TWI698941B - Two-sided stacked die package and packaging method thereof - Google Patents

Two-sided stacked die package and packaging method thereof Download PDF

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TWI698941B
TWI698941B TW108109850A TW108109850A TWI698941B TW I698941 B TWI698941 B TW I698941B TW 108109850 A TW108109850 A TW 108109850A TW 108109850 A TW108109850 A TW 108109850A TW I698941 B TWI698941 B TW I698941B
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contacts
metal
redistribution layer
chips
exposed
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TW108109850A
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TW202036735A (en
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沈尚宏
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力成科技股份有限公司
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/18High density interconnect [HDI] connectors; Manufacturing methods related thereto
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/1517Multilayer substrate
    • H01L2924/15192Resurf arrangement of the internal vias
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181Encapsulation

Abstract

The present invention relates to a two-sided die package and packaging method thereof. A plurality of first dies and second dies are respectively stacked on two opposite sides of a first RDL and electrically connected to the RDL by wires. A first encapsulation encapsulates the first dies and a second encapsulation encapsulates the second dies. A plurality of metal posts are formed inside the second encapsulation and a second RDL is formed on the second encapsulation. Each metal post is electrically connected between the first and second RDLs. Therefore, in the two-sided die package of the present invention, a plurality of first and second pads of the first RDL are not limited to form on only one of dies only and an amount of the dies is not limited.

Description

雙面堆疊式晶片封裝結構及其製法 Double-sided stacked chip packaging structure and manufacturing method thereof

本發明係關於一種堆疊式晶片封裝結構及其製法,尤指一種雙面堆疊式晶片封裝結構及其製法。 The invention relates to a stacked chip packaging structure and a manufacturing method thereof, in particular to a double-sided stacked chip packaging structure and a manufacturing method thereof.

隨著終端產品應用需求增加與技術趨勢演進,對於元件所需的頻寬、容量與工作效率等亦相對提高,所需晶片數量增加,在一定晶片數量內,一種堆疊式晶片封裝結構可提供良好的半導體元件封裝良率。 With the increasing demand for terminal product applications and the evolution of technology trends, the bandwidth, capacity, and work efficiency required for components have also increased. The number of chips required has increased. Within a certain number of chips, a stacked chip package structure can provide good The semiconductor component packaging yield rate.

對於超過一定晶片數量的半導體元件,則可改採如圖4所示的雙面堆疊式晶片封裝結構80,即於一中介層81的上表面811及下表面812分別部分疊設有一晶片組82、83,並透過既有打線製程步驟,將位在上表面811之晶片組83的複數晶片831分別與該上表面811的接點電性連接,並將位在下表面812之晶片組83的複數晶片831分別與該下表面812的接點電性連接,又其中疊設在該下表面812的晶片組83的最下方晶片(下稱訊號傳輸晶片831’)進一步形成有複數外接墊832,以外露於一封膠體84外。因此,該訊號傳輸晶片831’的外接墊832除了與其本身的訊號接點電性連接外,還必須供其它晶片821、831的訊號接點連接。 For semiconductor components exceeding a certain number of chips, a double-sided stacked chip package structure 80 as shown in FIG. 4 can be adopted, that is, a chip set 82 is partially stacked on the upper surface 811 and the lower surface 812 of an interposer 81. , 83, and through the existing wire bonding process steps, the plurality of chips 831 of the chip set 83 located on the upper surface 811 are electrically connected with the contacts of the upper surface 811, and the plurality of chips 83 located on the lower surface 812 The chip 831 is electrically connected to the contacts of the lower surface 812, and the lowermost chip of the chip set 83 (hereinafter referred to as the signal transmission chip 831') stacked on the lower surface 812 is further formed with a plurality of external pads 832. Exposed outside the gel 84. Therefore, the external pad 832 of the signal transmission chip 831' must be connected to the signal contacts of other chips 821 and 831 in addition to being electrically connected to its own signal contacts.

換言之,上、下晶片組的所有晶片的訊號接點必須匯整至該訊號傳輸晶片,以與對應外接墊電性連接;是以,由於晶片面積一定,勢必限制 其上外接墊的數量,自然也限制此一雙面堆疊式晶片封裝結構可封裝的晶片數量,有必要進一步改良之。 In other words, the signal contacts of all the chips in the upper and lower chipset must be integrated to the signal transmission chip to be electrically connected to the corresponding external pad; therefore, due to a certain chip area, it is bound to be limited The number of external pads naturally limits the number of chips that can be packaged by this double-sided stacked chip package structure, and it is necessary to further improve it.

有鑑於前揭雙面堆疊式晶片封裝結構的缺點,本發明主要發明目的係提供一種新的雙面堆疊式晶片封裝結構。 In view of the disadvantages of the aforementioned double-sided stacked chip package structure, the main purpose of the present invention is to provide a new double-sided stacked chip package structure.

欲達上述目的所使用的主要技術手段係令該雙面堆疊式晶片封裝結構包含有:一第一重佈線層,具有一第一表面及一第二表面,該第一表面上形成有複數第一接點,而該第二表面上形成有複數第二接點及複數第三接點;複數第一晶片,係部分堆疊在該第一重佈線層的第一表面,各該第一晶片具有外露的第一金屬接點,各該第一金屬接點係以第一金屬線電性連接至該第一表面所對應的該第一接點;複數第二晶片,係部分堆疊在該第一重佈線層的第二表面,各該第二晶片具有外露的第二金屬接點,各該第二金屬接點係以第二金屬線電性連接至該第二表面所對應的該第二接點;複數金屬柱,其共同一端係分別電性連接至該第一重佈線層之第二表面的第三接點,且各該金屬柱的高度係高於該些第二金屬線的高度;一第一封膠體,係形成於該第一重佈線層的該第一表面上,以包覆該第一晶片組及該些第一金屬線;一第二封膠體,係形成於該第一重佈線層的該第二表面上,以包覆該第二晶片組、該些第二金屬線及該些金屬柱;其中該些金屬柱共同另一端係外露於該第二封膠體的一外表面;以及 一第二重佈線層,其一第三表面係形成於該第二封膠體的外表面,並與該些金屬柱外露一側電性連接,而一第四表面係形成有複數外接墊。 The main technical means used to achieve the above objective is to make the double-sided stacked chip package structure include: a first redistribution layer having a first surface and a second surface, and a plurality of second surfaces are formed on the first surface A contact, and a plurality of second contacts and a plurality of third contacts are formed on the second surface; a plurality of first chips are partially stacked on the first surface of the first redistribution layer, each of the first chips has Exposed first metal contacts, each of the first metal contacts is electrically connected to the first contact corresponding to the first surface by a first metal wire; a plurality of second chips are partially stacked on the first On the second surface of the redistribution layer, each of the second chips has exposed second metal contacts, and each of the second metal contacts is electrically connected to the second contact corresponding to the second surface by a second metal wire Points; a plurality of metal pillars, the common end of which is respectively electrically connected to the third contact on the second surface of the first redistribution layer, and the height of each metal pillar is higher than the height of the second metal wires; A first molding compound is formed on the first surface of the first redistribution layer to cover the first chip set and the first metal wires; a second molding compound is formed on the first On the second surface of the redistribution layer, the second chip set, the second metal wires and the metal pillars are covered; wherein the other end of the metal pillars is exposed to an outside of the second sealing compound Surface; and A second redistribution layer has a third surface formed on the outer surface of the second encapsulant body and electrically connected to the exposed side of the metal pillars, and a fourth surface is formed with a plurality of external pads.

由上述說明可知,本發明的雙面堆疊式晶片封裝結構係主要於該第一重佈線層的雙面分別封裝有二組晶片,並於其中一面直接形成有金屬柱,且該金屬柱係電性連接至該第二封膠體外表面之第二重佈線層;如此,本發明的雙面堆疊式晶片封裝結構不必將第一重佈線層的第一及第二接點集中在其中一顆晶片上,不會限制堆疊晶片數量。 It can be seen from the above description that the double-sided stacked chip packaging structure of the present invention is mainly used to package two sets of chips on both sides of the first redistribution layer, and a metal pillar is directly formed on one of the sides, and the metal pillar is an electrical The second redistribution layer connected to the outer surface of the second encapsulant; in this way, the double-sided stacked chip package structure of the present invention does not need to concentrate the first and second contacts of the first redistribution layer on one chip The number of stacked wafers is not limited.

欲達上述目的所使用的主要技術手段係令該雙面堆疊式晶片封裝結構的製法包含有:(a)準備一載板,其上形成有一第一重佈線層;(b)將複數第一晶片依序部分疊設於該第一重佈線層的一第一表面上,且各該第一晶片的第一金屬接點及該第一表面的複數第一接點外露;(c)將各該第一金屬接點打線電性連接至對應的該第一接點,使各該第一金屬接點與對應的該第一接點之間連接有一第一金屬線;(d)於該第一重佈線層之該第一表面上形成一第一封膠體,以包覆該些第一晶片及該些第一金屬線;(e)反轉該載板後令該載板自該第一重佈線層之一第二表面脫離,令該第二表面的複數第二接點及複數第三接點外露;(f)於外露的該些第三接點上分別形成有一金屬柱;(g)將複數第二晶片依序部分疊設於該第一重佈線層的該第二表面上,且各該第二晶片的第二金屬接點及該第二表面的複數第二接點外露;(h)將各該第二金屬接點打線電性連接至對應的該第二接點; (i)於該第一重佈線層之該第二表面上形成一第二封膠體,以包覆該些第二晶片、該些第二金屬線及該些金屬柱,各該金屬柱的一端係外露於該第二封膠體的一外表面;(j)於該封膠體的外表面上形成有一第二重佈線層;以及(k)於該第二重佈線層上形成有複數外接墊。 The main technical means used to achieve the above-mentioned purpose is to make the manufacturing method of the double-sided stacked chip package structure include: (a) preparing a carrier board on which a first redistribution layer is formed; (b) placing a plurality of first The chips are sequentially partially stacked on a first surface of the first redistribution layer, and the first metal contacts of each first chip and a plurality of first contacts on the first surface are exposed; (c) each The first metal contact is wire-bonded and electrically connected to the corresponding first contact, so that a first metal wire is connected between each first metal contact and the corresponding first contact; (d) at the first metal contact A first molding compound is formed on the first surface of a redistribution layer to cover the first chips and the first metal wires; (e) inverting the carrier board to make the carrier board from the first A second surface of the redistribution layer is detached, so that the plurality of second contacts and the plurality of third contacts of the second surface are exposed; (f) a metal pillar is respectively formed on the exposed third contacts; (g) ) A plurality of second chips are sequentially partially stacked on the second surface of the first redistribution layer, and the second metal contacts of each second chip and the plurality of second contacts on the second surface are exposed; (h) Wire each of the second metal contacts to the corresponding second contacts; (i) A second molding compound is formed on the second surface of the first redistribution layer to cover the second chips, the second metal wires and the metal pillars, one end of each metal pillar It is exposed on an outer surface of the second encapsulant body; (j) a second redistribution layer is formed on the outer surface of the encapsulant body; and (k) a plurality of external pads are formed on the second redistribution layer.

由上述說明可知,本發明的雙面堆疊式晶片封裝結構的製法係主要於封裝該第一重佈線層的雙面的二組晶片時,令其中一面直接形成有金屬柱,且該金屬柱係電性連接至該第二封膠體外表面之第二重佈線層;如此,本發明的雙面堆疊式晶片封裝結構不必將第一重佈線層的第一及第二接點集中在其中一顆晶片上,不會限制堆疊晶片數量。 It can be seen from the above description that the manufacturing method of the double-sided stacked chip packaging structure of the present invention is mainly used for packaging the two-sided double-sided chips of the first redistribution layer, so that a metal pillar is directly formed on one side, and the metal pillar is Electrically connected to the second redistribution layer on the outer surface of the second encapsulant; in this way, the double-sided stacked chip package structure of the present invention does not need to concentrate the first and second contacts of the first redistribution layer on one of them On the wafer, there is no limit to the number of stacked wafers.

欲達上述目的所使用的主要技術手段係令該雙面堆疊式晶片封裝結構的另一製法包含有:(a)準備一載板,其上形成有一第一重佈線層;(b)將複數第一晶片依序部分疊設於該第一重佈線層的一第一表面上,且各該第一晶片的第一金屬接點及該第一表面的複數第一接點外露;(c)將各該第一金屬接點打線電性連接至對應的該第一接點;(d)於該第一重佈線層之該第一表面上形成一第一封膠體,以包覆該些第一晶片及該些第一金屬線;(e)反轉該載板後令該載板自該第一重佈線層之一第二表面脫離,令該第二表面的複數第二接點及複數第三接點外露;(f)將複數第二晶片依序部分疊設於該第一重佈線層的該第二表面上,且各該第二晶片的第二金屬接點及該第二表面的複數第二接點外露;(g)將各該第二金屬接點打線電性連接至對應的該第二接點; (h)於該第一重佈線層之該第二表面上形成一第二封膠體,以包覆該些第二晶片及該些第二金屬線;(i)於該第二封膠體對應各該第三接點位置形成有貫穿孔,並於各該貫穿孔內電鍍一金屬柱,令各該金屬柱的一端係外露於該第二封膠體的一外表面;(j)於該封膠體的外表面上形成有一第二重佈線層;以及(k)於該第二重佈線層上形成有複數外接墊。 The main technical means used to achieve the above purpose is to make another manufacturing method of the double-sided stacked chip package structure include: (a) preparing a carrier board on which a first redistribution layer is formed; (b) combining plural The first chips are partially stacked on a first surface of the first redistribution layer in sequence, and the first metal contacts of each first chip and the plurality of first contacts on the first surface are exposed; (c) Wire each of the first metal contacts to the corresponding first contacts; (d) forming a first sealing compound on the first surface of the first redistribution layer to cover the first A chip and the first metal wires; (e) after reversing the carrier board, the carrier board is separated from a second surface of the first redistribution layer, so that a plurality of second contacts and a plurality of second contacts on the second surface The third contact is exposed; (f) a plurality of second chips are sequentially partially stacked on the second surface of the first redistribution layer, and the second metal contacts of each second chip and the second surface The plurality of second contacts of are exposed; (g) wire each of the second metal contacts to the corresponding second contacts; (h) A second molding compound is formed on the second surface of the first redistribution layer to cover the second chips and the second metal wires; (i) corresponding to each of the second molding compound A through hole is formed at the third contact position, and a metal pillar is plated in each through hole, so that one end of each metal pillar is exposed on an outer surface of the second sealing compound; (j) on the sealing body A second redistribution layer is formed on the outer surface of, and (k) a plurality of external pads are formed on the second redistribution layer.

由上述說明可知,本發明的雙面堆疊式晶片封裝結構的製法係主要於封裝該第一重佈線層的雙面的二組晶片時,令其中一面直接電性連接有金屬柱,且該金屬柱係電性連接至該第二封膠體外表面之第二重佈線層;如此,本發明的雙面堆疊式晶片封裝結構不必將第一重佈線層的第一及第二接點集中在其中一顆晶片上,不會限制堆疊晶片數量。 It can be seen from the above description that the manufacturing method of the double-sided stacked chip package structure of the present invention is mainly used to package the two groups of double-sided chips of the first redistribution layer, one of which is directly electrically connected with a metal pillar, and the metal The pillar is electrically connected to the second redistribution layer on the outer surface of the second encapsulant; in this way, the double-sided stacked chip package structure of the present invention does not need to concentrate the first and second contacts of the first redistribution layer in it There is no limit to the number of stacked chips on one chip.

10:第一重佈線層 10: The first heavy wiring layer

101:第一表面 101: first surface

102:第二表面 102: second surface

11:第一接點 11: The first contact

12:第二接點 12: second contact

13:第三接點 13: Third contact

14:介電本體 14: Dielectric body

15:內連接線 15: Internal connection line

20:第一晶片 20: The first chip

21:第一金屬接點 21: The first metal contact

22:第一金屬線 22: The first metal wire

221:第一直立線段 221: first straight line segment

222:第二直立線段 222: The second upright segment

30:第二晶片 30: second chip

31:第二金屬接點 31: The second metal contact

32:第二金屬線 32: The second metal wire

40、40’:金屬柱 40, 40’: Metal pillar

501:外表面 501: outer surface

51:第一封膠體 51: The first sealant

52:第二封膠體 52: The second sealant

60:第二重佈線層 60: second wiring layer

601:第三表面 601: Third Surface

602:第四表面 602: Fourth Surface

603:外接墊 603: external pad

611:錫球 611: tin ball

62:第三重佈線層 62: The third wiring layer

621:第四接點 621: Fourth Contact

622:內連接線 622: Internal connection line

70:載板 70: carrier board

80:雙面堆疊式晶片封裝結構 80: Double-sided stacked chip package structure

81:中介層 81: Intermediary layer

811:上表面 811: upper surface

812:下表面 812: lower surface

82:晶片組 82: Chipset

821:晶片 821: chip

83:晶片組 83: Chipset

831:晶片 831: Chip

831’:訊號傳輸晶片 831’: Signal transmission chip

832:外接墊 832: external pad

84:封膠體 84: sealant

圖1:本發明雙面堆疊式晶片封裝結構的第一實施例的剖面圖。 Fig. 1: A cross-sectional view of the first embodiment of the double-sided stacked chip package structure of the present invention.

圖2A至圖2H:本發明雙面堆疊式晶片封裝結構的製法的第一實施例的封裝流程圖。 2A to 2H: the packaging flow chart of the first embodiment of the manufacturing method of the double-sided stacked chip packaging structure of the present invention.

圖2-1A至圖2-1D:本發明雙面堆疊式晶片封裝結構的製法的第二實施例的封裝流程圖。 Figures 2-1A to 2-1D: the packaging flow chart of the second embodiment of the manufacturing method of the double-sided stacked chip packaging structure of the present invention.

圖3A至圖3D:本發明雙面堆疊式晶片封裝結構的製法的第三實施例的部分封裝流程圖。 3A to 3D: a partial packaging flow chart of the third embodiment of the manufacturing method of the double-sided stacked chip packaging structure of the present invention.

圖4:既有一雙面堆疊式晶片封裝結構的剖面圖。 Figure 4: A cross-sectional view of an existing double-sided stacked chip package structure.

本發明係針對雙面堆疊式晶片封裝結構提出改良,使雙面堆疊式晶片封裝結構可封裝的晶片數量不受限於晶片尺寸,以下謹以複數實施例配合圖式詳加說明本發明的技術內容。 The present invention proposes an improvement to the double-sided stacked chip package structure, so that the number of chips that can be packaged by the double-sided stacked chip package structure is not limited to the chip size. The following is a detailed description of the technology of the present invention with a plurality of embodiments and drawings. content.

首先請參閱圖1所示,係為本發明雙面堆疊式晶片封裝結構包含有一第一重佈線層10、複數第一晶片20、複數第二晶片30、複數金屬柱40、一第一封膠體51、一第二封膠體52及一第二重佈線層60。 First, please refer to FIG. 1, which is a double-sided stacked chip package structure of the present invention. It includes a first redistribution layer 10, a plurality of first chips 20, a plurality of second chips 30, a plurality of metal pillars 40, and a first sealing compound. 51. A second sealing compound 52 and a second rewiring layer 60.

上述第一重佈線層10係包含有二相對的一第一表面101及一第二表面102,該第一表面101上形成有複數第一接點11,而該第二表面102上形成有複數第二接點12及複數第三接點13;於本實施例,該第一重佈線層10係於一介電本體14內形成有複數內連接線15,而該些內連接線15係用以將該些第一接點11與該些第二接點12及第三接點13電性連接,且該些第三接點13係位在該些第二接點12之外。 The first redistribution layer 10 includes two opposite first surfaces 101 and a second surface 102. A plurality of first contacts 11 are formed on the first surface 101, and a plurality of first contacts 11 are formed on the second surface 102. The second contact 12 and a plurality of third contacts 13; in this embodiment, the first redistribution layer 10 is formed with a plurality of inner connecting wires 15 in a dielectric body 14, and the inner connecting wires 15 are used The first contacts 11 are electrically connected with the second contacts 12 and the third contacts 13, and the third contacts 13 are located outside the second contacts 12.

上述該些第一晶片20係依序部分疊設於該第一重佈線層10的第一表面101,且各該第一晶片20的第一金屬接點21係外露,各該第一金屬接點21係以第一金屬線22電性連接至該第一重佈線層10的第一表面101上所對應的該第一接點11。於實施例中,該些第一晶片20部分疊設方式係由拾取放置方式(pick-and-place method),一個接著一個地以階梯偏移、交錯、塔狀等方式進行部分堆疊設置;又該些第一晶片20數量大於或等於二,但本發明並不限制該些第一晶片的數量。 The aforementioned first chips 20 are partially stacked on the first surface 101 of the first redistribution layer 10 in sequence, and the first metal contacts 21 of each first chip 20 are exposed, and each of the first metal contacts The point 21 is electrically connected to the corresponding first contact 11 on the first surface 101 of the first redistribution layer 10 by a first metal wire 22. In the embodiment, the partial stacking method of the first wafers 20 is a pick-and-place method, which is partially stacked one after another in a step offset, stagger, tower, etc.; and The number of the first chips 20 is greater than or equal to two, but the invention does not limit the number of the first chips.

上述該些第二晶片30同樣依序部分疊設於該第一重佈線層10的第二表面102,且各該第二晶片30的第二金屬接點31係外露,各該第二金屬接點31係以第二金屬線32電性連接至該第一重佈線層10的第二表面102上所對應的該第二接點12。於實施例中,該些第二晶片30部分疊設方式係由拾取放置方式(pick-and-place method),一個接著一個地以階梯偏移、交錯、塔狀等方式進 行部分堆疊設置;又該些第二晶片30數量大於或等於二,但本發明並不限制該些第一晶片的數量。 The aforementioned second chips 30 are also partially stacked on the second surface 102 of the first redistribution layer 10 in sequence, and the second metal contacts 31 of each second chip 30 are exposed, and each of the second metal contacts The point 31 is electrically connected to the corresponding second contact point 12 on the second surface 102 of the first redistribution layer 10 by a second metal wire 32. In the embodiment, the partial stacking method of the second wafers 30 is a pick-and-place method, one after another in a step offset, staggered, tower, etc. The rows are partially stacked; and the number of the second wafers 30 is greater than or equal to two, but the invention does not limit the number of the first wafers.

上述複數金屬柱40的共同一端係分別電性連接至該第一重佈線層10之第二表面102上的第三接點13,且各該金屬柱40的高度係高於該些第二金屬線32的高度。 The common ends of the plurality of metal pillars 40 are respectively electrically connected to the third contacts 13 on the second surface 102 of the first redistribution layer 10, and the height of each metal pillar 40 is higher than the second metal The height of line 32.

上述第一封膠體51係形成在該第一重佈線層10上的第一表面101上,以包覆該些第一晶片20;而該第二封膠體52係形成在該第一重佈線層10的第二表面102上,以包覆該些第二晶片30及該些金屬柱40;其中該些金屬柱40共同另一端係外露於該第二封膠體52的一外表面501;較佳地,該些金屬柱40共同另一端與該第二封膠體52的外表面501齊平。 The first encapsulant 51 is formed on the first surface 101 on the first redistribution layer 10 to cover the first chips 20; and the second encapsulant 52 is formed on the first redistribution layer On the second surface 102 of 10, the second chips 30 and the metal pillars 40 are covered; the other end of the metal pillars 40 is exposed on an outer surface 501 of the second sealing compound 52; preferably Ground, the other end of the metal pillars 40 is flush with the outer surface 501 of the second sealing compound 52.

上述第二重佈線層60包含有二相對的一第三表面601及第四表面602,該第四表面602係形成於該第二封膠體52的外表面501,並與該些金屬柱40的外露一側電性連接,而該第三表面601係形成有複數外接墊603。於本實施例,該些外接墊603進一步分別形成有錫球61或凸塊。 The second redistribution layer 60 includes a third surface 601 and a fourth surface 602 opposed to each other. The fourth surface 602 is formed on the outer surface 501 of the second molding compound 52 and is connected to the metal pillars 40. The exposed side is electrically connected, and the third surface 601 is formed with a plurality of external pads 603. In this embodiment, the external pads 603 are further formed with solder balls 61 or bumps, respectively.

由上為本發明雙面堆疊式晶片封裝結構的結構說明,以下進一步說明完成該雙面堆疊式晶片封裝結構的各種製法。 Based on the above description of the structure of the double-sided stacked chip package structure of the present invention, various manufacturing methods for completing the double-sided stacked chip package structure are further described below.

首先請參閱圖2A至圖2H所示,本發明之一雙面堆疊式晶片封裝製法的第一實施例;於本實施例,此一封裝製程方法為重佈線層優先製程(RDL first process),其包含以下步驟(a)至步驟(k)。 First, please refer to FIG. 2A to FIG. 2H, a first embodiment of a double-sided stacked chip packaging method of the present invention; in this embodiment, the packaging process method is the RDL first process, which It includes the following steps (a) to (k).

如圖2A所示的步驟(a),首先準備一載板70,該載板70上形成有第一重佈線層10,故可依序於該載板70上形成有該些第二接點12及第三接點13、該介電本體14、該些內連接線15及該些第一接點11;在此步驟(a)中,該些第一接點11係外露朝上。 As shown in step (a) of FIG. 2A, first prepare a carrier 70 on which the first rewiring layer 10 is formed, so the second contacts can be formed on the carrier 70 in sequence 12 and the third contact 13, the dielectric body 14, the inner connecting wires 15, and the first contacts 11; in this step (a), the first contacts 11 are exposed upward.

如圖2B所示的步驟(b),將該些第一晶片20依序部分疊設於該第一重佈線層10的一第一表面101上,且各該第一晶片20的第一金屬接點21及該第一表面101的複數第一接點11均外露。於本實施例,該些第一晶片20部分疊設方式係由拾取放置方式(pick-and-place method),一個接著一個地以階梯偏移、交錯、塔狀等方式進行部分堆疊設置;又該些第一晶片20數量大於或等於四,但本發明並不限制該些第一晶片的數量。 As shown in step (b) of FIG. 2B, the first chips 20 are sequentially partially stacked on a first surface 101 of the first redistribution layer 10, and the first metal of each first chip 20 is The contact 21 and the plurality of first contacts 11 on the first surface 101 are all exposed. In this embodiment, the partial stacking of the first wafers 20 is a pick-and-place method, which is partially stacked one after another in a step offset, staggered, tower, etc.; and The number of the first chips 20 is greater than or equal to four, but the invention does not limit the number of the first chips.

如圖2C所示的步驟(c),將各該第一晶片20的該第一金屬接點21打線電性連接至對應的該第一接點11,故各該第一金屬接點21與對應的該第一接點11之間連接有該第一金屬線22。 As shown in step (c) of FIG. 2C, the first metal contacts 21 of each of the first chips 20 are electrically connected to the corresponding first contacts 11, so that each of the first metal contacts 21 and The first metal wire 22 is connected between the corresponding first contacts 11.

如圖2D所示的步驟(d),於該第一重佈線層10之該第一表面101上形成一第一封膠體51,以包覆該些第一晶片20及該些第一金屬線22。 As shown in step (d) of FIG. 2D, a first molding compound 51 is formed on the first surface 101 of the first redistribution layer 10 to cover the first chips 20 and the first metal wires twenty two.

於上述步驟(e)中,將圖2D的該載板70予以反轉後,令該載板70自該第一重佈線層10之一第二表面102脫離,如圖2E所示,該第二表面102的複數第二接點12及複數第三接點13即朝上外露。 In the above step (e), after the carrier board 70 of FIG. 2D is reversed, the carrier board 70 is separated from a second surface 102 of the first redistribution layer 10, as shown in FIG. 2E, The plurality of second contacts 12 and the plurality of third contacts 13 of the two surfaces 102 are exposed upward.

如圖2E所示步驟(f),再於該些外露的第三接點13上分別形成有一金屬柱40。 As shown in step (f) of FIG. 2E, a metal pillar 40 is formed on the exposed third contacts 13 respectively.

如圖2F所示的步驟(g),將複數第二晶片30依序部分疊設於該第一重佈線層10的該第二表面102上,且各該第二晶片30的第二金屬接點31及該第二表面102的複數第二接點12均朝上外露;於實施例中,該些第二晶片30部分疊設方式係由拾取放置方式(pick-and-place method),一個接著一個地以階梯偏移、交錯、塔狀等方式進行部分堆疊設置;又該些第二晶片30數量大於或等於四,但本發明並不限制該些第一晶片的數量。 As shown in step (g) of FIG. 2F, a plurality of second chips 30 are sequentially partially stacked on the second surface 102 of the first redistribution layer 10, and the second metal connection of each second chip 30 is The points 31 and the plurality of second contacts 12 on the second surface 102 are all exposed upward; in the embodiment, the partial stacking of the second wafers 30 is a pick-and-place method, one Then, they are partially stacked one by one in a step offset, staggered, tower-like manner, etc.; and the number of the second wafers 30 is greater than or equal to four, but the present invention does not limit the number of the first wafers.

如圖2F所示的步驟(h),將各該第二晶片30的第二金屬接點31打線電性連接至對應的該第二接點12,故各該第二金屬接點31與對應的該第二接 點12之間連接有該第二金屬線32。各該金屬柱40的高度係高於對應該第一重佈線層10之第二金屬線32的最高點高度。 In step (h) shown in FIG. 2F, the second metal contacts 31 of each second chip 30 are electrically connected to the corresponding second contacts 12, so that each of the second metal contacts 31 corresponds to The second connection The second metal wire 32 is connected between the points 12. The height of each metal pillar 40 is higher than the height of the highest point of the second metal line 32 corresponding to the first redistribution layer 10.

如圖2G所示的步驟(i),於該第一重佈線層10之該第二表面102上形成一第二封膠體52,以包覆該些第二晶片30、該些第二金屬線32及該些金屬柱40,各該金屬柱40的一端係外露於該第二封膠體52的一外表面501,即各該金屬柱40的一端係與該第二封膠體52的外表面501平齊。即,當該第二封膠體52包覆所有第二金屬線32的同時,該金屬柱40即外露於該第二封膠體52的外表面501。 In step (i) as shown in FIG. 2G, a second molding compound 52 is formed on the second surface 102 of the first redistribution layer 10 to cover the second chips 30 and the second metal wires 32 and the metal posts 40, one end of each metal post 40 is exposed on an outer surface 501 of the second sealing compound 52, that is, one end of each metal post 40 is connected to the outer surface 501 of the second sealing compound 52 Flush. That is, when the second molding compound 52 covers all the second metal wires 32, the metal pillar 40 is exposed on the outer surface 501 of the second molding compound 52.

如圖2H所示的步驟(j),於該第二封膠體52的外表面501上形成有該第二重佈線層60。 As shown in step (j) of FIG. 2H, the second rewiring layer 60 is formed on the outer surface 501 of the second molding compound 52.

如圖2H所示的步驟(k),再於該第二重佈線層60上的複數外接墊603上分別形成凸塊或錫球61。 In step (k) as shown in FIG. 2H, bumps or solder balls 61 are formed on the plurality of external pads 603 on the second rewiring layer 60, respectively.

由前揭第一實施例可知,該些金屬柱40可在第二封膠體52成形之前,直接於第三接點13上成形,再與接續成形的第二封膠體52齊平。 As can be seen from the first embodiment disclosed above, the metal pillars 40 can be directly formed on the third contact 13 before the second sealing compound 52 is formed, and then flush with the continuously formed second sealing compound 52.

再請參閱圖2-1A至圖2-1D所示,本發明之一雙面堆疊式晶片封裝製法的第二實施例;本實施例與第一實施例大致相同,惟圖2C及圖2D所示的製程步驟係由圖2-1A至圖2-1C取代,即如圖2-1A所示,將各該第一晶片20的該第一金屬接點21同樣打線電性連接至對應的該第一接點11,故各該第一金屬接點21與對應的該第一接點11之間連接有該第一金屬線22;惟各條第一金屬線高度高於堆疊後的該些第一晶片20的高度;之後於該第一重佈線層10之該第一表面101上形成一第一封膠體51,以包覆該些第一晶片20及該些第一金屬線22;接著。接著,再如圖2-1B所示,研磨該第一封膠體51至一定高度,使得各該第一金屬線保留連接於各第一晶片20的第一金屬接點21的第一直立線段221,以及連接對應第一接點11的第二金屬線段222;其中該第一及第二直立線段221、 222均垂直於其對應該些第一晶片20及該第一重佈線層10,且各該第一及第二直立線段221、222的自由端係外露於該第一封膠體51。 Please refer to FIGS. 2-1A to 2-1D, a second embodiment of a double-sided stacked chip packaging method of the present invention; this embodiment is roughly the same as the first embodiment, except that shown in FIGS. 2C and 2D The illustrated process steps are replaced by FIGS. 2-1A to 2-1C, that is, as shown in FIG. 2-1A, the first metal contacts 21 of each first chip 20 are also wired and electrically connected to the corresponding The first contact 11, therefore, the first metal wire 22 is connected between each first metal contact 21 and the corresponding first contact 11; however, the height of each first metal wire is higher than the stacked ones. The height of the first chip 20; then a first encapsulant 51 is formed on the first surface 101 of the first redistribution layer 10 to cover the first chips 20 and the first metal wires 22; then . Next, as shown in FIG. 2-1B, grind the first molding compound 51 to a certain height, so that each of the first metal wires remains connected to the first straight line segment 221 of the first metal contact 21 of each first chip 20 , And connected to the second metal line segment 222 corresponding to the first contact 11; wherein the first and second upright line segments 221, 222 is perpendicular to the first chips 20 and the first redistribution layer 10, and the free ends of the first and second vertical line segments 221 and 222 are exposed outside the first sealing compound 51.

再如圖2-1C所示,再於該第一封膠體51上形成一第三重佈線層62,透過該第三重佈線層62的內連接線621將該些第一直立線段221及該些第二直立線段222對應連接,於第三重佈線層62構成迴路,且各該第一晶片20的第一金屬接點21係透過第三重佈線層62電性連接至對應的第一接點11。接下來步驟即如第一實施例的圖2E至2G所示,最後即構成如圖2-1D所示的雙面堆疊式晶片封裝結構。 As shown in FIG. 2-1C, a third redistribution layer 62 is formed on the first encapsulant 51, and the first straight line segments 221 and the inner connecting lines 621 of the third redistribution layer 62 The second vertical line segments 222 are correspondingly connected to form a loop on the third redistribution layer 62, and the first metal contact 21 of each first chip 20 is electrically connected to the corresponding first connection through the third redistribution layer 62 Point 11. The next steps are as shown in FIGS. 2E to 2G of the first embodiment, and finally the double-sided stacked chip package structure shown in FIG. 2-1D is formed.

再請參閱圖3A至圖3D所示,係為本發明之一雙面堆疊式晶片封裝製法的第二實施例,其同樣包含有步驟(a)至步驟(h)的後數道步驟,惟步驟(a)至步驟(e)與第一實施例的步驟(a)至步驟(e),即如圖2A至圖2D所示,故不再贅述;以下進一步說明本實施例的步驟(f)至步驟(k)。 Please refer to FIG. 3A to FIG. 3D, which is a second embodiment of a double-sided stacked chip packaging manufacturing method of the present invention, which also includes steps (a) to (h) after the next steps, but Steps (a) to (e) and steps (a) to (e) of the first embodiment are shown in Figures 2A to 2D, so they will not be repeated here; the following further describes step (f) of this embodiment ) To step (k).

首先請參閱圖2D所示,當該載板70自該第一重佈線層10之一第二表面102脫離,該第二表面102的複數第二接點12及複數第三接點13即朝上外露,如圖3A所示的步驟(f),將複數第二晶片30依序部分疊設於該第一重佈線層10的該第二表面102上,且各該第二晶片30的第二金屬接點31及該第二表面102的複數第二接點12均朝上外露。 First, please refer to FIG. 2D. When the carrier 70 is separated from a second surface 102 of the first redistribution layer 10, the second surface 102 has a plurality of second contacts 12 and a plurality of third contacts 13 facing 3A, step (f) shown in FIG. 3A, a plurality of second chips 30 are sequentially partially stacked on the second surface 102 of the first redistribution layer 10, and each second chip 30 is The two metal contacts 31 and the plurality of second contacts 12 on the second surface 102 are exposed upward.

如圖3A所示的步驟(g),將各該第二晶片30的第二金屬接點31打線電性連接至對應的該第二接點12,故各該第二金屬接點31與對應的該第二接點12之間連接有該第二金屬線32。 As shown in step (g) of FIG. 3A, the second metal contacts 31 of each second chip 30 are electrically connected to the corresponding second contacts 12, so that each second metal contact 31 corresponds to The second metal wire 32 is connected between the second contacts 12.

如圖3A所示的步驟(h),於該第一重佈線層10之該第二表面102上形成一第二封膠體52,以包覆該些第二晶片30及該些第二金屬線32。 In step (h) as shown in FIG. 3A, a second molding compound 52 is formed on the second surface 102 of the first redistribution layer 10 to cover the second chips 30 and the second metal wires 32.

如圖3B所示的步驟(i),於該第二封膠體52對應各該第三接點13位置形成有貫穿孔521,再如圖3C所示,再於各該貫穿孔521內電鍍一金屬柱 40’,令各該金屬柱40’的一端係外露於該第二封膠體52的外表面501,即同樣與該第二封膠體52的外表面501齊平。 As shown in step (i) of FIG. 3B, through holes 521 are formed in the second sealing compound 52 corresponding to the positions of the third contacts 13, and then as shown in FIG. 3C, a through hole 521 is plated Metal pillar 40', so that one end of each metal post 40' is exposed on the outer surface 501 of the second sealant body 52, that is, is also flush with the outer surface 501 of the second sealant body 52.

如圖3D所示步驟(j),於該第二封膠體52的外表面501上形成有該第二重佈線層60。 As shown in step (j) in FIG. 3D, the second rewiring layer 60 is formed on the outer surface 501 of the second molding compound 52.

如圖3D所示的步驟(k),再於該第二重佈線層60的複數外接墊603上分別形成有凸塊或錫球61。 As shown in step (k) in FIG. 3D, bumps or solder balls 61 are formed on the plurality of external pads 603 of the second rewiring layer 60, respectively.

由前揭第二實施例可知,該些金屬柱40’可在第二封膠體52成形後,再對該第二封膠體52開設複數貫穿孔521並對準第三接點13,使第三接點13外露,再以如電鍍方式於該貫穿孔521內形成金屬柱40’。 As can be seen from the second embodiment disclosed above, after the second sealing compound body 52 is formed, a plurality of through holes 521 can be opened in the second sealing compound body 52 and aligned with the third contact 13 so that the third The contact 13 is exposed, and then a metal pillar 40' is formed in the through hole 521 by electroplating.

綜上所述,本發明雙面堆疊式晶片封裝結構係主要於該第一重佈線層的雙面分別封裝有二組晶片,並於其中一面直接形成有金屬柱,且該金屬柱係電性連接至該第二封膠體外表面之第二重佈線層;如此,本發明的雙面堆疊式晶片封裝結構不必將第一重佈線層的第一及第二接點集中在其中一顆晶片上,不會限制堆疊晶片數量;又前揭封裝製程方法的第一及第二實施例係採用重佈線優先製程,直接於載板上形成該第一重佈線層,不必使用預先製作成型的中介板,具有容易對位、高平坦度及更佳的表面條件;另外,也進一步揭露該些與該第一重佈線層電性連接的金屬柱的不同成形方法,不會提高製程難度且容易實施。 In summary, the double-sided stacked chip packaging structure of the present invention is mainly used to package two sets of chips on both sides of the first redistribution layer, and a metal pillar is directly formed on one of the sides, and the metal pillar is electrically conductive The second redistribution layer connected to the outer surface of the second encapsulant; in this way, the double-sided stacked chip package structure of the present invention does not need to concentrate the first and second contacts of the first redistribution layer on one of the chips , Does not limit the number of stacked chips; the first and second embodiments of the packaging process method adopt the re-wiring priority process to directly form the first re-wiring layer on the carrier board without using pre-made and molded interposers , Has easy alignment, high flatness and better surface conditions; in addition, it further discloses the different forming methods of the metal pillars electrically connected to the first rewiring layer, which will not increase the difficulty of the manufacturing process and is easy to implement.

以上所述僅是本發明的實施例而已,並非對本發明做任何形式上的限制,雖然本發明已以實施例揭露如上,然而並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明技術方案的範圍內,當可利用上述揭示的技術內容作出些許更動或修飾為等同變化的等效實施例,但凡是未脫離本發明技術方案的內容,依據本發明的技術實質對以上實施例所作的任何簡單修改、等同變化與修飾,均仍屬於本發明技術方案的範圍內。 The above are only the embodiments of the present invention, and do not limit the present invention in any form. Although the present invention has been disclosed in the above embodiments, it is not intended to limit the present invention. Anyone with ordinary knowledge in the relevant technical field, Without departing from the scope of the technical solution of the present invention, when the technical content disclosed above can be used to make slight changes or modification into equivalent embodiments with equivalent changes, but any content that does not deviate from the technical solution of the present invention is based on the technical essence of the present invention Any simple modifications, equivalent changes and modifications made to the above embodiments still fall within the scope of the technical solutions of the present invention.

10:第一重佈線層 10: The first heavy wiring layer

101:第一表面 101: first surface

102:第二表面 102: second surface

11:第一接點 11: The first contact

12:第二接點 12: second contact

13:第三接點 13: Third contact

14:介電本體 14: Dielectric body

15:內連接線 15: Internal connection line

20:第一晶片 20: The first chip

21:第一金屬接點 21: The first metal contact

22:第一金屬線 22: The first metal wire

30:第二晶片 30: second chip

31:第二金屬接點 31: The second metal contact

32:第二金屬線 32: The second metal wire

40:金屬柱 40: metal column

50:封膠體 50: sealant

501:外表面 501: outer surface

51:第一封膠體 51: The first sealant

52:第二封膠體 52: The second sealant

60:第二重佈線層 60: second wiring layer

601:第三表面 601: Third Surface

602:第四表面 602: Fourth Surface

603:外接墊 603: external pad

61:錫球 61: tin ball

Claims (10)

一種雙面堆疊式晶片封裝結構,包括: 一第一重佈線層,具有一第一表面及一第二表面,該第一表面上形成有複數第一接點,而該第二表面上形成有複數第二接點及複數第三接點; 複數第一晶片,係部分堆疊在該第一重佈線層的第一表面,各該第一晶片具有外露的第一金屬接點,各該第一金屬接點係以第一金屬線電性連接至該第一表面所對應的該第一接點; 複數第二晶片,係部分堆疊在該第一重佈線層的第二表面,各該第二晶片具有外露的第二金屬接點,各該第二金屬接點係以第二金屬線電性連接至該第二表面所對應的該第二接點; 複數金屬柱,其共同一端係分別電性連接至該第一重佈線層之第二表面的第三接點,且各該金屬柱的高度係高於該些第二金屬線的高度; 一第一封膠體,係形成於該第一重佈線層的該第一表面上,以包覆該第一晶片組及該些第一金屬線; 一第二封膠體,係形成於該第一重佈線層的該第二表面上,以包覆該第二晶片組、該些第二金屬線及該些金屬柱;其中該些金屬柱共同另一端係外露於該第二封膠體的一外表面;以及 一第二重佈線層,其一第三表面係形成於該第二封膠體的外表面,並與該些金屬柱外露一側電性連接,而一第四表面係形成有複數外接墊。 A double-sided stacked chip packaging structure includes: A first redistribution layer has a first surface and a second surface. A plurality of first contacts are formed on the first surface, and a plurality of second contacts and a plurality of third contacts are formed on the second surface ; A plurality of first chips are partially stacked on the first surface of the first redistribution layer, each of the first chips has exposed first metal contacts, and each of the first metal contacts is electrically connected by a first metal wire To the first contact corresponding to the first surface; A plurality of second chips are partially stacked on the second surface of the first redistribution layer, each of the second chips has exposed second metal contacts, and each of the second metal contacts is electrically connected by a second metal wire To the second contact corresponding to the second surface; A plurality of metal pillars, the common ends of which are respectively electrically connected to the third contact on the second surface of the first redistribution layer, and the height of each metal pillar is higher than the height of the second metal wires; A first molding compound formed on the first surface of the first redistribution layer to cover the first chip set and the first metal wires; A second molding compound is formed on the second surface of the first redistribution layer to cover the second chip set, the second metal lines, and the metal pillars; wherein the metal pillars share another One end is exposed on an outer surface of the second sealing compound; and A second redistribution layer has a third surface formed on the outer surface of the second encapsulant body and electrically connected to the exposed side of the metal pillars, and a fourth surface is formed with a plurality of external pads. 如請求項1所述之雙面堆疊式晶片封裝結構,該第一線路重佈層係於一介電本體內形有複數內連接線,以與該些第一接點及該些第二接點電性連接。According to the double-sided stacked chip package structure of claim 1, the first circuit redistribution layer is formed with a plurality of internal connection lines in a dielectric body to connect with the first contacts and the second contacts Point electrical connection. 如請求項1或2所述之雙面堆疊式晶片封裝結構,該些外接墊係分別形成有凸塊或錫球。In the double-sided stacked chip package structure described in claim 1 or 2, the external pads are formed with bumps or solder balls, respectively. 一種雙面堆疊式晶片封裝結構的製法,包括以下步驟: (a) 準備一載板,其上形成有一第一重佈線層; (b) 將複數第一晶片依序部分疊設於該第一重佈線層的一第一表面上,且各該第一晶片的第一金屬接點及該第一表面的複數第一接點外露; (c) 將各該第一金屬接點打線電性連接至對應的該第一接點,使各該第一金屬接點與對應的該第一接點之間連接有一第一金屬線; (d) 於該第一重佈線層之該第一表面上形成一第一封膠體,以包覆該些第一晶片及該些第一金屬線; (e) 反轉該載板後令該載板自該第一重佈線層之一第二表面脫離,令該第二表面的複數第二接點及複數第三接點外露; (f) 於外露的該些第三接點上分別形成有一金屬柱; (g) 將複數第二晶片依序部分疊設於該第一重佈線層的該第二表面上,且各該第二晶片的第二金屬接點及該第二表面的複數第二接點外露; (h) 將各該第二金屬接點打線電性連接至對應的該第二接點; (i) 於該第一重佈線層之該第二表面上形成一第二封膠體,以包覆該些第二晶片、該些第二金屬線及該些金屬柱,各該金屬柱的一端係外露於該第二封膠體的一外表面; (j) 於該封膠體的外表面上形成有一第二重佈線層;以及 (k) 於該第二重佈線層上形成有複數外接墊。 A method for manufacturing a double-sided stacked chip packaging structure includes the following steps: (a) Prepare a carrier board on which a first redistribution layer is formed; (b) A plurality of first chips are sequentially partially stacked on a first surface of the first redistribution layer, and the first metal contacts of each first chip and the plurality of first contacts on the first surface Exposed (c) Wire each of the first metal contacts to the corresponding first contact, so that a first metal wire is connected between each of the first metal contacts and the corresponding first contact; (d) forming a first molding compound on the first surface of the first redistribution layer to cover the first chips and the first metal wires; (e) After reversing the carrier board, the carrier board is separated from a second surface of the first redistribution layer, so that the plurality of second contacts and the plurality of third contacts of the second surface are exposed; (f) A metal pillar is respectively formed on the exposed third contacts; (g) A plurality of second chips are sequentially partially stacked on the second surface of the first redistribution layer, and the second metal contacts of each second chip and the plurality of second contacts on the second surface Exposed (h) Wire each of the second metal contacts to the corresponding second contacts; (i) A second molding compound is formed on the second surface of the first redistribution layer to cover the second chips, the second metal wires and the metal pillars, one end of each metal pillar Is exposed on an outer surface of the second sealing compound; (j) A second rewiring layer is formed on the outer surface of the molding compound; and (k) A plurality of external pads are formed on the second rewiring layer. 如請求項4所述之雙面堆疊式晶片封裝結構的製法,其中: 上述步驟(c)的該些第一金屬線高度係高於堆疊後的該些第一晶片的高度;以及 上述步驟(d)於形成該第一封膠體後,進一步包含有以下步驟: (d1) 研磨該第一封膠體至一定高度,使得各該第一金屬線保留連接於各第一晶片的第一金屬接點的第一直立線段,以及連接對應第一接點的第二金屬線段;其中該些第一直立線垂直於對應的該第一晶片,而該些第二第二金屬線段係垂直於該第一重佈線層,且各該第一及第二直立線段的自由端係外露於該第一封膠體;以及 (d2) 於該第一封膠體上形成一第三重佈線層,透過該第三重佈線層的內連接線將該些第一直立線段及該些第二直立線段對應連接。 The manufacturing method of the double-sided stacked chip package structure as described in claim 4, wherein: The height of the first metal wires in the above step (c) is higher than the height of the first chips after stacking; and The above step (d) further includes the following steps after forming the first sealing compound: (d1) Grind the first sealing compound to a certain height so that each of the first metal wires retains the first straight line segment connected to the first metal contact of each first chip, and connects the second metal corresponding to the first contact Line segments; wherein the first straight lines are perpendicular to the corresponding first chip, and the second second metal line segments are perpendicular to the first redistribution layer, and the free ends of the first and second upright line segments Is exposed to the first sealant; and (d2) A third redistribution layer is formed on the first encapsulant, and the first vertical line segments and the second vertical line segments are correspondingly connected through the inner connecting lines of the third redistribution layer. 如請求項5所述之雙面堆疊式晶片封裝結構的製法,上述步驟(k)中,該些外接墊係進一步分別形成有凸塊或錫球。According to the manufacturing method of the double-sided stacked chip package structure described in claim 5, in the above step (k), the external pads are further formed with bumps or solder balls, respectively. 如請求項5或6所述之雙面堆疊式晶片封裝結構的製法,上述步驟(a)中,該第一重佈線層係於該載板上依序形成有該些第二接點、第三接點、一介電本體、複數內連接線及該些第一接點。According to the manufacturing method of the double-sided stacked chip package structure of claim 5 or 6, in the above step (a), the first rewiring layer is formed on the carrier board with the second contacts and the first Three contacts, a dielectric body, a plurality of internal connecting lines and the first contacts. 一種雙面堆疊式晶片封裝結構的製法,包括以下步驟: (a) 準備一載板,其上形成有一第一重佈線層; (b) 將複數第一晶片依序部分疊設於該第一重佈線層的一第一表面上,且各該第一晶片的第一金屬接點及該第一表面的複數第一接點外露; (c) 將各該第一金屬接點打線電性連接至對應的該第一接點; (d) 於該第一重佈線層之該第一表面上形成一第一封膠體,以包覆該些第一晶片及該些第一金屬線; (e) 反轉該載板後令該載板自該第一重佈線層之一第二表面脫離,令該第二表面的複數第二接點及複數第三接點外露; (f) 將複數第二晶片依序部分疊設於該第一重佈線層的該第二表面上,且各該第二晶片的第二金屬接點及該第二表面的複數第二接點外露; (g) 將各該第二金屬接點打線電性連接至對應的該第二接點; (h) 於該第一重佈線層之該第二表面上形成一第二封膠體,以包覆該些第二晶片及該些第二金屬線; (i) 於該第二封膠體對應各該第三接點位置形成有貫穿孔,並於各該貫穿孔內電鍍一金屬柱,令各該金屬柱的一端係外露於該第二封膠體的一外表面; (j) 於該封膠體的外表面上形成有一第二重佈線層;以及 (k) 於該第二重佈線層上形成有複數外接墊。 A method for manufacturing a double-sided stacked chip packaging structure includes the following steps: (a) Prepare a carrier board on which a first redistribution layer is formed; (b) A plurality of first chips are sequentially partially stacked on a first surface of the first redistribution layer, and the first metal contacts of each first chip and the plurality of first contacts on the first surface Exposed (c) Wire each of the first metal contacts to the corresponding first contacts; (d) forming a first molding compound on the first surface of the first redistribution layer to cover the first chips and the first metal wires; (e) After reversing the carrier board, the carrier board is separated from a second surface of the first redistribution layer, so that the plurality of second contacts and the plurality of third contacts of the second surface are exposed; (f) A plurality of second chips are sequentially partially stacked on the second surface of the first redistribution layer, and the second metal contacts of each second chip and the plurality of second contacts on the second surface Exposed (g) Wire each of the second metal contacts to the corresponding second contacts; (h) forming a second molding compound on the second surface of the first redistribution layer to cover the second chips and the second metal wires; (i) A through hole is formed in the second sealing compound body corresponding to each of the third contacts, and a metal pillar is plated in each through hole, so that one end of each metal pillar is exposed to the second sealing body An outer surface; (j) A second rewiring layer is formed on the outer surface of the molding compound; and (k) A plurality of external pads are formed on the second rewiring layer. 如請求項8所述之雙面堆疊式晶片封裝結構的製法,上述步驟(k)中,該些外接墊係進一步分別形成有凸塊或錫球。According to the manufacturing method of the double-sided stacked chip package structure described in claim 8, in the above step (k), the external pads are further formed with bumps or solder balls, respectively. 如請求項8或9所述之雙面堆疊式晶片封裝結構的製法,上述步驟(a)中,該第一重佈線層係於該載板上依序形成有該些第二接點、第三接點、一介電本體、複數內連接線及該些第一接點。According to the method for manufacturing a double-sided stacked chip package structure according to claim 8 or 9, in the above step (a), the first rewiring layer is formed on the carrier board with the second contacts and the first Three contacts, a dielectric body, a plurality of internal connecting lines and the first contacts.
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