TWI771232B - System and method for testing radiation susceptibility - Google Patents

Abstract

A method for testing radiation susceptibility includes transmitting radiation wave to a device under test, measuring the device under test to obtain a first voltage according to the radiation wave, outputting a reference voltage to a coupling device so that the coupling device generates a second voltage according to the reference voltage, adjusting the reference voltage so that the second voltage approximates the first voltage, storing the adjusted reference voltage, outputting the second voltage to the device under test according to the adjusted reference voltage to simulate the impact of the radiation wave to the device under test, the device under test accordingly transmitting a control signal to the coupling device after receiving the second voltage, and determining a status of the device under test according to the control signal.

Description

System and method for testing radiation susceptibility

The present invention relates to a system and method for testing radiation sensitivity, in particular, to a system and method for testing radiation sensitivity that can simulate the influence of radiation waves on a device under test.

Radiated susceptibility (RS) testing is critical for electronic equipment, such as computers or servers. Due to the ubiquity of electromagnetic fields, if the radiation susceptibility test cannot be passed, the electronic equipment may be disturbed by radiation waves, resulting in functional failure and damage.

Currently, in order to test radiation sensitivity, electronic equipment must be placed in an anechoic chamber, radio waves are emitted to the electronic equipment, and the impact on the electronic equipment is measured. If the result is not passed, the engineer must enter the anechoic chamber by trial and error, adjust the settings, and then repeatedly perform the relevant operations to analyze or debug.

This process consumes a lot of site resources and operation time, and it is not easy to find the root cause of the error. In addition, it is not conducive to the safety and health of the engineers because the engineers have to enter the high radiation area from time to time.

Furthermore, for simple tests that do not require a formal radiation sensitivity verification report, such as engineering prediction or result comparison, if these simple tests still need to be performed in an anechoic chamber, the resources occupied and the cost will be It is almost equivalent to a formal radiation susceptibility certification test, which is quite uneconomical. Therefore, it is necessary to establish a system and method for radiation sensitivity testing without the need for an anechoic chamber, so as to facilitate analysis or debugging by engineers.

Embodiments provide a system for testing radiation sensitivity, including a peripheral control device, a coupling device, a signal generator, and a device under test. The peripheral control device is used for judging the state of a tested device according to a data signal and a first control signal. The peripheral control device includes a first terminal for transceiving the first control signal, and a second terminal for transceiving the data signal corresponding to a reference voltage. The coupling device includes a first terminal for receiving the reference voltage, a second terminal for outputting a second voltage corresponding to a first voltage according to the reference voltage and transmitting and receiving a corresponding one of the first control signal The second control signal and a third end are coupled to the first end of the peripheral control device for receiving and sending the first control signal. The signal generator includes a first end coupled to the first end of the coupling device for outputting the reference voltage, and a second end coupled to the second end of the peripheral control device for outputting the reference voltage Send and receive the data signal. The device under test is coupled to the second end of the coupling device for receiving the second voltage and receiving and transmitting the second control signal. The first voltage is measured when a radiation wave is applied to the device under test, and the reference voltage is set so that the second voltage approximates the first voltage to simulate the effect of the radiation wave on the device under test .

Another embodiment provides a method for testing radiation sensitivity, which includes transmitting a radiation wave to a device under test; measuring the device under test to measure a first voltage according to the radiation wave; outputting a reference voltage to a coupling device, to make the coupling device generate a second voltage according to the reference voltage; adjust the reference voltage to make the second voltage approximate the first voltage; store the adjusted reference voltage; output the first voltage according to the adjusted reference voltage Two voltages are applied to the device under test to simulate the influence of the radiation wave on the device under test; after the device under test receives the second voltage, a control signal is correspondingly sent to the coupling device; and the device is determined according to the control signal. The state of the device under test.

To address the aforementioned deficiencies, embodiments may provide systems and methods for testing radiation sensitivity, as described below.

According to an embodiment, the antenna can be used to transmit radiation waves to the device under test before the antenna anechoic chamber (or anechoic chamber), and the device under test can be measured to obtain a corresponding first voltage, and the frequency of the radiation waves emitted by the antenna is high or low , from each measurement frequency point between 80MHz and 1,000MHz (eg, 100MHz, 125MHz, 250MHz, 400MHz, and 1,000MHz, etc.), the EUT can obtain different first voltages. Afterwards, a reference voltage is provided by a signal generator to generate a second voltage through the coupling device to be applied to the device under test. The reference voltage generated by the signal generator can be adjusted to make the second voltage approximate to the first voltage. The adjusted reference voltage can be stored for backup, and the reference voltages corresponding to all the measurement frequency points are stored in the database; after that, it is no longer necessary to use the antenna darkroom, and the stored reference voltage can be used, and then through the coupling device A second voltage is generated and applied to the device under test to simulate the effect of the radiation wave on the device under test.

FIG. 1 is a schematic diagram of applying a radiation wave W to the EUT of the device under test in the embodiment. FIG. 2 is a schematic diagram illustrating the influence of the simulated radiation wave W on the EUT of the device under test in the embodiment. FIG. 3 is a flow chart of a method 300 for testing radiation sensitivity in an embodiment. FIG. 1 may correspond to steps 310 to 320 of FIG. 3 , and FIG. 2 may correspond to steps 330 to 380 of FIG. 3 . As shown in FIGS. 1-3, the method 300 may include the following steps:

Step 310: transmitting the radiation wave W to the EUT of the device under test;

Step 320: Measure the device under test EUT to measure the first voltage VRS according to the radiation wave W;

Step 330: Output the reference voltage Vi to the coupling device CT, so that the coupling device CT generates the second voltage V'RS according to the reference voltage Vi;

Step 340: Adjust the reference voltage Vi to make the second voltage V'RS approximate to the first voltage VRS;

Step 350: Store the adjusted reference voltage Vi;

Step 360: output the second voltage V'RS to the device under test EUT according to the adjusted reference voltage Vi, to simulate the influence of the radiation wave W on the device under test EUT;

Step 370: After receiving the second voltage V'RS, the device under test EUT transmits the control signal Sc2 to the coupling device CT correspondingly; and

Step 380: Determine the state of the EUT of the device under test according to the control signal Sc2.

As shown in FIG. 1, steps 310 to 320 may be performed in the antenna darkroom 110, wherein the radiation wave W emitted by the antenna ANT may have a predetermined frequency according to the requirements of the test. For example, the measuring device MD may be an oscilloscope, such as a digital storage oscilloscope (DSO). In Figure 1, the measuring device MD can be placed in a Faraday cage FC to avoid being affected by the radiation waves. The EUT of the device under test may include a network cable (CAT cable) and a network connector. For example, the network cable may be a CAT 5E cable, and the network connector may be an RJ45 LAN connector. Therefore, the radiation sensitivity of network cables and connectors can be tested. According to an embodiment, in FIG. 1, the measuring device MD and the device under test EUT can be placed on the work table T. As shown in FIG. The work table T may be insulating, eg a wooden table, in order to comply with the test-related specifications.

After measurement and calculation, it can be confirmed that the second voltage V'RS can indeed simulate the first voltage VRS, only the waveform has a phase difference. Therefore, it is feasible and accurate to use the second voltage V'RS to simulate the influence of the radiation wave W. Spend. FIG. 4 and FIG. 5 are schematic diagrams of the first voltage VRS and the second voltage V'RS in different embodiments. In FIGS. 4 and 5, the horizontal axis may be the time axis, and the unit may be, for example, 10 microseconds (μs), and the vertical axis may correspond to the voltage, and the unit may be, for example, volts. For example, Figure 4 may correspond to a radiation wave having a frequency of about 100 MHz, and Figure 4 may correspond to a radiation wave having a frequency of about 125 MHz. Due to the high frequency, the details of the waveforms in Figures 4 and 5 cannot be fully presented. However, as shown in Figures 4 and 5, the waveforms and voltages of the second voltage V'RS and the first voltage VRS are standardized The bits are almost identical, and the waveforms of the two have only a phase difference. Since the phase difference can be easily handled in the post-processing procedure, as shown in FIGS. 4 and 5, the solution of the embodiment can indeed use the second voltage V'RS to simulate the first voltage VRS, thereby simulating the radiation wave Effect on EUT of the device under test.

As shown in FIG. 2, in steps 330 to 350, the coupling device CT and the signal generator SG can be used to generate the second voltage V'RS to simulate the influence of the radiation wave W. As shown in FIG. 2 , the coupling device CT may include a first terminal P1 , a second terminal P2 and a third terminal P3 , wherein the first terminal P1 can receive the reference voltage Vi, and the second terminal P2 can output a corresponding voltage according to the reference voltage Vi The third terminal P3 of the second voltage V'RS of the first voltage VRS (shown in FIG. 1 ) can be coupled to the peripheral control device PD to transmit and receive the control signal Sc1 . The control signal Sc1 will be described later. Since the coupling device CT has the first end P1 to the third end P3, the coupling device CT can be a three-port coupling device.

The signal generator SG can be coupled to the first terminal P1 of the coupling device CT to output the reference voltage Vi. The device under test EUT can be coupled to the second terminal P2 of the coupling device CT to receive the second voltage V'RS. According to an embodiment, the second voltage V'RS may be positively related to the sum of the first voltage VRS and a correction factor CF, for example as shown in equation eq-1:

Vi = V'RS + CF ... eq-1;

As shown in steps 340 to 350, since the first voltage VRS has been obtained in step 320, the signal generator SG can be adjusted to a suitable reference voltage Vi, so that the second voltage V'RS is similar to the first voltage VRS. For example, the difference between the first voltage VRS and the second voltage V'RS may be no more than 10%, 5% or 1% of the first voltage VRS. As described in step 360, the second voltage V'RS may be output to the device under test EUT according to the adjusted reference voltage Vi, so as to simulate the influence of the radiation wave W on the device under test EUT.

According to an embodiment, steps 310 to 350 may be repeatedly performed to obtain reference voltages Vi corresponding to different frequencies. For example, in step 310, the radiation wave W may have a first frequency, so in steps 340 to 350, the adjusted reference voltage Vi may correspond to the first frequency. Afterwards, the radiation wave W can be adjusted from the first frequency to the second frequency to obtain the reference voltage Vi corresponding to the second frequency, and so on.

Through multiple calibrations and operations, a comparison table of multiple frequencies and multiple reference voltages Vi can be obtained. After that, if you want to apply a radiation wave W of a predetermined frequency to the EUT, you can directly use the method shown in Figure 2. The second voltage V'RS is output to the device under test EUT for simulation using the corresponding reference voltage Vi. For example, the frequencies corresponding to the reference voltages Vi in the comparison table may be in the range of tens to hundreds of megahertz (MHz), but less than 1 gigahertz (GHz) to avoid noise when the frequency is too high Too much proportion. According to an embodiment, as shown in the second figure, the data transmission between the peripheral control device PD, the coupling device CT and the EUT under test can use a local area network (LAN) for data transmission

FIG. 6 is a schematic diagram of a system 400 for testing radiation sensitivity in an embodiment. The system 400 may correspond to steps 360 to 380 in FIG. 3, and the details of the operations are as follows. The system 400 may include the coupling device CT shown in FIG. 2 , the signal generator SG, the device under test EUT, and the peripheral control device PD. However, the system 400 of FIG. 6 does not include the measurement device MD shown in FIG. 1 .

In the system 400, the peripheral control device PD can be used to test the device under test EUT according to the data signal Sd and the control signal Sc1, so as to determine the state of the device under test EUT. The peripheral control device PD may include a first end and a second end, wherein the first end is used for transceiving the control signal Sc1, and the second end is used for transceiving the data signal Sd corresponding to the reference voltage Vi. The coupling device CT includes a first terminal, a second terminal and a third terminal, wherein the first terminal is used for receiving the reference voltage Vi, and the second terminal is used for outputting the second voltage V'RS corresponding to the first voltage VRS according to the reference voltage Vi and transmit and receive the control signal Sc2 corresponding to the control signal Sc1, and the third end is coupled to the first end of the peripheral control device PD to transmit and receive the control signal Sc1. The signal generator SG includes a first end and a second end, wherein the first end is coupled to the first end of the coupling device CT for outputting the reference voltage Vi, and the second end is coupled to the first end of the peripheral control device PD The two terminals are used to send and receive data signals Sd. The device under test EUT can be coupled to the second end of the coupling device CT for receiving the second voltage V'RS and the transceiver control signal Sc2. As described above, the reference voltage Vi can be set so that the second voltage V'RS is approximated to the first voltage VRS to simulate the effect of the radiation wave W having a predetermined frequency on the device under test EUT.

According to an embodiment, the peripheral control device PD includes a desktop computer, a server, a notebook computer, a tablet computer and/or a computing device for performing related control. For example, the peripheral control device PD can execute a remote control program, To remotely control or adjust the signal generator SG, the remote control program has a database for storing the reference voltages corresponding to all the measurement frequency points, and the remote control program can be based on the reference voltage in the database Voltage, automatically and sequentially perform the test of the reference voltage corresponding to all the measurement frequency points. According to an embodiment, the device under test EUT may include a CAT cable and a network connector. For example, the network cable can be a CAT 5E cable, and the network connector can be an RJ45 LAN connector. Therefore, the radiation sensitivity of network cables and connectors can be tested.

As shown in FIG. 6 , the system 400 can optionally further include an amplifier A, which is coupled between the first end of the signal generator SG and the first end of the coupling device CT, for amplifying the reference voltage Vi. As shown in FIG. 6 , the system 400 can optionally further include an adapter C, which is coupled between the second end of the signal generator SG and the second end of the peripheral control device PD, for connecting the corresponding signal generator The first interface of the device SG and the second interface corresponding to the peripheral control device PD, wherein the first interface is different from the second interface, for example, the first interface can be a general purpose interface bus (GPIB), and The second interface may be a Universal Serial Bus (USB).

As shown in FIG. 6 , the system 400 may further include a work table T1 and a work table T2, wherein the peripheral control device PD, the coupling device CT and the signal generator SG can be set on the work table T1, and the device under test EUT can be set on the work table T1 Table T2. The work table T1 and the work table T2 may be separated by a predetermined distance, and the work table T1 and the work table T2 may be formed of insulating materials, such as wood.

According to an embodiment, in the system 400, the first end of the peripheral control device PD and the third end of the coupling device CT can be coupled through a local area network cable (LAN cable), and the second end of the coupling device CT and The devices under test can be coupled through another local area network cable. Therefore, as shown in FIG. 6, the control signal Sc1, the second voltage V'RS and the control signal Sc2 can be carried over the local area network cable for transmission.

According to an embodiment, the peripheral control device PD can transmit a piece of test data to the EUT under test through the control signal Sc1 and the control signal Sc2 and receive a corresponding piece of response data to determine the state of the EUT under test corresponding to the reference voltage Vi. For example, when the signal generator SG outputs the reference signal Vi, the peripheral control device PD can use the data signal Sd to inquire about the frequency of the simulated radiation wave corresponding to the reference signal Vi and other related information.

For example, the peripheral control device PD can output a test packet through the control signal Sc1, and the coupling device CT can transmit the test packet to the EUT through the control signal Sc2. If the device under test EUT still operates normally after the second voltage V'RS is applied, the device under test EUT can transmit the response packet to the coupling device CT through the control signal Sc2, and the coupling device CT can transmit the response packet to the coupling device CT through the control signal Sc1 The peripheral control device PD, so that the peripheral control device PD knows that the EUT is still operating normally. In this case, it can be simulated that the EUT of the device under test can operate normally when it is affected by electromagnetic waves.

In another case, if the device under test EUT is applied with the second voltage V'RS and an abnormality occurs, after the coupling device CT can transmit the test packet to the device under test EUT through the control signal Sc2, the device under test EUT fails to A response packet is returned within a predetermined time. Therefore, according to the simulation results, the peripheral control device PD can determine that an abnormality will occur when the EUT of the device under test is affected by electromagnetic waves.

As mentioned above, with the system 400 in FIG. 6, it is possible to simulate and determine the effect of electromagnetic waves on the EUT of the device under test through the data signal Sd, the control signal S1 and the control signal S2 without using an oscilloscope and a probe to measure the EUT. influences. According to the embodiment, the control program and the hardware interface of the peripheral control device PD can be appropriately adjusted to perform the above operations.

FIG. 7 is a schematic diagram of the coupling device CT of FIGS. 2 and 6 . According to an embodiment, the coupling device CT may include a set of capacitors and a set of resistors, which are coupled to the first end P1 of the coupling device CT. The coupling device CT may further include a choke circuit 610, which is coupled to the third end P3 of the coupling device CT. The choke circuit 610 may include, for example, a common mode choke. The choke circuit 610 can reduce or even block the interference of the second voltage VR'S to the peripheral control device PD. For example, the SMA (SubMiniature version A) connector can be coupled to the first end P1 of the coupling device CT, the first RJ45 connector can be coupled to the second end P2 of the coupling device CT, and the second RJ45 connector can be coupled to The third end P3 of the coupling device CT. The external mechanism of the coupling device CT can be, for example, a cube with suitable heat dissipation holes. For example, the length, width and height of the coupling device CT may be (but not limited to) 180 mm, 180 mm and 50 mm, and the RJ45 connectors of the second end P2 and the third end P3 of the coupling device CT may be provided with on the same side of the cube. According to the embodiment, by modifying the coupling device CT, it is not limited to use the RJ45 connector, but also applicable to other connectors, such as a universal serial bus (USB) connector and the like. The circuit structure of FIG. 7 is only an example, and the scope of the embodiment is not limited thereto.

According to an embodiment, the method 300 and the system 400 for testing radiation sensitivity can be used for server testing, so as to simulate the symptoms caused by electromagnetic radiation interference of the server outside the antenna dark room, so as to facilitate engineers to analyze or debug to solve the problem , to improve the stability and reliability of the server. Therefore, the server can be more suitable for artificial intelligence (AI) computing, edge computing (Edge Computing), and can also support applications such as 5G communication servers, cloud servers, and Internet of Vehicles servers.

To sum up, with the method 300 and system 400 for testing radiation sensitivity provided by the embodiments, initial measurement and calibration can be performed in the anechoic chamber 110 , and then the signal generator SG can be used to generate the corresponding reference voltage Vi , thereby generating the second voltage V'RS to simulate the interference and influence of the radiation wave W on the EUT of the device under test. According to an embodiment, the system 400 can perform related simulations without using an oscilloscope and a probe. Since it is no longer necessary to repeatedly enter the antenna darkroom 110 for operation, the health and safety of personnel can be improved, the cost of equipment and time can be reduced, and the convenience of debugging and fault analysis can be improved. helpful. The above descriptions are only preferred embodiments of the present invention, and all equivalent changes and modifications made according to the scope of the patent application of the present invention shall fall within the scope of the present invention.

110: anechoic chamber ANT: Antenna W: radiation wave EUT: Device Under Test MD: measuring device FC: Faraday Cage CT: Coupling device VRS: first voltage SG: Signal Generator PD: Peripheral Control Device Vi: reference voltage P1: first end P2: second end P3: The third end V'RS: second voltage 300: Method 310 to 380: Steps 400: System T, T1, T2: work table Sd: data signal Sc1, Sc2: Control signal 610: Choke circuit A: Amplifier C: Adapter

FIG. 1 is a schematic diagram of applying a radiation wave to a device under test in an embodiment. FIG. 2 is a schematic diagram illustrating the influence of the simulated radiation wave on the device under test in the embodiment. FIG. 3 is a flowchart of a method for testing radiation sensitivity in an embodiment. FIG. 4 and FIG. 5 are schematic diagrams of the first voltage and the second voltage in different embodiments. FIG. 6 is a schematic diagram of a system for testing radiation sensitivity in an embodiment. FIG. 7 is a schematic diagram of the coupling device of FIGS. 2 and 6 .

EUT: Device Under Test

CT: Coupling device

SG: Signal Generator

PD: Peripheral Control Device

Vi: reference voltage

P1: first end

P2: second end

P3: The third end

V'RS: second voltage

400: System

T1, T2: work table

Sd: data signal

Sc1, Sc2: Control signal

A: Amplifier

C: Adapter

Claims (10)

A system for testing radiation susceptibility, comprising: a peripheral control device for judging the state of a device under test according to a data signal and a first control signal, the peripheral control device includes a first terminal for sending and receiving the first control signal, and a second terminal, for sending and receiving the data signal corresponding to a reference voltage; A coupling device includes a first terminal for receiving the reference voltage, a second terminal for outputting a second voltage corresponding to a first voltage according to the reference voltage and transmitting and receiving a signal corresponding to the first control signal a second control signal, and a third end, coupled to the first end of the peripheral control device, for sending and receiving the first control signal; A signal generator includes a first end coupled to the first end of the coupling device for outputting the reference voltage, and a second end coupled to the second end of the peripheral control device for outputting the reference voltage to send and receive the data signal; and the device under test is coupled to the second end of the coupling device for receiving the second voltage and receiving and transmitting the second control signal; Wherein the first voltage can be measured when a radiation wave is applied to the device under test, and the reference voltage is set so that the second voltage approximates the first voltage to simulate the effect of the radiation wave on the device under test influences. The system for testing radiation sensitivity of claim 1, wherein the peripheral control device comprises a desktop computer, a server, a notebook computer, a tablet computer and/or a computing device. The system for testing radiation sensitivity of claim 1, wherein the device under test comprises a network cable and a network connector. The system for testing radiation susceptibility of claim 1, wherein the coupling device comprises: an SMA connector is coupled to the first end of the coupling device; a first RJ45 connector is coupled to the second end of the coupling device; A second RJ45 connector is coupled to the third end of the coupling device; and A choke circuit is coupled to the third end of the coupling device. A system for testing radiation susceptibility as described in claim 1, further comprising: An amplifier is coupled between the first end of the signal generator and the first end of the coupling device for amplifying the reference voltage. A system for testing radiation susceptibility as described in claim 1, further comprising: an adapter, coupled between the second end of the signal generator and the second end of the peripheral control device, for connecting a first interface corresponding to the signal generator and a first interface corresponding to the peripheral control device A second interface of the device, wherein the first interface is different from the second interface. The system for testing radiation sensitivity according to claim 1 further comprises a first work table and a second work table, wherein the peripheral control device, the coupling device and the signal generator are arranged on the first work table, The device under test is disposed on the second work table, a predetermined distance is separated between the first work table and the second work table, and the first work table and the second work table are formed of insulating materials. The system for testing radiation sensitivity of claim 1, wherein the first end of the peripheral control device and the third end of the coupling device are coupled through a local area network cable, and the coupling The second end of the device and the device under test are coupled through another local area network cable. The system for testing radiation sensitivity as claimed in claim 1, wherein the peripheral control device transmits a test data to the device under test by using the first control signal and the second control signal and receives a response data correspondingly, to determine the state of the device under test corresponding to the reference voltage. A method of testing radiation susceptibility comprising: transmitting a radiation wave to a device under test; measuring the device under test to measure a first voltage according to the radiation wave; outputting a reference voltage to a coupling device, so that the coupling device generates a second voltage according to the reference voltage; adjusting the reference voltage so that the second voltage approximates the first voltage; storing the adjusted reference voltage; outputting the second voltage to the device under test according to the adjusted reference voltage to simulate the influence of the radiation wave on the device under test; After the device under test receives the second voltage, correspondingly sends a control signal to the coupling device; and Determine the state of the device under test according to the control signal.

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