referring to FIG. 1 to FIG. 3 , an
請參閱圖2及圖3所示,緩衝件12嵌設於凹槽111內,緩衝件12突出於第一面11一高度H,高度H的範圍不限,例如,可介於0.1~3公厘之範圍。緩衝件12具有一徑向寬度W,徑向寬度W的尺寸不限,例如,可介於1~2.5公厘之範圍。於工件30之週緣具有一無效區域31,緩衝件12的位置相對應於無效區域31。無效區域31之尺寸不限,就晶圓而言,無效區域大約為晶圓周緣約3公厘區域。
2 and 3, the
關於本案可採用的緩衝件12,其材質不限,例如,可為橡膠或泡棉其中之一。更進一步地,緩衝件12的材質可為矽橡膠(silicone)或氟橡膠(FKM、Viton)其中之一。
Regarding the
由於緩衝件12直接抵壓於工件30上,因此緩衝件12的硬度必須小於工件30的硬度,例如,緩衝件12的硬度可介於邵氏硬度(Shore Hardness)30~90度之範圍。
Since the
此外,緩衝件12具有耐熱特性,例如耐熱溫度可介於攝氏-20~290度之範圍,以適用於高溫的蒸鍍製程。
In addition, the
請參閱圖3及圖4所示,將工件30置放於承載盤20中之後,將上蓋10之第一面11朝向承載盤20設置於承載盤20上且緩衝件12抵壓於工件30的無效區域31,如圖4所示,而後,操作人員即可將承載有工件30的蒸鍍製程治具1送入蒸鍍鍋(圖中未示出)內,然後開始進行蒸鍍製程。
3 and 4, after the
由於緩衝件12的硬度小於工件30的硬度,且緩衝件12為具有彈性的橡膠或泡棉所組成,因此可避免上蓋10直接接觸工件30而導致工件30損傷。
Since the hardness of the
請參閱圖5及圖6所示,於本實施例中,上蓋10A的第一面11A設有一圓環形之凹槽111A,於凹槽111A內設有複數呈弧形之緩衝件12A。緩衝件12A突出於第一面11A之高度HA介於0.1~3公厘之範圍。每一呈弧形之緩衝件12A之徑向寬度WA介於1~2.5公厘之範圍。
Please refer to FIG. 5 and FIG. 6 , in this embodiment, the
請參閱圖7及圖8所示,於本實施例中,上蓋10B的第一面11B設有複數凹槽111B,於每一凹槽111B內設有一呈柱狀之緩衝件12B。緩衝件12B突出於第一面11B之高度HB介於0.1~3公厘之範圍。每一呈柱狀之緩衝件12B之橫斷面尺寸WB介於1~2.5公厘之範圍。
Please refer to FIG. 7 and FIG. 8 , in this embodiment, the
必須說明的是,圖5中的緩衝件12A的長度可依所需改變,數量也不限圖中的四個,而且,圖5的圓環形凹槽111A內亦可設置如圖7的柱狀之緩衝件12B,此外,圖7的凹槽111B的形狀與緩衝件12B相對應即可,不限圖示的圓柱型。
It must be noted that the length of the
綜觀圖3、圖5、圖7所示實施例,雖然緩衝件的態樣略有不同,但是都不脫離本發明之主要技術特徵,亦即,緩衝件突出設置於上蓋之一面,將上蓋蓋上工件的承載盤時,緩衝件可抵壓於工件表面,使上蓋不致與工件直接接觸。 Looking at the embodiments shown in Fig. 3, Fig. 5 and Fig. 7, although the appearance of the buffer is slightly different, they all do not deviate from the main technical features of the present invention, that is, the buffer is protrudingly arranged on one side of the upper cover, and the upper cover is covered. When the loading plate of the workpiece is put on, the buffer member can be pressed against the surface of the workpiece, so that the upper cover will not be in direct contact with the workpiece.
因此,於本案圖示實施例中的緩衝件雖然皆是以嵌設於凹槽中的方式設置於上蓋,然亦可以黏著或藉由螺絲或其他固定件固定等方式使緩衝件連接於上蓋,不限圖示嵌設於凹槽的方式。 Therefore, although the buffer members in the illustrated embodiment of this case are all arranged on the upper cover in the manner of being embedded in the groove, the buffer members can also be connected to the upper cover by means of adhesion or fixing by screws or other fixing members. The way shown in the figure is not limited to being embedded in the groove.
綜上所述,本發明所提供之蒸鍍製程治具,由於在上蓋設有緩衝件與工件接觸,因此能避免上蓋與工件直接接觸而對工件造成損傷,且藉由緩衝件的抵壓可對工件提供固定力,避免操作人員於作業中所施加的外 力或蒸鍍鍋於蒸鍍製程旋轉時所產生的外力而對工件造成損傷。經實際驗證,以晶圓為例,本發明可增加機台產能114%,提高生產良率。 To sum up, the vapor deposition process jig provided by the present invention can avoid damage to the workpiece due to direct contact between the upper cover and the workpiece because the upper cover is provided with a buffer member to contact the workpiece, and the pressure of the buffer member can Provide a fixed force on the workpiece, avoiding the external force exerted by the operator during the operation The external force generated when the evaporation pot rotates during the evaporation process will cause damage to the workpiece. Through actual verification, taking wafers as an example, the present invention can increase the production capacity of the machine by 114%, and improve the production yield.
雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明的精神和範圍內,當可作些許的更動與潤飾,故本發明的保護範圍當視後附的申請專利範圍所界定者為準。 Although the present invention has been disclosed above with the embodiments, it is not intended to limit the present invention. Anyone with ordinary knowledge in the technical field may make some changes and modifications without departing from the spirit and scope of the present invention. The scope of protection of the present invention should be defined by the scope of the appended patent application.
1:蒸鍍製程治具 1: Evaporation process fixture
10:上蓋 10: Upper cover
11:第一面 11: The first side
12:緩衝件 12: Buffer
20:承載盤 20: carrying plate
30:工件 30: Workpiece
Claims (8)
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TW108124213A TWI802723B (en) | 2019-07-10 | 2019-07-10 | Evaporation process jig |
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TW108124213A TWI802723B (en) | 2019-07-10 | 2019-07-10 | Evaporation process jig |
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TW202102700A TW202102700A (en) | 2021-01-16 |
TWI802723B true TWI802723B (en) | 2023-05-21 |
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