TWI799474B - 用於表面改性及加工的大氣壓線性rf電漿源 - Google Patents

用於表面改性及加工的大氣壓線性rf電漿源 Download PDF

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Publication number
TWI799474B
TWI799474B TW107142888A TW107142888A TWI799474B TW I799474 B TWI799474 B TW I799474B TW 107142888 A TW107142888 A TW 107142888A TW 107142888 A TW107142888 A TW 107142888A TW I799474 B TWI799474 B TW I799474B
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TW
Taiwan
Prior art keywords
treatment
atmospheric pressure
surface modification
plasma source
pressure linear
Prior art date
Application number
TW107142888A
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English (en)
Other versions
TW201927081A (zh
Inventor
丹尼爾羅伯特 鮑頓
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美商康寧公司
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Application filed by 美商康寧公司 filed Critical 美商康寧公司
Publication of TW201927081A publication Critical patent/TW201927081A/zh
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Publication of TWI799474B publication Critical patent/TWI799474B/zh

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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05HPLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H1/00Generating plasma; Handling plasma
    • H05H1/24Generating plasma
    • H05H1/2406Generating plasma using dielectric barrier discharges, i.e. with a dielectric interposed between the electrodes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32009Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082Radio frequency generated discharge
    • H01J37/321Radio frequency generated discharge the radio frequency energy being inductively coupled to the plasma
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/3244Gas supply means
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/32798Further details of plasma apparatus not provided for in groups H01J37/3244 - H01J37/32788; special provisions for cleaning or maintenance of the apparatus
    • H01J37/32816Pressure
    • H01J37/32825Working under atmospheric pressure or higher
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05HPLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H1/00Generating plasma; Handling plasma
    • H05H1/24Generating plasma
    • H05H1/46Generating plasma using applied electromagnetic fields, e.g. high frequency or microwave energy
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05HPLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H1/00Generating plasma; Handling plasma
    • H05H1/24Generating plasma
    • H05H1/46Generating plasma using applied electromagnetic fields, e.g. high frequency or microwave energy
    • H05H1/4645Radiofrequency discharges
    • H05H1/4652Radiofrequency discharges using inductive coupling means, e.g. coils
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32009Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082Radio frequency generated discharge
    • H01J37/32174Circuits specially adapted for controlling the RF discharge
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05HPLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H2240/00Testing
    • H05H2240/10Testing at atmospheric pressure
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05HPLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H2245/00Applications of plasma devices
    • H05H2245/40Surface treatments

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Electromagnetism (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Plasma Technology (AREA)
  • Drying Of Semiconductors (AREA)
  • Chemical Vapour Deposition (AREA)
TW107142888A 2017-11-30 2018-11-30 用於表面改性及加工的大氣壓線性rf電漿源 TWI799474B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201762592799P 2017-11-30 2017-11-30
US62/592,799 2017-11-30

Publications (2)

Publication Number Publication Date
TW201927081A TW201927081A (zh) 2019-07-01
TWI799474B true TWI799474B (zh) 2023-04-21

Family

ID=66665804

Family Applications (1)

Application Number Title Priority Date Filing Date
TW107142888A TWI799474B (zh) 2017-11-30 2018-11-30 用於表面改性及加工的大氣壓線性rf電漿源

Country Status (3)

Country Link
US (1) US11533801B2 (zh)
TW (1) TWI799474B (zh)
WO (1) WO2019108855A1 (zh)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11246480B2 (en) 2015-09-07 2022-02-15 Plasmatica Ltd. Preventing fog on a medical device viewport
US11896203B2 (en) 2015-09-07 2024-02-13 Plasmatica Ltd. Methods and systems for providing plasma treatments to optical surfaces
US11896204B2 (en) 2015-09-07 2024-02-13 Plasmatica Ltd. Methods and systems for providing plasma treatments to optical surfaces
JP2024518772A (ja) * 2021-04-22 2024-05-02 プラズマティカ リミテッド 光学面にプラズマ処理を提供するための方法及びシステム

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8222822B2 (en) * 2009-10-27 2012-07-17 Tyco Healthcare Group Lp Inductively-coupled plasma device
US20140320017A1 (en) * 2013-04-25 2014-10-30 Psk Inc. Plasma generating device, method of controlling the same, and substrate processing device including the plasma generating device
US9550694B2 (en) * 2014-03-31 2017-01-24 Corning Incorporated Methods and apparatus for material processing using plasma thermal source
TW201737296A (zh) * 2016-01-24 2017-10-16 應用材料股份有限公司 用於產生派形加工的對稱電漿源

Family Cites Families (39)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6087778A (en) * 1996-06-28 2000-07-11 Lam Research Corporation Scalable helicon wave plasma processing device with a non-cylindrical source chamber having a serpentine antenna
US6273022B1 (en) * 1998-03-14 2001-08-14 Applied Materials, Inc. Distributed inductively-coupled plasma source
TW503442B (en) * 2000-02-29 2002-09-21 Applied Materials Inc Coil and coil support for generating a plasma
KR200253559Y1 (ko) * 2001-07-30 2001-11-22 주식회사 플라즈마트 회전방향으로 균일한 플라즈마 밀도를 발생시키는유도결합형 플라즈마 발생장치의 안테나구조
US20030168009A1 (en) * 2002-03-08 2003-09-11 Denes Ferencz S. Plasma processing within low-dimension cavities
US20030015965A1 (en) * 2002-08-15 2003-01-23 Valery Godyak Inductively coupled plasma reactor
US8357242B2 (en) * 2007-05-03 2013-01-22 Jewett Russell F Crystalline film devices, apparatuses for and methods of fabrication
JP2006344527A (ja) * 2005-06-09 2006-12-21 Tdk Corp イオン源
US8328982B1 (en) 2005-09-16 2012-12-11 Surfx Technologies Llc Low-temperature, converging, reactive gas source and method of use
US20070170996A1 (en) * 2006-01-20 2007-07-26 Dutton David T Plasma generating devices having alternative ground geometry and methods for using the same
US8130986B2 (en) * 2006-01-23 2012-03-06 The Regents Of The University Of Michigan Trapped fluid microsystems for acoustic sensing
US10083817B1 (en) * 2006-08-22 2018-09-25 Valery Godyak Linear remote plasma source
US8377209B2 (en) 2008-03-12 2013-02-19 Applied Materials, Inc. Linear plasma source for dynamic (moving substrate) plasma processing
JP5098079B2 (ja) * 2008-06-27 2012-12-12 国立大学法人山梨大学 イオン化分析方法および装置
EP2145978A1 (fr) * 2008-07-16 2010-01-20 AGC Flat Glass Europe SA Procédé et installation pour le dépôt de couches sur un substrat
US20110199027A1 (en) 2008-10-16 2011-08-18 Yong Hwan Kim Electron beam generator having adjustable beam width
JP5642181B2 (ja) * 2009-08-21 2014-12-17 マットソン テクノロジー インコーポレイテッドMattson Technology, Inc. 基体を処理する装置及び基体の処理方法
DE102009048397A1 (de) 2009-10-06 2011-04-07 Plasmatreat Gmbh Atmosphärendruckplasmaverfahren zur Herstellung oberflächenmodifizierter Partikel und von Beschichtungen
US20130029123A1 (en) 2011-04-12 2013-01-31 Madocks John E Tin oxide deposited by linear plasma enhanced chemical vapor deposition
KR101196309B1 (ko) * 2011-05-19 2012-11-06 한국과학기술원 플라즈마 발생 장치
EP3502070B1 (en) 2011-10-25 2023-07-26 Corning Incorporated Glass compositions with improved chemical and mechanical durability
US20130273262A1 (en) * 2012-04-13 2013-10-17 Applied Materials, Inc. Static deposition profile modulation for linear plasma source
US9101042B2 (en) * 2012-07-24 2015-08-04 Tokyo Electron Limited Control of uniformity in a surface wave plasma source
US9447205B2 (en) * 2012-11-19 2016-09-20 Ut-Battelle, Llc Atmospheric pressure plasma processing of polymeric materials utilizing close proximity indirect exposure
CN103227090B (zh) * 2013-02-04 2016-04-06 深圳市劲拓自动化设备股份有限公司 一种线性等离子体源
US9406485B1 (en) * 2013-12-18 2016-08-02 Surfx Technologies Llc Argon and helium plasma apparatus and methods
US10800092B1 (en) * 2013-12-18 2020-10-13 Surfx Technologies Llc Low temperature atmospheric pressure plasma for cleaning and activating metals
US10023858B2 (en) * 2014-05-29 2018-07-17 U.S. Patent Innovations, LLC System and method for selective ablation of cancer cells with cold atmospheric plasma
KR101718515B1 (ko) 2014-10-27 2017-03-22 최도현 화이어 챔버, 플라즈마 발생기, 플라즈마 발생 방법
US9691592B2 (en) * 2015-04-11 2017-06-27 Ximan Jiang Plasma source enhanced with booster chamber and low cost plasma strength sensor
US9711333B2 (en) * 2015-05-05 2017-07-18 Eastman Kodak Company Non-planar radial-flow plasma treatment system
US20160329192A1 (en) * 2015-05-05 2016-11-10 Eastman Kodak Company Radial-flow plasma treatment system
US20160329193A1 (en) * 2015-05-05 2016-11-10 Eastman Kodak Company Atmospheric-pressure plasma treatment system
WO2017119074A1 (ja) * 2016-01-06 2017-07-13 東芝三菱電機産業システム株式会社 ガス供給装置
KR101880852B1 (ko) * 2017-05-16 2018-07-20 (주)어플라이드플라즈마 대기압 플라즈마 장치
WO2019005288A1 (en) * 2017-06-27 2019-01-03 Vandermeulen Peter F METHODS AND SYSTEMS FOR PLASMA DEPOSITION AND TREATMENT
US10651014B2 (en) * 2017-12-29 2020-05-12 Surfplasma, Inc. Compact portable plasma reactor
US10475628B2 (en) * 2018-05-21 2019-11-12 Main Law Cafe Plasma beam penetration of millimeter scale holes with high aspect ratios
JP2020033619A (ja) * 2018-08-30 2020-03-05 キオクシア株式会社 排気配管装置及びクリーニング装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8222822B2 (en) * 2009-10-27 2012-07-17 Tyco Healthcare Group Lp Inductively-coupled plasma device
US20140320017A1 (en) * 2013-04-25 2014-10-30 Psk Inc. Plasma generating device, method of controlling the same, and substrate processing device including the plasma generating device
US9550694B2 (en) * 2014-03-31 2017-01-24 Corning Incorporated Methods and apparatus for material processing using plasma thermal source
TW201737296A (zh) * 2016-01-24 2017-10-16 應用材料股份有限公司 用於產生派形加工的對稱電漿源

Also Published As

Publication number Publication date
US11533801B2 (en) 2022-12-20
WO2019108855A1 (en) 2019-06-06
US20200383197A1 (en) 2020-12-03
TW201927081A (zh) 2019-07-01

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