TWI764416B - Operating state detection system and method thereof - Google Patents
Operating state detection system and method thereofInfo
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Abstract
Description
本發明是有關於一種用於檢測電子裝置的檢測系統以及檢測方法,且特別是有關於一種用於檢測電子裝置的運作狀態的檢測系統以及檢測方法。 The present invention relates to a detection system and a detection method for detecting an electronic device, and more particularly, to a detection system and a detection method for detecting the operation state of the electronic device.
現行的檢測系統大多會使用一個或多個監視器來檢視一個或多個待測電子裝置在測試中的運作狀況。檢測系統會藉由監視器接收待測電子裝置所顯示出的畫面或影像。然而,監視器會受到來自於外部的環境光的影響(如,反光或眩光)而使檢測系統可能發生誤判,進而降低檢測精確度。因此,每一個待測電子裝置與對應的監視器會需要由一個遮光布幕或一個遮光箱來阻隔外部的環境光。因此,檢測系統往往會因為遮光布幕或遮光箱而大幅浪費使用空間。此外,遮光布幕或遮光箱也會影響待測電子裝置的運作的散熱。 Most of the current inspection systems use one or more monitors to monitor the operation status of one or more electronic devices to be tested during the test. The detection system will receive the screen or image displayed by the electronic device to be tested through the monitor. However, the monitor may be affected by ambient light from the outside (eg, reflection or glare), which may cause misjudgment by the detection system, thereby reducing the detection accuracy. Therefore, each electronic device to be tested and the corresponding monitor need to be shielded from external ambient light by a shading screen or a shading box. Therefore, inspection systems often waste a lot of space due to blackout curtains or blackout boxes. In addition, the shading screen or shading box will also affect the heat dissipation of the operation of the electronic device under test.
因此,如何提高檢測系統的檢測精確度並降低檢測系統的使用空間,是本領域技術人員努力研究的課題之一。 Therefore, how to improve the detection accuracy of the detection system and reduce the usable space of the detection system is one of the topics that those skilled in the art are working hard to study.
本發明提供一種運作狀態檢測系統以及運作狀態檢測系統方法,能夠提高檢測系統的檢測精確度並降低檢測系統的使用空間。 The present invention provides an operation state detection system and an operation state detection system method, which can improve the detection accuracy of the detection system and reduce the usage space of the detection system.
本發明的運作狀態檢測系統用於檢測至少一電子裝置的運作狀態。運作狀態檢測系統包括至少一光感測器以及至少一處理器。所述至少一光感測器各具有鏡頭。所述至少一光感測器的鏡頭以一對一方式分別被緊貼於所述至少一電子裝置的至少一螢幕上。各所述至少一光感測器分別經配置以接收所述至少一螢幕的對應一者所顯示的影像中的局部影像。所述至少一處理器以一對一方式分別耦接於所述至少一光感測器。所述至少一處理器各經配置以接收局部影像,當局部影像發生靜止時,對發生靜止的局部影像的靜止時間長度進行計時,並且當靜止時間長度被判斷出大於預設時間長度時,判定對應的電子裝置處於當機狀態。 The operating state detection system of the present invention is used to detect the operating state of at least one electronic device. The operating state detection system includes at least one light sensor and at least one processor. Each of the at least one light sensor has a lens. The lenses of the at least one light sensor are respectively attached to at least one screen of the at least one electronic device in a one-to-one manner. Each of the at least one light sensor is respectively configured to receive a partial image of an image displayed by a corresponding one of the at least one screen. The at least one processor is respectively coupled to the at least one light sensor in a one-to-one manner. The at least one processor is each configured to receive a partial image, when the partial image is stationary, time the stationary time length of the stationary partial image, and when the stationary time length is determined to be greater than a preset time length, determine The corresponding electronic device is in a shutdown state.
本發明的運作狀態檢測方法用於檢測至少一電子裝置的運作狀態。運作狀態檢測方法包括:將至少一光感測器的鏡頭以一對一方式分別緊貼於所述至少一電子裝置的至少一螢幕上;藉由所述至少一光感測器分別接收所述至少一螢幕的所顯示的至少一影像中的至少一局部影像;當所述至少一局部影像的至少一者發生靜止時,對發生靜止的至少一者局部影像的靜止時間長度進行計時;以及當靜止時間長度被判斷出大於預設時間長度時,判 定對應的電子裝置處於當機狀態。 The operation state detection method of the present invention is used to detect the operation state of at least one electronic device. The operation state detection method includes: attaching the lens of at least one light sensor to at least one screen of the at least one electronic device in a one-to-one manner; receiving the at least one light sensor respectively by the at least one light sensor at least one partial image in at least one image displayed on at least one screen; when at least one of the at least one partial image is still, timing the still time length of the at least one partial image that is still; and when When the stationary time length is judged to be greater than the preset time length, it is judged that Make sure that the corresponding electronic device is in a shutdown state.
基於上述,在運作狀態檢測系統中,光感測器的鏡頭是被緊貼在螢幕。因此,光感測器不會接收到外部的環境光所產生的反光或眩光。運作狀態檢測系統可以不需要遮光布幕或遮光箱。如此一來,相較於現行的檢測系統,運作狀態檢測系統具有較高的檢測精確度以及較低的使用空間。除此之外,處理器以分工方式分別判斷對應的電子裝置的運作狀態。因此,運作狀態檢測系統的處理器的處理效能的要求可以較低。 Based on the above, in the operating state detection system, the lens of the light sensor is closely attached to the screen. Therefore, the light sensor does not receive reflections or glare caused by external ambient light. The operational status detection system may not require a blackout curtain or a blackout box. As a result, compared with the current detection system, the operation state detection system has higher detection accuracy and lower usage space. In addition, the processor determines the operation state of the corresponding electronic device in a divisional manner. Therefore, the processing performance requirement of the processor of the operating state detection system can be lower.
為讓本發明的上述特徵和優點能更明顯易懂,下文特舉實施例,並配合所附圖式作詳細說明如下。 In order to make the above-mentioned features and advantages of the present invention more obvious and easy to understand, the following embodiments are given and described in detail with the accompanying drawings as follows.
100、200:運作狀態檢測系統 100, 200: Operational status detection system
110_1、110_2、210_1、210_2、212_1、212_2:光感測器 110_1, 110_2, 210_1, 210_2, 212_1, 212_2: light sensor
112、112_1、112_2:鏡頭 112, 112_1, 112_2: Lens
130、230:主機 130, 230: host
120_1、120_2、220_1、220_2:處理器 120_1, 120_2, 220_1, 220_2: Processor
240_1、240_2:攝影機 240_1, 240_2: Camera
510:容置槽 510: accommodating slot
520:固定部 520: Fixed part
ABP:異常圖片 ABP: Abnormal picture
ABV:異常發生影片 ABV: Abnormal Occurrence Video
D1、D2:電子裝置 D1, D2: Electronic device
DT:預設時間長度 DT: preset time length
FS、FS1:定位結構 FS, FS1: positioning structure
P1、P2:局部影像 P1, P2: Partial image
S100、S200、S300、S400:運作狀態檢測方法 S100, S200, S300, S400: Operational Status Detection Method
S110~S180:步驟 S110~S180: Steps
S410~S480:步驟 S410~S480: Steps
SC1、SC2:螢幕 SC1, SC2: Screen
圖1是依據本發明第一實施例所繪示的運作狀態檢測系統的示意圖。 FIG. 1 is a schematic diagram of an operation state detection system according to a first embodiment of the present invention.
圖2是依據本發明第一實施例所繪示的運作狀態檢測方法的方法示意圖。 FIG. 2 is a schematic diagram of a method for detecting an operating state according to a first embodiment of the present invention.
圖3是依據本發明第一實施例所繪示的另一運作狀態檢測方法的方法示意圖。 FIG. 3 is a schematic diagram of another operating state detection method according to the first embodiment of the present invention.
圖4是依據本發明第一實施例所繪示的再一運作狀態檢測方法的方法示意圖。 FIG. 4 is a schematic diagram of still another operation state detection method according to the first embodiment of the present invention.
圖5是依據本發明一實施例所繪示的定位結構的示意圖。 FIG. 5 is a schematic diagram of a positioning structure according to an embodiment of the present invention.
圖6是依據本發明一實施例所繪示的定位結構的架設在電子裝置上的示意圖。 6 is a schematic diagram of a positioning structure mounted on an electronic device according to an embodiment of the present invention.
圖7是依據本發明第二實施例所繪示的運作狀態檢測系統的示意圖。 FIG. 7 is a schematic diagram of an operating state detection system according to a second embodiment of the present invention.
圖8是依據本發明第二實施例所繪示的運作狀態檢測方法的方法示意圖。 FIG. 8 is a schematic diagram of a method for detecting an operating state according to a second embodiment of the present invention.
本發明的部份實施例接下來將會配合附圖來詳細描述,以下的描述所引用的元件符號,當不同附圖出現相同的元件符號將視為相同或相似的元件。這些實施例只是本發明的一部份,並未揭示所有本發明的可實施方式。更確切的說,這些實施例只是本發明的專利申請範圍中的裝置與方法的範例。 Some embodiments of the present invention will be described in detail below with reference to the accompanying drawings. Element symbols quoted in the following description will be regarded as the same or similar elements when the same element symbols appear in different drawings. These examples are only a part of the invention and do not disclose all possible embodiments of the invention. Rather, these embodiments are merely exemplary of apparatus and methods within the scope of the present invention.
請參考圖1,圖1是依據本發明第一實施例所繪示的運作狀態檢測系統的示意圖。在本實施例中,運作狀態檢測系統100能夠檢測電子裝置D1、D2的運作狀態。舉例來說,運作狀態檢測系統100可以檢測電子裝置D1、D2的運作是否正常。上述的檢測可以是在研發階段、出廠前測試或品保階段中進行。在本實施例中,電子裝置D1、D2是以筆記型電腦來示例。本發明的電子裝置D1、D2可以是具有螢幕的電子裝置(如筆記型電腦、手機、平板電腦或桌上型電腦等),並不以本實施例為限。
Please refer to FIG. 1 . FIG. 1 is a schematic diagram of an operation state detection system according to a first embodiment of the present invention. In this embodiment, the operating
在本實施例中,運作狀態檢測系統100包括光感測器
110_1、110_2以及處理器120_1、120_2。光感測器110_1具有鏡頭112_1。光感測器110_2具有鏡頭112_2。光感測器110_1、110_2的鏡頭112_1、112_2採一對一方式被緊貼於電子裝置D1、D2的螢幕SC1、SC2上。在本實施例中,光感測器110_1會接收螢幕SC1所顯示出的影像中的局部影像P1。由於鏡頭112_1是被緊貼在螢幕SC1。因此,局部影像P1的範圍大致上等於鏡頭112_1的影像接收範圍。相似地,光感測器110_2會接收螢幕SC2所顯示出的影像中的局部影像P2。局部影像P2的範圍大致上等於鏡頭112_2的影像接收範圍。本實施例的光感測器110_1、110_2可以是由沒有搭載光源的影像擷取裝置或顏色感測裝置來實現。
In this embodiment, the operating
在本實施例中,處理器120_1、120_2以一對一方式分別耦接於光感測器110_1、110_2。在本實施例中,處理器120_1耦接於光感測器110_1以接收局部影像P1。處理器120_2耦接於光感測器110_2以接收局部影像P2。處理器120_1、120_2分別會依據局部影像P1、P2判定出電子裝置D1、D2的運作狀態。以處理器120_1為例,當局部影像P1被判斷出發生靜止時,處理器120_1會對發生靜止的局部影像的靜止時間長度進行計時。處理器120_1進一步判斷靜止時間長度是否大於預設時間長度DT。當靜止時間長度被判斷出大於預設時間長度DT時,處理器120_1判定對應的電子裝置D1處於當機狀態。本實施例的預設時間長度DT是內建於處理器120_1、120_2中。預設時間長度DT可以基於實際的檢測需求而被調整。預設時間長度DT可以是數秒或數分鐘。基於實 際的檢測需求,處理器120_1的預設時間長度DT以及處理器120_2的預設時間長度DT可以相同或不相同。 In this embodiment, the processors 120_1 and 120_2 are respectively coupled to the light sensors 110_1 and 110_2 in a one-to-one manner. In this embodiment, the processor 120_1 is coupled to the light sensor 110_1 to receive the partial image P1. The processor 120_2 is coupled to the light sensor 110_2 to receive the partial image P2. The processors 120_1 and 120_2 respectively determine the operation states of the electronic devices D1 and D2 according to the partial images P1 and P2 . Taking the processor 120_1 as an example, when the partial image P1 is determined to be still, the processor 120_1 will count the still time length of the still partial image. The processor 120_1 further determines whether the stationary time length is greater than the preset time length DT. When the stationary time length is determined to be greater than the preset time length DT, the processor 120_1 determines that the corresponding electronic device D1 is in a shutdown state. The preset time length DT in this embodiment is built in the processors 120_1 and 120_2. The preset time length DT can be adjusted based on actual detection requirements. The preset time length DT may be several seconds or several minutes. based on real Depending on the actual detection requirement, the preset time length DT of the processor 120_1 and the preset time length DT of the processor 120_2 may be the same or different.
在本實施例中,處理器120_1、120_2可以是由例如是中央處理單元(Central Processing Unit,CPU),或是其他可程式化之一般用途或特殊用途的微處理器(Microprocessor)、數位訊號處理器(Digital Signal Processor,DSP)、可程式化控制器、特殊應用積體電路(Application Specific Integrated Circuits,ASIC)、可程式化邏輯裝置(Programmable Logic Device,PLD)或其他類似裝置或這些裝置的組合。本實施例的處理器120_1、120_2可以是由單晶片裝置(Arduino系列、樹梅派)來實現。 In this embodiment, the processors 120_1 and 120_2 may be, for example, a central processing unit (Central Processing Unit, CPU), or other programmable general-purpose or special-purpose microprocessors (Microprocessors), digital signal processing Digital Signal Processor (DSP), Programmable Controller, Application Specific Integrated Circuits (ASIC), Programmable Logic Device (PLD) or other similar devices or combinations of these devices . The processors 120_1 and 120_2 in this embodiment may be implemented by single-chip devices (Arduino series, Raspberry Pi).
在本實施例中,運作狀態檢測系統100還包括主機130。主機130耦接於處理器120_1、120_2。處理器120_1、120_2分別會將關聯於電子裝置D1、D2的運作狀態的判定結果提供到主機130。舉例來說,以處理器120_1為例,當處理器120_1判定出電子裝置D1處於當機狀態時,處理器120_1會將電子裝置D1處於當機狀態的判定結果提供到主機130。本實施例的主機130可以是任意形式的中央控制終端、伺服器或雲端伺服器。然本案並不以此為限,實際執行時,處理器120_1亦可獨立處理判定結果。
In this embodiment, the operating
在本實施例中,電子裝置D1、D2的數量、光感測器110_1、110_2的數量以及處理器120_1、120_2的數量分別以2個為例。然本發明並不以電子裝置的數量、光感測器的數量以及處理器的數量為限。本發明的電子裝置的數量、光感測器的數量以 及處理器的數量可以是一個或多個。 In this embodiment, the number of the electronic devices D1 and D2 , the number of the light sensors 110_1 and 110_2 and the number of the processors 120_1 and 120_2 are respectively two as an example. However, the present invention is not limited to the number of electronic devices, the number of light sensors and the number of processors. The number of electronic devices and the number of light sensors in the present invention are based on And the number of processors can be one or more.
在此值得一提的是,鏡頭112_1、112_2分別是被緊貼在螢幕SC1、SC2。因此,光感測器110_1、110_2不會接收到外部的環境光所產生的反光或眩光。運作狀態檢測系統100可以不需要遮光布幕或遮光箱。如此一來,相較於現行的檢測系統,本實施例的運作狀態檢測系統100具有較高的檢測精確度以及較低的使用空間。除此之外,處理器120_1、120_2以分工方式分別判斷對應的電子裝置D1、D2的運作狀態。因此,運作狀態檢測系統100的處理器120_1、120_2的處理效能的要求可以較低。
It is worth mentioning here that the lenses 112_1 and 112_2 are attached to the screens SC1 and SC2 respectively. Therefore, the light sensors 110_1 and 110_2 will not receive reflection or glare caused by external ambient light. The operating
請同時參考圖1以及圖2,圖2是依據本發明第一實施例所繪示的運作狀態檢測方法的方法示意圖。本實施例的運作狀態檢測方法S100適用於運作狀態檢測系統100。在步驟S110中,光感測器110_1、110_2的鏡頭112_1、112_2以一對一方式分別被緊貼在電子裝置D1、D2的螢幕SC1、SC2上。舉例來說,光感測器110_1的鏡頭112_1被緊貼在電子裝置D1的螢幕SC1上。光感測器110_2的鏡頭112_2被緊貼在電子裝置D2的螢幕SC2上。在步驟S120中,運作狀態檢測系統100藉由光感測器110_1接收螢幕SC1的所顯示的影像中的局部影像P1,並藉由光感測器110_2接收螢幕SC2的所顯示的影像中的局部影像P2。
Please refer to FIG. 1 and FIG. 2 at the same time. FIG. 2 is a schematic diagram of a method for detecting an operation state according to a first embodiment of the present invention. The operation state detection method S100 of this embodiment is applicable to the operation
在步驟S130中,局部影像P1、P2會被判斷是否發生靜止。步驟S130可以是由處理器120_1、120_2以分工方式來執行。當局部影像P1、P2都沒有發生靜止時,運作狀態檢測方法S100
會回到步驟S120。也就是說,局部影像P1、P2持續變化時,運作狀態檢測系統100會持續地執行步驟S120。在另一方面,當局部影像P1、P2的至少其中一者發生靜止時,運作狀態檢測方法S100會進入步驟S140以對發生靜止的局部影像的靜止時間長度進行計時。在步驟S150中,靜止時間長度會被判斷是否大於預設時間長度DT。當靜止時間長度會被判斷出大於預設時間長度DT時,運作狀態檢測方法S100會在步驟S160中判定對應於發生靜止的局部影像的電子裝置處於當機狀態。在另一方面,當靜止時間長度會被判斷出小於或等於預設時間長度DT時,運作狀態檢測方法S100則會回到步驟S120。
In step S130, it is determined whether the partial images P1 and P2 are still. Step S130 may be performed by the processors 120_1 and 120_2 in a divisional manner. When the partial images P1 and P2 are not stationary, the operation state detection method S100
It will return to step S120. That is to say, when the partial images P1 and P2 continue to change, the operation
在此舉例來說明,當處理器120_1在步驟S130中判斷出局部影像P1發生靜止時,處理器120_1會在步驟S140中對局部影像P1的靜止時間長度進行計時。處理器120_1在步驟S150中進一步判斷局部影像P1的靜止時間長度是否大於預設時間長度DT。如果處理器120_1判斷出靜止時間長度大於預設時間長度DT,這意味著局部影像P1沒有改變,並且局部影像P1沒有改變的時間長度超過了預設時間長度DT。因此處理器120_1在步驟S160中判定電子裝置D1處於當機狀態。 For example, when the processor 120_1 determines in step S130 that the partial image P1 is still, the processor 120_1 will time the still time length of the partial image P1 in step S140. The processor 120_1 further determines in step S150 whether the still time length of the partial image P1 is greater than the preset time length DT. If the processor 120_1 determines that the still time length is greater than the preset time length DT, it means that the partial image P1 has not changed, and the unchangeable time length of the partial image P1 exceeds the preset time length DT. Therefore, the processor 120_1 determines in step S160 that the electronic device D1 is in a shutdown state.
另舉例來說明,如果處理器120_1在步驟S130中判斷出局部影像P1持續改變,或者是在步驟S150中判斷出局部影像P1的靜止時間長度小於或等於預設時間長度DT,處理器120_1則會在步驟S120中持續接收局部影像P1。 For another example, if the processor 120_1 determines in step S130 that the partial image P1 continues to change, or determines in step S150 that the stationary time length of the partial image P1 is less than or equal to the preset time length DT, the processor 120_1 will The partial video P1 is continuously received in step S120.
請同時參考圖1以及圖3,圖3是依據本發明第一實施例所繪示的另一運作狀態檢測方法的方法示意圖。在本實施例中,運作狀態檢測方法S200適用於運作狀態檢測系統100。相較於圖2的運作狀態檢測方法S100,本實施例的運作狀態檢測方法S400還包括步驟S170。運作狀態檢測方法S200會在步驟S170中進一步判斷發生靜止的局部影像的顏色的色系。發生靜止的局部影像的顏色的色系關聯於當機狀態的發生原因。舉例來說,發生靜止的局部影像的顏色的色系可能是灰色色系(如黑畫面並且背光模組被致能,或白畫面)、黑色色系(如黑畫面並且背光模組被禁能)以及藍色色系(如藍畫面)的其中一者。運作狀態檢測系統100的處理器120_1、120_2可依據發生靜止的局部影像的顏色的色系整理出當機的大致發生原因。
Please refer to FIG. 1 and FIG. 3 at the same time. FIG. 3 is a schematic diagram of another operating state detection method according to the first embodiment of the present invention. In this embodiment, the operation state detection method S200 is applicable to the operation
舉例來說,本實施例的步驟S170是在步驟S150之後。也就是說,當靜止時間長度在步驟S150中會被判斷出大於預設時間長度DT時,運作狀態檢測方法S200會在步驟S170中進一步判斷維持於發生靜止的局部影像的顏色的色系。然本發明並不以此為限。依據實際的檢測需求,本發明的步驟S170可以是在步驟S130~S160之間,或者是在步驟S160之後。 For example, step S170 of this embodiment is after step S150. That is, when the still time length is determined to be greater than the preset time length DT in step S150 , the operation state detection method S200 further determines the color system of the color of the partial image where the stillness occurs in step S170 . However, the present invention is not limited to this. According to actual detection requirements, step S170 of the present invention may be between steps S130-S160, or after step S160.
請同時參考圖1以及圖4,圖4是依據本發明第一實施例所繪示的再一運作狀態檢測方法的方法示意圖。在本實施例中,運作狀態檢測方法S300適用於運作狀態檢測系統100。相較於圖2的運作狀態檢測方法S100,本實施例的運作狀態檢測方法S300
還包括步驟S180。運作狀態檢測方法S300會在步驟S180中判斷發生靜止的局部影像的顏色是否維持於多個特定色系的其中之一。上述的多個特定色系至少包括灰色色系(如黑畫面並且背光模組被致能,或白畫面)、黑色色系(如黑畫面並且背光模組被禁能)以及藍色色系(如藍畫面)。
Please refer to FIG. 1 and FIG. 4 at the same time. FIG. 4 is a schematic diagram of a method for detecting yet another operating state according to the first embodiment of the present invention. In this embodiment, the operation state detection method S300 is applicable to the operation
舉例來說,本實施例的步驟S180是在步驟S150之後。當靜止時間長度在步驟S150中會被判斷出大於預設時間長度DT時,運作狀態檢測方法S300會在步驟S180中進一步判斷發生靜止的局部影像的顏色是否維持於上述多個特定色系的其中之一。當發生靜止的局部影像的顏色是上述多個特定色系的其中之一時,運作狀態檢測方法S300會進入步驟S160以判定對應的電子裝置處於當機狀態。在另一方面,當發生靜止的局部影像的顏色並不是上述多個特定色系的其中之一時,運作狀態檢測方法S300則會回到步驟S120。也就是說,在本實施例中,當靜止時間長度被判斷出大於預設時間長度DT並且發生靜止的局部影像的顏色維持於上述多個特定色系的其中之一時,對應的電子裝置被判定為處於當機狀態。 For example, step S180 in this embodiment is after step S150. When the still time length is determined to be greater than the preset time length DT in step S150 , the operation state detection method S300 further determines in step S180 whether the color of the partial image in which the stillness occurs is maintained among the above-mentioned specific color systems one. When the color of the static partial image is one of the above-mentioned specific color systems, the operation state detection method S300 will proceed to step S160 to determine that the corresponding electronic device is in a shutdown state. On the other hand, when the color of the still partial image is not one of the above-mentioned specific color systems, the operation state detection method S300 returns to step S120. That is to say, in this embodiment, when it is determined that the stationary time length is greater than the preset time length DT and the color of the partial image in which the stationary image occurs is maintained in one of the above-mentioned specific color systems, the corresponding electronic device is determined to be to be in a shutdown state.
依據實際的檢測需求,本發明的步驟S180可以是在步驟S130~S160之間。本發明並不以本實施例的步驟S180在運作狀態檢測方法S300中的順序為限。 According to actual detection requirements, step S180 of the present invention may be between steps S130-S160. The present invention is not limited to the order of step S180 in the operation state detection method S300 in this embodiment.
接下來說明將光感測器架設在電子裝置上的實施細節。運作狀態檢測系統還包括定位結構。定位結構分別一對一方式被 架設在電子裝置(如圖1所示的電子裝置D1、D2)上,使得光感測器的鏡頭(如圖1所示的鏡頭112_1、112_1)緊貼於電子裝置的螢幕(如圖1所示的螢幕SC1、SC2)上。 Next, the details of the implementation of mounting the light sensor on the electronic device will be described. The operating state detection system also includes a positioning structure. The positioning structures are respectively one-to-one Set up on the electronic device (the electronic devices D1 and D2 shown in FIG. 1 ), so that the lenses of the light sensor (the lenses 112_1 and 112_1 shown in FIG. 1 ) are closely attached to the screen of the electronic device (as shown in FIG. 1 ). displayed on the screen SC1, SC2).
具體來說明,請參考圖5,圖5是是依據本發明一實施例所繪示的定位結構的示意圖。在本實施例中,定位結構FS包括容置槽510以及固定部520。在本實施例中,容置槽510容置光感測器。容置槽510包覆光感測器的一部分,並且僅使光感測器的鏡頭112暴露於容置槽510的外部。在本實施例中,固定部520將定位結構FS固定在螢幕上,使得鏡頭112緊貼於螢幕的顯示面上。在本實施例中,固定部520的部分可以被設計為掛勾。然本發明並不以此為限。在一些實施例中,固定部520的部分可以被設計為支撐架。
Specifically, please refer to FIG. 5 , which is a schematic diagram of a positioning structure according to an embodiment of the present invention. In this embodiment, the positioning structure FS includes an
請同時參考圖1以及圖6,圖6是依據本發明一實施例所繪示的定位結構的架設在電子裝置上的示意圖。在本實施例中,定位結構FS1可適用於運作狀態檢測系統100。本實施例以定位結構FS1對應於電子裝置D1為例。定位結構FS1的容置槽510會容置光感測器110_1。光感測器110_1的鏡頭112_1暴露於容置槽510的外部。固定部520的掛勾部分被固定在螢幕SC1的上緣,被容置於定位結構FS1內的光感測器110_1的鏡頭112_1緊貼於螢幕SC1的顯示面上。如此一來,鏡頭112_1可直接地接收螢幕SC1所顯示出的局部影像P1而不會接收到來自於外部的環境光。
Please refer to FIG. 1 and FIG. 6 at the same time. FIG. 6 is a schematic diagram of a positioning structure mounted on an electronic device according to an embodiment of the present invention. In this embodiment, the positioning structure FS1 can be applied to the operating
請同時參考圖7以及圖8,圖7是依據本發明第二實施例
所繪示的運作狀態檢測系統的示意圖。圖8是依據本發明第二實施例所繪示的運作狀態檢測方法的方法示意圖。在本實施例中,運作狀態檢測系統200包括光感測器210_1、210_2、處理器220_1、220_2、主機230以及攝影機240_1、240_2。光感測器210_1、210_2、處理器220_1、220_2與主機230之間的耦接關係可例如相同於光感測器210_1、210_2、處理器220_1、220_2與主機230之間的耦接關係,因此恕不在此重述。在本實施例中,攝影機240_1、240_2以一對一方式分別與處理器220_1、220_2對應耦接,並以一對一方式分別對螢幕SC1、SC2中的對應螢幕所顯示的影像進行錄影。舉例來說,攝影機240_1耦接於處理器220_1,並對螢幕SC1所顯示的影像進行錄影。攝影機240_2耦接於處理器220_2,並對螢幕SC2所顯示的影像進行錄影。
Please refer to FIG. 7 and FIG. 8 at the same time. FIG. 7 is a second embodiment of the present invention.
The schematic diagram of the operating state detection system shown. FIG. 8 is a schematic diagram of a method for detecting an operating state according to a second embodiment of the present invention. In this embodiment, the operating
在本實施例中,運作狀態檢測方法S400適用於運作狀態檢測系統200。在步驟S410中,光感測器210_1、210_2的鏡頭212_1、212_2以一對一方式分別被緊貼在電子裝置D1、D2的螢幕SC1、SC2上。舉例來說,鏡頭212_1被緊貼在電子裝置D1的螢幕SC1上。鏡頭212_2被緊貼在電子裝置D2的螢幕SC2上。在步驟S420中,運作狀態檢測系統200藉由光感測器210_1接收螢幕SC1的所顯示的影像中的局部影像P1,並藉由光感測器210_2接收螢幕SC2的所顯示的影像中的局部影像P2。此外,運作狀態檢測系統200還藉由攝影機240_1對螢幕SC1所顯示的影像進行錄影,並藉由攝影機240_2對螢幕SC2所顯示的影像進行錄影。
在本實施例中,攝影機240_1可基於處理器220_1的指示或命令對螢幕SC1所顯示的影像進行錄影。攝影機240_2可基於處理器220_2的指示或命令對螢幕SC2所顯示的影像進行錄影。
In this embodiment, the operation state detection method S400 is applicable to the operation
在步驟S430中,局部影像P1、P2會被判斷是否發生靜止。當局部影像P1、P2都沒有發生靜止時,運作狀態檢測方法S400會回到步驟S420。在另一方面,當局部影像P1、P2的至少其中一者發生靜止時,運作狀態檢測方法S400會進入步驟S440以對發生靜止的局部影像的靜止時間長度進行計時。在步驟S450中,靜止時間長度會被判斷是否大於預設時間長度DT。當靜止時間長度會被判斷出大於預設時間長度DT時,運作狀態檢測方法S400會在步驟S460中判定對應於發生靜止的局部影像的電子裝置處於當機狀態。在另一方面,當靜止時間長度會被判斷出小於或等於預設時間長度DT時,運作狀態檢測方法S400則會回到步驟S420。運作狀態檢測方法S400的步驟S430~S460的實施細節可以由運作狀態檢測方法S100~S300的步驟S130~S160的示例中獲致足夠的教示,因此述不再此重述。 In step S430, it is determined whether the partial images P1 and P2 are still. When neither of the partial images P1 and P2 is stationary, the operation state detection method S400 returns to step S420. On the other hand, when at least one of the partial images P1 and P2 is stationary, the operation state detection method S400 will proceed to step S440 to count the stationary time length of the stationary partial images. In step S450, it is determined whether the stationary time length is greater than the preset time length DT. When the still time length is determined to be greater than the preset time length DT, the operation state detection method S400 determines in step S460 that the electronic device corresponding to the static partial image is in a shutdown state. On the other hand, when the stationary time length is determined to be less than or equal to the preset time length DT, the operation state detection method S400 returns to step S420. The implementation details of steps S430 - S460 of the operation state detection method S400 can be sufficiently taught from the examples of steps S130 - S160 of the operation state detection method S100 - S300 , so the description will not be repeated here.
在步驟S470中,運作狀態檢測系統200會完成錄影以獲得處於當機狀態的電子裝置的異常發生影片ABV,並且擷取處於當機狀態的電子裝置的異常圖片ABP。在步驟S480中,運作狀態檢測系統200會異常發生影片ABV以及異常圖片ABP提供致主機230。舉例來說明,以電子裝置D1為例,當電子裝置D1在步驟S460中被判定處於當機狀態時,處理器220_1在步驟S470中
會指示攝影機240_1完成錄影,藉以獲得電子裝置D1的異常發生影片ABV。此外,處理器220_1還會指示攝影機240_1擷取電子裝置D1在處於當機狀態時的異常圖片ABP。在步驟S470中,處理器220_1可指示攝影機240_1以最高解析度拍攝電子裝置D1的螢幕SC1所顯示的影像以獲得異常圖片ABP。在步驟S480中,處理器220_1將電子裝置D1的異常圖片ABP以及異常發生影片ABV提供致主機230。
In step S470 , the operation
舉例來說明,主機230會經由處理器220_1接收異常發生影片ABV以及異常圖片ABP。異常發生影片ABV紀錄了電子裝置D1發生當機時的影像以及發生當機前的顯示過程。因此,主機230可依據異常發生影片ABV獲得電子裝置D1發生當機時的顯示過程。工程人員可經由異常發生影片ABV獲知電子裝置D1發生當機的可能歷程。
For example, the
另舉例來說明,異常圖片ABP中可能顯示了電子裝置D1發生當機時的影像的內容。電子裝置D1發生當機時的影像的內容例如是黑畫面、白畫面、停擺(hang)靜止畫面以及藍畫面的其中一者。主機230可依據異常圖片ABP獲得電子裝置D1發生當機時所顯示的錯誤碼(如,在藍畫面中的「Stop code:CRITICAL_PROCESS_DIED」)或文字。工程人員可經由錯誤碼或文字的內容獲知電子裝置D1發生當機的原因。
For another example, the abnormal picture ABP may display the content of the image when the electronic device D1 crashes. The content of the image when the electronic device D1 crashes is, for example, one of a black image, a white image, a hang still image, and a blue image. The
綜上所述,本發明的運作狀態檢測系統中,光感測器的鏡頭是被緊貼在螢幕。光感測器並不會接收到外部的環境光所產 生的反光或眩光。因此,本發明的運作狀態檢測系統可以不需要遮光布幕或遮光箱。如此一來,本發明的運作狀態檢測系統以及運作狀態檢測方法能夠使電子裝置的運作狀態檢測架構具有較高的檢測精確度以及較低的使用空間。除此之外,本發明的處理器以分工方式分別判斷對應的電子裝置的運作狀態。因此,本發明的運作狀態檢測系統的處理器的處理效能的要求可以較低。 To sum up, in the operating state detection system of the present invention, the lens of the light sensor is closely attached to the screen. The light sensor does not receive external ambient light resulting in reflections or glare. Therefore, the operating state detection system of the present invention may not need a light-shielding curtain or a light-shielding box. In this way, the operation state detection system and the operation state detection method of the present invention can enable the operation state detection structure of the electronic device to have higher detection accuracy and lower usage space. In addition, the processor of the present invention judges the operation state of the corresponding electronic device in a divisional manner. Therefore, the processing performance requirement of the processor of the operating state detection system of the present invention can be lower.
雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明的精神和範圍內,當可作些許的更動與潤飾,故本發明的保護範圍當視後附的申請專利範圍所界定者為準。 Although the present invention has been disclosed above by the embodiments, it is not intended to limit the present invention. Anyone with ordinary knowledge in the technical field can make some changes and modifications without departing from the spirit and scope of the present invention. Therefore, The protection scope of the present invention shall be determined by the scope of the appended patent application.
100:運作狀態檢測系統100: Operational status detection system
110_1、110_2:光感測器110_1, 110_2: Light sensor
112_1、112_2:鏡頭112_1, 112_2: Lens
120_1、120_2:處理器120_1, 120_2: Processor
130:主機130: host
D1、D2:電子裝置D1, D2: Electronic device
DT:預設時間長度DT: preset time length
P1、P2:局部影像P1, P2: Partial image
SC1、SC2:螢幕SC1, SC2: Screen
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