TWI777780B - Film supply device and pre-peeling machine - Google Patents

Film supply device and pre-peeling machine Download PDF

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TWI777780B
TWI777780B TW110135222A TW110135222A TWI777780B TW I777780 B TWI777780 B TW I777780B TW 110135222 A TW110135222 A TW 110135222A TW 110135222 A TW110135222 A TW 110135222A TW I777780 B TWI777780 B TW I777780B
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conveying path
film
turning edge
carrier sheet
machine body
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TW110135222A
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TW202313312A (en
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石敦智
語尚 林
魏榮良
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均華精密工業股份有限公司
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Abstract

The present invention provides a film supply device and a pre-peeling machine. The pre-peeling machine includes a machine body, a plurality of rollers rollably assembled to the machine body, and a pre-peeling member that is fixed to the machine body. The rollers jointly define a transportation path, and the pre-peeling member has a turning edge located at the transportation path. The rollers are configured to enable a carrying sheet adhered with films to move along the transportation path, and the turning edge is configured to allow two parts of the carrying sheet respectively arranged at two opposite sides thereof to have a turning angle that is less than 180 degrees, so that a part of the films adjacent to the turning edge can separate from the carrying sheet one by one after passing through the turning edge at different time points.

Description

供膜裝置及預剝膜機台Film supply device and pre-stripping machine

本發明涉及一種供膜裝置,尤其涉及能夠使膜片逐個剝離且供應的一種供膜裝置及預剝膜機台。The invention relates to a film supply device, in particular to a film supply device and a pre-stripping machine that can peel off and supply films one by one.

現有的供膜機制是將多個膜片設置於一承載片上,以提供擷取器自所述承載片直接取下所述膜片。然而,現有供膜機制都是朝向如何改良擷取器,以利於上述擷取器更為便利地自所述承載片上取下所述膜片,但上述擷取器的改良也逐漸遇到了瓶頸。In the existing film supply mechanism, a plurality of film sheets are arranged on a carrier sheet, so as to provide a catcher to directly remove the film sheets from the carrier sheet. However, the existing film supply mechanisms are all directed towards improving the extractor so as to facilitate the extractor to remove the film from the carrier sheet more conveniently, but the improvement of the extractor has gradually encountered a bottleneck.

於是,本發明人認為上述缺陷可改善,乃特潛心研究並配合科學原理的運用,終於提出一種設計合理且有效改善上述缺陷的本發明。Therefore, the inventor believes that the above-mentioned defects can be improved. Nate has devoted himself to research and application of scientific principles, and finally proposes an invention with reasonable design and effective improvement of the above-mentioned defects.

本發明實施例在於提供一種供膜裝置及預剝膜機台,其能有效地改善現有供膜機制所可能產生的缺陷。The embodiments of the present invention provide a film supply device and a pre-stripping machine, which can effectively improve the defects that may occur in the existing film supply mechanism.

本發明實施例公開一種供膜裝置,其包括:一機台本體;一料件模組,可分離地架設於所述機台本體;其中,所述料件模組包含有一承載片及貼附於所述承載片上的多個膜片;多個滾軸,可滾動地安裝於所述機台本體,並且多個所述滾軸共同定義出一輸送路徑;其中,所述承載片能在所述輸送路徑上移動;以及一預剝離件,固定於所述機台本體;其中,所述預剝離件具有位於所述輸送路徑上的一轉折邊緣;其中,當多個所述滾軸驅使所述承載片沿著所述輸送路徑移動時,分別位在所述轉折邊緣相反兩側的所述承載片的兩個部分形成有小於180度的一轉折角,以使鄰近所述轉折邊緣的多個所述膜片分別於不同時間點經過所述轉折邊緣而逐個自所述承載片分離。An embodiment of the present invention discloses a film supply device, which includes: a machine body; a material module, which is detachably erected on the machine body; wherein, the material module includes a carrier sheet and an attachment a plurality of diaphragms on the carrier sheet; a plurality of rollers, which are rotatably mounted on the machine body, and a plurality of the rollers together define a conveying path; wherein, the carrier sheet can be and a pre-stripping piece fixed on the machine body; wherein, the pre-stripping piece has a turning edge located on the conveying path; wherein, when the plurality of rollers drive the When the carrier sheet moves along the conveying path, two parts of the carrier sheet located on opposite sides of the turning edge respectively form a turning angle of less than 180 degrees, so that many parts adjacent to the turning edge are formed. Each of the film sheets passes through the turning edge at different time points and is separated from the carrier sheet one by one.

本發明實施例也公開一種預剝膜機台,其包括:一機台本體;多個滾軸,可滾動地安裝於所述機台本體並且多個所述滾軸共同定義出一輸送路徑;以及一預剝離件,固定於所述機台本體,並且所述預剝離件具有位於所述輸送路徑上的一轉折邊緣;其中,多個所述滾軸能用以供貼附有多個膜片的一承載片沿著所述輸送路徑移動,並且所述轉折邊緣能用來使位於其相反兩側的所述承載片的兩個部分形成有小於180度的一轉折角,以令鄰近所述轉折邊緣的多個所述膜片分別於不同時間點經過所述轉折邊緣而逐個自所述承載片分離。The embodiment of the present invention also discloses a pre-stripping machine, which includes: a machine body; a plurality of rollers, which are rotatably mounted on the machine body, and the plurality of the rollers jointly define a conveying path; and a pre-stripping piece fixed on the machine body, and the pre-stripping piece has a turning edge on the conveying path; wherein, a plurality of the rollers can be used for attaching a plurality of films A carrier sheet of the sheet moves along the conveying path, and the turning edge can be used to form a turning angle of less than 180 degrees between the two parts of the carrier sheet on opposite sides thereof, so that the adjacent The plurality of films of the turning edge pass through the turning edge at different time points and are separated from the carrier sheet one by one.

綜上所述,本發明實施例所公開的供膜裝置及預剝膜機台,其能通過在所述預剝離件設有所述轉折邊緣,據以利於多個所述膜片逐個自所述承載片分離,進而有效地提升其運作效率。To sum up, in the film supply device and the pre-stripping machine disclosed in the embodiments of the present invention, the pre-stripping member can be provided with the turning edge, so that the plurality of membranes can be removed one by one. The carrier sheet is separated, thereby effectively improving its operation efficiency.

為能更進一步瞭解本發明的特徵及技術內容,請參閱以下有關本發明的詳細說明與附圖,但是此等說明與附圖僅用來說明本發明,而非對本發明的保護範圍作任何的限制。In order to further understand the features and technical content of the present invention, please refer to the following detailed description and accompanying drawings of the present invention, but these descriptions and drawings are only used to illustrate the present invention, rather than make any claims to the protection scope of the present invention. limit.

以下是通過特定的具體實施例來說明本發明所公開有關“供膜裝置及預剝膜機台”的實施方式,本領域技術人員可由本說明書所公開的內容瞭解本發明的優點與效果。本發明可通過其他不同的具體實施例加以施行或應用,本說明書中的各項細節也可基於不同觀點與應用,在不悖離本發明的構思下進行各種修改與變更。另外,本發明的附圖僅為簡單示意說明,並非依實際尺寸的描繪,事先聲明。以下的實施方式將進一步詳細說明本發明的相關技術內容,但所公開的內容並非用以限制本發明的保護範圍。The following are specific examples to illustrate the embodiments of the "film supply device and pre-stripping machine" disclosed in the present invention. Those skilled in the art can understand the advantages and effects of the present invention from the contents disclosed in this specification. The present invention can be implemented or applied through other different specific embodiments, and various details in this specification can also be modified and changed based on different viewpoints and applications without departing from the concept of the present invention. In addition, the drawings of the present invention are merely schematic illustrations, and are not drawn according to the actual size, and are stated in advance. The following embodiments will further describe the related technical contents of the present invention in detail, but the disclosed contents are not intended to limit the protection scope of the present invention.

應當可以理解的是,雖然本文中可能會使用到“第一”、“第二”、“第三”等術語來描述各種元件或者信號,但這些元件或者信號不應受這些術語的限制。這些術語主要是用以區分一元件與另一元件,或者一信號與另一信號。另外,本文中所使用的術語“或”,應視實際情況可能包括相關聯的列出項目中的任一個或者多個的組合。It should be understood that although terms such as "first", "second" and "third" may be used herein to describe various elements or signals, these elements or signals should not be limited by these terms. These terms are primarily used to distinguish one element from another element, or a signal from another signal. In addition, the term "or", as used herein, should include any one or a combination of more of the associated listed items, as the case may be.

[實施例一][Example 1]

請參閱圖1至圖7所示,其為本發明的實施例一。如圖1所示,本實施例公開一種晶片貼膜設備1000,其包含有一循環式工作站S及位置對應於所述循環式工作站S的多個裝置D。其中,所述循環式工作站S於一環狀路徑上設有多個站點S’,並且所述循環式工作站S包含沿著所述環狀路徑移動的多個擷取器S1,任一個所述擷取器S1能沿所述環狀路徑逐一經過多個所述站點S’。Please refer to FIG. 1 to FIG. 7 , which are Embodiment 1 of the present invention. As shown in FIG. 1 , the present embodiment discloses a wafer lamination equipment 1000 , which includes a circulating workstation S and a plurality of devices D corresponding to the circulating workstation S. Wherein, the circulating workstation S is provided with a plurality of stations S' on an annular path, and the circulating workstation S includes a plurality of extractors S1 moving along the annular path, any one of which is The extractor S1 can pass through a plurality of the stations S' one by one along the circular path.

於本實施例中,所述環狀路徑呈圓環狀,多個所述擷取器S1的數量不小於多個所述站點S’的數量,並且多個所述擷取器S1能分別於多個所述站點S’同步運作,據以提升所述晶片貼膜設備1000的整體運作效能,但本發明不受限於此。In this embodiment, the annular path is annular, the number of the extractors S1 is not less than the number of the stations S', and the extractors S1 can be respectively A plurality of the stations S' are operated synchronously, so as to improve the overall operation performance of the chip attaching apparatus 1000, but the present invention is not limited thereto.

更詳細地說,每個所述站點S’例如是一個作業區域,並且多個所述站點S’具有不同但相關聯的作用、及彼此相異的區域面積。其中,本實施例所述及的多個所述站點S’於所述環狀路徑上依序包含有一取膜站S100、一膜對位站S200、一貼合站S300、一晶片確認站S400、一檢查站S500、一廢品站S600、及一良品站S700,但本發明不以此為限。舉例來說,在本發明未繪示的其他實施例中,多個所述站點S’的排序可以依據需求而加以調整(如:所述廢品站S600與所述良品站S700的排序對調)。In more detail, each of the stations S' is, for example, a work area, and a plurality of the stations S' have different but associated roles and different area areas from each other. Wherein, the multiple stations S' mentioned in this embodiment sequentially include a film taking station S100, a film alignment station S200, a lamination station S300, and a wafer confirmation station on the annular path. S400, a check station S500, a reject station S600, and a good product station S700, but the present invention is not limited to this. For example, in other embodiments not shown in the present invention, the order of the plurality of stations S' can be adjusted according to requirements (eg, the order of the reject station S600 and the good station S700 are reversed) .

再者,多個所述裝置D於本實施例中是包含位置對應於所述取膜站S100的一供膜裝置100、位置對應於所述膜對位站S200的一膜對位裝置200、位置對應於所述貼合站S300的一晶片擷取裝置300、位置對應於所述晶片確認站S400的一晶片確認裝置400、位置對應於所述檢查站S500的一檢查裝置500、位置對應於所述廢品站S600的一廢品收納裝置600、及位置對應於所述良品站S700的一良品收納裝置700,但本發明不受限於此。Furthermore, a plurality of the devices D in this embodiment include a film supply device 100 corresponding to the film taking station S100, a film alignment device 200 corresponding to the film alignment station S200, The position corresponds to a wafer pickup device 300 of the bonding station S300, the position corresponds to a wafer verification device 400 of the wafer verification station S400, the position corresponds to an inspection device 500 of the inspection station S500, and the position corresponds to A waste storage device 600 of the waste station S600 and a good product storage device 700 corresponding to the position of the good product station S700, but the present invention is not limited thereto.

舉例來說,在本發明未繪示的其他實施例中,多個所述站點S’的其中部分(如:所述膜對位站S200、所述晶片確認站S400、所述檢查站S500、所述廢品站S600、及所述良品站S700)及其相對應的所述裝置D(如:所述膜對位裝置200、所述晶片確認裝置400、所述檢查裝置500、所述廢品收納裝置600、及所述良品收納裝置700)可以依據設計需求而縮減;或者,所述晶片貼膜設備1000也可以依據設計需求而增設新的站點與其相對應的裝置。For example, in other embodiments not shown in the present invention, some of the multiple stations S' (eg, the film alignment station S200, the wafer confirmation station S400, the inspection station S500) , the reject station S600, and the good product station S700) and its corresponding device D (eg: the film alignment device 200, the wafer confirmation device 400, the inspection device 500, the reject device The storage device 600 and the good product storage device 700) can be reduced according to design requirements; alternatively, the wafer attaching device 1000 can also add new sites and corresponding devices according to design requirements.

為便於理解本實施例中的所述晶片貼膜設備1000的具體運作,以下說明每個所述裝置D及其相對應的所述站點S’的功能與用途,並且多個所述擷取器S1的運作流程皆相同,所以本實施例的圖式僅以一個所述擷取器S1的運作來說明,但本發明不受限於此。In order to facilitate the understanding of the specific operation of the wafer attaching apparatus 1000 in this embodiment, the function and purpose of each of the devices D and their corresponding stations S' will be described below, and a plurality of the extractors will be described below. The operation process of S1 is the same, so the drawings of this embodiment only describe the operation of one of the extractors S1, but the present invention is not limited thereto.

其中,如圖1所示,所述供膜裝置100能持續性地供應膜片21,用以供任一個所述擷取器S1擷取;也就是說,所述取膜站S100通過其位置對應於所述供膜裝置100,用以供移動至所述取膜站S100的任一個所述擷取器S1能自所述供膜裝置100擷取一個所述膜片21。Wherein, as shown in FIG. 1 , the film supply device 100 can continuously supply the film 21 for capture by any of the capture devices S1; that is, the film capture station S100 passes through its position Corresponding to the film supply device 100 , any one of the extractors S1 for moving to the film taking station S100 can extract one of the film sheets 21 from the film supply device 100 .

再者,如圖2A和圖2B所示,所述膜對位裝置200位於所述供膜裝置100的下游,並且所述膜對位站S200通過其位置對應於所述膜對位裝置200,用以供移動至所述膜對位站S200的任一個所述擷取器S1能通過所述膜對位裝置200來對其所擷取的所述膜片21進行對位。更詳細地說,所述膜對位裝置200於本實施例中可以是一底攝像器,用以偵測所述擷取器S1及其所擷取的所述膜片21之間的相對位置,據以利於後續的晶片貼合作業。Furthermore, as shown in FIGS. 2A and 2B , the film alignment device 200 is located downstream of the film supply device 100 , and the film alignment station S200 corresponds to the film alignment device 200 by its position, Any one of the extractors S1 for moving to the film alignment station S200 can use the film alignment device 200 to align the captured film 21 . More specifically, the film alignment device 200 in this embodiment may be a bottom camera for detecting the relative position between the capture device S1 and the captured film 21 , so as to facilitate the subsequent wafer bonding operation.

如圖3A至圖3D所示,所述晶片擷取裝置300位於所述膜對位裝置200(或所述供膜裝置100)的下游,並且所述晶片擷取裝置300用來擷取一晶片C、並對其所擷取的所述晶片C進行對位。再者,所述貼合站S300通過其位置對應於所述晶片擷取裝置300,用以供移動至所述貼合站S300的任一個所述擷取器S1能將其所擷取的所述膜片21來與所述晶片擷取裝置300所擷取的所述晶片C相互貼合。As shown in FIG. 3A to FIG. 3D , the wafer capture device 300 is located downstream of the film alignment device 200 (or the film supply device 100 ), and the wafer capture device 300 is used to capture a wafer C, and aligning the captured wafer C. Furthermore, the bonding station S300 corresponds to the wafer capture device 300 by its position, so that any one of the capturers S1 moved to the bonding station S300 can capture all the captured wafers. The film 21 is attached to the wafer C captured by the wafer capturing device 300 .

更詳細地說,所述晶片擷取裝置300於本實施例中包含有裝載有多個所述晶片C的一晶片載盤301、位置對應於所述晶片載盤301的一貼合座302、可移動地位於所述晶片載盤301與所述貼合座302之間的一移載器303、及位置對應於所述貼合座302的一頂攝像器304。其中,所述移載器303能用來自所述晶片載盤301上輸送一個所述晶片C至所述貼合座302上,並且所述頂攝像器304用來偵測所述貼合座302及其上的所述晶片C之間的相對位置,而所述貼合座302則可以用來將所述晶片C移動至位於所述貼合站S300的所述擷取器S1的下方。More specifically, the wafer extraction device 300 in this embodiment includes a wafer carrier 301 loaded with a plurality of the wafers C, a bonding seat 302 corresponding to the wafer carrier 301 , A transfer device 303 movably located between the wafer carrier 301 and the bonding seat 302 , and a top camera 304 corresponding to the bonding seat 302 . The transfer device 303 can transport one of the wafers C from the wafer carrier 301 to the bonding seat 302 , and the top camera 304 is used to detect the bonding seat 302 The relative position between the wafer C and the wafer C thereon, and the bonding seat 302 can be used to move the wafer C to the position below the extractor S1 of the bonding station S300.

於本實施例中,所述貼合座302包含有位置分別對應於所述移載器303與所述擷取器S1的兩個貼合部3021,並且所述移載器303能將一個所述晶片C設置於一個所述貼合部3021上。其中,當所述貼合座302將一個所述貼合部3021與其承載的所述晶片C旋轉至所述擷取器S1的下方時,另一個所述貼合部3021的位置則對應於所述移載器303,用以供所述移載器303輸送另一個所述晶片C至其上,據以提升所述晶片擷取裝置300的整體工作效率。In this embodiment, the abutment seat 302 includes two abutment parts 3021 corresponding to the transfer unit 303 and the extractor S1 respectively, and the transfer unit 303 can attach a The wafer C is disposed on one of the bonding portions 3021 . Wherein, when the bonding seat 302 rotates one of the bonding portions 3021 and the wafer C carried by it to below the extractor S1, the position of the other bonding portion 3021 corresponds to the position of the other bonding portion 3021. The transfer device 303 is used for the transfer device 303 to transfer another of the wafers C thereon, so as to improve the overall work efficiency of the wafer extraction device 300 .

據此,通過所述擷取器S1及所述膜片21之間的相對位置、及所述貼合座302與所述晶片C之間的相對位置皆已被精準地測得,以利於所述擷取器S1能夠將其所擷取的所述膜片21於所述貼合站S300中精準地貼合至所述晶片C的預定位置上。Accordingly, the relative position between the extractor S1 and the diaphragm 21, and the relative position between the bonding seat 302 and the chip C have been accurately measured, so as to facilitate the The picker S1 can precisely fit the film 21 picked up by the picker S1 to a predetermined position of the wafer C in the bonding station S300 .

再者,當任一個所述擷取器S1在經過所述貼合站S300後,其能輸送所擷取的所述膜片21與相貼合的所述晶片C至下一個所述站點S’,據以使得所述晶片貼膜設備1000可以通過所述擷取器S1來快速地串連不同的所述站點S’(或不同的所述裝置D),進而有效地提升所述晶片貼膜設備1000的整體工作效率。Furthermore, when any one of the extractors S1 passes through the lamination station S300, it can transport the extracted film 21 and the attached wafer C to the next station. S', so that the wafer attaching apparatus 1000 can quickly connect different stations S' (or different devices D) in series through the extractor S1, thereby effectively lifting the wafer The overall work efficiency of the lamination device 1000.

換個角度來說,所述擷取器S1能依序移動經過所述供膜裝置100、膜對位裝置200、及晶片擷取裝置300;其中,所述擷取器S1能自所述供膜裝置100擷取一個所述膜片21、並能通過所述膜對位裝置200來對其所擷取的所述膜片21進行對位、且能將其所擷取的所述膜片21來與所述晶片擷取裝置300所擷取的所述晶片C相互貼合、且能(朝後續所述站點S’)輸送相互貼合的所述晶片C與所述膜片21。In other words, the extractor S1 can move through the film supply device 100 , the film alignment device 200 , and the wafer extracting device 300 in sequence; wherein, the extractor S1 can move through the film supply device 300 . The device 100 captures one of the film sheets 21 , and can use the film alignment device 200 to align the captured film sheet 21 , and can align the captured film sheet 21 The wafer C and the film 21 attached to each other can be transported (toward the subsequent station S') to be attached to the wafer C captured by the wafer extraction device 300 .

需額外說明的是,所述晶片貼膜設備1000可以在所述貼合站S300或所述晶片擷取裝置300的下游,依據所述膜片21與相貼合所述晶片C能被所述擷取器S1輸送的功能並搭配設計需求,據以選擇性地增設相對應的站點或裝置,不受限於本實施例所載。It should be noted that, the wafer attaching device 1000 may be downstream of the bonding station S300 or the wafer pickup device 300 , and the wafer C can be captured by the film 21 and the attached wafer C. The conveying function of the fetcher S1 is matched with the design requirements, and corresponding stations or devices can be selectively added accordingly, which is not limited to what is contained in this embodiment.

如圖4A和圖4B所示,所述晶片確認裝置400於本實施例中位於所述晶片擷取裝置300的下游,並且當任一個所述擷取器S1在經過所述貼合站S300後,其能輸送所擷取的所述膜片21與相貼合的所述晶片C至所述晶片確認站S400,用以通過所述晶片確認裝置400來對由所述膜片21貼合的所述晶片C進行一晶片確認作業。As shown in FIG. 4A and FIG. 4B , the wafer confirmation device 400 is located downstream of the wafer extraction device 300 in this embodiment, and when any of the extraction devices S1 passes through the bonding station S300 , which can transport the captured film 21 and the attached wafer C to the wafer confirmation station S400 , so as to pass the wafer confirmation device 400 to the wafer C attached to the film 21 . The wafer C is subjected to a wafer confirmation operation.

更詳細地說,所述晶片確認裝置400於本實施例中可以是一底側光學檢測器,用以通過自動光學檢測(Automated Optical Inspection,AOI)流程而由貼合於所述膜片21的所述晶片C之底側進行位置的檢測、或是確認所述膜片21是否確實貼合有所述晶片C(即,所述晶片確認作業),但本發明不受限於此。需說明的是,在所述晶片確認裝置400實施檢測的過程中,所述擷取器S1是維持擷取所述膜片21,並且所述膜片21保持黏貼所述晶片C,據以利於迅速地進入下一個所述站點S’(或下一個的所述裝置D)。In more detail, the wafer verification device 400 may be a bottom-side optical detector in this embodiment, which is used to detect the wafer 21 attached to the diaphragm 21 through an automated optical inspection (Automated Optical Inspection, AOI) process. The position of the bottom side of the wafer C is detected, or whether the film 21 is actually attached to the wafer C (ie, the wafer confirmation operation), but the present invention is not limited to this. It should be noted that, during the detection process of the wafer verification device 400, the extractor S1 keeps extracting the film 21, and the film 21 keeps sticking to the wafer C, so as to facilitate the Promptly enter the next said station S' (or the next said device D).

如圖5A至圖5D所示,所述檢查裝置500位於所述晶片確認裝置400的下游,並且當任一個所述擷取器S1在經過所述晶片確認站S400後,其能輸送所擷取的所述膜片21與相貼合的所述晶片C至所述檢查站S500,用以通過所述檢查裝置500進行所述膜片21與相貼合的所述晶片C的一檢查作業。As shown in FIGS. 5A to 5D , the inspection device 500 is located downstream of the wafer confirmation device 400 , and when any one of the extractors S1 passes through the wafer confirmation station S400 , it can transport the extracted The film 21 and the attached wafer C are sent to the inspection station S500 for performing an inspection operation of the film 21 and the attached wafer C by the inspection device 500 .

更詳細地說,所述檢查裝置500於本實施例中包含有一檢查座501及位置對應於所述檢查座501的一頂側光學檢測器502。其中,所述檢查座501的位置可轉動地對應於所述頂側光學檢測器502與位於所述檢查站S500的所述擷取器S1,並且所述擷取器S1能將其所擷取的所述膜片21與相貼合的所述晶片C設置於所述檢查座501上。More specifically, the inspection device 500 in this embodiment includes an inspection base 501 and a top-side optical detector 502 corresponding to the inspection base 501 . Wherein, the position of the inspection base 501 is rotatably corresponding to the top-side optical detector 502 and the extractor S1 located at the inspection station S500, and the extractor S1 can extract the The diaphragm 21 and the attached wafer C are arranged on the inspection seat 501 .

當所述檢查座501將其所承載的所述晶片C與所述膜片21旋轉至所述頂側光學檢測器502的下方時,所述頂側光學檢測器502能接著通過自動光學檢測(AOI)流程而由所述晶片C與所述膜片21之頂側進行相對位置的檢測(即,所述檢查作業)。再者,所述晶片C與所述膜片21之頂側在通過所述檢查作業之後,所述檢查座501能將通過所述檢查作業的所述晶片C與所述膜片21轉動至所述擷取器S1的下方,以供所述擷取器S1擷取所述膜片21及相貼合的所述晶片C。When the inspection stand 501 rotates the wafer C and the diaphragm 21 it carries to be below the top-side optical detector 502, the top-side optical detector 502 can then pass the automatic optical inspection ( According to the AOI) process, the relative position detection (ie, the inspection operation) is performed by the wafer C and the top side of the diaphragm 21 . Furthermore, after the top sides of the wafer C and the diaphragm 21 pass the inspection operation, the inspection base 501 can rotate the wafer C and the diaphragm 21 that have passed the inspection operation to the desired position. Below the extractor S1, the extractor S1 extracts the film 21 and the attached chip C.

需額外說明的是,在所述檢查裝置500實施上述檢測的過程中,所述膜片21與所述晶片C是離開所述擷取器S1而置於所述檢查裝置500,並於檢測結束後,再由所述擷取器S1輸送至下一個所述站點S’(或下一個所述裝置D)。It should be noted that, during the inspection process performed by the inspection device 500, the diaphragm 21 and the wafer C are separated from the extractor S1 and placed in the inspection device 500, and the inspection ends. Afterwards, it is transported to the next station S' (or the next device D) by the extractor S1.

如圖6和圖7所示,所述廢品收納裝置600與所述良品收納裝置700皆位於所述檢查裝置500的下游,並且所述良品收納裝置700於本實施例中是位在所述廢品收納裝置600的下游,但本發明不受限於此。其中,任一個所述擷取器S1是依據所述晶片確認作業與所述檢查作業的判定結果,而選擇性地移動至所述廢品收納裝置600與所述良品收納裝置700的其中之一。As shown in FIG. 6 and FIG. 7 , both the waste storage device 600 and the good product storage device 700 are located downstream of the inspection device 500 , and the good product storage device 700 is located in the waste product in this embodiment. downstream of the storage device 600, but the present invention is not limited thereto. Wherein, any one of the extractors S1 is selectively moved to one of the reject storage device 600 and the good product storage device 700 according to the determination results of the wafer verification operation and the inspection operation.

更詳細地說,如圖6所示,當任一個所述擷取器S1所擷取的所述膜片21與相貼合的所述晶片C在所述晶片確認作業或所述檢查作業之中被判定為不合格時,其能被輸送至所述廢品站S600,用以通過所述廢品收納裝置600收納。或者,如圖7所示,當任一個所述擷取器S1所擷取的所述膜片21與相貼合的所述晶片C在所述晶片確認作業及所述檢查作業之中被判定為合格時,其能(跳過所述廢品站S600而)被輸送至所述良品站S700,用以通過所述良品收納裝置700收納。More specifically, as shown in FIG. 6 , when the film 21 captured by any of the capture devices S1 and the attached wafer C are in the process of the wafer confirmation operation or the inspection operation When it is determined to be unqualified, it can be transported to the waste station S600 for storage by the waste storage device 600 . Or, as shown in FIG. 7 , when the film 21 captured by any of the capture devices S1 and the attached wafer C are determined during the wafer confirmation operation and the inspection operation When it is qualified, it can be transported (by skipping the reject station S600 ) to the good product station S700 for storage by the good product storage device 700 .

於本實施例中,如圖6所示,所述廢品收納裝置600例如是一廢品載盤,用以供移動至所述廢品站S600的任一個所述擷取器S1能將其所擷取的所述膜片21與相貼合的所述晶片C設置於其上。其中,所述廢品載盤可以通過移動,以使位於所述擷取器S1下方的所述廢品載盤部位能夠維持足夠的空間,據以收納所述膜片21與相貼合的所述晶片C。In this embodiment, as shown in FIG. 6 , the waste storage device 600 is, for example, a waste tray, which is used for any of the extractors S1 moving to the waste station S600 to be able to extract the waste. The diaphragm 21 and the attached wafer C are arranged on it. Wherein, the waste tray can be moved, so that the waste tray part located under the extractor S1 can maintain enough space to accommodate the film 21 and the attached wafer. C.

再者,如圖7所示,所述良品收納裝置700包含有多個載入件701及對應於至少一個所述載入件設置的一包裝模組702。其中,多個所述載入件701能逐一經過所述良品站S700,用以(自位於所述良品站S700的所述擷取器S1)接收判定為合格的所述膜片21與相貼合的所述晶片C;其中,多個所述載入件701於本實施例中可以是設置於一轉盤上,以通過所述轉盤的旋轉而逐一經過所述良品站S700。再者,而所述包裝模組702則是能自多個所述載入件701逐一接收所述膜片21與相貼合的所述晶片C。Furthermore, as shown in FIG. 7 , the good product storage device 700 includes a plurality of loading elements 701 and a packaging module 702 corresponding to at least one of the loading elements. Wherein, a plurality of the loading parts 701 can pass through the good product station S700 one by one, so as to receive (from the extractor S1 located in the good product station S700 ) the diaphragms 21 judged to be qualified and stick them together In this embodiment, a plurality of the loading members 701 may be disposed on a turntable, so as to pass through the good product station S700 one by one through the rotation of the turntable. Furthermore, the packaging module 702 can receive the film 21 and the attached chip C one by one from the plurality of loading elements 701 .

[實施例二][Example 2]

請參閱圖8至圖11所示,其為本發明的實施例二。由於本實施例類似於上述實施例一,所以兩個實施例的相同處不再加以贅述,而本實施例相較於上述實施例一的差異主要在於所述供膜裝置100,並且所述供膜裝置100於本實施例中的構造大致說明如下:Please refer to FIG. 8 to FIG. 11 , which is the second embodiment of the present invention. Since this embodiment is similar to the above-mentioned first embodiment, the similarities between the two embodiments will not be repeated. The structure of the membrane device 100 in this embodiment is roughly described as follows:

如圖8和圖9A所示,所述供膜裝置100包含有一機台本體1、可分離地架設於所述機台本體1的一料件模組2、可滾動地安裝於所述機台本體1的多個滾軸3、及固定於所述機台本體1的一預剝離件4。其中,所述機台本體1、多個所述滾軸3、及所述預剝離件4於本實施例中是合併稱為一預剝膜機台10,並且所述預剝膜機台10雖是以搭配於所述料件模組2來說明,但本發明不受限於此。舉例來說,在本發明未繪示的其他實施例中,所述預剝膜機台10可以單獨地被應用(如:販賣)或是搭配其他構件使用。As shown in FIG. 8 and FIG. 9A , the film supply device 100 includes a machine body 1 , a material module 2 detachably erected on the machine body 1 , and rotatably installed on the machine A plurality of rollers 3 of the main body 1 and a pre-stripping member 4 fixed to the machine main body 1 . The machine body 1 , the plurality of rollers 3 , and the pre-stripping member 4 are collectively referred to as a pre-stripping machine 10 in this embodiment, and the pre-stripping machine 10 Although it is described as being matched with the material module 2, the present invention is not limited thereto. For example, in other embodiments not shown in the present invention, the pre-stripping machine 10 can be used alone (eg, sold) or used in combination with other components.

多個所述滾軸3共同定義出一輸送路徑P,所述料件模組2包含有一承載片22及貼附於所述承載片22上的多個膜片21,並且所述承載片22能在所述輸送路徑P上移動(也就是,多個所述滾軸3能用以使所述承載片22沿著所述輸送路徑P移動),而所述預剝離件4具有位於所述輸送路徑P上的一轉折邊緣41。A plurality of the rollers 3 together define a conveying path P, the material module 2 includes a carrier sheet 22 and a plurality of film sheets 21 attached to the carrier sheet 22, and the carrier sheet 22 Can move on the conveying path P (that is, a plurality of the rollers 3 can be used to move the carrier sheet 22 along the conveying path P), and the pre-stripping member 4 has a A turning edge 41 on the conveying path P.

進一步地說,當多個所述滾軸3驅使所述承載片22沿著所述輸送路徑P移動時,分別位在所述轉折邊緣41相反兩側的所述承載片22的兩個部分221形成有小於180度的一轉折角α1(或是說,所述轉折邊緣41能用來使所述承載片22的兩個所述部分221形成有所述轉折角α1),以使鄰近所述轉折邊緣41的多個所述膜片21分別於不同時間點經過所述轉折邊緣41而逐個自所述承載片22分離。Further, when a plurality of the rollers 3 drive the carrier sheet 22 to move along the conveying path P, the two parts 221 of the carrier sheet 22 located on opposite sides of the turning edge 41 respectively A turning angle α1 smaller than 180 degrees is formed (or in other words, the turning edge 41 can be used to form the turning angle α1 for the two parts 221 of the carrier sheet 22 ), so that the adjacent The plurality of film sheets 21 of the turning edge 41 pass through the turning edge 41 at different time points and are separated from the carrier sheet 22 one by one.

於本實施例中,所述轉折角α1是以小於90度(如:70度~85度)來說明,但本發明不受限於此。再者,所述供膜裝置100通過在所述預剝離件4設有所述轉折邊緣41,據以利於多個所述膜片21逐個自所述承載片22分離,進而有效地提升其運作效率,並能進一步用來提供移動至所述取膜站S100的任一個所述擷取器S1進行擷取,以提升的整體運作效能。In this embodiment, the turning angle α1 is described as being less than 90 degrees (eg, 70 degrees to 85 degrees), but the present invention is not limited thereto. Furthermore, the film feeding device 100 is provided with the turning edge 41 on the pre-peeling member 4 , so as to facilitate the separation of the plurality of film sheets 21 from the carrier sheet 22 one by one, thereby effectively improving the operation thereof. efficiency, and can be further used to provide capture by any of the capture devices S1 moved to the film capture station S100, so as to improve the overall operation performance.

更詳細地說,所述料件模組2於本實施例中包含有彼此配合使用的一捲放器23與一捲收器24,並且所述捲放器23與所述捲收器24皆安裝於所述機台本體1。其中,所述捲放器23位於所述輸送路徑P的起點,所述承載片22及多個所述膜片21捲繞於所述捲放器23,並且所述捲放器23用以傳輸所述承載片22及多個所述膜片21至所述輸送路徑P。再者,所述捲收器24位於所述輸送路徑P的終點,並且所述捲放器23用來捲收移動經過所述轉折邊緣41的所述承載片22。More specifically, the material module 2 includes a retractor 23 and a retractor 24 used in cooperation with each other in this embodiment, and both the retractor 23 and the retractor 24 are Installed on the machine body 1 . Wherein, the unwinder 23 is located at the starting point of the conveying path P, the carrier sheet 22 and a plurality of the film sheets 21 are wound around the unwinder 23, and the unwinder 23 is used for conveying The carrier sheet 22 and a plurality of the film sheets 21 are sent to the conveying path P. Furthermore, the retractor 24 is located at the end of the conveying path P, and the retractor 23 is used to retract the carrier sheet 22 that has moved past the turning edge 41 .

進一步地說,如圖8和圖9A所示,所述供膜裝置100(或所述預剝膜機台10)於本實施例中可以進一步包含有安裝於所述機台本體1的一影像擷取器5,並且所述影像擷取器5的位置對應於所述輸送路徑P並位於所述轉折邊緣41的上游,用以擷取多個所述膜片21在移動經過所述轉折邊緣41前的位置。Further, as shown in FIG. 8 and FIG. 9A , the film supply device 100 (or the pre-stripping machine 10 ) in this embodiment may further include an image mounted on the machine body 1 A capture device 5, and the position of the image capture device 5 corresponds to the conveying path P and is located upstream of the turning edge 41, for capturing a plurality of the films 21 moving past the turning edge location before 41.

再者,如圖8至圖9C所示,任一個所述擷取器S1移動至所述取膜站S100來進行所述膜片21擷取的一取膜位置可以是保持不變,並且所述機台本體1包含有能移動所述預剝離件4與至少部分所述料件模組2的一橫移機構11。舉例來說,所述橫移機構11可以是由多個線軌所組成(如:XY軸滑台),用以使所述捲放器23、所述承載片22、多個所述膜片21、及所述預剝離件4可以在一平面上移動。Furthermore, as shown in FIG. 8 to FIG. 9C , any one of the capturing devices S1 moves to the film capturing station S100 for capturing a film position of the film sheet 21 may remain unchanged, and all The machine body 1 includes a traverse mechanism 11 capable of moving the pre-stripping member 4 and at least part of the material module 2 . For example, the traverse mechanism 11 may be composed of a plurality of linear rails (eg, an XY axis slide table), so as to make the unwinder 23 , the carrier sheet 22 , and a plurality of the film sheets 21, and the pre-stripping member 4 can move on a plane.

於本實施例中,經過所述轉折邊緣41而逐個自所述承載片22分離的多個所述膜片21,其能通過所述橫移機構11依據所述影像擷取器5而逐個移動至所述取膜位置。據此,所述橫移機構11通過所述影像擷取器5所得到的多個所述膜片21位置資訊,其不但能有效地消除多個所述膜片21排列於所述承載片22上所產生的誤差、並有助於任一個所述擷取器S1的所述取膜位置可以維持不變,進而顯著地提高每個所述擷取器S1擷取所述膜片21的效率與精準度。In this embodiment, the plurality of diaphragms 21 separated from the carrier sheet 22 one by one through the turning edge 41 can be moved one by one according to the image capture device 5 through the traverse mechanism 11 . to the film removal position. Accordingly, the position information of the plurality of diaphragms 21 obtained by the traverse mechanism 11 through the image capture device 5 can not only effectively eliminate the arrangement of the plurality of diaphragms 21 on the carrier sheet 22 It helps to maintain the film capture position of any one of the extractors S1 unchanged, thereby significantly improving the efficiency of each extractor S1 in extracting the film 21 and precision.

此外,在本發明未繪的其他實施例中,所述擷取器S1進行所述膜片21擷取的所述取膜位置可以依據所述影像擷取器5而改變,以使所述擷取器S1可以移動至由所述承載片22分離且待擷取的所述膜片21的正上方,因而令所述供膜裝置100無須設有所述橫移機構11。In addition, in other embodiments not shown in the present invention, the position of the film captured by the film 21 by the capture device S1 can be changed according to the image capture device 5, so that the capture The picker S1 can be moved to just above the film sheet 21 that is separated from the carrier sheet 22 and to be picked up, so that the film supply device 100 does not need to be provided with the traverse mechanism 11 .

需額外說明的是,為了使多個所述膜片21能夠在所述轉折邊緣41較為順利地自所述承載片22逐個分離,多個所述膜片21、所述輸送路徑P、及所述轉折邊緣41彼此之間的相對應關係較佳是符合下述條件,但本發明不受限於此。It should be noted that, in order to enable the plurality of film sheets 21 to be smoothly separated from the carrier sheet 22 one by one at the turning edge 41 , the plurality of film sheets 21 , the conveying path P, and the The corresponding relationship between the turning edges 41 preferably meets the following conditions, but the present invention is not limited thereto.

其中,多個所述膜片21沿非平行於所述輸送路徑P的一排列方向R排成多列,並且所述轉折邊緣41與所述排列方向R相夾有一銳角α2。如圖9A所示,所述排列方向R垂直於所述輸送路徑P,並且所述銳角α2介於3度~30度。再者,所述轉折邊緣41非垂直於所述輸送路徑P,並且所述轉折邊緣41與所述輸送路徑P可以形成有介於45度~60度的一夾角α3。Wherein, a plurality of the film sheets 21 are arranged in multiple rows along an arrangement direction R that is not parallel to the conveying path P, and the turning edge 41 and the arrangement direction R form an acute angle α2. As shown in FIG. 9A , the arrangement direction R is perpendicular to the conveying path P, and the acute angle α2 is between 3 degrees and 30 degrees. Furthermore, the turning edge 41 is not perpendicular to the conveying path P, and the turning edge 41 and the conveying path P may form an included angle α3 between 45 degrees and 60 degrees.

需說明的是,符合所述銳角α2與所述夾角α3的上述條件於本實施例中可以是同時出現在圖9A之中(如:所述銳角α2為30度,所述夾角α3為60度),但符合所述銳角α2與所述夾角α3的上述條件也可以是分別出現在不同的實施態樣之中,本發明在此不加以限制。舉例來說,如圖10所示,在符合所述轉折邊緣41非垂直於所述輸送路徑P,並符合所述夾角α3介於45度~60度的條件下,所述排列方向R可以是非垂直於所述輸送路徑P。It should be noted that the above-mentioned conditions satisfying the acute angle α2 and the included angle α3 may appear in FIG. 9A at the same time in this embodiment (for example, the acute angle α2 is 30 degrees, and the included angle α3 is 60 degrees) ), but the above-mentioned conditions satisfying the acute angle α2 and the included angle α3 may also appear in different embodiments, which are not limited in the present invention. For example, as shown in FIG. 10 , under the condition that the turning edge 41 is not perpendicular to the conveying path P, and that the included angle α3 is between 45 degrees and 60 degrees, the arrangement direction R may be non-perpendicular to the conveying path P. perpendicular to the conveying path P.

更進一步地說,在圖9A和圖10所示的構造中,所述轉折邊緣41是非垂直於所述輸送路徑P,但本發明不受限於此。舉例來說,如圖11所示,所述排列方向R可以非垂直於所述輸送路徑P,並且所述銳角α2較佳是介於30度~45度;在符合上述條件之下,所述轉折邊緣41可以是垂直於所述輸送路徑P。Furthermore, in the configuration shown in FIGS. 9A and 10 , the turning edge 41 is not perpendicular to the conveying path P, but the present invention is not limited thereto. For example, as shown in FIG. 11 , the arrangement direction R may be non-perpendicular to the conveying path P, and the acute angle α2 is preferably between 30 degrees and 45 degrees; under the above conditions, the The turning edge 41 may be perpendicular to the conveying path P. As shown in FIG.

再者,所述供膜裝置100(或所述預剝膜機台10)可以進一步包含有安裝於所述機台本體1的一張力調整機構6,並且所述張力調整機構6的位置對應於所述輸送路徑P並位於所述轉折邊緣41的下游,用以使所述承載片22的兩個所述部分221的張力值維持相同。Furthermore, the film supply device 100 (or the pre-stripping machine 10 ) may further include a tension adjustment mechanism 6 installed on the machine body 1 , and the position of the tension adjustment mechanism 6 corresponds to the position of the tension adjustment mechanism 6 . The conveying path P is located downstream of the turning edge 41 to maintain the same tension value of the two portions 221 of the carrier sheet 22 .

[本發明實施例的技術效果][Technical effects of the embodiments of the present invention]

綜上所述,本發明實施例所公開的晶片貼膜設備,其通過多個所述裝置與所述擷取器的搭配設計,使得所述擷取器能夠同時輸送所述膜片與相貼合的所述晶片,據以快速地串連不同的所述裝置,進而有效地提升整體的工作效率。To sum up, the wafer lamination equipment disclosed in the embodiments of the present invention is designed through the matching design of a plurality of the devices and the extractor, so that the extractor can convey the film and attach the film at the same time. The said chip can quickly connect different said devices in series, thereby effectively improving the overall work efficiency.

再者,通過所述擷取器及所述膜片之間的相對位置、及所述貼合座與所述晶片之間的相對位置皆已在所述膜對位站與所述貼膜站中被精準地測得,以利於所述擷取器能夠將其所擷取的所述膜片於所述貼合站中精準地貼合至所述晶片的預定位置上。Furthermore, through the relative position between the extractor and the film, and the relative position between the bonding seat and the wafer, both in the film alignment station and the film attaching station It is accurately measured, so that the extractor can accurately attach the captured film to the predetermined position of the wafer in the attaching station.

另外,本發明實施例所公開的供膜裝置與預剝膜機台,其能通過在所述預剝離件設有所述轉折邊緣,據以利於多個所述膜片逐個自所述承載片分離,進而有效地提升其運作效率,並能進一步用來提供擷取器進行擷取。In addition, in the film supply device and the pre-peeling machine disclosed in the embodiments of the present invention, the pre-peeling member can be provided with the turning edge, so that the plurality of film sheets can be separated from the carrier sheet one by one. separation, thereby effectively improving its operational efficiency, and can be further used to provide a capture device for capture.

以上所公開的內容僅為本發明的優選可行實施例,並非因此侷限本發明的專利範圍,所以凡是運用本發明說明書及圖式內容所做的等效技術變化,均包含於本發明的專利範圍內。The content disclosed above is only a preferred feasible embodiment of the present invention, and is not intended to limit the patent scope of the present invention. Therefore, any equivalent technical changes made by using the contents of the description and drawings of the present invention are included in the patent scope of the present invention. Inside.

1000:晶片貼膜設備 D:裝置 100:供膜裝置 10:預剝膜機台 1:機台本體 11:橫移機構 2:料件模組 21:膜片 22:承載片 221:部分 23:捲放器 24:捲收器 3:滾軸 4:預剝離件 41:轉折邊緣 5:影像擷取器 6:張力調整機構 200:膜對位裝置 300:晶片擷取裝置 301:晶片載盤 302:貼合座 3021:貼合部 303:移載器 304:頂攝像器 400:晶片確認裝置 500:檢查裝置 501:檢查座 502:頂側光學檢測器 600:廢品收納裝置 700:良品收納裝置 701:載入件 702:包裝模組 S:循環式工作站 S1:擷取器 S’:站點 S100:取膜站 S200:膜對位站 S300:貼合站 S400:晶片確認站 S500:檢查站 S600:廢品站 S700:良品站 C:晶片 P:輸送路徑 R:排列方向 α1:轉折角 α2:銳角 α3:夾角1000: Wafer Lamination Equipment D: device 100: Film supply device 10: Pre-stripping machine 1: Machine body 11: Traverse mechanism 2: Material module 21: Diaphragm 22: Carrier sheet 221: Parts 23: Rewinder 24: Retractor 3: Roller 4: Pre-stripped pieces 41: Turning Edges 5: Image grabber 6: Tension adjustment mechanism 200: Membrane alignment device 300: Chip Capture Device 301: Wafer carrier 302: Fitting seat 3021: Fitting Department 303:Transfer 304: Top Camera 400: Wafer Confirmation Device 500: Inspection device 501: Inspection Seat 502: Topside Optical Detector 600: Waste storage device 700: Good product storage device 701: Loading Piece 702: Packaging Module S: Circulation workstation S1: Fetcher S': site S100: Film removal station S200: Film Alignment Station S300: Fitting Station S400: Wafer Confirmation Station S500: Checkpoint S600: Scrap Station S700: Liangpin Station C: wafer P: conveying path R: Arrangement direction α1: turning angle α2: acute angle α3: included angle

圖1為本發明實施例一的晶片貼膜設備的俯視示意圖。FIG. 1 is a schematic top view of a wafer lamination device according to Embodiment 1 of the present invention.

圖2A為圖1的後續作動示意圖。FIG. 2A is a schematic diagram of subsequent operations in FIG. 1 .

圖2B為所述晶片貼膜設備於膜對位站的側視示意圖。FIG. 2B is a schematic side view of the wafer lamination equipment at the film alignment station.

圖3A為圖2A的後續作動示意圖。FIG. 3A is a schematic diagram of subsequent operations of FIG. 2A .

圖3B為所述晶片貼膜設備於貼合站的側視示意圖(一)。FIG. 3B is a schematic side view (1) of the wafer sticking equipment at the bonding station.

圖3C為所述晶片貼膜設備於貼合站的側視示意圖(二)。FIG. 3C is a schematic side view (2) of the wafer sticking equipment at the bonding station.

圖3D為所述晶片貼膜設備於貼合站的側視示意圖(三)。FIG. 3D is a schematic side view (3) of the wafer sticking equipment at the bonding station.

圖4A為圖3A的後續作動示意圖。FIG. 4A is a schematic diagram of subsequent operations of FIG. 3A .

圖4B為所述晶片貼膜設備於晶片確認站的側視示意圖。FIG. 4B is a schematic side view of the wafer sticking equipment at the wafer verification station.

圖5A為圖4A的後續作動示意圖。FIG. 5A is a schematic diagram of subsequent operations of FIG. 4A .

圖5B為所述晶片貼膜設備於檢查站的側視示意圖(一)。FIG. 5B is a schematic side view (1) of the wafer sticking equipment at the inspection station.

圖5C為所述晶片貼膜設備於檢查站的側視示意圖(二)。FIG. 5C is a schematic side view (2) of the wafer sticking equipment at the inspection station.

圖5D為所述晶片貼膜設備於檢查站的側視示意圖(三)。FIG. 5D is a schematic side view (3) of the wafer sticking equipment at the inspection station.

圖6為圖5A的後續作動示意圖。FIG. 6 is a schematic diagram of subsequent operations of FIG. 5A .

圖7為圖5A的後續作動示意圖。FIG. 7 is a schematic diagram of subsequent operations of FIG. 5A .

圖8為本發明實施例二的晶片貼膜設備對應於取膜站的示意圖。FIG. 8 is a schematic diagram of the wafer lamination device according to the second embodiment of the present invention corresponding to the film taking station.

圖9A為圖8的局部俯視示意圖。FIG. 9A is a partial top schematic view of FIG. 8 .

圖9B為圖9A的後續作動示意圖。FIG. 9B is a schematic diagram of subsequent operations of FIG. 9A .

圖9C為圖9B的後續作動示意圖。FIG. 9C is a schematic diagram of subsequent operations of FIG. 9B .

圖10為圖9A另一態樣的示意圖。FIG. 10 is a schematic diagram of another aspect of FIG. 9A .

圖11為圖9A又一態樣的示意圖。FIG. 11 is a schematic diagram of another aspect of FIG. 9A .

100:供膜裝置 100: Film supply device

10:預剝膜機台 10: Pre-stripping machine

1:機台本體 1: Machine body

11:橫移機構 11: Traverse mechanism

2:料件模組 2: Material module

21:膜片 21: Diaphragm

22:承載片 22: Carrier sheet

221:部分 221: Parts

23:捲放器 23: Rewinder

24:捲收器 24: Retractor

3:滾軸 3: Roller

4:預剝離件 4: Pre-stripped pieces

5:影像擷取器 5: Image grabber

6:張力調整機構 6: Tension adjustment mechanism

S1:擷取器 S1: Fetcher

S100:取膜站 S100: Film removal station

P:輸送路徑 P: conveying path

α1:轉折角 α1: turning angle

Claims (11)

一種供膜裝置,其包括: 一機台本體; 一料件模組,可分離地架設於所述機台本體;其中,所述料件模組包含有一承載片及貼附於所述承載片上的多個膜片; 多個滾軸,可滾動地安裝於所述機台本體,並且多個所述滾軸共同定義出一輸送路徑;其中,所述承載片能在所述輸送路徑上移動;以及 一預剝離件,固定於所述機台本體;其中,所述預剝離件具有位於所述輸送路徑上的一轉折邊緣; 其中,當多個所述滾軸驅使所述承載片沿著所述輸送路徑移動時,分別位在所述轉折邊緣相反兩側的所述承載片的兩個部分形成有小於180度的一轉折角,以使鄰近所述轉折邊緣的多個所述膜片分別於不同時間點經過所述轉折邊緣而逐個自所述承載片分離。 A film supply device, comprising: a machine body; A material module module is detachably erected on the machine body; wherein, the material module module includes a carrier sheet and a plurality of diaphragms attached to the carrier sheet; a plurality of rollers, rotatably mounted on the machine body, and a plurality of the rollers together define a conveying path; wherein, the carrier sheet can move on the conveying path; and a pre-stripping piece fixed on the machine body; wherein, the pre-stripping piece has a turning edge on the conveying path; Wherein, when a plurality of the rollers drive the carrier sheet to move along the conveying path, two parts of the carrier sheet respectively located on opposite sides of the turning edge are formed with a rotation of less than 180 degrees. The angle is folded, so that a plurality of the membrane sheets adjacent to the turning edge pass through the turning edge at different time points and separate from the carrier sheet one by one. 如請求項1所述的供膜裝置,其中,多個所述膜片沿非平行於所述輸送路徑的一排列方向排成多列,並且所述轉折邊緣與所述排列方向相夾有一銳角。The film supply device according to claim 1, wherein a plurality of the film sheets are arranged in a plurality of rows along an arrangement direction that is not parallel to the conveying path, and the turning edge and the arrangement direction form an acute angle . 如請求項2所述的供膜裝置,其中,所述排列方向垂直於所述輸送路徑,並且所述銳角介於3度~30度。The film supply device according to claim 2, wherein the arrangement direction is perpendicular to the conveying path, and the acute angle is between 3 degrees and 30 degrees. 如請求項2所述的供膜裝置,其中,所述排列方向非垂直於所述輸送路徑,並且所述銳角介於30度~45度。The film supply device according to claim 2, wherein the arrangement direction is not perpendicular to the conveying path, and the acute angle is between 30 degrees and 45 degrees. 如請求項2所述的供膜裝置,其中,所述轉折邊緣非垂直於所述輸送路徑,並且所述轉折邊緣與所述輸送路徑形成有介於45度~60度的一夾角。The film supply device according to claim 2, wherein the turning edge is not perpendicular to the conveying path, and the turning edge and the conveying path form an included angle ranging from 45 degrees to 60 degrees. 如請求項1所述的供膜裝置,其中,所述供膜裝置包含有安裝於所述機台本體的一影像擷取器,並且所述影像擷取器的位置對應於所述輸送路徑並位於所述轉折邊緣的上游,用以擷取多個所述膜片移動經過所述轉折邊緣前的位置。The film supply device according to claim 1, wherein the film supply device includes an image capture device mounted on the machine body, and the position of the image capture device corresponds to the conveying path and It is located upstream of the turning edge, and is used to capture a plurality of positions of the diaphragms before moving past the turning edge. 如請求項6所述的供膜裝置,其中,所述機台本體包含有能移動所述預剝離件與至少部分所述料件模組的一橫移機構;其中,經過所述轉折邊緣而逐個自所述承載片分離的多個所述膜片,其能通過所述橫移機構依據所述影像擷取器而逐個移動至所述取膜位置。The film supply device according to claim 6, wherein the machine body includes a traverse mechanism capable of moving the pre-stripping member and at least part of the material module; A plurality of the film sheets separated from the carrier sheet one by one can be moved to the film taking position one by one according to the image capture device through the traversing mechanism. 如請求項1所述的供膜裝置,其中,所述供膜裝置包含有安裝於所述機台本體的一張力調整機構,並且所述張力調整機構的位置對應於所述輸送路徑並位於所述轉折邊緣的下游,用以使所述承載片的兩個所述部分的張力值維持相同。The film supply device according to claim 1, wherein the film supply device includes a tension adjustment mechanism mounted on the machine body, and the tension adjustment mechanism is located in a position corresponding to the conveying path and located at the position of the tension adjustment mechanism. downstream of the turning edge, so as to maintain the same tension value of the two parts of the carrier sheet. 如請求項1所述的供膜裝置,其中,所述料件模組包含有: 一捲放器,安裝於所述機台本體且位於所述輸送路徑的起點,所述承載片及多個所述膜片捲繞於所述捲放器,並且所述捲放器用以傳輸所述承載片及多個所述膜片至所述輸送路徑;及 一捲收器,安裝於所述機台本體且位於所述輸送路徑的終點,並且所述捲放器用來捲收移動經過所述轉折邊緣的所述承載片。 The film supply device according to claim 1, wherein the material module comprises: an unwinder installed on the machine body and located at the starting point of the conveying path, the carrier sheet and a plurality of the film sheets are wound on the unwinder, and the unwinder is used to transport the the carrier sheet and a plurality of the film sheets to the conveying path; and A retractor is installed on the machine body and is located at the end of the conveying path, and the retractor is used for retracting the carrier sheet that moves past the turning edge. 一種預剝膜機台,其包括: 一機台本體; 多個滾軸,可滾動地安裝於所述機台本體並且多個所述滾軸共同定義出一輸送路徑;以及 一預剝離件,固定於所述機台本體,並且所述預剝離件具有位於所述輸送路徑上的一轉折邊緣; 其中,多個所述滾軸能用以供貼附有多個膜片的一承載片沿著所述輸送路徑移動,並且所述轉折邊緣能用來使位於其相反兩側的所述承載片的兩個部分形成有小於180度的一轉折角,以令鄰近所述轉折邊緣的多個所述膜片分別於不同時間點經過所述轉折邊緣而逐個自所述承載片分離。 A pre-stripping machine, comprising: a machine body; a plurality of rollers, rotatably mounted on the machine body and a plurality of the rollers together define a conveying path; and a pre-stripping piece fixed on the machine body, and the pre-stripping piece has a turning edge on the conveying path; Wherein, a plurality of the rollers can be used to move a carrier sheet attached with a plurality of film sheets along the conveying path, and the turning edge can be used to make the carrier sheet on opposite sides thereof move The two parts of the inflection edge are formed with a turning angle less than 180 degrees, so that a plurality of the membrane sheets adjacent to the turning edge pass through the turning edge at different time points and separate from the carrier sheet one by one. 如請求項10所述的預剝膜機台,其中,所述轉折邊緣非垂直於所述輸送路徑,並且所述轉折邊緣與所述輸送路徑形成有介於45度~60度的一夾角。The pre-stripping machine of claim 10, wherein the turning edge is not perpendicular to the conveying path, and the turning edge and the conveying path form an included angle ranging from 45 degrees to 60 degrees.
TW110135222A 2021-09-23 2021-09-23 Film supply device and pre-peeling machine TWI777780B (en)

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Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW201344806A (en) * 2012-04-16 2013-11-01 Gallant Micro Machining Co Ltd Die peeling and retrieving method and apparatus thereof
CN104425689A (en) * 2013-08-19 2015-03-18 人科机械有限公司 Film feeding and attaching apparatus, semiconductor chip package fabricating apparatus with the same, and method for fabricating semiconductor chip package
CN109103126A (en) * 2017-06-21 2018-12-28 琳得科株式会社 Paster apparatus and method of attaching

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW201344806A (en) * 2012-04-16 2013-11-01 Gallant Micro Machining Co Ltd Die peeling and retrieving method and apparatus thereof
CN104425689A (en) * 2013-08-19 2015-03-18 人科机械有限公司 Film feeding and attaching apparatus, semiconductor chip package fabricating apparatus with the same, and method for fabricating semiconductor chip package
CN109103126A (en) * 2017-06-21 2018-12-28 琳得科株式会社 Paster apparatus and method of attaching

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