TWI703540B - Display panel - Google Patents
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- TWI703540B TWI703540B TW108120839A TW108120839A TWI703540B TW I703540 B TWI703540 B TW I703540B TW 108120839 A TW108120839 A TW 108120839A TW 108120839 A TW108120839 A TW 108120839A TW I703540 B TWI703540 B TW I703540B
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136259—Repairing; Defects
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/1345—Conductors connecting electrodes to cell terminals
- G02F1/13452—Conductors connecting driver circuitry and terminals of panels
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136286—Wiring, e.g. gate line, drain line
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136259—Repairing; Defects
- G02F1/136263—Line defects
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- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Mathematical Physics (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
Abstract
Description
本發明是有關於一種顯示面板,且特別是有關於一種具有修復線的顯示面板。The present invention relates to a display panel, and particularly relates to a display panel with repair lines.
現有的顯示面板通常是以多條掃描線(scan line)與多條資料線(data line)來控制排列成陣列的子畫素(sub-pixel),而達成顯示圖像之目的。各掃描線依序地被導通以開啟或關閉對應的開關元件,以使各資料線所傳送之訊號能夠傳輸進子畫素中,從而改變對應之子畫素的狀態,並達成顯示畫面之目的。The existing display panel usually uses multiple scan lines and multiple data lines to control the sub-pixels arranged in an array to achieve the purpose of displaying images. Each scan line is sequentially turned on to turn on or off the corresponding switch element, so that the signal transmitted by each data line can be transmitted into the sub-pixels, thereby changing the state of the corresponding sub-pixels, and achieving the purpose of displaying images.
雖然顯示面板的相關技術已趨成熟,但顯示面板的組成元件,如畫素陣列,在製造過程之中難免會產生一些瑕疵(defect)。例如,畫素陣列中的掃描線與資料線因其長度很長,故容易發生斷線的情形。當掃描線或資料線發生斷線時,會導致一部分的子畫素無法動作(線缺陷),故必須設法修補斷線。此外,若僅依賴改善製程技術來實現零瑕疵率是非常困難的,因此,顯示面板的瑕疵修補技術就變得相當重要。Although the related technology of the display panel has matured, the component elements of the display panel, such as the pixel array, will inevitably have some defects in the manufacturing process. For example, the scan lines and data lines in the pixel array are prone to disconnection due to their long lengths. When the scan line or the data line is broken, it will cause a part of the sub-pixels to fail (line defect), so we must try to repair the broken line. In addition, it is very difficult to achieve zero defect rate only by relying on improving process technology. Therefore, defect repair technology for display panels becomes very important.
在習知技術中,顯示面板的瑕疵修補通常採用雷射熔接(laser welding)及/或雷射切割(laser cutting)等方式進行。舉例來說,藉由將修復線與損壞之資料線熔接,使修復線之訊號可以傳輸給損壞之資料線。然而,修復線所傳輸的訊號容易被寄生電容所影響,導致訊號衰減及修復成功率降低等問題。In the prior art, the defect repair of the display panel is usually performed by means of laser welding and/or laser cutting. For example, by welding the repair line and the damaged data line, the signal of the repair line can be transmitted to the damaged data line. However, the signal transmitted by the repair line is easily affected by parasitic capacitance, which leads to problems such as signal attenuation and lower repair success rate.
本發明提供一種顯示面板,能改善修復線訊號衰減及修復成功率降低等問題的問題。The present invention provides a display panel, which can improve the problems of repair line signal attenuation and reduction of repair success rate.
本發明的一實施例提供一種顯示面板,包括基板、畫素陣列、晶片、多個第一多工器、多條訊號源線路、修復線、第二多工器以及第一傳輸線。畫素陣列位於基板上。畫素陣列包括多條資料線、多條掃描線以及多個子畫素。各資料線的第一端靠近畫素陣列的第一側,且各資料線的第二端靠近畫素陣列的第二側。多個子畫素電性連接至資料線以及掃描線。晶片位於基板上。多個第一多工器靠近畫素陣列的第一側,且電性連接資料線。多條訊號源線路電性連接晶片以及第一多工器。修復線重疊於訊號源線路。修復線具有多個第一接墊,第一多工器位於第一接墊與畫素陣列之間,且各第一接墊重疊於訊號源線路中對應的一條。第二多工器電性連接修復線。第一傳輸線重疊於第二多工器。第一傳輸線具有位於畫素陣列的第二側的多個第二接墊。各第二接墊重疊於資料線中對應的一條。An embodiment of the present invention provides a display panel including a substrate, a pixel array, a chip, a plurality of first multiplexers, a plurality of signal source lines, a repair line, a second multiplexer, and a first transmission line. The pixel array is located on the substrate. The pixel array includes multiple data lines, multiple scan lines, and multiple sub-pixels. The first end of each data line is close to the first side of the pixel array, and the second end of each data line is close to the second side of the pixel array. The multiple sub-pixels are electrically connected to the data line and the scan line. The wafer is located on the substrate. The plurality of first multiplexers are close to the first side of the pixel array and are electrically connected to the data line. The multiple signal source lines are electrically connected to the chip and the first multiplexer. The repair line overlaps the signal source line. The repair line has a plurality of first pads, the first multiplexer is located between the first pads and the pixel array, and each first pad overlaps a corresponding one of the signal source lines. The second multiplexer is electrically connected to the repair line. The first transmission line overlaps the second multiplexer. The first transmission line has a plurality of second pads located on the second side of the pixel array. Each second pad overlaps a corresponding one of the data lines.
為讓本發明的上述特徵和優點能更明顯易懂,下文特舉實施例,並配合所附圖式作詳細說明如下。In order to make the above-mentioned features and advantages of the present invention more comprehensible, the following specific embodiments are described in detail in conjunction with the accompanying drawings.
在附圖中,為了清楚起見,放大了層、膜、面板、區域等的厚度。在整個說明書中,相同或類似的附圖標記表示相同或類似的元件。應當理解,當諸如層、膜、區域或基板的元件被稱為在另一元件「上」或「連接到」另一元件時,前述元件可以直接在另一元件上或與另一元件連接,或者位於前述元件與另一元件之間的中間元件可以也存在。相反,當元件被稱為「直接在另一元件上」或「直接連接到」另一元件時,前述元件與另一元件之間不存在中間元件。如本文所使用的,「連接」可以指物理及/或電性連接。再者,「電性連接」或「耦合」係可為二元件間存在其它元件。In the drawings, the thickness of layers, films, panels, regions, etc., are exaggerated for clarity. Throughout the specification, the same or similar reference signs indicate the same or similar elements. It should be understood that when an element such as a layer, film, region or substrate is referred to as being "on" or "connected" to another element, the aforementioned element may be directly on or connected to another element, Or an intermediate element between the aforementioned element and another element may also be present. In contrast, when an element is referred to as being "directly on" or "directly connected to" another element, there are no intermediate elements between the aforementioned element and the other element. As used herein, "connection" can refer to physical and/or electrical connection. Furthermore, "electrical connection" or "coupling" can mean that there are other elements between two elements.
本文使用的「約」、「近似」、或「實質上」包括所述值和在本領域普通技術人員確定的特定值的可接受的偏差範圍內的平均值,考慮到所討論的測量和與測量相關的誤差的特定數量(即,測量系統的限制)。例如,「約」可以表示在所述值的一個或多個標準偏差內,或±30%、±20%、±10%、±5%內。再者,本文使用的「約」、「近似」或「實質上」可依光學性質、蝕刻性質或其它性質,來選擇可接受的偏差範圍或標準偏差。As used herein, "approximately", "approximately", or "substantially" includes the stated value and the average value within the acceptable deviation range of the specific value determined by a person of ordinary skill in the art, taking into account the measurement in question and the The specific amount of measurement-related error (ie, the limitation of the measurement system). For example, "about" can mean within one or more standard deviations of the stated value, or within ±30%, ±20%, ±10%, ±5%. Furthermore, the "about", "approximately" or "substantially" used herein can select an acceptable deviation range or standard deviation based on optical properties, etching properties or other properties.
除非另有定義,本文使用的所有術語(包括技術和科學術語)具有與本發明所屬領域的普通技術人員通常理解的相同的含義。諸如在通常使用的字典中定義的那些術語應當被解釋為具有與它們在相關技術和本發明的上下文中的含義一致的含義,並且將不被解釋為理想化的或過度正式的意義,除非本文中明確地這樣定義。Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by those of ordinary skill in the art to which the present invention belongs. Terms such as those defined in commonly used dictionaries should be interpreted as having meanings consistent with their meanings in the context of the related technology and the present invention, and will not be interpreted as idealized or excessively formal meanings unless this text Clearly defined in this way.
圖1是依照本發明的一實施例的一種顯示面板的上視示意圖。圖2A是圖1的顯示面板的區域A的局部放大圖。圖2B是圖1的顯示面板的區域A的局部電路圖。圖3A是圖2A剖線aa’的剖面示意圖。圖3B是圖2A剖線bb’的剖面示意圖。圖4A是圖1的顯示面板的區域B的局部放大圖。圖4B是圖1的顯示面板的區域B的局部電路圖。圖5是圖4A剖線cc’的剖面示意圖。圖6是圖1的顯示面板的區域C的局部放大圖。圖7是圖6剖線dd’的剖面示意圖。FIG. 1 is a schematic top view of a display panel according to an embodiment of the invention. FIG. 2A is a partial enlarged view of area A of the display panel of FIG. 1. FIG. 2B is a partial circuit diagram of area A of the display panel of FIG. 1. Fig. 3A is a schematic cross-sectional view taken along line aa' in Fig. 2A. Fig. 3B is a schematic cross-sectional view taken along line bb' of Fig. 2A. FIG. 4A is a partial enlarged view of area B of the display panel of FIG. 1. 4B is a partial circuit diagram of area B of the display panel of FIG. 1. Fig. 5 is a schematic cross-sectional view taken along line cc' of Fig. 4A. FIG. 6 is a partial enlarged view of area C of the display panel in FIG. 1. Fig. 7 is a schematic cross-sectional view taken along the line dd' of Fig. 6.
請參考圖1,顯示面板10包括基板100、畫素陣列200、晶片300、多個第一多工器410、第二多工器420、多條訊號源線路510、修復線520以及第一傳輸線530。在本實施例中,顯示面板10還包括導線540、訊號放大器600、可撓式電路板700、電路板800以及對向基板900。Please refer to FIG. 1, the
基板100之材質可為玻璃、石英、有機聚合物、或是不透光/反射材料(例如:導電材料、金屬、晶圓、陶瓷或其它可適用的材料)或是其它可適用的材料。若使用導電材料或金屬時,則在基板100上覆蓋一層絕緣層(未繪示),以避免短路問題。The material of the
基板100包括顯示區110以及位於顯示區110外側的周邊區120。The
畫素陣列200位於基板100上。畫素陣列200包括多條資料線210、多條掃描線220以及多個子畫素230。各資料線210的第一端212靠近畫素陣列200的第一側S1,且各資料線210的第二端214靠近畫素陣列200的第二側S2。多個子畫素230位於顯示區110上。多條資料線210以及多條掃描線220部分位於顯示區110上,且多條資料線210以及多條掃描線220部分位於周邊區120。The
多個子畫素230電性連接至多條資料線210以及多條掃描線220。在本實施例中,各個子畫素230包括開關元件232以及畫素電極234。開關元件232與對應的一條掃描線220、對應的一條資料線210以及對應的一個畫素電極234電性連接。在本實施例中,開關元件232為底部閘極型開關元件,但本發明不以此為限。在其他實施例中,開關元件232為頂部閘極型開關元件或其他類型的開關元件。The plurality of
晶片300位於基板100上。在本實施例中,晶片300位於基板100的周邊區120上。晶片300中例如包括源極驅動電路以及其他電路,且晶片300電性連接至資料線210。在一些實施例中,顯示面板10包括閘極驅動電路(未繪出),閘極驅動電路可以位於晶片300中,也可以位於基板100上之其他位置。閘極驅動電路電性連接至掃描線220。晶片300的數量可以依照實際需求而進行調整。The
請同時參考圖1、圖2A以及圖2B,多個第一多工器410位於基板100上。在本實施例中,第一多工器410位於基板100的周邊區120上。Please refer to FIG. 1, FIG. 2A and FIG. 2B at the same time, a plurality of
多個第一多工器410靠近畫素陣列200的第一側S1,且電性連接資料線210。多條訊號源線路510電性連接晶片300以及第一多工器410。The plurality of
在本實施例中,各第一多工器410包括第一開關元件412以及第二開關元件414。第一開關元件412的汲極412D以及第二開關元件414的汲極414D電性連接至訊號源線路510中對應的一條。第一開關元件412的源極412S以及第二開關元件414的源極414S分別電性連接至資料線210中不同的兩條。In this embodiment, each
請參考圖1、圖2A、圖2B與圖3A,在本實施例中,多條資料線210包括依序排列的資料線2101、資料線2102、資料線2103以及資料線2104。資料線210的數量可以依照實際需求而進行調整。Please refer to FIG. 1, FIG. 2A, FIG. 2B, and FIG. 3A. In this embodiment, the plurality of
多個第一多工器410包括依序排列的第一多工器4101以及第一多工器4102。第一多工器4101電性連接至資料線2101以及資料線2103。第一多工器4102電性連接至資料線2102以及資料線2104。藉此,可以改善顯示面板10畫面紋路的問題,並可使顯示面板10更省電。The plurality of
請參考圖2A以及圖3A,在本實施例中,顯示面板10更包括第一絕緣層I1以及第二絕緣層I2。第一絕緣層I1位於基板100上。第二絕緣層I2位於第一絕緣層I1上。2A and 3A, in this embodiment, the
第一多工器4101透過連接線CS以及橋接結構BS電性連接資料線2103。連接線CS連接第一多工器4101,且透過第一開口H1電性連接至橋接結構BS。橋接結構BS跨越資料線2102。資料線2103透過第二開口H2電性連接至橋接結構BS。第一開口H1以及第二開口H2貫穿第二絕緣層I2。在其他實施例中,資料線2102與資料線2103的位置互換,且第一多工器4101不需要透過連接線CS以及橋接結構BS電性連接資料線2103電性連接資料線2103。換句話說,本發明並未限制顯示面板10包括連接線CS以及橋接結構BS。The
請參考圖2A以及圖2B,在本實施例中,顯示面板10更包括第一控制線416以及第二控制線418。第一控制線416電性連接至第一開關元件412的閘極412G。第二控制線418電性連接至第二開關元件414的閘極414G。2A and FIG. 2B, in this embodiment, the
雖然在本實施例中,第一多工器410包括兩個開關元件為例,但本發明不以此為限。在其他實施例中,第一多工器410包括三個以上的開關元件,且各第一多工器410電性連接至三條資料線210。Although in this embodiment, the
請參考圖1、圖2A、圖2B以及圖3B,修復線520重疊於訊號源線路510。修復線520具有多個第一接墊522。第一多工器410位於第一接墊522與畫素陣列200之間。Please refer to FIG. 1, FIG. 2A, FIG. 2B, and FIG. 3B, the
各第一接墊522於垂直基板100的方向D上重疊於訊號源線路510中對應的一條。第二絕緣層I2位於修復線520的第一接墊522與訊號源線路510之間。由於第一接墊522是重疊於訊號源線路510而非重疊於資料線210,且訊號源線路510的數量少於資料線210的數量,因此,修復線520上的寄生電容可以減少,且訊號不會先被第一多工器410減弱後才傳至修復線520,因此,能改善修復線520訊號衰減及顯示面板10修復成功率降低等問題。Each
在本實施例中,修復線520包括第一線段524以及第二線段526。部分第一接墊522位於第一線段524上,且重疊於部分訊號源線路510。另一部分第一接墊522位於第二線段526上,且重疊於另一部分訊號源線路510,藉此,進一步降低修復線520上的寄生電容,並改善修復線520訊號衰減及顯示面板10修復成功率降低等問題。In this embodiment, the
在本實施例中,第一接墊522的寬度小於第一線段524以及第二線段526的寬度,但本發明不以此為限。須注意的是,圖1與圖3中的第一接墊522的大小僅是用於示意。為了方便說明,圖1與圖3中的第一接墊522之尺寸被額外放大。In this embodiment, the width of the
請同時參考圖1、圖4A、圖4B以及圖5,第二多工器420電性連接修復線520。在本實施例中,訊號放大器600電性連接修復線520。導線540電性連接訊號放大器600與第二多工器420。換句話說,修復線520上的訊號被訊號放大器600加強後,經由導線540傳遞給第二多工器420。在本實施例中,訊號放大器600位於晶片300上。Please refer to FIGS. 1, 4A, 4B and 5 at the same time, the
第二多工器420包括第三開關元件422以及第四開關元件424。第三開關元件422的汲極422D以及第四開關元件424的汲極424D電性連接至修復線520。在本實施例中,第三開關元件422的汲極422D以及第四開關元件424的汲極424D透過導線540以及訊號放大器600電性連接修復線520。The
在本實施例中,顯示面板10更包括第三控制線426以及第四控制線428。第三控制線426電性連接至第三開關元件422的閘極422G。第四控制線428電性連接至第四開關元件424的閘極424G。在本實施例中,第三控制線426以及第四控制線428分別控制的訊號時序與第一控制線416以及第二控制線418同。換句話說,第三控制線426與第一控制線416電性相連,且兩者傳遞同樣的訊號;第四控制線428與第二控制線418電性相連,且兩者傳遞同樣的訊號。In this embodiment, the
第一傳輸線530於垂直基板100的方向D上重疊於第二多工器420。在本實施例中,第一傳輸線530重疊於第三開關元件422的源極422S以及第四開關元件424的源極424S。在本實施例中,第一傳輸線530與源極422S之間以及第一傳輸線530與源極424S之間夾有第二絕緣層I2。第一傳輸線530自畫素陣列200的第三側S3繞過畫素陣列200,其中畫素陣列200的第三側S3位於畫素陣列200的第一側S1與第二側S2之間。The
請參考圖1、圖6以及圖7,第一傳輸線530具有位於畫素陣列200的第二側S2的多個第二接墊532。各第二接墊532重疊於資料線210(包括圖6中的資料線2101至2104)中對應的一條。在本實施例中,各資料線210(包括圖6中的資料線2101至2104)分別包括第一導電層210a以及第二導電層210b。在本實施例中,第一導電層210a位於第一絕緣層I1與第二絕緣層I2之間,且第二導電層210b位於第二絕緣層I2上。第二導電層210b透過開口H3而電性連接至第一導電層210a,開口H3例如位於第二絕緣層I2中。各第二接墊532於垂直基板100的方向D上重疊於資料線210的第一導電層210a,且第二接墊532與第一導電層210a之間夾有第二絕緣層I2。Please refer to FIGS. 1, 6 and 7, the
在本實施例中,多個標記LB位於資料線210旁邊,標記LB可以為數字。設置標記LB能使損壞的資料線210之位置更容易被辨別。In this embodiment, multiple marks LB are located beside the
請參考圖1,可撓式電路板700以及電路板800位於基板100上。對向基板900位於基板100上,且覆蓋畫素陣列200。在一些實施例中,顯示面板10為液晶顯示面板,且對向基板900與基板100之間夾有液晶材料。在一些實施例中,對向基板900包括濾光元件。Please refer to FIG. 1, the
圖8是依照本發明的一實施例的一種顯示面板的上視示意圖。圖9是圖8的顯示面板的區域A的局部放大圖。圖10是圖9剖線bb’的剖面示意圖。圖11是圖8的顯示面板的區域B的局部放大圖。圖12是圖11剖線cc’的剖面示意圖。圖13是圖8的顯示面板的區域C的局部放大圖。圖14是圖13剖線dd’的剖面示意圖。FIG. 8 is a schematic top view of a display panel according to an embodiment of the invention. FIG. 9 is a partial enlarged view of area A of the display panel of FIG. 8. Fig. 10 is a schematic cross-sectional view taken along line bb' of Fig. 9. FIG. 11 is a partial enlarged view of area B of the display panel of FIG. 8. Fig. 12 is a schematic cross-sectional view taken along the line cc' in Fig. 11. FIG. 13 is a partial enlarged view of area C of the display panel of FIG. 8. Fig. 14 is a schematic cross-sectional view taken along the line dd' of Fig. 13.
圖8的顯示面板10a與圖1的顯示面板10之主要差異在於:顯示面板10a的其中一條資料線210具有缺陷DF。The main difference between the
在本實施例中,藉由熔接製程來修復具有缺陷DF的資料線210。在本實施例中,以資料線2103具有缺陷DF為例。In this embodiment, the
請參考圖8、圖9以及圖10,第一接墊522的其中一者與訊號源線路510中對應的一條熔接。在本實施例中,與第一接墊522熔接之訊號源線路510對應於具有缺陷DF之資料線2103,使提供給資料線2103之訊號可以傳遞至修復線520。Please refer to FIG. 8, FIG. 9, and FIG. 10, one of the
在本實施例中,藉由雷射熔接第一接墊522與訊號源線路510,使第二絕緣層I2中形成有第一熔接孔WH1。In this embodiment, by laser welding the
請參考圖8、圖11以及圖12,第二多工器420中,第三開關元件422的源極422S與第一傳輸線530熔接,使第二絕緣層I2中形成有第二熔接孔WH2,且第四開關元件424的源極424S斷路。換句話說,修復線520上的訊號在經由訊號放大器600放大後傳至導線540,而導線540上的訊號藉由第三開關元件422來控制是否傳遞給第一傳輸線530。也可以說,第三開關元件422控制了第一傳輸線530上之訊號的時序。Referring to FIGS. 8, 11 and 12, in the
在其他實施例中,第四開關元件424的源極424S與第一傳輸線530熔接,且第三開關元件422的源極422S斷路。In other embodiments, the
在本實施例中,由於第二多工器420藉由一條第一傳輸線530輸出訊號,相較於第三開關元件的源極以及第四開關元件的源極分別藉由不同之傳輸線輸出訊號,本實施例可以減少傳輸線所佔據之顯示面板10a的周邊區120面積。因此,本實施例的顯示面板10a可以有更大的空間以設置其他電路(例如閘極驅動電路)。In this embodiment, since the
請參考圖8、圖13以及圖14,第二接墊532的其中一者與資料線210中對應的一條熔接,使第二絕緣層I2中形成有第三熔接孔WH3。在本實施例中,與第二接墊532熔接之資料線210為具有缺陷DF之資料線2103,使訊號源線路510之訊號可以提供給資料線2103。Referring to FIGS. 8, 13 and 14, one of the
基於上述,即使資料線2103於缺陷DF處斷線,位於缺陷DF處後面的資料線2103仍然能傳輸訊號,使位於缺陷DF處後面的子畫素230能夠運作。此外,由於第一接墊522是重疊於訊號源線路510而非重疊於資料線210,修復線520上的寄生電容可以減少,且訊號不會先被第一多工器410減弱後才傳至修復線520,因此,能改善修復後之資料線2103的訊號衰弱的問題及修復成功率低的問題。Based on the above, even if the
在其他實施例中,資料線2103短路,藉由雷射切割製程使資料線2103短路的部分斷路,接著再修復資料線2103。In other embodiments, the
圖15是依照本發明的一實施例的一種顯示面板的上視示意圖。圖16A是圖15的顯示面板的區域C的局部放大圖。圖16B是圖15的顯示面板的區域C的局部電路圖。FIG. 15 is a schematic top view of a display panel according to an embodiment of the invention. FIG. 16A is a partial enlarged view of area C of the display panel of FIG. 15. FIG. 16B is a partial circuit diagram of area C of the display panel of FIG. 15.
圖15的顯示面板10b與圖9的顯示面板10a類似,因此顯示面板10b與顯示面板10a相同的部分於此不再說明。顯示面板10b與顯示面板10a之主要差異在於:顯示面板10b更包括第二傳輸線530a。The
在本實施例中,第二多工器420設置於畫素陣列200的第二側S2。導線540自畫素陣列200的第三側S3繞過畫素陣列200。In this embodiment, the
第一傳輸線530與第二傳輸線530a重疊於第二多工器420。第三開關元件422的源極422S與第一傳輸線530電性連接。第四開關元件424的源極424S與第二傳輸線530a電性連接。The
第一傳輸線530具有位於畫素陣列200的第二側S2的多個第二接墊532,且各第二接墊532重疊於資料線210中對應的一條。第二傳輸線530a具有位於畫素陣列200的第二側S2的多個第三接墊532a,且各第三接墊532a重疊於資料線210中對應的一條。The
在本實施例中,資料線2103具有缺陷DF。熔接第二接墊532或第二接墊532a與具有缺陷DF之資料線2103,使訊號源線路510之訊號可以提供給資料線2103。在本實施例中,熔接第二接墊532與資料線2103,使第二絕緣層I2中形成有第三熔接孔WH3。In this embodiment, the
雖然在本實施例中,以熔接第二接墊532與資料線2103為例,但本發明不以此為限。在其他實施例中,其他資料線具有缺陷,例如資料線2102具有缺陷,因此,熔接第三接墊532a與資料線2102以修復資料線2102。Although in this embodiment, the welding of the
基於上述,即使資料線2103於缺陷DF處斷線,位於缺陷DF處後面的資料線2103仍然能傳輸訊號,使位於缺陷DF處後面的子畫素230能夠運作。此外,由於第一接墊522是重疊於訊號源線路510而非重疊於資料線210,修復線520上的寄生電容可以減少,且訊號不會先被第一多工器410減弱後才傳至修復線520,因此,能改善修復後之資料線2103的訊號衰弱的問題及修復成功率降低的問題。Based on the above, even if the
圖17是依照本發明的一實施例的一種顯示面板的上視示意圖。FIG. 17 is a schematic top view of a display panel according to an embodiment of the invention.
圖17的顯示面板10c與圖15的顯示面板10b類似,因此顯示面板10c與顯示面板10b相同的部分於此不再說明。顯示面板10c與顯示面板10b之主要差異在於:顯示面板10c的部分修復線520以及部分導線540經過可撓式電路板700以及電路板800。The
請參考圖17,在本實施例中,部分修復線520以及部分導線540位於可撓式電路板700以及電路板800中。舉例來說,部分第二線段526以及部分導線540位於可撓式電路板700以及電路板800中。Please refer to FIG. 17, in this embodiment, part of the
在本實施例中,藉由可撓式電路板700以及電路板800設置,可減少修復線520以及導線540跨越其他電路時所產生之電容。In this embodiment, by providing the
圖18是依照本發明的一實施例的一種顯示面板的上視示意圖。FIG. 18 is a schematic top view of a display panel according to an embodiment of the invention.
圖18的顯示面板10d與圖17的顯示面板10c類似,因此顯示面板10d與顯示面板10c相同的部分於此不再說明。顯示面板10d與顯示面板10c之主要差異在於:顯示面板10d的訊號放大器600位於可撓式電路板700上。The
綜上所述,由於修復線的第一接墊是重疊於訊號源線路而非重疊於資料線,修復線上的寄生電容可以減少,且訊號不會先被第一多工器減弱後才傳至修復線,因此,能改善修復後之資料線的訊號衰弱的問題及修復成功率低的問題。In summary, since the first pad of the repair line overlaps the signal source line instead of the data line, the parasitic capacitance on the repair line can be reduced, and the signal will not be transmitted to after being weakened by the first multiplexer. The repair line, therefore, can improve the problem of the signal weakening of the repaired data line and the problem of low repair success rate.
雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明的精神和範圍內,當可作些許的更動與潤飾,故本發明的保護範圍當視後附的申請專利範圍所界定者為準。Although the present invention has been disclosed in the above embodiments, it is not intended to limit the present invention. Anyone with ordinary knowledge in the relevant technical field can make slight changes and modifications without departing from the spirit and scope of the present invention. The scope of protection of the present invention shall be determined by the scope of the attached patent application.
10、10a、10b、10c、10d:電子裝置
100:基板
110:顯示區
120:周邊區
200:畫素陣列
210、2101~2104:資料線
210a:第一導電層
210b:第二導電層
220:掃描線
230:子畫素
232:開關元件
234:畫素電極
300:晶片
410、4101、4102:第一多工器
412:第一開關元件
412D、414D、422D、424D:汲極
412G、414G、422G、424G:閘極
412S、414S、422S、424S:源極
414:第二開關元件
416:第一控制線
418:第二控制線
420:第二多工器
422:第三開關元件
424:第四開關元件
426:第三控制線
428:第四控制線
510:訊號源線路
520:修復線
522:第一接墊
524:第一線段
526:第二線段
530:第一傳輸線
530a:第二傳輸線
532:第二接墊
532a:第三接墊
540:導線
600:訊號放大器
700:可撓式電路板
800:電路板
900:對向基板
A、B、C:區域
BS:橋接結構
CS:連接線
D:方向
DF:缺陷
H1:第一開口
H2:第二開口
H3:開口
I1:第一絕緣層
I2:第二絕緣層
LB:標記
S1:第一側
S2:第二側
S3:第三側
WH1:第一熔接孔
WH2:第二熔接孔
WH3:第三熔接孔10, 10a, 10b, 10c, 10d: electronic device
100: substrate
110: display area
120: Surrounding area
200:
圖1是依照本發明的一實施例的一種顯示面板的上視示意圖。 圖2A是圖1的顯示面板的區域A的局部放大圖。 圖2B是圖1的顯示面板的區域A的局部電路圖。 圖3A是圖2A剖線aa’的剖面示意圖。 圖3B是圖2A剖線bb’的剖面示意圖。 圖4A是圖1的顯示面板的區域B的局部放大圖。 圖4B是圖1的顯示面板的區域B的局部電路圖。 圖5是圖4A剖線cc’的剖面示意圖。 圖6是圖1的顯示面板的區域C的局部放大圖。 圖7是圖6剖線dd’的剖面示意圖。 圖8是依照本發明的一實施例的一種顯示面板的上視示意圖。 圖9是圖8的顯示面板的區域A的局部放大圖。 圖10是圖9剖線bb’的剖面示意圖。 圖11是圖8的顯示面板的區域B的局部放大圖。 圖12是圖11剖線cc’的剖面示意圖。 圖13是圖8的顯示面板的區域C的局部放大圖。 圖14是圖13剖線dd’的剖面示意圖。 圖15是依照本發明的一實施例的一種顯示面板的上視示意圖。 圖16A是圖15的顯示面板的區域C的局部放大圖。 圖16B是圖15的顯示面板的區域C的局部電路圖。 圖17是依照本發明的一實施例的一種顯示面板的上視示意圖。 圖18是依照本發明的一實施例的一種顯示面板的上視示意圖。 FIG. 1 is a schematic top view of a display panel according to an embodiment of the invention. FIG. 2A is a partial enlarged view of area A of the display panel of FIG. 1. FIG. 2B is a partial circuit diagram of area A of the display panel of FIG. 1. Fig. 3A is a schematic cross-sectional view taken along line aa' in Fig. 2A. Fig. 3B is a schematic cross-sectional view taken along line bb' of Fig. 2A. FIG. 4A is a partial enlarged view of area B of the display panel of FIG. 1. 4B is a partial circuit diagram of area B of the display panel of FIG. 1. Fig. 5 is a schematic cross-sectional view taken along line cc' of Fig. 4A. FIG. 6 is a partial enlarged view of area C of the display panel in FIG. 1. Fig. 7 is a schematic cross-sectional view taken along the line dd' of Fig. 6. FIG. 8 is a schematic top view of a display panel according to an embodiment of the invention. FIG. 9 is a partial enlarged view of area A of the display panel of FIG. 8. Fig. 10 is a schematic cross-sectional view taken along line bb' of Fig. 9. FIG. 11 is a partial enlarged view of area B of the display panel of FIG. 8. Fig. 12 is a schematic cross-sectional view taken along the line cc' in Fig. 11. FIG. 13 is a partial enlarged view of area C of the display panel of FIG. 8. Fig. 14 is a schematic cross-sectional view taken along the line dd' of Fig. 13. FIG. 15 is a schematic top view of a display panel according to an embodiment of the invention. FIG. 16A is a partial enlarged view of area C of the display panel of FIG. 15. FIG. 16B is a partial circuit diagram of area C of the display panel of FIG. 15. FIG. 17 is a schematic top view of a display panel according to an embodiment of the invention. FIG. 18 is a schematic top view of a display panel according to an embodiment of the invention.
10a:電子裝置 10a: Electronic device
100:基板 100: substrate
110:顯示區 110: display area
120:周邊區 120: Surrounding area
200:畫素陣列 200: pixel array
210:資料線 210: data line
220:掃描線 220: scan line
230:子畫素 230: sub-pixel
232:開關元件 232: switching element
234:畫素電極 234: pixel electrode
300:晶片 300: chip
410:第一多工器 410: first multiplexer
420:第二多工器 420: second multiplexer
510:訊號源線路 510: signal source line
520:修復線 520: repair line
522:第一接墊 522: first pad
524:第一線段 524: first line segment
526:第二線段 526: second line segment
530:第一傳輸線 530: The first transmission line
532:第二接墊 532: second pad
540:導線 540: Wire
600:訊號放大器 600: signal amplifier
700:可撓式電路板 700: Flexible circuit board
800:電路板 800: circuit board
900:對向基板 900: Opposite substrate
A、B、C:區域 A, B, C: area
D:方向 D: direction
DF:缺陷 DF: defect
S1:第一側 S1: First side
S2:第二側 S2: second side
S3:第三側 S3: Third side
WH1:第一熔接孔 WH1: The first welding hole
WH2:第二熔接孔 WH2: second welding hole
WH3:第三熔接孔 WH3: third welding hole
Claims (13)
Priority Applications (2)
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TW108120839A TWI703540B (en) | 2019-06-17 | 2019-06-17 | Display panel |
CN201911139520.XA CN110908200B (en) | 2019-06-17 | 2019-11-20 | Display panel |
Applications Claiming Priority (1)
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TW108120839A TWI703540B (en) | 2019-06-17 | 2019-06-17 | Display panel |
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TWI703540B true TWI703540B (en) | 2020-09-01 |
TW202101405A TW202101405A (en) | 2021-01-01 |
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TW (1) | TWI703540B (en) |
Cited By (1)
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TWI762324B (en) * | 2020-11-10 | 2022-04-21 | 友達光電股份有限公司 | Display apparatus |
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US11728228B2 (en) * | 2020-05-12 | 2023-08-15 | Chengdu Boe Optoelectronics Technology Co., Ltd. | Display panel and display apparatus |
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TW580682B (en) * | 1999-11-23 | 2004-03-21 | Koninkl Philips Electronics Nv | Self diagnostic and repair in matrix display panel |
TW201445156A (en) * | 2013-05-31 | 2014-12-01 | Samsung Display Co Ltd | Organic light-emitting display panel |
TW201709172A (en) * | 2015-08-26 | 2017-03-01 | 樂金顯示科技股份有限公司 | Display device comprising display panel with bridge patterns |
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KR20070020778A (en) * | 2005-08-17 | 2007-02-22 | 삼성전자주식회사 | Liquid crystal display panel, testing method thereof, and repairing method thereof |
CN101587247A (en) * | 2008-05-23 | 2009-11-25 | 上海广电Nec液晶显示器有限公司 | Liquid crystal display device and repairing method thereof |
CN102789077B (en) * | 2012-08-01 | 2014-12-10 | 京东方科技集团股份有限公司 | LCD device and repair method thereof |
US20160093260A1 (en) * | 2014-09-29 | 2016-03-31 | Innolux Corporation | Display device and associated method |
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EP0806727B1 (en) * | 1996-04-29 | 2002-08-14 | International Business Machines Corporation | TFT/LCD active data line repair |
TW580682B (en) * | 1999-11-23 | 2004-03-21 | Koninkl Philips Electronics Nv | Self diagnostic and repair in matrix display panel |
TW201445156A (en) * | 2013-05-31 | 2014-12-01 | Samsung Display Co Ltd | Organic light-emitting display panel |
TW201709172A (en) * | 2015-08-26 | 2017-03-01 | 樂金顯示科技股份有限公司 | Display device comprising display panel with bridge patterns |
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TWI762324B (en) * | 2020-11-10 | 2022-04-21 | 友達光電股份有限公司 | Display apparatus |
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TW202101405A (en) | 2021-01-01 |
CN110908200A (en) | 2020-03-24 |
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