TWI751722B - Wafer cloth glue fixture - Google Patents
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Abstract
一種晶圓布膠治具,其用於對晶圓的正面執行布膠作業,且包括能上下相對離合的治具本體與載板,以及能通過治具本體與載板之間的膠膜,位於載板上方的治具本體包括具有布膠槽之模座、蓋板、抽氣通道與注膠通道,所述晶圓能以正面朝下置設於模座上,並以蓋板予以固定,使晶圓之正面相對於顯露在布膠槽底部之膠膜之間形成密閉的布膠空間,並通過抽氣通道對布膠空間抽氣,以及通過注膠通道對布膠空間注入液態膠體,液態膠體藉布膠空間抽氣後之負壓吸引作用與注膠壓力而流動且全面地塗布於晶圓的正面與膠膜之間,用以在晶圓正面形成一可被撕離的防護膠體層。A wafer cloth glue jig is used to perform glue operation on the front side of a wafer, and includes a jig body and a carrier plate that can be relatively clutched up and down, and an adhesive film that can pass between the jig body and the carrier plate, The jig body located above the carrier includes a mold base with a glue groove, a cover plate, an air suction channel and a glue injection channel. The wafer can be placed on the mold base with its face down and fixed by the cover plate. , so that the front side of the wafer forms a closed adhesive space between the adhesive films exposed at the bottom of the adhesive tank, and the adhesive space is pumped through the air extraction channel, and liquid colloid is injected into the adhesive space through the injection channel. , the liquid colloid flows and is fully coated between the front side of the wafer and the adhesive film by the suction effect of negative pressure and the glue injection pressure after the vacuuming of the adhesive space, so as to form a tearable protection on the front side of the wafer colloid layer.
Description
本發明係關於一種布膠治具,尤指應用於晶圓正面布膠製程的晶圓布膠治具。 The present invention relates to a cloth glue jig, in particular to a wafer cloth glue jig which is applied to the front face cloth glue process of wafers.
目前完成前段半導體製程的晶圓進行後段封裝製程之前,晶圓須先經研磨至預定的厚度,為了保護晶圓正面的多個晶粒單元免於後續研磨製程中受損,必須於先於晶圓正面貼附保護膠膜,使晶圓具有保護膠膜的正面能被固定於機具上,再對晶圓背面執行表面研磨步驟,直至晶圓被研磨、拋光至預定厚度後,再表面清潔,晶圓背面重新貼附切割膠膜,撕離保護膠膜。 At present, the wafers that have completed the front-end semiconductor process must be ground to a predetermined thickness before the back-end packaging process. In order to protect the multiple die units on the front side of the wafer from being damaged in the subsequent grinding process A protective film is attached to the round front, so that the front side of the wafer with the protective film can be fixed on the machine, and then the surface grinding step is performed on the back of the wafer until the wafer is ground and polished to a predetermined thickness, and then the surface is cleaned. Re-attach the dicing film on the back of the wafer and peel off the protective film.
前述晶圓研磨前,於晶圓正面貼附保護膠膜的方式雖能在晶圓背面研磨時,對晶圓正面提供一定保護作用,但是,晶圓正面的晶粒單元表面為非平坦表面,保護膠膜難以全面貼覆晶圓正面,故當晶圓進行背面研磨過程中,保護膠膜無法對晶圓正面提供足夠的機械強度,以致晶圓進行背面研磨,易使晶圓正面的晶粒單元受損,實有進一步改善的必要。 The aforementioned method of attaching a protective film to the front side of the wafer before grinding the wafer can provide a certain protective effect on the front side of the wafer during the backside grinding of the wafer. However, the surface of the die unit on the front side of the wafer is a non-flat surface. It is difficult for the protective film to fully cover the front side of the wafer. Therefore, when the wafer is subjected to back grinding, the protective film cannot provide sufficient mechanical strength to the front side of the wafer, so that the backside grinding of the wafer will easily cause die on the front side of the wafer. The unit is damaged, and there is a need for further improvement.
本發明之目的在於提供一種晶圓布膠治具,解決目前保護膠膜貼覆於晶圓正面,在晶圓背面研磨過程中,保護膠膜無法對晶圓正面提供足夠的機械強度之問題。 The purpose of the present invention is to provide a wafer cloth adhesive jig, which solves the problem that the current protective film is attached to the front side of the wafer, and the protective film cannot provide sufficient mechanical strength to the front side of the wafer during the backside grinding process of the wafer.
為了達成前述目的,本發明所提出的晶圓布膠治具係用於對一晶圓的正面執行布膠,且包括:一載板,其具有一平坦的承載面;以及 一治具本體,其能分離地裝設於該載板的上方,且該治具本體的底部與該載板的承載面之間具有一橫向通道,並能提供一膠膜通過該橫向通道,且該治具本體包括一模座、一蓋板、一抽氣通道與一注膠通道,其中:該模座中形成由上而下貫通的一布膠槽,且該膠膜覆設於該布膠槽的底部,所述晶圓能以正面朝下面向該布膠槽的方式置放於該模座上;該蓋板係能拆組地裝設於該模座上,並能封閉該布膠槽上端的開口及固定所述晶圓,使面向該布膠槽之所述晶圓正面與覆設於該布膠槽底部的該膠膜之間形成一封閉的布膠空間;該抽氣通道與該注膠通道係分別連通該布膠空間且相對於該布膠空間之中心的相對兩側,並能通過該抽氣通道對該布膠空間抽氣,以及通過該注膠通道對該布膠空間注入具有流動性的液態膠體,使所述液態膠體能布設於所述晶圓的正面與該膠膜之間形成一防護膠體層。 In order to achieve the aforementioned object, the wafer adhesive jig provided by the present invention is used for performing adhesive on the front side of a wafer, and includes: a carrier board having a flat carrier surface; and a jig body, which can be detachably installed above the carrier board, and has a transverse channel between the bottom of the fixture body and the bearing surface of the carrier board, and can provide an adhesive film to pass through the transverse channel, And the fixture body includes a mold seat, a cover plate, an air suction channel and a glue injection channel, wherein: a cloth glue groove is formed in the mold seat from top to bottom, and the glue film is covered on the The bottom of the glue tank, the wafer can be placed on the mold base with the front side facing the glue tank; the cover plate is detachably installed on the mold base, and can close the mold base an opening at the upper end of the glue dispensing tank and fixing the wafer, so that a closed glue dispensing space is formed between the front side of the wafer facing the glue dispensing tank and the glue film covering the bottom of the glue dispensing tank; The air channel and the glue injection channel are respectively communicated with the glue distribution space and opposite sides relative to the center of the glue glue space, and the glue space can be pumped through the air suction channel, and the glue injection channel Liquid colloid with fluidity is injected into the adhesive space, so that the liquid colloid can be arranged between the front surface of the wafer and the adhesive film to form a protective colloid layer.
前述晶圓布膠治具能應用於晶圓正面塗膠作業中,並在晶圓正面形成一防護膠體層,其中,利用能上下相對離合的治具本體與載板,以及能通過治具本體與載板之間的膠膜,位於載板上方的治具本體以其模座中的上下貫通的布膠槽提供晶圓以正面朝下置設於模座上,蓋板能封閉模座之布膠槽且固定晶圓,使晶圓之正面相對於顯露於布膠槽底部之膠膜之間形成密閉的布膠空間,並通過抽氣通道對布膠空間抽氣,以及通過注膠通道對布膠空間注入液態膠體,液態膠體藉布膠空間抽氣後之負壓吸引作用以及注膠壓力而流動且全面地塗布於晶圓的正面與膠膜之間,並藉由治具本體控制晶圓正面與膠膜之間塗布的膠體厚度與平坦性,使晶圓正面與膠膜之間形成一可被撕離的防護膠體層。 The aforementioned wafer cloth glue jig can be applied to the front side gluing operation of the wafer, and a protective colloid layer is formed on the front side of the wafer. The adhesive film between the carrier and the carrier, the jig body located above the carrier, provides wafers with the upper and lower through-through glue grooves in the die base, and is placed on the die base face down, and the cover plate can close the die base. The glue tank and the wafer are fixed so that the front side of the wafer forms a closed glue space relative to the glue film exposed at the bottom of the glue bath, and the glue space is evacuated through the air suction channel, and the glue injection channel is used. The liquid colloid is injected into the adhesive space, and the liquid colloid flows and is fully coated between the front side of the wafer and the adhesive film by the suction effect of negative pressure after the adhesive space is evacuated and the glue injection pressure, and is controlled by the fixture body. The thickness and flatness of the colloid coated between the front side of the wafer and the adhesive film form a peelable protective colloid layer between the front side of the wafer and the adhesive film.
藉此,完成布膠作業的晶圓於後續晶圓背面的研磨製程,晶圓正面經由防護膠體層外側膠膜置設固定於於研磨機具上,即能進行晶圓背面研 磨、拋光至預定厚度等晶圓背面研磨製程。於晶圓背面研磨製程中,晶圓塗設膠體的正面因有全面性塗布覆蓋之防護膠體層與外側的膠膜提供防護功能,對晶圓具有多個晶粒單元的正面提供足夠的機械強度與防護性能,在晶圓背面研磨製程中,能有效地降低晶圓背面研磨時,晶圓正面的晶粒單元受損的情形。待晶圓背面研磨製程完成後,於進行晶粒單元切割製程前,能藉由膠膜將覆設於晶圓正面的防護膠體層予以撕離。 In this way, the subsequent grinding process of the wafer on the backside of the wafer after the adhesive dispensing operation is completed, the front side of the wafer is arranged and fixed on the grinding machine through the outer adhesive film of the protective colloid layer, and the backside grinding of the wafer can be carried out. Grinding, polishing to a predetermined thickness and other wafer back grinding processes. In the wafer back grinding process, the front side of the wafer coated with colloid is provided with a protective colloid layer and an outer side film to provide a protective function, which provides sufficient mechanical strength to the front side of the wafer with multiple die units. With the protection performance, in the wafer back grinding process, it can effectively reduce the damage of the die units on the front side of the wafer during the back grinding of the wafer. After the wafer backside grinding process is completed, before the die unit cutting process, the protective colloid layer covering the front side of the wafer can be torn off by an adhesive film.
10:載板 10: Carrier board
11:承載面 11: Bearing surface
20:治具本體 20: Fixture body
200:布膠空間 200: Fabric space
21:模座 21: Mold base
211:布膠槽 211: Cloth glue tank
22:蓋板 22: Cover
23:抽氣通道 23: exhaust channel
24:注膠通道 24: glue injection channel
30:膠膜 30: film
40:紫外光燈具 40: UV lamps
50:晶圓 50: Wafer
51:正面 51: front
52:背面 52: Back
60:防護膠體層 60: Protective colloid layer
70:研磨機具 70: Grinding Machines
圖1係本發明晶圓布膠治具之一較佳實施例的示意圖。 FIG. 1 is a schematic diagram of a preferred embodiment of a wafer cloth adhesive fixture of the present invention.
圖2係圖1所示晶圓布膠治具較佳實施例應用於晶圓布膠作業的使用狀態參考圖(一)。 FIG. 2 is a reference diagram (1) of the use state of the preferred embodiment of the wafer adhesive jig shown in FIG. 1 applied to the wafer adhesive operation.
圖3係圖1所示晶圓布膠治具較佳實施例應用於晶圓布膠作業的使用狀態參考圖(二)。 FIG. 3 is a reference diagram (2) of the use state of the preferred embodiment of the wafer glue jig shown in FIG. 1 applied to the wafer glue operation.
圖4係圖1所示晶圓布膠治具較佳實施例應用於晶圓布膠作業的使用狀態參考圖(三)。 FIG. 4 is a reference diagram (3) of the use state of the preferred embodiment of the wafer adhesive jig shown in FIG. 1 applied to the wafer adhesive operation.
圖5係布膠後具有防護膠體層的晶圓置放於研磨機具上的平面示意圖。 FIG. 5 is a schematic plan view of a wafer with a protective colloid layer placed on a polishing machine after being glued.
如圖1所示,其揭示本發明晶圓布膠治具之一較佳實施例,該晶圓布膠治具係用於對一晶圓的正面執行布膠,所述晶圓之正面係指所述晶圓具有多個晶粒單元的表面,所述晶圓相對於正面之另一側為一背面,該背面貼覆有一保護膠膜。該晶圓布膠治具包括能相對離合的一載板10與一治具本體20,以及能通過該載板10與該治具本體20之間的一膠膜30。
As shown in FIG. 1, which discloses a preferred embodiment of the wafer adhesive jig of the present invention, the wafer adhesive jig is used to perform adhesive bonding on the front side of a wafer, and the front side of the wafer is Refers to the surface of the wafer having a plurality of die units, the other side of the wafer relative to the front surface is a back surface, and the back surface is covered with a protective film. The wafer cloth adhesive jig includes a
如圖1所示,該載板10頂部具有一平坦的承載面11,於本較佳實施例中,該承載面11為一光滑平面。該載板10配合晶圓預定塗布之光固化型膠
體時,該載板10可以選用透光材料製成的板體,所述透光材料可以選用石英玻璃等,該載板10的下方可設置一紫外光燈具40,該紫外光燈具40發出的紫外光能向上通過該載板10。若該載板10係配合晶圓預定塗布之熱固化型膠體時,則該載板10可以選用透光或非透光材料製成的板體,該載板10的下方可設置一加熱器50,用以提供熱固化型膠體固化所需的熱能,該加熱器50可以選用電熱式加熱器。
As shown in FIG. 1 , the top of the
如圖1所示,該治具本體20係能分離地裝設於該載板10的上方,且該治具本體20的底部與該載板10的承載面之間具有一橫向通道,並能提供該膠膜30通過該橫向通道。於本較佳實施例中,該橫向通道的高度係對應於該膠膜30的厚度,該膠膜30可以捲帶型態並通過捲帶輸送裝置輸送通過該橫向通道。該膠膜30可為具有透光性或非透光性之膜片,該膠膜30可選用具有優良的堅韌性,拉伸、抗衝擊強度、耐磨性及電絕緣性等之聚對苯二甲酸乙二酯(polyethylene terephthalate,PET)材質的膜片。該膠膜30配合晶圓預定塗布之光固化型膠體時,該膠膜30選用具透光性之膜片;若該膠膜30配合晶圓預定塗布之熱固化型膠體,該膠膜30則可以選用非透光性之膜片。
As shown in FIG. 1 , the
如圖1所示,前述中,該治具本體20包括一模座21、一蓋板22、一抽氣通道23與一注膠通道24,該模座21能置設於該載板10承載面11與膠膜30上,且該模座21中形成由上而下貫通的一布膠槽211,待布膠的晶圓能置設於該模座21的頂部且所述晶圓能以其正面朝下面向該布膠槽211,所述膠膜30位於該模座21的底部且覆設於該布膠槽211的底部。蓋板22係能拆組地裝設於模座21,並能封閉該布膠槽211上端的開口及固定所述晶圓,使面向該布膠槽211之所述晶圓的正面與覆設於該布膠槽211底部的該膠膜30之間形成一封閉的布膠空間200。
As shown in FIG. 1 , as mentioned above, the
如圖1所示,該抽氣通道23與該注膠通道24係分別連通該布膠空間200且相對於該布膠空間200之中心的相對兩側。該抽氣通道23能外接抽氣裝置,並能通過該抽氣通道23對該布膠空間200抽氣而使該布膠空間200產生負壓;該注膠通道24則能外接液態膠體供給源,並能通過該注膠通道24對該布膠空間200注入具有流動性的液態膠體,且藉由該布膠空間200抽氣後負壓吸引作用而使液態膠體於布膠空間200中流動。
As shown in FIG. 1 , the
如圖1所示,於本較佳實施例中,該抽氣通道23與該注膠通道24可分別設置於治具本體20的模座21中,該抽氣通道23與該注膠通道24分別位於該布膠空間200之中心的相對兩側。此外,該抽氣通道與該注膠通道亦能變更其設置位置,並能達到相同的效果,例如:該抽氣通道與該注膠通道也可分別設置於治具本體的蓋板中且分別位於該布膠空間之中心的相對兩側。或者,該抽氣通道與該注膠通道兩者中之任一通道設於該治具本體的模座中且連通該布膠空間,另一通道則設置於該治具本體的蓋板中且連通該布膠空間,且該抽氣通道與該注膠通道位於該布膠空間之中心的相對兩側。
As shown in FIG. 1 , in this preferred embodiment, the
關於本發明晶圓布膠治具應用於晶圓正面布膠作業時,如圖2至圖4所示,所述膠膜30被輸送至該載板10的承載面11上,其次,將治具本體20的模座21對位固定於具有膠膜30的載板10上,再將待布膠的晶圓50置放在模座21上,並使該晶圓50具有多個晶粒單元的正面51朝下面向模座21的布膠槽211,次將蓋板22蓋合於模座21上,蓋板22封閉該布膠槽211上端的開口並固定該晶圓50,使面向該布膠槽211之晶圓50的正面51與顯露於布膠槽211底部的膠膜30之間形成一封閉的布膠空間200,接續,通過該抽氣通道23對該布膠空間200抽氣,使該布膠空間200抽氣後產生負壓,再通過該注膠通道24對該布膠空間200注入具有流動性的液態膠體,所述液態膠體藉該布膠空間200抽氣後之負壓吸引作用而於布膠空間200中流動,直至液態膠體注滿布膠空間200,液體膠
體即全面性塗布於所述晶圓50的正面51且覆設於顯露在布膠槽211底部的膠膜30後停止注膠,其藉由封閉的布膠空間200控制晶圓50正面51與膠膜30之間的膠體厚度,使晶圓50的正面51與膠膜30之間形成一防護膠體層60。
When the wafer adhesive jig of the present invention is applied to the front side of the wafer, as shown in FIG. 2 to FIG. The
接續,依據注入布膠空間200的液態膠體為光固化型膠體或熱固化型膠體,而啟用相對應的紫外光燈具40或加熱器,其中藉由紫外光燈具40發出之紫外光通過透光的載板10、透光的膠膜30而投射在光固化型液態膠體,使液態膠體光固化;或者藉由加熱器提供熱能,並通過載板10與膠膜30的熱傳導對熱固化型液態膠體加熱,使液態膠體受熱固化。待液態膠體固化後,再令治具本體20依序脫離以及切斷膠膜30後取出,此時,晶圓50的正面51具有防護膠體層60及位於防護膠體層60外側的膠膜30。
Then, according to whether the liquid colloid injected into the
前述中,所述液態膠體基於後續晶圓製程,須再自晶圓50的正面51撕離,故所述液態膠體的材料須選擇固化後的防護膠體層60與晶圓50的正面51之間存在較低黏著性的膠體材料,使固化後的防護膠體層60能夠易於自晶圓50的正面51撕離且不會損壞晶圓正面的晶粒單元,此膠體材料係屬現有的材料,於此不再贅述。該膠膜30與固化後的防護膠體層60之間的黏著性則宜大於固化後的防護膠體層60與晶圓50的正面51之間的黏著性,以利後續經由膠膜30自晶圓50正面51撕離防護膠體層60。
As mentioned above, the liquid colloid needs to be peeled off from the
前述中,完成布膠作業的晶圓50即可接續晶圓背面的研磨製程,如圖5所示,於晶圓研磨製程時,利用晶圓50正面51成形之防護膠體層60外側貼附之膠膜30固定於研磨機具70的機台上,晶圓50的背面52朝上,之後,撕離晶圓50背面52之保護膠膜,再由研磨機具70的研磨機構進行晶圓50的背面52執行研磨、拋光至預定厚度等晶圓背面研磨製程。於此晶圓背面的研磨製程中,晶圓50的正面51因有晶圓正面具有防護膠體層,該防護膠體層全面覆蓋於晶圓具有多數晶粒單元的正面,故防護膠體層能對晶圓具有多個晶粒單元的正
面提供足夠的機械強度與防護性能,在晶圓背面研磨製程中,能有效地降低晶圓背面研磨時,晶圓正面的晶粒單元受損的情形。
In the above, the
待晶圓背面研磨製程完成後,於進行晶圓之晶粒切割製程前,先於晶圓已完成研磨製程的背面重新貼覆保護膠膜,再利用貼覆於防護膠體層60外側面之膠膜30將防護膠體層60自晶圓50的正面51撕離,即能進行後續晶圓之晶粒切割製程。
After the backside grinding process of the wafer is completed, before the die cutting process of the wafer is performed, the protective film is reapplied on the backside of the wafer after the grinding process is completed, and then the adhesive applied to the outer side of the
10:載板 10: Carrier board
11:承載面 11: Bearing surface
20:治具本體 20: Fixture body
200:布膠空間 200: Fabric space
21:模座 21: Mold base
211:布膠槽 211: Cloth glue tank
22:蓋板 22: Cover
23:抽氣通道 23: exhaust channel
24:注膠通道 24: glue injection channel
30:膠膜 30: film
40:紫外光燈具 40: UV lamps
50:晶圓 50: Wafer
51:正面 51: front
52:背面 52: Back
Claims (6)
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Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5851845A (en) * | 1995-12-18 | 1998-12-22 | Micron Technology, Inc. | Process for packaging a semiconductor die using dicing and testing |
TW201412931A (en) * | 2009-09-07 | 2014-04-01 | Nitto Denko Corp | Thermosetting die bonding film, dicing/die bonding film and semiconductor device |
TWM590309U (en) * | 2019-07-29 | 2020-02-01 | 日月光半導體製造股份有限公司 | Vacuum fixture |
-
2020
- 2020-09-28 TW TW109133728A patent/TWI751722B/en active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5851845A (en) * | 1995-12-18 | 1998-12-22 | Micron Technology, Inc. | Process for packaging a semiconductor die using dicing and testing |
TW201412931A (en) * | 2009-09-07 | 2014-04-01 | Nitto Denko Corp | Thermosetting die bonding film, dicing/die bonding film and semiconductor device |
TWM590309U (en) * | 2019-07-29 | 2020-02-01 | 日月光半導體製造股份有限公司 | Vacuum fixture |
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