TWI701440B - Auxiliary device for function expansion applied to test system - Google Patents

Abstract

An auxiliary device used for function expansion of a test system is a pogo pin lap device with a coil spring collar, a fixing part and a signal wire. Both the spiral spring collar and the signal wire are limited to the fixing member, and the spiral spring collar and the signal wire are electrically connected. Set the lap device on the pogo pin of the test system's pogo pin interface, and electrically connect the signal line to the expansion instrument equipment to establish a signal path between the expansion instrument equipment and the pogo pin interface of the test system. Realize the function expansion or performance upgrade of the test system. Because the coil spring collar has good elasticity, it is not easy to damage the fragile pogo pin, and it can also form multi-point contact with the pogo pin wall to effectively reduce the contact resistance, so it can achieve a good stable and non-destructive lap effect.

Description

Auxiliary device for function expansion applied to test system

The present invention is an auxiliary device applied to the function expansion of the test system, in particular, the coil spring collar is applied to the pogo pin interface of the automatic test system to make full use of the multiple advantages of the coil spring collar, and it can stably expand the instrument The equipment is integrated into the pogo pin interface of the automatic test system to realize the function expansion or performance upgrade of the automatic test system.

The automatic test production lines of the semiconductor industry and the optoelectronic industry sometimes face that the performance of the test system purchased in the past does not meet the requirements of the latest test application or production capacity, so it must be considered to replace the test system or perform the test system function Expansion and upgrade.

For the function expansion of the automatic test system, there are mainly the following two common methods:

1. When the original test system is designing the automatic test system, it reserves expansion slots inside the system or reserves some expansion ports on the external side panel of the system.

2. The supporting scheme can be designed in the links of test carrier or probe card, through the intermediary of test carrier or probe card, the expansion equipment can be connected to the test system and the DUT.

However, the current common difficulties are as follows:

1. Generally, the original design of the automatic test system cannot reserve a sufficient number of internal slots or expansion interfaces with applicable specifications. After all, the original system manufacturer may not be able to predict the future new applications of the client in advance, and the original system manufacturer will consider reducing costs , It is inconvenient to add too many reserved designs.

2. It is easily restricted by the mechanical design of the test system itself, and may not be suitable for the use of repair Change the test carrier board or modify the probe card to integrate and expand the equipment.

3. The probe card is a consumable that needs frequent replacement and maintenance. If you connect the expansion instrument to the probe card, you will often face the trouble of having to disassemble and reinstall the instrument cable.

Therefore, the inventor, after active thinking, prototype testing and continuous improvement, finally developed a more practical auxiliary device for testing system function expansion.

The present invention discloses an auxiliary device for function expansion applied to a test system, which is a pogo pin lap device, with at least one coil spring collar, at least one fixing piece and at least one signal wire; the fixing piece is provided with at least one limiter The location hole and at least one through hole, the spiral spring collar is limited in the location hole, the signal wire is limited in the through hole, and the signal wire is electrically connected with the spiral spring collar.

With the above device, the advantages of the present invention are as follows:

1. The coil spring collar is sleeved on the pogo pin, which can generate a very ideal tightening force, so that the pogo pin lap device can be more stable and not easy to fall off, and by the space between the coil spring collar and the pogo pin wall The formed ring-shaped distributed multi-point contact can effectively reduce the contact resistance and achieve a better overlap effect.

2. The coil spring collar has good flexibility and can be firmly sleeved on the pogo pin, but it is not easy to cause damage to the fragile pogo pin. It is a safe and reliable overlap method.

3. It does not pass through the auxiliary interface or expansion slot of the test system at all, so it can achieve the greatest degree of expansion, and it is not easy to be restricted by the expansion limitation caused by the original design of the test system.

4. The original design of the automatic test system or the probe card is not changed at all, so There will be no increase in related costs, and the user can remove the pogo pin lap device at any time and easily restore the automatic test system to the original state designed by the original factory. This is a completely reversible expansion and upgrade program.

10‧‧‧Pogo pin lap device

101‧‧‧Pogo pin lap device

102‧‧‧Pogo pin lap device

12‧‧‧Fixed parts

121‧‧‧Limit hole

122‧‧‧Through hole

123‧‧‧Locating hole

124‧‧‧Top piece

125‧‧‧Supporting structure

14‧‧‧Helical spring collar

16‧‧‧Tube body

18‧‧‧Signal line

19‧‧‧Elastic parts

23‧‧‧Pogo box

24‧‧‧Pogo pin

25‧‧‧Probe card

26‧‧‧Pogo pin interface

30‧‧‧Object to be tested

Figure 1 is a perspective view of the first embodiment of the pogo pin lap device of the present invention

Figure 2 is a three-dimensional exploded schematic diagram of Figure 1

Figure 3 is a perspective view of a second embodiment of the pogo pin lap device of the present invention

Figure 4 is a three-dimensional exploded schematic diagram of Figure 3

Figure 5 is a perspective view of the third embodiment of the pogo pin lap device of the present invention

Figure 6 is a three-dimensional exploded schematic diagram of Figure 5

Figure 7 is a schematic diagram of the pogo pin lap device of the present invention about to be lapped to the pogo pin interface of the test system

Figure 8 is a schematic view of the action of the pogo pin lap device of the present invention that is about to be sheathed in the pogo pin box

Fig. 9 is a schematic diagram of another view of the pogo pin lap device of Fig. 8 being installed on the pogo pin holder

The various embodiments of this case will be described in detail below, with the aid of the drawings. In addition to these detailed descriptions, the present invention can also be widely implemented in other embodiments. Any easy substitutions, modifications, and equivalent changes of the embodiments are included in the scope of this case, and the subsequent patent scope shall prevail. . In the description of the specification, in order to enable the reader to have a more complete understanding of the present invention, many specific details are provided; however, the present invention may still be implemented under the premise that some or all of these characteristic details are omitted. In addition, well-known steps or elements are not described in details to avoid unnecessary limitation of the present invention. The same or similar elements in the drawings will be the same or similar Like symbols to indicate. It should be noted that the drawings are for illustrative purposes only, and do not represent the actual size or quantity of the components unless otherwise specified.

1 and 2, the auxiliary device for function expansion of the present invention is applied to the test system. It is disclosed that the present invention is a schematic diagram of the first embodiment of a pogo pin lap device 10, which has a fixing member 12. A coil spring collar 14 and at least one signal wire 18. The coil spring collar 14 is made of metal and has moderate elasticity. The material of the fixing member 12 is not limited. The fixing member 12 is provided with at least one limiting hole 121 And at least one through hole 122, the coil spring collar 14 is confined in the limiting hole 121, the signal wire 18 is confined to the through hole 122, the signal wire 18 is electrically connected to the spiral spring collar 14 , The other end of the signal line 18 is electrically connected to the expansion equipment (not shown) with the actual extension length required.

3 and 4, it is disclosed that the present invention is a second embodiment of a pogo pin lap device 101. The pogo pin lap device 101 has a fixing member 12, two coil spring collars 14 and two signal wires 18. The spiral spring collar 14 is made of metal and has moderate elasticity. The fixing member 12 is made of insulating material. The fixing member 12 is provided with a plurality of limiting holes 121 and a through hole 122. The fixing member 12 extends at least An abutting member 124, each of the abutting members 124 must be arranged adjacent to or abutting against the coil spring collars 14 to form a topping effect, and the coil spring collars 14 are limited to the corresponding limit holes 121 Inside, the signal wires 18 are limited to the through hole 122, the signal wires 18 are electrically connected to the corresponding coil spring collars 14, and the other end of the signal wires 18 is extended by the actual required length. Connect to expansion equipment (not shown).

5 and 6, it is disclosed that the present invention is a third embodiment of a pogo pin lap device 102. The pogo pin lap device 102 has a fixing member 12 and two coil spring sleeves. Ring 14 and two signal lines 18, the fixing member 12 is made of insulating material, the fixing member 12 is provided with two limiting holes 121 and two through holes 122, and the corresponding wall surfaces on both sides of the fixing member 12 are respectively provided with a positioning hole 123 An elastic member 19 is provided on the positioning holes 123, two ends of the elastic member 19 respectively penetrate the positioning holes 123, and at least one end of the elastic member 19 is embossed outside the side wall surface of the fixing member 12. At least one abutting member 124 extends from both sides of the fixing member 12, and each abutting member 124 must be arranged adjacent to or abutting against the coil spring collars 14 to form a abutting effect. Each abutting member 124 At least one support structure 125 is set on the free ends of the two respectively facing the same side. The height of the support structures 125 is the same as the overall height of the fixing member 12. The coil spring rings 14 are made of metal and have moderate elasticity. Each coil spring ring The ends of the 14 are respectively provided with a tube body 16, the tubes 16 are first sleeved on the corresponding ends of the coil spring collars 14 for crimping, and then the tube bodies 16 are respectively set in each of the limiting holes 121. The tubes 16 can be metal or non-metal. If the tubes 16 are metal, each of the coil spring collars 14 does not necessarily have to be in direct contact with each of the signal lines 18, and the tubes 16 are used as an intermediary The indirect contact can also achieve electrical connection; if the tubes 16 are non-metallic, each of the coil spring collars 14 must directly contact each of the signal lines 18 to achieve electrical connection. The tubes 16 are used To assist in fixing the coil spring collars 14, the signal wires 18 are limited to the through holes 122, the signal wires 18 are electrically connected to the corresponding coil spring collars 14, and the other ends of the signal wires 18 With the actual required extension length, it is electrically connected to the expansion equipment (not shown).

Next, referring to FIGS. 7 to 9 in conjunction with FIGS. 5 and 6, a schematic diagram of the pogo pin lap device 102 disposed on a pogo pin box 23 of a pogo pin interface 26 is disclosed. Set the coil spring collar 14 to the plural pogo pins 24 And press the fixing member 12 into the pogo pin box 23, so that the coil spring collars 14 are pushed to the root of each pogo pin 24, and the coil spring collars 14 are pushed against Will be pushed to the corresponding abutting members 124 to bear the thrust, so each abutting member 124 can assist the corresponding coil spring collar 14 to be pushed to the root of each spring pin 24, and at the same time the supports The structure 125 will push to the bottom of the pogo pin box 23, so that the pogo pin lap device 102 is attached to the pogo pin box 23 stably, and then the signal wires 18 can pass through the coil spring collars 14 The lapped and electrically connected to the spring pins 24 and a probe card 25 below it. The other end of the signal lines 18 is electrically connected to the expansion equipment (not shown) with the actual required extension length, so through the pogo pin lap device 102, the expansion equipment and the probe card 25 can be connected A signal path is established between the touched objects 30. The coil spring collars 14 have better expansion and contraction and size adaptability, and can provide a reliable overlap effect without damaging the fragile spring pins 24. The coil spring collars 14 and the spring pins 24 can form a ring-shaped distributed multi-point contact, which helps to reduce the contact resistance and achieve good conductive contact. In addition, the elastic member 19 has elasticity. Therefore, when the pogo pin lap device 102 is combined with the pogo pin box 23, at least one end of the elastic member 19 is buckled to the inner wall surface of the pogo pin box 23 to strengthen the spring. The bonding strength of the needle overlap device 102 and the pogo needle cassette 23.

10‧‧‧Pogo pin lap device

12‧‧‧Fixed parts

14‧‧‧Helical spring collar

18‧‧‧Signal line

Claims (6)

An auxiliary device for function expansion of a test system, comprising: a pogo pin lap device with at least one coil spring collar, at least one fixing piece and at least one signal wire; the fixing piece is provided with at least one limiting hole and At least one through hole, the coil spring collar is limited in the limiting hole, the signal line is limited in the through hole, and the signal line is electrically connected with the spiral spring collar. As described in the first item of the scope of patent application, the auxiliary device for function expansion of a test system, wherein at least one abutting member extends from both sides of the fixing member, and each abutting member is adjacent to or abuts against the coil spring Set of loops. As described in item 2 of the scope of patent application, the auxiliary device for function expansion of the test system, wherein the free ends of each abutting member are respectively provided with at least one supporting structure facing the same side surface, and the height of the supporting structure is the same as that of the fixing member The overall height is the same. As described in item 3 of the scope of patent application, the auxiliary device for function expansion of the test system, wherein the corresponding wall surfaces on both sides of the fixing member are respectively provided with a positioning hole, and an elastic member is provided on the positioning holes. Two ends of the elastic member are respectively penetrated and fixed in the positioning holes, and at least one end of the elastic member is embossed outside the side wall surface of the fixing member. As described in item 4 of the scope of patent application, the auxiliary device for function expansion of the test system, wherein a tube body is arranged at the end of the coil spring collar, and the tube body is arranged in the limiting hole. As described in item 1 of the scope of patent application, the auxiliary device for function expansion of the test system, wherein the coil spring collar is made of metal and has moderate elasticity.

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