TWI735240B - Probe device - Google Patents
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- TWI735240B TWI735240B TW109117434A TW109117434A TWI735240B TW I735240 B TWI735240 B TW I735240B TW 109117434 A TW109117434 A TW 109117434A TW 109117434 A TW109117434 A TW 109117434A TW I735240 B TWI735240 B TW I735240B
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Abstract
Description
本發明涉及一種探針裝置,特別是一種具有一體成型式探針的探針裝置。 The invention relates to a probe device, in particular to a probe device with an integrally formed probe.
請參閱圖1,其顯示為現有的探針裝置的剖面示意圖。現有的探針裝置P包含一底座P1、多個一體成型式探針P2及一頂蓋P3。底座P1包含多個限位穿孔P11,頂蓋P3具有多個頂蓋穿孔P31。探針裝置P的安裝方式為:先進行植針作業,以將多個一體成型式探針P2的一端對應設置於底座P1的多個限位穿孔P11中;接著,將頂蓋P3的多個限位穿孔P11對應穿過多個一體成型式探針P2,而使頂蓋P3能與底座P1相互固定,並據以通過底座P1及頂蓋P3而限制多個一體成型式探針P2的活動範圍。 Please refer to FIG. 1, which shows a schematic cross-sectional view of a conventional probe device. The existing probe device P includes a base P1, a plurality of integrated probes P2, and a top cover P3. The base P1 includes a plurality of limit perforations P11, and the top cover P3 has a plurality of top cover perforations P31. The installation method of the probe device P is as follows: firstly perform the needle planting operation, so that one end of the multiple integrated probes P2 is correspondingly set in the multiple limit perforations P11 of the base P1; then, the multiple The limit perforation P11 correspondingly passes through the multiple integrated probes P2, so that the top cover P3 and the base P1 can be fixed to each other, and accordingly the movement range of the multiple integrated probes P2 is restricted by the base P1 and the top cover P3 .
依上所述,在實際應用中,在一體成型式探針P2的數量較多,或一體成型式探針P2尺寸較小的實施例中,容易發生頂蓋P3的多個限位穿孔P11無法順利地穿過多個一體成型式探針P2,進而發生頂蓋P3無法與底座P1相互固定的問題。 As mentioned above, in practical applications, in an embodiment where the number of integrated probes P2 is large, or the size of integrated probes P2 is small, it is easy to cause multiple limit perforations P11 of the top cover P3 to fail. Smoothly pass through a plurality of integrally formed probes P2, and then the problem that the top cover P3 and the base P1 cannot be fixed to each other occurs.
本發明公開一種探針裝置及一體成型式探針,主要用以改善習知的探針裝置在組裝過程中,容易發生頂蓋難以與設置有多個彈簧探針的底座相互固定的問題。 The invention discloses a probe device and an integrated probe, which are mainly used to improve the problem that the top cover is difficult to be fixed to the base provided with a plurality of spring probes during the assembly process of the conventional probe device.
本發明的其中一實施例公開一種探針裝置,其包含:至少一第一導板,其具有多個第一穿孔;至少一第二導板,其與所述第一導板間隔地設置,至少一所述第二導板具有多個第二穿孔,各個所述第二穿孔貫穿所 述第二導板,多個所述第二穿孔彼此間隔且不相互連通地形成於所述第二導板;多個一體成型式探針,各個所述一體成型式探針包含一本體及兩個凸出結構,所述本體彼此相反的兩端分別定義為一接觸端及一固定端,所述本體於所述接觸端及所述固定端之間形成有一彈性結構;兩個所述凸出結構形成於所述本體的兩側;多個所述一體成型式探針設置於所述第一導板及所述第二導板之間,且各個所述一體成型式探針的兩個所述凸出結構抵靠於所述第二導板面對所述第一導板的一側面,而兩個所述凸出結構未容置於相鄰的兩個所述第二穿孔中,各個所述本體的一端穿出各個所述第一穿孔,而露出於所述第一導板相反於所述第二導板的一側;其中,所述接觸端受壓時,所述彈性結構將彈性變形,而所述接觸端不再受壓時,所述彈性結構將恢復至未變形的狀態;其中,各個所述一體成型式探針的所述本體、兩個所述凸出結構及所述彈性結構能穿過各個所述第二穿孔。 One of the embodiments of the present invention discloses a probe device, which includes: at least one first guide plate having a plurality of first perforations; at least one second guide plate, which is spaced apart from the first guide plate, At least one of the second guide plates has a plurality of second perforations, and each of the second perforations penetrates through the In the second guide plate, a plurality of the second perforations are spaced apart from each other and are not connected to each other and are formed on the second guide plate; a plurality of integrally formed probes, each of the integrally formed probes includes a body and two Two protruding structures, the opposite ends of the body are defined as a contact end and a fixed end, the body forms an elastic structure between the contact end and the fixed end; two protruding ends The structure is formed on both sides of the body; a plurality of the integrally formed probes are arranged between the first guide plate and the second guide plate, and each of the integrally formed probes has two positions The protruding structure abuts against a side surface of the second guide plate facing the first guide plate, and the two protruding structures are not accommodated in two adjacent second through holes, each One end of the body passes through each of the first perforations, and is exposed on the side of the first guide plate opposite to the second guide plate; wherein, when the contact end is pressed, the elastic structure will Elastically deformed, and when the contact end is no longer compressed, the elastic structure will return to an undeformed state; wherein, the body of each of the integrally formed probes, the two protruding structures, and the The elastic structure can pass through each of the second perforations.
本發明的其中一實施例公開一種一體成型式探針,其包含一本體、兩個凸出結構及一彈性結構,本體為沿一軸向方向延伸形成的長條狀結構,本體、凸出結構及彈性結構一體成型地設置,兩個凸出結構由本體彼此相反的兩側向外延伸形成;其中,本體的一端受壓時,彈性結構將彈性變形,而本體的一端不再受壓時,彈性結構將回復至未受壓時的狀態。 One of the embodiments of the present invention discloses an integrally formed probe, which includes a main body, two protruding structures and an elastic structure. The main body is an elongated structure extending in an axial direction. The main body and the protruding structure And the elastic structure are integrally formed, and the two protruding structures are formed by extending outward from the opposite sides of the main body; wherein, when one end of the main body is compressed, the elastic structure will elastically deform, and when one end of the main body is no longer compressed, The elastic structure will return to its uncompressed state.
綜上所述,本發明的探針裝置及一體成型式探針,通過於一體成型式探針設置兩個凸出結構,於第二導板設置多個第二穿孔等設計,讓探針裝置可以方便地進行組裝。 In summary, the probe device and the integrated probe of the present invention are designed to provide two protruding structures on the integrated probe and multiple second perforations on the second guide plate, so that the probe device Can be assembled easily.
為能更進一步瞭解本發明的特徵及技術內容,請參閱以下有關本發明的詳細說明與附圖,但是此等說明與附圖僅用來說明本發明,而非對本發明的保護範圍作任何的限制。 In order to further understand the features and technical content of the present invention, please refer to the following detailed descriptions and drawings about the present invention, but these descriptions and drawings are only used to illustrate the present invention, and do not make any claims about the protection scope of the present invention. limit.
習知技術: Known technology:
P:探針裝置 P: Probe device
P1:底座 P1: Base
P11:限位穿孔 P11: Limit perforation
P2:一體成型式探針 P2: Integrated probe
P3:頂蓋 P3: Top cover
P31:頂蓋穿孔 P31: Top cover perforation
本發明: this invention:
100:探針裝置 100: Probe device
1:第一導板 1: The first guide plate
11:第一穿孔 11: The first perforation
2:間隔框體 2: Interval frame
21:穿孔 21: Piercing
3:第二導板 3: The second guide plate
3A:側面 3A: Side
31:第二穿孔 31: second perforation
311:避讓孔 311: Avoidance Hole
32:限位結構 32: limit structure
321:凹槽 321: Groove
4:一體成型式探針 4: One-piece probe
41:本體 41: body
411:接觸端 411: contact end
412:固定端 412: fixed end
42:凸出結構 42: protruding structure
43:彈性結構 43: Elastic structure
5:輔助導板 5: Auxiliary guide
51:輔助穿孔群 51: auxiliary perforation group
511:輔助穿孔 511: auxiliary perforation
512:卡合槽 512: snap slot
513:避讓槽 513: Avoidance Slot
SP:容置空間 SP: housing space
W1、W2、、W4:寬度 W1, W2, W4: width
W3:軸向寬度 W3: Axial width
W5、W6:徑向寬度 W5, W6: radial width
圖1為習知的探針裝置的剖面示意圖。 Fig. 1 is a schematic cross-sectional view of a conventional probe device.
圖2為本發明的探針裝置的第一實施例的立體示意圖。 Fig. 2 is a three-dimensional schematic diagram of the first embodiment of the probe device of the present invention.
圖3為本發明的探針裝置的第一實施例的分解示意圖。 Fig. 3 is an exploded schematic diagram of the first embodiment of the probe device of the present invention.
圖4為本發明的探針裝置的第一實施例的局部剖面示意圖。 4 is a schematic partial cross-sectional view of the first embodiment of the probe device of the present invention.
圖5為本發明的一體成型式探針的其中一實施例的側面示意圖。 Fig. 5 is a schematic side view of one embodiment of the integrally formed probe of the present invention.
圖6為本發明的探針裝置的第一實施例的局部組裝過程示意圖。 Fig. 6 is a schematic diagram of a partial assembly process of the first embodiment of the probe device of the present invention.
圖7為本發明的探針裝置的第一實施例的局部組裝過程示意圖。 Fig. 7 is a schematic diagram of a partial assembly process of the first embodiment of the probe device of the present invention.
圖8為本發明的探針裝置的第二實施例的局部分解示意圖。 Fig. 8 is a partial exploded schematic view of the second embodiment of the probe device of the present invention.
圖9為本發明的探針裝置的第二實施例的局部剖面示意圖。 FIG. 9 is a schematic partial cross-sectional view of the second embodiment of the probe device of the present invention.
圖10為本發明的探針裝置的第三實施例的局部分解示意圖。 Fig. 10 is a partial exploded schematic view of the third embodiment of the probe device of the present invention.
圖11為本發明的探針裝置的第三實施例的局部組裝過程示意圖。 11 is a schematic diagram of a partial assembly process of the third embodiment of the probe device of the present invention.
圖12為本發明的探針裝置的第三實施例的局部剖面示意圖。 FIG. 12 is a schematic partial cross-sectional view of the third embodiment of the probe device of the present invention.
圖13為本發明的探針裝置的第四實施例的局部剖面示意圖。 FIG. 13 is a schematic partial cross-sectional view of the fourth embodiment of the probe device of the present invention.
於以下說明中,如有指出請參閱特定圖式或是如特定圖式所示,其僅是用以強調於後續說明中,所述及的相關內容大部份出現於該特定圖式中,但不限制該後續說明中僅可參考所述特定圖式。 In the following description, if it is pointed out, please refer to the specific drawing or as shown in the specific drawing, it is only used to emphasize that in the subsequent description, most of the related content appears in the specific drawing. However, it is not limited that only the specific drawings can be referred to in this subsequent description.
請一併參閱圖2至圖4,圖2顯示為本發明的探針裝置的第一實施例的立體示意圖,圖3顯示為本發明的探針裝置的第一實施例的分解示意圖,圖4顯示為圖2所示的本實施例的探針裝置100沿Ⅳ-Ⅳ剖面線剖開後的剖面示意圖。本發明的探針裝置100包含一第一導板1、一間隔框體2、一第二導板3及多個一體成型式探針4。第一導板1具有多個第一穿孔11。各個第一
穿孔11彼此間隔地設置,且各個第一穿孔11貫穿第一導板1。於本實施例的圖式中,是以探針裝置100包含6個一體成型式探針4為例,但一體成型式探針4的數量不以6個為限。
Please refer to FIGS. 2 to 4 together. FIG. 2 is a perspective view of the first embodiment of the probe device of the present invention, and FIG. 3 is an exploded view of the first embodiment of the probe device of the present invention, and FIG. 4 It is a schematic cross-sectional view of the
間隔框體2設置於第一導板1的一側,第二導板3設置於間隔框體2相反於第一導板1的一側,而第二導板3與第一導板1彼此間隔地設置。在實際應用中,第一導板1、間隔框體2及第二導板3三者之間例如可以是利用多個螺絲相互固定,但不以此為限。其中,間隔框體2主要是用來使第一導板1與第二導板3彼此間隔地設置,因此,間隔框體2的外型及其厚度等皆可依據需求變化,不以圖中所示為限。特別說明的是,只要第一導板1與第二導板3兩者是間隔地設置,探針裝置100也可以是不具有間隔框體2,舉例來說,在不同的實施例中,間隔框體2與第一導板1可以是一體成型地設置,或者,間隔框體2與第二導板3可以是一體成型地設置。
The
第二導板3具有多個第二穿孔31,各個第二穿孔31貫穿第二導板3,多個第二穿孔31彼此間隔且不相互連通地設置。其中,各個第二穿孔31是大致對應於第一導板1的各個第一穿孔11設置。各個第二穿孔31是用來提供各個一體成型式探針4穿過,因此,各個第二穿孔31的外型可以是依據一體成型式探針4的外型進行變化。
The
各個一體成型式探針4包含一本體41、兩個凸出結構42及一彈性結構43,本體41、兩個凸出結構42及彈性結構43一體成型地設置。本體41的外型可以大致為沿一軸向方向延伸形成的長條狀矩形體結構,即業界俗稱之「矩形探針」或「方型探針」,但本體41的外型不以此為限,在不同的實施例,本體41的外型也可以是大致為圓柱狀結構。
Each integrally formed
兩個凸出結構42形成於本體41的兩側(例如是彼此相反的兩側)。在本體41的外型為長條狀矩形體結構的實施例中,兩個凸出結構42可以是由本體41彼此相反的兩個側面向外延伸形成,而兩個凸出結構42可以是
大致位於同一軸線上,且各個凸出結構42的外型可以是矩形體。在實際應用中,各個凸出結構42的外型、尺寸及形成於本體41的位置,皆可依據需求變化,不以本實施例各圖式所示為限。
Two protruding
本體41彼此相反的兩端分別定義為一接觸端411及一固定端412,本體41於接觸端411及固定端412之間形成有所述彈性結構43。當本體41的接觸端411受外力抵壓時,彈性結構43將彈性變形,並對應產生彈性回復力,而當本體41的接觸端411不再受外力抵壓時,彈性結構43受壓所產生的彈性回復力,將使彈性結構43恢復至未受壓的狀態。具體來說,所述彈性結構43受壓後最大變化量,即為一體成型式探針4的最大行程。
The opposite ends of the
在本實施例的圖式中,是以彈性結構43的外型大致呈現彎曲狀的矩形體為例,但彈性結構43的外型不以此為限,彈性結構43主要是用來使一體成型式探針4的一端受壓時,能夠於一體成型式探針4的長度方向彈性變形,因此,只要是能在一體成型式探針4的一端受壓時,使一體成型式探針4於長度方向彈性變形,彈性結構43可以是任意外型。如圖5所示,其顯示為本發明的一體成型式探針4的其中一實施例的側面示意圖,一體成型式探針4的彈性結構43也可以是呈現為圖5中所示的柵欄狀結構。
In the drawings of this embodiment, the shape of the
請一併參閱圖3及圖6,圖6為本發明的探針裝置的第一實施例的局部組裝過程示意圖。各個一體成型式探針4的兩個凸出結構42的寬度W1與本體41的寬度W2和,是不大於第二導板3的各個第二穿孔31的軸向寬度W3,而各個一體成型式探針4的本體41及兩個凸出結構42能穿過第二穿孔31。在本實施例中,是以各個一體成型式探針4的本體41為矩形體且各個凸出結構42為矩形體,而各第二穿孔31為矩形穿孔為例,但在一體成型式探針4的本體41及凸出結構42為不相同的外型時,第二穿孔31的外型可以是對應於本體41及凸出結構42的外型而變化,舉例來說,在一體成型式探針4的本體41為圓柱體,而兩個凸出結構為矩形體的實施例中,第二穿孔31可以是由
一圓形穿孔及兩個方形穿孔共同組成,而一體成型式探針4的本體41則能通過圓形穿孔,而兩個凸出結構42則能通過方形穿孔。
Please refer to FIGS. 3 and 6 together. FIG. 6 is a schematic diagram of a partial assembly process of the first embodiment of the probe device of the present invention. The sum of the width W1 of the two protruding
如圖3及圖6所示,各個一體成型式探針4的彈性結構43的寬度W4小於各第二穿孔31的軸向寬度W3,而各個一體成型式探針4的彈性結構43可以通過第二穿孔31。各個第二穿孔31是用來使一體成型式探針4的兩個凸出結構42及彈性結構43通過,因此,各個第二穿孔31的外型及尺寸,可以是依據各個一體成型式探針4的本體41、兩個凸出結構42及彈性結構43的外型進行變化。為利於第二穿孔31的外型設計,可以是使彈性結構43對應位於兩個凸出結構42的正下方,並使各個一體成型式探針4的彈性結構43的寬度W4,小於一體成型式探針4的本體41的寬度W2及兩個凸出結構42的寬度W1和(亦即,W4<W1+W1+W2),如此,只要一體成型式探針4的本體41及兩個凸出結構42能穿過第二穿孔31,則彈性結構43亦能穿過第二穿孔31。若是彈性結構43是由本體41向一側彎曲而成,則彈性結構43的寬度W4可以是小於相對應的凸出結構42的寬度W1即可。
As shown in Figures 3 and 6, the width W4 of the
請一併參閱圖4、圖6及圖7,圖7為本發明的探針裝置的第一實施例的第一導板的一部分、第二導板的一部分及單一個一體成型式探針的分解示意圖(為利清楚顯示一體成型式探針4的結構,於圖7中並未顯示前述間隔框體2)。本發明的探針裝置的一體成型式探針4安裝於第一導板1及第二導板3的植針方式可以是:如圖6所示,先使一體成型式探針4的彈性結構43及兩個凸出結構42依序通過第二導板3的第二穿孔31;在使兩個凸出結構42通過第二穿孔31,而使兩個凸出結構42位於第二導板3面對第一導板1的一側後,旋轉一體成型式探針4(如圖7所示),以使兩個凸出結構42不再位於第二穿孔31的正下方,藉此完成植針步驟。在實際應用中,一體成型式探針4旋轉的角度可以是依據兩個凸出結構42的位置決定,於此不加以限制,以圖7
所示的一體成型式探針4來說,在安裝一體成型式探針4時,可以是使一體成型式探針4旋轉90度。
Please refer to FIG. 4, FIG. 6 and FIG. 7. FIG. 7 is a part of the first guide plate, a part of the second guide plate, and a single integrated probe of the first embodiment of the probe device of the present invention An exploded schematic view (in order to clearly show the structure of the
承上,在使兩個凸出結構42通過第二穿孔31的過程中,可以是使一體成型式探針4的一端穿過第一導板1的第一穿孔11,或者,也可以是在旋轉一體成型式探針4後,再使一體成型式探針4向靠近第一導板1的方向移動,而使一體成型式探針4的一端穿過第一穿孔11。當然,在使兩個凸出結構42通過第二穿孔31的過程中,使一體成型式探針4的一端穿過第一穿孔11的實施例中,第一穿孔11的孔徑是略大於一體成型式探針4的一端的寬度,而一體成型式探針4能相對於第一穿孔11旋轉。在實際應用中,為利於一體成型式探針4於第一穿孔11中旋轉,第一穿孔11可以是圓形穿孔,或者,第一穿孔11的孔徑是大於一體成型式探針4的外徑。如圖2及圖3所示,在實際應用中,在一體成型式探針4的本體41的至少一部分為矩形條狀結構的實施例中,第二導板3還可以是包含多個避讓孔311,多個避讓孔311與多個第二穿孔31相互連通,各個避讓孔311的徑向寬度W6大於各個第二穿孔31的徑向寬度W5,各個一體成型式探針4的一部分穿設各個避讓孔311,而各個一體成型式探針4能對應於各個避讓孔311中旋轉。換言之,為了使一體成型式探針4能夠順暢地相對於第二導板3旋轉,除了可以是加寬第二穿孔31的軸向寬度外,也可以是使第二導板3形成有多個避讓孔311。
In addition, in the process of passing the two protruding
如圖6及圖7所示,在將一體成型式探針4安裝於第一導板1及第二導板3的過程中,可以是利用外部的相關輔助構件(圖未示,例如是各式墊材等),以使第二導板3與間隔框體2之間形成有間隙,如此,將可確保一體成型式探針4的旋轉過程中,不會受到第二導板3的干擾。當然,若是在安裝一體成型式探針4的過程中,讓第二導板3與間隔框體2之間形成有間隙,則在旋轉一體成型式探針4,以使兩個凸出結構42不位於第二穿孔31的正下
方後,還必須移除相關輔助構件,以使第二導板3向第一導板1的方向移動,並據以使兩個凸出結構42對應抵靠於第二導板3面向第一導板1的一側面3A(如圖4所示)。
As shown in Figures 6 and 7, in the process of installing the
依上所述,如圖3及圖4,本實施例的探針裝置100在完成組裝後,各個凸出結構42是抵靠於第二導板3面對第一導板1的側面3A,而一體成型式探針4將的活動範圍將被限制在第一導板1與第二導板3之間。其中,一體成型式探針4的穿出第一穿孔11的一端可以是接觸端411,其用來接觸待測物(device under test,DUT);在不同的實施例中,一體成型式探針4穿出第一穿孔11的一端,也可以是固定端412,其用來固定於電路板。
As described above, as shown in FIGS. 3 and 4, after the
如圖4及圖5所示,值得一提的是,間隔框體2的中心具有一穿孔21,穿孔21貫穿間隔框體2設置。當探針裝置100的第一導板1、間隔框體2及第二導板3相互固定時,將第一導板1、間隔框體2及第二導板3共同形成一容置空間SP,而多個一體成型式探針4的兩個凸出結構42的部分則是對應位於容置空間SP中。所述間隔框體2主要是用來使第一導板1與第二導板3彼此間隔地設置,而使各個一體成型式探針4的彈性結構43能對應於容置空間SP中彈性變形,因此,間隔框體2的外型及厚度等,可依據各個一體成型式探針4的外型來決定。
As shown in FIGS. 4 and 5, it is worth mentioning that the center of the
綜上所述,本發明的探針裝置100通過一體成型式探針4的凸出結構42、第二導板3的多個第二穿孔31等設計,相關機械手臂或人員將各個一體成型式探針4插入第一導板1及第二導板3中並旋轉後,即可完成該一體成型式探針4的植針作業,而本發明的探針裝置100不會存在有圖1所示的習知探針裝置P,在將多個一體成型式探針P2植入底座P1後,欲將頂蓋P3與底座P1相互固定時,多個一體成型式探針P2可能無法正確地穿過頂蓋P3的多個頂蓋穿孔P31的問題。
In summary, the
請一併參閱圖8至圖9,圖8顯示為本發明的探針裝置的第二實施例的單一個一體成型式探針、第一導板及第二導板的局部分解示意圖,圖9顯示為本發明的探針裝置的第二實施例的局部剖面示意圖。本實施例的探針裝置100與前述第一實施例最大不同之處在於:第二導板3的側面3A還形成有多組限位結構32,各組限位結構32包含兩個凹槽321,各個凹槽321未貫穿第二導板3,各組限位結構32的兩個凹槽321與各第二穿孔31相互連通,且與一個第二穿孔31相連通的兩個凹槽321能對應容置單一個一體成型式探針4的兩個凸出結構42。簡單來說,第二導板3於所述側面3A形成有為盲孔的多個凹槽321,每一個第二穿孔31與兩個凹槽321相連通。
Please refer to FIGS. 8-9 together. FIG. 8 shows a partial exploded view of a single integrated probe, the first guide plate and the second guide plate of the second embodiment of the probe device of the present invention. FIG. 9 Shown is a schematic partial cross-sectional view of the second embodiment of the probe device of the present invention. The biggest difference between the
在實際應用中,本實施例的探針裝置100的多個一體成型式探針4的植針流程可以是:先利用相關機構(例如可以是墊片、類似於間隔框體2的構件等),使第二導板3與間隔框體2間隔地設置,接著,使各個一體成型式探針4的本體41及兩個凸出結構42穿過第二導板3的第二穿孔31後,旋轉各個一體成型式探針4,以使各個一體成型式探針4的兩個凸出結構42位於兩個凹槽321的正下方;當每一個一體成型式探針4的兩個凸出結構42都對應位於相鄰的兩個凹槽321的正下方時,則將原本設置於第二導板3與間隔框體2之間的相關機構移開,以使第二導板3向間隔框體2的方向移動,據以使各個一體成型式探針4的兩個凸出結構42對應容置於第二導板3的兩個凹槽321中;最後,使第一導板1、間隔框體2及第二導板3相互固定,據以完成所述植針作業。也就是說,本實施例的探針裝置100,在完成各個一體成型式探針4的植針作業後,各個一體成型式探針4的兩個凸出結構42將對應卡合於第二導板3的兩個凹槽321中,而各個一體成型式探針4將難以相對於第二導板3旋轉。
In practical applications, the needle implantation process of the multiple
依上所述,通過於第二導板3的所述側面3A形成多個凹槽321等設計,各個一體成型式探針4的兩個凸出結構42可以對應卡合於兩個凹槽
321中,藉此,各個一體成型式探針4將不易相對於第一導板1及第二導板3旋轉。在實際應用中,只要各個凸出結構42能對應卡合於凹槽321中,並據以限制各個一體成型式探針4不易相對於第二導板3旋轉,各個凸出結構42的外型、尺寸及各個凹槽321的外型及尺寸,皆可依據需求設置。
As mentioned above, by forming a plurality of
請一併參閱圖10至圖12,圖10顯示為本發明的探針裝置的第三實施例的立體局部分解示意圖,圖11顯示為本發明的探針裝置的第三實施例的組裝過程示意圖,圖12顯示為本發明的探針裝置的第三實施例的局部剖面示意圖。本實施例的探針裝置100與前述第一實施例最大不同之處在於:探針裝置100還包含一輔助導板5。輔助導板5設置於第二導板3面對第一導板1的一側,亦即,輔助導板5設置於第一導板1與第二導板3之間。在實際應用中,第一導板1、間隔框體2、第二導板3及輔助導板5可以是通過螺絲相互固定,但固定方式不以此為限。
Please refer to FIGS. 10 to 12 together. FIG. 10 shows a three-dimensional partial exploded schematic view of the third embodiment of the probe device of the present invention, and FIG. 11 shows a schematic diagram of the assembly process of the third embodiment of the probe device of the present invention. 12 shows a schematic partial cross-sectional view of the third embodiment of the probe device of the present invention. The biggest difference between the
輔助導板5具有多個輔助穿孔群51。各個輔助穿孔群51包含一輔助穿孔511及兩個卡合槽512,各個輔助穿孔511貫穿輔助導板5,各個卡合槽512由輔助導板5的一側內凹形成,且各個卡合槽512面對第二導板3設置,各個輔助穿孔群51的輔助穿孔511與兩個卡合槽512相互連通。
The
輔助導板5固定於第二導板3的一側,且各第二穿孔31與各組輔助穿孔群51的輔助穿孔511相互連通。在實際應用中,各個第二穿孔31與各組輔助穿孔群51的輔助穿孔511可以是具有完全相同的外型及尺寸,而各個一體成型式探針4的兩個凸出結構42及彈性結構43,能先後穿過各個第二穿孔31及各組輔助穿孔群51的輔助穿孔511。各組輔助穿孔群51的兩個卡合槽512用以與各個一體成型式探針4的兩個凸出結構42相互卡合。
The
本實施例的探針裝置100的各個一體成型式探針4的植針作業流程可以是:先利用相關構件使第二導板3與輔助導板5之間形成間隔,而後,使各個一體成型式探針4的彈性結構43穿過第二導板3的第二穿孔31及輔 助導板5的輔助穿孔511,並使兩個凸出結構42穿過第二穿孔31而位於第二導板3與輔助導板5之間;接著,旋轉一體成型式探針4(例如是旋轉90度),以使兩個凸出結構42不再位於第二穿孔31的正下方,而使兩個凸出結構42位於相鄰的兩個卡合槽512的正上方;最後,當所有一體成型式探針4都穿設於第二導板3及輔助導板5並旋轉後,則將原本設置於輔助導板5與間隔框體2之間的構件抽離,以使輔助導板5及第二導板3向間隔框體2的方向移動,而各個一體成型式探針4的兩個凸出結構42將對應卡合設置於相鄰的兩個卡合槽512中,且第二導板3將對應抵靠於輔助導板5相反於第一導板1的一側,如此,各個一體成型式探針4將無法輕易地被旋轉。 The needle planting process of each integrated probe 4 of the probe device 100 of this embodiment can be as follows: first use related components to form a gap between the second guide plate 3 and the auxiliary guide plate 5, and then make each one integrated The elastic structure 43 of the type probe 4 passes through the second perforation 31 of the second guide plate 3 and the auxiliary The auxiliary perforation 511 of the auxiliary guide plate 5, and the two protruding structures 42 pass through the second perforation 31 to be located between the second guide plate 3 and the auxiliary guide plate 5; then, rotate the integrated probe 4 (for example, Rotate 90 degrees) so that the two protruding structures 42 are no longer directly below the second perforation 31, but the two protruding structures 42 are positioned directly above the two adjacent engaging grooves 512; finally, when all After the integrated probe 4 is inserted through the second guide plate 3 and the auxiliary guide plate 5 and rotated, the components originally arranged between the auxiliary guide plate 5 and the spacer frame 2 are removed to make the auxiliary guide plate 5 and the second guide plate 3 move in the direction of the spacer frame 2, and the two protruding structures 42 of each integrally formed probe 4 will be correspondingly locked in the two adjacent locking grooves 512, and the first The two guide plates 3 will correspondingly abut against the side of the auxiliary guide plate 5 opposite to the first guide plate 1, so that each integrated probe 4 cannot be easily rotated.
如圖10所示,值得一提的是,在第二導板3具有多個避讓孔311的情況下,輔助導板5也可以是具有相對應的多個避讓槽513,各個避讓槽513的徑向寬度大於各個輔助穿孔511的徑向寬度,且各個輔助穿孔511與兩個避讓槽513相互連通。通過多個避讓孔311、避讓槽513的設計,可以讓各個一體成型式探針4更容易相對於第二導板3及輔助導板5旋轉。
As shown in FIG. 10, it is worth mentioning that in the case where the
請參閱圖12,其顯示為本發明的探針裝置的第四實施例的局部剖面示意圖。如圖所示,本實施例的探針裝置與前述第三實施例的最大不同之處在於:輔助導板5的多組輔助穿孔群51的卡合槽512是由輔助導板5面向第一導板1的一側向內凹設形成,而各個一體成型式探針4在固定於第一導板1及第二導板3之間時,一體成型式探針4的兩個凸出結構42是對應位於輔助導板5與第一導板1之間,且兩個凸出結構42的至少一部分是對應卡合於相鄰的兩個卡合槽512中。本實施例在具體的應用中,各個卡合槽512也可以是貫穿輔助導板5設置。
Please refer to FIG. 12, which shows a schematic partial cross-sectional view of the fourth embodiment of the probe device of the present invention. As shown in the figure, the biggest difference between the probe device of this embodiment and the aforementioned third embodiment is that the engaging
本實施例的探針裝置100的一體成型式探針4的安裝流程可以是:先利用相關構件使輔助導板5與間隔框體2之間形成有間隔;接著,逐一使各個一體成型式探針4穿過第二導板3的各個第二穿孔31及輔助導板5的各
個輔助穿孔511,並旋轉一體成型式探針4,以使各個一體成型式探針4的兩個凸出結構42對應位於相鄰的兩個卡合槽512的正下方;最後,抽離位於輔助導板5與間隔框體2之間的相關構件,以使輔助導板5及第二導板3一同向第一導板1的方向移動,而使各個卡合槽512與各個凸出結構42相互卡合。
The installation process of the
特別說明的是,在實際應用中,上述各實施例所指的一體成型式探針4也可以是被單獨地製造、販售,而各個一體成型式探針4不侷限於僅可與探針裝置100一同製造、販售。
It is particularly noted that, in practical applications, the
綜上所述,本發明的探針裝置及一體成型式探針,通過於一體成型式探針設置兩個凸出結構,於第二導板設置多個第二穿孔等設計,讓探針裝置可以方便地進行組裝。 In summary, the probe device and the integrated probe of the present invention are designed to provide two protruding structures on the integrated probe and multiple second perforations on the second guide plate, so that the probe device Can be assembled easily.
以上所述僅為本發明的較佳可行實施例,非因此侷限本發明的專利範圍,故舉凡運用本發明說明書及圖式內容所做的等效技術變化,均包含於本發明的保護範圍內。 The above descriptions are only the preferred and feasible embodiments of the present invention, which do not limit the scope of the present invention. Therefore, all equivalent technical changes made by using the description and drawings of the present invention are included in the protection scope of the present invention. .
100:探針裝置 100: Probe device
1:第一導板 1: The first guide plate
11:第一穿孔 11: The first perforation
2:間隔框體 2: Interval frame
3:第二導板 3: The second guide plate
3A:側面 3A: Side
31:第二穿孔 31: second perforation
4:一體成型式探針 4: One-piece probe
41:本體 41: body
42:凸出結構 42: protruding structure
43:彈性結構 43: Elastic structure
SP:容置空間 SP: housing space
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Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
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WO1996037931A1 (en) * | 1995-05-26 | 1996-11-28 | Formfactor, Inc. | Spring element electrical contact and methods |
US20160370406A1 (en) * | 2013-03-15 | 2016-12-22 | Johnstech International Corporation | On-Center Electrically Conductive Pins For Integrated Testing |
TW201915498A (en) * | 2017-09-19 | 2019-04-16 | 韓商威儀科技股份有限公司 | Needle unit for vertical probe card with reduced scrub phenomenon and vertical probe using thereof |
TW201942584A (en) * | 2018-04-03 | 2019-11-01 | 中華精測科技股份有限公司 | Probe card device and probe head |
-
2020
- 2020-05-26 TW TW109117434A patent/TWI735240B/en active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
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WO1996037931A1 (en) * | 1995-05-26 | 1996-11-28 | Formfactor, Inc. | Spring element electrical contact and methods |
US20160370406A1 (en) * | 2013-03-15 | 2016-12-22 | Johnstech International Corporation | On-Center Electrically Conductive Pins For Integrated Testing |
TW201915498A (en) * | 2017-09-19 | 2019-04-16 | 韓商威儀科技股份有限公司 | Needle unit for vertical probe card with reduced scrub phenomenon and vertical probe using thereof |
TW201942584A (en) * | 2018-04-03 | 2019-11-01 | 中華精測科技股份有限公司 | Probe card device and probe head |
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