TWI799930B - 壓力檢測電路 - Google Patents

壓力檢測電路 Download PDF

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Publication number
TWI799930B
TWI799930B TW110128172A TW110128172A TWI799930B TW I799930 B TWI799930 B TW I799930B TW 110128172 A TW110128172 A TW 110128172A TW 110128172 A TW110128172 A TW 110128172A TW I799930 B TWI799930 B TW I799930B
Authority
TW
Taiwan
Prior art keywords
detection circuit
force detection
force
circuit
detection
Prior art date
Application number
TW110128172A
Other languages
English (en)
Other versions
TW202221337A (zh
Inventor
羅勇
Original Assignee
大陸商深圳市繪王動漫科技有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 大陸商深圳市繪王動漫科技有限公司 filed Critical 大陸商深圳市繪王動漫科技有限公司
Publication of TW202221337A publication Critical patent/TW202221337A/zh
Application granted granted Critical
Publication of TWI799930B publication Critical patent/TWI799930B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/14—Measuring force or stress, in general by measuring variations in capacitance or inductance of electrical elements, e.g. by measuring variations of frequency of electrical oscillators
    • G01L1/142—Measuring force or stress, in general by measuring variations in capacitance or inductance of electrical elements, e.g. by measuring variations of frequency of electrical oscillators using capacitors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/10—Measuring force or stress, in general by measuring variations of frequency of stressed vibrating elements, e.g. of stressed strings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/14—Measuring force or stress, in general by measuring variations in capacitance or inductance of electrical elements, e.g. by measuring variations of frequency of electrical oscillators
    • G01L1/142—Measuring force or stress, in general by measuring variations in capacitance or inductance of electrical elements, e.g. by measuring variations of frequency of electrical oscillators using capacitors
    • G01L1/144—Measuring force or stress, in general by measuring variations in capacitance or inductance of electrical elements, e.g. by measuring variations of frequency of electrical oscillators using capacitors with associated circuitry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/14—Measuring force or stress, in general by measuring variations in capacitance or inductance of electrical elements, e.g. by measuring variations of frequency of electrical oscillators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
    • G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
    • G01L1/225—Measuring circuits therefor
    • G01L1/2256—Measuring circuits therefor involving digital counting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
    • G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
    • G01L1/225—Measuring circuits therefor
    • G01L1/2262—Measuring circuits therefor involving simple electrical bridges
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/02—Input arrangements using manually operated switches, e.g. using keyboards or dials
    • G06F3/0202—Constructional details or processes of manufacture of the input device
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K21/00—Details of pulse counters or frequency dividers
    • H03K21/02—Input circuits
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/22—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral
    • H03K5/24—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Nonlinear Science (AREA)
  • Human Computer Interaction (AREA)
  • Measuring Fluid Pressure (AREA)
  • Force Measurement Appropriate To Specific Purposes (AREA)
  • Measurement Of Force In General (AREA)
  • Control Of Voltage And Current In General (AREA)
TW110128172A 2020-11-23 2021-07-30 壓力檢測電路 TWI799930B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CNCN202011319383.0 2020-11-23
CN202011319383.0A CN112504519B (zh) 2020-11-23 2020-11-23 一种压力检测电路、装置及压力输入装置

Publications (2)

Publication Number Publication Date
TW202221337A TW202221337A (zh) 2022-06-01
TWI799930B true TWI799930B (zh) 2023-04-21

Family

ID=74959430

Family Applications (1)

Application Number Title Priority Date Filing Date
TW110128172A TWI799930B (zh) 2020-11-23 2021-07-30 壓力檢測電路

Country Status (6)

Country Link
US (1) US11692886B2 (zh)
EP (1) EP4001874A1 (zh)
JP (1) JP7134321B2 (zh)
KR (1) KR102578897B1 (zh)
CN (1) CN112504519B (zh)
TW (1) TWI799930B (zh)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4550611A (en) * 1984-01-05 1985-11-05 Motorola, Inc. Electronic pressure transducer
KR101235841B1 (ko) * 2012-03-22 2013-02-25 세원텔레텍 주식회사 터치 스크린의 정전 용량 측정 장치
TWI593234B (zh) * 2012-09-06 2017-07-21 萊迪思半導體公司 環形振盪器之測試解決方案

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3657660A (en) * 1970-07-24 1972-04-18 Bendix Corp Error detecting and failure indicating system and method in a servo loop
JP2000258272A (ja) 1999-01-04 2000-09-22 Fuji Electric Co Ltd 静電容量型圧力センサ
JP5357461B2 (ja) * 2008-08-11 2013-12-04 パナソニック株式会社 近接センサ
JP5461852B2 (ja) * 2009-03-04 2014-04-02 フリースケール セミコンダクター インコーポレイテッド 自動調整発振器
JP5351590B2 (ja) * 2009-04-01 2013-11-27 キヤノン株式会社 圧電素子駆動ユニット及び異物除去装置
US8674709B2 (en) * 2010-05-13 2014-03-18 Silicon Works Co., Ltd. Circuit and method for measuring capacitance value of touch screen
CN103364116A (zh) * 2013-07-25 2013-10-23 安徽皖科电子工程有限公司 时差振荡高精度压力传感器的压力测量方法
CN103364119A (zh) * 2013-07-25 2013-10-23 安徽皖科电子工程有限公司 时差振荡高精度压力传感器
US10175130B2 (en) * 2015-04-20 2019-01-08 Infineon Technologies Ag System and method for a MEMS sensor
CN205607567U (zh) 2015-11-19 2016-09-28 南京信息工程大学 一种多量程阵列式压力传感芯片及其检测设备
CN106843544B (zh) * 2017-01-22 2021-01-29 深圳市绘王动漫科技有限公司 无源手写笔的压感信号处理系统、方法及手绘板
CN108287033B (zh) 2018-01-31 2019-12-27 京东方科技集团股份有限公司 压感检测电路和方法以及显示面板、显示装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4550611A (en) * 1984-01-05 1985-11-05 Motorola, Inc. Electronic pressure transducer
KR101235841B1 (ko) * 2012-03-22 2013-02-25 세원텔레텍 주식회사 터치 스크린의 정전 용량 측정 장치
TWI593234B (zh) * 2012-09-06 2017-07-21 萊迪思半導體公司 環形振盪器之測試解決方案

Also Published As

Publication number Publication date
TW202221337A (zh) 2022-06-01
KR102578897B1 (ko) 2023-09-14
EP4001874A1 (en) 2022-05-25
CN112504519B (zh) 2022-05-20
JP2022082500A (ja) 2022-06-02
US11692886B2 (en) 2023-07-04
US20220163411A1 (en) 2022-05-26
JP7134321B2 (ja) 2022-09-09
KR20220071103A (ko) 2022-05-31
CN112504519A (zh) 2021-03-16

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