TWI747464B - Method and equipment for hole position detection based on upper and lower drilling circuit boards - Google Patents

Method and equipment for hole position detection based on upper and lower drilling circuit boards Download PDF

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TWI747464B
TWI747464B TW109129512A TW109129512A TWI747464B TW I747464 B TWI747464 B TW I747464B TW 109129512 A TW109129512 A TW 109129512A TW 109129512 A TW109129512 A TW 109129512A TW I747464 B TWI747464 B TW I747464B
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circuit board
hole
hole position
target circuit
circle
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TW109129512A
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Chinese (zh)
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TW202109353A (en
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胡冰峰
張志軍
陳朋飛
郭勇祥
楊紅軍
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大陸商蘇州康代智能科技股份有限公司
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/08Measuring arrangements characterised by the use of optical techniques for measuring diameters
    • G01B11/12Measuring arrangements characterised by the use of optical techniques for measuring diameters internal diameters
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/22Measuring arrangements characterised by the use of optical techniques for measuring depth

Abstract

Method and inspection equipment for hole position detection based on upper and lower drilling circuit boards, the method includes: judging whether the hole position is qualified according to a deviation of the upper and lower drilling holes and the depth of the holes; the inspection equipment provides an upper and lower light source supplementary light environment for the circuit board imaging, judging whether the hole position is penetrated, the deviation degree is qualified, and the hole depth is qualified according to front imaging information of the circuit board. The present disclosure comprehensively detects the hole quality of the circuit board, even if the top hole or bottom hole is inclined or the depth of the top hole and the bottom hole are inconsistent, the quality of the hole position of the circuit board can also be accurately measured.

Description

基於上下鉆孔電路板之孔位檢測方法及檢測設備Hole position detection method and detection equipment based on upper and lower drilling circuit boards

本發明涉及電路板孔位檢測領域,尤其涉及一種基於上下鉆孔電路板之孔位檢測方法及檢測設備。 The invention relates to the field of circuit board hole position detection, in particular to a hole position detection method and detection equipment based on upper and lower drilling circuit boards.

現如今在高度發展之電子工業時代,印刷電路板(Printed Circuit Board,簡稱PCB)已成為計算機、電子通信等產品上必不可缺之重要部件之一。PCB鉆孔是印刷電路板中比較靠前之一道工序,鉆孔之質量好壞直接影響到PCB板後續之幾十道工序,因此如何控制好鉆孔質量是現在PCB電子廠商重點關註點。 Nowadays, in the era of the highly developed electronics industry, the printed circuit board (PCB) has become one of the indispensable and important components in products such as computers and electronic communications. PCB drilling is one of the most advanced processes in printed circuit boards. The quality of the drilling directly affects the dozens of subsequent processes on the PCB. Therefore, how to control the quality of the drilling is now the focus of PCB electronics manufacturers.

現有PCB鉆孔主要分為機械式鉆孔以及激光鉆孔,由於PCB電路板要求精度越來越高,且厚度越來越薄,現有高精度之PCB電路板主要使用激光鉆孔,其主要分為通孔、盲孔等,為了得到更好之孔徑要求,在加工通孔時需要從上下兩面分別使用激光鉆孔,由於無法確保上下鉆之孔完全正對,會出現上面孔與下面 孔偏移之現象,當上下孔之間之偏移量超過可接受範圍時,該PCB電路板就需要檢修或者報廢處理。 The existing PCB drilling is mainly divided into mechanical drilling and laser drilling. As PCB circuit boards require higher precision and thinner thickness, the existing high-precision PCB circuit boards mainly use laser drilling. For through holes, blind holes, etc., in order to obtain better aperture requirements, it is necessary to use laser drilling from the upper and lower sides when processing the through holes. Since it is impossible to ensure that the upper and lower drilling holes are completely aligned, the upper and lower holes will appear. The phenomenon of hole offset, when the offset between the upper and lower holes exceeds the acceptable range, the PCB circuit board needs to be repaired or scrapped.

公開號為CN106257232B,名稱為印刷電路板之孔位信息之檢測方法及檢測設備之專利文獻中提及了一種可以檢測上下孔位偏移量之方法,如圖7所示,但是該方法僅適用於上面孔完全垂直於PCB電路板且頂孔與底孔深度一致(各占電路板厚度之二分之一)之情況,一旦所述上面孔或者下面孔發生鉆孔傾斜(同一個錐形孔之上圓周和下圓周非同心設置)或者頂孔與底孔鉆孔深度不一致時(如圖4和圖5所示),計算結果會出現偏差,從而影響對頂部孔和底部孔之間真實偏移量之判斷。事實上,很難確保上下鉆孔深度完全一致,而這一定會影響以上這個現有技術中孔位信息檢測精度:以圖4和圖5中同軸孔為例,按照該現有技術中之檢測方法可以得到第一孔及所述第二孔之孔位偏移量d之孔位信息:d=D1-(2*D13S)-D3,其結果是不為零(圖4中為大於0,圖5中為小於0),而實際上,圖4和圖5中頂孔和底孔之圓心是同軸,即偏移量實際為0,因此,現有技術中缺少一種精準檢測孔位合格與否之方法和設備。 The publication number is CN106257232B, and the patent document titled “Detection Method of Hole Position Information and Inspection Equipment for Printed Circuit Boards” mentions a method that can detect the offset of upper and lower hole positions, as shown in Figure 7, but this method is only applicable When the upper hole is completely perpendicular to the PCB circuit board and the depth of the top hole and the bottom hole are the same (each occupies one-half of the thickness of the circuit board), once the upper hole or the lower hole is inclined (the same tapered hole) When the upper and lower circumferences are not concentrically arranged) or the depth of the top hole and the bottom hole are inconsistent (as shown in Figure 4 and Figure 5), the calculation result will be deviated, which will affect the true deviation between the top hole and the bottom hole. Judgment of displacement. In fact, it is difficult to ensure that the upper and lower drilling depths are exactly the same, and this will definitely affect the detection accuracy of the hole position information in the above prior art: take the coaxial hole in Figure 4 and Figure 5 as an example, according to the detection method in the prior art Obtain the hole position information of the hole position offset d of the first hole and the second hole: d=D1-(2*D13S)-D3, the result is not zero (more than 0 in Figure 4, Figure 5 The middle is less than 0). In fact, the centers of the top and bottom holes in Figures 4 and 5 are coaxial, that is, the offset is actually 0. Therefore, the prior art lacks a method for accurately detecting whether the hole position is qualified or not. And equipment.

為瞭解決現有技術之問題,本發明提供了一種基於上下鉆孔電路板之孔位檢測方法及檢測設備,無論頂部孔或者底部孔是否發生鉆孔傾斜,均可以確保頂部孔和底部孔之間偏移量之檢 測精度,所述技術方案如下: In order to solve the problems of the prior art, the present invention provides a hole position detection method and detection device based on the upper and lower drilling circuit boards, which can ensure the gap between the top hole and the bottom hole regardless of whether the top hole or the bottom hole is drilled or not. Offset check The technical solution is as follows:

一方面,本發明提供了一種基於上下鉆孔電路板之孔位檢測方法,用於對完成上下鉆孔之目標電路板進行孔位偏移檢測,所述孔位檢測方法包括以下步驟:步驟S11、在補光狀態下,獲取目標電路板之正面圖像;步驟S12、對所述正面圖像進行分析,若所述正面圖像中包括兩個圓,則執行步驟S13;若所述正面圖像中包括一個完整圓及兩條相交圓弧,則執行步驟S14和步驟S15;若所述正面圖像不滿足上述條件,則判定所述目標電路板之孔位不合格;步驟S13、計算所述正面圖像中兩個圓之圓心距離,若所述兩個圓之圓心距離小於或等於預設之第一距離閾值,則判定所述目標電路板之孔位對準度合格,否則判定所述目標電路板之孔位不合格;步驟S14、確定第一圓弧所在圓之第一圓心及第二圓弧所在圓之第二圓心;步驟S15、若第一圓心與所述完整圓之圓心之間距離及第二圓心與所述完整圓之圓心之間之距離中之較小距離小於或等於預設之第一距離閾值,且其之中之較大距離小於或等於預設之第二距離閾值,其中,所述第一距離閾值小於或等於第二距離閾值,則判定所述目標電路板之孔位對準度合格,否則判定所述目標電路板之孔位不合格。 On the one hand, the present invention provides a hole position detection method based on up and down drilling of a circuit board, which is used to perform hole position offset detection on a target circuit board that has completed up and down drilling. The hole position detection method includes the following steps: step S11 , Under the light supplement state, obtain the front image of the target circuit board; step S12, analyze the front image, if the front image includes two circles, then perform step S13; if the front image If the image includes a complete circle and two intersecting arcs, step S14 and step S15 are executed; if the front image does not meet the above conditions, it is determined that the hole position of the target circuit board is unqualified; step S13, the calculation station The distance between the centers of the two circles in the front image. If the distance between the centers of the two circles is less than or equal to the preset first distance threshold, it is determined that the alignment of the holes of the target circuit board is qualified, otherwise it is determined that the The hole position of the target circuit board is unqualified; step S14, determine the first center of the circle where the first arc is located and the second center of the circle where the second arc is located; step S15, if the first center of the circle is the center of the complete circle The smaller of the distance between the center and the distance between the center of the second circle and the center of the complete circle is less than or equal to the preset first distance threshold, and the greater distance is less than or equal to the preset second The distance threshold, where the first distance threshold is less than or equal to the second distance threshold, the hole alignment of the target circuit board is determined to be qualified, otherwise the hole position of the target circuit board is determined to be unqualified.

進一步地,步驟S15中判定所述目標電路板之孔位對準 度合格之後還包括:計算所述第一圓弧所在圓之第一半徑及第二圓弧所在圓之第二半徑,若所述第一半徑與第二半徑中之較小半徑與所述完整圓之半徑之比值大於或等於預設之比例閾值,則所述目標電路板之孔位合格,否則所述目標電路板之孔位不合格。 Further, it is determined in step S15 that the hole positions of the target circuit board are aligned After the degree is qualified, it also includes: calculating the first radius of the circle where the first arc is located and the second radius of the circle where the second arc is located, if the smaller of the first radius and the second radius is the same as the complete If the ratio of the radius of the circle is greater than or equal to the preset ratio threshold, the hole position of the target circuit board is qualified, otherwise the hole position of the target circuit board is unqualified.

進一步地,步驟S13中判定所述目標電路板之孔位對準度合格之後還包括:計算所述兩個圓之半徑,若較小半徑與較大半徑之比值大於或等於預設之比例閾值,則所述目標電路板之孔位合格,否則所述目標電路板之孔位不合格。 Further, after determining that the alignment of the holes of the target circuit board is qualified in step S13, the method further includes: calculating the radii of the two circles, if the ratio of the smaller radius to the larger radius is greater than or equal to a preset ratio threshold , The hole position of the target circuit board is qualified, otherwise the hole position of the target circuit board is unqualified.

進一步地,步驟S14中,在所述第一圓弧和第二圓弧上分別各取至少三個點,通過坐標法或者中垂線法確定第一圓弧所在圓之第一圓心及第二圓弧所在圓之第二圓心。 Further, in step S14, at least three points are respectively taken on the first arc and the second arc, and the first center and the second circle of the circle where the first arc is located are determined by the coordinate method or the perpendicular method. The second center of the circle where the arc is located.

進一步地,步驟S11中之補光狀態包括:同時打開所述目標電路板上方之上光源及所述目標電路板下方之背光源。 Further, the light supplement state in step S11 includes: simultaneously turning on the light source above the target circuit board and the backlight source below the target circuit board.

進一步地,根據用於獲取目標電路板正面圖像之攝像參數,得到正面圖像與實際目標電路板之尺寸比例,並根據所述尺寸比例預設置所述第一距離閾值和第二距離閾值或者根據所述尺寸比例將圖像上測量之距離數據轉化為實際電路板上之距離數據。 Further, according to the camera parameters used to obtain the front image of the target circuit board, the size ratio of the front image to the actual target circuit board is obtained, and the first distance threshold and the second distance threshold are preset according to the size ratio, or According to the size ratio, the distance data measured on the image is converted into the distance data on the actual circuit board.

另一方面,本發明提供了另一種基於上下鉆孔電路板之孔位檢測方法,用於對完成上下鉆孔之目標電路板進行孔位偏移檢測,所述孔位檢測方法包括以下步驟: 步驟S21、在補光狀態下,獲取目標電路板之正面圖像;步驟S22、對所述正面圖像進行分析,若所述正面圖像中包括兩個圓,則執行步驟S23;若所述正面圖像中包括一個完整圓及兩條相交圓弧,則執行步驟S24和步驟S25;若所述正面圖像不滿足上述條件,則判定所述目標電路板之孔位不合格;步驟S23、計算所述兩個圓之半徑,若較小半徑與較大半徑之比值大於或等於預設之比例閾值,則判定所述目標電路板之孔位深度合格,否則所述目標電路板之孔位深度不合格;步驟S24、確定第一圓弧所在圓之第一半徑及第二圓弧所在圓之第二半徑;步驟S25、若第一半徑與第二半徑中之較小半徑與所述完整圓之半徑之比值大於或等於預設之比例閾值,則判定所述目標電路板之孔位深度合格,否則所述目標電路板之孔位不合格。 On the other hand, the present invention provides another hole position detection method based on upper and lower drilling circuit boards, which is used to perform hole position offset detection on the target circuit board for which the upper and lower drilling holes are completed. The hole position detection method includes the following steps: Step S21: Acquire the front image of the target circuit board in the light-filled state; Step S22: Analyze the front image, and if the front image includes two circles, perform step S23; if the If the front image includes a complete circle and two intersecting arcs, step S24 and step S25 are executed; if the front image does not meet the above conditions, it is determined that the hole position of the target circuit board is unqualified; step S23, Calculate the radii of the two circles. If the ratio of the smaller radius to the larger radius is greater than or equal to the preset ratio threshold, the hole depth of the target circuit board is determined to be qualified, otherwise the hole position of the target circuit board The depth is unqualified; step S24, determine the first radius of the circle where the first arc is located and the second radius of the circle where the second arc is located; step S25, if the smaller of the first radius and the second radius is the same as the complete If the ratio of the radius of the circle is greater than or equal to the preset ratio threshold, it is determined that the hole depth of the target circuit board is qualified, otherwise the hole position of the target circuit board is unqualified.

進一步地,步驟S25中判定所述目標電路板之孔位深度合格之後還包括:確定第一圓弧所在圓之第一圓心及第二圓弧所在圓之第二圓心;若第一圓心與所述完整圓之圓心之間之距離及第二圓心與所述完整圓之圓心之間之距離中之較小距離小於或等於預設之第一距離閾值,且其之中之較大距離小於或等於預設之第二距離閾值,其中,所述第一距離閾值小於或等於第二距離閾值,則判定所述目標電路板之孔位合格,否則判定所述目標電路板之孔位不 合格。 Further, after determining that the hole depth of the target circuit board is qualified in step S25, the method further includes: determining the first center of the circle where the first arc is located and the second center of the circle where the second arc is located; The smaller of the distance between the center of the complete circle and the distance between the second center of the complete circle and the center of the complete circle is less than or equal to the preset first distance threshold, and the greater distance is less than or Equal to the preset second distance threshold, where the first distance threshold is less than or equal to the second distance threshold, it is determined that the hole position of the target circuit board is qualified, otherwise it is determined that the hole position of the target circuit board is not qualified.

進一步地,步驟S23中判定所述目標電路板之孔位深度合格之後還包括:計算所述正面圖像中兩個圓之圓心距離,若所述兩個圓之圓心距離小於或等於預設之第一距離閾值,則判定所述目標電路板之孔位合格,否則判定所述目標電路板之孔位不合格。 Further, after determining that the hole depth of the target circuit board is qualified in step S23, the method further includes: calculating the distance between the centers of the two circles in the front image, if the distance between the centers of the two circles is less than or equal to a preset value For the first distance threshold, it is judged that the hole position of the target circuit board is qualified, otherwise it is judged that the hole position of the target circuit board is unqualified.

再一方面,本發明提供了一種基於上下鉆孔電路板之孔位檢測設備,包括背光裝置、設置在所述背光裝置上方之多個上光源和圖像採集裝置,所述多個上光源發射之光線在所述背光裝置上進行匯聚,所述圖像採集裝置設置在所述上光源之光線匯聚處之上方;所述背光裝置包括多個受獨立控制之背光板,每個背光板上之背光源能夠獨立打開或者關閉,多個所述背光板拼接設置而形成多種不同尺寸之矩形背光區,所述孔位檢測設備利用如上所述之孔位檢測方法對電路板進行孔位偏移檢測。 In yet another aspect, the present invention provides a hole position detection device based on up and down drilling circuit boards, which includes a backlight device, a plurality of upper light sources and an image acquisition device arranged above the backlight device, and the plurality of upper light sources emit The light is condensed on the backlight device, and the image acquisition device is arranged above the light converging point of the upper light source; the backlight device includes a plurality of independently controlled backlight panels, and each backlight panel has a The backlight source can be turned on or off independently, a plurality of the backlight boards are spliced and arranged to form a rectangular backlight area of different sizes, and the hole position detection device uses the hole position detection method as described above to detect the hole position deviation of the circuit board .

本發明具有如下有益效果: The present invention has the following beneficial effects:

僅需從待檢電路板的上方對其採集圖像,通過圖像算法即可得到上下鉆孔電路板的孔位質量的檢測結果;既檢測頂孔與底孔之間之偏移度,又檢測孔深度,全面檢測孔位質量;無論頂孔、底孔是否發生鉆孔傾斜,都能確保孔位質量檢測之準確性;無論頂孔、底孔之鉆孔深度是否一致,都能確保孔位質量 檢測之準確性;能夠根據PCB板材之大小確定背光板所需打開區域,關閉不需要之背光區光源,節約能源且避免強光對人眼之傷害。 Only need to collect the image from the top of the circuit board to be inspected, and the inspection result of the hole position quality of the upper and lower drilled circuit boards can be obtained through the image algorithm; it not only detects the deviation between the top hole and the bottom hole, but also Inspect the depth of the hole and comprehensively inspect the quality of the hole; whether the top hole or bottom hole is inclined, the accuracy of the hole quality detection can be ensured; whether the drilling depth of the top hole and the bottom hole are the same, the hole can be guaranteed Bit quality Accuracy of detection: It can determine the required opening area of the backlight board according to the size of the PCB board, and turn off the light source in the backlight area that is not needed, saving energy and avoiding the damage to human eyes by strong light.

1:背光裝置 1: Backlight device

11:背光板 11: Backlight board

12:散光層 12: Astigmatism layer

2:上光源 2: Upper light source

3:圖像採集裝置 3: Image acquisition device

4:電路板 4: Circuit board

5:壓緊裝置 5: Compression device

6:菲林板 6: Film board

S11、S12、S13、S14、S15、S21、S22、S23、S24、S25、S261、S262:步驟 S11, S12, S13, S14, S15, S21, S22, S23, S24, S25, S261, S262: steps

被視為本發明之主題在說明書之結論部分中被特別指出並清楚地主張權利。然而,當結合附圖一起參閱時,通過參考以下詳細描述可以最佳地理解本發明之組織、操作方法,以及主題、特徵和優點。 The subject matter deemed to be the present invention is specifically pointed out and clearly claimed in the concluding part of the specification. However, when referred to in conjunction with the accompanying drawings, the organization, operation method, subject, features, and advantages of the present invention can be best understood by referring to the following detailed description.

圖1是本發明實施例提供之第一種基於上下鉆孔電路板之孔位檢測方法之流程圖;圖2是本發明實施例提供之用於檢測電路板上下鉆孔之孔位檢測設備之結構示意圖;圖3是本發明實施例提供之第二種基於上下鉆孔電路板之孔位檢測方法;圖4是本發明實施例提供之底孔深度大於頂孔深度情況下電路板之剖視圖;圖5是本發明實施例提供之頂孔深度大於底孔深度情況下電路板之剖視圖;圖6是本發明實施例提供之包括一個完整圓與兩條相交弧線之正面圖像示意圖;圖7是現有技術中孔位檢測方法之計算原理圖; 圖8是本發明實施例提供之具有散光層之孔位檢測設備之結構示意圖;圖9是本發明實施例提供之具有L形背光板之背光板拼接示意圖;圖10是本發明實施例提供之具有回字形背光板之背光板拼接示意圖。 Fig. 1 is a flowchart of the first hole position detection method based on the upper and lower drilling circuit board provided by the embodiment of the present invention; Fig. 2 is the hole position detection equipment for detecting the upper and lower holes of the circuit board provided by the embodiment of the present invention Schematic diagram of the structure; FIG. 3 is a second hole detection method based on the upper and lower holes of the circuit board provided by the embodiment of the present invention; 5 is a cross-sectional view of the circuit board when the depth of the top hole is greater than the depth of the bottom hole according to an embodiment of the present invention; FIG. 6 is a schematic diagram of a front image including a complete circle and two intersecting arcs according to an embodiment of the present invention; The calculation principle diagram of the hole position detection method in the prior art; Fig. 8 is a schematic structural diagram of a hole position detection device with a light-scattering layer provided by an embodiment of the present invention; Fig. 9 is a schematic diagram of a splicing backlight plate with an L-shaped backlight plate provided by an embodiment of the present invention; Fig. 10 is provided by an embodiment of the present invention Schematic diagram of the splicing of backlight panels with back-shaped backlight panels.

在以下詳細描述中,闡述了許多具體細節以便提供對本發明之透徹理解。然而,本領域技術人員將理解,可以在沒有這些具體細節之情況下實踐本發明。在其他情況下,沒有詳細描述衆所周知之方法,過程和組件,以免模糊本發明。 In the following detailed description, many specific details are set forth in order to provide a thorough understanding of the present invention. However, those skilled in the art will understand that the present invention can be practiced without these specific details. In other cases, well-known methods, procedures and components have not been described in detail so as not to obscure the present invention.

被視為本發明之主題在說明書之結論部分中被特別指出並清楚地主張權利。然而,當結合附圖一起參閱時,通過參考以下詳細描述可以最佳地理解本發明之組織、操作方法,以及主題、特徵和優點。 The subject matter deemed to be the present invention is specifically pointed out and clearly claimed in the concluding part of the specification. However, when referred to in conjunction with the accompanying drawings, the organization, operation method, subject, features, and advantages of the present invention can be best understood by referring to the following detailed description.

應當理解,為了說明之簡單和清楚,圖中所示之元件不一定按比例繪制。例如,為了清楚起見,一些元件之尺寸可能相對於其他元件被放大。 It should be understood that, for simplicity and clarity of description, the elements shown in the figures are not necessarily drawn to scale. For example, for clarity, the size of some components may be exaggerated relative to other components.

由於本發明之說明性實施例在很大程度上可使用本領域技術人員熟知之電子元件和電路來實施,如上文所述,在認為必要之範圍之外,不會對細節作更大之解釋,以便理解和體會本發明之 基本概念,以免混淆或分散本發明之教導。 Since the illustrative embodiments of the present invention can be implemented using electronic components and circuits well known to those skilled in the art to a large extent, as described above, the details will not be explained in greater detail outside the scope deemed necessary , In order to understand and appreciate the present invention Basic concepts, so as not to confuse or distract the teaching of the present invention.

在電路板上進行鉆孔得到之錐形孔,即越往下鉆,孔下圓周越小。本發明提供之基於上下鉆孔電路板之孔位檢測方法既檢測上下孔之間之偏移度,又檢測上下孔之深度,即即使上下孔為同軸設置,若上孔鉆得很深,下孔鉆得很淺,這樣之孔位也是不合格之;反之,即使上下孔位之深度均為電路板厚度之一半,若兩孔圓心偏移過多,這樣之孔位即為不合格,這樣之電路板需要檢修。 The tapered hole obtained by drilling the circuit board, that is, the lower the hole is, the smaller the circumference of the hole. The hole position detection method based on the upper and lower drilling circuit board provided by the present invention not only detects the deviation between the upper and lower holes, but also detects the depth of the upper and lower holes. If the hole is drilled very shallowly, the hole position is also unqualified; on the contrary, even if the depth of the upper and lower holes is half the thickness of the circuit board, if the center of the two holes deviates too much, the hole position in this way is unqualified. The circuit board needs to be overhauled.

在本發明之一個實施例中,提供了一種基於上下鉆孔電路板之孔位檢測方法,用於對完成上下鉆孔之目標電路板進行孔位偏移檢測,先檢測孔位偏移情況,後檢測孔位深度,參見圖1,所述孔位檢測方法包括以下步驟: In one embodiment of the present invention, a hole position detection method based on upper and lower drilling circuit boards is provided, which is used to perform hole position offset detection on the target circuit board for which the upper and lower drilling holes are completed. The hole position offset is first detected. After detecting the depth of the hole position, referring to Fig. 1, the method for detecting the hole position includes the following steps:

步驟S11、在補光狀態下,獲取目標電路板之正面圖像。 Step S11: Obtain the front image of the target circuit board in the light supplement state.

將目標電路板放置在如圖2和圖8所示之孔位檢測設備上,所述孔位檢測設備包括背光裝置1、設置在所述背光裝置1上方之多個上光源2和圖像採集裝置3,所述多個上光源2發射之光線在所述背光裝置1上進行匯聚,所述圖像採集裝置3設置在所述上光源2之光線匯聚處之上方,所述圖像採集裝置3優選為電荷耦合裝置(Charge-Coupled Device,CCD)相機。 Place the target circuit board on the hole position detection equipment shown in Figures 2 and 8. The hole position detection equipment includes a backlight device 1, a plurality of upper light sources 2 arranged above the backlight device 1, and image capture Device 3, the light emitted by the plurality of upper light sources 2 is converged on the backlight device 1, the image acquisition device 3 is arranged above the light converging point of the upper light source 2, the image acquisition device 3 is preferably a Charge-Coupled Device (CCD) camera.

如圖9和10所示,所述背光裝置1包括多個受獨立控制之背光板11,每個背光板11上之背光源能夠獨立打開或者關閉,多個所述背光板11拼接設置而形成多種不同尺寸之矩形背光區,使得用戶可以根據實際目標電路板之尺寸靈活選擇打開背光板11 之數量,實現節能之目的。 As shown in Figures 9 and 10, the backlight device 1 includes a plurality of independently controlled backlight panels 11, and the backlight source on each backlight panel 11 can be independently turned on or off, and a plurality of the backlight panels 11 are spliced and formed. A variety of rectangular backlight areas of different sizes, allowing users to flexibly choose to turn on the backlight board according to the actual target circuit board size 11 To achieve the purpose of energy saving.

在本發明之一個優選實施例中,所述背光裝置1還包括設置在所述背光板11上之散光層12,所述散光層12托載待檢測之電路板4,如圖8所示,所述散光層12優選為平面度要求達到0.05mm之光學玻璃層。所述散光層12保證了背光板11出來之光照射在每個被測孔上面之一致性,不會出現黑點、亮點等情況,保證檢測之孔位信息之真實性。 In a preferred embodiment of the present invention, the backlight device 1 further includes an astigmatism layer 12 arranged on the backlight plate 11, and the astigmatism layer 12 supports the circuit board 4 to be inspected, as shown in FIG. 8, The light scattering layer 12 is preferably an optical glass layer with a flatness requirement of 0.05 mm. The astigmatism layer 12 ensures the consistency of the light from the backlight 11 irradiating on each hole to be tested, and there will be no black spots, bright spots, etc., and the authenticity of the hole position information to be detected.

如圖2或圖8所示,所述多個上光源2為線性光源,所述上光源2之個數為三個或者三個以上,所述多個上光源2在所述背光裝置1上之光線入射角度相同(優選地,每個上光源2能夠單獨調節光線之射出方向),所述多個上光源2之光源亮度可調,保證將孔位之信息正確之反饋到CCD相機中。 As shown in FIG. 2 or FIG. 8, the plurality of upper light sources 2 are linear light sources, the number of the upper light sources 2 is three or more, and the plurality of upper light sources 2 are on the backlight device 1. The light incident angle is the same (preferably, each upper light source 2 can independently adjust the direction of light emission), and the light source brightness of the multiple upper light sources 2 is adjustable to ensure that the hole position information is correctly fed back to the CCD camera.

可選地,所述多個上光源2能夠同步平面移動,和/或所述背光裝置1能夠平面移動,總之,所述上光源2與背光裝置1之間能夠發生相對移動。比如:在檢測之前,將已經鉆好孔之PCB電路板4放置在背光板11(更優選地放置在散光層12)上面,根據PCB電路板4之大小,調節背光源相對應之區域尺寸,並利用壓緊裝置5將待檢測之PCB電路板4壓緊在背光裝置1上面,然後調節移動上光源2或者移動背光裝置1(背光裝置1帶著電路板4一起移動),有可能地還需要調節上光源2與背光裝置1之間之高度距離,直至上光源2發射之光線之匯聚處位於所述壓緊裝置5上對應於電路板4之孔位之區域(若沒有壓緊裝置5,則上光源 2發射之光線直接匯聚於所述電路板4之孔位處)。所述壓緊裝置5優選為玻璃,從而不會影響圖像採集裝置3採集圖像。 Optionally, the plurality of upper light sources 2 can simultaneously move in a plane, and/or the backlight device 1 can move in a plane. In short, the upper light source 2 and the backlight device 1 can move relative to each other. For example, before the inspection, the PCB circuit board 4 with the drilled holes is placed on the backlight board 11 (more preferably on the astigmatism layer 12), and the area size corresponding to the backlight source is adjusted according to the size of the PCB circuit board 4. And use the pressing device 5 to press the PCB circuit board 4 to be tested on the backlight device 1, and then adjust and move the upper light source 2 or move the backlight device 1 (the backlight device 1 moves with the circuit board 4), possibly It is necessary to adjust the height distance between the upper light source 2 and the backlight device 1 until the convergence of the light emitted by the upper light source 2 is located in the area corresponding to the hole position of the circuit board 4 on the pressing device 5 (if there is no pressing device 5 , Then the light source 2 The emitted light is directly concentrated at the hole position of the circuit board 4). The pressing device 5 is preferably glass, so as not to affect the image acquisition by the image acquisition device 3.

CCD相機通過採集PCB板上面之孔位之信息後,檢測設備從而可以記錄孔位圖片,並標識出每個孔位之坐標信息,為後續之判定孔之質量做準備。 After the CCD camera collects the hole position information on the PCB board, the inspection equipment can record the hole position picture and mark the coordinate information of each hole position in preparation for the subsequent determination of the hole quality.

如上所述,所述多個所述背光板11拼接設置可以形成多種不同尺寸之矩形背光區,其實施方式包括但不限定於以下兩種: As mentioned above, the splicing arrangement of the plurality of backlight plates 11 can form a variety of rectangular backlight areas of different sizes, and the implementation manners include but are not limited to the following two:

第一種方式:所述背光板11包括一個矩形背光板及一個或多個不同尺寸之L形背光板,如圖9所示,所述矩形背光板與最小尺寸之L形背光板相鄰拼接,所述L形背光板按照尺寸大小相鄰拼接,較小L形背光板之外邊緣與較大L形背光板之內邊緣拼接。 The first method: the backlight plate 11 includes a rectangular backlight plate and one or more L-shaped backlight plates of different sizes, as shown in FIG. 9, the rectangular backlight plate and the smallest size L-shaped backlight plate are adjacently spliced The L-shaped backlight plates are joined adjacently according to the size, and the outer edge of the smaller L-shaped backlight plate is joined with the inner edge of the larger L-shaped backlight plate.

第二種方式:所述背光板11包括一個矩形背光板及一個或多個不同尺寸之回字形背光板,如圖10所示,所述矩形背光板與最小尺寸之回字形背光板之內邊緣相鄰拼接,所述回字形背光板按照尺寸大小相鄰拼接,較小回字形背光板之外邊緣與較大回字形背光板之內邊緣拼接。 The second method: The backlight plate 11 includes a rectangular backlight plate and one or more zigzag backlight plates of different sizes, as shown in FIG. 10, the inner edge of the rectangular backlight plate and the smallest zigzag backlight plate Adjacent splicing, the back-shaped backlight boards are connected adjacently according to the size, and the outer edge of the smaller back-shaped back light board is spliced with the inner edge of the larger back-shaped back light board.

即本發明實施例根據待檢測之PCB板材大小,確定背光板所需區域,關閉不需要之背光區光源,結合上光源之照射,能夠確保將孔位信息正確地反饋到圖像採集裝置中,為後續之孔位檢測提供良好之光照環境,以提高孔位質量檢測之準確性。 That is to say, the embodiment of the present invention determines the required area of the backlight board according to the size of the PCB to be inspected, turns off the light source in the backlight area that is not needed, and combines the illumination of the light source to ensure that the hole position information is correctly fed back to the image acquisition device. Provide a good lighting environment for subsequent hole position inspection to improve the accuracy of hole position quality inspection.

步驟S12、對所述正面圖像進行分析,若所述正面圖像中 包括兩個圓,則執行步驟S13;若所述正面圖像中包括一個完整圓及兩條相交圓弧,如圖6所示,則執行步驟S14和步驟S15;若所述正面圖像不滿足上述條件,則判定所述目標電路板之孔位不合格。 Step S12: Analyze the front image, if the front image is If two circles are included, go to step S13; if the front image includes a complete circle and two intersecting arcs, as shown in FIG. 6, go to steps S14 and S15; if the front image does not satisfy The above conditions determine that the hole position of the target circuit board is unqualified.

也就是說,目標電路板之孔位合格之必要不充分條件有兩種情況,一種是俯視電路板(即所述正面圖像)可以看到兩個圓,其中,大圓為頂孔之上圓周,小圓可能為頂孔之下圓周,也可能是底孔之上圓周;另一種情況是俯視電路板可以看到一個圓即在這個圓內之兩條弧線,其中,完整之圓為頂孔之上圓周,其中一條弧線為頂孔之下圓周之一部分,另一條弧線為底孔之上圓周之一部分。除此以外之情形,比如盲孔,其成像之正面圖像為一個圓,另一種正面圖像為一個完整圓及一條圓弧之孔都判定為孔位不合格。 That is to say, there are two necessary and insufficient conditions for the hole position of the target circuit board to be qualified. One is that two circles can be seen from the top of the circuit board (that is, the front image), where the large circle is the circumference above the top hole , The small circle may be the circumference below the top hole, or it may be the circumference above the bottom hole; in another case, you can see a circle that is two arcs in this circle when looking down on the circuit board, and the complete circle is the top hole On the upper circumference, one of the arcs is a part of the circumference below the top hole, and the other arc is a part of the circumference above the bottom hole. In other cases, such as blind holes, the front image of the image is a circle, and the other front image is a complete circle and a hole with an arc is judged as a hole position unqualified.

步驟S13、計算所述正面圖像中兩個圓之圓心距離,若所述兩個圓之圓心距離小於或等於預設之第一距離閾值,則判定所述目標電路板之孔位對準度合格,否則判定所述目標電路板之孔位不合格。 Step S13: Calculate the distance between the centers of the two circles in the front image, and if the distance between the centers of the two circles is less than or equal to the preset first distance threshold, determine the alignment of the holes of the target circuit board Qualified, otherwise it is determined that the hole position of the target circuit board is unqualified.

所述第一距離閾值與下述步驟S15中之第一距離閾值相同,為用於判斷鉆孔是否傾斜即頂孔上邊緣和下邊緣之偏移量之允許範圍。 The first distance threshold is the same as the first distance threshold in the following step S15, and is an allowable range for judging whether the drilling is inclined, that is, the offset between the upper edge and the lower edge of the top hole.

正如實施例一開始所說,除了判斷孔位對準度,還需要判斷鉆孔深度是否合格,只有孔位對準度與鉆孔深度均合格,才可以判斷電路板之孔位合格,因此,步驟S13中判定所述目標電路板 之孔位對準度合格之後還包括: As mentioned at the beginning of the embodiment, in addition to judging the hole alignment, it is also necessary to judge whether the drilling depth is qualified. Only when the hole alignment and the drilling depth are both qualified, the hole position of the circuit board can be judged as qualified. Therefore, The target circuit board is determined in step S13 After the hole alignment is qualified, it also includes:

計算所述兩個圓之半徑,若較小半徑與較大半徑之比值大於或等於預設之比例閾值,則所述目標電路板之孔位合格,否則所述目標電路板之孔位不合格。正如上述,電路板上之鉆孔為錐形孔,如圖4和圖5所示,孔之上下邊緣之圓周大小比例體現了鉆孔之深度,設定一個最低標準(比例閾值),若兩個圓之較小半徑與較大半徑之比值低於這個最低標準,則說明較小半徑過小,即鉆孔過深,孔位深度不合格,即孔位不合格。 Calculate the radii of the two circles. If the ratio of the smaller radius to the larger radius is greater than or equal to the preset ratio threshold, the hole position of the target circuit board is qualified, otherwise the hole position of the target circuit board is unqualified . As mentioned above, the hole on the circuit board is a tapered hole, as shown in Figure 4 and Figure 5. The ratio of the circumference of the upper and lower edges of the hole reflects the depth of the hole. A minimum standard (proportion threshold) is set. The ratio of the smaller radius to the larger radius of the circle is lower than this minimum standard, indicating that the smaller radius is too small, that is, the hole is drilled too deep, and the hole depth is unqualified, that is, the hole is unqualified.

步驟S14、在相交之每一條圓弧上分別取至少三個點,以確定第一圓弧所在圓之第一圓心及第二圓弧所在圓之第二圓心。 Step S14: Take at least three points on each intersecting arc to determine the first center of the circle where the first arc is located and the second center of the circle where the second arc is located.

針對正面圖像中有一個完整圓和兩條弧線之情況,由於兩條弧線相交是頂孔之下圓與底孔之上圓相交之結果,因此,其肯定是貫穿孔,且根據(不在一直線之)三個點可以確定一個圓及其圓心系公知常識,比如,三個點中之點兩兩連成線段,三個線段之中垂線匯交點即為圓心,所述匯交點到三個點中任意一個點之距離即為半徑。或者建立坐標系,得到三個點之坐標,建立二元二次方程組,求取到這三個點之距離相等之坐標點即為圓心,所計算之相等之距離即為半徑。或者,還可以採用已知之最小二乘法(Sun of Least Suqares)或是霍夫變換(Hough Transform),計算出每個弧之所在圓之圓心。 For the situation where there is a complete circle and two arcs in the front image, because the intersection of the two arcs is the result of the intersection of the circle under the top hole and the circle above the bottom hole, it must be a through hole, and according to (not in a straight line) (Of) Three points can determine a circle and its center are common knowledge. For example, the points of the three points are connected by two to form a line segment. The intersection of the vertical lines among the three line segments is the center of the circle. The intersection point to three points The distance between any point in is the radius. Or establish a coordinate system, obtain the coordinates of three points, and establish a two-dimensional quadratic equation system. The coordinate point with the same distance to these three points is the center of the circle, and the calculated equal distance is the radius. Alternatively, the known least square method (Sun of Least Suqares) or Hough Transform (Hough Transform) can also be used to calculate the center of the circle where each arc is located.

步驟S15、若第一圓心與所述完整圓之圓心之間之距離及第二圓心與所述完整圓之圓心之間之距離中之較小距離小於或等 於預設之第一距離閾值,且其之中之較大距離小於或等於預設之第二距離閾值,其中,所述第一距離閾值小於或等於第二距離閾值,則判定所述目標電路板之孔位對準度合格,否則判定所述目標電路板之孔位不合格。 Step S15. If the smaller of the distance between the first circle center and the center of the complete circle and the distance between the second circle center and the center of the complete circle is less than or equal to At a preset first distance threshold, and the larger distance among them is less than or equal to the preset second distance threshold, wherein the first distance threshold is less than or equal to the second distance threshold, then the target circuit is determined The hole position alignment of the board is qualified, otherwise the hole position of the target circuit board is judged to be unqualified.

假定完整圓之圓心為C1,所述第一圓弧所在圓之第一圓心為C2,所述第二圓弧所在圓之第二圓心為C3,判斷圓心之間之距離|C2-C1|與|C3-C1|之大小,假如|C2-C1|較小,則判定C2為頂孔之下圓周圓心,而C3為底孔之上圓周圓心。預先設有第一距離閾值和第二距離閾值,其中,所述第一距離閾值小於或等於第二距離閾值,所述第一距離閾值為用於判斷鉆孔是否傾斜即頂孔上邊緣和下邊緣之偏移量之允許範圍,若|C2-C1|=0,則說明鉆孔沒有傾斜,若|C2-C1|超出第一距離閾值,則判定電路板之孔位不合格;所述第二距離閾值為用於判斷頂部孔與底部孔錯位偏移量之允許範圍,若|C3-C1|=0,則說明兩孔沒有偏移,若|C3-C1|超出第二距離閾值,則判定電路板之孔位不合格;只有同時滿足|C2-C1|

Figure 109129512-A0305-02-0016-1
第一距離閾值,且|C3-C1|
Figure 109129512-A0305-02-0016-2
第二距離閾值,則判定電路板之孔位對準度合格。 Assuming that the center of a complete circle is C1, the first center of the circle where the first arc is located is C2, and the second center of the circle where the second arc is located is C3, determine the distance between the center of the circle |C2-C1| and The size of |C3-C1|, if |C2-C1| is small, it is determined that C2 is the center of the circumference under the top hole, and C3 is the center of the circumference above the bottom hole. A first distance threshold and a second distance threshold are preset, wherein the first distance threshold is less than or equal to the second distance threshold, and the first distance threshold is used to determine whether the borehole is inclined, that is, the upper edge and the lower edge of the top hole The allowable range of edge offset. If |C2-C1|=0, it means that the drilling is not inclined. If |C2-C1| exceeds the first distance threshold, the hole position of the circuit board is judged to be unqualified; The second distance threshold is the allowable range for judging the offset of the top hole and the bottom hole. If |C3-C1|=0, then the two holes have no offset. If |C3-C1| exceeds the second distance threshold, then Determine the hole position of the circuit board as unqualified; only meet |C2-C1|
Figure 109129512-A0305-02-0016-1
The first distance threshold, and |C3-C1|
Figure 109129512-A0305-02-0016-2
The second distance threshold determines that the hole alignment of the circuit board is qualified.

正如實施例一開始所說,除了判斷孔位對準度,還需要判斷鉆孔深度是否合格,只有孔位對準度與鉆孔深度均合格,才可以判斷電路板之孔位合格,因此,步驟S15中判定所述目標電路板之孔位對準度合格之後還包括:計算所述第一圓弧所在圓之第一半徑及第二圓弧所在圓 之第二半徑,若所述第一半徑與第二半徑中之較小半徑與所述完整圓之半徑之比值大於或等於預設之比例閾值,則所述目標電路板之孔位合格,否則所述目標電路板之孔位不合格。 As mentioned at the beginning of the embodiment, in addition to judging the hole alignment, it is also necessary to judge whether the drilling depth is qualified. Only when the hole alignment and the drilling depth are both qualified, the hole position of the circuit board can be judged as qualified. Therefore, After determining that the hole alignment of the target circuit board is qualified in step S15, the method further includes: calculating the first radius of the circle where the first arc is located and the circle where the second arc is located If the ratio of the smaller of the first radius and the second radius to the radius of the complete circle is greater than or equal to the preset ratio threshold, the hole position of the target circuit board is qualified, otherwise The hole position of the target circuit board is unqualified.

以上距離數值都需要進行轉化,具體地,根據用於獲取目標電路板正面圖像之攝像參數,得到正面圖像與實際目標電路板之尺寸比例,並根據所述尺寸比例預設置所述第一距離閾值和第二距離閾值或者根據所述尺寸比例將圖像上測量之距離數據轉化為實際電路板上之距離數據。即比如正面圖像與實際目標電路板之尺寸比例為N:1,一種轉化方式是將圖像上測量得到之距離數據(除以N)轉化為實際電路板上之距離數據,然後和實際標準閾值比較,另一種轉化方式就是將實際標準閾值(乘以N)轉化為與圖象上測量得到之距離數據作比較之閾值。 The above distance values need to be converted. Specifically, according to the camera parameters used to obtain the front image of the target circuit board, the size ratio between the front image and the actual target circuit board is obtained, and the first size ratio is preset according to the size ratio. The distance threshold value and the second distance threshold value or the distance data measured on the image are converted into distance data on the actual circuit board according to the size ratio. That is, for example, the size ratio between the front image and the actual target circuit board is N:1. One conversion method is to convert the distance data measured on the image (divided by N) into the distance data on the actual circuit board, and then compare it with the actual standard Threshold comparison, another conversion method is to convert the actual standard threshold (multiplied by N) into a threshold for comparison with the distance data measured on the image.

在本發明之另一個實施例中,本發明提供了另一種基於上下鉆孔電路板之孔位檢測方法,用於對完成上下鉆孔之目標電路板進行孔位偏移檢測,先檢測孔位偏移情況,後檢測孔位深度,參見圖3,所述孔位檢測方法包括以下步驟: In another embodiment of the present invention, the present invention provides another hole position detection method based on the upper and lower drilling circuit board, which is used to detect the hole position offset of the target circuit board after the upper and lower drilling is completed. The hole position is first detected In case of deviation, the depth of the hole position is detected afterwards. See Fig. 3. The hole position detection method includes the following steps:

步驟S21、在補光狀態下,獲取目標電路板之正面圖像。 Step S21: Acquire the front image of the target circuit board in the light supplement state.

將目標電路板放置在如圖2所示之孔位檢測設備上,所述孔位檢測設備包括背光板1、設置在所述背光板1上方之上光源2和圖像採集裝置3,所述上光源2為對稱設置結構,所述圖像採集裝置3設置在背光板1上方且在所述上光源2之對稱軸線處,將所述目標電路板放置在背光板1上,同時打開上光源2和背光 板1,優選地,在電路板與背光板之間還可以防止一層透明薄板(未圖示),以將背光板1發出之光打散,使得光均勻分佈,確保背光板1發出之光照射在被測孔之一致性,不會出現黑點、亮點情況,確保將孔位之信息準確地反饋到圖像採集裝置3(比如CCD相機)中。 Place the target circuit board on the hole position detection equipment as shown in FIG. The upper light source 2 has a symmetrical arrangement structure, the image acquisition device 3 is arranged above the backlight plate 1 and at the symmetry axis of the upper light source 2, the target circuit board is placed on the backlight plate 1, and the upper light source is turned on at the same time 2 and backlight Plate 1, preferably, a layer of transparent thin plate (not shown) can be prevented between the circuit board and the backlight plate to disperse the light emitted by the backlight plate 1, so that the light is evenly distributed, and ensures that the light emitted by the backlight plate 1 is irradiated In the consistency of the tested holes, there will be no black spots and bright spots, so as to ensure that the information of the hole position is accurately fed back to the image acquisition device 3 (such as a CCD camera).

步驟S22、對所述正面圖像進行分析,若所述正面圖像中包括兩個圓,則執行S23;若所述正面圖像中包括一個完整圓及兩條相交圓弧,如圖6所示,則執行S24和S25;若所述正面圖像不滿足上述條件,則判定所述目標電路板之孔位不合格。 Step S22: Analyze the front image. If the front image includes two circles, execute S23; if the front image includes a complete circle and two intersecting arcs, as shown in FIG. 6 If shown, S24 and S25 are executed; if the front image does not meet the above conditions, it is determined that the hole position of the target circuit board is unqualified.

也就是說,目標電路板之孔位合格之必要不充分條件有兩種情況,一種是俯視電路板(即所述正面圖像)可以看到兩個圓,其中,大圓為頂孔之上圓周,小圓可能為頂孔之下圓周,也可能是底孔之上圓周;另一種情況是俯視電路板可以看到一個圓即在這個圓內之兩條弧線,其中,完整之圓為頂孔之上圓周,其中一條弧線為頂孔之下圓周之一部分,另一條弧線為底孔之上圓周之一部分。除此以外之情形都判定為孔位不合格之情況,比如正面成像為一個圓之盲孔,以及正面成像為一個完整圓和一條圓弧之孔等等。 That is to say, there are two necessary and insufficient conditions for the hole position of the target circuit board to be qualified. One is that two circles can be seen from the top of the circuit board (that is, the front image), where the large circle is the circumference above the top hole , The small circle may be the circumference below the top hole, or it may be the circumference above the bottom hole; in another case, you can see a circle that is two arcs in this circle when looking down on the circuit board, and the complete circle is the top hole On the upper circumference, one of the arcs is a part of the circumference below the top hole, and the other arc is a part of the circumference above the bottom hole. Other situations are judged as unqualified hole positions, such as a blind hole with a circle on the front, and a hole with a complete circle and an arc on the front, and so on.

步驟S23、計算所述兩個圓之半徑,若較小半徑與較大半徑之比值大於或等於預設之比例閾值,則判定所述目標電路板之孔位深度合格,否則所述目標電路板之孔位不合格。 Step S23. Calculate the radii of the two circles. If the ratio of the smaller radius to the larger radius is greater than or equal to the preset ratio threshold, then it is determined that the hole depth of the target circuit board is qualified, otherwise the target circuit board The hole position is unqualified.

正如上述,電路板上之鉆孔為錐形孔,如圖4和圖5所示,孔之上下邊緣之圓周大小比例體現了鉆孔之深度,設定一個最 低標準(比例閾值),若兩個圓之較小半徑與較大半徑之比值低於這個最低標準,則說明較小半徑過小,即鉆孔過深,孔位深度不合格,即孔位不合格。 As mentioned above, the hole on the circuit board is a tapered hole, as shown in Figure 4 and Figure 5. The ratio of the circumference of the upper and lower edges of the hole reflects the depth of the hole. Set a minimum Low standard (proportion threshold). If the ratio of the smaller radius to the larger radius of the two circles is lower than this minimum standard, it means that the smaller radius is too small, that is, the drilling is too deep, and the hole depth is unqualified, that is, the hole position is not qualified. qualified.

正如實施例一開始所說,除了判斷鉆孔深度,還需要判斷孔位對準度是否合格,只有孔位對準度與鉆孔深度均合格,才可以判斷電路板之孔位合格,因此,步驟S23中判定所述目標電路板之孔位深度合格之後還包括:計算所述正面圖像中兩個圓之圓心距離,若所述兩個圓之圓心距離小於或等於預設之第一距離閾值,則判定所述目標電路板之孔位合格,否則判定所述目標電路板之孔位不合格。此處之所述第一距離閾值與下述步驟S262中之第一距離閾值相同,為用於判斷鉆孔是否傾斜即頂孔上邊緣和下邊緣之偏移量之允許範圍。 As mentioned at the beginning of the embodiment, in addition to judging the drilling depth, it is also necessary to judge whether the hole alignment is qualified. Only when the hole alignment and the drilling depth are both qualified, the hole position of the circuit board can be judged as qualified. Therefore, After determining that the hole depth of the target circuit board is qualified in step S23, the method further includes: calculating the distance between the centers of the two circles in the front image, if the distance between the centers of the two circles is less than or equal to the preset first distance Threshold, it is judged that the hole position of the target circuit board is qualified, otherwise it is judged that the hole position of the target circuit board is unqualified. The first distance threshold here is the same as the first distance threshold in the following step S262, and is used to determine whether the drilling is inclined, that is, the allowable range of the offset between the upper edge and the lower edge of the top hole.

步驟S24、在相交之每一條圓弧上分別取至少三個點,以確定第一圓弧所在圓之第一半徑及第二圓弧所在圓之第二半徑。 Step S24: Take at least three points on each of the intersecting arcs to determine the first radius of the circle where the first arc is located and the second radius of the circle where the second arc is located.

針對正面圖像中有一個完整圓和兩條弧線之情況,由於兩條弧線相交是頂孔之下圓與底孔之上圓相交之結果,因此,其肯定是貫穿孔,且根據(不在一直線之)三個點可以確定一個圓及其圓心系公知,比如,利用中垂法:三個點中之點兩兩連成線段,三個線段之中垂線匯交點即為圓心,所述匯交點到三個點中任意一個點之距離即為半徑。或者利用坐標法:建立坐標系,得到三個點之坐標,建立二元二次方程組,求取到這三個點之距離相等之坐標點即為圓心,所計算之相等之距離即為半徑。或者,還可以採用已 知之最小二乘法(Sun of Least Suqares)或是霍夫變換(Hough Transform),計算出每個弧之所在圓之圓心,隨後計算出第一圓弧所在圓之第一半徑及第二圓弧所在圓之第二半徑。 For the situation where there is a complete circle and two arcs in the front image, because the intersection of the two arcs is the result of the intersection of the circle under the top hole and the circle above the bottom hole, it must be a through hole, and according to (not in a straight line) (Of) Three points can determine a circle and its center system. For example, using the vertical method: the points of the three points are connected by two to form a line segment, and the intersection of the vertical lines among the three line segments is the center of the circle. The intersection point The distance to any one of the three points is the radius. Or use the coordinate method: establish a coordinate system, get the coordinates of three points, establish a two-dimensional quadratic equation system, find the coordinate point with the same distance to these three points is the center of the circle, and the calculated equal distance is the radius . Or, you can also use Known least square method (Sun of Least Suqares) or Hough Transform (Hough Transform), calculate the center of the circle where each arc is located, and then calculate the first radius of the circle where the first arc is located and where the second arc is located The second radius of the circle.

步驟S25、若第一半徑與第二半徑中之較小半徑與所述完整圓之半徑之比值大於或等於預設之比例閾值,則判定所述目標電路板之孔位深度合格,否則所述目標電路板之孔位不合格。 Step S25. If the ratio of the smaller radius of the first radius and the second radius to the radius of the complete circle is greater than or equal to the preset ratio threshold, then it is determined that the hole depth of the target circuit board is qualified, otherwise the The hole position of the target circuit board is unqualified.

正如實施例一開始所說,除了判斷鉆孔深度,還需要判斷孔位對準度是否合格,只有孔位對準度與鉆孔深度均合格,才可以判斷電路板之孔位合格,因此,判定所述目標電路板之孔位深度合格之後還包括:步驟S261、確定第一圓弧所在圓之第一圓心及第二圓弧所在圓之第二圓心;步驟S262、若第一圓心與所述完整圓之圓心之間之距離及第二圓心與所述完整圓之圓心之間之距離中之較小距離小於或等於預設之第一距離閾值,且其之中之較大距離小於或等於預設之第二距離閾值,其中,所述第一距離閾值小於或等於第二距離閾值,則判定所述目標電路板之孔位合格,否則判定所述目標電路板之孔位不合格。 As mentioned at the beginning of the embodiment, in addition to judging the drilling depth, it is also necessary to judge whether the hole alignment is qualified. Only when the hole alignment and the drilling depth are both qualified, the hole position of the circuit board can be judged as qualified. Therefore, After determining that the hole depth of the target circuit board is qualified, the method further includes: step S261, determining the first center of the circle where the first arc is located and the second center of the circle where the second arc is located; The smaller of the distance between the center of the complete circle and the distance between the second center of the complete circle and the center of the complete circle is less than or equal to the preset first distance threshold, and the greater distance is less than or It is equal to the preset second distance threshold, where the first distance threshold is less than or equal to the second distance threshold, the hole position of the target circuit board is determined to be qualified, otherwise the hole position of the target circuit board is determined to be unqualified.

假定完整圓之圓心為C1,所述第一圓弧所在圓之第一圓心為C2,所述第二圓弧所在圓之第二圓心為C3,判斷圓心之間之距離|C2-C1|與|C3-C1|之大小,其中,|C2-C1|為圓心C1與圓心C2之間之距離,|C3-C1|為圓心C3與圓心C1之間之距離,假如|C2- C1|較小,則判定C2為頂孔之下圓周圓心,而C3為底孔之上圓周圓心。預先設有第一距離閾值和第二距離閾值,其中,所述第一距離閾值小於或等於第二距離閾值,所述第一距離閾值為用於判斷鉆孔是否傾斜即頂孔上邊緣和下邊緣之偏移量之允許範圍,若|C2-C1|=0,則說明鉆孔沒有傾斜,若|C2-C1|超出第一距離閾值,則判定電路板之孔位不合格;所述第二距離閾值為用於判斷頂部孔與底部孔錯位偏移量之允許範圍,若|C3-C1|=0,則說明兩孔沒有偏移,若|C3-C1|超出第二距離閾值,則判定電路板之孔位不合格;只有同時滿足|C2-C1|

Figure 109129512-A0305-02-0021-3
第一距離閾值,且|C3-C1|
Figure 109129512-A0305-02-0021-4
第二距離閾值,則判定電路板之孔位對準度合格。 Assuming that the center of a complete circle is C1, the first center of the circle where the first arc is located is C2, and the second center of the circle where the second arc is located is C3, determine the distance between the center of the circle |C2-C1| and The size of |C3-C1|, where |C2-C1| is the distance between the center C1 and the center C2, |C3-C1| is the distance between the center C3 and the center C1, if |C2- C1| is smaller , It is judged that C2 is the center of the circle below the top hole, and C3 is the center of the circle above the bottom hole. A first distance threshold and a second distance threshold are preset, wherein the first distance threshold is less than or equal to the second distance threshold, and the first distance threshold is used to determine whether the borehole is inclined, that is, the upper edge and the lower edge of the top hole The allowable range of edge offset. If |C2-C1|=0, it means that the drilling is not inclined. If |C2-C1| exceeds the first distance threshold, the hole position of the circuit board is judged to be unqualified; The second distance threshold is the allowable range for judging the offset of the top hole and the bottom hole. If |C3-C1|=0, then the two holes have no offset. If |C3-C1| exceeds the second distance threshold, then Determine the hole position of the circuit board as unqualified; only meet |C2-C1|
Figure 109129512-A0305-02-0021-3
The first distance threshold, and |C3-C1|
Figure 109129512-A0305-02-0021-4
The second distance threshold determines that the hole alignment of the circuit board is qualified.

本發明公開了一種基於上下鉆孔電路板之孔位檢測方法及檢測設備,從上下鉆孔之偏移度和孔深度判斷孔位是否合格,檢測設備為電路板成像提供上下光源補光環境,利用電路板之正面成像信息,判斷孔位是否貫穿、偏移度是否合格、孔位深度是否合格。本發明全面檢測電路板之孔位質量,利用本發明之檢測方法,即使在頂孔或底孔發生鉆孔傾斜之情況下或者頂孔與底孔之鉆孔深度不一致之情況,同樣能夠準確地測量電路板之孔位質量。 The invention discloses a hole position detection method and detection equipment based on upper and lower drilling circuit boards, which can judge whether the hole positions are qualified from the deviation of the upper and lower drilling holes and the depth of the holes. Use the front imaging information of the circuit board to determine whether the hole position is penetrated, the deviation degree is qualified, and the hole depth is qualified. The present invention comprehensively detects the quality of the hole positions of the circuit board. Using the detection method of the present invention, even when the top hole or bottom hole is inclined or the depth of the top hole and the bottom hole are inconsistent, it can also accurately Measure the quality of the holes on the circuit board.

此外,本領域技術人員將意識到,上述操作之間之界限僅為示例性。多個操作可以合並為單個操作,單個操作可以分佈於額外操作中,且可在至少部分重疊之時間下執行操作。此外,可選實施例可包括特定操作之多個舉例說明,並且操作順序可在各種其他實施例中變化。 In addition, those skilled in the art will realize that the boundaries between the above operations are only exemplary. Multiple operations can be combined into a single operation, a single operation can be distributed in additional operations, and operations can be performed at least partially overlapping times. In addition, alternative embodiments may include multiple illustrations of specific operations, and the order of operations may be changed in various other embodiments.

然而,其他修改、變化及替代也是可能之。因此,應在示例性意義上而非限制性意義上看待說明書及附圖。 However, other modifications, changes and substitutions are also possible. Therefore, the description and drawings should be viewed in an exemplary rather than restrictive sense.

在權利要求聲明中,置於圓括號之間任何參考符號不應被視為限制請求項。詞語「包括」並不排除那些列在權利要求聲明中之其他元件或步驟之存在。此外,本文所使用之術語「一」或「一個」,被定義為一個或多於一個。除非另有說明,否則諸如「第一」和「第二」之類之術語用於任意區分這些術語所描述之元素。因此,這些術語不一定旨在表示這些元素之時間或其他優先級。在彼此不同之權利要求中敘述某些措施之僅有事實並不表示這些措施之組合不能加以利用。 In the claim statement, any reference signs placed between parentheses shall not be regarded as restrictive claims. The word "comprising" does not exclude the existence of other elements or steps listed in the claims. In addition, the term "a" or "an" as used herein is defined as one or more than one. Unless otherwise stated, terms such as "first" and "second" are used to arbitrarily distinguish the elements described by these terms. Therefore, these terms are not necessarily intended to indicate the timing or other priority of these elements. The mere fact that certain measures are recited in mutually different claims does not indicate that a combination of these measures cannot be used.

雖然本文已經說明和描述了本發明之某些特徵,但是本領域普通技術人員現在將想到許多修改、替換、改變和等同物。因此,應該理解,所附權利要求旨在覆蓋落入本發明之真正精神內之所有這些修改和變化。 Although certain features of the present invention have been illustrated and described herein, those of ordinary skill in the art will now think of many modifications, substitutions, changes and equivalents. Therefore, it should be understood that the appended claims are intended to cover all these modifications and changes that fall within the true spirit of the present invention.

11:背光板 11: Backlight board

2:上光源 2: Upper light source

3:圖像採集裝置 3: Image acquisition device

4:電路板 4: Circuit board

Claims (10)

一種基於上下鉆孔電路板之孔位檢測方法,用於對完成上下鉆孔之目標電路板進行孔位偏移檢測,即使上孔或下孔發生鉆孔傾斜或者上孔與下孔的鉆孔深度不一致,所述孔位檢測方法包括以下步驟:步驟S11、在補光狀態下,獲取目標電路板之正面圖像;步驟S12、對所述正面圖像進行分析,若所述正面圖像中包括兩個圓,則執行步驟S13;若所述正面圖像中包括一個完整圓及兩條相交圓弧,則執行步驟S14和步驟S15;若所述正面圖像不滿足上述條件,則判定所述目標電路板之孔位不合格;步驟S13、計算所述正面圖像中兩個圓之圓心距離,若所述兩個圓之圓心距離小於或等於預設之第一距離閾值,則判定所述目標電路板之孔位對準度合格,否則判定所述目標電路板之孔位不合格;步驟S14、確定第一圓弧所在圓之第一圓心及第二圓弧所在圓之第二圓心;以及步驟S15、若第一圓心與所述完整圓之圓心之間之距離及第二圓心與所述完整圓之圓心之間之距離中之較小距離小於或等於預設之第一距離閾值,且其之中之較大距離小於或等於預設之第二距離閾值,其中,所述第一距離閾值小於或等於第二距離閾值,則判定所述目標電路板之孔位對準度合格,否則判定所述目標電路板之孔位不合格。 A hole position detection method based on up and down drilling circuit boards, used to detect the hole position offset of the target circuit board that has completed the up and down drilling, even if the upper hole or the lower hole is drilled or the upper hole and the lower hole are drilled If the depth is inconsistent, the hole position detection method includes the following steps: step S11, in the light supplement state, obtain the front image of the target circuit board; step S12, analyze the front image, if the front image is If two circles are included, step S13 is executed; if the frontal image includes a complete circle and two intersecting arcs, then steps S14 and S15 are executed; if the frontal image does not meet the above conditions, it is determined that all The hole position of the target circuit board is unqualified; step S13, the distance between the centers of the two circles in the front image is calculated, and if the distance between the centers of the two circles is less than or equal to the preset first distance threshold, it is determined The hole alignment of the target circuit board is qualified, otherwise the hole position of the target circuit board is determined to be unqualified; step S14, determine the first center of the circle where the first arc is located and the second center of the circle where the second arc is located And step S15, if the smaller of the distance between the first circle center and the center of the complete circle and the distance between the second circle center and the center of the complete circle is less than or equal to the preset first distance threshold , And the larger distance among them is less than or equal to the preset second distance threshold, where the first distance threshold is less than or equal to the second distance threshold, then it is determined that the hole alignment of the target circuit board is qualified , Otherwise it is judged that the hole position of the target circuit board is unqualified. 如請求項1之孔位檢測方法,步驟S15中判定所述目標電路板之孔位對準度合格之後還包括:計算所述第一圓弧所在圓之第一半徑及第二圓弧所在圓之第二半徑,若所述第一半徑與第二半徑中之較小半徑與所述完整圓之半徑之比值大於或等於預設之比例閾值,則所述目標電路板之孔位合格,否則所述目標電路板之孔位不合格。 For example, the hole position detection method of claim 1, after determining that the hole position alignment of the target circuit board is qualified in step S15, it further includes: calculating the first radius of the circle where the first arc is located and the circle where the second arc is located If the ratio of the smaller of the first radius and the second radius to the radius of the complete circle is greater than or equal to the preset ratio threshold, the hole position of the target circuit board is qualified, otherwise The hole position of the target circuit board is unqualified. 如請求項1之孔位檢測方法,步驟S13中判定所述目標電路板之孔位對準度合格之後還包括:計算所述兩個圓之半徑,若較小半徑與較大半徑之比值大於或等於預設之比例閾值,則所述目標電路板之孔位合格,否則所述目標電路板之孔位不合格。 For example, the hole position detection method of claim 1, after determining that the hole position alignment of the target circuit board is qualified in step S13, it further includes: calculating the radii of the two circles, if the ratio of the smaller radius to the larger radius is greater than If it is equal to the preset ratio threshold, the hole position of the target circuit board is qualified, otherwise the hole position of the target circuit board is unqualified. 如請求項1之孔位檢測方法,步驟S14中,在所述第一圓弧和第二圓弧上分別各取至少三個點,通過坐標法或者中垂線法確定第一圓弧所在圓之第一圓心及第二圓弧所在圓之第二圓心。 For example, in the hole position detection method of claim 1, in step S14, at least three points are respectively taken on the first arc and the second arc, and the first arc is determined by the coordinate method or the vertical line method. The second center of the circle where the first center and the second arc are located. 如請求項1之孔位檢測方法,步驟S11中之所述補光狀態包括:同時打開所述目標電路板上方之上光源及所述目標電路板下方之背光源。 As in the hole position detection method of claim 1, the light supplement state in step S11 includes: simultaneously turning on the light source above the target circuit board and the backlight source below the target circuit board. 如請求項1之孔位檢測方法,根據用於獲取目標電路板正面圖像之攝像參數,得到正面圖像與實際目標電路板之尺寸比例,並根據所述尺寸比例預設置所述第一距離閾值和第二距離 閾值或者根據所述尺寸比例將圖像上測量之距離數據轉化為實際電路板上之距離數據。 Such as the hole position detection method of claim 1, according to the camera parameters used to obtain the front image of the target circuit board, the size ratio of the front image and the actual target circuit board is obtained, and the first distance is preset according to the size ratio Threshold and second distance The threshold value or the distance data measured on the image is converted into the distance data on the actual circuit board according to the size ratio. 一種基於上下鉆孔電路板之孔位檢測方法,用於對完成上下鉆孔之目標電路板進行孔位偏移檢測,即使上孔或下孔發生鉆孔傾斜或者上孔與下孔的鉆孔深度不一致,所述孔位檢測方法包括以下步驟:S21、在補光狀態下,獲取目標電路板之正面圖像;S22、對所述正面圖像進行分析,若所述正面圖像中包括兩個圓,則執行S23;若所述正面圖像中包括一個完整圓及兩條相交圓弧,則執行S24和S25;若所述正面圖像不滿足上述條件,則判定所述目標電路板之孔位不合格;S23、計算所述兩個圓之半徑,若較小半徑與較大半徑之比值大於或等於預設之比例閾值,則判定所述目標電路板之孔位深度合格,否則所述目標電路板之孔位不合格;S24、確定第一圓弧所在圓之第一半徑及第二圓弧所在圓之第二半徑;以及S25、若第一半徑與第二半徑中之較小半徑與所述完整圓之半徑之比值大於或等於預設之比例閾值,則判定所述目標電路板之孔位深度合格,否則所述目標電路板之孔位不合格。 A hole position detection method based on up and down drilling circuit boards, used to detect the hole position offset of the target circuit board that has completed the up and down drilling, even if the upper hole or the lower hole is drilled or the upper hole and the lower hole are drilled If the depth is inconsistent, the hole position detection method includes the following steps: S21, in the light supplement state, obtain the front image of the target circuit board; S22, analyze the front image, if the front image includes two If the front image includes a complete circle and two intersecting arcs, then execute S24 and S25; if the front image does not meet the above conditions, then it is determined that the target circuit board is The hole position is unqualified; S23. Calculate the radii of the two circles. If the ratio of the smaller radius to the larger radius is greater than or equal to the preset ratio threshold, determine that the hole depth of the target circuit board is qualified; otherwise, The hole position of the target circuit board is unqualified; S24. Determine the first radius of the circle where the first arc is located and the second radius of the circle where the second arc is located; and S25. If the first radius and the second radius are smaller If the ratio of the radius to the radius of the complete circle is greater than or equal to the preset ratio threshold, it is determined that the hole depth of the target circuit board is qualified, otherwise the hole position of the target circuit board is unqualified. 如請求項7之孔位檢測方法,步驟S25中判定所述目標電路板之孔位深度合格之後還包括:確定第一圓弧所在圓之第一圓心及第二圓弧所在圓之第二圓 心;以及若第一圓心與所述完整圓之圓心之間之距離及第二圓心與所述完整圓之圓心之間之距離中之較小距離小於或等於預設之第一距離閾值,且其之中之較大距離小於或等於預設之第二距離閾值,其中,所述第一距離閾值小於或等於第二距離閾值,則判定所述目標電路板之孔位合格,否則判定所述目標電路板之孔位不合格。 For example, the hole position detection method of claim 7, after determining that the hole depth of the target circuit board is qualified in step S25, it further includes: determining the first center of the circle where the first arc is located and the second circle of the circle where the second arc is located And if the smaller of the distance between the first circle center and the center of the complete circle and the distance between the second circle center and the center of the complete circle is less than or equal to the preset first distance threshold, and The larger distance among them is less than or equal to the preset second distance threshold, wherein if the first distance threshold is less than or equal to the second distance threshold, it is determined that the hole position of the target circuit board is qualified, otherwise it is determined that the hole position of the target circuit board is qualified. The hole position of the target circuit board is unqualified. 如請求項7之孔位檢測方法,步驟S23中判定所述目標電路板之孔位深度合格之後還包括:計算所述正面圖像中兩個圓之圓心距離,若所述兩個圓之圓心距離小於或等於預設之第一距離閾值,則判定所述目標電路板之孔位合格,否則判定所述目標電路板之孔位不合格。 For example, the hole detection method of claim 7, after determining that the hole depth of the target circuit board is qualified in step S23, the method further includes: calculating the center distance of the two circles in the front image, if the center of the two circles is If the distance is less than or equal to the preset first distance threshold, it is determined that the hole position of the target circuit board is qualified; otherwise, the hole position of the target circuit board is determined to be unqualified. 一種基於上下鉆孔電路板之孔位檢測設備,包括:背光裝置;多個上光源,設置在所述背光裝置(1)上方;以及圖像採集裝置;其中所述多個上光源發射之光線在所述背光裝置上進行匯聚,所述圖像採集裝置設置在所述上光源之光線匯聚處之上方;其中所述背光裝置包括多個受獨立控制之背光板,每個所述背光板上之背光源能夠獨立打開或者關閉,多個所述背光板拼接設置而形成多種不同尺寸之矩形背光區,所述孔位檢測設備利用如請求項1-9中任意一項所述之孔位檢測方法對電路板進行孔位 偏移檢測。A hole position detection equipment based on upper and lower drilling circuit boards, comprising: a backlight device; a plurality of upper light sources arranged above the backlight device (1); and an image acquisition device; wherein the light emitted by the plurality of upper light sources Convergence is performed on the backlight device, and the image capture device is arranged above the light converging point of the upper light source; wherein the backlight device includes a plurality of independently controlled backlight panels, and each of the backlight panels The backlight source can be turned on or off independently, and a plurality of the backlight boards are spliced and arranged to form a rectangular backlight area of different sizes. The hole position detection device uses the hole position detection described in any one of claim items 1-9 Method to make holes on the circuit board Offset detection.
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