TWI747780B - Crystal growth furnace - Google Patents
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- TWI747780B TWI747780B TW110113712A TW110113712A TWI747780B TW I747780 B TWI747780 B TW I747780B TW 110113712 A TW110113712 A TW 110113712A TW 110113712 A TW110113712 A TW 110113712A TW I747780 B TWI747780 B TW I747780B
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/02—Elements
- C30B29/06—Silicon
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Abstract
Description
本發明係與長晶爐有關;特別是指一種能使爐腔內氣體流動均勻的長晶爐。The invention relates to a crystal growth furnace; in particular, it refers to a crystal growth furnace that can make the gas flow uniform in the furnace cavity.
在典型的CZ法(Czochralski)製程中,係將矽料置於坩堝內,並將矽料在約1416℃之溫度熔化為液態矽後,將具預定結晶取向之矽晶種下降以接觸液態矽之表面,在適當地溫度控制下,液態矽在矽晶種上形成具有與該矽晶種所具預定結晶取向之單晶,接著,旋轉並慢慢提拉矽晶種及坩堝,以在矽晶種下方形成矽晶棒。In a typical CZ method (Czochralski) process, the silicon material is placed in a crucible, and the silicon material is melted into liquid silicon at a temperature of about 1416°C, and then a silicon seed crystal with a predetermined crystal orientation is lowered to contact the liquid silicon Under proper temperature control, the liquid silicon forms a single crystal on the silicon seed crystal with a predetermined crystalline orientation with the silicon seed crystal. Then, the silicon seed crystal and the crucible are rotated and slowly pulled up so that the silicon A silicon crystal rod is formed under the seed crystal.
已知於長晶過程中,長晶爐內必須導入惰性氣體以及將爐腔內氣體導出,以達到降溫及排除雜質的目的,習知的長晶爐之氣體是透過長晶爐之爐體上方的入氣口將氣體導入, 以及由長晶爐之下爐體開設一氣體導出口將爐腔內氣體導出,然而此設計僅能將下爐體之氣體導出口附近的氣體排出,對於長晶爐內之坩堝周圍的雜質則不易隨著氣體一同被排出,因此容易造成雜質沉積影響矽晶棒品質,除此之外,此排氣設計也容易使坩堝周圍的氣流紊亂不均,進而導致坩堝散熱不良而影響矽晶棒的晶粒大小均勻度。因此,如何改善長晶爐爐腔內之氣流均勻度並使坩堝周圍的雜質有效排出爐腔是亟待解決的問題。It is known that in the process of crystal growth, inert gas must be introduced into the crystal growth furnace and the gas in the furnace cavity must be discharged to achieve the purpose of cooling and removing impurities. The gas of the conventional crystal growth furnace passes through the upper part of the furnace body of the crystal growth furnace The gas inlet is introduced into the gas, and a gas outlet is opened from the furnace body under the crystal growth furnace to take out the gas in the furnace cavity. However, this design can only discharge the gas near the gas outlet of the lower furnace body. For the crystal growth furnace The impurities around the crucible in the inner crucible are not easy to be discharged with the gas, so it is easy to cause impurities to deposit and affect the quality of the silicon ingot. In addition, this exhaust design is also easy to make the air flow around the crucible turbulent and uneven, which will cause the crucible to dissipate heat. It is undesirable and affects the uniformity of the crystal grain size of the silicon crystal rod. Therefore, how to improve the uniformity of the air flow in the furnace cavity of the crystal growth furnace and effectively discharge the impurities around the crucible out of the furnace cavity is an urgent problem to be solved.
有鑑於此,本發明之目的在於提供一種長晶爐,於能改善長晶爐爐腔內之氣流均勻度並使坩堝周圍的雜質有效排出爐腔。In view of this, the object of the present invention is to provide a crystal growth furnace, which can improve the uniformity of the air flow in the furnace cavity of the crystal growth furnace and effectively discharge the impurities around the crucible from the furnace cavity.
緣以達成上述目的,本發明提供的一種長晶爐,連接一抽氣裝置,該抽氣裝置包含一排氣管,該長晶爐包含一爐體、一坩堝、一上排氣件以及一導流件,該爐體具有一爐腔;該坩堝設置於該爐腔中,該爐腔內具有一入氣通道位於該坩堝上方;該上排氣件設置於該爐腔中,該上排氣件具有相連通的一流道及一出氣口,該流道及該出氣口位於該坩堝之上方,該流道具有一開放側圍繞該入氣通道,該排氣管與該出氣口連通;該導流件與該上排氣件連接且設置於該流道之該開放側,該導流件上具有一第一入氣孔及至少二第二入氣孔,該第一入氣孔設置於遠離該出氣口的一側,定義一縱向參考面通過該第一入氣孔及該出氣口,該導流件能以該縱向參考面而區分為一第一段及一第二段,該至少二第二入氣孔分別設置於該第一段及該第二段,該第一入氣孔之開口面積大於該至少二第二入氣孔之開口面積;透過該抽氣裝置將該爐腔中之氣體分別經該導流件之該第一入氣孔及該至少二第二入氣孔抽至該上排氣件的該流道後,再經由該上排氣件的該出氣口及該排氣管抽出該爐腔。In order to achieve the above-mentioned object, the present invention provides a crystal growth furnace connected to an exhaust device, the exhaust device includes an exhaust pipe, the crystal growth furnace includes a furnace body, a crucible, an upper exhaust and a The flow guide, the furnace body has a furnace cavity; the crucible is arranged in the furnace cavity, and the furnace cavity has an air inlet channel above the crucible; the upper exhaust member is arranged in the furnace cavity, and the upper row The gas element has a connected flow channel and an air outlet, the flow channel and the air outlet are located above the crucible, the flow tool has an open side surrounding the air inlet channel, and the exhaust pipe communicates with the air outlet; the guide The flow element is connected to the upper exhaust element and is arranged on the open side of the flow channel. The flow guide has a first air inlet and at least two second air inlets, and the first air inlet is arranged far away from the air outlet One side of, defines a longitudinal reference plane passing through the first air inlet and the air outlet, the guide piece can be divided into a first section and a second section by the longitudinal reference plane, the at least two second air inlets Respectively disposed in the first section and the second section, the opening area of the first air inlet is larger than the opening area of the at least two second air inlets; the gas in the furnace cavity is respectively passed through the diversion device through the air extraction device After the first air inlet hole and the at least two second air inlet holes of the upper exhaust member are drawn to the flow channel of the upper exhaust member, the furnace cavity is extracted through the air outlet and the exhaust pipe of the upper exhaust member.
本發明之效果在於,透過該導流件之設置及該出氣口之設置位置,能使得該爐腔中之氣體經該第一入氣孔及該至少二第二入氣孔流入該上排氣件之該流道時之流速均勻分布,如此一來,能改善長晶爐爐腔內之氣流均勻度並使坩堝周圍的雜質有效排出爐腔。The effect of the present invention is that through the arrangement of the guide element and the arrangement position of the air outlet, the gas in the furnace cavity can flow into the upper exhaust part through the first air inlet and the at least two second air inlets. The flow rate of the flow channel is evenly distributed, so that the uniformity of the air flow in the crystal growth furnace cavity can be improved and the impurities around the crucible can be effectively discharged from the furnace cavity.
為能更清楚地說明本發明,茲舉數較佳實施例並配合圖式詳細說明如後。請參圖1所示,為本發明第一較佳實施例之長晶爐1,包括一爐體10、一坩堝20、一加熱裝置30、一升降裝置40、一上排氣件50及一導流件60,該爐體10具有一爐腔R,該坩堝20設置於該爐腔R中,用以容置長晶之原料,該加熱裝置30設置於該坩堝20的側邊外圍,用以對該坩堝20加熱,該升降裝置40連接有晶種,用以將晶種垂降至該坩堝20含有液體矽之表面,並伴隨適當之拉離速率緩慢升起晶種以進行長晶製程。In order to explain the present invention more clearly, a few preferred embodiments are listed in detail in conjunction with the drawings as follows. Please refer to FIG. 1, which is the first preferred embodiment of the crystal growth furnace 1 of the present invention, including a
該爐腔R內設置有一熱遮罩70,該熱遮罩70呈錐狀設置於該坩堝20之上方,該爐腔R具有一入氣通道T1位於該坩堝20上方供自該爐腔R外部輸入例如惰氣體之氣體,該熱遮罩70環繞該入氣通道T1設置且該入氣通道T1穿過該熱遮罩70底部之開口。該上排氣件50設置於該爐腔R中,且該上排氣件50沿該爐體10之爐壁環繞設置,該上排氣件50具有相連通的一流道501及一出氣口502,該流道501及該出氣口502位於該坩堝20之上方,該流道501具有一開放側501a圍繞該入氣通道T1,該導流件60與該上排氣件50連接且設置於該流道501之該開放側501a以封閉該開放側501a,該導流件60上具有一個第一入氣孔61及四個第二入氣孔62。該長晶爐1連接一抽氣裝置,該抽氣裝置包含一排氣管80及一抽氣設備,該排氣管80設置於該爐體之上部且位於高於該坩堝20的位置,該排氣管80一端與該出氣口502連通,另一端連通該抽氣設備,藉此,透過該抽氣裝置能使該爐腔R中之氣體分別經該導流件60之該第一入氣孔61及該些第二入氣孔62後抽至該上排氣件50的該流道501,再經由該上排氣件50的該出氣口502及該排氣管80抽出該爐腔外。A
請配合圖1至圖3,進一步說明的是,該第一入氣孔61設置於遠離該出氣口502的一側,定義一縱向參考面S1通過該第一入氣孔61及該出氣口502,該導流件60能以該縱向參考面S1而區分為一第一段601及一第二段602,該些第二入氣孔62以兩個為一組分別設置於該第一段601及該第二段602,且該第一入氣孔61之開口面積大於該些第二入氣孔62之開口面積,如此一來,透過該導流件60、該第一入氣孔61之開口面積大於該些第二入氣孔62之開口面積及該出氣口502設置位置之設計,能使得該爐腔R中之氣體經該第一入氣孔61及該些第二入氣孔62流入該上排氣件50之該流道501時於該流道501中之該第一入氣孔61及該出氣口502處之流速均勻分布並使坩堝20周圍的雜質有效排出爐腔R,除此之外,該些第二入氣孔62之設置能加速排出該爐腔R中之氣體,改善習用長晶爐因單一出氣孔的設置而導致氣體流速分布不均勻的問題。Please cooperate with Figures 1 to 3, it is further explained that the
於本實施例中,第二入氣孔62是以四個為例說明,於其他實施例中,不排除第二入氣孔之數量為兩個、三個、或是四個以上,舉例來說,當第二入氣孔之數量為兩個時,能分別於該第一段及該第二段上設置一個第二入氣孔,而當第二入氣孔之數量為三個時,能於該第一段上設置一個第二入氣孔及該第二段上設置兩個第二入氣孔,同樣能達成上述使得該爐腔R中之氣體流入該上排氣件50之該流道501時之流速均勻分布之效果。In this embodiment, four second
於本實施例中,該流道501為環狀,該出氣口502設置於該流道501之上方,該導流件60為環狀,該導流件60之高度H為50~150mm,較佳者為55~120 mm,該導流件60之厚度T為10~20mm,較佳者為11~18.5 mm,該導流件60之環壁表面積A與該第一入氣孔61及該些第二入氣孔62之開口面積總和之比為10:1~20:1,較佳者為 12:1~17:1。其中定義一橫向參考面S2通過該第一入氣孔61及各該第二入氣孔62,該橫向參考面S2與該第一入氣孔61孔壁之兩側相交於一第一點P1及一第二點P2,該第一點P1及該第二點P2與該導流件60環繞之一中心C之連線的夾角θ1為35度至55度之間,較佳者為37度至45度之間,該橫向參考面S2與各該第二入氣孔62之兩側相交於一第三點P3及一第四點P4,該第三點P3及該第四點P4與該中心C之連線的夾角θ2為3度至30度之間,較佳者為3度至25度之間,於本實施例中,各該第二入氣孔62之該第三點P3及該第四點P4與該中心C之連線的夾角θ2為3度至10度之間之小型孔622。其中兩相鄰的該第一入氣孔61及一該第二入氣孔62於靠近彼此的一側與該橫向參考面S2分別相交於一第五點P5及一第六點P6,以及兩相鄰的二該第二入氣孔62於靠近彼此的一側與該橫向參考面S2也分別相交於一第五點P5及一第六點P6,該第五點P5及該第六點P6與該中心C連線的夾角θ3為20度至55度之間,較佳者為25度至25.5度之間。透過上述夾角θ1, θ2, θ3之設置,能定義該第一入氣孔61及該些第二入氣孔62之大小及排列位置,進而達到使氣體流速分布均勻之最佳配置。In this embodiment, the
於本實施例中,該些第二入氣孔62是以四個開口面積相等的小型孔622為例說明,實務上,該些第二入氣孔62能滿足該至少二第二入氣孔中之至少一者之開口面積相異於該至少二第二入氣孔中之另一者之開口面積之條件,舉例來說,該些第二入氣孔62也能是包含複數個中型孔621及複數個小型孔622,例如圖4所示之一個第一入氣孔61、兩個中型孔621及兩個小型孔622,其中中型孔621之開口面積大於小型孔622之開口面積,小型孔622之該第三點P3及該第四點P4與該中心C之連線的夾角θ2為3度至10度之間,中型孔621之該第三點P3及該第四點P4與該中心C之連線的夾角θ2為15度至30度之間,且每個小型孔622間之開口面積也可以是不同大小,每個中型孔621間之開口面積也可以是不同大小。再說明的是,該些第二入氣孔62也能是包含複數個中型孔621,例如圖5所示之一個第一入氣孔61及六個中型孔621,請續配合圖7,其中圖7為對照如圖2所示之該第一入氣孔61及該些第二入氣孔62之大小及排列位置之氣體流速模擬照片,由圖7之模擬結果可見,氣體之流速於該流道501中之該第一入氣孔61及該出氣口502處其氣體流速差異小,且氣體於該流道501中之流速能保持均勻分布。In this embodiment, the second
請配合圖6,為本發明第二較佳實施例之長晶爐2,該長晶爐2具有與上述第一較佳實施例之長晶爐1大致相同之結構,於此不再贅述,不同的是,該長晶爐2包含一下排氣通道T2,設置於該爐腔R中並位於該坩堝20之下方,該下排氣通道T2連通一外部抽氣裝置,藉此,透過該外部抽氣裝置能將該爐腔R中之氣體自該下排氣通道T2排出。除此之外,本發明第二較佳實施例之長晶爐2之該導流件60包含複數個擋板90,該些擋板90可受控制地遮蔽或開啟該第一入氣孔61及該些第二入氣孔62之開口,當該第一入氣孔61或各該第二入氣孔62被各該擋板90遮蔽時,該爐腔R內之氣體無法自被擋板90遮蔽之第一入氣孔61或第二入氣孔62流入該流道501中,進而能調整內部氣流之流向。Please cooperate with FIG. 6, which shows the
綜上所述,透過本發明之該導流件60、該第一入氣孔61之開口面積大於該些第二入氣孔62之開口面積及該出氣口502設置位置之設計,能使得該爐腔R中之氣體經該第一入氣孔61及該些第二入氣孔62流入該上排氣件50之該流道501時之流速均勻分布並使該坩堝20周圍的雜質有效排出該爐腔R,以改善習用長晶爐因單一出氣孔的設置而導致氣體流速分布不均勻的問題。In summary, the design of the opening area of the
以上所述僅為本發明較佳可行實施例而已,舉凡應用本發明說明書及申請專利範圍所為之等效變化,理應包含在本發明之專利範圍內。The above are only the preferred and feasible embodiments of the present invention. Any equivalent changes made by applying the specification of the present invention and the scope of the patent application should be included in the patent scope of the present invention.
[本發明]
1,2:長晶爐
10:爐體
20:坩堝
30:加熱裝置
40升降裝置
50:上排氣件
501:流道
501a:開放側
502:出氣口
60:導流件
601:第一段
602:第二段
61:第一入氣孔
62:第二入氣孔
621:中型孔
622:小型孔
70:熱遮罩
80:排氣管
90:擋板
C:中心
H:高度
P1:第一點
P2:第二點
P3:第三點
P4:第四點
P5:第五點
P6:第六點
R:爐腔
S1:縱向參考面
S2:橫向參考面
T1:入氣通道
T2:下排氣通道
T:厚度
A:表面積[this invention]
1,2: Crystal growth furnace
10: Furnace
20: Crucible
30:
圖1為本發明第一較佳實施例之長晶爐的示意圖。 圖2為上述較佳實施例之長晶爐於橫向參考面上的剖視示意圖。 圖3為上述較佳實施例之導流件的立體圖。 圖4為另一較佳實施例於橫向參考面上的剖視示意圖。 圖5為另一較佳實施例於橫向參考面上的剖視示意圖。 圖6為本發明第二較佳實施例之長晶爐的示意圖。 圖7為本發明第一較佳實施例之氣體流速模擬照片。 Fig. 1 is a schematic diagram of a crystal growth furnace according to a first preferred embodiment of the present invention. 2 is a schematic cross-sectional view of the crystal growth furnace of the above preferred embodiment on a transverse reference plane. Fig. 3 is a perspective view of the air guide of the above-mentioned preferred embodiment. 4 is a schematic cross-sectional view of another preferred embodiment on a transverse reference plane. Fig. 5 is a schematic cross-sectional view of another preferred embodiment on a transverse reference plane. Fig. 6 is a schematic diagram of a crystal growth furnace according to a second preferred embodiment of the present invention. Fig. 7 is a simulation photo of the gas flow rate of the first preferred embodiment of the present invention.
1:長晶爐 1: Crystal growth furnace
10:爐體 10: Furnace
20:坩堝 20: Crucible
30:加熱裝置 30: heating device
40:升降裝置 40: Lifting device
50:上排氣件 50: Upper exhaust
501:流道 501: runner
501a:開放側 501a: open side
502:出氣口 502: air outlet
60:導流件 60: deflector
61:第一入氣孔 61: The first air inlet
62:第二入氣孔 62: second air inlet
70:熱遮罩 70: Heat mask
80:排氣管 80: Exhaust pipe
H:高度 H: height
R:爐腔 R: Oven cavity
S2:橫向參考面 S2: Horizontal reference plane
T1:入氣通道 T1: Inlet channel
Claims (10)
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JP2022033775A JP7470143B2 (en) | 2021-04-16 | 2022-03-04 | Crystal Growth Furnace |
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CN115233291A (en) * | 2022-06-29 | 2022-10-25 | 徐州鑫晶半导体科技有限公司 | Flow guide assembly, crystal growth furnace with flow guide assembly and crystal growth method |
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TWM473400U (en) * | 2013-11-15 | 2014-03-01 | Eversol Corp | Exhaust mechanism of crystal growth furnace |
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CN115233291A (en) * | 2022-06-29 | 2022-10-25 | 徐州鑫晶半导体科技有限公司 | Flow guide assembly, crystal growth furnace with flow guide assembly and crystal growth method |
CN115233291B (en) * | 2022-06-29 | 2023-08-04 | 中环领先(徐州)半导体材料有限公司 | Flow guide assembly, crystal growth furnace with flow guide assembly and crystal growth method |
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TW202242212A (en) | 2022-11-01 |
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