TWI698941B - Two-sided stacked die package and packaging method thereof - Google Patents
Two-sided stacked die package and packaging method thereof Download PDFInfo
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- TWI698941B TWI698941B TW108109850A TW108109850A TWI698941B TW I698941 B TWI698941 B TW I698941B TW 108109850 A TW108109850 A TW 108109850A TW 108109850 A TW108109850 A TW 108109850A TW I698941 B TWI698941 B TW I698941B
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/18—High density interconnect [HDI] connectors; Manufacturing methods related thereto
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/1517—Multilayer substrate
- H01L2924/15192—Resurf arrangement of the internal vias
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
Abstract
Description
本發明係關於一種堆疊式晶片封裝結構及其製法,尤指一種雙面堆疊式晶片封裝結構及其製法。 The invention relates to a stacked chip packaging structure and a manufacturing method thereof, in particular to a double-sided stacked chip packaging structure and a manufacturing method thereof.
隨著終端產品應用需求增加與技術趨勢演進,對於元件所需的頻寬、容量與工作效率等亦相對提高,所需晶片數量增加,在一定晶片數量內,一種堆疊式晶片封裝結構可提供良好的半導體元件封裝良率。 With the increasing demand for terminal product applications and the evolution of technology trends, the bandwidth, capacity, and work efficiency required for components have also increased. The number of chips required has increased. Within a certain number of chips, a stacked chip package structure can provide good The semiconductor component packaging yield rate.
對於超過一定晶片數量的半導體元件,則可改採如圖4所示的雙面堆疊式晶片封裝結構80,即於一中介層81的上表面811及下表面812分別部分疊設有一晶片組82、83,並透過既有打線製程步驟,將位在上表面811之晶片組83的複數晶片831分別與該上表面811的接點電性連接,並將位在下表面812之晶片組83的複數晶片831分別與該下表面812的接點電性連接,又其中疊設在該下表面812的晶片組83的最下方晶片(下稱訊號傳輸晶片831’)進一步形成有複數外接墊832,以外露於一封膠體84外。因此,該訊號傳輸晶片831’的外接墊832除了與其本身的訊號接點電性連接外,還必須供其它晶片821、831的訊號接點連接。
For semiconductor components exceeding a certain number of chips, a double-sided stacked
換言之,上、下晶片組的所有晶片的訊號接點必須匯整至該訊號傳輸晶片,以與對應外接墊電性連接;是以,由於晶片面積一定,勢必限制 其上外接墊的數量,自然也限制此一雙面堆疊式晶片封裝結構可封裝的晶片數量,有必要進一步改良之。 In other words, the signal contacts of all the chips in the upper and lower chipset must be integrated to the signal transmission chip to be electrically connected to the corresponding external pad; therefore, due to a certain chip area, it is bound to be limited The number of external pads naturally limits the number of chips that can be packaged by this double-sided stacked chip package structure, and it is necessary to further improve it.
有鑑於前揭雙面堆疊式晶片封裝結構的缺點,本發明主要發明目的係提供一種新的雙面堆疊式晶片封裝結構。 In view of the disadvantages of the aforementioned double-sided stacked chip package structure, the main purpose of the present invention is to provide a new double-sided stacked chip package structure.
欲達上述目的所使用的主要技術手段係令該雙面堆疊式晶片封裝結構包含有:一第一重佈線層,具有一第一表面及一第二表面,該第一表面上形成有複數第一接點,而該第二表面上形成有複數第二接點及複數第三接點;複數第一晶片,係部分堆疊在該第一重佈線層的第一表面,各該第一晶片具有外露的第一金屬接點,各該第一金屬接點係以第一金屬線電性連接至該第一表面所對應的該第一接點;複數第二晶片,係部分堆疊在該第一重佈線層的第二表面,各該第二晶片具有外露的第二金屬接點,各該第二金屬接點係以第二金屬線電性連接至該第二表面所對應的該第二接點;複數金屬柱,其共同一端係分別電性連接至該第一重佈線層之第二表面的第三接點,且各該金屬柱的高度係高於該些第二金屬線的高度;一第一封膠體,係形成於該第一重佈線層的該第一表面上,以包覆該第一晶片組及該些第一金屬線;一第二封膠體,係形成於該第一重佈線層的該第二表面上,以包覆該第二晶片組、該些第二金屬線及該些金屬柱;其中該些金屬柱共同另一端係外露於該第二封膠體的一外表面;以及 一第二重佈線層,其一第三表面係形成於該第二封膠體的外表面,並與該些金屬柱外露一側電性連接,而一第四表面係形成有複數外接墊。 The main technical means used to achieve the above objective is to make the double-sided stacked chip package structure include: a first redistribution layer having a first surface and a second surface, and a plurality of second surfaces are formed on the first surface A contact, and a plurality of second contacts and a plurality of third contacts are formed on the second surface; a plurality of first chips are partially stacked on the first surface of the first redistribution layer, each of the first chips has Exposed first metal contacts, each of the first metal contacts is electrically connected to the first contact corresponding to the first surface by a first metal wire; a plurality of second chips are partially stacked on the first On the second surface of the redistribution layer, each of the second chips has exposed second metal contacts, and each of the second metal contacts is electrically connected to the second contact corresponding to the second surface by a second metal wire Points; a plurality of metal pillars, the common end of which is respectively electrically connected to the third contact on the second surface of the first redistribution layer, and the height of each metal pillar is higher than the height of the second metal wires; A first molding compound is formed on the first surface of the first redistribution layer to cover the first chip set and the first metal wires; a second molding compound is formed on the first On the second surface of the redistribution layer, the second chip set, the second metal wires and the metal pillars are covered; wherein the other end of the metal pillars is exposed to an outside of the second sealing compound Surface; and A second redistribution layer has a third surface formed on the outer surface of the second encapsulant body and electrically connected to the exposed side of the metal pillars, and a fourth surface is formed with a plurality of external pads.
由上述說明可知,本發明的雙面堆疊式晶片封裝結構係主要於該第一重佈線層的雙面分別封裝有二組晶片,並於其中一面直接形成有金屬柱,且該金屬柱係電性連接至該第二封膠體外表面之第二重佈線層;如此,本發明的雙面堆疊式晶片封裝結構不必將第一重佈線層的第一及第二接點集中在其中一顆晶片上,不會限制堆疊晶片數量。 It can be seen from the above description that the double-sided stacked chip packaging structure of the present invention is mainly used to package two sets of chips on both sides of the first redistribution layer, and a metal pillar is directly formed on one of the sides, and the metal pillar is an electrical The second redistribution layer connected to the outer surface of the second encapsulant; in this way, the double-sided stacked chip package structure of the present invention does not need to concentrate the first and second contacts of the first redistribution layer on one chip The number of stacked wafers is not limited.
欲達上述目的所使用的主要技術手段係令該雙面堆疊式晶片封裝結構的製法包含有:(a)準備一載板,其上形成有一第一重佈線層;(b)將複數第一晶片依序部分疊設於該第一重佈線層的一第一表面上,且各該第一晶片的第一金屬接點及該第一表面的複數第一接點外露;(c)將各該第一金屬接點打線電性連接至對應的該第一接點,使各該第一金屬接點與對應的該第一接點之間連接有一第一金屬線;(d)於該第一重佈線層之該第一表面上形成一第一封膠體,以包覆該些第一晶片及該些第一金屬線;(e)反轉該載板後令該載板自該第一重佈線層之一第二表面脫離,令該第二表面的複數第二接點及複數第三接點外露;(f)於外露的該些第三接點上分別形成有一金屬柱;(g)將複數第二晶片依序部分疊設於該第一重佈線層的該第二表面上,且各該第二晶片的第二金屬接點及該第二表面的複數第二接點外露;(h)將各該第二金屬接點打線電性連接至對應的該第二接點; (i)於該第一重佈線層之該第二表面上形成一第二封膠體,以包覆該些第二晶片、該些第二金屬線及該些金屬柱,各該金屬柱的一端係外露於該第二封膠體的一外表面;(j)於該封膠體的外表面上形成有一第二重佈線層;以及(k)於該第二重佈線層上形成有複數外接墊。 The main technical means used to achieve the above-mentioned purpose is to make the manufacturing method of the double-sided stacked chip package structure include: (a) preparing a carrier board on which a first redistribution layer is formed; (b) placing a plurality of first The chips are sequentially partially stacked on a first surface of the first redistribution layer, and the first metal contacts of each first chip and a plurality of first contacts on the first surface are exposed; (c) each The first metal contact is wire-bonded and electrically connected to the corresponding first contact, so that a first metal wire is connected between each first metal contact and the corresponding first contact; (d) at the first metal contact A first molding compound is formed on the first surface of a redistribution layer to cover the first chips and the first metal wires; (e) inverting the carrier board to make the carrier board from the first A second surface of the redistribution layer is detached, so that the plurality of second contacts and the plurality of third contacts of the second surface are exposed; (f) a metal pillar is respectively formed on the exposed third contacts; (g) ) A plurality of second chips are sequentially partially stacked on the second surface of the first redistribution layer, and the second metal contacts of each second chip and the plurality of second contacts on the second surface are exposed; (h) Wire each of the second metal contacts to the corresponding second contacts; (i) A second molding compound is formed on the second surface of the first redistribution layer to cover the second chips, the second metal wires and the metal pillars, one end of each metal pillar It is exposed on an outer surface of the second encapsulant body; (j) a second redistribution layer is formed on the outer surface of the encapsulant body; and (k) a plurality of external pads are formed on the second redistribution layer.
由上述說明可知,本發明的雙面堆疊式晶片封裝結構的製法係主要於封裝該第一重佈線層的雙面的二組晶片時,令其中一面直接形成有金屬柱,且該金屬柱係電性連接至該第二封膠體外表面之第二重佈線層;如此,本發明的雙面堆疊式晶片封裝結構不必將第一重佈線層的第一及第二接點集中在其中一顆晶片上,不會限制堆疊晶片數量。 It can be seen from the above description that the manufacturing method of the double-sided stacked chip packaging structure of the present invention is mainly used for packaging the two-sided double-sided chips of the first redistribution layer, so that a metal pillar is directly formed on one side, and the metal pillar is Electrically connected to the second redistribution layer on the outer surface of the second encapsulant; in this way, the double-sided stacked chip package structure of the present invention does not need to concentrate the first and second contacts of the first redistribution layer on one of them On the wafer, there is no limit to the number of stacked wafers.
欲達上述目的所使用的主要技術手段係令該雙面堆疊式晶片封裝結構的另一製法包含有:(a)準備一載板,其上形成有一第一重佈線層;(b)將複數第一晶片依序部分疊設於該第一重佈線層的一第一表面上,且各該第一晶片的第一金屬接點及該第一表面的複數第一接點外露;(c)將各該第一金屬接點打線電性連接至對應的該第一接點;(d)於該第一重佈線層之該第一表面上形成一第一封膠體,以包覆該些第一晶片及該些第一金屬線;(e)反轉該載板後令該載板自該第一重佈線層之一第二表面脫離,令該第二表面的複數第二接點及複數第三接點外露;(f)將複數第二晶片依序部分疊設於該第一重佈線層的該第二表面上,且各該第二晶片的第二金屬接點及該第二表面的複數第二接點外露;(g)將各該第二金屬接點打線電性連接至對應的該第二接點; (h)於該第一重佈線層之該第二表面上形成一第二封膠體,以包覆該些第二晶片及該些第二金屬線;(i)於該第二封膠體對應各該第三接點位置形成有貫穿孔,並於各該貫穿孔內電鍍一金屬柱,令各該金屬柱的一端係外露於該第二封膠體的一外表面;(j)於該封膠體的外表面上形成有一第二重佈線層;以及(k)於該第二重佈線層上形成有複數外接墊。 The main technical means used to achieve the above purpose is to make another manufacturing method of the double-sided stacked chip package structure include: (a) preparing a carrier board on which a first redistribution layer is formed; (b) combining plural The first chips are partially stacked on a first surface of the first redistribution layer in sequence, and the first metal contacts of each first chip and the plurality of first contacts on the first surface are exposed; (c) Wire each of the first metal contacts to the corresponding first contacts; (d) forming a first sealing compound on the first surface of the first redistribution layer to cover the first A chip and the first metal wires; (e) after reversing the carrier board, the carrier board is separated from a second surface of the first redistribution layer, so that a plurality of second contacts and a plurality of second contacts on the second surface The third contact is exposed; (f) a plurality of second chips are sequentially partially stacked on the second surface of the first redistribution layer, and the second metal contacts of each second chip and the second surface The plurality of second contacts of are exposed; (g) wire each of the second metal contacts to the corresponding second contacts; (h) A second molding compound is formed on the second surface of the first redistribution layer to cover the second chips and the second metal wires; (i) corresponding to each of the second molding compound A through hole is formed at the third contact position, and a metal pillar is plated in each through hole, so that one end of each metal pillar is exposed on an outer surface of the second sealing compound; (j) on the sealing body A second redistribution layer is formed on the outer surface of, and (k) a plurality of external pads are formed on the second redistribution layer.
由上述說明可知,本發明的雙面堆疊式晶片封裝結構的製法係主要於封裝該第一重佈線層的雙面的二組晶片時,令其中一面直接電性連接有金屬柱,且該金屬柱係電性連接至該第二封膠體外表面之第二重佈線層;如此,本發明的雙面堆疊式晶片封裝結構不必將第一重佈線層的第一及第二接點集中在其中一顆晶片上,不會限制堆疊晶片數量。 It can be seen from the above description that the manufacturing method of the double-sided stacked chip package structure of the present invention is mainly used to package the two groups of double-sided chips of the first redistribution layer, one of which is directly electrically connected with a metal pillar, and the metal The pillar is electrically connected to the second redistribution layer on the outer surface of the second encapsulant; in this way, the double-sided stacked chip package structure of the present invention does not need to concentrate the first and second contacts of the first redistribution layer in it There is no limit to the number of stacked chips on one chip.
10:第一重佈線層 10: The first heavy wiring layer
101:第一表面 101: first surface
102:第二表面 102: second surface
11:第一接點 11: The first contact
12:第二接點 12: second contact
13:第三接點 13: Third contact
14:介電本體 14: Dielectric body
15:內連接線 15: Internal connection line
20:第一晶片 20: The first chip
21:第一金屬接點 21: The first metal contact
22:第一金屬線 22: The first metal wire
221:第一直立線段 221: first straight line segment
222:第二直立線段 222: The second upright segment
30:第二晶片 30: second chip
31:第二金屬接點 31: The second metal contact
32:第二金屬線 32: The second metal wire
40、40’:金屬柱 40, 40’: Metal pillar
501:外表面 501: outer surface
51:第一封膠體 51: The first sealant
52:第二封膠體 52: The second sealant
60:第二重佈線層 60: second wiring layer
601:第三表面 601: Third Surface
602:第四表面 602: Fourth Surface
603:外接墊 603: external pad
611:錫球 611: tin ball
62:第三重佈線層 62: The third wiring layer
621:第四接點 621: Fourth Contact
622:內連接線 622: Internal connection line
70:載板 70: carrier board
80:雙面堆疊式晶片封裝結構 80: Double-sided stacked chip package structure
81:中介層 81: Intermediary layer
811:上表面 811: upper surface
812:下表面 812: lower surface
82:晶片組 82: Chipset
821:晶片 821: chip
83:晶片組 83: Chipset
831:晶片 831: Chip
831’:訊號傳輸晶片 831’: Signal transmission chip
832:外接墊 832: external pad
84:封膠體 84: sealant
圖1:本發明雙面堆疊式晶片封裝結構的第一實施例的剖面圖。 Fig. 1: A cross-sectional view of the first embodiment of the double-sided stacked chip package structure of the present invention.
圖2A至圖2H:本發明雙面堆疊式晶片封裝結構的製法的第一實施例的封裝流程圖。 2A to 2H: the packaging flow chart of the first embodiment of the manufacturing method of the double-sided stacked chip packaging structure of the present invention.
圖2-1A至圖2-1D:本發明雙面堆疊式晶片封裝結構的製法的第二實施例的封裝流程圖。 Figures 2-1A to 2-1D: the packaging flow chart of the second embodiment of the manufacturing method of the double-sided stacked chip packaging structure of the present invention.
圖3A至圖3D:本發明雙面堆疊式晶片封裝結構的製法的第三實施例的部分封裝流程圖。 3A to 3D: a partial packaging flow chart of the third embodiment of the manufacturing method of the double-sided stacked chip packaging structure of the present invention.
圖4:既有一雙面堆疊式晶片封裝結構的剖面圖。 Figure 4: A cross-sectional view of an existing double-sided stacked chip package structure.
本發明係針對雙面堆疊式晶片封裝結構提出改良,使雙面堆疊式晶片封裝結構可封裝的晶片數量不受限於晶片尺寸,以下謹以複數實施例配合圖式詳加說明本發明的技術內容。 The present invention proposes an improvement to the double-sided stacked chip package structure, so that the number of chips that can be packaged by the double-sided stacked chip package structure is not limited to the chip size. The following is a detailed description of the technology of the present invention with a plurality of embodiments and drawings. content.
首先請參閱圖1所示,係為本發明雙面堆疊式晶片封裝結構包含有一第一重佈線層10、複數第一晶片20、複數第二晶片30、複數金屬柱40、一第一封膠體51、一第二封膠體52及一第二重佈線層60。
First, please refer to FIG. 1, which is a double-sided stacked chip package structure of the present invention. It includes a
上述第一重佈線層10係包含有二相對的一第一表面101及一第二表面102,該第一表面101上形成有複數第一接點11,而該第二表面102上形成有複數第二接點12及複數第三接點13;於本實施例,該第一重佈線層10係於一介電本體14內形成有複數內連接線15,而該些內連接線15係用以將該些第一接點11與該些第二接點12及第三接點13電性連接,且該些第三接點13係位在該些第二接點12之外。
The
上述該些第一晶片20係依序部分疊設於該第一重佈線層10的第一表面101,且各該第一晶片20的第一金屬接點21係外露,各該第一金屬接點21係以第一金屬線22電性連接至該第一重佈線層10的第一表面101上所對應的該第一接點11。於實施例中,該些第一晶片20部分疊設方式係由拾取放置方式(pick-and-place method),一個接著一個地以階梯偏移、交錯、塔狀等方式進行部分堆疊設置;又該些第一晶片20數量大於或等於二,但本發明並不限制該些第一晶片的數量。
The aforementioned
上述該些第二晶片30同樣依序部分疊設於該第一重佈線層10的第二表面102,且各該第二晶片30的第二金屬接點31係外露,各該第二金屬接點31係以第二金屬線32電性連接至該第一重佈線層10的第二表面102上所對應的該第二接點12。於實施例中,該些第二晶片30部分疊設方式係由拾取放置方式(pick-and-place method),一個接著一個地以階梯偏移、交錯、塔狀等方式進
行部分堆疊設置;又該些第二晶片30數量大於或等於二,但本發明並不限制該些第一晶片的數量。
The aforementioned
上述複數金屬柱40的共同一端係分別電性連接至該第一重佈線層10之第二表面102上的第三接點13,且各該金屬柱40的高度係高於該些第二金屬線32的高度。
The common ends of the plurality of
上述第一封膠體51係形成在該第一重佈線層10上的第一表面101上,以包覆該些第一晶片20;而該第二封膠體52係形成在該第一重佈線層10的第二表面102上,以包覆該些第二晶片30及該些金屬柱40;其中該些金屬柱40共同另一端係外露於該第二封膠體52的一外表面501;較佳地,該些金屬柱40共同另一端與該第二封膠體52的外表面501齊平。
The
上述第二重佈線層60包含有二相對的一第三表面601及第四表面602,該第四表面602係形成於該第二封膠體52的外表面501,並與該些金屬柱40的外露一側電性連接,而該第三表面601係形成有複數外接墊603。於本實施例,該些外接墊603進一步分別形成有錫球61或凸塊。
The
由上為本發明雙面堆疊式晶片封裝結構的結構說明,以下進一步說明完成該雙面堆疊式晶片封裝結構的各種製法。 Based on the above description of the structure of the double-sided stacked chip package structure of the present invention, various manufacturing methods for completing the double-sided stacked chip package structure are further described below.
首先請參閱圖2A至圖2H所示,本發明之一雙面堆疊式晶片封裝製法的第一實施例;於本實施例,此一封裝製程方法為重佈線層優先製程(RDL first process),其包含以下步驟(a)至步驟(k)。 First, please refer to FIG. 2A to FIG. 2H, a first embodiment of a double-sided stacked chip packaging method of the present invention; in this embodiment, the packaging process method is the RDL first process, which It includes the following steps (a) to (k).
如圖2A所示的步驟(a),首先準備一載板70,該載板70上形成有第一重佈線層10,故可依序於該載板70上形成有該些第二接點12及第三接點13、該介電本體14、該些內連接線15及該些第一接點11;在此步驟(a)中,該些第一接點11係外露朝上。
As shown in step (a) of FIG. 2A, first prepare a
如圖2B所示的步驟(b),將該些第一晶片20依序部分疊設於該第一重佈線層10的一第一表面101上,且各該第一晶片20的第一金屬接點21及該第一表面101的複數第一接點11均外露。於本實施例,該些第一晶片20部分疊設方式係由拾取放置方式(pick-and-place method),一個接著一個地以階梯偏移、交錯、塔狀等方式進行部分堆疊設置;又該些第一晶片20數量大於或等於四,但本發明並不限制該些第一晶片的數量。
As shown in step (b) of FIG. 2B, the
如圖2C所示的步驟(c),將各該第一晶片20的該第一金屬接點21打線電性連接至對應的該第一接點11,故各該第一金屬接點21與對應的該第一接點11之間連接有該第一金屬線22。
As shown in step (c) of FIG. 2C, the
如圖2D所示的步驟(d),於該第一重佈線層10之該第一表面101上形成一第一封膠體51,以包覆該些第一晶片20及該些第一金屬線22。
As shown in step (d) of FIG. 2D, a
於上述步驟(e)中,將圖2D的該載板70予以反轉後,令該載板70自該第一重佈線層10之一第二表面102脫離,如圖2E所示,該第二表面102的複數第二接點12及複數第三接點13即朝上外露。
In the above step (e), after the
如圖2E所示步驟(f),再於該些外露的第三接點13上分別形成有一金屬柱40。
As shown in step (f) of FIG. 2E, a
如圖2F所示的步驟(g),將複數第二晶片30依序部分疊設於該第一重佈線層10的該第二表面102上,且各該第二晶片30的第二金屬接點31及該第二表面102的複數第二接點12均朝上外露;於實施例中,該些第二晶片30部分疊設方式係由拾取放置方式(pick-and-place method),一個接著一個地以階梯偏移、交錯、塔狀等方式進行部分堆疊設置;又該些第二晶片30數量大於或等於四,但本發明並不限制該些第一晶片的數量。
As shown in step (g) of FIG. 2F, a plurality of
如圖2F所示的步驟(h),將各該第二晶片30的第二金屬接點31打線電性連接至對應的該第二接點12,故各該第二金屬接點31與對應的該第二接
點12之間連接有該第二金屬線32。各該金屬柱40的高度係高於對應該第一重佈線層10之第二金屬線32的最高點高度。
In step (h) shown in FIG. 2F, the
如圖2G所示的步驟(i),於該第一重佈線層10之該第二表面102上形成一第二封膠體52,以包覆該些第二晶片30、該些第二金屬線32及該些金屬柱40,各該金屬柱40的一端係外露於該第二封膠體52的一外表面501,即各該金屬柱40的一端係與該第二封膠體52的外表面501平齊。即,當該第二封膠體52包覆所有第二金屬線32的同時,該金屬柱40即外露於該第二封膠體52的外表面501。
In step (i) as shown in FIG. 2G, a
如圖2H所示的步驟(j),於該第二封膠體52的外表面501上形成有該第二重佈線層60。
As shown in step (j) of FIG. 2H, the
如圖2H所示的步驟(k),再於該第二重佈線層60上的複數外接墊603上分別形成凸塊或錫球61。
In step (k) as shown in FIG. 2H, bumps or
由前揭第一實施例可知,該些金屬柱40可在第二封膠體52成形之前,直接於第三接點13上成形,再與接續成形的第二封膠體52齊平。
As can be seen from the first embodiment disclosed above, the
再請參閱圖2-1A至圖2-1D所示,本發明之一雙面堆疊式晶片封裝製法的第二實施例;本實施例與第一實施例大致相同,惟圖2C及圖2D所示的製程步驟係由圖2-1A至圖2-1C取代,即如圖2-1A所示,將各該第一晶片20的該第一金屬接點21同樣打線電性連接至對應的該第一接點11,故各該第一金屬接點21與對應的該第一接點11之間連接有該第一金屬線22;惟各條第一金屬線高度高於堆疊後的該些第一晶片20的高度;之後於該第一重佈線層10之該第一表面101上形成一第一封膠體51,以包覆該些第一晶片20及該些第一金屬線22;接著。接著,再如圖2-1B所示,研磨該第一封膠體51至一定高度,使得各該第一金屬線保留連接於各第一晶片20的第一金屬接點21的第一直立線段221,以及連接對應第一接點11的第二金屬線段222;其中該第一及第二直立線段221、
222均垂直於其對應該些第一晶片20及該第一重佈線層10,且各該第一及第二直立線段221、222的自由端係外露於該第一封膠體51。
Please refer to FIGS. 2-1A to 2-1D, a second embodiment of a double-sided stacked chip packaging method of the present invention; this embodiment is roughly the same as the first embodiment, except that shown in FIGS. 2C and 2D The illustrated process steps are replaced by FIGS. 2-1A to 2-1C, that is, as shown in FIG. 2-1A, the
再如圖2-1C所示,再於該第一封膠體51上形成一第三重佈線層62,透過該第三重佈線層62的內連接線621將該些第一直立線段221及該些第二直立線段222對應連接,於第三重佈線層62構成迴路,且各該第一晶片20的第一金屬接點21係透過第三重佈線層62電性連接至對應的第一接點11。接下來步驟即如第一實施例的圖2E至2G所示,最後即構成如圖2-1D所示的雙面堆疊式晶片封裝結構。
As shown in FIG. 2-1C, a
再請參閱圖3A至圖3D所示,係為本發明之一雙面堆疊式晶片封裝製法的第二實施例,其同樣包含有步驟(a)至步驟(h)的後數道步驟,惟步驟(a)至步驟(e)與第一實施例的步驟(a)至步驟(e),即如圖2A至圖2D所示,故不再贅述;以下進一步說明本實施例的步驟(f)至步驟(k)。 Please refer to FIG. 3A to FIG. 3D, which is a second embodiment of a double-sided stacked chip packaging manufacturing method of the present invention, which also includes steps (a) to (h) after the next steps, but Steps (a) to (e) and steps (a) to (e) of the first embodiment are shown in Figures 2A to 2D, so they will not be repeated here; the following further describes step (f) of this embodiment ) To step (k).
首先請參閱圖2D所示,當該載板70自該第一重佈線層10之一第二表面102脫離,該第二表面102的複數第二接點12及複數第三接點13即朝上外露,如圖3A所示的步驟(f),將複數第二晶片30依序部分疊設於該第一重佈線層10的該第二表面102上,且各該第二晶片30的第二金屬接點31及該第二表面102的複數第二接點12均朝上外露。
First, please refer to FIG. 2D. When the
如圖3A所示的步驟(g),將各該第二晶片30的第二金屬接點31打線電性連接至對應的該第二接點12,故各該第二金屬接點31與對應的該第二接點12之間連接有該第二金屬線32。
As shown in step (g) of FIG. 3A, the
如圖3A所示的步驟(h),於該第一重佈線層10之該第二表面102上形成一第二封膠體52,以包覆該些第二晶片30及該些第二金屬線32。
In step (h) as shown in FIG. 3A, a
如圖3B所示的步驟(i),於該第二封膠體52對應各該第三接點13位置形成有貫穿孔521,再如圖3C所示,再於各該貫穿孔521內電鍍一金屬柱
40’,令各該金屬柱40’的一端係外露於該第二封膠體52的外表面501,即同樣與該第二封膠體52的外表面501齊平。
As shown in step (i) of FIG. 3B, through
如圖3D所示步驟(j),於該第二封膠體52的外表面501上形成有該第二重佈線層60。
As shown in step (j) in FIG. 3D, the
如圖3D所示的步驟(k),再於該第二重佈線層60的複數外接墊603上分別形成有凸塊或錫球61。
As shown in step (k) in FIG. 3D, bumps or
由前揭第二實施例可知,該些金屬柱40’可在第二封膠體52成形後,再對該第二封膠體52開設複數貫穿孔521並對準第三接點13,使第三接點13外露,再以如電鍍方式於該貫穿孔521內形成金屬柱40’。
As can be seen from the second embodiment disclosed above, after the second
綜上所述,本發明雙面堆疊式晶片封裝結構係主要於該第一重佈線層的雙面分別封裝有二組晶片,並於其中一面直接形成有金屬柱,且該金屬柱係電性連接至該第二封膠體外表面之第二重佈線層;如此,本發明的雙面堆疊式晶片封裝結構不必將第一重佈線層的第一及第二接點集中在其中一顆晶片上,不會限制堆疊晶片數量;又前揭封裝製程方法的第一及第二實施例係採用重佈線優先製程,直接於載板上形成該第一重佈線層,不必使用預先製作成型的中介板,具有容易對位、高平坦度及更佳的表面條件;另外,也進一步揭露該些與該第一重佈線層電性連接的金屬柱的不同成形方法,不會提高製程難度且容易實施。 In summary, the double-sided stacked chip packaging structure of the present invention is mainly used to package two sets of chips on both sides of the first redistribution layer, and a metal pillar is directly formed on one of the sides, and the metal pillar is electrically conductive The second redistribution layer connected to the outer surface of the second encapsulant; in this way, the double-sided stacked chip package structure of the present invention does not need to concentrate the first and second contacts of the first redistribution layer on one of the chips , Does not limit the number of stacked chips; the first and second embodiments of the packaging process method adopt the re-wiring priority process to directly form the first re-wiring layer on the carrier board without using pre-made and molded interposers , Has easy alignment, high flatness and better surface conditions; in addition, it further discloses the different forming methods of the metal pillars electrically connected to the first rewiring layer, which will not increase the difficulty of the manufacturing process and is easy to implement.
以上所述僅是本發明的實施例而已,並非對本發明做任何形式上的限制,雖然本發明已以實施例揭露如上,然而並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明技術方案的範圍內,當可利用上述揭示的技術內容作出些許更動或修飾為等同變化的等效實施例,但凡是未脫離本發明技術方案的內容,依據本發明的技術實質對以上實施例所作的任何簡單修改、等同變化與修飾,均仍屬於本發明技術方案的範圍內。 The above are only the embodiments of the present invention, and do not limit the present invention in any form. Although the present invention has been disclosed in the above embodiments, it is not intended to limit the present invention. Anyone with ordinary knowledge in the relevant technical field, Without departing from the scope of the technical solution of the present invention, when the technical content disclosed above can be used to make slight changes or modification into equivalent embodiments with equivalent changes, but any content that does not deviate from the technical solution of the present invention is based on the technical essence of the present invention Any simple modifications, equivalent changes and modifications made to the above embodiments still fall within the scope of the technical solutions of the present invention.
10:第一重佈線層 10: The first heavy wiring layer
101:第一表面 101: first surface
102:第二表面 102: second surface
11:第一接點 11: The first contact
12:第二接點 12: second contact
13:第三接點 13: Third contact
14:介電本體 14: Dielectric body
15:內連接線 15: Internal connection line
20:第一晶片 20: The first chip
21:第一金屬接點 21: The first metal contact
22:第一金屬線 22: The first metal wire
30:第二晶片 30: second chip
31:第二金屬接點 31: The second metal contact
32:第二金屬線 32: The second metal wire
40:金屬柱 40: metal column
50:封膠體 50: sealant
501:外表面 501: outer surface
51:第一封膠體 51: The first sealant
52:第二封膠體 52: The second sealant
60:第二重佈線層 60: second wiring layer
601:第三表面 601: Third Surface
602:第四表面 602: Fourth Surface
603:外接墊 603: external pad
61:錫球 61: tin ball
Claims (10)
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Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7345361B2 (en) * | 2003-12-04 | 2008-03-18 | Intel Corporation | Stackable integrated circuit packaging |
TW201023313A (en) * | 2008-12-11 | 2010-06-16 | Xintec Inc | Package structure for chip and method for forming the same |
US7825520B1 (en) * | 2006-11-16 | 2010-11-02 | Amkor Technology, Inc. | Stacked redistribution layer (RDL) die assembly package |
US7944034B2 (en) * | 2007-06-22 | 2011-05-17 | Texas Instruments Incorporated | Array molded package-on-package having redistribution lines |
TW201121015A (en) * | 2009-12-02 | 2011-06-16 | Wen-Kun Yang | Substrate structure with die embedded inside and dual build-up layers over both side surfaces and method of the same |
TW201830612A (en) * | 2015-11-10 | 2018-08-16 | 南韓商三星電子股份有限公司 | Fan-out semiconductor package and electronic device including the same |
TW201832327A (en) * | 2017-02-21 | 2018-09-01 | 力成科技股份有限公司 | Fan-out semiconductor package structure and fabricating method |
-
2019
- 2019-03-21 TW TW108109850A patent/TWI698941B/en active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7345361B2 (en) * | 2003-12-04 | 2008-03-18 | Intel Corporation | Stackable integrated circuit packaging |
US7825520B1 (en) * | 2006-11-16 | 2010-11-02 | Amkor Technology, Inc. | Stacked redistribution layer (RDL) die assembly package |
US7944034B2 (en) * | 2007-06-22 | 2011-05-17 | Texas Instruments Incorporated | Array molded package-on-package having redistribution lines |
TW201023313A (en) * | 2008-12-11 | 2010-06-16 | Xintec Inc | Package structure for chip and method for forming the same |
TW201121015A (en) * | 2009-12-02 | 2011-06-16 | Wen-Kun Yang | Substrate structure with die embedded inside and dual build-up layers over both side surfaces and method of the same |
TW201830612A (en) * | 2015-11-10 | 2018-08-16 | 南韓商三星電子股份有限公司 | Fan-out semiconductor package and electronic device including the same |
TW201832327A (en) * | 2017-02-21 | 2018-09-01 | 力成科技股份有限公司 | Fan-out semiconductor package structure and fabricating method |
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