TWI716935B - Method, device and equipment for inspecting sheet objects - Google Patents

Method, device and equipment for inspecting sheet objects Download PDF

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Publication number
TWI716935B
TWI716935B TW108124796A TW108124796A TWI716935B TW I716935 B TWI716935 B TW I716935B TW 108124796 A TW108124796 A TW 108124796A TW 108124796 A TW108124796 A TW 108124796A TW I716935 B TWI716935 B TW I716935B
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conveying
inspection
rail
flow path
patent application
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TW108124796A
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TW202102424A (en
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紀証耀
陳瑞銘
黃景德
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萬潤科技股份有限公司
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Abstract

本發明提供一種薄片物件檢查方法、裝置及設備,其檢查方法包括:使一薄片物件被以一搬送流路進行傳送;在該搬送流路使該薄片物件被一治具吸附;使被該治具吸附的該薄片物件被一整平單元下壓;使該整平單元脫離該薄片物件後,以一檢視單元對該對該薄片物件進行檢視;藉此使薄片物件可以被進行其上製程成果檢查。 The present invention provides a thin object inspection method, device and equipment. The inspection method includes: causing a thin object to be transported by a conveying flow path; causing the thin object to be absorbed by a jig in the conveying flow path; The sheet object with adsorption is pressed down by a flattening unit; after the flattening unit is separated from the sheet object, the sheet object is inspected by a viewing unit; thereby, the sheet object can be processed on the sheet object. an examination.

Description

薄片物件檢查方法、裝置及設備 Method, device and equipment for inspecting sheet objects

本發明係有關於一種物件檢查方法、裝置及設備,尤指一種對於可能在製程中產生撓曲變形的薄片物件進行其上製程成果檢查的薄片物件檢查方法、裝置及設備。 The present invention relates to an object inspection method, device and equipment, in particular to a thin object inspection method, device and equipment for inspecting the production process results of a thin object that may be deformed during the manufacturing process.

按,一般的晶片具有多種的製程,一種在薄片狀矩形基板上設置形成複數個矩陣排列的電路區間,使該基板在經清潔、噴助焊劑、及在各該電路區間進行複數之錫球植放後,經烘烤再將晶粒植放於該電路區間的該錫球上焊固聯接及定位的製程被業界使用,此種製程在植球(錫球)並經烘烤後,通常必需經由一道檢查的程序,以確認基板上的錫球是否在正確的位置。 According to the general chip, there are a variety of manufacturing processes. One is to form a plurality of circuit sections arranged in a matrix on a thin rectangular substrate, so that the substrate is cleaned, flux sprayed, and multiple solder balls are implanted in each circuit section. After placing, after baking, the process of soldering and fixing the connection and positioning of the die on the solder ball in the circuit area is used in the industry. This process is usually necessary after the ball (solder ball) is planted and baked Go through an inspection process to confirm whether the solder balls on the substrate are in the correct position.

先前技術採用抽樣檢查的方式作人工檢查,原因在於薄片狀的該基板經烘烤後會產生撓曲變形,且變形的方向具有多種的變數,有縱向弧曲、亦有橫向弧曲,有朝上弧曲、亦有朝下弧曲,操作者困難在弧曲變形的該基板上作自動化的植球檢查,只能選擇取下變形量較小的基板以人工方式作抽樣檢查,如此既欠缺效率,亦可能會有不良品產生而未被發現。 The prior art uses sampling inspection for manual inspection. The reason is that the flaky substrate will be flexed and deformed after baking, and the direction of deformation has a variety of variables. There are longitudinal arcs and transverse arcs. There are curved upwards and downward curved. It is difficult for the operator to perform automated ball planting inspections on the curved and deformed substrates. They can only choose to remove the substrates with a small amount of deformation for manual sampling inspection, which is lacking. Efficiency, defective products may also be produced without being discovered.

爰是,本發明的目的,在於提供一種適用於對薄板狀物件進行檢查的薄片物件檢查裝置。 The object of the present invention is to provide a sheet object inspection device suitable for inspecting thin plate objects.

本發明的另一目的,在於提供一種使用如所述薄片物件檢查裝置的薄片物件檢查方法。 Another object of the present invention is to provide a thin object inspection method using the thin object inspection device.

本發明的又一目的,在於提供一種用以執行如所述薄片物件檢查方法的裝置。 Another object of the present invention is to provide a device for performing the inspection method of the thin object.

本發明的再一目的,在於提供一種使用如所述薄片物件檢查方法的設備。 Another object of the present invention is to provide a device using the thin object inspection method.

依據本發明目的之薄片物件檢查裝置,包括:一軌架,其上形成傳送一薄片物件的一搬送流路;一治具,設於該搬送流路中,該治具設有負壓可吸附該薄片物件;一整平單元,設於該搬送流路中,可被位移至該治具上方;一檢視單元,設於該搬送流路中,可被位移至該治具上方。 A thin object inspection device according to the object of the present invention includes: a rail frame on which a conveying flow path for conveying a thin object is formed; a jig, which is arranged in the conveying flow path, and the jig is provided with a negative pressure capable of adsorbing The sheet object; a leveling unit, which is arranged in the conveying flow path, can be displaced to the top of the jig; a viewing unit, which is arranged in the conveying flow path, can be displaced to the top of the jig.

依據本發明另一目的之薄片物件檢查方法,使用如所述薄片物件檢查裝置,包括:使一薄片物件被以一搬送流路進行傳送;在該搬送流路使該薄片物件被一治具吸附;使被該治具吸附的該薄片物件被一整平單元下壓;使該整平單元脫離該薄片物件後,以一檢視單元對該對該薄片物件進行檢視。 According to another object of the present invention, a method for inspecting a thin object using the thin object inspection device includes: causing a thin object to be transported by a conveying flow path; in the conveying flow path, causing the thin object to be adsorbed by a jig ; The sheet object adsorbed by the fixture is pressed down by a flattening unit; after the flattening unit is separated from the sheet object, the sheet object is inspected with a viewing unit.

依據本發明又一目的之薄片物件檢查裝置,包括:用以執行如所述薄片物件檢查方法的裝置。 According to another object of the present invention, a thin object inspection device includes: a device for executing the thin object inspection method.

依據本發明再一目的之薄片物件檢查設備,使用如所述薄片物件檢查方法,更包括一入料裝置,該入料裝置設有複數個提供運送流路的輸送道,用以輸入該薄片物件。 According to still another object of the present invention, a sheet object inspection device using the method for inspecting a sheet object further includes a feeding device provided with a plurality of conveying channels providing a conveying flow path for inputting the sheet object .

依據本發明再一目的之另一薄片物件檢查設備,使用如所述薄片物件檢查方法,更包括一收集裝置,設有複數個框盒。 According to another object of the present invention, another thin object inspection device using the thin object inspection method as described above further includes a collecting device provided with a plurality of frame boxes.

本發明實施例之薄片物件檢查方法、裝置及設備,由於該薄片物件可以在吸附定位時同時進行壓整操作,使該薄片物件各周緣都被吸附形 成平整的表面,減少撓曲變形的現象,令後續的檢視作業可以取的精確的檢視結果,減少誤判及不良率。 According to the method, device and equipment for inspecting a thin object according to the embodiment of the present invention, since the thin object can be pressed while being adsorbed and positioned, each peripheral edge of the thin object is adsorbed It becomes a flat surface to reduce the phenomenon of deflection and deformation, so that the follow-up inspection operation can obtain accurate inspection results, and reduce the misjudgment and defect rate.

A:入料裝置 A: Feeding device

A1:輸送道 A1: Conveyor

A2:輥筒 A2: Roller

A3:出料口 A3: Outlet

A4:驅動件 A4: Driver

A5:閘門 A5: Gate

A6:遮蔽件 A6: Shield

A7:導引件 A7: guide

A8:偵測器 A8: Detector

A9:驅動件 A9: Driver

A91:皮帶 A91: Belt

B:第一轉換裝置 B: The first conversion device

B1:第一軌座 B1: The first rail seat

B2:載入軌架 B2: Loading the rail

B21:輸送流路 B21: Conveying flow path

B211:出料口 B211: discharge port

B22:輥筒 B22: roller

B221:驅動件 B221: Driver

B222:皮帶 B222: Belt

B23:側輥軸 B23: Side roller

B24:撥件 B24: dial

B241:驅動件 B241: Driver

B242:滑軌 B242: Slide rail

B243:驅動件 B243: Driver

B25:閘門 B25: Gate

B251:驅動件 B251: Driver

B26:遮蔽件 B26: Shield

B261:導引件 B261: guide

B27:偵測器 B27: Detector

B28:推抵件 B28: Pushing piece

B281:聯動架 B281: linkage frame

B282:驅動件 B282: Driver

B283:皮帶 B283: Belt

B284:滑軌 B284: Slide rail

C:檢查裝置 C: Inspection device

C1:軌架 C1: Rail frame

C11:搬送流路 C11: Transport flow path

C111:入料區 C111: Feeding area

C112:檢查區 C112: Inspection area

C113:排料區 C113: Discharge area

C114:入口端 C114: Entry side

C12:第一軌架 C12: The first rail

C121:側架 C121: side frame

C122:驅動件 C122: Driver

C123:皮帶 C123: Belt

C124:槽道 C124: Channel

C125:驅動件 C125: Driver

C126:移靠機構 C126: Relocation mechanism

C127:撥件 C127: dial

C128:驅動件 C128: Driver

C129:滑軌 C129: Slide rail

C13:第二軌架 C13: Second rail

C131:側架 C131: side frame

C132:驅動件 C132: Driver

C133:皮帶 C133: Belt

C134:槽道 C134: Channel

C135:驅動件 C135: Driver

C136:移靠機構 C136: Relocation mechanism

C137:夾持件 C137: Clamping parts

C1371:驅動件 C1371: Driver

C1372:驅動件 C1372: Driver

C1373:滑軌 C1373: Slide rail

C138:抵推件 C138: Pushing pieces

C1381:抵推部 C1381: Arrival and Push Department

C1382:驅動件 C1382: Driver

C1383:皮帶 C1383: belt

C1384:滑軌 C1384: Slide rail

C139:排出口 C139: Outlet

C1391:感測件 C1391: Sensor

C1392:擋抵件 C1392: Blocking piece

C1393:擋抵部 C1393: Blocking Department

C14:壓抵機構 C14: Pressing mechanism

C141:驅動件 C141: Driver

C142:壓輪 C142: Pressure roller

C143:驅動件 C143: Driver

C15:檢視器 C15: Viewer

C16:治具 C16: Fixture

C161:第一治具座 C161: The first fixture seat

C162:第二治具座 C162: The second fixture seat

C163:樞桿 C163: Pivot

C164:間隔件 C164: Spacer

C165:底座 C165: Base

C1651:鏤空區間 C1651: hollow interval

C166:驅動件 C166: Driver

C1661:缸桿 C1661: Cylinder rod

C167:扣件 C167: Fastener

C168:模座 C168: Mould base

C169:吸附座 C169: Adsorption seat

C1691:載模 C1691: Load mold

C1692:容置區間 C1692: containment interval

C1693:密封墊 C1693: gasket

C1694:透氣座 C1694: Breathable seat

C1695:氣孔 C1695: Stoma

C2:檢視單元 C2: Viewing unit

C21:軌座 C21: Rail seat

C211:座架 C211: Seat frame

C22:軌座 C22: Rail seat

C23:固定座 C23: fixed seat

C231:滑軌 C231: Slide rail

C24:鏡頭 C24: lens

C241:光源座 C241: light source base

C3:整平單元 C3: Leveling unit

C31:軌座 C31: Rail seat

C32:軌座 C32: Rail seat

C33:固定架 C33: Fixed frame

C331:第一固定座 C331: The first fixed seat

C3311:鏤空區間 C3311: hollow interval

C332:第二固定座 C332: second fixed seat

C3321:懸吊座 C3321: suspension seat

C3322:端部 C3322: end

C3323:擋件 C3323: Block

C3324:微調件 C3324: Fine tuning pieces

C3325:感測件 C3325: Sensor

C333:樞桿 C333: Pivot

C334:間距 C334: Spacing

C335:架板 C335: shelf board

C336:驅動件 C336: Driver

C337:扣件 C337: Fastener

C338:彈性件 C338: Elastic parts

C34:墊座 C34: Pedestal

C341:墊體 C341: Pad body

C4:聯接件 C4: coupling

D:第二轉換裝置 D: The second conversion device

D1:第二軌座 D1: The second rail seat

D2:第三軌座 D2: Third rail seat

D3:移出軌架 D3: Remove the rail rack

D31:側架 D31: Side frame

D311:抵壓輪 D311: Pressure wheel

D312:驅動件 D312: Driver

D32:驅動件 D32: Driver

D33:皮帶 D33: Belt

D34:槽道 D34: Channel

D35:輸送流路 D35: Conveying flow path

D351:出口端 D351: Exit

D36:移靠機構 D36: Relocation mechanism

D361:擋抵部 D361: Blocking Department

D371:驅動件 D371: Driver

D372:皮帶 D372: Belt

D373:滑軌 D373: Slide rail

E:收集裝置 E: Collection device

E1:盒座 E1: Box holder

E11:槽間 E11: Slot

E12:滾輪 E12: Wheel

E2:框盒 E2: Box

E21:開口 E21: Opening

E3:座架 E3: Seat frame

E31:燈號 E31: light signal

E32:偵測器 E32: Detector

F:第一轉換裝置 F: The first conversion device

F1:載入軌架 F1: Load rail frame

G:第二轉換裝置 G: Second conversion device

G1:移出軌架 G1: Remove the rail rack

H:檢查裝置 H: Inspection device

H1:軌架 H1: Rail frame

H11:治具 H11: Fixture

H2:軌座 H2: Rail seat

H3:檢視單元 H3: Viewing unit

H4:整平單元 H4: Leveling unit

K:基板 K: substrate

K1:電路區間 K1: Circuit section

L:植球檢查設備 L: Ball planting inspection equipment

L1:機台 L1: Machine

L2:台面 L2: Countertop

L3:區間 L3: interval

M:軌架 M: Rail frame

M1:輸送流路 M1: Conveying flow path

N:入料裝置 N: Feeding device

N1:第一輸送部 N1: The first conveyor

N11:輸送道 N11: Conveyor

N2:第二輸送部 N2: The second conveying part

N21:輸送道 N21: Conveyor

O:基板 O: substrate

圖1係本發明實施例中植球檢查設備上各裝置配置關係示意圖。 FIG. 1 is a schematic diagram of the configuration relationship of each device on the ball planting inspection equipment in the embodiment of the present invention.

圖2係本發明實施例中植球檢查設備上各裝置配置關係立體示意圖。 Fig. 2 is a three-dimensional schematic diagram of the configuration relationship of the devices on the ball planting inspection equipment in the embodiment of the present invention.

圖3係本發明實施例中入料裝置之立體示意圖。 Fig. 3 is a three-dimensional schematic diagram of the feeding device in the embodiment of the present invention.

圖4係本發明實施例中入料裝置一側的部份示意圖。 Figure 4 is a partial schematic diagram of one side of the feeding device in the embodiment of the present invention.

圖5係本發明實施例中第一轉換裝置之立體示意圖。 Fig. 5 is a three-dimensional schematic diagram of the first conversion device in the embodiment of the present invention.

圖6係本發明實施例中第一轉換裝置之一側的部份示意圖。 FIG. 6 is a partial schematic diagram of one side of the first conversion device in the embodiment of the present invention.

圖7係本發明實施例中檢查裝置之軌架的一側立體示意圖。 Fig. 7 is a perspective view of one side of the rail of the inspection device in the embodiment of the present invention.

圖8係本發明實施例中檢查裝置之軌架的另一側立體示意圖。 Fig. 8 is a perspective view of the other side of the rail of the inspection device in the embodiment of the present invention.

圖9係本發明實施例中檢查裝置之軌架的俯視示意圖。 Figure 9 is a schematic top view of the rail of the inspection device in the embodiment of the present invention.

圖10係本發明實施例中檢查裝置之壓抵機構立體示意圖。 Fig. 10 is a three-dimensional schematic diagram of the pressing mechanism of the inspection device in the embodiment of the present invention.

圖11係本發明實施例中檢查裝置之檢視單元及整平單元架設之立體示意圖。 Fig. 11 is a three-dimensional schematic diagram of the erection of the inspection unit and the leveling unit of the inspection device in the embodiment of the present invention.

圖12係本發明實施例中整平單元與治具之立體分解示意圖。 Fig. 12 is a three-dimensional exploded schematic diagram of the leveling unit and the jig in the embodiment of the present invention.

圖13係本發明實施例中第二轉換裝置之立體示意圖。 Figure 13 is a three-dimensional schematic diagram of a second conversion device in an embodiment of the present invention.

圖14係本發明實施例中收集裝置之立體示意圖。 Figure 14 is a three-dimensional schematic diagram of the collecting device in the embodiment of the present invention.

圖15係本發明第二實施例之植球檢查設備上各裝置配置關係示意圖。 FIG. 15 is a schematic diagram of the configuration relationship of each device on the ball planting inspection equipment of the second embodiment of the present invention.

圖16係本發明第二實施例之植球檢查設備上各裝置配置關係立體示意圖。 FIG. 16 is a three-dimensional schematic diagram of the configuration relationship of the devices on the ball planting inspection equipment according to the second embodiment of the present invention.

請參閱圖1,本發明實施例之薄片物件檢查方法可以圖中所示的植球檢查設備L為例作說明,本發明實施例之薄片物件可為該植球檢查設備用以承接完成植球(錫球)並烘烤後的基板K,該基板K為一矩形薄片物件,該基板K上設置形成複數個矩陣排列的電路區間K1,各電路區間中已依電路需要植設有複數個供焊接晶粒的錫球(由於數量眾多且過於微細,圖中未顯示)。 Please refer to FIG. 1. The method for inspecting a thin object according to the embodiment of the present invention can be illustrated by the ball planting inspection device L shown in the figure as an example. The thin object of the embodiment of the present invention can be the ball planting inspection device to accept and complete the ball planting. (Solder ball) and baked substrate K, the substrate K is a rectangular thin object, the substrate K is provided with a plurality of circuit sections K1 arranged in a matrix, each circuit section has been planted with a plurality of supply Soldering dies of solder balls (due to the large number and too small, not shown in the figure).

請參閱圖1、2,該植球檢查設備L係在同一機台L1上設有:一入料裝置A,設有複數個X軸向並提供運送流路A11的輸送道A1,用以接收前製程完成植球及烘烤的該基板K輸入該植球檢查設備L中;一第一轉換裝置B,設有一Y軸向的第一軌座B1,該第一軌座B1上設有一提供X軸向的輸送流路B21的一載入軌架B2,該載入軌架B2可受該第一軌座B1所驅動及在該第一軌座B1上作選擇性位移以選擇性對應該入料裝置A上的各輸送道A1,並承接所對應之該輸送道A1所傳送的該基板K;一檢查裝置C,設有Y軸向相互平行併列的二軌架C1,每一軌架C1分別各提供X軸向直線的搬送流路C11使該基板K可於其上作搬送,該搬送流路C11位於該輸送流路B21搬送方向後;該第一轉換裝置B上的該載入軌架B2可分別選擇性對應其中一軌架C1,並將該載入軌架B2上的該基板K傳送給所對應的該軌架C1;該檢查裝置C設有可被驅動作X、Y、Z軸向位移的一檢視單元C2及一整平單元C3,其中,該檢視單元C2位於該軌架C1之搬送流路C11的前段上方,並可選擇性對應其中一軌架C1;該整平單元C3位於該軌架C1之該搬送流路C11的後段上方,並可選擇性對應其中一軌架C1; 一第二轉換裝置D,設有一Y軸向的第二軌座D1,該第二軌座D1上設有一Z軸向的第三軌座D2,該第三軌座D2上設有提供X軸向輸送流路D21的一移出軌架D3,該輸送流路D21位於該搬送流路C11的搬送方向前;該第二軌座D1可驅動該第三軌座D2連動該移出軌架D3作Y軸向位移,該移出軌架D3可受該第三軌座D2所驅動而在該第二軌座D1上作上下昇降位移,該移出軌架D3藉該第二軌座D1、第三軌座D2選擇性位移以選擇性對應檢查裝置C上的各軌架C1,並承接所對應之該軌架C1所傳送的已完成檢查的該基板K;該第二轉換裝置D位於該機台L1上相對該入料裝置A、第一轉換裝置B、檢查裝置C所設台面L2為凹設陷落的一區間L3中;一收集裝置E,設有一具有Y軸向相互平行併列的複數個X軸向之槽間E11的一盒座E1,每一槽間E11分別可供容設置放一框盒E2,第二轉換裝置D的該移出軌架D3可分別選擇性對應其中一框盒E2,並將該移出軌架D3上的該基板K傳送給所對應的該框盒E2。 Please refer to Figures 1 and 2. The ball planting inspection equipment L is equipped on the same machine L1 with: a feeding device A, which is equipped with a plurality of X-axis and provides a conveying path A1 of a conveying flow path A11 for receiving The substrate K, which has been ball-planted and baked in the previous process, is input into the ball-planting inspection equipment L; a first conversion device B is provided with a Y-axis first rail seat B1, and the first rail seat B1 is provided with a A loading rail B2 of the X-axis conveying flow path B21, the loading rail B2 can be driven by the first rail seat B1 and selectively displaced on the first rail seat B1 to selectively correspond Each conveying lane A1 on the feeding device A accepts the substrate K conveyed by the corresponding conveying lane A1; an inspection device C is provided with two rails C1 parallel to each other in the Y axis, each rail C1 respectively provide a X-axis linear transport flow path C11 so that the substrate K can be transported thereon, the transport flow path C11 is located behind the transport flow path B21 in the transport direction; the loading on the first conversion device B The rail frame B2 can selectively correspond to one of the rail frames C1, and the substrate K loaded on the rail frame B2 can be transferred to the corresponding rail frame C1; the inspection device C is provided with a device that can be driven as X, Y , A viewing unit C2 and a leveling unit C3 displaced in the Z-axis, wherein the viewing unit C2 is located above the front section of the transport flow path C11 of the rail frame C1, and can selectively correspond to one of the rail frames C1; The flat unit C3 is located above the rear section of the conveying flow path C11 of the rail frame C1, and can selectively correspond to one of the rail frames C1; A second conversion device D is provided with a Y-axis second rail seat D1, the second rail seat D1 is provided with a Z-axis third rail seat D2, and the third rail seat D2 is provided with an X-axis Move the rail frame D3 to one of the conveying flow path D21, the conveying flow path D21 is located in front of the conveying direction of the conveying flow path C11; the second rail seat D1 can drive the third rail seat D2 to link the moving out rail rack D3 as Y Axial displacement, the movable rail frame D3 can be driven by the third rail seat D2 to move up and down on the second rail seat D1, and the movable rail frame D3 uses the second rail seat D1 and the third rail seat D2 is selectively shifted to selectively correspond to each rail C1 on the inspection device C, and to receive the substrate K that has been inspected transmitted by the corresponding rail C1; the second conversion device D is located on the machine L1 Relative to the feeding device A, the first conversion device B, and the inspection device C, the table surface L2 is recessed in an interval L3; a collection device E is provided with a plurality of X axes parallel to each other with the Y axis A box seat E1 in the slot E11, each slot E11 can accommodate a frame box E2, and the derailing rack D3 of the second conversion device D can selectively correspond to one of the frame boxes E2, and The substrate K on the removal rail D3 is transferred to the corresponding frame box E2.

請參閱圖3、4,該入料裝置A的每一輸送道A1在水平輸送面分別各由複數個相間隔以X軸向平行併列的Y軸向之輥筒A2所構成,每一輸送道A1分別各在出料口A3設有可受氣壓缸構成的一驅動件A4驅動作上、下位移的閘門A5作擋止或開啟的管控,該出料口A3的上方且該閘門A5內側設有一遮蔽件A6,該遮蔽件A6限制該基板K在該出料口A3處的高度,該遮蔽件A6下方並設置具有一朝該出料口A3向下傾斜面的導引件A7,使該可能存在例如圖中呈兩側往上弧曲的該基板K前端部K2可以被導引朝下而被該閘門A5擋抵,以免該前端部K2由該遮蔽件A6與該閘門A5間的餘隙凸伸出外部;該出料口A3處並設有偵測器A8以偵測出 料狀況;各輥筒A2受由馬達構成的一驅動件A9驅動並以一皮帶A91連動而可作主動性轉動。 Please refer to Figures 3 and 4, each conveying path A1 of the feeding device A on the horizontal conveying surface is respectively composed of a plurality of Y-axis rollers A2 spaced parallel to the X-axis, and each conveying path A1 is respectively provided at the discharge port A3 with a gate A5 that can be driven up and down by a driving member A4 composed of a pneumatic cylinder for blocking or opening control. The discharge port A3 is above the discharge port A3 and the inside of the gate A5 is provided There is a shielding member A6, the shielding member A6 limits the height of the substrate K at the discharge port A3, and below the shielding member A6 is provided a guide member A7 with a downwardly inclined surface toward the discharge port A3, so that the There may be, for example, that the front end portion K2 of the substrate K that curves upward on both sides in the figure can be guided downward and blocked by the gate A5, so as to prevent the front end portion K2 from being left between the shielding member A6 and the gate A5. The gap protrudes outside; the discharge port A3 is equipped with a detector A8 to detect Material condition: Each roller A2 is driven by a driving member A9 composed of a motor and is linked by a belt A91 for active rotation.

請參閱圖5、6,該第一轉換裝置B的該載入軌架B2在水平輸送面由複數個相間隔以X軸向平行併列的Y軸向輥筒B22構成該輸送流路B21,該載入軌架B2的一側邊設有複數個相間隔以X軸向平行併列的Z軸向之側輥軸B23,該輸送流路B21上設有一Z軸向桿狀的撥件B24,該撥件B24可受一驅動件B241驅動在靠該側輥軸B23之一側的一滑軌B242上作X軸向位移及受一驅動件B243驅動作Z軸向上、下位移,以由該輸送流路B21上方由上往下垂設地自該基板K後端撥抵該基板K作X軸向位移;該載入軌架B2的該輸送流路B21在一出料口B211處設有可受氣壓缸構成的一驅動件B251驅動作上、下位移的閘門B25作擋止或開啟的管控,該出料口B211的上方且該閘門B25內側設有一遮蔽件B26,該遮蔽件B26限制該基板K在該出料口B211處的高度,該遮蔽件B26下方並設置具有一朝該出料口B211向下傾斜面的導引件B261,使該可能存在例如圖中呈兩側往上弧曲的該基板K前端部K2可以被導引朝下而被該閘門B25擋抵,以免該前端部K2由該遮蔽件B26與該閘門B25間的餘隙凸伸出外部;該出料口B211處並設有偵測器B27以偵測出料狀況;各輥筒B22受由馬達構成的一驅動件B221驅動並以一皮帶B222連動而可作主動性轉動;該載入軌架B2相對該側輥軸B23的另一側相隔間距設有Z軸向桿狀的二推抵件B28,二推抵件B28共同設於水平設置的一聯動架B281兩側,該聯動架B281受一馬達構成的驅動件B282驅動一皮帶B283所連動而可在一滑軌B284上作Y軸向位移,並藉以連動二推抵件B28可在二輥筒B22間作Y軸向位移靠推該基板K,使該基板K在一側朝該側輥軸B23靠抵下被輸送。 Referring to Figures 5 and 6, the loading rail B2 of the first conversion device B on the horizontal conveying surface consists of a plurality of Y-axis rollers B22 spaced in parallel with the X-axis to form the conveying flow path B21. On one side of the loading rail B2, there are a plurality of Z-axis side rollers B23 arranged parallel to the X-axis. The conveying flow path B21 is provided with a Z-axis rod-shaped shift member B24. The shift member B24 can be driven by a driving member B241 on a slide rail B242 on the side of the side roller shaft B23 for X-axis displacement and driven by a driving member B243 for Z-axis upward and downward displacement, so as to be conveyed by the The upper part of the flow path B21 hangs down from the back end of the base plate K to push against the base plate K for X-axis displacement; the conveying flow path B21 loaded into the rail frame B2 is provided at a discharge port B211. A driving member B251 composed of a pneumatic cylinder drives a gate B25 that moves up and down for blocking or opening control. Above the discharge port B211 and inside the gate B25 is provided a shielding member B26, and the shielding member B26 restricts the substrate The height of K at the discharge port B211, below the shielding member B26, there is provided a guide member B261 with a downwardly inclined surface toward the discharge port B211, so that the possibility exists, for example, curved upward on both sides in the figure. The front end portion K2 of the substrate K can be guided downward and blocked by the gate B25, so as to prevent the front end portion K2 from protruding outside from the clearance between the shielding member B26 and the gate B25; at the discharge port B211 It is equipped with a detector B27 to detect the discharging condition; each roller B22 is driven by a driving member B221 composed of a motor and is linked by a belt B222 for active rotation; the loading rail B2 is opposite to the side The other side of the roller shaft B23 is provided with two Z-axis rod-shaped pushers B28 at intervals. The two pushers B28 are arranged on both sides of a horizontally arranged linkage frame B281. The linkage frame B281 is composed of a motor. The driving member B282 drives a belt B283 to be linked to make Y-axis displacement on a slide rail B284, and through the linkage of the two pushing members B28, the Y-axis displacement between the two rollers B22 can push the substrate K, so that The substrate K is transported against the side roller B23 on one side.

請參閱圖7~10,任一各該軌架C1所形成之該搬送流路C11依照輸送經過的順序,分別各包括一入料區C111、一檢查區C112、及一排料區C113;其中,該入料區C111、檢查區C112由一第一軌架C12所構成,該排料區C113由一第二軌架C13所構成,該第一軌架C12較該第二軌架C13長;該第一軌架C12設有在Y軸向相間隔平行設置的二側架C121,二側架C121相向的二內側分別各設有受驅動件C122驅動而同步連動的皮帶C123,二該皮帶C123分別各與其所對應貼靠的該側架C121上端間形成一向該側架C121內側凹設的X軸向槽道C124,二該皮帶C123共同形成該搬送流路C11的一部份;二側架C121並受一驅動件C125所驅動的一移靠機構C126所作用而可改變相間隔的間距,以適用於不同規格的輸送物;在該入料區C111中設有一呈Z軸向桿狀的撥件C127,該撥件C127受該第一軌架C12外的一驅動件C128所驅動而可在一滑軌C129上位移,並將桿狀部位伸於該入料區C111中作X軸向位移,以推抵該基板K由一端至另一端並進入該檢查區C112中;該搬送流路C11的入口端C114係位於該第一軌架C12上該入料區C111的一端,該入口端C114處的該第一軌架C12之二側架C121上分別各設有一壓抵機構C14,該壓抵機構C14包括受一馬達構成之驅動件C141驅動可作旋轉的一壓輪C142,該壓輪C142受一氣壓缸構成的驅動件C143作用可作上、下位移,該壓輪C142位於該皮帶C123及該槽道C124上方;靠近搬送流路C11的該入口端C114處下方設有一檢視器C15,用以檢測該基板K的底部資訊,例如條碼;該檢查區C112設有一治具C16;該第二軌架C13設有在Y軸向相間隔平行設置的二側架C131,二側架C131相向的二內側分別各設有受驅動件C132驅動而同步連動的皮帶 C133,二該皮帶C133分別各與其所對應貼靠的該側架C131上端間形成一向該側架C131內側凹設的X軸向槽道C134,二該皮帶C133共同形成該搬送流路C11的另一部份;二側架C131並受一驅動件C135所驅動的一移靠機構C136所作用而可改變相間隔的間距,以適用於不同規格的輸送物;在該排料區C113中設有一夾持件C137,該夾持件C137受該第二軌架C13外的一驅動件C1371所驅動而可作Z軸向上、下位移,並受另一驅動件C1372所驅動在一滑軌C1373上位移,藉此該夾持件C137下降移入該排料區C113中的該搬送流路C11中作X軸向位移,以將該檢查區C112中的該基板K夾持並移入該排料區C113中,該基板K到達定位後再鬆放並上昇離開該搬送流路C11;該排料區C113的該搬送流路C11下方設有一抵推件C138,該抵推件C138上設有可作Z軸向昇降的抵推部A1381,該抵推件C138受一驅動件C1382所驅動的皮帶C1383所連動,可在二側架C131間的一X軸向滑軌C1384上作X軸向位移,將位於該排料區C113中的該基板K推出至圖2中該第二轉換裝置D的該移出軌架D3;該排料區C113的排出口C139處設有一感測器C1391及一擋抵件C1392,該感測器C1391用以偵測該基板K的排出資訊,該擋抵件C1392設有可作Z軸向上下位移的擋抵部C1393以控制擋抵或允許該基板K自該排出口C139排出。 Please refer to Figures 7-10. The conveying flow path C11 formed by any of the rails C1 respectively includes a feeding area C111, an inspection area C112, and a discharging area C113 according to the order of conveyance; , The feeding area C111 and the inspection area C112 are formed by a first rail frame C12, and the discharging area C113 is formed by a second rail frame C13, the first rail frame C12 is longer than the second rail frame C13; The first rail frame C12 is provided with two side frames C121 spaced in parallel in the Y-axis direction. The two inner sides of the two side frames C121 facing each other are respectively provided with belts C123 that are driven by a driving member C122 and synchronously linked. The second belts C123 An X-axis channel C124 recessed to the inner side of the side frame C121 is formed between the upper ends of the side frames C121 to which they correspond to each other, and the two belts C123 together form a part of the conveying flow path C11; two side frames C121 is also actuated by a moving mechanism C126 driven by a driving member C125 to change the distance between each other to be suitable for conveying objects of different specifications; a Z-axis rod-shaped rod is provided in the feeding zone C111 The shift member C127 is driven by a driving member C128 outside the first rail frame C12 to move on a slide rail C129, and extends the rod-shaped part in the feeding area C111 for the X axis To push the substrate K from one end to the other end and enter the inspection area C112; the entrance end C114 of the conveying flow path C11 is located at one end of the feeding area C111 on the first rail C12, and the entrance end The two side frames C121 of the first rail frame C12 at C114 are respectively provided with a pressing mechanism C14. The pressing mechanism C14 includes a pressing wheel C142 that is driven to rotate by a driving member C141 composed of a motor. The wheel C142 can be moved up and down under the action of a driving member C143 formed by a pneumatic cylinder. The pressure wheel C142 is located above the belt C123 and the channel C124; a viewer is provided below the entrance end C114 near the conveying flow path C11 C15 is used to detect the bottom information of the substrate K, such as a bar code; the inspection area C112 is provided with a jig C16; the second rail frame C13 is provided with two side frames C131 arranged in parallel in the Y axis at intervals, two side frames The two opposite inner sides of C131 are respectively provided with belts that are driven by the driving part C132 and are synchronously linked. C133, the two belts C133 form an X-axis channel C134 recessed inside the side frame C131 between the two belts C133 and the upper end of the side frame C131 to which they are abutted, and the two belts C133 together form the other of the conveying flow path C11 One part; two side frames C131 and a moving mechanism C136 driven by a driving member C135 can change the spacing between them to be suitable for conveying objects of different specifications; in the discharge area C113 is provided Clamping member C137, the clamping member C137 is driven by a driving member C1371 outside the second rail C13 to move up and down in the Z-axis, and is driven by another driving member C1372 on a slide rail C1373 Displacement, whereby the clamping member C137 descends and moves into the conveying flow path C11 in the discharge zone C113 for X-axis displacement, so as to clamp the substrate K in the inspection zone C112 and move it into the discharge zone C113 When the substrate K reaches the position, it is loosened and lifted away from the conveying flow path C11; under the conveying flow path C11 of the discharging area C113 is provided a pusher C138, and the pusher C138 is provided with a Z The thrusting part A1381 that rises and lowers in the axial direction. The thrusting part C138 is linked by a belt C1383 driven by a driving part C1382, and can perform X-axis displacement on an X-axis slide rail C1384 between the two side frames C131, and The substrate K located in the discharging area C113 is pushed out to the removal rail D3 of the second conversion device D in FIG. 2; a sensor C1391 and a stopper are provided at the discharge port C139 of the discharging area C113 C1392. The sensor C1391 is used to detect the discharge information of the substrate K. The blocking member C1392 is provided with a blocking portion C1393 that can move up and down in the Z-axis to control blocking or allow the substrate K to exit the discharge port C139 is discharged.

請參閱圖11,該檢查裝置C的該檢視單元C2設於被一座架C211架高的一X軸向之軌座C21上所設Y軸向之軌座C22上,該軌座C22可被該軌座C21驅動作X軸向位移,該檢視單元C2可被該軌座C22驅動作Y軸向位移,而該檢視單元C2可在固設於該軌座C22上的一固定座C23的一Z軸向之滑軌C231上作Z軸向位移;該檢視單元C2可為一CCD的鏡頭C24,該鏡頭C24藉由光源投射經下方一光源座C241上一直 Y軸向直線狀細縫(圖中未示),而以一線掃瞄方式對下方的該基板K(圖1)上的植球狀況進行檢視;該檢查裝置C的該整平單元C3設於被一座架C311架高的一X軸向之軌座C31上所設Y軸向之軌座C32上,該軌座C32可被該軌座C31驅動作X軸向位移,該整平單元C3可被該軌座C32驅動作Y軸向位移;該檢視單元C2所設的Y軸向之該軌座C22與該整平單元C3所設的Y軸向之該軌座C32間設有一聯接件C4,該軌座C22與該軌座C32在X軸向的位移係在保持相隔一定間距下同步位移,該聯接件C4一方面確保該同步位移的關係,另一方面防止因故障所導致的該軌座C22與該軌座C32互撞問題發生。 Please refer to FIG. 11, the inspection unit C2 of the inspection device C is set on a rail seat C22 in the Y axis which is set on an X-axis rail seat C21 elevated by a frame C211, and the rail seat C22 can be The rail seat C21 is driven for X-axis displacement, the inspection unit C2 can be driven by the rail seat C22 for Y-axis displacement, and the inspection unit C2 can be mounted on a Z of a fixed seat C23 fixed on the rail seat C22. The axial slide rail C231 is displaced in the Z axis; the viewing unit C2 can be a CCD lens C24, which is projected by a light source through the lower light source holder C241. The Y-axis linear slits (not shown in the figure) are used to inspect the ball planting condition on the substrate K (Figure 1) below by a line scan; the leveling unit C3 of the inspection device C is set in On a Y-axis rail seat C32 set on an X-axis rail seat C31 elevated by a frame C311, the rail seat C32 can be driven by the rail seat C31 for X-axis displacement, and the leveling unit C3 can Driven by the rail seat C32 for Y-axis displacement; a connecting piece C4 is provided between the rail seat C22 in the Y axis of the inspection unit C2 and the rail seat C32 in the Y axis of the leveling unit C3 , The displacement of the rail seat C22 and the rail seat C32 in the X-axis direction is synchronously displaced while keeping a certain distance apart. The coupling C4 on the one hand ensures the synchronous displacement relationship, and on the other hand prevents the rail from malfunctioning. The collision between the seat C22 and the rail seat C32 occurred.

請參閱圖11、12,該整平單元C3設有用以和該軌座C32固設連動的一固定架C33,該固定架C33下方固設有一水平設置的矩形之第一固定座C331,該第一固定座C331下方設有一水平設置的矩形之第二固定座C332,該第一固定座C331與該第二固定座C332間設有複數支Z軸向的樞桿C333;該固定架C33包括相隔一間距C334且相互平行的二架板C335,二架板C335間設有一汽壓缸構成的驅動件C336,該驅動件C336以一缸桿(圖中未示)伸經該第一固定座C331而與該第二固定座C332連動,並可驅動該第二固定座C332作上下位移;該第二固定座C332下方藉由扣件C337繫扣固設有矩形的一墊座C34,該墊座C34底部設有具適當撓性的墊體C341,該第二固定座C332兩側與該固定架C33兩側間聯設有拉伸彈簧構成的彈性件C338,使該驅動件C336對該第二固定座C332驅動下移時蓄積具有彈性之回復力;該第一固定座C331上設有一鏤空區間C3311,該第二固定座C332上凸設有Z軸向的一懸吊座C3321,該懸吊座C3321凸伸經該鏤空區間C3311而於該第一固定座C331上方的一端部C3322上橫設一寬度大於該鏤空區間寬度的一擋件C3323,並於該擋件C3323上設 有微調件C3324及一感測件C3325,該擋件C3323限制該第二固定座C332與該第一固定座C331上下分離的間距,並藉該微調件C3324微調該間距的行程,及藉該感測件C3325作近接的偵測以執行到位時的下一動作訊號控制。 Referring to Figures 11 and 12, the leveling unit C3 is provided with a fixing frame C33 for fixing and interlocking with the rail base C32, and a horizontally arranged rectangular first fixing base C331 is fixedly arranged under the fixing frame C33. A horizontally arranged rectangular second fixed seat C332 is arranged under a fixed seat C331, and a plurality of Z-axis pivots C333 are arranged between the first fixed seat C331 and the second fixed seat C332; the fixed frame C33 includes a spacer Two frame plates C335 with a spacing of C334 and parallel to each other, between the two frame plates C335 is provided a driving member C336 composed of a pneumatic cylinder, and a cylinder rod (not shown in the figure) extends through the first fixing seat C331. And it is linked with the second fixing base C332, and can drive the second fixing base C332 to move up and down; under the second fixing base C332, a rectangular pedestal C34 is fastened by a fastener C337, the pedestal The bottom of the C34 is provided with a cushion body C341 with appropriate flexibility. The two sides of the second fixing seat C332 and the two sides of the fixing frame C33 are connected with an elastic member C338 composed of a tension spring, so that the driving member C336 is opposite to the second The fixing seat C332 accumulates an elastic restoring force when it is driven downward; the first fixing seat C331 is provided with a hollow section C3311, and the second fixing seat C332 is protrudingly provided with a suspension seat C3321 in the Z-axis direction. The seat C3321 protrudes through the hollow section C3311, and on one end C3322 above the first fixing seat C331, a stopper C3323 having a width greater than the width of the hollow section is transversely provided, and a stopper C3323 is provided on the stopper C3323 There are a fine adjustment member C3324 and a sensing member C3325. The stop member C3323 limits the upper and lower separation distance between the second fixing seat C332 and the first fixing seat C331, and uses the fine adjustment member C3324 to fine-tune the distance of the distance, and the sensing The test piece C3325 performs proximity detection to perform the next motion signal control when it is in place.

請參閱圖7、12,該軌架C1之該檢查區C112的該治具C16設有一水平設置的矩形之第一治具座C161,該第一治具座C161上方設有一水平設置的矩形之第二治具座C162,該第一治具座C161與該第二治具座C162間設有複數支Z軸向的樞桿C163;該第一治具座C161下方以桿狀的間隔件C164相隔間距設有一底座C165,該底座C165上設有一鏤空區間C1651,該第一治具座C161下方設有一氣壓缸構成的驅動件C166,該驅動件C166下端伸經該底座C165的該鏤空區間C1611,其上端以一缸桿C1661伸經該第一治具座C161而與該第二治具座C162連動,並可驅動該第二治具座C162作上下位移;該第二治具座C162上方藉由扣件C167繫扣固設有矩形的一模座C168,該模座C168上設有一吸附座C169,該吸附座C169呈矩形並設有一載模C1691,該載模C1691上設有凹設的矩形之容置區間C1692,該容置區間C1692中設有撓性體構成的大致為矩形環框狀之密封墊C1693,該密封墊C1693環框狀所圍設的面積內部設有一矩形板狀的透氣座C1694,該密封墊C1693環框狀的周緣高於該透氣座C1694表面,該透氣座C1694上設有複數個氣孔C1695,該氣孔C1695可藉負壓氣體提供吸附力;該載模C1691上該容置區間C1692及其中該密封墊C1693、透氣座C1694的數目及形狀一該基板K的規格而定,該基板K的面積大於該密封墊C1693矩形環框狀之面積,並可覆置貼靠於該密封墊C1693矩形環框狀之上方環緣呈密著狀;該密封墊C1693環框狀所圍設的面積小於該基板K的面積但涵蓋該基板K大部份的面積,在不同規格的 該基板K設計中,該基板K可能分左右兩區域,並在兩區域間的中間部位形成鏤空間隙,則此時該密封墊C1693可能設成兩個相隔間距避開該鏤空間隙的環框狀分別對應左右兩個區域,使每一個環框狀所圍設的面積小於該基板K所對應左側或右側區域的面積但涵蓋該基板K左側或右側區域大部份的面積,如此可避免環框狀所圍設的面積涵蓋該鏤空間隙而造成洩氣。 7 and 12, the fixture C16 of the inspection area C112 of the rail frame C1 is provided with a horizontally arranged rectangular first fixture seat C161, and a horizontally arranged rectangular fixture seat C161 is provided above the first fixture seat C161 A second jig seat C162. A plurality of Z-axis pivot rods C163 are provided between the first jig seat C161 and the second jig seat C162; a rod-shaped spacer C164 is provided under the first jig seat C161 A base C165 is spaced apart, a hollow section C1651 is provided on the base C165, a driving member C166 composed of a pneumatic cylinder is disposed under the first jig seat C161, and the lower end of the driving member C166 extends through the hollow section C1611 of the base C165 , The upper end of the cylinder rod C1661 extends through the first fixture seat C161 to be linked with the second fixture seat C162, and can drive the second fixture seat C162 to move up and down; above the second fixture seat C162 A rectangular mold base C168 is fastened by the fastener C167. The mold base C168 is provided with a suction base C169. The suction base C169 is rectangular and is provided with a carrier mold C1691. The carrier mold C1691 is provided with a recess A rectangular accommodating area C1692, the accommodating area C1692 is provided with a substantially rectangular ring-shaped gasket C1693 composed of a flexible body, and the area enclosed by the ring-shaped gasket C1693 has a rectangular plate-shaped inside The air-permeable seat C1694, the ring-shaped periphery of the gasket C1693 is higher than the surface of the air-permeable seat C1694, the air-permeable seat C1694 is provided with a plurality of air holes C1695, the air holes C1695 can provide adsorption force by negative pressure gas; the carrier mold C1691 The number and shape of the upper accommodating area C1692, the sealing gasket C1693, and the air-permeable seat C1694 are determined by the specifications of the substrate K. The area of the substrate K is larger than the rectangular ring-shaped area of the gasket C1693 and can be covered The upper edge of the rectangular ring frame shape of the sealing pad C1693 is tight; the area enclosed by the ring frame shape of the sealing pad C1693 is smaller than the area of the substrate K but covers most of the area of the substrate K. Different specifications In the design of the substrate K, the substrate K may be divided into two regions, left and right, and a hollow gap is formed in the middle part between the two regions. At this time, the gasket C1693 may be set in two ring-frame shapes separated by a distance to avoid the hollow gap. Corresponding to the left and right areas respectively, so that the area enclosed by each ring frame is smaller than the area of the left or right area corresponding to the substrate K but covers most of the area of the left or right area of the substrate K, so that the ring frame can be avoided The area enclosed by the shape covers the hollowed-out gap, causing deflation.

請參閱圖12,該第二轉換裝置D的該移出軌架D3設有在Y軸向相間隔平行設置的二側架D31,二側架D31相向的二內側分別各設有受驅動件D32驅動而同步連動的皮帶D33,二該皮帶D33分別各與其所對應貼靠的該側架D31上端間形成一向該側架D31內側凹設的X軸向槽道D34,二該皮帶D33共同形成一輸送流路D35;二側架D31並受一驅動件(圖中未示)所驅動的一移靠機構D36所作用而可改變相間隔的間距,以適用於不同規格的輸送物;在該輸送流路D35中設有一呈Z軸向桿狀的撥件D37,該撥件D37受二側架D31外的一驅動件D371所驅動的一皮帶D372連動而可在一滑軌D373上位移,並伸於該輸送流路D35中作X軸向位移,以推抵圖2中該基板K由一端至另一端並排出該移出軌架D3;該輸送流路D35的出口端D351處的該移出軌架D3之二側架D31上分別各設有一抵壓輪D311,該抵壓輪D311,該抵壓輪D311位於該皮帶D33上方,分別各可受一驅動件D312驅動而作旋轉;該出口端D351同時設有一擋抵件D36,其上設有可作昇降的擋抵部D361。 Please refer to FIG. 12, the removal rail frame D3 of the second conversion device D is provided with two side frames D31 spaced in parallel in the Y-axis direction, and the two inner sides of the two side frames D31 facing each other are respectively driven by a driving member D32. The synchronously linked belt D33 and the two belts D33 respectively form an X-axis channel D34 recessed inside the side frame D31 between the upper ends of the two belts D33 and the corresponding side frame D31. The two belts D33 together form a conveyor Flow path D35; two side frames D31 and a moving mechanism D36 driven by a driving member (not shown in the figure) can change the spacing between them to be suitable for conveying objects of different specifications; in the conveying flow The road D35 is provided with a Z-axis rod-shaped shift member D37. The shift member D37 is linked by a belt D372 driven by a driving member D371 outside the two side frames D31 to move on a slide rail D373 and extend X-axis displacement is made in the conveying flow path D35 to push the substrate K from one end to the other end in FIG. 2 and discharge the removal rail D3; the removal rail D351 at the exit end D351 of the conveying flow path D35 The two side frames D31 of D3 are respectively provided with a pressing wheel D311, the pressing wheel D311, the pressing wheel D311 is located above the belt D33, and each can be driven by a driving member D312 to rotate; the outlet end D351 At the same time, a stopper D36 is provided, and a stopper D361 that can be raised and lowered is provided on it.

請參閱圖7、13,該收集裝置E的每一框盒E2分別各具有前、後的開口E21,其中,位於進料端的該開口E21上下兩側分別各設有相互對應並自端緣凹設的鏤空區間E22;該盒座E1上每一槽間E11兩側分別各設有複數個滾輪E12,該框盒E2位於兩側該滾輪E12間;各該框盒E2 上方設有一龍門式的座架E3,該座架E3上設有用以顯示對應之該框盒E2工作現況的燈號E31,並設有分別對應各框盒E1中該鏤空區間E22的偵測器E32以偵測入料狀況。 Referring to Figures 7 and 13, each frame box E2 of the collection device E has front and rear openings E21, respectively, wherein the upper and lower sides of the opening E21 at the feeding end are respectively provided with corresponding and recessed ends There are a plurality of rollers E12 on both sides of each slot E11 on the box seat E1, and the frame box E2 is located between the rollers E12 on both sides; each frame box E2 A gantry-like seat frame E3 is provided on the upper side. The seat frame E3 is provided with a light E31 to display the working status of the corresponding frame box E2, and a detector corresponding to the hollow section E22 in each frame box E1 E32 to detect the feeding condition.

本發明實施例之該基板K由該入料裝置A的該輸送道A1輸入後,將被擋止於該閘門A5前,待可作選擇性位移對應輸入或輸出對象以搬送該薄片物件的該第一轉換裝置B的該載入軌架B2上的該輸送流路B21選擇性對應該輸送道A1後,該閘門A5才開啟並放行使該基板K被傳送至該載入軌架B2;該載入軌架B2中的該基板K被二推抵件B28在推移朝該側輥軸B23的一側靠抵下被輸送至該閘門B25被擋止,待該載入軌架B2選擇性地對應該檢查裝置C中二軌架C1其中之一後,該載入軌架B2中的該閘門B25才開啟並放行該基板K並傳送至該軌架C1的入料區C111;被傳送進入該入料區C111的該基板K將被該壓抵機構C14的該壓輪C142執行由上往下壓抵,使倘具有撓曲而前端朝上弧曲的表面在被限制壓抵下往前傳送至對應該槽道C124中受該皮帶C123傳送,並在被檢視器C15檢視條碼後受該撥件C127推抵下進入該檢查區C112中並位於該治具C16上方;該治具C16將使該驅動件C166驅動該第二治具座C162連動該模座C168、吸附座C169上昇抵附該基板K底面並移載該基板K至一預定高度,並使該吸附座C169的該氣孔C1695被通以負壓而吸附該基板K,並使該整平單元C3較該檢視單元C2先位移至該治具C16的該基板K上方適當高度定位,並使該驅動件C336驅動該墊座C34以底部具適當撓性的墊體C341下壓該基板K,使該基板K可以平整壓抵下方環框狀的該密封墊C1693,使該密封墊C1693充分密封負壓氣體,而使該基板K平整地被吸附定位後,再使該整平單元C3的該驅動件C336洩除氣壓缸的氣體,而使該墊座C34被該彈性件C338的回復力作用,而連同底部的墊體C341 被拉回上提而脫離該基板K並移開,再續由該檢視單元C2位移至已平整定位的該治具C16上該基板K上方適當高度定位處,使該鏡頭C24以線掃瞄方式對下方的該基板K上的植球狀況進行檢視;完成檢視後,該治具C16的該吸附座C169上的該氣孔C1695被卸除負壓,並使該驅動件C166驅動該第二治具座C162連動該模座C168、吸附座C169下降脫離該基板K底面,此時在該排料區C113中的該夾持件C137將移入該排料區C113中的該搬送流路C11中作X軸向位移,並將該檢查區C112中的該基板K夾持並移入該排料區C113中直到受該擋抵件C1392的擋抵部C1393擋抵定位,該基板K到達定位後該夾持件C137再鬆放並上昇離開該搬送流路C11,此時在可作選擇性位移對應輸入或輸出對象以搬送該薄片物件的該第二轉換裝置D的該移出軌架D3之輸送流路D21已對應該該軌架C1的該排料區C113的排出口C139下,該擋抵件C1392的擋抵部C1393將下降,並使該抵推件C138將位於該排料區C113中的該基板K推出至該第二轉換裝置D的該移出軌架D3中直到受該擋抵件D36的擋抵部D361擋抵定位,在該移出軌架D3的出口端D351選擇性對應至該收集裝置E上的一預定的該框盒E2時,該擋抵部D361下降並使該撥件D37,推抵該基板K經該出口端D351處的該抵壓輪D311與該皮帶D33間排出該移出軌架D3至該框盒E2中以進行收集。 After the substrate K of the embodiment of the present invention is input by the conveying path A1 of the feeding device A, it will be blocked in front of the gate A5, and wait for the selective displacement corresponding to the input or output object to transport the sheet object. After the conveying channel B21 on the loading rail B2 of the first conversion device B selectively corresponds to the conveying channel A1, the gate A5 is opened and the substrate K is released to be transferred to the loading rail B2; The substrate K loaded in the rail B2 is transported to the gate B25 to be stopped by the second pushing member B28 moving toward the side of the side roller shaft B23. When the loading rail B2 is selectively After corresponding to one of the two rail racks C1 in the inspection device C, the gate B25 loaded in the rail rack B2 is opened and the substrate K is released and transferred to the feeding area C111 of the rail rack C1; The substrate K in the feeding area C111 will be pressed from top to bottom by the pressing wheel C142 of the pressing mechanism C14, so that the curved surface with the front end facing upwards will be conveyed forward under the restricted pressing. To the corresponding channel C124, it is conveyed by the belt C123, and after the barcode is checked by the viewer C15, it is pushed down by the dial piece C127 into the inspection area C112 and is located above the fixture C16; the fixture C16 will make The driving member C166 drives the second jig seat C162 to link the mold seat C168 and the suction seat C169 up to the bottom surface of the substrate K and transfer the substrate K to a predetermined height, and the air hole C1695 of the suction seat C169 is blocked The substrate K is adsorbed by negative pressure, and the leveling unit C3 is displaced to a proper height above the substrate K of the jig C16 before the inspection unit C2, and the driving member C336 drives the pedestal C34 to A cushion body C341 with appropriate flexibility at the bottom presses down the substrate K, so that the substrate K can be smoothly pressed against the ring-shaped gasket C1693 below, so that the gasket C1693 can fully seal the negative pressure gas and make the substrate K flat After the ground is adsorbed and positioned, the driving member C336 of the leveling unit C3 is then made to vent the air in the air cylinder, so that the cushion C34 is acted on by the restoring force of the elastic member C338 together with the cushion body C341 at the bottom. It is pulled back and lifted away from the substrate K and moved away, and then continues to move from the inspection unit C2 to a position at a proper height above the substrate K on the jig C16 that has been flatly positioned, so that the lens C24 is scanned in a line Inspect the ball planting condition on the substrate K below; after the inspection is completed, the air hole C1695 on the suction seat C169 of the fixture C16 is relieved of negative pressure, and the driving member C166 drives the second fixture The seat C162 links the mold seat C168 and the adsorption seat C169 down and away from the bottom surface of the substrate K. At this time, the clamping member C137 in the discharge area C113 will move into the conveying flow path C11 in the discharge area C113 as X Axial displacement, and clamp the substrate K in the inspection area C112 and move it into the discharging area C113 until it is blocked and positioned by the blocking portion C1393 of the blocking member C1392. After the substrate K reaches the positioning, the clamping The piece C137 is released again and rises away from the conveying flow path C11. At this time, the conveying flow path D21 of the removal rail D3 of the second conversion device D that can be selectively displaced corresponding to the input or output object to convey the sheet object Corresponding to the discharge port C139 of the discharging area C113 of the rail frame C1, the blocking portion C1393 of the blocking member C1392 will descend, and the blocking member C138 will be positioned on the substrate in the discharging area C113 K is pushed out into the removal rail D3 of the second conversion device D until it is resisted and positioned by the blocking portion D361 of the blocking member D36, and the outlet end D351 of the removal rail D3 selectively corresponds to the collecting device E When a predetermined frame box E2 is placed on the upper part, the blocking portion D361 is lowered and the shifting member D37 is pushed against the base plate K and is discharged out of the rail between the pressing wheel D311 and the belt D33 at the outlet end D351 D3 into the box E2 for collection.

本發明實施例之薄片物件檢查方法、裝置及設備,由於使該基板K之薄片物件可以在吸附定位時同時進行壓整操作,使該薄片物件各周緣都獲得被吸附形成平整的表面,減少撓曲變形的現象,令後續的檢視作業可以取的精確的檢視結果,減少誤判及不良率。 In the method, device and equipment for inspecting a thin object according to the embodiment of the present invention, since the thin object of the substrate K can be pressed and pressed at the same time during adsorption and positioning, each peripheral edge of the thin object can be adsorbed to form a flat surface, which reduces the deflection. The phenomenon of warp and deformation enables the subsequent inspection operations to obtain accurate inspection results, reducing misjudgments and defective rates.

請參閱圖14、15,為本發明另一實施例之示意,其中與原實施例相同的部份不作贅述,僅作例外部份的說明,相同的裝置沿用原編號; 主要係將第一轉換裝置F設有二載入軌架F1,並將第二轉換裝置G設有二移出軌架G1,另檢查裝置H在一軌架H1設有一治具H11,而機台L1另設有其上形成一輸送流路M1的一軌架M;該軌架H1一側設一X軸向的軌座H2,該軌座H2上共同設有相隔間距可被該軌座H2驅動作X軸向同步位移的一檢視單元H3及一整平單元H4;該入料裝置N設有第一輸送部N1及第二輸送部N2,該第一輸送部N1包括二輸送道N11,該第二輸送部N2包括二輸送道N21;其中,該第一輸送部N1用以輸送已完成植球並已完成烘烤的該基板K,該第二輸送部N2用以輸送已完成植球但尚未進行烘烤的基板O;該基板K由該第一輸送部N1其中一輸送道N11輸入後,被該第一轉換裝置F的其中靠該第一輸送部N1一側的該載入軌架F1選擇性對應及承接後,將直接傳送給設有該治具H11的該軌架H1,並經該整平單元H4整平及該檢視單元H3檢視後,被該第二轉換裝置G靠該軌架H1側的該移出軌架G1承接,並傳送至該收集裝置E其中一預設的框盒E2收集;該基板O由該第二輸送部N2其中一輸送道N211輸入後,被該第一轉換裝置F的其中靠該第二輸送部N2一側的該載入軌架F1選擇性對應及承接後,將直接傳送給設有僅有該輸送流路M1的該軌架M,並直接傳送給該第二轉換裝置G靠該軌架H2側的該移出軌架G1承接,並傳送至該收集裝置E之盒座E1上的其中一預設的框盒E2收集。 Please refer to Figures 14 and 15, which are schematic diagrams of another embodiment of the present invention, in which the same parts as the original embodiment will not be repeated, and only the exceptions will be explained. The same devices use the original numbers; Mainly, the first conversion device F is equipped with two loading rail frames F1, and the second conversion device G is equipped with two removal rail frames G1, and the inspection device H is equipped with a jig H11 on the first rail frame H1, and the machine L1 is additionally provided with a rail frame M on which a conveying flow path M1 is formed; one side of the rail frame H1 is provided with an X-axis rail seat H2, and the rail seat H2 is provided with a common distance between the rail seat H2 Drives a viewing unit H3 and a leveling unit H4 for synchronous displacement in the X axis; the feeding device N is provided with a first conveying part N1 and a second conveying part N2. The first conveying part N1 includes two conveying channels N11, The second conveying part N2 includes two conveying lanes N21; wherein, the first conveying part N1 is used to convey the substrate K that has been planted and baked, and the second conveying part N2 is used to convey the completed planting But the substrate O that has not been baked; after the substrate K is input by one of the conveying lanes N11 of the first conveying portion N1, it is loaded by the loading rail on the side of the first conveying portion N1 of the first conversion device F After the frame F1 is selectively corresponding and accepted, it will be directly transmitted to the rail frame H1 provided with the fixture H11, and after being leveled by the leveling unit H4 and inspected by the inspection unit H3, it is leaned by the second conversion device G The removal rail G1 on the side of the rail H1 is received and transported to one of the preset frame boxes E2 of the collection device E for collection; the substrate O is input by one of the conveying lanes N211 of the second conveying part N2, and is After the loading rail F1 on the side of the second conveying part N2 of the first conversion device F is selectively corresponding and accepted, it will be directly transferred to the rail M with only the conveying flow path M1, and It is directly transferred to the second conversion device G to be received by the removal rail G1 on the side of the rail H2, and transferred to one of the preset frame boxes E2 on the box seat E1 of the collecting device E for collection.

惟以上所述者,僅為本發明之較佳實施例而已,當不能以此限定本發明實施之範圍,即大凡依本發明申請專利範圍及發明說明內容所作之簡單的等效變化與修飾,皆仍屬本發明專利涵蓋之範圍內。 However, the foregoing are only preferred embodiments of the present invention, and should not be used to limit the scope of implementation of the present invention, that is, simple equivalent changes and modifications made in accordance with the scope of the patent application of the present invention and the description of the invention, All are still within the scope of the invention patent.

A:入料裝置 A: Feeding device

B:第一轉換裝置 B: The first conversion device

C:檢查裝置 C: Inspection device

D:第二轉換裝置 D: The second conversion device

E:收集裝置 E: Collection device

K:基板 K: substrate

L:植球檢查設備 L: Ball planting inspection equipment

L1:機台 L1: Machine

L2:台面 L2: Countertop

L3:區間 L3: interval

Claims (13)

一種薄片物件檢查裝置,包括:一軌架,其上形成傳送一薄片物件的一搬送流路;一治具,設於該搬送流路中,該治具設有負壓可吸附該薄片物件;一整平單元,設於該搬送流路中,可被位移至該治具上方;一檢視單元,設於該搬送流路中,可被位移至該治具上方。 A thin object inspection device, comprising: a rail frame on which a conveying flow path for conveying a thin object is formed; a jig, arranged in the conveying flow path, and the jig is provided with a negative pressure to absorb the thin object; A leveling unit is arranged in the conveying flow path and can be displaced above the jig; and a viewing unit is arranged in the conveying flow path and can be displaced above the jig. 如申請專利範圍第1項所述薄片物件檢查裝置,該軌架包括設有一入料區、一檢查區的一第一軌架,設有一排料區的一第二軌架。 As described in the first item of the scope of patent application, the rail frame includes a first rail frame with a feeding area and an inspection area, and a second rail frame with a discharge area. 一種薄片物件檢查方法,使用如申請專利範圍第1至2項任一項所述薄片物件檢查裝置,包括:使一薄片物件被該搬送流路進行傳送;在該搬送流路使該薄片物件被該治具吸附;使被該治具吸附的該薄片物件被該整平單元下壓;使該整平單元脫離該薄片物件後,以該檢視單元對該對該薄片物件進行檢視。 A method for inspecting a sheet object, using the sheet object inspection device as described in any one of items 1 to 2 of the scope of patent application, includes: making a sheet object be transported by the conveying flow path; making the sheet object be transported in the conveying flow path The fixture is adsorbed; the sheet object adsorbed by the fixture is pressed down by the flattening unit; after the flattening unit is separated from the sheet object, the inspection unit is used to inspect the sheet object. 如申請專利範圍第3項所述薄片物件檢查方法,包括:該治具被通入負壓氣體至一密封墊中,該薄片物件被置於該密封墊上方並被移載至一預定高度。 For example, the method for inspecting a thin object according to item 3 of the scope of patent application includes: the jig is vented into a gasket with negative pressure, and the thin object is placed on the gasket and moved to a predetermined height. 如申請專利範圍第3項所述薄片物件檢查方法,包括:被傳送進入該搬送流路的該薄片物件被執行由上往下壓抵,使該薄片物件前端在被限制壓抵下往前傳送。 For example, the sheet object inspection method described in item 3 of the scope of patent application includes: the sheet object conveyed into the conveying flow path is pressed from top to bottom, so that the front end of the sheet object is conveyed forward under the restriction . 如申請專利範圍第3項所述薄片物件檢查方法,包括:該搬送流路搬送方向之前或後其中之一,設有可作選擇性位移對應輸入或輸出對象以搬送該薄片物件的一輸送流路。 For example, the method for inspecting sheet objects described in item 3 of the scope of patent application includes: one of the front or back of the conveying direction of the conveying flow path is provided with a conveying flow that can be selectively displaced corresponding to the input or output object to convey the sheet object road. 如申請專利範圍第3項所述薄片物件檢查方法,該搬送流路依照輸送經過的順序,分別各包括該入料區、該檢查區、及該排料區;該薄片物件以推抵方式由該入料區至該檢查區中;該檢查區中的該薄片物件以夾持方式移入該排料區中。 For example, the sheet object inspection method described in item 3 of the scope of patent application, the conveying flow path includes the feeding area, the inspection area, and the discharge area according to the order of conveyance; the sheet object is pushed by The feeding area enters the inspection area; the sheet object in the inspection area is moved into the discharge area in a clamping manner. 如申請專利範圍第3項所述薄片物件檢查方法,該整平單元與該檢視單元在X軸向可同步連動。 As the method for inspecting a thin object described in item 3 of the scope of patent application, the leveling unit and the inspection unit can be synchronized and linked in the X axis. 一種薄片物件檢查裝置,包括:用以執行如申請專利範圍第3至8項任一項所述薄片物件檢查方法的裝置。 A thin object inspection device includes: a device for executing the thin object inspection method as described in any one of items 3 to 8 in the scope of patent application. 一種薄片物件檢查設備,使用如申請專利範圍第3至8項任一項所述薄片物件檢查方法,更包括一入料裝置,該入料裝置設有複數個提供運送流路的輸送道,用以輸入該薄片物件。 A sheet object inspection equipment, which uses the sheet object inspection method described in any one of items 3 to 8 of the scope of the patent application, and further includes a feeding device provided with a plurality of conveying channels providing conveying flow paths. To import the sheet object. 如申請專利範圍第10項所述薄片物件檢查設備,其中,該入料裝置設有第一輸送部及第二輸送部,該第一輸送部用以輸送已完成植球並已完成烘烤的基板,該第二輸送部用以輸送已完成植球但尚未進行烘烤的基板。 For example, the sheet object inspection equipment described in item 10 of the scope of patent application, wherein the feeding device is provided with a first conveying part and a second conveying part, and the first conveying part is used for conveying the balls that have been planted and baked The substrate, the second conveying part is used to convey the substrate that has been ball-planted but not yet baked. 如申請專利範圍第11項所述薄片物件檢查設備,其中,由該第一輸送部輸入的基板被經該整平單元整平及該檢視單元檢視;由該第二輸送部輸入的基板直接傳送給設有僅有一輸送流路的一軌架並傳送至一收集裝置收集。 Such as the sheet object inspection equipment described in item 11 of the scope of patent application, wherein the substrate input by the first conveying part is leveled by the leveling unit and inspected by the inspection unit; the substrate input by the second conveying part is directly conveyed A rail rack with only one conveying flow path is provided and transported to a collection device for collection. 一種薄片物件檢查設備,使用如申請專利範圍第3至8項任一項所述薄片物件檢查方法,更包括一收集裝置,設有複數個框盒。 A thin object inspection equipment, which uses the thin object inspection method described in any one of items 3 to 8 in the scope of the patent application, further includes a collection device with a plurality of frame boxes.
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Publication number Priority date Publication date Assignee Title
TWI822555B (en) * 2023-01-12 2023-11-11 萬潤科技股份有限公司 Conveying device and inspection equipment using the conveying device

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