TWI755958B - Plating apparatus and plating method - Google Patents
Plating apparatus and plating method Download PDFInfo
- Publication number
- TWI755958B TWI755958B TW109142716A TW109142716A TWI755958B TW I755958 B TWI755958 B TW I755958B TW 109142716 A TW109142716 A TW 109142716A TW 109142716 A TW109142716 A TW 109142716A TW I755958 B TWI755958 B TW I755958B
- Authority
- TW
- Taiwan
- Prior art keywords
- substrate
- anode
- shielding
- plating
- shielding member
- Prior art date
Links
Images
Landscapes
- Electroplating Methods And Accessories (AREA)
Abstract
本發明實現一種可在希望之時間遮蔽基板之特定部位的鍍覆裝置,該鍍覆裝置包含:用於收容鍍覆液之鍍覆槽410;配置於鍍覆槽410中之陽極430;在將被鍍覆面朝向下方狀態下,用於保持基板Wf之基板固持器440;用於使基板固持器440旋轉之旋轉機構447;及依基板固持器440之旋轉角度,使遮蔽構件482在陽極430與基板Wf之間移動的遮蔽機構460。The present invention realizes a plating device capable of shielding a specific part of a substrate at a desired time, the plating device comprising: a plating tank 410 for accommodating a plating solution; an anode 430 arranged in the plating tank 410; When the surface to be plated faces downward, the substrate holder 440 for holding the substrate Wf; the rotation mechanism 447 for rotating the substrate holder 440; The shielding mechanism 460 that moves between the substrates Wf.
Description
本申請案係關於一種鍍覆裝置、及鍍覆方法。The present application relates to a coating apparatus and a coating method.
習知鍍覆裝置之一例為杯式的電解鍍覆裝置。杯式之電解鍍覆裝置係使將被鍍覆面朝向下方而保持於基板固持器之基板(例如半導體晶圓)浸漬於鍍覆液,藉由在基板與陽極之間施加電壓,而使導電膜析出至基板表面。An example of a conventional plating apparatus is a cup-type electrolytic plating apparatus. The cup-type electrolytic plating apparatus immerses a substrate (such as a semiconductor wafer) on a substrate holder with the surface to be plated facing downwards in a plating solution, and applies a voltage between the substrate and the anode to make a conductive film. Precipitate to the surface of the substrate.
杯式之電解鍍覆裝置習知係使用遮蔽構件來遮蔽形成於陽極與基板之間的電場。例如,專利文獻1中揭示有藉由將陽極遮罩環配置於陽極與基板之間,使在基板之外緣部附近的電流密度降低,藉此抑制在基板之外緣部周邊形成厚的鍍覆膜。 [先前技術文獻] [專利文獻] Cup-type electrolytic plating apparatuses conventionally use shielding members to shield the electric field formed between the anode and the substrate. For example, Patent Document 1 discloses that, by arranging an anode mask ring between the anode and the substrate, the current density in the vicinity of the outer edge of the substrate is reduced, thereby suppressing the formation of thick plating around the outer edge of the substrate. Laminate. [Prior Art Literature] [Patent Literature]
[專利文獻1]日本特開2014-51697號公報[Patent Document 1] Japanese Patent Application Laid-Open No. 2014-51697
(發明所欲解決之問題)(The problem that the invention intends to solve)
但是,由於過去技術之電解鍍覆裝置係將陽極遮罩環固定於鍍覆槽之內壁的任意高度,因此陽極與基板外緣部之間始終被陽極遮罩環遮蔽。如此,始終遮蔽基板之特定部位時,該部位極不容易形成鍍覆膜,因此,依基板之種類,有需要始終不遮蔽陽極與基板之間,而僅在希望的時間希望遮蔽基板之特定部位。However, in the electrolytic plating apparatus of the prior art, the anode shield ring is fixed at any height of the inner wall of the coating tank, so the space between the anode and the outer edge of the substrate is always shielded by the anode shield ring. In this way, when a specific part of the substrate is always shielded, it is extremely difficult to form a plated film. Therefore, depending on the type of the substrate, it is necessary to always not shield the gap between the anode and the substrate, but only to shield a specific part of the substrate at a desired time. .
因此,本申請案之一個目的為實現一種可在希望之時間遮蔽基板之特定部位的鍍覆裝置及鍍覆方法。 (解決問題之手段) Therefore, an object of the present application is to realize a plating apparatus and a plating method that can shield a specific portion of a substrate at a desired time. (means to solve the problem)
一個實施形態揭示一種鍍覆裝置,係包含:鍍覆槽,其係用於收容鍍覆液;陽極,其係配置於前述鍍覆槽中;基板固持器,其係在將被鍍覆面朝向下方之狀態下用於保持基板;旋轉機構,其係用於使前述基板固持器旋轉,及遮蔽機構,其係依前述基板固持器之旋轉角度,使遮蔽構件在前述陽極與前述基板之間移動。An embodiment discloses a plating apparatus, comprising: a plating tank for accommodating a plating solution; an anode disposed in the plating tank; and a substrate holder for orienting the surface to be plated downward In this state, it is used to hold the substrate; the rotating mechanism is used to rotate the substrate holder, and the shielding mechanism is used to move the shielding member between the anode and the substrate according to the rotation angle of the substrate holder.
以下,參照圖式說明本發明之實施形態。以下說明之圖式中,在相同或相當之元件上註記相同符號,並省略重複之說明。 <鍍覆裝置之整體構成> Hereinafter, embodiments of the present invention will be described with reference to the drawings. In the drawings described below, the same or corresponding elements are denoted by the same symbols, and repeated descriptions are omitted. <The overall structure of the coating device>
圖1係顯示本實施形態之鍍覆裝置的整體構成立體圖。圖2係顯示本實施形態之鍍覆裝置的整體構成俯視圖。如圖1、2所示,鍍覆裝置1000具備:裝載埠100、搬送機器人110、對準器120、預濕模組200、預浸模組300、鍍覆模組400、清洗模組500、自旋沖洗乾燥器600、搬送裝置700、及控制模組800。FIG. 1 is a perspective view showing the overall configuration of the coating apparatus of the present embodiment. FIG. 2 is a plan view showing the overall configuration of the coating apparatus of the present embodiment. As shown in FIGS. 1 and 2 , the
裝載埠100係用於將收納於無圖示之FOUP(前開式晶圓傳送盒)等的匣盒之基板搬入鍍覆裝置1000,或是從鍍覆裝置1000搬出基板至匣盒的模組。本實施形態係在水平方向並列配置4台裝載埠100,不過裝載埠100之數量及配置不拘。搬送機器人110係用於搬送基板之機器人,且以在裝載埠100、對準器120、及搬送裝置700之間交接基板的方式構成。搬送機器人110及搬送裝置700在搬送機器人110與搬送裝置700之間交接基板時,可經由無圖示之暫置台進行基板的交接。The
對準器120係用於使基板之定向平面及凹槽等的位置對準指定方向之模組。本實施形態係在水平方向並列配置2台對準器120,不過對準器120之數量及配置不拘。預濕模組200藉由以純水或脫氣水等之處理液濕潤鍍覆處理前之基板的被鍍覆面,而將形成於基板表面之圖案內部的空氣替換成處理液。預濕模組200係以在鍍覆時藉由將圖案內部之處理液替換成鍍覆液,來實施容易在圖案內部供給鍍覆液之預濕處理的方式構成。本實施形態係在上下方向並列配置2台預濕模組200,不過預濕模組200之數量及配置不拘。The
預浸模組300係以硫酸及鹽酸等處理液蝕刻除去例如形成於鍍覆處理前之基板被鍍覆面的種層表面等上存在的電阻大之氧化膜,實施清洗或活化鍍覆基底表面之預浸處理的方式構成。本實施形態係在上下方向並列配置2台預浸模組300,不過預浸模組300之數量及配置不拘。鍍覆模組400係對基板實施鍍覆處理。本實施形態有2組在上下方向並列配置3台且在水平方向並列配置4台之12台的鍍覆模組400,合計設有24台的鍍覆模組400,不過鍍覆模組400之數量及配置不拘。The
清洗模組500係以為了除去殘留於鍍覆處理後之基板上的鍍覆液等而對基板實施清洗處理的方式構成。本實施形態係在上下方向並列配置2台清洗模組500,不過清洗模組500之數量及配置不拘。自旋沖洗乾燥器600係用於使清洗處理後之基板高速旋轉而乾燥的模組。本實施形態係在上下方向並列配置2台自旋沖洗乾燥器,不過自旋沖洗乾燥器之數量及配置不拘。搬送裝置700係用於在鍍覆裝置1000中之複數個模組間搬送基板的裝置。控制模組800係以控制鍍覆裝置1000之複數個模組的方式構成,例如可由具備與作業人員間之輸入輸出介面的一般電腦或專用電腦而構成。The
以下說明藉由鍍覆裝置1000之一連串鍍覆處理的一例。首先,將收納於匣盒之基板搬入裝載埠100。繼續,搬送機器人110從裝載埠100之匣盒取出基板,並將基板搬送至對準器120。對準器120使基板之定向平面及凹槽等的位置對準指定方向。搬送機器人110將以對準器120對準方向後之基板送交搬送裝置700。An example of a serial plating process by the plating
搬送裝置700將從搬送機器人110接收之基板搬送至預濕模組200。預濕模組200對基板實施預濕處理。搬送裝置700將實施預濕處理後之基板搬送至預浸模組300。預浸模組300對基板實施預浸處理。搬送裝置700將實施預浸處理後之基板搬送至鍍覆模組400。鍍覆模組400對基板實施鍍覆處理。The
搬送裝置700將實施鍍覆處理後之基板搬送至清洗模組500。清洗模組500對基板實施清洗處理。搬送裝置700將實施清洗處理後之基板搬送至自旋沖洗乾燥器600。自旋沖洗乾燥器600對基板實施乾燥處理。搬送裝置700將實施乾燥處理後之基板送交搬送機器人110。搬送機器人110將從搬送裝置700接收之基板搬送至裝載埠100的匣盒。最後,從裝載埠100搬出收納了基板之匣盒。
<鍍覆模組之構成>
The
其次,說明鍍覆模組400之構成。本實施形態中之24台鍍覆模組400係相同構成,因此僅說明1台鍍覆模組400。圖3係概略顯示一個實施形態之鍍覆模組構成的縱剖面圖,且顯示遮蔽構件退開之狀態。如圖3所示,鍍覆模組400具備用於收容鍍覆液之鍍覆槽410。鍍覆模組400具備在上下方向隔開鍍覆槽410之內部的隔膜420。鍍覆槽410之內部藉由隔膜420分隔成陰極區域422與陽極區域424。Next, the structure of the
在陰極區域422與陽極區域424中分別充填鍍覆液。鍍覆模組400具備:朝向陰極區域422而開口之噴嘴426;及經由噴嘴426用於對陰極區域422供給鍍覆液之供給源428。鍍覆模組400就陽極區域424亦同樣地,具備用於對陽極區域424供給鍍覆液之機構,不過省略圖示。在陽極區域424之鍍覆槽410的底面設置陽極430。陰極區域422中,與隔膜420相對配置電阻體450。電阻體450係用於謀求在基板Wf之被鍍覆面Wf-a均勻實施鍍覆處理的構件,並藉由形成有許多孔之板狀構件而構成。The
此外,鍍覆模組400具備在將被鍍覆面Wf-a朝向下方之狀態下用於保持基板Wf的基板固持器440。基板固持器440具備用於從並未圖示之電源對基板Wf饋電的饋電接點。基板固持器440具備:用於支撐基板Wf之被鍍覆面Wf-a的外緣部之密封環固持器442;及用於將密封環固持器442保持於並未圖示之基板固持器本體的框架446。此外,基板固持器440具備:用於推壓基板Wf之被鍍覆面Wf-a的背面之背面板444;及安裝於背面板444之基板推壓面的背面之軸桿448。Moreover, the
鍍覆模組400具備:用於使基板固持器440升降之升降機構443;及以基板Wf在軸桿448之假設軸(在被鍍覆面Wf-a之中央垂直伸展的假設性旋轉軸)的周圍旋轉之方式,用於使基板固持器440旋轉的旋轉機構447。升降機構443及旋轉機構447例如可藉由馬達等習知之機構來實現。鍍覆模組400係以使用升降機構443將基板Wf浸漬於陰極區域422之鍍覆液,並藉由在陽極430與基板Wf之間施加電壓,而對基板Wf之被鍍覆面Wf-a實施鍍覆處理的方式構成。The
鍍覆模組400具備配置於陽極430與基板Wf之間時,用於遮蔽形成於陽極430與基板Wf之間的電場之遮蔽構件482。遮蔽構件482例如亦可係形成板狀之遮蔽板。遮蔽構件482貫穿鍍覆槽410之側壁而插入陰極區域422中,並在並未插入鍍覆槽410之側的端部安裝有凸緣484。本實施形態之遮蔽構件482並非始終應配置於陽極430與基板Wf之間,而係以在希望之時間遮蔽基板Wf之特定部位的方式構成。以下,就這一點進行說明。The
圖4係概略顯示一個實施形態之鍍覆模組構成的俯視圖,且顯示遮蔽構件退開之狀態。如圖3及圖4所示,鍍覆模組400具備:依旋轉機構447旋轉基板固持器440之角度使遮蔽構件482在陽極430與基板Wf之間移動的遮蔽機構460。遮蔽機構460具備安裝於基板固持器440之凸輪構件461。凸輪構件461包含安裝於密封環固持器442之上面的圓板凸輪462。遮蔽機構460具備依推壓凸輪構件461(圓板凸輪462)之突起462a而在陽極430與基板Wf之間擠壓遮蔽構件482的從動節470。FIG. 4 is a plan view schematically showing the structure of a coating module according to an embodiment, and shows a state in which the shielding member is retracted. As shown in FIGS. 3 and 4 , the
從動節470具備被圓板凸輪462之突起462a推壓而在從基板固持器440遠離的方向移動之從動件473。在鍍覆槽410上部之外壁面安裝有基座472,從動件473被可在將軸桿448作為中心之放射方向往返移動的基座472支撐。從動件473係在將軸桿448作為中心之放射方向伸展的棒狀構件。在從動件473之一方端部安裝有在與軸桿448之旋轉軸平行的軸周圍旋轉之第一軋輥471。在從動件473之另一方端部安裝有可在與軸桿448之旋轉軸的方向及將軸桿448作為中心之放射方向兩者垂直的軸周圍旋轉之第二軋輥475。The
從動節470具備依來自從動件473之推壓而旋轉,而在陽極430與基板Wf之間擠壓遮蔽構件482的連桿474。連桿474係棒狀構件,且被可在設於基座472之旋轉軸476周圍旋轉的基座472支撐。旋轉軸476係與第二軋輥475之旋轉軸平行的旋轉軸。連桿474係以夾著連桿474之旋轉軸476的一方側可與第二軋輥475接觸的方式被基座472支撐。在夾著連桿474之旋轉軸476的另一方側端部安裝有可在與第二軋輥475之旋轉軸平行的軸周圍旋轉之第三軋輥478。連桿474係以第三軋輥478可與遮蔽構件482之凸緣484接觸的方式被基座472支撐。The follower joint 470 is provided with a
從動節470具備遮蔽構件482未被連桿474擠壓時,將遮蔽構件482推回從陽極430與基板Wf之間遠離方向的推壓構件479。推壓構件479例如係一方端部安裝於鍍覆槽410之外壁,另一方端部安裝於遮蔽構件482之凸緣484的壓縮線圈彈簧,不過不限定於此。The driven joint 470 includes a
其次,說明遮蔽構件482藉由遮蔽機構460之動作。如圖3及圖4所示,圓板凸輪462之突起462a未推壓第一軋輥471時,凸緣484藉由推壓構件479之施加力而在從鍍覆槽410遠離的方向推壓。藉此,遮蔽構件482移動至從陽極430與基板Wf之間退開的位置。此外,凸緣484在從鍍覆槽410遠離之方向推壓時,連桿474藉由凸緣484推壓第三軋輥478而在逆時針方向旋轉。於是,連桿474之夾著旋轉軸476的一方側朝向軸桿448之中心推壓第二軋輥475。藉此,從動件473朝向軸桿448之中心移動。Next, the operation of the shielding
圖5係概略顯示一個實施形態之鍍覆模組構成的縱剖面圖,且顯示遮蔽構件在陽極與基板之間移動的狀態。圖6係概略顯示一個實施形態之鍍覆模組構成的俯視圖,且顯示遮蔽構件在陽極與基板之間移動的狀態。如圖5及圖6所示,基板固持器440旋轉而在指定之旋轉角度的範圍內時,圓板凸輪462之突起462a推壓第一軋輥471,藉此,第一軋輥471在從軸桿448之中心遠離的方向移動。與此同時,從動件473在從軸桿448之中心遠離的方向移動,第二軋輥475推壓連桿474之夾著旋轉軸476的一方側。藉此,連桿474在順時針方向旋轉,第三軋輥478抵抗推壓構件479之施加力而將凸緣484在接近鍍覆槽410的方向推壓。結果,遮蔽構件482在陽極430與基板Wf之間擠壓。基板固持器440超過指定之旋轉角度的範圍而旋轉時,如使用圖3及圖4之說明,遮蔽構件482移動至從陽極430與基板Wf之間退開的位置。FIG. 5 is a longitudinal sectional view schematically showing the structure of a coating module according to an embodiment, and shows a state in which the shielding member is moved between the anode and the substrate. FIG. 6 is a plan view schematically showing the structure of a coating module according to an embodiment, and shows a state in which the shielding member is moved between the anode and the substrate. As shown in FIG. 5 and FIG. 6 , when the
其次,說明基板之非圖案區域與遮蔽構件的關係。圖7係顯示基板之非圖案區域與遮蔽構件之關係的俯視圖。圖7A係顯示基板之圖案區域與非圖案區域的俯視圖。圖7B係顯示遮蔽構件覆蓋之基板區域的俯視圖。圖7A係從基板Wf之被鍍覆面Wf-a側觀看如圖5及圖6所示基板固持器440在指定之旋轉角度範圍內的狀態之圖,且遮蔽構件482省略圖示。圖7B係從基板Wf之被鍍覆面Wf-a側觀看如圖5及圖6所示遮蔽構件482在陽極430與基板Wf之間擠壓的狀態之圖。Next, the relationship between the non-patterned area of the substrate and the shielding member will be described. FIG. 7 is a top view showing the relationship between the non-patterned area of the substrate and the shielding member. FIG. 7A is a top view showing the pattern area and the non-pattern area of the substrate. FIG. 7B is a top view showing the area of the substrate covered by the shielding member. 7A is a view of the state where the
如圖7A所示,基板Wf具有凹槽Wf-n(缺口)。基板Wf係以凹槽Wf-n與圓板凸輪462之突起462a變成相同旋轉角度之方式而設置於基板固持器440。此外,基板Wf之被鍍覆面Wf-a具有:形成有電路等圖案之圖案區域Wf-b;及凹槽Wf-n周圍不形成電路等圖案之非圖案區域Wf-c。如圖7B所示,遮蔽機構460係以基板Wf之凹槽Wf-n在指定角度範圍內旋轉時,將遮蔽構件482在陽極430與基板Wf的凹槽Wf-n之間擠壓的方式構成。遮蔽構件482係以藉由遮蔽機構460在陽極430與基板Wf的凹槽Wf-n之間擠壓時,覆蓋凹槽Wf-n及凹槽Wf-n周圍之非圖案區域Wf-c的方式構成。另外,本實施形態就基板Wf之特定部位,係以凹槽Wf-n或非圖案區域Wf-c為例做說明,不過,基板Wf之特定部位不限定於此等。此外,本實施形態就凹槽Wf-n周圍之特定區域,係以非圖案區域Wf-c為例做說明,不過凹槽Wf-n周圍之特定區域不限定於此。As shown in FIG. 7A, the substrate Wf has grooves Wf-n (notches). The substrate Wf is provided on the
按照本實施形態,係具備並非將遮蔽構件482始終配置於陽極430與基板Wf之間,而係依基板固持器440之旋轉角度使遮蔽構件482在陽極430與基板Wf之間移動的遮蔽機構460。因此,可在希望之時間遮蔽應藉由遮蔽構件482覆蓋之基板Wf的特定部位。例如,基板Wf之特定部位係凹槽Wf-n周圍之非圖案區域Wf-c情況下,可在希望時間遮蔽凹槽Wf-n及凹槽Wf-n周圍之非圖案區域Wf-c。非圖案區域Wf-c與圖案區域Wf-b不同,因為基板Wf露出,電場集中於非圖案區域Wf-c,結果,造成圖案區域Wf-b之鍍覆膜厚不均勻。另外,本實施形態由於可在希望之時間以遮蔽構件482覆蓋非圖案區域Wf-c,因此可適切抑制電場集中於非圖案區域Wf-c,結果,可使圖案區域Wf-b之鍍覆膜厚均勻化。另外,本實施形態係顯示藉由遮蔽構件482覆蓋凹槽Wf-n及凹槽Wf-n周圍的非圖案區域之例,不過不限定於此,亦可在希望之時間覆蓋基板Wf之特定部位。According to the present embodiment, instead of arranging the shielding
此外,本實施形態係顯示設置1個圓板凸輪462的突起462a之例,不過不限定於此,例如,沿著基板Wf之周方向存在複數個基板Wf的特定部位情況下,亦可依基板Wf之特定部位的配置來設置複數個圓板凸輪462之突起462a。此外,本實施形態係顯示設置1個遮蔽機構460,不過不限定於此,亦可沿著鍍覆槽410之周方向設置複數個遮蔽機構460。藉此,基板Wf之特定部位在不同之複數個指定旋轉角度範圍內時,可藉由遮蔽構件482覆蓋基板Wf之特定部位。例如,亦可以圖案區域Wf-b之鍍覆膜厚變成均勻的方式調整遮蔽機構460之數量及配置角度。In addition, the present embodiment shows an example in which one
圖8係顯示一個實施形態之圓板凸輪構造的俯視圖。上述實施形態係顯示以一體構成來製作圓板凸輪462之例,不過不限定於此。如圖8所示,圓板凸輪462之構成亦可包含:安裝於基板固持器440(密封環固持器442)之本體構件463;及可裝卸地安裝於本體構件463之突起構件464。如圖8所示,突起構件464包含:第一突起構件464-1;及與第一突起構件464-1形狀不同之第二突起構件464-2。按照圖8之實施形態,可對不同種類之基板更換突起構件464。由於第一突起構件464-1與第二突起構件464-2之突起尺寸不同,因此可使遮蔽構件482在陽極430與基板Wf之間的移動量不同。因此,例如基板Wf之特定部位的尺寸不同時,無須更換遮蔽機構460,或是更換整個圓板凸輪462,僅更換突起構件464即可,因此可對複數種類之基板迅速因應。Fig. 8 is a plan view showing the structure of a disc cam according to an embodiment. The above-described embodiment shows an example in which the
其次,說明使用本實施形態之鍍覆模組400的鍍覆方法。圖9係使用一個實施形態之鍍覆模組的鍍覆方法之流程圖。另外,以下之鍍覆方法係在不對圓板凸輪462之本體構件463安裝突起構件464的狀態下開始者。Next, the plating method using the
本實施形態之鍍覆方法中,首先,在具有不同突起尺寸之圓板凸輪462的複數個突起構件(例如第一突起構件464-1與第二突起構件464-2)中,選擇與保持於基板固持器440之基板Wf種類對應的突起構件而安裝於圓板凸輪462之本體構件463(步驟101)。此時,第一突起構件464-1係安裝於本體構件463者。繼續,鍍覆方法在基板固持器440上設置基板Wf(步驟102)。步驟102例如可藉由無圖示之機器手等將被鍍覆面Wf-a朝向下方狀態的基板Wf設置於密封環固持器442,並藉由背面板444推壓基板Wf之背面來執行。In the plating method of the present embodiment, first, among a plurality of protruding members (for example, the first protruding member 464-1 and the second protruding member 464-2) having the
繼續,鍍覆方法藉由升降機構443使基板固持器440下降至鍍覆槽410中(下降步驟103)。繼續,鍍覆方法藉由旋轉機構447使基板固持器440旋轉(旋轉步驟104)。Continuing, the plating method lowers the
鍍覆方法依旋轉步驟104時基板固持器440之旋轉角度使遮蔽構件482在陽極430與基板Wf之間移動(遮蔽步驟105)。遮蔽步驟105可藉由遮蔽機構460來執行。遮蔽步驟105之詳細內容於後述。繼續,鍍覆方法繼續執行旋轉步驟104及遮蔽步驟105,而且藉由在配置於鍍覆槽410中之陽極430與保持於基板固持器440的基板Wf之間施加電壓,來對被鍍覆面Wf-a實施鍍覆處理(鍍覆步驟106)。The plating method moves the shielding
繼續,鍍覆方法判定是否應結束鍍覆處理(步驟107)。鍍覆方法例如藉由從開始鍍覆處理尚未經過指定時間,而判定為不應結束鍍覆處理情況下(步驟107, No),返回旋轉步驟106繼續處理。Continuing, the plating method determines whether the plating process should be terminated (step 107 ). In the plating method, for example, when it is determined that the plating treatment should not be terminated (
另外,鍍覆方法例如藉由開始鍍覆處理且經過指定時間而判定為應結束鍍覆處理情況下(步驟107, Yes),停止藉由旋轉機構447旋轉基板固持器440(步驟108)。繼續,鍍覆方法藉由升降機構443使基板固持器440上升(步驟109),結束鍍覆處理。In addition, in the plating method, for example, when the plating process is started and the predetermined time elapses and it is determined that the plating process should be terminated (
其次,說明遮蔽步驟105之詳細內容。圖10係使用一個實施形態之鍍覆模組的鍍覆方法中之遮蔽步驟的流程圖。遮蔽步驟105於基板固持器440在指定之旋轉角度範圍內時,具體而言,基板Wf之凹槽Wf-n在指定角度範圍內旋轉時,藉由安裝於基板固持器440之圓板凸輪462的第一突起構件464-1使從動件473在從基板固持器440遠離的方向移動(步驟105-1)。Next, the details of the masking
繼續,遮蔽步驟105依來自從動件473之推壓使連桿474旋轉,而在陽極430與基板Wf之間,具體而言,在陽極430與基板Wf的凹槽Wf-n之間擠壓遮蔽構件482(步驟105-2)。藉此,藉由遮蔽構件482覆蓋凹槽Wf-n及凹槽Wf-n周圍之非圖案區域Wf-c。繼續,遮蔽步驟105於並未在陽極430與基板Wf之間擠壓遮蔽構件482時,亦即,基板固持器440在指定之旋轉角度範圍外旋轉時,藉由推壓構件479將遮蔽構件482從在陽極430與基板Wf之間遠離的方向推回(步驟105-3)。遮蔽步驟105在藉由旋轉機構447使基板固持器440旋轉期間,反覆進行步驟105-1至步驟105-3。Continuing, the shielding
按照本實施形態之鍍覆方法,並非將遮蔽構件482始終配置於陽極430與基板Wf之間,而係藉由遮蔽步驟105依基板固持器440之旋轉角度,使遮蔽構件482在陽極430與基板Wf之間移動。因此,可在希望之時間遮蔽應藉由遮蔽構件482覆蓋之基板Wf的特定部位。According to the plating method of the present embodiment, the shielding
以上,係說明本發明之一些實施形態,不過上述發明之實施形態是為了容易瞭解本發明者,而並非限定本發明者。本發明在不脫離其旨趣範圍內可變更、改良,並且本發明中當然包含其等效物。此外,在可解決上述問題之至少一部分範圍內,或是可達成效果之至少一部分的範圍內,申請專利範圍及說明書中記載之各元件可任意組合或省略。Although some embodiments of the present invention have been described above, the embodiments of the present invention described above are for the purpose of facilitating the understanding of the present invention and are not intended to limit the present invention. The present invention can be changed and improved without departing from the scope of the gist, and it is needless to say that the equivalents thereof are included in the present invention. In addition, within the scope of at least a part of solving the above problems, or the scope of achieving at least a part of the effect, the various elements described in the scope of the patent application and the specification can be arbitrarily combined or omitted.
本申請案之一個實施形態揭示一種鍍覆裝置,係包含:鍍覆槽,其係用於收容鍍覆液;陽極,其係配置於前述鍍覆槽中;基板固持器,其係在將被鍍覆面朝向下方之狀態下用於保持基板;旋轉機構,其係用於使前述基板固持器旋轉,及遮蔽機構,其係依前述基板固持器之旋轉角度,使遮蔽構件在前述陽極與前述基板之間移動。An embodiment of the present application discloses a coating apparatus, which includes: a coating tank, which is used to accommodate a plating solution; an anode, which is arranged in the coating tank; and a substrate holder, which is fastened to be The plated surface is used to hold the substrate when the plated surface is facing downward; the rotating mechanism is used to rotate the substrate holder, and the shielding mechanism is based on the rotation angle of the substrate holder, so that the shielding member is used for the anode and the substrate. move between.
進一步,本申請案之一個實施形態揭示一種鍍覆裝置,其中前述遮蔽機構包含:凸輪構件,其係安裝於前述基板固持器;及從動節,其係依被前述凸輪構件之突起推壓,而在前述陽極與前述基板之間擠壓前述遮蔽構件。Further, an embodiment of the present application discloses a coating device, wherein the shielding mechanism comprises: a cam member, which is mounted on the substrate holder; and a follower, which is pressed by the protrusion of the cam member, The shielding member is pressed between the anode and the substrate.
進一步,本申請案之一個實施形態揭示一種鍍覆裝置,其中前述凸輪構件具有複數個突起,前述從動節係以每當被前述複數個突起推壓時,在前述陽極與前述基板之間擠壓前述遮蔽構件的方式構成。Further, an embodiment of the present application discloses a coating device, wherein the cam member has a plurality of protrusions, and the driven link is pressed between the anode and the substrate every time it is pressed by the plurality of protrusions It is constituted by pressing the above-mentioned shielding member.
進一步,本申請案之一個實施形態揭示一種鍍覆裝置,其中前述凸輪構件包含圓板凸輪,前述從動節包含:從動件,其係被前述圓板凸輪之突起推壓,而在從前述基板固持器遠離之方向移動;連桿,其係依來自前述從動件之推壓而旋轉,而在前述陽極與前述基板之間擠壓前述遮蔽構件;及推壓構件,其係前述遮蔽構件未被前述連桿擠壓時,在從前述陽極與前述基板之間遠離的方向推回前述遮蔽構件。Further, an embodiment of the present application discloses a coating device, wherein the cam member includes a circular plate cam, and the driven joint includes: a follower that is pushed by the protrusion of the circular plate cam, and is pushed from the above-mentioned circular plate cam. The substrate holder moves in the direction away from; the connecting rod rotates according to the pressing force from the follower, and presses the shielding member between the anode and the substrate; and a pressing member is the shielding member When not being pressed by the link, the shielding member is pushed back in a direction away from between the anode and the substrate.
進一步,本申請案之一個實施形態揭示一種鍍覆裝置,其中前述圓板凸輪包含:本體構件,其係安裝於前述基板固持器;及突起構件,其係可裝卸地安裝於前述本體構件。Further, an embodiment of the present application discloses a coating apparatus, wherein the circular plate cam includes: a body member mounted on the substrate holder; and a protruding member detachably mounted on the body member.
進一步,本申請案之一個實施形態揭示一種鍍覆裝置,其中前述遮蔽機構係以當前述基板之特定部位旋轉至指定角度範圍內時,在前述陽極與前述基板的特定部位之間擠壓前述遮蔽構件的方式構成。Further, an embodiment of the present application discloses a coating device, wherein the shielding mechanism is configured to press the shielding between the anode and the specific portion of the substrate when the specific portion of the substrate rotates within a specified angle range the way components are constructed.
進一步,本申請案之一個實施形態揭示一種鍍覆裝置,其中前述特定部位係前述基板之凹槽,且前述遮蔽構件係以藉由前述遮蔽機構在前述陽極與前述基板的凹槽之間擠壓時,覆蓋前述基板之凹槽及前述基板之凹槽周圍的特定區域之方式構成。Further, an embodiment of the present application discloses a coating device, wherein the specific portion is a groove of the substrate, and the shielding member is pressed between the anode and the groove of the substrate by the shielding mechanism At the same time, it is formed by covering the groove of the substrate and a specific area around the groove of the substrate.
進一步,本申請案之一個實施形態揭示一種鍍覆裝置,其中前述基板之凹槽周圍的特定區域包含前述基板之凹槽周圍並未形成圖案的區域。Further, an embodiment of the present application discloses a plating apparatus, wherein a specific area around the groove of the substrate includes an area around the groove of the substrate that is not patterned.
進一步,本申請案之一個實施形態揭示一種鍍覆裝置,其中前述遮蔽機構沿著前述鍍覆槽之周方向設置複數個。Further, an embodiment of the present application discloses a coating apparatus, wherein a plurality of the shielding mechanisms are provided along the circumferential direction of the coating tank.
進一步,本申請案之一個實施形態揭示一種鍍覆方法,係包含:下降步驟,其係在被鍍覆面朝向下方之狀態下,使保持基板之基板固持器下降至鍍覆槽中;旋轉步驟,其係使前述基板固持器旋轉;遮蔽步驟,其係依前述旋轉步驟時前述基板固持器之旋轉角度,使遮蔽構件在前述陽極與前述基板之間移動;及鍍覆步驟,其係藉由在將配置於前述鍍覆槽中之陽極與保持於前述基板固持器的基板之間施加電壓,而對前述被鍍覆面實施鍍覆處理。Further, an embodiment of the present application discloses a plating method, which includes: a lowering step, in which the substrate holder for holding the substrate is lowered into the plating tank when the surface to be plated faces downward; the rotating step, The above-mentioned substrate holder is rotated; the shielding step is performed by moving the shielding member between the above-mentioned anode and the above-mentioned substrate according to the rotation angle of the above-mentioned substrate holder during the above-mentioned rotating step; and the plating step is performed by A voltage is applied between the anode arranged in the plating tank and the substrate held by the substrate holder, and the plating treatment is performed on the plating surface.
進一步,本申請案之一個實施形態揭示一種鍍覆方法,其中前述遮蔽步驟包含以下步驟:藉由安裝於前述基板固持器之圓板凸輪的突起,使從動件在從前述基板固持器遠離之方向移動;及依來自前述從動件之推壓使連桿旋轉,而在前述陽極與前述基板之間擠壓前述遮蔽構件。Further, an embodiment of the present application discloses a plating method, wherein the masking step includes the following steps: by means of the protrusions of the circular plate cam installed on the substrate holder, the follower is moved away from the substrate holder in a position away from the substrate holder. moving in the direction; and according to the push from the follower, the connecting rod rotates, and the shielding member is pressed between the anode and the base plate.
進一步,本申請案之一個實施形態揭示一種鍍覆方法,其中前述遮蔽步驟進一步包含當並未在前述陽極與前述基板之間擠壓前述遮蔽構件時,在從前述陽極與前述基板之間遠離方向推回前述遮蔽構件的步驟。Further, an embodiment of the present application discloses a plating method, wherein the shielding step further comprises: when the shielding member is not pressed between the anode and the substrate, in a direction away from the anode and the substrate Push back the previous step of the shielding member.
進一步,本申請案之一個實施形態揭示一種鍍覆方法,其中進一步包含從具有不同突起尺寸之前述圓板凸輪的複數個突起構件中選擇與保持於前述基板固持器之基板種類對應的突起構件,而安裝於前述圓板凸輪之本體構件的步驟。Further, an embodiment of the present application discloses a plating method, further comprising selecting a protruding member corresponding to the type of substrate held in the substrate holder from a plurality of protruding members of the circular plate cam having different protruding sizes, The step of installing the body member of the aforementioned circular plate cam.
100:裝載埠
110:搬送機器人
120:對準器
200:預濕模組
300:預浸模組
400:鍍覆模組
410:鍍覆槽
420:隔膜
422:陰極區域
424:陽極區域
426:噴嘴
428:供給源
430:陽極
440:基板固持器
442:密封環固持器
443:升降機構
444:背面板
446:框架
447:旋轉機構
448:軸桿
450:電阻體
460:遮蔽機構
461:凸輪構件
462:圓板凸輪
462a:突起
463:本體構件
464:突起構件
464-1:第一突起構件
464-2:第二突起構件
470:從動節
471:第一軋輥
472:基座
473:從動件
474:連桿
475:第二軋輥
476:旋轉軸
478:第三軋輥
479:推壓構件
482:遮蔽構件
484:凸緣
500:清洗模組
600:自旋沖洗乾燥器
700:搬送裝置
800:控制模組
1000:鍍覆裝置
Wf:基板
Wf-n:凹槽
Wf-b:圖案區域
Wf-c:非圖案區域
100: Load port
110: Transfer Robot
120: Aligner
200: Pre-wet module
300: Prepreg module
400: Plating module
410: Plating tank
420: Diaphragm
422: Cathode area
424: Anode area
426: Nozzle
428: Supply Source
430: Anode
440: Substrate holder
442: Seal Ring Retainer
443: Lifting mechanism
444: Back Panel
446: Frame
447: Rotary Mechanism
448: Shaft
450: Resistor body
460: Shading Mechanism
461: Cam member
462:
圖1係顯示本實施形態之鍍覆裝置的整體構成立體圖。 圖2係顯示本實施形態之鍍覆裝置的整體構成俯視圖。 圖3係概略顯示一個實施形態之鍍覆模組構成的縱剖面圖,且顯示遮蔽構件退開之狀態。 圖4係概略顯示一個實施形態之鍍覆模組構成的俯視圖,且顯示遮蔽構件退開之狀態。 圖5係概略顯示一個實施形態之鍍覆模組構成的縱剖面圖,且顯示遮蔽構件在陽極與基板之間移動的狀態。 圖6係概略顯示一個實施形態之鍍覆模組構成的俯視圖,且顯示遮蔽構件在陽極與基板之間移動的狀態。 圖7A係顯示基板之圖案區域與非圖案區域的俯視圖。 圖7B係顯示遮蔽構件覆蓋之基板區域的俯視圖。 圖8係顯示一個實施形態之圓板凸輪構造的俯視圖。 圖9係使用一個實施形態之鍍覆模組的鍍覆方法之流程圖。 圖10係使用一個實施形態之鍍覆模組的鍍覆方法中之遮蔽步驟的流程圖。 FIG. 1 is a perspective view showing the overall configuration of the coating apparatus of the present embodiment. FIG. 2 is a plan view showing the overall configuration of the coating apparatus of the present embodiment. FIG. 3 is a longitudinal sectional view schematically showing the structure of a coating module according to an embodiment, and shows a state in which the shielding member is retracted. FIG. 4 is a plan view schematically showing the structure of a coating module according to an embodiment, and shows a state in which the shielding member is retracted. FIG. 5 is a longitudinal sectional view schematically showing the structure of a coating module according to an embodiment, and shows a state in which the shielding member is moved between the anode and the substrate. FIG. 6 is a plan view schematically showing the structure of a coating module according to an embodiment, and shows a state in which the shielding member is moved between the anode and the substrate. FIG. 7A is a top view showing the pattern area and the non-pattern area of the substrate. FIG. 7B is a top view showing the area of the substrate covered by the shielding member. Fig. 8 is a plan view showing the structure of a disc cam according to an embodiment. FIG. 9 is a flow chart of a coating method using the coating module of one embodiment. FIG. 10 is a flowchart of a masking step in a coating method using a coating module of an embodiment.
410:鍍覆槽 410: Plating tank
420:隔膜 420: Diaphragm
422:陰極區域 422: Cathode area
424:陽極區域 424: Anode area
426:噴嘴 426: Nozzle
428:供給源 428: Supply Source
430:陽極 430: Anode
440:基板固持器 440: Substrate holder
442:密封環固持器 442: Seal Ring Retainer
443:升降機構 443: Lifting mechanism
444:背面板 444: Back Panel
446:框架 446: Frame
447:旋轉機構 447: Rotary Mechanism
448:軸桿 448: Shaft
450:電阻體 450: Resistor body
460:遮蔽機構 460: Shading Mechanism
461:凸輪構件 461: Cam member
462:圓板凸輪 462: Disc Cam
462a:突起 462a: Protrusion
470:從動節 470: Driven Festival
471:第一軋輥 471: First Roll
472:基座 472: Pedestal
473:從動件 473: Follower
474:連桿 474: Connecting rod
475:第二軋輥 475: Second Roll
476:旋轉軸 476: Rotary axis
478:第三軋輥 478: Third Roll
479:推壓構件 479: Push member
482:遮蔽構件 482: Shading member
484:凸緣 484: Flange
Wf:基板 Wf: substrate
Claims (11)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW109142716A TWI755958B (en) | 2020-12-04 | 2020-12-04 | Plating apparatus and plating method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW109142716A TWI755958B (en) | 2020-12-04 | 2020-12-04 | Plating apparatus and plating method |
Publications (2)
Publication Number | Publication Date |
---|---|
TWI755958B true TWI755958B (en) | 2022-02-21 |
TW202223171A TW202223171A (en) | 2022-06-16 |
Family
ID=81329247
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW109142716A TWI755958B (en) | 2020-12-04 | 2020-12-04 | Plating apparatus and plating method |
Country Status (1)
Country | Link |
---|---|
TW (1) | TWI755958B (en) |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6027631A (en) * | 1997-11-13 | 2000-02-22 | Novellus Systems, Inc. | Electroplating system with shields for varying thickness profile of deposited layer |
TW589399B (en) * | 1998-03-02 | 2004-06-01 | Ebara Corp | Apparatus for plating a substrate |
JP2005089812A (en) * | 2003-09-17 | 2005-04-07 | Casio Comput Co Ltd | Plating apparatus, and method for plating semiconductor substrate |
JP2016211010A (en) * | 2015-04-28 | 2016-12-15 | 株式会社荏原製作所 | Electrolytic treatment device |
JP2020533792A (en) * | 2017-09-07 | 2020-11-19 | エーシーエム リサーチ (シャンハイ) インコーポレーテッド | Chuck device for plating |
-
2020
- 2020-12-04 TW TW109142716A patent/TWI755958B/en active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6027631A (en) * | 1997-11-13 | 2000-02-22 | Novellus Systems, Inc. | Electroplating system with shields for varying thickness profile of deposited layer |
TW589399B (en) * | 1998-03-02 | 2004-06-01 | Ebara Corp | Apparatus for plating a substrate |
JP2005089812A (en) * | 2003-09-17 | 2005-04-07 | Casio Comput Co Ltd | Plating apparatus, and method for plating semiconductor substrate |
JP2016211010A (en) * | 2015-04-28 | 2016-12-15 | 株式会社荏原製作所 | Electrolytic treatment device |
JP2020533792A (en) * | 2017-09-07 | 2020-11-19 | エーシーエム リサーチ (シャンハイ) インコーポレーテッド | Chuck device for plating |
Also Published As
Publication number | Publication date |
---|---|
TW202223171A (en) | 2022-06-16 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
WO2022118431A1 (en) | Plating apparatus and plating method | |
TWI555121B (en) | Method and apparatus for filling interconnect structures | |
TWI662160B (en) | Anisotropic high resistance ionic current source (ahrics) | |
WO2022190243A1 (en) | Plating apparatus and plating method | |
KR20120135489A (en) | Support and transport unit for a print substrate for a plant for depositing print tracks , and relative deposition method | |
TWI755958B (en) | Plating apparatus and plating method | |
US20220178046A1 (en) | Plating apparatus and plating method | |
US7828951B2 (en) | Wafer support apparatus for electroplating process and method for using the same | |
JP7279273B1 (en) | Plating equipment | |
US20220396895A1 (en) | Plating apparatus and plating processing method | |
CN108330518B (en) | Method and apparatus for filling an interconnect structure | |
US20210010148A1 (en) | Substrate processing system and substrate processing method | |
WO2023148950A1 (en) | Plating apparatus | |
WO2023145049A1 (en) | Plating device and plating method | |
WO2023084584A1 (en) | Plating apparatus | |
TWI806408B (en) | Plating device and plating method | |
JP7128385B1 (en) | Plating equipment and manufacturing method of plating equipment | |
JP7027622B1 (en) | Resistors and plating equipment | |
JP6990342B1 (en) | Substrate wetting method and plating equipment | |
TWI838038B (en) | Coating equipment | |
JP2022127862A (en) | Plating apparatus and liquid level adjustment method for plating solution | |
TW202409358A (en) | Plating device and plating method | |
KR100293239B1 (en) | device and method for plating the semiconductor substrate | |
JP2002332598A (en) | Solution treatment apparatus | |
KR20180025449A (en) | Apparatus and method for treating substrate |