TWI694126B - Resin composition, adhesive film and semiconductor device - Google Patents

Resin composition, adhesive film and semiconductor device Download PDF

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TWI694126B
TWI694126B TW104110416A TW104110416A TWI694126B TW I694126 B TWI694126 B TW I694126B TW 104110416 A TW104110416 A TW 104110416A TW 104110416 A TW104110416 A TW 104110416A TW I694126 B TWI694126 B TW I694126B
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resin composition
component
thermal conductivity
adhesive film
mass
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TW201546222A (en
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高杉寛史
黒川津与志
戸島順
青木一生
寺木慎
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日商納美仕有限公司
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    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G59/00Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
    • C08G59/18Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
    • C08G59/20Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the epoxy compounds used
    • C08G59/32Epoxy compounds containing three or more epoxy groups
    • C08G59/3227Compounds containing acyclic nitrogen atoms
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    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K3/00Use of inorganic substances as compounding ingredients
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K3/00Use of inorganic substances as compounding ingredients
    • C08K3/01Use of inorganic substances as compounding ingredients characterized by their specific function
    • C08K3/013Fillers, pigments or reinforcing additives
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L101/00Compositions of unspecified macromolecular compounds
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L63/00Compositions of epoxy resins; Compositions of derivatives of epoxy resins
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    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L71/00Compositions of polyethers obtained by reactions forming an ether link in the main chain; Compositions of derivatives of such polymers
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    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J7/00Adhesives in the form of films or foils
    • C09J7/30Adhesives in the form of films or foils characterised by the adhesive composition
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/34Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
    • H01L23/36Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
    • H01L23/373Cooling facilitated by selection of materials for the device or materials for thermal expansion adaptation, e.g. carbon
    • H01L23/3737Organic materials with or without a thermoconductive filler
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G2650/00Macromolecular compounds obtained by reactions forming an ether link in the main chain of the macromolecule
    • C08G2650/28Macromolecular compounds obtained by reactions forming an ether link in the main chain of the macromolecule characterised by the polymer type
    • C08G2650/56Polyhydroxyethers, e.g. phenoxy resins
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    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K2201/00Specific properties of additives
    • C08K2201/001Conductive additives
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2203/00Applications of adhesives in processes or use of adhesives in the form of films or foils
    • C09J2203/326Applications of adhesives in processes or use of adhesives in the form of films or foils for bonding electronic components such as wafers, chips or semiconductors

Abstract

The present invention provides a resin composition excellent in thermal conductivity, adhesiveness and film formation properties, in particular, a resin composition with excellent thermal conductivity after curing.
The resin composition of this invention comprises: (A) aminophenol epoxy resin, (B) at least one selected from the group consisting of phenoxy resin and thermal plastic elastomer, and (C) high-thermal-conductive inorganic filler, and with respect to 1 part by mass of the (A) component, (B) component is 0.5 to 5 parts by mass.

Description

樹脂組成物、接著膜及半導體裝置 Resin composition, adhesive film and semiconductor device

本發明係有關一種樹脂組成物、接著薄膜、以及半導體裝置,尤其是,可形成散熱性優良,可靠度高的半導體裝置之樹脂組成物,以及接著薄膜,以及此樹脂組成物,藉由接著薄膜所製造的半導體裝置。 The present invention relates to a resin composition, an adhesive film, and a semiconductor device, in particular, a resin composition capable of forming a semiconductor device with excellent heat dissipation and high reliability, and an adhesive film, and the resin composition by the adhesive film The manufactured semiconductor device.

近年,隨著模件(Module)或電子零組件之高機能化、高密度化,由模件或電子零組件等的發熱體所發生之熱量會變大。來自此等發熱體之熱會傳導至基板等,並被散熱。為了有效率地進行此熱的傳導,在發熱體與基板之間的接著劑,係使用高導熱率的物質。又,從操作性之良好性而言,可使用高導熱的接著薄膜來取代接著劑。 In recent years, as modules and electronic components have become more functional and denser, heat generated by heating elements such as modules or electronic components will increase. The heat from these heating elements is conducted to the substrate and the like, and is dissipated. In order to efficiently conduct this heat, the adhesive between the heating element and the substrate is made of a material with high thermal conductivity. In addition, from the viewpoint of good operability, an adhesive film with high thermal conductivity can be used instead of the adhesive.

在此,接著薄膜的導熱不佳時,在已組裝模件或電子零組件之半導體裝置中會累積熱量,並招致半導體裝置之故障之問題。因此,各公司正在進行開發高導熱率的薄膜。 Here, when the thermal conductivity of the film is not good, heat will accumulate in the semiconductor device of the assembled module or electronic component, and it will cause the problem of failure of the semiconductor device. Therefore, companies are developing thin films with high thermal conductivity.

在上述的接著薄膜中,不僅要求導熱性, 同時也要求有絶緣性、耐熱性以及接續可靠度(接著強度)。在接著薄膜中,若大量使用高導熱性之填充物,雖可以提高相關的導熱性,但隨著填充物填充量的増加,由於接著薄膜中的樹脂成分量會相對地減少,故有難以得到期望之接著強度的問題。又,隨著此填充物填充量的増加,接著強度降低的問題,並不限於高導熱的接著薄膜,例如,從低熱膨脹率化的觀點而言,在組成物中填充填充物之時也會產生的問題。 In the above adhesive film, not only thermal conductivity is required, It also requires insulation, heat resistance, and connection reliability (adhesion strength). In the adhesive film, if a large amount of filler with high thermal conductivity is used, although the related thermal conductivity can be improved, as the filling amount of the filler increases, the amount of the resin component in the adhesive film will be relatively reduced, so it is difficult to obtain The question of strength follows expectations. In addition, with the increase in the filling amount of the filler, the problem of lowering the strength is not limited to the adhesive film with high thermal conductivity. For example, from the viewpoint of lowering the thermal expansion rate, when the filler is filled in the composition, The problem.

作為目標在高導熱性之環氧樹脂者,在專利文獻1已揭示一種環氧樹脂,其係適用於薄膜成形、塗布等的製程中具有充分的製膜性、延伸性,導熱性、耐熱性、可撓性等各物性也都優良的環氧樹脂,具有聯苯基骨架的環氧樹脂;在專利文獻2已揭示一種環氧樹脂,其係不管是否有導入液晶原基(mesogenic group),而容易製造,且可得到對有機溶劑的溶解性優良、強韌性、導熱率性優良之硬化物。 As an epoxy resin with high thermal conductivity, Patent Document 1 has disclosed an epoxy resin which is suitable for processes such as film forming and coating, and has sufficient film-forming properties, extensibility, thermal conductivity, and heat resistance. , Flexible and other physical properties are also excellent epoxy resins, epoxy resins with biphenyl skeleton; Patent Document 2 has disclosed an epoxy resin, whether it is introduced into the liquid crystal original group (mesogenic group), It is easy to manufacture and can obtain a hardened product with excellent solubility in organic solvents, strong toughness, and excellent thermal conductivity.

[先前技術文獻] [Prior Technical Literature] (專利文獻) (Patent Literature)

專利文獻1:日本特開2012-107215號公報 Patent Document 1: Japanese Patent Laid-Open No. 2012-107215

專利文獻2:日本特開2010-001427號公報 Patent Document 2: Japanese Patent Application Publication No. 2010-001427

然而,要求具有上述環氧樹脂的導熱率以 上之導熱率的環氧樹脂。本發明係有鑑於上述之事實而成者,本發明的目的在於提供具有優良的導熱性、接著性、薄膜成形性之樹脂組成物,尤其是,在硬化後導熱性優良的樹脂組成物。 However, it is required to have the thermal conductivity of the above epoxy resin to Epoxy resin with thermal conductivity. The present invention was made in view of the above facts, and an object of the present invention is to provide a resin composition having excellent thermal conductivity, adhesiveness, and film formability, especially a resin composition having excellent thermal conductivity after curing.

本發明係有關藉由具有以下的結構而解決上述問題之樹脂組成物、接著薄膜、半導體裝置。 The present invention relates to a resin composition, an adhesive film, and a semiconductor device that solve the above problems by having the following structure.

[1]一種樹脂組成物,係含有(A)胺基酚型環氧樹脂,(B)選自苯氧樹脂以及熱塑性彈性體所組成群組中之至少1種,以及(C)高導熱性無機填充物,且相對於(A)成分1質量份,(B)成分為0.5至5質量份。 [1] A resin composition containing (A) an aminophenol-type epoxy resin, (B) at least one selected from the group consisting of phenoxy resins and thermoplastic elastomers, and (C) high thermal conductivity An inorganic filler, and the component (B) is 0.5 to 5 parts by mass relative to 1 part by mass of the component (A).

[2]如上述[1]記載的樹脂組成物,其中,(A)成分為以下述化學式(1)表示。 [2] The resin composition according to the above [1], wherein the component (A) is represented by the following chemical formula (1).

Figure 104110416-A0305-02-0005-1
Figure 104110416-A0305-02-0005-1

[3]如上述[1]或[2]記載的樹脂組成物,其中,(B)成分的玻璃轉移温度為未達50℃。 [3] The resin composition according to the above [1] or [2], wherein the glass transition temperature of the component (B) is less than 50°C.

[4]如上述[1]至[3]中任一項記載之樹脂組成物,其中,(C)成分為選自MgO、Al2O3、AlN、BN、鑽石填充物、ZnO、以及SiC所組成群組中之至少1種。 [4] The resin composition according to any one of the above [1] to [3], wherein the (C) component is selected from MgO, Al 2 O 3 , AlN, BN, diamond filler, ZnO, and SiC At least one of the groups formed.

[5]一種接著薄膜,係由上述[1]至[4]中任一項記載的樹脂組成物所形成者。 [5] An adhesive film formed from the resin composition according to any one of the above [1] to [4].

[6]一種半導體裝置,係使用上述[5]記載的接著薄膜之硬化體者。 [6] A semiconductor device using the cured body of the adhesive film described in [5] above.

若依據本發明[1],可提供導熱性、接著性、薄膜成形性優良的樹脂組成物,尤其是,在硬化後導熱性優良的樹脂組成物。 According to the present invention [1], it is possible to provide a resin composition excellent in thermal conductivity, adhesiveness, and film formability, in particular, a resin composition excellent in thermal conductivity after curing.

若依據本發明[5],可提供導熱性、接著性優良,尤其是,在硬化後導熱性優良的接著薄膜。若依據本發明[6],藉由導熱性、接著性、導熱性優良的接著薄膜之硬化體,可提供可靠度高的半導體裝置。 According to the present invention [5], it is possible to provide an adhesive film having excellent thermal conductivity and adhesiveness, especially, excellent thermal conductivity after hardening. According to the present invention [6], a highly reliable semiconductor device can be provided by a cured body of an adhesive film having excellent thermal conductivity, adhesion, and thermal conductivity.

第1圖(A)至(E)表示用以說明刮取塗布方法之模式圖。 Figures 1 (A) to (E) show schematic diagrams for explaining the method of blade coating.

本發明的樹脂組成物,係含有(A)胺基酚型環氧樹脂、(B)選自苯氧樹脂以及熱塑性彈性體所組成群組中之至少1種,以及(C)高導熱性無機填充物,且相對於(A)成分1質量份,(B)成分為0.5至5質量份。在此,(C)高導熱性無機充物係指5W/m‧K以上的無機填充物。 The resin composition of the present invention contains (A) an aminophenol-type epoxy resin, (B) at least one selected from the group consisting of phenoxy resins and thermoplastic elastomers, and (C) high thermal conductivity inorganic The filler is 0.5 to 5 parts by mass relative to 1 part by mass of (A) component. Here, (C) inorganic filler with high thermal conductivity means an inorganic filler of 5 W/m‧K or more.

(A)成分是在硬化後的樹脂組成物中,可賦予高導熱率性。本發明中,(A)成分的胺基酚型環氧樹脂 是指以公知的方法使各種的胺基酚類環氧化者。作為胺基酚類的例子者,可以列舉:2-胺基酚、3-胺基酚、4-胺基酚、2-胺基-m-甲酚、2-胺基-p-甲酚、3-胺基-o-甲酚、4-胺基-m-甲酚、6-胺基-m-甲酚等的胺基酚、胺基甲酚類等,但不限定於此等。 (A) The component is in the resin composition after hardening, and can impart high thermal conductivity. In the present invention, the aminophenol epoxy resin of component (A) Refers to those who have epoxidized various aminophenols by known methods. Examples of aminophenols include 2-aminophenol, 3-aminophenol, 4-aminophenol, 2-amino-m-cresol, 2-amino-p-cresol, Aminophenols such as 3-amino-o-cresol, 4-amino-m-cresol, 6-amino-m-cresol, and aminocresols are not limited thereto.

(A)成分是以下述化學式(1):

Figure 104110416-A0305-02-0007-2
(A) The component is the following chemical formula (1):
Figure 104110416-A0305-02-0007-2

為使硬化後的樹脂組成物為高導熱性,故以胺基酚型環氧樹脂為佳。作為(A)成分的市售品者,可以列舉三菱化學製胺基酚型環氧樹脂(品名:630)。(A)成分可以單獨使用,也可以合併使用2種以上。 In order to make the cured resin composition highly thermally conductive, an aminophenol-type epoxy resin is preferred. Examples of the commercially available product of component (A) include aminophenol-type epoxy resins (product name: 630) manufactured by Mitsubishi Chemical Corporation. (A) The component may be used alone, or two or more kinds may be used in combination.

(B)成分係可對樹脂組成物賦予薄膜成形性。(B)成分的苯氧樹脂並無特別限定,可以列舉具有選自雙酚A骨架、雙酚F骨架、雙酚S骨架、雙酚苯乙酮骨架、酚醛骨架、聯苯基骨架、芴骨架、二環戊二烯骨架、降冰片烯骨架、萘骨架、蒽骨架、金剛烷骨架、萜骨架、三甲基環己烷骨架中1種以上的骨架者。作為(B)成分的苯氧樹脂之市售品者,可以列舉三菱化學製可撓性苯氧樹脂(品名:YL7178,玻璃轉移温度:15℃)。 (B) The component system can impart film formability to the resin composition. (B) The phenoxy resin of the component is not particularly limited, and examples thereof include bisphenol A skeleton, bisphenol F skeleton, bisphenol S skeleton, bisphenol acetophenone skeleton, phenolic skeleton, biphenyl skeleton, and fluorene skeleton. , Dicyclopentadiene skeleton, norbornene skeleton, naphthalene skeleton, anthracene skeleton, adamantane skeleton, terpene skeleton, trimethylcyclohexane skeleton, one or more skeletons. As a commercially available product of the phenoxy resin of the component (B), a flexible phenoxy resin (product name: YL7178, glass transition temperature: 15°C) made by Mitsubishi Chemicals can be cited.

作為(B)成分的熱塑性彈性體者,可以列舉 聚胺酯橡膠、丙烯酸橡膠、聚矽氧橡膠、乙烯基烷基醚橡膠、聚乙烯醇橡膠、聚乙烯基吡咯烷酮橡膠、聚丙烯醯胺橡膠、纖維素橡膠、天然橡膠、丁二烯橡膠,氯丁二烯橡膠、苯乙烯/丁二烯橡膠(SBR)、丙烯腈/丁二烯橡膠(NBR)、苯乙烯/乙烯/丁二烯/苯乙烯橡膠、苯乙烯/異戊二烯/苯乙烯橡膠、苯乙烯/異丁烯橡膠、異戊二烯橡膠、聚異丁烯橡膠、丁基橡膠、含(甲基)丙烯酸烷基酯之單體的聚合所得到的合成丙烯酸橡膠、苯乙烯-丁二烯塊狀共聚物(SBS)、苯乙烯-乙烯/丁烯-苯乙烯塊狀共聚物(SEBS)、苯乙烯-異戊二烯-苯乙烯塊狀共聚物(SIS)、聚丁二烯(PB)、苯乙烯-(乙烯-乙烯/丙烯)-苯乙烯塊狀共聚物(SEEPS)、乙烯-不飽和羧酸共聚物(例如,乙烯-丙烯酸共聚物、乙烯-甲基丙烯酸共聚物等)、乙烯-不飽和羧酸酯共聚物(例如,乙烯-乙基丙烯酸酯共聚物、乙烯-乙基甲基丙烯酸酯共聚物等),以及選自此等的羧酸酐改質物(例如馬來酸酐改質物)所組成群組中之至少1種。作為(B)成分的熱塑性彈性體的市售品者,可以列舉:Nagasechemtex公司製丙烯酸酯共聚物(品名:SG790,玻璃轉移温度:-32℃)。(B)成分是可以單獨使用,也可以合併使用2種以上。 Examples of the thermoplastic elastomer as component (B) include Polyurethane rubber, acrylic rubber, polysiloxane rubber, vinyl alkyl ether rubber, polyvinyl alcohol rubber, polyvinylpyrrolidone rubber, polypropylene amide rubber, cellulose rubber, natural rubber, butadiene rubber, chloroprene Ene rubber, styrene/butadiene rubber (SBR), acrylonitrile/butadiene rubber (NBR), styrene/ethylene/butadiene/styrene rubber, styrene/isoprene/styrene rubber, Synthetic acrylic rubber obtained by polymerization of styrene/isobutylene rubber, isoprene rubber, polyisobutylene rubber, butyl rubber, alkyl (meth)acrylate-containing monomer, styrene-butadiene block copolymerization (SBS), styrene-ethylene/butene-styrene block copolymer (SEBS), styrene-isoprene-styrene block copolymer (SIS), polybutadiene (PB), benzene Ethylene-(ethylene-ethylene/propylene)-styrene block copolymer (SEEPS), ethylene-unsaturated carboxylic acid copolymer (for example, ethylene-acrylic acid copolymer, ethylene-methacrylic acid copolymer, etc.), ethylene-not Saturated carboxylic acid ester copolymers (for example, ethylene-ethyl acrylate copolymers, ethylene-ethyl methacrylate copolymers, etc.), and carboxylic anhydride modified products (such as maleic anhydride modified products) selected from these Form at least one of the groups. As a commercially available product of the thermoplastic elastomer of component (B), an acrylate copolymer (product name: SG790, glass transition temperature: -32°C) manufactured by Nagasechemtex Corporation can be cited. (B) The component may be used alone, or two or more kinds may be used in combination.

又,(B)成分係由於具有樹脂組成物的薄膜成形性、硬化後的樹脂組成物中適度的柔軟性、玻璃轉移溫度(Tg)未達50℃,故較佳。又,從樹脂組成物的薄膜成形性、接著性的觀點而言,(B)成分是以玻璃轉移温度 (Tg)為未達50℃的苯氧樹脂為更佳。 The component (B) system is preferred because it has film formability of the resin composition, moderate flexibility in the resin composition after curing, and a glass transition temperature (Tg) of less than 50°C. In addition, from the viewpoint of film formability and adhesiveness of the resin composition, the component (B) is the glass transition temperature The phenoxy resin whose (Tg) is less than 50°C is more preferable.

作為(C)成分,若導熱率為5W/m‧K以上,從保持絶緣性之觀點而言,可以使用一般的無機填充物。從導熱率、絶緣性以及熱膨脹係數的觀點而言,若為選自MgO、Al2O3、AlN、BN、鑽石填充物、ZnO、以及SiC所組成群組中之至少1種以上的無機填充物,以(C)成分為較佳。又,ZnO以及SiC中,可依需要而進行絶緣處理。作為各材料的導熱率測定結果的一個例子(單位是W/m‧K),MgO是37,Al2O3是30,AlN是200,BN是30,鑽石是2000,ZnO是54,SiC是90。作為(C)成分的市售品,可以列舉堺化學工業製氧化鎂粉末(品名:SMO-5、SMO-1、SMO-02、SMO-2)、昭和電工製氧化鋁(Al2O3)粉末(品名:CBA09S)、電氣化學工業製氧化鋁(Al2O3)粉末(品名:DAW-03、ASFP-20)。 As the component (C), if the thermal conductivity is 5 W/m‧K or more, from the viewpoint of maintaining insulation, a general inorganic filler can be used. From the viewpoint of thermal conductivity, insulation and thermal expansion coefficient, if it is at least one inorganic filler selected from the group consisting of MgO, Al 2 O 3 , AlN, BN, diamond filler, ZnO, and SiC It is preferable to use the component (C). In addition, in ZnO and SiC, insulation treatment may be performed as necessary. As an example of the measurement results of the thermal conductivity of each material (unit is W/m‧K), MgO is 37, Al 2 O 3 is 30, AlN is 200, BN is 30, diamond is 2000, ZnO is 54 and SiC is 90. Examples of commercially available products of component (C) include magnesium oxide powder (product names: SMO-5, SMO-1, SMO-02, and SMO-2) manufactured by Sakai Chemical Industries, and alumina (Al 2 O 3 ) manufactured by Showa Denko. Powder (product name: CBA09S), alumina (Al 2 O 3 ) powder (product name: DAW-03, ASFP-20) manufactured by the Electric Chemical Industry.

(C)成分的平均粒徑(不是粒狀時,指其平均最大徑),雖無特別限定,但就使(C)成分均勻地分散在樹脂組成物中而言,以0.05至50μm為佳。未達0.05μm時,樹脂組成物的黏度會上昇,成形性有變差之虞。超過50μm時,在樹脂組成物中,恐(C)成分難以均勻地分散。在此,(C)成分的平均粒徑係藉由動態光散射式奈米軌跡粒度分析計來測定。(C)成分可以單獨使用,也可以將2種以上合併使用。 (C) The average particle diameter of the component (when it is not granular, refers to the average maximum diameter), although not particularly limited, it is preferably 0.05 to 50 μm in terms of uniformly dispersing the (C) component in the resin composition . If it is less than 0.05 μm, the viscosity of the resin composition will increase, and the moldability may deteriorate. If it exceeds 50 μm, it may be difficult for the (C) component to be uniformly dispersed in the resin composition. Here, the average particle diameter of the component (C) is measured by a dynamic light scattering nano-track particle size analyzer. (C) The component may be used alone, or two or more kinds may be used in combination.

(A)成分係相對於樹脂組成物(除去溶劑):100質量份,以1.5至15質量份為佳,以2至10質 量份為更佳。 (A) Component system relative to resin composition (without solvent): 100 parts by mass, preferably 1.5 to 15 parts by mass, and 2 to 10 parts by mass The portion is better.

(B)成分係從樹脂組成物的薄膜成形性、硬化後的樹脂組成物的導熱率、耐熱性的觀點而言,相對於(A)成分1質量份,為0.5至5質量份。(B)成分係相對於(A)成分1質量份,在未滿0.5質量份時,無法使樹脂組成物薄膜成形,超過5質量份時,硬化後的樹脂組成物之導熱率會變低。又,(A)與(B)的合計,從樹脂組成物的薄膜成形性、接著性、硬化後的樹脂組成物的導熱率之觀點而言,相對於樹脂組成物(除去溶劑):100質量份,以4至20質量份為較佳。 (B) The component system is 0.5 to 5 parts by mass relative to 1 part by mass of (A) component from the viewpoints of the film formability of the resin composition, the thermal conductivity of the cured resin composition, and the heat resistance. (B) The component system is less than 0.5 parts by mass relative to 1 part by mass of the (A) component, and the resin composition film cannot be formed. When it exceeds 5 parts by mass, the thermal conductivity of the cured resin composition becomes low. In addition, the total of (A) and (B), from the viewpoint of the film formability, adhesiveness of the resin composition, and the thermal conductivity of the cured resin composition, relative to the resin composition (without solvent): 100 mass Parts, preferably 4 to 20 parts by mass.

從樹脂組成物的接著性、硬化後的樹脂組成物的絶緣性、以及熱膨脹係數的觀點而言,(C)成分相對於樹脂組成物(除去溶劑):100質量份,以40至95質量份為佳。(C)成分若超過95質量份,樹脂組成物的接著力容易降低。另一方面,若(C)成分未達40質量份,高導熱性無機填充物的導熱率即使很高,硬化後的樹脂組成物之導熱恐怕也不充分。 From the viewpoints of adhesiveness of the resin composition, insulation of the cured resin composition, and thermal expansion coefficient, (C) component relative to the resin composition (excluding solvent): 100 parts by mass, 40 to 95 parts by mass Better. (C) If the component exceeds 95 parts by mass, the adhesive force of the resin composition tends to decrease. On the other hand, if the component (C) is less than 40 parts by mass, even if the thermal conductivity of the high thermal conductivity inorganic filler is high, the thermal conductivity of the cured resin composition may not be sufficient.

樹脂組成物復以含有(D)硬化劑為佳。作為(D)成分者,可以列舉:酚系硬化劑、酸酐系硬化劑、胺系硬化劑、咪唑系硬化劑、羧酸二肼硬化劑等,以選自酚系硬化劑、胺系硬化劑、酸酐系硬化劑以及咪唑系硬化劑所組成群組中之至少1種為佳。又,從樹脂組成物的接著性之觀點而言,以酚系硬化劑為更佳,又,從樹脂組成物的流動性、接著性的觀點而言,以酸酐系硬化劑為更佳。從 樹脂組成物的保存安定性之觀點而言,以咪唑系硬化劑為更佳。 The resin composition preferably contains (D) hardener. Examples of component (D) include phenol-based hardeners, acid anhydride-based hardeners, amine-based hardeners, imidazole-based hardeners, carboxylic acid dihydrazine hardeners, etc., selected from phenol-based hardeners and amine-based hardeners At least one of the group consisting of an acid anhydride hardener and an imidazole hardener is preferred. In addition, from the viewpoint of adhesiveness of the resin composition, a phenol-based hardener is more preferable, and from the viewpoint of fluidity and adhesiveness of the resin composition, an acid anhydride-based hardener is more preferable. From From the viewpoint of storage stability of the resin composition, an imidazole-based hardener is more preferable.

作為酚系硬化劑,可以列舉:酚酚醛清漆、甲酚酚醛清漆等,以酚酚醛清漆為佳。又,酚系硬化劑,因為比酸酐系硬化劑、胺系硬化劑、咪唑系硬化劑等的其他硬化劑之硬化速度更慢,故使用其他的硬化劑,樹脂組成物的硬化速度變成過炔時,可併用酚系硬化劑,以延緩樹脂組成物的硬化速度之目的下使用。 Examples of the phenolic hardener include phenol novolak and cresol novolak, and phenol novolak is preferred. In addition, phenol-based hardeners have a slower curing rate than other hardeners such as anhydride-based hardeners, amine-based hardeners, and imidazole-based hardeners. Therefore, when other hardeners are used, the curing rate of the resin composition becomes peracetylene In this case, a phenolic curing agent can be used in combination to slow down the curing speed of the resin composition.

作為酸酐,可以列舉:四氫鄰苯二甲酸酐、六氫鄰苯二甲酸酐、甲基四氫鄰苯二甲酸酐、甲基六氫鄰苯二甲酸酐、甲基納迪克酸酐、氫化甲基納迪克酸酐、三烷基四氫鄰苯二甲酸酐、甲基環己烯四羧酸二酐、鄰苯二甲酸酐、偏苯三酸酐、均苯四甲酸二酐、二苯甲酮四羧酸二酐、乙二醇雙脫水偏苯三酸酯、甘油雙(脫水偏苯三酸酯)單乙酸酯、十二烯基琥珀酸酐、脂肪族二元酸多酐、氯菌酸酐(Chlorendic anhydride)、甲基丁烯基四氫鄰苯二甲酸酐、烷基化四氫鄰苯二甲酸酐、甲基腐植(HIMIC)酸酐、以以烯基取代之琥珀酸酐、戊二酸酐等,以甲基丁烯基四氫鄰苯二甲酸酐為佳。 Examples of the acid anhydride include tetrahydrophthalic anhydride, hexahydrophthalic anhydride, methyltetrahydrophthalic anhydride, methylhexahydrophthalic anhydride, methylnadic anhydride, and hydrogenated methyl Kinadike anhydride, trialkyltetrahydrophthalic anhydride, methylcyclohexene tetracarboxylic dianhydride, phthalic anhydride, trimellitic anhydride, pyromellitic dianhydride, benzophenone tetracarboxylic diacid Anhydride, ethylene glycol bis-dehydrated trimellitate, glycerol bis(dehydrated trimellitate) monoacetate, dodecenyl succinic anhydride, aliphatic dibasic acid polyanhydride, Chlorendic anhydride , Methylbutenyl tetrahydrophthalic anhydride, alkylated tetrahydrophthalic anhydride, methyl humic (HIMIC) anhydride, succinic anhydride substituted with alkenyl, glutaric anhydride, etc., with methyl Butenyl tetrahydrophthalic anhydride is preferred.

作為胺系硬化劑,可以列舉:鏈狀脂肪族胺、環狀脂肪族胺、脂肪芳香族胺、芳香族胺等,以芳香族胺為佳。作為羧酸二肼硬化劑者,可以列舉:己二酸二肼、間苯二甲酸二肼、癸二酸二肼、十二烷酸二肼等,以己二酸二肼為佳。 Examples of the amine-based hardener include chain aliphatic amines, cyclic aliphatic amines, aliphatic aromatic amines, and aromatic amines, and aromatic amines are preferred. Examples of carboxylic acid dihydrazine hardeners include adipic acid dihydrazine, isophthalic acid dihydrazine, sebacic acid dihydrazine, and dodecanoic acid dihydrazine. Adipic acid dihydrazine is preferred.

作為咪唑系硬化劑,從樹脂組成物的保存安定性之觀點而言,係以被微膠囊化之咪唑化合物硬化劑、胺加成型硬化劑為佳,從樹脂組成物的作業性、硬化速度、保存安定性的觀點而言,以分散於液狀雙酚A型等的液狀環氧樹脂中之微膠囊化咪唑化合物硬化劑為更佳。作為咪唑硬化劑,可以列舉:2-甲基咪唑、2-十一烷基咪唑、2-十七烷基咪唑、2-乙基-4-甲基咪唑、2-苯基咪唑、2-苯基-4-甲基咪唑、2,4-二胺基-6-[2’-甲基咪唑基-(1’)]乙基-s-三嗪、2-苯基-4,5-二羥基甲基咪唑、2-苯基-4-甲基-5-羥基甲基咪唑、2,3-二氫-1H-吡咯[1,2-a]苯並咪唑等,其中,2,4-二胺基-6-[2’-甲基咪唑基-(1’)]乙基-s-三嗪、2,4-二胺基-6-[2’-十一烷基咪唑基-(1)]-乙基-s-三嗪、2,4-二胺基-6-[2’-乙基-4’-甲基咪唑基-(1’)]-乙基-s-三嗪等,從樹脂組成物的硬化速度、作業性、耐濕性的觀點而言,為較佳。 As the imidazole-based hardener, from the viewpoint of storage stability of the resin composition, it is preferably an imidazole compound hardener microencapsulated and an amine addition molding hardener. From the workability of the resin composition, the curing speed, From the viewpoint of preservation of stability, a microencapsulated imidazole compound hardener dispersed in liquid epoxy resin such as liquid bisphenol A type is more preferable. Examples of the imidazole hardener include 2-methylimidazole, 2-undecylimidazole, 2-heptadecylimidazole, 2-ethyl-4-methylimidazole, 2-phenylimidazole, and 2-benzene 4-methylimidazole, 2,4-diamino-6-[2'-methylimidazolyl-(1')]ethyl-s-triazine, 2-phenyl-4,5-di Hydroxymethylimidazole, 2-phenyl-4-methyl-5-hydroxymethylimidazole, 2,3-dihydro-1H-pyrrole[1,2-a]benzimidazole, etc., of which 2,4- Diamino-6-[2'-methylimidazolyl-(1')]ethyl-s-triazine, 2,4-diamino-6-[2'-undecylimidazolyl-( 1)]-ethyl-s-triazine, 2,4-diamino-6-[2'-ethyl-4'-methylimidazolyl-(1')]-ethyl-s-triazine It is preferable from the viewpoint of curing speed, workability, and moisture resistance of the resin composition.

作為(D)成分的市售品,可以列舉:明和化成製酚硬化劑(品名:MEH8000、MEH8005)、三菱化學製酸酐(等級:YH306、H307)、日立化成工業製3或4-甲基-六氫鄰苯二甲酸酐(品名:HN-5500)、日本化藥製胺硬化劑(品名:Kayahard A-A)、日本Finechem製己二酸二肼(品名:ADH)、旭化成E-materials製微膠囊化咪唑化合物硬化劑(品名:HX3722、HX3742、HX3932HP、HX3941HP)、味之素Finetechno公司製的胺加成型硬化劑(品名:PN-40J)、四國化成工業製2-乙基-4-甲基咪唑(品 名:2E4MZ)等,(D)成分並不侷限於此等品名之產品。(D)成分是可以單獨使用,也可以合併使用2種以上。 Examples of commercially available products of component (D) include phenolic hardeners manufactured by Meiwa Chemicals (product names: MEH8000, MEH8005), acid anhydrides manufactured by Mitsubishi Chemical Corporation (grades: YH306, H307), and Hitachi Chemical Co., Ltd. 3 or 4-methyl- Hexahydrophthalic anhydride (product name: HN-5500), amine hardener made by Nippon Kayaku (product name: Kayahard AA), adipic acid dihydrazine (product name: ADH) made by Finechem Japan, microcapsules made by Asahi Kasei E-materials Imidazole compound hardener (product name: HX3722, HX3742, HX3932HP, HX3941HP), amine addition molding hardener (product name: PN-40J) manufactured by Ajinomoto Finetechno Corporation, 2-ethyl-4-methyl manufactured by Shikoku Chemical Industry Imidazole Name: 2E4MZ), etc., (D) ingredients are not limited to products of this name. (D) The component may be used alone, or two or more kinds may be used in combination.

(D)成分從樹脂組成物的保存安定性、硬化性的觀點而言,相對於樹脂組成物(除去溶劑):100質量份,以0.1至5質量份為佳。 (D) The component is preferably 0.1 to 5 parts by mass relative to 100 parts by mass of the resin composition (excluding the solvent) from the viewpoint of storage stability and curability of the resin composition.

又,樹脂組成物係在不損及本發明效果之範圍內,也可以含有偶合劑、增黏劑、消泡劑、流動調整劑、成膜補助劑、分散劑等的添加劑,或有機溶劑。 In addition, the resin composition may contain additives such as coupling agents, tackifiers, defoamers, flow regulators, film-forming auxiliary agents, dispersants, or organic solvents as long as the effects of the present invention are not impaired.

作為有機溶劑,可以列舉:芳香族系溶劑,例如甲苯、二甲苯等、酮系溶劑,例如甲乙酮、甲基異丁基酮等。有機溶劑可以單獨使用,也可以組合2種以上而使用。又,有機溶劑的使用量雖無特別限定,但固形分是以成為20至50質量%的方式來使用為佳。從樹脂組成物的作業性之觀點而言,樹脂組成物以在200至3000mPa‧s的黏度範圍為佳。黏度係使用E型黏度計,為以回轉數10rpm、25℃測定之值。 Examples of organic solvents include aromatic solvents such as toluene and xylene, and ketone solvents such as methyl ethyl ketone and methyl isobutyl ketone. The organic solvents may be used alone or in combination of two or more. In addition, although the amount of the organic solvent used is not particularly limited, the solid content is preferably used so as to be 20 to 50% by mass. From the viewpoint of workability of the resin composition, the resin composition preferably has a viscosity range of 200 to 3000 mPa‧s. The viscosity is a value measured using an E-type viscometer at a rotation speed of 10 rpm and 25°C.

[接著薄膜] [Then film]

上述的樹脂組成物是適合在接著薄膜的形成。藉由將含有(A)至(C)成分等的原料溶解或分散於有機溶劑中,可得到樹脂組成物。作為此等原料的溶解或分散等之裝置,並無特別的限定,但可以使用具備攪拌、加熱裝置之破碎機、3滾磨機、球磨機、行星式混合機、珠磨機等。又,也可以適當組合此等裝置而使用。 The above-mentioned resin composition is suitable for the formation of an adhesive film. The resin composition can be obtained by dissolving or dispersing raw materials containing components (A) to (C) in an organic solvent. The apparatus for dissolving or dispersing these raw materials is not particularly limited, but a crusher, a three-roll mill, a ball mill, a planetary mixer, a bead mill, etc. equipped with a stirring and heating device can be used. In addition, these devices may be appropriately combined and used.

接著薄膜係藉由將上述的樹脂組成物塗布在所期望的支持體上之後,乾燥而得到。支持體係無特別限定,而可以列舉銅、鋁等的金屬箔、聚酯樹脂、聚乙烯樹脂、聚對苯二甲酸乙二酯樹脂等的有機薄膜等。支持體也可以聚矽氧系化合物等進行離型處理。 Next, the film is obtained by applying the above-mentioned resin composition on a desired support and drying it. The supporting system is not particularly limited, and examples include metal foils such as copper and aluminum, organic resins such as polyester resin, polyethylene resin, and polyethylene terephthalate resin. The support can also be released from polysilicon compounds.

將樹脂組成物塗布在支持體上的方法,並無特別限定,但從薄膜化/膜厚控制的觀點而言,以微凹版印刷法、縫口模頭法、刮片法為佳。藉由縫口模頭法,可得到熱硬化後的厚度成為10至300μm的接著薄膜。 The method of applying the resin composition to the support is not particularly limited, but from the viewpoint of thinning/thickness control, the microgravure printing method, the slit die method, and the doctor blade method are preferred. By the slit die method, an adhesive film with a thickness of 10 to 300 μm after heat curing can be obtained.

乾燥條件是對應在樹脂組成物中使用的有機溶劑種類、量或是塗布之厚度等,而可以適當設定,例如,可以設為50至120℃、1至30分鐘左右。如此方式所得到的接著薄膜,具有良好的保存安定性。又,接著薄膜在所期望的時間點,可從支持體剝離。 The drying conditions can be appropriately set according to the type, amount, or thickness of the organic solvent used in the resin composition, and for example, it can be set to about 50 to 120° C. for about 1 to 30 minutes. The adhesive film obtained in this way has good storage stability. Then, the film can be peeled from the support at a desired time.

接著薄膜例如以130至200℃、30至180分鐘使其熱硬化,可接著被接著物。使發熱體的被接著物與受熱體的被接著物接著時,經硬化的接著薄膜係將來自發熱體的被接著物之熱朝向受熱體的被接著物側逃逸,在受熱體的被接著物側發揮使其散熱之傳熱作用。再者,經硬化的接著薄膜係發揮緩和在發熱體的被接著物與受熱體的被接著物之間的熱膨脹率差所產生的應力之作用。 Then, the film is thermally hardened at 130 to 200° C. for 30 to 180 minutes, for example, and can be adhered. When the adherend of the heating element and the adherend of the heating element are connected, the hardened adhesive film escapes the heat of the adherend from the heating element toward the adherend side of the heating element, and the adherend of the heating element The side plays the role of heat transfer to dissipate heat. In addition, the hardened adhesive film functions to relax the stress caused by the difference in thermal expansion rate between the adherend of the heating element and the adherend of the heated body.

接著薄膜的厚度較佳係10μm以上300μm以下,更佳是10μm以上100μm以下,再更佳是10μm以上50μm以下。未達10μm時,恐無法得到所期望 之絶緣性。若超過300μm,發熱之被接著物恐無法充分散熱。隨著接著薄膜的厚度變薄,發熱體的被接著物與受熱體之被接著物的距離會變短,故從有效率的導熱之觀點而言,接著薄膜的厚度愈薄愈佳。 Next, the thickness of the film is preferably 10 μm or more and 300 μm or less, more preferably 10 μm or more and 100 μm or less, and still more preferably 10 μm or more and 50 μm or less. When it is less than 10μm, I may not get what I expect Insulation. If it exceeds 300 μm, the object to be heated may not be able to dissipate heat sufficiently. As the thickness of the adhesive film becomes thinner, the distance between the adherend of the heating element and the adherend of the heat receiving body becomes shorter, so from the viewpoint of efficient heat conduction, the thinner the adhesive film is, the better.

又,經硬化的接著薄膜係以導熱率為2W/m‧K以上較佳。又,在硬化之接著薄膜的導熱率未達2W/m‧K時,對來自發熱體之受熱器之傳熱恐怕有不充足的情形。與硬化的接著薄膜之體積電阻率與導熱率,係可藉由(C)成分的種類與含量而控制。 In addition, the cured adhesive film preferably has a thermal conductivity of 2 W/m‧K or more. In addition, when the thermal conductivity of the hardened adhesive film is less than 2W/m‧K, the heat transfer from the heat receiver of the heating element may be insufficient. The volume resistivity and thermal conductivity of the cured film can be controlled by the type and content of (C) component.

經硬化之接著薄膜的剝離強度以超過5N/cm為佳。若硬化之接著薄膜的剝離強度超過5N/cm,使用接著薄膜的硬化體,可提高半導體裝置之可靠度。 The peel strength of the hardened adhesive film is preferably more than 5N/cm. If the peeling strength of the cured adhesive film exceeds 5 N/cm, the use of a cured body of the adhesive film can improve the reliability of the semiconductor device.

經硬化的接著薄膜係以體積電阻率為1×1010Ω‧cm以上為佳。經硬化之接著薄膜的體積電阻率為未達1×1010Ω‧cm時,恐怕無法滿足半導體裝置所要求之絶緣性。 The cured adhesive film preferably has a volume resistivity of 1×10 10 Ω‧cm or more. When the volume resistivity of the hardened adhesive film is less than 1×10 10 Ω‧cm, the insulation required by the semiconductor device may not be satisfied.

[半導體裝置] [Semiconductor device]

本發明的半導體裝置是使用上述接著薄膜之硬化物。藉由導熱性、接著強度優良之接著薄膜的硬化物,可提供可靠度高的半導體裝置。作為半導體裝置,可以列舉將模組或電子零組件等的發熱體、與基板等的受熱體以接著薄膜的硬化物接著者;或將接受來自發熱體的熱之基板的熱、與進一步接受由此基板之熱的散熱板等以接著薄膜 的硬化物而接著者。 The semiconductor device of the present invention uses the cured product of the aforementioned adhesive film. The cured product of the adhesive film having excellent thermal conductivity and adhesive strength can provide a highly reliable semiconductor device. Examples of semiconductor devices include those in which a heating element such as a module or an electronic component, and a heating element such as a substrate are connected with a hardened material that adheres to a thin film; or a substrate that receives heat from the heating element and further The heat dissipation plate of this substrate is attached to the film And the hardener.

[實施例] [Example]

關於本發明,雖是藉由實施例來說明,但本發明是並不侷限於此等。又,在以下的實施例中,份、%若無特別論述,係表示質量份、質量%。 Although the present invention is explained by the examples, the present invention is not limited to these. In the following examples, parts and% represent mass parts and mass% unless otherwise specified.

[實施例1至12、比較例1至4] [Examples 1 to 12, Comparative Examples 1 to 4]

以表1與表2中所示之調配,將(A)成分、(B)成分、適量的甲苯經計量配合後,將此等投入於加溫至80℃之反應釜內,以回轉數150rpm一面回轉,一面在常壓中進行混合3小時,製作清漆。在所製作的清漆中,加入(C)成分、(D)成分、其他的成分,藉由行星型混合機分散,製作接著薄膜用樹脂組成物。 According to the formulation shown in Table 1 and Table 2, (A) component, (B) component, and an appropriate amount of toluene are metered and mixed, then put these into a reaction kettle heated to 80 ℃, with a rotation number of 150rpm While rotating, mix at normal pressure for 3 hours to produce a varnish. To the produced varnish, component (C), component (D), and other components are added, and dispersed by a planetary mixer to produce a resin composition for an adhesive film.

[評估方法] [assessment method]

1.導熱率的測定 1. Determination of thermal conductivity

將所得到的接著薄膜用樹脂組成物,在經實施離型劑之50μm厚度的PET薄膜上,以乾燥後的膜厚成為200至400μm之方式刮取塗布。在第1圖中,係表示用以說明刮取塗布的方法之示意圖。首先,在付有離型劑之PET薄膜上,以成為適當厚度的方式,重疊2列間隔物之後,以黏著膠帶黏貼(第1圖(A))。在附離型劑的PET薄膜上,注入適量的接著薄膜用組成物(第1圖(B))。在間隔物上放置表玻璃,刮取接著薄膜用組成物並加以塗布(第1 圖(C)至(E))。其次,將已塗布之接著薄膜用組成物充分乾燥之後,所得到的接著薄膜,使用真空加壓機以180℃×60分鐘、0.1MPa的條件使其硬化。將已硬化的接著薄膜裁切成10×10mm,製作導熱率測定用試験片。所製作的導熱率測定用試験片之導熱率,以NETZSCH公司製導熱率計(Xe閃光分析儀,型號:LFA 447 Nano flash)測定。在表1與表2中,表示導熱率的測定結果。 The obtained resin composition for an adhesive film was applied on a 50 μm-thick PET film subjected to a release agent so that the film thickness after drying was 200 to 400 μm. Fig. 1 is a schematic diagram for explaining the method of blade coating. First, on the PET film to which the release agent is applied, two rows of spacers are stacked so as to have an appropriate thickness, and then pasted with an adhesive tape (Figure 1(A)). On the PET film to which the release agent is attached, an appropriate amount of the composition for adhesive film is injected (Figure 1 (B)). Place the watch glass on the spacer, scrape and apply the composition for the next film and apply it (1st Figures (C) to (E)). Next, after the applied adhesive film composition was sufficiently dried, the resulting adhesive film was cured using a vacuum press at 180° C.×60 minutes and 0.1 MPa. The cured adhesive film was cut into 10×10 mm, and a test piece for measuring thermal conductivity was prepared. The thermal conductivity of the prepared test piece for thermal conductivity measurement was measured with a thermal conductivity meter (Xe flash analyzer, model: LFA 447 Nano flash) manufactured by NETZSCH. Tables 1 and 2 show the measurement results of thermal conductivity.

2.剝離強度的測定 2. Determination of peel strength

準備單面已粗糙化的銅箔。在與導熱率評估時同樣操作而得到之接著薄膜之兩面,使內側為粗化面而黏貼銅箔。使用真空加壓機,以180℃×60分鐘、0.1MPa的條件加熱壓接,使其硬化。將此硬化體切成10mm寬,製作剝離強度測定用試料。將所作成之剝離強度測定用試料以島津製作所製精密萬能試驗機(型號:ASG-J-5 k NJ)剝離,測定剝離強度。有關測定結果,計算各N=5的平均值。在表1與表2中,表示剝離強度的結果。 Prepare copper foil that has been roughened on one side. In the same manner as the thermal conductivity evaluation, the two sides of the film are adhered, and the inner side is the roughened surface and the copper foil is adhered. Using a vacuum press, it was heated and pressure-bonded at 180°C for 60 minutes at 0.1 MPa to harden it. This hardened body was cut to a width of 10 mm to prepare a sample for measuring peel strength. The prepared sample for peel strength measurement was peeled with a precision universal testing machine (model: ASG-J-5 k NJ) manufactured by Shimadzu Corporation, and the peel strength was measured. Regarding the measurement results, the average value of each N=5 was calculated. Tables 1 and 2 show the results of peel strength.

3.薄膜成形性 3. Film formability

將所得到的接著薄膜用組成物在已施予離型劑之50μm厚度的PET薄膜上使用塗布機塗布成寬為20cm且乾燥後的膜厚為30至200μm。將已塗布之接著薄膜用組成物以80℃乾燥20分鐘。將此薄膜捲取成50mmφ、40cm寬的捲軸,評估薄膜成形性。即使彎折也不會龜裂時設為 「5」,若彎折,一部分會龜裂時設為「4」,若彎折完全龜裂時設為「3」,成為薄膜但容易龜裂時,設為「2」,不成為薄膜而無法使用時設為「1」。在表1與表2中,顯示薄膜成形性的結果。 The obtained composition for an adhesive film was coated on a 50 μm-thick PET film to which a release agent had been applied using a coater to have a width of 20 cm and a film thickness of 30 to 200 μm after drying. The applied adhesive film composition was dried at 80°C for 20 minutes. This film was wound into a reel of 50 mmφ and 40 cm width, and the film formability was evaluated. Set to prevent cracking even if it is bent "5", if it is bent, part of it will crack, set to "4", if it is completely cracked, set to "3", when it becomes a film, but it is easy to crack, set to "2", not become a film. Set to "1" when not available. Tables 1 and 2 show the results of film formability.

Figure 104110416-A0305-02-0018-3
Figure 104110416-A0305-02-0018-3

1)三菱化學,品名:630 1) Mitsubishi Chemical, product name: 630

2)DIC,品名:HP4032D 2) DIC, product name: HP4032D

3)DIC,品名:HP4700 3) DIC, product name: HP4700

4)三菱化學製,品名:EXA4816 4) Mitsubishi Chemical, product name: EXA4816

5)三菱化學製,品名:YL7178,玻璃轉移溫度:15℃ 5) Mitsubishi Chemical, product name: YL7178, glass transition temperature: 15℃

6)長瀨化學科技製,品名:SG790,丙烯酸n-丁基與丙烯腈之共聚物,玻璃轉移溫度:-32℃ 6) Made by Nagase Chemical Technology, product name: SG790, copolymer of acrylic acid n-butyl and acrylonitrile, glass transition temperature: -32℃

7)新日鐵住金化學製,品名:YP50S,玻璃轉移溫度:84℃ 7) Nippon Steel & Sumitomo Chemical Co., Ltd., product name: YP50S, glass transition temperature: 84℃

8)堺化學工業製,品名:SMO-5,平均粒徑:5μm 8) Sakai Chemical Industry, product name: SMO-5, average particle size: 5 μm

9)堺化學工業製,品名:SMO-1,平均粒徑:1μm 9) manufactured by Sakai Chemical Industry, product name: SMO-1, average particle size: 1 μm

10)堺化學工業製,品名:SMO-02,平均粒徑:0.2μm 10) Sakai Chemical Industry, product name: SMO-02, average particle size: 0.2 μm

11)堺化學工業製,品名:SMO-2,平均粒徑:2μm 11) Sakai Chemical Industry, product name: SMO-2, average particle size: 2 μm

12)昭和電工業製,品名:CBA09S,平均粒徑:9μm 12) Showa Denko Industries, product name: CBA09S, average particle diameter: 9 μm

13)電氣化學製,品名:DAW-03,平均粒徑:3.7μm 13)Electrochemical system, product name: DAW-03, average particle size: 3.7μm

14)電氣化學製,品名:ASFP-20,平均粒徑:0.3μm 14)Electrochemical system, product name: ASFP-20, average particle size: 0.3μm

15)四國化成工業製2-乙基-4-甲基咪唑,品名:2E4MZ 15) 2-ethyl-4-methylimidazole manufactured by Shikoku Chemical Industry Co., Ltd., product name: 2E4MZ

16)旭化成E-Materials製,品名:HX3941HP 16) Asahi Kasei E-Materials, product name: HX3941HP

17)DIC製酚醛清漆型酚硬化劑,品名:KA1160 17) Novolac type phenol hardener made by DIC, product name: KA1160

18)信越化學工業製3-環氧丙基丙基三甲氧基矽烷,品名:KBM403 18) 3-Epoxypropyltrimethoxysilane manufactured by Shin-Etsu Chemical Co., Ltd., product name: KBM403

19)BYK製,品名:BYK111 19) BYK system, product name: BYK111

Figure 104110416-A0305-02-0019-4
Figure 104110416-A0305-02-0019-4

由表1、2可知,實施例1至12的全部中,導熱率、剝離強度、薄膜成形性的全部結果都為良好。相對於此等,使用以萘型環氧樹脂取代胺基酚型環氧樹脂的比較例1,導熱率低。使用萘型多官能環氧樹脂取代胺基酚型環氧樹脂的比較例2,導熱率也低。使用雙酚A型環氧樹脂取代胺基酚型環氧樹脂的比較例3,導熱率也低。(B)成分相對於(A)成分為過少的比較例4,無法使接著薄膜用組成物成形為薄膜,故不能測定導熱率、剝離強度。 As is clear from Tables 1 and 2, all the results of thermal conductivity, peel strength, and film formability were good in all of Examples 1 to 12. In contrast to this, Comparative Example 1 using a naphthalene-type epoxy resin in place of an aminophenol-type epoxy resin has a low thermal conductivity. In Comparative Example 2 in which a naphthalene type multifunctional epoxy resin was used instead of an aminophenol type epoxy resin, the thermal conductivity was also low. In Comparative Example 3 in which bisphenol A type epoxy resin was used instead of aminophenol type epoxy resin, the thermal conductivity was also low. (B) The comparative example 4 whose component is too small with respect to (A) component cannot form the composition for adhesive films into a thin film, and therefore cannot measure thermal conductivity and peel strength.

如上述,本發明的組成物,係可提供一種導熱性、接著性、薄膜成形性優良之樹脂組成物,尤其可提供硬化後導熱性優良的樹脂組成物。 As described above, the composition of the present invention can provide a resin composition excellent in thermal conductivity, adhesiveness, and film formability, and particularly can provide a resin composition excellent in thermal conductivity after curing.

Claims (7)

一種樹脂組成物,係含有(A)胺基酚型環氧樹脂,(B)玻璃轉移溫度為未達50℃的苯氧樹脂,以及(C)選自MgO、Al2O3、AlN、BN、鑽石填充物、ZnO以及SiC所組成群組中之至少1種的高導熱性無機填充物,且相對於(A)成分1質量份,(B)成分為0.5至5質量份,相對於樹脂組成物(除去溶劑)100質量份,(C)成分為40至95質量份。 A resin composition containing (A) an aminophenol-type epoxy resin, (B) a phenoxy resin with a glass transition temperature of less than 50°C, and (C) selected from MgO, Al 2 O 3 , AlN, BN , Diamond filler, ZnO and SiC at least one kind of high thermal conductivity inorganic filler, and relative to (A) component 1 part by mass, (B) component is 0.5 to 5 parts by mass, relative to resin The composition (excluding the solvent) is 100 parts by mass, and the component (C) is 40 to 95 parts by mass. 如申請專利範圍第1項所述之樹脂組成物,其中,(A)成分為以下述化學式(1)表示,
Figure 104110416-A0305-02-0021-5
The resin composition as described in item 1 of the scope of patent application, wherein component (A) is represented by the following chemical formula (1),
Figure 104110416-A0305-02-0021-5
一種接著薄膜,其係由如申請專利範圍第1項或第2項所述之樹脂組成物所形成者。 An adhesive film formed from the resin composition as described in the first or second patent application. 一種如申請專利範圍第1項或第2項所述之樹脂組成物的硬化物。 A cured product of a resin composition as described in item 1 or 2 of the patent application. 一種如申請專利範圍第3項所述之接著薄膜的硬化物。 A cured product of an adhesive film as described in item 3 of the patent application. 一種半導體裝置,其係使用如申請專利範圍第3項所述之接著薄膜的硬化物者。 A semiconductor device using the cured product of an adhesive film as described in item 3 of the patent application. 一種半導體裝置,其係使用如申請專利範圍第1項或第2項所述之樹脂組成物的硬化物者。 A semiconductor device that uses the cured product of the resin composition as described in the first or second patent application.
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Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005187508A (en) * 2003-12-24 2005-07-14 Sumitomo Bakelite Co Ltd Adhesive film for semiconductor and semiconductor device
JP2011168672A (en) * 2010-02-17 2011-09-01 Sekisui Chem Co Ltd Insulation sheet

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0782392A (en) * 1993-06-30 1995-03-28 Nippon Oil Co Ltd Prepreg for composite material and production of tubular molding of composite material
JP5348740B2 (en) 2008-06-23 2013-11-20 日本化薬株式会社 Epoxy resin, epoxy resin composition, and cured product thereof
JP2012079880A (en) * 2010-09-30 2012-04-19 Sumitomo Bakelite Co Ltd Adhesive, multilayered circuit board, semiconductor component, and semiconductor device
JP5737129B2 (en) 2010-10-18 2015-06-17 三菱化学株式会社 Epoxy resin, epoxy resin composition and cured product

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005187508A (en) * 2003-12-24 2005-07-14 Sumitomo Bakelite Co Ltd Adhesive film for semiconductor and semiconductor device
JP2011168672A (en) * 2010-02-17 2011-09-01 Sekisui Chem Co Ltd Insulation sheet

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