TWI799474B - 用於表面改性及加工的大氣壓線性rf電漿源 - Google Patents
用於表面改性及加工的大氣壓線性rf電漿源 Download PDFInfo
- Publication number
- TWI799474B TWI799474B TW107142888A TW107142888A TWI799474B TW I799474 B TWI799474 B TW I799474B TW 107142888 A TW107142888 A TW 107142888A TW 107142888 A TW107142888 A TW 107142888A TW I799474 B TWI799474 B TW I799474B
- Authority
- TW
- Taiwan
- Prior art keywords
- treatment
- atmospheric pressure
- surface modification
- plasma source
- pressure linear
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H1/00—Generating plasma; Handling plasma
- H05H1/24—Generating plasma
- H05H1/2406—Generating plasma using dielectric barrier discharges, i.e. with a dielectric interposed between the electrodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/321—Radio frequency generated discharge the radio frequency energy being inductively coupled to the plasma
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/3244—Gas supply means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32798—Further details of plasma apparatus not provided for in groups H01J37/3244 - H01J37/32788; special provisions for cleaning or maintenance of the apparatus
- H01J37/32816—Pressure
- H01J37/32825—Working under atmospheric pressure or higher
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H1/00—Generating plasma; Handling plasma
- H05H1/24—Generating plasma
- H05H1/46—Generating plasma using applied electromagnetic fields, e.g. high frequency or microwave energy
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H1/00—Generating plasma; Handling plasma
- H05H1/24—Generating plasma
- H05H1/46—Generating plasma using applied electromagnetic fields, e.g. high frequency or microwave energy
- H05H1/4645—Radiofrequency discharges
- H05H1/4652—Radiofrequency discharges using inductive coupling means, e.g. coils
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/32174—Circuits specially adapted for controlling the RF discharge
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H2240/00—Testing
- H05H2240/10—Testing at atmospheric pressure
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H2245/00—Applications of plasma devices
- H05H2245/40—Surface treatments
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Electromagnetism (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Plasma Technology (AREA)
- Drying Of Semiconductors (AREA)
- Chemical Vapour Deposition (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201762592799P | 2017-11-30 | 2017-11-30 | |
US62/592,799 | 2017-11-30 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201927081A TW201927081A (zh) | 2019-07-01 |
TWI799474B true TWI799474B (zh) | 2023-04-21 |
Family
ID=66665804
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW107142888A TWI799474B (zh) | 2017-11-30 | 2018-11-30 | 用於表面改性及加工的大氣壓線性rf電漿源 |
Country Status (3)
Country | Link |
---|---|
US (1) | US11533801B2 (zh) |
TW (1) | TWI799474B (zh) |
WO (1) | WO2019108855A1 (zh) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US11246480B2 (en) | 2015-09-07 | 2022-02-15 | Plasmatica Ltd. | Preventing fog on a medical device viewport |
US11896203B2 (en) | 2015-09-07 | 2024-02-13 | Plasmatica Ltd. | Methods and systems for providing plasma treatments to optical surfaces |
US11896204B2 (en) | 2015-09-07 | 2024-02-13 | Plasmatica Ltd. | Methods and systems for providing plasma treatments to optical surfaces |
JP2024518772A (ja) * | 2021-04-22 | 2024-05-02 | プラズマティカ リミテッド | 光学面にプラズマ処理を提供するための方法及びシステム |
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US8222822B2 (en) * | 2009-10-27 | 2012-07-17 | Tyco Healthcare Group Lp | Inductively-coupled plasma device |
US20140320017A1 (en) * | 2013-04-25 | 2014-10-30 | Psk Inc. | Plasma generating device, method of controlling the same, and substrate processing device including the plasma generating device |
US9550694B2 (en) * | 2014-03-31 | 2017-01-24 | Corning Incorporated | Methods and apparatus for material processing using plasma thermal source |
TW201737296A (zh) * | 2016-01-24 | 2017-10-16 | 應用材料股份有限公司 | 用於產生派形加工的對稱電漿源 |
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JP2006344527A (ja) * | 2005-06-09 | 2006-12-21 | Tdk Corp | イオン源 |
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2018
- 2018-11-29 US US16/767,837 patent/US11533801B2/en active Active
- 2018-11-29 WO PCT/US2018/063165 patent/WO2019108855A1/en active Application Filing
- 2018-11-30 TW TW107142888A patent/TWI799474B/zh active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8222822B2 (en) * | 2009-10-27 | 2012-07-17 | Tyco Healthcare Group Lp | Inductively-coupled plasma device |
US20140320017A1 (en) * | 2013-04-25 | 2014-10-30 | Psk Inc. | Plasma generating device, method of controlling the same, and substrate processing device including the plasma generating device |
US9550694B2 (en) * | 2014-03-31 | 2017-01-24 | Corning Incorporated | Methods and apparatus for material processing using plasma thermal source |
TW201737296A (zh) * | 2016-01-24 | 2017-10-16 | 應用材料股份有限公司 | 用於產生派形加工的對稱電漿源 |
Also Published As
Publication number | Publication date |
---|---|
US11533801B2 (en) | 2022-12-20 |
WO2019108855A1 (en) | 2019-06-06 |
US20200383197A1 (en) | 2020-12-03 |
TW201927081A (zh) | 2019-07-01 |
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