TWI777780B - Film supply device and pre-peeling machine - Google Patents
Film supply device and pre-peeling machine Download PDFInfo
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Description
本發明涉及一種供膜裝置,尤其涉及能夠使膜片逐個剝離且供應的一種供膜裝置及預剝膜機台。The invention relates to a film supply device, in particular to a film supply device and a pre-stripping machine that can peel off and supply films one by one.
現有的供膜機制是將多個膜片設置於一承載片上,以提供擷取器自所述承載片直接取下所述膜片。然而,現有供膜機制都是朝向如何改良擷取器,以利於上述擷取器更為便利地自所述承載片上取下所述膜片,但上述擷取器的改良也逐漸遇到了瓶頸。In the existing film supply mechanism, a plurality of film sheets are arranged on a carrier sheet, so as to provide a catcher to directly remove the film sheets from the carrier sheet. However, the existing film supply mechanisms are all directed towards improving the extractor so as to facilitate the extractor to remove the film from the carrier sheet more conveniently, but the improvement of the extractor has gradually encountered a bottleneck.
於是,本發明人認為上述缺陷可改善,乃特潛心研究並配合科學原理的運用,終於提出一種設計合理且有效改善上述缺陷的本發明。Therefore, the inventor believes that the above-mentioned defects can be improved. Nate has devoted himself to research and application of scientific principles, and finally proposes an invention with reasonable design and effective improvement of the above-mentioned defects.
本發明實施例在於提供一種供膜裝置及預剝膜機台,其能有效地改善現有供膜機制所可能產生的缺陷。The embodiments of the present invention provide a film supply device and a pre-stripping machine, which can effectively improve the defects that may occur in the existing film supply mechanism.
本發明實施例公開一種供膜裝置,其包括:一機台本體;一料件模組,可分離地架設於所述機台本體;其中,所述料件模組包含有一承載片及貼附於所述承載片上的多個膜片;多個滾軸,可滾動地安裝於所述機台本體,並且多個所述滾軸共同定義出一輸送路徑;其中,所述承載片能在所述輸送路徑上移動;以及一預剝離件,固定於所述機台本體;其中,所述預剝離件具有位於所述輸送路徑上的一轉折邊緣;其中,當多個所述滾軸驅使所述承載片沿著所述輸送路徑移動時,分別位在所述轉折邊緣相反兩側的所述承載片的兩個部分形成有小於180度的一轉折角,以使鄰近所述轉折邊緣的多個所述膜片分別於不同時間點經過所述轉折邊緣而逐個自所述承載片分離。An embodiment of the present invention discloses a film supply device, which includes: a machine body; a material module, which is detachably erected on the machine body; wherein, the material module includes a carrier sheet and an attachment a plurality of diaphragms on the carrier sheet; a plurality of rollers, which are rotatably mounted on the machine body, and a plurality of the rollers together define a conveying path; wherein, the carrier sheet can be and a pre-stripping piece fixed on the machine body; wherein, the pre-stripping piece has a turning edge located on the conveying path; wherein, when the plurality of rollers drive the When the carrier sheet moves along the conveying path, two parts of the carrier sheet located on opposite sides of the turning edge respectively form a turning angle of less than 180 degrees, so that many parts adjacent to the turning edge are formed. Each of the film sheets passes through the turning edge at different time points and is separated from the carrier sheet one by one.
本發明實施例也公開一種預剝膜機台,其包括:一機台本體;多個滾軸,可滾動地安裝於所述機台本體並且多個所述滾軸共同定義出一輸送路徑;以及一預剝離件,固定於所述機台本體,並且所述預剝離件具有位於所述輸送路徑上的一轉折邊緣;其中,多個所述滾軸能用以供貼附有多個膜片的一承載片沿著所述輸送路徑移動,並且所述轉折邊緣能用來使位於其相反兩側的所述承載片的兩個部分形成有小於180度的一轉折角,以令鄰近所述轉折邊緣的多個所述膜片分別於不同時間點經過所述轉折邊緣而逐個自所述承載片分離。The embodiment of the present invention also discloses a pre-stripping machine, which includes: a machine body; a plurality of rollers, which are rotatably mounted on the machine body, and the plurality of the rollers jointly define a conveying path; and a pre-stripping piece fixed on the machine body, and the pre-stripping piece has a turning edge on the conveying path; wherein, a plurality of the rollers can be used for attaching a plurality of films A carrier sheet of the sheet moves along the conveying path, and the turning edge can be used to form a turning angle of less than 180 degrees between the two parts of the carrier sheet on opposite sides thereof, so that the adjacent The plurality of films of the turning edge pass through the turning edge at different time points and are separated from the carrier sheet one by one.
綜上所述,本發明實施例所公開的供膜裝置及預剝膜機台,其能通過在所述預剝離件設有所述轉折邊緣,據以利於多個所述膜片逐個自所述承載片分離,進而有效地提升其運作效率。To sum up, in the film supply device and the pre-stripping machine disclosed in the embodiments of the present invention, the pre-stripping member can be provided with the turning edge, so that the plurality of membranes can be removed one by one. The carrier sheet is separated, thereby effectively improving its operation efficiency.
為能更進一步瞭解本發明的特徵及技術內容,請參閱以下有關本發明的詳細說明與附圖,但是此等說明與附圖僅用來說明本發明,而非對本發明的保護範圍作任何的限制。In order to further understand the features and technical content of the present invention, please refer to the following detailed description and accompanying drawings of the present invention, but these descriptions and drawings are only used to illustrate the present invention, rather than make any claims to the protection scope of the present invention. limit.
以下是通過特定的具體實施例來說明本發明所公開有關“供膜裝置及預剝膜機台”的實施方式,本領域技術人員可由本說明書所公開的內容瞭解本發明的優點與效果。本發明可通過其他不同的具體實施例加以施行或應用,本說明書中的各項細節也可基於不同觀點與應用,在不悖離本發明的構思下進行各種修改與變更。另外,本發明的附圖僅為簡單示意說明,並非依實際尺寸的描繪,事先聲明。以下的實施方式將進一步詳細說明本發明的相關技術內容,但所公開的內容並非用以限制本發明的保護範圍。The following are specific examples to illustrate the embodiments of the "film supply device and pre-stripping machine" disclosed in the present invention. Those skilled in the art can understand the advantages and effects of the present invention from the contents disclosed in this specification. The present invention can be implemented or applied through other different specific embodiments, and various details in this specification can also be modified and changed based on different viewpoints and applications without departing from the concept of the present invention. In addition, the drawings of the present invention are merely schematic illustrations, and are not drawn according to the actual size, and are stated in advance. The following embodiments will further describe the related technical contents of the present invention in detail, but the disclosed contents are not intended to limit the protection scope of the present invention.
應當可以理解的是,雖然本文中可能會使用到“第一”、“第二”、“第三”等術語來描述各種元件或者信號,但這些元件或者信號不應受這些術語的限制。這些術語主要是用以區分一元件與另一元件,或者一信號與另一信號。另外,本文中所使用的術語“或”,應視實際情況可能包括相關聯的列出項目中的任一個或者多個的組合。It should be understood that although terms such as "first", "second" and "third" may be used herein to describe various elements or signals, these elements or signals should not be limited by these terms. These terms are primarily used to distinguish one element from another element, or a signal from another signal. In addition, the term "or", as used herein, should include any one or a combination of more of the associated listed items, as the case may be.
[實施例一][Example 1]
請參閱圖1至圖7所示,其為本發明的實施例一。如圖1所示,本實施例公開一種晶片貼膜設備1000,其包含有一循環式工作站S及位置對應於所述循環式工作站S的多個裝置D。其中,所述循環式工作站S於一環狀路徑上設有多個站點S’,並且所述循環式工作站S包含沿著所述環狀路徑移動的多個擷取器S1,任一個所述擷取器S1能沿所述環狀路徑逐一經過多個所述站點S’。Please refer to FIG. 1 to FIG. 7 , which are
於本實施例中,所述環狀路徑呈圓環狀,多個所述擷取器S1的數量不小於多個所述站點S’的數量,並且多個所述擷取器S1能分別於多個所述站點S’同步運作,據以提升所述晶片貼膜設備1000的整體運作效能,但本發明不受限於此。In this embodiment, the annular path is annular, the number of the extractors S1 is not less than the number of the stations S', and the extractors S1 can be respectively A plurality of the stations S' are operated synchronously, so as to improve the overall operation performance of the
更詳細地說,每個所述站點S’例如是一個作業區域,並且多個所述站點S’具有不同但相關聯的作用、及彼此相異的區域面積。其中,本實施例所述及的多個所述站點S’於所述環狀路徑上依序包含有一取膜站S100、一膜對位站S200、一貼合站S300、一晶片確認站S400、一檢查站S500、一廢品站S600、及一良品站S700,但本發明不以此為限。舉例來說,在本發明未繪示的其他實施例中,多個所述站點S’的排序可以依據需求而加以調整(如:所述廢品站S600與所述良品站S700的排序對調)。In more detail, each of the stations S' is, for example, a work area, and a plurality of the stations S' have different but associated roles and different area areas from each other. Wherein, the multiple stations S' mentioned in this embodiment sequentially include a film taking station S100, a film alignment station S200, a lamination station S300, and a wafer confirmation station on the annular path. S400, a check station S500, a reject station S600, and a good product station S700, but the present invention is not limited to this. For example, in other embodiments not shown in the present invention, the order of the plurality of stations S' can be adjusted according to requirements (eg, the order of the reject station S600 and the good station S700 are reversed) .
再者,多個所述裝置D於本實施例中是包含位置對應於所述取膜站S100的一供膜裝置100、位置對應於所述膜對位站S200的一膜對位裝置200、位置對應於所述貼合站S300的一晶片擷取裝置300、位置對應於所述晶片確認站S400的一晶片確認裝置400、位置對應於所述檢查站S500的一檢查裝置500、位置對應於所述廢品站S600的一廢品收納裝置600、及位置對應於所述良品站S700的一良品收納裝置700,但本發明不受限於此。Furthermore, a plurality of the devices D in this embodiment include a
舉例來說,在本發明未繪示的其他實施例中,多個所述站點S’的其中部分(如:所述膜對位站S200、所述晶片確認站S400、所述檢查站S500、所述廢品站S600、及所述良品站S700)及其相對應的所述裝置D(如:所述膜對位裝置200、所述晶片確認裝置400、所述檢查裝置500、所述廢品收納裝置600、及所述良品收納裝置700)可以依據設計需求而縮減;或者,所述晶片貼膜設備1000也可以依據設計需求而增設新的站點與其相對應的裝置。For example, in other embodiments not shown in the present invention, some of the multiple stations S' (eg, the film alignment station S200, the wafer confirmation station S400, the inspection station S500) , the reject station S600, and the good product station S700) and its corresponding device D (eg: the
為便於理解本實施例中的所述晶片貼膜設備1000的具體運作,以下說明每個所述裝置D及其相對應的所述站點S’的功能與用途,並且多個所述擷取器S1的運作流程皆相同,所以本實施例的圖式僅以一個所述擷取器S1的運作來說明,但本發明不受限於此。In order to facilitate the understanding of the specific operation of the
其中,如圖1所示,所述供膜裝置100能持續性地供應膜片21,用以供任一個所述擷取器S1擷取;也就是說,所述取膜站S100通過其位置對應於所述供膜裝置100,用以供移動至所述取膜站S100的任一個所述擷取器S1能自所述供膜裝置100擷取一個所述膜片21。Wherein, as shown in FIG. 1 , the
再者,如圖2A和圖2B所示,所述膜對位裝置200位於所述供膜裝置100的下游,並且所述膜對位站S200通過其位置對應於所述膜對位裝置200,用以供移動至所述膜對位站S200的任一個所述擷取器S1能通過所述膜對位裝置200來對其所擷取的所述膜片21進行對位。更詳細地說,所述膜對位裝置200於本實施例中可以是一底攝像器,用以偵測所述擷取器S1及其所擷取的所述膜片21之間的相對位置,據以利於後續的晶片貼合作業。Furthermore, as shown in FIGS. 2A and 2B , the
如圖3A至圖3D所示,所述晶片擷取裝置300位於所述膜對位裝置200(或所述供膜裝置100)的下游,並且所述晶片擷取裝置300用來擷取一晶片C、並對其所擷取的所述晶片C進行對位。再者,所述貼合站S300通過其位置對應於所述晶片擷取裝置300,用以供移動至所述貼合站S300的任一個所述擷取器S1能將其所擷取的所述膜片21來與所述晶片擷取裝置300所擷取的所述晶片C相互貼合。As shown in FIG. 3A to FIG. 3D , the
更詳細地說,所述晶片擷取裝置300於本實施例中包含有裝載有多個所述晶片C的一晶片載盤301、位置對應於所述晶片載盤301的一貼合座302、可移動地位於所述晶片載盤301與所述貼合座302之間的一移載器303、及位置對應於所述貼合座302的一頂攝像器304。其中,所述移載器303能用來自所述晶片載盤301上輸送一個所述晶片C至所述貼合座302上,並且所述頂攝像器304用來偵測所述貼合座302及其上的所述晶片C之間的相對位置,而所述貼合座302則可以用來將所述晶片C移動至位於所述貼合站S300的所述擷取器S1的下方。More specifically, the
於本實施例中,所述貼合座302包含有位置分別對應於所述移載器303與所述擷取器S1的兩個貼合部3021,並且所述移載器303能將一個所述晶片C設置於一個所述貼合部3021上。其中,當所述貼合座302將一個所述貼合部3021與其承載的所述晶片C旋轉至所述擷取器S1的下方時,另一個所述貼合部3021的位置則對應於所述移載器303,用以供所述移載器303輸送另一個所述晶片C至其上,據以提升所述晶片擷取裝置300的整體工作效率。In this embodiment, the
據此,通過所述擷取器S1及所述膜片21之間的相對位置、及所述貼合座302與所述晶片C之間的相對位置皆已被精準地測得,以利於所述擷取器S1能夠將其所擷取的所述膜片21於所述貼合站S300中精準地貼合至所述晶片C的預定位置上。Accordingly, the relative position between the extractor S1 and the
再者,當任一個所述擷取器S1在經過所述貼合站S300後,其能輸送所擷取的所述膜片21與相貼合的所述晶片C至下一個所述站點S’,據以使得所述晶片貼膜設備1000可以通過所述擷取器S1來快速地串連不同的所述站點S’(或不同的所述裝置D),進而有效地提升所述晶片貼膜設備1000的整體工作效率。Furthermore, when any one of the extractors S1 passes through the lamination station S300, it can transport the extracted
換個角度來說,所述擷取器S1能依序移動經過所述供膜裝置100、膜對位裝置200、及晶片擷取裝置300;其中,所述擷取器S1能自所述供膜裝置100擷取一個所述膜片21、並能通過所述膜對位裝置200來對其所擷取的所述膜片21進行對位、且能將其所擷取的所述膜片21來與所述晶片擷取裝置300所擷取的所述晶片C相互貼合、且能(朝後續所述站點S’)輸送相互貼合的所述晶片C與所述膜片21。In other words, the extractor S1 can move through the
需額外說明的是,所述晶片貼膜設備1000可以在所述貼合站S300或所述晶片擷取裝置300的下游,依據所述膜片21與相貼合所述晶片C能被所述擷取器S1輸送的功能並搭配設計需求,據以選擇性地增設相對應的站點或裝置,不受限於本實施例所載。It should be noted that, the
如圖4A和圖4B所示,所述晶片確認裝置400於本實施例中位於所述晶片擷取裝置300的下游,並且當任一個所述擷取器S1在經過所述貼合站S300後,其能輸送所擷取的所述膜片21與相貼合的所述晶片C至所述晶片確認站S400,用以通過所述晶片確認裝置400來對由所述膜片21貼合的所述晶片C進行一晶片確認作業。As shown in FIG. 4A and FIG. 4B , the
更詳細地說,所述晶片確認裝置400於本實施例中可以是一底側光學檢測器,用以通過自動光學檢測(Automated Optical Inspection,AOI)流程而由貼合於所述膜片21的所述晶片C之底側進行位置的檢測、或是確認所述膜片21是否確實貼合有所述晶片C(即,所述晶片確認作業),但本發明不受限於此。需說明的是,在所述晶片確認裝置400實施檢測的過程中,所述擷取器S1是維持擷取所述膜片21,並且所述膜片21保持黏貼所述晶片C,據以利於迅速地進入下一個所述站點S’(或下一個的所述裝置D)。In more detail, the
如圖5A至圖5D所示,所述檢查裝置500位於所述晶片確認裝置400的下游,並且當任一個所述擷取器S1在經過所述晶片確認站S400後,其能輸送所擷取的所述膜片21與相貼合的所述晶片C至所述檢查站S500,用以通過所述檢查裝置500進行所述膜片21與相貼合的所述晶片C的一檢查作業。As shown in FIGS. 5A to 5D , the
更詳細地說,所述檢查裝置500於本實施例中包含有一檢查座501及位置對應於所述檢查座501的一頂側光學檢測器502。其中,所述檢查座501的位置可轉動地對應於所述頂側光學檢測器502與位於所述檢查站S500的所述擷取器S1,並且所述擷取器S1能將其所擷取的所述膜片21與相貼合的所述晶片C設置於所述檢查座501上。More specifically, the
當所述檢查座501將其所承載的所述晶片C與所述膜片21旋轉至所述頂側光學檢測器502的下方時,所述頂側光學檢測器502能接著通過自動光學檢測(AOI)流程而由所述晶片C與所述膜片21之頂側進行相對位置的檢測(即,所述檢查作業)。再者,所述晶片C與所述膜片21之頂側在通過所述檢查作業之後,所述檢查座501能將通過所述檢查作業的所述晶片C與所述膜片21轉動至所述擷取器S1的下方,以供所述擷取器S1擷取所述膜片21及相貼合的所述晶片C。When the
需額外說明的是,在所述檢查裝置500實施上述檢測的過程中,所述膜片21與所述晶片C是離開所述擷取器S1而置於所述檢查裝置500,並於檢測結束後,再由所述擷取器S1輸送至下一個所述站點S’(或下一個所述裝置D)。It should be noted that, during the inspection process performed by the
如圖6和圖7所示,所述廢品收納裝置600與所述良品收納裝置700皆位於所述檢查裝置500的下游,並且所述良品收納裝置700於本實施例中是位在所述廢品收納裝置600的下游,但本發明不受限於此。其中,任一個所述擷取器S1是依據所述晶片確認作業與所述檢查作業的判定結果,而選擇性地移動至所述廢品收納裝置600與所述良品收納裝置700的其中之一。As shown in FIG. 6 and FIG. 7 , both the
更詳細地說,如圖6所示,當任一個所述擷取器S1所擷取的所述膜片21與相貼合的所述晶片C在所述晶片確認作業或所述檢查作業之中被判定為不合格時,其能被輸送至所述廢品站S600,用以通過所述廢品收納裝置600收納。或者,如圖7所示,當任一個所述擷取器S1所擷取的所述膜片21與相貼合的所述晶片C在所述晶片確認作業及所述檢查作業之中被判定為合格時,其能(跳過所述廢品站S600而)被輸送至所述良品站S700,用以通過所述良品收納裝置700收納。More specifically, as shown in FIG. 6 , when the
於本實施例中,如圖6所示,所述廢品收納裝置600例如是一廢品載盤,用以供移動至所述廢品站S600的任一個所述擷取器S1能將其所擷取的所述膜片21與相貼合的所述晶片C設置於其上。其中,所述廢品載盤可以通過移動,以使位於所述擷取器S1下方的所述廢品載盤部位能夠維持足夠的空間,據以收納所述膜片21與相貼合的所述晶片C。In this embodiment, as shown in FIG. 6 , the
再者,如圖7所示,所述良品收納裝置700包含有多個載入件701及對應於至少一個所述載入件設置的一包裝模組702。其中,多個所述載入件701能逐一經過所述良品站S700,用以(自位於所述良品站S700的所述擷取器S1)接收判定為合格的所述膜片21與相貼合的所述晶片C;其中,多個所述載入件701於本實施例中可以是設置於一轉盤上,以通過所述轉盤的旋轉而逐一經過所述良品站S700。再者,而所述包裝模組702則是能自多個所述載入件701逐一接收所述膜片21與相貼合的所述晶片C。Furthermore, as shown in FIG. 7 , the good
[實施例二][Example 2]
請參閱圖8至圖11所示,其為本發明的實施例二。由於本實施例類似於上述實施例一,所以兩個實施例的相同處不再加以贅述,而本實施例相較於上述實施例一的差異主要在於所述供膜裝置100,並且所述供膜裝置100於本實施例中的構造大致說明如下:Please refer to FIG. 8 to FIG. 11 , which is the second embodiment of the present invention. Since this embodiment is similar to the above-mentioned first embodiment, the similarities between the two embodiments will not be repeated. The structure of the
如圖8和圖9A所示,所述供膜裝置100包含有一機台本體1、可分離地架設於所述機台本體1的一料件模組2、可滾動地安裝於所述機台本體1的多個滾軸3、及固定於所述機台本體1的一預剝離件4。其中,所述機台本體1、多個所述滾軸3、及所述預剝離件4於本實施例中是合併稱為一預剝膜機台10,並且所述預剝膜機台10雖是以搭配於所述料件模組2來說明,但本發明不受限於此。舉例來說,在本發明未繪示的其他實施例中,所述預剝膜機台10可以單獨地被應用(如:販賣)或是搭配其他構件使用。As shown in FIG. 8 and FIG. 9A , the
多個所述滾軸3共同定義出一輸送路徑P,所述料件模組2包含有一承載片22及貼附於所述承載片22上的多個膜片21,並且所述承載片22能在所述輸送路徑P上移動(也就是,多個所述滾軸3能用以使所述承載片22沿著所述輸送路徑P移動),而所述預剝離件4具有位於所述輸送路徑P上的一轉折邊緣41。A plurality of the
進一步地說,當多個所述滾軸3驅使所述承載片22沿著所述輸送路徑P移動時,分別位在所述轉折邊緣41相反兩側的所述承載片22的兩個部分221形成有小於180度的一轉折角α1(或是說,所述轉折邊緣41能用來使所述承載片22的兩個所述部分221形成有所述轉折角α1),以使鄰近所述轉折邊緣41的多個所述膜片21分別於不同時間點經過所述轉折邊緣41而逐個自所述承載片22分離。Further, when a plurality of the
於本實施例中,所述轉折角α1是以小於90度(如:70度~85度)來說明,但本發明不受限於此。再者,所述供膜裝置100通過在所述預剝離件4設有所述轉折邊緣41,據以利於多個所述膜片21逐個自所述承載片22分離,進而有效地提升其運作效率,並能進一步用來提供移動至所述取膜站S100的任一個所述擷取器S1進行擷取,以提升的整體運作效能。In this embodiment, the turning angle α1 is described as being less than 90 degrees (eg, 70 degrees to 85 degrees), but the present invention is not limited thereto. Furthermore, the
更詳細地說,所述料件模組2於本實施例中包含有彼此配合使用的一捲放器23與一捲收器24,並且所述捲放器23與所述捲收器24皆安裝於所述機台本體1。其中,所述捲放器23位於所述輸送路徑P的起點,所述承載片22及多個所述膜片21捲繞於所述捲放器23,並且所述捲放器23用以傳輸所述承載片22及多個所述膜片21至所述輸送路徑P。再者,所述捲收器24位於所述輸送路徑P的終點,並且所述捲放器23用來捲收移動經過所述轉折邊緣41的所述承載片22。More specifically, the
進一步地說,如圖8和圖9A所示,所述供膜裝置100(或所述預剝膜機台10)於本實施例中可以進一步包含有安裝於所述機台本體1的一影像擷取器5,並且所述影像擷取器5的位置對應於所述輸送路徑P並位於所述轉折邊緣41的上游,用以擷取多個所述膜片21在移動經過所述轉折邊緣41前的位置。Further, as shown in FIG. 8 and FIG. 9A , the film supply device 100 (or the pre-stripping machine 10 ) in this embodiment may further include an image mounted on the machine body 1 A
再者,如圖8至圖9C所示,任一個所述擷取器S1移動至所述取膜站S100來進行所述膜片21擷取的一取膜位置可以是保持不變,並且所述機台本體1包含有能移動所述預剝離件4與至少部分所述料件模組2的一橫移機構11。舉例來說,所述橫移機構11可以是由多個線軌所組成(如:XY軸滑台),用以使所述捲放器23、所述承載片22、多個所述膜片21、及所述預剝離件4可以在一平面上移動。Furthermore, as shown in FIG. 8 to FIG. 9C , any one of the capturing devices S1 moves to the film capturing station S100 for capturing a film position of the
於本實施例中,經過所述轉折邊緣41而逐個自所述承載片22分離的多個所述膜片21,其能通過所述橫移機構11依據所述影像擷取器5而逐個移動至所述取膜位置。據此,所述橫移機構11通過所述影像擷取器5所得到的多個所述膜片21位置資訊,其不但能有效地消除多個所述膜片21排列於所述承載片22上所產生的誤差、並有助於任一個所述擷取器S1的所述取膜位置可以維持不變,進而顯著地提高每個所述擷取器S1擷取所述膜片21的效率與精準度。In this embodiment, the plurality of
此外,在本發明未繪的其他實施例中,所述擷取器S1進行所述膜片21擷取的所述取膜位置可以依據所述影像擷取器5而改變,以使所述擷取器S1可以移動至由所述承載片22分離且待擷取的所述膜片21的正上方,因而令所述供膜裝置100無須設有所述橫移機構11。In addition, in other embodiments not shown in the present invention, the position of the film captured by the
需額外說明的是,為了使多個所述膜片21能夠在所述轉折邊緣41較為順利地自所述承載片22逐個分離,多個所述膜片21、所述輸送路徑P、及所述轉折邊緣41彼此之間的相對應關係較佳是符合下述條件,但本發明不受限於此。It should be noted that, in order to enable the plurality of
其中,多個所述膜片21沿非平行於所述輸送路徑P的一排列方向R排成多列,並且所述轉折邊緣41與所述排列方向R相夾有一銳角α2。如圖9A所示,所述排列方向R垂直於所述輸送路徑P,並且所述銳角α2介於3度~30度。再者,所述轉折邊緣41非垂直於所述輸送路徑P,並且所述轉折邊緣41與所述輸送路徑P可以形成有介於45度~60度的一夾角α3。Wherein, a plurality of the
需說明的是,符合所述銳角α2與所述夾角α3的上述條件於本實施例中可以是同時出現在圖9A之中(如:所述銳角α2為30度,所述夾角α3為60度),但符合所述銳角α2與所述夾角α3的上述條件也可以是分別出現在不同的實施態樣之中,本發明在此不加以限制。舉例來說,如圖10所示,在符合所述轉折邊緣41非垂直於所述輸送路徑P,並符合所述夾角α3介於45度~60度的條件下,所述排列方向R可以是非垂直於所述輸送路徑P。It should be noted that the above-mentioned conditions satisfying the acute angle α2 and the included angle α3 may appear in FIG. 9A at the same time in this embodiment (for example, the acute angle α2 is 30 degrees, and the included angle α3 is 60 degrees) ), but the above-mentioned conditions satisfying the acute angle α2 and the included angle α3 may also appear in different embodiments, which are not limited in the present invention. For example, as shown in FIG. 10 , under the condition that the turning
更進一步地說,在圖9A和圖10所示的構造中,所述轉折邊緣41是非垂直於所述輸送路徑P,但本發明不受限於此。舉例來說,如圖11所示,所述排列方向R可以非垂直於所述輸送路徑P,並且所述銳角α2較佳是介於30度~45度;在符合上述條件之下,所述轉折邊緣41可以是垂直於所述輸送路徑P。Furthermore, in the configuration shown in FIGS. 9A and 10 , the turning
再者,所述供膜裝置100(或所述預剝膜機台10)可以進一步包含有安裝於所述機台本體1的一張力調整機構6,並且所述張力調整機構6的位置對應於所述輸送路徑P並位於所述轉折邊緣41的下游,用以使所述承載片22的兩個所述部分221的張力值維持相同。Furthermore, the film supply device 100 (or the pre-stripping machine 10 ) may further include a
[本發明實施例的技術效果][Technical effects of the embodiments of the present invention]
綜上所述,本發明實施例所公開的晶片貼膜設備,其通過多個所述裝置與所述擷取器的搭配設計,使得所述擷取器能夠同時輸送所述膜片與相貼合的所述晶片,據以快速地串連不同的所述裝置,進而有效地提升整體的工作效率。To sum up, the wafer lamination equipment disclosed in the embodiments of the present invention is designed through the matching design of a plurality of the devices and the extractor, so that the extractor can convey the film and attach the film at the same time. The said chip can quickly connect different said devices in series, thereby effectively improving the overall work efficiency.
再者,通過所述擷取器及所述膜片之間的相對位置、及所述貼合座與所述晶片之間的相對位置皆已在所述膜對位站與所述貼膜站中被精準地測得,以利於所述擷取器能夠將其所擷取的所述膜片於所述貼合站中精準地貼合至所述晶片的預定位置上。Furthermore, through the relative position between the extractor and the film, and the relative position between the bonding seat and the wafer, both in the film alignment station and the film attaching station It is accurately measured, so that the extractor can accurately attach the captured film to the predetermined position of the wafer in the attaching station.
另外,本發明實施例所公開的供膜裝置與預剝膜機台,其能通過在所述預剝離件設有所述轉折邊緣,據以利於多個所述膜片逐個自所述承載片分離,進而有效地提升其運作效率,並能進一步用來提供擷取器進行擷取。In addition, in the film supply device and the pre-peeling machine disclosed in the embodiments of the present invention, the pre-peeling member can be provided with the turning edge, so that the plurality of film sheets can be separated from the carrier sheet one by one. separation, thereby effectively improving its operational efficiency, and can be further used to provide a capture device for capture.
以上所公開的內容僅為本發明的優選可行實施例,並非因此侷限本發明的專利範圍,所以凡是運用本發明說明書及圖式內容所做的等效技術變化,均包含於本發明的專利範圍內。The content disclosed above is only a preferred feasible embodiment of the present invention, and is not intended to limit the patent scope of the present invention. Therefore, any equivalent technical changes made by using the contents of the description and drawings of the present invention are included in the patent scope of the present invention. Inside.
1000:晶片貼膜設備 D:裝置 100:供膜裝置 10:預剝膜機台 1:機台本體 11:橫移機構 2:料件模組 21:膜片 22:承載片 221:部分 23:捲放器 24:捲收器 3:滾軸 4:預剝離件 41:轉折邊緣 5:影像擷取器 6:張力調整機構 200:膜對位裝置 300:晶片擷取裝置 301:晶片載盤 302:貼合座 3021:貼合部 303:移載器 304:頂攝像器 400:晶片確認裝置 500:檢查裝置 501:檢查座 502:頂側光學檢測器 600:廢品收納裝置 700:良品收納裝置 701:載入件 702:包裝模組 S:循環式工作站 S1:擷取器 S’:站點 S100:取膜站 S200:膜對位站 S300:貼合站 S400:晶片確認站 S500:檢查站 S600:廢品站 S700:良品站 C:晶片 P:輸送路徑 R:排列方向 α1:轉折角 α2:銳角 α3:夾角1000: Wafer Lamination Equipment D: device 100: Film supply device 10: Pre-stripping machine 1: Machine body 11: Traverse mechanism 2: Material module 21: Diaphragm 22: Carrier sheet 221: Parts 23: Rewinder 24: Retractor 3: Roller 4: Pre-stripped pieces 41: Turning Edges 5: Image grabber 6: Tension adjustment mechanism 200: Membrane alignment device 300: Chip Capture Device 301: Wafer carrier 302: Fitting seat 3021: Fitting Department 303:Transfer 304: Top Camera 400: Wafer Confirmation Device 500: Inspection device 501: Inspection Seat 502: Topside Optical Detector 600: Waste storage device 700: Good product storage device 701: Loading Piece 702: Packaging Module S: Circulation workstation S1: Fetcher S': site S100: Film removal station S200: Film Alignment Station S300: Fitting Station S400: Wafer Confirmation Station S500: Checkpoint S600: Scrap Station S700: Liangpin Station C: wafer P: conveying path R: Arrangement direction α1: turning angle α2: acute angle α3: included angle
圖1為本發明實施例一的晶片貼膜設備的俯視示意圖。FIG. 1 is a schematic top view of a wafer lamination device according to
圖2A為圖1的後續作動示意圖。FIG. 2A is a schematic diagram of subsequent operations in FIG. 1 .
圖2B為所述晶片貼膜設備於膜對位站的側視示意圖。FIG. 2B is a schematic side view of the wafer lamination equipment at the film alignment station.
圖3A為圖2A的後續作動示意圖。FIG. 3A is a schematic diagram of subsequent operations of FIG. 2A .
圖3B為所述晶片貼膜設備於貼合站的側視示意圖(一)。FIG. 3B is a schematic side view (1) of the wafer sticking equipment at the bonding station.
圖3C為所述晶片貼膜設備於貼合站的側視示意圖(二)。FIG. 3C is a schematic side view (2) of the wafer sticking equipment at the bonding station.
圖3D為所述晶片貼膜設備於貼合站的側視示意圖(三)。FIG. 3D is a schematic side view (3) of the wafer sticking equipment at the bonding station.
圖4A為圖3A的後續作動示意圖。FIG. 4A is a schematic diagram of subsequent operations of FIG. 3A .
圖4B為所述晶片貼膜設備於晶片確認站的側視示意圖。FIG. 4B is a schematic side view of the wafer sticking equipment at the wafer verification station.
圖5A為圖4A的後續作動示意圖。FIG. 5A is a schematic diagram of subsequent operations of FIG. 4A .
圖5B為所述晶片貼膜設備於檢查站的側視示意圖(一)。FIG. 5B is a schematic side view (1) of the wafer sticking equipment at the inspection station.
圖5C為所述晶片貼膜設備於檢查站的側視示意圖(二)。FIG. 5C is a schematic side view (2) of the wafer sticking equipment at the inspection station.
圖5D為所述晶片貼膜設備於檢查站的側視示意圖(三)。FIG. 5D is a schematic side view (3) of the wafer sticking equipment at the inspection station.
圖6為圖5A的後續作動示意圖。FIG. 6 is a schematic diagram of subsequent operations of FIG. 5A .
圖7為圖5A的後續作動示意圖。FIG. 7 is a schematic diagram of subsequent operations of FIG. 5A .
圖8為本發明實施例二的晶片貼膜設備對應於取膜站的示意圖。FIG. 8 is a schematic diagram of the wafer lamination device according to the second embodiment of the present invention corresponding to the film taking station.
圖9A為圖8的局部俯視示意圖。FIG. 9A is a partial top schematic view of FIG. 8 .
圖9B為圖9A的後續作動示意圖。FIG. 9B is a schematic diagram of subsequent operations of FIG. 9A .
圖9C為圖9B的後續作動示意圖。FIG. 9C is a schematic diagram of subsequent operations of FIG. 9B .
圖10為圖9A另一態樣的示意圖。FIG. 10 is a schematic diagram of another aspect of FIG. 9A .
圖11為圖9A又一態樣的示意圖。FIG. 11 is a schematic diagram of another aspect of FIG. 9A .
100:供膜裝置 100: Film supply device
10:預剝膜機台 10: Pre-stripping machine
1:機台本體 1: Machine body
11:橫移機構 11: Traverse mechanism
2:料件模組 2: Material module
21:膜片 21: Diaphragm
22:承載片 22: Carrier sheet
221:部分 221: Parts
23:捲放器 23: Rewinder
24:捲收器 24: Retractor
3:滾軸 3: Roller
4:預剝離件 4: Pre-stripped pieces
5:影像擷取器 5: Image grabber
6:張力調整機構 6: Tension adjustment mechanism
S1:擷取器 S1: Fetcher
S100:取膜站 S100: Film removal station
P:輸送路徑 P: conveying path
α1:轉折角 α1: turning angle
Claims (11)
Priority Applications (1)
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TW110135222A TWI777780B (en) | 2021-09-23 | 2021-09-23 | Film supply device and pre-peeling machine |
Applications Claiming Priority (1)
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TW110135222A TWI777780B (en) | 2021-09-23 | 2021-09-23 | Film supply device and pre-peeling machine |
Publications (2)
Publication Number | Publication Date |
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TWI777780B true TWI777780B (en) | 2022-09-11 |
TW202313312A TW202313312A (en) | 2023-04-01 |
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Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW201344806A (en) * | 2012-04-16 | 2013-11-01 | Gallant Micro Machining Co Ltd | Die peeling and retrieving method and apparatus thereof |
CN104425689A (en) * | 2013-08-19 | 2015-03-18 | 人科机械有限公司 | Film feeding and attaching apparatus, semiconductor chip package fabricating apparatus with the same, and method for fabricating semiconductor chip package |
CN109103126A (en) * | 2017-06-21 | 2018-12-28 | 琳得科株式会社 | Paster apparatus and method of attaching |
-
2021
- 2021-09-23 TW TW110135222A patent/TWI777780B/en active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW201344806A (en) * | 2012-04-16 | 2013-11-01 | Gallant Micro Machining Co Ltd | Die peeling and retrieving method and apparatus thereof |
CN104425689A (en) * | 2013-08-19 | 2015-03-18 | 人科机械有限公司 | Film feeding and attaching apparatus, semiconductor chip package fabricating apparatus with the same, and method for fabricating semiconductor chip package |
CN109103126A (en) * | 2017-06-21 | 2018-12-28 | 琳得科株式会社 | Paster apparatus and method of attaching |
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TW202313312A (en) | 2023-04-01 |
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