TWI765717B - Reconfigurable quantum electronic device - Google Patents
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Description
本發明是有關於一種量子電子元件,特別是指一種可配置的量子電子元件。The present invention relates to a quantum electronic component, particularly a configurable quantum electronic component.
自量子計算機(quantum computer,QC)誕生以來,超導電路和半導體量子點(quantum dots QDs)的廣泛研究已使量子位元(qubit)技術在廣闊的應用領域中取得了令人矚目的進步。Since the birth of quantum computer (QC), extensive research on superconducting circuits and semiconductor quantum dots (quantum dots QDs) has enabled quantum bit (qubit) technology to achieve remarkable progress in a wide range of applications.
另一種量子點的應用便是能有效操控單一電荷變化的單電子電晶體(single electron transistor,SET),其是以量子點作為基本組成核心,運用量子點擁有獨特的庫倫阻斷(coulomb blockade)效應來操作單一電子或是電洞的變化,進而能運用單電子電晶體作為邏輯元件與記憶體元件,並與場效電晶體整合,其重要性日益增加。Another application of quantum dots is a single electron transistor (SET) that can effectively control the change of a single charge. It uses quantum dots as the basic core, and uses quantum dots to have a unique coulomb blockade (coulomb blockade). It is increasingly important to operate single-electron or hole changes by the effect of single-electron transistors, which can be used as logic elements and memory elements, and integrated with field-effect transistors.
一般常見形成半導體量子點的製程方法,有例如透過電場約束載子密度所形成之電性上的量子點,或是利用微影與蝕刻形成之物理上的量子點。Generally, there are common process methods for forming semiconductor quantum dots, such as electrical quantum dots formed by constraining the carrier density by an electric field, or physical quantum dots formed by lithography and etching.
使用電場約束法的優點為可控性高,其透過電極即可調控量子點的能階或是自旋特性,但卻需要製作多個電極,因此會有大面積與嚴重寄生電容效應的缺點;而微影與蝕刻製程雖可以借助先進且成熟的CMOS微影蝕刻製程方法來定義製作半導體量子點,也比較有機會實現室溫下操作的單電子電晶體,但卻非常考驗微影解析度及對準的能力。The advantage of using the electric field confinement method is that it is highly controllable, and the energy level or spin characteristics of quantum dots can be adjusted through electrodes, but multiple electrodes need to be fabricated, so there are disadvantages of large area and serious parasitic capacitance effects; Although the lithography and etching process can use the advanced and mature CMOS lithography and etching process method to define the production of semiconductor quantum dots, it is also more likely to realize single-electron transistors operating at room temperature, but it is very difficult to test the resolution and efficiency of lithography. ability to align.
因此,本發明的目的,即在提供一種可配置的量子電子元件。Therefore, the purpose of the present invention is to provide a configurable quantum electronic device.
於是,本發明可配置的量子電子元件包含一半導體基板及至少一量子單元。Thus, the configurable quantum electronic device of the present invention includes a semiconductor substrate and at least one quantum unit.
該至少一量子單元包括二導電脊、一量子點、一隔離層,及一電極組。該等導電脊彼此成角度地設置在該半導體基板上,而界定出一夾角區。該量子點設置在該半導體基板上並位在該夾角區。該隔離層位在該夾角區而圍繞該量子點。該電極組對準該量子點地設置在該等導電脊之間。The at least one quantum unit includes two conductive ridges, a quantum dot, an isolation layer, and an electrode group. The conductive ridges are arranged on the semiconductor substrate at an angle to each other to define an included angle area. The quantum dots are arranged on the semiconductor substrate and located in the included angle region. The isolation layer is located in the angle region and surrounds the quantum dot. The electrode set is positioned between the conductive ridges in alignment with the quantum dots.
本發明的功效在於,透過設置該等導電脊而定義出該夾角區,使該量子點能輕易地佈置在半導體基板上且位在該夾角位置處。能高度掌控每個量子點的直徑與均勻性。且自組成長的該隔離層能與該量子點彼此緊密耦合,更可以運用自對準的該電極組來進行注入或是操控電荷。可以視實際應用端的需求,施予適合的偏壓,提供多種的新型量子點元件組態,具有高度的可重構性。The effect of the present invention is that the included angle region is defined by arranging the conductive ridges, so that the quantum dots can be easily arranged on the semiconductor substrate and located at the included angle position. The diameter and uniformity of each quantum dot can be highly controlled. In addition, the self-organized isolation layer and the quantum dots can be tightly coupled to each other, and the self-aligned electrode group can be used to inject or manipulate charges. Appropriate bias voltage can be applied according to the needs of practical applications, providing a variety of new quantum dot device configurations, with high reconfigurability.
在本發明被詳細描述之前,應當注意在以下的說明內容中,類似的元件是以相同的編號來表示。Before the present invention is described in detail, it should be noted that in the following description, similar elements are designated by the same reference numerals.
參閱圖1與圖2,本發明可配置的量子電子元件的一實施例包含一半導體基板2、多個陣列設置在該半導體基板2上的量子單元3;其中,每一個該量子單元3包括二導電脊31、一量子點32、一隔離層33,及一電極組34。該半導體基板2的是使用具有單晶矽(c-Si)層的絕緣層上矽(silicon on insulator,SOI)基板。Referring to FIG. 1 and FIG. 2 , an embodiment of the configurable quantum electronic device of the present invention includes a
具體地說,在本實施例中,該等量子單元3是圍繞一軸線L陣列排列,較佳地,是讓該等量子單元3的其中一個該導電脊31彼此相連而在該半導體基板2上陣列地排列成一圓形,且彼此相連的該等導電脊31呈扇形脊態樣。要說明的是,本實施例僅是以陣列排列成圓形態樣為例做說明,但並不限於此,只要該等量子單元3成陣列排列即可,又,量子單元3的數量也沒有特別限制,也可以只有一個,在本實施例中,是以八個量子單元3為例做說明。Specifically, in this embodiment, the
詳細地說,在每一個該量子單元3中,該等導電脊31是彼此成角度地設置在該半導體基板2上,且該等導電脊31分別包括二彼此相向而共同界定出呈扇形的一夾角區310的側壁311,在本實施例中,每一個該導電脊31是由氮化矽(Si
3N
4)所構成。
In detail, in each of the
該量子點32設置在該半導體基板2上並位在該夾角區310中,且該隔離層33位在該夾角區310以圍繞該量子點32,要說明的是,該量子點32的設置位置或尺寸均是可調控的,較佳地,在本實施例中,該量子點32是鄰近該夾角區310的夾角處設置,而該量子點32為圓形且其直徑可介於5nm~20nm,且相鄰的該等量子點32之間的距離可控制在12nm左右。The
由於本實施例形成量子點32的材料是使用矽鍺合金且是透過高溫熱氧化方式所形成,因此,在矽鍺合金經高溫熱氧化後,其矽會多方向氧化成二氧化矽(SiO
2),而鍺(Ge)則會析出往核心中推擠並濃縮合成以構成該量子點32,此時,包圍鍺量子點32的二氧化矽(SiO
2)便是該隔離層33,在本實施例中,該隔離層33的厚度介於15nm~20nm。要說明的是,選用製成該量子點32及該隔離層33的材料並不限於前述的矽鍺合金,只要找到具有選擇性氧化的合金便可。
Since the material for forming the
該電極組34則是對準該量子點32地設置在該等導電脊31之間,用以對該等量子點32的電調節,以調諧(tuning)/去調(detuning)該等量子點32之間的電荷交換相互作用(exchange interactions)。較佳地,在本實施例中,該電極組34包括一設置在該半導體基板2上,並位在該等導電脊31之間的柱塞閘極341,及二分別設置在該等側壁311上的側壁閘極342,且構成該等柱塞閘極341與該等側壁閘極342的材料是多晶矽(poly-Si)。The
要特別說明的是,本實施例的圖1、2是示出每一個該量子單元3均具有該柱塞閘極341及該等側壁閘極342以方便說明,但實際應用可視情況而選擇於某幾個該量子單元3中只設置該柱塞閘極341,其相關結構容後說明。It should be noted that, FIGS. 1 and 2 of this embodiment show that each of the
透過先在該等半導體基板2上設置好呈陣列排列的該等導電脊31,而定義出該等夾角區310後,便能確保讓後續的該等量子點32形成在該等導電脊31之間的夾角處,更能讓該等柱塞閘極341及該等側壁閘極342準確地對準對應的該量子點32。By first setting the
配合參閱圖3,圖3顯示出該實施例的一能量散射X射線譜(EDS)成分映像圖,由圖3確實可對應圖1、2而看出該等量子點32是分別設置在兩該等導電脊31之間並具有由二氧化矽(SiO
2)構成的該隔離層33,及設置在該等導電脊31之間而分別對準該等量子點32的該等電極組34,且能得知該等量子點32之間的間距介於30nm~50nm,此間距主要是由該等導電脊31的寬度與厚度來決定;其中,圖3(a)矽(Si)以藍色呈現,而鍺(Ge)則是以綠色呈現,圖3(b)的氮(N)以紅色表示,而圖3(c)的氧(O)則以白色表示。
Referring to FIG. 3, FIG. 3 shows an energy dispersive X-ray spectrum (EDS) composition map of this embodiment, and it can be seen from FIG. 3 that the
參閱圖4,圖4是顯示出從本發明可配置的量子電子元件的該實施中選其中二個相鄰的該量子單元3,或只在該半導體基板2上設置兩個相鄰的該量子單元3。圖4是讓該等量子單元3相鄰設置,使該等量子單元3中的其中一該導電脊31彼此相連,但與前述該量子單元3不同的是,圖4是只包括二設置在該半導體基板2上,而分別位在該等導電脊31之間的柱塞閘極341,從而構成雙量子點(DQDs)。Referring to FIG. 4, FIG. 4 shows that two adjacent
進一步而言,在此雙量子點元件中,其量子點32主要是作為量子位元(qubit)的應用,且此結構的該等導電脊31便可直接用作為電極,而無需設置該等側壁閘極342。進一步地來說,直接透過該等導電脊31作為電極時,從而能調整相鄰的該等量子點32之間的作用,也就是說,直接對該等導電脊31給予偏壓或反向偏壓時,能直接讓相鄰的該等量子點32相互作用或是相互隔絕該等量子點32。Further, in this double quantum dot device, the
但要說明的是,本發明可配置的量子電子元件也可以做為單個量子位元(qubit),也就是在該半導體基板2上只設置有單個量子單元3,而同樣地讓該量子單元2的該等導電脊31之間僅具有該柱塞閘極341,並直接以該等導電脊31作為電極之用。However, it should be noted that the configurable quantum electronic element of the present invention can also be used as a single quantum bit (qubit), that is, only a single
參閱圖5,圖5是顯示出從本發明可配置的量子電子元件的該實施中選其中一個該量子單元3,或只在該半導體基板2上設置單個該量子單元3。與前述該量子單元3的結構相同,該電極組34包括該柱塞閘極341及該等側壁閘極342,從而構成構成一量子點單電子電晶體(QD-SET),此時,該柱塞閘極341便是作為該量子點單電子電晶體的閘極G的電極,而該等側壁閘極342則分別作為源極S與汲極D的電極之用。Referring to FIG. 5 , it is shown that one of the
參閱圖6,圖6是顯示出從本發明可配置的量子電子元件的該實施中選其中兩個相鄰的該量子單元3,其結構與圖5大致相同,也同時具有該等柱塞閘極341與該等側壁閘極342,透過兩個相鄰的兩量子單元3來構成一互補式量子點的邏輯電路。Referring to FIG. 6, FIG. 6 shows the selection of two adjacent
參閱圖7,圖7便是整合如圖1陣列的該等量子單元3,且依據不同應用而對應設置該等柱塞閘極341與該等側壁閘極342,從而將量子位元與單電子電晶體相互整合在一起,圖7是以呈現六個量子位元及兩個單電子電晶體為例做說明。Referring to FIG. 7, FIG. 7 is the integration of the
為了清楚說明本發明可配置的量子電子元件的該實施例的結構,以下說明製作可配置的量子電子元件的該實施例的步驟。In order to clearly illustrate the structure of this embodiment of the configurable quantum electronic device of the present invention, the steps for fabricating this embodiment of the configurable quantum electronic device are described below.
參閱圖8,在具有單晶矽(c-Si)層的絕緣層上矽(silicon on isulator,SOI)基板4上,以低壓化學氣相沉積(low-pressure chemical vapor deposition,LPCVD)沉積氮化矽(Si
3N
4)層41,再配合電子束微影(electron-beam lithography,EBL)及使用SF
6/C
4F
8等離子蝕刻(plasma etching),以在基板4上產生圖案化的扇形脊5。
Referring to FIG. 8 , on a silicon-on-isulator (SOI)
參閱圖9與圖10,接著,再於圖案化的扇形脊5上依序沉積厚度不同的氮化矽(Si
3N
4)層41與多晶矽鍺(poly-Si
0.85Ge
0.15)層6,已構成雙層模而用以包覆該等扇形脊5(見圖8);隨後,通過使用SF
6/C
4F
8等離子體進行直接回蝕,以在該等扇形脊5對應的側壁上對稱產生多晶矽鍺島61(如圖10所示)。
Referring to FIG. 9 and FIG. 10 , then, a silicon nitride (Si 3 N 4 )
參閱圖11與圖12,透過光阻層7遮蓋部分的該等扇形脊5中心區域,以蝕刻多晶矽鍺島61而定義該等扇形脊5的側壁上的多晶矽鍺島61的長度。Referring to FIGS. 11 and 12 , the central regions of the fan-
配合參閱圖13,在圖12中定義出多晶矽鍺島61的長度後,在H
2O環境中,以850℃~900℃進行25分鐘~40分鐘的熱氧化,以將被定義的多晶矽鍺島61在相鄰的該等扇形脊5的夾角處轉換成鍺(Ge)量子點32,並同時形成包圍對應的該量子點32的該隔離層33(SiO
2)。
Referring to FIG. 13 , after the length of the polycrystalline
配合參閱圖1與圖14,最後,於圖13所示的元件上沉積多晶矽(poly-Si)層8,並進行選擇性蝕刻,從而在扇形脊5之間形成自對準的多晶矽外部電極,以構成如圖1可配置的量子電子元件。Referring to FIG. 1 and FIG. 14 , finally, a polysilicon (poly-Si)
由前述製程可知,可透過光阻層7所曝光定義出的多晶矽鍺島61的長度,能用以決定鍺量子點32的含量及尺寸大小,而形成鍺量子點32的數量及位置,則可透過預先定義的該等扇形脊5來決定配置,能有效改善現有透過微影與蝕刻製程來形成量子點而需要非常考驗微影解析度及對準的能力的缺點。It can be seen from the foregoing process that the length of the
綜上所述,透過定義出圖案化且具有夾角區310的該等導電脊31,而可同時分別在該夾角位置處形成多個緊密耦合鍺量子點32,以能高度掌控每個鍺量子點32的直徑與均勻性,從而具有良好的直徑可調控與均勻性,且於形成量子點32的過程中,自組成長的二氧化矽(SiO
2)隔離層33能與量子點32彼此緊密耦合;此外,在量子單元3中進一步設置柱塞閘極341 與側壁閘極342 等三個鄰近的自我對準電極設計,可以視實際應用端的需求,施予適合的偏壓,提供多種的新型量子點元件組態,具有高度的可重構性,其所建立的自我對準電極技術,可以直接整合量子點量子位元與單電子電晶體電路,提高讀取量子狀態的精準度,故確實能達成本發明的目的。
To sum up, by defining the patterned
惟以上所述者,僅為本發明的實施例而已,當不能以此限定本發明實施的範圍,凡是依本發明申請專利範圍及專利說明書內容所作的簡單的等效變化與修飾,皆仍屬本發明專利涵蓋的範圍內。However, the above are only examples of the present invention, and should not limit the scope of implementation of the present invention. Any simple equivalent changes and modifications made according to the scope of the patent application of the present invention and the contents of the patent specification are still included in the scope of the present invention. within the scope of the invention patent.
2:半導體基板 3:量子單元 31:導電脊 310:夾角區 311:側壁 32:量子點 33:隔離層 34:電極組 341:柱塞閘極 342:側壁閘極 4:基板 41:氮化矽層 5:扇形脊 6:多晶矽鍺層 61:多晶矽鍺島 7:光阻層 8:多晶矽層 L:軸線2: Semiconductor substrate 3: Quantum unit 31: Conductive Ridges 310: Angle area 311: Sidewall 32: Quantum Dots 33: isolation layer 34: Electrode set 341: Plunger gate 342: sidewall gate 4: Substrate 41: Silicon nitride layer 5: Scalloped Ridge 6: Polycrystalline silicon germanium layer 61: Polycrystalline silicon germanium island 7: Photoresist layer 8: Polysilicon layer L: axis
本發明的其他的特徵及功效,將於參照圖式的實施方式中清楚地呈現,其中: 圖1是一立體示意圖,說明本發明可配置的量子電子元件的一實施例; 圖2是一俯視示意圖,輔助圖1說明本發明該實施例; 圖3是一能量散射X射線譜(energy dispersive x-ray spectroscopy,EDS)成分映像圖,說明; 圖4是一電路示意圖,說明本發明該實施例的其中二兩量子單元構成一雙量子點(double quantum dots,DQDs); 圖5是一電路示意圖,說明本發明該實施例的其中一個量子單元構成一量子點單電子電晶體(quantum dot single electron transistor,QD-SET); 圖6是一電路示意圖,說明本發明該實施例的其中二兩量子單元構成一互補式量子點的邏輯電路; 圖7是一電路示意圖,說明本發明該實施例的該等量子單元構成的量子位元與單電子電晶體相互整合在一起; 圖8是一示意圖,說明本發明形成該實施例可配置的量子電子元件時,進行光刻圖案化的定義步驟,以產生圖案化的扇形脊; 圖9是一示意圖,說明本發明形成該實施例可配置的量子電子元件時,沉積氮化矽(Si 3N 4)與多晶矽鍺(poly-Si 0.85Ge 0.15); 圖10是一示意圖,說明本發明形成該實施例可配置的量子電子元件時,進行回蝕工藝; 圖11是一示意圖,說明本發明形成該實施例可配置的量子電子元件時,透過光阻來定義多晶矽鍺(poly-Si 0.85Ge 0.15)島的長度; 圖12是一示意圖,說明本發明形成該實施例可配置的量子電子元件時,多晶矽鍺島經蝕刻後的態樣; 圖13是一示意圖,說明本發明形成該實施例可配置的量子電子元件時,多晶矽鍺島進行熱氧化而在夾角處形成鍺量子點;及 圖14是一示意圖,說明本發明形成該實施例可配置的量子電子元件時,沉積多晶矽並進行回蝕,以構成該等電極組。 Other features and effects of the present invention will be clearly presented in the embodiments with reference to the drawings, wherein: FIG. 1 is a schematic perspective view illustrating an embodiment of the configurable quantum electronic device of the present invention; FIG. 2 is a top view Figure 1 is a schematic diagram to illustrate this embodiment of the present invention; Figure 3 is an energy dispersive X-ray spectroscopy (EDS) component map, illustrating; Figure 4 is a schematic circuit diagram illustrating this embodiment of the present invention Wherein two or two quantum units constitute a double quantum dot (double quantum dots, DQDs); Fig. 5 is a circuit schematic diagram, which illustrates that one of the quantum units of this embodiment of the present invention constitutes a quantum dot single electron transistor (quantum dot single electron transistor) transistor, QD-SET); FIG. 6 is a schematic circuit diagram illustrating a logic circuit in which two or two quantum units constitute a complementary quantum dot in this embodiment of the present invention; FIG. 7 is a circuit schematic diagram illustrating the embodiment of the present invention. The qubits and single-electron transistors composed of these quantum units are integrated with each other; FIG. 8 is a schematic diagram illustrating the defining steps of photolithography patterning when the configurable quantum electronic device of this embodiment is formed according to the present invention, so as to A patterned fan-shaped ridge is generated; FIG. 9 is a schematic diagram illustrating the deposition of silicon nitride (Si 3 N 4 ) and polycrystalline silicon germanium (poly-Si 0.85 Ge 0.15 ) when the configurable quantum electronic device of this embodiment is formed according to the present invention; FIG. 10 is a schematic diagram illustrating the etch-back process when the configurable quantum electronic device of this embodiment is formed according to the present invention; FIG. 11 is a schematic diagram illustrating the transmission of the photoresist when the configurable quantum electronic device of this embodiment is formed by the present invention. to define the length of the polycrystalline silicon germanium (poly-Si 0.85 Ge 0.15 ) island; FIG. 12 is a schematic diagram illustrating the state of the polycrystalline silicon germanium island after etching when the configurable quantum electronic device of this embodiment is formed by the present invention; FIG. 13 is a A schematic diagram illustrating the formation of the configurable quantum electronic device of this embodiment of the present invention, the thermal oxidation of polysilicon germanium islands to form germanium quantum dots at the included corners; and FIG. 14 is a schematic diagram illustrating the formation of the configurable quantum electronic device of this embodiment of the present invention. In quantum electronic devices, polysilicon is deposited and etched back to form the electrode groups.
2:半導體基板 2: Semiconductor substrate
3:量子單元 3: Quantum unit
310:夾角區 310: Angle area
311:側壁 311: Sidewall
32:量子點 32: Quantum Dots
33:隔離層 33: isolation layer
34:電極組 34: Electrode set
341:柱塞閘極 341: Plunger gate
342:側壁閘極 342: sidewall gate
L:軸線 L: axis
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Citations (4)
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TW200522338A (en) * | 2003-12-25 | 2005-07-01 | Nat Applied Res Laboratries | Fabrication method of nonvolatile memories with quantum dots for storage nodes |
US20090124052A1 (en) * | 2006-07-20 | 2009-05-14 | Industrial Technology Research Institute | Method of fabricating memory cell |
US20170288076A1 (en) * | 2016-03-31 | 2017-10-05 | Hitachi, Ltd. | Silicon-based quantum dot device |
US20180175241A1 (en) * | 2016-03-12 | 2018-06-21 | Faquir Chand Jain | Quantum dot channel (qdc) quantum dot gate transistors, memories and other devices |
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Publication number | Priority date | Publication date | Assignee | Title |
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TW200522338A (en) * | 2003-12-25 | 2005-07-01 | Nat Applied Res Laboratries | Fabrication method of nonvolatile memories with quantum dots for storage nodes |
US20090124052A1 (en) * | 2006-07-20 | 2009-05-14 | Industrial Technology Research Institute | Method of fabricating memory cell |
US20180175241A1 (en) * | 2016-03-12 | 2018-06-21 | Faquir Chand Jain | Quantum dot channel (qdc) quantum dot gate transistors, memories and other devices |
US20170288076A1 (en) * | 2016-03-31 | 2017-10-05 | Hitachi, Ltd. | Silicon-based quantum dot device |
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