TWI753761B - Memory device startup information reconstruction method and system thereof - Google Patents

Abstract

A memory device startup information reconstruction method and system thereof are provided. The memory device startup information reconstruction system includes a memory device and an electronic device. The memory device includes non-volatile memory, and the non-volatile memory includes good blocks and bad blocks. The electronic device includes initialization software to execute the memory device startup information reconstruction method. The memory device startup information reconstruction method comprises the following steps: the initialization software obtains a non-volatile memory bad block address data of the corresponding memory device according to an exclusive serial number and a lookup table; the initialization software makes the memory device to erase good blocks in the non-volatile memory based on the non-volatile memory bad block address data; the initialization software generates user system data and makes the memory device to write it into the non-volatile memory.

Description

Method and system for restoring boot information of memory device

The present invention relates to a method and system for restoring boot information of a memory device, and more particularly, to a method for indexing and obtaining the address data of non-volatile memory damaged blocks of a corresponding memory device according to an exclusive serial number and a comparison table , and encode it to generate user system data according to the memory device activation information restoration method and system.

Generally, a storage device (eg, a solid state drive) includes a controller and a non-volatile memory (eg, flash memory), where the non-volatile memory is used to store data. When memory manufacturers manufacture non-volatile memories, it is inevitable that some non-volatile memories do not meet the original specifications and are listed as downgrades. Therefore, before these degraded products are assembled into products, a card opening (initialization) step is required to obtain the addresses of all bad blocks in the non-volatile memory and record them in the boot information. (or startup information). The boot-up information is usually an information block stored in non-volatile memory. However, these degraded products are classified as defective products due to the high temperature environment of the reflow oven during the production of SMT (Surface Mount Technology). Profitable revenue.

Therefore, in order to solve the problem that the boot information in the non-volatile memory is damaged or lost due to the high temperature environment of the reflow oven when the degraded product of the non-volatile memory passes through the reflow oven. Embodiments of the present invention provide a method for restoring boot information of a memory device, which is suitable for a memory device and a card opening software thereof, wherein the memory device includes a non-volatile memory, and the non-volatile memory includes a plurality of good blocks and a plurality of In the damaged block, the memory device starts the information restoration method. Erase these good blocks in the non-volatile memory according to the bad block address data of the non-volatile memory; and the card opening software generates the user system data and makes the memory device write it to the non-volatile memory in the body.

In an embodiment of the present invention, the memory device activates the information restoration method before the step of obtaining the address data of the non-volatile memory damaged block corresponding to the memory device by the card opening software according to the exclusive serial number and the comparison table, It further includes: before the memory device passes through the reflow oven, the memory device starts the information restoration method, including: the card opening software receives the non-volatile memory damaged block address data generated by the memory device, and responds to the memory device Generate an exclusive serial number, in which the non-volatile memory damaged block address data and the exclusive serial number have a one-to-one correspondence; the card opening software creates a comparison table between the non-volatile memory damaged block address data and the exclusive serial number; And the card opening software uses the high-level error correction unit of the electronic device, or enables the memory device to use the low-level error correction unit of the memory device to encode the exclusive serial number, and then write multiple encoded exclusive serial numbers to the non-volatile memory. wherein, after the memory device passes through the reflow oven, the memory device starts the information restoration method, further comprising: the card opening software uses the high-level error correction unit of the electronic device, or makes the memory device use the low-level error of the memory device The correction unit decodes at least one of the encoded exclusive serial numbers in the non-volatile memory to restore the exclusive serial numbers.

In an embodiment of the present invention, the card opening software uses the high-level error correction unit of the electronic device, or the memory device uses the low-level error correction unit of the memory device to encode the exclusive serial number, and then write these After the step of encoding the exclusive serial number into the non-volatile memory, the step further includes: the card opening software enables the memory device to divide the non-volatile memory into a system data area and a user data area.

In an embodiment of the present invention, after the step of erasing the good blocks in the non-volatile memory according to the damaged block address data of the non-volatile memory by the card opening software, the memory device further includes: : The card opening software enables the memory device to divide the non-volatile memory into system data area and user data area.

In an embodiment of the present invention, the step of generating the user system data by the card opening software further includes: the card opening software uses a low-level error correction unit of the electronic device to correct the damaged block address of the non-volatile memory Data is encoded to generate user system data.

An embodiment of the present invention further provides a system for restoring boot information of a memory device, including: a memory device including a non-volatile memory, the non-volatile memory including a plurality of good blocks and a plurality of damaged blocks; and an electronic device, The electronic device is coupled to the memory device, and the electronic device includes a card-opening software to execute a method for restoring activation information of the memory device. The volatile memory corrupts the block address data; the card opening software causes the memory device to erase these good blocks in the non-volatile memory according to the non-volatile memory corrupted block address data; and the card opening software generates User system data and have the memory device write it to non-volatile memory.

In the method and system for restoring boot information of a memory device provided by the embodiments of the present invention, before the memory device passes through the reflow oven, the card opening software establishes the non-volatile memory damaged area of the corresponding memory device with the exclusive serial number Correspondence between block address data. Then write multiple coded unique serial numbers into the non-volatile memory. After the memory device passes through the reflow oven, the card opening software uses the decoded exclusive serial number to index and obtain the non-volatile memory damaged block address data of the corresponding memory device through the comparison table. Then, the non-volatile memory damaged block address data is encoded, and the user system data is generated and restored accordingly. It is then written to non-volatile memory. In this way, the address data of the damaged block of the non-volatile memory can be successfully obtained through the exclusive serial number and the comparison table, and the user system data can be restored to the non-volatile memory, thereby effectively preventing the memory device from reflowing through soldering. During the furnace, due to the high temperature environment of the reflow furnace, the same non-volatile memory damaged block address data in the non-volatile memory is damaged or lost, so that the memory device passes through the reflow furnace. , the problem that the user's system data cannot be restored.

The above description is only an overview of the technical solutions of the present invention, in order to be able to understand the technical means of the present invention more clearly, it can be implemented according to the content of the description, and in order to make the above and other purposes, features and advantages of the present invention more obvious and easy to understand , the following specific preferred embodiments, and in conjunction with the accompanying drawings, are described in detail as follows. In order to make the above-mentioned and other objects, features and advantages of the present invention more obvious and easy to understand, the following specific embodiments are given and described in detail in conjunction with the accompanying drawings.

FIG. 1 is a schematic diagram of a system structure of a memory device boot information restoration system according to an embodiment of the present invention. As shown in FIG. 1 , the memory device activation information restoration system 1 includes a memory device 10 and an electronic device 20 coupled to the memory device 10 . The memory device 10 includes a non-volatile memory 110, a memory controller 120 and a low-level error correction unit 130, wherein the memory controller 120 is coupled to the non-volatile memory 110 and the low-level error correction unit 130, wherein the non-volatile memory 110 and the low-level error correction unit 130 are The volatile memory 110 includes a plurality of damaged blocks and a plurality of good blocks, wherein the good blocks are preferably data blocks for storing data, and each data block includes a plurality of data pages. The memory device 10 is preferably a device for storing data, such as a solid-state drive or an SD (secure digital) memory card. The non-volatile memory 110 may be a data storage medium with long-term data retention, such as a flash memory (Flash Memory). The electronic device 20 includes a card opening software 210 , an advanced error correction unit 220 and a processor 230 . The processor 230 is mainly used to control the high-level error correction unit 220 or the memory device 10 or communicate with the memory device 10 according to the instructions or steps of the card opening software 210 to transmit or receive instructions/data, wherein the processor 230 is coupled to the card opening software 210 and the high-level error correction unit 220, and the electronic device 20 is preferably a computer or a flash drive. In addition, the electronic device 20 may further include a low-level error correction unit (not shown) coupled to the processor 230, such as a low-level error correction codec, which uses general error correction/error correction capabilities for error correction code, such as BCH code.

When the memory device 10 is in the manufacturing stage, the memory manufacturer uses the electronic device 20 to open (initialize) the memory device 10 . Furthermore, the memory manufacturer loads and executes the card-opening software 210 to open the memory device 10 . Card opening mainly includes low-level initialization and high-level initialization. The low-level initialization is the stage before the memory device 10 passes through the reflow oven, and is mainly for establishing a one-to-one correspondence with the non-volatile memory damaged block address data (damaged block record table) of the memory device 10 The exclusive serial number (unique serial number) of the corresponding memory device is used to index the non-volatile memory corruption block address data of the corresponding memory device through the comparison table. Then, write multiple coded specific serial numbers into the non-volatile memory 110, and store the non-volatile memory damaged block address data and the comparison table to the electronic device 20 or the cloud host (not shown). The high-level initialization is a stage after the memory device 10 has passed through the reflow oven, and is mainly to restore the exclusive serial numbers by decoding the encoded exclusive serial numbers. Then, by reading the restored exclusive serial number, the address data of the damaged block of the non-volatile memory corresponding to the memory device 10 is obtained by indexing through the comparison table. Then encode the damaged block address data of the non-volatile memory, and generate and restore the user system data (boot-up information or activation information, which includes the damaged block record table) accordingly, and then write it to the non-volatile memory in sexual memory 110.

Please refer to FIG. 1 and FIG. 2 at the same time. FIG. 2 is a schematic flowchart of a method for restoring boot information of a memory device according to an embodiment of the present invention before and after the memory device passes through a reflow oven. The electronic device 20 includes a card opening software 210 to execute the method for restoring the boot information of the memory device. The method for restoring the boot information of the memory device includes the following steps: before the memory device 10 passes through the reflow oven, as shown in step S100, the memory controller 120 scans or detects the non-volatile memory 110 to check each block in the non-volatile memory 110 for damaged blocks. Once the memory controller 120 finds a damaged block, it will mark or record the information of the damaged block (eg, the address of the damaged block) in the non-volatile memory damaged block address data (eg, store the non-volatile block address). address of all damaged blocks in the memory 110 ), and transmits the generated non-volatile memory damaged block address data to the electronic device 20 or the card opening software 210 .

As shown in step S110 , the electronic device 20 or the card opening software 210 receives the non-volatile memory damaged block address data (damaged block record table) generated by the memory device 10 , and generates an exclusive serial number for the memory device 10 . The exclusive serial number is preferably any number, letter, special symbol or combination thereof. In other words, there is a one-to-one correspondence between the non-volatile memory damaged block address data and the specific serial number, that is, the specific non-volatile memory damaged block address data and the specific specific serial number are exclusive to the specific non-volatile memory damaged block address data and the specific specific serial number. memory device. In addition, the card opening software 210 can store the non-volatile memory damaged block address data in the memory (not shown in the figure) of the electronic device 20 or transmit and store it to the memory of the cloud host (not shown in the figure) through the network )middle.

As shown in step S120, the card opening software 210 establishes a comparison table between the address data of the non-volatile memory damaged block and the exclusive serial number. The comparison table records the correspondence between the address data of the damaged block of the non-volatile memory and the exclusive serial number. That is to say, the card opening software 210 can index and obtain the non-volatile memory damaged block address data of the corresponding memory device through the look-up table. In addition, the card opening software 210 can store the comparison table in the memory of the electronic device 20 or transmit and store the comparison table in the memory of the cloud host through the network.

As shown in step S130, the card opening software 210 enables the high-level error correction unit 220 of the electronic device 20, or the memory controller 120 to use the low-level error correction unit 130 of the memory device 10 to encode the exclusive serial number, and then write Enter multiple coded specific serial numbers into the non-volatile memory 110 . The higher order error correction unit 220 is, for example, a higher order error correction codec, which uses an error correction code with excellent error correction/error correction capability, such as an LDPC code (Low Density Parity Check Code). The low-order error correction unit 130 is, for example, a low-order error correction codec, which uses an error correction code with general error correction/error correction capability, such as a BCH code. For example, the memory controller 120 can copy the first encoded unique serial number (the original unique serial number) of multiple (eg, 100) transactions, and write these encoded unique serial numbers into the non-volatile memory One or more data pages of one or more data blocks in body 110. Of course, it is preferable to fill all available data blocks/data pages in the non-volatile memory 110 with the encoded exclusive serial numbers. The method of writing the encoded exclusive serial number is not limited, and may be continuous writing, non-sequential writing or random writing. Since these writing methods belong to the scope of the prior art, they will not be repeated here.

As shown in step S131 , the card opening software 210 enables the memory device 10 to divide the non-volatile memory 110 into a system data area and a user data area by the memory controller 120 . The system data area is preferably composed of a portion of all good blocks, and the user data block is preferably composed of another portion of all good blocks. For example, if all good blocks of the non-volatile memory 110 include M data blocks, the first to Nth data blocks may be the system data area, and the N+1th data block may be the system data block. to the Mth data block, wherein N and M are positive integers, and M is greater than N.

After the memory device 10 passes through the reflow oven, the memory device starts the information restoration method, which further includes the following steps: First, as shown in step S140, the card opening software 210 uses the high-level error correction unit 220 of the electronic device 20, or makes the memory The controller 120 uses the low-level error correction unit 130 of the memory device 10 to decode at least one of the encoded unique serial numbers in the non-volatile memory 110 to restore the unique serial number. Furthermore, the card opening software 210 enables the memory controller 120 to read at least one of the encoded unique serial numbers from the non-volatile memory 110 , and enables the processor 230 to use the high-level error correction unit 220 to read at least one The obtained encoded exclusive serial number is decoded, or the memory controller 120 uses the low-level error correction unit 130 to decode the read encoded exclusive serial number. This restores the unique serial number.

Due to the small amount of data of the exclusive serial number, there are usually only a few Bytes (bytes), for example, 4Bytes. Therefore, if more parity bits than the data bits of the dedicated serial number are used, such as 9 Bytes, the 4 Bytes of dedicated serial numbers are protected by the parity bits of 9 Bytes to ensure that the memory device 10 can pass the return After soldering, the error/damage bits of the encoded unique serial number can be corrected by the high-level error correction unit 220 or the low-level error correction unit 130, and the correction can be completed successfully. For example, for 1KB (kilobyte) data, the number of bits that can be corrected by the high-order error correction unit 220 is, for example, 240, and the number of bits that the low-order error correction unit 130 can correct is, for example, 72. Therefore, for an exclusive serial number with a size of 4 Bytes, after decoding the encoded exclusive serial number by the high-order error correction unit 220 or the low-order error correction unit 130, the exclusive serial number can be successfully restored.

As shown in step S150 , the card opening software 210 obtains the address data of the non-volatile memory damaged block corresponding to the memory device 10 according to the exclusive serial number (ie the exclusive serial number obtained after decoding) and the comparison table. Furthermore, the card opening software 210 enables the processor 230 to obtain a comparison table from the memory of the electronic device 20 or to the memory of the cloud host through the network, and passes the comparison table to the memory of the electronic device 20 according to the specific serial number. In the memory of the host or the cloud host, the damaged block address data of the non-volatile memory corresponding to the memory device 10 can be indexed and obtained.

As shown in step S160, the card opening software 210 enables the memory controller 120 to erase all the good blocks in the non-volatile memory 110 according to the address data of the damaged block of the non-volatile memory.

As shown in step S170, the card-opening software 210 generates user system data (boot-up information/activation information) according to the non-volatile memory corruption block address data, and makes the memory controller 120 write it into the non-volatile memory in volatile memory 110 . Furthermore, the card opening software 210 uses the low-level error correction unit (not shown) of the electronic device 20 to encode the non-volatile memory damaged block address data, and generate user system data accordingly. Next, the card opening software 210 enables the memory controller 120 to write the user system data into the system data area of the non-volatile memory 110 . In this way, the address data of the non-volatile memory damaged block of the corresponding memory device 10 is successfully obtained through the exclusive serial number, and the user system data is generated and restored to the non-volatile memory 110 accordingly, so as to effectively Therefore, when the memory device 10 passes through the reflow oven, due to the high temperature environment of the reflow oven, the block address data/boot information of the same non-volatile memory in the non-volatile memory 110 may be damaged by multiple blocks of the same non-volatile memory. It is damaged or lost, so that the memory device 10 cannot obtain the user system data after passing through the reflow oven.

Please refer to FIGS. 1 , 2 and 3 at the same time. FIG. 3 is a schematic flowchart of a method for restoring boot information of a memory device according to another embodiment of the present invention before and after the memory device passes through a reflow oven. The steps of this embodiment (ie the step shown in FIG. 3 ) are similar to the steps of the previous embodiment (ie the step shown in FIG. 2 ), the difference is that this embodiment lacks step S131 but adds step S161 . Since the content of the process executed in step S161 is the same as that in step S131, it will not be repeated here. In addition, the content of the processes executed in steps S100, S110, S120, S130, S140, S150, S160, and S170 in this embodiment is the same as that in steps S100, S110, S120, S130, and S140 in the previous embodiment (ie, FIG. 2 ). , S150, S160 and S170 are completely the same, so they are not repeated here.

Please refer to FIG. 1 , FIG. 2 and FIG. 4 at the same time. FIG. 4 is a schematic flowchart of a method for restoring boot information of a memory device according to another embodiment of the present invention after the memory device passes through a reflow oven. After the memory device passes through the reflow oven, the card opening software 210 can index and obtain the non-volatile memory corresponding to the memory device 10 only by reading the dedicated serial number in the non-volatile memory 110 and passing the comparison table. Damage block address data (as shown in step S210). Next, the card opening software 210 enables the memory controller 120 to erase all good blocks in the non-volatile memory 110 according to the address data of the damaged blocks of the non-volatile memory (as shown in step S220). Then, the card opening software 210 encodes the non-volatile memory damaged block address data, and generates and restores user system data accordingly, and enables the memory controller 120 to write the user system data to the non-volatile memory in the memory 110 (as shown in step S230). In this way, the data of the damaged block address of the non-volatile memory can be successfully indexed and obtained through the exclusive serial number and the comparison table, and the user system data can be restored to the non-volatile memory 110 , thereby effectively avoiding the memory device 10 . When passing through the reflow oven, due to the high temperature environment of the reflow oven, multiple identical non-volatile memory damaged block address data in the non-volatile memory 110 are damaged or lost, resulting in the memory device 10 . After passing through the reflow oven, the user's system data cannot be restored. In addition, for further description of steps S210 , S220 and S230 , reference may be made to the description of steps S150 , S160 and S170 in the previous embodiment, which will not be repeated here.

To sum up, in the method and system for restoring the boot information of a memory device provided by the embodiments of the present invention, before the memory device passes through the reflow oven, the card opening software establishes the non-volatile memory of the corresponding memory device through the exclusive serial number. Correspondence between address data of corrupted memory blocks. Then write multiple coded unique serial numbers into the non-volatile memory. After the memory device passes through the reflow oven, the card opening software uses the decoded exclusive serial number to index and obtain the non-volatile memory damaged block address data of the corresponding memory device through the comparison table. Then, the non-volatile memory damaged block address data is encoded, and the user system data is generated and restored accordingly. It is then written to non-volatile memory. In this way, the address data of the damaged block of the non-volatile memory can be successfully obtained through the exclusive serial number and the comparison table, and the user system data can be restored to the non-volatile memory, thereby effectively preventing the memory device from reflowing through soldering. During the furnace, due to the high temperature environment of the reflow furnace, the same non-volatile memory damaged block address data in the non-volatile memory is damaged or lost, so that the memory device passes through the reflow furnace. , the problem that the user's system data cannot be restored.

Although the present invention has been disclosed as above with examples, it is not intended to limit the present invention. Those with ordinary knowledge in the technical field to which the present invention pertains can make some changes and modifications without departing from the spirit and scope of the present invention. Therefore, the protection scope of the present invention should be determined by the scope of the appended patent application.

1: The memory device starts the information restoration system 10: Memory device 110: Non-volatile memory 120: Memory Controller 130: Low-order error correction unit 20: Electronics 210: Card opening software 220: Higher order error correction unit 230: Processor S100～S170, S210～S230: steps

FIG. 1 is a schematic diagram of a system structure of a memory device boot information restoration system according to an embodiment of the present invention. 2 is a schematic flowchart of a method for restoring boot information of a memory device according to an embodiment of the present invention before and after the memory device passes through a reflow oven. 3 is a schematic flowchart of a method for restoring boot information of a memory device according to another embodiment of the present invention before and after the memory device passes through a reflow oven. 4 is a schematic flowchart of a method for restoring boot information of a memory device after the memory device passes through a reflow oven according to another embodiment of the present invention.

S210~S230: Steps

Claims (10)

A method for restoring boot information of a memory device, suitable for a memory device and card opening software thereof, wherein the memory device includes a non-volatile memory, the non-volatile memory includes a plurality of good blocks and a plurality of damaged areas block, the memory device starts the information restoration method, including: The card opening software obtains address data of a non-volatile memory damaged block corresponding to the memory device according to an exclusive serial number and a comparison table; The card opening software enables the memory device to erase the good blocks in the non-volatile memory according to the address data of the bad blocks of the non-volatile memory; and The card opening software generates a user system data and causes the memory device to write it into the non-volatile memory. The method for restoring startup information of a memory device according to claim 1, wherein the card opening software obtains the address data of the damaged block of the non-volatile memory corresponding to the memory device according to the exclusive serial number and the comparison table. Before, the memory device activation information restoration method further includes: Wherein, before the memory device passes through the reflow oven, the memory device starts an information restoration method, including: The card opening software receives the non-volatile memory damaged block address data generated by the memory device, and generates the exclusive serial number for the memory device, wherein the non-volatile memory damaged block address data and the exclusive serial number is a one-to-one correspondence; the card opening software establishes the look-up table between the non-volatile memory damaged block address data and the unique serial number; and The card opening software uses a high-level error correction unit of an electronic device, or enables the memory device to use a low-level error correction unit of the memory device to encode the exclusive serial number, and then write multiple encoded exclusive serial numbers to in the non-volatile memory; Wherein, after the memory device passes through the reflow oven, the memory device starts an information restoration method, further comprising: The card opening software uses the high-level error correction unit of the electronic device, or enables the memory device to use the low-level error correction unit of the memory device, at least one of the unique serial numbers encoded in the pens in the non-volatile memory Decode to restore the unique serial number. The memory device activation information restoration method as claimed in claim 2, wherein the card opening software uses the high-level error correction unit of the electronic device, or enables the memory device to use the low-level error correction unit of the memory device to correct After encoding the exclusive serial number, and then writing the encoded exclusive serial numbers of the pens into the non-volatile memory, the steps further include: The card opening software enables the memory device to divide the non-volatile memory into a system data area and a user data area. The memory device activation information restoration method as claimed in claim 1, wherein the card opening software causes the memory device to erase the non-volatile memory according to the damaged block address data of the non-volatile memory After some good block steps, more include: The card opening software enables the memory device to divide the non-volatile memory into a system data area and a user data area. The method for restoring boot information of a memory device as claimed in claim 1, wherein the step of generating the user system data by the card opening software further comprises: The card opening software encodes the non-volatile memory damaged block address data with a low-level error correction unit of an electronic device to generate the user system data. A memory device boot information restoration system, comprising: a memory device including a non-volatile memory including a plurality of good blocks and a plurality of bad blocks; and An electronic device coupled to the memory device, the electronic device comprising a card opening software for executing a memory device activation information restoration method, the memory device activation information restoration method comprising: The card opening software obtains address data of a non-volatile memory damaged block corresponding to the memory device according to an exclusive serial number and a comparison table; The card opening software enables the memory device to erase the good blocks in the non-volatile memory according to the address data of the bad blocks of the non-volatile memory; and The card opening software generates a user system data and causes the memory device to write it into the non-volatile memory. The memory device activation information restoration system according to claim 6, wherein the card opening software obtains the address data of the damaged block of the non-volatile memory corresponding to the memory device according to the exclusive serial number and the comparison table Before, the memory device activation information restoration method further includes: Wherein, before the memory device passes through the reflow oven, the memory device starts an information restoration method, including: The card opening software receives the non-volatile memory damaged block address data generated by the memory device, and generates the exclusive serial number for the memory device, wherein the non-volatile memory damaged block address data and the exclusive serial number is a one-to-one correspondence; the card opening software establishes the look-up table between the non-volatile memory damaged block address data and the unique serial number; and The card opening software uses a high-level error correction unit of an electronic device, or enables the memory device to use a low-level error correction unit of the memory device to encode the exclusive serial number, and then write multiple encoded exclusive serial numbers to in the non-volatile memory; Wherein, after the memory device passes through the reflow oven, the memory device starts an information restoration method, further comprising: The card opening software uses the high-level error correction unit of the electronic device, or enables the memory device to use the low-level error correction unit of the memory device, at least one of the unique serial numbers encoded in the pens in the non-volatile memory Decode to restore the unique serial number. The memory device activation information restoration system of claim 7, wherein the card opening software uses the high-level error correction unit of the electronic device, or enables the memory device to use the low-level error correction unit of the memory device to correct After encoding the exclusive serial number, and then writing the encoded exclusive serial numbers of the pens into the non-volatile memory, the steps further include: The card opening software enables the memory device to divide the non-volatile memory into a system data area and a user data area. The memory device activation information restoration system of claim 6, wherein the card opening software causes the memory device to erase the non-volatile memory according to the non-volatile memory damaged block address data After some good block steps, more include: The card opening software enables the memory device to divide the non-volatile memory into a system data area and a user data area. The memory device activation information restoration system according to claim 6, wherein the step of generating the user system data by the card opening software further comprises: The card opening software encodes the non-volatile memory damaged block address data with a low-level error correction unit of an electronic device to generate the user system data.

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