TWI703375B - Sensing control module and sensing method - Google Patents
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Abstract
Description
本發明有關一種感應控制電路以及感應方法;特別是有關於一種可以應用於微流體控制或電濕潤控制的感應控制電路以及感應方法。The present invention relates to an induction control circuit and an induction method; in particular, it relates to an induction control circuit and an induction method that can be applied to microfluidic control or electrowetting control.
微流道生物晶片可以不需要額外的標記(Label-free)來對樣品作檢測。藉由電溼潤(electro-wetting)效應,微流道中的流體樣品可以藉由電壓來控制,例如是移動位置或是流體樣品和基板的接觸面積,藉以提供更精密、更自動化的生物樣品檢測。Microfluidic biochips can detect samples without additional labels (Label-free). With the electro-wetting effect, the fluid sample in the microchannel can be controlled by voltage, such as moving the position or the contact area between the fluid sample and the substrate, so as to provide more precise and automated biological sample detection.
本發明提供一種感應控制模組以及感應方法,其可以維持良好的訊號對比,藉以提供有效的感應功能。The present invention provides a sensing control module and sensing method, which can maintain good signal contrast, thereby providing effective sensing functions.
本發明一實施例的感應控制模組包括多個電路組以及多個第一感應線。每個電路組包括多個感應控制電路,每個感應控制電路包括感應電容以及第一電晶體。每個感應電容中具有一檢測空間供流體通過。感應電容連接至第一電晶體的閘極。每個感應線連接至其中一電路組中這些第一電晶體,並透過這些第一電晶體連接至一第一電源,以傳遞第一感應訊號。The sensing control module of an embodiment of the present invention includes a plurality of circuit groups and a plurality of first sensing lines. Each circuit group includes a plurality of induction control circuits, and each induction control circuit includes an induction capacitor and a first transistor. Each sensing capacitor has a detection space for fluid to pass through. The sensing capacitor is connected to the gate of the first transistor. Each sensing line is connected to the first transistors in one of the circuit groups, and is connected to a first power source through the first transistors to transmit the first sensing signal.
本發明一實施例的感應控制模組包括多個感應控制電路、多條第一感應線以及多條參考電壓線。這些感應控制電路排列為多個元件行。每個感應控制電路包括感應電容以及第一電晶體。每個感應電容中具有一檢測空間供流體通過,且感應電容連接至第一電晶體的閘極。每個感應控制電路的第一電晶體連接於其中一第一感應線和一第一電源之間,以傳遞一第一感應訊號。每個感應控制電路的第一電晶體的閘極連接於其中一參考電壓線。在每個感應控制電路中,參考電壓線在第一電晶體傳遞第一感應訊號之前提供一參考電壓訊號,在第一電晶體傳遞第一感應訊號時,參考電壓訊號自一第一電位提升至一第二電位。The induction control module of an embodiment of the present invention includes a plurality of induction control circuits, a plurality of first induction lines, and a plurality of reference voltage lines. These sensing control circuits are arranged in multiple element rows. Each induction control circuit includes an induction capacitor and a first transistor. Each sensing capacitor has a detection space for fluid to pass through, and the sensing capacitor is connected to the gate of the first transistor. The first transistor of each induction control circuit is connected between one of the first induction lines and a first power source to transmit a first induction signal. The gate of the first transistor of each induction control circuit is connected to one of the reference voltage lines. In each sensing control circuit, the reference voltage line provides a reference voltage signal before the first transistor transmits the first sensing signal. When the first transistor transmits the first sensing signal, the reference voltage signal is raised from a first potential to A second potential.
本發明一實施例的感應方法包括: 提供一參考電壓訊號至一感應控制電路中的一第一電晶體的閘極,第一參考電壓訊號具有第一電位; 自第一電晶體感應一第一感應訊號,同時將第二參考電壓訊號的第一電位提升至第二電位; 其中第一電晶體連接於一第一電源以及一第一感應線之間,且第一電晶體的閘極連接至一感應電容,感應電容包括一檢測空間,檢測空間適於供流體通過。The sensing method of an embodiment of the present invention includes: providing a reference voltage signal to the gate of a first transistor in an inductive control circuit, the first reference voltage signal having a first potential; and inducing a first voltage signal from the first transistor The sensing signal simultaneously raises the first potential of the second reference voltage signal to the second potential; wherein the first transistor is connected between a first power source and a first sensing line, and the gate of the first transistor is connected to An induction capacitor includes a detection space, and the detection space is suitable for the passage of fluid.
由上述可知,本發明所提出的感應控制電路可以降低漏電流發生時所造成的訊號影響;本發明所提出的感應方法可以使第一感應訊號不會受到漏電流所影響。It can be seen from the above that the induction control circuit proposed by the present invention can reduce the signal influence caused by leakage current; the induction method proposed by the present invention can prevent the first induction signal from being affected by the leakage current.
本發明所提出的感應控制模組適於應用在微流體晶片等檢測裝置中,較佳為有利用電場的變化以及電濕潤(Electro-wetting)來移動、控制流體樣品的檢測裝置中。請參照圖1A所繪本發明第一實施例中感應控制模組50的示意圖。The induction control module proposed by the present invention is suitable for application in detection devices such as microfluidic chips, preferably in detection devices that use changes in electric field and electro-wetting to move and control fluid samples. Please refer to FIG. 1A for a schematic diagram of the
在附圖中,為了清楚起見,放大了層、膜、面板、區域等的大小及厚度。在整個說明書中,相同或類似的附圖標記表示相同的元件。應當理解,當諸如層、膜、區域或基板的元件被稱為在另一元件「上」或「連接到」另一元件時,其可以直接在另一元件上或與另一元件連接,或者中間元件可以也存在。相反,當元件被稱為「直接在另一元件上」或「直接連接到」另一元件時,不存在中間元件。如本文所使用的,「連接」可以指物理及/或電性連接。再者,「電性連接」或「耦合」係可為二元件間存在其它元件。In the drawings, the size and thickness of layers, films, panels, regions, etc., are exaggerated for clarity. Throughout the specification, the same or similar reference numerals denote the same elements. It should be understood that when an element such as a layer, film, region, or substrate is referred to as being "on" or "connected to" another element, it can be directly on or connected to the other element, or Intermediate elements may also be present. In contrast, when an element is referred to as being "directly on" or "directly connected to" another element, there are no intervening elements. As used herein, "connection" can refer to physical and/or electrical connection. Furthermore, "electrical connection" or "coupling" can mean that there are other elements between two elements.
請參照圖1A,本發明第一實施例的感應控制模組50適於在感應區50S感應或控制一流體,較佳為感應或控制一液滴。液滴可以包含任何帶有極性的液體,其可以為帶有離子的液體或水溶液。舉例而言,此液滴設置於感應控制模組50的兩個基板之間的空間,且在此空間中液滴四周可以由非極性液體,例如矽油、十二烷等填充。換句話說,在兩個基板中間所形成的空間中,藉由基板間所施加的電壓而產生的電濕潤效應,液滴可以移動、變形或附著,而剩下的空間可以由上述的非極性液體填充。以上僅舉例說明本發明所提出的感應控制模組50所能應用的領域,並非用以限定本發明。1A, the
請參照圖1A,本實施例的感應控制模組50包括多個電路組100G,這些電路組100G各自包括多個感應控制電路100,且這些電路組100G的這些感應控制電路100分布於感應區50S中。感應控制模組50還可以包括資料控制電路51以及掃描控制電路52,其中資料控制電路51用以傳遞資料訊號並藉由掃描控制電路52來依序開啟這些感應控制電路100中的電晶體以使資料訊號可以傳遞至資料控制電路51中並改變感應區50S中部分區域的電場。1A, the
較佳而言,本實施例的感應控制模組50還包括感應電路53以及定址偵測電路54,其中感應電路53可以感應這些感應控制電路100中其中一行所連接的第一感應線的第一感應訊號,而定址偵測電路54依序提供第二感應訊號來逐一擾動(perturb)每個感應控制電路100中的感應電容,以使感應電路53可以藉由第一感應線所傳遞的第一感應訊號量測到帶有感應電容的電性資訊。以下將進一步說明本發明實施例中感應控制 電路100的特徵。Preferably, the
應當理解,儘管術語「第一」、「第二」等在本文中可以用於描述各種元件、部件或部分,但是這些元件、部件或部分不應受這些術語限制。這些術語僅用於將一個元件、部件或部分區分開。因此,下面討論的「第一元件」、「第一部件」、「第一電晶體」、「第一電容」或「第一訊號」也可以被稱為「第二元件」、「第二部件」、「第二電晶體」、「第二電容」或「第二訊號」而不脫離本文的教導。It should be understood that although the terms "first", "second", etc. may be used herein to describe various elements, components or parts, these elements, components or parts should not be limited by these terms. These terms are only used to distinguish one element, component or part. Therefore, the “first component”, “first component”, “first transistor”, “first capacitor” or “first signal” discussed below can also be referred to as “second component” or “second component” ", "Second Transistor", "Second Capacitor" or "Second Signal" without departing from the teaching of this article.
請參照圖1B所繪之感應控制電路100的示意圖。感應電路控制電路100包括感應電容102以及第一電晶體103。感應電容102具有檢測空間供流體通過,且另一端連接至一參考電極101。第一電晶體103的一端連接至一第一電源v1,另一端連接至第一感應線Sense1,因此當第一電晶體103被致能時,可以自第一電源v1產生電流形成第一感應訊號。Please refer to the schematic diagram of the
具體而言,第一電晶體103的閘極透過電路110連接至感應電容102,其中電路110、第一感應線Sense1以及第一電晶體103例如形成於感應控制模組50的下基板(未繪示),感應電容102所連接的參考電極101例如形成於感應控制模組50的上基板(未繪示),感應電容102的檢測空間位於上基板和下基板之間,感應電容102的電容值因檢測空間中的流體改變時,第一電晶體103的閘極接收到的訊號會改變,進而改變第一電晶體103的通道大小以及來自第一電源v1的第一感應訊號大小。本發明不限於上述的電路元件之基板配置位置,在其他實施例中更可以以同時形成在一側基板的電極來形成電容。Specifically, the gate of the
請參照圖1B,本發明第一實施例的感應控制模組50中,還包括第二感應線Sense2,用以提供第二感應訊號至電路110以擾動感應電容102,並藉由感應電容102的電容值對應此擾動所改變的電壓位準大小來進一步影響第一電晶體103的通道大小,以使第一感應訊號帶有可以得到感應電容102中電容值大小的資訊。1B, the
本發明第一實施例中感應控制模組50還包括閘極線Gate1及掃描線Gate2。閘極線Gate1用以控制第一電晶體103之閘極參考電壓訊號的傳遞;掃描線Gate2用以控制來自資料線Data之資料訊號的傳遞。In the first embodiment of the present invention, the
上述資料線Data以及掃描線Gate2用以控制感應控制電路100中控制液滴的功能,僅用以舉例說明,本領域具有通常知識者可以進一步以其他線路佈局來提供訊號以控制液滴。以下將進一步具體說明本發明所提出的感應控制電路。The above-mentioned data line Data and scan line Gate2 are used to control the function of controlling liquid droplets in the
本發明第一實施例的感應控制模組50包括多個感應控制電路,且這些感應控制電路形成多個電路組,且感應控制模組50還包括多個第一感應線,各自連接其中一電路組。請參照圖2A所繪之本發明第一實施例之元件行column1的示意圖。在本發明的第一實施例中,元件行column1包括感應控制電路100a1、100b1、100a2以及100b2,其中感應控制電路100a1以及100a2來自其中一電路組;感應控制電路100b1以及100b2來自另一電路組。來自同一電路組的感應控制電路100a1以及100a2的第一電晶體103a1以及103a2連接至第一感應線sense1a;來自另一電路組的感應控制電路100b1以及100b2的第一電晶體103b1以及103b2連接至第一感應線sense1b。換句話說,在元件行Column1中,這些感應控制電路100a1、100a2、100b1以及100b2的第一電晶體103a1、103a2、103b1、103b2分別各自連接至第一感應線sense1a或第一感應線sense1b,使第一感應線sense1a、sense1b各自所連接的感應控制電路的數量降低。The
感應電容102a1連接至第一電晶體103a1的閘極;感應電容102a2連接至第一電晶體103a2的閘極,因此第一感應線sense1a所傳遞的第一感應訊號大小實質上會與感應電容102a1或102a2的電容值大小有關。感應電容102b1連接至第一電晶體103b1的閘極;感應電容102b2連接至第一電晶體103b2的閘極,因此第一感應線sense2a所傳遞的第一感應訊號大小實質上會與感應電容102b1或102b2的電容值大小有關。The sensing capacitor 102a1 is connected to the gate of the first transistor 103a1; the sensing capacitor 102a2 is connected to the gate of the first transistor 103a2, so the first sensing signal transmitted by the first sensing line sense1a is substantially equal to the sensing capacitor 102a1 or The capacitance value of 102a2 is related. The sensing capacitor 102b1 is connected to the gate of the first transistor 103b1; the sensing capacitor 102b2 is connected to the gate of the first transistor 103b2, so the first sensing signal transmitted by the first sensing line sense2a is substantially equal to the sensing capacitor 102b1 or The capacitance value of 102b2 is related.
在本實施例中,藉由降低上述每個第一感應線sense1a、sense1b所連接的感應控制電路數量,可以減少漏電流對第一感應訊號的影響。舉例而言,每次在藉由其中一第一感應線(以sense1a為例)接收其中一感應控制電路100a1的第一感應訊號時,第一感應線sense1a只會接收到第一電晶體103a2的漏電流,不會接收到第一電晶體103b1以及103b2的漏電流,反之亦然。因此,藉由不同電路組的感應控制電路各自連接至不同的第一感應線來傳遞第一感應訊號,可以使本實施力的感應控制模組不會受到第一電晶體的漏電流影響到第一感應訊號的偵測能力。換句話說,在感應控制模組50的感應區50S有一血液樣品液滴在矽油移動時,感應控制電路100a1的感應電容102a1的檢測空間中有樣品液滴時的第一感應訊號大小和檢測空間中僅有矽油的第一感應訊號大小差異夠大,可以呈現足夠的對比來判斷樣品液滴是否位於此檢測空間,進而提升第一感應訊號的偵測靈敏度。In this embodiment, by reducing the number of sensing control circuits connected to each of the first sensing wires sense1a, sense1b, the influence of the leakage current on the first sensing signal can be reduced. For example, every time one of the first sensing lines (take sense1a as an example) receives the first sensing signal of one of the sensing control circuits 100a1, the first sensing line sense1a will only receive the first transistor 103a2 The leakage current does not receive the leakage current of the first transistors 103b1 and 103b2, and vice versa. Therefore, by connecting the sensing control circuits of different circuit groups to different first sensing lines to transmit the first sensing signal, the sensing control module of the present implementation force will not be affected by the leakage current of the first transistor. A detection capability for sensing signals. In other words, when a blood sample droplet is moving in the silicon oil in the
具體而言,在本實施例中,第一感應線sense1a或sense1b各自所連接的感應控制電路100的數量可以依據電晶體特性調整,設計為可以讓漏電流所造成的影響降至最低的感應控制電路100最佳化數量,因此可以有效維持第一感應訊號的偵測靈敏度。Specifically, in this embodiment, the number of
另一方面,在本實施例中,這些電路組的感應控制電路100a1、100a2、100b1、100b2為交替排列於元素行column1中。換句話說,感應控制電路100b1的兩側與來自另一電路組的感應控制電路100a1以及100a2相鄰;感應控制電路100a2的兩側則與來自另一電路組的感應控制電路100b1以及100b2相鄰。這些第一感應線sense1a、sense1b可以輪流接收第一感應訊號來依序檢測元素行column1中的這些感應控制電路100a1、100a2、100b1、100b2。On the other hand, in this embodiment, the sensing control circuits 100a1, 100a2, 100b1, and 100b2 of these circuit groups are alternately arranged in the element row column1. In other words, the two sides of the sensing control circuit 100b1 are adjacent to the sensing control circuits 100a1 and 100a2 from another circuit group; the two sides of the sensing control circuit 100a2 are adjacent to the sensing control circuits 100b1 and 100b2 from the other circuit group. . The first sensing lines sense1a, sense1b can receive the first sensing signal in turn to sequentially detect the sensing control circuits 100a1, 100a2, 100b1, 100b2 in the element row column1.
然而,本發明並不限於上述的交替排列方式。請參照圖2B所繪本發明另一實施例的元素行的示意圖。在此實施例中,感應控制模組60的感應區由多個子區域60a、60b形成,其中每個電路組對應其中一個子區域設置。換句話說,感應區的子區域60a是由感應控制電路100a1、100a2(以處以兩個為例,本發明並不限於此數量)所形成的電路組形成;感應區的子區域60b是由感應控制電路100b1、100b2(此處以兩個為例,本發明並無限於此數量)所形成的電路形成。這些子區域60a、60b例如在元件行column分為兩個部分排列,藉以降低一第一感應線所連接之感應控制電路的數量。另一方面,在本實施例中,第一感應線sense1a以及第二感策線sense1b可以都朝著相同方向延伸以連接至一感應電路,亦可各自朝著相反的方向延伸,連接至位於中央的感應電路或位於兩側的多個感應電路。However, the present invention is not limited to the alternate arrangement described above. Please refer to FIG. 2B for a schematic diagram of element rows in another embodiment of the present invention. In this embodiment, the sensing area of the
詳細而言,請參照回圖2A所繪第一實施例的感應控制模組50。在本實施例的感應控制電路100a1、100a2、100b1、100b2的電路110中,各自還包括第一電容111a1、111a2、111b1以及111b2。在感應控制電路100a1中,第一電容111a1連接於感應電容102a1和第一電晶體103a1的閘極之間。第一電容111a2、111b1以及111b2各自以相同的相對位置連接於感應控制電路100a2、100b1以及100b2之間,此處不再贅述。In detail, please refer back to the
本實施例的感應控制電路100a1、100a2、100b1、100b2各自還包括第二電容112a1、112a2、112b1、112b2。在感應控制電路100a1中,第二電容112a1連接於感應電容102a1以及第二感應線sense2a1之間,且第一電容111a1和第二電容112a1並聯至感應電容102a1。第二感應線sense2a1適於提供一第二感應訊號至第二電容112a1,進而藉由電位差異來擾動感應電容102a1中的電壓位準。第二電容112a2、112b1、112b2各自連接至感應控制電路100a2、100b1以及100b2的相對位置,且各自連接至第二感應線sense2b1、sense2a2、sense2b2,此處不再贅述。The sensing control circuits 100a1, 100a2, 100b1, and 100b2 of this embodiment each further include second capacitors 112a1, 112a2, 112b1, 112b2. In the sensing control circuit 100a1, the second capacitor 112a1 is connected between the sensing capacitor 102a1 and the second sensing line sense2a1, and the first capacitor 111a1 and the second capacitor 112a1 are connected in parallel to the sensing capacitor 102a1. The second sensing line sense2a1 is adapted to provide a second sensing signal to the second capacitor 112a1, so as to disturb the voltage level in the sensing capacitor 102a1 by the potential difference. The second capacitors 112a2, 112b1, and 112b2 are respectively connected to the relative positions of the sensing control circuits 100a2, 100b1, and 100b2, and are respectively connected to the second sensing lines sense2b1, sense2a2, sense2b2, which will not be repeated here.
本實施例的感應控制電路100a1、100b1、100a2、100b2各自還包括第二電晶體113a1、113b1、113a2、113b2。在感應控制電路100a1中,第二電晶體113a1連接於參考電壓線v2a1以及第一電晶體103a1的閘極之間,藉由閘極線Gate1a1致能第二電晶體113a1以傳遞一參考電壓訊號至第一電晶體103a1和第一電容111a1之間。The sensing control circuits 100a1, 100b1, 100a2, and 100b2 of this embodiment each further include second transistors 113a1, 113b1, 113a2, and 113b2. In the sensing control circuit 100a1, the second transistor 113a1 is connected between the reference voltage line v2a1 and the gate of the first transistor 103a1, and the gate line Gate1a1 enables the second transistor 113a1 to transmit a reference voltage signal to Between the first transistor 103a1 and the first capacitor 111a1.
在本實施例中,參考電壓訊號實質上與第二感應訊號同步或在第二感應訊號之前提供,藉以調整第一電晶體103a1的閘極的電壓位準。當第二感應訊號自第二感應線sense2a1提供時,感應電容102a1、第一電容111a1和第二電容112a1會被擾動並使第一電晶體103a1的閘極的電壓位準自參考電壓位準進一步提升,而影響到第一電晶體103a1的通道大小。藉由自第一感應線sense1a可以取得對應的第一感應訊號以取得感應電容102a1的電容值。第二電晶體113b1、113a2、113b2各自連接至感應控制電路100b1、100a2、100b2的相對位置,且各自對應連接至參考電壓線v2b1、v2a2、v2b2,同時各自的閘極各自連接至閘級線Gateb1、Gatea2、Gateb2。這些第二電晶體113b1、113a2、113b2的運作方式大致與上述第二電晶體113a1類似,在此不再贅述。In this embodiment, the reference voltage signal is substantially synchronized with the second sensing signal or provided before the second sensing signal, so as to adjust the voltage level of the gate of the first transistor 103a1. When the second sensing signal is provided from the second sensing line sense2a1, the sensing capacitor 102a1, the first capacitor 111a1, and the second capacitor 112a1 will be disturbed and make the voltage level of the gate of the first transistor 103a1 further from the reference voltage level. The increase affects the channel size of the first transistor 103a1. The corresponding first sensing signal can be obtained from the first sensing line sense1a to obtain the capacitance value of the sensing capacitor 102a1. The second transistors 113b1, 113a2, 113b2 are respectively connected to the relative positions of the sensing control circuits 100b1, 100a2, and 100b2, and are respectively connected to the reference voltage lines v2b1, v2a2, v2b2, and their respective gates are respectively connected to the gate line Gateb1 , Gatea2, Gateb2. The operation mode of these second transistors 113b1, 113a2, 113b2 is substantially similar to the above-mentioned second transistor 113a1, and will not be repeated here.
在本實施例的元件行column1中,第一感應訊號可以同時在第一感應線sense1a和sense1b傳遞,第一感應線sense1a和sense1b亦可以輪流傳遞第一感應訊號。具體而言,在自第一感應線sense1a接收第一感應訊號時,在元件行column1中例如是以依序傳遞第二感應訊號至第二感應線sense2a1、sense2a2,並依序傳遞閘極訊號至閘極線Gate1a1、Gate1a2來依序致能第二電晶體113a1、113a2,以掃描這些感應電容102a1、102a2。In the element row column1 of this embodiment, the first sensing signal can be transmitted on the first sensing lines sense1a and sense1b at the same time, and the first sensing lines sense1a and sense1b can also transmit the first sensing signal in turn. Specifically, when the first sensing signal is received from the first sensing line sense1a, in the device row column1, for example, the second sensing signal is sequentially transmitted to the second sensing lines sense2a1, sense2a2, and the gate signal is sequentially transmitted to The gate lines Gate1a1 and Gate1a2 sequentially enable the second transistors 113a1 and 113a2 to scan the sensing capacitors 102a1 and 102a2.
在這些閘極線Gate1a1、Gate1a2傳遞閘極訊號的同時,本實施例也可以同時經由第二感應線senseb1、senseb2傳遞第二感應訊號,並經由閘極線Gateb1、Gateb2傳遞閘極訊號,使第一感應線sense1a和第一感應線sense1b可以同時接收第一感應訊號。While these gate lines Gate1a1 and Gate1a2 transmit gate signals, this embodiment can also simultaneously transmit second sensing signals via second sensing lines senseb1 and senseb2, and transmit gate signals via gate lines Gateb1 and Gateb2, so that A sensing line sense1a and a first sensing line sense1b can simultaneously receive the first sensing signal.
本發明不限於上述的第一感應訊號接收方式,在其他實施例中亦可以輪流自第一感應線sense1a和sense1b接收第一感應訊號。舉例而言,第二感應訊號可以依序由第二感應線sense2a1、sense2b1、sense2a2、sense2b2傳遞,閘極訊號可以依序由閘極線Gate1a1、Gate1b1、Gate1a2、Gate1b2傳遞,而再各自由第一感應線sense1a、sense1b、sense1a、sense1b的順序接收第一感應訊號。The present invention is not limited to the above-mentioned first sensing signal receiving method. In other embodiments, the first sensing signal may be received from the first sensing lines sense1a and sense1b in turn. For example, the second sensing signal can be sequentially transmitted by the second sensing lines sense2a1, sense2b1, sense2a2, sense2b2, and the gate signal can be sequentially transmitted by the gate lines Gate1a1, Gate1b1, Gate1a2, Gate1b2, and then each by the first The sensing lines sense1a, sense1b, sense1a, and sense1b receive the first sensing signal in sequence.
另一方面,在本實施例的元件行column1中,第一感應線sense1a、sense1b可以各自以不同的方向掃描這些感應控制電路。舉例而言,對應第一感應線sense1a,第二感應訊號可以依序傳遞至第二感應線sense2a1、sense2a2;閘極訊號可以依序傳遞至閘極線Gate1a1、Gate1a2,使感應控制電路100a1、100a2可以依序傳遞第一感應訊號至第一感應線sense1a。相對地,對應第二感應線sense2a,第二感應訊號可以依序傳遞至第二感應線sense2b2、sense2b1;閘極訊號可以依序傳遞至閘極線Gate1b2、Gate1b1,使感應控制電路100b2、100b1可以依序傳遞第一感應訊號至第一感應線sense1b。On the other hand, in the element row column1 of this embodiment, the first sensing lines sense1a and sense1b can scan these sensing control circuits in different directions. For example, corresponding to the first sensing line sense1a, the second sensing signal can be sequentially transmitted to the second sensing lines sense2a1, sense2a2; the gate signal can be sequentially transmitted to the gate lines Gate1a1, Gate1a2, so that the sensing control circuit 100a1, 100a2 The first sensing signal can be transmitted to the first sensing line sense1a in sequence. In contrast, corresponding to the second sensing line sense2a, the second sensing signal can be sequentially transmitted to the second sensing line sense2b2, sense2b1; the gate signal can be sequentially transmitted to the gate line Gate1b2, Gate1b1, so that the sensing control circuit 100b2, 100b1 can be The first sensing signal is sequentially transmitted to the first sensing line sense1b.
本發明不限於上述的訊號傳遞順序,在其他實施例中,第一感應線sense1a和sense1b也可以相同方向掃描各自所連接的感應控制電路。The present invention is not limited to the above-mentioned signal transmission sequence. In other embodiments, the first sensing lines sense1a and sense1b can also scan their connected sensing control circuits in the same direction.
另一方面,本實施例的這些感應控制電路100a1、100b1、100a2、100b2也各自包含可以控制液滴的電子元件。以感應控制電路100a1為例,其中還包括第三電晶體114a1,連接於感應電容102a1和資料線Data之間,並由掃描線Gate2所傳遞的訊號來致能。具體而言,資料線Data所傳遞的訊號實質上是用以改變感應電容102a1中的電位差,亦即資料訊號和參考電極101的電位差,藉以使感應電容102a1的檢驗空間中的液滴可以藉由電濕潤效應移動或攤平。本實施例上述的第一感應線sense1a、sense1b所傳遞的第一感應訊號則用以確認液滴的位置,且可以提供高靈敏度的偵測效果。On the other hand, the induction control circuits 100a1, 100b1, 100a2, and 100b2 of this embodiment also each include electronic components that can control liquid droplets. Taking the sensing control circuit 100a1 as an example, it also includes a third transistor 114a1, which is connected between the sensing capacitor 102a1 and the data line Data, and is enabled by the signal transmitted by the scan line Gate2. Specifically, the signal transmitted by the data line Data is essentially used to change the potential difference in the sensing capacitor 102a1, that is, the potential difference between the data signal and the
本實施例的感應控制電路100b1、100a2、100b2各自包含第三電晶體114b1、114a2、114b2,且各自連接於相似的相對位置,此處不再贅述。The sensing control circuits 100b1, 100a2, and 100b2 of this embodiment each include third transistors 114b1, 114a2, and 114b2, and they are connected to similar relative positions, which will not be repeated here.
以下以一實驗例進一步舉例說明上述第一實施例之感應控制模組。在一實驗例中,一第一感應線連接至50個如上述第一實施例之感應控制電路100中的第一電晶體;在一比較例中,一感應線連接至100個電晶體,且這些電晶體的閘極各自連接一感應電容,感應線依序掃描這100個電晶體來得知各感應電容中的電容值。在經過模擬後,實驗例中第一感應線在有液滴時量測到0.28微安培;在沒有液滴時量測到1.04微安培,兩個數值的比值高達3.76。在比較例中,感應線在有液滴時量測到0.42微安培;在沒有液滴時量測到1.18微安培,兩個數值的比值僅2.84。由上述可知,當藉由上述第一實施例中這些第一感應線的架設方式,將100個第一電晶體各自分為50個第一電晶體所形成的電路組,可以大幅提升訊號的對比值。Hereinafter, an experimental example is used to further illustrate the induction control module of the above-mentioned first embodiment. In an experimental example, a first sensing wire is connected to 50 first transistors in the
圖3A是本發明第二實施例中感應控制電路的示意圖;圖3B是本發明第二實施例中感應控制訊號的示意圖。本發明所提出的感應控制電路並不限於上述藉由多個第一感應線來降低漏電流影響的實施方式,以下將搭配感應驅動模組一併說明本發明所提出的感應方法。FIG. 3A is a schematic diagram of an induction control circuit in the second embodiment of the present invention; FIG. 3B is a schematic diagram of an induction control signal in the second embodiment of the present invention. The induction control circuit proposed by the present invention is not limited to the above-mentioned implementation of reducing the influence of leakage current by using a plurality of first induction lines. The induction method proposed by the present invention will be described together with the induction driving module below.
請參照圖3A,本發明第二實施例的感應控制模組70包括感應控制電路200a以及200b,還包括資料線Data、第一感應線Sense、第二感應線Sense pulse(n-1)、第二感應線Sense pulse(n)、閘極線RST(n-1)、閘極線RST(n)、掃描線Gate(n),其中資料線Data和掃描線Gate(n)可以在感應控制電路200b提供控制液滴的功能。3A, the
在本實施例中,感應控制電路200a包括感應電容210a、第一電晶體220a以及第二電晶體230a。第一電晶體220a連接至第一感應線Sense,且第一感應線Sense透過第一電晶體220a連接至第一電源Vdd。感應電容210a連接至第一電晶體220a的閘極,較佳為透過一電容連接至第一電晶體220a的閘極。第二電晶體230a一端可以連接至參考電壓線VRST(n-1),另一端連接至第一電晶體220a的閘極。藉由閘極線RST(n-1)所傳遞的訊號可以致能第二電晶體230a,以使參考電壓線VRST(n-1)可以提供參考電壓訊號至第一電晶體220a的閘極,進而使第二感應線Sense pulse(n-1)傳遞第二感應訊號並擾動感應電容210a時,第一電晶體220a可以對應開啟通道來使第一感應訊號自第一電源Vdd傳遞至第一感應線Sense。In this embodiment, the
相似地,感應控制電路200b包括感應電容210b、第一電晶體220b以及第二電晶體230b。第一電晶體220b連接至第一感應線Sense,且第一感應線Sense透過第一電晶體220b連接至第一電源Vdd。感應電容210b連接至第一電晶體220b的閘極,較佳為透過一電容連接至第一電晶體220b的閘極。第二電晶體230b一端可以連接至參考電壓線VRST(n),另一端連接至第一電晶體220b的閘極。藉由閘極線RST(n)所傳遞的訊號可以致能第二電晶體230b,以使參考電壓線VRST(n)可以提供參考電壓訊號至第一電晶體220b的閘極,進而使第二感應線Sense pulse(n)傳遞第二感應訊號並擾動感應電容210b時,第一電晶體220b可以對應開啟通道來使第一感應訊號自第一電源Vdd傳遞至第一感應線Sense。Similarly, the
請一併參照圖3A,本實施例的感應控制電路200b中,第一電晶體220b的閘極(以接點Vsense(n)為例)會先經由參考電壓訊號提升電壓位準,再由第一感應線Sense接收第一感應訊號,且在接收第一感應訊號的同時也會進一步提升第一電晶體220b的參考電壓。詳細而言,請參照圖3B,在時間t1時,參考電壓線VRST(n)準備提升電壓位準,閘極線RST(n)還維持高電壓位準,而Vsense(n)的參考電壓透過第二電晶體230b提升至第一電壓v1。在時間t2時,閘極線RST(n)的電壓位準下降,關閉第二電晶體230b,使接點Vsense(n)浮接(floating)。在時間t3時,第二感應線Sense pulse(n)傳遞第二感應訊號,使接點Vsense(n)的參考電壓進一步提升至第二電壓v2並開啟第一電晶體220b。在時間t4時,第二感應線Sense pulse(n)的電壓位準下降,關閉第一電晶體220b。在時間t3至t4之間,第一感應線Sense接收第一感應訊號。在時間t5時,參考電壓線VRST(n)的電壓位準下降,閘極線RST(n)的電壓位準上升,使接點Vsense(n)回歸參考店為。如上所述,藉由分階段調整接點Vsense(n)的參考電壓,本實施例的感應控制電路的第一電晶體的漏電流可以降低。Please also refer to FIG. 3A. In the
另一方面,掃描線Gate(n)在上述的過程中都是在低電壓位準,因此上述元件大都是彼此浮接(floating),可以藉由電容的電位差影響電壓位準。On the other hand, the scan line Gate(n) is at a low voltage level during the above process, so the above-mentioned elements are mostly floating with each other, and the voltage level can be affected by the potential difference of the capacitor.
又另一方面,參考電壓線VRST(n)的參考電壓訊號和參考電壓線VRST(n-1)的參考電壓訊號實質上彼此有部分重疊;閘極線路RST(n)的閘極訊號和閘極線路RST(n-1)的閘極訊號實質上彼此有部分重疊。換句話說,參考電壓線VRST(n)可以在其他感應控制電路還在傳遞第一感應訊號時,提前藉由閘極線路RST(n)和參考電壓線VRST(n)來提升至第一電壓位準v1,以降低其他感應控制電路的漏電流得以降低。On the other hand, the reference voltage signal of the reference voltage line VRST(n) and the reference voltage signal of the reference voltage line VRST(n-1) substantially overlap with each other; the gate signal of the gate line RST(n) and the gate The gate signals of the pole line RST(n-1) substantially overlap with each other. In other words, the reference voltage line VRST(n) can be boosted to the first voltage by the gate line RST(n) and the reference voltage line VRST(n) in advance while other sensing control circuits are still transmitting the first sensing signal. Level v1 to reduce the leakage current of other induction control circuits can be reduced.
以下以第二實驗例以及第二比較例說明。第二實驗例類似上述第二實施例預先將第一電晶體的閘極的參考電壓提升至一電壓位準;第二比較例的參考電壓維持單一電壓位準。經由模擬後,第二實驗例中的第一感應訊號在沒有目標液滴時測到0.9微安培;在有液滴時測到0.14微安培,兩個數值的比值高達6.39。在比較例中,感應訊號在沒有目標液滴時測到1.18微安培,在有液滴時測到0.42微安培,兩個數值的比值僅2.84。由上述可知,使用本發明第二實施例中的感測方法的感測控制模組可以大幅提升訊號的對比,進而提升感測的靈敏度。The second experimental example and the second comparative example are described below. The second experimental example is similar to the above-mentioned second embodiment. The reference voltage of the gate of the first transistor is raised to a voltage level in advance; the reference voltage of the second comparative example maintains a single voltage level. After simulation, the first sensing signal in the second experimental example measured 0.9 microampere when there was no target droplet; when there was a droplet, it measured 0.14 microampere, and the ratio of the two values was as high as 6.39. In the comparative example, the sensing signal measures 1.18 microamperes when there is no target droplet, and 0.42 microamperes when there is a droplet. The ratio of the two values is only 2.84. From the foregoing, it can be seen that the sensing control module using the sensing method in the second embodiment of the present invention can greatly improve the signal contrast, thereby improving the sensitivity of sensing.
綜上所述,本發明所提出的感應控制模組以及感應方法可以降低漏電流造成的影響,進而維持感應靈敏度。To sum up, the induction control module and the induction method proposed by the present invention can reduce the influence caused by leakage current, thereby maintaining the induction sensitivity.
這裡使用的術語僅僅是為了描述特定實施例的目的,而不是限制性的。如本文所使用的,除非內容清楚地指示,否則單數形式「一」、「一個」和「該」旨在包括複數形式,包括「至少一個」。「或」表示「及/或」。如本文所使用的,術語「及/或」包括一個或多個相關所列項目的任何和所有組合。還應當理解,當在本說明書中使用時,術語「包括」指定所述特徵、區域、整體、步驟、操作、元件的存在及/或部件,但不排除一個或多個其它特徵、區域整體、步驟、操作、元件、部件及/或其組合的存在或添加。The terminology used here is only for the purpose of describing specific embodiments and is not limiting. As used herein, unless the content clearly indicates otherwise, the singular forms "a", "an" and "the" are intended to include the plural forms, including "at least one." "Or" means "and/or". As used herein, the term "and/or" includes any and all combinations of one or more related listed items. It should also be understood that when used in this specification, the term "including" designates the features, regions, wholes, steps, operations, presence of elements and/or components, but does not exclude one or more other features, whole regions, The existence or addition of steps, operations, elements, components, and/or combinations thereof.
需要說明的是,諸如「下」或「底部」和「上」或「頂部」的相對術語可在本文中用於描述一個元件與另一元件的關係,如圖所示。應當理解,相對術語旨在包括除了圖中所示的方位之外的裝置的不同方位。例如,如果一個附圖中的裝置翻轉,則被描述為在其他元件的「下」側的元件將被定向在其他元件的「上」側。因此,示例性術語「下」可以包括「下」和「上」的取向,取決於附圖的特定取向。類似地,如果一個附圖中的裝置翻轉,則被描述為在其它元件「下方」的元件將被定向為在其它元件「上方」。因此,示例性術語「下方」可以包括上方和下方的取向。It should be noted that relative terms such as "down" or "bottom" and "up" or "top" can be used herein to describe the relationship between one element and another element, as shown in the figure. It should be understood that relative terms are intended to include different orientations of the device other than those shown in the figures. For example, if the device in one figure is turned over, elements described as being on the "lower" side of other elements will be oriented on the "upper" side of the other elements. Therefore, the exemplary term "lower" may include an orientation of "lower" and "upper", depending on the specific orientation of the drawing. Similarly, if the device in one figure is turned over, elements described as "below" other elements will be oriented "above" the other elements. Thus, the exemplary term "below" can include an orientation of above and below.
本文使用的「約」、「近似」、或「實質上」包括所述值和在本領域普通技術人員確定的特定值的可接受的偏差範圍內的平均值,考慮到所討論的測量和與測量相關的誤差的特定數量(即,測量系統的限制)。例如,「約」可以表示在所述值的一個或多個標準偏差內,或±30%、±20%、±10%、±5%內。再者,本文使用的「約」、「近似」或「實質上」可依光學性質、蝕刻性質或其它性質,來選擇較可接受的偏差範圍或標準偏差,而可不用一個標準偏差適用全部性質。As used herein, "approximately", "approximately", or "substantially" includes the stated value and the average value within the acceptable deviation range of the specific value determined by a person of ordinary skill in the art, taking into account the measurement and A certain amount of measurement-related error (ie, the limitation of the measurement system). For example, "about" can mean within one or more standard deviations of the stated value, or within ±30%, ±20%, ±10%, ±5%. Furthermore, the "about", "approximate" or "substantially" used herein can select a more acceptable deviation range or standard deviation based on optical properties, etching properties or other properties, and not one standard deviation can be applied to all properties .
除非另有定義,本文使用的所有術語(包括技術和科學術語)具有與本發明所屬領域的普通技術人員通常理解的相同的含義。將進一步理解的是,諸如在通常使用的字典中定義的那些術語應當被解釋為具有與它們在相關技術和本發明的上下文中的含義一致的含義,並且將不被解釋為理想化的或過度正式的意義,除非本文中明確地這樣定義。Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by those of ordinary skill in the art to which the present invention belongs. It will be further understood that terms such as those defined in commonly used dictionaries should be interpreted as having meanings consistent with their meanings in the context of related technologies and the present invention, and will not be interpreted as idealized or excessive The formal meaning, unless explicitly defined as such in this article.
本文參考作為理想化實施例的示意圖的截面圖來描述示例性實施例。因此,可以預期到作為例如製造技術及/或公差的結果的圖示的形狀變化。因此,本文所述的實施例不應被解釋為限於如本文所示的區域的特定形狀,而是包括例如由製造導致的形狀偏差。例如,示出或描述為平坦的區域通常可以具有粗糙及/或非線性特徵。此外,所示的銳角可以是圓的。因此,圖中所示的區域本質上是示意性的,並且它們的形狀不是旨在示出區域的精確形狀,並且不是旨在限制權利要求的範圍。The exemplary embodiments are described herein with reference to cross-sectional views that are schematic diagrams of idealized embodiments. Therefore, a change in the shape of the diagram as a result of, for example, manufacturing technology and/or tolerance can be expected. Therefore, the embodiments described herein should not be interpreted as being limited to the specific shape of the area as shown herein, but include, for example, shape deviations caused by manufacturing. For example, areas shown or described as flat may generally have rough and/or non-linear characteristics. In addition, the acute angles shown may be rounded. Therefore, the regions shown in the figures are schematic in nature, and their shapes are not intended to show the precise shape of the regions, and are not intended to limit the scope of the claims.
column1, column2 元件行 Data 資料線 Gate(n), Gate2 掃描線 Gate1a1, Gate1b1, Gate1a2, Gate1b2, RST(n-1), RST(n) 閘極線 Sense, sense1a, sense1b 第一感應線 sense2a1, sense2b1, sense2a2, sense2b2, Sense pulse(n-1), sense pulse(n) 第二感應線 v1, Vdd 第一電源 v2a1, v2a2, v2b1, v2b2 參考電壓線 VRST(n-1), VRST(n) 參考電壓線 Vsense(n) 接點 50, 60, 70 感應控制模組 50S 感應區 51 資料控制電路 52 掃描控制電路 53 感測電路 54 定址偵測電路 100, 100a1, 100a2, 100b1, 100b2, 200a, 200b 感應控制電路 100G 電路組 101 參考電極 102, 102a1, 102a2, 102b1, 102b2, 210a, 210b 感應電容 103, 103a1, 103a2, 103b1, 103b2, 220a, 220b 第一電晶體 110 電路 111a1, 111a2, 111b1, 111b2 第一電容 112a1, 112a2, 112b1, 112b2 第二電容 113a1, 113a2, 113b1, 113b2, 230a, 230b 第二電晶體 114a1, 114a2, 114b1, 114b2 第三電晶體column1, column2 element row Data data lines Gate(n), Gate2 scan lines Gate1a1, Gate1b1, Gate1a2, Gate1b2, RST(n-1), RST(n) Gate lines Sense, sense1a, sense1b First sense lines sense2a1, sense2b1 , sense2a2, sense2b2, Sense pulse(n-1), sense pulse(n) Second sense line v1, Vdd First power supply v2a1, v2a2, v2b1, v2b2 Reference voltage line VRST(n-1), VRST(n) Reference Voltage line Vsense(n)
圖1A是本發明第一實施例中感應控制模組的示意圖; 圖1B是本發明第一實施例中感應控制線路的示意圖; 圖2A是本發明第一實施例中元件行的示意圖; 圖2B是本發明另一實施例中元件行的示意圖; 圖3A是本發明第二實施例中感應控制模組的示意圖; 圖3B是本發明第二實施例中感應訊號的示意圖。Figure 1A is a schematic diagram of the induction control module in the first embodiment of the present invention; Figure 1B is a schematic diagram of the induction control circuit in the first embodiment of the present invention; Figure 2A is a schematic diagram of the component row in the first embodiment of the present invention; Figure 2B It is a schematic diagram of a component row in another embodiment of the present invention; FIG. 3A is a schematic diagram of a sensing control module in a second embodiment of the present invention; FIG. 3B is a schematic diagram of sensing signals in a second embodiment of the present invention.
column1 元件行 Data 資料線 Gate2 掃描線 Gate1a1, Gate1b1, Gate1a2, Gate1b2 閘極線 sense1a, sense1b 第一感應線 sense2a1, sense2b1, sense2a2, sense2b2 第二感應線 v1 第一電源 v2a1, v2a2, v2b1, v2b2 參考電壓線 50 感應控制模組 100a1, 100a2, 100b1, 100b2 感應控制電路 101 參考電極 102a1, 102a2, 102b1, 102b2 感應電容 103a1, 103a2, 103b1, 103b2 第一電晶體 110 電路 111a1, 111a2, 111b1, 111b2 第一電容 112a1, 112a2, 112b1, 112b2 第二電容 113a1, 113a2, 113b1, 113b2 第二電晶體 114a1, 114a2, 114b1, 114b2 第三電晶體column1 element row Data data line Gate2 scan line Gate1a1, Gate1b1, Gate1a2, Gate1b2 gate line sense1a, sense1b first sense line sense2a1, sense2b1, sense2a2, sense2b2 second sense line v1 first power supply v2a1, v2a2, v2b1, v2b2
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